M290997 八、新型說明： 【新型所屬之技術領域】 本創作係有關於一種測試裝置， a 一種機赫化、、目丨1 4°平而δ之，係關於 禋钺械化測忒電路板之測試裝置。 【先前技術】 目前，例如電腦、伺服器等電 在該產品組裝出礙前， 的製造商’均會 > 質。通常，測試員會將該待測電路板盘 =電路板其相配合之配件(例如散熱器等源電=;、 常運二板測試該待測電路板是否可正 、^二包子產品在没計中都採用連接器 接c，°:r二)生來產進:于測試電路板與待測電路板之間的連 U 產測試時，職人B是採取直接人工方 式來回插拔連接器，如fl圖所示，係直接 ^ 之連接器30,的針腳（Pirn ，扞垃认4 、八弘路板 器5。，的針_，二二插=:電路板之連接 進行待測電路板之·作路㈣㈣接’俾供後續 然，由於現在的連接器針腳越來越多 =接得更可靠’―般具有防誤插的設計，因此在連= 不便於測試人員插拔，而且，以人工方式進行連 4插拔速度相當緩慢’且耗費人力，於大量生產過程 中，媒法符合速度快且低成本之需求。 再者，以人工手動方式直接插拔連接器，容易產生 如將源電路板之針腳位置插錯等人為之錯誤動作，進而導 19189 5 M290997 致電路短路而損窆兮付、 ㈣，由於二=電路板上之電子元件。 以完成，而且在電路=!、透過兩個連接器之完全接觸得 行多次的插拔，會造成、束試過程中，需要對連接器進 短連接器的使用壽人"产的磨損’如此-來將大大縮 :用…從而影響測試的結果。 、、、不上所述，如何避免習知技術 —、 前亟欲解決之技術課題。 、，貫為目 【新型内容】 寥於上述習知技術之缺點 供-種機械化測試之础乍之主要目的在於提 式。 、"衣置，以取代傳統人工插拔之方 本創作之另一目的在於 的直接連接，以接含绵枝 裡」避免連接為之間 工作效率之測試裝二業之便利性’進而提升 繁插拔而造成連接哭1 ’則柄以人工方式對連接器頻 命 運接-之磨知，進而提升該連接器之使用壽 本創作之再—目的在於提供 哥命之測t讀置，減少測試時 ==使用 拔而造成連接器之磨損。 a方式對連接益頻繁插 括-：上用述=目的，本創作提供-種測試裝置，包 連接件及探針，接=個相；-轉接件，具有— 測試之測試電路與一對該待測電路板進行 u路板的連接器電性連接，且該連接件與該探 19189 6 M290997 針藉由一轉接線電性連接，而哕 路板之連接器的針腳；以及—承計以連接該待測電 且對應置於該基座之待測電路=广=係置於該基座上， η安仟之奴針’並於該承載座上 戰 於該測試電路板對該待測電路板進行二二知作件，以 ::以使該轉接件之探針與該待 二作 接，俾對哕炷说丨+ Α 你' < 連接盗電性連 平對。亥待測電路板進行測試。 .接器該;器為一母連接器，而該連接件為-連 測試電路板之二:連接器，而與該連接件對應連接的 連接器，而連接器:該連接件亦可為-公 一母連接8:、 應連#_試電路板之連接器為 者施作部及從動部’該操作部係供操作 係固接於該轉接：動二 =係樞接於該操作部而另-端 作。该操作部係為mu 门步動 相較於先前技術，本創作 =::該_路板連接，該連; 二=使針插接於該待测電路板之連接； 而可進行電路電路板與待測電路板之電性連接， 設計=接;用=賴置無需直接連接具有防誤插 接85之針腳上即可進行測試作業’其結構簡單 19189 7 M290997 ί人^::免^術中人工直接插拔連接器之時間以 上、毛、，提咼連接器插拔作業之便利性，進而提升 率。同時’由於本創作之測試裝置係利用探針以及 I接線進行連接作掌，摆斜σ β 之#彳木針，、疋與该待測電路板之連接器 接觸’並非與整個測試電路板之連接器接觸，因 二作技術中直接進行連接器之間的頻繁插拔 【實施=式】接a之磨損，進而提升該連接器之使用壽命。 ’以下係藉由特定的具體實例說明本創作之實施方 ^:熟悉此技藝之人士可由本說明書所揭示之内容輕易地 作之其他優點與功效。本創作亦可藉由其他不同 l體貫例加以施行或應用，本說明書中的各項細節亦可 土於不同硯點與應用’在不悖離本創作之精神下進行久種 =與變更。另值得注意的是，以下圖式均為簡化之:音 圖式’而僅以示意方式說明本創作之基本構想，遂圖式中 僅顯示與本創作有關之元件而非按照實際實施時之元件數 目、形狀及尺寸緣製’其實際實施時各元件之型態、數量 =例可為一種隨意之變更，且其元件佈局型態二能更= 斤旻雜。 請參閱第2圖’係顯示本創作之測試裝置之立體圖。 如圖所示’本創作之測試裝置卜包括一基座1〇、 件2 〇以及一承載座3 0。 忒基座10係呈一 L狀之型體，用以置放一待測電路 板4,該待測電路板4具有一連接器4〇，且該連接器如 19189 8 M290997 具有複數個針腳401。於本實_中 連接器40為一母連接器。 /寺測电路板4之 。亥I接件20，具有_連接件2〇ι及探 件201係用以與一對該待測電路板4谁>、、、—該連接 板5的連接器5〇電性 仃測试之測試電路 藉由一轉接、線203電性連接’:接件2〇1與該探針202 待測電路板4之連接哭咖十2 〇 2係用以連接該 接件如為一連=了=1 針腳401°於本實施例中該連 接件201對應連接的 接时，而與該連 ^ . ,S4 , 』°式电路板5之連接器50為—公連接 二”員知者’该連接件2〇1，亦可為一公連接哭 = 接之該測試電路板5之連接器5〇 -=對應連 ^中具有通吊知識者均能推： 以圖示及為文贅述之。 阱f故在此不另予 於本貝鈀例中，該探針202於實際實施時之數旦/ 狀、及尺寸比例係依據該待測：夂： 聊如之數量、形狀、及尺寸比例而設置連的u之各針 吕亥承載座3 0，係晉热# f & ·! Λ 座10之待測電路板4之適i ’且對應置於該基 2Q之探物，並於 3 01，以於該測試電路直"又置—刼作件 板5對遺待測電路板4進行測斌眭， 刼作該操作件301以使該韓接# 9η … 路板4之連接器4。電性連該待測電 試。 ％注運接，俾對该待測電路板4進行測 騎作件3G1具有—操作部302以及-從動部3〇3， 19189 9 M290997 \其I ’該操作部302係供操作者施力用，而該從動部303 Γπ一接於該操作部咖而另—端係固接於該轉接件 卜 U轉接件20與該從動部3G3可同步動作，於本實 =二該操作件3〇1係作垂直上下位移，但不以此為：。 且於本只施例中，該摔作 者下壓該操作部時，= = 動該承載座30沿方向a垂直^動 ° 〇直私動’帶 板4。 直私動而壓合連接至該待測電路 。月參閱弟3圖，係、顯示本創作之測試褒置之作動立體 =圖戶:示，當欲測試該待測電路板“，，首先將該轉 20 2〇2 30 ^ 2〇2 Lit 連接# 2G1連接，並再將該與探針 接之連接件2〇1與該測試電路板5之連接哭 完成準備測試之前置作業，再將欲測試之;待二 A接置St基座1〇’此時該探針2〇2對料 之連接益40的針腳4(Π，再藉由按壓該操作件則之於 ^ 302，^而使該從動部3〇3帶動該承载座3〇沿方向^ 移動而讓該探針2Q2插接至該待測電路板4之連接哭 :二=電性連接’而可進行測試程序。而當測物 卞 貝可藉由上拉該操作部302而使該從動部3 沿方向A，垂直移動，帶動該承載座3〇沿方向A，垂直^ 2使幻采針2 〇 2离 1開該待測電路板4之連接器4 〇，俾使該 木=2 0 2與該待測電路板4之連接器4 〇脫離接觸，並藉由 、该基座上之待測電路板4，即可進行另—待測電路板 19189 10 M290997 之測試。 試電作測試裝置]係無需將該測 器㈣針腳針腳直接與待測電路板4之連接 2。3達成測試電路=:電僅路透广2°2以及轉接線 進而避免習知技術之種種缺失。反4之間的電性連接， 綜上所述，本創作之測 連接件201與該測”“置1利用一轉接件20之 丨一轉接線包板5連接，該連接件201再藉由 粍接線203與该探針2〇2連 於該待測電路板4之連接哭t接取後错由探針202插接 電路Mu,連妾40的針腳4〇卜俾使完成測試 弘路板5與待測電路板4 Λ 測試。 電眭連接，而可進行電路板之 相應地，應用本創作測試裝 插設計之連接器，口 ml 接具有防誤 連接哭之斜腳卜/ 施力以令探針對應插接於 $ t 進行測試作業，其結構簡單且易於實 =人糾可避免習知技術中人工直接插拔連接器間以 費：提高連接器插拔作業之便利性，進而提升 : ㈣，由於本創作之測試裝置係利用探針以及 =線進行連接作業，探針只是與該待測電路板之連接= ^針:相接觸，並非與整個測試電路板之連接器 : 匕，亦可避免習知技術中直接進行連接器之間的頻= ^乍而造成連接器之磨損，進而提升該連接器之^壽 卩故’本創作已然具備極高之產業利用價值。 上述實施例僅例示性說明本創作之原理及其功效，而 19189 11 M290997 非用於限制本創作。任何熟習此項技藝之 π〜八士均可 背本創作之精神及範疇下，對上述實施例進行修方 變。因此，本創作之權利保護範圍’應如後：：：：： 範圍所列。 Τ 口月I利 【圖式簡單說明】 第1圖係顯不習知之測試電路板之 板之連接II之連接方式示意目； 相4待挪電 第2圖係顯示本創作之測 筮3园乂H二丄匕· 直之立肢圖，以及 【主要 元件符號說明】 1 測試装置 4 待測電路板 5 測試電路板 10 基座 20 轉接件 30 承載座 • 40 連接器 50 連接器 201 連接件 202 探針 203 轉接線 301 操作件 302 操作部 303 從動部 401 針腳 19189 12M290997 VIII. New Description: [New Technology Field] This creation department is about a test device, a kind of machine, and it is 1 4° flat and δ. It is about the mechanical test circuit board. Test device. [Prior Art] At present, manufacturers such as computers, servers, etc., before the assembly of the product, will be > Usually, the tester will test the circuit board to be tested = the matching board of the circuit board (such as the source of the heat sink =;; the second board of the normal test to test whether the board to be tested is correct, ^ two buns products are not In the meter, the connector is connected to c, °: r 2) is born to produce: when the test board and the circuit board to be tested are connected to the U production test, the staff B is to directly and manually plug the connector. As shown in the figure of fl, it is the pin of the connector 30, which is directly connected to the connector 30 (Pirn, 捍 认 4, 八 弘 板 板 5,, pin _, two two plug =: circuit board connection for the circuit board to be tested The road (4) (4) is connected to the '俾 for the follow-up, because the current connector pins are more and more = the connection is more reliable' - the design has anti-missing insertion, so the connection = is not convenient for the test personnel to plug and unplug, and, Manually connecting and plugging and unplugging speeds is quite slow' and labor intensive. In a large number of production processes, the media method meets the requirements of high speed and low cost. Moreover, the manual plugging and unplugging of the connector is easy to generate. The pin position of the source circuit board is wrongly inserted, etc. 19189 5 M290997 The circuit is short-circuited and damaged, (4), because the two = electronic components on the board. To complete, and in the circuit =!, through the full contact of the two connectors, the plugging and unplugging will In the process of causing and testing, the connector needs to be short-circuited by the connector. The wear and tear of the product will be greatly reduced: use ... to affect the test results.,,, not mentioned, how to avoid Conventional technology—the technical subject to be solved by the former. The new content is the shortcoming of the above-mentioned conventional technology. The main purpose of the mechanized test is to mention the style. In order to replace the traditional manual plug-in, the other purpose of the creation is to directly connect to the connection, so as to avoid the connection between the convenience of the test and the efficiency of the second industry, thereby increasing the complexity of the insertion. Connected to cry 1 'the handle manually to the connector's frequency fate - to improve the use of the connector's life-long creation - the purpose is to provide a test of the life of the t-read, reduce the test time == use Pull out The wear of the connector. A way to insert the connection frequently -: The above description = purpose, this creation provides - test device, package connector and probe, connect = phase; - adapter, with - test The test circuit is electrically connected to a pair of the circuit board to be tested, and the connector is electrically connected to the probe 19189 6 M290997 by a rotary connection, and the connector of the circuit board is a pin; and - a circuit to be connected to the test to be tested and corresponding to the base to be tested = wide = is placed on the base, η 仟 仟 奴 ' ' and on the carrier The test circuit board performs two or two knowledge on the circuit board to be tested, so as to: the probe of the adapter is connected with the standby, and the pair is said to be 丨+ Α you' < connection thief Evenly flat. The board to be tested is tested. The connector is a female connector, and the connector is a test circuit board 2: a connector, and a connector corresponding to the connector, and the connector: the connector can also be - The male-female connection 8:, the connector of the #_ test circuit board is the application part and the follow-up part 'the operation part is for the operation system to be fixed to the transfer: the second two is pivoted to the operation Department and another - end. The operation part is the mu door step movement compared to the prior art, the creation =:: the _ road board connection, the connection; the second = the pin is connected to the connection of the circuit board to be tested; and the circuit board can be performed Electrical connection with the circuit board to be tested, design = connection; use = directly without the need to directly connect the pins with anti-missing 85 to carry out the test operation's simple structure 19189 7 M290997 ί人^:: 免^ Manually plugging and unplugging the connector for a period of time, hair, and the convenience of plugging and unplugging the connector, thereby increasing the rate. At the same time, 'Because the test device of this creation is connected by the probe and the I wiring, the #彳木针 of the pendulum σ β, and the contact of the 疋 with the connector of the circuit board to be tested' is not with the entire test circuit board. The connector is in contact with each other. Because of the frequent insertion and removal of the connectors between the two technologies, the wear and tear of the connector is increased, thereby improving the service life of the connector. The following is a description of the present invention by way of specific specific examples. ^: Those skilled in the art can readily make other advantages and effects from the disclosure of the present disclosure. This creation can also be carried out or applied through other different styles. The details in this manual can also be used in different ways and applications to make long-term changes and changes without departing from the spirit of this creation. It is also worth noting that the following figures are simplified: the sound pattern 'only describes the basic idea of the creation in a schematic way. Only the components related to the creation are displayed in the figure, rather than the components in actual implementation. The number, shape and size of the system 'the type and quantity of each component in the actual implementation can be an arbitrary change, and the component layout type can be more complicated. Please refer to Fig. 2 for a perspective view showing the test device of the present creation. As shown in the figure, the test device of the present invention includes a base 1 〇, a piece 2 〇, and a carrier 30. The cymbal base 10 is an L-shaped body for arranging a circuit board 4 to be tested. The circuit board 4 to be tested has a connector 4 〇, and the connector such as 19189 8 M290997 has a plurality of pins 401. . In the present embodiment, the connector 40 is a female connector. / Temple test circuit board 4 of. The connector I of the Hai I connector has a connector 2 and a probe 201 for testing with a pair of the circuit board 4 to be tested, and the connector 5 of the connector 5 is electrically tested. The test circuit is electrically connected by a switch, line 203': the connection between the connector 2〇1 and the probe 202 to be tested on the circuit board 4 is 十2 〇 2 is used to connect the connector as a connection = =1 pin 401° in the present embodiment, the connecting member 201 is connected to the corresponding connection, and the connector 50 of the connecting circuit board 5 is connected to the public connector 2 The connector 2〇1 can also be a male connection crying = the connector of the test circuit board 5 is connected to the connector 5 〇 -= corresponding to the connection can be pushed: The well f is not otherwise provided in the present Palladium example. The number of deniers/shapes and the size ratio of the probe 202 in actual practice are based on the test to be tested: 夂: number, shape, and size of the chat Proportion and set the u pin of each of the Lu Hai carrier 3 0, is the heat of the # f & ·! 10 10 of the circuit board 4 to be tested and corresponding to the base 2Q of the object, and At 3 01, for this test The road straight "also--the work piece 5 is used to test the test board 4, and the operation piece 301 is made so that the connector 4 of the board 4 is electrically connected. The electric test to be tested is carried out, and the measuring device 3G1 of the circuit board 4 to be tested has an operation unit 302 and a follower unit 3〇3, 19189 9 M290997, and its I' For the operator to apply force, the driven portion 303 is connected to the operating portion, and the other end is fixed to the adapter U adapter 20 and the driven portion 3G3 can be synchronized. Actually, the operating member 3〇1 is vertically displaced up and down, but not as follows: and in the present embodiment, when the falling author presses the operating portion, == moving the bearing seat 30 in the direction a vertical ^ move ° 〇 straight private move 'with board 4. Straight private movement and press to connect to the circuit to be tested. Month to see the brother 3 map, the system, display the test of the creation of the action stereo = map household: show When the board to be tested is to be tested, first connect the turn 20 2〇2 30 ^ 2〇2 Lit connection # 2G1, and then connect the probe to the probe 2〇1 and the test board 5 Cry to complete the test before the test, and then test it; wait until the second A is connected to the St base 1〇' at this time the probe 2〇2 is connected to the pin 4 of the benefit 40 (Π, then by pressing The operating member is then used to move the carrier 3 〇3 in the direction ^ to move the probe 2Q2 to the connection of the circuit board 4 to be tested. The test procedure can be performed electrically. When the sample mussel can be pulled up by the operation portion 302, the driven portion 3 is vertically moved in the direction A, and the carrier 3 is driven along the direction A, vertical. ^ 2, the magic pin 2 〇 2 is separated from the connector 4 of the circuit board 4 to be tested, so that the wood = 2 0 2 is out of contact with the connector 4 该 of the circuit board 4 to be tested, and by The test board 4 on the pedestal can be tested by the other circuit board 19189 10 M290997. Test the test device] It is not necessary to connect the pin of the detector (4) directly to the circuit board 4 to be tested. 2. 3 to reach the test circuit =: electricity only wide 2 ° 2 and the patch cord to avoid the various techniques of the prior art Missing. The electrical connection between the reverse 4, in summary, the test connector 201 of the present invention is connected to the first switch panel 5 of the adapter 20, and the connector 201 is connected. By connecting the connection 203 to the connection of the probe 2〇2 to the circuit board 4 to be tested, the probe 202 is plugged into the circuit Mu, and the pin 4 of the link 40 is used to complete the test. The board 5 is tested with the board to be tested 4 Λ. The electrical connection is made, and the connector of the design test plug-in design can be applied correspondingly to the circuit board, and the mouth ml is connected with the anti-missing connection and the slanting force/force is applied to make the probe correspondingly plugged in the $t Test operation, its structure is simple and easy to be real = people can avoid the need to manually insert and remove the connector between the conventional technology: increase the convenience of connector insertion and removal, and then improve: (4), because the test device of this creation Using the probe and the = line to connect, the probe is only connected to the board to be tested = ^ pin: contact, not the connector of the entire test board: 匕, can also avoid direct connection in the prior art The frequency between the devices = ^ 乍 causes the wear of the connector, which in turn increases the reliability of the connector. This creation has already had a very high industrial utilization value. The above embodiments are merely illustrative of the principles of the present invention and its effects, and 19189 11 M290997 is not intended to limit the creation. Any of the π~Bats who are familiar with this technique can modify the above-mentioned embodiments under the spirit and scope of the creation. Therefore, the scope of protection of this creation shall be as listed in the following::::: range. Τ口月I利 [Simple diagram of the diagram] The first diagram shows the connection mode of the connection board of the test circuit board which is not known. The phase diagram of the phase 4 is to be transferred to the second diagram.乂H 二丄匕· Straight leg diagram, and [Main component symbol description] 1 Test device 4 Board to be tested 5 Test board 10 Base 20 Adapter 30 Carrier • 40 Connector 50 Connector 201 Connector 202 probe 203 adapter cable 301 operating member 302 operating portion 303 follower portion 401 pin 19189 12