TWI840287B - Quartz cutting speed adjustment system - Google Patents

Quartz cutting speed adjustment system Download PDF

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TWI840287B
TWI840287B TW112129689A TW112129689A TWI840287B TW I840287 B TWI840287 B TW I840287B TW 112129689 A TW112129689 A TW 112129689A TW 112129689 A TW112129689 A TW 112129689A TW I840287 B TWI840287 B TW I840287B
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speed
cutting
group
information
unit
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TW112129689A
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何超群
黃彥翔
何昆年
陳炤彰
賴廷寰
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澤米科技股份有限公司
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Abstract

A quartz cutting speed adjustment system includes a cutting module having a cutting device and a driving device for driving the cutting device, a control module for driving the cutting module and provided with a central processing unit, a detection unit, a speed unit and a timing unit connected to one another, the driving device is connected to the central processing unit, the timing unit prestores a cutting time information, the speed unit prestores a cutting speed information, the cutting time information is bound to the cutting speed information and stored in the central processing unit, the central processing unit drives the drive device according to the cutting time information and the cutting speed information, so as to reduce the instantaneous stress of quartz wafers and the risk of deformation.

Description

石英切割速度調整系統Quartz cutting speed adjustment system

本發明關於一種切割速度調整系統,特別係關於一種石英切割速度調整系統。The present invention relates to a cutting speed adjustment system, and more particularly to a quartz cutting speed adjustment system.

晶圓切割是半導體製程中的重要步驟,晶圓切割的品質和效率會直接影響到晶片的良率和成本,因此需要嚴格控制切割的參數和條件,其中,進給率是決定了切割的時間和精度,進給率過低會降低切割效率,增加生產成本;進給率過高,相對切割速度過快,可能導致過高的切削力和熱量累積,這樣的情況會導致被切割物變形的風險增加,例如彎曲、扭曲、曲翹或破裂等,更會造成切割器磨損加劇,影響切割品質。Wafer cutting is an important step in the semiconductor manufacturing process. The quality and efficiency of wafer cutting will directly affect the yield and cost of the chip. Therefore, the parameters and conditions of cutting need to be strictly controlled. Among them, the feed rate determines the time and accuracy of cutting. A feed rate that is too low will reduce cutting efficiency and increase production costs. A feed rate that is too high and the relative cutting speed is too fast may lead to excessive cutting force and heat accumulation. This will increase the risk of deformation of the cut object, such as bending, twisting, warping or cracking, and will cause increased wear of the cutter, affecting the cutting quality.

按,以往切割石英柱,當切割線鋸接觸到石英柱時,因為進給率過快造成瞬間應力過大,容易對晶圓造成曲翹損傷,產生裂紋、缺口、碎屑等缺陷,降低晶片的可靠性,但若調整進給率過慢,則降低切割效率,不符成本。In the past, when cutting quartz columns, when the cutting wire saw touched the quartz column, the instantaneous stress was too large due to the too fast feed rate, which could easily cause the wafer to bend and damage, and produce defects such as cracks, notches, and debris, reducing the reliability of the chip. However, if the feed rate is adjusted too slowly, the cutting efficiency will be reduced, which is not cost-effective.

本發明之目的為提供一種石英切割速度調整系統,降低瞬間壓力,減少晶片變形。The purpose of the present invention is to provide a quartz cutting speed adjustment system to reduce instantaneous pressure and reduce chip deformation.

為了達成此目的,本發明提供一種石英切割速度調整系統,包括:To achieve this purpose, the present invention provides a quartz cutting speed adjustment system, comprising:

一切割模組,具有一切割裝置及一驅動裝置,該切割裝置與該驅動裝置資訊連接,該驅動裝置驅動該切割裝置作動,該驅動裝置調控該切割裝置作動的速度及時間;及A cutting module having a cutting device and a driving device, wherein the cutting device is informationally connected to the driving device, the driving device drives the cutting device to operate, and the driving device adjusts the speed and time of the operation of the cutting device; and

一控制模組,該控制模組驅動該切割模組,該控制模組具有一中央處理單元、一偵測單元、一速度單元及一計時單元,該驅動裝置資訊連接該中央處理單元,該中央處理單元、該偵測單元、該速度單元及該計時單元互相資訊連接,該計時單元預存一切割時間資訊,該速度單元預存一切割速度資訊,該切割時間資訊與該切割速度資訊綁定並儲存於該中央處理單元,該切割時間資訊包含複數時間,該切割速度資訊包含複數切割速度,該中央處理單元依據該切割時間資訊及該切割速度資訊控制該驅動裝置,a control module, the control module drives the cutting module, the control module has a central processing unit, a detection unit, a speed unit and a timing unit, the driving device is information-connected to the central processing unit, the central processing unit, the detection unit, the speed unit and the timing unit are information-connected to each other, the timing unit stores a cutting time information in advance, the speed unit stores a cutting speed information in advance, the cutting time information is bound to the cutting speed information and stored in the central processing unit, the cutting time information includes a plurality of times, the cutting speed information includes a plurality of cutting speeds, the central processing unit controls the driving device according to the cutting time information and the cutting speed information,

其中,該切割速度資訊為複數速度群組,包含,一第一速度群組、一第二速度群組、一第三速度群組及一第四速度群組,該第一速度群組之速度小於該第二速度群組之速度,該第二速度群組之速度大於該第三速度群組之速度,該第四速度群組之速度小於該第二速度群組之速度。The cutting speed information is a plurality of speed groups, including a first speed group, a second speed group, a third speed group and a fourth speed group. The speed of the first speed group is less than that of the second speed group, the speed of the second speed group is greater than that of the third speed group, and the speed of the fourth speed group is less than that of the second speed group.

更具體地,該計時單元具有一計時器。More specifically, the timing unit has a timer.

更具體地,該偵測單元具有至少一偵測器。More specifically, the detection unit has at least one detector.

較佳地,該第四速度群組之最後一個速度等於該第一速度群組之第一個速度。Preferably, the last speed of the fourth speed group is equal to the first speed of the first speed group.

本發明透過該計時單元設置該切割時間資訊,及該速度單元設置該切割速度資訊,藉由該中央處理單元依照不同切割速度及不同切割時間驅動該驅動裝置,藉此使該驅動裝置調控該切割裝置作動時間及速度,藉此達成降低該石英晶圓的瞬間應力,且同時能夠大幅度的減少該石英晶圓變形的可能性。The present invention sets the cutting time information through the timing unit and the cutting speed information through the speed unit, and drives the driving device according to different cutting speeds and different cutting times through the central processing unit, thereby enabling the driving device to adjust the actuation time and speed of the cutting device, thereby achieving the goal of reducing the instantaneous stress of the quartz wafer and at the same time being able to significantly reduce the possibility of deformation of the quartz wafer.

本發明的提供一種石英切割速度調整系統,如圖1所示,包含:The present invention provides a quartz cutting speed adjustment system, as shown in FIG1 , comprising:

一切割模組2及一控制模組3,該切割模組2與該控制模組3電性連接及資訊連接,該控制模組3供以調控該切割模組2作動時的速度及時間,該切割模組2係供以切割一石英晶圓。A cutting module 2 and a control module 3, the cutting module 2 is electrically and informationally connected to the control module 3, the control module 3 is used to adjust the speed and time of the cutting module 2 when it is in motion, and the cutting module 2 is used to cut a quartz wafer.

該切割模組2具有一切割裝置20及一驅動裝置21,該切割裝置20與該驅動裝置21資訊連接,該驅動裝置21驅動該切割裝置20作動,並調控該切割裝置20作動時的速度及時間。The cutting module 2 has a cutting device 20 and a driving device 21. The cutting device 20 is informationally connected to the driving device 21. The driving device 21 drives the cutting device 20 to operate and adjusts the speed and time of the cutting device 20 during operation.

該控制模組3具有一中央處理單元30、一偵測單元31、一速度單元32及一計時單元33,該中央處理單元30、該偵測單元31、該速度單元32及該計時單元33互相資訊連接,該驅動裝置21與該中央處理單元30資訊連接,該計時單元33事先預存一切割時間資訊331,該速度單元32事先預存一切割速度資訊321,該切割時間資訊331與該切割速度資訊321綁定,並儲存於該中央處理單元30。該中央處理單元30發出一切割指令至該驅動裝置21,該驅動裝置21接收到該切割指令,同時控制該切割裝置20作動;該偵測單元31具有至少一偵測器,該偵測單元31用以感測該切割裝置20是否切割或觸碰到該石英晶圓,若該切割裝置20切割或觸碰到該石英晶圓時,該偵測單元31發出一切割訊號,該偵測單元31將該切割訊號傳遞至該中央處理單元30,該中央處理單元30接收到該切割訊號同時觸發該計時單元33開始計時。The control module 3 has a central processing unit 30, a detection unit 31, a speed unit 32 and a timing unit 33. The central processing unit 30, the detection unit 31, the speed unit 32 and the timing unit 33 are connected to each other for information. The driving device 21 is connected to the central processing unit 30 for information. The timing unit 33 pre-stores a cutting time information 331. The speed unit 32 pre-stores a cutting speed information 321. The cutting time information 331 is bound to the cutting speed information 321 and stored in the central processing unit 30. The central processing unit 30 sends a cutting command to the driving device 21. The driving device 21 receives the cutting command and controls the cutting device 20 to move. The detection unit 31 has at least one detector. The detection unit 31 is used to sense whether the cutting device 20 cuts or touches the quartz wafer. If the cutting device 20 cuts or touches the quartz wafer, the detection unit 31 sends a cutting signal. The detection unit 31 transmits the cutting signal to the central processing unit 30. The central processing unit 30 receives the cutting signal and triggers the timing unit 33 to start timing.

該計時單元33具有一計時器,該中央處理單元30接收該切割訊號後,驅動該計時器依照該切割時間資訊331開始計時,該切割時間資訊331包含複數時間,該計時單元33依據該切割時間資訊331完成計時後會發出一調整訊號至該中央處理單元30。該切割時間資訊331可根據使用者需求進行調整,於本實施例中,該等時間具有一第一時間及一第二時間,各該第一時間為不同切割速度維持的時間,請參照圖2,當切割速度為10.8 mm/hr時維持24秒,上述24秒為該第一時間,該第二時間為二個不同切割速度間轉換的時間,請參照圖2,切割速度自10.8 mm/hr轉換至11 mm/hr的時間即為該第二時間,舉例而言,該第一時間為24秒,該第二時間為3秒,該第一時間及該第二時間為重複排列之數列,即每二個該第一時間之間設有一個該第二時間,每二個該第二時間之間設有一個該第一時間,該計時單元33根據該切割時間資訊331之各該時間,每計時完一個該時間該計時單元33傳送該調整訊號給該中央處理單元30,該中央處理單元30接收到該調整訊號後,該中央處理單元30依據該切割時間資訊331及該切割速度資訊321控制該驅動裝置21。The timing unit 33 has a timer. After the central processing unit 30 receives the cutting signal, it drives the timer to start timing according to the cutting time information 331. The cutting time information 331 includes multiple times. After the timing unit 33 completes the timing according to the cutting time information 331, it will send an adjustment signal to the central processing unit 30. The cutting time information 331 can be adjusted according to user needs. In this embodiment, the times have a first time and a second time. Each first time is the time for maintaining different cutting speeds. Please refer to Figure 2. When the cutting speed is 10.8 mm/hr, it is maintained for 24 seconds. The above 24 seconds is the first time. The second time is the time for switching between two different cutting speeds. Please refer to Figure 2. The cutting speed is switched from 10.8 mm/hr to 11 The time of mm/hr is the second time. For example, the first time is 24 seconds, and the second time is 3 seconds. The first time and the second time are repeated series, that is, there is a second time between every two first times, and there is a first time between every two second times. The timing unit 33 transmits the adjustment signal to the central processing unit 30 every time a time is counted according to the cutting time information 331. After the central processing unit 30 receives the adjustment signal, the central processing unit 30 controls the driving device 21 according to the cutting time information 331 and the cutting speed information 321.

該中央處理單元30依據該切割時間資訊331和該切割速度資訊321傳輸一速度訊號給該驅動裝置21,該切割速度資訊321包含複數切割速度,該等切割速度根據使用者需求進行調整,更具體地,該中央處理單元30接收該調整訊號後,該中央處理單元30傳輸該速度訊號給該驅動裝置21,使該驅動裝置21依據該速度訊號驅動該切割裝置20切削,直到該計時單元33依據該切割時間資訊331完成計時後,該計時單元33再傳送該調整訊號給該中央處理單元30,該中央處理單元30再依據該切割時間資訊331及該切割速度資訊321傳送該速度訊號給該驅動裝置21,具體而言,該驅動裝置21依據該切割速度資訊321中的第二個該切割速度調整該切割裝置20作動速度變化。於本實施例中,該切割時間資訊331如表一所示,該等切割速度為根據不同進給量(Feed Rate)表示,即該切割裝置20相對於該石英晶圓移動的距離,較高的進給量導致較快的切割速度,而較低的進給量則導致較慢的切割速度,材料去除率(Material Removal Rate)則用於衡量該切割裝置20去除該石英晶圓體積。The central processing unit 30 transmits a speed signal to the driving device 21 according to the cutting time information 331 and the cutting speed information 321. The cutting speed information 321 includes a plurality of cutting speeds, and the cutting speeds are adjusted according to user needs. More specifically, after the central processing unit 30 receives the adjustment signal, the central processing unit 30 transmits the speed signal to the driving device 21, so that the driving device 21 drives the cutting device 21 according to the speed signal. 0 cutting, until the timing unit 33 completes the timing according to the cutting time information 331, the timing unit 33 then transmits the adjustment signal to the central processing unit 30, and the central processing unit 30 then transmits the speed signal to the driving device 21 according to the cutting time information 331 and the cutting speed information 321. Specifically, the driving device 21 adjusts the actuation speed of the cutting device 20 according to the second cutting speed in the cutting speed information 321. In this embodiment, the cutting time information 331 is shown in Table 1. The cutting speeds are represented by different feed rates, that is, the distance that the cutting device 20 moves relative to the quartz wafer. A higher feed rate results in a faster cutting speed, while a lower feed rate results in a slower cutting speed. The material removal rate is used to measure the volume of the quartz wafer removed by the cutting device 20.

綜上所述,該驅動裝置21驅動該切割裝置20依據該切割時間資訊331與該切割速度資訊321作動,直到該切割時間資訊331及該切割速度資訊321等數列結束。更具體地,該等第一時間之間穿插設置該等第二時間,每個該切割速度維持該第一時間,請參照圖2,於本實施例,該切割速度1維持時間為該第一時間(即24秒),並在該第二時間(即3秒)內從該切割速度1切換至該切割速度2,該切割速度2維持時間為該第一時間(即24秒),並在該第二時間(即3秒)內從該切割速度2切換至該切割速度3,以此類推,直到該切割速度20維持該第一時間結束。In summary, the driving device 21 drives the cutting device 20 to operate according to the cutting time information 331 and the cutting speed information 321 until the cutting time information 331 and the cutting speed information 321 are terminated. More specifically, the second times are interspersed between the first times, and each cutting speed is maintained for the first time. Please refer to FIG. 2 . In this embodiment, the cutting speed 1 is maintained for the first time (i.e., 24 seconds), and is switched from the cutting speed 1 to the cutting speed 2 within the second time (i.e., 3 seconds). The cutting speed 2 is maintained for the first time (i.e., 24 seconds), and is switched from the cutting speed 2 to the cutting speed 3 within the second time (i.e., 3 seconds), and so on, until the cutting speed 20 is maintained for the first time.

表一 切割速度資訊 進給量 單位: mm/hr 材料去除率 單位: mm 3/hr 切割速度1 10.8 1.944 切割速度2 11.0 1.980 切割速度3 11.5 2.070 切割速度4 11.3 2.034 切割速度5 11.0 1.980 切割速度6 10.8 1.944 切割速度7 10.5 1.890 切割速度8 10.2 1.836 切割速度9 10.1 1.818 切割速度10 10.0 1.800 切割速度11 10.0 1.800 切割速度12 10.1 1.818 切割速度13 10.2 1.836 切割速度14 10.5 1.890 切割速度15 10.8 1.944 切割速度16 11.0 1.980 切割速度17 11.3 2.034 切割速度18 11.5 2.070 切割速度19 11.0 1.980 切割速度20 10.8 1.944 Table I Cutting speed information Feed rate unit: mm/hr Material removal rate unit: mm 3 /hr Cutting speed 1 10.8 1.944 Cutting speed 2 11.0 1.980 Cutting speed 3 11.5 2.070 Cutting speed 4 11.3 2.034 Cutting speed 5 11.0 1.980 Cutting speed 6 10.8 1.944 Cutting speed 7 10.5 1.890 Cutting speed 8 10.2 1.836 Cutting speed 9 10.1 1.818 Cutting speed 10 10.0 1.800 Cutting speed 11 10.0 1.800 Cutting speed 12 10.1 1.818 Cutting speed 13 10.2 1.836 Cutting speed 14 10.5 1.890 Cutting speed 15 10.8 1.944 Cutting speed 16 11.0 1.980 Cutting speed 17 11.3 2.034 Cutting speed 18 11.5 2.070 Cutting speed 19 11.0 1.980 Cutting speed 20 10.8 1.944

值得說明的是,請參照表一,該切割裝置20開始以該切割速度1開始切割該石英晶圓,此時該切割速度1為一入線速度,同時該計時單元33開始依據該切割時間資訊331持續驅動該計時器計數,該驅動裝置21同樣依據該切割速度資訊321持續驅動該切割裝置20變換切割速度,經由上述該控制模組3調控該切割模組2的速度與時間,如圖2所示,該切割裝置20於該切割時間資訊331(時間)與該切割速度資訊321(進給量)的速度與時間關係圖,值得說明的是,該石英切割速度調整系統藉由該切割裝置20在碰到該石英晶圓的進給量慢,使該石英晶圓不會因為瞬間的應力過大,接著逐漸將進給量加快至11.5 mm/hr,此時該切割裝置20進入該石英晶圓1/2周徑,將進給量逐漸減慢直到10.0 mm/hr,該切割裝置20離開該石英晶圓之最長周徑,再開始將進給量上升至11.5 mm/hr,至最後下降至該切割速度20,此時該切割速度20為10.8 mm/hr,該切割速度20為一出線速度,使該切割裝置20碰觸到該石英晶圓(即該入線速度)及離開該石英晶圓(即該出線速度)均為最慢進給量,換言之,該入線速度等於該出線速度,藉此使該石英晶圓應力不會過度集中,降低該石英晶圓變形因素。It is worth noting that, referring to Table 1, the cutting device 20 starts to cut the quartz wafer at the cutting speed 1, at which the cutting speed 1 is a line speed, and at the same time the timing unit 33 starts to drive the timer to count according to the cutting time information 331, and the driving device 21 also drives the cutting device 20 to change the cutting speed according to the cutting speed information 321. The speed and time of the cutting module 2 are shown in FIG. 2 , which is a speed and time relationship diagram of the cutting device 20 at the cutting time information 331 (time) and the cutting speed information 321 (feeding amount). It is worth noting that the quartz cutting speed adjustment system uses the cutting device 20 to feed the quartz wafer slowly when it encounters the quartz wafer so that the quartz wafer will not be overstressed due to the instantaneous stress, and then gradually speeds up the feeding amount to 11.5 mm/hr, at this time the cutting device 20 enters 1/2 of the circumference of the quartz wafer, and gradually slows down the feed rate until it reaches 10.0 mm/hr. The cutting device 20 leaves the longest circumference of the quartz wafer, and then starts to increase the feed rate to 11.5 mm/hr, and finally drops to the cutting speed 20, at which time the cutting speed 20 is 10.8 mm/hr. The cutting speed 20 is an outlet speed, so that the cutting device 20 touches the quartz wafer (i.e., the entry speed) and leaves the quartz wafer (i.e., the outlet speed) at the slowest feed rate. In other words, the entry speed is equal to the outlet speed, so that the stress of the quartz wafer will not be overly concentrated, reducing the deformation factor of the quartz wafer.

該切割速度資訊321內之該等速度進一步定義為複數速度群組,包含,一第一速度群組S1、一第二速度群組S2、一第三速度群組S3及一第四速度群組S4,該第一速度群組S1之平均速度小於該第二速度群組S2之平均速度,該第二速度群組S2之平均速度大於該第三速度群組S3之平均速度,該第四速度群組S4之平均速度小於該第二速度群組S2之平均速度,該第四速度群組S4之平均速度等於該第一速度群組S1之平均速度。The speeds in the cutting speed information 321 are further defined as a plurality of speed groups, including a first speed group S1, a second speed group S2, a third speed group S3 and a fourth speed group S4, the average speed of the first speed group S1 is less than the average speed of the second speed group S2, the average speed of the second speed group S2 is greater than the average speed of the third speed group S3, the average speed of the fourth speed group S4 is less than the average speed of the second speed group S2, and the average speed of the fourth speed group S4 is equal to the average speed of the first speed group S1.

於另一個實施例中,同樣包含,該第一速度群組S1、該第二速度群組S2、該第三速度群組S3及該第四速度群組S4,該第一速度群組S1之最後一個速度小於該第二速度群組S2之第一個速度,該第二速度群組S2之最後一個速度大於該第三速度群組S3之第一個速度,該第四速度群組S4之第一個速度小於該第三速度群組S3之最後一個速度,該第四速度群組S4之第一個速度小於該第二速度群組S2之最後一個速度,該第四速度群組S4之最後一個速度等於該第一速度群組S1之第一個速度。In another embodiment, the first speed group S1, the second speed group S2, the third speed group S3 and the fourth speed group S4 are also included, the last speed of the first speed group S1 is less than the first speed of the second speed group S2, the last speed of the second speed group S2 is greater than the first speed of the third speed group S3, the first speed of the fourth speed group S4 is less than the last speed of the third speed group S3, the first speed of the fourth speed group S4 is less than the last speed of the second speed group S2, and the last speed of the fourth speed group S4 is equal to the first speed of the first speed group S1.

於另一個實施例中,同樣包含,該第一速度群組S1、該第二速度群組S2、該第三速度群組S3及該第四速度群組S4,與第一實施例大致相同,為避免贅述,僅描述不同點,其中,該第四速度群組S4之平均速度小於該第一速度群組S1之平均速度。In another embodiment, the first speed group S1, the second speed group S2, the third speed group S3 and the fourth speed group S4 are also included, which are substantially the same as the first embodiment. To avoid redundancy, only the differences are described, wherein the average speed of the fourth speed group S4 is less than the average speed of the first speed group S1.

本發明透過該石英切割速度調整系統,使該控制模組3將時間及速度可以事先預存至該計時單元33及該速度單元32,如此能確保該控制模組3可依照預存之速度及時間驅動該切割模組2,藉此使該切割裝置20控制切削力和熱量的生成,減少該石英晶圓被切割瞬間壓力,減少變形風險,同時有助於提供穩定的切割過程,減少振動和不穩定的情況,進而確保穩定性。The present invention uses the quartz cutting speed adjustment system to enable the control module 3 to pre-store the time and speed in the timing unit 33 and the speed unit 32, thereby ensuring that the control module 3 can drive the cutting module 2 according to the pre-stored speed and time, thereby enabling the cutting device 20 to control the generation of cutting force and heat, reduce the instantaneous pressure of the quartz wafer being cut, reduce the risk of deformation, and at the same time help provide a stable cutting process, reduce vibration and instability, and thus ensure stability.

2:切割模組 20:切割裝置 21:驅動裝置 3:控制模組 30:中央處理單元 31:偵測單元 32:速度單元 321:切割速度資訊 33:計時單元 331:切割時間資訊 S1:第一速度群組 S2:第二速度群組 S3:第三速度群組 S4:第四速度群組2: Cutting module 20: Cutting device 21: Driving device 3: Control module 30: Central processing unit 31: Detection unit 32: Speed unit 321: Cutting speed information 33: Timing unit 331: Cutting time information S1: First speed group S2: Second speed group S3: Third speed group S4: Fourth speed group

圖1為本發明系統架構圖。 圖2為本發明實施例進給量與時間座標關係圖。 Figure 1 is a diagram of the system architecture of the present invention. Figure 2 is a diagram showing the relationship between feed amount and time coordinates of an embodiment of the present invention.

2:切割模組 2: Cutting module

20:切割裝置 20: Cutting device

21:驅動裝置 21: Drive device

3:控制模組 3: Control module

30:中央處理單元 30: Central processing unit

31:偵測單元 31: Detection unit

32:速度單元 32: Speed unit

321:切割速度資訊 321: Cutting speed information

33:計時單元 33: Timing unit

331:切割時間資訊 331: Cutting time information

Claims (4)

一種石英切割速度調整系統,包括: 一切割模組,具有一切割裝置及一驅動裝置,該切割裝置與該驅動裝置資訊連接,該驅動裝置驅動該切割裝置作動,該驅動裝置調控該切割裝置作動的速度及時間;及 一控制模組,該控制模組驅動該切割模組,該控制模組具有一中央處理單元、一偵測單元、一速度單元及一計時單元,該驅動裝置資訊連接該中央處理單元,該中央處理單元、該偵測單元、該速度單元及該計時單元互相資訊連接,該計時單元預存一切割時間資訊,該速度單元預存一切割速度資訊,該切割時間資訊與該切割速度資訊綁定並儲存於該中央處理單元,該切割時間資訊包含複數時間,該切割速度資訊包含複數切割速度,該中央處理單元依據該切割時間資訊及該切割速度資訊控制該驅動裝置, 其中,該切割速度資訊為複數速度群組,包含,一第一速度群組、一第二速度群組、一第三速度群組及一第四速度群組,該第一速度群組之速度小於該第二速度群組之速度,該第二速度群組之速度大於該第三速度群組之速度,該第四速度群組之速度小於該第二速度群組之速度。 A quartz cutting speed adjustment system comprises: a cutting module having a cutting device and a driving device, the cutting device is informationally connected to the driving device, the driving device drives the cutting device to operate, and the driving device adjusts the speed and time of the operation of the cutting device; and A control module drives the cutting module. The control module has a central processing unit, a detection unit, a speed unit and a timing unit. The driving device is information-connected to the central processing unit. The central processing unit, the detection unit, the speed unit and the timing unit are information-connected to each other. The timing unit stores a cutting time information. The speed unit stores a cutting speed information. The cutting time information is bound to the cutting speed information and stored in the central processing unit. The cutting time information includes multiple times. The cutting speed information includes multiple cutting speeds. The central processing unit controls the driving device according to the cutting time information and the cutting speed information. The cutting speed information is a plurality of speed groups, including a first speed group, a second speed group, a third speed group and a fourth speed group. The speed of the first speed group is less than the speed of the second speed group, the speed of the second speed group is greater than the speed of the third speed group, and the speed of the fourth speed group is less than the speed of the second speed group. 如請求項1所述之石英切割速度調整系統,其中,該計時單元具有一計時器。A quartz cutting speed adjustment system as described in claim 1, wherein the timing unit has a timer. 如請求項1所述之石英切割速度調整系統,其中,該偵測單元具有至少一偵測器。A quartz cutting speed adjustment system as described in claim 1, wherein the detection unit has at least one detector. 如請求項1所述之石英切割速度調整系統,其中,該第四速度群組之最後一個速度等於該第一速度群組之第一個速度。A quartz cutting speed adjustment system as described in claim 1, wherein the last speed of the fourth speed group is equal to the first speed of the first speed group.
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CN102233620A (en) * 2010-04-28 2011-11-09 云南中科鑫圆晶体材料有限公司 Method for controlling multi-wire cutting load
CN112405912A (en) * 2020-10-30 2021-02-26 唐山国芯晶源电子有限公司 Process method for cutting quartz wafer by diamond wire
CN213353037U (en) * 2020-07-23 2021-06-04 北京晶泽远洋石英玻璃制品有限公司 Cutting and grinding device of quartz plate

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1324285A (en) * 1998-10-29 2001-11-28 库利克-索法投资公司 Monitoring system for dicing saws
TW478023B (en) * 1999-12-01 2002-03-01 Kulicke & Soffa Investments Monitoring system for dicing saws
CN102233620A (en) * 2010-04-28 2011-11-09 云南中科鑫圆晶体材料有限公司 Method for controlling multi-wire cutting load
CN213353037U (en) * 2020-07-23 2021-06-04 北京晶泽远洋石英玻璃制品有限公司 Cutting and grinding device of quartz plate
CN112405912A (en) * 2020-10-30 2021-02-26 唐山国芯晶源电子有限公司 Process method for cutting quartz wafer by diamond wire

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