TWM445761U - Chip pickup device - Google Patents
Chip pickup device Download PDFInfo
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- TWM445761U TWM445761U TW101217053U TW101217053U TWM445761U TW M445761 U TWM445761 U TW M445761U TW 101217053 U TW101217053 U TW 101217053U TW 101217053 U TW101217053 U TW 101217053U TW M445761 U TWM445761 U TW M445761U
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- 230000007246 mechanism Effects 0.000 claims description 42
- 235000012431 wafers Nutrition 0.000 claims description 33
- 239000000463 material Substances 0.000 claims description 7
- 239000000758 substrate Substances 0.000 description 13
- 238000000034 method Methods 0.000 description 12
- 230000008569 process Effects 0.000 description 10
- 238000010586 diagram Methods 0.000 description 6
- 238000000605 extraction Methods 0.000 description 6
- 230000000903 blocking effect Effects 0.000 description 2
- 230000006698 induction Effects 0.000 description 2
- 238000005452 bending Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- NLYAJNPCOHFWQQ-UHFFFAOYSA-N kaolin Chemical compound O.O.O=[Al]O[Si](=O)O[Si](=O)O[Al]=O NLYAJNPCOHFWQQ-UHFFFAOYSA-N 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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Description
本新型係在於提供一種收集裝置,尤指一種晶片的收集裝置。The present invention is to provide a collecting device, especially a collecting device for a wafer.
請參閱第一圖所示,一般的晶片型電阻形成於一片狀基板1上,於該基板1上以雷射方式割劃出縱、橫的折痕11並格設出多個格狀晶片12;請參閱第二圖所示,格狀晶片12再以自動化方式進行剝離出一條條細長的電阻條13,並將各細長的電阻條13予以收集堆疊成整組,再將整組堆疊完整的電阻條13送至下一個進行折粒成每一格狀晶片12為一單元的製程;此種將形成晶片型電阻的片狀基板1進行剝離及堆疊的習知技術例如CN2566426「晶片電阻剝條整列機」,其主要利用傳送裝置將晶片基板置入輸送皮帶,使其進入由二汽缸所驅動的二壓輪組間,以上、下兩個方向作凹折的剝離裝置內進行剝條的作業,完成剝條作業的電阻條再經由輸送帶傳送至集料裝置受收集堆疊。Referring to the first figure, a general wafer type resistor is formed on a sheet substrate 1, and vertical and horizontal creases 11 are obliquely cut on the substrate 1 to form a plurality of lattice wafers. 12; Referring to the second figure, the lattice wafer 12 is then automatically stripped out of a strip of elongated resistive strips 13, and the elongated strips 13 are collected and stacked into a complete group, and then the entire stack is completed. The strip 13 is sent to the next process for dicing the wafer 12 into a unit; such a technique for stripping and stacking the sheet-like substrate 1 forming the wafer-type resistor, such as CN2566426 "wafer resistor stripping" The strip arranging machine mainly uses a conveying device to place the wafer substrate into the conveying belt, and enters the two pressure roller groups driven by the two cylinders, and strips the stripping device in the upper and lower directions. The work, the strip of strips that complete the stripping operation is then transferred via the conveyor belt to the collecting device to be collected by the stack.
上述習知技術對晶片型電阻的片狀基板進行剝離,採用晶片基板置入輸送皮帶,使其進入由二汽缸所驅動的二壓輪組間,以上、下兩個方向作凹折的剝離方式,由於上下壓輪的輥壓施力相對折痕線較不對應,晶 片在輸送帶上剝離的品質亦不甚理想,亦不適用較小晶片電阻的剝離操作,爰是,申請人曾研發直接將電阻條以逐條彎折的剝離方式進行,然後使剝離後的電阻條經由一傳送裝置傳送至一收集裝置被提取,以將電阻條置入一堆疊裝置中的料框內,形成一完整的晶片堆疊組件,以使整個晶片堆疊組件可移至下一製程做折粒的作業。The above-mentioned prior art peels off the sheet-shaped substrate of the wafer type resistor, and inserts the wafer into the transport belt to enter the two pressure roller groups driven by the two cylinders, and the upper and lower directions are concavely folded. Because the roller pressing force of the upper and lower pressing wheels does not correspond to the crease line, the crystal The quality of the peeling of the sheet on the conveyor belt is also not satisfactory, and the peeling operation of the smaller wafer resistor is not applicable. Therefore, the applicant has developed a stripping method in which the strips are bent one by one, and then the stripped strip is removed. The resistor strip is transferred to a collection device via a transfer device for extraction to place the resistor strip into a frame in a stacking device to form a complete wafer stack assembly so that the entire wafer stack assembly can be moved to the next process. Folding work.
本新型之目的,在於提供一種能夠將剝離後,經傳送裝置傳送來的電阻條予以提取並置入堆疊裝置進行堆疊的晶片的收集裝置。SUMMARY OF THE INVENTION An object of the present invention is to provide a collecting device capable of extracting a strip of electric resistance which has been conveyed by a conveying device after being peeled off and placing it in a stacking device for stacking.
依據本新型之目的,本新型晶片的收集裝置,包括:在一載座上設有一取料機構及一置料機構;該取料機構設置可在一滑座上滑移的滑塊,滑塊藉由一連接件連設一取出件,取出件設有取料臂;該置料機構設置可在一滑座上滑移的滑塊,滑塊藉由一連接件連設一置放座,置放座設置設有負壓的吸針;藉取料機構取料臂提取的物料,經由置料機構吸針的吸取而進行置放堆疊。According to the purpose of the present invention, the collecting device of the novel wafer comprises: a feeding mechanism and a feeding mechanism on a carrier; the reclaiming mechanism is provided with a slider that can slide on a sliding seat, and a slider A take-up member is connected by a connecting member, and the take-out member is provided with a take-up arm; the feeding mechanism is provided with a slider which can slide on a sliding seat, and the slider is connected with a placing seat by a connecting member. The placing seat is provided with a suction needle provided with a negative pressure; the material extracted by the take-up arm of the take-up mechanism is placed and stacked by suction of the suction needle of the feeding mechanism.
本新型所達成的優點:在對應晶片電阻剝折過程中由傳送裝置所傳遞來的電阻條,能夠逐一對應的提取及置放在堆疊裝置的料框中,除完全取代人工的提取及置放作業,且精確而自動化的逐一操作步驟,使提取作業不遺漏、置放堆疊的作業亦精準完善,可大量節約勞力,降低運作成本。The advantages achieved by the present invention are that the resistive strips transmitted by the transfer device during the corresponding wafer resistance stripping process can be extracted and placed one by one in the frame of the stacking device, except that the artificial extraction and placement are completely replaced. The operation, and the precise and automatic one-by-one operation steps, make the extraction operation not miss, and the stacking operation is also accurate and perfect, which can save a lot of labor and reduce operating costs.
請參閱第三圖和第四圖,本新型實施例對其上設有晶片電阻的基板2進行剝離的方式,係使基板2一端被嵌入一傳送裝置3的一嵌槽311中。Referring to the third and fourth figures, the substrate 2 on which the chip resistance is provided is stripped in such a manner that one end of the substrate 2 is embedded in a recess 311 of a transfer device 3.
請參閱第五圖,本新型實施例使載有基板2的剝離裝置4執行向一側偏斜的彎折操作,以使基板2欲折切的電阻條21被剝離。Referring to the fifth embodiment, in the present embodiment, the peeling device 4 carrying the substrate 2 is subjected to a bending operation which is deflected to one side so that the resistive strip 21 to be folded by the substrate 2 is peeled off.
請參閱第六圖,剝離後的電阻條21嵌於傳送裝置3嵌槽311中,經由傳送裝置3旋轉180度至另一側,以被本新型實施例的收集裝置5所提取並置入堆疊裝置6進行堆疊;其中,該剝離裝置4、傳送裝置3及堆疊裝置6並非本新型的特徵,以下僅針對本新型實施例所主張的收集裝置5詳細作說明。Referring to the sixth figure, the stripped resistive strip 21 is embedded in the recess 311 of the transport device 3, rotated 180 degrees to the other side via the transport device 3, and is extracted by the collecting device 5 of the present embodiment and placed in the stack. The device 6 is stacked; wherein the stripping device 4, the transport device 3, and the stacking device 6 are not features of the present invention, and only the collecting device 5 claimed in the new embodiment will be described in detail below.
請參閱第七圖,本新型實施例的收集裝置5包括一載座51,其上設有一取料機構52及一置料機構54。Referring to the seventh figure, the collecting device 5 of the present embodiment includes a carrier 51 on which a reclaiming mechanism 52 and a receiving mechanism 54 are disposed.
請參閱第八圖,載座51一側藉由樞設元件511與固定座512樞設,而使其相對固定座512可以進行一個掀起的操作;載座51上設有一鏤空的操作區間513。Referring to the eighth figure, the side of the carrier 51 is pivoted by the pivoting member 511 and the fixing base 512 so that it can be lifted relative to the fixing base 512; the carrier 51 is provided with a hollow operation section 513.
請參閱第八、九圖,取料機構52藉由一固定座521以固定於載座51上,固定座521一側固設一其上設置滑塊522的滑座523,滑塊522上設有一向上凸設的感應部524,滑座523上設有第一、二感測元件525、526;滑塊522藉由一連接件527連設一固設於連接件527下方的取出件528,該取出件528可容置於操作區間513中,並設有鏤空的第二操作區間529;請參閱第九、十 圖,在該第二操作區間529兩側各設一取料臂530,並於二取料臂530前端下方各設有開口朝後的扣槽531。Referring to the eighth and ninth drawings, the reclaiming mechanism 52 is fixed on the carrier 51 by a fixing base 521, and a sliding seat 523 on which the slider 522 is disposed is fixed on one side of the fixing base 521, and the slider 522 is disposed. The first and second sensing elements 525 and 526 are disposed on the sliding block 523. The slider 522 is connected to the removing member 528 fixed to the lower side of the connecting member 527 by a connecting member 527. The take-up member 528 can be accommodated in the operation section 513 and provided with a hollow second operation section 529; please refer to the ninth and tenth A take-up arm 530 is disposed on each side of the second operation section 529, and a buckle groove 531 having an opening rearward is disposed below the front end of the two take-up arms 530.
請參閱第十一圖,置料機構54藉由一固定座541以固定於第八圖中的載座51上,固定座541一側固設一其上設置滑塊542的滑座543,滑塊542上設有一向一側凸設的感應部544,滑座543上、下分別設有第三、四感測元件545、546;滑塊542藉由一連接件547連設一固設於連接件547上的置放座548,該置放座548設有分置兩側且被設有負壓的二吸針549;固定座541同時以一固定件550接設一前端兩側各凸設一擋抵部551的擋抵件552。Referring to FIG. 11 , the loading mechanism 54 is fixed to the carrier 51 in the eighth figure by a fixing base 541 , and a sliding seat 543 on which the slider 542 is disposed is fixed on one side of the fixing base 541 . The block 542 is provided with a sensing portion 544 protruding from one side, and the third and fourth sensing elements 545 and 546 are respectively disposed on the upper and lower sides of the sliding frame 543. The slider 542 is fixedly connected by a connecting member 547. a mounting seat 548 is disposed on the connecting member 547, and the receiving seat 548 is provided with two suction needles 549 which are disposed on both sides and are provided with a negative pressure; the fixing base 541 is simultaneously connected with a fixing member 550 and a convex portion on both sides of the front end. A retaining member 552 of the abutting portion 551 is provided.
請參閱第十二圖,本新型實施例的收集裝置5在使用上係用於將第六圖完成剝折的電阻條21提取後置入堆疊裝置6中的一料框61內,該堆疊裝置6及料框61的構造由於非本新型特徵,茲不贅述!惟以下茲以料框6係位於第十二圖所示收集裝置5下方作說明。Referring to FIG. 12, the collecting device 5 of the present embodiment is used to extract the strips 21 which have been stripped in the sixth drawing and put them into a frame 61 in the stacking device 6, the stacking device. 6 and the structure of the material frame 61 is not described in this new feature! However, the following description of the frame 6 is made below the collecting device 5 shown in Fig. 12.
請參閱第十三圖,在電阻條21的提取操作上,係先驅動取料機構52,使滑塊522相對滑座523作往前滑移,以連動連接件527、取出件528、取料臂530前移,直到滑塊522上的感應部524受位於滑座523前的第一感測元件525所感應而停止,此時第六圖的傳送裝置3將把電阻條21傳送至取出件528的取料臂530扣槽531開口前以被扣槽531鉤取。Referring to the thirteenth figure, in the extraction operation of the resistor bar 21, the reclaiming mechanism 52 is driven to slide the slider 522 forward relative to the sliding block 523 to interlock the connecting member 527, the removing member 528, and the reclaiming material. The arm 530 is moved forward until the sensing portion 524 on the slider 522 is stopped by the first sensing element 525 located in front of the slider 523, at which time the conveyor 3 of the sixth figure will transfer the resistance bar 21 to the removal member. The take-up arm 530 of the 528 is hooked by the buckle groove 531 before the opening of the groove 531 is opened.
請參閱第十四圖,取料機構52的取料臂530扣槽 531鉤取回電阻條21後將回位;回位行程中,電阻條21在抵於擋抵件552凸設的二擋抵部551時,滑塊522亦將同時使第二感測元件526受到感測,而使取料機構52的取料臂530在此止動。Referring to FIG. 14 , the take-up arm 530 of the take-up mechanism 52 is buckled. After the 531 hook retrieves the resistance bar 21, it will return to the position; during the return stroke, when the resistance bar 21 abuts against the second blocking abutment portion 551 protruding from the blocking member 552, the slider 522 will also cause the second sensing element 526 to simultaneously It is sensed that the take-up arm 530 of the take-up mechanism 52 is stopped there.
請參閱第十五圖,當電阻條21抵於擋抵部551而止動的同時,置料機構54被設有負壓的二吸針549亦將同時被啟動而吸住電阻條21,此時取料機構52的取料臂530將再被驅動前移進行下一次的取料,而因取料臂530的前移,取料臂530上的扣槽531亦將脫離對電阻條21的拘束。Referring to the fifteenth figure, while the resistive strip 21 is stopped against the abutting portion 551, the second suction pin 549 of the receiving mechanism 54 which is provided with the negative pressure will also be activated to simultaneously attract the resistive strip 21, The take-up arm 530 of the take-up mechanism 52 will be driven forward again for the next take-up, and the take-up arm 530 on the take-up arm 530 will also be disengaged from the resistive strip 21 due to the advancement of the take-up arm 530. Restricted.
請參閱第十六圖,此時置料機構54被設有負壓的二吸針549吸住電阻條21將在滑塊542受驅動與滑座543相對滑動下,將所吸住的電阻條21向下置入料框61中,直到滑塊542向一側凸設的感應部544被第四感測元件546所感測才停止,並續執行在完成置料後二吸針549停止負壓而鬆放所吸住的電阻條21,及使置料機構54二吸針549上升回位,直到滑塊542受第三感測元件545所感測而止動;依循第十三圖至第十六圖的操作,可順利完成本新型實施例的取、置料操作。Referring to the sixteenth embodiment, the loading mechanism 54 is sucked by the two suction needles 549 provided with the negative pressure to hold the resistance bar 21, and the slider 542 is driven to slide relative to the slider 543, and the resistive strip is sucked. 21 is placed downward in the feeding frame 61 until the sensing portion 544 protruding from the slider 542 to one side is stopped by the sensing of the fourth sensing element 546, and the second suction needle 549 stops the negative pressure after the completion of the loading. And releasing the resistive strip 21, and causing the loading mechanism 54 to raise the needle 549 back to the position until the slider 542 is sensed by the third sensing element 545; according to the thirteenth to tenth The operation of the six figures can smoothly complete the taking and placing operations of the novel embodiment.
本新型實施例晶片的收集裝置在對應晶片電阻剝折過程中由傳送裝置3所傳遞來的電阻條21,能夠逐一對應的提取及置放在堆疊裝置6的料框61中,除完全取代人工的提取及置放作業,且精確而自動化的逐一操作步驟,使提取作業不遺漏、置放堆疊的作業亦精準 完善,可大量節約勞力,降低運作成本。The collecting device of the wafer of the present invention can be extracted and placed one by one in the material frame 61 of the stacking device 6 in the corresponding process of the wafer resistance stripping process, except for completely replacing the artificial The extraction and placement operations, and precise and automated one-by-one operation steps, so that the extraction operation is not missed, and the stacking operations are also accurate. Perfect, can save a lot of labor and reduce operating costs.
惟以上所述者,僅為本新型之較佳實施例而已,當不能以此限定本新型實施之範圍,即大凡依本新型申請專利範圍及新型說明內容所作之簡單的等效變化與修飾,皆仍屬本新型專利涵蓋之範圍內。However, the above description is only a preferred embodiment of the present invention, and the scope of the present invention cannot be limited thereto, that is, the simple equivalent change and modification made by the novel patent application scope and the novel description content, All remain within the scope of this new patent.
1‧‧‧基板1‧‧‧Substrate
11‧‧‧折痕11‧‧‧ crease
12‧‧‧晶片12‧‧‧ wafer
13‧‧‧電阻條13‧‧‧Resistance strip
2‧‧‧基板2‧‧‧Substrate
21‧‧‧電阻條21‧‧‧Resistance strip
3‧‧‧傳送裝置3‧‧‧Transfer device
31‧‧‧傳送輪31‧‧‧Transport wheel
311‧‧‧嵌槽311‧‧‧ slotted
4‧‧‧剝離裝置4‧‧‧ peeling device
5‧‧‧收集裝置5‧‧‧Collection device
51‧‧‧載座51‧‧‧Hosting
511‧‧‧樞設元件511‧‧‧ pivoting components
512‧‧‧固定座512‧‧‧ fixed seat
513‧‧‧操作區間513‧‧‧Operation interval
52‧‧‧取料機構52‧‧‧Reclaiming agency
521‧‧‧固定座521‧‧‧ Fixed seat
522‧‧‧滑塊522‧‧‧ Slider
523‧‧‧滑座523‧‧‧Slide
524‧‧‧感應部524‧‧‧Induction Department
525‧‧‧第一感測元件525‧‧‧First sensing element
526‧‧‧第二感測元件526‧‧‧Second sensing element
527‧‧‧連接件527‧‧‧Connecting parts
528‧‧‧取出件528‧‧‧Remove parts
529‧‧‧第二操作區間529‧‧‧Second operating interval
530‧‧‧取料臂530‧‧‧Retracting arm
531‧‧‧扣槽531‧‧‧ buckle groove
54‧‧‧置料機構54‧‧‧Feeding agency
541‧‧‧固定座541‧‧‧ Fixed seat
542‧‧‧滑塊542‧‧‧ Slider
543‧‧‧滑座543‧‧ ‧ slide
544‧‧‧感應部544‧‧‧Induction Department
545‧‧‧第三感測元件545‧‧‧ Third sensing element
546‧‧‧第四感測元件546‧‧‧ Fourth sensing element
547‧‧‧連接件547‧‧‧Connecting parts
548‧‧‧置放座548‧‧‧Places
549‧‧‧吸針549‧‧ ‧needle
550‧‧‧固定件550‧‧‧Fixed parts
551‧‧‧擋抵部551‧‧‧Abutment
552‧‧‧擋抵件552‧‧‧Parts
6‧‧‧堆疊裝置6‧‧‧Stacking device
61‧‧‧料框61‧‧‧ ‧ frame
第一圖係一般晶片電阻的剝折前的構造示意圖。The first figure is a schematic diagram of the structure of the general wafer resistor before stripping.
第二圖係一般晶片電阻所剝折出的電阻條示意圖。The second figure is a schematic diagram of the strip of resistance stripped by the general chip resistor.
第三圖係本新型實施例的晶片剝折及堆疊的製程關係圖。The third figure is a process relationship diagram of wafer stripping and stacking of the novel embodiment.
第四圖係本新型實施例的晶片剝折製程中,晶片電阻基板推入傳送裝置嵌槽的放大示意圖。The fourth figure is an enlarged schematic view of the wafer resistor substrate being pushed into the groove of the transfer device in the wafer stripping process of the novel embodiment.
第五圖係本新型實施例的晶片剝折製程中,晶片電阻基板進行剝折的操作示意圖。The fifth figure is a schematic view of the operation of stripping the chip resistor substrate in the wafer stripping process of the novel embodiment.
第六圖係本新型實施例的晶片剝折製程中,剝折出的電阻條受傳送裝置移送至本新型收集裝置的製程示意圖。The sixth figure is a schematic diagram of the process of transferring the stripped resistive strip to the novel collecting device by the conveying device in the wafer stripping process of the novel embodiment.
第七圖係本新型實施例立體構造示意圖。The seventh figure is a schematic view of the three-dimensional structure of the novel embodiment.
第八圖係本新型實施例中載座構造示意圖。The eighth figure is a schematic view of the structure of the carrier in the novel embodiment.
第九圖係本新型實施例中取料機構立體示意圖。The ninth drawing is a perspective view of the reclaiming mechanism in the new embodiment.
第十圖係第九圖本新型實施例A部位構造的放大示意圖。Figure 10 is an enlarged schematic view showing the structure of the portion A of the novel embodiment of the ninth embodiment.
第十一圖係本新型實施例中置料機構的立體構造示意 圖。The eleventh figure is a three-dimensional structure of the feeding mechanism in the novel embodiment Figure.
第十二圖係本新型實施例中配合堆疊裝置中料框的構造示意圖。The twelfth figure is a schematic view showing the structure of the material frame in the stacking device in the novel embodiment.
第十三圖係本新型實施例中取料機構取料臂前伸取料的構造示意圖。The thirteenth drawing is a schematic structural view of the take-up arm of the take-up arm of the take-up mechanism in the novel embodiment.
第十四圖係本新型實施例中取料機構取料臂取料後,退回時,受置料機構擋抵件的擋抵部所擋抵的構造示意圖。The fourteenth figure is a structural diagram of the retaining mechanism of the take-off mechanism of the take-off mechanism of the pick-up mechanism after the take-up arm of the present invention is retracted.
第十五圖係本新型實施例中置料機構吸針吸附電阻條後,取料機構取料臂前移進行下一次取料的構造示意圖。The fifteenth figure is a structural schematic diagram of the take-up arm of the take-up mechanism moving forward for the next take-up after the suction mechanism of the feeding mechanism sucks the resistance strip in the new embodiment.
第十六圖係本新型實施例中置料機構吸針將吸附的電阻條置入料框的構造示意圖。The sixteenth figure is a schematic structural view of the feeding mechanism of the feeding mechanism of the feeding mechanism for placing the adsorbed electric resistance strip into the material frame.
5‧‧‧收集裝置5‧‧‧Collection device
51‧‧‧載座51‧‧‧Hosting
52‧‧‧取料機構52‧‧‧Reclaiming agency
54‧‧‧置料機構54‧‧‧Feeding agency
Claims (10)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220338868 CN202839559U (en) | 2012-07-13 | 2012-07-13 | Chip collecting device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWM445761U true TWM445761U (en) | 2013-01-21 |
Family
ID=47951201
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW101217053U TWM445761U (en) | 2012-07-13 | 2012-09-05 | Chip pickup device |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN202839559U (en) |
| TW (1) | TWM445761U (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI700760B (en) * | 2018-10-23 | 2020-08-01 | 萬潤科技股份有限公司 | Feeding method and device for chip peeling process |
| TWI675426B (en) * | 2018-10-23 | 2019-10-21 | 萬潤科技股份有限公司 | Method and device for positioning wafer stripping process |
| TWI683383B (en) * | 2018-10-23 | 2020-01-21 | 萬潤科技股份有限公司 | Pushing method and mechanism of wafer stripping process and equipment using the mechanism |
-
2012
- 2012-07-13 CN CN 201220338868 patent/CN202839559U/en not_active Expired - Fee Related
- 2012-09-05 TW TW101217053U patent/TWM445761U/en not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| CN202839559U (en) | 2013-03-27 |
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