TWM262950U - Automatically solder-melting replacement apparatus for the chip-die module and chips on mainboard - Google Patents
Automatically solder-melting replacement apparatus for the chip-die module and chips on mainboard Download PDFInfo
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- TWM262950U TWM262950U TW93215794U TW93215794U TWM262950U TW M262950 U TWM262950 U TW M262950U TW 93215794 U TW93215794 U TW 93215794U TW 93215794 U TW93215794 U TW 93215794U TW M262950 U TWM262950 U TW M262950U
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M262950 四、創作說明(1) 【新型所屬之技術領域】 本創作係關於一種多個顆粒晶片熔錫焊接組裝於 板成一晶片模組,經檢測出模組中不良品顆粒晶片之 上品顆粒晶片裝置者,·尤指,該不良品顆粒錫拔 :【,顆粒晶片之抓持插組或表面黏著或錫球 哀烊連作業係由裝置依序自動控制操作者。 【先前技術】 時,炼組成品檢測出不良品顆粒晶片 諸多接腳溶化的等熱源正對該不良品顆粒晶片 腳對準電路^ 人工另失持良品顆粒晶片接 焊錫持續錄化呈液^使用該熱風焊搶等熱源正對該 脫離熱源,冷郤熄i 回置,並繼續壓持該顆粒晶片 的人工:業=錫以固接回置的顆粒晶片;然而,如是 行人工拔除和焊==不彰,且須由熟練的技術人員執 本;再者,m的:業以保持品質’相對的提高人工成 細的接腳植入動祚匕焊錫的熱和氣味’及眼力專注晶片微 有,人工作掌县,易造成作業人員疲勞和人為疏失;更 事,需再拆組或搭組…度成為不良品之 約有3 0 %須重工)、、專重工作業(人工換裝後的不良率仍 本案創作2有Γ見其缺失。 驗,終而揭示f I於此,仍詳加研究改進,幾經實作試 之自動熔锡拆& B創作一種晶片顆粒模組和主機板上晶片 鄉取暨換新裝置。 M262950 四、創作說明(2) 【新型内容】 本創作之主要目的係在於提供一曰 i機板上晶片之自動熔錫拆取暨換新裝 /顆粒模組和主 品顆粒晶片的多個晶片模組放置於同—i係將檢測出不良 進行鎔錫拔除顆粒晶片的動作,較之/Q具盤内,可同時 工具逐-持對進行鎔錫操作,能提】持熱風 者。 生產數S和作業效率 本創作之次一目的係在於提供一 機板上晶片之自動熔錫拆取暨換新裝曰,日片顆粒模組和主 模組上欲拔除的顆粒晶片接腳進行教;鎔=時對數個晶片 錫溫度和固定的喷吹位置距離角度,=二以預設的鎔 定的喷吹鎔錫速度,提供更準確的鎔錫作】:的加熱和穩 本創作之另一目的係在於提供一^ 機板上晶片之自動熔錫拆取暨換新裝置:曰:=J 間完…後,即自動進行設定角度的拔除錫: 或搭合更易對準電路板接點的焊錫^良时顆粒晶片的插合 本創作之再目的係在於提供一種晶片顆粒模纟4 機板上晶片之自動熔錫拆取暨換新裝4,同時抓持數σ 粒晶片數值化自動操作對合電路板接孔位 同位搭置,可提高換裝良品顆粒晶片的速度和效=叠或 機板的係在於提供一種晶片顆教模組和主 機板上as片之自動熔錫拆取暨換新裝置,於晶 板接孔插置或搭置顆粒晶片接腳前,亦進行熱風喷莫吹: 第6頁 四、創作說明(3) 錫作業,使每一顆粒晶片接腳確實的對合電路板接點鎔融 的焊錫固接者。 本創作的技術方案是: 片之自動熔錫拆取暨 組件者; 的線形導軌組 構設置於機架 數治具盤放置 片者; 晶片模組電路 跨置於該機架 組的滑行軌道 接腳者; 置於該機架門 應欲換裝的晶 該熱源裝置二 對合吸持和放 一種晶片顆粒模組和主機板上晶 換新裝置,包括: 一門型 立體三 支架上 設於該 組滑行 換裝的 具組各 熱風喷 的座標 欲拔除 該座標 軌組滑 設置吸 泵裝置 支架容組各 座標軸運動 者; 座標導行機 檯上,合置 良品顆粒晶 治具盤放置 嘴,使垂直 軸線形導軌 晶片兩側的 導行機構設 行檯上,對 持套位置於 ’可操作的 一機架,基座上立置 一座標導行機構,呈 設置於該機架基座和門型 一治具組,其基板固 基座上的座標軸線形導軌 多個晶片模組電路板和預 一熱源裝置,對應治 板顆粒晶片位置設有二排 基座上的該座標導行機構 上方’可調整固定的正對 一抓持機構,固設於 型支架上一座標軸線形導 片模組電路板顆粒晶片, 排熱風喷嘴間連通一真空 開欲換裝的顆粒晶片者; 源裝置可調設各數值 將本創作可行的實施 一控制裝置,連接各運動件和熱 和手自動切換的操控順序動作者。 兹就所附諸圖式配合下列說明, 例進一步說明而得以具體明晰之。 M262950M262950 IV. Creation Instructions (1) [Technical Field to which the New Type belongs] This creation is about a kind of multiple particle wafers which are welded and assembled on a board to form a wafer module. Or, especially, the defective product tin tin: [, the chip wafer holding insert group or surface sticking or solder ball wailing operation is automatically controlled by the device in order by the operator. [Previous technology] At the time of refining the composition, the isothermal source that detected that many pins of the defective wafers had melted was aligned with the circuit of the defective wafer pins. ^ Manually lost the good quality wafers. The solder was continuously recorded. The heat source, such as the hot air welding, is facing the disengagement heat source, cooling and replacing it, and continuing to hold the particle wafer manually: industry = tin to fix the returned particle wafer; however, if it is manually removed and soldered = = Not good, and must be performed by skilled technicians; furthermore, m: to maintain the quality 'relatively improve the artificially thin pin implantation of the heat and odor of the solder' and the eyesight focus on the chip micro Yes, people working in the county can easily cause operator fatigue and human negligence; what's more, it needs to be disassembled or assembled ... 30% of the defective products must be reworked, and special work (after manual replacement) The defect rate of this case is still missing in the creation of this case. It was finally revealed that f I was here, and research and improvement were still carried out in detail. After several trials, the automatic solder disassembly & B created a chip pellet module and a motherboard. Go to Chip Township and get a new device. M262950 IV. Creation Instructions (2) [New Content] The main purpose of this creation is to provide automatic solder removal and replacement of chips on the i-board and replacement of multiple chips / chip modules and multiple chips of the main particle chip. The module is placed in the same-i series. It will detect the defect and perform the operation of removing the tin wafer. Compared with the / Q tool tray, the tool can be operated one-by-one at the same time to perform the tin operation, which can improve the hot air. S and operating efficiency The second purpose of this creation is to provide automatic solder removal and replacement of a chip on a board. The chip chip and the chip chip pins to be removed from the main module are taught;镕 = when the temperature of several wafers tin and the fixed spraying distance angle, = 2 at a preset predetermined spraying tin speed to provide more accurate tin tin work]: heating and stabilization of another The purpose is to provide an automatic tin-melting removal and renewal device for the chip on the board: after: = J is finished, the tin is automatically removed at a set angle: or it is easier to align the circuit board contacts Insertion of solder ^ Liangshi particle wafer The invention is to provide an automatic tin melting and removal of a wafer chip die 4 chip on the board and a new installation 4, while holding a number of sigma wafers numerically automatic operation butt-hole placement of the circuit board joints can improve the replacement The speed and effect of good quality chip wafers = stacking or machine boards is to provide an automatic tin melting and removal and replacement device for chip teaching modules and as-chips on the motherboard, inserting or laminating particles in the crystal board holes. Hot air blowing is also performed before the chip pins: Page 6 Fourth, creation instructions (3) Tin operation, so that each particle chip pin is sure to be soldered to the circuit board to fuse the solder joints. The technical solution is: those who automatically remove and assemble and remove the components from the chip; those who have a linear guide rail structure set on the rack and the number of jigs and discs; those who have the chip module circuit across the slide rail pins of the rack group ; The heat source device that is placed on the door of the rack should be replaced, and the two pairs of holding and holding a wafer particle module and a new device on the motherboard, including: a door-type three-bracket set on the group to glide Coordinates for each hot-air spray If you want to remove the coordinate rail group, set a suction pump device bracket to accommodate each axis of the coordinate group; On the coordinate guide machine, a good product grain crystal fixture disc is placed, so that the guide mechanisms on both sides of the vertical axis-shaped wafer are set. On the traveling platform, the holding sleeve is located in an operable rack, and a standard guide mechanism is erected on the base, which is arranged on the base of the rack and a gate-type fixture set, and the base plate is fixed on the base. The coordinate axis-shaped guide rails have multiple chip module circuit boards and a pre-heat source device. Two rows of pedestals above the coordinate guide mechanism are arranged above the coordinate guide mechanism corresponding to the chip particle position of the plate. A standard axis-shaped guide module circuit board particle wafer is arranged on the type bracket, and a hot air nozzle is connected with a particle wafer to be replaced by a vacuum. The source device can be adjusted to set various values to implement a control device that is feasible for this creation. Connect the moving parts and the heat and hand automatically switch the sequence of actors. The accompanying drawings are clarified with the following description and examples for further explanation. M262950
四、創作說明(4) ’本創作係包括·· 一機架(1 ), 一座標導行機構(2) 一治具組(3 ),一赦、j、,4. Creative Instructions (4) ‘This creative department includes a frame (1), a standard guide (2), a fixture group (3), a pardon, j ,,
二座標軸線形導軌組(23)亦十字交叉的連設於該第二座標 軸線形導軌組(22)的滑行檯(221)上,投影垂直該第一座 標軸線形導軌組(2 1 ),使整體呈三座標軸運動形態設立。 該治具組(3 )基板(3 1 )固設於該座標導行機構(2)第一 座標軸線形導軌組(2 1 )的滑行檯(2 1 1 )上,並挖設數凹室 (32)底面穿設諸多的透氣孔(33),及於各透氣孔(33)間的 凹至(32)底面没置諸多的凸點(34),使一治具盤(35)外形 對合該凹室(32),以形成該治具盤(35)和凹室(32)間呈一 氣室(36)。該基板(31)各凹室(32)和治具盤(35)對合的邊 緣壁預定位置挖設數夾取槽(3 11 )。 δ亥治具盤(3 5 )對應欲處理的晶片模組電路板(p )挖設 對合的數個階梯凹槽(3 5 1)(如第四、五、六圖所示),立 各階梯凹槽(351 )底面穿設諸多通孔(352),其邊緣挖設諸 多的通風槽(353)連通該各晶片模組電路板(Ρ)底面的空間 (3 7 ),並於該治具盤(3 5 )的邊緣板上嵌設諸多溫度感測點 【實施方式】 參閱第一〜三圖所示, M262950 四、創作說明(5) ( 3 54),以及數個定置槽( 35 5 )托置預換裝的良品顆粒晶片 (C );該定置槽(3 5 5 )底面兩側對應顆粒晶片(c )接腳(C1) 放置的位置穿設腳溝( 3 5 6 ),各定置槽( 3 5 5 )間挖通助焊劑 流通溝(3 5 7 ),使連通兩側挖設的助焊劑承置穴(3 5 8 ),注 入通流適量的液態助焊劑於該流通溝(3 5 7 )沾置於各顆粒 晶片(C )的接腳(C1 )底部(如第六、七圖所示)。 該治具盤(3 5 )各階梯凹槽(3 5 1 )和晶片模組電路板(P ) 對合的邊緣預定位置各挖設有數取出槽(3 5 9 )。本創作該 顆粒晶片(C )接腳(c 1 )可為插組焊固,亦可為搭組焊固的 規格(如第七圖所示)。 該熱源裝置(4 )對應該治具盤(3 5 )放置的晶片模組電 路板(P )數量設置二排同數的熱風喷嘴(41 ),以預設角度 相對的各連置於一支桿(42)上,可調整固定的各滑設於支 架組(43)上,使垂直跨置於該第一座標軸線形導軌組(21 ) 的滑行軌道上方,且間置正對欲拔除顆粒晶片(c)兩侧的 接腳(如第四圖所示)。該各熱風喷嘴(4 1 )係單一或雙併或 多個併合的套接於一熱發生器(44)的出口,鄰近該出口設 置一混流擋板(4 4 1 )分流及均流熱風,使連接因應一熱源 控制器(4 5 )引接熱源或操控熱源的供給。 該抓持機構(5)對應該治具盤(35)放置晶片模組電路 板(P)的顆粒晶片(C)數量和位置,設有同數的吸持套(5 1) 正對該欲拔除的晶片(C)而置於該熱源裝置(4)的二排熱風 噴嘴(4 1)之間。該吸持套(5丨)頂部連通一管桿(5 2 )遊穿過 固設於該第三座標軸線形導軌組(2 3 )滑行檯(2 3 1 )上的一Two coordinate axis-shaped guide rail groups (23) are also cross-connected on the sliding table (221) of the second coordinate axis-shaped guide rail group (22), and the projection is perpendicular to the first coordinate axis-shaped guide rail group (2 1), so that the overall appearance is Three coordinate axis motion patterns were established. The base plate (3 1) of the jig set (3) is fixed on the sliding table (2 1 1) of the first coordinate axis-shaped guide rail group (2 1) of the coordinate guide mechanism (2), and a plurality of recesses ( 32) A large number of ventilation holes (33) are penetrated on the bottom surface, and the recesses (32) between the ventilation holes (33) are not provided with many convex points (34) on the bottom surface, so that the shape of a fixture plate (35) is aligned. The cavity (32) forms an air chamber (36) between the jig tray (35) and the cavity (32). A plurality of clamping grooves (3 11) are dug at predetermined positions of the edge walls of the base plate (31) and the concave wall (32) of the fixture plate (35). δHai fixture plate (3 5) digs several stepped grooves (3 5 1) corresponding to the chip module circuit board (p) to be processed (as shown in the fourth, fifth, and sixth figures), and stands A plurality of through holes (352) are penetrated on the bottom surface of each stepped groove (351), and a plurality of ventilation slots (353) are dug on the edge thereof to communicate with the space (3 7) on the bottom surface of each chip module circuit board (P), and Many temperature sensing points are embedded in the edge plate of the fixture plate (3 5). [Embodiment] Refer to the first to third pictures, M262950 IV. Creation instructions (5) (3 54), and several fixing slots ( 35 5) Hold the pre-replaced good-quality granule wafer (C); the setting groove (3 5 5) on both sides of the bottom surface corresponding to the grain wafer (c) pin (C1) is placed through a foot groove (3 5 6) A flux circulation groove (3 5 7) is dug out between each fixed groove (3 5 5), so that the flux receiving cavity (3 5 8) dug at both sides is connected, and an appropriate amount of liquid flux is injected into the flux. The flow channel (3 5 7) is attached to the bottom of the pin (C1) of each particle wafer (C) (as shown in Figures 6 and 7). The stepped grooves (3 5 1) of the jig plate (3 5) and the predetermined edge positions of the chip module circuit board (P) are dug with a plurality of extraction grooves (3 5 9). The pin (c 1) of the chip (C) in this article can be inserted and welded, and it can also be a welded specification (as shown in Figure 7). The heat source device (4) is provided with two rows of the same number of hot air nozzles (41) corresponding to the number of the chip module circuit boards (P) placed on the fixture plate (3 5), and each is connected at a predetermined angle to each other. Each of the rods (42) can be adjusted and fixed on the bracket group (43), so that the vertical span is placed above the sliding track of the first coordinate axis-shaped guide rail group (21), and the particles are positioned in the opposite direction to the wafers to be removed. (C) Pins on both sides (as shown in Figure 4). The hot air nozzles (41) are single or double parallel or multiple merged sockets connected to an outlet of a heat generator (44), and a mixed flow baffle (4 4 1) is arranged adjacent to the outlet to divide and distribute hot air. Make the connection according to a heat source controller (45) to lead the heat source or control the supply of the heat source. The holding mechanism (5) is provided with the same number of holding sleeves (5 1) corresponding to the number and position of the particle wafers (C) where the wafer module circuit board (P) is placed on the fixture plate (35). The removed wafer (C) is placed between two rows of hot air nozzles (41) of the heat source device (4). The top of the holding sleeve (5 丨) communicates with a pipe rod (5 2) and swims through a rod fixed on the sliding table (2 3 1) of the third coordinate axis-shaped guide rail group (2 3).
M262950M262950
ίΪ!ί3、’於該管桿(52)兩端套持-前彈簧(“I)和-一 《 — 頂觸擋止於該套持管(5 3 )内預設位置連設的 :間隔環(53 1),使該管桿(52)具有雙向緩衝彈性的保持 ί )一,&各管桿(52)經-開關閥(54)連通真 Ζ ["(圖未恕不),並設置一吸持棒(55)工具供操作時 顆粒晶片(C)的人工持移作業。 4吸持套(5 1 )底部對應其正對的該欲拔除或換裝的晶 片(c)外形挖設一凹穴(511),使該凹穴(511)周壁各轉角 切除避料間距(5 1 2 )和周壁内緣切設一引料倒角(5丨3 ), 及對應該顆粒晶片(c)上設置的定位凹孔(C2)凸設定位塊 (514)可微隙精準的套合該顆粒晶片(c)頂部,並於該凹穴 (511)内面對稱的彈性滑持數耐高溫吸盤(515),以吸持力 和準確套合的精岔抓持該顆粒晶片(C)(如第九、十、十一 圖所示)。該控制裝置(6)連接各運動組件和熱源裝置(4) 可調設各數值和手自動切換的順序操作動作者。 使用本創作時,將置裝顆粒晶片(c)檢測出不良晶片 之晶片模組(P)依同一位置不良者微緊的壓合平置於同一 ’口具盤(3 5 ),及放置欲換裝的良品顆粒晶片(c )於治具盤 (35)定置槽(355),即可將各治具盤(35)整體對合置又該 基板(31)的凹室(32)内,於該控制裝置(6)輸入欲換裝= 片的位值及設定該熱源控制器(4 5 )控制熱發生器(4 4)的鎔 錫溫度,及調整該熱風喷嘴(41)預設的高度後(可由治具 盤(35)邊緣板的溫度感測點(354 )手動或自動的預先量測 而依據調整),啟動順序運作該座標導行機構(2 )的第一座ίΪ! ί 3, 'Front springs ("I) and-one" sleeved on both ends of the pipe rod (52) — the top contact is stopped at a preset position in the sleeve pipe (5 3): Ring (53 1), so that the pipe rod (52) has a two-way buffering elasticity to keep it)), & each pipe rod (52) is connected via a -on-off valve (54) true Z [" (picture not allowed) And a gripping rod (55) tool is provided for manual holding of the pellet wafer (C) during operation. 4 The bottom of the gripping sleeve (5 1) corresponds to the wafer (c) to be removed or replaced. A recess (511) is dug in the shape, and the corners of the peripheral wall of the recess (511) are cut away from the material avoidance distance (5 1 2) and the inner edge of the peripheral wall is cut by a chamfer (5 丨 3) and corresponding to the chip wafer. The positioning concave hole (C2) convex setting block (514) provided on (c) can precisely fit the top of the particle wafer (c) with a small gap, and is symmetrical in elasticity on the inner surface of the cavity (511). The high-temperature sucker (515) grasps the particle wafer (C) with a holding force and an accurately fitted fine fork (as shown in Figs. 9, 10, and 11). The control device (6) connects each moving component and Heat source device (4) can be set with various values and hands Automatically switch the sequence to operate the actor. When using this creation, place the wafer module (P) on which the defective wafer (c) is detected to be defective, and place it on the same tray with the tight pressing of the defective one at the same position. (3 5), and placing the good-quality particle wafer (c) to be replaced in the fixture groove (35) setting groove (355), the fixture plates (35) can be aligned and the substrate (31) as a whole. In the alcove (32), input the bit value of the chip to be replaced in the control device (6) and set the heat source controller (4 5) to control the tin temperature of the heat generator (4 4), and adjust the After the preset height of the hot air nozzle (41) (can be adjusted manually or automatically based on the pre-measurement of the temperature sensing point (354) of the edge plate of the fixture plate (35)), the coordinate guide mechanism (2 First block
、創作說明(7) ίί::導軌組(21)和第二座標軸線形導軌組(22),使該 ΐ鉞Ϊ (41)正對欲拔除的各顆粒晶片(c)接腳(C1)鎔 :且(23)降至Ϊ设之鎔化時間後’作動第三座標軸線形導軌 .•且(2= ^下該抓持機構(5)吸持套(5丨)套合顆粒晶片 (5m% i吸持套(51)凹穴(511)周壁的微隙和其引料倒角 5精準的對合時,該凹穴(511)的周壁轉角的避料間距 f U方止放置顆粒晶片時微傾斜的偏置,及該彈性設 和該管桿(52)前後彈簧(521)、( 522 ) “ ,▲加溫昇熔谭鍚時能以預置拉力和更緩和的 衝墼5亥顆粒晶片⑹,以避免對晶片模組電路板(Ρ) 成損壞’·於確實套合吸持該顆粒晶片⑹後,微提 Π:?標軸線形導軌組(23),再藉該管桿(52)雙向彈 曰Λ和-力作動’以綿順的彈性持續力拉拔該顆粒晶 軸绫片模組電路板(ρ),即可提昇該第三座护 幸由線形導軌組(2 3 )完全拔除該顆 = 電路板(Ρ),移動該第-座標軸魂开二脫離:片模組 斷真空吸力丢棄不良晶片 線形導軌組(21 )至定位切 (35) 不良顆粒晶片後,移動放置於該治具盤 摔0 的^良品顆粒晶片(C)正對吸持套(51), 生器(44),將%日片槿Λ啟動該熱源控制器(45)及熱發 止喷吹熱風而冷郤的且上:除顆粒晶片(C)停 作動該第三座桿軸線升2f紅融,於預設時間的鎔化即 才釉綠形導轨組(23)下降該套吸持良品晶片 M262950 沒、創作說明(8) ' $吸^套(51 ) ’使該良品顆粒晶片(c)接腳(C1)正對該晶 模組電路板(p )對應焊接點,以彈性的緩和力對合到位 j ’切斷熱源使鎔錫冷郤固連晶片接腳(C1)再切斷真空吸 p力退^持昇起’卸下各該治具盤(35)和其上的各晶片模組 _ 复置入放置欲換裝顆粒晶片(C)另一組治具盤進行次 換裝作業。本創作可依不同的晶片模組顆粒晶片的位置 :規1換裝該治具組(3)治具盤(35)和該熱源裝置(4)的熱 喷_ (4 1) ’及該抓持機構(5 )吸持套(5 1 )對合該欲拔除 和插組的晶片位置和形狀大小。 μ 本創作該抓持機構(5a)另一實施例(如第十二圖所示) =,忒吸持套(51a)可調整固定的旋接於該管桿(52a)底部 二紋部份(52 la)(該吸持套(5 la)可為圓形、方形、長方形 寺對%形狀),該吸盤(515a)則直接套接該管桿(52a)底端 二,$該吸持套(51a)底緣面挖設一凹穴(5Ua)含容該吸 现(曰51 5 a)周緣範圍且間距一縮置空間(512a);於吸持該顆 片(c)時,該吸盤(515a)定方位的直接壓觸該顆粒晶 片(c)被擠入該縮置空間(512a),以真空吸力拉引使該 粒晶片(C)頂面貼合該吸持套(51a)水平底面貼 (如第十三圖所示)。 π置 本創作該治具盤(35)上的顆粒晶片(c)定置槽(355 ) 不限位置和數量的設置戎另机於Α从 堪又其治具,以為該抓持機 構(5)吸持新的顆粒晶片(c)置裝於該晶片模組電路板 上預设位置;亦可將該抓持機構(5)的吸持套 裝成印刷石夕橡膠’於預設位置沾附印刷染料作 矣 * ^ 日日、 Creation description (7) ί :: the guide rail group (21) and the second coordinate axis-shaped guide rail group (22), so that the ΐ 钺 Ϊ (41) is directly facing each particle wafer (c) pin (C1) 镕: And (23) after the set time has elapsed, the third coordinate axis-shaped guide rail is actuated. • and (2 = ^ the holding mechanism (5) holding sleeve (5 丨) fits the chip wafer (5m% i When the micro-gap of the peripheral wall of the cavity (511) of the holding sleeve (51) and its primer chamfer 5 are accurately aligned, the material avoidance interval f U of the peripheral wall corner of the cavity (511) is fine when the particle wafer is placed. The bias offset, and the elastic setting and the front and rear springs (521), (522) of the tube rod (52), ▲ can be used to pre-set tension and a more gentle punch when the temperature rises and melts. In order to avoid damage to the chip module circuit board (P) '· After the particle wafer is indeed clamped and clamped, the Π :? standard axis-shaped guide rail group (23) is micro-lifted, and the pipe rod (52) is borrowed in both directions With the Λ and -force action ', the grain crystal shaft cymbal module circuit board (ρ) is pulled with a smooth and elastic continuous force, and the third seat can be lifted off by the linear guide group (2 3). This piece = circuit board (P ), Move the -coordinate axis soul to open two disengagement: the chip module breaks the vacuum suction and discards the defective wafer linear guide group (21) to the positioning cut (35) the defective particle wafer, and then moves and places it on the fixture plate and drops 0 ^ The good product chip wafer (C) is facing the holding sleeve (51) and the generator (44), and the% Japanese sheet hibiscus is activated by the heat source controller (45) and the heat generator stops blowing hot air to cool down. The particle wafer (C) stops operating the third seatpost axis to rise by 2f and melts. At a preset time, the glaze green-shaped guide rail group (23) is lowered. The set of holding wafers M262950 is not prepared. (8 ) '$ 吸 ^ 套 (51)' Make the good product chip wafer (c) pin (C1) corresponding to the corresponding solder joint of the crystal module circuit board (p), and align it with the elastic relaxation force in place j 'cut off The heat source causes the tin solder to cool and fix the chip pins (C1), and then cuts off the vacuum suction force to withdraw and hold it up. 'Remove each fixture plate (35) and each wafer module thereon. If you want to change another set of fixture wafers (C), perform another refit operation. This creation can be based on the position of the different wafer module particle wafers: Rule 1 Change the fixture set (3) fixtures The thermal spray (_4) of the disc (35) and the heat source device (4) and the gripping sleeve (5 1) of the grasping mechanism (5) match the position and shape of the wafer to be removed and inserted. μ Another embodiment of the holding mechanism (5a) (as shown in the twelfth figure) of this creation =, the suction holding sleeve (51a) can be adjusted and fixedly screwed to the bottom two lines of the pipe rod (52a) (52 la) (the holding sleeve (5 la) can be round, square, rectangular shape), the suction cup (515a) is directly connected to the bottom end of the pipe rod (52a). A recess (5Ua) is dug in the bottom surface of the sleeve (51a) to contain the periphery of the suction (say 51 5a) and a space (512a) is spaced; when holding the piece (c), the The sucker (515a) directly presses the granular wafer (c) in a fixed orientation and is squeezed into the shrink space (512a). The vacuum wafer is pulled to make the top surface of the granular wafer (C) fit the holding sleeve (51a). Horizontal bottom surface (as shown in Figure 13). π Zhiben created the particle wafers on the fixture plate (35), (c) the setting grooves (355), and the unlimited position and number of settings were set up in A Congkanji, and the holding mechanism (5) Hold the new particle wafer (c) at a preset position on the circuit board of the chip module; the holding set of the grasping mechanism (5) can also be printed into a printed stone eve rubber 'with a print attached to the preset position Dyes
第12頁 M262950 四、創作說明(9) --------- 片(C )或晶片模組電路拓(p、 裝置之前後各設置治具盤(35)自=::槿,創作可於 手等裝置),以聯結呈全自動 下枓機構(例如機械 土王目勁作業系絲。 綜上所述,本創作較 i本創作可將檢測出同=具有下列諸優點: 模組放置於同-治且盤内=^品顆粒晶片的多個晶片 拔除顆粒晶片的動;乍,較之焊錫即接續的 具的鎔錫操作再換持枋昤I之人工進仃手持熱風工 和效率者。 /、π彳乍業,此k向生產數量 2·本創作同時正對數個晶片 進行熱嫁作業,使鎔錫二;拔除的顆粒晶片接腳 的操控,r以始ϊί 喷吹位置皆為預設固定 =二b =勻的加熱和穩定的喷吹距離角度提供更 準確的鎔錫作業者。 π反捉t、更 3.=創作於預定録錫作#時間完全鎵融後,_自動 5顆粒晶片的動作’使顆粒晶片接腳的更易予脫離曰片 模組電路板的焊錫者。 丁脫離日日片 4· i創:乍同時,持數個顆粒晶片自動對合晶片模組電路板 率=i置或搭置,可提高換裝良品顆粒晶片的速度和效 5·本創,於晶片模組電路板接孔插置入顆粒晶片接腳前, 亦進仃熱風噴吹鎔錫作業,使每一顆粒晶片接腳確 對合於嫁融的焊錫内焊連固接者。 、 、五以上所不者僅為本創作之一可取實施例,本創作可於 不違以上5兒明及以下申請專利範圍所述之特徵,據以作不Page 12 M262950 IV. Creative Instructions (9) --------- Chip (C) or chip module circuit extension (p. Set fixture discs (35) before and after the device. Since :: hibiscus, The creation can be installed in the hand, etc., with a fully automatic lowering mechanism (such as the mechanical king Wang Jinjin operation system). In summary, compared with the i creation, this creation can detect the same = = has the following advantages: A group of multiple wafers placed on the same substrate and the wafers are removed from the wafer; at first, compared to soldering, the subsequent soldering operation is replaced by the manual operation of the holding fan. And efficiency. /, Π 彳 彳, this k-direction production quantity 2. This creation is simultaneously performing a heat-graft operation on several wafers to make tin tin two; the control of the unplugged particle wafer pins, r begins The positions are all preset fixed = two b = uniform heating and stable blowing distance angle to provide more accurate tin soldering operators. ΠAnti-catch t 、 More 3. = Created in the scheduled recording tin for #time after complete gallium melting _Automatic 5 particle wafer action 'makes it easier for the pin of the particle wafer to be separated from the solder of the chip module circuit board. Japanese and Japanese film 4. i-Creation: At the same time, holding a number of particle wafers automatically align the chip module circuit board rate = i or stack, which can improve the speed and efficiency of changing good-quality particle wafers. The module circuit board socket is inserted before the chip chip pins, and the hot air is also blown into the tin to make sure that each chip chip pin is mated to the internal solder of the solder. None of the above is just one of the desirable embodiments of this creation. This creation can be made without prejudice to the features described in the scope of the above-mentioned patent applications and below.
M262950 四、創作說明(10) 同形狀、位置、數量之修飾、設計者。 本創作已製成功能樣品,經實 具功效,較之習用人工古寺間試驗操作確 安排現場審試,即If有任何疑慮、’請電或函示當即 既能增進功效,『暸解本創作構成新穎、實用、簡單, 外刊物或公開俊又未I有相同特徵之前案或物品見於國内 用 只已符合專利法新型專利之要件。M262950 IV. Creative Instructions (10) Decoration, designer with same shape, position and quantity. This creation has been made into functional samples, and it is effective. Compared with the traditional artificial ancient temple test operation, on-site review is arranged. That is to say, if you have any doubts, 'please call or send a letter to improve the effectiveness immediately. "Understand the composition of this creation It is novel, practical, and simple. Foreign publications or open publications have the same features as previous cases or articles. They are found in domestic use and have only met the requirements for new patents under the Patent Law.
第14頁 ---- M262950 圖式簡單說明 第一圖係本創作整體的外 第一圖係本創作的正視剖示圖。 第二圖係本創作的侧視剖示圖。 第四圖係本創作治具盤的外立 第五圖係本創作熱源溶錫拔除===° 第六圖係本創作抓持顆粒晶片換乍圖: 箆七H係士 4丨Α β η俠展作業的不思圖。 弟七圖係本創作另一顆粒 復\ m 乂么i h 6規格示意圖0 第八圖係本創作顆粒晶片 筐士阊後士 ^ , ?丨符機構的組合剖示圖。 圖係本創作抓持顆粒晶 篦+阊後赞丄π 门幻及盤正視剖不圖0 ,十圖係苐九圖的側視剖示圖。 f十一圖係第九圖的俯視剖示圖。 第十一圖係本創作抓持顆粒曰Η 第十二圖在赞丄 貝位日日片吸盤另一實施例剖示圖 弟卞一圖係第十二圖實施 圖號說明: 探作不思圖。 ⑴· (2) · (21) (22) (23) (3) · (32) (35) ( 35 3 ) ( 3 5 6 ) 機架 (11)…基座 座標導行機構 卓 座^轴線形導軌組 ,二座標軸線形導軌組 第二座標軸線形導軌組 (12)…門型支架 治具組 凹室 〉合具盤 ••通風槽 ”腳溝 (31) · (33) · (351) ( 3 54) ( 357) 基板 透氣孔 ••階梯凹槽 (211) (221) (231) (311) (34)-( 3 52 ) ••溫度感測點( 3 55 ) ••流通溝 ( 3 58 ) •滑行檯 •滑行檯 •滑行檯 ••夾取槽 凸點 ••通孑L •定置槽 •承置穴Page 14 ---- M262950 Brief Description of the Drawings The first picture is the whole outside of the creation. The first picture is a front sectional view of the creation. The second picture is a side cross-sectional view of this creation. The fourth picture shows the exterior of the fixture plate. The fifth picture shows the heat source dissolution of tin in the creation === °. The sixth picture shows the granule chip replacement at first glance: 箆 七 H 系 士 4 丨 Α β η Unthinking of the Xiazhi homework. The seventh figure is another particle diagram of this creative composition \ m 乂 么 i h 6 specification sketch 0 The eighth figure is a combined sectional view of the original particle wafer. The picture is the grain crystal 创作 + 阊 after the 丄 丄 门 门 portal fantasy and pan front view is not shown in Fig. 0, and the ten picture is the side view of the nine pictures. The eleventh figure is a top sectional view of the ninth figure. The eleventh picture is a piece of this creative grasping particle. The twelfth picture is a sectional view of another embodiment of the sun-dial sucker in the Zanzi bay. The first picture is the twelfth picture. Illustration. ⑴ · (2) · (21) (22) (23) (3) · (32) (35) (35 3) (3 5 6) Frame (11) ... base coordinate guide mechanism bracket ^ axis Linear guide rail group, two coordinate axis guide rail group Second coordinate axis guide rail group (12) ... Gantry bracket fixture set alcove> combining plate •• ventilation groove "foot groove (31) · (33) · (351) ( 3 54) (357) Substrate ventilation holes • Stepped grooves (211) (221) (231) (311) (34)-(3 52) •• Temperature sensing point (3 55) •• Flow channel (3 58) • gliding table • gliding table • gliding table • gripping groove bumps • through hole L • fixed groove • receiving hole
M262950 圖式簡單說明 ( 3 5 9 )…取出槽 (36)… 氣室 (37)…空間 (4)…熱源裝置 (41)… 熱風喷嘴 (4 2 )…支桿 (4 3 )…支架組 (44)… 熱發生器 (441 )…混流擋板 (45)…熱源控制器 (5 )…抓持機構 (51)… 吸持套 (511)…凹穴 (512)…避料間距 (513)- *·引料倒角 (5 1 4 )…定位塊 (5 1 5 )…吸盤 (52)… 管桿 (521)…前彈簧 ( 522 )…後彈簧 (53)… 套持管 (531)…間隔環 (54)…開關閥 (55)… 吸持棒 (6)…控制裝置M262950 Brief description of the drawings (3 5 9) ... Removal slot (36) ... Air chamber (37) ... Space (4) ... Heat source device (41) ... Hot air nozzle (4 2) ... Support rod (4 3) ... Bracket group (44) ... Heat generator (441) ... Mixed flow baffle (45) ... Heat source controller (5) ... Holding mechanism (51) ... Holding sleeve (511) ... Cavity (512) ... Avoidance distance (513) )-* · Chamfering of the material (5 1 4) ... Positioning block (5 1 5) ... Suction cup (52) ... Pipe rod (521) ... Front spring (522) ... Rear spring (53) ... Holding tube (531) … Spacer ring (54)… switch valve (55)… holding rod (6)… control device
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TW93215794U TWM262950U (en) | 2004-10-06 | 2004-10-06 | Automatically solder-melting replacement apparatus for the chip-die module and chips on mainboard |
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TW93215794U TWM262950U (en) | 2004-10-06 | 2004-10-06 | Automatically solder-melting replacement apparatus for the chip-die module and chips on mainboard |
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TWI747717B (en) * | 2021-01-18 | 2021-11-21 | 上利新科技股份有限公司 | Welding device |
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TWI747717B (en) * | 2021-01-18 | 2021-11-21 | 上利新科技股份有限公司 | Welding device |
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