M328004 八、新型說明： 【新型所屬之技術領域】 本新型是有關於一種量測系統，特別是有關於用以量 測發光一極體之溫度特性的量測系統。 【先前技術】 發光二極體(Light Emitting Diode ; LED)具有工作電壓 低，耗電量小，發光效率高，反應時間短，光色純，結構 牢固，抗衝擊，耐振動，性能穩定可靠，重量輕，體積小 及成本低等特點。隨著技術的進步，發光二極體可展現的 亮度等級越來越高，其應用領域也越來越廣泛，例如：大 面積圖文顯不全彩屏，狀態指示、標誌照明、信號顯示、 液晶顯示器的背光源或車内照明。 為了得知環境溫度對於發光二極體之光電特性的影 響，需要對發光二板體進行溫度特性的量測。當進行發光 二極體的溫度特性量測時，需利用例如:環境控制箱、烤 • 箱或冷熱二極體等溫控設備，來控制發光二極體的環境溫 度’並藉由光學量測系統來量測環境溫度對於發光二極體 之光電待性的影響。當進行發光二極體的低溫測試時，則 需另搭配壓縮機或其他冷卻裝置，來降低發光二極體的環 然而，在一般發光二極體的溫度特性量測過程中，發 光二極體元件和光學量測系統的偵測器係暴露於一般大^ 中，當壤境溫度產线化時，例如當環境溫度纟室溫下降 至零度以下時，則容易發生水氣凝結或結霜的情形，因而 M328004 造成光學量測上的誤差，影響量測的準確性。 【新型内容】 因此，本新型之一方面係在於提供一種量測系統，用 ^量測發光二極體的溫度特性，並可避免在量測時發生水 氣凝結或結霜的情形，因而確保量測準確度。 根據本新型之實施例，此量測系統係用以量測發光二 極體的溫度特性，其中量測系統至少包含環境控制裝置、 介質、溫度控制裝置及光學量測裝置。環境控制装置具有 容置空間，其中發光二極體係設置於容置空間中。介質係 填充於環境控制裝置的容置空間中，並包覆住發光二極 體，其中介質係絕緣材質，且介質在容置空間内的溫度操 作範圍係實質介於—55度⑺）與」40度（。〇之間。溫度控制 裝置係用以控制容置空間内的溫度。光學量測裝置係用以 量測發光二極體的光學特性。 因此本新型之量測系統可用以量測環境溫度對於發光 • 二極體之光學特性的影響，並可確保在環境溫度變化時的 量測準確度。 【實施方式】 為讓本新型之上述和其他目的、特徵及優點能更明顯 易懂，本說明書特舉較佳實施例，並配合所附圖式，作詳 細說明如下： 請參照第1圖和第2圖，第1圖係繪示依照本新型第 貝施例之里測糸統的糸統方塊不意圖’弟2圖係、纟會示依 M328004 妝本新型第一實施例之量測系統的系統示意圖。本實施例 的里測系統100係用以量測發光二極體200的溫度特性， 藉以了解環境溫度對於發光二極體200之光學特性的影 響’其中量測系統100至少包含有環境控制裝置丨1〇、介質 120、溫度控制裝置130、光學量測裝置14〇、控制單元15〇 及電源電錶(Source Meter) 160。發光二極體200係設置於環 圭兄控制裝置110内，以進行量測，介質12〇係填充於環境 控制裝置110内，並包覆住發光二極體200，溫度控制裝置 130傣用以控制環境控制裝置11〇内的溫度，光學量測裝置 140係用以量測發光二極體2〇〇的光學特性，控制單元15〇 係電性連接於溫度控制裝置130、光學量測裝置140及電源 電錶160，以進行控制動作，電源電錶16〇係用以偵測發光 二極體200的電性表現。 如第2圖所示，本實施例的環境控制裝置HQ具有容 置空間111，用以容設發光二極體200和介質12〇，藉以使 發光二極體200設置於介質120中，並透過介質12〇來量 測發光二極體200的溫度特性’亦即量測發光二極體200 在不同環境溫度下的光學特性表現。此外，環境控制|置 110可設有均溫裝置112，例如為··磁力攪拌棒或藉由馬達 來帶動葉片，其設置於容置空間111中，藉以對容置空間 111内的介質120進行攪拌動作，而達到快速均溫效果。 如第2圖所示，本實施例的介質120係填充於環境控 制裝置110的容置空間中，並包覆住發光二極體2〇〇， 其中介質120較佺為絕緣流體材質，且介質12〇在容置空 間111内的溫度操作範圍（亦即發光二極體200環境溫度變 M328004 化）係實質介於負55度（—551 )與i4〇度（χ：)之間，較佳為 實質介於負40度卜贼浪⑵度⑺之間^在本實施例 中，介質120例如為油質材料，較佳為石夕油，此時環境控 制裝置110例如可為油浴槽，以容置矽油和發光二極體 200。由於本實施例的介質12〇在高溫（例如1〇〇度以上)或 低溫（例如零度以下）時可未產生變化，且不會與發光二極體 200產生反應，因而本實施例的介質12〇可適合作為發光二 極體200的環境介質，以進行量測發光二極體2〇〇的溫度 特性。 如第2圖所示，本實施例的溫度控制裝置13〇設有溫 度控制器131、加熱裝置132及冷卻裝置133，温度控制器 131係電性連接於加熱裝置132和冷卻裝置133，以控制加 熱裝置132來加熱容置空間lu内的介質12〇，或者控制冷 卻裝置133來冷卻介質120，藉以提高或降低量測系統]〇〇 的環境溫度。加熱裝置132例如為加熱線圏或冷熱二極體， 用以快速地提高介質12〇的溫度。冷卻裝置丨3 3例如為冷 卻壓縮機、冷熱二極體或液態氣體冷卻裝置，用以快速地 降低介質120的溫度。 如第2圖所示，本實施例的光學量測裝置14〇係用以 昼測在介質120中之發光二極體2〇〇的光學特性，例如·· 光通量、光分佈、亮度、光譜分佈、色度座標、顯色指數 或發光效率等。光學量測裝置140設有偵測器141和隔絕 透鏡142，偵測器141係設置於環境控制裝置110中，並對 應於發光二極體200,以直接偵測發光二極體200的光學特 性。隔絕透鏡142係設置偵測器141上，用以隔絕介質12〇, M328004 並允許光線透過，其中债測器141和隔絕透鏡142之間可 進行真空處理或設有除濕劑材料，以防止水氣產生。控制 單兀150係用以控制溫度控制裝置13〇、光學量測裝置 及電源電錶160,控制單元15〇例如為電腦主機或微控制晶 片’並可设有顯示裝置（未繪示），以顯示量測結果。電源電 錶160係電性連接於發光二極體2〇〇，以即時偵測發光二極 體200的電性表現(例如：電壓和電流表現)。 值得注意的是，本實施例的量測系統丨〇〇可分別量測 發光二極體200在不同環境溫度下的光學特性，藉以進行 比對，因而可得到發光二極體2〇〇的溫度特性。 因此，本實施例之量測系統100可藉由絕緣的介質12〇 來作為發光二極體200的環境介質，以避免在環境溫度產 生變化時發生水氣凝結或結霜的情形，因而可確保量測準 確性。 睛參照第3圖’其繪示依照本新型之第二實施例之量 測系統的系統示意圖。以下僅就本實施例舆第一實施例之 相異處進行說明，關於相似處在此不再贅述。相較於第一 實施例，第二實施例之介質120a例如為超純水（切1：1^111^ Water)，藉以作為發光二極體200的環境介質，以確保量測 準確性。 由上述本新型之實施例可知，本新型之量測系統可用 以量測環境溫度對於發光二極體之光學特性的影響，並可 確保在環境溫度變化時的量測準確度。 雖然本新型已以較佳實施例揭露如上，然其並非用以 限定本新型，任何熟習此技藝者，在不脫離本新型之精神 M328004 和範圍内，當可作各種之更動與潤飾’因此本新型之保護 範圍當視後附之申請專利範圍所界定者為準。 【圖式簡單說明】 為讓本新型之上述和其他目的、特徵、優點與實施例 能更明顯易懂，所附圖式之詳細說明如下·· 第1圖係繪示依照本新型第一實施例之量測系統的系 統方塊示意圖。 第2圖係繪示依照本新型第一實施例之量測系統的系 統示意圖。 第3圖係繪示依照本新型第二實施例之量測系統的系 統示意圖。 【主要元件符號說明】 100 ： 量測系統 110: 環境控制裝置 111 ： 容置空間 112 ： 均溫裝置 120、 ‘ 120a :介質 130: 溫度控制裝置 131 溫度控制器 132 : 加熱裝置 133 冷卻裝置 140 ： 光學量測震置 141 偵測器 142 : 隔絕透鏡 150 控制單元 160 : 電源電錶 200 發光二極體 \〇M328004 VIII. New description: [New technical field] The present invention relates to a measuring system, in particular to a measuring system for measuring the temperature characteristics of a light-emitting body. [Prior Art] Light Emitting Diode (LED) has low operating voltage, low power consumption, high luminous efficiency, short reaction time, pure light color, firm structure, impact resistance, vibration resistance, stable and reliable performance. Light weight, small size and low cost. With the advancement of technology, the brightness level of the LED can be displayed more and more, and its application fields are more and more extensive, such as: large-area graphic display, full color screen, status indication, logo illumination, signal display, liquid crystal display Backlight or interior lighting. In order to know the influence of the ambient temperature on the photoelectric characteristics of the light-emitting diode, it is necessary to measure the temperature characteristics of the light-emitting two-plate body. When measuring the temperature characteristics of the light-emitting diode, it is necessary to control the ambient temperature of the light-emitting diode by using temperature control devices such as an environmental control box, a roasting box or a hot and cold diode, and to measure by optical measurement. The system measures the effect of ambient temperature on the photo-resistance of the light-emitting diode. When performing the low temperature test of the light-emitting diode, a compressor or other cooling device is required to reduce the ring of the light-emitting diode. However, in the process of measuring the temperature characteristics of the general light-emitting diode, the light-emitting diode is used. The detectors of components and optical measurement systems are exposed to the general system. When the temperature of the soil is linearized, for example, when the ambient temperature 纟 room temperature drops below zero, water condensation or frosting is prone to occur. In this case, M328004 causes an error in the optical measurement, which affects the accuracy of the measurement. [New content] Therefore, one aspect of the present invention is to provide a measuring system for measuring the temperature characteristics of a light-emitting diode and avoiding condensation or frosting during measurement, thereby ensuring Measurement accuracy. According to an embodiment of the present invention, the measurement system is configured to measure temperature characteristics of the light-emitting diode, wherein the measurement system includes at least an environmental control device, a medium, a temperature control device, and an optical measurement device. The environment control device has a receiving space, wherein the light emitting diode system is disposed in the accommodating space. The medium is filled in the accommodating space of the environmental control device and covers the illuminating diode, wherein the medium is an insulating material, and the temperature operating range of the medium in the accommodating space is substantially -55 degrees (7)) 40 degrees (between 〇. The temperature control device is used to control the temperature in the accommodating space. The optical measuring device is used to measure the optical characteristics of the illuminating diode. Therefore, the measuring system of the present invention can be used for measurement The influence of the ambient temperature on the optical characteristics of the light-emitting diode and the measurement accuracy in the change of the ambient temperature. [Embodiment] The above and other objects, features and advantages of the present invention can be more clearly understood. The present specification is specifically described with reference to the accompanying drawings, and is described in detail below. Referring to FIG. 1 and FIG. 2, FIG. 1 is a schematic diagram showing a system according to the first embodiment of the present invention. The system of the system is not intended to be a system diagram of the measurement system of the first embodiment of the M328004 makeup. The system 100 of the present embodiment is used to measure the LED 200. Temperature characteristics The influence of the ambient temperature on the optical characteristics of the light-emitting diode 200 is understood. The measurement system 100 includes at least an environmental control device, a medium 120, a temperature control device 130, an optical measurement device 14A, and a control unit 15 And a power meter (Source Meter) 160. The light-emitting diode 200 is disposed in the ring-shaped brother control device 110 for measurement, and the medium 12 is filled in the environment control device 110 and covers the light-emitting diode. 200, the temperature control device 130 is used to control the temperature in the environmental control device 11, the optical measurement device 140 is used to measure the optical characteristics of the light-emitting diode 2, the control unit 15 is electrically connected to the temperature The control device 130, the optical measuring device 140 and the power meter 160 perform a control operation, and the power meter 16 is used to detect the electrical performance of the light-emitting diode 200. As shown in Fig. 2, the environment of the embodiment The control device HQ has a accommodating space 111 for accommodating the illuminating diode 200 and the medium 12 〇, so that the illuminating diode 200 is disposed in the medium 120, and the illuminating diode 200 is measured through the medium 12 〇. The temperature characteristic 'that is, the optical characteristic of the light-emitting diode 200 at different ambient temperatures is measured. In addition, the environmental control device 110 can be provided with a temperature equalizing device 112, for example, a magnetic stir bar or driven by a motor. The blade is disposed in the accommodating space 111 to agitate the medium 120 in the accommodating space 111 to achieve a rapid temperature equalization effect. As shown in FIG. 2, the medium 120 of the embodiment is filled in the environment control. The accommodating space of the device 110 covers the illuminating diode 2 〇〇, wherein the medium 120 is made of an insulating fluid material, and the temperature of the medium 12 is within the accommodating space 111 (ie, the illuminating diode) The body temperature of the body 200 becomes M328004) is substantially between minus 55 degrees (-551) and i4 degree (χ:), preferably between 40 degrees and thief waves (2) degrees (7). In the embodiment, the medium 120 is, for example, an oleaginous material, preferably a diarrhea oil. At this time, the environmental control device 110 can be, for example, an oil bath to accommodate the eucalyptus oil and the light emitting diode 200. Since the medium 12 of the present embodiment may not change when it is at a high temperature (for example, 1 degree or more) or a low temperature (for example, below zero degree), and does not react with the light emitting diode 200, the medium 12 of the present embodiment. 〇 can be suitably used as an environmental medium for the light-emitting diode 200 to measure the temperature characteristics of the light-emitting diode 2 . As shown in FIG. 2, the temperature control device 13 of the present embodiment is provided with a temperature controller 131, a heating device 132, and a cooling device 133. The temperature controller 131 is electrically connected to the heating device 132 and the cooling device 133 to control The heating device 132 heats the medium 12 in the accommodating space lu, or controls the cooling device 133 to cool the medium 120, thereby increasing or decreasing the ambient temperature of the measuring system. The heating device 132 is, for example, a heating coil or a hot and cold diode for rapidly increasing the temperature of the medium 12 。. The cooling device 丨3 3 is, for example, a cooling compressor, a hot and cold diode or a liquid gas cooling device for rapidly reducing the temperature of the medium 120. As shown in FIG. 2, the optical measuring device 14 of the present embodiment is used to measure the optical characteristics of the light-emitting diodes 2 in the medium 120, for example, luminous flux, light distribution, brightness, and spectral distribution. , chromaticity coordinates, color rendering index or luminous efficiency. The optical measuring device 140 is provided with a detector 141 and an isolation lens 142. The detector 141 is disposed in the environment control device 110 and corresponds to the LED 200 to directly detect the optical characteristics of the LED 200. . The insulating lens 142 is disposed on the detector 141 for isolating the medium 12, M328004 and allowing light to pass therethrough. The vacuum detector 141 and the insulating lens 142 can be vacuum-treated or provided with a desiccant material to prevent moisture. produce. The control unit 150 is used to control the temperature control device 13 , the optical measuring device and the power meter 160 , and the control unit 15 is, for example, a computer host or a micro control chip ′ and may be provided with a display device (not shown) for display. Measurement results. The power meter 160 is electrically connected to the LEDs 2 to instantly detect the electrical performance (e.g., voltage and current performance) of the LEDs 200. It should be noted that the measurement system of the present embodiment can separately measure the optical characteristics of the LEDs 200 at different ambient temperatures, thereby performing comparison, thereby obtaining the temperature of the LEDs 2〇〇. characteristic. Therefore, the measuring system 100 of the present embodiment can serve as an environmental medium for the light-emitting diode 200 by using the insulating medium 12 , to avoid condensation or frosting when the ambient temperature changes, thereby ensuring Measurement accuracy. Referring to Figure 3, there is shown a system diagram of a measurement system in accordance with a second embodiment of the present invention. In the following, only the differences between the first embodiment and the first embodiment will be described, and the similarities will not be described herein. Compared with the first embodiment, the medium 120a of the second embodiment is, for example, ultrapure water (cut 1:1^111^ Water), thereby serving as an environmental medium for the light-emitting diode 200 to ensure measurement accuracy. It can be seen from the above embodiments of the present invention that the measuring system of the present invention can measure the influence of the ambient temperature on the optical characteristics of the light-emitting diode and can ensure the measurement accuracy when the ambient temperature changes. Although the present invention has been disclosed in the above preferred embodiments, it is not intended to limit the present invention, and any person skilled in the art can make various changes and refinements without departing from the spirit of the present invention. The scope of the new protection is subject to the definition of the scope of the patent application. BRIEF DESCRIPTION OF THE DRAWINGS In order to make the above and other objects, features, advantages and embodiments of the present invention more obvious, the detailed description of the drawings is as follows: FIG. 1 is a first embodiment of the present invention. A block diagram of the system of the measurement system of the example. Fig. 2 is a schematic view showing the system of the measuring system according to the first embodiment of the present invention. Fig. 3 is a schematic view showing the system of the measuring system according to the second embodiment of the present invention. [Description of main component symbols] 100: Measurement system 110: Environmental control device 111: accommodating space 112: temperature equalizing device 120, '120a: medium 130: temperature control device 131 temperature controller 132: heating device 133 cooling device 140: Optical measuring device 141 Detector 142 : Isolated lens 150 Control unit 160 : Power meter 200 Light-emitting diodes 〇