TWM397528U - Testing system for graphics card - Google Patents

Testing system for graphics card Download PDF

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Publication number
TWM397528U
TWM397528U TW99216222U TW99216222U TWM397528U TW M397528 U TWM397528 U TW M397528U TW 99216222 U TW99216222 U TW 99216222U TW 99216222 U TW99216222 U TW 99216222U TW M397528 U TWM397528 U TW M397528U
Authority
TW
Taiwan
Prior art keywords
display card
test
carrier
disposed
test system
Prior art date
Application number
TW99216222U
Other languages
Chinese (zh)
Inventor
Chien-Chen Pan
Shang-Jui Lee
Dan Zhao
Jin-Ming Zhang
Zheng-Bo Li
Original Assignee
Maintek Comp Suzhou Co Ltd
Pegatron Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Maintek Comp Suzhou Co Ltd, Pegatron Corp filed Critical Maintek Comp Suzhou Co Ltd
Priority to TW99216222U priority Critical patent/TWM397528U/en
Publication of TWM397528U publication Critical patent/TWM397528U/en

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Abstract

This utility provides a testing system for a graphics card for testing a plurality of graphics cards. The testing system includes a base, a plurality of testing devices, a testing host, and a server. The base includes a fastening element and a rotatable element. The rotatable element rotates around the fastening element. The testing devices are disposed at the rotatable element. The graphics cards are disposed at the testing devices, respectively. The testing host is disposed at the rotatable element of the base and is coupled with the testing devices, respectively. The server is wirelessly connected with the testing host.

Description

M397528 五、新型說明: 【新型所屬之技術領域】 且特別是有關於一種顯 本創作有關於一種測試系統 示卡測試系統。 【先前技術】 二顯示卡在出廠之前需要進行測試,以確保其品質。目 別,顯不卡的測試過程通常是在鐵製的固定桌上進行呈M397528 V. New description: [New technical field] It is especially related to a kind of test system for a test system card test system. [Prior Art] Two graphics cards need to be tested before they leave the factory to ensure their quality. The test process of the card is usually carried out on a fixed iron table.

3而顯示卡的測試裝置設置於固定桌上:、於測;過J =人^要於戟裝置之間不停地走動以操作多個 /、丨忒淡置。如此,不僅降低了操作人員的工作效 容易使操作人員疲勞。 此外,顯示卡的測試數據需經由傳輸線傳送至飼服 益。如此,需要較多佈線材料,導致成本較高。 【新型内容】3 The test device of the display card is set on the fixed table: in the test; after J = person ^ is to move around between the devices to operate multiple /, faded. In this way, not only the operator's work efficiency is lowered, but also the operator is fatigued. In addition, the test data of the display card needs to be transmitted to the feeding service via the transmission line. As such, more wiring materials are required, resulting in higher costs. [New content]

本創作提供-種顯示卡測試系、統,能夠解決上 題。 J 本創作提供一種顯示卡測試系統,用於測試多個顯示 卡。顯不卡測試系統包括基座、多個測試裝置、測試主 以及飼縣。基座包括固定件與轉動件,_件以固定件 為軸心轉動。測·置設置於基觸轉動件上,該些顧亍 ^分別設置於該些職裝置。截主機設置於基座的轉動 件亚分軸接於該些測試裝置。飼服器無線連接於測試主 M397528 機。 根據本創作之一具體實施例,基座還包括至少兩個集 電環與至少兩個碳刷,該些集電環環設於固定件,該些碳 刷設置於轉動件,當轉動件以固定件為軸心轉動時,該些 碳刷始終一一對應地接觸該些集電環。 根據本創作之一具體實施例,基座的轉動件呈雙層圓 盤狀。 根據本創作之一具體實施例,顯示卡測試系統還包括 無線路由器’,伺服器藉由無線路由器無線連接於測試主 機。 根據本創作之一具體實施例,每一測試裝置包括本 體、控制模組、連接件、承載件以及操作件。控制模組、 連接件、承載件以及操作件設置於本體,操作件耦接於連 接件與承載件。當操作件沿第一方向移動時,操作件同時 帶動連接件沿第一方向移動並帶動承載件沿第二方向移 動,且第一方向垂直於第二方向。 根據本創作之一具體實施例,每一測試裝置的連接件 包括兩個探針型連接端子,該些探針型連接端子連接顯示 卡與控制模組。 根據本創作之一具體實施例,每一測試裝置的承載件 包括載板與蓋板,蓋板枢接於載板。載板具有容置槽,用 於容置顯示卡,蓋板具有卡合部與抵靠部。當蓋板蓋合於 載板時,卡合部卡合於載板,且抵靠部抵靠容置槽内的顯 示卡。 5 M397528 源自動創作之具體實施例,每—測試裝置還包括電 源自動L·制㈣’编接於控制模組。 電據作之—具體實施例,每—測試裝置還包括放 电開闕,放電開關設置於本體。 個浐根據t創作之—具體實施例,每-測試裝置還包括多 ^几件,該㈣^件設置於本體並補於控制模 件以提供之顯示卡測試系統十,由於基座的轉動 d為軸心轉動’因此’於測試過程中,摔作人員 轉測Γ裝置之間走動’即操作人員可於原地通過轉動 件物作不同的測試裝置。籍此,提高了操作人員的 ::::門f緩解1操作人員的疲勞。此外,測試主機* 低成本,亚減小整個顯示卡測試系統的體積。 降 為讓本創作之上述和其它目的、特徵和優 二下文特舉較佳實施例’並配合所附圖式,作詳2 【實施方式】 圖1所示為根據本創作之—較佳實_之顯 :统:示意圖。圖2所示為根據本創作之一較佳實施= -不卡測⑽朗局部錢圖。請—併參相丨斑 本實施例所提供之顯示卡測試系統1用於測…^ 不卡2。顯示卡魏系統1包括基座1G、多個測試|置^ M397528 測試主機14、無線路由器15以及祠服器16。其中,測試 裝置12與測試主機14設置於基座10。測試主機14分別 耦接於測試裝置12。伺服器16藉由無線路由器15無線連 接於測試主機14。 於本實施例中,基座10包括固定件1〇〇與轉動件 102。轉動件102以固定件100為軸心轉動。如圖】所示, 轉動件102呈雙層圓盤狀。具體而言,固定件可包括 固疋支架1001。轉動件102可包括轉動支架(圖未示)、 圓开> 承載板1020以及多個矩形承載板丨〇21。轉動件j 〇2 的轉動支架可轉動地設置於固定支架1〇〇1。轉動件1〇2的 圓形承載板1020與矩形承載板1〇21均 上。其/,㈣形峨1ΰ2丨·_載板 置’且雜矩縣載板1Q2i所在平面低於圓縣載板1〇2〇 所在平面’從而形成雙層圓盤狀的轉動件iG2。然而,本 創作並不限定轉動件1G2的結構與雜。此外,於本實施 例中,固定件_還可包括多個滾輪刪。該些滾輪臟 設置於固定支架職的底部,從而便於整個顯示卡測試 系統1的移動。 :本,施例中,多個測試裝置12分別設置於轉動件 載板1020與矩形承載板1021上。藉此,於 作㈣人1可於原地通過轉動轉動件iG2以操 作不同的測試裝置】2,從接古 ^ ^ 知可知作人貝的工作效率並緩This creation provides a kind of display card test system and system that can solve the problem. J This author provides a display card test system for testing multiple display cards. The display card test system includes a base, a plurality of test devices, a test master, and a feeding county. The base includes a fixing member and a rotating member, and the member is pivoted by the fixing member. The measuring device is disposed on the base touch rotating member, and the plurality of devices are respectively disposed on the plurality of devices. The rotating member disposed on the base of the main unit is sub-axis coupled to the test devices. The feeder is wirelessly connected to the test main M397528. According to a specific embodiment of the present invention, the base further includes at least two collector rings and at least two carbon brushes, the collector rings are disposed on the fixing member, and the carbon brushes are disposed on the rotating member, when the rotating member is When the fixing member rotates in the axial direction, the carbon brushes always contact the collecting rings one-to-one correspondingly. According to a specific embodiment of the present invention, the rotating member of the base has a double-layered disk shape. According to a specific embodiment of the present invention, the display card test system further includes a wireless router', and the server is wirelessly connected to the test host by a wireless router. According to one embodiment of the present invention, each test device includes a body, a control module, a connector, a carrier, and an operating member. The control module, the connecting member, the carrying member and the operating member are disposed on the body, and the operating member is coupled to the connecting member and the carrier. When the operating member moves in the first direction, the operating member simultaneously drives the connecting member to move in the first direction and drives the carrier to move in the second direction, and the first direction is perpendicular to the second direction. According to one embodiment of the present invention, the connector of each test device includes two probe type connection terminals that connect the display card to the control module. According to one embodiment of the present invention, the carrier of each test device includes a carrier and a cover, and the cover is pivotally coupled to the carrier. The carrier board has a receiving groove for accommodating the display card, and the cover plate has an engaging portion and an abutting portion. When the cover is closed to the carrier, the engaging portion is engaged with the carrier, and the abutting portion abuts against the display card in the receiving slot. 5 M397528 The source automatic creation of the specific embodiment, each test device also includes power automatic L · system (four) 'combined in the control module. According to a specific embodiment, each of the test devices further includes a discharge opening, and the discharge switch is disposed on the body. According to the specific embodiment, each test device further includes a plurality of pieces, and the (four) pieces are disposed on the body and complemented by the control module to provide the display card test system ten, due to the rotation of the base d Rotating for the axis 'so' during the test, the squad turns to move between the squatting devices', that is, the operator can rotate the pieces in place to make different test devices. As a result, the operator's :::: door f is improved to alleviate the fatigue of the operator. In addition, the test host* is low cost, sub-reducing the size of the entire display card test system. The above and other objects, features and advantages of the present invention are described in the following, and the preferred embodiment of the present invention is described in conjunction with the accompanying drawings. FIG. 1 shows a preferred embodiment according to the present invention. The display: system: schematic. Figure 2 shows a preferred implementation of one of the present inventions = - no card test (10). Please - and participate in the freckle The display card test system 1 provided in this embodiment is used to measure ... ^ not card 2. The display card system 1 includes a base 1G, a plurality of tests, a M397528 test host 14, a wireless router 15, and a server 16. The test device 12 and the test host 14 are disposed on the base 10. The test host 14 is coupled to the test device 12, respectively. The server 16 is wirelessly connected to the test host 14 by the wireless router 15. In the present embodiment, the base 10 includes a fixing member 1 and a rotating member 102. The rotating member 102 is pivoted about the fixing member 100. As shown in the figure, the rotating member 102 has a double disc shape. Specifically, the fixing member may include a fixing bracket 1001. The rotating member 102 may include a rotating bracket (not shown), a circular opening > a carrier plate 1020, and a plurality of rectangular carrier plates 21 . The rotating bracket of the rotating member j 〇 2 is rotatably provided to the fixed bracket 1〇〇1. The circular carrier plate 1020 of the rotating member 1〇2 is overlapped with the rectangular carrier plate 1〇21. The / (4) shape 峨 1 ΰ 2 丨 _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ However, the present creation does not limit the structure and the complexity of the rotating member 1G2. Further, in the embodiment, the fixing member_ may further include a plurality of rollers. The rollers are dirty on the bottom of the fixed bracket to facilitate movement of the entire display card test system 1. In the embodiment, a plurality of test devices 12 are respectively disposed on the rotating member carrier 1020 and the rectangular carrying plate 1021. Therefore, in the fourth (person), the person 1 can operate the different test device by rotating the rotating member iG2 in the original place. 2, from the time of the ancient knowledge, it can be known that the work efficiency of the person is slow.

外’於本實施例中’測試裝置U —個。如圖1所示,八個測試裝置12設置於 7 M397528 圓形承載板1020,十二個測叫#里、 # . 1〇91 ^ U分別設置於矩形承 載板1〇2卜,然*,本創作對此不作任何限定。 於:實施例中,測試主機14設置於轉動請的轉 響於測試裝置12。於此,測試細的 數目為兩個(圖未示),每—個測試主機Η可分別連接十 個測試裝置12。鈇而,士 a a 刀⑴适接卞 然而本創作對此不作任何限定。 於本實施例中,飼服器16藉由無線路由器Μ血線連 線傳輸採㈣咖心協定, 從而滿足測試需求並有效傳輸測試數據。然 不限定於此。於其它實施例中,_ϋ16可採3 = ’藍牙或紅外線)連接於測試主機二 u此,相平交於允前技術,未嘗 丨t日以 節省佈線材料,降低成本 之"線連接方式可 統1的體積。 i有效減小整個顯示卡測試系 另外,本創作亦不限定無線路由 設置位置,只要確伴測气土她^ t 服时16的 通訊即可。 ㈣式主機14與伺服器16可進行無線 孕统^ = ?根據本創作之一較佳實施例之顯示卡測試 m局部示意圖。請—併參考圖1至圖p 於本^例中,如圖3所示,基座Μ =件:Γ個碳刷104,106。集電環 置l’:圍繞固心 ⑹。其中^ :件102且分別對應於集電環, 木電%⑻,1〇5連接於電源3。具體而言, 集電環103連接於電源3 3的零線。當轉動件環⑼連接於電源 刷刚,1〇6始終一—對 1〇0為軸心轉動時,碳 ^ . . r , 千應地接觸集電環103,1〇5。於太 貝鈿例中,碳刷1〇4始終接 於本 接觸集電環1〇5。藉此,^103 ’碳刷106始終 刷ΠΗ,⑽可盘华動件1〇2的轉動過程中,碳 從而確保於轉動過持電性接觸狀態, 試系統1中的測試裳置12 寺,知疋地為顯示卡測 衣罝12與測試主機14供電。 此外’於其它實施例中, 電環,用於連接兩^ " 還可匕括另一個集 用於連接心原3的地線。以每兩個碳刷 為一組而言,基座Η)還可包括另— = 同樣地依照上述方式與集電環…。二 試裝置12盥測古式丰嬙“ 接觸以刀別為測 何限定。^機14供電。然而’本創作對此不作任 圖4所不為根據本創作之—純實 糸統I之測試裝詈丨9从_九 只丨下列5式 之-較佳實施例之:亍:不二圖5所示為根據本創作 部示音圖。往一7 糸統1之測試裝置12的局 圖2中僅繪:一:參考圖2、圖4以及圖5。需注意的是, 關於其馀測12與其它元件的連接關係。 裝置12的連接關係―:接關係’均與圖2所示的測試 ⑵、轉置12㈣本㈣、控制模組 制模組125、多個二载:123、操作件124、電源自動控 才曰不7L件126以及放電開關127。其中, 控制模紋121、連接 源自動控制模組125載修 設置於本體12〇。連接=ΓΓ6以及放電開關127均 示元件n η 電源自動控制模組125、指 於 以 電開關127均耦接於控制模組12卜 二承栽部本體120具有第一承載部1201與第 1201 0 7|承載部1202垂直設置於第—承載部 第〜7載牛123、操作件124以及放電開關I27設置於 的〜承栽部1201 ±,連接件122設置於第一承载部· 、〜側,電源自動控制模組125設置於第一承载部12〇1 才工制模組121與指示元件126設置於第二承載部1202。 ,於本實施例中,如圖2所示,控制模組121包括主機 板1210、兩個測試單元i2ii,12丨2以及切換單元Gw = 主機板1210耦接於切換單元1213。切換單元1213耦接於 :個測試單元’ 1212。測試單元1211,1212可分別 碉試顯示卡2的不同顯示模式(例如,DVI,HDMI等模 ,)。相較於先前技術中採用測試單元單獨測試顯示卡的 杈式,於本實施例中,測試單元][211,1212可通過 =換單1213的切換,整合測試顯示卡2的多種模式。 f此,畲測試單元1211結束對顯示卡2的測試後,通過 刀換單70 1213的切換,測試單元1212可接著對顯示卡2 ,订測試。相較於先前技術,本實施例提供之整合測試可 1化測忒流程,節省測試時間。 寺此外,於本實施例中,控制模組121還包括—網路連 埠1214。控制模組121藉由網路連接埠1214通過網路 M397528 連接線轉接於測试主機丨4並與測試主機1 4進行數據傳 輸於本貫^例中,控制模組l2l可即時地將測試數據傳 輸給測試主機14。 ^於本實施例中,連接件122用於連接顯示卡2與控制 '、、’ 121具體而s,連接件122包括兩個探針型連接端 子1222。此外,由於探針型連接端子1222的一端與控制 ‘ 模,丨21始終保持連接狀態,因此,於操作過程中,操作 人員無需進行多次插拔連線。 • 於本實施例中,*載件123言史置於本體12〇的第一承 載部1201上,並包括载板1231與蓋板。蓋板1232 樞接於載板1231。其中,圖5所示為測試裝置12於蓋板 1232掀開的狀態(即蓋板1232未蓋合於載板1231上)。 如圖5所示,載板1231具有容置槽1233,用於容置顯示 卡2谷置槽1233的形狀符合顯示卡2的形狀,藉以定位 顯不卡2。此外,如圖4所示,蓋板1232具有卡合部1234 φ 與抵靠部1235。當蓋板1232蓋合於載板1231時,蓋板 1232的卡合部丨234 (例如,卡勾)會卡合於載板1231的 一側邊(例如’載板1231的卡槽丨236)。抵靠部1235抵 、 罪容置槽1233内的顯示卡2,從而輔助定位顯示卡2。 於本實施例中,操作件124為一操作手柄。操作人員 沿第一方向D1扳動操作件124’即可完成顯示卡2的測試 連接。 具體而言,於本實施例中,操作件124耦接於連接件 122與承載件123。當操作件124沿第一方向D1移動時, M397528 SI::同動連接件122沿第-方向D1移動並帶 1 23沿弟二方向D2移動。其中,第一方向⑴ 垂直於第二方向〇2。 承』6繪示在測試裳置12的本體120内部連接件122、 裁牛123以及操作件124之間的減關係。請—併參考 =與圖6。如圖6所示,連接件122具有連接板㈣, 接板1220連接於操作件124的連桿1240。連接件122 的連接板122G上設有—_槽122卜承載件123底部且 有-凸塊⑽,且承载件123的凸塊123〇可移動地設置 於楔形槽1221内。 具體而言,於本實施例中,如圖6所示’楔形槽1221 具有第-部分1221a與第二部分12训。其中,楔形槽㈣ 的第二部分1221b的延伸方向平行於第-方向Dl。第一部 分122U具有一端部1221c,且端部122 】酬-部分咖與第二部分咖之間形 度。弟-部分122la的端部1221c到第二部分12训的垂 直方向平行於第二方向D2。 於本實施例中,如圖4與圖6所示,當操作件% 第-方向Di移動時’操作件124的連桿副: 122的連接板1220沿第-方向m移動,同時承載件⑵ 的凸塊Π30會沿楔形槽1221移動,從而使得承载件⑵ 沿第二方向D2移動(即朝本體12〇的第二承載部咖^ 動)。當操作件m被移動到位後,連接件122的^ 連接端子1222可插人顯示卡2的對應插槽中,顯示卡2 12 M397528 ===板—中’即顯示卡2可分別連接控 21的主機板121〇與測試單幻叫,⑵2 , 僅:扳動操作件124即可完成顯示卡2的測試連 °,於K不同顯示卡時,操作人員I需手 ,種連線’不僅節省了操作時間,而且減少了由於操作人 貝的刼作差異而造成的測試誤判。 、/、 此外,於本實施例巾,如圖 ^兩個導柱咖。當連接件122沿第—方連向包 Π 223可分別進入本體120的導孔(圖未示)内,從 示卡= 二的探針型連接™可準確軸 或關動用於自動開啟 扳動操作件心: = = = : f 5式衣置12的電源。當顯示卡2的測試結束後,電源自 動控制模組〗25可自動_測試裝置!2的電源。’、 此外,財實_巾,當糾卡2職 裝置丨2巾的域板咖騎存在靜電。 = 電影響主機板⑵。上的元件,操作人員可通過放= ST::心1〇進行放電’從而排除靜電干擾。然而: 、不限疋於此。於其它實施例中,亦 開關127’而於電源自動關閉後自動放電。 、 於本實施例中,指示元件126麵接於控制模組121用 M397528 ^指示Γ裝置12的測試狀況與測試結果。如圖情示, “疋件126例如可包括多個指示燈。 卡2處於測試過程時,指 ^ °田頌不 閃烨以浐干:/ 的測試指示燈會持續 2^ Γ 當㈣㈣121制到顯示卡 沪千六产、日,4 . 々、色拍不燈會持續發光以 才a不存在測试不良。當控 ,.h . 佐刷杈組121檢測到顯示卡2正常 τ 才曰不兀件126的绛岛3匕;I*汉人_1各* 受〜 录色才曰不燈會持續發光以指示測試正 吊元成4。 自於本實施例中,指示元件126還.接於電源 1?的二1 *組125。指示元件126還可用於指示測試裝置 =電源狀況。例如’指示元件126的電源指示燈可持續 旨示電源開啟狀態。^ ’本創作並不限定於此: 於八匕貫施例中’指示科126彳包括多個指示燈应蜂鳴 窃。指示燈可用於指示例如電源狀況與測試狀況等 器可用於指示存在測試不良的狀況。 相技術巾賴數據被傳送至職主機後通 過如螢幕顯示測試結果的方式,於本實施例中,操作人 員通過測試裝置12的指示元件126可直觀地了解每個測 試裝置12的測試狀況與測試結果。如此, 的操作,省時省力。 作貝 /綜上所述’於本創作較佳實施例所揭露之顯示卡測試 系統中,由於基座的轉動件以固定件為軸心轉動,因此, 於測=過程中,操作人員無需於測試裝置之間走動,即操 作人員可於原地通過轉動轉動件以操作不同的測試裝 14 置。籍此,提高了握你A^ 昌6V庙签、貝的工作效率,並緩解了操作人 ,A ^ 4 "、伺服器之間通過無線方式進 订連接,可卽省佈線材料 測試系統的體積。 降低成本,城小整個顯示卡 限定佳實施例揭露如上,然其並非用以 和㈣ A _#者,衫賴本創作之精神 和犯圍内,當可作4b畔夕帝知&、n rpi者、目& —D更動與潤飾,因此本創作之保護 摩έ*圍富視後附之申兮主gg 4丨々斤 %專利抱圍所界定者為準。 【圖式簡單說明】 圖1所示為根據本創作 系統的示意圖。 圖2所示為根據本創作之一 系統的局部方塊圖。In the present embodiment, the test device U is used. As shown in FIG. 1, eight test devices 12 are disposed on a 7 M397528 circular carrier plate 1020, and twelve test calls #里, #.1〇91^U are respectively disposed on the rectangular carrier plate 1〇2, respectively*, This creation does not limit this. In the embodiment, the test host 14 is set to rotate to the test device 12. Here, the number of test details is two (not shown), and each of the test hosts can be connected to ten test devices 12, respectively.鈇 ,, 士 a a knife (1) fit 卞 However, this creation does not limit this. In the present embodiment, the feeder 16 transmits the (4) coffee heart protocol through the wireless router to connect the bloodline to meet the test requirements and effectively transmit the test data. However, it is not limited to this. In other embodiments, _ϋ16 can be connected to the test host by using 3 = 'Bluetooth or Infrared'. This is the same as before the technology, and it has not been used to save wiring materials and reduce the cost. The volume of the system 1. i effectively reduce the entire display card test system In addition, this creation does not limit the location of the wireless routing, as long as it is accompanied by the measurement of gas, she can communicate with the service. (4) The host computer 14 and the server 16 can perform wireless pregnancy control. The display card test according to a preferred embodiment of the present invention is a partial diagram of the m. Please - and refer to Figure 1 to Figure p. In this example, as shown in Figure 3, the base Μ = piece: one carbon brush 104, 106. The collector ring l': surrounds the solid center (6). Wherein: : 102 and corresponding to the collector ring, the wood electricity % (8), 1 〇 5 is connected to the power source 3. Specifically, the slip ring 103 is connected to the neutral line of the power source 33. When the rotating member ring (9) is connected to the power supply brush, 1〇6 is always one-to-one when 1〇0 is the axis rotation, the carbon ^ . . . r is in contact with the collector ring 103, 1〇5. In the case of the Tai Tai Biao, the carbon brush 1〇4 is always connected to the contact slip ring 1〇5. Thereby, the ^103 'carbon brush 106 is always brushed, and (10) during the rotation of the movable member 1〇2, the carbon is ensured to rotate through the state of holding the electric contact, and the test in the test system 1 is set to 12 temples. It is known to supply power to the display card clothing magazine 12 and the test host 14. Further, in other embodiments, an electrical loop for connecting two " can also include another ground wire that is used to connect the cardinal 3. In the case of a set of two carbon brushes, the base Η) may also include another - in the same manner as described above with the collector ring. The second test device 12 盥 古 古 古 嫱 嫱 嫱 接触 接触 接触 接触 接触 接触 接触 接触 接触 接触 ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^詈丨9 From _9 丨 丨 丨 丨 丨 - - - 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳Only painted: one: refer to Figure 2, Figure 4 and Figure 5. It should be noted that the connection relationship between the device 12 and other components is the connection relationship of the device 12: the connection relationship is shown in Figure 2 Test (2), transposition 12 (four) (4), control module module 125, multiple two loads: 123, operating device 124, power supply automatic control, not 7L 126 and discharge switch 127. Among them, control pattern 121, connection The source automatic control module 125 is installed on the main body 12〇. The connection=ΓΓ6 and the discharge switch 127 are all shown as components n η. The power automatic control module 125 and the electrical switch 127 are all coupled to the control module 12 The plant body 120 has a first bearing portion 1201 and a 1201 0 7 bearing portion 1202 disposed perpendicularly to the first carrier portion ~7 The cow 123, the operating member 124, and the discharge switch I27 are disposed on the receiving portion 1201 ±, the connecting member 122 is disposed on the first carrying portion ·, the side, and the power automatic control module 125 is disposed on the first carrying portion 12〇1 The working module 121 and the indicating component 126 are disposed on the second carrying portion 1202. In this embodiment, as shown in FIG. 2, the control module 121 includes a motherboard 1210, two test units i2ii, 12丨2, and switching. The unit Gw = the motherboard 1210 is coupled to the switching unit 1213. The switching unit 1213 is coupled to: a test unit '1212. The test units 1211, 1212 can respectively test different display modes of the display card 2 (for example, DVI, HDMI, etc.) In the present embodiment, the test unit][211, 1212 can pass the switch of the change order 1213, and integrates multiple modes of the test display card 2, compared with the prior art, in which the test unit is separately tested for the display card. f. After the test unit 1211 finishes testing the display card 2, the test unit 1212 can then perform a test on the display card 2 by switching the knife change order 70 1213. Compared with the prior art, the present embodiment provides Integration test In addition, in this embodiment, the control module 121 further includes a network port 1214. The control module 121 is connected to the network through the network M397528 through the network connection 埠1214. The host computer 4 and the test host 14 perform data transmission in the present example, and the control module 111 can transmit the test data to the test host 14 in real time. In the embodiment, the connector 122 is used for connection display. The card 2 and the control ', '' are specifically s, and the connector 122 includes two probe-type connection terminals 1222. In addition, since one end of the probe type connection terminal 1222 and the control 'module, the 丨 21 is always connected, the operator does not need to perform multiple plugging and unplugging during the operation. • In the present embodiment, the *carrier 123 is placed on the first load portion 1201 of the body 12'''''''''''''' The cover plate 1232 is pivotally connected to the carrier plate 1231. 5 shows the state in which the test device 12 is opened in the cover plate 1232 (ie, the cover plate 1232 is not covered on the carrier plate 1231). As shown in FIG. 5, the carrier 1231 has a receiving groove 1233 for accommodating the shape of the display card 2, and the shape of the valley 1233 conforms to the shape of the display card 2, thereby positioning the card 2. Further, as shown in FIG. 4, the cover plate 1232 has an engaging portion 1234 φ and an abutting portion 1235. When the cover plate 1232 is covered by the carrier 1231, the engaging portion 234 (for example, the hook) of the cover 1232 can be engaged with one side of the carrier 1231 (for example, the card slot 236 of the carrier 1231). . The abutting portion 1235 abuts the display card 2 in the slot 1233, thereby assisting in positioning the display card 2. In this embodiment, the operating member 124 is an operating handle. The operator can complete the test connection of the display card 2 by pulling the operating member 124' in the first direction D1. Specifically, in the embodiment, the operating member 124 is coupled to the connecting member 122 and the carrier 123. When the operating member 124 moves in the first direction D1, the M397528 SI:: the movable connecting member 122 moves in the first direction D1 and the belt 1 23 moves in the second direction D2. Wherein, the first direction (1) is perpendicular to the second direction 〇2. The drawing 6 shows the subtractive relationship between the inner connecting member 122, the cutting cow 123 and the operating member 124 of the body 120 of the test skirt 12. Please - and refer to = and Figure 6. As shown in FIG. 6, the connecting member 122 has a connecting plate (four), and the connecting plate 1220 is coupled to the connecting rod 1240 of the operating member 124. The connecting plate 122G of the connecting member 122 is provided with a groove 122 and a bottom portion of the carrier 123 and has a projection (10), and the projection 123 of the carrier 123 is movably disposed in the wedge groove 1221. Specifically, in the present embodiment, as shown in Fig. 6, the 'wedge groove 1221' has the first portion 1221a and the second portion 12. Wherein, the extending direction of the second portion 1221b of the wedge-shaped groove (four) is parallel to the first direction D1. The first portion 122U has an end portion 1221c, and the end portion 122 is shaped between the portion and the second portion. The vertical direction from the end portion 1221c to the second portion 12 of the portion 122a is parallel to the second direction D2. In the present embodiment, as shown in FIG. 4 and FIG. 6, when the operating member % first-direction Di moves, the connecting plate 1220 of the link pair: 122 of the operating member 124 moves in the first direction m while the carrier (2) The bumps 30 will move along the wedge-shaped slots 1221, thereby causing the carrier (2) to move in the second direction D2 (i.e., toward the second carrier of the body 12A). When the operating member m is moved into position, the connecting terminal 1222 of the connecting member 122 can be inserted into the corresponding slot of the display card 2, and the display card 2 12 M397528 === board-in-the display card 2 can be respectively connected to the control 21 The motherboard 121〇 and the test single scream, (2) 2, only: pull the operating member 124 to complete the test of the display card 2 °, when K different display cards, the operator I need hands, the kind of connection 'not only saves The operation time is reduced, and the test misjudgment caused by the difference in the operation of the operator is reduced. In addition, in the towel of this embodiment, as shown in the figure, two guide pillars. When the connecting member 122 can enter the guiding hole (not shown) of the body 120 along the first-side connecting bag 223, the probe type connection TM from the card = 2 can be accurately shafted or closed for automatic opening and pulling. Operating part of the heart: = = = : f 5 type of clothing 12 power supply. When the test of the display card 2 is finished, the power automatic control module 〖25 can automatically _ test the device! 2 power supply. ‘In addition, the financial _ towel, when the card is 2, the device 丨 2 towel domain board rides static. = Electrical influence on the motherboard (2). On the upper component, the operator can discharge by placing = ST::heart 1〇 to eliminate static interference. However, it is not limited to this. In other embodiments, switch 127' is also automatically discharged after the power is automatically turned off. In this embodiment, the indicating component 126 is connected to the control module 121 to indicate the test condition and test result of the device 12 by M397528^. As shown in the figure, "the device 126 can include, for example, a plurality of indicator lights. When the card 2 is in the test process, the indicator light does not flash to dry: / the test indicator will continue for 2^ Γ when (four) (four) 121 system to display Cards, Shanghai, and Taiwan, production, day, 4, 々, color, no light will continue to shine, then there is no bad test. When the control, .h. 佐 brush 杈 group 121 detects that the display card 2 is normal τ 126 绛 匕 匕 匕 匕 I I I I I I I I I I I I I I I I I I I I I I 126 126 126 126 126 126 126 126 126 126 126 126 126 126 126 126 126 126 126 126 126 126 126 126 126 The two 1* group 125. The indicating component 126 can also be used to indicate the test device = power condition. For example, the power indicator of the indicating component 126 can continue to indicate the power-on state. ^ 'This creation is not limited to this: In the example, the 'instruction section 126' includes a plurality of indicator lights that should be beeped. The indicator light can be used to indicate that a device such as a power supply condition and a test condition can be used to indicate that there is a bad test condition. After the host computer displays the test result by a screen, in this embodiment The operator can intuitively understand the test condition and test result of each test device 12 through the indicating component 126 of the test device 12. Thus, the operation saves time and effort. In the display card test system disclosed in the example, since the rotating member of the base rotates with the fixing member as the axis, during the measurement, the operator does not need to move between the testing devices, that is, the operator can pass through in the field. Rotate the rotating parts to operate different test fixtures 14. This improves the efficiency of holding your A^ Chang 6V temple sign, and eases the operator, A ^ 4 ", the server between the wireless way The ordering connection can save the volume of the wiring material testing system. Reduce the cost, the whole small display card of the city is limited to the best embodiment disclosed above, but it is not used and (4) A _#, the spirit of the creation and the peri Inside, when it can be used as 4b, the emperor knows &n npipi, the eye &-D is more moving and retouching, so the protection of this creation is surrounded by the 兮 兮 兮 富 富 富 gg gg gg gg gg gg gg gg The definition of the enclosure is subject to. Brief Description of formula 1] is shown in Fig. Is a partial schematic block diagram of an authoring system according to the present as shown in FIG. 2 in accordance with one of the present authoring system.

之一較佳實施例之顯示卡測試 較佳實施例之顯示卡測試 較佳實施例之顯示卡測試 較佳實施例之顯示卡測試 圖3所示為根據本創作之一 系統的基座的局部示意圖。 圖4所示為根據本創作之一 系統的測試裝置的示意圖。 圖5所不為根據本創作 έ ^ ΛΛ ,ρ|, ,, ^ 早又^施例之顯示卡測試 糸、,充的測试裝置的局部示意圖。 所7^為在測試裝置的本體内部連接件、承載件以 #作件之間的耦接關係。 【主要元件符號說明】 15 M397528 〔習知〕 無 〔本創作〕 1 顯示卡測試系統 10 基座 100 固定件 1001 固定支架 1002 滚輪 102 轉動件 1020 圓形承載板 1021 矩形承載板 103, 105集電環 104 , 106 碳刷 12 測試裝置 120 本體 1201 第一承載部 1202 第二承載部 121 控制模組 1210 主機板 1211, 1212 測試早兀 1213 切換單元 1214 網路連接埠 122 連接件 1220 連接板 1221 楔形槽 1221a 第一部分 1221b 第二部分 1221c 端部 1222 探針型連接端子 1223 導柱 123 承載件 1230 凸塊 1231 載板 1232 蓋板 1233 容置槽 1234 卡合部 1235 抵靠部 1236 卡槽 124 操作件 1240 連桿 125 電源自動控制模組 126 指示元件 127 放電開關 16Display card test of a preferred embodiment of the preferred embodiment of the display card test preferred embodiment of the display card test preferred embodiment of the display card test Figure 3 shows a portion of the base of the system according to the present invention schematic diagram. Figure 4 is a schematic illustration of a test apparatus in accordance with one of the present teachings. Figure 5 is not a partial schematic diagram of the test device according to the present invention, ρ^ ΛΛ , ρ|, , , ^, and the display card test of the example. 7^ is the coupling relationship between the connecting member and the carrier in the body of the testing device. [Main component symbol description] 15 M397528 [Practical] No [This creation] 1 Display card test system 10 Base 100 Fixing member 1001 Fixing bracket 1002 Roller 102 Rotating member 1020 Round carrier plate 1021 Rectangular carrier plate 103, 105 Collector Ring 104, 106 Carbon brush 12 Test device 120 Body 1201 First carrier 1202 Second carrier 121 Control module 1210 Motherboard 1211, 1212 Test early 1213 Switching unit 1214 Network connection 埠 122 Connector 1220 Connecting plate 1221 Wedge Slot 1221a First portion 1221b Second portion 1221c End portion 1222 Probe type connection terminal 1223 Guide post 123 Carrier 1230 Bump 1231 Carrier plate 1232 Cover plate 1233 accommodating groove 1234 Engagement portion 1235 Abutment portion 1236 Card slot 124 Operating member 1240 connecting rod 125 power automatic control module 126 indicating component 127 discharging switch 16

Claims (1)

M397528 99年11月15日補充修正修正頁. 六、申請專利範圍: 1、一種顯示卡測試系統,用於測試多個顯示卡,該顯示. 卡測試系統包括: · 一基座,其包括一固定件與一轉動件,該轉動件以該 固定件為軸心轉動; 多個測試裝置,其設置於該基座的該轉動件上,該些 顯示卡分別設置於該些測試裝置; 一測試主機,其設置於該基座的該轉動件並分別耦接 於該些測試裝置;以及 鲁 一伺服器,其無線連接於該測試主機。 2、 如申請專利範圍第1項所述之顯示卡測試系統,其中 該基座還包括至少兩個集電環與至少兩個$炭刷;該些 集電環環設於該固定件,該些碳刷設置於該轉動件, 當該轉動件以該固定件為軸心轉動時,該些碳刷始終 ——對應地接觸該些集電環。 3、 如申請專利範圍第1項所述之顯示卡測試系統,其中A 該基座的該轉動件呈雙層圓盤狀。 4、 如申請專利範圍第1項所述之顯示卡測試系統,還包 括一無線路由器,該伺服器籍由該無線路由器無線連 接於該測試主機。 5、 如申請專利範圍第1項所述之顯示卡測試系統,其中— 每一該些測試裝置包括一本體、一控制模組、一連接 件、一承載件以及一操作件,該控制模組、該連接件、 該承載件以及該操作件設置於該本體,該操作件耦接 18 M397528 ,.' 99年11月15日補充修正修正頁 ' 於該連接件與該承載件,當該操作件沿一第一方向移 . 動時,該操作件同時帶動該連接件沿該第一方向移動 : 並帶動該承載件沿一第二方向移動,且該第一方向垂 直於該第二方向。 6、如申請專利範圍第5項所述之顯示卡測試系統,其中 每一該些測試裝置的該連接件包括兩個探針型連接端 子,該些探針型連接端子連接該顯示卡與該控制模組。 7、如申請專利範圍第5項所述之顯示卡測試系統,其中 • 每一該些測試裝置的該承載件包括一載板與一蓋板, 該蓋板枢接於該載板,該載板具有一容置槽,用於容 置該顯示卡,該蓋板具有一卡合部與一抵靠部,當該 蓋板蓋合於該載板時,該卡合部卡合於該載板,且該 抵靠部抵靠該容置槽内的該顯示卡。 8、 如申請專利範圍第5項所述之顯示卡測試系統,其中 每一該些測試裝置還包括一電源自動控制模組,耦接 於該控制模組。 • . 9、 如申請專刹範圍第5項所述之顯示卡測試系統,其中 每一該些測試裝置還包括一放電開關,該放電開關設 置於該本體。 • ‘ 10、如申請專利範圍第5項所述之顯示卡測試系統,其中 • 每一該些測試裝置還包括多個指示元件,該些指示元 件設置於該本體並耦接於該控制模組。 19 M397528M397528 Supplementary Amendment Amendment Page, November 15, 1999. VI. Patent Application Range: 1. A display card test system for testing multiple display cards, the display. The card test system includes: a pedestal including one a fixing member and a rotating member, the rotating member is pivoted about the fixing member; a plurality of testing devices are disposed on the rotating member of the base, and the display cards are respectively disposed on the testing devices; The main body is disposed on the rotating component of the base and coupled to the testing devices respectively; and the Luyi server is wirelessly connected to the testing host. 2. The display card test system of claim 1, wherein the base further comprises at least two collector rings and at least two carbon brushes; the collector rings are disposed on the fixing member, The carbon brushes are disposed on the rotating member, and when the rotating member rotates with the fixing member as an axis, the carbon brushes always contact correspondingly the collecting rings. 3. The display card test system of claim 1, wherein the rotating member of the base has a double-layered disk shape. 4. The video card test system of claim 1, further comprising a wireless router, the server wirelessly connected to the test host by the wireless router. 5. The display card test system of claim 1, wherein each of the test devices comprises a body, a control module, a connector, a carrier, and an operating member, the control module The connecting member, the carrying member and the operating member are disposed on the body, and the operating member is coupled to 18 M397528, . 'November 15, 1999 Supplementary Correction Page' on the connecting member and the carrying member when the operation When the piece moves in a first direction, the operating member simultaneously drives the connecting member to move in the first direction: and drives the carrier to move in a second direction, and the first direction is perpendicular to the second direction. 6. The display card test system of claim 5, wherein the connector of each of the test devices comprises two probe type connection terminals, the probe type connection terminals connecting the display card and the Control module. 7. The display card test system of claim 5, wherein the carrier of each of the test devices comprises a carrier and a cover, the cover being pivotally connected to the carrier, the carrier The board has a receiving slot for receiving the display card. The cover has a latching portion and an abutting portion. When the cover is attached to the carrier, the engaging portion is engaged with the loading portion. a plate, and the abutting portion abuts the display card in the receiving slot. 8. The display card test system of claim 5, wherein each of the test devices further comprises a power supply automatic control module coupled to the control module. 9. The display card test system of claim 5, wherein each of the test devices further comprises a discharge switch, the discharge switch being disposed on the body. The display card test system of claim 5, wherein each of the test devices further includes a plurality of indicator elements, the indicator elements are disposed on the body and coupled to the control module . 19 M397528 圖1figure 1
TW99216222U 2010-08-23 2010-08-23 Testing system for graphics card TWM397528U (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103941112A (en) * 2013-01-18 2014-07-23 技嘉科技股份有限公司 System and method for detecting multiple image signals
TWI499789B (en) * 2012-06-04 2015-09-11 Advantest Corp Testing system and server
US9140752B2 (en) 2012-06-04 2015-09-22 Advantest Corporation Tester hardware
US9563527B2 (en) 2013-06-04 2017-02-07 Advantest Corporation Test system

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI499789B (en) * 2012-06-04 2015-09-11 Advantest Corp Testing system and server
US9140752B2 (en) 2012-06-04 2015-09-22 Advantest Corporation Tester hardware
CN103941112A (en) * 2013-01-18 2014-07-23 技嘉科技股份有限公司 System and method for detecting multiple image signals
US9563527B2 (en) 2013-06-04 2017-02-07 Advantest Corporation Test system

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