TWM414585U - Automated array chip detection device - Google Patents

Automated array chip detection device Download PDF

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Publication number
TWM414585U
TWM414585U TW100208021U TW100208021U TWM414585U TW M414585 U TWM414585 U TW M414585U TW 100208021 U TW100208021 U TW 100208021U TW 100208021 U TW100208021 U TW 100208021U TW M414585 U TWM414585 U TW M414585U
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TW
Taiwan
Prior art keywords
unit
housing
array wafer
array
wafer inspection
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TW100208021U
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Chinese (zh)
Inventor
Xiu-Ru Lin
Hui-Ren Zhang
Si-Kai Xiong
Chang-Han Wu
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Fooyin University Hospital
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Application filed by Fooyin University Hospital filed Critical Fooyin University Hospital
Priority to TW100208021U priority Critical patent/TWM414585U/en
Publication of TWM414585U publication Critical patent/TWM414585U/en
Priority to CN2012100335129A priority patent/CN102768285A/en

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M4M585 五、新型說明: 【新型所屬之技術領域】 本創作是有關於一種自動化陣列晶片檢測裝置,尤指一種 可以自動化機構進行待測物之處理及陣列晶片之反應操作,而 達到快速檢測以及精準度高之功效者。 【先前技術】 按,-般於傳統分子生物檢測分析流程中,生物臨床待測 物之前處理與濃鮮取之辦斜分重要的操作步驟。於傳统 醫學應職财,基雜的實驗技術,諸如臨床待測物前處 理、去氧核糖核酸(de〇Xyrib〇nucleic acid,DNA)以及核糖核酸 (nbonudeicacKl’RNA)之萃取與純化尤其不易,往往浪費許多 的時間’且其繁複的人工操作與步驟更料增加制物之損耗 與檢測之車禮W。M4M585 V. New description: [New technology field] This creation is about an automatic array wafer inspection device, especially an automatic mechanism for processing the object to be tested and the reaction operation of the array wafer to achieve rapid detection and precision. A person with a high degree of efficacy. [Prior Art] According to the traditional molecular bioassay analysis process, the biological clinical test object is processed and concentrated. It is especially difficult to extract and purify traditional medical applications, such as clinical analyte pretreatment, de〇Xyrib〇nucleic acid (DNA), and ribonucleic acid (nbonudeicac Kl'RNA). It is often a waste of time' and its complicated manual operations and steps are more likely to increase the loss of the product and the inspection of the car.

【新型内容】 本=之主要目的係在於,Μ自統機構之方式進行待 曰之則处理’包含裂解、分離、純化萃取及標定,及與陣列 =片之作’與反應完成並崎後之影賴取及數據分析 寺’而達職速制以及精準度高之功效。 边之目的’本創作係_種自動化陣列晶片檢測裝 =ST有第—、二及第三置放單元之殼體; 前= 承載機構,其端面至少設有-待測物 处品,.,屯化萃取區、—反轉錄及標定反應區及-陣列晶 M4t4585 操取機構;以及-設於殼體-面上且與承频構、致動機構、 片反應及顯像區;一設於殼體中且與承載機構連接之致動機 構;一設於殼體中且與承載機構連接之溫控機構;一設於第二 置放單元中之試劑存放機構’其包含有多數試劑置放區、及一 磁珠置放區;一設於殼體中之抽取機構;一設於第三置放單元 中之廢液姐機構-設於㈣t且躲賴構連接之磁場押 織構;-設綠ϋ中且與陣列晶片反應及顯像區對應之景^ 磁場控制機構及影像擷 溫控機構、試劑存放機構、抽取機構、 取機構連接之操作機構 於本創作之一實施例中,該殼體中係可設有與第一、二、 三置放單元及操作機構連接之感應馬達。 ^ 一 於本創作之一 有(I車一 ” 實施例中’辦列晶肢應及崎區中係設[New content] The main purpose of this = is that the processing of the self-contained organization is to be processed, including the cracking, separation, purification, extraction and calibration, and the array and the film's work and the reaction is completed. It relies on the data and analysis of the temple's to achieve the effect of high speed and high precision. The purpose of the side 'this creation department _ kind of automatic array wafer inspection equipment = ST has the first, second and third placement unit housing; front = bearing mechanism, the end face of at least - the object to be tested,. Deuteration extraction zone, - reverse transcription and calibration reaction zone and - array crystal M4t4585 operation mechanism; and - on the shell-surface and with the carrier structure, actuation mechanism, sheet reaction and imaging area; An actuating mechanism in the housing and connected to the carrying mechanism; a temperature control mechanism disposed in the housing and connected to the carrying mechanism; and a reagent storing mechanism disposed in the second placing unit, which includes a plurality of reagents a zone, and a magnetic bead placement zone; an extraction mechanism disposed in the housing; a waste liquid sister mechanism disposed in the third placement unit - a magnetic field texture disposed at (4) t and escaping; An embodiment of the present invention is an embodiment in which the green magnetic field and the array wafer reaction and the imaging area correspond to the magnetic field control mechanism, the image temperature control mechanism, the reagent storage mechanism, the extraction mechanism, and the extraction mechanism are The housing can be provided with the first, second and third placing units and the operating machine The induction motor is connected. ^ One of the creations of this one (I car one) in the example of the implementation of the crystal limbs should be in the area

於本創作之一實施例中, 該致動機構係可為伺服馬達。 該抽取機構係可為真空吸引器。 該影像擷取機構係可為感光元 於本創作之一實施例中, 疋、一與處理單元連接之輸入單元 程式邏輯陣列。 於本創作之一實施例中,該 於本創作之一實施例中,該 出單元。 於本創作之一實施例中, ,。該操作機構係包含有一處理單 潭元'及-與處理單元連接之輸 該處理單綠可騎^或為可 該輸入單元係可為多數按鍵。 該輸出單元係可為顯示幕。 【實施方式】 請參閱『第1、2、3、4及第5圖』所示,係分別為本 創作之立體外觀圖、本創作之立體分解圖本創作之基本架構方 塊圖、本創作之方塊示意圖及本創作承載機構之示意圖。如圖 所不:本創作係一種自動化陣列晶片檢測裝置,豆 殼體1 0、承載機構1、致動機構2、溫賴構3、試劑存放 機構4、娜機構5、廢液存放機構9、磁場控賴構6、影 像擷取機構7及操作機構8所構成。 — 和队分负乐一置放單元10 。弟可=riQ21三纽單元1Q3,該殼體10 中係1%又有與弟一、二、三置放單元1〇1、丄 及操作機構8連接之感應馬達1〇 4。 該承載機構1係設於第一置放單元丄〇丄中盆端面至少 設有一待測物前處理區1卜一純化萃取區1 2、二反㈣及 標定反應區13及一陣列晶片反應及顯像區14,传 待測物檢測時之盛放及反應操作平台,且 ^ = 像區14中係設有陣列式晶片141,而各晶片;日:== 有多數生物探針,待測物與陣列式晶片工4丄 ^ 反應方式可為化學酵素呈色’—此為限 —連接,用 2係可細㈣達,但不以此為限。Μ痛,而該致動機構 該溫控機構3係設於殼體1〇令且 以於檢測過程中對承載機構1進行溫紅控=構1連接,用 M414585 泫試劑存放機構4係設於第二置放單元丄〇 2中,其包含 有多數試鮮放d4 1、及1珠置舰42,係提供制物 於反應時所需之試劑。 該抽取機構5係設聽體工〇中,可取用所需之試劑於承 載機構1上’及待測物於承載機構中各區之傳送,及待測物完 成反應後所產生廢液之排放,而該抽取機構5係可為真空吸引 器,但不以此為限。 該廢液存放機構9係設於第三置放單元^ 3中。 該磁場控制機構6係設於殼體i 〇中且與承載機構丄連 接’可配合磁珠置放區4 2内之磁珠對制物進行純化萃取。 該影像娜機構7係設於殼體! 〇中且與陣列晶片反應 及顯像區1 4對應,可娜御彳物辨列^進行反應及顯像 後所產生之影像,而該影像触機構7係可域光元件,但不 以此為限。 該操作機構8係設於殼體χ 〇之一面上且與承載機構 1、致動機構2、溫控機構3、試劑存放機構4、抽取機構5、 磁場控制機構6及影像操取機構7連接,可料各機構運作時 之控制、反應影像分析及數據顯示,而操作機構8係包含有一 處理單元81、一與處理單元8 χ連接之輸入單元82'及一 與處理單元8 1連接之輸出單元8 3,其巾該處理單元8 1係 可為單晶片或為可程式邏輯陣列’該輸入單元8 2係可為多數 按鍵’該輸出單元8 3係可為顯示幕。如是,ϋ由上述之二構 構成一全新之自動化陣列晶片檢測裝置。 當本創作於檢測分析時,至少包含有下列步驟: 一'以手動或操作機構8配合感應馬達1〇 4之方式移出 6 第二置放單元1 Q 1,且將承顧構i設於第—置 ==測物一)輸送至承載機構1之待測物前 處理£ 1 1中亚时注人裂解處理溶液,之後將第—置 U1收容於殼體10中’錢過溫⑽__彳物前處理 1進仃加熱至35C〜8(rc,且賴取機構5於第二置放 單儿1 0 2巾所設試肺放機構4之磁珠置魏4 2中將磁 珠及分離純化所需試鑛送至待曝祕繩丨丨,再由致動 機構2以100〜20_搖動該承载機構丄,使上述之待測物、 磁珠及反應觸進行混合,贿磁珠有魏行與彳铜物之接合 作用。 、二、將酬物祕理區11中之完錢合之制物及磁珠 以抽取機構5傳送至純化萃取區^ 2巾,並由磁場控制機構6 ,附磁珠’而將待測物力口以純化,此時再以抽取機構5將純化 萃取區1 2巾之不含磁珠之上清液去除,並將廢液儲放於第三 置放單元1〇 3中之廢液存放機構9内。 二、再以抽取機構5於試劑置放區4 i中吸取反應溶液加 入純化萃取區1 2巾,同時關閉磁場控賴構6使磁珠懸浮, 且由致動機構2以1〇〇〜2〇〇φπ1搖動該承賴構i,使磁珠與 反應浴液充分混合,讓待測物與磁珠分離,而釋出待測生物分 子0 四、之後將純化萃取區12中含有待測生物分子之溶液以 抽取機構5傳送反轉錄及標定反應區1 3中,另外再以抽取機 構b於試劑置放區41中吸取反應溶液於反轉錄及標定反應 區1 3中且由致動機構2以1〇〇〜2〇〇rpm搖動該承載機構 1 ’且由溫控機構3對反轉錄及標定反應區1 3加熱至35。〇 M414585 〜80 C,藉以完成待測生物分子之反轉錄及標記物標定反應。 五、 將反轉錄及標定反應區1 3中完成反轉錄及標定後之 待測生物分子以柚取機構5傳送至陣列晶片反應及顯像區丄 4中進行反應’以抽取機構5於試劑置放區4 1中吸取多數反 應溶液於陣列晶片反應及顯像區丄4中,且由致動機構2以 100〜200rpm搖動該承載機構丄,且由溫控機構3對陣列晶片 反應及顯像區1 4加熱至35。(:〜8G°C,藉以由陣列式晶片丄 4 1上之生物探針作專一性結合,再與所需之反應試劑進行顯 像反應。 六、 再由影像擷取機構7對陣列晶片反應及顯像區i 4擷 取待測生物分子與㈣式晶片i 4丨所具有之生物探針進行 結合反應並顯像後產生之影像’並由操作機構8之輸入單元8 2與輸出單元8 3配合處理單元8 i進行影像之判讀或相關 之傳輸及顯示,而可由影像操取機構7所操取之影像,並進行 分析判別,即完成待測物中特定生物分子之檢測。 如是,可藉由本創作之各機構配合上述之步驟達成全程自 動化檢測操作之目的,減少傳統人為操作實驗所可能產生之誤 是,有效建立標準操作流程,且可有效加速各種反應之進行i 而有助於縮短檢測時間。 上所述本創作自動化陣列晶片檢測裝置可有效改善習 用之種種缺點’可以自動化機構進行制物之檢測操作,而達 =快速檢測以及精準度高之功效,_使本創作之産生能更進 二、更實用、更符合消費者㈣之所須,確已符合創作專 。月之要件,爰依法提出專利申請。 准以上所述者,僅為本創作之較佳實施例而已當不能以In one embodiment of the present invention, the actuation mechanism can be a servo motor. The extraction mechanism can be a vacuum aspirator. The image capturing mechanism can be a photosensitive element in an embodiment of the present invention, and an input unit program logic array connected to the processing unit. In one embodiment of the present author, in one embodiment of the present author, the unit is out. In one embodiment of the present creation, . The operating mechanism includes a processing unit and a connection to the processing unit. The processing unit can be a green button or the input unit can be a plurality of buttons. The output unit can be a display screen. [Embodiment] Please refer to the "1st, 2nd, 3rd, 4th, and 5th drawings", which are the basic architectural block diagrams of the three-dimensional external drawing of the creation and the three-dimensional exploded drawing of the creation. A block diagram and a schematic diagram of the authoring mechanism. As shown in the figure: the present invention is an automatic array wafer detecting device, a bean casing 10, a carrying mechanism 1, an actuating mechanism 2, a temperature absorbing structure 3, a reagent storing mechanism 4, a Na mechanism 5, a waste liquid storage mechanism 9, The magnetic field control structure 6, the image capturing mechanism 7 and the operating mechanism 8 are formed. — Place the unit 10 with the team. The brother can = riQ21 three-unit unit 1Q3, and the casing 10 is 1% and has an induction motor 1〇4 connected to the first, second and third placement units 1〇1, 丄 and the operating mechanism 8. The bearing mechanism 1 is disposed in the first placement unit, wherein the end surface of the basin is provided with at least one sample pretreatment area 1 , a purification extraction zone 1 2 , a second anti ( 4 ) and a calibration reaction zone 13 and an array of wafer reactions and The imaging area 14 transmits the imaging and reaction operation platform when the object is detected, and the image area 14 is provided with the array wafer 141, and each wafer; day: == has many biological probes, to be tested The reaction mode of the object and the array type wafer processor can be a chemical enzyme coloring - this is a limit - connection, and the 2 series can be fine (four) up, but not limited thereto. The operating mechanism 3 is provided in the housing 1 and is configured to perform a temperature red control on the carrier mechanism 1 during the detection process, and the M414585 泫 reagent storage mechanism 4 is The second placement unit 丄〇2 includes a plurality of fresh-keeping d4 1 and a bead-mounted ship 42 to provide a reagent required for the reaction. The extraction mechanism 5 is configured to receive the required reagents on the carrier mechanism 1 and the transmission of the object to be tested in each zone of the carrier mechanism, and the discharge of the waste liquid generated after the reaction of the object to be tested is completed. The extraction mechanism 5 can be a vacuum aspirator, but is not limited thereto. The waste liquid storage mechanism 9 is provided in the third placement unit ^3. The magnetic field control mechanism 6 is disposed in the housing i 且 and is coupled to the carrier mechanism ’. The magnetic beads in the magnetic bead placement area 42 can be used to purify and extract the product. The image of the Na body 7 system is set in the shell! In the middle of the ridge and corresponding to the array wafer reaction and the imaging area 14 , the image can be detected and imaged after the image is generated, and the image sensing mechanism 7 is a domain light component, but not Limited. The operating mechanism 8 is disposed on one surface of the casing 且 and is connected to the carrying mechanism 1, the actuating mechanism 2, the temperature control mechanism 3, the reagent storage mechanism 4, the extracting mechanism 5, the magnetic field control mechanism 6, and the image manipulation mechanism 7. The operation mechanism 8 can include control, reaction image analysis and data display, and the operating mechanism 8 includes a processing unit 81, an input unit 82 ′ connected to the processing unit 8 , and an output connected to the processing unit 8 1 . Unit 8 3, the processing unit 8 1 may be a single chip or a programmable logic array 'The input unit 8 2 may be a plurality of buttons'. The output unit 8 3 may be a display screen. If so, a new automated array wafer inspection device is constructed from the above two configurations. When the creation is in the detection analysis, at least the following steps are included: 1. The manual placement or operation mechanism 8 cooperates with the induction motor 1〇4 to remove the second placement unit 1 Q 1, and the construction unit is set to - Set = = Measurement 1) Pre-treatment of the analyte to be transported to the support mechanism 1 £ 1 1 When the medium is injected into the cracking treatment solution, then the first set U1 is housed in the housing 10 'money over temperature (10) __彳The pretreatment of the material is heated to 35C~8 (rc, and the magnetic mechanism is separated by the magnetic bead placed in the test tube 5 in the second placement unit 1 0 2 towel. The test mixture required for purification is sent to the rope to be exposed, and then the actuating mechanism 2 shakes the carrier mechanism by 100~20_, so that the above-mentioned object to be tested, the magnetic beads and the reaction touch are mixed, and the magnetic beads are The bonding effect between Wei Xing and the bismuth copper material. 2. The material and magnetic beads of the money in the secret area 11 are transferred to the purification extraction zone 2 by the extraction mechanism 5, and the magnetic field control mechanism 6 , the magnetic beads are attached to the object to be tested for purification. At this time, the supernatant of the purified extraction zone is removed by the extraction mechanism 5, and the waste liquid is removed. Placed in the waste liquid storage mechanism 9 in the third placement unit 1〇3. Second, the extraction mechanism 5 is used to take the reaction solution into the purification extraction zone 1 2 towel, and the magnetic field control is turned off. The structure 6 suspends the magnetic beads, and the actuating mechanism 2 shakes the support structure i at a frequency of 1 〇〇 2 〇〇 φπ1 to sufficiently mix the magnetic beads with the reaction bath to separate the object to be tested from the magnetic beads. The biomolecule to be tested is taken out. 4. After that, the solution containing the biomolecule to be tested in the extraction zone 12 is purified to be sent to the reverse transcription and calibration reaction zone 13 by the extraction mechanism 5, and further to the reagent placement zone 41 by the extraction mechanism b. The reaction solution is aspirated in the reverse transcription and calibration reaction zone 13 and the carrier mechanism 1' is shaken by the actuation mechanism 2 at 1 〇〇 to 2 rpm and the reverse transcription and calibration reaction zone 13 is heated by the temperature control mechanism 3. To 35. 〇M414585 ~ 80 C, in order to complete the reverse transcription of the biomolecule to be tested and the labeling reaction of the label. V. The reverse transcription and calibration reaction zone 13 complete the reverse transcription and calibration of the biomolecule to be tested Mechanism 5 is transferred to the array wafer reaction and development zone 丄4 for reaction 'Using the extraction mechanism 5 to take most of the reaction solution into the array wafer reaction and development zone 4 in the reagent placement area 41, and the carrier mechanism is shaken by the actuation mechanism 2 at 100 to 200 rpm, and the temperature control mechanism is 3 pairs of array wafer reaction and development zone 14 heated to 35. (: ~ 8G ° C, whereby the bioprobe on the array wafer 丄 4 1 is specifically combined, and then the desired reagent is used for imaging 6. The image is obtained by the image capturing mechanism 7 on the array wafer reaction and the imaging area i 4 and the biological probe of the (4) wafer i 4 进行 is combined and developed. And the input unit 8 2 and the output unit 8 3 of the operating mechanism 8 cooperate with the processing unit 8 i to perform image interpretation or related transmission and display, and the image captured by the image manipulation mechanism 7 can be analyzed and determined. That is, the detection of specific biomolecules in the test object is completed. If so, the various agencies of the author can cooperate with the above steps to achieve the purpose of the whole process of automatic testing, reduce the mistakes that may be caused by the traditional human operation experiment, effectively establish a standard operation process, and effectively accelerate the various reactions. Helps reduce inspection time. The above-mentioned creative automatic array wafer detecting device can effectively improve various shortcomings of the conventional use, and the automated detection mechanism can be used for the detection operation of the manufacturing object, and the effect of the high-speed detection and the high precision can make the creation of the creation more advanced. It is more practical and more in line with the needs of consumers (4). It has indeed met the creative profession. The requirements of the month, 提出 file a patent application according to law. The above-mentioned ones are only for the preferred embodiment of the present invention.

M4MD0J M4MD0J 皆應仍屬本創作 專利涵蓋之範圍内 【圖式簡單說明】 第1圖’係本創作之立體外觀圖。 第2圖’係本創作之立體分解圖。 第3圖’係本解之基核構方塊圖。 第4圖’係本創作之方塊示意圖。 第5圖,係本創作承載機構之示意圖。 【主要元件符號說明】 承載機構1 殼體1 0 第一置放單元1〇1 第二置放單元1〇 2 第三置放單元1〇 3 感應馬達1〇 4 待測物前處理區11 純化萃取區12 反轉錄及標定反應區13 陣列晶片反應及顯像區14 陣列式晶片14 1 致動機構2 溫控機構3 M414585 試劑存放機構4 試劑置放區41 磁珠置放區4 2 抽取機構5 磁場控制機構6 影像擷取機構7 操作機構8 處理單元81 輸入單元8 2 輸出單元8 3 廢液存放機構9M4MD0J M4MD0J should still be within the scope of this creation patent [Simplified illustration] Figure 1 is a three-dimensional appearance of the creation. Figure 2 is an exploded view of the creation. Figure 3 is a block diagram of the basic structure of the present solution. Figure 4 is a block diagram of the creation. Figure 5 is a schematic diagram of the creative carrying mechanism. [Main component symbol description] Carrier mechanism 1 Housing 1 0 First placement unit 1〇1 Second placement unit 1〇2 Third placement unit 1〇3 Induction motor 1〇4 Pre-treatment area for analytes 11 Purification Extraction zone 12 Reverse transcription and calibration reaction zone 13 Array wafer reaction and imaging zone 14 Array wafer 14 1 Actuation mechanism 2 Temperature control mechanism 3 M414585 Reagent storage mechanism 4 Reagent placement area 41 Magnetic bead placement area 4 2 Extraction mechanism 5 Magnetic field control mechanism 6 Image capturing mechanism 7 Operating mechanism 8 Processing unit 81 Input unit 8 2 Output unit 8 3 Waste liquid storage mechanism 9

Claims (1)

M414585 六、申請專利範圍: 1· 一種自動化陣列晶片檢測裝置’包括有: 一殼體,係活動收容有第一置放單元、第二置放單元 及第三置放單元; 一承載機構,係設於第一置放單元中,其端面至少設 有一待測物前處理區、一純化萃取區、一反轉錄及標定反 應區及一陣列晶片反應及顯像區; 一致動機構,係設於殼體中且與承載機構連接; 一溫控機構,係設於殼體令且與承載機構連接; 一武劍存放機構,係s又於弟二置放單元中’其包含有 多數試劑置放區、及一磁珠置放區; 一柚取機構,係設於殼體中; 一廢液存放機構,係設於第三置放單元中; 一磁場控制機構,係設於殼體中且與承載機構連接; 一影像擷取機構,係設於殼體中且與陣列晶片反應及 顯像區對應;以及 一操作機構,係設於殼體一面上且與承載機構、致動 機構、溫控機構、試劑存放機構、柚取機構、磁場控制機 構及影像擷取機構連接。 2.依申請專利範圍第i項所述之自動化陣列晶片檢測裝置,其 中,該殼體中係可設有與第-、二、三置放單元及操作機 構連接之感應馬達。 3 ·依申請專利範圍第丄項所述之自動化_晶片檢測裝置,並 中,該陣列晶片反應及顯像區中係設有陣列式晶片,而^ 晶片上係具有多數生物探針。 4·依申請專利範圍第1項所述之自動化陣列晶片檢測裝置,其 中’該玖動機構係可為伺服馬達。 6 5·依申請專利範圍第1項所述之自動化陣列晶片檢測裝 置’其_,該柚取機構係可為真空吸引器。 7 依申請專利範圍第1項所述之自動化陣列晶片檢測裝置,其 中,該影像擷取機構係可為感光元件。 8. 依申印專利fe圍第1項所述之自動化陣列晶片檢測裝置,其 中’雜作機_包含有—處理單元、—減理單元連接 之輸=平元、及一與處理單元連接之輸出單元。 9. 二申。:專利:圍* 7項所述之自動化陣列晶片檢測裝置,其 s處里單元係可為單晶片或為可程式邏輯陣列。 := 利範圍第7項所述之自動化陣列晶片檢測裝置,其 令,雜入單元係可為多數按鍵。 置,第7項所述之自動化_晶片檢測裝 置其令,雜出單元係可為顯示幕。 0M414585 VI. Patent Application Range: 1. An automated array wafer inspection device includes: a housing for housing a first placement unit, a second placement unit, and a third placement unit; The first surface of the first placement unit is provided with at least one object pretreatment area, a purification extraction area, a reverse transcription and calibration reaction area, and an array of wafer reaction and imaging areas; a casing is connected to the supporting mechanism; a temperature control mechanism is disposed on the casing and connected to the supporting mechanism; a sword storage mechanism is installed in the second unit, and includes a plurality of reagents a magnetic bead placement area; a pomelo extraction mechanism is disposed in the housing; a waste liquid storage mechanism is disposed in the third placement unit; a magnetic field control mechanism is disposed in the housing Connected to the carrying mechanism; an image capturing mechanism disposed in the housing and corresponding to the array wafer reaction and the imaging area; and an operating mechanism disposed on one side of the housing and coupled to the carrying mechanism, the actuating mechanism, and the temperature Control agency, The reagent storage mechanism, the pomelo extraction mechanism, the magnetic field control mechanism, and the image capturing mechanism are connected. 2. The automated array wafer inspection apparatus of claim i, wherein the housing is provided with an induction motor coupled to the first, second, and third placement units and the operating mechanism. 3. The automated wafer inspection apparatus according to the scope of the patent application, wherein the array wafer reaction and development zone is provided with an array wafer, and the wafer has a plurality of biological probes. 4. The automated array wafer inspection apparatus of claim 1, wherein the tumbling mechanism is a servo motor. 6 5. The automated array wafer inspection device of claim 1, wherein the pomelo extraction mechanism is a vacuum aspirator. 7. The automated array wafer inspection apparatus of claim 1, wherein the image capture mechanism is a photosensitive element. 8. The automated array wafer inspection apparatus according to the first aspect of the invention, wherein the 'miscellaneous machine_including the processing unit, the transmission unit connected to the transmission unit, and the processing unit are connected. Output unit. 9. Second application. Patent: The automatic array wafer inspection device described in item 7, wherein the unit in the s unit can be a single chip or a programmable logic array. The automatic array wafer inspection apparatus of claim 7 is characterized in that the miscellaneous unit is a plurality of buttons. The automation_wafer detecting device described in item 7 is such that the miscellaneous unit can be a display screen. 0
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