TWI857041B - 用以偵測捲盤中存在異常的裝置和方法 - Google Patents

用以偵測捲盤中存在異常的裝置和方法 Download PDF

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Publication number
TWI857041B
TWI857041B TW109111518A TW109111518A TWI857041B TW I857041 B TWI857041 B TW I857041B TW 109111518 A TW109111518 A TW 109111518A TW 109111518 A TW109111518 A TW 109111518A TW I857041 B TWI857041 B TW I857041B
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TW
Taiwan
Prior art keywords
reel
camera
image
anomalies
movable support
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TW109111518A
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English (en)
Chinese (zh)
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TW202106601A (zh
Inventor
拉莫斯 亞歷山大 巴塞洛斯
達 席爾瓦 羅德里格 紐尼斯
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巴西商飛薩諾特西杜斯有限公司
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Publication of TW202106601A publication Critical patent/TW202106601A/zh
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65HHANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H63/00Warning or safety devices, e.g. automatic fault detectors, stop-motions ; Quality control of the package
    • B65H63/006Warning or safety devices, e.g. automatic fault detectors, stop-motions ; Quality control of the package quality control of the package
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952Inspecting the exterior surface of cylindrical bodies or wires
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65HHANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2553/00Sensing or detecting means
    • B65H2553/40Sensing or detecting means using optical, e.g. photographic, elements
    • B65H2553/42Cameras
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65HHANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2701/00Handled material; Storage means
    • B65H2701/30Handled filamentary material
    • B65H2701/31Textiles threads or artificial strands of filaments
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N2021/845Objects on a conveyor

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  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
TW109111518A 2019-04-03 2020-04-06 用以偵測捲盤中存在異常的裝置和方法 TWI857041B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP19167111.4A EP3718939B1 (en) 2019-04-03 2019-04-03 Device and method for detecting the presence of abnormalities in a reel
EPEP19167111.4 2019-04-03

Publications (2)

Publication Number Publication Date
TW202106601A TW202106601A (zh) 2021-02-16
TWI857041B true TWI857041B (zh) 2024-10-01

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ID=66092086

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TW109111518A TWI857041B (zh) 2019-04-03 2020-04-06 用以偵測捲盤中存在異常的裝置和方法

Country Status (5)

Country Link
US (1) US12371301B2 (https=)
EP (1) EP3718939B1 (https=)
BR (1) BR112021019431A8 (https=)
TW (1) TWI857041B (https=)
WO (1) WO2020202050A1 (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3848311A1 (de) * 2020-01-07 2021-07-14 Lenzing Aktiengesellschaft Automatische qualitätskontrolle von spulen
WO2022138570A1 (ja) * 2020-12-25 2022-06-30 三菱重工機械システム株式会社 段ボールシートの紙継ぎ部検出装置および段ボールシートの製造装置
EP4469790A1 (en) * 2022-01-28 2024-12-04 Sanko Tekstil Isletmeleri Sanayi ve Ticaret Anonim Sirketi Baspinar Subesi Inspection system for yarn bobbins and method for inspecting yarn bobbins
CN116256371A (zh) * 2023-02-28 2023-06-13 广州赛奥碳纤维技术股份有限公司 一种碳纤维卷线质量实时检测方法、装置及存储介质
CN116639540A (zh) * 2023-06-12 2023-08-25 桂林电子科技大学 一种基于机器视觉的电缆自调节卷线系统

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07125925A (ja) * 1993-11-04 1995-05-16 Murata Mach Ltd パッケージ検査装置
JP2000337827A (ja) * 1999-03-25 2000-12-08 Fuji Photo Film Co Ltd 外観検査方法及び外観検査装置
WO2016135664A2 (en) * 2015-02-27 2016-09-01 Pulsar S.R.L. A unit for controlling or managing products.
CN106469448A (zh) * 2015-06-26 2017-03-01 康耐视公司 利用3d视觉进行自动化工业检查
CN106999994A (zh) * 2014-10-17 2017-08-01 妮玛·纳巴维 自清洁光学传感器组件

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02265867A (ja) * 1989-04-04 1990-10-30 Murata Mach Ltd パッケージの異常部検出方法
GB9024936D0 (en) * 1990-11-16 1991-01-02 Leicester Polytechnic Methods and apparatus for fabric inspection
US5315366A (en) * 1991-04-09 1994-05-24 Murata Kikai Kabushiki Kaisha Yarn package inspecting apparatus
JP2869338B2 (ja) 1994-06-17 1999-03-10 鐘紡株式会社 巻糸ボビンの汚れ検出装置
DE69705532T2 (de) 1997-03-19 2002-05-16 Cognivision Research, S.L. Verfahren zur überprüfung von textilspulen und vorrichtung für seine durchführung
JP2001039628A (ja) * 1999-07-27 2001-02-13 Toray Ind Inc 糸条の巻き形態異常の検知方法および検知装置
US6633383B1 (en) 1999-10-25 2003-10-14 Linetech Industries, Inc. Method and apparatus for the automated inspection of yarn packages
JP2003213585A (ja) * 2001-11-07 2003-07-30 Mitsubishi Heavy Ind Ltd 紙の品質モニタリング装置及び抄紙機並びに紙の製造方法
FI127623B (fi) * 2007-08-31 2018-10-31 Abb Ltd Rainan paksuuden mittauslaite
US9435749B2 (en) 2013-03-13 2016-09-06 Alcoa Inc. System and method for inspection of roll surface
JP6479706B2 (ja) * 2016-04-11 2019-03-06 株式会社PSM International 長尺シート材の厚み計測方法および厚み計測システム
US10021369B2 (en) * 2016-07-26 2018-07-10 Qcify Inc. In-flight 3D inspector

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07125925A (ja) * 1993-11-04 1995-05-16 Murata Mach Ltd パッケージ検査装置
JP2000337827A (ja) * 1999-03-25 2000-12-08 Fuji Photo Film Co Ltd 外観検査方法及び外観検査装置
CN106999994A (zh) * 2014-10-17 2017-08-01 妮玛·纳巴维 自清洁光学传感器组件
WO2016135664A2 (en) * 2015-02-27 2016-09-01 Pulsar S.R.L. A unit for controlling or managing products.
CN106469448A (zh) * 2015-06-26 2017-03-01 康耐视公司 利用3d视觉进行自动化工业检查

Also Published As

Publication number Publication date
US20220185619A1 (en) 2022-06-16
BR112021019431A8 (pt) 2022-11-22
TW202106601A (zh) 2021-02-16
BR112021019431A2 (https=) 2021-11-30
US12371301B2 (en) 2025-07-29
WO2020202050A1 (en) 2020-10-08
EP3718939B1 (en) 2023-01-04
EP3718939A1 (en) 2020-10-07

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