TWM311032U - Universal test apparatus of composite circuit board - Google Patents

Universal test apparatus of composite circuit board Download PDF

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Publication number
TWM311032U
TWM311032U TW95220085U TW95220085U TWM311032U TW M311032 U TWM311032 U TW M311032U TW 95220085 U TW95220085 U TW 95220085U TW 95220085 U TW95220085 U TW 95220085U TW M311032 U TWM311032 U TW M311032U
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Taiwan
Prior art keywords
circuit board
test
hole
long
wire
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TW95220085U
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Chinese (zh)
Inventor
Bo-Wen Guo
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Unitech Printed Circuit Board
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Priority to TW95220085U priority Critical patent/TWM311032U/en
Publication of TWM311032U publication Critical patent/TWM311032U/en

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Description

M311032 八、新型說明: 【新型所屬之技術領域】 本創作係-種萬Μ複合式電路板職治具,其聽—種於針盤及夹人座 中鑽設複數侧定間距且相對狀狐及穿孔,鱗航、穿孔中分別^電 性連通之導雜針與長針,當更換不隨格之待戦路板進行測辦,僅需更 改爽合座、長針設置位置與職tb對程式即可,並藉由導線接點可以一對二或 -對多模式與導電探針連接’而可增加本_之測試點面積,具有節省治:製 作時間、減少治具成本過高種種問題。 # 【先前技術】 s按,習知之印刷電路板於製成後,尚須經過檢測程式以檢測該電路板線路 是否為良品;而-般電路板製造廠商所常採用之檢測機器,可概分為專用型 (Dedicated)測試治具及萬用型(Univ_sal Grid)測試治具兩種,其中,專用型 測試治具之測賴驗宜且測試速度快,但由魏合電路板上精錄路接 用之-對-之彈性導電探針,其針頭較細而昂貴,且容易損壞而常須更換,造 成測試成本的增加,·反之,萬用型治具則是測試機器昂貴,但其所用之探針可 為-般長針,並可重複使用,所以治具便宜;故一般之使用情況係在作印刷電 鲁路板樣品之檢測時,先選用萬用型測試機,待該電路板驗証透過要開始量產時, 則改用專用型測試機,但必須多增加一次製作治具之針盤及長針,如此將增加 人工之鑽孔及灑針工時,完全不符合經濟需要。 *針對以上之缺失,遂有人個專_職機上成本較為低廉之測試主機與 萬用型測試機可重複使狀長針等優雜赌合,而絲複合式職治具,但 使用上仍有其缺點: 1·使用者架設治具時間的浪費:基本上架設治具都要花費半小時以上時間 插排線,若是治具之點數數量超過12,000點以上時,其排線近達185條左右, 光是在架設治具時,就必須花費相當多的時間。 2·治具不用時之儲位不足:使用者如以平均每個月有15_2〇個量產產品為 M311032 例’母個里產產品最少需開設2組治具以供使用,則經過一段時間,將嚴重發 生儲位不足之問題。 成本·虽冶具報廢後’其長針雖是可以回收利用,但針盤的部份所使 用之針管錢無法时制,祕造成成本增加。 〜之損壞· S冶具反覆架設時,常由於測試人員於架^治具或搬運的過 程中造成治具損壞。 5· ’口具1作間的問題:由於治具之製作分為針盤及長針部份 ,從程式撰寫 夕’孔以至於;麗針’ 一個治具的工作天最少要四天才能夠完成,若其測試點命 夕,其工作天數會更長,尤其以針盤的製作時間最久。 雷腦上述測試治具之導線接點同時僅連接一導電探針,如為測試傳統 ,機板,由於其電路板之面積較大且其測試接點間之舰亦較大,因此 無明顯差異,尚能符合需要;惟對於現今愈來愈小及精緻化之 3 ·!^子裝置之触㈣,其電職之面積及職接點間之點 作_言,可同時容_相_之祕板—次檢測, 仁如此亦a加戦主機之成本負擔,在制上不盡理想。 【新型内容】 創作綱要: 電路料輪等敝乃研嘛_之制贿合式 有針ίΓΓί—目的’在提供—種朗型複合式電路板測試治具,該产且上… 有:盤及夾合座及導線座;其中’針盤上設有複 = 孔中分別設有導電探針;射,夾合座1距之鑽孔’該等鑽 該夾合座上亦設有*鑽孔相斟廂Β …十盤’並與針盤保持-定間距, 又,畀鑽孔相對應且固定間距之穿孔, 長針一端係與待測電路板之測試點 、q牙孔内设有長針,該 導電探針電性接觸;其中,導、^向外偏斜模式與針盤上之 電性排線透過導電探針與待測電路板上之測試點電性連通,接= M311032 規格之制板騎測試時’不需更麟盤及魏座,僅需依制電路板之 待測點接點不同,更改夾合座及設定長針之設置位置及測試比對程式即可,而 節省治具製作時間及降低治具成本。 本創作之再一目的,其每一導線接點可同時與二個以上之導電探針相連 接,而使不親格之待_路板在獨加導線鼓下柯進行職,而節省測 試工你。 本創作之另-目的’其只要雜之崎及夾合座可配合械應之孔數 足夠,則可测试大小面積不同的待測電路板。M311032 VIII. New Description: 【New Technology Fields】 This creation department is a kind of composite circuit board tool, which is designed to be drilled in the dial and the holder. And the perforating, the squaring and the perforation are respectively connected to the conductive needle and the long needle. When the replacement is not carried out, the setting of the position and the position of the long needle is changed. Yes, and the wire contact can be connected to the conductive probe by a pair of two or -to-multi mode, and the test point area can be increased, which has the problems of saving treatment, making time and reducing the cost of the fixture. # [Prior Art] s press, after the printed circuit board is manufactured, it is still necessary to go through a test program to check whether the circuit board is a good product; and the detection machine commonly used by the circuit board manufacturers can be divided into It is a Dedicated test fixture and a universal type (Univ_sal Grid) test fixture. Among them, the special test fixture is suitable for testing and testing speed, but it is recorded by Weihe circuit board. The elastic conductive probe that is used is a thin and expensive needle, which is easy to damage and often needs to be replaced, resulting in an increase in test cost. Conversely, the universal jig is expensive for the test machine, but it is used. The probe can be a long needle and can be reused, so the fixture is cheap; therefore, the general use condition is to select the universal type test machine when testing the printed circuit board sample, and the board is verified. When it is time to start mass production, the special type test machine will be used instead, but the needle plate and the long needle for making the jig must be added one more time. This will increase the manual drilling and needle-spraying time, which is completely inconsistent with economic needs. * In view of the above-mentioned shortcomings, there is a special test machine and a universal test machine that can be used for a relatively low cost on the job machine, and can be repeatedly used to make a long needle and other gambling, and the silk composite type of jig, but still use Its shortcomings: 1. The waste of the time for setting up the fixture: basically it takes more than half an hour to insert the cable when the fixture is set up. If the number of points of the fixture exceeds 12,000, the cable is nearly 185. Left and right, it takes a lot of time to set up the fixture. 2. Insufficient storage when the fixture is not in use: If the user has an average of 15_2〇 production products per month for the M311032 case, the mother's product must be opened at least 2 sets of fixtures for use. The problem of insufficient storage will occur seriously. Costs Although the long needles are recyclable after the scraps are scrapped, the needles used in the parts of the dials cannot be used at the time, and the cost is increased. ~ Damaged · When the S tool is repeatedly erected, it is often caused by the tester's damage during the process of the fixture or handling. 5· 'The problem between the 1st and the mouthpieces: Since the production of the jig is divided into the dial and the long needle part, from the writing of the eve of the hole to the hole; the working hours of a jig can be completed in at least four days. If the test point is on the eve, the working days will be longer, especially if the dial is produced for the longest time. The wire joints of the above test fixtures are connected to only one conductive probe at the same time. For the test tradition, the board has no significant difference due to the large area of the circuit board and the larger ship between the test joints. , can still meet the needs; but for today's increasingly smaller and more refined 3 ·! ^ sub-device touch (four), the area of the electric job and the points between the positions of the contact point _ words, can simultaneously accommodate _ phase _ The secret board - the second test, Ren is also a cost burden on the host, which is not ideal in the system. [New content] Creation outline: Circuit material wheel, etc. is a research method. _ The bribe-type combination has a needle ίΓΓί--the purpose of providing a kind of lang-type composite circuit board test fixture, the production and... There are: disk and folder a seat and a wire holder; wherein the 'needle plate is provided with a plurality of conductive probes in the hole=the hole; the hole is formed by the hole of the clamped seat 1', and the drilled hole is also provided on the clamp seat斟 Β 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十 十Conductive probe electrical contact; wherein, the outward deflection mode and the electrical cable on the dial are electrically connected to the test point on the circuit board to be tested through the conductive probe, and the board of the M311032 specification is connected When riding a test, you don't need a more slab and a Wei seat. You only need to change the position of the clamp and set the long needle and test the comparison program according to the different points of the board to be tested. Time and reduce fixture costs. For the further purpose of the present invention, each of the wire contacts can be connected to more than two conductive probes at the same time, so that the incompatibility of the road board is carried out under the exclusive wire drum, and the tester is saved. you. The other purpose of this creation is to test the board to be tested with different sizes and sizes as long as the number of holes in the miscellaneous and the clamping seat can be matched.

【實施方式】 請參閱第卜2圖所示’本創作係一種萬用型複合式電路板測試治具,其主 要設有-針盤H) ’該針盤係架設於測賴台(圖中未示)上,請參照第3圖所 不’該針盤1G於-定雜上設有複數個狐n,辦概u彼此之間保持一 定間距’另’該等鑽孔U分別埋設有—導電探針2G,該等導電探針2g 一端與 在鑽孔11内之彈性件21接觸,於本實施例該等彈性件為彈菁,另一端則凸 鑽孔11外。 再者該針盤10上設有-個夾合座30,該夾合座3〇之面積可依製作者之 需求而更改,另,該夹合錢係由—相對之上、下座3卜32組合而成,且該 上下座31 32严曰%又有-個以上之夾合板33,於本實施例為4個,該等夾合板 33間保持-定間距,其中,上、下座3卜犯設有與鑽孔n相對應之穿孔二, 且違上、下座31、32及夾合板33上設有與穿孔34相對之針孔35,該等針孔 35係呈逐漸向外擴展傾斜狀,且該等穿孔制與針孔奶中分別穿設有與待測電 路板40之利試點相對之長針36,該等長針%之數量與導電探針相符,且分別 與相對應之導f探針20成-對-f性接觸。 ,此外,睛參照第4、4a圖所示,該針盤10 S設有-個以上之導線座50(俗 稱牛角座),該等導線座5〇上設有複數個導線接點5卜該等導線接點Μ可藉由 電性排線52分顯導電探針W相連接,當更換不同規格之電路板進行測試:夺, 7 M311032 不需細規格之待測電路板4_製作,只需更改夾合座別、長針 電路二於測試程式上設定導線接點51與待測電路板4G之測試點之 =::導通即可’如此一來’可節省治具製作時間及有效降低治具製作 另 $雜1 接點51分別可藉由電性排線52同時與二個或二個以上 相連接,因此在導線座5Q及導線接點相_下,其針盤之灌 4 ’可以較習知技術以1倍、2倍等倍數增加,因此待測電路板 40之測4點數量亦可呈相同比率增加,如此在相同測試時間下,可節省μ、 1/3之工時,以提高測試效率。 並不侷所述’僅為本創作最佳之一具體實施例,惟本創作之構造、特徵 亚不舰於此’任何縣該概藝者在本解領_,可 飾,皆可涵蓋在以下本咖範_。 。及之繼c 【圖式簡單說明】 第1圖係本創作之斷面組合示意圖。 第2圖係本創作之部分斷面組合放大示意圖。 第3圖係本創作針盤之部分立體示意圖。 第4圖係本創作針盤與導線座連接之立體示意圖。 第4a圖係本創作針盤與導線座連接之立體放大示意圖。 【主要元件符號說明】 10 11 20 21 30 31 32 針盤 鑽孔 導電探針 彈性件 夾合座 上座 下座 8 M311032 夾合板 33 穿孔 34 針孔 35 長針 36 待測電路板 40 導線座 50 導線接點 51 排線 52[Embodiment] Please refer to Figure 2, 'This creation is a universal composite circuit board test fixture, which is mainly equipped with - dial H) 'The dial is erected on the measuring platform (in the picture) (not shown), please refer to the figure in Figure 3. 'The dial 1G has a plurality of foxes on the fixed-range, and the office u maintains a certain distance between each other. 'The other holes' are buried separately. The conductive probe 2G has one end of the conductive probe 2g in contact with the elastic member 21 in the bore 11. In the embodiment, the elastic member is an elastic crystal and the other end is convex outside the hole 11. Furthermore, the dial 10 is provided with a clamping seat 30, the area of the clamping seat 3 can be changed according to the needs of the producer, and the clamping money is made up of - relatively upper and lower seats 3 32, the upper and lower seats 3, and the upper and lower seats 3, 32, and more than one or more of the sandwiching plates 33, in this embodiment, four, the sandwiching plates 33 maintain a constant spacing, wherein the upper and lower seats 3 The hole is provided with a perforation 2 corresponding to the hole n, and the upper and lower seats 31, 32 and the clamping plate 33 are provided with pinholes 35 opposite to the perforations 34, and the pin holes 35 are gradually expanded outward. Tilted, and the perforated and pinhole milk respectively are provided with a long needle 36 opposite to the pilot of the circuit board 40 to be tested, and the number of the long needles is consistent with the conductive probe, and respectively corresponding to the guide The f probe 20 is in the form of a pair-f-contact. In addition, as shown in Figures 4 and 4a, the dial 10 S is provided with more than one lead frame 50 (commonly known as a horn stand), and the wire holders 5 are provided with a plurality of wire contacts 5 The wire contacts can be connected by the conductive cable W by the electrical cable 52. When the circuit board of different specifications is replaced, the test is performed: 7 M311032 does not need to be tested on the board to be tested 4_, only It is necessary to change the clamping seat and long needle circuit 2 to set the wire contact point 51 and the test point of the circuit board 4G to be tested on the test program. =:: Turn on the 'this way' to save the fixture making time and effectively reduce the treatment. With the production of another miscellaneous 1 contact 51 can be connected to two or more at the same time by the electrical cable 52, so the pin 4' can be filled under the wire holder 5Q and the wire contact phase _ Compared with the prior art, the number of 4 points measured by the circuit board 40 to be tested can also be increased by the same ratio, so that the working time of μ and 1/3 can be saved under the same test time. To improve test efficiency. It is not the case that it is only one of the best examples of this creation. However, the structure and characteristics of this creation are not in this. Any county in this county can be covered in this _, can be decorated, can be covered in The following coffee _. . Follow-up c [Simple description of the diagram] The first diagram is a schematic diagram of the cross-section of the creation. Figure 2 is an enlarged schematic view of a partial section of the creation. Figure 3 is a partial perspective view of the creation of the dial. Fig. 4 is a perspective view showing the connection of the creation dial and the lead frame. Figure 4a is a three-dimensional enlarged view of the connection between the creation dial and the lead frame. [Main component symbol description] 10 11 20 21 30 31 32 Dial drilling conductive probe elastic member clamping seat upper seat lower seat 8 M311032 plywood 33 perforation 34 pinhole 35 long needle 36 board to be tested 40 wire holder 50 wire connection Point 51 cable 52

Claims (1)

M311032 九、申請專利範園·· 1.二種制顯合式電路板職治具,賤裝置綱顯台上, 一針盤’撕紅_夹該,料做央 =. 之鑽孔及穿孔,且_孔與觀__孔=^數_對應 若干導酬,婦賴__, 彈性件相連接,另_劇凸出觀外; ,、在鑽孔中之 若干長針,制分職置夾合赴,並鱗龍針成—對—電M311032 IX. Applying for a patent Fan Park·· 1. Two types of display circuit board fixtures, 贱 纲 纲 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , And _ hole and view __ hole = ^ number _ corresponding to a number of rewards, women _ _, elastic parts connected, another _ drama protruding out;;, a number of long needles in the hole, the division of the folder Going together, and the scales of the dragon into a pair - right - electricity 树接’該導_上設有導線接點,每 導線接點为別與二個穿孔及導電探針相連接; 藉由上驗倾成,當錢獨聽之電職進行職時 需依不同規格之待測電路板重新製作,只要更改夾合座及長針之設^^不 亚於測雜式上設定導線接點與細電路板之舰狀電路導通或不導通即 可,如此就雜之灑舰量及面躺言,可讀f知技術增加丨倍,因 _路板之測試點數量亦可呈相同比率增加,所以在相同測試時間下,可節 癌1/2工時,可節省治具製作時間及纽降低治具製佩本種種問題及p 測試效率。 回 2·如申請專利範圍第i項所述之萬用型複合式電路板測試治具,其導線座之 # 線接點可與二個以上之導電探針相連接。 3·如申請專利範圍第丨項所述之萬用型複合式電路板測試治具,其導電接點 時與二點以上導電探針做連接。 “ SThere are wire contacts on the tree connection, and each wire contact is connected to two perforations and conductive probes. The specification of the circuit board to be tested is re-made, as long as the setting of the clip-on seat and the long-pin is not as good as that on the meter type, the ship-shaped circuit of the wire contact and the thin circuit board is turned on or off, so that it is mixed. Sprinkle the ship and face the words, the readable technology can be increased by a factor of two, because the number of test points of the _ road board can also increase by the same ratio, so under the same test time, can save 1/2 working hours, can save The time of the fixture making and the reduction of the fixtures are all kinds of problems and the efficiency of the test. Back to 2. The universal composite circuit board test fixture described in claim i of the patent scope, the # line contact of the lead frame can be connected with more than two conductive probes. 3. If the universal composite circuit board test fixture described in the scope of the patent application is connected, the conductive contacts are connected with two or more conductive probes. “ S
TW95220085U 2006-11-15 2006-11-15 Universal test apparatus of composite circuit board TWM311032U (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103207290A (en) * 2012-01-12 2013-07-17 瑞统企业股份有限公司 Improved test fixture structure of circuit board
CN106680695A (en) * 2017-02-28 2017-05-17 珠海拓优电子有限公司 One needle and two wires testing jig imitating four wires
CN112485724A (en) * 2019-08-21 2021-03-12 泰科电子(上海)有限公司 Flexible flat cable test system
CN117330801A (en) * 2023-10-19 2024-01-02 深圳市兆兴博拓科技股份有限公司 Circuit board testing device, debugging method and debugging system

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103207290A (en) * 2012-01-12 2013-07-17 瑞统企业股份有限公司 Improved test fixture structure of circuit board
CN106680695A (en) * 2017-02-28 2017-05-17 珠海拓优电子有限公司 One needle and two wires testing jig imitating four wires
CN112485724A (en) * 2019-08-21 2021-03-12 泰科电子(上海)有限公司 Flexible flat cable test system
CN117330801A (en) * 2023-10-19 2024-01-02 深圳市兆兴博拓科技股份有限公司 Circuit board testing device, debugging method and debugging system
CN117330801B (en) * 2023-10-19 2024-02-20 深圳市兆兴博拓科技股份有限公司 Circuit board testing device, debugging method and debugging system

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