TWM241433U - Metallic organic chemical vapor deposition device - Google Patents
Metallic organic chemical vapor deposition device Download PDFInfo
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- TWM241433U TWM241433U TW92221553U TW92221553U TWM241433U TW M241433 U TWM241433 U TW M241433U TW 92221553 U TW92221553 U TW 92221553U TW 92221553 U TW92221553 U TW 92221553U TW M241433 U TWM241433 U TW M241433U
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M241433M241433
一、 【創作所屬之技術領域】 本創作係有關於一種金屬有機化學氣相沉積裝置,尤 才曰一種可藉由調整各種氣體進入反應室之種類及順序,以 便依序於該晶圓上沉積出所需之複數個金屬氧化物層之金 屬有機化學氣相沉積裝置。 二、 【先前技術】I. [Technical field of creation] This creation is about a metal organic chemical vapor deposition device, especially a type and order in which various gases can enter the reaction chamber, so as to sequentially deposit on the wafer. A metal-organic chemical vapor deposition device with a plurality of metal oxide layers is required. 2. [Previous Technology]
按一般於製造白光LED時,同常需於一晶圓上生長複 數層之金屬氧化物層,而該晶圓生長過程通常需借助於一 金屬有機化學氣相沉積裝置(M0CVD)。在製造白光LEI)之過 私中’通常需將氧氣(〇2)、氬氣(Argon)及另一種金屬例如 但不限於鋅(Zn)或鎂(Mg)等氣體依序送入該金屬有機化學 氣相沉積裝置之反應室中混合,以便該氧氣(〇2)、氬氣 (Aragon)及鋅(Zn)或鎂(Mg)等氣體於該晶圓上沉積出所需 之氧化物層。但是,該氧氣(〇2)、氬氣(Argon)及鋅(Zn)或 儀(Mg)等氣體在送入反應室中混合之前不可互相混合,以 避免^體提早混合後無法於該晶圓上沉積出所需之氧化物 層。是以’如何使氧氣(〇2)、氬氣(Argon)及鋅(Zn)或鎂 (Mg)等氣體可單獨進入該反應室中,實為金屬有機化學氣 相沉積裳置設計時一個重要之課題。 々 ^例如我國專利公告第455633號專利「金屬有機化學 氣相/儿積t置及沉積方法」,係提供一種金屬有機化學氣 相’儿積裳置及沉積方法,可用以形成高介電薄膜的金屬有 予沈積裝置,包括·· 一裝有溶於溶劑中之反應物的原 广觀’一用於輸送溶解反應物的液體微唧筒,一用於蒸發Generally, when manufacturing a white LED, a plurality of metal oxide layers are usually grown on a wafer, and the wafer growth process usually requires a metal organic chemical vapor deposition device (MOCVD). In the production of white light LEI), it is usually necessary to sequentially send gas such as oxygen (〇2), argon (Argon) and another metal such as but not limited to zinc (Zn) or magnesium (Mg) into the metal organic The reaction chamber of the chemical vapor deposition apparatus is mixed so that the oxygen (02), argon (Aragon), and zinc (Zn) or magnesium (Mg) gases can be used to deposit a desired oxide layer on the wafer. However, the gases such as oxygen (〇2), argon (Argon), zinc (Zn), or spectrometer (Mg) cannot be mixed with each other before being sent to the reaction chamber for mixing, so as to avoid being unable to be mixed with the wafer after early mixing A desired oxide layer is deposited on it. Therefore, how to make oxygen (〇2), argon (Argon) and zinc (Zn) or magnesium (Mg) and other gases can enter the reaction chamber separately, which is an important factor in the design of metal organic chemical vapor deposition. Subject.例如 ^ For example, Chinese Patent Publication No. 455633 "Metal-Organic Chemical Vapor Phase / Electrodeposition and Deposition Method" provides a metal-organic chemical vapor-phase 'Electrodeposition and deposition method, which can be used to form high dielectric films The metal has a pre-deposition device, including ... a Yuan Guangguan filled with reactants dissolved in a solvent-a liquid microcylinder for transporting dissolved reactants, and-for evaporation
M241433M241433
由微唧筒 蒸發反應 蒸發反應 機化學沈 給額外量 再凝結, 送管線, 氧氣(〇2) 該反應室 三、【創 輪送進來的溶解反應物之蒸發器,及一用於沈 ,,已裝載於其中之半導體基板上的反應器,該 勿是由一載體氣體供應至該反應器中,該金屬有 積裝置的特徵為另外包括一溶劑供應裝置,以供 的溶劑至該蒸發器中,以防止反應物在蒸發器中 及防止再凝結反應物阻塞蒸發器和反應器間的輪 然,觀該案說明書之内容,其並未說明如何可使 氩氣(Argon)及鋅(Zn)或鎂(Mg)等氣體單獨進入 中而不會提早混合,誠屬美中不足之處。 作内容】Evaporate the reaction from the micro-cylinder evaporation reaction chemical reactor to give an extra amount of re-condensation, send the line, oxygen (〇2) the reaction chamber three, [the reactor to dissolve the reactants sent in, and one for the sink, has been The reactor mounted on the semiconductor substrate therein should not be supplied to the reactor by a carrier gas. The metal accumulation device is further characterized by including a solvent supply device for supplying the solvent to the evaporator. In order to prevent reactants in the evaporator and prevent recondensation of the reactants from blocking the circulation between the evaporator and the reactor, the content of the description of the case does not explain how to make argon (Argon) and zinc (Zn) or Magnesium (Mg) and other gases enter alone without mixing early, which is a disadvantage of the United States. Content
因此’為解決習知金屬有機化學氣相沉精裝置之缺 點’本創作提供一種金屬有機化學氣相沉積裝置,其可精 岔的控制氧氣(〇2)、氬氣(Argon)及鋅(Zn)或鎂(Mg)等氣體 單獨進入反應室中而不會提早混合,且可藉由調整各種氣 體進入反應室之種類及順序,以便依序於該晶圓上沉積出 所需之複數個金屬氧化物層之金屬有機化學氣相沉積裝 置。Therefore, 'in order to solve the shortcomings of the conventional metal organic chemical vapor deposition device', this creation provides a metal organic chemical vapor deposition device which can control the oxygen (〇2), argon (Argon), and zinc (Zn). ) Or magnesium (Mg) and other gases enter the reaction chamber alone without early mixing, and the type and sequence of various gases entering the reaction chamber can be adjusted to sequentially deposit the required plurality of metals on the wafer Metal organic chemical vapor deposition device for oxide layer.
本創作之金屬有機化學氣相沉積裝置,包括:金屬有 機化學氣相沉積裝置,係用以在一晶圓上沉積出所需之複 數個金屬氧化物層,其包括:基座,其具有底板、容置空 間、複數個支撐板、滑板、複數個升降導桿及上板,其 中’該滑板係置於該些支撐板上,且該些支撐板係分別與 該底板平行,而該些升降導桿則與該上板垂直以便支撐該 上板,且可藉由滑塊鎖固於該滑板上,以支撐後述之反應The metal-organic chemical vapor deposition device of this creation includes: a metal-organic chemical vapor deposition device, which is used to deposit a plurality of metal oxide layers required on a wafer, and includes: a base having a bottom plate Accommodating space, a plurality of support plates, a sliding plate, a plurality of lifting guides and an upper plate, wherein 'the sliding plate is placed on the supporting plates, and the supporting plates are respectively parallel to the bottom plate, and the lifting The guide bar is perpendicular to the upper plate to support the upper plate, and can be locked on the slide plate by a slider to support the reaction described below.
第6頁 M241433 五、創作說明(3) 至及该氣體控制裝置;升降裝置,係置於該容置空間中, 用以升降一晶圓;加熱器,係置於該升降裝置之上,用以 將$晶圓加熱至一特定溫度;反應室,係置於該複數個升 降^ ^之間’用以提供該晶圓與複數個氣體進行金屬有機 $學氣相沉積之處所;以及氣體控制裝置,係置於該反應 至=頂邛,且可與該反應室密合,其包括一第一進氣盤、 々第一,氣盤及一第三進氣盤,且該第一進氣盤上蓋有一 第「,氣盤蓋以便呈密合狀態,其中,該第一進氣盤、第 二進氣盤、第三進氣盤上分別具有數量不等之複數個進氣Page 6 M241433 V. Creation instructions (3) to the gas control device; the lifting device is placed in the accommodating space for lifting a wafer; the heater is placed on the lifting device for To heat the wafer to a specific temperature; the reaction chamber is placed between the plurality of lifts ^ ^ to provide the wafer and a plurality of gases for metal organic vapor deposition; and gas control The device is arranged at the reaction to the top, and can be tightly connected to the reaction chamber. The device includes a first air inlet plate, a first air inlet plate, a third air inlet plate, and a third air inlet plate, and the first air inlet The top of the disc is covered with a cap, so that the air disc cap is in a tight state, wherein the first intake disc, the second intake disc, and the third intake disc each have a plurality of air intakes of varying amounts.
孔γ且其四側分別開設有一進氣槽;俾於該晶圓藉由該升 ,I置進入該反應室時,可藉由調整該氣體控制裝置之進 ^及順序,以便依序於該晶圓上沉積出所需之複數個 金屬氧化物層。 四、【實施方式】 請參 裝置之組 相沉積裝 反應室4 0 其中 複數個支 其中,該 係分別與 垂直以便 上,以支 照圖1 (a ),其繪 合示意圖。如圖 置,其包括:基 ;以及氣體控制 ’該基座1 0進一 樓板1 3、滑板1 4 滑板1 4係置於言亥 該底板11平行, 支撐該上板16, 撐該反應室4 0及 τ本案之金屬有機化學氣相沉: 1所示,本案之金屬有機化學氣 座1 0 ;升降裝置2 0 ;加熱器3 〇 裝置50所組合而成。The holes γ are provided with air inlet grooves on each of the four sides. When the wafer enters the reaction chamber through the liter, the inlet and the order of the gas control device can be adjusted by adjusting the order and order of the gas. The required plurality of metal oxide layers are deposited on the wafer. Fourth, [implementation] Please refer to the group of the device, the phase deposition device, the reaction chamber 40, among which a plurality of branches, among which the system is perpendicular to each other so as to support, as shown in Fig. 1 (a), and the schematic diagram is shown. As shown in the figure, it includes: a base; and a gas control 'the base 10 enters a floor 1 3, the slide 1 4 the slide 14 is placed on the bottom plate 11 in parallel, supports the upper plate 16, and supports the reaction chamber 4 0 and τ metal organic chemical vapor deposition in this case: As shown in FIG. 1, the metal organic chemical gas seat in this case 10; the lifting device 20; the heater 30 device 50 are combined.
步包括一底板11、容置空間12 、複數個升降導桿丨5及上板1 6 些支撐板13上,且該些支撐板1 而該些升降導桿15則與該上板j 且可藉由滑塊1 7鎖固於該滑板1 該氣體控制裝置5 〇。該升降裝The steps include a bottom plate 11, an accommodation space 12, a plurality of lifting guides 5 and an upper plate 16 on the support plates 13, and the support plates 1 and the lifting guides 15 and the upper plate j can be The slider 1 7 is locked to the slide 1 and the gas control device 50. The lifting equipment
M241433 創作說明(4) 20,係置於該容置空間丨2中,用以升降一晶圓(圖未示), 其例如但不限於為一氣壓缸,於使用時,可藉由調整該升 降裝置20,使該晶圓進入該反應室4〇中進行沉積程序。M241433 Creative Instructions (4) 20, placed in the accommodating space 丨 2 for lifting a wafer (not shown), such as but not limited to a pneumatic cylinder. When in use, you can adjust the The lifting device 20 allows the wafer to enter the reaction chamber 40 to perform a deposition process.
加熱為30,其具有一加熱桿31及一平台32,其中該加 熱桿31係置於該升降裝置2〇之上,用以將該晶圓加熱至一 特定溫度,例如但不限於為攝氏6〇 〇 t,以使該晶圓易於 與該反應室40中之氣體,例如但不限於氧氣(〇2)、氬氣 (Argon)及辞(Zn)或鎂(Mg)等氣體進行反應,而該平台32 則用以承載晶圓60。該反應室4〇,係置於該複數個升降導 桿15之間,用以提供該晶圓與氧氣(A)、氬氣(Arg⑽)及鋅 (Zn)或鎂(Mg)等氣體進行金屬有機化學氣相沉積之處所, 其較佳係由石英管材質所構成,以達保溫又透明之目的。 此外,該反應室40之兩側分別具有外殼罩41,且於該外殼 罩41之一側具有一進水孔411、一螺旋冷卻槽412及一出ς 孔4 1 3,以便對該反應室40進行螺旋循環冷卻,使用時可 將冷卻液(例如但不限於水)經由該進水孔411注入該螺扩 冷卻槽412中並由該出水孔413輸出,以便對該反應/室4〇< 行冷卻。而該外殼罩41另一側之下方則具有一抽氣孔延 414,以便藉由該抽氣孔414可對該反應室4〇進行抽直处 作業,以確保氧氣、氬氣及鋅或鎂等氣體不會與外界$ 言月餐妝圖1(b),其繪示本案之升降裝置2〇上升後 加熱器30進入反應室40之示意圖。如圖1(b)所示, 升降裝置20於上升後可將置於該升降步二 茶之 '表置20頂面之邊平台The heating is 30, which has a heating rod 31 and a platform 32, wherein the heating rod 31 is placed on the lifting device 20 for heating the wafer to a specific temperature, such as but not limited to 6 degrees Celsius 〇〇t, so that the wafer is easy to react with the gas in the reaction chamber 40, such as, but not limited to, oxygen (〇2), argon (Argon) and gas (Zn) or magnesium (Mg) and other gases, and The platform 32 is used to carry the wafer 60. The reaction chamber 40 is arranged between the plurality of lifting guide rods 15 and is used to provide the wafer with oxygen (A), argon (Arg⑽), and zinc (Zn) or magnesium (Mg) for metal Organic chemical vapor deposition sites are preferably made of quartz tube material for the purpose of thermal insulation and transparency. In addition, two sides of the reaction chamber 40 are respectively provided with a housing cover 41, and one side of the housing cover 41 is provided with a water inlet hole 411, a spiral cooling groove 412, and an outlet hole 4 1 3 in order to the reaction chamber. 40 performs spiral circulation cooling. In use, a cooling liquid (such as, but not limited to, water) can be injected into the helical expansion cooling tank 412 through the water inlet hole 411 and output through the water outlet hole 413, so that the reaction / chamber 4 〇 <; Cool down. A suction hole extension 414 is provided below the other side of the housing cover 41, so that the reaction chamber 40 can be pumped straight through the suction hole 414 to ensure oxygen, argon, zinc or magnesium gas, etc. It will not communicate with the outside world. Figure 1 (b) shows a schematic diagram of the heater 30 entering the reaction chamber 40 after the lifting device 20 of this case rises. As shown in Fig. 1 (b), the lifting device 20 can be placed on the side platform of the top surface of the tea table 20 after the lifting step 20
第8頁 M241433Page 8 M241433
32及該晶圓60送入反應室40中,以便置於該加熱器3〇頂面 之晶圓60可於該反應室40中與氧氣、氬氣及鋅或^氣 進行反應。 、〃版 該氣體控制裝置50,係為本創作之重點所在,係置於 该反應室40之頂部,且可與該反應室4〇密合,其包括一第 一進氣盤51、一第一進氣盤蓋52、一第二進氣盤53、及一 第三進氣盤55,且該第一進氣盤51、第一進氣盤芸 二進氣盤53及第三進氣盤55間係呈密合狀態。32 and the wafer 60 are sent into the reaction chamber 40 so that the wafer 60 placed on the top surface of the heater 30 can react with oxygen, argon, zinc or zinc in the reaction chamber 40. The gas control device 50 of the Chinese version is the focus of this creation. It is placed on the top of the reaction chamber 40 and can be closely fitted to the reaction chamber 40. It includes a first air inlet plate 51, a first An air intake disk cover 52, a second air intake disk 53, and a third air intake disk 55. The first air intake disk 51, the first air intake disk 53, the second air intake disk 53, and the third air intake disk. 55 lines were in a close state.
凊芩照圖2 ( a )及(b ),其分別繪示本案之第一進氣盤 之上視及剖面示意圖。如圖2(a)及(b)所示,本案之該 第一進氣盤51上之圓形通氣區511内具有複數個第一進氣 孔5 1 2,且其四側分別開設有一第一水平孔5丨3及一第一垂 直孔5 1 4 ’且每一個第一進氣孔5丨2中皆開設有一導溝 2 1 °其中該第一進氣孔5 1 2之出口高度係低於圓形通氣 ,511之高度,以便當該第一進氣盤蓋52蓋合於該第一進 氣盤51時’氣體經由第一水平孔51 3注入後,經由該第一 垂直孔5 1 4可順利進入該複數個導溝5 1 2 1中。其中,該第 一進氣孔5 1 2之排列方式係由該圓形通氣區5 1 1之一圓週處 開^排列該第一進氣孔5 1 2,並於間隔一間距d後排放第二 排第一進氣孔5 1 2,依此順序排列直到該圓形通氣區5 11之 另一圓週處為止。 請參照圖3 (a )及(b ),其分別繪示本案之第二進氣盤 53之上視及剖面示意圖。如圖3(a)及(b)所示,本案之第 一進氣盤5 3其四側分別開設有一第二水平孔5 3 4及一第二According to Fig. 2 (a) and (b), they show the top view and cross-sectional schematic diagrams of the first air intake tray in this case, respectively. As shown in FIGS. 2 (a) and 2 (b), the circular ventilation zone 511 on the first air intake plate 51 in the present case has a plurality of first air intake holes 5 1 2 and a first air hole is provided on each of its four sides. A horizontal hole 5 丨 3 and a first vertical hole 5 1 4 ', and each first air inlet hole 5 丨 2 is provided with a guide groove 2 1 °, wherein the exit height of the first air inlet hole 5 1 2 is Lower than the circular ventilation, the height of 511, so that when the first air inlet disc cover 52 is covered on the first air inlet disc 51, after the gas is injected through the first horizontal hole 51 3, it passes through the first vertical hole 5 1 4 can smoothly enter the plurality of guide grooves 5 1 2 1. Wherein, the arrangement of the first air inlet holes 5 1 2 is formed by arranging the first air inlet holes 5 1 2 at a circumference of the circular ventilation area 5 1 1 and discharging the first air holes 5 at an interval d. The two rows of first air inlet holes 5 1 2 are arranged in this order until the other circumference of the circular ventilation area 5 11. Please refer to Figs. 3 (a) and (b), which respectively show a top view and a cross-sectional schematic diagram of the second air intake plate 53 in this case. As shown in FIGS. 3 (a) and (b), the first air inlet plate 5 3 in this case is provided with second horizontal holes 5 3 4 and a second horizontal hole, respectively.
第9頁 M241433Page 9 M241433
垂直孔53 5,且除於其圓形通氣區531中與該複數個第一進 氣孔512相同位置處設有複數個第二進氣孔532外,並於該 圓形通氣區5 3 1之圓周外圍裝設複數個不與該第一進氣孔 512導通之第三進氣孔533,且於該複數個第三進氣孔533 之導氣孔外設有一導溝5331,以便氣體可藉由該導溝5331 進入該複數個第三進氣孔533中。其中該第二水平孔534之 出口高度係低於圓形通氣區531之高度,以便當第一進氣 盤蓋52及該第一進氣盤51疊合於該第二進氣盤53時,氣體 經由第二水平孔5 3 4注入後,經由該第二垂直孔5 3 5可順利 進入該複數個導溝5331中。因此,該第二進氣盤53上之第 一進氣孔532及不與該第一進氣孔512導通之第三進氣孔 533之數量總合係大於該第一進氣孔51 2。The vertical holes 53 5 are provided in the circular ventilation area 531 at the same position as the plurality of first air inlet holes 512 and are provided with a plurality of second air inlet holes 532, and in the circular ventilation area 5 3 1 A plurality of third air inlet holes 533 which are not in communication with the first air inlet hole 512 are installed on the periphery of the circumference, and a guide groove 5331 is provided on the periphery of the air outlet holes of the plurality of third air inlet holes 533 so that the gas can be borrowed. The guide grooves 5331 enter the plurality of third air inlet holes 533. The height of the exit of the second horizontal hole 534 is lower than the height of the circular ventilation area 531, so that when the first air intake disc cover 52 and the first air intake disc 51 are superposed on the second air intake disc 53, After the gas is injected through the second horizontal hole 5 3 4, it can smoothly enter the plurality of guide grooves 5331 through the second vertical hole 5 3 5. Therefore, the total number of the first air inlet hole 532 and the third air inlet hole 533 which is not in communication with the first air inlet hole 512 on the second air inlet plate 53 is greater than that of the first air inlet hole 512.
請參照圖4 (a )及(b ),其分別繪示本案之第三進氣盤 55之上視及剖面示意圖。如圖4(a)及(b)所示,本案之第 三進氣盤55其四側分別開設有一第三水平孔555及一第三 垂直孔5 56,且除於其圓形通氣區551中與該複數個第一進 氣孔512、該複數個第二進氣孔532相同位置處設有複數個 第四進氣孔5 52外,並於該圓形通氣區551之圓周外圍裝設 與該複數個第三進氣孔5 3 3導通之複數個第五進氣孔5 5 3, 再於該複數個第四進氣孔5 5 2與複數個第四進氣孔5 5 2之間 的間距d上設置複數個第六進氣孔5 54,且於該複數個第六 進氣孔554之導氣孔外設有一導溝5541,以便氣體可藉由 該導溝5 5 4 1進入該複數個第六進氣孔5 5 4中。其中該第三 水平孔5 5 5之出口高度係低於複數個第六進氣孔5 5 4之高Please refer to FIGS. 4 (a) and (b), which respectively illustrate a top view and a cross-sectional schematic diagram of the third air intake plate 55 in this case. As shown in FIGS. 4 (a) and (b), the third air inlet plate 55 of the present case is provided with a third horizontal hole 555 and a third vertical hole 5 56 on its four sides, and is divided by its circular ventilation area 551. A plurality of fourth air inlet holes 5 52 are provided at the same positions as the plurality of first air inlet holes 512 and the plurality of second air inlet holes 532, and are installed on the periphery of the circular ventilation area 551. A plurality of fifth air inlets 5 5 3 which are in communication with the plurality of third air inlets 5 3 3, and then between the plurality of fourth air inlets 5 5 2 and the plurality of fourth air inlets 5 5 2 A plurality of sixth air inlet holes 5 54 are provided on the interval d, and a guide groove 5541 is provided outside the air guide hole of the plurality of sixth air inlet holes 554 so that gas can enter through the guide groove 5 5 4 1 The plurality of sixth air inlet holes 5 5 4. The exit height of the third horizontal hole 5 5 5 is lower than the height of the plurality of sixth air holes 5 5 4
M241433 五、創作說明(7) 度,以便當進第一進氣盤蓋52、該第一進氣盤51及該第二 進氣盤5 3疊合於該第三進氣盤55時,氣體可經由第三水平 孔555注入後,經由該第三垂直孔5 56可順利^入該^數個 導溝5 5 4 1中。 請參照圖5,其繪示本案之第一進氣盤蓋52、第一進 氣盤51、第二進氣盤53、及第三進氣盤55相互疊合時之 面示意圖。如圖所示,當第一進氣盤蓋52、該;二‘ $二 51、弟一進氣盤53、及第三進氣盤55相互疊合時,一 Ί 氣體,例如但不限於氧氣經由第一水平孔5丨3進入後弟一 為第一進氣盤51上面被第一進氣盤蓋52蓋住,因入此<,’因 氣體便往位於相同位置且重疊相通之該複數個第一造,— 512、複數個第二進氣孔532及複數個第四進氣孔55氣孔 流動而進入該反應室40中,而第二氣體,例如但方向 氣經由第二水平孔534進入後,因為上面被第—-艮於氩 蓋住,因此,第二氣體便往位於相同位置且重β氣盤51 數個第三進氣孔533及複數個第五進氣孔553方=之複 入該反應室40中,而-第三氣體,例如但不 :?而進 由第三水平孔555進入後,因為上面;鋅或鎂經 住,因此,第三氣體便可直接經由剩被下弟之;進-,蓋 554進入該反岸室40中。士π 士 系弟六進氣子丨 延八肩反應至4U中。如此,三種二孔 或鎮)進入該反應室40之路徑及長 孔鼠氣及鋅 種氣體進入該反應室40之前互相θ度人白不相同,以避免二 订。其中’三種氣體加入之順序依序為“ 1程序之進 依序為該鋅或鎂及該氧氣,或者a辟=飞虱先加入,再 飞者疋该鋅或鎂先加入 舟 _ 再佑 IH1 M241433 五、創作說明(8) 序為該鼠氣及該氧氣。 其中本案所揭示者,乃較佳實施例,舉凡局部之變更 或修飾而源於本案之技術思想而為熟習該項技藝之人所易 於推知者,倶不脫本案之專利權範疇。 綜上所陳,本案無論就目的、手段與功效,在在顯示 其迥異於習知之技術特徵,且其首先創作合於實用,亦在 在符合新型之專利要件,懇請 貴審查委員明察,並祈早 · 曰賜予專利,俾嘉惠社會,實感德便。M241433 V. Creation description (7) degrees, so that when the first intake disc cover 52, the first intake disc 51 and the second intake disc 53 are superposed on the third intake disc 55, the gas After being implanted through the third horizontal hole 555, it can be smoothly inserted into the plurality of guide grooves 5 5 41 through the third vertical hole 5 56. Please refer to FIG. 5, which illustrates a schematic diagram of the first intake disk cover 52, the first intake disk 51, the second intake disk 53, and the third intake disk 55 when they are overlapped with each other. As shown in the figure, when the first air intake cover 52, the two's two 51, the first air intake 53, and the third air intake 55 are superimposed on each other, a stack of gas, such as, but not limited to, oxygen After entering through the first horizontal hole 5 丨 3, the first brother is the top of the first air inlet plate 51 and is covered by the first air inlet plate cover 52. Because of this < ', because of the gas, it should be located at the same position and overlapped with each other. A plurality of first constructions, 512, a plurality of second air inlets 532, and a plurality of fourth air inlets 55 flow into the reaction chamber 40, and a second gas, such as a directional gas, passes through the second horizontal hole. After 534 entered, because the top was covered by the first --- argon, the second gas will go to the same position and weigh β air disc 51. There are several third air inlets 533 and multiple fifth air inlets 553. = Reintroduced into the reaction chamber 40, and-a third gas, such as but not:? After entering through the third horizontal hole 555, because the upper side is held by zinc or magnesium, the third gas can directly pass through the remaining younger one; enter the cover 554 into the anti-shore chamber 40. Ππ 士 The brother's six-injector 丨 Yanba shoulder reacted to 4U. In this way, the three paths (two holes or towns) entering the reaction chamber 40 and the long squirrel gas and zinc species before entering the reaction chamber 40 are different from each other in order to avoid the second order. Among them, the order of adding the three kinds of gas is "1. The order of the program is the zinc or magnesium and the oxygen, or a = = plant lice first, then the fly 疋 the zinc or magnesium first join the boat _ then you IH1 M241433 V. Creative Instructions (8) The sequence is the rat gas and the oxygen. Among them, the one disclosed in this case is a preferred embodiment. For example, those who have made partial changes or modifications derived from the technical ideas of this case and are familiar with the art. Those who are easy to deduce do not depart from the scope of the patent right of the case. In summary, the case, regardless of the purpose, means and effect, is showing its technical characteristics that are quite different from the conventional ones, and its first creation is practical and practical. It meets the requirements of the new type of patent. We urge your reviewing committee to make a clear observation, and pray that the patent will be granted as soon as possible.
第12頁 M241433Page 12 M241433
五、【圖式之簡單說明】 圖1(a)為一示意圖,其繪 沉積裝置之組合示意圖; ’、承案之金屬有機化學氣相 圖1(b),其繪示本案之升 30進入反應室40之示意圖; 展置20上升後,該加熱器 其分別繪示本案之第一進 其分別綠示本案之第二進 以及 ’其分別繪示本案之第三進 圖2(a)及(b)為一圖 氣盤5 1之上視及剖面示意圖 圖3U)及(b)為—示意圖 氣盤53之上視及剖面示意圖 圖4(a)及(b)為一示意圖 氣盤55之上視及剖面示意圖, 圖5為一示惫R _ 一進氣盤51、第、、、日不本案之第一進氣盤蓋52、第 之剖面示意圖。 氣i53及第三進氣盤55相互疊合時 圖號說明: 基座10 支撐板13 上板1 6 加熱器3 0 進水孔411 抽氣孔414 底板11 滑板14 滑塊17 反應室4 0 螺旋冷卻槽41 2 第二外殼罩42 容置空間1 2 升降導桿1 5 升降裝置20 第一外殼罩41 出水孔4 13 抽氣孔4 2 1V. [Simplified description of the drawing] Fig. 1 (a) is a schematic diagram, which depicts the combined schematic diagram of the deposition device; ', the metal-organic chemical vapor phase diagram of the case 1 (b), which shows the rise of the case into the 30 Schematic diagram of the reaction chamber 40; After the installation 20 rises, the heater displays the first progress of the case, the second progress of the case, and the third progress of the case. Figure 2 (a) and (B) is a schematic top view and cross-sectional schematic diagram of air disc 51 (Fig. 3U) and (b) are-schematic top view and cross-sectional schematic diagram of air disc 53 Fig. 4 (a) and (b) are schematic air disc 55 A top view and a schematic cross-sectional view, FIG. 5 is a schematic cross-sectional view showing the exhaust air intake plate 51, the first, the second, the first air inlet cover 52, the first, and the second. Air i53 and the third air intake tray 55 are superimposed on each other. The illustration of the drawing number: Base 10 Support plate 13 Upper plate 1 6 Heater 3 0 Water inlet hole 411 Air exhaust hole 414 Floor plate 11 Slider 14 Slider 17 Reaction chamber 4 0 Spiral Cooling tank 41 2 Second housing cover 42 Receiving space 1 2 Lifting guide rod 1 5 Lifting device 20 First housing cover 41 Outlet hole 4 13 Exhaust hole 4 2 1
第13頁 M241433 圖式簡單說明 氣體控制裝置5 0 第一進氣盤5 1 導溝5121 第一進氣盤蓋52 圓形通氣區5 3 1 導溝5 3 3 1 第三進氣盤5 5 第五進氣孔553 第三水平孔5 5 5 圓形通氣區5 11 第一水平孔5 13 第二進氣盤53 第二進氣孔5 3 2 第二水平孔534 圓形通氣區5 5 1 第六進氣孔554 第三垂直孔5 5 6 第一進氣孔5 12 第一垂直孔5 14 第三進氣盤55 第三進氣孔533 第二垂直孔535 第四進氣孔552 導溝5541Page 13 M241433 Schematic illustration of the gas control device 5 0 The first air inlet plate 5 1 Guide groove 5121 The first air inlet plate cover 52 Circular ventilation area 5 3 1 Guide groove 5 3 3 1 The third air inlet plate 5 5 Fifth air inlet hole 553 Third horizontal hole 5 5 5 Circular ventilation zone 5 11 First horizontal hole 5 13 Second air inlet plate 53 Second air inlet hole 5 3 2 Second horizontal hole 534 Round ventilation zone 5 5 1 Sixth air inlet hole 554 Third vertical hole 5 5 6 First air inlet hole 5 12 First vertical hole 5 14 Third air inlet plate 55 Third air inlet hole 533 Second vertical hole 535 Fourth air inlet hole 552 Channel 5541
第14頁Page 14
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TWI486484B (en) * | 2013-08-02 | 2015-06-01 | Beijing Nmc Co Ltd | Reaction chamber and MOCVD device |
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TWI486484B (en) * | 2013-08-02 | 2015-06-01 | Beijing Nmc Co Ltd | Reaction chamber and MOCVD device |
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