M407394M407394
五、創作說明： 【新型所屬之技術頜域】 本創作是有關於一種測試裝置’且特別是有關於一種 發光二極體燈具的高壓測試裝置。 【先前技術】 近20年來，人們一直致力於新型照明光源的開發。由 於發光二極體（light emitting diode，LED)具有省電、耐用 以及體積小等優點，且這是傳統照明光源(例如：白熾燈和 螢光燈)無法比擬的。因此，發光二極體被公認為21世紀 最有價值的“綠色”光源(green lighting)，並可將取代白熾燈 和螢光燈，成為照明市場的主導產品。 砰細而言，發光二極體屬於半導體元件，其材料主要 使用EI-V族化學元素之化合物，例如磷化鎵(Gap)或砷化 鎵(GaAs)。發光二極體便是藉由對化合物半導體施加電 流’並透過電子與制的結合將過獅能量以蚊波長 。由於發光二極體的發光現象不是藉“ 發光’因此發光二_的壽命長達十 此Γίί電轉換效率比傳統照明光源更為良好。 國安規認證才可關而^子產品皆需通過各 即為安規認證巾重制-環。所 產品能夠麵定電壓下安全地:的轉㈣’亦即電子 開關或其他職所引起的瞬^ ’而且能夠抵抗由電療 ，藉以讓消費者能夠安 3 M407394 全地使用此電子產品。藉此，廠商為了使發光二極體燈具 皆能通過安規認證，便於生產發光二極體燈具的流程關卡 中設置了高壓測試裝置以自行檢驗。 【新型内容】 本創作提供一種發光二極體燈具的高壓測試裝置，其 可對發光二極體燈具進行高壓測試。 本創作提出一種發光二極體燈具的高壓測試設備，此 咼壓測試設備包括有燈座及針點式高壓測試裝置。燈座可 谷納發光二極體燈具的螺旋部，並且此燈座可供應接地電 壓至發光二極體燈具的接地端。針點式高壓測試裝置則可 以在預定期間内將額定電壓供應至發光二極體燈具的輸入 端，以測试上述發光二極體燈具是否可於預定期間内正常 運作，藉此來對發光二極體燈具進行一高壓測試。 在本創作之一實施例中，上述之針點式高壓測試裝置 可包括有針狀導電件、電壓供應單元及動力設備。針狀導 電件配置於動力設備上，且針狀導電件指向發光二極體燈 具的輸入端。電壓供應單元則電性連接至針狀導電件，藉 以供應額定電壓至針狀導電件上。藉此，動力設備於預^ 期間時可移動針狀導電件，使針狀導電件接觸發光二極體 燈具的輸入端並供應額定電壓予發光二極體燈具，藉以測 试發光一極體燈具在額定電壓下是否可正常運作。於預定 期間後’動力設備便將針狀導電件復位，以結束高壓測試。 4 M407394 在本創作之-實施例中，上述的動力設備可為—氣壓 缸，並且上述的電壓供應單元可為一電源供應器。 在本創作之-實施例中，上述之針狀導^的 採用金、銀、銅、鐵或石墨等可導電材料。 =創作之-實施财，上述之針點式高壓測試裝置 更l括-判縣置，此判斷裝置可於默期 二極體燈具是否正常運作，並顯示高壓職的結^斷^ 此判斷裝置可判斷此發光二極體燈具衫通過高壓^ 在本創作之一實施例中，上述之判斷裝置可由一 f則器及—顯示單元來域。亮度感·可於敢期^ fV則以極:燈r亮度大小，藉此來產生-判斷信 二收判斷信號’並顯示此發光二極體燈 晶顯式t述之顯示單元可利用-液 供麻ΐ於t述’本創作實施例的高壓測試設備可利用電壓 應較電壓給針狀導電件，並於高壓測試 :部動針狀導電件來接觸發光二極體燈具的輸 間内且提;：^€壓，11此賴發光二極贿具於預定期 ===壓時是否可以正常運作。此外，本實施 極體燈具是否 等感广ϊ置來偵測並判㈣^ 擾。疋否通過円壓測試，稭以免除人力判斷誤差的困 5 為讓本創作之上述特徵和優點能更明顯易懂，下文特 麥實施例’並配合所附圖式作詳細說明如下。 【實施方式】 現將詳細參考本創作之示範性實施例，在附圖中說明 所述示範性實施例之實例。另外，凡可能之處，在圖式及 實施方式中使用相同標號的元件/構件/符號代表相同或類 似部分。 廠商為了讓例如發光二極體燈具100等電子產品通過 各國的高壓測試，藉以取得該國販賣許可，便依據各國相 關的電子產品安全規範來設立高壓測試設備10，藉以先行 自行檢測發光二極體燈具1〇〇是否符合其規定。^參照圖 1及圖2’圖1是依照本創作之一實施例說明發光二極體燈 具100的尚壓測試設備10的示意圖，圖2是依照本創作之 一實，例說明發光二極體燈具100的高壓測試設備1〇的另 一不意圖。如圖1及圖2所示，發光二極體燈具1〇〇的高 壓測試設備10包财難12()及針點式縫測試袋置 125。燈座12〇可以容納發光二極體燈具1〇〇的螺旋部 1 〇此外，燈座120可供應接地電壓至發光二極體燈具 100的接地端》於本實施例中，發光二極體燈具1〇〇的接 地端位於螺旋部11G的黑色部分，而發光二極體燈具⑽ ，電源輸入端則位於螺旋部110的非黑色部分，並且螺旋 邻110以鋼作為其構成材質，藉以提升其導電效果。 M407394 δ月Μ續參照圖1及圖2，針點式高壓測試裝置125則 包括有針狀導電件13〇、動力設備及電壓供應單元。針點 式高壓測試裝置125可以在預定期間内將符合發光二極體 ^具100的額定電壓供應至發光二極體燈具1〇〇的輸入 知以測试發光二極體燈具100是否可於預定期間内正常 運作，藉此對發光二極體燈具10〇進行高壓測試。在此詳 =說明之，於本實施例中，動力設備以氣綠刚作為其V. Creation Description: [New Type of Technical Jaw Domain] This creation is about a test device' and in particular a high voltage test device for a light-emitting diode lamp. [Prior Art] In the past 20 years, people have been working on the development of new lighting sources. Light emitting diodes (LEDs) have the advantages of power saving, durability, and small size, which are unmatched by traditional lighting sources such as incandescent lamps and fluorescent lamps. As a result, LEDs are recognized as the most valuable “green” lighting in the 21st century and will replace incandescent and fluorescent lamps as the leading products in the lighting market. In detail, the light-emitting diode belongs to a semiconductor element, and its material mainly uses a compound of an EI-V chemical element such as gallium phosphide (Gap) or gallium arsenide (GaAs). The light-emitting diodes pass the electric current to the compound semiconductor and transmit the lion energy to the mosquito wavelength through the combination of electrons and electrons. Since the illuminating phenomenon of the light-emitting diode is not by "lighting", the life of the light-emitting diode is as long as ten. The electrical conversion efficiency is better than that of the conventional lighting source. The national security certification can be closed and the products must pass through each For the safety certification towel re-made - the ring. The product can be safely set to the voltage: the transfer (four) 'that is, the electronic switch or other posts caused by the instant ^ ' and can resist the electric therapy, so that consumers can safely 3 M407394 This electronic product is used in the whole place. In this way, in order to make the LEDs of the LEDs pass the safety certification, the high-voltage test device is installed in the process level for the production of the LED lamps to test by themselves. [New content] A high-voltage test device for a light-emitting diode lamp is provided, which can perform high-voltage test on a light-emitting diode lamp. The present invention proposes a high-voltage test device for a light-emitting diode lamp, which includes a lamp holder and a pin point High-voltage test device. The lamp holder can be the spiral part of the nano-light diode lamp, and the lamp holder can supply the ground voltage to the LED lamp. The grounding end of the needle-point type high-voltage test device can supply the rated voltage to the input end of the light-emitting diode lamp for a predetermined period of time to test whether the above-mentioned light-emitting diode lamp can operate normally within a predetermined period, thereby To perform a high voltage test on the illuminating diode lamp. In one embodiment of the present invention, the pin point type high voltage testing device may include a needle-shaped conductive member, a voltage supply unit, and a power device. On the power device, the needle-shaped conductive member is directed to the input end of the light-emitting diode lamp. The voltage supply unit is electrically connected to the needle-shaped conductive member to supply the rated voltage to the needle-shaped conductive member. ^ During the period, the needle-shaped conductive member can be moved to make the needle-shaped conductive member contact the input end of the light-emitting diode lamp and supply the rated voltage to the light-emitting diode lamp, thereby testing whether the light-emitting one-pole lamp can be normal under the rated voltage. Operation. After the predetermined period of time, the power unit resets the needle-like conductive member to end the high-voltage test. 4 M407394 In the present application, in the embodiment, the above The force device may be a pneumatic cylinder, and the voltage supply unit may be a power supply. In the present invention, the needle-shaped guide is electrically conductive with gold, silver, copper, iron or graphite. Material. = Creation - Implementation Finance, the above-mentioned pin-point high-voltage test device is more included - Judging County, this judgment device can operate normally in the silent diode lamp, and shows the connection of the high-voltage job ^ The determining device can determine that the light-emitting diode lamp body passes the high voltage. In an embodiment of the present invention, the determining device can be used by a f-or device and a display unit. The brightness sense can be used in the dazzle period. Pole: the brightness of the lamp r, thereby generating a -determining signal and determining the signal 'and indicating that the display unit of the LED lamp crystal display can be utilized - the liquid is paralyzed by the present embodiment The high-voltage test equipment can use the voltage to be compared with the voltage to the needle-shaped conductive member, and in the high-voltage test: the moving needle-shaped conductive member contacts the light-emitting diode lamp in the transmission room and raises it; Extreme bribes can be shipped normally during the scheduled period === . In addition, whether the polar light fixture of the present embodiment is widely used to detect and judge (four) ^ disturbance.円 No through the pressure test, straw to avoid the error of human judgment error 5 In order to make the above features and advantages of the present invention more obvious and easy to understand, the following example of the invention is described in detail below with reference to the drawings. [Embodiment] Reference will now be made in detail to the exemplary embodiments of the present invention In addition, wherever possible, the same reference numerals in the FIGS. In order to allow electronic products such as light-emitting diode lamps 100 to pass the high-voltage test of various countries, the manufacturer has obtained the country's sales license, and then set up the high-voltage test equipment 10 according to the relevant electronic product safety regulations of various countries, so as to detect the light-emitting diodes first. Whether the lamp 1〇〇 meets its requirements. 1 and FIG. 2' is a schematic diagram illustrating a pressure testing device 10 of a light-emitting diode lamp 100 according to an embodiment of the present invention, and FIG. 2 is a schematic diagram illustrating a light-emitting diode according to an embodiment of the present invention. Another intent of the high voltage test equipment 1 of the luminaire 100. As shown in Fig. 1 and Fig. 2, the high-voltage test equipment 10 of the light-emitting diode lamp 1 has a package of 12 () and a pin-point test bag 125. The lamp holder 12 〇 can accommodate the spiral portion 1 of the illuminating diode lamp 1 〇 In addition, the lamp holder 120 can supply the grounding voltage to the ground end of the illuminating diode lamp 100. In this embodiment, the illuminating diode lamp The grounding end of the 1〇〇 is located in the black portion of the spiral portion 11G, and the light emitting diode lamp (10), the power input end is located in the non-black portion of the spiral portion 110, and the spiral adjacent 110 is made of steel as its constituent material, thereby enhancing its conductivity. effect. M407394 δ月ΜContinuously referring to Figs. 1 and 2, the pin point type high voltage testing device 125 includes a needle-shaped conductive member 13A, a power device, and a voltage supply unit. The pin-point high-voltage test device 125 can supply the rated voltage of the light-emitting diode 100 to the input of the light-emitting diode lamp 1 预定 for a predetermined period of time to test whether the light-emitting diode lamp 100 can be scheduled. During the period of normal operation, high-voltage testing of the light-emitting diode lamp 10〇 was carried out. Herein, in detail, in the present embodiment, the power device uses the gas green just as its
實現方式，且電壓供應單元則以電源供應器15〇作為其實 現方式，但熟習此技術領域者應可推知，動力設備及電壓 ，應單it亦具有其他的實現方式，本創作實施例不應以此 為限。 針狀導電件130配置於氣壓缸14〇的前端伸縮部 145’且針狀導電件13”向發光二極體燈具觸的電源輸 入端(亦即發光二極體燈具⑽之螺旋部110的非里色部 =)。於本實施例中，針狀導電件13G的材質可_金、銀、The implementation manner, and the voltage supply unit uses the power supply 15〇 as its implementation manner, but those skilled in the art should be able to infer that the power device and the voltage should have other implementations, and the present embodiment should not This is limited to this. The needle-shaped conductive member 130 is disposed at the front end expansion-contraction portion 145' of the pneumatic cylinder 14A and the needle-shaped conductive member 13" is directed to the power input end of the light-emitting diode lamp (that is, the non-spiral portion 110 of the light-emitting diode lamp (10) In the present embodiment, the material of the needle-shaped conductive member 13G can be _ gold, silver,
ίt石墨等導電良好的材料，使其具有良好的導電係 =j秘應器丨料電性連接至針狀導電件13G及氣壓 提供氣壓紅14。電能，並供應額定電壓VR 來，導電件130,使得針狀導電件 二具100的電源輪入端以供應額定電壓 :=燈具100(如圖2所示)’藉以進行 二極體燈具⑽在較f壓VR下是否可 作。並且’在預定期間後，氣壓缸⑽便將針狀導電^= 7 M407394 復位(如圖1所示）’以結束發光二極體燈具WO的高壓測 試。 上述實施例中，發光二極體燈具100的測試結果可經 由，試人員以人眼來判斷是否通過高壓測試。換句話說， 在间壓測試的預定期間中（亦即發光二極體燈具丨⑻在針 狀導電件130接觸到發光二極體燈具⑽㈣源輸入端至 針狀導電件no復位之間的時間），發光二極體燈具是 否^ ¥輸出足額的光線亮度L。但是在當同時測試大量發 光二極體燈具100時，人眼難以判斷細微的光源變化，因 而難以判斷發光二極體燈具⑽是否通過高壓檢測。藉 此，請參_ 3 ’ ® 3是紐本創作另—實闕說明發光 -極體燈具100的高制試設備3〇的示意圖。本實施例與 上述圖1之貫施例相似，因此相同動作方式與說明不再贅 ，。其不同之處在於圖3的高壓測試設備3〇更包括有—判 斷裝^，此判斷裴置可於預定期間時判斷發光二極體燈具 100疋否正常運作，並顯示高壓測試的結果。換言之，此 判斷裝置可判斷此發光二極體燈具1GG是否通過高壓測 試。 一，此，本創作實施例便利用亮度感測器310及顯示單 疋來^現上述的判斷裳置。顯示單元以液晶顯示螢幕”0 作為實現方式’但熟f此技術賴者射推知，顯示單元 y有其他的實現方式，本創作實施例不應以此為限。亮 可於高壓測試的預錢間内來感測發光二ς 體、且八100所發出之光線L的亮度大小，以產生判斷信 號”夜晶顯示榮幕320接收並依據亮度感測器3 i 〇所產生 f判斷信絲顯示發光三極體燈具⑽是否通過高壓測 私屮t A例中’當發光二極體燈具1GG在預定期間中 么出足夠亮度的光線L時，液晶顯示螢幕32() 古沉」字樣’如得知發光二極體燈具⑽通過高壓測 Γ對地’在當發光二極體燈具卿在預定期間中的光 於亮度感測器m的預設值，或是發光二極體燈具 你各預疋期間中並無發出光線L時，液晶顯示登幕320 、0顯示出「NG」字樣，藉以得知發光二極體燈具100 並沒有通過高壓測試0 /、 綜上所述，本創作實施例的高壓測試設備可利用電壓 1應單元綠應敎錢給針料電件，胁高壓測試 時’動力設備移動針狀導電件來接觸發光二極體燈且的輸 入部以供應額定電壓，藉此測試發光二極體燈具於預定期 間内且提供歡電壓時是否可以正常運作。此外本實施 例亦可利用冗度感測II等感測裝置來彳貞測並判斷此發光二 極體燈具是否通過高制試，藉以免除人力骑誤差的困 雖然本創作已以實施例揭露如上，然其並非用以限定 本創作，任何所屬技術領域中具有通常知财，在不脫離 本創作之精神和範_，當可作些許之更動朗飾，故本 創作之賴範圍當視後附之申請專利範_界定者為準。 M407394 【圖式簡單說明】 圖1是依照本創作之一實施例說明發光二極體燈具的 高壓測試設備的示意圖。 圖2是依照本創作之一實施例說明發光二極體燈具的 高壓測試設備的另一示意圖。 圖3是依照本創作另一實施例說明發光二極體燈具的 高壓測試設備的示意圖。Ίt graphite and other conductive materials, so that it has a good electrical conductivity system. The jig material is electrically connected to the needle-like conductive member 13G and the air pressure provides the pressure red 14. Electrical energy, and supply rated voltage VR, conductive member 130, so that the needle-shaped conductive member has 100 power supply wheels to supply the rated voltage: = luminaire 100 (shown in Figure 2) 'by means of the diode lamp (10) Whether it can be done under f pressure VR. And 'after a predetermined period of time, the pneumatic cylinder (10) resets the needle-shaped conductive ^= 7 M407394 (as shown in Fig. 1) to end the high voltage test of the light-emitting diode lamp WO. In the above embodiment, the test result of the light-emitting diode lamp 100 can be passed, and the tester judges whether the high-voltage test is passed by the human eye. In other words, during the predetermined period of the interstitial test (ie, the time between the light-emitting diode lamp 丨 (8) and the needle-shaped conductive member 130 contacting the source input end of the light-emitting diode lamp (10) (four) to the reset of the needle-shaped conductive member no ), whether the light-emitting diode lamp ^ ^ outputs the full light brightness L. However, when a large number of light-emitting diode lamps 100 are simultaneously tested, it is difficult for the human eye to judge a slight change in the light source, and it is difficult to judge whether or not the light-emitting diode lamp (10) passes the high-pressure detection. In this case, please refer to _ 3 ’ ® 3 for the creation of a new one. This embodiment is similar to the above-described embodiment of Fig. 1, and therefore the same operation mode and description are no longer necessary. The difference is that the high-voltage test equipment 3 of FIG. 3 further includes a judgment device, and the judgment device can judge whether the light-emitting diode lamp 100 is normally operated during a predetermined period, and display the result of the high-voltage test. In other words, the judging means can judge whether or not the light-emitting diode lamp 1GG passes the high-voltage test. First, the present embodiment facilitates the use of the brightness sensor 310 and the display unit to determine the above-described determination. The display unit uses the liquid crystal display screen as the implementation mode. However, the display unit y has other implementations. The present embodiment should not be limited to this. Indirectly, the brightness of the light illuminating body and the light L emitted by the eight 100 are sensed to generate a judgment signal. The night crystal display glory 320 receives and judges the letter display according to the f generated by the brightness sensor 3 i 〇 Whether the illuminating triode luminaire (10) passes the high-voltage measurement 屮t in the case of 'When the illuminating diode lamp 1GG emits sufficient brightness L in a predetermined period, the liquid crystal display screen 32() Knowing that the light-emitting diode lamp (10) passes the high-voltage test to the ground's preset value of the brightness sensor m when the light-emitting diode lamp is in the predetermined period, or the light-emitting diode lamp When no light L is emitted during the period, the liquid crystal display screens 320 and 0 display the word "NG", so that the light-emitting diode lamp 100 does not pass the high-voltage test 0 /, in summary, the present embodiment High voltage test equipment can use voltage 1 should The unit green should pay for the electric parts of the needles. When the high-voltage test is carried out, the power equipment moves the needle-shaped conductive parts to contact the input part of the light-emitting diode lamp to supply the rated voltage, thereby testing the light-emitting diode lamps for a predetermined period. Whether it can work normally when the voltage is provided. In addition, in this embodiment, the sensing device such as the redundancy sensing II can also be used to detect and determine whether the LED device has passed the high test, thereby avoiding the trapping of the human riding error. However, it is not intended to limit the creation of this work. In any field of technology, it has the usual knowledge of wealth. Without departing from the spirit and scope of this creation, when some changes can be made, the scope of this creation should be attached. The patent application is defined as the standard. M407394 [Simple Description of the Drawings] Fig. 1 is a schematic view showing a high voltage testing apparatus for a light-emitting diode lamp in accordance with an embodiment of the present invention. 2 is another schematic diagram of a high voltage testing apparatus for a light emitting diode lamp in accordance with an embodiment of the present invention. 3 is a schematic diagram of a high voltage testing apparatus for a light emitting diode lamp in accordance with another embodiment of the present invention.
I 【主要元件符號說明】 10、30 :發光二極體燈具的高壓測試設備 100 :發光二極體燈具 110 :發光二極體燈具的螺旋部 120 :燈座 125 :針點式高壓測試裝置 130 :針狀導電件 140 :氣壓缸 145 :氣壓缸的前端伸縮部 150 :電源供應器 310 :亮度感測器 320 :液晶顯示螢幕 L :光線 VR :額定電壓I [Description of main component symbols] 10, 30: High-voltage test equipment for light-emitting diode lamps 100: Light-emitting diode lamps 110: Spiral portion 120 of light-emitting diode lamps: Lamp holder 125: pin-point high-voltage test device 130 : Needle-shaped conductive member 140: pneumatic cylinder 145: front end expansion and contraction portion 150 of pneumatic cylinder: power supply 310: brightness sensor 320: liquid crystal display screen L: light VR: rated voltage