M306331 八、新型說明： 【新型所屬之技術領域】 本創作係有關於一種測試治且 i uu 人二μ /、尤才日一種用以供諸如 主機板、介面卡等測試板組接 具。 進订測成作業之測試治 【先前技術】 通常，各類液晶電視之内部係設有例如 (Ma.n board) + 冉面Λ係透過一調諧器將接收到的視頻音頻訊 二、雁擬視頻輸出埠及模擬音頻輸出蟑將訊 ㈣达至相應主機板，然後進行包括模擬/數位轉換及數 子圖像處理等在内之各項處理。 R時’為避免各視頻及音頻訊號受到干擾而影響電視 旦面及聲音之清晰度，通常該輸出入介面卡係以直接組接 之方式與該主機板相連接，而非藉由相應之轉接線與該主 機板進行訊號傳送。 是以，爲了確保訊號傳送之品質，會例如對輸出入介 面卡進行測試。而且，在進行測試作業前，首先需要將諸 如作為待測試板m介面卡與諸如作為測試板之主 機板組接，包括然後再組接所有的介面連接埠（例如電視 訊號連接埠）。如此’待各相應之組接作業完成之後，方 可進行測試。 惟，於應用以往之組接治具上組接輸出入介面卡時， 測試作業人M需要執行繁複之組接動作，除了複雜的人工 5 19520 M3 063 31 作業易致使測試作業人員感覺疲勞之外 之出錯率:，導致測試作業效率不佳。 θ加組接 費大==由於需要組接部分較多，測試作業人員必須花 數不Γ日1於操作治具逐一組接待測試板、測試板、及為 =不：之介面連接埠等’致使組接作業費時過多，從而： 長了整個測試作業之時間，更令測試效率低落。而延 因此，如何提供一種應用於組接諸如主機板之 _ 面卡之待測試板以進行測試之測試治具，以ς決 型::】缺失，實已成爲業界亟待解決之技術課題。、 供-知技:之缺點’本創作之主要目的在於提 率。 動作兀成組接，俾提高組接效 接時Γ作之另一目的在於提供一種測試治具，俾節省組 且為達上述目的及其他目的’本創作係提供一種測試治 广]“具係用以組接具第一結合 =進行測試作業，該測試治具至少包括:治具本體: ”有仏活動設置該待測試板之第一承载區、及盘該第一承 試板之第二承載區；以及驅動機 晉於;-^具本體—側之線性驅動部、及活動設 二弟-承載區並連動於該驅動部之第二結合部，該第 二，部係用以結合該待測試板之第一結合部，以使該待 測试板可受該該線性驅動部連動而移動組接至固設於該 19520 6 M306331 第二呈載區之測試板。 較佳地，該第一承葡π私 ^ 二結合部，該凹部例如呈；；：“凹部供活動設置該第 >☆y μ王τ子型，亚可令該第二結合部之 =大於該凹部之深度，以令該第二結合部可局部凸出 =至該第一結合部;而該第二結合部之寬度係可小於 该凹和以形成間距而相對_該第二結 二結合部亦可為了字形塊體或其他對應該凹部之 寻效形狀。該線性驅動部包括連接該第二結合部之連接 及連接該連接軸以用於作動該連接軸之把手，於— =貫施態樣中，該把手與該連接軸係軸接於治具本體邊 此外’該第一承載區读離兮笛_ 有連接埠載件，承載區之側邊復可設 填，心〜 連埠㈣係具有複數介面連接 皐以供笔性連接至該待測試板以進行測試。 兮測知技術，當作業人員需要組接該待測試板至 =试㈣，制透過推動該線_動部 生移動’即可帶動該待測試板組接該測;: 之:二=中測試作業人員須逐'组接測試板及相應 有，丨面連接埠之缺失，藉以提升組接之效 由於應用本創作可由單一動作 σ 技術中+ α 战、、且接，因而可解決習知 士中而要組接較多部分，令測試作業人員必須花 日=於操作治具逐—組接，致使組接作f f 而= 日了±她物業之時間的缺失，相對節省測試作孝人= 寸曰’。故’本創作實已克服習知技術之種種缺失：、 19520 7 M3 063 31 【實施方式】 以下係藉由特定的具體實施例說明本創作之實施方 式，所屬技術領域中具有通常知識者可由本說明書’所揭示 之内容輕易地瞭解本創作之其他優點與功效。 第1A至第3B圖係依本創作測試治具之較佳實施例所 製之圖式。第1A圖係顯示本創作之測試 意圖，其中於該測試治具係已設置測試板，二= 本創作之具之另—結構示意圖，其中於該測試治 具係已設置測試板及待測試板，第2A圖係顯示第ia圖之M306331 VIII. New Description: [New Technology Field] This creation department is about a test and i uu people 2μ /, You Cai Day is used for test board assembly such as motherboard, interface card. Test and treatment of the ordering test [Prior Art] Generally, various types of LCD TVs are equipped with, for example, (Ma.n board) + 冉 Λ Λ 透过 透过 透过 透过 透过 透过 透过 雁 雁 雁 雁The video output 模拟 and the analog audio output 蟑 (4) reach the corresponding motherboard, and then perform various processing including analog/digital conversion and digital image processing. In order to avoid the interference of each video and audio signal and affect the clarity of the TV surface and the sound, the input/output interface card is usually connected to the motherboard in a direct connection manner instead of being rotated accordingly. Wiring and signal transmission to the motherboard. Therefore, in order to ensure the quality of the signal transmission, for example, the input/output interface card is tested. Moreover, before performing the test operation, it is first necessary to combine the interface card as a board to be tested with a host board such as a test board, and then to assemble all interface ports (e.g., television signal ports). So, after the corresponding grouping operations are completed, the test can be performed. However, when applying the input and output interface cards on the previous group of fixtures, the test operator M needs to perform complicated assembly operations, except for the complicated manual 5 19520 M3 063 31, which makes the test workers feel tired. Error rate: resulting in inefficient test work. θ plus group connection fee ==Because more parts need to be connected, the test operator must spend several days on the operating fixture to receive the test board, test board, and = no interface connection, etc. As a result, the assembly operation takes too much time, so that the test time is long and the test efficiency is low. Therefore, how to provide a test fixture for testing a board to be tested, such as a motherboard, for testing, is a technical problem to be solved in the industry. , supply - knowledge: the shortcomings of the main purpose of this creation is to raise the rate. Another purpose of the action is to provide a test fixture, to save the group and to provide a test and control for the above purposes and other purposes. For testing the first combination = performing a test operation, the test fixture includes at least: a fixture body: "the first load bearing area of the board to be tested and the second test board of the first test board a carrying area; and a driving machine; the linear driving part of the body-side; and the second set-bearing area of the movable setting and the second binding part of the driving part, the second part is used for combining And a first bonding portion of the board to be tested, so that the board to be tested can be moved and connected to the test board fixed in the second loading area of the 19520 6 M306331 by the linear driving part. Preferably, the first splicing portion is formed by the first splicing portion, and the recess portion is, for example, "; the recess portion is provided for the movement of the gt; ☆ y μ king τ subtype, and the second joint portion is a depth greater than the recess so that the second joint portion can partially protrude = to the first joint portion; and the width of the second joint portion can be smaller than the concave portion to form a pitch relative to the second knot The joint portion may also be a shape for the font block or other corresponding concave portion. The linear drive portion includes a connection connecting the second joint portion and a handle connecting the connecting shaft for actuating the connecting shaft, In the embodiment, the handle and the connecting shaft are axially connected to the side of the jig body, and the first carrying area is read away from the flute _ with a connecting 埠 carrier, and the side of the carrying area can be filled, and the heart is connected.埠 (4) has a plurality of interface ports for pen connection to the board to be tested for testing. 兮 Detecting technology, when the operator needs to assemble the board to be tested to = test (4), the system pushes the line The student can move the test board to connect the test;: Members must assemble the test boards one by one and the corresponding ones, the lack of the connection of the facets, so as to improve the effect of the combination. Since the application can be created by the single action σ technology + α battle, and the connection, thus can solve the problem However, it is necessary to assemble more parts, so that the test operators must spend the day = in the operation of the jig - grouping, resulting in the group connected to ff and = day ± the lack of time in her property, relative savings test for filial piety = inch曰 '. Therefore, this creation has overcome various shortcomings of the prior art: 19520 7 M3 063 31 [Embodiment] The following describes the implementation of the present invention by a specific embodiment, which has common knowledge in the technical field. Other advantages and effects of the present invention can be easily understood by the contents disclosed in the present specification. Figures 1A to 3B are diagrams prepared according to preferred embodiments of the present invention. FIG. 1A shows the present invention. The test intention of the creation, in which the test fixture has set up a test board, and the second part of the creation is a structural schematic diagram in which the test board and the board to be tested have been set, and the 2A figure is displayed. ia map of the
測試治具中驅動機構之第二結合部與第—承載區之凹部 的結構放大示意圖，第2B圖係顯示第1B ㈣機構的第二結合部與第—承㈣之凹部與= 式板中 =面之弟肖合部結合後之示意圖，第3A圖係顯示第1A 圖之驅動機才冓的線性驅動部作動第二結合部後之示音 =第3'圖係用以顯示第1β圖之第二結合部已與二試 _ :面之弟一結合部結合，而將待測試板與測試板組接之 不思圖。 2合參_1A及第㈣，係本創作較佳實施例之 -二八1之結構示意圖。該測試治具1係用以組接具第 35(未圖示）之待測試板3至測試板5以進行測 體該測㈣W至少包括治具本體u，該治具本 1一側形成有供設置該待測試板3之第一承載區 、及鄰接該第一承載區⑴並供設置該測試板5之第 一载區113、以及設置於該治具本體以一側之驅動 19520 M306331 機構13，該驅動機構13包括用以結合該第一結人 結合部13卜及用以驅動該第二結合部131之線性 驅動部13 3。 於本實施例中，該待測試板3可為諸如介面卡。並 且，該待測試板3 -側設有第一電性連接埠3ι、凡 =該第-電性連接埠31相對狀複數第二電性連接淳又 。較佳地’該第-結合部3 5係凹設於該待測試板3之 第2Β圖所示，容後陳述）。且該待測試板3 係用於連接外部裝置（未圖示）與該測試板5。 =賴板5可為諸如主機板，且可例如為液晶電視之 機板，並具有可供對應組接該第-電性連接埠31之第 二電性連接埠51。 主機f Γ f的是’該待測試板3與該測試板5並非侷限於 主機板及介面卡，其他需要先對應組 板與待測試板均適用於本創作；同時，本實施^中式 《測試板3與測試板5的結構與設置位置僅為 者，並非用以限制本創作，合先敘明。 配合參閱第1A及第⑽，該第 ” π丨卜且該凹部lm係大致㈣。此外，於 1 =例中’該第-承載區⑴遠離該第二承載區113之 ^是可㈣連接埠載件7。該連料載件7係具有可 ^且接該第二電性連接埠33之複數介面連接埠71，並可 接號連接卡，以藉此進行測試作業。由於該連 車载件7之結構及測試作業之原理與技術均屬習知 19520 9 M306331 ^ 者，故於此不再為文贅述。 、 請配合參閱第Μ及第2B圖，於本實施例中，該第一 結合…例如呈T字形，且該第二結合部131之匕 =略高於該凹部mi之深度而形成有高度差131&，且該 第二結合部131之寬度係略小於該凹部11U之寬度而形 成有間距131b，並令該第二結合部131之大小（τ形之斷 面尺寸）與該差距131a為恰可容置於亦呈對應τ形之該第 -結合部35’使得該第二結合部131可設置於該凹則⑴ 與該第一結合部35之間時可水平移動者。當然，該第二 結合部131亦可為其他對應該凹部uu及該第一結合部 35之等效形狀’所屬技術領域巾具有通常知識者可依需 要進行變化及修改，而非以此為限。而該差距mb為恰 可使該第—電性連接埠31組接至第三電性連接㈣所需 之距離。 而 請茶閲第1A圖，該線性驅動部133包括連接該第二 屬^Γ31之連接轴1331、以及連接該連接軸1331以用 於作動該連接軸1331之把丰j — 手則與該連接軸1331m 例令’該把 係軸接於该治具本體11邊緣， :用例如連桿作動原理進行驅動，但並非以此為 =:、:如曲柄作動、撥彈作動、牽桿作動、或其他可供 °’接軸1331之等效作動結構亦適用於本創作。同 :說:於前述作動原理與結構均屬習知者，故於此不再多 於欲進行測試作業之前，如第1A圖所示，可先將該 19520 10 M306331 測试板5固定於該第二承載區113，並將裝設有該第 性連接埠51之一側朝向該第一承載區111 ;接著，如第 1B圖所不，將該待測試板3置於該第一承載區I”上， 使該待測試板3底面之該第一結合部35對應結合該第二 結合部13卜且將該第一電性連接琿31朝向該第三電性 ^接埠51，該第二電性連接埠33朝向該介面連接埠71 ; 取後，如第3A圖所示，作動該驅動機構13，使該線性驅 動部133驅動該第二結合部131車月該第二承載區113移 動。藉此’如第3B圖所示，便可令該第二結合部⑶ 動該待測試板3朝該測試板5移動。 此τ °亥第一電性連接埠31係組接該第三電性連接 埠5卜且該第二電性連接埠33係組接該介面連接埠7卜 如此，便可使該待測試板3組接至該測試板5。因此，告 =進行測:式作業時’測試作業人員便可由單一動作完成： 接，而隨即進行測試作業。 ^目較於習知技術，藉由本創作之測試治具卜測試作 業人員僅需以單一動作便可使組接該待測試板3與該測 试板5,並同時令該連接埠载们與該待測試板3電性連 利用一次性全面組接之動作，避免習知技 ^將各連接介面相組接之缺失，相對提升組接 =率。同時’由於應用本創作之測試治具1可提升組接效 率，故可節省組接時間，進而可節約測試作業之時間。 非用=施例僅例示性說明本創作之原理及其功效，而 制本創作。任何所屬技術領域中具有通常知識者 19520 11 M306331 本創作之權力保護範圍，應如後述 均可在不違背本創作之精神及範疇下’對上述實施例進行 之 19520 12 M306331 【圖式簡單說明】 第1A圖係顯示本創作之測試治具之結構示意圖，其 中於該測試治具係已設置測試板； /、 第1B圖係顯示本創作之測試治具之另一結構示音 圖，其中於该測試治具係已設置測試板及待測試板； 第2A圖係顯示第1A圖之測試治具中驅動機構之第二 結合部與第一承載區之凹部的結構放大示意圖； 一 第2B圖係顯示第1B圖之測試治具中驅動機構二 I結合部與第-承載區之凹部與待測試板底面—处人— 部結合後之示意圖； δ 〜第3Α圖係顯示第1Α圖之驅動機構的線性驅動部作動 弟—結合部後之示意圖；以及 板底=第圖係Γ Γ顯示第1B圖之第二結合部已與待測試 示= 合，而將待測試板與測試板組接之 【主要 元件符號說明】 1 測試治具 11 治具本體 111 第一承載區 1111 凹部 113 弟一承載區 13 驅動機構 131 第二結合部 131a 高度差 19520 13 M306331 131b 間距 133 線性驅動部 1331 連接軸 1333 把手 3 待測試板 31 第一電性連接璋 33 第二電性連接埠 35 第一結合部 5 測試板 51 第三電性連接崞 7 連接埠載件 71 介面連接埠An enlarged schematic view of the structure of the second joint portion of the driving mechanism and the concave portion of the first load-bearing portion in the test fixture, and the second panel shows the second joint portion of the first B (fourth) mechanism and the concave portion of the first bearing (four) and the = plate = The schematic diagram of the combination of the brothers and the brothers of the face is shown in Fig. 3A, which shows that the linear drive unit of the drive unit of Fig. 1A is activated after the second joint portion is activated. The third figure is used to display the first β map. The second joint has been combined with the joint of the two test _: the face, and the board to be tested is assembled with the test board. 2 参 _1A and (4) are the schematic diagrams of the structure of the preferred embodiment of the present invention. The test fixture 1 is used for assembling the test board 3 to the test board 5 of the 35th (not shown) to perform the measurement. The test (4) W includes at least the fixture body u, and the fixture has one side formed thereon. a first load-bearing area for arranging the board to be tested 3, a first load area 113 adjacent to the first load-bearing area (1) for providing the test board 5, and a drive 19520 M306331 mechanism disposed on one side of the fixture body 13. The driving mechanism 13 includes a linear driving portion 13 3 for combining the first junction bonding portion 13 and the second bonding portion 131. In this embodiment, the board to be tested 3 may be, for example, an interface card. Moreover, the side of the board to be tested is provided with a first electrical connection 埠3ι, where the first electrical connection 埠31 is opposite to the second plurality of electrical connections. Preferably, the first joint portion 35 is recessed in the second figure of the board to be tested 3, as described later. And the board to be tested 3 is used to connect an external device (not shown) with the test board 5. The board 5 can be, for example, a motherboard, and can be, for example, a board of a liquid crystal television, and has a second electrical port 51 for correspondingly connecting the first electrical connector 31. The host f Γ f is 'the board to be tested 3 and the test board 5 are not limited to the motherboard and the interface card, and the other groups need to be corresponding to the group board and the board to be tested are applicable to the creation; meanwhile, the implementation of the Chinese version of the test The structure and setting position of the board 3 and the test board 5 are only for the purpose of limiting the creation, and are described first. Referring to FIGS. 1A and 10(10), the first portion is π and the recess lm is substantially (four). Further, in the case of 1 = 'the first load-bearing region (1) is away from the second load-bearing region 113. The carrier member 7 has a plurality of interface ports 71 that can be connected to the second electrical port 33, and can be connected to the card for testing work. The structure and the principle of the test and the working principle of the device are all known as 19520 9 M306331 ^, so it will not be described here. Please refer to the second and second diagrams. In this embodiment, the first In combination, for example, in a T-shape, and the second joint portion 131 has a height difference 131 & a slightly higher than the depth of the recess mi, and the width of the second joint portion 131 is slightly smaller than the width of the recess portion 11U. And the spacing 131b is formed, and the size of the second bonding portion 131 (the cross-sectional dimension of the τ shape) and the gap 131a are such that the first bonding portion 35' which is also corresponding to the τ shape makes the first The second joint portion 131 can be disposed horizontally between the concave portion (1) and the first joint portion 35. Of course, the The second joint portion 131 may also be an equivalent shape of the other corresponding recess portion uu and the first joint portion 35. The technical field of the prior art may be changed and modified as needed, and not limited thereto. The mb is the distance required for the first electrical connection 31 to be connected to the third electrical connection (4). Please refer to FIG. 1A, the linear driving unit 133 includes a connection connecting the second genus 31. a shaft 1331, and a connecting rod 1331 for actuating the connecting shaft 1331, and the connecting shaft 1331m is operative to connect the shaft to the edge of the fixture body 11 The principle of actuation is driven, but it is not used for this: =:,: such as crank actuation, plucking, strut actuation, or other equivalent actuation structure for the ''axis 1331' is also applicable to this creation. The foregoing operation principle and structure are well-known, so there is no more than the previous test operation, as shown in FIG. 1A, the 19520 10 M306331 test board 5 can be first fixed to the second load-bearing area. 113, and one side of the first connection port 51 is mounted toward the first side The first bonding portion 35 of the bottom surface of the to-be-tested board 3 is correspondingly coupled to the second bonding portion, as shown in FIG. 1B. The first electrical connector 31 faces the third electrical connector 51, and the second electrical connector 33 faces the interface port 71; after that, as shown in FIG. 3A, The drive mechanism 13 causes the linear drive unit 133 to drive the second joint portion 131 to move the second load-bearing area 113. Thereby, as shown in FIG. 3B, the second joint portion (3) can move the board to be tested 3 toward the test board 5. The τ ° hai first electrical connection 系 31 is connected to the third electrical connection 卜 5 and the second electrical connection 埠 33 is connected to the interface connection 卜 7 so that the board to be tested can be Three sets are connected to the test board 5. Therefore, the test is carried out: when the test is performed, the test operator can be completed by a single action: the test is performed immediately. Compared with the prior art, the test fixture of the present invention allows the operator to assemble the test board 3 and the test board 5 with a single action, and simultaneously make the connection The board to be tested 3 is electrically connected by a one-time comprehensive assembly operation, so as to avoid the lack of conventional connection of the connection interfaces, and relatively improve the assembly rate. At the same time, the application of the test fixture 1 can improve the efficiency of the group, so the assembly time can be saved, and the test operation time can be saved. Non-use = The example only exemplifies the principle and function of this creation, and makes the creation. Anyone who has the usual knowledge in the technical field 19520 11 M306331 The scope of the protection of this creation should be as follows, without departing from the spirit and scope of this creation, '19520 12 M306331 for the above embodiment [Simplified illustration] Figure 1A is a schematic view showing the structure of the test fixture of the present invention, wherein a test board has been set in the test fixture; /, Figure 1B shows another structural diagram of the test fixture of the present invention, wherein The test fixture has been provided with a test board and a board to be tested; FIG. 2A is an enlarged schematic view showing the structure of the second joint portion of the drive mechanism and the recess portion of the first load-bearing area in the test fixture of FIG. 1A; The figure shows the schematic diagram of the combination of the driving mechanism II I joint portion and the concave portion of the first load bearing area and the bottom surface of the test board in the test fixture of FIG. 1B; the δ~3Α diagram shows the driving of the first map. The linear drive part of the mechanism acts as the schematic diagram of the joint part; and the bottom part = the figure system Γ Γ shows that the second joint of the 1st figure has been combined with the test to be tested, and the board to be tested and the test board set [Main component symbol description] 1 Test fixture 11 Fixture body 111 First load-bearing area 1111 Recession 113 Younger load-bearing area 13 Drive mechanism 131 Second joint portion 131a Height difference 19520 13 M306331 131b Spacing 133 Linear drive unit 1331 Connecting shaft 1333 handle 3 test board 31 first electrical connection 璋 33 second electrical connection 埠 35 first joint 5 test board 51 third electrical connection 崞 7 connection 埠 carrier 71 interface 埠