M443168 五、新型說明： 【新型所屬之技術領域】 本新型是有關於-種取像系統，特別是指一種進行光 學檢測的取像系統。 【先前技術】 參閱圖1，影像檢測裝置是用來對—待測物92的一待 測表面T1進行影像檢測。—般檢測裝置的一影像棟取單元 91 ’檢㈣是對位於該制表面T1 ’並沿—光學卿進行 取像。該影像操取單元91包含垂直該光學轴N1且沿該光學 軸N1間隔排列的一鏡頭透鏡911及一例如或感 光面板912。由於該光學軸N1與該待測表面丁丨的法線见的 夾角為零時，無法觀測到例如刮痕或是液晶面板的水波紋 等現象，因此業者通常使該光學軸N1與該待測表面耵的法 線N2夾一角度，藉此，得以觀測到如刮痕或液晶面板的水 波紋等現象。 然而’當該待測表面T1與該鏡頭透鏡9U爽一角度， 成像面T2亦會與感光面板912夾一角度而非重疊，也就是 會有一部分光線聚焦於該感光面板912上而清楚成像， 而大部分光線聚焦於該感光面板912前方或後方，導致成 像模糊。 【新型内容】 因此’本新型之目的，即在提供一種傾斜取像而可清 楚成像的取像系統。 於是’本新型取像系統，適用於對一待測物的一待測 3 M443168 面進行取像，包含一鏡頭透鏡及一感光面板。 該鏡頭透鏡平行該待測面，具有一光學中心。 該感光面板偏移地平行間隔排列於該鏡頭透鏡遠離該 待測面的一側，具有一面板中心。 定義一通過該光學中心及該面板中心的轴線，該轴線 通過該待測面且與一垂直該待測面的法線夾一非零的角度 ，多條光線分別自該待測面經該鏡頭透鏡在該感光面板上 聚焦’形成一與該感光面板重疊的成像面。 較佳地，該感光面板包括一面掃瞄感光元件。 較佳地，該感光面板包括一多重線掃瞄感光元件。 本新型之功效在於：該光學中心及該面板中心的軸線 與該待測面的法線夾一非零的角度而能傾斜取像，且來自 該待測面的多條光線分別經該鏡頭透鏡在該感光面板上聚 焦，形成一與該感光面板重疊的成像面而能清楚成像。 【實施方式】 有關本新型之前述及其他技術内容、特點與功效，在 以下配合參考圖式之一個較佳實施例的詳細說明中，將可 清楚地呈現。 參閱圖2，本新型取像系統之一較佳實施例，適用於 對一待測物3的待測面S1進行取像，包含一鏡頭透鏡1及 一感光面板2。待測物3例如為一液晶面板，由於可能存 在刮痕或水波紋等缺陷，因此出廠前利用本新型取像系統 擷取清楚的影像後，有利於提高後續影像檢測的準確率。 該待測面S1可以為被其他光源照射而發光的被動發光面， 4 也可以是自行發光的主動發光面。 該鏡頭透鏡1平行該待測面S1，具有一光學中心P1。 S亥感光面板2偏移地平行間隔排列於該鏡頭透鏡1遠 離該待測面S1的一側，具有—面板令心p2。 定義一通過該光學中心P1及該面板中心p2的軸線L1， 該軸線L1通過該待測面S1且與一垂直該待測面S1的法線L2 夾一非零的角度。該角度可容許的大小與該鏡頭透鏡i的 成像範圍、感光面板2的面積有關，在本實施例中，該角 度約為10度’但實際上可能需再視整體設備參數加以調適 〇 由於該鏡頭透鏡1 '該感光面板2都是平行該待測面 S1 ;因此自該待測面S1發出的多條光線分別經該鏡頭透鏡 1折射後’能夠都在該感光面板2上聚焦，形成一與該感 光面板2重疊的成像面S2。 在本實施例中’該感光面板2包括一面掃晦感光元件 ’在另一實施態樣中，也可以是包括一多重線掃瞄（TDI， Time delay integration)感光元件。使用面掃瞄或是多重線掃瞒 的原因是在於，當發光面光能量不足時，使用面掃瞄或者 多重線掃瞄可一次使用多排的光電二極體進行感光作用， 而在一次曝光時間下，累積多排光電二極體的光量，轉換 成電荷訊號之後再傳輸出去，累積的亮度較一般線掃猫系 統來得高。但此類系統的成像需要該成像面S2與該感光面 板2重疊，因此結合於本新型之設計，其優勢得以發揮。 綜上所述，該光學中心P1及該面板中心P2的轴線L1與 M443168 該待測面S1的法線L2夾一非零的角度而能傾斜取像，且來 自該待測面S1的多條光線分別經該鏡頭透鏡丨在該感光面 板2上聚焦，形成一與該感光面板2重疊的成像面幻而能 清楚成像，故媒實能達成本新型之目的。 惟以上所述者，僅為本新型之較佳實施例而已，當不 月&以此限定本新型實施之範圍，即大凡依本新型申請專利 範圍及新型說明内容所作之簡單的等效變化與修飾，皆仍 屬本新型專利涵蓋之範圍内。 【圖式簡單說明】 圖1是一系統配置示意圖，說明先前技術的一種影像 操取單元；及 圖2是一系統配置示意圖，說明本新型取像系統的一 較佳實施例。 M443168 【主要元件符號說明】 1 ..........鏡頭透鏡 s 1.........待測面 2 ..........感光面板 S2.........成像面 L1 ........轴線 P1.........光學中心 L2 ........法線 P2.........面板中心M443168 V. New description: [New technology field] The new type is related to the image acquisition system, especially the image acquisition system for optical inspection. [Prior Art] Referring to Fig. 1, an image detecting device is used for image detection of a surface T1 to be tested 92. An image capturing unit 91 of the general detecting device is used to take images from the surface T1' and along the optical film. The image capturing unit 91 includes a lens lens 911 and a light sensor panel 912 that are perpendicular to the optical axis N1 and spaced along the optical axis N1. Since the angle between the optical axis N1 and the normal of the surface to be tested is zero, such as scratches or water ripples of the liquid crystal panel, etc., the operator usually makes the optical axis N1 and the to-be-tested. The normal line N2 of the surface flaw is angled, whereby phenomena such as scratches or water ripples of the liquid crystal panel can be observed. However, when the surface T1 to be tested is at an angle to the lens lens 9U, the imaging surface T2 is also angled with the photosensitive panel 912 instead of overlapping, that is, a portion of the light is focused on the photosensitive panel 912 for clear imaging. Most of the light is focused in front of or behind the photosensitive panel 912, resulting in blurred imaging. [New content] Therefore, the object of the present invention is to provide an image capturing system capable of clearly imaging by oblique image acquisition. Therefore, the novel image capturing system is adapted to image a 3 M443168 surface to be tested, including a lens lens and a photosensitive panel. The lens lens is parallel to the surface to be tested and has an optical center. The photosensitive panels are arranged offset in parallel at a side of the lens lens away from the surface to be tested, and have a panel center. Defining an axis passing through the optical center and the center of the panel, the axis passing through the surface to be tested and being at a non-zero angle with a normal line perpendicular to the surface to be tested, and a plurality of rays respectively from the surface to be tested The lens lens is focused on the photosensitive panel to form an imaging surface that overlaps the photosensitive panel. Preferably, the photosensitive panel comprises a scanning photosensitive element on one side. Preferably, the photosensitive panel comprises a multi-line scanning photosensitive element. The effect of the present invention is that the optical center and the axis of the center of the panel and the normal of the surface to be tested are clipped at a non-zero angle, and a plurality of rays from the surface to be tested are respectively passed through the lens lens. Focusing on the photosensitive panel forms an imaging surface overlapping the photosensitive panel for clear imaging. The above and other technical contents, features and effects of the present invention will be apparent from the following detailed description of the preferred embodiments. Referring to FIG. 2, a preferred embodiment of the present imaging system is adapted to image a surface S1 of a test object 3, including a lens lens 1 and a photosensitive panel 2. The object to be tested 3 is, for example, a liquid crystal panel. Since there may be defects such as scratches or water ripples, it is advantageous to improve the accuracy of subsequent image detection by using the novel image capturing system to obtain a clear image before leaving the factory. The surface to be tested S1 may be a passive light-emitting surface that is illuminated by other light sources, and may also be an active light-emitting surface that emits light by itself. The lens lens 1 is parallel to the surface to be tested S1 and has an optical center P1. The S-light-sensing panels 2 are arranged offset in parallel at intervals on the side of the lens lens 1 remote from the surface to be tested S1, and have a panel center of mind p2. An axis L1 passing through the optical center P1 and the panel center p2 is defined. The axis L1 passes through the surface to be tested S1 and is at a non-zero angle with a normal L2 perpendicular to the surface S1 to be tested. The allowable size of the angle is related to the imaging range of the lens lens i and the area of the photosensitive panel 2. In the present embodiment, the angle is about 10 degrees, but in practice, it may be necessary to adjust the overall device parameters. The lens panel 1 'the photosensitive panel 2 is parallel to the surface to be tested S1; therefore, a plurality of light rays emitted from the surface to be tested S1 are respectively refracted by the lens lens 1 and can be focused on the photosensitive panel 2 to form a An imaging surface S2 that overlaps the photosensitive panel 2. In the present embodiment, the photosensitive panel 2 includes a broom photosensitive member. In another embodiment, a photosensitive element of a time delay integration (TDI) may be included. The reason for using a face scan or a multi-wire broom is that when the light energy of the light-emitting surface is insufficient, the surface scan or the multi-line scan can be used to perform photo-sensing using multiple rows of photodiodes at one time, while in one exposure. Under the time, the amount of light of the multi-row photodiode is accumulated, converted into a charge signal and then transmitted, and the accumulated brightness is higher than that of the general line sweeping cat system. However, the imaging of such a system requires the imaging surface S2 to overlap the photosensitive panel 2, so that the advantages of this type of design are combined with the design of the present invention. In summary, the optical center P1 and the axis L1 of the panel center P2 and the normal line L2 of the surface S1 of the panel S1 are at a non-zero angle, and can be obliquely taken, and the number of the surface to be tested S1 is large. The strips of light are respectively focused on the photosensitive panel 2 through the lens lens to form an imaging surface overlapping the photosensitive panel 2, and can be clearly imaged, so that the medium can achieve the purpose of the novel. However, the above description is only a preferred embodiment of the present invention, and the scope of the present invention is limited by the use of the present invention, that is, the simple equivalent change of the patent application scope and the new description content of the present invention. And modifications are still within the scope of this new patent. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a schematic diagram of a system configuration illustrating an image manipulation unit of the prior art; and FIG. 2 is a schematic diagram of a system configuration illustrating a preferred embodiment of the novel image capture system. M443168 [Description of main component symbols] 1 .......... Lens lens s 1.........Determination surface 2 ..........Photosensitive panel S2.. .......imaging plane L1 ........axis P1.........optical center L2 ........normal line P2... ...panel center