M316394 八、新型說明： ‘【新型所屬之技術領域】 • 本創作係揭露一種天線量測系統及其發射天線結構，特別 是關於用以量測天線遠場場型之天線量測系統及其發射天線結 構。 【先前技術】M316394 VIII. New description: '[New technology field] • This creation department discloses an antenna measurement system and its transmitting antenna structure, especially the antenna measurement system and its emission for measuring the far field type of the antenna. Antenna structure. [Prior Art]
由於通訊技術的發展，天線設計已普遍應用在通訊產品中， 天線設計餅娜㈣輸收關題，因此設計者需善肤:的增 益、輻射翻及指向性等麵雜，赠讓天線發糾最大^ 用。為準確量測財際制天線之練場型，職場地須為一隔 離室’其用以屏蔽外部之電子電機造成之雜訊干擾。 m 立如第-圖所示’其係習知技藝之一種量測天線遠場場型之示 意圖，圖中，-隔離室n六_壁面加裝吸波元件12，用以防止 内壁面形成反射波，藉此避免影_試結果的準確性，且，吸波 元件12 一般採用介質損耗型，如聚氨《員之泡珠塑料或亞鐵磁碑 等’吸波讀12通常作朗錐狀、稜鱗狀或方楔形狀，以保持 連續漸變之焦耳阻抗結構。再者， ^ 者在隔離室11内設置已知特性的 發射天線13及一待測天線14，复 寸们 ϋ卩“中毛射天線13用於發出工作波 線14之最大長度為D，又’由於量測 退場場型需以平面波來進行量 、、 9n2/ ', 、]且待测天線14與發射天線13 必狐2D/A鄉，—視為-平面波，因此量 6 M316394 測所需的空間將隨量測頻段或天線種類的不同而改變。 然而’為符合量測各頻段或不同種類天線的需求，通常需要 很大的隔離室，以滿足遠場場型測試所需的距離條件，因此需要 較大的空間及吸波元件，增加測量的成本及空間。目前，另有先 行畺測待測天線之近場場型，再經由快速傅利葉轉換（Fast Fourier Transform，FFT)以求得待測天線之遠場場型的方法，但 此轉換方法將增加軟體分析的複雜度，因此需在分析上耗費較高 的成本及時間。 由此，在成本、空間及方便性等因素的考量下，本創作提出 一種天線量測系統及其發射天線結構，用以作為上述問題之解 決方法與依據。 【新型内容】 本創作之目的為提供一種天線量測系統及其發射天線結 構特別疋猎由反射天線之抛物面設計，以減小量測天線遠場場 型所需之距離條件，解決測量所需之成本及空間太大的問題，且 不需增加軟體分析的複雜度，增加量測上的方便性。 緣是，為達上述目的，本創作揭露一種天線量測系統，其設 置於所有壁面皆鋪滿吸波元件之測試空間中，此系統包含有一 待測天線、-反射元件、—發射源以及—阻抗結構。其中，發射 源可朝反射元狀拋物面糾錄敎，而闕元件之抛物面， 則用於反射此無線電波，使無線電波成為平面波，再藉由待測天 M3163 94 線接收此平面波，以作為量測分析儀器量測待啦線遠場場型之 ，據’且’阻抗結構連接難物面之外緣’以電雜配反射元件， 藉此可降低拖物面產生邊緣繞射干_程度，增加量測的準 確性。 、承上所本創作之阻抗結構為一種貼片電阻，待測天線可 為主動、鶴棒狀天線、觀錢、轉雙錐天線、對數螺旋天 線或勢Λ天線等，且發射源及反射元件可採用主轴偏離聚焦一次 反射的方敍職線f舰而使其成騎面波，翻減少成本及 量測空間且操作方便、快逮等功效。 錄為使貴審查委員對本創作之實施及達成方式有更進一步 之瞭解與認識，下文謹提供較佳之實施例及_圖式以為辅佐之 用’並以詳細之說明文字配合說明如後。 【實施方式】 為讓本創作之上述目的、特徵、和優點能更明㈣懂，下文 依本創作财之天線量_統及其發射轉結構，鱗較佳實 施例並配合所__式，作詳細_如下，其巾_的元件將 以相同的元件符號加以說明。 請—併參閱第二圖及第三圖’第二_為本創作所揭露之發 射天線結構之側視圖，第三圖係為本創作所揭露之發射天線結構 ^正視圖’此發射天線結構2適合制於需低雜訊干擾之天線 量測系統中。圖中，發射天線結構2包含有發射源Μ、反射元件 M316394 22及阻抗結構23，其中發射源21及反射元件22之組合係為一種 主軸偏離聚焦一次反射式天線的應用，反射元件22具有一拋物面 221，以提供反射發射源21所發出之無線電波21ι，且無線電波 211經拋物面221反射後，即延著拋物面221之主軸方向222前 進再者’反射元件22及其拋物面221係由導電材質所組成， 因此在導電材質之邊緣，即拋物面221外緣的地方，容易產生 邊緣繞射干擾的問題，因此，藉由阻抗結構23連接於拋物面221 Φ 之外緣’其可電性匹配反射元件22，藉此可降低反射元件22 及其拋物面221產生邊緣繞射干擾的程度。 接續，請參閱第四圖，其係本創作所揭露之天線量測系統之 示思圖，此系統適用於量測一待測天線之遠場場型。圖中， 天線量測系統4設置於一測試空間41中，測試空間41通常 由一隔離室11及其所有内壁面鋪設之吸波元件12所組成，以防 止内壁面形成反射波及外來之訊號干擾，籍此確保測試結果的準 _ 確性。天線量測系統4由發射天線結構2及待測天線42所組成， 發射源21發出無線電波211後，無線電波211先經由拋物面221 反射後，再延拋物面221之主軸方向222輻射，在輻射無線電波 211 —段距離後，無線電波211即可視為平面波212，其可提供本 系統4量測待測天線42之遠場場型。由於發射天線結構2之發射 源21發出無線電波211後，無線電波211已先經由拋物面221反 射後再延拋物面221之主軸222方向輻射，因此無線電波211成 9 M316394 為平面波212所需的距離小於其他同樣 、^ 小量測待測天線42時 灰的天線精此減 接於拋物面221之外:广工間41。又，阻抗結構23連 降彳__ 22 成減射讀22之雜隨，藉此 度，進而可與力其拋物面221產生邊緣繞射干擾的程 、— 明之準雜。上叙酬域42可為主動、 ⑽、_天線、功率雙錐天線、對數螺旋天線或· =線專，阻抗結構23較佳為貼娜，吸波树12—般採用介 質祕型’如聚氨脂類之泡珠塑料或亞鐵磁磚等，吸波元件12通 ㊉作成圓錐狀、稜角錐狀或方楔形狀，以鱗連續漸變之焦耳阻 抗結構。 以上所述僅為舉例性，而非為限制性者。任何未脫離本創作 之精神與鱗，㈣其精之等效修料變更，均應包含於後附 之申清專利範圍中。 #【圖式簡單說明】 第一圖係為習知技藝之一種天線量測系統之示意圖； 第一圖係為本創作所揭露之發射天線結構之側視圖； 第三圖係為本創作所揭露之發射天線結構之場型之示意圖；以 及 第四圖係為本創作所揭露之天線量測系統之示意圖。 M316394 【主要元件符號說明】 -π :隔離室； _12 :吸波元件； 13 ··發射天線； 14 :待測天線； λ :工作波長； D:待測天線之最大長度； 2:發射天線結構； 21 :發射源； 211 :無線電波； 212 :平面波； 22 ·•反射元件； 221 :拋物面； 222 :拋物面之主軸方向； 23 :阻抗結構； 4:天線量測系統； 41 ··測試空間；以及 42 :待測天線。Due to the development of communication technology, antenna design has been widely used in communication products. The antenna design is designed to contain the problem. Therefore, designers need to be good at the skin: gain, radiation and directivity. Maximum ^. In order to accurately measure the practice type of the financial antenna, the workplace must be a separate room, which is used to shield the external electronic motor from noise interference. m as shown in the figure--a schematic diagram of a far-field type of measuring antenna of a conventional technique. In the figure, the isolation chamber n6-wall is provided with an absorbing element 12 to prevent reflection of the inner wall surface. Wave, thereby avoiding the accuracy of the shadow test result, and the wave absorbing element 12 generally adopts a dielectric loss type, such as a polyurethane "foam bead plastic or a ferromagnetic monument", etc. , scaly or square wedge shape to maintain a continuous gradient of the Joule impedance structure. Furthermore, the transmitter antenna 13 and the antenna 14 to be tested of known characteristics are disposed in the isolation chamber 11, and the maximum length of the medium-wave antenna 13 for issuing the working wave line 14 is D, and Since the measurement of the exit field type needs to be carried out by plane wave, 9n2/ ', ], and the antenna 14 to be tested and the transmitting antenna 13 must be 2D/A township, as - plane wave, so the amount of 6 M316394 is required for measurement. The space will vary depending on the measurement frequency band or the type of antenna. However, in order to meet the requirements of measuring various frequency bands or different types of antennas, a large isolation room is usually required to meet the distance conditions required for far field field test. Therefore, a large space and a absorbing component are required, and the cost and space of the measurement are increased. At present, another near field field type of the antenna to be tested is firstly measured, and then subjected to Fast Fourier Transform (FFT) to obtain a solution. The method of measuring the far field type of the antenna, but this conversion method will increase the complexity of the software analysis, so it requires a high cost and time in the analysis. Therefore, under the consideration of factors such as cost, space and convenience, etc. Bento An antenna measuring system and its transmitting antenna structure are proposed to be used as a solution and basis for the above problems. [New content] The purpose of this creation is to provide an antenna measuring system and its transmitting antenna structure, which is specially designed by a reflective antenna. Parabolic design, to reduce the distance conditions required to measure the far field field of the antenna, to solve the problem of cost and space required for measurement, and to increase the complexity of the software analysis without increasing the complexity of the software analysis. Therefore, in order to achieve the above object, the present invention discloses an antenna measuring system which is disposed in a test space in which all wall surfaces are covered with a absorbing member, and the system includes an antenna to be tested, a reflecting element, an emitting source, and The impedance structure, wherein the emission source can correct the 敎 to the reflective paraboloid, and the paraboloid of the 阙 element is used to reflect the radio wave, so that the radio wave becomes a plane wave, and the plane wave is received by the M3163 94 line to be measured, As a measurement and analysis instrument, the far-field type of the line to be measured is measured. According to the 'and' impedance structure, the outer edge of the difficult object is connected. The shooting element can reduce the edge diffraction of the tow surface and increase the accuracy of the measurement. The impedance structure of the present invention is a chip resistor, and the antenna to be tested can be an active, crane-like antenna. , view money, turn biconical antenna, logarithmic spiral antenna or potential antenna, and the source and the reflective element can be used to offset the primary reflection of the main axis of the ship to make the surface wave, reduce costs and The measurement space is easy to operate and fast to capture. It is recorded that the reviewer will have a better understanding and understanding of the implementation and implementation of this creation. The following examples are provided to provide a better example and _ schema for the purpose of 'and The detailed description of the text is as follows: [Embodiment] In order to make the above-mentioned purpose, characteristics, and advantages of this creation more clear (4), the following is based on the amount of the antenna of the creation and its transmission structure. The preferred embodiment, in conjunction with the __ formula, is described in detail below, and the components of the towel will be described with the same component symbols. Please - see the second and third figures 'Second _ is a side view of the structure of the transmitting antenna disclosed in the present invention, and the third picture is the structure of the transmitting antenna disclosed in the present invention. ^ This transmitting antenna structure 2 It is suitable for antenna measurement systems that require low noise interference. In the figure, the transmitting antenna structure 2 includes an emission source Μ, a reflective element M316394 22 and an impedance structure 23, wherein the combination of the emission source 21 and the reflective element 22 is an application of a main axis off-focusing primary reflection antenna, and the reflective element 22 has a The paraboloid 221 is provided to reflect the radio wave 21ι emitted by the emission source 21, and the radio wave 211 is reflected by the parabolic surface 221, that is, the main axis direction 222 of the paraboloid 221 is advanced. The reflective element 22 and its paraboloid 221 are made of a conductive material. Therefore, at the edge of the conductive material, that is, the outer edge of the paraboloid 221, the problem of edge diffraction interference is easily generated, and therefore, the impedance structure 23 is connected to the outer edge of the paraboloid 221 Φ, which can electrically match the reflective element. 22, thereby reducing the extent to which the reflective element 22 and its paraboloid 221 create edge diffraction interference. For the continuation, please refer to the fourth figure, which is a schematic diagram of the antenna measurement system disclosed in the present application. The system is suitable for measuring the far field pattern of an antenna to be tested. In the figure, the antenna measuring system 4 is disposed in a test space 41. The test space 41 is generally composed of an isolation chamber 11 and all of the inner wall surfaces of the absorbing elements 12 to prevent reflection of the inner wall surface and external signal interference. In order to ensure the accuracy of the test results. The antenna measuring system 4 is composed of a transmitting antenna structure 2 and an antenna 42 to be tested. After the transmitting source 21 emits a radio wave 211, the radio wave 211 is first reflected by the paraboloid 221, and then radiated by the main axis direction 222 of the paraboloid 221 to radiate wirelessly. After the radio wave 211 is a segment distance, the radio wave 211 can be regarded as a plane wave 212, which can provide the far field mode of the system 4 for measuring the antenna 42 to be tested. Since the transmitting source 21 of the transmitting antenna structure 2 emits the radio wave 211, the radio wave 211 has been reflected by the paraboloid 221 and then radiated in the direction of the main axis 222 of the paraboloid 221, so that the distance required for the radio wave 211 to be 9 M316394 is the plane wave 212 is smaller than The other antennas that are the same as the small measurement of the antenna 42 to be tested are finely reduced to the outside of the paraboloid 221: the workshop 41. Moreover, the impedance structure 23 is continuously reduced by 彳__22 into a diffractive read 22, whereby the degree of interference with the parabolic surface 221 of the edge 221 is generated. The upper remuneration field 42 can be active, (10), _antenna, power biconical antenna, logarithmic spiral antenna or ·= line. The impedance structure 23 is preferably a smear, and the absorbing tree 12 is generally a medium secret type. The urethane foam or the ferritic tile, etc., the absorbing element 12 is formed into a conical shape, an angular pyramid shape or a square wedge shape, and the gradual gradient of the Joule impedance structure. The above is intended to be illustrative only and not limiting. Any changes to the spirit and scale of this creation, (4) the equivalent of the modified material, shall be included in the scope of the attached patent. #[Simple description of the diagram] The first diagram is a schematic diagram of an antenna measurement system of the prior art; the first diagram is a side view of the structure of the transmitting antenna disclosed by the present invention; A schematic diagram of a field pattern of a transmitting antenna structure; and a fourth diagram is a schematic diagram of an antenna measuring system disclosed in the present disclosure. M316394 [Description of main component symbols] -π: isolation chamber; _12: absorbing component; 13 · transmitting antenna; 14: antenna to be tested; λ: working wavelength; D: maximum length of antenna to be tested; 2: transmitting antenna structure 21: emission source; 211: radio wave; 212: plane wave; 22 ·•reflecting element; 221: paraboloid; 222: main axis direction of paraboloid; 23: impedance structure; 4: antenna measurement system; 41 · test space; And 42: the antenna to be tested.