TWI840287B - Quartz cutting speed adjustment system - Google Patents
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- TWI840287B TWI840287B TW112129689A TW112129689A TWI840287B TW I840287 B TWI840287 B TW I840287B TW 112129689 A TW112129689 A TW 112129689A TW 112129689 A TW112129689 A TW 112129689A TW I840287 B TWI840287 B TW I840287B
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- 238000005520 cutting process Methods 0.000 title claims abstract description 187
- 239000010453 quartz Substances 0.000 title claims abstract description 33
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 title claims abstract description 33
- 238000001514 detection method Methods 0.000 claims abstract description 15
- 235000012431 wafers Nutrition 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 101001121408 Homo sapiens L-amino-acid oxidase Proteins 0.000 description 1
- 102100026388 L-amino-acid oxidase Human genes 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
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Abstract
Description
本發明關於一種切割速度調整系統,特別係關於一種石英切割速度調整系統。The present invention relates to a cutting speed adjustment system, and more particularly to a quartz cutting speed adjustment system.
晶圓切割是半導體製程中的重要步驟,晶圓切割的品質和效率會直接影響到晶片的良率和成本,因此需要嚴格控制切割的參數和條件,其中,進給率是決定了切割的時間和精度,進給率過低會降低切割效率,增加生產成本;進給率過高,相對切割速度過快,可能導致過高的切削力和熱量累積,這樣的情況會導致被切割物變形的風險增加,例如彎曲、扭曲、曲翹或破裂等,更會造成切割器磨損加劇,影響切割品質。Wafer cutting is an important step in the semiconductor manufacturing process. The quality and efficiency of wafer cutting will directly affect the yield and cost of the chip. Therefore, the parameters and conditions of cutting need to be strictly controlled. Among them, the feed rate determines the time and accuracy of cutting. A feed rate that is too low will reduce cutting efficiency and increase production costs. A feed rate that is too high and the relative cutting speed is too fast may lead to excessive cutting force and heat accumulation. This will increase the risk of deformation of the cut object, such as bending, twisting, warping or cracking, and will cause increased wear of the cutter, affecting the cutting quality.
按,以往切割石英柱,當切割線鋸接觸到石英柱時,因為進給率過快造成瞬間應力過大,容易對晶圓造成曲翹損傷,產生裂紋、缺口、碎屑等缺陷,降低晶片的可靠性,但若調整進給率過慢,則降低切割效率,不符成本。In the past, when cutting quartz columns, when the cutting wire saw touched the quartz column, the instantaneous stress was too large due to the too fast feed rate, which could easily cause the wafer to bend and damage, and produce defects such as cracks, notches, and debris, reducing the reliability of the chip. However, if the feed rate is adjusted too slowly, the cutting efficiency will be reduced, which is not cost-effective.
本發明之目的為提供一種石英切割速度調整系統,降低瞬間壓力,減少晶片變形。The purpose of the present invention is to provide a quartz cutting speed adjustment system to reduce instantaneous pressure and reduce chip deformation.
為了達成此目的,本發明提供一種石英切割速度調整系統,包括:To achieve this purpose, the present invention provides a quartz cutting speed adjustment system, comprising:
一切割模組,具有一切割裝置及一驅動裝置,該切割裝置與該驅動裝置資訊連接,該驅動裝置驅動該切割裝置作動,該驅動裝置調控該切割裝置作動的速度及時間;及A cutting module having a cutting device and a driving device, wherein the cutting device is informationally connected to the driving device, the driving device drives the cutting device to operate, and the driving device adjusts the speed and time of the operation of the cutting device; and
一控制模組,該控制模組驅動該切割模組,該控制模組具有一中央處理單元、一偵測單元、一速度單元及一計時單元,該驅動裝置資訊連接該中央處理單元,該中央處理單元、該偵測單元、該速度單元及該計時單元互相資訊連接,該計時單元預存一切割時間資訊,該速度單元預存一切割速度資訊,該切割時間資訊與該切割速度資訊綁定並儲存於該中央處理單元,該切割時間資訊包含複數時間,該切割速度資訊包含複數切割速度,該中央處理單元依據該切割時間資訊及該切割速度資訊控制該驅動裝置,a control module, the control module drives the cutting module, the control module has a central processing unit, a detection unit, a speed unit and a timing unit, the driving device is information-connected to the central processing unit, the central processing unit, the detection unit, the speed unit and the timing unit are information-connected to each other, the timing unit stores a cutting time information in advance, the speed unit stores a cutting speed information in advance, the cutting time information is bound to the cutting speed information and stored in the central processing unit, the cutting time information includes a plurality of times, the cutting speed information includes a plurality of cutting speeds, the central processing unit controls the driving device according to the cutting time information and the cutting speed information,
其中,該切割速度資訊為複數速度群組,包含,一第一速度群組、一第二速度群組、一第三速度群組及一第四速度群組,該第一速度群組之速度小於該第二速度群組之速度,該第二速度群組之速度大於該第三速度群組之速度,該第四速度群組之速度小於該第二速度群組之速度。The cutting speed information is a plurality of speed groups, including a first speed group, a second speed group, a third speed group and a fourth speed group. The speed of the first speed group is less than that of the second speed group, the speed of the second speed group is greater than that of the third speed group, and the speed of the fourth speed group is less than that of the second speed group.
更具體地,該計時單元具有一計時器。More specifically, the timing unit has a timer.
更具體地,該偵測單元具有至少一偵測器。More specifically, the detection unit has at least one detector.
較佳地,該第四速度群組之最後一個速度等於該第一速度群組之第一個速度。Preferably, the last speed of the fourth speed group is equal to the first speed of the first speed group.
本發明透過該計時單元設置該切割時間資訊,及該速度單元設置該切割速度資訊,藉由該中央處理單元依照不同切割速度及不同切割時間驅動該驅動裝置,藉此使該驅動裝置調控該切割裝置作動時間及速度,藉此達成降低該石英晶圓的瞬間應力,且同時能夠大幅度的減少該石英晶圓變形的可能性。The present invention sets the cutting time information through the timing unit and the cutting speed information through the speed unit, and drives the driving device according to different cutting speeds and different cutting times through the central processing unit, thereby enabling the driving device to adjust the actuation time and speed of the cutting device, thereby achieving the goal of reducing the instantaneous stress of the quartz wafer and at the same time being able to significantly reduce the possibility of deformation of the quartz wafer.
本發明的提供一種石英切割速度調整系統,如圖1所示,包含:The present invention provides a quartz cutting speed adjustment system, as shown in FIG1 , comprising:
一切割模組2及一控制模組3,該切割模組2與該控制模組3電性連接及資訊連接,該控制模組3供以調控該切割模組2作動時的速度及時間,該切割模組2係供以切割一石英晶圓。A
該切割模組2具有一切割裝置20及一驅動裝置21,該切割裝置20與該驅動裝置21資訊連接,該驅動裝置21驅動該切割裝置20作動,並調控該切割裝置20作動時的速度及時間。The
該控制模組3具有一中央處理單元30、一偵測單元31、一速度單元32及一計時單元33,該中央處理單元30、該偵測單元31、該速度單元32及該計時單元33互相資訊連接,該驅動裝置21與該中央處理單元30資訊連接,該計時單元33事先預存一切割時間資訊331,該速度單元32事先預存一切割速度資訊321,該切割時間資訊331與該切割速度資訊321綁定,並儲存於該中央處理單元30。該中央處理單元30發出一切割指令至該驅動裝置21,該驅動裝置21接收到該切割指令,同時控制該切割裝置20作動;該偵測單元31具有至少一偵測器,該偵測單元31用以感測該切割裝置20是否切割或觸碰到該石英晶圓,若該切割裝置20切割或觸碰到該石英晶圓時,該偵測單元31發出一切割訊號,該偵測單元31將該切割訊號傳遞至該中央處理單元30,該中央處理單元30接收到該切割訊號同時觸發該計時單元33開始計時。The
該計時單元33具有一計時器,該中央處理單元30接收該切割訊號後,驅動該計時器依照該切割時間資訊331開始計時,該切割時間資訊331包含複數時間,該計時單元33依據該切割時間資訊331完成計時後會發出一調整訊號至該中央處理單元30。該切割時間資訊331可根據使用者需求進行調整,於本實施例中,該等時間具有一第一時間及一第二時間,各該第一時間為不同切割速度維持的時間,請參照圖2,當切割速度為10.8 mm/hr時維持24秒,上述24秒為該第一時間,該第二時間為二個不同切割速度間轉換的時間,請參照圖2,切割速度自10.8 mm/hr轉換至11 mm/hr的時間即為該第二時間,舉例而言,該第一時間為24秒,該第二時間為3秒,該第一時間及該第二時間為重複排列之數列,即每二個該第一時間之間設有一個該第二時間,每二個該第二時間之間設有一個該第一時間,該計時單元33根據該切割時間資訊331之各該時間,每計時完一個該時間該計時單元33傳送該調整訊號給該中央處理單元30,該中央處理單元30接收到該調整訊號後,該中央處理單元30依據該切割時間資訊331及該切割速度資訊321控制該驅動裝置21。The
該中央處理單元30依據該切割時間資訊331和該切割速度資訊321傳輸一速度訊號給該驅動裝置21,該切割速度資訊321包含複數切割速度,該等切割速度根據使用者需求進行調整,更具體地,該中央處理單元30接收該調整訊號後,該中央處理單元30傳輸該速度訊號給該驅動裝置21,使該驅動裝置21依據該速度訊號驅動該切割裝置20切削,直到該計時單元33依據該切割時間資訊331完成計時後,該計時單元33再傳送該調整訊號給該中央處理單元30,該中央處理單元30再依據該切割時間資訊331及該切割速度資訊321傳送該速度訊號給該驅動裝置21,具體而言,該驅動裝置21依據該切割速度資訊321中的第二個該切割速度調整該切割裝置20作動速度變化。於本實施例中,該切割時間資訊331如表一所示,該等切割速度為根據不同進給量(Feed Rate)表示,即該切割裝置20相對於該石英晶圓移動的距離,較高的進給量導致較快的切割速度,而較低的進給量則導致較慢的切割速度,材料去除率(Material Removal Rate)則用於衡量該切割裝置20去除該石英晶圓體積。The
綜上所述,該驅動裝置21驅動該切割裝置20依據該切割時間資訊331與該切割速度資訊321作動,直到該切割時間資訊331及該切割速度資訊321等數列結束。更具體地,該等第一時間之間穿插設置該等第二時間,每個該切割速度維持該第一時間,請參照圖2,於本實施例,該切割速度1維持時間為該第一時間(即24秒),並在該第二時間(即3秒)內從該切割速度1切換至該切割速度2,該切割速度2維持時間為該第一時間(即24秒),並在該第二時間(即3秒)內從該切割速度2切換至該切割速度3,以此類推,直到該切割速度20維持該第一時間結束。In summary, the driving
表一
值得說明的是,請參照表一,該切割裝置20開始以該切割速度1開始切割該石英晶圓,此時該切割速度1為一入線速度,同時該計時單元33開始依據該切割時間資訊331持續驅動該計時器計數,該驅動裝置21同樣依據該切割速度資訊321持續驅動該切割裝置20變換切割速度,經由上述該控制模組3調控該切割模組2的速度與時間,如圖2所示,該切割裝置20於該切割時間資訊331(時間)與該切割速度資訊321(進給量)的速度與時間關係圖,值得說明的是,該石英切割速度調整系統藉由該切割裝置20在碰到該石英晶圓的進給量慢,使該石英晶圓不會因為瞬間的應力過大,接著逐漸將進給量加快至11.5 mm/hr,此時該切割裝置20進入該石英晶圓1/2周徑,將進給量逐漸減慢直到10.0 mm/hr,該切割裝置20離開該石英晶圓之最長周徑,再開始將進給量上升至11.5 mm/hr,至最後下降至該切割速度20,此時該切割速度20為10.8 mm/hr,該切割速度20為一出線速度,使該切割裝置20碰觸到該石英晶圓(即該入線速度)及離開該石英晶圓(即該出線速度)均為最慢進給量,換言之,該入線速度等於該出線速度,藉此使該石英晶圓應力不會過度集中,降低該石英晶圓變形因素。It is worth noting that, referring to Table 1, the cutting
該切割速度資訊321內之該等速度進一步定義為複數速度群組,包含,一第一速度群組S1、一第二速度群組S2、一第三速度群組S3及一第四速度群組S4,該第一速度群組S1之平均速度小於該第二速度群組S2之平均速度,該第二速度群組S2之平均速度大於該第三速度群組S3之平均速度,該第四速度群組S4之平均速度小於該第二速度群組S2之平均速度,該第四速度群組S4之平均速度等於該第一速度群組S1之平均速度。The speeds in the
於另一個實施例中,同樣包含,該第一速度群組S1、該第二速度群組S2、該第三速度群組S3及該第四速度群組S4,該第一速度群組S1之最後一個速度小於該第二速度群組S2之第一個速度,該第二速度群組S2之最後一個速度大於該第三速度群組S3之第一個速度,該第四速度群組S4之第一個速度小於該第三速度群組S3之最後一個速度,該第四速度群組S4之第一個速度小於該第二速度群組S2之最後一個速度,該第四速度群組S4之最後一個速度等於該第一速度群組S1之第一個速度。In another embodiment, the first speed group S1, the second speed group S2, the third speed group S3 and the fourth speed group S4 are also included, the last speed of the first speed group S1 is less than the first speed of the second speed group S2, the last speed of the second speed group S2 is greater than the first speed of the third speed group S3, the first speed of the fourth speed group S4 is less than the last speed of the third speed group S3, the first speed of the fourth speed group S4 is less than the last speed of the second speed group S2, and the last speed of the fourth speed group S4 is equal to the first speed of the first speed group S1.
於另一個實施例中,同樣包含,該第一速度群組S1、該第二速度群組S2、該第三速度群組S3及該第四速度群組S4,與第一實施例大致相同,為避免贅述,僅描述不同點,其中,該第四速度群組S4之平均速度小於該第一速度群組S1之平均速度。In another embodiment, the first speed group S1, the second speed group S2, the third speed group S3 and the fourth speed group S4 are also included, which are substantially the same as the first embodiment. To avoid redundancy, only the differences are described, wherein the average speed of the fourth speed group S4 is less than the average speed of the first speed group S1.
本發明透過該石英切割速度調整系統,使該控制模組3將時間及速度可以事先預存至該計時單元33及該速度單元32,如此能確保該控制模組3可依照預存之速度及時間驅動該切割模組2,藉此使該切割裝置20控制切削力和熱量的生成,減少該石英晶圓被切割瞬間壓力,減少變形風險,同時有助於提供穩定的切割過程,減少振動和不穩定的情況,進而確保穩定性。The present invention uses the quartz cutting speed adjustment system to enable the
2:切割模組 20:切割裝置 21:驅動裝置 3:控制模組 30:中央處理單元 31:偵測單元 32:速度單元 321:切割速度資訊 33:計時單元 331:切割時間資訊 S1:第一速度群組 S2:第二速度群組 S3:第三速度群組 S4:第四速度群組2: Cutting module 20: Cutting device 21: Driving device 3: Control module 30: Central processing unit 31: Detection unit 32: Speed unit 321: Cutting speed information 33: Timing unit 331: Cutting time information S1: First speed group S2: Second speed group S3: Third speed group S4: Fourth speed group
圖1為本發明系統架構圖。 圖2為本發明實施例進給量與時間座標關係圖。 Figure 1 is a diagram of the system architecture of the present invention. Figure 2 is a diagram showing the relationship between feed amount and time coordinates of an embodiment of the present invention.
2:切割模組 2: Cutting module
20:切割裝置 20: Cutting device
21:驅動裝置 21: Drive device
3:控制模組 3: Control module
30:中央處理單元 30: Central processing unit
31:偵測單元 31: Detection unit
32:速度單元 32: Speed unit
321:切割速度資訊 321: Cutting speed information
33:計時單元 33: Timing unit
331:切割時間資訊 331: Cutting time information
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Citations (5)
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---|---|---|---|---|
CN1324285A (en) * | 1998-10-29 | 2001-11-28 | 库利克-索法投资公司 | Monitoring system for dicing saws |
TW478023B (en) * | 1999-12-01 | 2002-03-01 | Kulicke & Soffa Investments | Monitoring system for dicing saws |
CN102233620A (en) * | 2010-04-28 | 2011-11-09 | 云南中科鑫圆晶体材料有限公司 | Method for controlling multi-wire cutting load |
CN112405912A (en) * | 2020-10-30 | 2021-02-26 | 唐山国芯晶源电子有限公司 | Process method for cutting quartz wafer by diamond wire |
CN213353037U (en) * | 2020-07-23 | 2021-06-04 | 北京晶泽远洋石英玻璃制品有限公司 | Cutting and grinding device of quartz plate |
-
2023
- 2023-08-08 TW TW112129689A patent/TWI840287B/en active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1324285A (en) * | 1998-10-29 | 2001-11-28 | 库利克-索法投资公司 | Monitoring system for dicing saws |
TW478023B (en) * | 1999-12-01 | 2002-03-01 | Kulicke & Soffa Investments | Monitoring system for dicing saws |
CN102233620A (en) * | 2010-04-28 | 2011-11-09 | 云南中科鑫圆晶体材料有限公司 | Method for controlling multi-wire cutting load |
CN213353037U (en) * | 2020-07-23 | 2021-06-04 | 北京晶泽远洋石英玻璃制品有限公司 | Cutting and grinding device of quartz plate |
CN112405912A (en) * | 2020-10-30 | 2021-02-26 | 唐山国芯晶源电子有限公司 | Process method for cutting quartz wafer by diamond wire |
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