M370071 ^ 五、新型說明： 【新型所屬之技術領域】 一種微型光譜儀’用以檢測發光裝置之光學頻譜訊號，或以光 譜進行物質之組成成份分析’本創作尤指一種於内部成型有一雜 散光消除裝置的微型光譜儀。 . 【先前技術】 • 按’物質的組成，通常可以用諸多的方法將其分解、離析，以 了解其組成的成分，例如礦石的組成、水源所包含的化合物等， 上述的分解、離析等，都屬於破壞性的檢測，一般是依需求進行 必要的檢測過程，而光譜儀，則是屬於一種非破壞性的檢測儀器， 其主要是利用光反射的原理，以及物質内組成結構對光不同頻段 • 的反射、吸收或穿透程衫_差異，按照波長排列，不同物質 • 會顯現個麟徵的光譜，料得到物質的原子、分子等的能階結 .構、化學鍵性質等多方面物質結構的知識，進而得以辨認物質的 成分組成及特性；而上述所稱的光譜儀，隨著科技的發展及演進， 目前市場上係已具有W的麵，常見的如繞射式分光儀 、干涉 ，〃義等如上無淪是繞射式或干涉式光譜儀，大多具有體 積龐大、系統複雜、诰僭b主 , 艳價叩貝等特性，如何微小化、集成化、量 產化成為最大的課韻. > .碭，而目别，市％上已有出現微型化後的光譜 3 M370071 儀器，其主要制贱變光柵之製作方法以提高㈣度及良率， 並以微機電技賴發光、機、電等元件，解決微小空間及元件所 造成的組裝公差及解析度下降等問題，如上，微型光譜儀的概念， 即在以最小光學路徑内實現分光與聚焦的功能，進而簡化系統架 構，降低元件數量與組裝成本，然而，設計及整合的過程中，亦 相對面臨了莫大的挑戰，例如：光學架構扁平化，機械設計與組 裝難度提高、小空間内雜散光之避免與訊號光之收集問題。 請參閱「第1圖」，圖中所示係為一習知光線路徑示意圖，如 圖中所示’一入射狹縫裝置20，組設於一光通道201的前端，且 入射狹縫裝置20的一端，係組設有一發光裝置30，當發光裝置 30所產生的光源W1，通過入射狹縫裝置20後，即形成一入射光 源W2 ;又，如圖中所示，入射光源W2係呈球面波的形式在光通 道201中前進，當所述的入射光源W2在光通道中接觸到一平面 (如圖中所示的2011)、或一反射面，則入射光源W2係因折射或 反射作用，而形成一折射光源W3(或反射光源）；在上述的光譜儀 器中，是於光通道201中組設有一光栅’以使入射光源W2在抵達 光柵後’可反射至一線型偵測器，由線塑偵測器擷取所有的反射 光，以轉換成光譜，然而，理想上，入射光源W2應依所稱的光通 道201全數抵達光柵後產生折射，但實際上，因為入射光源W2 經入射狹縫裝置20後以球面波形式行進，故’部份的光經折射後， 4 M370071 會形成所述的雜散光，若雜散光過多，則光譜所呈現的數據將會 党到嚴重的雜訊影響，故，在習知的光譜儀中，會在光通道中成 形有複數個雜散光消除裝置，其主要作用，是使雜散光在產生後， 可藉由雜散光消除裝置’使雜散光受到阻擋，進而產生偏向的反 射或折射，使其在反射或折射的過程中耗盡，如此，雖可達到提 升消除雜散光的有效性，然而，由於所述的消除雜散光裝置係成 型在光通道之中，其加工性有極大的不便之處，再者，必需正確 計算及預估出雜散光的折射路徑，亦為相當的繁複及困難，且， 在光譜儀微型化後’上述的加工作則顯困難。 【新型内容】 有繁於上述的問題，本創作者係依據多年來從事相關產品設計 的經驗，針對微型光譜儀的組成、架構，進行相關研究及分析， 期旎找出更為適切的解決方案，以有效的處理小空間内部產生的 雜散光問題；緣此，本創作主要的目的在於提供一種可有效消除 光譜儀内部空間的雜散光，以提升訊號光之收集效率的微型光譜 儀。 為達上述的目的，本創作主要係於—微型光譜儀的組成結構 中，成形n肖除雜散光的除光部，使光路彳身具有消除雜 散光的功效’如此，當翻光譜儀作鱗，其在光路徑因折射、 5 M370071 反射所產生祕散光’可受除光部有效料，以提升微型光譜儀 之光譜訊號的對雜訊比值，進而使檢測效率及準確度提升。 為使貴審查委S得以清楚了解補作的_、架構及其實施 的功效，茲以下列說明搭配圖示，請參閱。 【實施方式】 請參閱「第2圖」’圖中所示係為本創作的構件組成示意圖， 如圖中所示的微型光譜儀10 ’其主要係由一底座體1〇1形成一容 置空間1011，在此容置空間1011内部，係成型有一入射光通道 1012、一反射光通道1013，且入射光通道ι〇12與反射光通道1013 呈相連通，又，所述的入射光通道1012與反射光通道1013，係組 設有一上反射片以及一下反射片（本圖中尚未繪示），而所述的上反 射片及下反射片之間，係組設有複數個墊片106,以使兩者之間形 成一間隙(本圖未示，請參閱「第3圖」），另，在入射光通道1〇12 與反射光通道1013的銜接處，係組設有一反射型微型光柵1014， 所稱的反射型微型光柵1014則以凹型光柵為較佳；又，沿入射光 通道1012及反射光通道1013的一側，係成型有一可消除雜散光 的除光部1015，此所稱的除光部1015，係可使入射光及反射光在 經過入射光通道1012及反射光通道1013的過程中所產生的雜散 光，受到有效的消弭；再請參閱圖中所示’在入射光通道1012的 M370071 月ij端，係組設有一入射狹縫裝置102，以及在反射光通道i〇i3的 末端，組設有一線型偵測器103 ;另，一蓋體1〇4，係可蓋設於底 座體101上方，以使上述的各構件受底座體1〇丨與蓋體1〇4完整 包覆，並使入射光通道1012與反射光通道1〇13達到全遮光的效 用0 請參閱「第3圖」，圖中所示係為本創作的實施示意圖，如圖 中所示，本創作實施時，係以一發光裝置1〇5接設於入射狹縫裝 置102 ’以使發光裝置105所產生的光源，可經由入射狹縫裝置 102進入到入射光通道1012，而所稱的發光裝置1〇5可例如為發 光二極體；如圖’當發光裝置105所產生的光源進入到入射光通 道1012後，即形成一入射光al，當入射光al沿入射光通道1012 抵達反射型微型光柵1014，隨即產生複數道反射光(a2、a3..·)，且 各反射光(a2、a3._.)會隨即反射至線型偵測器1〇3,由此線型偵測 器103依所偵測到的各波段反射光，以數位或數據的方式顯示於 另一電子裝置，例如一部與微型光譜儀10呈資訊連接的電腦主機 及顯示幕；請再參閱圖中所示，除光部1015，其細部結構(圖中剖 切線cl)係如「第4圖」，其係為除光部之剖切放大示意圖，如圖， 除光部1015係成型有一斜面狀的折射面10151，而入射光通道 1012係組設有一上反射片1016以及一下反射片1017,如圖所示， 上、下反射片（1016、1017)組設完成後，兩者之間的間隙dl，係形 7 M370071 成一個可供光線通過的光通道1018，由本圖中可知，光通道i〇i8 的兩侧出口 10181，係緊鄰著左、右兩側的除光部1〇15之折射面 1015卜當一光線L1通過進入光通道1018後，其透出光通道1018 的一雜散光L1’ ’會於抵達折射面10151後，折射而出，亦即，雜 散光L1’無法再回到光通道1〇18中。 請參閱「第5圖」，圖中所示係為本創作構件之放大示意圖， 請搭配參照「第3圖」及「第4圖」，如「第5圖」所示，所述的 墊片106,係組設於上反射片1016以及下反射片1〇17之間，以使 兩者之間形成間隙dl，又，所述的墊片1〇6，其一端係成形有一 導光面1061，如此，可使光線在經過入射光通道1〇12時，被順利 導引向反射光通道1013。 综上所述’本創作主要係於入射光通道與反射光通道中，成型 有一除光部，而所稱的除光部，係成型有一呈斜面狀的折射面， 以使雜散光離開主要的光通道後，經由所述的折射面折射而出， 且無法再回到主要的光通道中，有效的消除光線在經過入射光通 道與反射光通道時所產生的雜散光，以確保線型偵測器所偵測之 各光波長的準確率；據此，本創作其據以實施後，確實可以達到 提供一種可有效消除光譜儀内部空間的雜散光，以提升訊號光之 收集效率的微型光譜儀之目的。 唯’以上所述者，僅為本創作之較佳之實施例而已，並非用以 8 M370071 限定本創作實施之範圍；任何熟習此技藝者，在不脫離本創作之 精神與範圍下所作之均等變化與修飾，皆應涵蓋於本創作之專利 範圍内。 綜上所述，本創作之功效，係具有新型之「產業可利用性」、「新 穎性」與「進步性」等專利要件；申請人爰依專利法之規定，向 鈞局提起新型專利之申請。 M370071 【圖式簡單說明】 第1圖，為習知的光線路徑示意圖。 第2圖，為本創作的構件組成示意圖。 第3圖，為本創作的實施示意圖。 第4圖，為除光部之剖切放大示意圖。 第5圖，為本創作構件之放大示意圖。M370071 ^ V. New description: [New technical field] A miniature spectrometer is used to detect the optical spectrum signal of a light-emitting device, or to analyze the composition of a substance by spectroscopy. This creation especially refers to the elimination of a stray light in the interior. A miniature spectrometer for the device. [Prior Art] • According to the composition of a substance, it can usually be decomposed and isolated by various methods to understand the composition of its composition, such as the composition of ore, the compound contained in the water source, etc., the above decomposition, separation, etc. Both are destructive tests, generally performing the necessary testing process according to requirements, and the spectrometer is a non-destructive testing instrument, which mainly uses the principle of light reflection, and the composition of the material in different frequency bands. Reflection, absorption or penetration of the machine _ difference, according to the wavelength arrangement, different substances • will reveal a spectrum of lining, material to obtain the atomic, molecular and other energy level structure of the material, structure, chemical bond properties and other aspects of the material structure Knowledge, in turn, can identify the composition and characteristics of the substance; and the above-mentioned spectrometer, with the development and evolution of technology, currently has a surface on the market, such as diffraction spectrometer, interference, derogatory Such as the above-mentioned flawless is a diffraction or interferometric spectrometer, most of which have a large volume, complex system, 诰僭b main, expensive price, etc. Sex, how to miniaturize, integrate, mass production becomes the biggest lesson. > . 砀, and the visual, the city has seen the miniaturized spectrum 3 M370071 instrument, the main production of 贱 光栅 光栅 之The method is to improve the (four) degree and the yield, and to solve the problems of assembly tolerance and resolution caused by tiny space and components by using micro-electromechanical technology, such as illuminating, machine and electricity. As above, the concept of the micro spectrometer is The function of splitting and focusing in the minimum optical path, which simplifies the system architecture and reduces component count and assembly cost. However, in the process of design and integration, it faces relatively great challenges, such as flat optical structure, mechanical design and Increased assembly difficulty, avoidance of stray light in small spaces, and collection of signal light. Please refer to FIG. 1 , which is a schematic diagram of a conventional light path. As shown in the figure, an incident slit device 20 is disposed at the front end of a light tunnel 201 and the incident slit device 20 is provided. One end of the system is provided with a light-emitting device 30. When the light source W1 generated by the light-emitting device 30 passes through the incident slit device 20, an incident light source W2 is formed. Further, as shown in the figure, the incident light source W2 is spherical. The form of the wave advances in the optical channel 201. When the incident light source W2 contacts a plane (2011 as shown in the figure) or a reflecting surface in the optical channel, the incident light source W2 is refracted or reflected. Forming a refracting light source W3 (or a reflecting light source); in the above spectroscopy apparatus, a grating ' is disposed in the optical channel 201 so that the incident light source W2 can be reflected to the line detector after reaching the grating, All the reflected light is extracted by the wire-shaped detector to be converted into a spectrum. However, ideally, the incident light source W2 should be refracted after reaching the grating according to the all-called optical channel 201, but actually, because the incident light source W2 passes through After the incident slit device 20, the ball The surface wave travels, so after the partial light is refracted, 4 M370071 will form the stray light. If there is too much stray light, the data presented by the spectrum will have a serious influence on the party. Therefore, In the known spectrometer, a plurality of stray light removing devices are formed in the optical channel, and the main function is that after the stray light is generated, the stray light can be blocked by the stray light eliminating device, thereby generating a deflected reflection. Or refracting, so that it is depleted during reflection or refraction, so that the effectiveness of eliminating stray light can be improved. However, since the stray-eliminating device is formed in the optical channel, the processability thereof is The great inconvenience, in addition, the correct calculation and estimation of the refraction path of stray light is also quite complicated and difficult, and it is difficult to add the above work after the spectrometer is miniaturized. [New content] With the above problems, the creator is based on the experience of related product design for many years, and carries out related research and analysis on the composition and structure of the micro spectrometer, and finds more suitable solutions. In order to effectively deal with the problem of stray light generated inside a small space; the main purpose of this creation is to provide a micro spectrometer that can effectively eliminate stray light in the internal space of the spectrometer to improve the collection efficiency of signal light. In order to achieve the above objectives, the present invention is mainly in the composition of the micro-spectrometer, forming a light-removing portion for removing stray light, so that the optical path has the effect of eliminating stray light. Thus, when the spectrometer is scaled, In the light path due to refraction, 5 M370071 reflection generated by the secret light 'can be affected by the light-removing part of the effective material, in order to improve the noise ratio of the spectral signal of the micro spectrometer, thereby improving the detection efficiency and accuracy. In order for your review committee to have a clear understanding of the _, structure and implementation of the supplement, please refer to the following instructions for matching. [Embodiment] Please refer to "Fig. 2". The figure shows the composition of the components. The miniature spectrometer 10' shown in the figure mainly consists of a base body 1〇1 to form an accommodation space. 1011, inside the accommodating space 1011, an incident light channel 1012 and a reflected light channel 1013 are formed, and the incident light channel ι 12 is in communication with the reflected light channel 1013, and the incident light channel 1012 is The reflective light channel 1013 is provided with an upper reflective sheet and a lower reflective sheet (not shown in the figure), and a plurality of spacers 106 are disposed between the upper reflective sheet and the lower reflective sheet to A gap is formed between the two (not shown in this figure, please refer to "3"). In addition, at the junction of the incident light channel 1〇12 and the reflected light channel 1013, a reflective micro-grating 1014 is arranged. The reflective micro-grating 1014 is preferably a concave grating. Further, along the side of the incident optical channel 1012 and the reflected optical channel 1013, a light-removing portion 1015 for eliminating stray light is formed. The light removing unit 1015 can make incident light and reflection The stray light generated during the process of passing through the incident light channel 1012 and the reflected light channel 1013 is effectively eliminated; again, as shown in the figure, 'at the end of the M370071 month of the incident light channel 1012, the system is provided with an incident narrow The slitting device 102, and a line type detector 103 is disposed at the end of the reflected light channel i〇i3; and a cover body 1〇4 is disposed above the base body 101 to receive the above-mentioned components. The base body 1〇丨 and the cover body 1〇4 are completely covered, and the incident light channel 1012 and the reflected light channel 1〇13 are fully shielded from light. Please refer to “Fig. 3”, which is shown in the figure. A schematic diagram of the implementation, as shown in the figure, is implemented by a light-emitting device 1〇5 connected to the incident slit device 102' so that the light source generated by the light-emitting device 105 can enter through the incident slit device 102. To the incident light channel 1012, the so-called light-emitting device 1〇5 can be, for example, a light-emitting diode; as shown in the figure, when the light source generated by the light-emitting device 105 enters the incident light channel 1012, an incident light a is formed. The incident light a1 reaches the opposite direction along the incident light channel 1012 The type micro-grating 1014 then generates a plurality of reflected light (a2, a3..·), and each reflected light (a2, a3._.) is then reflected to the line type detector 1〇3, thereby the line type detector 103 according to the detected reflected light of each band, digitally or dataly displayed on another electronic device, such as a computer host and display screen connected with the micro spectrometer 10; please refer to the figure, In addition to the light-receiving portion 1015, the detailed structure (cut line cl in the figure) is as shown in Fig. 4, which is a cut-away enlarged view of the light-removing portion. As shown in the figure, the light-removing portion 1015 is formed with a slanted refractive surface. 10151, and the incident light channel 1012 is provided with an upper reflection sheet 1016 and a lower reflection sheet 1017. As shown in the figure, after the upper and lower reflection sheets (1016, 1017) are assembled, the gap dl between the two is Shape 7 M370071 is a light passage 1018 through which light can pass. As can be seen from the figure, the outlets 10181 on both sides of the optical passage i〇i8 are adjacent to the refraction surface 1015 of the light-removing portion 1〇15 on the left and right sides. When a light L1 passes through the light path 1018, it passes through a stray light L1' of the light channel 1018. After reaching the refractive surface 10151, it is refracted, that is, the stray light L1' cannot be returned to the optical channel 1〇18. Please refer to "Figure 5", which is an enlarged view of the creative components. Please refer to "3" and "4", as shown in Figure 5, the gasket 106, the system is disposed between the upper reflective sheet 1016 and the lower reflective sheet 1〇17 to form a gap dl therebetween, and the spacer 1〇6 has a light guiding surface 1061 formed at one end thereof. In this way, the light can be smoothly guided to the reflected light channel 1013 as it passes through the incident light channel 1〇12. In summary, the present invention is mainly based on the incident light channel and the reflected light channel, and has a light-removing portion, and the so-called light-removing portion is formed with a slanted refractive surface to make the stray light away from the main After the optical channel is refracted through the refracting surface, and can not be returned to the main optical channel, effectively eliminating stray light generated by the light passing through the incident optical channel and the reflected optical channel to ensure line detection The accuracy of the wavelength of each light detected by the device; accordingly, after the implementation of the present invention, it is indeed possible to provide a micro spectrometer that can effectively eliminate the stray light in the internal space of the spectrometer to improve the collection efficiency of the signal light. . The above description is only for the preferred embodiment of the present invention, and is not intended to limit the scope of the present invention to 8 M370071; any person skilled in the art can make equal changes without departing from the spirit and scope of the present invention. And modifications should be covered by the scope of this creation. In summary, the effectiveness of this creation is in the form of new types of patents such as “industry availability,” “novelty,” and “progressiveness”; the applicant filed a new patent with the bureau in accordance with the provisions of the Patent Law. Application. M370071 [Simple description of the diagram] Fig. 1 is a schematic diagram of a conventional ray path. Figure 2 is a schematic diagram of the components of the creation. Figure 3 is a schematic diagram of the implementation of the creation. Fig. 4 is a schematic enlarged plan view showing the light removing portion. Figure 5 is an enlarged schematic view of the authoring component.
【主要元件符號說明】 10 微型光譜儀 101 底座體 1011 容置空間 1012 入射光通道 1013 反射光通道 1014 反射型微型光柵 1015 除光部 10151 折射面 1016 上反射片 1017 下反射片 1018 光通道 10181 出π 106 墊片 1061 導光面 102 入射狹縫裝置 103 線型偵測器 M370071[Main component symbol description] 10 Micro spectrometer 101 Base body 1011 accommodating space 1012 Incident light channel 1013 Reflected light channel 1014 Reflective micro grating 1015 Light removing part 10151 Refractive surface 1016 Upper reflecting piece 1017 Lower reflecting piece 1018 Optical path 10181 Out π 106 spacer 1061 light guide surface 102 incident slit device 103 line type detector M370071
104 蓋體 105 發光裝置 20 入射狹縫裝置 201 光通道 2011 平面 30 發光裝置 al 入射光 a2 反射光 a3 反射光 cl 剖切線 dl 間隙 LI 光線 LI， 雜散光 W1 光源 W2 入射光源 W3 折射光源104 Cover 105 Light-emitting device 20 Incident slit device 201 Light channel 2011 Plane 30 Light-emitting device al Incident light a2 Reflected light a3 Reflected light cl Cut line dl Clearance LI Light LI, Stray light W1 Light source W2 Incident light source W3 Refracted light source