M361020 五、新型說明·· 【新型所屬之技術領域】 本新型是有關於-種測試結構，且 種用以測試封裝體的治具。 疋有關於 【先前技術】 t半導體元件在封裝(Paekage)完成後，必須予以 迕戈功能是否良好，將封裝過程中種種因辛所 以筛選，進而確保半導體元件的品質。 :參閱苐1圖，其繪示習知技術 示意圖。傳統上封裝體2〇之测試方的拍 f λ .'ρ,ΐ ^ ^ a τ λ ^ 、式方式係將封裝體20 ，入K治具1G内’料行測試作業。關治且 ^座體14、一蓋體16及多個探針18。座體Μ、 =之間以-轉抽24相連接。座體14 一般會固定；j 丨2上’並形成有一凹槽22。凹槽22配合封裝體 之尺寸，用以容置及定位封裝體2〇。 每一楝針18貫穿座體14,其一端突出於凹槽22内， =接觸封裝體20之接點26;另一端則突出於座體Μ ’以連接基板12。基板12彳將測試訊號傳遞至測試 機（圖未顯示）上’關試封裝體2G之電性或功能。 、”然而，傳統的測試治具10僅能對單一的封裝體20 或單面的接點26執行測試’無法量測多個封裝體之間的 作用或功能，亦無法量測具雙面接點之封裝體的功能。 因此舄要一種新的測试治具，可用來量測多個封裝體 或具雙面接點之封裝體的功能。 M361020 【新型内容】 體和—二提供—種測試治具，其包含-座體, 皿體。連接體逵垃 ^ 尾體、一連指 座體設置於—基板主、…盖體連接此連接體。 第-封裝體。多個；寸斜=一第T凹槽以容置-第-探針突出於第=胃讀’並連接基板，且 連接體具有二以電性連接第—封裝體。M361020 V. New Description·· 【New Technical Fields Included】 This new type is related to the test structure and the jig for testing the package.疋About [Prior Art] After the completion of the package (Paekage), the t-semiconductor components must be well-functioned, and the various components in the packaging process should be screened to improve the quality of the semiconductor components. : Refer to Figure 1, which shows a schematic diagram of a prior art. Traditionally, the tester of the package 2〇 f λ . 'ρ, ΐ ^ ^ a τ λ ^ , the method of the package 20, into the K fixture 1G 'material line test operation. Guan Zhi and ^ seat 14, a cover 16 and a plurality of probes 18. The seat Μ, = is connected by - to draw 24. The seat 14 is generally fixed; j 丨 2 is 'and formed with a recess 22. The recess 22 fits the size of the package for receiving and positioning the package. Each of the pins 18 extends through the base 14 and has one end projecting into the recess 22, = contacting the contact 26 of the package 20, and the other end projecting from the base Μ ' to connect the substrate 12. The substrate 12 turns the test signal to the tester (not shown) to turn off the electrical or functional function of the package 2G. However, the conventional test fixture 10 can only perform a test on a single package 20 or a single-sided contact 26 'cannot measure the function or function between multiple packages, and cannot measure the double-sided contacts The function of the package. Therefore, a new test fixture can be used to measure the function of multiple packages or packages with double-sided contacts. M361020 [New content] Body and - provide two kinds of test treatment The utility model comprises a body, a body, a connecting body, a tail body, and a connecting body, which are arranged on the substrate main body, and the cover body is connected to the connecting body. The first package body; the plurality of inches; The T groove is adapted to receive the first probe to protrude from the stomach and connect to the substrate, and the connector has two wires to electrically connect the first package.
面對座體。連接體的第二面設置有4:面，且第-面 置一第二封罗和户/社 弟一凹槽，用以容 二摄、夕個第二探針貫穿連接體，每一個第 一心針的兩端分別突出於連接體的第 母個弟 分別電性連接第—封裝體和第二封裝體。面，以 -第實施例中，連接體的第—面可設置有 之另二眚，’第三凹槽面對且對齊第-凹槽。在本新型 對且對齊第二凹槽具有一弟四凹槽’第四凹槽面 • 接體可透過-第—轉軸連接座體，並以第一轉轴 二〜而相對於座體旋轉，進而選擇性地遮覆或顯露第 1槽的開口。連接體亦可透過—卡接結構、一扣合結 構或各種方式連接座體。在本新型之另一實施例中，連 .接體^設置有一第一卡接結構，用以卡接座體和連接體。 、 蓋體可透過一第二轉軸連接此連接體，並以第二轉 軸為中心而相對於連接體旋轉，進而選擇性地遮覆或顯 露第二凹槽的開口。蓋體亦可透過卡接結構、扣合結構 或各種方式連接此連接體。在本新型之另一實施例中， M361020 蓋體上設置有-第二卡接結構，用以卡接連接體與蓋體。 在本新型之另一實施例中，第一封裝體具有一上表 面和下表面，夕個第一接點及多個第二接點分別設置 於下表面和上表面。此些第一探針電性連接此些第一接 點，此些第二探針電性連接此些第二接點。 在本,型之另—實施例中，第一封裝體更具有多個 t 此&銲球――設置於此些第-接點上，此些第-，針，過此些銲球電性連接此些第—接點。在本新型之 -俨：，第二封裝體具有多個第三接點，此些第 一探針電性連接此些第三接點。 針之另一實施例中’此些第-探針或第二探 針之長度為可伸縮長度或固定長度。 接上新型=提供一種測試治具，其包含-座體、-連 體上，並可料笛：二基板上。連接體堆疊於座 體上，並:座體。蓋體堆疊於連接 體亦可各連接此連接體。連接體與蓋 分別連接座體及連接體。 u各種方式， 座體或連接體設置有一第一 裝體。多個第一摈广- 乂谷置一苐一封 -探針突出二：：:座體’並連接基板，且此些第 罢體^^ 以電性連接第—封裝體。 裝體多置有一第二凹槽，以容置-第二封 兩端分別突出於第一凹㈣ 二们第-•木針的 接第-封裝體和第二：體弟一凹槽中’以分別電性連 本新型又提供試料，其包含—㈣和一蓋 M361020 體:座體設置於-基板上，且座體上設置有—第一凹样 一封裝體。蓋體選擇性地遮覆或顯露第-： 曰夕盍體具有一第二凹槽以容置一第二封裝體。 一 座體/連㈣板，且突出於帛 第一封f/，此些s—探針便可心電性連接 多個第二探針自第二凹槽穿過蓋 第-探針了用凹槽或盍體之-第三凹槽中。每一個 H 電性連接第一封裝體和第二封裝體。 用之—實施财，蓋體具有—蓋板，蓋板可 用、擇性地遮覆或顯露第二凹槽。 在本新型之另一實施例中， 柱，蓋體具有至少一㈣I I體具有至少-定位 覆第—凹槽時，定位柱=置二位柱對齊凹孔。當蓋體遮 體上。 ①位柱*置於凹孔中，使蓋體定位於座 本新型再提供一種測試治具，1人一 體。座體堆疊於—基板上體;體和—蓋 至少—卡接結構卡接座體。盍體L於座體上’並透過 座體或蓋體設置有—篦— 體。蓋體JL古 ^ 凹枱以容置一第一封裝 皿體具有—第二凹槽以:衣 第-凹槽不連接第二凹槽。 封袭體。其中， -凹t個中第—探針貫穿座體，並連接基板，且突出於第 凹槽中。此些第一控私叮m 低且大出於弟 基板。多個第二探針自第二凹=性連接第—封裝體和 一凹槽或蓋體之—第三 槽=過蓋體，且突出於第 以電性連接第—縣體和個第二探針均可用 由上述各個貫施例可知，本新型所揭露之測試治具 6 M361020 可用於測量至少兩個封裝體，以測試兩封裝體之間的作 用和功旎，並可對具雙面接點之封裝體執行測試作業。 【實施方式】 請參照第2圖和第3圖，讀示依照本_之測試 ，具之第-實施例的剖面示意圖。在第—實施例中，測 試治具1〇〇包含-座體110、一連接體12〇和一 130。座體110設置於一基板1〇2上，連接體12〇可堆疊 於座體no上’而蓋體130可堆疊於連接體12〇上 細來說，連接體120具有互相相對的第一面122和 面124，且第一面122面對座體110,第二面124面對i 體130 。 皿 座體110或連接體120可設置—第一凹槽14〇以容 置第-封裝體200。換句話說，第―凹槽⑽可位於座 體no上，也可位於連接體12〇上。在第一實施例中， 座體110在面對連接體12〇的表面上設置有第一凹栌 140，以容置第一封裝體200。 日 另-方面，在第-實施例中’連接體u -上可設置-第三凹請。第三凹糟144面丄； 弟-凹槽M0,可與第一凹槽140形成一個用以 一封裝體200的容置空間。 多 =第一探針150貫穿座體11〇。每一第一探針… 的U於座體11G外，以電性連接基板1G2;另一 端犬出於第-凹槽14。中’以電性連接第—封裝體細。 第一探針150可以是固定長度的探針，也可以是可 7 M3 61020 伸縮長度的探針。本技術領域中具有通常知識者應熟知 各種目定長度或可伸縮長度的探針及其結構，在此便不 再多加贊述。 , 第一探針150的配置方式，可依照基板1〇2和第一 • 封裝體2〇〇的配線位置設置。在第一實施例中，第一封 、'裝體200是一種雙面均配置接點的封裝體。亦即，第一 封裝體200的上表面202配置有多個第二接點2〇补，其 下表面204也配置有多個第一接點2〇6a。此些第一探針 150的設置可一一對齊於下表φ 2〇4的第一接點顺， 以電性連接此些第一接點206a。另一方面，在第一實施 例中，第一封裝體200具有多個銲球2〇8。此些銲球2〇8 厂一設置於此些第一接點206&上，且此些第一探針15〇 透過此些銲球208電性連接此些第一接點2〇6a。 連接體120可透過一第一轉軸16〇連接座體“ο。藉 此，連接體120可以第一轉轴16〇為中心，並相對於座 體110旋轉。如此一來，連接體120便可轉到座體110 上而遮覆第一凹槽14〇，或者連接體12〇也可轉開而顯 露第一凹槽140的開口 180。此外，連接體12〇亦可透 過一卡接結構、一扣合結構或各種方式連接座體u〇。 另一方面，當連接體12〇轉到座體u〇上，使得連 接體120的第一面122接觸座體11〇，並遮覆第一凹槽 時，可藉由第一卡接結構17〇連接兩者。具體而言， 、第一卡接結構170可設置於座體110或連接體12〇上， 以卡接座體110和連接體12〇。 °月’主思，可用以卡接座體11 〇和連接體120的結構 有报多種。在此雖然提出一種第一卡接結構17()作為說 M361020 明’然而並非用以限制本新型。 120上第例中’第—卡接結構17G設置於連接體 座體u〇H接/構170可具有一第一卡榫-，而 喪入第一卡样l7f —弟一卡槽176a。第一卡摔174a可 I a之中，以卡接座體110及連接體120。 容置-第二或蓋體130可設置有一第二凹槽142,以 置於連換句話說’第二凹槽142可設 贫 上’亦可設置於蓋體130上。請注音， 不連接第一凹槽·在第-實“二 第:封;體：於連接體120的第二面124,用以容置 120 在第一實施例中’蓋體130面對連接體 面對且對上可設置一第四凹槽146。第四凹槽146 面對且對齊弟二凹揭〗4?，ότ企结 用以容置第二封裝=的 多個第二探針152貫穿連接體12〇，每一個第二 152的兩端分別突出於連接體120 #第一φ 122和第1 面⑶。此些第二探針152突出於第一 二: 於第—凹槽14。或第三凹槽144之中，用卜= 性連接弟一封裝體200。此些第二探針152突出於第二 IT之外的部分’則可位於第二凹槽142或第四凹ί 146中，用以電性連接第二封裝體21〇。 才曰 類似於第一探針15〇，此些第二探針i52也可 定長度或可伸縮長度的探針。 此些第一板針152❺配置方式，可依照第—封 200和第二封裝體別的配線位置設置。在第—實施例 9 M361020 ^此些第二楝針152突出於第一面122之外的部分， 可★對齊於第一封裝體200的第二接點2〇6b ,以電性 連接第二接點206b。而此些第二探針152突出於第二面 以之外的部分，則可——對齊於第二封裝體2ι〇的第 二接，206c，以電性連接第三接點2〇&。 —蓋體130可透過一第二轉軸162連接此連接體12〇。 糟此，盍體130可以第二轉軸162為中心，並相對於連 接體120旋轉。如此一來’蓋體130便可轉到連接體120 上，且接觸連接體120的第二面124而遮覆第二凹槽 142。或者，蓋體130也可轉開而顯露第二凹槽142的開 口 182。此外，蓋體13〇亦可透過卡接結構、扣合結構 或各種方式連接此連接體120。 另一方面，當蓋體130旋轉到連接體12〇上，並接 觸連接體120的第二面124時，可藉由第二卡接結構172 連接兩者。具體而言，第二卡接結構172可設置於蓋體 130或，接體12〇上，以卡接連接體和蓋體no。 在第一貫施例中，第二卡接結構172設置於蓋體13〇 上。第二卡接結構172可具有一第二卡榫174b，而連接 體二20可設置有—第二卡槽mb。第二卡榫咖可巍 入第Ϊ卡^ 176b之中，以卡接連接體120及蓋體130。 請注意，可用以卡接連接體12〇和蓋體13〇的結構 有报多種。在此雖然提出一種第二卡接結構172作為說 明，然而並非用以限制本新型。 第—封裝體200和第二封裝體21〇可以是功能上互 相匹配’或是電性上互相連接的封裝體。測試治具100 可測試第一封裝體200和第二封裝體21〇之間的^乍用和 M361020 可對具雙面接點之第—封裝體雇執行測試作 :面，也可透過兩封裝體其中一者來測試另一 封裝^ot說，、測試人員可先提供一個功能良好的第一 、則並透過本新型所揭露的測試治具100，加以 封龍21G的功能或作用是否良好。反之’測 村先提供第二封裝體跡再透過測試治具議 及I δ式第一封裝體2〇〇的功能。 吞月參考弟4圖和第$ fsi jj.,.— a . ^ ^ 圖，其繪示依照本新型之測試 /口，、之弟一實施例的剖面示音 ^ ^ ,λ ,ηη ^ ^ 囟丁思圖。在弟二實施例中，測 置於一基板402上，雲體42〇 土^體420 °座體410設 風體420堆豐於座體410上。 座體410或蓋體420可母罟楚 第-·體200。換㈣；1十凹槽權以容置 41Π μ 換口話說，弟一凹槽440可位於座體 上，也可㈣蓋體42()上。在第二實 410在面對蓋體420的表面上 广體 置一第-封裝體200。 L又置有弟一凹槽梢，以容 另-方面’在第二實施例中’蓋體伽 〇 的表面422上可設置一第二 丁从篮 —凹槽444。第三凹样444面 對且對齊第-凹槽440,可愈笛⑽凹槽444面 ^ J興弟一凹槽440形成一個用 以奋置弟一封裝體200的容置空間。 座體4Η)上設置有多個第：探曰針 針450貫穿座體410。每一 且此二弟抹 於座體4iG外，以電性連接針45G的一端突出 电陧連接基板4〇2 ;另一端&丨穿屮於 第-凹槽440中，以電性遠桩筮+力知則大出於 、 电Γ連接弟一封裝體200。 如前所述’第一封裝體2〇〇 _ 的封裝體。換句話說，第一封，：面均配置接點 了居體200的下表面204配 M361020 置有多個第一接點206a，其上表面202也配置有多個第 二接點206b。在第二實施例中，此些第一探針450電性 連接第一封裝體200的第一接點206a。另一方面，第一 封裝體200具有多個銲球208。此些銲球208——設置 ' 於此些第一接點206a上，且此些第一探針450透過此些 - 銲球208電性連接此些第一接點206a。 ' 蓋體420選擇性地遮覆或顯露座體410上的第一凹 槽440。換句話說，蓋體420可堆疊於座體410上，進 而遮覆住第一凹槽440的開口 430。蓋體420也可移開， • 使得第一凹槽440的開口 430得以顯露出來。 蓋體420可透過轉轴、卡接結構、扣合結構或各種 方式連接座體410。在第二實施例中，蓋體420透過卡 接結構470卡接座體410。 卡接結構470可設置於座體410或蓋體420上，以 卡接兩者。在第二實施例中，卡接結構470係設置於蓋 體420上。卡接結構470可具有一卡榫472，而座體410 可設置有一卡槽478。卡榫472可嵌入卡槽478之中， • 以卡接蓋體420和座體410。 卡接結構470亦可具有一扳件474和一轉軸476。轉 轴476設置於卡榫472和扳件474之間。當扳動扳件 474,使其相對於轉軸476轉動時，扳件474會帶動卡榫 '472轉動，使得卡榫472轉入或轉出卡槽478。 - 蓋體420可設置有一第二凹槽442以容置一第二封 裝體210。請注意，第二凹槽442不連接第一凹槽440。 在第二實施例中，蓋體420更具有一蓋板424。蓋板424 可選擇性地遮覆或顯露第二凹槽442。換句話說，蓋板 12 M361020 424可堆疊於蓋體伽上的第二 進而遮覆住坌-π城η τ曰料2的開口 432處， 槽 2 ㈣ 口 432。—42^^ 凹槽442 _口 432得以顯露出來。 心每—ΊΓϋ蓋體420上設置有多個第二探針 ㈣，且突====第，442穿過蓋體 說，此此黛/ 或弟三凹槽444中。換句話 凹槽44:ίτΓ=:Γ於第—凹槽440或第三 電性連接：f「 第二凹槽442中，用以分別 連接第—封裝體如第二封裝體210。 二C列中，此些第二探針452位於第-凹槽 體：〇二 4，的部分，可一-對齊於第-封裝 2〇6b而：I;接點雇，以電性連接此些第二接點 ,11而此些弟二探針452位於第二凹槽442巾的部分， 一對齊於第二封裝體210的第三接‘點206c，以電 性連接此些第三接點206c。 H-探針45G和第二探針452可以是固定長度 ==十’也可以是可伸縮長度的探針。本技術領域中具 知識者應熟知各翻定長度或可伸縮長度的探針 及其結構，在此便不再多加贅述。 一為了協助盍體420和座體41〇的對齊和定位，在第 :實施例中’測試治具彻更包含—定位結構，定位結 構^定位柱460與凹孔462之結合。具體而言，座體41〇 和盍體420可分別設置有至少一定位柱46〇和至少一凹 孔462,且定位柱460對齊凹孔462。當蓋體42〇堆疊於 座體410上，並遮覆第一凹槽44〇時，定位柱46〇會容 置在凹孔462中，使蓋體420定位於座體41〇上。 13 M3 61020 且別Θ纟本新型所揭露的測試治具400可容置 且測I第一封裝體2〇〇 』谷置 面桩Eh夕曾^ 乐一封裝體210，並可對具雙 面接”沾之弟一封裝體2〇〇執 ^ ^ JL 4ΠΠ λα m - 仃'則忒作業，因而擴充了測Facing the seat. The second side of the connecting body is provided with a 4: face, and the first side is provided with a second seal and a recess of the household/social brother for receiving two photos and a second probe penetrating the connecting body, each of the first The two ends of the one-pin are respectively protruded from the first parent of the connecting body to electrically connect the first package and the second package respectively. In the first embodiment, the first face of the connector may be provided with the other face, and the third groove faces and aligns with the first groove. In the present invention, the aligned second groove has a fourth groove. The fourth groove surface is connected to the base through the first-rotor shaft and rotated relative to the base body by the first shaft. Further, the opening of the first groove is selectively covered or exposed. The connector may also be coupled to the base through a snap-fit structure, a snap-fit structure or various means. In another embodiment of the present invention, the connector body is provided with a first latching structure for engaging the body and the connector. The cover body is connected to the connecting body through a second rotating shaft and rotates relative to the connecting body centering on the second rotating shaft to selectively cover or expose the opening of the second recess. The cover may also be connected to the connector through a snap-fit structure, a snap-fit structure or various means. In another embodiment of the present invention, the M361020 cover body is provided with a second snap-fit structure for engaging the connector body and the cover body. In another embodiment of the present invention, the first package has an upper surface and a lower surface, and the first contact and the plurality of second contacts are disposed on the lower surface and the upper surface, respectively. The first probes are electrically connected to the first contacts, and the second probes are electrically connected to the second contacts. In another embodiment of the present invention, the first package further has a plurality of solder balls which are disposed on the first contacts, and the first, the pins, and the solder balls are Sexually connect these first-contacts. In the present invention, the second package has a plurality of third contacts, and the first probes are electrically connected to the third contacts. In another embodiment of the needle, the length of the first probe or the second probe is a retractable length or a fixed length. Connected to the new = provide a test fixture, including - seat, - connected, and can be flute: on the two substrates. The connectors are stacked on the body and are: a seat. The cover body may be stacked on the connector body to connect the connector body. The connecting body and the cover are respectively connected to the base body and the connecting body. u In various ways, the seat or the connecting body is provided with a first body. A plurality of first 摈--------------------------------------------------- The second body is provided with a second recess for accommodating - the two ends of the second cover respectively protrude from the first concave (four) two of the first - the first needle of the wooden needle and the second: the body of a groove The invention further provides a sample, which comprises - (4) and a cover M361020 body: the base body is disposed on the substrate, and the base body is provided with a first concave sample-package. The cover selectively covers or reveals the first:: the second body has a second recess for receiving a second package. a body/connector (four) plate, and protruding from the first f/, the s-probe can be electrocardially connected to the plurality of second probes from the second groove through the cover. The groove or the body - in the third groove. Each of the H is electrically connected to the first package and the second package. In order to implement the money, the cover has a cover plate, and the cover can selectively cover or reveal the second groove. In another embodiment of the present invention, the post, the cover body has at least one (four) I I body having at least a positioning over-groove, and the positioning post = the two-column post is aligned with the recessed hole. When the cover is covered. The 1 column* is placed in the recessed hole to position the cover body. The present invention further provides a test fixture, which is one person. The body is stacked on the upper body of the substrate; the body and the cover are at least - the snap-fit structure is engaged with the body. The body L is placed on the seat body and is provided with a body through the seat body or the cover body. The cover body JL ancient recessed table to accommodate a first package body has a second recess to: the first groove does not connect to the second groove. Sealing body. Wherein, the concave - the first probe penetrates the base body and is connected to the substrate and protrudes in the first groove. These first control private m are low and large. The plurality of second probes are connected to the first recess from the second recess=the first package and the third slot=the cover body, and protrude from the first to electrically connect the first county and the second The probes can be used. According to the above various embodiments, the test fixture 6 M361020 disclosed in the present invention can be used to measure at least two packages to test the function and function between the two packages, and can be double-sided. The point package performs the test job. [Embodiment] Referring to Figures 2 and 3, a cross-sectional view of a first embodiment is shown in accordance with the test of the present invention. In the first embodiment, the test fixture 1 includes a body 110, a connector 12A, and a 130. The base body 110 is disposed on a substrate 1〇2, and the connecting body 12〇 can be stacked on the base body no. The cover body 130 can be stacked on the connecting body 12〇. The connecting body 120 has a first surface opposite to each other. 122 and face 124, and the first face 122 faces the seat body 110, and the second face 124 faces the i body 130. The holder body 110 or the connector body 120 may be provided with a first recess 14'' to accommodate the first package body 200. In other words, the first groove (10) may be located on the seat no or on the connecting body 12〇. In the first embodiment, the base 110 is provided with a first recess 140 on the surface facing the connecting body 12A to accommodate the first package 200. On the other hand, in the first embodiment, the -th recess can be set on the connector u-. The third recess 144 is formed in the first recess 140 to form a receiving space for the package 200. More = The first probe 150 penetrates the seat 11 〇. The U of each of the first probes is electrically connected to the substrate 1G2 outside the base 11G; the other end of the dog is out of the first groove 14. The middle is electrically connected to the first package. The first probe 150 may be a fixed length probe or a 7 M3 61020 telescopic length probe. Those of ordinary skill in the art will be familiar with probes of various lengths or lengths and their structures, and will not be further described herein. The first probe 150 is disposed in accordance with the wiring position of the substrate 1〇2 and the first package 2〇〇. In the first embodiment, the first package, the package 200 is a package in which both sides are provided with contacts. That is, the upper surface 202 of the first package 200 is provided with a plurality of second contacts 2, and the lower surface 204 is also provided with a plurality of first contacts 2〇6a. The first probes 150 are arranged to be aligned with the first contacts of the following table φ 2〇4 to electrically connect the first contacts 206a. On the other hand, in the first embodiment, the first package 200 has a plurality of solder balls 2〇8. The solder balls 2 〇 8 are disposed on the first contacts 206 & and the first probes 15 电 are electrically connected to the first contacts 2 〇 6 a through the solder balls 208 . The connecting body 120 can be connected to the seat body ο through a first rotating shaft 16 。. Thereby, the connecting body 120 can be centered on the first rotating shaft 16 , and rotate relative to the seat body 110. Thus, the connecting body 120 can be Turning to the seat 110 to cover the first recess 14 〇, or the connecting body 12 〇 can also be turned away to reveal the opening 180 of the first recess 140. In addition, the connecting body 12 〇 can also pass through a snap-fit structure, A fastening structure or a plurality of ways to connect the body u. On the other hand, when the connecting body 12 turns to the seat u〇, the first surface 122 of the connecting body 120 contacts the seat 11〇 and covers the first In the case of the recess, the two latching structures 17 can be connected to each other. Specifically, the first latching structure 170 can be disposed on the base 110 or the connecting body 12 to engage the socket 110 and the connecting body. The body 12〇. ° month's main idea, can be used to lock the body 11 〇 and the structure of the connector 120 has been reported a variety. Here, a first snap-in structure 17 () is proposed as saying M361020 clearly 'but not used Limiting the present invention. In the first example of the above, the 'first-clamping structure 17G is disposed on the connecting body body u〇H connection/structure 170 may have a first榫 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , A second recess 142 may be disposed to be placed, in other words, 'the second recess 142 may be set to lean' or may be disposed on the cover body 130. Please note that the first groove is not connected. The second surface: the sealing body is disposed on the second surface 124 of the connecting body 120 for receiving 120. In the first embodiment, the cover body 130 faces the connecting body and a fourth groove 146 may be disposed on the upper side. . The fourth recess 146 faces and aligns with the second recess 44?, and the plurality of second probes 152 for accommodating the second package= penetrate the connecting body 12〇, and the two ends of each second 152 The connecting body 120 #first φ 122 and the first surface (3) are respectively protruded. The second probes 152 protrude from the first two: the first groove 14. Or in the third recess 144, the package 200 is connected to the second one. The portion of the second probe 152 that protrudes beyond the second IT may be located in the second recess 142 or the fourth recess 146 for electrically connecting the second package 21 〇. Similar to the first probe 15〇, the second probes i52 can also be probes of a length or a length that can be stretched. The first plate pins 152 are arranged in such a manner that they can be arranged according to the wiring positions of the first cover 200 and the second package. In the first embodiment, M361020, the second cymbal 152 protrudes from the portion other than the first surface 122, and can be aligned with the second contact 2 〇 6b of the first package 200 to electrically connect the second Contact 206b. And the second probe 152 protrudes from the portion other than the second surface, and then the second connection 206c can be aligned with the second package 2 ι, to electrically connect the third contact 2 〇 & . The cover body 130 can be connected to the connecting body 12 through a second rotating shaft 162. In spite of this, the body 130 can be centered on the second rotating shaft 162 and rotated relative to the connecting body 120. In this way, the cover 130 can be turned onto the connecting body 120 and contact the second surface 124 of the connecting body 120 to cover the second recess 142. Alternatively, the cover 130 can be turned away to reveal the opening 182 of the second recess 142. In addition, the cover 13 can also be connected to the connector 120 through a snap-fit structure, a snap-fit structure or various means. On the other hand, when the cover 130 is rotated onto the connector body 12 and contacts the second face 124 of the connector body 120, both can be connected by the second latching structure 172. Specifically, the second latching structure 172 can be disposed on the cover body 130 or the connector body 12 to engage the connector body and the cover body no. In the first embodiment, the second snap-fit structure 172 is disposed on the cover 13A. The second latching structure 172 can have a second latch 174b, and the connector body 20 can be provided with a second latching slot mb. The second card can be inserted into the first card ^ 176b to snap the connector 120 and the cover 130. Note that there are many types of structures that can be used to snap the connector 12A and the cover 13A. Although a second snap-fit structure 172 is presented herein as an illustration, it is not intended to limit the present invention. The first package 200 and the second package 21A may be functionally matched to each other or electrically connected to each other. The test fixture 100 can test the relationship between the first package body 200 and the second package body 21 and the M361020 can perform the test for the first package body with double-sided contacts: face or through two packages One of them to test another package ^ot said that the tester can first provide a functional first, and through the test fixture 100 disclosed in the present invention, whether the function or function of the Fenglong 21G is good. On the other hand, the village first provides the second package trace and then passes the test fixture and the function of the I δ type first package. Swallowing the reference 4 and the $ fsi jj.,. - a . ^ ^ diagram, showing the cross-section sounds of an embodiment of the test/mouth according to the present invention ^ ^ , λ , ηη ^ ^囟丁思图. In the second embodiment, the measurement is placed on a substrate 402, and the cloud body 42 is disposed on the body 410. The seat 410 or the cover 420 can be a female body. Change (4); 1 ten groove right to accommodate 41 Π μ In other words, the younger one groove 440 can be located on the seat body, or (4) the cover body 42 (). A first package body 200 is disposed on the surface of the second body 410 facing the cover 420. L is further provided with a groove-like recess for accommodating a second-side basket-groove 444 on the surface 422 of the cover gamma in the second embodiment. The third concave sample 444 faces and aligns with the first groove 440, and the groove 104 of the groove can be formed. The groove 440 forms a space for accommodating the package 200. A plurality of stages are provided on the base 4: the probe needle 450 penetrates the base 410. Each of the two brothers is smeared outside the seat 4iG, and one end of the electrical connection pin 45G protrudes from the base connection substrate 4〇2; the other end & 丨 passes through the first groove 440 to electrically extend the pile筮+力知是大出, Γ Connected to the brother of a package 200. As described above, the package of the first package 2 〇〇 _. In other words, the first cover: the face is disposed with the contact of the lower surface 204 of the body 200. The M361020 is provided with a plurality of first contacts 206a, and the upper surface 202 is also provided with a plurality of second contacts 206b. In the second embodiment, the first probes 450 are electrically connected to the first contacts 206a of the first package 200. On the other hand, the first package 200 has a plurality of solder balls 208. The solder balls 208 are disposed on the first contacts 206a, and the first probes 450 are electrically connected to the first contacts 206a through the solder balls 208. The cover 420 selectively covers or reveals the first recess 440 on the base 410. In other words, the cover 420 can be stacked on the base 410 to cover the opening 430 of the first recess 440. The cover 420 can also be removed, • such that the opening 430 of the first recess 440 is revealed. The cover 420 can be coupled to the base 410 through a rotating shaft, a snap-fit structure, a snap-fit structure, or various manners. In the second embodiment, the cover 420 is snapped into the base 410 through the snap-fit structure 470. The snap-fit structure 470 can be disposed on the base 410 or the cover 420 to snap both. In the second embodiment, the snap-fit structure 470 is disposed on the cover 420. The snap-fit structure 470 can have a latch 472, and the base 410 can be provided with a card slot 478. The cassette 472 can be embedded in the card slot 478 to engage the cover 420 and the base 410. The snap-fit structure 470 can also have a trigger member 474 and a shaft 476. The spindle 476 is disposed between the cassette 472 and the trigger 474. When the wrench 474 is pulled to rotate relative to the rotating shaft 476, the trigger 474 causes the latch '472 to rotate, so that the latch 472 is turned into or out of the slot 478. - The cover 420 can be provided with a second recess 442 for receiving a second package 210. Please note that the second groove 442 is not connected to the first groove 440. In the second embodiment, the cover 420 further has a cover 424. The cover 424 can selectively cover or reveal the second recess 442. In other words, the cover plate 12 M361020 424 can be stacked on the second cover of the cover body to cover the opening 432 of the 坌-π城η τ 曰 2, the slot 2 (four) port 432. —42^^ The groove 442 _ mouth 432 is revealed. A plurality of second probes (four) are disposed on the heart cover 420, and the protrusions ==== the first, 442 passes through the cover body, and the 黛/ or the third grooves 444. In other words, the groove 44: ίτΓ=: 第 in the first groove 440 or the third electrical connection: f "the second groove 442 is used to respectively connect the first package body such as the second package body 210. In the column, the second probes 452 are located in the first groove body: the portion of the second groove 4, which can be aligned with the first package 2〇6b and: I; the contacts are employed to electrically connect the first probes. The two contacts, 11 and the second two probes 452 are located in the second recess 442, and are aligned with the third contact point 206c of the second package 210 to electrically connect the third contacts 206c. The H-probe 45G and the second probe 452 may be fixed length == ten' or may be a telescopic length probe. Those skilled in the art should be familiar with probes of various lengths or lengths. And the structure thereof will not be described again here. In order to assist the alignment and positioning of the body 420 and the seat 41〇, in the embodiment: 'the test fixture is further included-positioning structure, positioning structure ^ positioning column 460 is combined with the recessed hole 462. Specifically, the base 41〇 and the body 420 may be respectively provided with at least one positioning post 46〇 and at least one recessed hole 462, and are positioned The 460 is aligned with the recess 462. When the cover 42 is stacked on the base 410 and covers the first recess 44, the positioning post 46 is received in the recess 462 to position the cover 420 on the base 420. 41 〇上. 13 M3 61020 and not to mention the test fixture 400 disclosed in the present invention can accommodate and measure the first package body 2 〇〇 置 置 桩 E E E E E E E E E E E E E E E For the two-sided connection, the dip of the brother of a package 2 ^ ^ ^ JL 4 ΠΠ λα m - 仃 'then the operation, thus expanding the test
4, 47. . .. α 丹者，透過卡接結構470、轉 # 476和盍板424的埒要，铉 付 ^ 、 的°又置，苐—凹槽440和第二凹样442 可依照測試人員的兩本& ❿θ 穿體20“货 或封閉’以便更換第-封 裝體200和第二封裝體210。 以二：t新型已以多個實施例揭露如上，然其並非用 本新型，任何熟習此技藝者，在我離本新型之 =^口乾圍内，當可作各種之更動與潤饰，因此本新型 保護乾圍當視後附之申請專利範圍所界定者為準。 【圖式簡單說明】 第1圖係習知技術中測試治具的剖面示意圖。 第2圖至第3圖係繪示依照本新型之測試治具之第 —實施例的剖面示意圖。 第4圖至第5圖係繪示依照本新型之測試治具之第 二實施例的剖面示意圖。 【主要元件符號說明】 10 測試治具 12 •基板 14 座體 16 :蓋體 18 朱針 20 :封裝體 22 凹槽 24 :轉軸 14 M361020 26 ： 接點 102 ： 基板 120 ： 連接體 124 ： 第二面 132 ： 表面 142 ： 第二凹槽 146 ： 第四凹槽 152 ： 第二探針 162 ： 第二轉轴 172 ： 第二卡接結構 174b :第二卡榫 176b :第二卡槽 200 ： 第一封裝體 204 ： 下表面 206b :第二接點 208 ： 鮮球 400 ： 測試治具 410 ： 座體 422 ： 表面 430、 432 :開口 442 ： 第二凹槽 450 ： 第一探針 460 ： 定位柱 470 ： 卡接結構 474 ： 扳件 478 ： 卡槽4, 47. . . . α 丹 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , The tester's two & ❿ θ piercing bodies 20 are "closed" or "closed" in order to replace the first package 200 and the second package 210. The second: t new type has been disclosed in various embodiments as above, but it is not using the present invention Anyone who is familiar with this skill, in the absence of the new type of ^ ^ mouth, can be used for a variety of changes and retouching, so this new type of protection is defined by the scope of the patent application. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a schematic cross-sectional view showing a test fixture in the prior art. Fig. 2 through Fig. 3 are schematic cross-sectional views showing a first embodiment of the test fixture according to the present invention. 5 is a schematic cross-sectional view showing a second embodiment of the test fixture according to the present invention. [Main component symbol description] 10 Test fixture 12 • Substrate 14 Seat 16: Cover 18 Zhu Pin 20: Package 22 Groove 24: Rotary shaft 14 M361020 26 : Contact 102 : Substrate 120 : Connector 1 24: second face 132: surface 142: second groove 146: fourth groove 152: second probe 162: second rotating shaft 172: second snapping structure 174b: second latch 176b: second card Slot 200: First package 204: Lower surface 206b: Second contact 208: Fresh ball 400: Test fixture 410: Seat 422: Surface 430, 432: Opening 442: Second groove 450: First probe 460 : positioning post 470 : snap-in structure 474 : puller 478 : card slot
100 :測試治具 110 :座體 122 :第一面 130 :蓋體 140 :第一凹槽 144 :第三凹槽 150 :第一探針 160 :第一轉軸 170 :第一卡接結構 174a :第一卡榫 176a :第一卡槽 180 、 182 :開口 202 :上表面 206a :第一接點 206c :第三接點 210 :第二封裝體 402 ··基板 420 :蓋體 424 :蓋板 440 :第一凹槽 444 ··第三凹槽 452 :第二探針 462 :凹孑L 472 :卡榫 4 7 6 :轉轴 15100: Test fixture 110: Seat 122: First face 130: Cover 140: First groove 144: Third groove 150: First probe 160: First shaft 170: First snap structure 174a: First cassette 176a: first card slot 180, 182: opening 202: upper surface 206a: first contact 206c: third contact 210: second package 402 · substrate 420: cover 424: cover 440 : first groove 444 · · third groove 452 : second probe 462 : concave 孑 L 472 : cassette 4 7 6 : shaft 15