M327474 八、新型說明： 【新型所屬之技術領域】 本創作係一種液晶面板之測試治具，尤指一種藉由簡 單之結構’使得成本大幅降低之液晶面板的測試治具者。 【先前技術】 按，液晶面板是液晶顯示器中最重要的零組件之一， 由於液晶面板的優劣會直接影響其顯示品質，因此，為使液 晶面板出廠後能保持一定之品質，一般液晶面板在被製造出 來後，皆需先利用測試治具測試其功能是否正常。 而習知液晶面板之測試治具，其係包括有：一底座；一 測試電路，該測試電路固定於該底座上；一承載台，用來放 置一待測液晶面板，並且以沿一預定方向移動之方式連接於 該底座上；一定位模組，當該定位模組位於一第一狀態時其 係與該待測液晶面板分離，當該定位模組位於一第二狀態時 係沿該特定方向推擠該待測液晶面板以及該承載台，並且使 該待測液晶面板之至少-測試點電連接於該測試電路；以及 複數根定位針，該等定位針之部份係以可旋轉之方式固定於 該承載台之一側，該等定位針之另一部分係固定於相鄰之另 一側，藉此，透過該定位模組結構簡單及輕巧， 低測試治具之體積與重量。 然而，該習知液晶面板之測試治具雖可大幅降低測試户 重量，但是其上具有複數個汽缸，由於待測液： ::;、有細重規格，導致每一種規袼液晶面板之㈣ ρ:個別女裝，數個汽红，如此造成使用汽虹過多，大幅辦 加使用成本，實在非常不便利。 曰 【新型内容】 、、m創Γ人/f於前述先前技術之缺點，乃依其從事各種 ㈣口具之“經驗和技術累積，針對上述缺失染夂 種解決的方法，在經過不斷的研究、實驗'後 ； M327474 以 ==作之一種全新液晶面板之測試治具之創作， 期月b摒除先前技術所產生之缺失。 入壯^創^之―目的’係提供—種液晶面板之測試治呈，以 々結構間皁而能大幅降低成本。 "以 根據上述之目的，本創作之測試治 載台，該承載台中奂#古_糾7必a ，、係叹有一承 、°又有仏承載待測液晶面板之承载部， W、—面積略小於待測液晶面板面積之矩形開口 液晶面板：置放於該開口上方；承載台於開口—側 另二I真可私動之第—電氣連接體，承載台於相鄰該側邊之 ^則政則設有-可移動之第二電氣連接體；其中，第 =連接，面對開口-端底端設有複數支探針，另端則 探Λ與連接璋電氣連接;而第二電氣連 一 ^ &鳊5又有複數支探針，另端則設置有至少 2接埠’該等探針與連接埠電氣連接；俾進行測試時，可 呈=液晶面板安裝於承載部之開σ上方，以及將本測試治 :二1: 一測試機台上，並使第一、二電氣連接體之連接埠 /、^14機台電氣連接，再藉由測試機台之汽缸推動第一；二 ，氣連接體位移至待測液晶面板二邊緣上，直到第一'二電 氣連接體之探針接觸待測液晶.面板邊緣之電路，使待測液晶 面板之電路經由第一、二電氣連接體與測試機台電氣連接， 而使測試機台可傳送測試訊號至待測液晶面板，進而能於開 :下方設置—f光面板’進行測試該待測液晶面板是否具有 2，如此’透過不需於測試治具上設置汽缸，令整體結構 間早，大量使用於複數種規格之待測液晶面板時，能大幅降 低成本。 Μ為便貴審查委員能對本創作之目的、形狀、構造裝置 特彳政及其功效，做更進一步之認識與瞭解，茲舉實施例配合 圖式，詳細說明如下： 【實施方式】 本創作乃有關一種「液晶面板之測試治具」，請參閱第 M327474 、3圖所示，本創作之測試治具ι〇，其係設有一承载台 Η ’该承載台11中央設有一供承載待測液晶面板2〇之承载部 12’承載部12上設有一面積略小於待測液晶面板2〇面積之矩 开y開口 13，使待測液晶面板2〇可置放於該開口丨3上方；承M327474 VIII. New Description: [New Technology Field] This creation is a test fixture for liquid crystal panels, especially a test fixture for liquid crystal panels that is significantly reduced in cost by a simple structure. [Prior Art] Press, the liquid crystal panel is one of the most important components in the liquid crystal display. Since the quality of the liquid crystal panel directly affects the display quality, the liquid crystal panel can maintain a certain quality after leaving the factory. After being manufactured, it is necessary to test the function of the test fixture first. The test fixture of the conventional liquid crystal panel includes: a base; a test circuit, the test circuit is fixed on the base; and a carrying platform for placing a liquid crystal panel to be tested, and in a predetermined direction a moving module is connected to the base; a positioning module is separated from the liquid crystal panel to be tested when the positioning module is in a first state, and is adjacent to the specific positioning module when the positioning module is in a second state Directionally pushing the liquid crystal panel to be tested and the carrying platform, and electrically connecting at least a test point of the liquid crystal panel to be tested to the test circuit; and a plurality of positioning pins, the portions of the positioning pins being rotatable The method is fixed on one side of the carrying platform, and the other part of the positioning pins is fixed on the adjacent side, whereby the structure of the positioning module is simple and light, and the volume and weight of the test fixture are low. However, the test fixture of the conventional liquid crystal panel can greatly reduce the weight of the tester, but has a plurality of cylinders thereon, due to the liquid to be tested: ::;, has fine and heavy specifications, resulting in each of the standard liquid crystal panels (4) ρ: Individual women's wear, a few steam red, so the use of steam rainbow too much, a large cost of use, it is very inconvenient.曰[New content], m, Γ / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / After the experiment's; M327474 with == for the creation of a new type of LCD panel test fixture, the period of the month b. In addition to the lack of prior art. Into the Zhuang ^ Chuang ^ - the purpose of the system provides a test of liquid crystal panels In the case of the inter-structure soap, the cost can be greatly reduced. "In accordance with the above purpose, the test bench of the creation, the carrier 奂#古_纠7 must be a, the sigh has a bearing, ° and仏 carrying the carrying portion of the liquid crystal panel to be tested, W, a rectangular open liquid crystal panel having an area slightly smaller than the area of the liquid crystal panel to be tested: placed above the opening; the carrying platform is at the opening - the other side is the second privately movable The electrical connector, the carrier is adjacent to the side of the side, and the movable second electrical connector is provided; wherein, the first connection, the bottom end of the opening-end end is provided with a plurality of probes, and the other end Then explore the electrical connection with the connection; The second electrical connector 1 & 鳊 5 has a plurality of probes, and the other end is provided with at least 2 connectors 该 'the probes are electrically connected to the connection 俾; 俾 when testing, can be = liquid crystal panel mounted on Above the opening σ of the load-bearing part, and the test is to be carried out: 2: a test machine, and the first and second electrical connectors are connected 埠/, ^14 machine, and then by the test machine The cylinder pushes the first; second, the gas connection body is displaced to the two edges of the liquid crystal panel to be tested until the probe of the first 'two electrical connector contacts the circuit of the edge of the liquid crystal to be tested, so that the circuit of the liquid crystal panel to be tested passes the first The first and second electrical connectors are electrically connected to the test machine, and the test machine can transmit the test signal to the liquid crystal panel to be tested, and then can be set to open under the -f light panel to test whether the liquid crystal panel to be tested has 2 In this way, by setting the cylinders on the test fixtures and making the whole structure early and using them in a large number of LCD panels to be tested, the cost can be greatly reduced. Shape, structure The device is specially designed and understood, and further understanding and understanding will be made. The following is a detailed description of the following examples: [Embodiment] This creation is related to a "testing tool for liquid crystal panels", see M327474 As shown in Fig. 3, the test fixture of the present invention is provided with a loading platform. The center of the carrying platform 11 is provided with a bearing portion 12 for carrying the liquid crystal panel 2 to be tested. The opening y opening 13 is slightly smaller than the area of the liquid crystal panel 2 to be tested, so that the liquid crystal panel 2 to be tested can be placed above the opening 丨3;
開口 13 一側邊設有一可移動之第-電氣連接體30,承 口 11於相鄰該側邊之另一側邊則設有一可移動之第二 ，連接體40;其中’第-電氣連接體30面對開川―端底端 設有複數支探針31，另端則設置有至少一連接璋32,該等探 針3〇! ”連接埠32電氣連接’·而第二電氣連接體40面對開口 13 一端底端設有複數支探針41，另端則設置有至少一連接埠“ ，該等探針41與連接埠42電氣連接。 進行測試時’請㈣第4圖所示，可將待測液晶面板2〇 女滅，承載部12之開口 13上方’以及將本測試治具1〇安裝於 ^。式機° (圖中未不）上，並使第—、二電氣連接體30 連接4 3 2、4 2與载機台電氣連接，再藉由測試機台 之:：推動第一、二電氣連接體3〇 4〇位移至待測液晶面板 :、'彖上，直到第一、二電氣連接體、4〇之探針3丨、41 接=測液晶面板2G邊緣之電路，使待測液晶面板2〇之電路 由弟一、二電氣連接體30、40與測試機台電氣連接，而使 口 $機口可傳送測试訊號至待測液晶面板上，進而能於開 =:方設置一背光面板，進行測試該待測液晶面板2 〇是否 縮彈ί請=縮2性3。圖所示，該等探針31、41⑽ 二t閱第1、2、3圖所示，該承載台11二對應邊角上 °又 槌把14 ’以供可提起搬運該承載台11至測試機台上 ’或自測试機台上取出。 Μ亡復明參閱第1、2、3圖所示，該承載部12於開口 13邊緣 L f少一凹陷部15,俾完成測試後，卩將手指插入該等凹 曰邛5中，而將完成測試之待測液晶面板20取出。 M327474 ㈣㈣第3圖所示’㈣—電氣連接體3g中設有導線 :排線）’該導線33—端與探針31相接，另一端則 y、連接埠32相連接，令該等探針31與連接棒犯電氣連接。 ，請參_3圖所示’鮮二電氣連接體辦設有導線 二排線），_43一端與探針41相接，另一端則 人連接埠42_接’令該轉針41與連料42電氣連接。 Μ 此’透過不需於本測試治具1G上設置汽缸，令整體 = 成:量使用於複數種規格之待測液晶一 ^ 綜合上所述，本創作之液晶面板之輯治具，確實且 未有之創新構造，其既未見於任何刊物，且市 =見有任何類似的產品，是以’其具有新穎性_慮。另 所以^料具有之獨特特徵以及功能遠㈣料可二擬， ㈣性’而符合我國專利法有關 寻利之申明要件之規疋，乃依法提起專利申請。 構、=上所述，僅為本創作最佳具體實施例，惟本創作之 内，可輕易思及之變化或修飾，皆可涵幺：乍領域 範圍。 /M盍在以下本案之專利 【圖式簡單說明】 ，丨圖為本創作測試治具之立體外觀圖。 圖為本創作測試治具之平面示意圖。 第3圖為本創作測試治具之側面示意圖。 第4圖為本創作測試治具進行測試之示意圖。 【主要元件符號說明】 1 〇、測試治具 11、 承載台 12、 承載部 13、 開口 M327474 、提把 、凹陷部 、待測液晶面板 、第一電氣連接體 、第二電氣連接體 、探針 、連接埠 、導線 、探針 、連接埠 、導線One side of the opening 13 is provided with a movable first-electrical connecting body 30, and the socket 11 is provided with a movable second connecting body 40 on the other side of the adjacent side; wherein the first electrical connection The body 30 is provided with a plurality of probes 31 at the bottom end of the Kawagawa end, and at least one connection port 32 is provided at the other end, and the probes are connected to the 埠32. The connection 埠32 is electrically connected to the second electrical connector. The facing opening 13 has a plurality of probes 41 at the bottom end and at least one connector 另" at the other end. The probes 41 are electrically connected to the port 42. When performing the test, please refer to Fig. 4 of Fig. 4. The liquid crystal panel to be tested 2 can be turned off, the upper end of the opening 13 of the carrying portion 12, and the test fixture 1〇 can be mounted to ^. The machine (not shown), and the first and second electrical connectors 30 are connected 4 3 2, 4 2 and the carrier is electrically connected, and then by the test machine:: push the first and second electrical The connection body 3〇4〇 is displaced to the liquid crystal panel to be tested: “彖, until the first and second electrical connectors, the probes of the 4〇, 3丨, 41 are connected to the circuit of the edge of the liquid crystal panel 2G, so that the liquid crystal to be tested The circuit of the panel 2 is electrically connected to the test machine by the first and second electrical connectors 30, 40, and the port can transmit the test signal to the liquid crystal panel to be tested, and then can be set to open =: Backlight panel, test whether the liquid crystal panel 2 to be tested is shrinking or not. As shown in the figure, the probes 31, 41 (10) are shown in Figures 1, 2, and 3, and the carrier table 11 has two corners corresponding to the corners and is used for lifting and transporting the carrier 11 to the test. On the machine' or take it out of the test machine. Referring to Figures 1, 2, and 3, the bearing portion 12 has a recess 15 at the edge Lf of the opening 13. After the test is completed, the finger is inserted into the recess 5 and will be completed. The liquid crystal panel 20 to be tested is taken out. M327474 (4) (4) Figure 3 (4) - Electrical connection body 3g is provided with a wire: a cable) 'The wire 33-end is connected to the probe 31, and the other end is y, the connection port 32 is connected, so that the probe The needle 31 is electrically connected to the connecting rod. Please refer to the _3 picture for the 'fresh two electrical connection system with two wires of the wire), the _43 end is connected with the probe 41, and the other end is connected with the 埠42_接' to make the needle 41 and the lining 42 electrical connections. Μ This 'through the need to set the cylinder on the test fixture 1G, so that the overall = into: the amount of liquid crystal to be tested in a variety of specifications, as described above, the liquid crystal panel of this creation, the fixture There are no innovative structures, which are not found in any publications, and the city = see any similar products, is 'have novelty. In addition, the material has the unique characteristics and functions far (four) can be second, (4) sexuality and in line with the provisions of the Chinese Patent Law on the requirements of the claim for profit-seeking, is to file a patent application according to law. The above description is only the best embodiment of this creation, but within the scope of this creation, it can be easily changed or modified, and it can cover: the scope of the field. /M盍The following patents in this case [Simple description of the diagram], the diagram is a three-dimensional appearance of the creation test fixture. The figure is a schematic diagram of the creation test fixture. Figure 3 is a side view of the creation test fixture. Figure 4 is a schematic diagram of the test of the creation test fixture. [Main component symbol description] 1 〇, test fixture 11, carrier 12, carrying portion 13, opening M327474, handle, recess, liquid crystal panel to be tested, first electrical connector, second electrical connector, probe , connecting wires, wires, probes, ports, wires