TWI834820B - Thermosetting resin film and first protective film forming sheet - Google Patents
Thermosetting resin film and first protective film forming sheet Download PDFInfo
- Publication number
- TWI834820B TWI834820B TW109105943A TW109105943A TWI834820B TW I834820 B TWI834820 B TW I834820B TW 109105943 A TW109105943 A TW 109105943A TW 109105943 A TW109105943 A TW 109105943A TW I834820 B TWI834820 B TW I834820B
- Authority
- TW
- Taiwan
- Prior art keywords
- thermosetting resin
- resin film
- thermosetting
- protective film
- film
- Prior art date
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- 229920001187 thermosetting polymer Polymers 0.000 title claims abstract description 604
- 229920005989 resin Polymers 0.000 title claims abstract description 525
- 239000011347 resin Substances 0.000 title claims abstract description 525
- 230000001681 protective effect Effects 0.000 title claims abstract description 342
- 229920000178 Acrylic resin Polymers 0.000 claims abstract description 40
- 239000004925 Acrylic resin Substances 0.000 claims abstract description 40
- 239000000463 material Substances 0.000 claims description 96
- 239000003822 epoxy resin Substances 0.000 claims description 56
- 229920000647 polyepoxide Polymers 0.000 claims description 56
- 229920000642 polymer Polymers 0.000 claims description 50
- 239000003795 chemical substances by application Substances 0.000 claims description 35
- 238000002834 transmittance Methods 0.000 claims description 31
- 239000000945 filler Substances 0.000 claims description 28
- 125000000524 functional group Chemical group 0.000 claims description 24
- 238000006243 chemical reaction Methods 0.000 claims description 14
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims 1
- 229910052760 oxygen Inorganic materials 0.000 claims 1
- 239000001301 oxygen Substances 0.000 claims 1
- 125000003700 epoxy group Chemical group 0.000 abstract description 14
- 239000010410 layer Substances 0.000 description 226
- 239000000203 mixture Substances 0.000 description 121
- 239000004065 semiconductor Substances 0.000 description 80
- 239000012790 adhesive layer Substances 0.000 description 70
- 235000012431 wafers Nutrition 0.000 description 70
- 239000002585 base Substances 0.000 description 68
- 230000001070 adhesive effect Effects 0.000 description 61
- 239000000853 adhesive Substances 0.000 description 60
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 54
- 230000015572 biosynthetic process Effects 0.000 description 49
- 150000001875 compounds Chemical class 0.000 description 49
- 238000000034 method Methods 0.000 description 49
- 238000004519 manufacturing process Methods 0.000 description 46
- 239000000049 pigment Substances 0.000 description 45
- 239000011254 layer-forming composition Substances 0.000 description 32
- 238000005520 cutting process Methods 0.000 description 28
- 239000002904 solvent Substances 0.000 description 27
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 24
- 238000001723 curing Methods 0.000 description 24
- 230000000694 effects Effects 0.000 description 24
- 239000004615 ingredient Substances 0.000 description 22
- 239000003431 cross linking reagent Substances 0.000 description 21
- -1 polysiloxane Polymers 0.000 description 20
- 150000002430 hydrocarbons Chemical group 0.000 description 18
- 239000004593 Epoxy Substances 0.000 description 17
- 229930195735 unsaturated hydrocarbon Natural products 0.000 description 17
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 16
- 239000007822 coupling agent Substances 0.000 description 15
- 238000011156 evaluation Methods 0.000 description 15
- 229920002554 vinyl polymer Polymers 0.000 description 15
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 14
- 230000000052 comparative effect Effects 0.000 description 14
- 238000002156 mixing Methods 0.000 description 14
- 239000003086 colorant Substances 0.000 description 13
- 238000000227 grinding Methods 0.000 description 13
- 238000010438 heat treatment Methods 0.000 description 13
- 150000001241 acetals Chemical class 0.000 description 12
- 239000004840 adhesive resin Substances 0.000 description 12
- 229920006223 adhesive resin Polymers 0.000 description 12
- 238000001035 drying Methods 0.000 description 12
- 230000001678 irradiating effect Effects 0.000 description 12
- 239000005011 phenolic resin Substances 0.000 description 12
- 239000005056 polyisocyanate Substances 0.000 description 12
- 229920001228 polyisocyanate Polymers 0.000 description 12
- 239000000758 substrate Substances 0.000 description 11
- DHKHKXVYLBGOIT-UHFFFAOYSA-N acetaldehyde Diethyl Acetal Natural products CCOC(C)OCC DHKHKXVYLBGOIT-UHFFFAOYSA-N 0.000 description 10
- 238000010030 laminating Methods 0.000 description 10
- 239000004848 polyfunctional curative Substances 0.000 description 10
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical compound CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 description 9
- 150000001252 acrylic acid derivatives Chemical class 0.000 description 9
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 9
- 239000002245 particle Substances 0.000 description 9
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N phenol group Chemical group C1(=CC=CC=C1)O ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 9
- 239000000126 substance Substances 0.000 description 9
- 238000012360 testing method Methods 0.000 description 9
- 239000000654 additive Substances 0.000 description 8
- 125000003277 amino group Chemical group 0.000 description 8
- 238000002360 preparation method Methods 0.000 description 8
- 125000003118 aryl group Chemical group 0.000 description 7
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 7
- 239000000470 constituent Substances 0.000 description 7
- 230000009477 glass transition Effects 0.000 description 7
- 239000011256 inorganic filler Substances 0.000 description 7
- 229910003475 inorganic filler Inorganic materials 0.000 description 7
- 239000000377 silicon dioxide Substances 0.000 description 7
- 229920005992 thermoplastic resin Polymers 0.000 description 7
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 6
- 239000003999 initiator Substances 0.000 description 6
- 229920002037 poly(vinyl butyral) polymer Polymers 0.000 description 6
- 238000012545 processing Methods 0.000 description 6
- 238000001029 thermal curing Methods 0.000 description 6
- 230000000996 additive effect Effects 0.000 description 5
- ISAOCJYIOMOJEB-UHFFFAOYSA-N benzoin Chemical compound C=1C=CC=CC=1C(O)C(=O)C1=CC=CC=C1 ISAOCJYIOMOJEB-UHFFFAOYSA-N 0.000 description 5
- 238000011049 filling Methods 0.000 description 5
- 238000006116 polymerization reaction Methods 0.000 description 5
- 239000002356 single layer Substances 0.000 description 5
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 4
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 4
- ZJCCRDAZUWHFQH-UHFFFAOYSA-N Trimethylolpropane Chemical compound CCC(CO)(CO)CO ZJCCRDAZUWHFQH-UHFFFAOYSA-N 0.000 description 4
- 239000011354 acetal resin Substances 0.000 description 4
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 4
- 239000011248 coating agent Substances 0.000 description 4
- 238000000576 coating method Methods 0.000 description 4
- 238000007865 diluting Methods 0.000 description 4
- 238000010894 electron beam technology Methods 0.000 description 4
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 4
- IQPQWNKOIGAROB-UHFFFAOYSA-N isocyanate group Chemical group [N-]=C=O IQPQWNKOIGAROB-UHFFFAOYSA-N 0.000 description 4
- 239000000178 monomer Substances 0.000 description 4
- 229920006324 polyoxymethylene Polymers 0.000 description 4
- 238000003756 stirring Methods 0.000 description 4
- JAHNSTQSQJOJLO-UHFFFAOYSA-N 2-(3-fluorophenyl)-1h-imidazole Chemical compound FC1=CC=CC(C=2NC=CN=2)=C1 JAHNSTQSQJOJLO-UHFFFAOYSA-N 0.000 description 3
- KWOLFJPFCHCOCG-UHFFFAOYSA-N Acetophenone Chemical compound CC(=O)C1=CC=CC=C1 KWOLFJPFCHCOCG-UHFFFAOYSA-N 0.000 description 3
- 229930185605 Bisphenol Natural products 0.000 description 3
- 241001050985 Disco Species 0.000 description 3
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 3
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 3
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 3
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 3
- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 3
- 239000006087 Silane Coupling Agent Substances 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 3
- 230000001476 alcoholic effect Effects 0.000 description 3
- 125000001931 aliphatic group Chemical group 0.000 description 3
- 150000001412 amines Chemical class 0.000 description 3
- 238000004132 cross linking Methods 0.000 description 3
- QGBSISYHAICWAH-UHFFFAOYSA-N dicyandiamide Chemical compound NC(N)=NC#N QGBSISYHAICWAH-UHFFFAOYSA-N 0.000 description 3
- 150000002148 esters Chemical class 0.000 description 3
- 238000005227 gel permeation chromatography Methods 0.000 description 3
- RAXXELZNTBOGNW-UHFFFAOYSA-N imidazole Natural products C1=CNC=N1 RAXXELZNTBOGNW-UHFFFAOYSA-N 0.000 description 3
- LVHBHZANLOWSRM-UHFFFAOYSA-N methylenebutanedioic acid Natural products OC(=O)CC(=C)C(O)=O LVHBHZANLOWSRM-UHFFFAOYSA-N 0.000 description 3
- 229910052757 nitrogen Inorganic materials 0.000 description 3
- 229920003986 novolac Polymers 0.000 description 3
- 229940059574 pentaerithrityl Drugs 0.000 description 3
- WXZMFSXDPGVJKK-UHFFFAOYSA-N pentaerythritol Chemical compound OCC(CO)(CO)CO WXZMFSXDPGVJKK-UHFFFAOYSA-N 0.000 description 3
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 3
- FKTHNVSLHLHISI-UHFFFAOYSA-N 1,2-bis(isocyanatomethyl)benzene Chemical compound O=C=NCC1=CC=CC=C1CN=C=O FKTHNVSLHLHISI-UHFFFAOYSA-N 0.000 description 2
- TXBCBTDQIULDIA-UHFFFAOYSA-N 2-[[3-hydroxy-2,2-bis(hydroxymethyl)propoxy]methyl]-2-(hydroxymethyl)propane-1,3-diol Chemical compound OCC(CO)(CO)COCC(CO)(CO)CO TXBCBTDQIULDIA-UHFFFAOYSA-N 0.000 description 2
- 125000003903 2-propenyl group Chemical group [H]C([*])([H])C([H])=C([H])[H] 0.000 description 2
- NLHHRLWOUZZQLW-UHFFFAOYSA-N Acrylonitrile Chemical compound C=CC#N NLHHRLWOUZZQLW-UHFFFAOYSA-N 0.000 description 2
- NOWKCMXCCJGMRR-UHFFFAOYSA-N Aziridine Chemical compound C1CN1 NOWKCMXCCJGMRR-UHFFFAOYSA-N 0.000 description 2
- VTYYLEPIZMXCLO-UHFFFAOYSA-L Calcium carbonate Chemical compound [Ca+2].[O-]C([O-])=O VTYYLEPIZMXCLO-UHFFFAOYSA-L 0.000 description 2
- JOYRKODLDBILNP-UHFFFAOYSA-N Ethyl urethane Chemical compound CCOC(N)=O JOYRKODLDBILNP-UHFFFAOYSA-N 0.000 description 2
- 239000005057 Hexamethylene diisocyanate Substances 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- BAPJBEWLBFYGME-UHFFFAOYSA-N Methyl acrylate Chemical compound COC(=O)C=C BAPJBEWLBFYGME-UHFFFAOYSA-N 0.000 description 2
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 2
- KAESVJOAVNADME-UHFFFAOYSA-N Pyrrole Chemical compound C=1C=CNC=1 KAESVJOAVNADME-UHFFFAOYSA-N 0.000 description 2
- 235000000126 Styrax benzoin Nutrition 0.000 description 2
- 244000028419 Styrax benzoin Species 0.000 description 2
- 235000008411 Sumatra benzointree Nutrition 0.000 description 2
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 2
- XTXRWKRVRITETP-UHFFFAOYSA-N Vinyl acetate Chemical compound CC(=O)OC=C XTXRWKRVRITETP-UHFFFAOYSA-N 0.000 description 2
- UUQQGGWZVKUCBD-UHFFFAOYSA-N [4-(hydroxymethyl)-2-phenyl-1h-imidazol-5-yl]methanol Chemical compound N1C(CO)=C(CO)N=C1C1=CC=CC=C1 UUQQGGWZVKUCBD-UHFFFAOYSA-N 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- 230000002378 acidificating effect Effects 0.000 description 2
- 125000002723 alicyclic group Chemical group 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 2
- 150000008064 anhydrides Chemical class 0.000 description 2
- 239000003963 antioxidant agent Substances 0.000 description 2
- 239000002216 antistatic agent Substances 0.000 description 2
- WPYMKLBDIGXBTP-UHFFFAOYSA-N benzoic acid Chemical compound OC(=O)C1=CC=CC=C1 WPYMKLBDIGXBTP-UHFFFAOYSA-N 0.000 description 2
- 229960002130 benzoin Drugs 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- WERYXYBDKMZEQL-UHFFFAOYSA-N butane-1,4-diol Chemical compound OCCCCO WERYXYBDKMZEQL-UHFFFAOYSA-N 0.000 description 2
- 239000006229 carbon black Substances 0.000 description 2
- 239000013522 chelant Substances 0.000 description 2
- PESYEWKSBIWTAK-UHFFFAOYSA-N cyclopenta-1,3-diene;titanium(2+) Chemical class [Ti+2].C=1C=C[CH-]C=1.C=1C=C[CH-]C=1 PESYEWKSBIWTAK-UHFFFAOYSA-N 0.000 description 2
- 125000005442 diisocyanate group Chemical group 0.000 description 2
- 125000003438 dodecyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 2
- 239000000975 dye Substances 0.000 description 2
- RJLZSKYNYLYCNY-UHFFFAOYSA-N ethyl carbamate;isocyanic acid Chemical group N=C=O.CCOC(N)=O RJLZSKYNYLYCNY-UHFFFAOYSA-N 0.000 description 2
- 238000009472 formulation Methods 0.000 description 2
- 125000003055 glycidyl group Chemical group C(C1CO1)* 0.000 description 2
- 235000019382 gum benzoic Nutrition 0.000 description 2
- RRAMGCGOFNQTLD-UHFFFAOYSA-N hexamethylene diisocyanate Chemical compound O=C=NCCCCCCN=C=O RRAMGCGOFNQTLD-UHFFFAOYSA-N 0.000 description 2
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 2
- PCKPVGOLPKLUHR-UHFFFAOYSA-N indoxyl Chemical group C1=CC=C2C(O)=CNC2=C1 PCKPVGOLPKLUHR-UHFFFAOYSA-N 0.000 description 2
- 239000001023 inorganic pigment Substances 0.000 description 2
- 239000012948 isocyanate Substances 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 125000001421 myristyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 2
- KBJFYLLAMSZSOG-UHFFFAOYSA-N n-(3-trimethoxysilylpropyl)aniline Chemical compound CO[Si](OC)(OC)CCCNC1=CC=CC=C1 KBJFYLLAMSZSOG-UHFFFAOYSA-N 0.000 description 2
- QWVGKYWNOKOFNN-UHFFFAOYSA-N o-cresol Chemical compound CC1=CC=CC=C1O QWVGKYWNOKOFNN-UHFFFAOYSA-N 0.000 description 2
- 125000002347 octyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 2
- 239000012860 organic pigment Substances 0.000 description 2
- 125000000913 palmityl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 229920006287 phenoxy resin Polymers 0.000 description 2
- 239000013034 phenoxy resin Substances 0.000 description 2
- 150000003003 phosphines Chemical class 0.000 description 2
- 230000000704 physical effect Effects 0.000 description 2
- 239000004014 plasticizer Substances 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 229920000058 polyacrylate Polymers 0.000 description 2
- 229920001515 polyalkylene glycol Polymers 0.000 description 2
- 229920001225 polyester resin Polymers 0.000 description 2
- 239000004645 polyester resin Substances 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 239000009719 polyimide resin Substances 0.000 description 2
- 229920005862 polyol Polymers 0.000 description 2
- 229920001296 polysiloxane Polymers 0.000 description 2
- 230000001568 sexual effect Effects 0.000 description 2
- 229920002050 silicone resin Polymers 0.000 description 2
- 229910000679 solder Inorganic materials 0.000 description 2
- 125000004079 stearyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 2
- SKRWFPLZQAAQSU-UHFFFAOYSA-N stibanylidynetin;hydrate Chemical compound O.[Sn].[Sb] SKRWFPLZQAAQSU-UHFFFAOYSA-N 0.000 description 2
- 229920002803 thermoplastic polyurethane Polymers 0.000 description 2
- YRHRIQCWCFGUEQ-UHFFFAOYSA-N thioxanthen-9-one Chemical class C1=CC=C2C(=O)C3=CC=CC=C3SC2=C1 YRHRIQCWCFGUEQ-UHFFFAOYSA-N 0.000 description 2
- 239000004408 titanium dioxide Substances 0.000 description 2
- DVKJHBMWWAPEIU-UHFFFAOYSA-N toluene 2,4-diisocyanate Chemical compound CC1=CC=C(N=C=O)C=C1N=C=O DVKJHBMWWAPEIU-UHFFFAOYSA-N 0.000 description 2
- IMNIMPAHZVJRPE-UHFFFAOYSA-N triethylenediamine Chemical compound C1CN2CCN1CC2 IMNIMPAHZVJRPE-UHFFFAOYSA-N 0.000 description 2
- BPSIOYPQMFLKFR-UHFFFAOYSA-N trimethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CO[Si](OC)(OC)CCCOCC1CO1 BPSIOYPQMFLKFR-UHFFFAOYSA-N 0.000 description 2
- RIOQSEWOXXDEQQ-UHFFFAOYSA-N triphenylphosphine Chemical compound C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 RIOQSEWOXXDEQQ-UHFFFAOYSA-N 0.000 description 2
- 229920006337 unsaturated polyester resin Polymers 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- DTGKSKDOIYIVQL-WEDXCCLWSA-N (+)-borneol Chemical group C1C[C@@]2(C)[C@@H](O)C[C@@H]1C2(C)C DTGKSKDOIYIVQL-WEDXCCLWSA-N 0.000 description 1
- QGKMIGUHVLGJBR-UHFFFAOYSA-M (4z)-1-(3-methylbutyl)-4-[[1-(3-methylbutyl)quinolin-1-ium-4-yl]methylidene]quinoline;iodide Chemical compound [I-].C12=CC=CC=C2N(CCC(C)C)C=CC1=CC1=CC=[N+](CCC(C)C)C2=CC=CC=C12 QGKMIGUHVLGJBR-UHFFFAOYSA-M 0.000 description 1
- MSAHTMIQULFMRG-UHFFFAOYSA-N 1,2-diphenyl-2-propan-2-yloxyethanone Chemical compound C=1C=CC=CC=1C(OC(C)C)C(=O)C1=CC=CC=C1 MSAHTMIQULFMRG-UHFFFAOYSA-N 0.000 description 1
- GVXUSZBBDOXETR-UHFFFAOYSA-N 1,3-bis(2-isocyanatoethyl)benzene Chemical compound O=C=NCCC1=CC=CC(CCN=C=O)=C1 GVXUSZBBDOXETR-UHFFFAOYSA-N 0.000 description 1
- DKEGCUDAFWNSSO-UHFFFAOYSA-N 1,8-dibromooctane Chemical compound BrCCCCCCCCBr DKEGCUDAFWNSSO-UHFFFAOYSA-N 0.000 description 1
- BOCJQSFSGAZAPQ-UHFFFAOYSA-N 1-chloroanthracene-9,10-dione Chemical compound O=C1C2=CC=CC=C2C(=O)C2=C1C=CC=C2Cl BOCJQSFSGAZAPQ-UHFFFAOYSA-N 0.000 description 1
- 239000012956 1-hydroxycyclohexylphenyl-ketone Substances 0.000 description 1
- LFSYUSUFCBOHGU-UHFFFAOYSA-N 1-isocyanato-2-[(4-isocyanatophenyl)methyl]benzene Chemical compound C1=CC(N=C=O)=CC=C1CC1=CC=CC=C1N=C=O LFSYUSUFCBOHGU-UHFFFAOYSA-N 0.000 description 1
- HECLRDQVFMWTQS-RGOKHQFPSA-N 1755-01-7 Chemical compound C1[C@H]2[C@@H]3CC=C[C@@H]3[C@@H]1C=C2 HECLRDQVFMWTQS-RGOKHQFPSA-N 0.000 description 1
- GPYLCFQEKPUWLD-UHFFFAOYSA-N 1h-benzo[cd]indol-2-one Chemical compound C1=CC(C(=O)N2)=C3C2=CC=CC3=C1 GPYLCFQEKPUWLD-UHFFFAOYSA-N 0.000 description 1
- ZOMATQMEHRJKLO-UHFFFAOYSA-N 1h-imidazol-2-ylmethanol Chemical compound OCC1=NC=CN1 ZOMATQMEHRJKLO-UHFFFAOYSA-N 0.000 description 1
- AHDSRXYHVZECER-UHFFFAOYSA-N 2,4,6-tris[(dimethylamino)methyl]phenol Chemical compound CN(C)CC1=CC(CN(C)C)=C(O)C(CN(C)C)=C1 AHDSRXYHVZECER-UHFFFAOYSA-N 0.000 description 1
- BTJPUDCSZVCXFQ-UHFFFAOYSA-N 2,4-diethylthioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC(CC)=CC(CC)=C3SC2=C1 BTJPUDCSZVCXFQ-UHFFFAOYSA-N 0.000 description 1
- SMZOUWXMTYCWNB-UHFFFAOYSA-N 2-(2-methoxy-5-methylphenyl)ethanamine Chemical compound COC1=CC=C(C)C=C1CCN SMZOUWXMTYCWNB-UHFFFAOYSA-N 0.000 description 1
- KUBDPQJOLOUJRM-UHFFFAOYSA-N 2-(chloromethyl)oxirane;4-[2-(4-hydroxyphenyl)propan-2-yl]phenol Chemical compound ClCC1CO1.C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 KUBDPQJOLOUJRM-UHFFFAOYSA-N 0.000 description 1
- LAXBNTIAOJWAOP-UHFFFAOYSA-N 2-chlorobiphenyl Chemical compound ClC1=CC=CC=C1C1=CC=CC=C1 LAXBNTIAOJWAOP-UHFFFAOYSA-N 0.000 description 1
- KMNCBSZOIQAUFX-UHFFFAOYSA-N 2-ethoxy-1,2-diphenylethanone Chemical compound C=1C=CC=CC=1C(OCC)C(=O)C1=CC=CC=C1 KMNCBSZOIQAUFX-UHFFFAOYSA-N 0.000 description 1
- XMLYCEVDHLAQEL-UHFFFAOYSA-N 2-hydroxy-2-methyl-1-phenylpropan-1-one Chemical compound CC(C)(O)C(=O)C1=CC=CC=C1 XMLYCEVDHLAQEL-UHFFFAOYSA-N 0.000 description 1
- OMIGHNLMNHATMP-UHFFFAOYSA-N 2-hydroxyethyl prop-2-enoate Chemical compound OCCOC(=O)C=C OMIGHNLMNHATMP-UHFFFAOYSA-N 0.000 description 1
- BQZJOQXSCSZQPS-UHFFFAOYSA-N 2-methoxy-1,2-diphenylethanone Chemical compound C=1C=CC=CC=1C(OC)C(=O)C1=CC=CC=C1 BQZJOQXSCSZQPS-UHFFFAOYSA-N 0.000 description 1
- LXBGSDVWAMZHDD-UHFFFAOYSA-N 2-methyl-1h-imidazole Chemical compound CC1=NC=CN1 LXBGSDVWAMZHDD-UHFFFAOYSA-N 0.000 description 1
- LOUORYQQOPCXGD-UHFFFAOYSA-N 2-methylpropan-1-ol Chemical compound CC(C)CO.CC(C)CO LOUORYQQOPCXGD-UHFFFAOYSA-N 0.000 description 1
- ZCUJYXPAKHMBAZ-UHFFFAOYSA-N 2-phenyl-1h-imidazole Chemical compound C1=CNC(C=2C=CC=CC=2)=N1 ZCUJYXPAKHMBAZ-UHFFFAOYSA-N 0.000 description 1
- IKYAJDOSWUATPI-UHFFFAOYSA-N 3-[dimethoxy(methyl)silyl]propane-1-thiol Chemical compound CO[Si](C)(OC)CCCS IKYAJDOSWUATPI-UHFFFAOYSA-N 0.000 description 1
- BUZICZZQJDLXJN-UHFFFAOYSA-N 3-azaniumyl-4-hydroxybutanoate Chemical compound OCC(N)CC(O)=O BUZICZZQJDLXJN-UHFFFAOYSA-N 0.000 description 1
- LVNLBBGBASVLLI-UHFFFAOYSA-N 3-triethoxysilylpropylurea Chemical compound CCO[Si](OCC)(OCC)CCCNC(N)=O LVNLBBGBASVLLI-UHFFFAOYSA-N 0.000 description 1
- SJECZPVISLOESU-UHFFFAOYSA-N 3-trimethoxysilylpropan-1-amine Chemical compound CO[Si](OC)(OC)CCCN SJECZPVISLOESU-UHFFFAOYSA-N 0.000 description 1
- UUEWCQRISZBELL-UHFFFAOYSA-N 3-trimethoxysilylpropane-1-thiol Chemical compound CO[Si](OC)(OC)CCCS UUEWCQRISZBELL-UHFFFAOYSA-N 0.000 description 1
- XDLMVUHYZWKMMD-UHFFFAOYSA-N 3-trimethoxysilylpropyl 2-methylprop-2-enoate Chemical compound CO[Si](OC)(OC)CCCOC(=O)C(C)=C XDLMVUHYZWKMMD-UHFFFAOYSA-N 0.000 description 1
- UPMLOUAZCHDJJD-UHFFFAOYSA-N 4,4'-Diphenylmethane Diisocyanate Chemical compound C1=CC(N=C=O)=CC=C1CC1=CC=C(N=C=O)C=C1 UPMLOUAZCHDJJD-UHFFFAOYSA-N 0.000 description 1
- XURABDHWIADCPO-UHFFFAOYSA-N 4-prop-2-enylhepta-1,6-diene Chemical compound C=CCC(CC=C)CC=C XURABDHWIADCPO-UHFFFAOYSA-N 0.000 description 1
- FVCSARBUZVPSQF-UHFFFAOYSA-N 5-(2,4-dioxooxolan-3-yl)-7-methyl-3a,4,5,7a-tetrahydro-2-benzofuran-1,3-dione Chemical compound C1C(C(OC2=O)=O)C2C(C)=CC1C1C(=O)COC1=O FVCSARBUZVPSQF-UHFFFAOYSA-N 0.000 description 1
- TYOXIFXYEIILLY-UHFFFAOYSA-N 5-methyl-2-phenyl-1h-imidazole Chemical compound N1C(C)=CN=C1C1=CC=CC=C1 TYOXIFXYEIILLY-UHFFFAOYSA-N 0.000 description 1
- HRPVXLWXLXDGHG-UHFFFAOYSA-N Acrylamide Chemical group NC(=O)C=C HRPVXLWXLXDGHG-UHFFFAOYSA-N 0.000 description 1
- QGZKDVFQNNGYKY-UHFFFAOYSA-O Ammonium Chemical compound [NH4+] QGZKDVFQNNGYKY-UHFFFAOYSA-O 0.000 description 1
- 229910052582 BN Inorganic materials 0.000 description 1
- 239000005711 Benzoic acid Substances 0.000 description 1
- LCFVJGUPQDGYKZ-UHFFFAOYSA-N Bisphenol A diglycidyl ether Chemical compound C=1C=C(OCC2OC2)C=CC=1C(C)(C)C(C=C1)=CC=C1OCC1CO1 LCFVJGUPQDGYKZ-UHFFFAOYSA-N 0.000 description 1
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- LCGLNKUTAGEVQW-UHFFFAOYSA-N Dimethyl ether Chemical compound COC LCGLNKUTAGEVQW-UHFFFAOYSA-N 0.000 description 1
- SNRUBQQJIBEYMU-UHFFFAOYSA-N Dodecane Natural products CCCCCCCCCCCC SNRUBQQJIBEYMU-UHFFFAOYSA-N 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 235000000177 Indigofera tinctoria Nutrition 0.000 description 1
- 229920000877 Melamine resin Polymers 0.000 description 1
- CERQOIWHTDAKMF-UHFFFAOYSA-M Methacrylate Chemical compound CC(=C)C([O-])=O CERQOIWHTDAKMF-UHFFFAOYSA-M 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- CNCOEDDPFOAUMB-UHFFFAOYSA-N N-Methylolacrylamide Chemical compound OCNC(=O)C=C CNCOEDDPFOAUMB-UHFFFAOYSA-N 0.000 description 1
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 1
- UEEJHVSXFDXPFK-UHFFFAOYSA-N N-dimethylaminoethanol Chemical compound CN(C)CCO UEEJHVSXFDXPFK-UHFFFAOYSA-N 0.000 description 1
- 229930192627 Naphthoquinone Natural products 0.000 description 1
- GORXRFCHPRVABO-UHFFFAOYSA-N O(C)[SiH](OC)OC.C=C Chemical compound O(C)[SiH](OC)OC.C=C GORXRFCHPRVABO-UHFFFAOYSA-N 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- BPQQTUXANYXVAA-UHFFFAOYSA-N Orthosilicate Chemical compound [O-][Si]([O-])([O-])[O-] BPQQTUXANYXVAA-UHFFFAOYSA-N 0.000 description 1
- 239000005062 Polybutadiene Substances 0.000 description 1
- 239000002202 Polyethylene glycol Substances 0.000 description 1
- 239000004721 Polyphenylene oxide Substances 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- NRCMAYZCPIVABH-UHFFFAOYSA-N Quinacridone Chemical compound N1C2=CC=CC=C2C(=O)C2=C1C=C1C(=O)C3=CC=CC=C3NC1=C2 NRCMAYZCPIVABH-UHFFFAOYSA-N 0.000 description 1
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- GSEJCLTVZPLZKY-UHFFFAOYSA-N Triethanolamine Chemical compound OCCN(CCO)CCO GSEJCLTVZPLZKY-UHFFFAOYSA-N 0.000 description 1
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 1
- GUCYFKSBFREPBC-UHFFFAOYSA-N [phenyl-(2,4,6-trimethylbenzoyl)phosphoryl]-(2,4,6-trimethylphenyl)methanone Chemical compound CC1=CC(C)=CC(C)=C1C(=O)P(=O)(C=1C=CC=CC=1)C(=O)C1=C(C)C=C(C)C=C1C GUCYFKSBFREPBC-UHFFFAOYSA-N 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 150000008062 acetophenones Chemical class 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 229920000800 acrylic rubber Polymers 0.000 description 1
- 238000007259 addition reaction Methods 0.000 description 1
- 125000005907 alkyl ester group Chemical group 0.000 description 1
- 125000000217 alkyl group Chemical group 0.000 description 1
- 150000001408 amides Chemical class 0.000 description 1
- PYKYMHQGRFAEBM-UHFFFAOYSA-N anthraquinone Natural products CCC(=O)c1c(O)c2C(=O)C3C(C=CC=C3O)C(=O)c2cc1CC(=O)OC PYKYMHQGRFAEBM-UHFFFAOYSA-N 0.000 description 1
- 150000004056 anthraquinones Chemical class 0.000 description 1
- 125000003710 aryl alkyl group Chemical group 0.000 description 1
- FFBZKUHRIXKOSY-UHFFFAOYSA-N aziridine-1-carboxamide Chemical compound NC(=O)N1CC1 FFBZKUHRIXKOSY-UHFFFAOYSA-N 0.000 description 1
- 239000011324 bead Substances 0.000 description 1
- MYONAGGJKCJOBT-UHFFFAOYSA-N benzimidazol-2-one Chemical compound C1=CC=CC2=NC(=O)N=C21 MYONAGGJKCJOBT-UHFFFAOYSA-N 0.000 description 1
- 235000010233 benzoic acid Nutrition 0.000 description 1
- CSNNWDJQKGMZPO-UHFFFAOYSA-N benzoic acid;2-hydroxy-1,2-diphenylethanone Chemical compound OC(=O)C1=CC=CC=C1.C=1C=CC=CC=1C(O)C(=O)C1=CC=CC=C1 CSNNWDJQKGMZPO-UHFFFAOYSA-N 0.000 description 1
- RWCCWEUUXYIKHB-UHFFFAOYSA-N benzophenone Chemical compound C=1C=CC=CC=1C(=O)C1=CC=CC=C1 RWCCWEUUXYIKHB-UHFFFAOYSA-N 0.000 description 1
- 239000012965 benzophenone Substances 0.000 description 1
- 125000003236 benzoyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C(*)=O 0.000 description 1
- 125000001797 benzyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])* 0.000 description 1
- LKMCJXXOBRCATQ-UHFFFAOYSA-N benzylsulfanylbenzene Chemical compound C=1C=CC=CC=1CSC1=CC=CC=C1 LKMCJXXOBRCATQ-UHFFFAOYSA-N 0.000 description 1
- 230000033228 biological regulation Effects 0.000 description 1
- MQDJYUACMFCOFT-UHFFFAOYSA-N bis[2-(1-hydroxycyclohexyl)phenyl]methanone Chemical compound C=1C=CC=C(C(=O)C=2C(=CC=CC=2)C2(O)CCCCC2)C=1C1(O)CCCCC1 MQDJYUACMFCOFT-UHFFFAOYSA-N 0.000 description 1
- CQEYYJKEWSMYFG-UHFFFAOYSA-N butyl acrylate Chemical compound CCCCOC(=O)C=C CQEYYJKEWSMYFG-UHFFFAOYSA-N 0.000 description 1
- 229910000019 calcium carbonate Inorganic materials 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000004359 castor oil Substances 0.000 description 1
- 235000019438 castor oil Nutrition 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 238000012790 confirmation Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 150000004696 coordination complex Chemical class 0.000 description 1
- 229920001577 copolymer Polymers 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000001186 cumulative effect Effects 0.000 description 1
- MAWOHFOSAIXURX-UHFFFAOYSA-N cyclopentylcyclopentane Chemical group C1CCCC1C1CCCC1 MAWOHFOSAIXURX-UHFFFAOYSA-N 0.000 description 1
- 229960002887 deanol Drugs 0.000 description 1
- 125000002704 decyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- KORSJDCBLAPZEQ-UHFFFAOYSA-N dicyclohexylmethane-4,4'-diisocyanate Chemical compound C1CC(N=C=O)CCC1CC1CCC(N=C=O)CC1 KORSJDCBLAPZEQ-UHFFFAOYSA-N 0.000 description 1
- OTARVPUIYXHRRB-UHFFFAOYSA-N diethoxy-methyl-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CCO[Si](C)(OCC)CCCOCC1CO1 OTARVPUIYXHRRB-UHFFFAOYSA-N 0.000 description 1
- 125000004177 diethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 125000005594 diketone group Chemical group 0.000 description 1
- XXBDWLFCJWSEKW-UHFFFAOYSA-N dimethylbenzylamine Chemical compound CN(C)CC1=CC=CC=C1 XXBDWLFCJWSEKW-UHFFFAOYSA-N 0.000 description 1
- PPSZHCXTGRHULJ-UHFFFAOYSA-N dioxazine Chemical compound O1ON=CC=C1 PPSZHCXTGRHULJ-UHFFFAOYSA-N 0.000 description 1
- ZUOUZKKEUPVFJK-UHFFFAOYSA-N diphenyl Chemical class C1=CC=CC=C1C1=CC=CC=C1 ZUOUZKKEUPVFJK-UHFFFAOYSA-N 0.000 description 1
- GPAYUJZHTULNBE-UHFFFAOYSA-N diphenylphosphine Chemical compound C=1C=CC=CC=1PC1=CC=CC=C1 GPAYUJZHTULNBE-UHFFFAOYSA-N 0.000 description 1
- VFHVQBAGLAREND-UHFFFAOYSA-N diphenylphosphoryl-(2,4,6-trimethylphenyl)methanone Chemical class CC1=CC(C)=CC(C)=C1C(=O)P(=O)(C=1C=CC=CC=1)C1=CC=CC=C1 VFHVQBAGLAREND-UHFFFAOYSA-N 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 229920001971 elastomer Polymers 0.000 description 1
- FWDBOZPQNFPOLF-UHFFFAOYSA-N ethenyl(triethoxy)silane Chemical compound CCO[Si](OCC)(OCC)C=C FWDBOZPQNFPOLF-UHFFFAOYSA-N 0.000 description 1
- 150000002170 ethers Chemical class 0.000 description 1
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
- 125000000219 ethylidene group Chemical group [H]C(=[*])C([H])([H])[H] 0.000 description 1
- 230000005496 eutectics Effects 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 238000005247 gettering Methods 0.000 description 1
- 239000003365 glass fiber Substances 0.000 description 1
- ZEMPKEQAKRGZGQ-XOQCFJPHSA-N glycerol triricinoleate Natural products CCCCCC[C@@H](O)CC=CCCCCCCCC(=O)OC[C@@H](COC(=O)CCCCCCCC=CC[C@@H](O)CCCCCC)OC(=O)CCCCCCCC=CC[C@H](O)CCCCCC ZEMPKEQAKRGZGQ-XOQCFJPHSA-N 0.000 description 1
- VOZRXNHHFUQHIL-UHFFFAOYSA-N glycidyl methacrylate Chemical compound CC(=C)C(=O)OCC1CO1 VOZRXNHHFUQHIL-UHFFFAOYSA-N 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 125000003187 heptyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- XXMIOPMDWAUFGU-UHFFFAOYSA-N hexane-1,6-diol Chemical compound OCCCCCCO XXMIOPMDWAUFGU-UHFFFAOYSA-N 0.000 description 1
- 125000004051 hexyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 150000002483 hydrogen compounds Chemical class 0.000 description 1
- 125000004356 hydroxy functional group Chemical group O* 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 229940097275 indigo Drugs 0.000 description 1
- COHYTHOBJLSHDF-UHFFFAOYSA-N indigo powder Natural products N1C2=CC=CC=C2C(=O)C1=C1C(=O)C2=CC=CC=C2N1 COHYTHOBJLSHDF-UHFFFAOYSA-N 0.000 description 1
- 230000002401 inhibitory effect Effects 0.000 description 1
- 150000002484 inorganic compounds Chemical class 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 125000000959 isobutyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])* 0.000 description 1
- 150000002513 isocyanates Chemical class 0.000 description 1
- PXZQEOJJUGGUIB-UHFFFAOYSA-N isoindolin-1-one Chemical compound C1=CC=C2C(=O)NCC2=C1 PXZQEOJJUGGUIB-UHFFFAOYSA-N 0.000 description 1
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 150000002576 ketones Chemical class 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 238000003698 laser cutting Methods 0.000 description 1
- 238000007561 laser diffraction method Methods 0.000 description 1
- 239000004849 latent hardener Substances 0.000 description 1
- 239000000314 lubricant Substances 0.000 description 1
- 125000002960 margaryl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- JDSHMPZPIAZGSV-UHFFFAOYSA-N melamine Chemical compound NC1=NC(N)=NC(N)=N1 JDSHMPZPIAZGSV-UHFFFAOYSA-N 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- DZVCFNFOPIZQKX-LTHRDKTGSA-M merocyanine Chemical compound [Na+].O=C1N(CCCC)C(=O)N(CCCC)C(=O)C1=C\C=C\C=C/1N(CCCS([O-])(=O)=O)C2=CC=CC=C2O\1 DZVCFNFOPIZQKX-LTHRDKTGSA-M 0.000 description 1
- 239000000434 metal complex dye Substances 0.000 description 1
- FQPSGWSUVKBHSU-UHFFFAOYSA-N methacrylamide Chemical compound CC(=C)C(N)=O FQPSGWSUVKBHSU-UHFFFAOYSA-N 0.000 description 1
- AYLRODJJLADBOB-QMMMGPOBSA-N methyl (2s)-2,6-diisocyanatohexanoate Chemical compound COC(=O)[C@@H](N=C=O)CCCCN=C=O AYLRODJJLADBOB-QMMMGPOBSA-N 0.000 description 1
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 1
- BFXIKLCIZHOAAZ-UHFFFAOYSA-N methyltrimethoxysilane Chemical compound CO[Si](C)(OC)OC BFXIKLCIZHOAAZ-UHFFFAOYSA-N 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- PHQOGHDTIVQXHL-UHFFFAOYSA-N n'-(3-trimethoxysilylpropyl)ethane-1,2-diamine Chemical compound CO[Si](OC)(OC)CCCNCCN PHQOGHDTIVQXHL-UHFFFAOYSA-N 0.000 description 1
- YLBPOJLDZXHVRR-UHFFFAOYSA-N n'-[3-[diethoxy(methyl)silyl]propyl]ethane-1,2-diamine Chemical compound CCO[Si](C)(OCC)CCCNCCN YLBPOJLDZXHVRR-UHFFFAOYSA-N 0.000 description 1
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000004123 n-propyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- LKKPNUDVOYAOBB-UHFFFAOYSA-N naphthalocyanine Chemical compound N1C(N=C2C3=CC4=CC=CC=C4C=C3C(N=C3C4=CC5=CC=CC=C5C=C4C(=N4)N3)=N2)=C(C=C2C(C=CC=C2)=C2)C2=C1N=C1C2=CC3=CC=CC=C3C=C2C4=N1 LKKPNUDVOYAOBB-UHFFFAOYSA-N 0.000 description 1
- 150000004780 naphthols Chemical class 0.000 description 1
- 150000002791 naphthoquinones Chemical class 0.000 description 1
- SLCVBVWXLSEKPL-UHFFFAOYSA-N neopentyl glycol Chemical compound OCC(C)(C)CO SLCVBVWXLSEKPL-UHFFFAOYSA-N 0.000 description 1
- 150000002825 nitriles Chemical class 0.000 description 1
- IJGRMHOSHXDMSA-UHFFFAOYSA-N nitrogen Substances N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- 238000010943 off-gassing Methods 0.000 description 1
- 229920002601 oligoester Polymers 0.000 description 1
- 150000002894 organic compounds Chemical class 0.000 description 1
- 239000012766 organic filler Substances 0.000 description 1
- 125000000962 organic group Chemical group 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- AUONHKJOIZSQGR-UHFFFAOYSA-N oxophosphane Chemical compound P=O AUONHKJOIZSQGR-UHFFFAOYSA-N 0.000 description 1
- 125000002958 pentadecyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000001147 pentyl group Chemical group C(CCCC)* 0.000 description 1
- DGBWPZSGHAXYGK-UHFFFAOYSA-N perinone Chemical compound C12=NC3=CC=CC=C3N2C(=O)C2=CC=C3C4=C2C1=CC=C4C(=O)N1C2=CC=CC=C2N=C13 DGBWPZSGHAXYGK-UHFFFAOYSA-N 0.000 description 1
- 125000002080 perylenyl group Chemical group C1(=CC=C2C=CC=C3C4=CC=CC5=CC=CC(C1=C23)=C45)* 0.000 description 1
- CSHWQDPOILHKBI-UHFFFAOYSA-N peryrene Natural products C1=CC(C2=CC=CC=3C2=C2C=CC=3)=C3C2=CC=CC3=C1 CSHWQDPOILHKBI-UHFFFAOYSA-N 0.000 description 1
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 1
- 125000000843 phenylene group Chemical group C1(=C(C=CC=C1)*)* 0.000 description 1
- 239000003504 photosensitizing agent Substances 0.000 description 1
- IEQIEDJGQAUEQZ-UHFFFAOYSA-N phthalocyanine Chemical compound N1C(N=C2C3=CC=CC=C3C(N=C3C4=CC=CC=C4C(=N4)N3)=N2)=C(C=CC=C2)C2=C1N=C1C2=CC=CC=C2C4=N1 IEQIEDJGQAUEQZ-UHFFFAOYSA-N 0.000 description 1
- 239000000088 plastic resin Substances 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 229920002857 polybutadiene Polymers 0.000 description 1
- 229920001083 polybutene Polymers 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 238000006068 polycondensation reaction Methods 0.000 description 1
- 229920000570 polyether Polymers 0.000 description 1
- 229920001223 polyethylene glycol Polymers 0.000 description 1
- 229920000139 polyethylene terephthalate Polymers 0.000 description 1
- 239000005020 polyethylene terephthalate Substances 0.000 description 1
- 230000000379 polymerizing effect Effects 0.000 description 1
- 150000003077 polyols Chemical class 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 229920005749 polyurethane resin Polymers 0.000 description 1
- 229920001289 polyvinyl ether Polymers 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- WVIICGIFSIBFOG-UHFFFAOYSA-N pyrylium Chemical compound C1=CC=[O+]C=C1 WVIICGIFSIBFOG-UHFFFAOYSA-N 0.000 description 1
- IZMJMCDDWKSTTK-UHFFFAOYSA-N quinoline yellow Chemical compound C1=CC=CC2=NC(C3C(C4=CC=CC=C4C3=O)=O)=CC=C21 IZMJMCDDWKSTTK-UHFFFAOYSA-N 0.000 description 1
- 150000004053 quinones Chemical class 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000000376 reactant Substances 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 239000011342 resin composition Substances 0.000 description 1
- 239000005060 rubber Substances 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 238000000790 scattering method Methods 0.000 description 1
- 125000002914 sec-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 230000011218 segmentation Effects 0.000 description 1
- 238000005204 segregation Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000007962 solid dispersion Substances 0.000 description 1
- 238000003892 spreading Methods 0.000 description 1
- 230000007480 spreading Effects 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 125000001424 substituent group Chemical group 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
- 239000000454 talc Substances 0.000 description 1
- 229910052623 talc Inorganic materials 0.000 description 1
- 238000009864 tensile test Methods 0.000 description 1
- 229920001897 terpolymer Polymers 0.000 description 1
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 150000003512 tertiary amines Chemical class 0.000 description 1
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 1
- 150000003568 thioethers Chemical class 0.000 description 1
- JOUDBUYBGJYFFP-FOCLMDBBSA-N thioindigo Chemical compound S\1C2=CC=CC=C2C(=O)C/1=C1/C(=O)C2=CC=CC=C2S1 JOUDBUYBGJYFFP-FOCLMDBBSA-N 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- RUELTTOHQODFPA-UHFFFAOYSA-N toluene 2,6-diisocyanate Chemical compound CC1=C(N=C=O)C=CC=C1N=C=O RUELTTOHQODFPA-UHFFFAOYSA-N 0.000 description 1
- TUQOTMZNTHZOKS-UHFFFAOYSA-N tributylphosphine Chemical compound CCCCP(CCCC)CCCC TUQOTMZNTHZOKS-UHFFFAOYSA-N 0.000 description 1
- 125000002889 tridecyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- CPUDPFPXCZDNGI-UHFFFAOYSA-N triethoxy(methyl)silane Chemical compound CCO[Si](C)(OCC)OCC CPUDPFPXCZDNGI-UHFFFAOYSA-N 0.000 description 1
- VTHOKNTVYKTUPI-UHFFFAOYSA-N triethoxy-[3-(3-triethoxysilylpropyltetrasulfanyl)propyl]silane Chemical compound CCO[Si](OCC)(OCC)CCCSSSSCCC[Si](OCC)(OCC)OCC VTHOKNTVYKTUPI-UHFFFAOYSA-N 0.000 description 1
- JXUKBNICSRJFAP-UHFFFAOYSA-N triethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CCO[Si](OCC)(OCC)CCCOCC1CO1 JXUKBNICSRJFAP-UHFFFAOYSA-N 0.000 description 1
- DQZNLOXENNXVAD-UHFFFAOYSA-N trimethoxy-[2-(7-oxabicyclo[4.1.0]heptan-4-yl)ethyl]silane Chemical compound C1C(CC[Si](OC)(OC)OC)CCC2OC21 DQZNLOXENNXVAD-UHFFFAOYSA-N 0.000 description 1
- 238000001392 ultraviolet--visible--near infrared spectroscopy Methods 0.000 description 1
- 125000002948 undecyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J201/00—Adhesives based on unspecified macromolecular compounds
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J7/00—Adhesives in the form of films or foils
- C09J7/30—Adhesives in the form of films or foils characterised by the adhesive composition
- C09J7/35—Heat-activated
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
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- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2301/00—Additional features of adhesives in the form of films or foils
- C09J2301/40—Additional features of adhesives in the form of films or foils characterized by the presence of essential components
- C09J2301/416—Additional features of adhesives in the form of films or foils characterized by the presence of essential components use of irradiation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/11—Manufacturing methods
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- Organic Chemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Chemical & Material Sciences (AREA)
- Laminated Bodies (AREA)
- Dicing (AREA)
- Adhesive Tapes (AREA)
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Abstract
本實施形態的熱硬化性樹脂膜係藉由貼附於工件中之具有突狀電極之面並使之熱硬化而於前述面形成第1保護膜;熱硬化性樹脂膜含有具有環氧基之丙烯酸樹脂以外的2種以上之熱硬化性成分;熱硬化性樹脂膜中的全部種類的前述熱硬化性成分的合計含量相對於熱硬化性樹脂膜的總質量之比例為40質量%以上;針對熱硬化性樹脂膜所含有之前述熱硬化性成分,按照每一種類求出X值,當求出全部種類的前述熱硬化性成分中的X值的合計值時,前述合計值成為400g/eq以下。The thermosetting resin film of this embodiment is attached to the surface of the workpiece with the protruding electrode and heat-hardened to form a first protective film on the surface; the thermosetting resin film contains an epoxy group. Two or more thermosetting components other than acrylic resin; the total content of all types of the aforementioned thermosetting components in the thermosetting resin film relative to the total mass of the thermosetting resin film is 40 mass % or more; for The X value was calculated for each type of the thermosetting component contained in the thermosetting resin film. When the total value of the X value in all types of the thermosetting component was calculated, the total value was 400 g/eq. the following.
Description
本發明係關於一種熱硬化性樹脂膜以及第1保護膜形成用片。 本申請案基於2019年2月26日在日本提出申請之日本特願2019-032828號主張優先權,且將該申請案的內容援引至本文中。The present invention relates to a thermosetting resin film and a first protective film forming sheet. This application claims priority based on Japanese Patent Application No. 2019-032828 filed in Japan on February 26, 2019, and the contents of this application are incorporated into this article.
先前,於將MPU(Micro Processor Uint;微處理器單元)或閘極陣列等中所使用之多接腳之LSI(Large Scale Integration,大型積體電路)封裝體安裝於印刷配線基板之情形時,採用以下之覆晶安裝方法:使用具備突狀電極(例如,凸塊、支柱等)之工件(例如,半導體晶圓等),藉由所謂倒裝(face down)方式,使工件加工物(例如,作為半導體晶圓之分割物之半導體晶片等)中的突狀電極與基板上的相對應的端子部相對、接觸且熔融/擴散接合。Previously, when a multi-pin LSI (Large Scale Integration) package used in an MPU (Micro Processor Unit) or a gate array was mounted on a printed wiring board, The following flip-chip mounting method is adopted: using a workpiece (for example, a semiconductor wafer, etc.) equipped with protruding electrodes (for example, bumps, pillars, etc.), through the so-called face down method, the workpiece processing object (for example, , the protruding electrodes in the semiconductor wafer, etc., which are divided parts of the semiconductor wafer, face, contact, and are melted/diffusion bonded with the corresponding terminal portions on the substrate.
於採用該安裝方法之情形時,以保護工件的電路面及突狀電極為目的,有時將硬化性樹脂膜貼附於突狀電極的表面及工件的電路面,使該膜硬化,於這些面形成保護膜。 此外,本說明書中,有時將突狀電極的表面與工件或工件加工物的電路面統稱為「突狀電極形成面」。When this mounting method is used, in order to protect the circuit surface of the workpiece and the protruding electrode, a curable resin film is sometimes attached to the surface of the protruding electrode and the circuit surface of the workpiece to harden the film. Form a protective film on the surface. In addition, in this specification, the surface of the protruding electrode and the circuit surface of the workpiece or workpiece may be collectively referred to as the "protruding electrode forming surface".
硬化性樹脂膜通常以藉由加熱而軟化之狀態貼附於工件的突狀電極形成面。藉此,突狀電極之包含頭頂部之上部貫通硬化性樹脂膜,自硬化性樹脂膜突出。另一方面,硬化性樹脂膜係以覆蓋工件的突狀電極之方式,於突狀電極間展開,密接於電路面,並且覆蓋突狀電極的表面、尤其是電路面的附近部位的表面,且將突狀電極埋入。然後,硬化性樹脂膜進而藉由硬化而被覆工件的電路面及突狀電極的電路面的附近部位的表面,成為保護這些區域之保護膜。The curable resin film is usually attached to the protruding electrode forming surface of the workpiece in a state softened by heating. Thereby, the upper part of the protruding electrode including the top of the head penetrates the curable resin film and protrudes from the curable resin film. On the other hand, the curable resin film is spread between the protruding electrodes to cover the protruding electrodes of the workpiece, is in close contact with the circuit surface, and covers the surface of the protruding electrodes, especially the surface of the vicinity of the circuit surface, and Bury the protruding electrode. Then, the curable resin film is further cured to cover the surface of the circuit surface of the workpiece and the vicinity of the circuit surface of the protruding electrode, thereby becoming a protective film that protects these areas.
於使用半導體晶圓之情形時,該安裝方法中所使用之半導體晶片例如藉由下述方式獲得:將於電路面形成有突狀電極之半導體晶圓中之與前述電路面為相反側的面進行研削或切割而進行分割。 於獲得此種半導體晶片之過程中,通常以保護半導體晶圓的電路面及突狀電極為目的,將硬化性樹脂膜貼附於突狀電極形成面,使該膜硬化,於突狀電極形成面形成保護膜。 進而,半導體晶圓分割為半導體晶片,最終成為於突狀電極形成面具備保護膜之半導體晶片(本說明書中,有時稱為「附保護膜之半導體晶片」)(參照專利文獻1)。When a semiconductor wafer is used, the semiconductor wafer used in the mounting method is obtained, for example, by: forming a protruding electrode on a circuit surface on a surface opposite to the circuit surface. Divide by grinding or cutting. In the process of obtaining such a semiconductor wafer, usually for the purpose of protecting the circuit surface and protruding electrodes of the semiconductor wafer, a curable resin film is attached to the protruding electrode formation surface, and the film is hardened to form the protruding electrode. Form a protective film on the surface. Furthermore, the semiconductor wafer is divided into semiconductor wafers, and finally becomes a semiconductor wafer having a protective film on the protruding electrode formation surface (sometimes referred to as "semiconductor wafer with protective film" in this specification) (see Patent Document 1).
此種於突狀電極形成面具備保護膜之工件加工物(本說明書中,有時稱為「附保護膜之工件加工物」)進而搭載於基板上而成為封裝體,進而使用該封裝體,構成目標裝置。於附保護膜之半導體晶片搭載於基板上之情形時,使用藉此獲得之半導體封裝體,構成目標半導體裝置。 [先前技術文獻] [專利文獻]Such a workpiece having a protective film on the protruding electrode formation surface (sometimes referred to as a "protective film-attached workpiece" in this specification) is mounted on a substrate to form a package, and the package is used. Make up the target device. When a semiconductor chip with a protective film is mounted on a substrate, the semiconductor package thus obtained is used to construct a target semiconductor device. [Prior technical literature] [Patent Document]
[專利文獻1]日本專利第5515811號公報。[Patent Document 1] Japanese Patent No. 5515811.
[發明所欲解決之課題][Problem to be solved by the invention]
以專利文獻1中所揭示之保護膜為代表,於使用先前的硬化性樹脂膜之情形時,工件之分割(例如,將半導體晶圓分割為半導體晶片)通常藉由使用切割刀片之刀片切割進行。但是,該方法雖然最廣泛地普及,但例如不適於製造尺寸小之工件加工物或厚度薄之工件加工物。原因在於,此種工件加工物容易產生破裂或缺損。When using a conventional curable resin film, such as the protective film disclosed in Patent Document 1, the workpiece is usually divided (for example, a semiconductor wafer is divided into semiconductor chips) by cutting with a dicing blade. However, although this method is the most widely used, it is not suitable for manufacturing small-sized workpieces or thin workpieces. The reason is that such workpieces are prone to cracks or defects.
因此,本發明的目的在於提供一種樹脂膜,能夠形成用以保護工件或工件加工物的突狀電極形成面之保護膜,且藉由使用該樹脂膜,能夠應用用以分割工件之新穎的方法。尤其是,本發明的目的在於提供一種樹脂膜,當應用此種新穎的方法時,於貼附於突狀電極形成面時,在突狀電極的上部之殘留得到抑制,且於工件之分割時,能夠良好地切斷作為硬化物之保護膜。 [用以解決課題之手段]Therefore, an object of the present invention is to provide a resin film capable of forming a protective film for protecting a protruding electrode forming surface of a workpiece or a workpiece to be processed, and by using the resin film, a novel method for dividing the workpiece can be applied. . In particular, an object of the present invention is to provide a resin film that, when attached to a protruding electrode forming surface, is prevented from remaining on the upper portion of the protruding electrode when this novel method is applied, and that can be used when dividing workpieces. , can cut the protective film that is hardened material well. [Means used to solve problems]
本發明提供一種熱硬化性樹脂膜,係藉由貼附於工件中之具有突狀電極之面並使之熱硬化而於前述面形成第1保護膜;前述熱硬化性樹脂膜含有具有環氧基之丙烯酸樹脂以外的2種以上之熱硬化性成分;前述熱硬化性樹脂膜中的全部種類的前述熱硬化性成分的合計含量相對於前述熱硬化性樹脂膜的總質量之比例為40質量%以上,針對前述熱硬化性樹脂膜所含有之前述熱硬化性成分,按照每一種類,求出由下述式所算出之X值,當求出前述熱硬化性樹脂膜所含有之全部種類的前述熱硬化性成分中的前述X值的合計值時,前述合計值成為400g/eq以下。 X=[熱硬化性成分的熱硬化反應相關的官能基的當量(g/eq)]×[熱硬化性樹脂膜的熱硬化性成分的含量(質量份)]/[熱硬化性樹脂膜的全部種類的熱硬化性成分的合計含量(質量份)]。 另外,本發明提供一種第1保護膜形成用片,具備第1支撐片,且於前述第1支撐片的一面上具備前述熱硬化性樹脂膜。 [發明功效]The present invention provides a thermosetting resin film that is attached to a surface with a protruding electrode in a workpiece and heat-hardened to form a first protective film on the surface; the thermosetting resin film contains an epoxy resin film. Two or more thermosetting components other than acrylic resin; the ratio of the total content of all types of thermosetting components in the thermosetting resin film to the total mass of the thermosetting resin film is 40 mass % or more, for each type of the thermosetting component contained in the thermosetting resin film, the X value calculated by the following formula is calculated for each type. When all types of the thermosetting resin film are included When the total value of the X values in the thermosetting components is 400 g/eq or less. X = [equivalent of functional groups related to the thermosetting reaction of the thermosetting component (g/eq)] × [content of the thermosetting component of the thermosetting resin film (parts by mass)]/[of the thermosetting resin film Total content (parts by mass) of all types of thermosetting ingredients]. Moreover, this invention provides the sheet for 1st protective film formation which is provided with the 1st support sheet, and is provided with the said thermosetting resin film on one surface of the said 1st support sheet. [Invention effect]
根據本發明,提供一種樹脂膜,能夠形成用以保護工件或工件加工物的突狀電極形成面之保護膜,且藉由使用該樹脂膜,能夠應用用以分割工件之新穎的方法。尤其是,提供一種樹脂膜,當應用此種新穎的方法時,於貼附於突狀電極形成面時,在突狀電極的上部之殘留得到抑制,且於工件之分割時,能夠良好地切斷作為硬化物之保護膜。According to the present invention, a resin film is provided that can form a protective film for protecting a workpiece or a protruding electrode forming surface of a workpiece to be processed, and by using the resin film, a novel method for dividing the workpiece can be applied. In particular, the present invention provides a resin film that, when applied to this novel method, is prevented from remaining on the upper portion of the protruding electrode when it is attached to the protruding electrode forming surface, and can be cut well when dividing a workpiece. Break as a protective film for hardened objects.
◇熱硬化性樹脂膜、第1保護膜形成用片 本發明的一實施形態的熱硬化性樹脂膜係藉由下述方式而用於形成第1保護膜:將前述熱硬化性樹脂膜貼附於工件中之具有突狀電極之面(亦即突狀電極形成面)並使之熱硬化,藉此於前述面形成第1保護膜;前述熱硬化性樹脂膜含有具有環氧基之丙烯酸樹脂以外的2種以上之熱硬化性成分;前述熱硬化性樹脂膜中的全部種類的前述熱硬化性成分的合計含量相對於前述熱硬化性樹脂膜的總質量之比例為40質量%以上;針對前述熱硬化性樹脂膜所含有之前述熱硬化性成分,按照每一種類,求出由下述式所算出之X值,當求出前述熱硬化性樹脂膜所含有之全部種類的前述熱硬化性成分中的前述X值的合計值時,前述合計值成為400g/eq以下。 X=[熱硬化性成分的熱硬化反應相關的官能基的當量(g/eq)]×[熱硬化性樹脂膜的熱硬化性成分的含量(質量份)]/[熱硬化性樹脂膜的全部種類的熱硬化性成分的合計含量(質量份)]。◇Thermosetting resin film, first protective film forming sheet The thermosetting resin film according to one embodiment of the present invention is used to form the first protective film by attaching the thermosetting resin film to a surface of a workpiece having a protruding electrode (that is, a protruding electrode). electrode formation surface) and thermally hardens it, thereby forming a first protective film on the aforementioned surface; the aforementioned thermosetting resin film contains two or more thermosetting components other than an acrylic resin having an epoxy group; the aforementioned thermosetting The total content of all types of the thermosetting components in the thermosetting resin film is 40% by mass or more relative to the total mass of the thermosetting resin film; the thermosetting component contained in the thermosetting resin film is , for each type, the value of The value becomes 400g/eq or less. X = [equivalent of functional groups related to the thermosetting reaction of the thermosetting component (g/eq)] × [content of the thermosetting component of the thermosetting resin film (parts by mass)]/[of the thermosetting resin film Total content (parts by mass) of all types of thermosetting ingredients].
另外,本發明的一實施形態的第1保護膜形成用片具備第1支撐片,且於前述第1支撐片的一面上具備前述熱硬化性樹脂膜。前述第1保護膜形成用片中,前述「熱硬化性樹脂膜」有時亦稱為「熱硬化性樹脂層」。In addition, a first protective film forming sheet according to an embodiment of the present invention includes a first support sheet, and the thermosetting resin film is provided on one side of the first support sheet. In the first protective film-forming sheet, the “thermosetting resin film” may also be called a “thermosetting resin layer”.
本實施形態中,作為工件,例如可列舉半導體晶圓等。 作為工件加工物,例如可列舉作為半導體晶圓之分割物之半導體晶片等。 工件之加工例如包括分割。 作為突狀電極,例如可列舉凸塊、支柱等。突狀電極係設置於工件的連接墊部,由共晶焊料、高溫焊料、金或銅等所構成。In this embodiment, examples of the workpiece include a semiconductor wafer and the like. Examples of the workpiece include semiconductor wafers that are divided parts of a semiconductor wafer. The processing of workpieces includes, for example, segmentation. Examples of protruding electrodes include bumps, pillars, and the like. The protruding electrode is arranged on the connection pad of the workpiece and is composed of eutectic solder, high-temperature solder, gold or copper.
前述第1保護膜形成用片係經由該片的熱硬化性樹脂膜(熱硬化性樹脂層),貼附於工件的突狀電極形成面(亦即突狀電極的表面及工件的電路面)而使用。並且,貼附後的熱硬化性樹脂膜藉由加熱而流動性增大,突狀電極之包含頭頂部之上部貫通熱硬化性樹脂膜,自熱硬化性樹脂膜突出。進而,熱硬化性樹脂膜係以覆蓋突狀電極之方式,於突狀電極間展開,與前述電路面密接,並且覆蓋突狀電極的表面、尤其是前述電路面附近部位的表面,且將突狀電極埋入。該狀態的熱硬化性樹脂膜進而藉由加熱而硬化,最終形成第1保護膜,以第1保護膜密接於前述電路面及突狀電極之狀態進行保護。如此,藉由使用本實施形態的熱硬化性樹脂膜,從而以第1保護膜充分地保護工件的電路面、及突狀電極的前述電路面附近的部位、亦即基部。The first protective film forming sheet is attached to the protruding electrode forming surface of the workpiece (that is, the surface of the protruding electrode and the circuit surface of the workpiece) via the thermosetting resin film (thermosetting resin layer) of the sheet. And use. Furthermore, the fluidity of the attached thermosetting resin film increases by heating, and the protruding electrode including the upper part of the head penetrates the thermosetting resin film and protrudes from the thermosetting resin film. Furthermore, the thermosetting resin film is spread between the protruding electrodes to cover the protruding electrodes, is in close contact with the circuit surface, and covers the surface of the protruding electrodes, especially the surface near the circuit surface, and connects the protruding electrodes. shaped electrodes are embedded. The thermosetting resin film in this state is further cured by heating, and finally a first protective film is formed, and the first protective film is protected in a state of being in close contact with the circuit surface and the protruding electrode. In this way, by using the thermosetting resin film of this embodiment, the circuit surface of the workpiece and the base portion of the protruding electrode near the circuit surface can be fully protected with the first protective film.
對於貼附第1保護膜形成用片後的工件,例如視需要將與前述電路面為相反側的面進行研削後,移除第1支撐片,繼而進行藉由熱硬化性樹脂膜之加熱而埋入突狀電極及形成第1保護膜。進而,進行工件之分割(亦即單片化為工件加工物)及第1保護膜之切斷,使用藉此獲得之於突狀電極形成面具備切斷後之第1保護膜之工件加工物(本說明書中,有時稱為「附第1保護膜之工件加工物」),製造半導體裝置等目標基板裝置。關於這些步驟,將於後文詳細地進行說明。For the workpiece with the first protective film forming sheet attached, for example, if necessary, grind the surface opposite to the circuit surface, remove the first supporting sheet, and then heat the thermosetting resin film. The protruding electrode is embedded and a first protective film is formed. Furthermore, the workpiece is divided (that is, separated into individual pieces into workpieces) and the first protective film is cut, and the workpiece thus obtained having the cut first protective film on the protruding electrode formation surface is used ( In this specification (sometimes referred to as "the workpiece with a first protective film"), a target substrate device such as a semiconductor device is manufactured. These steps will be explained in detail later.
此外,本說明書中,只要無特別說明,則僅記載為「硬化性樹脂膜」時,意指「硬化前的硬化性樹脂膜」,僅記載為「硬化性樹脂層」時,意指「硬化前的硬化性樹脂層」。例如,所謂「熱硬化性樹脂膜」,意指「硬化前的熱硬化性樹脂膜」,所謂「第1保護膜」,意指熱硬化性樹脂膜之硬化物。In addition, in this specification, unless otherwise specified, when it is simply described as "curable resin film", it means "the curable resin film before curing", and when it is simply described as "curable resin layer", it means "hardened resin film". The hardening resin layer in front of it." For example, the term "thermosetting resin film" means "the thermosetting resin film before curing", and the term "first protective film" means the cured product of the thermosetting resin film.
本實施形態的熱硬化性樹脂膜適於應用與先前不同的方法作為將工件分割(換言之,單片化)為工件加工物之方法。此處,作為「與先前不同的方法」,例如可列舉以下之方法。 亦即對於突狀電極形成面具備由前述熱硬化性樹脂膜所形成之第1保護膜之工件,照射雷射光,藉此於工件的內部形成改質層。繼而,對形成該改質層後的工件施加力。更具體而言,本實施形態中,將工件沿相對於該工件的電路面呈平行的方向進行擴展。藉此,於前述改質層之部位分割前述工件。此時,亦對第1保護膜施加力、更具體而言將第1保護膜沿相對於該第1保護膜之對工件之貼附面呈平行的方向進行擴展,藉此同時第1保護膜亦被切斷。此時,第1保護膜係沿著工件之分割部位被切斷。藉由以上步驟,製造附第1保護膜之工件加工物;前述附第1保護膜之工件加工物係具備工件加工物、及形成於前述工件加工物的前述突狀電極形成面之切斷後之第1保護膜。於此種工件加工物之製造時,藉由第1保護膜為前述熱硬化性樹脂膜之硬化物,能夠將工件良好地分割為工件加工物。另外,第1保護膜本身亦藉由為前述熱硬化性樹脂膜之硬化物,而於工件之分割時,能夠沿著工件之分割部位容易地被切斷。The thermosetting resin film of this embodiment is suitable for applying a method different from the conventional method as a method of dividing (in other words, singulating) a workpiece into a workpiece to be processed. Here, as a "method different from the previous method", for example, the following method can be mentioned. That is, a workpiece having a first protective film formed of the thermosetting resin film on the protruding electrode formation surface is irradiated with laser light, thereby forming a modified layer inside the workpiece. Then, force is applied to the workpiece after the modified layer is formed. More specifically, in this embodiment, the workpiece is expanded in a direction parallel to the circuit surface of the workpiece. Thereby, the aforementioned workpiece is divided at the portion of the aforementioned modified layer. At this time, a force is also applied to the first protective film, and more specifically, the first protective film is expanded in a direction parallel to the surface of the first protective film attached to the workpiece, whereby the first protective film is simultaneously Also cut off. At this time, the first protective film is cut along the divided parts of the workpiece. Through the above steps, a workpiece processed with a first protective film is produced; the workpiece processed with the first protective film is obtained by cutting the workpiece processed and the protruding electrode forming surface formed on the workpiece processed. 1st protective film. When manufacturing such a workpiece, since the first protective film is a cured product of the thermosetting resin film, the workpiece can be divided into workpieces satisfactorily. In addition, since the first protective film itself is a cured product of the thermosetting resin film, when the workpiece is divided, it can be easily cut along the divided portion of the workpiece.
此種伴隨改質層之形成之工件之分割方法被稱為隱形切割(註冊商標),與藉由對工件照射雷射光,一邊將照射部位的工件削去,一邊將工件自該工件的表面逐漸切斷之雷射切割本質上完全不同。This method of dividing a workpiece with the formation of a modified layer is called stealth cutting (registered trademark). The workpiece is irradiated with laser light and the workpiece is cut away from the irradiated area while gradually cutting the workpiece from the surface of the workpiece. Laser cutting is completely different in nature.
[全部種類的熱硬化性成分的合計含量之比例] 前述熱硬化性樹脂膜中,規定上述之合計含量之比例之「熱硬化性成分」係藉由加熱而顯示硬化反應之成分。其中,具有環氧基之丙烯酸樹脂不包含於該熱硬化性成分。作為熱硬化性成分,例如可列舉後述之熱硬化性成分(B)。 作為熱硬化性成分(B),例如可列舉環氧系熱硬化性樹脂、聚醯亞胺樹脂、不飽和聚酯樹脂等。環氧系熱硬化性樹脂由環氧樹脂(B1)及熱硬化劑(B2)所構成,這些2種成分均成為上述之合計含量之比例之規定對象。 另一方面,作為不包含於熱硬化性成分之具有環氧基之丙烯酸樹脂,例如可列舉後述之聚合物成分(A)中的丙烯酸樹脂中具有環氧基之化合物。例如具有縮水甘油基之丙烯酸樹脂包含於具有環氧基之丙烯酸樹脂。[Ratio of the total content of all types of thermosetting components] In the thermosetting resin film, the "thermosetting component" whose total content ratio is specified is a component that exhibits a curing reaction by heating. However, the acrylic resin having an epoxy group is not included in the thermosetting component. Examples of the thermosetting component include the thermosetting component (B) described below. Examples of the thermosetting component (B) include epoxy thermosetting resin, polyimide resin, unsaturated polyester resin, and the like. The epoxy-based thermosetting resin is composed of an epoxy resin (B1) and a thermosetting agent (B2), and the ratio of the total content of these two components is subject to regulation. On the other hand, examples of the acrylic resin having an epoxy group that is not included in the thermosetting component include compounds having an epoxy group in the acrylic resin in the polymer component (A) described below. For example, acrylic resin having a glycidyl group is included in acrylic resin having an epoxy group.
前述熱硬化性樹脂膜所含有之前述熱硬化性成分為2種以上,這些的組合及比率可任意選擇。The thermosetting resin film contains two or more types of the thermosetting components, and the combination and ratio of these components can be selected arbitrarily.
前述熱硬化性樹脂膜中的全部種類的前述熱硬化性成分的合計含量相對於前述熱硬化性樹脂膜的總質量之比例([熱硬化性樹脂膜中的全部種類的熱硬化性成分的合計含量(質量份)]/[熱硬化性樹脂膜的總質量(質量份)]×100)如上所述為40質量%以上。此處,所謂全部種類的熱硬化性成分的合計含量(質量份),意指2種以上之全部種類的熱硬化性成分的合計含量(質量份)。The ratio of the total content of all types of thermosetting components in the thermosetting resin film to the total mass of the thermosetting resin film ([the total amount of all types of thermosetting components in the thermosetting resin film Content (mass parts)]/[total mass of the thermosetting resin film (mass parts)] × 100) is 40 mass % or more as described above. Here, the total content (parts by mass) of all types of thermosetting components means the total content (parts by mass) of two or more types of all types of thermosetting components.
藉由滿足此種前述合計含量之比例之條件,熱硬化性樹脂膜於貼附於工件的突狀電極形成面時,能夠抑制在突狀電極之包含頭頂部之上部之殘留,作為用以形成第1保護膜之樹脂膜,具有適當的特性。如此,於將熱硬化性樹脂膜貼附於突狀電極形成面時,在突狀電極的上部不會殘留熱硬化性樹脂膜,換言之,突狀電極的上部貫通所貼附之熱硬化性樹脂膜而突出,藉此最終獲得之工件加工物於覆晶安裝時,能夠藉由該突狀電極而與基板充分地電性連接。亦即若熱硬化性樹脂膜不能抑制在突狀電極的上部之殘留,則無法將工件加工物供於實用。By satisfying the above-mentioned ratio conditions of the total content, when the thermosetting resin film is attached to the protruding electrode formation surface of the workpiece, it is possible to suppress the residue on the upper portion of the protruding electrode including the top portion of the protruding electrode, thereby forming the thermosetting resin film. The resin film of the first protective film has appropriate characteristics. In this way, when the thermosetting resin film is attached to the protruding electrode formation surface, the thermosetting resin film does not remain on the upper part of the protruding electrode. In other words, the upper part of the protruding electrode penetrates the attached thermosetting resin. The film is protruded, so that the workpiece finally obtained can be fully electrically connected to the substrate through the protruding electrode during flip-chip mounting. That is, if the thermosetting resin film cannot be suppressed from remaining on the upper portion of the protruding electrode, the workpiece cannot be put into practical use.
就更顯著地獲得上述有利效果之方面而言,前述熱硬化性樹脂膜中的全部種類的前述熱硬化性成分的合計含量相對於前述熱硬化性樹脂膜的總質量之比例例如可為50質量%以上、60質量%以上、70質量%以上、及80質量%以上之任一種。In order to obtain the above advantageous effects more significantly, the ratio of the total content of all kinds of the thermosetting components in the thermosetting resin film to the total mass of the thermosetting resin film may be, for example, 50 mass. % or more, 60 mass% or more, 70 mass% or more, or 80 mass% or more.
前述合計含量之比例的上限值並無特別限定。例如,就熱硬化性樹脂膜的造膜性變得更良好之方面而言,前述合計含量之比例較佳為90質量%以下。The upper limit of the aforementioned total content ratio is not particularly limited. For example, in order to obtain better film-forming properties of the thermosetting resin film, the ratio of the total content is preferably 90 mass % or less.
前述合計含量之比例可適宜調節為將上述之下限值及上限值任意組合而設定之範圍內。例如,一實施形態中,前述合計含量之比例可為40質量%至90質量%、50質量%至90質量%、60質量%至90質量%、70質量%至90質量%、及80質量%至90質量%之任一種。The ratio of the aforementioned total content can be appropriately adjusted to fall within a range set by any combination of the above-mentioned lower limit values and upper limit values. For example, in one embodiment, the proportion of the aforementioned total content may be 40 mass% to 90 mass%, 50 mass% to 90 mass%, 60 mass% to 90 mass%, 70 mass% to 90 mass%, and 80 mass% to 90% by mass.
[X值的合計值] 前述X值係針對前述熱硬化性樹脂膜所含有之1種熱硬化性成分,藉由前述式而算出。 作為前述X值之算出對象之「熱硬化性成分」與前述熱硬化性樹脂膜中規定上述之合計含量之比例之「熱硬化性成分」相同。[Total value of X values] The aforementioned X value is calculated from the aforementioned formula for one thermosetting component contained in the aforementioned thermosetting resin film. The "thermosetting component" to be calculated as the value of X is the same as the "thermosetting component" that defines the ratio of the total content in the thermosetting resin film.
所謂用以算出X值之「熱硬化性成分的熱硬化反應相關的官能基」,例如於後述之環氧樹脂(B1)之情形時為環氧基,於後述之熱硬化劑(B2)之情形時為酚性羥基、醇性羥基、胺基、羧基、酸基經酐化而成之基等。其中,這些係前述官能基的一例。The so-called "functional group related to the thermosetting reaction of the thermosetting component" used to calculate the value of In this case, it is a phenolic hydroxyl group, an alcoholic hydroxyl group, an amine group, a carboxyl group, an acid group formed by anhydride, etc. Among these, these are examples of the aforementioned functional groups.
考慮前述熱硬化性樹脂膜含有p種(p為2以上之整數)之熱硬化性成分之情形。將這些熱硬化性成分按照每一種類設為M1 、Mp 。並且,將熱硬化性成分M1 的前述官能基的當量設為m1 (g/eq),將熱硬化性成分Mp 的前述官能基的當量設為mp (g/eq),將熱硬化性樹脂膜的熱硬化性成分M1 的含量設為C1 (質量份),將熱硬化性樹脂膜的熱硬化性成分Mp 的含量設為Cp (質量份)。 此時,關於熱硬化性成分M1 ,前述X值(以下,稱為「X1 值」)係藉由下述式而算出。Consider the case where the thermosetting resin film contains p types (p is an integer of 2 or more) of thermosetting components. Let these thermosetting components be M 1 and M p for each type. Furthermore, let the equivalent of the aforementioned functional group of the thermosetting component M 1 be m 1 (g/eq), let the equivalent of the aforementioned functional group of the thermosetting component M p be m p (g/eq), and let Let the content of the thermosetting component M 1 of the curable resin film be C 1 (mass parts), and let the content of the thermosetting component M p of the thermosetting resin film be C p (mass parts). At this time, regarding the thermosetting component M 1 , the aforementioned X value (hereinafter referred to as “X 1 value”) is calculated by the following formula.
[數1] [Number 1]
同樣地,關於熱硬化性成分Mp ,前述X值(以下,稱為「Xp 值」)亦藉由下述式而算出。Similarly, regarding the thermosetting component M p , the aforementioned X value (hereinafter referred to as "X p value") is also calculated by the following formula.
[數2] [Number 2]
並且,前述熱硬化性樹脂膜所含有之全部種類的熱硬化性成分(M1 、・・・、MP )中的前述X值(X1 、・・・、Xp)的合計值如下所述。Furthermore, the total value of the above-mentioned X value (X 1 , ..., Xp ) among all types of thermosetting components (M 1 , ... .
[數3] [Number 3]
當熱硬化性成分的官能基的當量(m1 、mp (g/eq))並未特定於固定值,而是以一定的數值範圍來特定之情形時,只要將由該數值範圍的下限值及上限值算出平均值採用作為官能基的當量即可。When the equivalent weight (m 1 , m p (g/eq)) of the functional group of the thermosetting component is not specified as a fixed value but is specified in a certain numerical range, the lower limit of the numerical range shall be used. The average value and the upper limit value can be calculated using the equivalent weight of the functional group.
前述熱硬化性樹脂膜中,前述X值的合計值為400g/eq以下。 藉由滿足此種前述X值的合計值的條件,作為前述熱硬化性樹脂膜之硬化物之第1保護膜能夠於工件之分割時容易地被切斷。結果,能夠以高效率製造工件加工物,前述工件加工物係於突狀電極形成面具備切斷後之第1保護膜。In the thermosetting resin film, the total value of the X values is 400 g/eq or less. By satisfying the condition of the total value of the aforementioned X values, the first protective film, which is a cured product of the thermosetting resin film, can be easily cut when the workpiece is divided. As a result, a workpiece having the cut first protective film on the protruding electrode formation surface can be manufactured with high efficiency.
就更顯著地獲得上述有利效果之方面而言,前述熱硬化性樹脂膜中,前述X值的合計值例如可為375g/eq以下、350g/eq以下、及325g/eq以下之任一種。In order to obtain the above advantageous effects more significantly, in the thermosetting resin film, the total value of the X values may be, for example, any one of 375 g/eq or less, 350 g/eq or less, and 325 g/eq or less.
前述X值的合計值的下限值並無特別限定。例如,前述熱硬化性樹脂膜中,就抑制因過度之交聯反應引起之柔軟性之降低之方面而言,前述X值的合計值較佳為100g/eq以上。The lower limit of the total value of the aforementioned X values is not particularly limited. For example, in the thermosetting resin film, in order to suppress reduction in flexibility due to excessive cross-linking reaction, the total value of the X values is preferably 100 g/eq or more.
前述X值的合計值可適宜調節為將上述之下限值及上限值任意組合而設定之範圍內。例如,一實施形態中,前述X值的合計值可為100g/eq至400g/eq、100g/eq至375g/eq、100g/eq至350g/eq、及100g/eq至325g/eq之任一種。The total value of the aforementioned X value can be appropriately adjusted to fall within a range set by any combination of the aforementioned lower limit value and upper limit value. For example, in one embodiment, the total value of the aforementioned .
[熱硬化性樹脂膜之光之透過率] 厚度為200μm之1層之前述熱硬化性樹脂膜對於波長1342nm之光之透過率較佳為50%以上。 另外,將厚度未達200μm之前述熱硬化性樹脂膜積層2層以上而構成之合計厚度為200μm之積層膜對於波長1342nm之光之透過率較佳為50%以上。[Light transmittance of thermosetting resin film] The transmittance of one layer of the thermosetting resin film having a thickness of 200 μm for light with a wavelength of 1342 nm is preferably 50% or more. In addition, the transmittance of a laminated film with a total thickness of 200 μm, which is composed of two or more layers of the thermosetting resin film having a thickness of less than 200 μm, is preferably 50% or more for light with a wavelength of 1342 nm.
作為分割工件而製作工件加工物之方法,應用上文所說明之伴隨在工件的內部形成改質層之方法之情形時,藉由將波長1342nm之雷射光照射至工件,能夠形成改質層。此時,雷射光可對工件自該工件的電路面側照射,亦可自該工件的內面側照射。其中,於對工件自該工件的電路面側照射雷射光之情形時,經由形成於電路面之第1保護膜,照射雷射光。 另一方面,熱硬化性樹脂膜與其硬化物(例如,第1保護膜)對於相同波長之光之透過率大致相同或完全相同。因此,於厚度為200μm之1層之熱硬化性樹脂膜對於波長1342nm之光之透過率為50%以上之情形時,該熱硬化性樹脂膜之硬化物對於波長1342nm之光之透過率亦成為50%以上。同樣地,於前述積層膜對於波長1342nm之光之透過率為50%以上之情形時,該熱硬化性樹脂膜之硬化物對於波長1342nm之光之透過率亦成為50%以上。亦即使用與滿足此種光之透過率之條件之熱硬化性樹脂膜為相同組成的熱硬化性樹脂膜所形成之第1保護膜使波長1342nm之雷射光良好地透過。因此,於電路面具備此種第1保護膜之工件適合作為用以自該工件的電路面側照射雷射光,於工件的內部形成改質層之工件。When the above-described method of forming a modified layer inside the workpiece is applied as a method of dividing the workpiece to produce a workpiece, the modified layer can be formed by irradiating the workpiece with laser light having a wavelength of 1342 nm. At this time, the laser light can be irradiated to the workpiece from the circuit surface side of the workpiece, or from the inner surface side of the workpiece. When the workpiece is irradiated with laser light from the circuit surface side of the workpiece, the laser light is irradiated through the first protective film formed on the circuit surface. On the other hand, the transmittance of the thermosetting resin film and its cured product (for example, the first protective film) with respect to light of the same wavelength is approximately the same or exactly the same. Therefore, when the transmittance of one layer of thermosetting resin film with a thickness of 200 μm to light of wavelength 1342 nm is 50% or more, the transmittance of the cured product of the thermosetting resin film to light of wavelength 1342 nm also becomes above 50. Similarly, when the transmittance of the aforementioned laminated film to light with a wavelength of 1342 nm is 50% or more, the cured product of the thermosetting resin film also has a transmittance of 50% or more with respect to light with a wavelength of 1342 nm. That is, the first protective film formed using a thermosetting resin film having the same composition as a thermosetting resin film that satisfies such light transmittance conditions allows the laser light with a wavelength of 1342 nm to pass through well. Therefore, a workpiece having such a first protective film on the circuit surface is suitable as a workpiece for irradiating laser light from the circuit surface side of the workpiece to form a modified layer inside the workpiece.
就上述效果變得更顯著之方面而言,厚度為200μm之1層之熱硬化性樹脂膜或合計厚度為200μm之積層膜對於波長1342nm之光之透過率例如可為60%以上、70%以上、80%以上及85%以上之任一種。In order to make the above effect more remarkable, the transmittance of a thermosetting resin film with a thickness of 200 μm as one layer or a laminated film with a total thickness of 200 μm for light with a wavelength of 1342 nm can be, for example, 60% or more or 70% or more. , any of above 80% and above 85%.
厚度為200μm之1層之熱硬化性樹脂膜或合計厚度為200μm之積層膜對於波長1342nm之光之透過率的上限值並無特別限定,越高越佳。例如,就熱硬化性樹脂膜之製造相對較容易之方面而言,前述光之透過率較佳為95%以下。There is no particular limit on the upper limit of the transmittance of light with a wavelength of 1342 nm for a thermosetting resin film with a thickness of 200 μm as one layer or a laminated film with a total thickness of 200 μm. The higher the value, the better. For example, in order to make the production of the thermosetting resin film relatively easy, the light transmittance is preferably 95% or less.
前述光之透過率可適宜調節為將上述之下限值及上限值任意組合而設定之範圍內。一實施形態中,前述光之透過率較佳為50%至95%,例如可為60%至95%、70%至95%、80%至95%、及85%至95%之任一種。The aforementioned light transmittance can be appropriately adjusted within a range set by any combination of the aforementioned lower limit value and upper limit value. In one embodiment, the light transmittance is preferably 50% to 95%, for example, it may be any one of 60% to 95%, 70% to 95%, 80% to 95%, and 85% to 95%.
若於厚度為200μm之1層之熱硬化性樹脂膜與合計厚度為200μm之前述積層膜中,若這些含有成分相同,則這些(1層之熱硬化性樹脂膜與積層膜)之光之透過率並不限定於光之波長為1342nm之情形而相互相同。If a thermosetting resin film of one layer with a thickness of 200 μm and the above-mentioned laminated film with a total thickness of 200 μm contain the same components, then the light transmission of these (the thermosetting resin film of one layer and the laminated film) will The rates are not limited to the case where the wavelength of light is 1342nm but are the same as each other.
構成前述積層膜之厚度未達200μm之熱硬化性樹脂膜的層數並無特別限定,較佳為2至6。若為此種層數,則能夠更容易地製作前述積層膜。The number of layers constituting the thermosetting resin film having a thickness of less than 200 μm in the laminated film is not particularly limited, but is preferably 2 to 6. With this number of layers, the laminated film can be produced more easily.
構成前述積層膜之厚度未達200μm之熱硬化性樹脂膜的厚度可全部相同,亦可全部不同,還可僅一部分相同。The thicknesses of the thermosetting resin films constituting the laminated film and having a thickness of less than 200 μm may all be the same, may all be different, or may be only partially the same.
本實施形態中,於作為前述光之透過率之特定對象之1層之前述熱硬化性樹脂膜或積層膜中,將厚度規定為200μm之原因在於,藉由使用此種厚度的熱硬化性樹脂膜或積層膜,能夠更高精度且容易地測定前述光之透過率。 本實施形態中,1層之熱硬化性樹脂膜及由2層以上之複數層所構成之熱硬化性樹脂膜的厚度均如後所述不限定於200μm。In this embodiment, the thickness is set to 200 μm in one layer of the thermosetting resin film or laminated film that is the specific target of the light transmittance because by using the thermosetting resin with such a thickness film or laminated film, the transmittance of the light can be measured more accurately and easily. In this embodiment, the thickness of the thermosetting resin film of one layer and the thermosetting resin film composed of two or more layers is not limited to 200 μm as will be described later.
前述光之透過率例如可藉由調節後述之著色劑(I)、填充材料(D)等熱硬化性樹脂膜的含有成分的種類及含量、以及熱硬化性樹脂膜的表面狀態等而進行調節。The light transmittance can be adjusted, for example, by adjusting the types and contents of components contained in the thermosetting resin film such as the colorant (I) and the filler (D) described later, and the surface state of the thermosetting resin film. .
[第1保護膜的斷裂強度] 大小為20mm×130mm且厚度為40μm之第1保護膜以下述方法所測定之斷裂強度較佳為55MPa以下。與前述斷裂強度為前述上限值以下之第1保護膜為相同組成的第1保護膜藉由後述之擴展所致之切斷更容易。 作為前述第1保護膜的斷裂強度,可採用如下最大應力:將第1保護膜中的夾具間距離設為80mm,將第1保護膜的拉伸速度設為200mm/min,藉由夾具將第1保護膜沿相對於該第1保護膜的表面呈平行的方向拉伸時所測定之最大應力。 作為最大應力之測定對象之第1保護膜可使用將熱硬化性樹脂膜於130℃加熱2小時使之熱硬化而獲得之膜。[Breaking strength of the first protective film] The breaking strength measured by the following method of the first protective film having a size of 20 mm×130 mm and a thickness of 40 μm is preferably 55 MPa or less. The first protective film having the same composition as the first protective film whose breaking strength is equal to or less than the upper limit value is more easily cut by expansion described below. As the breaking strength of the first protective film, the following maximum stress can be used: the distance between the clamps in the first protective film is set to 80mm, the stretching speed of the first protective film is set to 200mm/min, and the first protective film is stretched by the clamps. 1 The maximum stress measured when the protective film is stretched in a direction parallel to the surface of the first protective film. As the first protective film to be measured for the maximum stress, a film obtained by heating and thermosetting a thermosetting resin film at 130° C. for 2 hours can be used.
就上述效果變得更顯著之方面而言,第1保護膜的前述斷裂強度例如可為52.5MPa以下、50MPa以下、及47.5MPa以下之任一種。In order to make the above effect more remarkable, the breaking strength of the first protective film may be, for example, any one of 52.5 MPa or less, 50 MPa or less, and 47.5 MPa or less.
第1保護膜的前述斷裂強度的下限值並無特別限定。就第1保護膜的保護能力變得更高之方面而言,第1保護膜的前述斷裂強度較佳為0.1MPa以上。The lower limit of the breaking strength of the first protective film is not particularly limited. In order to increase the protective ability of the first protective film, the breaking strength of the first protective film is preferably 0.1 MPa or more.
第1保護膜的前述斷裂強度可適宜調節為將上述之下限值及上限值任意組合而設定之範圍內。一實施形態中,第1保護膜的前述斷裂強度較佳為0.1MPa至55MPa,例如可為0.1MPa至52.5MPa、0.1MPa至50MPa、及0.1MPa至47.5MPa之任一種。The aforementioned breaking strength of the first protective film can be appropriately adjusted to be within a range set by any combination of the aforementioned lower limit value and upper limit value. In one embodiment, the breaking strength of the first protective film is preferably 0.1MPa to 55MPa, for example, it can be any one of 0.1MPa to 52.5MPa, 0.1MPa to 50MPa, and 0.1MPa to 47.5MPa.
第1保護膜的前述斷裂強度例如可藉由調節後述之熱硬化性樹脂層形成用組成物的含有成分、尤其是聚合物成分(A)、偶合劑(E)、填充材料(D)等的種類及含量、以及第1保護膜的厚度(換言之,熱硬化性樹脂膜的厚度)等而進行調節。The breaking strength of the first protective film can be determined, for example, by adjusting the components contained in the thermosetting resin layer-forming composition described below, particularly the polymer component (A), the coupling agent (E), the filler (D), and the like. The type and content, as well as the thickness of the first protective film (in other words, the thickness of the thermosetting resin film), etc. are adjusted.
於電路面上具有突狀電極之工件及工件加工物中,有時與電路面為相反側的面(內面)會裸露。因此,有時於該內面形成含有有機材料之保護膜(本說明書中,為了與第1保護膜加以區分,有時稱為「第2保護膜」)。第2保護膜係用以防止於工件之分割或封裝之後,於工件加工物產生龜裂。此種內面具備第2保護膜之附第2保護膜之工件加工物最終組入至半導體裝置等目標基板裝置。 另一方面,對於第2保護膜,有時要求能夠以雷射來標記工件加工物相關的資訊,或者隱蔽工件加工物的內面之功能。作為滿足此種要求之第2保護膜,已知有能夠藉由硬化而形成第2保護膜且光之透過特性經調節之硬化性樹脂膜。 但是,由於用以保護工件加工物的內面之第2保護膜與用以保護工件加工物的突狀電極形成面之第1保護膜在工件加工物中的形成位置不同,故而所要求之特性亦相互不同。因此,通常難以將能夠形成第2保護膜之熱硬化性樹脂膜直接用於第1保護膜之形成用途。In workpieces and workpieces with protruding electrodes on the circuit surface, the surface (inner surface) opposite to the circuit surface may be exposed. Therefore, a protective film containing an organic material may be formed on the inner surface (in this specification, it may be called a "second protective film" to distinguish it from the first protective film). The second protective film is used to prevent cracks in the workpiece after the workpiece is divided or packaged. This second protective film-attached workpiece having a second protective film on its inner surface is finally incorporated into a target substrate device such as a semiconductor device. On the other hand, the second protective film may be required to have the function of marking information about the workpiece with a laser or concealing the inner surface of the workpiece. As a second protective film that satisfies such a requirement, a curable resin film in which a second protective film can be formed by curing and whose light transmission characteristics are adjusted is known. However, since the second protective film for protecting the inner surface of the workpiece and the first protective film for protecting the protruding electrode forming surface of the workpiece are formed at different positions in the workpiece, the required characteristics are different. Also different from each other. Therefore, it is generally difficult to directly use a thermosetting resin film capable of forming a second protective film for forming a first protective film.
圖1係以示意方式表示使用本實施形態的熱硬化性樹脂膜而於突狀電極形成面形成有第1保護膜之狀態的一例之剖視圖。此外,為了易於理解本發明的特徵,方便起見,以下之說明中所使用之圖有時將成為要部之部分放大表示,而並不限於各構成要素的尺寸比率等與實際相同。FIG. 1 is a cross-sectional view schematically showing an example of a state in which a first protective film is formed on a protruding electrode formation surface using the thermosetting resin film of this embodiment. In addition, in order to make it easy to understand the characteristics of the present invention and for convenience, the drawings used in the following description may show essential parts in an enlarged manner, and the dimensional ratio of each component is not necessarily the same as the actual one.
於此處所示之工件90的電路面90a設置有複數個突狀電極91。圖1中,符號90b表示工件90中之與電路面90a為相反側的面(內面)。 突狀電極91具有球的一部分被平面切除所得之形狀,成為相當於該切除而露出之部位之平面接觸於工件90的電路面90a之狀態。 突狀電極91的形狀為大致球狀。A plurality of protruding electrodes 91 are provided on the circuit surface 90a of the workpiece 90 shown here. In FIG. 1, symbol 90b represents the surface (inner surface) of the workpiece 90 opposite to the circuit surface 90a. The protruding electrode 91 has a shape in which a part of the ball is cut off in a plane, and the plane corresponding to the cut-out and exposed portion is in contact with the circuit surface 90 a of the workpiece 90 . The shape of the protruding electrode 91 is substantially spherical.
第1保護膜12'係使用本實施形態的熱硬化性樹脂膜而形成,被覆工件90的電路面90a,進而被覆突狀電極91的表面91a中除了突狀電極91的頭頂部910及其附近以外的區域。如此,第1保護膜12'密接於除了突狀電極91的頭頂部910及其附近以外的表面91a,並且亦密接於工件90的電路面90a,且將突狀電極91埋入。 突狀電極91之如上述之大致球狀之形狀尤其有利於使用前述硬化性樹脂膜來形成第1保護膜。The first protective film 12' is formed using the thermosetting resin film of this embodiment, and covers the circuit surface 90a of the workpiece 90, and further covers the surface 91a of the protruding electrode 91 except the top portion 910 of the protruding electrode 91 and its vicinity. outside areas. In this way, the first protective film 12' is in close contact with the surface 91a except the top portion 910 of the protruding electrode 91 and its vicinity, is also in close contact with the circuit surface 90a of the workpiece 90, and embeds the protruding electrode 91. The substantially spherical shape of the protruding electrode 91 as described above is particularly advantageous for forming the first protective film using the curable resin film.
突狀電極91的高度H91 並無特別限定,較佳為50μm至500μm。藉由突狀電極91的高度H91 為前述下限值以上,能夠進一步提高突狀電極91的功能。藉由突狀電極91的高度H91 為前述上限值以下,於將熱硬化性樹脂膜貼附於工件90的突狀電極形成面(亦即突狀電極91的表面91a及工件90的電路面90a)時,抑制熱硬化性樹脂膜殘留在突狀電極91之包含頭頂部910之上部效果變得更高,結果抑制第1保護膜12'在突狀電極91的上部形成之效果變得更高。 此外,本說明書中,所謂「突狀電極的高度」,意指突狀電極中存在於距離工件或工件加工物的電路面最高之位置之部位(亦即頭頂部)的高度。The height H 91 of the protruding electrode 91 is not particularly limited, but is preferably 50 μm to 500 μm. When the height H 91 of the protruding electrode 91 is equal to or higher than the aforementioned lower limit, the function of the protruding electrode 91 can be further improved. When the height H 91 of the protruding electrode 91 is equal to or less than the aforementioned upper limit, the thermosetting resin film is attached to the protruding electrode formation surface of the workpiece 90 (that is, the surface 91 a of the protruding electrode 91 and the circuit of the workpiece 90 surface 90a), the effect of suppressing the thermosetting resin film from remaining on the upper portion of the protruding electrode 91 including the top portion 910 becomes higher. As a result, the effect of suppressing the formation of the first protective film 12' on the upper portion of the protruding electrode 91 becomes higher. higher. In addition, in this specification, the "height of the protruding electrode" means the height of the protruding electrode at the highest position from the circuit surface of the workpiece or workpiece processing object (ie, the top of the head).
突狀電極91的寬度W91 並無特別限定,較佳為50μm至600μm。藉由突狀電極91的寬度W91 為前述下限值以上,能夠進一步提高突狀電極91的功能。藉由突狀電極91的寬度W91 為前述上限值以下,於將熱硬化性樹脂膜貼附於工件90的突狀電極形成面(亦即突狀電極91的表面91a及工件90的電路面90a)時,抑制熱硬化性樹脂膜殘留在突狀電極91之包含頭頂部910之上部效果變得更高,結果抑制第1保護膜12'在突狀電極91的上部形成之效果變得更高。 此外,本說明書中,所謂「突狀電極的寬度」,意指自相對於工件或工件加工物的電路面垂直的方向往下看而俯視突狀電極時,將突狀電極表面上的不同的2點間用直線連結而獲得之線段的最大值。The width W 91 of the protruding electrode 91 is not particularly limited, but is preferably 50 μm to 600 μm. When the width W 91 of the protruding electrode 91 is equal to or greater than the aforementioned lower limit, the function of the protruding electrode 91 can be further improved. When the width W 91 of the protruding electrode 91 is equal to or less than the aforementioned upper limit, the thermosetting resin film is attached to the protruding electrode formation surface of the workpiece 90 (that is, the surface 91 a of the protruding electrode 91 and the circuit of the workpiece 90 surface 90a), the effect of suppressing the thermosetting resin film from remaining on the upper portion of the protruding electrode 91 including the top portion 910 becomes higher. As a result, the effect of suppressing the formation of the first protective film 12' on the upper portion of the protruding electrode 91 becomes higher. higher. In addition, in this specification, the "width of the protruding electrode" means that when the protruding electrode is viewed from a direction perpendicular to the circuit surface of the workpiece or workpiece processing object, the different widths on the surface of the protruding electrode are The maximum value of a line segment obtained by connecting two points with a straight line.
相鄰的突狀電極91間的距離D91 並無特別限定,較佳為100μm至800μm。藉由突狀電極91間的距離D91 為前述下限值以上,於將熱硬化性樹脂膜貼附於工件90的突狀電極形成面(亦即突狀電極91的表面91a及工件90的電路面90a)時,抑制熱硬化性樹脂膜殘留在突狀電極91之包含頭頂部910之上部之效果變得更高,結果抑制第1保護膜12'在突狀電極91的上部形成之效果變得更高。藉由突狀電極91間的距離D91 為前述上限值以下,突狀電極91的配置形態的自由度變得更高。 此外,本說明書中,所謂「相鄰的突狀電極間的距離」,意指相鄰的突狀電極彼此的表面間的距離的最小值。The distance D 91 between adjacent protruding electrodes 91 is not particularly limited, but is preferably 100 μm to 800 μm. When the distance D 91 between the protruding electrodes 91 is equal to or greater than the aforementioned lower limit, the protruding electrode forming surface (that is, the surface 91 a of the protruding electrode 91 and the workpiece 90 ) is attached to the thermosetting resin film. When the circuit surface 90a) is used, the effect of suppressing the thermosetting resin film from remaining on the upper portion of the protruding electrode 91 including the top portion 910 of the protruding electrode 91 becomes higher. As a result, the effect of suppressing the formation of the first protective film 12' on the upper portion of the protruding electrode 91 becomes higher. get taller. When the distance D 91 between the protruding electrodes 91 is equal to or less than the upper limit, the degree of freedom in the arrangement of the protruding electrodes 91 becomes higher. In addition, in this specification, the "distance between adjacent protruding electrodes" means the minimum value of the distance between the surfaces of adjacent protruding electrodes.
工件90之除了突狀電極91以外之部位的厚度T90 根據工件90的使用目的適宜選擇即可,並無特別限定。 例如,將工件90的內面90b研削後的前述厚度T90 較佳為50μm至500μm。藉由將內面90b研削後的工件90的厚度T90 設為前述下限值以上,於工件90之分割(換言之,單片化為工件加工物)時,抑制工件加工物之破損之效果變得更高。藉由將內面90b研削後的工件90的厚度T90 為前述上限值以下,能獲得薄型的工件加工物。 將工件90的內面90b進行研削之前的前述厚度T90 較佳為250μm至1500μm。The thickness T 90 of the parts of the workpiece 90 other than the protruding electrode 91 can be appropriately selected according to the purpose of use of the workpiece 90 and is not particularly limited. For example, the thickness T 90 after grinding the inner surface 90b of the workpiece 90 is preferably 50 μm to 500 μm. By setting the thickness T 90 of the workpiece 90 after grinding the inner surface 90 b to the above-described lower limit value, the effect of suppressing damage to the workpiece 90 when the workpiece 90 is divided (in other words, singulated into pieces) becomes Got higher. By setting the thickness T 90 of the workpiece 90 after grinding the inner surface 90 b to less than the aforementioned upper limit, a thin workpiece can be obtained. The aforementioned thickness T 90 before grinding the inner surface 90b of the workpiece 90 is preferably 250 μm to 1500 μm.
作為本實施形態的熱硬化性樹脂膜之使用對象之工件並不限定於圖1所示之工件,亦可在無損本發明的效果之範圍內,變更、刪除或追加一部分構成。The workpiece to which the thermosetting resin film of the present embodiment is used is not limited to the workpiece shown in FIG. 1 , and part of the structure may be changed, deleted, or added within the scope that does not impair the effects of the present invention.
例如,圖1中,作為突狀電極,顯示了如上述之大致球狀之形狀(球的一部分被平面切除所得之形狀)的突狀電極,但將此種大致球狀之形狀沿高度方向(圖1中,相對於工件90的電路面90a正交的方向)拉長而成之形狀、亦即作為大致長球之橢球體之形狀(換言之,包含作為長球之橢球體的長軸方向的一端之部位被平面切除所得之形狀)的突狀電極、或者將如上述之大致球狀之形狀沿高度方向壓扁而成之形狀、亦即作為大致扁球之橢球體之形狀(換言之,包含作為扁球之橢球體的短軸方向的一端之部位被平面切除所得之形狀)的突狀電極亦作為較佳形狀的突狀電極而列舉。此種大致橢球體之形狀的突狀電極亦與上述之大致球狀的突狀電極同樣地,尤其有利於使用本實施形態的熱硬化性樹脂膜來形成第1保護膜。 作為突狀電極,除了這些形狀以外,例如亦可列舉:為圓柱狀、橢圓柱狀、角柱狀、橢圓錐狀、角錐狀、圓錐台狀、橢圓錐台狀或角錐台狀之突狀電極;具有將圓柱、橢圓柱、角柱、圓錐台、橢圓錐台或角錐台來與上述之大致球或大致橢球體組合而成之形狀之突狀電極。 此外,前文中所說明之突狀電極的形狀僅為應用本實施形態的熱硬化性樹脂膜時較佳的形狀的一例,本發明中,突狀電極的形狀並不限定於這些。 以下,對本發明的構成詳細地進行說明。For example, FIG. 1 shows a protruding electrode having a substantially spherical shape (a shape in which a part of a ball is cut off in a plane) as described above, but this substantially spherical shape is arranged along the height direction ( In FIG. 1 , the shape is elongated in a direction orthogonal to the circuit surface 90 a of the workpiece 90 ), that is, the shape of an ellipsoid that is a substantially prolate sphere (in other words, the shape including the long axis direction of the ellipsoid that is a prolate sphere). A protruding electrode in the shape of one end of which is cut off in a plane), or a shape in which the above-mentioned roughly spherical shape is flattened in the height direction, that is, in the shape of an ellipsoid that is a roughly oblate sphere (in other words, including A protruding electrode having a shape in which one end of an oblate ellipsoid in the minor axis direction is cut off in a plane) is also exemplified as a preferred shape of the protruding electrode. This kind of substantially ellipsoid-shaped protruding electrode is particularly advantageous for forming the first protective film using the thermosetting resin film of the present embodiment, similarly to the above-mentioned substantially spherical protruding electrode. In addition to these shapes, the protruding electrodes may include, for example, cylindrical, elliptical columnar, angular prism, elliptical cone, pyramid, truncated cone, elliptical truncated cone, or truncated cone shape; A protruding electrode having a shape formed by combining a cylinder, an elliptical cylinder, a corner prism, a truncated cone, an elliptical frustum or a pyramidal cone with the above-mentioned roughly sphere or roughly ellipsoid. In addition, the shape of the protruding electrode described above is only an example of a preferred shape when applying the thermosetting resin film of this embodiment. In the present invention, the shape of the protruding electrode is not limited to these. Hereinafter, the structure of this invention is demonstrated in detail.
◎第1支撐片 前述第1支撐片可由1層(單層)所構成,亦可由2層以上之複數層所構成。於支撐片由複數層所構成之情形時,這些複數層的構成材料及厚度相互可相同亦可不同,只要無損本發明的效果,則這些複數層的組合並無特別限定。 此外,本說明書中,並不限於第1支撐片之情形,所謂「複數層相互可相同亦可不同」,意指「可全部層相同,亦可全部層皆不同,還可僅一部分層相同」,進而所謂「複數層相互不同」,意指「各層的構成材料及厚度的至少一者相互不同」。◎1st support piece The first supporting sheet may be composed of one layer (single layer), or may be composed of two or more layers. When the support sheet is composed of a plurality of layers, the constituent materials and thicknesses of the plurality of layers may be the same or different from each other. As long as the effect of the present invention is not impaired, the combination of the plurality of layers is not particularly limited. In addition, in this specification, it is not limited to the case of the first support sheet. The phrase "the plurality of layers may be the same or different from each other" means "all the layers may be the same, all the layers may be different, or only some of the layers may be the same." , and further, "the plurality of layers are different from each other" means that "at least one of the constituent materials and thickness of each layer is different from each other."
作為較佳的第1支撐片,例如可列舉:具備第1基材、及設置於前述第1基材上之第1黏著劑層之片(換言之,第1基材及第1黏著劑層於這些層的厚度方向上積層而成之片);具備第1基材、設置於前述第1基材上之第1中間層、及設置於前述第1中間層上之第1黏著劑層之片(換言之,第1基材、第1中間層及第1黏著劑層依序於這些層的厚度方向上積層而成之片);僅由第1基材所構成之片等。As a preferred first support sheet, for example, a sheet including a first base material and a first adhesive layer provided on the first base material (in other words, the first base material and the first adhesive layer are A sheet formed by laminating these layers in the thickness direction); a sheet including a first base material, a first intermediate layer provided on the first base material, and a first adhesive layer provided on the first intermediate layer (In other words, a sheet in which the first base material, the first intermediate layer, and the first adhesive layer are sequentially laminated in the thickness direction of these layers); a sheet composed only of the first base material, etc.
以下,按照此種第1支撐片的每一種類,一邊參照圖式,一邊說明本實施形態的第1保護膜形成用片的示例。Hereinafter, examples of the first protective film forming sheet of this embodiment will be described for each type of such first supporting sheet with reference to the drawings.
圖2係以示意方式表示本實施形態的第1保護膜形成用片的一例之剖視圖。
此處所示之第1保護膜形成用片1使用第1基材及第1黏著劑層於這些層的厚度方向上積層而成之片作為第1支撐片。亦即第1保護膜形成用片1係具備第1基材11、設置於第1基材11的一面上之第1黏著劑層13、及設置於第1黏著劑層13中之與第1基材11側為相反側的面13a上之熱硬化性樹脂層(熱硬化性樹脂膜)12而構成。
第1支撐片101係第1基材11及第1黏著劑層13之積層體。並且,可謂第1保護膜形成用片1具備第1支撐片101、及設置於第1支撐片101的一面101a上(第1黏著劑層13的一面13a上)之熱硬化性樹脂層12。FIG. 2 is a cross-sectional view schematically showing an example of the first protective film forming sheet according to this embodiment.
The first protective film forming sheet 1 shown here uses a sheet in which a first base material and a first adhesive layer are laminated in the thickness direction of these layers as a first supporting sheet. That is, the first protective film forming sheet 1 is provided with the
第1保護膜形成用片1中的熱硬化性樹脂層12中,上述之熱硬化性成分的合計含量之比例為40質量%以上,上述之X值的合計值為400g/eq以下。In the
圖3係以示意方式表示本實施形態的第1保護膜形成用片的另一例之剖視圖。 此外,於圖3以後的圖中,對與既已說明之圖所示相同的構成要素,標附與該已說明之圖之情形相同的符號,並省略該構成要素之詳細說明。FIG. 3 is a cross-sectional view schematically showing another example of the first protective film forming sheet according to this embodiment. In addition, in the drawings after FIG. 3 , the same components as those shown in the previously described drawings are assigned the same reference numerals as in the previously described drawings, and detailed descriptions of the components are omitted.
此處所示之第1保護膜形成用片2使用第1基材、第1中間層及第1黏著劑層依序於這些層的厚度方向上積層而成之片作為第1支撐片。亦即第1保護膜形成用片2係具備第1基材11、設置於第1基材11的一面上之第1中間層14、設置於第1中間層14中之與第1基材11側為相反側的面上之第1黏著劑層13、及設置於第1黏著劑層13中之與第1中間層14側為相反側的面13a上之熱硬化性樹脂層(熱硬化性樹脂膜)12而構成。
第1支撐片102係第1基材11、第1中間層14及第1黏著劑層13之積層體。並且,可謂第1保護膜形成用片2具備第1支撐片102,且於第1支撐片102的一面102a上(第1黏著劑層13的一面13a上)具備熱硬化性樹脂層12。The first protective
換言之,第1保護膜形成用片2係於圖2所示之第1保護膜形成用片1中,在第1基材11與第1黏著劑層13之間,進而具備第1中間層14。In other words, the first protective
第1保護膜形成用片2中的熱硬化性樹脂層12中,上述之熱硬化性成分的合計含量之比例為40質量%以上,上述之X值的合計值為400g/eq以下。In the
圖4係以示意方式表示本實施形態的第1保護膜形成用片的又一例之剖視圖。
此處所示之第1保護膜形成用片3使用僅由第1基材所構成之片作為第1支撐片。亦即第1保護膜形成用片3係具備第1基材11、及設置於第1基材11上之熱硬化性樹脂層(熱硬化性樹脂膜)12而構成。
第1支撐片103僅由第1基材11所構成。並且,可謂第1保護膜形成用片3具備第1支撐片103,且於第1支撐片103的一面103a上(第1基材11的一面11a上)具備熱硬化性樹脂層12。FIG. 4 is a cross-sectional view schematically showing another example of the first protective film forming sheet according to this embodiment.
The first protective
換言之,第1保護膜形成用片3係於圖2所示之第1保護膜形成用片1中,省略了第1黏著劑層13。In other words, the first protective
第1保護膜形成用片3中的熱硬化性樹脂層12中,上述之熱硬化性成分的合計含量之比例為40質量%以上,上述之X值的合計值為400g/eq以下。In the
其次,對第1支撐片的構成進行說明。 本實施形態中,作為第1支撐片,可使用公知的第1支撐片,可根據目的適宜選擇第1支撐片。Next, the structure of the first support piece will be described. In this embodiment, a known first support piece can be used as the first support piece, and the first support piece can be appropriately selected according to the purpose.
○第1基材 前述第1基材為片狀或膜狀,作為前述第1基材的構成材料,例如可列舉各種樹脂。○First base material The first base material is in the form of a sheet or film, and examples of the constituent material of the first base material include various resins.
構成第1基材之樹脂可僅為1種,亦可為2種以上,於為2種以上之情形時,這些的組合及比率可任意選擇。The resin constituting the first base material may be only one type, or may be two or more types. In the case of two or more types, the combination and ratio of these can be selected arbitrarily.
第1基材可僅為1層(單層),亦可為2層以上之複數層,於為複數層之情形時,這些複數層相互可相同亦可不同,這些複數層的組合並無特別限定。The first base material can be only one layer (single layer), or it can be a plurality of two or more layers. In the case of a plurality of layers, these plural layers can be the same or different from each other. There is no special combination of these plural layers. limited.
第1基材的厚度較佳為50μm至200μm。 此處,所謂「第1基材的厚度」,意指第1基材整體的厚度,例如所謂由複數層所構成之第1基材的厚度,意指構成第1基材之全部層的合計厚度。The thickness of the first base material is preferably 50 μm to 200 μm. Here, the "thickness of the first base material" means the thickness of the entire first base material. For example, the thickness of the first base material composed of a plurality of layers means the total of all the layers constituting the first base material. thickness.
第1基材中,除了前述樹脂等主要構成材料以外,亦可含有填充材料、著色劑、抗靜電劑、抗氧化劑、有機潤滑劑、觸媒、軟化劑(塑化劑)等公知的各種添加劑。In addition to the main constituent materials such as the aforementioned resin, the first base material may also contain various well-known additives such as fillers, colorants, antistatic agents, antioxidants, organic lubricants, catalysts, softeners (plasticizers), etc. .
第1基材可為透明,亦可為不透明,還可根據目的而著色,還可被其他層所蒸鍍。 於後述之第1黏著劑層或熱硬化性樹脂層具有能量線硬化性之情形時,第1基材較佳為使能量線透過。The first base material may be transparent or opaque, may be colored according to the purpose, and may be evaporated with other layers. When the first adhesive layer or thermosetting resin layer described below has energy ray curability, it is preferable that the first base material transmits energy rays.
第1基材例如亦可為如後文實施例中所述之樹脂製膜的單面藉由聚矽氧處理等進行了剝離處理而成之剝離膜。The first base material may be, for example, a release film in which one side of a resin film is subjected to a release treatment such as polysiloxane treatment as described in the Examples below.
第1基材可以公知的方法進行製造。例如,含有樹脂之第1基材可藉由將含有前述樹脂之樹脂組成物進行成形而製造。The first base material can be produced by a known method. For example, the first base material containing the resin can be produced by molding a resin composition containing the aforementioned resin.
○第1黏著劑層 前述第1黏著劑層為片狀或膜狀,含有黏著劑。 作為前述黏著劑,例如可列舉:丙烯酸樹脂、胺基甲酸酯樹脂、橡膠系樹脂、聚矽氧樹脂、環氧系樹脂、聚乙烯醚、聚碳酸酯等黏著性樹脂,較佳為丙烯酸樹脂。○1st adhesive layer The aforementioned first adhesive layer is in the form of a sheet or film and contains an adhesive. Examples of the adhesive include acrylic resin, urethane resin, rubber resin, silicone resin, epoxy resin, polyvinyl ether, polycarbonate and other adhesive resins, and acrylic resin is preferred. .
此外,本發明中,「黏著性樹脂」的概念包括具有黏著性之樹脂及具有接著性之樹脂兩者,例如不僅包括樹脂本身具有黏著性之樹脂,亦包括藉由與添加劑等其他成分併用而顯示黏著性之樹脂、或藉由存在熱或水等觸發(trigger)而顯示接著性之樹脂等。In addition, in the present invention, the concept of "adhesive resin" includes both adhesive resins and adhesive resins. For example, it includes not only resins that have adhesive properties by themselves, but also resins that are used in combination with other ingredients such as additives. Resin that exhibits adhesiveness, or resin that exhibits adhesiveness due to the presence of a trigger such as heat or water.
第1黏著劑層可僅為1層(單層),亦可為2層以上之複數層,於為複數層之情形時,這些複數層相互可相同亦可不同,這些複數層的組合並無特別限定。The first adhesive layer may be only one layer (single layer), or may be a plurality of two or more layers. In the case of a plurality of layers, the plurality of layers may be the same or different from each other. The combination of these plurality of layers does not matter. Specially limited.
第1黏著劑層的厚度較佳為3μm至40μm。 此處,所謂「第1黏著劑層的厚度」,意指第1黏著劑層整體的厚度,例如所謂由複數層所構成之第1黏著劑層的厚度,意指構成第1黏著劑層之全部層的合計厚度。The thickness of the first adhesive layer is preferably 3 μm to 40 μm. Here, the "thickness of the first adhesive layer" means the thickness of the entire first adhesive layer. For example, the thickness of the first adhesive layer composed of a plurality of layers means the thickness of the first adhesive layer. The total thickness of all layers.
第1黏著劑層可使用能量線硬化性黏著劑而形成,亦可使用非能量線硬化性黏著劑而形成。使用能量線硬化性之黏著劑而形成之第1黏著劑層可容易地調節硬化前及硬化後的物性。 本說明書中,所謂「能量線」,意指具有能量量子之電磁波或帶電粒子束,作為該能量線的示例,可列舉紫外線、放射線、電子束等。 紫外線例如可藉由使用高壓水銀燈、熔合燈、氙氣燈、黑光燈或LED(Light Emitting Diode;發光二極體)燈等作為紫外線源進行照射。電子束可照射藉由電子束加速器等產生之電子束。 本發明中,所謂「能量線硬化性」,意指藉由照射能量線而硬化之性質,所謂「非能量線硬化性」,意指即便照射能量線亦不硬化之性質。The first adhesive layer may be formed using an energy ray curable adhesive or a non-energy ray curable adhesive. The first adhesive layer formed using an energy ray curable adhesive can easily adjust the physical properties before and after hardening. In this specification, "energy rays" mean electromagnetic waves or charged particle beams having energy quanta. Examples of the energy rays include ultraviolet rays, radiation, electron beams, and the like. Ultraviolet rays can be irradiated by using, for example, a high-pressure mercury lamp, a fusion lamp, a xenon lamp, a black light lamp, or an LED (Light Emitting Diode) lamp as an ultraviolet source. The electron beam can be irradiated with an electron beam generated by an electron beam accelerator or the like. In the present invention, "energy ray hardenability" means the property of being hardened by irradiation with energy rays, and "non-energy ray hardenability" means the property of not being hardened even if energy rays are irradiated.
[第1黏著劑組成物] 第1黏著劑層可使用含有黏著劑之第1黏著劑組成物而形成。例如,於第1黏著劑層之形成對象面塗敷第1黏著劑組成物,視需要使之乾燥,藉此能夠於目標部位形成第1黏著劑層。第1黏著劑層的更具體的形成方法將與其他層的形成方法一起於後文詳細地進行說明。[First adhesive composition] The first adhesive layer can be formed using a first adhesive composition containing an adhesive. For example, the first adhesive layer can be formed on the target site by applying the first adhesive composition to the surface to be formed of the first adhesive layer and drying it if necessary. A more specific method of forming the first adhesive layer will be described in detail later along with methods of forming other layers.
以公知的方法塗敷第1黏著劑組成物即可,例如可列舉使用以下各種塗佈機之方法:氣刀塗佈機、刮刀塗佈機、棒式塗佈機、凹版塗佈機、輥式塗佈機、輥刀塗佈機、簾幕式塗佈機、模具塗佈機、刀式塗佈機、網版塗佈機、Meyer棒式塗佈機、輕觸式塗佈機等。The first adhesive composition can be applied by a known method. For example, the following methods can be used: air knife coater, knife coater, rod coater, gravure coater, roller coater, etc. Type coater, roller knife coater, curtain coater, mold coater, knife coater, screen coater, Meyer rod coater, touch coater, etc.
第1黏著劑組成物的乾燥條件並無特別限定,於第1黏著劑組成物含有溶媒之情形時,較佳為進行加熱乾燥。含有溶媒之第1黏著劑組成物例如可於70℃至130℃且10秒至5分鐘之條件下進行乾燥。The drying conditions of the first adhesive composition are not particularly limited. When the first adhesive composition contains a solvent, it is preferable to perform heat drying. The first adhesive composition containing a solvent can be dried, for example, at 70°C to 130°C for 10 seconds to 5 minutes.
於第1黏著劑層為能量線硬化性之情形時,作為含有能量線硬化性黏著劑之第1黏著劑組成物、亦即能量線硬化性之第1黏著劑組成物,例如可列舉以下之第1黏著劑組成物等:第1黏著劑組成物(I-1),含有非能量線硬化性之黏著性樹脂(I-1a)(以下,有時簡稱為「黏著性樹脂(I-1a)」)及能量線硬化性化合物;第1黏著劑組成物(I-2),含有於前述黏著性樹脂(I-1a)的側鏈導入有不飽和基之能量線硬化性之黏著性樹脂(I-2a)(以下,有時簡稱為「黏著性樹脂(I-2a)」);第1黏著劑組成物(I-3),含有前述黏著性樹脂(I-2a)及能量線硬化性低分子化合物。When the first adhesive layer is energy ray curable, examples of the first adhesive composition containing the energy ray curable adhesive, that is, the energy ray curable first adhesive composition include the following. The first adhesive composition, etc.: The first adhesive composition (I-1) contains a non-energy ray curable adhesive resin (I-1a) (hereinafter, sometimes referred to as "adhesive resin (I-1a)"). )") and an energy ray curable compound; the first adhesive composition (I-2), which contains an energy ray curable adhesive resin in which an unsaturated group is introduced into the side chain of the aforementioned adhesive resin (I-1a) (I-2a) (hereinafter, sometimes referred to as "adhesive resin (I-2a)"); the first adhesive composition (I-3) contains the aforementioned adhesive resin (I-2a) and energy ray curing Sexual low molecular compounds.
[第1黏著劑組成物(I-1)至第1黏著劑組成物(I-3)以外的第1黏著劑組成物] 第1黏著劑組成物(I-1)、第1黏著劑組成物(I-2)或第1黏著劑組成物(I-3)的含有成分亦可同樣地用於這些3種第1黏著劑組成物以外的全部第1黏著劑組成物(本說明書中,稱為「第1黏著劑組成物(I-1)至第1黏著劑組成物(I-3)以外的第1黏著劑組成物」)。[First adhesive composition other than the first adhesive composition (I-1) to the first adhesive composition (I-3)] The components contained in the first adhesive composition (I-1), the first adhesive composition (I-2) or the first adhesive composition (I-3) can also be used for these three first adhesives in the same way. All first adhesive compositions other than the first adhesive composition (in this specification, referred to as the first adhesive composition except the first adhesive composition (I-1) to the first adhesive composition (I-3) "thing").
作為第1黏著劑組成物(I-1)至第1黏著劑組成物(I-3)以外的第1黏著劑組成物,除了能量線硬化性之黏著劑組成物以外,亦可列舉非能量線硬化性之黏著劑組成物。 作為非能量線硬化性之第1黏著劑組成物,例如可列舉含有前述黏著性樹脂(I-1a)之第1黏著劑組成物(I-4)。 第1黏著劑組成物(I-4)較佳為含有丙烯酸樹脂作為前述黏著性樹脂(I-1a),更佳為進而含有1種或2種以上之交聯劑。As the first adhesive composition other than the first adhesive composition (I-1) to the first adhesive composition (I-3), in addition to the energy ray curable adhesive composition, non-energy ray curable adhesive compositions may also be cited. Linear hardening adhesive composition. Examples of the non-energy ray curable first adhesive composition include the first adhesive composition (I-4) containing the aforementioned adhesive resin (I-1a). The first adhesive composition (I-4) preferably contains an acrylic resin as the adhesive resin (I-1a), and more preferably further contains one or more cross-linking agents.
[第1黏著劑組成物之製造方法] 第1黏著劑組成物(I-1)至第1黏著劑組成物(I-4)等前述第1黏著劑組成物係藉由調配前述黏著劑及視需要的前述黏著劑以外的成分等用以構成第1黏著劑組成物之各成分而獲得。 調配各成分時的添加順序並無特別限定,亦可同時添加2種以上之成分。 於使用溶媒之情形時,可藉由下述方式使用:將溶媒與溶媒以外的任一種調配成分混合而將該調配成分預先稀釋;或是不將溶媒以外的任一種調配成分預先稀釋而是將溶媒與這些調配成分混合。 調配時混合各成分之方法並無特別限定,自以下公知的方法中適宜選擇即可:使攪拌子或攪拌翼等旋轉而進行混合之方法;使用混合機進行混合之方法;施加超音波進行混合之方法等。 關於添加及混合各成分時的溫度及時間,只要不使各調配成分劣化,則並無特別限定,適宜調節即可,溫度較佳為15℃至30℃。[Production method of the first adhesive composition] The aforementioned first adhesive compositions such as the first adhesive composition (I-1) to the first adhesive composition (I-4) are prepared by blending the aforementioned adhesive and, if necessary, components other than the aforementioned adhesive. Obtained from each component constituting the first adhesive composition. The order in which each component is added is not particularly limited, and two or more components may be added at the same time. When using a solvent, it can be used in the following manner: mixing the solvent with any preparation ingredients other than the solvent and diluting the preparation ingredients in advance; or not diluting any preparation ingredients other than the solvent in advance but The solvent is mixed with these formulation ingredients. The method of mixing each component during preparation is not particularly limited, and can be appropriately selected from the following known methods: mixing by rotating a stirrer or stirring blade, mixing with a mixer, and mixing by applying ultrasonic waves. methods, etc. The temperature and time when adding and mixing each component are not particularly limited as long as the components are not deteriorated and can be adjusted appropriately. The temperature is preferably 15°C to 30°C.
○第1中間層 前述第1中間層為片狀或膜狀,前述第1中間層的構成材料根據目的適宜選擇即可,並無特別限定。 例如,目的在於抑制於設置於突狀電極形成面之第1保護膜反映存在於前述電路面上之突狀電極的形狀所導致第1保護膜發生變形之情形時,作為前述第1中間層的較佳的構成材料,就第1中間層的貼附性進一步提高之方面而言,可列舉(甲基)丙烯酸胺基甲酸酯等。○1st middle layer The first intermediate layer is in the form of a sheet or a film, and the material constituting the first intermediate layer is not particularly limited as long as it is appropriately selected according to the purpose. For example, the purpose is to prevent the first protective film provided on the protruding electrode formation surface from being deformed due to the shape of the protruding electrode existing on the circuit surface, which is the first intermediate layer. Preferable constituent materials include (meth)acrylic urethane and the like, in order to further improve the adhesion of the first intermediate layer.
第1中間層可僅為1層(單層),亦可為2層以上之複數層,於為複數層之情形時,這些複數層相互可相同亦可不同,這些複數層的組合並無特別限定。The first intermediate layer can be only one layer (single layer), or it can be a plurality of two or more layers. In the case of a plurality of layers, these plural layers can be the same or different from each other. There is no special combination of these plural layers. limited.
第1中間層的厚度可根據成為保護對象之工件或工件加工物的表面所存在之突狀電極的高度而適宜調節。例如,就亦能夠容易地吸收高度相對高之突狀電極之影響之方面而言,第1中間層的厚度較佳為50μm至600μm。 此處,所謂「第1中間層的厚度」,意指第1中間層整體的厚度,例如所謂由複數層所構成之第1中間層的厚度,意指構成第1中間層之全部層的合計厚度。The thickness of the first intermediate layer can be appropriately adjusted according to the height of the protruding electrode present on the surface of the workpiece to be protected or the workpiece processed object. For example, the thickness of the first intermediate layer is preferably 50 μm to 600 μm in order to easily absorb the influence of a relatively high-height protruding electrode. Here, the "thickness of the first intermediate layer" means the thickness of the entire first intermediate layer. For example, the thickness of the first intermediate layer composed of a plurality of layers means the total of all the layers constituting the first intermediate layer. thickness.
[第1中間層形成用組成物] 第1中間層可使用含有該第1中間層的構成材料之第1中間層形成用組成物而形成。例如,於第1中間層之形成對象面塗敷第1中間層形成用組成物,視需要使之乾燥或藉由照射能量線而使之硬化,藉此能夠於目標部位形成第1中間層。第1中間層的更具體的形成方法將與其他層的形成方法一起於後文詳細地進行說明。[First intermediate layer forming composition] The first intermediate layer can be formed using a first intermediate layer-forming composition containing a constituent material of the first intermediate layer. For example, the first intermediate layer can be formed at the target site by applying the first intermediate layer forming composition on the surface to be formed of the first intermediate layer, drying it or hardening it by irradiating energy rays if necessary. A more specific method of forming the first intermediate layer will be described in detail later along with methods of forming other layers.
第1中間層形成用組成物例如可以與第1黏著劑組成物之情形相同的方法進行塗敷。The first intermediate layer forming composition can be applied, for example, in the same manner as the first adhesive composition.
第1中間層形成用組成物的乾燥條件並無特別限定,例如可與第1黏著劑組成物的乾燥條件相同。 於第1中間層形成用組成物具有能量線硬化性之情形時,亦可於乾燥後,進而藉由照射能量線而使之硬化。The drying conditions of the first intermediate layer forming composition are not particularly limited, and may be the same as the drying conditions of the first adhesive composition, for example. When the first intermediate layer forming composition has energy ray curability, it may be further cured by irradiating energy rays after drying.
[第1中間層形成用組成物之製造方法] 第1中間層形成用組成物例如除了調配成分不同之方面以外,可以與前述第1黏著劑組成物之情形相同的方法進行製造。[Method for manufacturing the first intermediate layer forming composition] The first intermediate layer forming composition can be produced in the same manner as the above-mentioned first adhesive composition except that the ingredients are different.
◎熱硬化性樹脂膜(熱硬化性樹脂層) 前述熱硬化性樹脂膜(熱硬化性樹脂層)係用以將工件及工件加工物的電路面、以及設置於該電路面上之突狀電極進行保護之膜(層)。 前述熱硬化性樹脂膜藉由熱硬化而形成第1保護膜。◎Thermosetting resin film (thermosetting resin layer) The thermosetting resin film (thermosetting resin layer) is a film (layer) used to protect the circuit surface of the workpiece and the workpiece processed object, and the protruding electrodes provided on the circuit surface. The thermosetting resin film is thermally cured to form a first protective film.
此外,本說明書中,即便於熱硬化性樹脂膜硬化後(換言之,形成第1保護膜後),只要維持第1支撐片及熱硬化性樹脂膜之硬化物(換言之,第1支撐片及第1保護膜)之積層結構,則亦將該積層結構體稱為「第1保護膜形成用片」。In addition, in this specification, even after the thermosetting resin film is cured (in other words, after the first protective film is formed), as long as the cured product of the first supporting sheet and the thermosetting resin film is maintained (in other words, the first supporting sheet and the first protective film are formed). 1 protective film), the laminated structure is also called "the first protective film forming sheet".
前述熱硬化性樹脂膜除了熱硬化性之特性以外,亦可具有或不具有能量線硬化性之特性。 其中,於熱硬化性樹脂膜具有能量線硬化性之特性之情形時,對於由熱硬化性樹脂膜形成第1保護膜而言,熱硬化性樹脂膜之熱硬化之貢獻大於能量線硬化之貢獻。In addition to thermosetting properties, the thermosetting resin film may or may not have energy ray curing properties. Among them, when the thermosetting resin film has the property of energy ray curability, the contribution of thermal curing of the thermosetting resin film to the formation of the first protective film from the thermosetting resin film is greater than the contribution of energy ray curing. .
前述熱硬化性樹脂膜無論有無能量線硬化性,均可由1層(單層)所構成,亦可由2層以上之複數層所構成。於熱硬化性樹脂膜由複數層所構成之情形時,這些複數層相互可相同亦可不同,這些複數層的組合並無特別限定。The thermosetting resin film may be composed of one layer (single layer) or a plurality of two or more layers, regardless of whether it has energy ray curability or not. When the thermosetting resin film is composed of a plurality of layers, the plurality of layers may be the same or different from each other, and the combination of the plurality of layers is not particularly limited.
熱硬化性樹脂膜的厚度無論有無能量線硬化性,均較佳為1μm至100μm,更佳為3μm至80μm,尤佳為5μm至60μm。藉由熱硬化性樹脂膜的厚度為前述下限值以上,能夠形成保護能力更高之第1保護膜。藉由熱硬化性樹脂膜的厚度為前述上限值以下,於將熱硬化性樹脂膜貼附於工件的突狀電極形成面時,抑制熱硬化性樹脂膜殘留在突狀電極的上部之效果變得更高。進而,藉由熱硬化性樹脂膜的厚度為前述上限值以下,於工件之分割時,能夠更良好地切斷第1保護膜。 此處,所謂「熱硬化性樹脂膜的厚度」,意指熱硬化性樹脂膜整體的厚度,例如所謂由複數層所構成之熱硬化性樹脂膜的厚度,意指構成熱硬化性樹脂膜之全部層的合計厚度。The thickness of the thermosetting resin film, regardless of whether it has energy ray curability or not, is preferably 1 μm to 100 μm, more preferably 3 μm to 80 μm, and particularly preferably 5 μm to 60 μm. When the thickness of the thermosetting resin film is equal to or greater than the aforementioned lower limit, a first protective film with higher protective capability can be formed. When the thickness of the thermosetting resin film is equal to or less than the aforementioned upper limit, when the thermosetting resin film is attached to the protruding electrode formation surface of the workpiece, the effect of suppressing the thermosetting resin film from remaining on the upper portion of the protruding electrode is suppressed. get taller. Furthermore, when the thickness of the thermosetting resin film is equal to or less than the aforementioned upper limit, the first protective film can be cut more favorably when the workpiece is divided. Here, the "thickness of the thermosetting resin film" means the thickness of the entire thermosetting resin film. For example, the thickness of the thermosetting resin film composed of a plurality of layers means the thickness of the thermosetting resin film constituting the thermosetting resin film. The total thickness of all layers.
[熱硬化性樹脂層形成用組成物] 熱硬化性樹脂膜可使用含有該熱硬化性樹脂膜的構成材料之熱硬化性樹脂層形成用組成物而形成。例如,熱硬化性樹脂膜可藉由於該熱硬化性樹脂膜之形成對象面塗敷熱硬化性樹脂層形成用組成物,並視需要使之乾燥而形成。熱硬化性樹脂層形成用組成物中的常溫下不會氣化的成分彼此的含量的比率通常與熱硬化性樹脂膜中的前述成分彼此的含量的比率相同。[Thermosetting resin layer forming composition] The thermosetting resin film can be formed using a thermosetting resin layer-forming composition containing a constituent material of the thermosetting resin film. For example, a thermosetting resin film can be formed by applying a thermosetting resin layer-forming composition to a surface to be formed of the thermosetting resin film and drying it if necessary. The ratio of the contents of components that do not vaporize at room temperature in the composition for forming a thermosetting resin layer is generally the same as the ratio of the contents of the above-mentioned components in the thermosetting resin film.
以公知的方法塗敷熱硬化性樹脂層形成用組成物即可,例如可列舉使用以下各種塗佈機之方法:氣刀塗佈機、刮刀塗佈機、棒式塗佈機、凹版塗佈機、輥式塗佈機、輥刀塗佈機、簾幕式塗佈機、模具塗佈機、刀式塗佈機、網版塗佈機、Meyer棒式塗佈機、輕觸式塗佈機等。The thermosetting resin layer-forming composition may be applied by a known method. For example, methods using the following various coaters: air knife coater, blade coater, rod coater, gravure coater Machine, roller coater, roller knife coater, curtain coater, mold coater, knife coater, screen coater, Meyer rod coater, light touch coating Machine etc.
關於熱硬化性樹脂層形成用組成物的乾燥條件,無論熱硬化性樹脂膜有無能量線硬化性,均無特別限定。其中,於熱硬化性樹脂層形成用組成物含有後述溶媒之情形時,較佳為進行加熱乾燥。含有溶媒之熱硬化性樹脂層形成用組成物例如亦可於70℃至130℃且10秒至5分鐘之條件下進行乾燥。其中,熱硬化性樹脂層形成用組成物較佳為以該組成物本身、及由該組成物所形成之熱硬化性樹脂膜不會熱硬化之方式來進行加熱乾燥。The drying conditions of the thermosetting resin layer-forming composition are not particularly limited regardless of whether the thermosetting resin film has energy ray curability or not. Among them, when the composition for forming a thermosetting resin layer contains a solvent described below, it is preferable to perform heating and drying. The composition for forming a thermosetting resin layer containing a solvent may be dried, for example, at 70°C to 130°C for 10 seconds to 5 minutes. Among them, the composition for forming a thermosetting resin layer is preferably heated and dried so that the composition itself and the thermosetting resin film formed from the composition are not thermally cured.
關於使熱硬化性樹脂膜熱硬化而形成第1保護膜時的硬化條件,只要第1保護膜成為充分地發揮該第1保護膜的功能之程度的硬化度,則並無特別限定,根據熱硬化性樹脂膜的種類適宜選擇即可。 例如,熱硬化性樹脂膜之熱硬化時的加熱溫度較佳為100℃至200℃,更佳為110℃至180℃,尤佳為120℃至170℃。並且,前述熱硬化時的加熱時間較佳為0.5小時至5小時,更佳為0.5小時至4小時,尤佳為1小時至3小時。The curing conditions when thermally curing the thermosetting resin film to form the first protective film are not particularly limited as long as the first protective film has a degree of curing that fully exhibits the function of the first protective film. The type of curable resin film may be appropriately selected. For example, the heating temperature during thermal curing of the thermosetting resin film is preferably 100°C to 200°C, more preferably 110°C to 180°C, and particularly preferably 120°C to 170°C. Furthermore, the heating time during the thermal hardening is preferably 0.5 to 5 hours, more preferably 0.5 to 4 hours, even more preferably 1 to 3 hours.
作為較佳的熱硬化性樹脂膜,例如可列舉含有聚合物成分(A)及熱硬化性成分(B)之膜。聚合物成分(A)係被視為聚合性化合物進行聚合反應而形成之成分。另外,熱硬化性成分(B)係可將熱作為反應之觸發而進行硬化(聚合)反應之成分。此外,本說明書中,聚合反應中亦包含縮聚反應。Preferable thermosetting resin films include, for example, films containing a polymer component (A) and a thermosetting component (B). The polymer component (A) is a component formed by polymerization reaction as a polymerizable compound. In addition, the thermosetting component (B) is a component that can perform a curing (polymerization) reaction using heat as a trigger for the reaction. In addition, in this specification, a polycondensation reaction is also included in a polymerization reaction.
[熱硬化性樹脂層形成用組成物(III-1)] 作為較佳的熱硬化性樹脂層形成用組成物,例如可列舉含有前述聚合物成分(A)及熱硬化性成分(B)之熱硬化性樹脂層形成用組成物(III-1)(本說明書中,有時僅簡稱為「組成物(III-1)」)等。[Thermosetting resin layer forming composition (III-1)] As a preferred thermosetting resin layer-forming composition, for example, the thermosetting resin layer-forming composition (III-1) containing the aforementioned polymer component (A) and thermosetting component (B) (this In the specification, it may be simply referred to as "composition (III-1)"), etc.
[聚合物成分(A)] 聚合物成分(A)係用以對熱硬化性樹脂膜賦予造膜性及可撓性等之聚合物化合物。聚合物成分(A)具有熱塑性,且不具有熱硬化性。 組成物(III-1)及熱硬化性樹脂膜所含有之聚合物成分(A)可僅為1種,亦可為2種以上,於為2種以上之情形時,這些的組合及比率可任意選擇。[Polymer component (A)] The polymer component (A) is a polymer compound for imparting film-forming properties, flexibility, etc. to the thermosetting resin film. The polymer component (A) has thermoplasticity and does not have thermosetting properties. The polymer component (A) contained in the composition (III-1) and the thermosetting resin film may be only one type, or may be two or more types. In the case of two or more types, the combination and ratio of these may be Take your pick.
作為聚合物成分(A),例如可列舉:丙烯酸樹脂、胺基甲酸酯樹脂、苯氧基樹脂、聚矽氧樹脂、飽和聚酯樹脂等。 這些之中,聚合物成分(A)較佳為聚乙烯醇縮醛或丙烯酸樹脂。Examples of the polymer component (A) include acrylic resin, urethane resin, phenoxy resin, silicone resin, saturated polyester resin, and the like. Among these, the polymer component (A) is preferably polyvinyl acetal or acrylic resin.
作為聚合物成分(A)中的前述聚乙烯醇縮醛,可列舉公知的聚乙烯醇縮醛。 其中,作為較佳的聚乙烯醇縮醛,例如可列舉聚乙烯醇縮甲醛、聚乙烯醇縮丁醛等,更佳為聚乙烯醇縮丁醛。 作為聚乙烯醇縮丁醛,可列舉具有下述式(i)-1、式(i)-2及式(i)-3所表示之構成單元之聚乙烯醇縮丁醛。Examples of the polyvinyl acetal in the polymer component (A) include known polyvinyl acetals. Among these, preferred polyvinyl acetals include polyvinyl formal, polyvinyl butyral, and the like, and polyvinyl butyral is more preferred. Examples of polyvinyl butyral include polyvinyl butyral having structural units represented by the following formula (i)-1, formula (i)-2, and formula (i)-3.
[化1] (式中,l、m及n分別獨立地為1以上之整數)[Chemical 1] (In the formula, l, m and n are each independently an integer above 1)
聚乙烯醇縮醛的重量平均分子量(Mw)較佳為5000至200000,更佳為8000至100000。藉由聚乙烯醇縮醛的重量平均分子量為此種範圍,於將熱硬化性樹脂膜貼附於前述突狀電極形成面時,抑制熱硬化性樹脂膜殘留在突狀電極的上部之效果變得更高。The weight average molecular weight (Mw) of the polyvinyl acetal is preferably 5,000 to 200,000, more preferably 8,000 to 100,000. By having the weight average molecular weight of the polyvinyl acetal in this range, when the thermosetting resin film is attached to the protruding electrode forming surface, the effect of preventing the thermosetting resin film from remaining on the upper portion of the protruding electrode is changed. Got higher.
聚乙烯醇縮醛的玻璃轉移溫度(Tg)較佳為40℃至80℃,更佳為50℃至70℃。藉由聚乙烯醇縮醛的Tg為此種範圍,於將熱硬化性樹脂膜貼附於前述突狀電極形成面時,抑制熱硬化性樹脂膜殘留在突狀電極的上部之效果變得更高。The glass transition temperature (Tg) of polyvinyl acetal is preferably 40°C to 80°C, more preferably 50°C to 70°C. When the Tg of the polyvinyl acetal is in this range, when the thermosetting resin film is attached to the protruding electrode forming surface, the effect of suppressing the thermosetting resin film from remaining on the upper portion of the protruding electrode becomes even greater. high.
構成聚乙烯醇縮醛之3種以上之單體之比率可任意選擇。The ratio of three or more monomers constituting polyvinyl acetal can be selected arbitrarily.
聚合物成分(A)中的丙烯酸樹脂意指具有由(甲基)丙烯酸或其衍生物所衍生之構成單元之樹脂。 此外,本說明書中,「(甲基)丙烯酸」的概念包括「丙烯酸」及「甲基丙烯酸」兩者。關於與(甲基)丙烯酸類似的用語亦相同,例如「(甲基)丙烯醯基」的概念包括「丙烯醯基」及「甲基丙烯醯基」兩者,「(甲基)丙烯酸酯」的概念包括「丙烯酸酯」及「甲基丙烯酸酯」兩者。 另外,本說明書中,某特定之化合物之「衍生物」意指具有該化合物的1個以上之氫原子由氫原子以外的基(取代基)取代而成之結構之化合物。例如,(甲基)丙烯酸酯為(甲基)丙烯酸之衍生物。The acrylic resin in the polymer component (A) means a resin having a structural unit derived from (meth)acrylic acid or a derivative thereof. In addition, in this specification, the concept of "(meth)acrylic acid" includes both "acrylic acid" and "methacrylic acid". The same applies to terms similar to (meth)acrylic acid. For example, the concept of "(meth)acrylyl" includes both "acrylyl" and "methacrylyl", and "(meth)acrylate" The concept includes both "acrylate" and "methacrylate". In addition, in this specification, a "derivative" of a specific compound means a compound having a structure in which one or more hydrogen atoms of the compound are substituted with groups (substituents) other than hydrogen atoms. For example, (meth)acrylates are derivatives of (meth)acrylic acid.
作為聚合物成分(A)中的前述丙烯酸樹脂,可列舉公知的丙烯酸系聚合物。 丙烯酸樹脂的重量平均分子量(Mw)較佳為10000至2000000,更佳為100000至1500000。藉由丙烯酸樹脂的重量平均分子量為前述下限值以上,熱硬化性樹脂膜的形狀穩定性(保管時的經時穩定性)提高。藉由丙烯酸樹脂的重量平均分子量為前述上限值以下,熱硬化性樹脂膜變得易於追隨於被接著體的凹凸面,從而能進一步抑制於被接著體與熱硬化性樹脂膜之間產生空隙等。 此外,本說明書中,所謂「重量平均分子量」,只要無特別說明,則係指藉由凝膠滲透層析(GPC;Gel Permeation Chromatography)法所測定之聚苯乙烯換算值。Examples of the acrylic resin in the polymer component (A) include known acrylic polymers. The weight average molecular weight (Mw) of the acrylic resin is preferably 10,000 to 2,000,000, more preferably 100,000 to 1,500,000. When the weight average molecular weight of the acrylic resin is equal to or higher than the aforementioned lower limit, the shape stability of the thermosetting resin film (stability over time during storage) is improved. When the weight average molecular weight of the acrylic resin is equal to or less than the upper limit, the thermosetting resin film can easily follow the uneven surface of the adherend, thereby further suppressing the generation of gaps between the adherend and the thermosetting resin film. wait. In addition, in this specification, the "weight average molecular weight" refers to the polystyrene-converted value measured by gel permeation chromatography (GPC; Gel Permeation Chromatography) unless otherwise specified.
丙烯酸樹脂的玻璃轉移溫度(Tg)較佳為-60℃至70℃,更佳為-30℃至50℃。藉由丙烯酸樹脂的Tg為前述下限值以上,例如熱硬化性樹脂膜之硬化物與支撐片之接著力得到抑制,支撐片的剝離性適度提高。藉由丙烯酸樹脂的Tg為前述上限值以下,熱硬化性樹脂膜及其硬化物與被接著體之接著力提高。The glass transition temperature (Tg) of the acrylic resin is preferably -60°C to 70°C, more preferably -30°C to 50°C. When the Tg of the acrylic resin is equal to or higher than the aforementioned lower limit, for example, the bonding force between the cured product of the thermosetting resin film and the support sheet is suppressed, and the peelability of the support sheet is moderately improved. When the Tg of the acrylic resin is equal to or less than the aforementioned upper limit, the adhesive force between the thermosetting resin film and its cured product and the adherend is improved.
作為丙烯酸樹脂,例如可列舉:1種或2種以上之(甲基)丙烯酸酯之聚合物;選自(甲基)丙烯酸、衣康酸、乙酸乙烯酯、丙烯腈、苯乙烯及N-羥甲基丙烯醯胺等中的2種以上之單體之共聚物等。Examples of the acrylic resin include polymers of one or more (meth)acrylic acid esters selected from the group consisting of (meth)acrylic acid, itaconic acid, vinyl acetate, acrylonitrile, styrene, and N-hydroxy. Copolymers of two or more monomers such as methacrylamide, etc.
作為構成丙烯酸樹脂之前述(甲基)丙烯酸酯,例如可列舉:(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸正丙酯、(甲基)丙烯酸異丙酯、(甲基)丙烯酸正丁酯、(甲基)丙烯酸異丁酯、(甲基)丙烯酸第二丁酯、(甲基)丙烯酸第三丁酯、(甲基)丙烯酸戊酯、(甲基)丙烯酸己酯、(甲基)丙烯酸庚酯、(甲基)丙烯酸2-乙基己酯、(甲基)丙烯酸異辛酯、(甲基)丙烯酸正辛酯、(甲基)丙烯酸正壬酯、(甲基)丙烯酸異壬酯、(甲基)丙烯酸癸酯、(甲基)丙烯酸十一烷基酯、(甲基)丙烯酸十二烷基酯((甲基)丙烯酸月桂酯)、(甲基)丙烯酸十三烷基酯、(甲基)丙烯酸十四烷基酯((甲基)丙烯酸肉豆蔻酯)、(甲基)丙烯酸十五烷基酯、(甲基)丙烯酸十六烷基酯((甲基)丙烯酸棕櫚酯)、(甲基)丙烯酸十七烷基酯、(甲基)丙烯酸十八烷基酯((甲基)丙烯酸硬脂酯)等構成烷基酯之烷基為碳數為1至18之鏈狀結構之(甲基)丙烯酸烷基酯;(甲基)丙烯酸異冰片酯、(甲基)丙烯酸二環戊酯等(甲基)丙烯酸環烷基酯;(甲基)丙烯酸苄酯等(甲基)丙烯酸芳烷基酯;(甲基)丙烯酸二環戊烯酯等(甲基)丙烯酸環烯酯;(甲基)丙烯酸二環戊烯氧基乙酯等(甲基)丙烯酸環烯氧基烷基酯;(甲基)丙烯醯亞胺;(甲基)丙烯酸縮水甘油酯等含縮水甘油基之(甲基)丙烯酸酯;(甲基)丙烯酸羥基甲酯、(甲基)丙烯酸2-羥基乙酯、(甲基)丙烯酸2-羥基丙酯、(甲基)丙烯酸3-羥基丙酯、(甲基)丙烯酸2-羥基丁酯、(甲基)丙烯酸3-羥基丁酯、(甲基)丙烯酸4-羥基丁酯等含羥基之(甲基)丙烯酸酯;(甲基)丙烯酸N-甲基胺基乙酯等含取代胺基之(甲基)丙烯酸酯等。此處,所謂「取代胺基」,意指胺基的1個或2個氫原子由氫原子以外的基取代而成之基。Examples of the (meth)acrylates constituting the acrylic resin include methyl (meth)acrylate, ethyl (meth)acrylate, n-propyl (meth)acrylate, isopropyl (meth)acrylate, n-butyl (meth)acrylate, isobutyl (meth)acrylate, sec-butyl (meth)acrylate, tert-butyl (meth)acrylate, pentyl (meth)acrylate, hexyl (meth)acrylate, heptyl (meth)acrylate, 2-ethylhexyl (meth)acrylate, isooctyl (meth)acrylate, and octyl (meth)acrylate. ) octyl (meth)acrylate, n-nonyl (meth)acrylate, isononyl (meth)acrylate, decyl (meth)acrylate, undecyl (meth)acrylate, dodecyl (meth)acrylate (lauryl (meth)acrylate), tridecyl (meth)acrylate, tetradecyl (meth)acrylate (myristyl (meth)acrylate), pentadecyl (meth)acrylate, hexadecyl (meth)acrylate (palmityl (meth)acrylate), heptadecyl (meth)acrylate, (Meth)acrylic acid alkyl esters whose alkyl group constituting the alkyl ester is a chain structure with a carbon number of 1 to 18, such as octadecyl (meth)acrylate (stearyl (meth)acrylate); (meth)acrylic acid cycloalkyl esters such as isobornyl (meth)acrylate and dicyclopentanyl (meth)acrylate; (meth)acrylic acid aralkyl esters such as benzyl (meth)acrylate; (meth)acrylic acid cycloalkyl esters such as dicyclopentenyl (meth)acrylate; (meth)acrylic acid cycloalkyl esters such as dicyclopentenyl (meth)acrylate; (meth)acrylic acid cycloalkyl esters such as dicyclopentenyloxyethyl ester; (meth)acrylic acid cycloalkyl esters imine; (meth)acrylates containing glycidyl groups such as (meth)acrylate glycidyl; (meth)acrylates containing hydroxyl groups such as (meth)acrylate hydroxymethyl, (meth)acrylate 2-hydroxyethyl, (meth)acrylate 2-hydroxypropyl, (meth)acrylate 3-hydroxypropyl, (meth)acrylate 2-hydroxybutyl, (meth)acrylate 3-hydroxybutyl, (meth)acrylate 4-hydroxybutyl; (meth)acrylates containing substituted amino groups such as (meth)acrylate N-methylaminoethyl. Here, the so-called "substituted amino group" means a group in which one or two hydrogen atoms of the amino group are replaced by a group other than hydrogen atoms.
丙烯酸樹脂例如除了前述(甲基)丙烯酸酯以外,亦可使選自(甲基)丙烯酸、衣康酸、乙酸乙烯酯、丙烯腈、苯乙烯及N-羥甲基丙烯醯胺等中的1種或2種以上之單體進行共聚而成。For example, in addition to the aforementioned (meth)acrylate, the acrylic resin may also be one selected from the group consisting of (meth)acrylic acid, itaconic acid, vinyl acetate, acrylonitrile, styrene, N-methylolacrylamide, and the like. It is formed by copolymerizing two or more monomers.
構成丙烯酸樹脂之單體可僅為1種,亦可為2種以上,於為2種以上之情形時,這些的組合及比率可任意選擇。The monomer constituting the acrylic resin may be only one type, or may be two or more types. In the case of two or more types, the combination and ratio of these may be selected arbitrarily.
丙烯酸樹脂亦可具有乙烯基、(甲基)丙烯醯基、胺基、羥基、羧基、異氰酸酯基等可與其他化合物鍵結之官能基。丙烯酸樹脂的前述官能基可經由後述交聯劑(F)與其他化合物鍵結,亦可不經由交聯劑(F)而與其他化合物直接鍵結。藉由丙烯酸樹脂經由前述官能基與其他化合物鍵結,有使用第1保護膜形成用片所獲得之封裝體的可靠性提高之傾向。Acrylic resin may also have functional groups such as vinyl group, (meth)acryl group, amine group, hydroxyl group, carboxyl group, isocyanate group, etc. that can be bonded with other compounds. The aforementioned functional group of the acrylic resin may be bonded to other compounds via the cross-linking agent (F) described below, or may be directly bonded to other compounds without the cross-linking agent (F). Since the acrylic resin is bonded to other compounds via the functional groups, the reliability of the package obtained using the first protective film forming sheet tends to be improved.
本發明中,例如,作為聚合物成分(A),可不使用聚乙烯醇縮醛及丙烯酸樹脂而單獨使用聚乙烯醇縮醛及丙烯酸樹脂以外的熱塑性樹脂(以下,有時僅簡稱為「熱塑性樹脂」),亦可與聚乙烯醇縮醛或丙烯酸樹脂併用。藉由使用前述熱塑性樹脂,從而有時第1保護膜自第1支撐片之剝離性提高,或熱硬化性樹脂膜變得易於追隨於被接著體的凹凸面,且能進一步抑制於被接著體與熱硬化性樹脂膜之間產生空隙等。In the present invention, for example, as the polymer component (A), instead of using polyvinyl acetal and acrylic resin, a thermoplastic resin other than polyvinyl acetal and acrylic resin (hereinafter, sometimes simply referred to as "thermoplastic resin") may be used alone. ”), can also be used together with polyvinyl acetal or acrylic resin. By using the aforementioned thermoplastic resin, the peelability of the first protective film from the first support sheet may be improved, or the thermosetting resin film may become easier to follow the uneven surface of the adherend, and may be further suppressed from being adhered to the adherend. Gaps are generated between the thermosetting resin film and the thermosetting resin film.
前述熱塑性樹脂的重量平均分子量較佳為1000至100000,更佳為3000至80000。The weight average molecular weight of the aforementioned thermoplastic resin is preferably 1,000 to 100,000, more preferably 3,000 to 80,000.
前述熱塑性樹脂的玻璃轉移溫度(Tg)較佳為-30℃至150℃,更佳為-20℃至120℃。The glass transition temperature (Tg) of the thermoplastic resin is preferably -30°C to 150°C, more preferably -20°C to 120°C.
作為前述熱塑性樹脂,例如可列舉:聚酯樹脂、聚胺基甲酸酯樹脂、苯氧基樹脂、聚丁烯、聚丁二烯、聚苯乙烯等。Examples of the thermoplastic resin include polyester resin, polyurethane resin, phenoxy resin, polybutene, polybutadiene, polystyrene, and the like.
組成物(III-1)及熱硬化性樹脂膜所含有之前述熱塑性樹脂可僅為1種,亦可為2種以上,於為2種以上之情形時,這些的組合及比率可任意選擇。The aforementioned thermoplastic resin contained in the composition (III-1) and the thermosetting resin film may be only one type, or may be two or more types. In the case of two or more types, the combination and ratio of these can be selected arbitrarily.
組成物(III-1)中,無論聚合物成分(A)的種類如何,聚合物成分(A)的含量相對於溶媒以外的全部成分的總含量之比例(亦即熱硬化性樹脂膜中的聚合物成分(A)的含量相對於熱硬化性樹脂膜的總質量之比例)例如均可為5質量%至60質量%、5質量%至45質量%、5質量%至30質量%、及5質量%至15質量%之任一種。In the composition (III-1), regardless of the type of the polymer component (A), the ratio of the content of the polymer component (A) to the total content of all components except the solvent (that is, the ratio of the content of the polymer component (A) in the thermosetting resin film The content of the polymer component (A) relative to the total mass of the thermosetting resin film may be, for example, 5 to 60 mass %, 5 to 45 mass %, 5 to 30 mass %, and Any one from 5 mass% to 15 mass%.
聚合物成分(A)有時亦符合於熱硬化性成分(B)。本發明中,於組成物(III-1)含有此種符合於聚合物成分(A)及熱硬化性成分(B)兩者之成分之情形時,組成物(III-1)視為含有聚合物成分(A)及熱硬化性成分(B)。The polymer component (A) may also correspond to the thermosetting component (B). In the present invention, when the composition (III-1) contains such a component that corresponds to both the polymer component (A) and the thermosetting component (B), the composition (III-1) is regarded as containing a polymer component. Physical component (A) and thermosetting component (B).
[熱硬化性成分(B)] 熱硬化性成分(B)係具有熱硬化性,且用以使熱硬化性樹脂膜熱硬化而形成硬質的第1保護膜之成分。 另外,熱硬化性樹脂膜中,熱硬化性成分(B)符合於規定上述之合計含量之比例之「熱硬化性成分」、及作為前述X值之算出對象之「熱硬化性成分」兩者。[Thermosetting ingredient (B)] The thermosetting component (B) has thermosetting properties and is a component for thermosetting the thermosetting resin film to form a hard first protective film. In addition, in the thermosetting resin film, the thermosetting component (B) conforms to both the "thermosetting component" that stipulates the above-mentioned total content ratio, and the "thermosetting component" that is the object of calculation of the aforementioned X value. .
組成物(III-1)及熱硬化性樹脂膜所含有之熱硬化性成分(B)可僅為1種,亦可為2種以上,於為2種以上之情形時,這些的組合及比率可任意選擇。The thermosetting component (B) contained in the composition (III-1) and the thermosetting resin film may be only one type, or may be two or more types. In the case of two or more types, the combination and ratio of these You can choose whatever you want.
作為熱硬化性成分(B),例如可列舉環氧系熱硬化性樹脂、聚醯亞胺樹脂、不飽和聚酯樹脂等。 這些之中,熱硬化性成分(B)較佳為環氧系熱硬化性樹脂。Examples of the thermosetting component (B) include epoxy thermosetting resin, polyimide resin, unsaturated polyester resin, and the like. Among these, the thermosetting component (B) is preferably an epoxy thermosetting resin.
[環氧系熱硬化性樹脂] 環氧系熱硬化性樹脂由環氧樹脂(B1)及熱硬化劑(B2)所構成。 熱硬化性樹脂膜中,環氧樹脂(B1)及熱硬化劑(B2)均符合於規定上述之合計含量之比例之「熱硬化性成分」、及作為前述X值之算出對象之「熱硬化性成分」兩者。[Epoxy thermosetting resin] The epoxy thermosetting resin is composed of an epoxy resin (B1) and a thermosetting agent (B2). In the thermosetting resin film, both the epoxy resin (B1) and the thermosetting agent (B2) meet the "thermosetting component" that stipulates the above-mentioned total content ratio, and the "thermosetting component" that is the calculation object of the aforementioned X value. Sexual component" both.
組成物(III-1)及熱硬化性樹脂膜所含有之環氧系熱硬化性樹脂可僅為1種,亦可為2種以上,於為2種以上之情形時,這些的組合及比率可任意選擇。The epoxy thermosetting resin contained in the composition (III-1) and the thermosetting resin film may be only one type, or may be two or more types. In the case of two or more types, the combination and ratio of these You can choose whatever you want.
・環氧樹脂(B1) 作為環氧樹脂(B1),可列舉公知的環氧樹脂,例如可列舉:多官能系環氧樹脂、聯苯化合物、雙酚A二縮水甘油醚及其氫化物、鄰甲酚酚醛清漆環氧樹脂、二環戊二烯型環氧樹脂、聯苯型環氧樹脂、雙酚A型環氧樹脂、雙酚F型環氧樹脂、伸苯基骨架型環氧樹脂等2官能以上之環氧化合物。・Epoxy resin (B1) Examples of the epoxy resin (B1) include known epoxy resins. Examples include polyfunctional epoxy resins, biphenyl compounds, bisphenol A diglycidyl ether and hydrogenated products thereof, and o-cresol novolak epoxy. Resin, dicyclopentadiene-type epoxy resin, biphenyl-type epoxy resin, bisphenol A-type epoxy resin, bisphenol F-type epoxy resin, phenylene skeleton type epoxy resin and other 2-functional or higher epoxy resins compound.
作為環氧樹脂(B1),亦可使用具有不飽和烴基之環氧樹脂。具有不飽和烴基之環氧樹脂相較於不具有不飽和烴基之環氧樹脂而言,與丙烯酸樹脂之相容性較高。因此,藉由使用具有不飽和烴基之環氧樹脂,使用第1保護膜形成用片所獲得之附第1保護膜之工件加工物的可靠性提高。As the epoxy resin (B1), an epoxy resin having an unsaturated hydrocarbon group can also be used. Epoxy resins with unsaturated hydrocarbon groups have higher compatibility with acrylic resins than epoxy resins without unsaturated hydrocarbon groups. Therefore, by using the epoxy resin having an unsaturated hydrocarbon group, the reliability of the workpiece processed product with the first protective film obtained using the first protective film forming sheet is improved.
作為具有不飽和烴基之環氧樹脂,例如可列舉:多官能系環氧樹脂的一部分環氧基變換為具有不飽和烴基之基而成之化合物。此種化合物例如藉由使(甲基)丙烯酸或其衍生物與環氧基進行加成反應而獲得。 另外,作為具有不飽和烴基之環氧樹脂,例如可列舉:構成環氧樹脂之芳香環等上直接鍵結有具有不飽和烴基之基之化合物等。 不飽和烴基為具有聚合性之不飽和基,作為該不飽和烴基的具體例,可列舉:次乙基(乙烯基)、2-丙烯基(烯丙基)、(甲基)丙烯醯基、(甲基)丙烯醯胺基等,較佳為丙烯醯基。Examples of the epoxy resin having an unsaturated hydrocarbon group include a compound in which a part of the epoxy groups of a polyfunctional epoxy resin is converted into a group having an unsaturated hydrocarbon group. Such a compound is obtained, for example, by addition reaction of (meth)acrylic acid or a derivative thereof and an epoxy group. Examples of the epoxy resin having an unsaturated hydrocarbon group include compounds in which a group having an unsaturated hydrocarbon group is directly bonded to an aromatic ring constituting the epoxy resin. The unsaturated hydrocarbon group is a polymerizable unsaturated group. Specific examples of the unsaturated hydrocarbon group include: ethylidene (vinyl), 2-propenyl (allyl), (meth)acrylyl, (Meth)acrylamide group and the like, preferably acrylyl group.
環氧樹脂(B1)的數量平均分子量並無特別限定,就熱硬化性樹脂膜的硬化性、以及硬化後的樹脂膜的強度及耐熱性之方面而言,較佳為300至30000,更佳為300至10000,尤佳為300至3000。The number average molecular weight of the epoxy resin (B1) is not particularly limited, but in terms of the curability of the thermosetting resin film and the strength and heat resistance of the cured resin film, it is preferably 300 to 30,000, more preferably The range is 300 to 10,000, preferably 300 to 3,000.
環氧樹脂(B1)的環氧當量較佳為100g/eq至1000g/eq,更佳為150g/eq至970g/eq,進而較佳為200g/eq至600g/eq。The epoxy equivalent of the epoxy resin (B1) is preferably 100g/eq to 1000g/eq, more preferably 150g/eq to 970g/eq, and further preferably 200g/eq to 600g/eq.
環氧樹脂(B1)可單獨使用1種,亦可併用2種以上,於併用2種以上之情形時,這些的組合及比率可任意選擇。One type of epoxy resin (B1) may be used alone, or two or more types may be used in combination. When two or more types are used in combination, the combination and ratio of these may be selected arbitrarily.
・熱硬化劑(B2) 熱硬化劑(B2)發揮作為針對環氧樹脂(B1)之硬化劑的功能。 作為熱硬化劑(B2),例如可列舉:1分子中具有2個以上之可與環氧基反應之官能基之化合物。作為前述官能基,例如可列舉:酚性羥基、醇性羥基、胺基、羧基、酸基經酐化而成之基等,較佳為酚性羥基、胺基、或酸基經酐化而成之基,更佳為酚性羥基或胺基。・Thermal hardener (B2) The thermosetting agent (B2) functions as a hardening agent for the epoxy resin (B1). Examples of the thermosetting agent (B2) include compounds having two or more functional groups capable of reacting with an epoxy group in one molecule. Examples of the functional group include a phenolic hydroxyl group, an alcoholic hydroxyl group, an amino group, a carboxyl group, an acidic group and the like, and preferably a phenolic hydroxyl group, an alcoholic hydroxyl group, an acidic group and an anhydride group. The group is preferably a phenolic hydroxyl group or an amine group.
熱硬化劑(B2)中,作為具有酚性羥基之酚系硬化劑,例如可列舉:多官能酚樹脂、聯苯酚、酚醛清漆型酚樹脂、二環戊二烯型酚樹脂、芳烷基型酚樹脂等。 熱硬化劑(B2)中,作為具有胺基之胺系硬化劑,例如可列舉雙氰胺等。Examples of the phenolic curing agent having a phenolic hydroxyl group among the thermal curing agents (B2) include polyfunctional phenol resins, biphenol, novolak-type phenol resins, dicyclopentadiene-type phenol resins, and aralkyl-type phenol resins. Phenol resin, etc. Among the thermal curing agents (B2), examples of the amine-based curing agent having an amino group include dicyandiamide and the like.
熱硬化劑(B2)亦可具有不飽和烴基。 作為具有不飽和烴基之熱硬化劑(B2),例如可列舉:酚樹脂的一部分羥基由具有不飽和烴基之基取代而成之化合物、於酚樹脂的芳香環上直接鍵結具有不飽和烴基之基而成之化合物等。 熱硬化劑(B2)中的前述不飽和烴基與上述之具有不飽和烴基之環氧樹脂中的不飽和烴基相同。The thermal hardener (B2) may have an unsaturated hydrocarbon group. Examples of the thermosetting agent (B2) having an unsaturated hydrocarbon group include: a compound in which a part of the hydroxyl groups of the phenol resin is substituted with a group having an unsaturated hydrocarbon group; and a compound having an unsaturated hydrocarbon group directly bonded to the aromatic ring of the phenol resin. Based compounds, etc. The aforementioned unsaturated hydrocarbon group in the thermal hardener (B2) is the same as the aforementioned unsaturated hydrocarbon group in the epoxy resin having an unsaturated hydrocarbon group.
於使用酚系硬化劑作為熱硬化劑(B2)之情形時,就第1保護膜自第1支撐片之剝離性提高之方面而言,熱硬化劑(B2)較佳為軟化點或玻璃轉移溫度高之酚系硬化劑。When a phenol-based hardener is used as the thermosetting agent (B2), in terms of improving the peelability of the first protective film from the first support sheet, the thermosetting agent (B2) preferably has a softening point or glass transition. High temperature phenolic hardener.
熱硬化劑(B2)中,例如多官能酚樹脂、酚醛清漆型酚樹脂、二環戊二烯型酚樹脂、芳烷基型酚樹脂等樹脂成分的數量平均分子量較佳為300至30000,更佳為400至10000,尤佳為500至3000。 熱硬化劑(B2)中,例如聯苯酚、雙氰胺等非樹脂成分的分子量並無特別限定,例如較佳為60至500。In the thermal hardener (B2), the number average molecular weight of resin components such as polyfunctional phenol resin, novolak type phenol resin, dicyclopentadiene type phenol resin, aralkyl type phenol resin, etc. is preferably 300 to 30,000, more preferably 300 to 30,000. The best value is 400 to 10,000, especially the best value is 500 to 3,000. In the thermosetting agent (B2), the molecular weight of non-resin components such as biphenol and dicyandiamide is not particularly limited, but is preferably 60 to 500, for example.
熱硬化劑(B2)可單獨使用1種,亦可併用2種以上,於併用2種以上之情形時,這些的組合及比率可任意選擇。One type of thermosetting agent (B2) can be used alone, or two or more types can be used in combination. When two or more types are used in combination, the combination and ratio of these can be selected arbitrarily.
組成物(III-1)及熱硬化性樹脂膜中,熱硬化劑(B2)的含量相對於環氧樹脂(B1)的含量100質量份,例如可為0.1質量份至500質量份、1質量份至250質量份、1質量份至150質量份、1質量份至100質量份、1質量份至75質量份、及1質量份至50質量份之任一種。藉由熱硬化劑(B2)的前述含量為前述下限值以上,熱硬化性樹脂膜變得更容易進行硬化。藉由熱硬化劑(B2)的前述含量為前述上限值以下,熱硬化性樹脂膜的吸濕率降低,使用第1保護膜形成用片所獲得之封裝體的可靠性進一步提高。In the composition (III-1) and the thermosetting resin film, the content of the thermosetting agent (B2) relative to 100 parts by mass of the epoxy resin (B1) can be, for example, 0.1 to 500 parts by mass, 1 part by mass. Any one of 1 to 250 parts by mass, 1 to 150 parts by mass, 1 to 100 parts by mass, 1 to 75 parts by mass, and 1 to 50 parts by mass. When the aforementioned content of the thermosetting agent (B2) is equal to or more than the aforementioned lower limit, the thermosetting resin film becomes easier to harden. When the content of the thermosetting agent (B2) is equal to or less than the upper limit, the moisture absorption rate of the thermosetting resin film is reduced, and the reliability of the package obtained using the first protective film forming sheet is further improved.
組成物(III-1)及熱硬化性樹脂膜中,熱硬化性成分(B)的含量(例如,環氧樹脂(B1)及熱硬化劑(B2)的總含量)相對於聚合物成分(A)的含量100質量份,例如可為300質量份至1400質量份、400質量份至1300質量份、500質量份至1100質量份、600質量份至1000質量份、及700質量份至900質量份之任一種。藉由熱硬化性成分(B)的前述含量為此種範圍,例如第1保護膜與第1支撐片之接著力得到抑制,第1支撐片的剝離性提高。In the composition (III-1) and the thermosetting resin film, the content of the thermosetting component (B) (for example, the total content of the epoxy resin (B1) and the thermosetting agent (B2)) relative to the polymer component ( The content of A) is 100 parts by mass, for example, it can be 300 to 1400 parts by mass, 400 to 1300 parts by mass, 500 to 1100 parts by mass, 600 to 1000 parts by mass, and 700 to 900 parts by mass Any kind of portion. When the aforementioned content of the thermosetting component (B) is in such a range, for example, the adhesive force between the first protective film and the first support sheet is suppressed, and the peelability of the first support sheet is improved.
[硬化促進劑(C)] 組成物(III-1)及熱硬化性樹脂膜亦可含有硬化促進劑(C)。硬化促進劑(C)係用以調整組成物(III-1)的硬化速度之成分。 作為較佳的硬化促進劑(C),例如可列舉:三乙二胺、苄基二甲胺、三乙醇胺、二甲胺基乙醇、三(二甲胺基甲基)苯酚等三級胺;2-甲基咪唑、2-苯基咪唑、2-苯基-4-甲基咪唑、2-苯基-4,5-二羥基甲基咪唑、2-苯基-4-甲基-5-羥基甲基咪唑等咪唑類(1個以上之氫原子由氫原子以外的基取代而成之咪唑);三丁基膦、二苯基膦、三苯基膦等有機膦類(1個以上之氫原子由有機基取代而成之膦);四苯基硼酸四苯基鏻、四苯基硼酸三苯基膦等四苯基硼鹽等。[Harding accelerator (C)] The composition (III-1) and the thermosetting resin film may contain a hardening accelerator (C). The hardening accelerator (C) is a component for adjusting the hardening speed of the composition (III-1). Preferred hardening accelerators (C) include, for example, tertiary amines such as triethylenediamine, benzyldimethylamine, triethanolamine, dimethylaminoethanol, and tris(dimethylaminomethyl)phenol; 2-methylimidazole, 2-phenylimidazole, 2-phenyl-4-methylimidazole, 2-phenyl-4,5-dihydroxymethylimidazole, 2-phenyl-4-methyl-5- Imidazoles such as hydroxymethylimidazole (imidazole in which more than one hydrogen atom is replaced by a group other than a hydrogen atom); organic phosphines such as tributylphosphine, diphenylphosphine, triphenylphosphine (more than one hydrogen atom is substituted by a group other than a hydrogen atom); Phosphines in which hydrogen atoms are substituted by organic groups); tetraphenylboron salts such as tetraphenylphosphonium tetraphenylborate and triphenylphosphine tetraphenylborate.
組成物(III-1)及熱硬化性樹脂膜所含有之硬化促進劑(C)可僅為1種,亦可為2種以上,於為2種以上之情形時,這些的組合及比率可任意選擇。The hardening accelerator (C) contained in the composition (III-1) and the thermosetting resin film may be only one type, or may be two or more types. In the case of two or more types, the combination and ratio of these may be Take your pick.
於使用硬化促進劑(C)之情形時,組成物(III-1)及熱硬化性樹脂膜中,硬化促進劑(C)的含量相對於熱硬化性成分(B)的含量100質量份,例如可為0.01質量份至10質量份及0.1質量份至7質量份之任一種。藉由硬化促進劑(C)的前述含量為前述下限值以上,能更顯著地獲得由使用硬化促進劑(C)所獲得之效果。藉由硬化促進劑(C)的含量為前述上限值以下,例如抑制高極性的硬化促進劑(C)於高溫、高濕度條件下於熱硬化性樹脂膜中朝熱硬化性樹脂膜與被接著體之接著界面側移動而偏析之效果變高。結果,使用第1保護膜形成用片所獲得之附第1保護膜之工件加工物的可靠性進一步提高。When a hardening accelerator (C) is used, the content of the hardening accelerator (C) in the composition (III-1) and the thermosetting resin film is 100 parts by mass relative to the content of the thermosetting component (B). For example, it may be any one of 0.01 to 10 parts by mass and 0.1 to 7 parts by mass. By setting the aforementioned content of the hardening accelerator (C) to be equal to or more than the aforementioned lower limit, the effect obtained by using the hardening accelerator (C) can be more significantly obtained. By keeping the content of the curing accelerator (C) below the aforementioned upper limit, for example, the highly polar curing accelerator (C) in the thermosetting resin film is prevented from moving toward the thermosetting resin film and the substrate under high temperature and high humidity conditions. As the body moves to the interface side, the effect of segregation becomes higher. As a result, the reliability of the workpiece processed product with the first protective film obtained using the first protective film forming sheet is further improved.
[填充材料(D)] 組成物(III-1)及熱硬化性樹脂膜亦可含有填充材料(D)。藉由熱硬化性樹脂膜含有填充材料(D),使熱硬化性樹脂膜硬化而獲得之第1保護膜變得容易調整熱膨脹係數。並且,藉由使該熱膨脹係數最適於第1保護膜之形成對象物,而使用第1保護膜形成用片所獲得之附第1保護膜之工件加工物的可靠性進一步提高。另外,藉由熱硬化性樹脂膜含有填充材料(D),亦能夠降低第1保護膜的吸濕率,或提高散熱性。[Filling material (D)] The composition (III-1) and the thermosetting resin film may contain a filler (D). Since the thermosetting resin film contains the filler (D), the thermal expansion coefficient of the first protective film obtained by curing the thermosetting resin film becomes easy to adjust. Furthermore, by optimizing the thermal expansion coefficient for the object to be formed with the first protective film, the reliability of the workpiece with the first protective film obtained using the first protective film forming sheet is further improved. In addition, when the thermosetting resin film contains the filler (D), the moisture absorption rate of the first protective film can also be reduced or the heat dissipation property can be improved.
填充材料(D)可為有機填充材料及無機填充材料之任一種,較佳為無機填充材料。 作為較佳的無機填充材料,例如可列舉:二氧化矽、氧化鋁、滑石、碳酸鈣、鈦白、鐵丹、碳化矽、氮化硼等之粉末;將這些無機填充材料球形化而成之珠粒;這些無機填充材料的表面改質品;這些無機填充材料的單晶纖維;玻璃纖維等。 這些之中,無機填充材料較佳為二氧化矽或氧化鋁,更佳為二氧化矽。The filler material (D) can be either an organic filler material or an inorganic filler material, and an inorganic filler material is preferred. Preferable inorganic fillers include, for example, powders of silica, alumina, talc, calcium carbonate, titanium dioxide, titanium dioxide, silicon carbide, boron nitride, etc.; these inorganic fillers are formed into spherical shapes. Beads; surface modifications of these inorganic filler materials; single crystal fibers of these inorganic filler materials; glass fibers, etc. Among these, the inorganic filler material is preferably silica or alumina, and more preferably silica.
填充材料(D)的平均粒徑根據目的適宜選擇即可,並無特別限定,例如可為0.02μm至2μm。 此外,本說明書中,所謂「平均粒徑」,只要無特別說明,則意指藉由雷射繞射散射法所求出之粒度分佈曲線中的累計值50%時的粒徑(D50 )的值。The average particle diameter of the filler (D) may be appropriately selected depending on the purpose and is not particularly limited. For example, it may be 0.02 μm to 2 μm. In addition, in this specification, the "average particle diameter" means the particle diameter (D 50 ) at 50% of the cumulative value in the particle size distribution curve obtained by the laser diffraction and scattering method, unless otherwise specified. value.
組成物(III-1)及熱硬化性樹脂膜所含有之填充材料(D)可僅為1種,亦可為2種以上,於為2種以上之情形時,這些的組合及比率可任意選擇。The filler material (D) contained in the composition (III-1) and the thermosetting resin film may be only one type, or may be two or more types. In the case of two or more types, the combination and ratio of these may be arbitrary. select.
組成物(III-1)中,填充材料(D)的含量相對於溶媒以外的全部成分的總含量之比例(亦即熱硬化性樹脂膜中的填充材料(D)的含量相對於熱硬化性樹脂膜的總質量之比例)例如可為3質量%至60質量%、4質量%至40質量%、5質量%至30質量%、5質量%至20質量%、及5質量%至15質量%之任一種。藉由前述比例為此種範圍,變得更容易調整上述之第1保護膜之熱膨脹係數。In the composition (III-1), the ratio of the content of the filler (D) to the total content of all components except the solvent (that is, the ratio of the content of the filler (D) in the thermosetting resin film to the total content of the thermosetting resin film) The proportion of the total mass of the resin film) may be, for example, 3% to 60% by mass, 4% to 40% by mass, 5% to 30% by mass, 5% to 20% by mass, and 5% to 15% by mass. % of any kind. When the aforementioned ratio is within this range, it becomes easier to adjust the thermal expansion coefficient of the above-mentioned first protective film.
[偶合劑(E)] 組成物(III-1)及熱硬化性樹脂膜亦可含有偶合劑(E)。藉由使用具有可與無機化合物或有機化合物反應之官能基之化合物作為偶合劑(E),能夠提高熱硬化性樹脂膜對被接著體之接著性及密接性。另外,藉由使用偶合劑(E),熱硬化性樹脂膜之硬化物不損害耐熱性而耐水性提高。[Coupling agent (E)] The composition (III-1) and the thermosetting resin film may contain the coupling agent (E). By using a compound having a functional group that can react with an inorganic compound or an organic compound as the coupling agent (E), the adhesiveness and adhesion of the thermosetting resin film to the adherend can be improved. In addition, by using the coupling agent (E), the cured product of the thermosetting resin film has improved water resistance without impairing the heat resistance.
偶合劑(E)較佳為具有可與聚合物成分(A)、熱硬化性成分(B)等所具有之官能基反應之官能基之化合物,更佳為矽烷偶合劑。 作為較佳的前述矽烷偶合劑,例如可列舉:3-縮水甘油氧基丙基三甲氧基矽烷、3-縮水甘油氧基丙基甲基二乙氧基矽烷、3-縮水甘油氧基丙基三乙氧基矽烷、3-縮水甘油氧基甲基二乙氧基矽烷、2-(3,4-環氧環己基)乙基三甲氧基矽烷、3-甲基丙烯醯氧基丙基三甲氧基矽烷、3-胺基丙基三甲氧基矽烷、3-(2-胺基乙基胺基)丙基三甲氧基矽烷、3-(2-胺基乙基胺基)丙基甲基二乙氧基矽烷、3-(苯基胺基)丙基三甲氧基矽烷、3-苯胺基丙基三甲氧基矽烷、3-脲基丙基三乙氧基矽烷、3-巰基丙基三甲氧基矽烷、3-巰基丙基甲基二甲氧基矽烷、雙(3-三乙氧基矽基丙基)四硫化物、甲基三甲氧基矽烷、甲基三乙氧基矽烷、乙烯基三甲氧基矽烷、乙烯基三乙醯氧基矽烷、咪唑矽烷等。The coupling agent (E) is preferably a compound having a functional group that can react with the functional group possessed by the polymer component (A), the thermosetting component (B), etc., and is more preferably a silane coupling agent. Preferred silane coupling agents include, for example, 3-glycidoxypropyltrimethoxysilane, 3-glycidoxypropylmethyldiethoxysilane, and 3-glycidoxypropyl Triethoxysilane, 3-glycidoxymethyldiethoxysilane, 2-(3,4-epoxycyclohexyl)ethyltrimethoxysilane, 3-methacryloxypropyltrimethyl Oxysilane, 3-aminopropyltrimethoxysilane, 3-(2-aminoethylamino)propyltrimethoxysilane, 3-(2-aminoethylamino)propylmethyl Diethoxysilane, 3-(phenylamino)propyltrimethoxysilane, 3-anilinopropyltrimethoxysilane, 3-ureidopropyltriethoxysilane, 3-mercaptopropyltrimethyl Oxysilane, 3-mercaptopropylmethyldimethoxysilane, bis(3-triethoxysilylpropyl)tetrasulfide, methyltrimethoxysilane, methyltriethoxysilane, ethylene Trimethoxysilane, vinyltriethyloxysilane, imidazolesilane, etc.
組成物(III-1)及熱硬化性樹脂膜所含有之偶合劑(E)可僅為1種,亦可為2種以上,於為2種以上之情形時,這些的組合及比率可任意選擇。The coupling agent (E) contained in the composition (III-1) and the thermosetting resin film may be only one type, or may be two or more types. In the case of two or more types, the combination and ratio of these may be arbitrary. select.
於使用偶合劑(E)之情形時,組成物(III-1)及熱硬化性樹脂膜中,偶合劑(E)的含量相對於聚合物成分(A)及熱硬化性成分(B)的總含量100質量份,例如可為0.03質量份至20質量份、0.05質量份至10質量份、及0.1質量份至5質量份之任一種。藉由偶合劑(E)的前述含量為前述下限值以上,能更顯著地獲得如下之由使用偶合劑(E)所帶來之效果:填充材料(D)於樹脂中之分散性提高,或熱硬化性樹脂膜與被接著體之接著性提高等。藉由偶合劑(E)的前述含量為前述上限值以下,能進一步抑制產生逸氣。When the coupling agent (E) is used, the content of the coupling agent (E) in the composition (III-1) and the thermosetting resin film is relative to the polymer component (A) and the thermosetting component (B). The total content may be any one of 0.03 to 20 parts by mass, 0.05 to 10 parts by mass, and 0.1 to 5 parts by mass per 100 parts by mass. By having the aforementioned content of the coupling agent (E) above the aforementioned lower limit, the following effects brought about by the use of the coupling agent (E) can be more significantly obtained: the dispersibility of the filler (D) in the resin is improved, Or the adhesion between the thermosetting resin film and the adherend can be improved, etc. When the content of the coupling agent (E) is equal to or less than the upper limit, the generation of outgassing can be further suppressed.
[交聯劑(F)] 於使用具有可與其他化合物鍵結之乙烯基、(甲基)丙烯醯基、胺基、羥基、羧基、異氰酸酯基等官能基之上述丙烯酸樹脂等作為聚合物成分(A)之情形時,組成物(III-1)及熱硬化性樹脂膜亦可含有交聯劑(F)。交聯劑(F)係用以使聚合物成分(A)中的前述官能基與其他化合物鍵結而進行交聯之成分,藉由如此進行交聯,能夠調節熱硬化性樹脂膜的初始接著力及凝聚力。[Crosslinking agent (F)] When the above-mentioned acrylic resin, etc., having functional groups such as vinyl, (meth)acrylyl, amine, hydroxyl, carboxyl, and isocyanate groups that can be bonded to other compounds is used as the polymer component (A), the composition The substance (III-1) and the thermosetting resin film may also contain a crosslinking agent (F). The cross-linking agent (F) is a component for cross-linking the aforementioned functional group in the polymer component (A) by bonding it to other compounds. By cross-linking in this way, the initial adhesion of the thermosetting resin film can be adjusted. strength and cohesion.
作為交聯劑(F),例如可列舉:有機多元異氰酸酯化合物、有機多元亞胺化合物、金屬螯合物系交聯劑(具有金屬螯合物結構之交聯劑)、氮丙啶系交聯劑(具有氮丙啶基之交聯劑)等。Examples of the cross-linking agent (F) include organic polyisocyanate compounds, organic polyimine compounds, metal chelate-based cross-linking agents (cross-linking agents having a metal chelate structure), and aziridine-based cross-linking agents. Agent (cross-linking agent with aziridine group), etc.
作為前述有機多元異氰酸酯化合物,例如可列舉:芳香族多元異氰酸酯化合物、脂肪族多元異氰酸酯化合物及脂環族多元異氰酸酯化合物(以下,有時將這些化合物統一簡稱為「芳香族多元異氰酸酯化合物等」);前述芳香族多元異氰酸酯化合物等之三聚物、異氰脲酸酯體及加合物;使前述芳香族多元異氰酸酯化合物等與多元醇化合物反應而獲得之末端異氰酸酯胺基甲酸酯預聚物等。前述「加合物」意指前述芳香族多元異氰酸酯化合物、脂肪族多元異氰酸酯化合物或脂環族多元異氰酸酯化合物,與乙二醇、丙二醇、新戊二醇、三羥甲基丙烷或蓖麻油等含低分子活性氫化合物而成之反應物。作為前述加合物的示例,可列舉如後述之三羥甲基丙烷之苯二甲基二異氰酸酯加成物等。另外,所謂「末端異氰酸酯胺基甲酸酯預聚物」,意指具有胺基甲酸酯鍵,並且於分子的末端部具有異氰酸酯基之預聚物。Examples of the organic polyisocyanate compound include aromatic polyisocyanate compounds, aliphatic polyisocyanate compounds, and alicyclic polyisocyanate compounds (hereinafter, these compounds may be collectively referred to as "aromatic polyisocyanate compounds, etc."); Terpolymers, isocyanurates and adducts of the aforementioned aromatic polyisocyanate compounds, etc.; terminal isocyanate urethane prepolymers, etc. obtained by reacting the aforementioned aromatic polyisocyanate compounds, etc. with polyol compounds. . The aforementioned "adduct" means the aforementioned aromatic polyisocyanate compound, aliphatic polyisocyanate compound or alicyclic polyisocyanate compound, and ethylene glycol, propylene glycol, neopentyl glycol, trimethylolpropane or castor oil, etc. Reactant made of low molecular weight active hydrogen compounds. Examples of the adduct include a xylylene diisocyanate adduct of trimethylolpropane, which will be described later. In addition, the term "terminated isocyanate urethane prepolymer" means a prepolymer having a urethane bond and an isocyanate group at the end of the molecule.
作為前述有機多元異氰酸酯化合物,更具體而言,例如可列舉:2,4-甲苯二異氰酸酯;2,6-甲苯二異氰酸酯;1,3-苯二甲基二異氰酸酯;1,4-苯二甲基二異氰酸酯;二苯基甲烷-4,4'-二異氰酸酯;二苯基甲烷-2,4'-二異氰酸酯;3-甲基二苯基甲烷二異氰酸酯;六亞甲基二異氰酸酯;異佛爾酮二異氰酸酯;二環己基甲烷-4,4'-二異氰酸酯;二環己基甲烷-2,4'-二異氰酸酯;於三羥甲基丙烷等多元醇的全部或一部分羥基加成了甲苯二異氰酸酯、六亞甲基二異氰酸酯及苯二甲基二異氰酸酯之任1種或2種以上而成之化合物;離胺酸二異氰酸酯等。More specific examples of the organic polyisocyanate compound include: 2,4-toluene diisocyanate; 2,6-toluene diisocyanate; 1,3-xylylenedimethyldiisocyanate; 1,4-xylenedimethyldiisocyanate Diisocyanate; diphenylmethane-4,4'-diisocyanate; diphenylmethane-2,4'-diisocyanate; 3-methyldiphenylmethane diisocyanate; hexamethylene diisocyanate; isophor Ertone diisocyanate; dicyclohexylmethane-4,4'-diisocyanate; dicyclohexylmethane-2,4'-diisocyanate; toluene diisocyanate added to all or part of the hydroxyl groups of polyols such as trimethylolpropane Any one or two or more compounds of isocyanate, hexamethylene diisocyanate and xylylene diisocyanate; lysine diisocyanate, etc.
作為前述有機多元亞胺化合物,例如可列舉:N,N'-二苯基甲烷-4,4'-雙(1-氮丙啶甲醯胺)、三羥甲基丙烷-三-β-氮丙啶基丙酸酯、四羥甲基甲烷-三-β-氮丙啶基丙酸酯、N,N'-甲苯-2,4-雙(1-氮丙啶甲醯胺)三伸乙基三聚氰胺等。Examples of the organic polyimine compound include N,N'-diphenylmethane-4,4'-bis(1-aziridinemethane), trimethylolpropane-tris-β-nitrogen Propiridylpropionate, tetramethylolmethane-tris-β-aziridinylpropionate, N,N'-toluene-2,4-bis(1-aziridinylcarboxamide)triethylene Based on melamine, etc.
於使用有機多元異氰酸酯化合物作為交聯劑(F)之情形時,作為聚合物成分(A),較佳為使用含羥基之聚合物。於交聯劑(F)具有異氰酸酯基,聚合物成分(A)具有羥基之情形時,藉由交聯劑(F)與聚合物成分(A)之反應,能夠將交聯結構簡便地導入至熱硬化性樹脂膜中。When an organic polyvalent isocyanate compound is used as the cross-linking agent (F), it is preferred to use a hydroxyl-containing polymer as the polymer component (A). When the cross-linking agent (F) has an isocyanate group and the polymer component (A) has a hydroxyl group, the cross-linked structure can be easily introduced through the reaction between the cross-linking agent (F) and the polymer component (A). In thermosetting resin film.
組成物(III-1)及熱硬化性樹脂膜所含有之交聯劑(F)可僅為1種,亦可為2種以上,於為2種以上之情形時,這些的組合及比率可任意選擇。The cross-linking agent (F) contained in the composition (III-1) and the thermosetting resin film may be only one type, or may be two or more types. In the case of two or more types, the combination and ratio of these may be Take your pick.
於使用交聯劑(F)之情形時,組成物(III-1)中,交聯劑(F)的含量相對於聚合物成分(A)的含量100質量份,例如可為0.01質量份至20質量份、0.1質量份至10質量份、及0.5質量份至5質量份之任一種。藉由交聯劑(F)的前述含量為前述下限值以上,能更顯著地獲得由使用交聯劑(F)所帶來之效果。藉由交聯劑(F)的前述含量為前述上限值以下,交聯劑(F)之過量使用得到抑制。When a cross-linking agent (F) is used, the content of the cross-linking agent (F) in the composition (III-1) relative to 100 parts by mass of the content of the polymer component (A) can be, for example, 0.01 to 0.01 parts by mass. Any one of 20 parts by mass, 0.1 to 10 parts by mass, and 0.5 to 5 parts by mass. By setting the aforementioned content of the cross-linking agent (F) to be equal to or more than the aforementioned lower limit, the effects brought about by the use of the cross-linking agent (F) can be more significantly obtained. When the content of the cross-linking agent (F) is equal to or less than the upper limit, excessive use of the cross-linking agent (F) is suppressed.
[能量線硬化性樹脂(G)] 組成物(III-1)及熱硬化性樹脂膜亦可含有能量線硬化性樹脂(G)。熱硬化性樹脂膜藉由含有能量線硬化性樹脂(G),可藉由照射能量線而改變特性。[Energy ray curable resin (G)] The composition (III-1) and the thermosetting resin film may contain energy ray curing resin (G). By containing energy ray curable resin (G), the thermosetting resin film can change its characteristics by irradiating energy rays.
能量線硬化性樹脂(G)係使能量線硬化性化合物進行聚合(硬化)而獲得。 作為前述能量線硬化性化合物,例如可列舉分子內具有至少1個聚合性雙鍵之化合物,較佳為具有(甲基)丙烯醯基之丙烯酸酯系化合物。Energy ray curable resin (G) is obtained by polymerizing (hardening) an energy ray curable compound. Examples of the energy ray curable compound include compounds having at least one polymerizable double bond in the molecule, and preferably are acrylate compounds having a (meth)acrylyl group.
作為前述丙烯酸酯系化合物,例如可列舉:三羥甲基丙烷三(甲基)丙烯酸酯、四羥甲基甲烷四(甲基)丙烯酸酯、季戊四醇三(甲基)丙烯酸酯、季戊四醇四(甲基)丙烯酸酯、二季戊四醇單羥基五(甲基)丙烯酸酯、二季戊四醇六(甲基)丙烯酸酯、1,4-丁二醇二(甲基)丙烯酸酯、1,6-己二醇二(甲基)丙烯酸酯等含鏈狀脂肪族骨架之(甲基)丙烯酸酯;二(甲基)丙烯酸二環戊酯等含環狀脂肪族骨架之(甲基)丙烯酸酯;聚乙二醇二(甲基)丙烯酸酯等聚伸烷基二醇(甲基)丙烯酸酯;寡酯(甲基)丙烯酸酯;(甲基)丙烯酸胺基甲酸酯低聚物;環氧改性(甲基)丙烯酸酯;前述聚伸烷基二醇(甲基)丙烯酸酯以外的聚醚(甲基)丙烯酸酯;衣康酸低聚物等。Examples of the acrylate compound include trimethylolpropane tri(meth)acrylate, tetramethylolmethane tetra(meth)acrylate, pentaerythritol tri(meth)acrylate, and pentaerythritol tetra(meth)acrylate. hydroxy) acrylate, dipentaerythritol monohydroxy penta(meth)acrylate, dipentaerythritol hexa(meth)acrylate, 1,4-butanediol di(meth)acrylate, 1,6-hexanediol di (Meth)acrylates and other (meth)acrylates containing a chain aliphatic skeleton; (meth)acrylates containing a cyclic aliphatic skeleton such as dicyclopentyl di(meth)acrylate; polyethylene glycol Polyalkylene glycol (meth)acrylate such as di(meth)acrylate; oligoester (meth)acrylate; (meth)acrylic urethane oligomer; epoxy modified (meth)acrylate (meth)acrylate; polyether (meth)acrylate other than the aforementioned polyalkylene glycol (meth)acrylate; itaconic acid oligomer, etc.
前述能量線硬化性化合物的重量平均分子量較佳為100至30000,更佳為300至10000。The weight average molecular weight of the energy ray curable compound is preferably 100 to 30,000, more preferably 300 to 10,000.
用於聚合之前述能量線硬化性化合物可僅為1種,亦可為2種以上,於為2種以上之情形時,這些的組合及比率可任意選擇。The energy ray curable compound used for polymerization may be only one type or two or more types. In the case of two or more types, the combination and ratio of these compounds may be selected arbitrarily.
組成物(III-1)及熱硬化性樹脂膜所含有之能量線硬化性樹脂(G)可僅為1種,亦可為2種以上,於為2種以上之情形時,這些的組合及比率可任意選擇。The energy ray curable resin (G) contained in the composition (III-1) and the thermosetting resin film may be only one type, or may be two or more types. In the case of two or more types, the combination of these and The ratio can be chosen arbitrarily.
於使用能量線硬化性樹脂(G)之情形時,組成物(III-1)中,能量線硬化性樹脂(G)的含量相對於組成物(III-1)的總質量之比例例如可為1質量%至95質量%、5質量%至90質量%、及10質量%至85質量%之任一種。When an energy ray curable resin (G) is used, the ratio of the content of the energy ray curable resin (G) in the composition (III-1) to the total mass of the composition (III-1) can be, for example, Any one of 1 mass% to 95 mass%, 5 mass% to 90 mass%, and 10 mass% to 85 mass%.
[光聚合起始劑(H)] 於組成物(III-1)及熱硬化性樹脂膜含有能量線硬化性樹脂(G)之情形時,為了使能量線硬化性樹脂(G)高效率地進行聚合反應,亦可含有光聚合起始劑(H)。[Photopolymerization initiator (H)] When the composition (III-1) and the thermosetting resin film contain the energy ray curable resin (G), in order to efficiently carry out the polymerization reaction of the energy ray curable resin (G), a photopolymerizable polymer may be included. Starter (H).
作為組成物(III-1)中的光聚合起始劑(H),例如可列舉:安息香、安息香甲醚、安息香乙醚、安息香異丙醚、安息香異丁醚、安息香苯甲酸、安息香苯甲酸甲酯、安息香二甲基縮酮等安息香化合物;苯乙酮、2-羥基-2-甲基-1-苯基-丙烷-1-酮、2,2-二甲氧基-1,2-二苯基乙烷-1-酮等苯乙酮化合物;雙(2,4,6-三甲基苯甲醯基)苯基氧化膦、2,4,6-三甲基苯甲醯基二苯基氧化膦等醯基氧化膦化合物;苄基苯基硫醚、一硫化四甲基秋蘭姆等硫醚化合物;1-羥基環己基苯基酮等α-酮醇化合物;偶氮雙異丁腈等偶氮化合物;二茂鈦等二茂鈦化合物;噻噸酮等噻噸酮化合物;過氧化物化合物;二乙醯等二酮化合物;苯偶醯;二苯偶醯;二苯甲酮;2,4-二乙基噻噸酮;1,2-二苯基甲烷;2-羥基-2-甲基-1-[4-(1-甲基乙烯基)苯基]丙酮;2-氯蒽醌等。 另外,作為前述光聚合起始劑,例如亦可列舉:1-氯蒽醌等醌化合物;胺等光增感劑等。Examples of the photopolymerization initiator (H) in the composition (III-1) include benzoin, benzoin methyl ether, benzoin ethyl ether, benzoin isopropyl ether, benzoin isobutyl ether, benzoic acid, and benzoin benzoic acid methyl ether. Benzoin compounds such as ester, benzoin dimethyl ketal; acetophenone, 2-hydroxy-2-methyl-1-phenyl-propan-1-one, 2,2-dimethoxy-1,2-di Acetophenone compounds such as phenylethane-1-one; bis(2,4,6-trimethylbenzoyl)phenylphosphine oxide, 2,4,6-trimethylbenzoyldiphenyl Phosphine oxide compounds such as phosphine oxide; thioether compounds such as benzylphenyl sulfide and tetramethylthiuram monosulfide; α-ketool compounds such as 1-hydroxycyclohexylphenyl ketone; azobisisobutyl Azo compounds such as nitriles; titanocene compounds such as titanocene; thioxanthone compounds such as thioxanthone; peroxide compounds; diketone compounds such as diethyl; benzoyl; diphenyl chloride; benzophenone ;2,4-diethylthioxanthone;1,2-diphenylmethane;2-hydroxy-2-methyl-1-[4-(1-methylvinyl)phenyl]propanone;2- Chloranthraquinone, etc. Examples of the photopolymerization initiator include quinone compounds such as 1-chloroanthraquinone and photosensitizers such as amines.
組成物(III-1)及熱硬化性樹脂膜所含有之光聚合起始劑(H)可僅為1種,亦可為2種以上,於為2種以上之情形時,這些的組合及比率可任意選擇。The photopolymerization initiator (H) contained in the composition (III-1) and the thermosetting resin film may be only one type, or may be two or more types. In the case of two or more types, the combination of these and The ratio can be chosen arbitrarily.
於使用光聚合起始劑(H)之情形時,組成物(III-1)中,光聚合起始劑(H)的含量相對於能量線硬化性樹脂(G)的含量100質量份,例如可為0.1質量份至20質量份、1質量份至10質量份、及2質量份至5質量份之任一種。When a photopolymerization initiator (H) is used, the content of the photopolymerization initiator (H) in the composition (III-1) is 100 parts by mass relative to the content of the energy ray curable resin (G), for example It may be any one of 0.1 to 20 parts by mass, 1 to 10 parts by mass, and 2 to 5 parts by mass.
[著色劑(I)] 組成物(III-1)及熱硬化性樹脂膜亦可含有著色劑(I)。 作為著色劑(I),例如可列舉無機系顏料、有機系顏料、有機系染料等公知的著色劑。[Color(I)] The composition (III-1) and the thermosetting resin film may contain the colorant (I). Examples of the colorant (I) include known colorants such as inorganic pigments, organic pigments, and organic dyes.
作為前述有機系顏料及有機系染料,例如可列舉:銨系色素、花青系色素、部花青系色素、克酮鎓(croconium)系色素、方酸鎓(squalilium)系色素、薁鎓系色素、聚次甲基系色素、萘醌系色素、吡喃鎓系色素、酞菁系色素、萘酞菁系色素、萘內醯胺系色素、偶氮系色素、縮合偶氮系色素、靛藍系色素、紫環酮(perinone)系色素、苝系色素、二噁嗪系色素、喹吖啶酮系色素、異吲哚啉酮系色素、喹啉黃(quinophthalone)系色素、吡咯系色素、硫代靛藍系色素、金屬錯合物系色素(金屬錯鹽染料)、二硫醇金屬錯合物系色素、吲哚酚系色素、三烯丙基甲烷系色素、蒽醌系色素、萘酚系色素、次甲基偶氮系色素、苯并咪唑酮系色素、皮蒽酮系色素及士林(threne)系色素等。Examples of the organic pigments and organic dyes include ammonium pigments, cyanine pigments, merocyanine pigments, croconium pigments, squalilium pigments, and azulium pigments. Pigments, polymethine pigments, naphthoquinone pigments, pyranium pigments, phthalocyanine pigments, naphthalocyanine pigments, naphtholactam pigments, azo pigments, condensed azo pigments, indigo Pigments, perinone pigments, perylene pigments, dioxazine pigments, quinacridone pigments, isoindolinone pigments, quinophthalone pigments, pyrrole pigments, Thioindigo-based pigments, metal complex-based pigments (metal complex dyes), dithiol metal complex-based pigments, indoxyl-based pigments, triallylmethane-based pigments, anthraquinone-based pigments, naphthols pigments, methine azo pigments, benzimidazolone pigments, picanthrone pigments and threne pigments, etc.
作為前述無機系顏料,例如可列舉:碳黑、鈷系色素、鐵系色素、鉻系色素、鈦系色素、釩系色素、鋯系色素、鉬系色素、釕系色素、鉑系色素、ITO(Indium Tin Oxide;氧化銦錫)系色素、ATO(Antimony Tin Oxide;氧化銻錫)系色素等。Examples of the inorganic pigment include carbon black, cobalt-based pigments, iron-based pigments, chromium-based pigments, titanium-based pigments, vanadium-based pigments, zirconium-based pigments, molybdenum-based pigments, ruthenium-based pigments, platinum-based pigments, and ITO (Indium Tin Oxide; indium tin oxide) pigments, ATO (Antimony Tin Oxide; antimony tin oxide) pigments, etc.
組成物(III-1)及熱硬化性樹脂膜所含有之著色劑(I)可僅為1種,亦可為2種以上,於為2種以上之情形時,這些的組合及比率可任意選擇。The colorant (I) contained in the composition (III-1) and the thermosetting resin film may be only one type, or may be two or more types. In the case of two or more types, the combination and ratio of these may be arbitrary. select.
於使用著色劑(I)之情形時,熱硬化性樹脂膜中的著色劑(I)的含量根據目的適宜調節即可。例如,組成物(III-1)中,著色劑(I)的含量相對於溶媒以外的全部成分的總含量之比例(亦即熱硬化性樹脂膜中的著色劑(I)的含量相對於熱硬化性樹脂膜的總質量之比例)可為0.1質量%至5質量%。藉由前述比例為前述下限值以上,能更顯著地獲得由使用著色劑(I)所帶來之效果。藉由前述比例為前述上限值以下,熱硬化性樹脂膜之透光性之過度降低得到抑制。When using the colorant (I), the content of the colorant (I) in the thermosetting resin film may be appropriately adjusted depending on the purpose. For example, in the composition (III-1), the ratio of the content of the colorant (I) to the total content of all components except the solvent (that is, the ratio of the content of the colorant (I) in the thermosetting resin film to the total content of the thermosetting resin film) The ratio of the total mass of the curable resin film) may be 0.1% by mass to 5% by mass. When the ratio is equal to or higher than the lower limit, the effect of using the colorant (I) can be more significantly obtained. When the ratio is equal to or less than the upper limit, excessive decrease in the light transmittance of the thermosetting resin film is suppressed.
[通用添加劑(J)] 組成物(III-1)及熱硬化性樹脂膜亦可在無損本發明的效果之範圍內,含有通用添加劑(J)。 通用添加劑(J)可為公知的化合物,可根據目的任意選擇,並無特別限定,作為較佳的通用添加劑(J),例如可列舉:塑化劑、抗靜電劑、抗氧化劑、吸氣劑(gettering agent)等。[General Additive(J)] The composition (III-1) and the thermosetting resin film may contain a general-purpose additive (J) within a range that does not impair the effects of the present invention. The general-purpose additive (J) can be a well-known compound, and can be selected arbitrarily according to the purpose, and is not particularly limited. Examples of preferred general-purpose additives (J) include plasticizers, antistatic agents, antioxidants, and getters. (gettering agent) etc.
組成物(III-1)及熱硬化性樹脂膜所含有之通用添加劑(J)可僅為1種,亦可為2種以上,於為2種以上之情形時,這些的組合及比率可任意選擇。 組成物(III-1)及熱硬化性樹脂膜中的通用添加劑(J)的含量並無特別限定,根據目的適宜選擇即可。The general additive (J) contained in the composition (III-1) and the thermosetting resin film may be only one type, or may be two or more types. In the case of two or more types, the combination and ratio of these may be arbitrary. select. The content of the general-purpose additive (J) in the composition (III-1) and the thermosetting resin film is not particularly limited and may be appropriately selected depending on the purpose.
[溶媒] 組成物(III-1)較佳為進而含有溶媒。含有溶媒之組成物(III-1)的操作性變得良好。 前述溶媒並無特別限定,作為較佳的前述溶媒,例如可列舉:甲苯、二甲苯等烴;甲醇、乙醇、2-丙醇、異丁醇(2-甲基丙烷-1-醇)、1-丁醇等醇;乙酸乙酯等酯;丙酮、甲基乙基酮等酮;四氫呋喃等醚;二甲基甲醯胺、N-甲基吡咯啶酮等醯胺(具有醯胺鍵之化合物)等。 組成物(III-1)所含有之溶媒可僅為1種,亦可為2種以上,於為2種以上之情形時,這些的組合及比率可任意選擇。[solvent] The composition (III-1) preferably further contains a solvent. The composition (III-1) containing a solvent has good operability. The solvent is not particularly limited. Examples of preferred solvents include: hydrocarbons such as toluene and xylene; methanol, ethanol, 2-propanol, isobutanol (2-methylpropan-1-ol), 1 -Alcohols such as butanol; esters such as ethyl acetate; ketones such as acetone and methyl ethyl ketone; ethers such as tetrahydrofuran; amide such as dimethylformamide and N-methylpyrrolidone (compounds with amide bonds )wait. The solvent contained in the composition (III-1) may be only one type, or may be two or more types. In the case of two or more types, the combination and ratio of these solvents may be selected arbitrarily.
就能夠使組成物(III-1)中的含有成分更均勻地混合之方面而言,組成物(III-1)所含有之溶媒較佳為甲基乙基酮等。From the viewpoint that the components contained in the composition (III-1) can be mixed more uniformly, the solvent contained in the composition (III-1) is preferably methyl ethyl ketone or the like.
組成物(III-1)中的溶媒的含量並無特別限定,例如根據溶媒以外的成分的種類適宜選擇即可。The content of the solvent in the composition (III-1) is not particularly limited, and may be appropriately selected depending on the types of components other than the solvent, for example.
作為本實施形態的較佳的熱硬化性樹脂膜的一例,可列舉以下之熱硬化性樹脂膜:係藉由下述方式而用於形成第1保護膜:將前述熱硬化性樹脂膜貼附於工件中之具有突狀電極之面並使之熱硬化,藉此於前述面形成第1保護膜;前述熱硬化性樹脂膜含有具有環氧基之丙烯酸樹脂以外的2種以上之熱硬化性成分;前述熱硬化性樹脂膜中的全部種類的前述熱硬化性成分的合計含量相對於前述熱硬化性樹脂膜的總質量之比例為40質量%以上,且針對前述熱硬化性樹脂膜所含有之前述熱硬化性成分,按照每一種類求出由下述式所算出之X值,當求出前述熱硬化性樹脂膜所含有之全部種類的前述熱硬化性成分中的前述X值的合計值時,前述合計值成為400g/eq以下。 X=[熱硬化性成分的熱硬化反應相關的官能基的當量(g/eq)]×[熱硬化性樹脂膜的熱硬化性成分的含量(質量份)]/[熱硬化性樹脂膜的全部種類的熱硬化性成分的合計含量(質量份)]。 厚度為200μm之1層之前述熱硬化性樹脂膜或將厚度未達200μm之前述熱硬化性樹脂膜積層2層以上而構成之合計厚度為200μm之積層膜對於波長1342nm之光之透過率為50%以上。As an example of a preferred thermosetting resin film of this embodiment, the following thermosetting resin film can be cited: it is used to form a first protective film by attaching the aforementioned thermosetting resin film The surface of the workpiece having the protruding electrode is thermally cured, thereby forming a first protective film on the surface; the thermosetting resin film contains two or more types of thermosetting properties other than acrylic resin having an epoxy group. Component; the total content of all types of the thermosetting components in the thermosetting resin film is 40% by mass or more relative to the total mass of the thermosetting resin film, and the thermosetting resin film contains The X value calculated from the following formula is calculated for each type of the thermosetting component. When the total X value of all types of the thermosetting components contained in the thermosetting resin film is calculated, value, the aforementioned total value becomes 400g/eq or less. X = [equivalent of functional groups related to the thermosetting reaction of the thermosetting component (g/eq)] × [content of the thermosetting component of the thermosetting resin film (parts by mass)]/[of the thermosetting resin film Total content (parts by mass) of all types of thermosetting ingredients]. One layer of the aforementioned thermosetting resin film with a thickness of 200 μm or a laminated film with a total thickness of 200 μm formed by laminating two or more layers of the aforementioned thermosetting resin film with a thickness less than 200 μm has a transmittance of 50 for light with a wavelength of 1342 nm. %above.
作為本實施形態的較佳的熱硬化性樹脂膜的另一例,可列舉以下之熱硬化性樹脂膜:係藉由下述方式而用於形成第1保護膜:將前述熱硬化性樹脂膜貼附於工件中之具有突狀電極之面並使之熱硬化,藉此於前述面形成第1保護膜;前述熱硬化性樹脂膜含有:聚合物成分(A)、具有環氧基之丙烯酸樹脂以外的2種以上之熱硬化性成分、及填充材料(D);前述熱硬化性成分由環氧樹脂(B1)及熱硬化劑(B2)所構成;前述熱硬化性樹脂膜中的全部種類的前述熱硬化性成分的合計含量(換言之,前述環氧樹脂(B1)及熱硬化劑(B2)的總含量)相對於前述熱硬化性樹脂膜的總質量之比例為40質量%以上;前述熱硬化性樹脂膜中的前述聚合物成分(A)的含量相對於前述熱硬化性樹脂膜的總質量之比例為5質量%至30質量%;前述熱硬化性樹脂膜中的前述填充材料(D)的含量相對於前述熱硬化性樹脂膜的總質量之比例為5質量%至20質量%;針對前述熱硬化性樹脂膜所含有之前述熱硬化性成分,按照每一種類求出由下述式所算出之X值,當求出前述熱硬化性樹脂膜所含有之全部種類的前述熱硬化性成分中的前述X值的合計值時,前述合計值成為400g/eq以下。 X=[熱硬化性成分的熱硬化反應相關的官能基的當量(g/eq)]×[熱硬化性樹脂膜的熱硬化性成分的含量(質量份)]/[熱硬化性樹脂膜的全部種類的熱硬化性成分的合計含量(質量份)]。Another example of a preferred thermosetting resin film of this embodiment is a thermosetting resin film used to form a first protective film in the following manner: the thermosetting resin film is pasted The first protective film is formed on the workpiece by attaching it to the surface with the protruding electrode and thermally hardening it. The thermosetting resin film contains: polymer component (A), acrylic resin with epoxy group Two or more thermosetting components and filler materials (D) other than the above; the aforementioned thermosetting component is composed of an epoxy resin (B1) and a thermosetting agent (B2); all types of the aforementioned thermosetting resin film The ratio of the total content of the thermosetting components (in other words, the total content of the epoxy resin (B1) and the thermosetting agent (B2)) to the total mass of the thermosetting resin film is 40 mass % or more; The content of the polymer component (A) in the thermosetting resin film is 5 to 30 mass% relative to the total mass of the thermosetting resin film; the filler (A) in the thermosetting resin film is The content of D) is 5% to 20% by mass relative to the total mass of the thermosetting resin film; the thermosetting component contained in the thermosetting resin film is calculated for each type as follows: When the X value calculated by the above formula is the total value of the X value in all types of the thermosetting components contained in the thermosetting resin film, the total value is 400 g/eq or less. X = [equivalent of functional groups related to the thermosetting reaction of the thermosetting component (g/eq)] × [content of the thermosetting component of the thermosetting resin film (parts by mass)]/[of the thermosetting resin film Total content (parts by mass) of all types of thermosetting ingredients].
作為本實施形態的較佳的熱硬化性樹脂膜的另一例,可列舉以下之熱硬化性樹脂膜,係藉由下述方式而用於形成第1保護膜:將前述熱硬化性樹脂膜貼附於工件中之具有突狀電極之面並使之熱硬化,藉此於前述面形成第1保護膜;前述熱硬化性樹脂膜含有:聚合物成分(A)、具有環氧基之丙烯酸樹脂以外的2種以上之熱硬化性成分、及填充材料(D);前述熱硬化性成分由環氧樹脂(B1)及熱硬化劑(B2)所構成;前述熱硬化性樹脂膜中的全部種類的前述熱硬化性成分的合計含量(換言之,前述環氧樹脂(B1)及熱硬化劑(B2)的總含量)相對於前述熱硬化性樹脂膜的總質量之比例為40質量%以上;前述熱硬化性樹脂膜中的前述聚合物成分(A)的含量相對於前述熱硬化性樹脂膜的總質量之比例為5質量%至30質量%;前述熱硬化性樹脂膜中的前述填充材料(D)的含量相對於前述熱硬化性樹脂膜的總質量之比例為5質量%至20質量%;針對前述熱硬化性樹脂膜所含有之前述熱硬化性成分,按照每一種類求出由下述式所算出之X值,當求出前述熱硬化性樹脂膜所含有之全部種類的前述熱硬化性成分中的前述X值的合計值時,前述合計值成為400g/eq以下。 X=[熱硬化性成分的熱硬化反應相關的官能基的當量(g/eq)]×[熱硬化性樹脂膜的熱硬化性成分的含量(質量份)]/[熱硬化性樹脂膜的全部種類的熱硬化性成分的合計含量(質量份)]。 厚度為200μm之1層之前述熱硬化性樹脂膜或將厚度未達200μm之前述熱硬化性樹脂膜積層2層以上而構成之合計厚度為200μm之積層膜對於波長1342nm之光之透過率為50%以上。As another example of the preferred thermosetting resin film of this embodiment, the following thermosetting resin film can be cited, which is used to form the first protective film in the following manner: the aforementioned thermosetting resin film is attached The first protective film is formed on the workpiece by attaching it to the surface with the protruding electrode and thermally hardening it. The thermosetting resin film contains: polymer component (A), acrylic resin with epoxy group Two or more thermosetting components and filler materials (D) other than the above; the aforementioned thermosetting component is composed of an epoxy resin (B1) and a thermosetting agent (B2); all types of the aforementioned thermosetting resin film The ratio of the total content of the thermosetting components (in other words, the total content of the epoxy resin (B1) and the thermosetting agent (B2)) to the total mass of the thermosetting resin film is 40 mass % or more; The content of the polymer component (A) in the thermosetting resin film is 5 to 30 mass% relative to the total mass of the thermosetting resin film; the filler (A) in the thermosetting resin film is The content of D) is 5% to 20% by mass relative to the total mass of the thermosetting resin film; the thermosetting component contained in the thermosetting resin film is calculated for each type as follows: When the X value calculated by the above formula is the total value of the X value in all types of the thermosetting components contained in the thermosetting resin film, the total value is 400 g/eq or less. X = [equivalent of functional groups related to the thermosetting reaction of the thermosetting component (g/eq)] × [content of the thermosetting component of the thermosetting resin film (parts by mass)]/[of the thermosetting resin film Total content (parts by mass) of all types of thermosetting ingredients]. One layer of the aforementioned thermosetting resin film with a thickness of 200 μm or a laminated film with a total thickness of 200 μm formed by laminating two or more layers of the aforementioned thermosetting resin film with a thickness less than 200 μm has a transmittance of 50 for light with a wavelength of 1342 nm. %above.
作為本實施形態的較佳的熱硬化性樹脂膜的另一例,可列舉以下之熱硬化性樹脂膜:係藉由下述方式而用於形成第1保護膜:將前述熱硬化性樹脂膜貼附於工件中之具有突狀電極之面並使之熱硬化,藉此於前述面形成第1保護膜;前述熱硬化性樹脂膜含有:聚合物成分(A)、具有環氧基之丙烯酸樹脂以外的2種以上之熱硬化性成分、及填充材料(D);前述熱硬化性成分由環氧樹脂(B1)及熱硬化劑(B2)所構成;前述熱硬化性樹脂膜中的全部種類的前述熱硬化性成分的合計含量(換言之,前述環氧樹脂(B1)及熱硬化劑(B2)的總含量)相對於前述熱硬化性樹脂膜的總質量之比例為40質量%以上;前述熱硬化性樹脂膜中的前述聚合物成分(A)的含量相對於前述熱硬化性樹脂膜的總質量之比例為5質量%至30質量%;前述熱硬化性樹脂膜中的前述填充材料(D)的含量相對於前述熱硬化性樹脂膜的總質量之比例為5質量%至20質量%;針對前述熱硬化性樹脂膜所含有之前述熱硬化性成分,按照每一種類求出由下述式所算出之X值,當求出前述熱硬化性樹脂膜所含有之全部種類的前述熱硬化性成分中的前述X值的合計值時,前述合計值成為400g/eq以下;藉由將前述熱硬化性樹脂膜於130℃加熱2小時使之熱硬化而獲得大小為20mm×130mm且厚度為40μm之第1保護膜,使用所獲得之第1保護膜,將夾具間距離設為80mm,將拉伸速度設為200mm/min,藉由前述夾具將前述第1保護膜沿相對於該第1保護膜的表面呈平行的方向拉伸時的前述第1保護膜的斷裂強度為55MPa以下。 X=[熱硬化性成分的熱硬化反應相關的官能基的當量(g/eq)]×[熱硬化性樹脂膜的熱硬化性成分的含量(質量份)]/[熱硬化性樹脂膜的全部種類的熱硬化性成分的合計含量(質量份)]。Another example of a preferred thermosetting resin film of this embodiment is a thermosetting resin film used to form a first protective film in the following manner: the thermosetting resin film is pasted The first protective film is formed on the workpiece by attaching it to the surface with the protruding electrode and thermally hardening it. The thermosetting resin film contains: polymer component (A), acrylic resin with epoxy group Two or more thermosetting components and filler materials (D) other than the above; the aforementioned thermosetting component is composed of an epoxy resin (B1) and a thermosetting agent (B2); all types of the aforementioned thermosetting resin film The ratio of the total content of the thermosetting components (in other words, the total content of the epoxy resin (B1) and the thermosetting agent (B2)) to the total mass of the thermosetting resin film is 40 mass % or more; The content of the polymer component (A) in the thermosetting resin film is 5 to 30 mass% relative to the total mass of the thermosetting resin film; the filler (A) in the thermosetting resin film is The content of D) is 5% to 20% by mass relative to the total mass of the thermosetting resin film; the thermosetting component contained in the thermosetting resin film is calculated for each type as follows: When the X value calculated by the above formula is the total value of the X value in all types of the thermosetting components contained in the thermosetting resin film, the total value becomes 400 g/eq or less; by The aforementioned thermosetting resin film was heated at 130° C. for 2 hours to thermoset to obtain a first protective film with a size of 20 mm × 130 mm and a thickness of 40 μm. Using the obtained first protective film, the distance between the clamps was set to 80 mm. When the stretching speed is 200 mm/min and the first protective film is stretched in a direction parallel to the surface of the first protective film by the clamp, the breaking strength of the first protective film is 55 MPa or less. X = [equivalent of functional groups related to the thermosetting reaction of the thermosetting component (g/eq)] × [content of the thermosetting component of the thermosetting resin film (parts by mass)]/[of the thermosetting resin film Total content (parts by mass) of all types of thermosetting ingredients].
作為本實施形態的較佳的熱硬化性樹脂膜的另一例,可列舉以下之熱硬化性樹脂膜:係藉由下述方式而用於形成第1保護膜:將前述熱硬化性樹脂膜貼附於工件中之具有突狀電極之面並使之熱硬化,藉此於前述面形成第1保護膜;前述熱硬化性樹脂膜含有:聚合物成分(A)、具有環氧基之丙烯酸樹脂以外的2種以上之熱硬化性成分、及填充材料(D);前述熱硬化性成分由環氧樹脂(B1)及熱硬化劑(B2)所構成;前述熱硬化性樹脂膜中的全部種類的前述熱硬化性成分的合計含量(換言之,前述環氧樹脂(B1)及熱硬化劑(B2)的總含量)相對於前述熱硬化性樹脂膜的總質量之比例為40質量%以上;前述熱硬化性樹脂膜中的前述聚合物成分(A)的含量相對於前述熱硬化性樹脂膜的總質量之比例為5質量%至30質量%;前述熱硬化性樹脂膜中的前述填充材料(D)的含量相對於前述熱硬化性樹脂膜的總質量之比例為5質量%至20質量%;針對前述熱硬化性樹脂膜所含有之前述熱硬化性成分,按照每一種類求出由下述式所算出之X值,當求出前述熱硬化性樹脂膜所含有之全部種類的前述熱硬化性成分中的前述X值的合計值時,前述合計值成為400g/eq以下。 X=[熱硬化性成分的熱硬化反應相關的官能基的當量(g/eq)]×[熱硬化性樹脂膜的熱硬化性成分的含量(質量份)]/[熱硬化性樹脂膜的全部種類的熱硬化性成分的合計含量(質量份)]。 厚度為200μm之1層之前述熱硬化性樹脂膜或將厚度未達200μm之前述熱硬化性樹脂膜積層2層以上而構成之合計厚度為200μm之積層膜對於波長1342nm之光之透過率為50%以上;藉由將前述熱硬化性樹脂膜於130℃加熱2小時使之熱硬化而獲得大小為20mm×130mm且厚度為40μm之第1保護膜,使用所獲得之第1保護膜,將夾具間距離設為80mm,將拉伸速度設為200mm/min,藉由前述夾具將前述第1保護膜沿相對於該第1保護膜的表面呈平行的方向拉伸時的前述第1保護膜的斷裂強度為55MPa以下。Another example of a preferred thermosetting resin film of this embodiment is a thermosetting resin film used to form a first protective film in the following manner: the thermosetting resin film is pasted The first protective film is formed on the workpiece by attaching it to the surface with the protruding electrode and thermally hardening it. The thermosetting resin film contains: polymer component (A), acrylic resin with epoxy group Two or more thermosetting components and filler materials (D) other than the above; the aforementioned thermosetting component is composed of an epoxy resin (B1) and a thermosetting agent (B2); all types of the aforementioned thermosetting resin film The ratio of the total content of the thermosetting components (in other words, the total content of the epoxy resin (B1) and the thermosetting agent (B2)) to the total mass of the thermosetting resin film is 40 mass % or more; The content of the polymer component (A) in the thermosetting resin film is 5 to 30 mass% relative to the total mass of the thermosetting resin film; the filler (A) in the thermosetting resin film is The content of D) is 5% to 20% by mass relative to the total mass of the thermosetting resin film; the thermosetting component contained in the thermosetting resin film is calculated for each type as follows: When the X value calculated by the above formula is the total value of the X value in all types of the thermosetting components contained in the thermosetting resin film, the total value is 400 g/eq or less. X = [equivalent of functional groups related to the thermosetting reaction of the thermosetting component (g/eq)] × [content of the thermosetting component of the thermosetting resin film (parts by mass)]/[of the thermosetting resin film Total content (parts by mass) of all types of thermosetting ingredients]. One layer of the aforementioned thermosetting resin film with a thickness of 200 μm or a laminated film with a total thickness of 200 μm formed by laminating two or more layers of the aforementioned thermosetting resin film with a thickness less than 200 μm has a transmittance of 50 for light with a wavelength of 1342 nm. % or more; by heating the aforementioned thermosetting resin film at 130°C for 2 hours to thermoset, a first protective film with a size of 20 mm × 130 mm and a thickness of 40 μm was obtained. Using the obtained first protective film, the clamp was The distance is set to 80 mm, the stretching speed is set to 200 mm/min, and the first protective film is stretched by the clamp in a direction parallel to the surface of the first protective film. The breaking strength is 55MPa or less.
[熱硬化性樹脂層形成用組成物之製造方法] 組成物(III-1)等熱硬化性樹脂層形成用組成物藉由調配用以構成該組成物之各成分而獲得。 調配各成分時的添加順序並無特別限定,亦可同時添加2種以上之成分。 於使用溶媒之情形時,可藉由下述方式使用:將溶媒與溶媒以外的任一種調配成分混合而將該調配成分預先稀釋;或是不將溶媒以外的任一種調配成分預先稀釋而是將溶媒與這些調配成分混合。 調配時混合各成分之方法並無特別限定,自以下公知的方法中適宜選擇即可:使攪拌子或攪拌翼等旋轉而進行混合之方法;使用混合機進行混合之方法;施加超音波進行混合之方法等。 關於添加及混合各成分時的溫度及時間,只要不使各調配成分劣化,則並無特別限定,適宜調節即可,溫度較佳為15℃至30℃。[Method for manufacturing composition for forming thermosetting resin layer] A composition for forming a thermosetting resin layer such as composition (III-1) is obtained by blending each component constituting the composition. The order in which each component is added is not particularly limited, and two or more components may be added at the same time. When using a solvent, it can be used in the following manner: mixing the solvent with any preparation ingredients other than the solvent and diluting the preparation ingredients in advance; or not diluting any preparation ingredients other than the solvent in advance but The solvent is mixed with these formulation ingredients. The method of mixing each component during preparation is not particularly limited, and can be appropriately selected from the following known methods: mixing by rotating a stirrer or stirring blade, mixing with a mixer, and mixing by applying ultrasonic waves. methods, etc. The temperature and time when adding and mixing each component are not particularly limited as long as the components are not deteriorated and can be adjusted appropriately. The temperature is preferably 15°C to 30°C.
◇第1保護膜形成用片之製造方法 前述第1保護膜形成用片可藉由將上述各層以成為對應的位置關係之方式依序積層而製造。各層的形成方法如上文所說明。 例如,於製造第1支撐片時,於第1基材上積層第1黏著劑層或第1中間層之情形時,於第1基材上塗敷上述之第1黏著劑組成物或第1中間層形成用組成物,視需要使之乾燥或照射能量線,藉此能夠積層第1黏著劑層或第1中間層。◇Method for manufacturing the first protective film forming sheet The said 1st protective film formation sheet can be manufactured by laminating|stacking each said layer sequentially so that it may become a corresponding positional relationship. The formation method of each layer is as described above. For example, when the first adhesive layer or the first intermediate layer is laminated on the first base material when manufacturing the first support sheet, the above-mentioned first adhesive composition or first intermediate layer is coated on the first base material. The layer-forming composition can be laminated by drying or irradiating energy rays as necessary, thereby laminating the first adhesive layer or the first intermediate layer.
另一方面,例如於已積層於第1基材上之第1黏著劑層上,進而積層熱硬化性樹脂層(熱硬化性樹脂膜)之情形時,可於第1黏著劑層上塗敷熱硬化性樹脂層形成用組成物,直接形成熱硬化性樹脂層。同樣地,於已積層於第1基材上之第1中間層上,進而積層第1黏著劑層之情形時,可於第1中間層上塗敷第1黏著劑組成物,直接形成第1黏著劑層。如此,於使用任一種組成物形成連續之2層之積層結構之情形時,可於由前述組成物所形成之層上,進而塗敷另一組成物而重新形成層。其中,較佳為這些2層中之後積層的層於另一剝離膜上使用前述組成物而預先形成,使該已形成之層中之與前述剝離膜接觸之側為相反側的露出面與既已形成之剩餘層的露出面貼合,藉此形成連續之2層之積層結構。此時,前述組成物較佳為塗敷於剝離膜的剝離處理面。於形成積層結構後,視需要移除剝離膜即可。On the other hand, for example, when a thermosetting resin layer (thermosetting resin film) is laminated on the first adhesive layer that has been laminated on the first base material, the first adhesive layer may be coated with heat The composition for forming a curable resin layer directly forms a thermosetting resin layer. Similarly, when the first adhesive layer is further laminated on the first intermediate layer that has been laminated on the first base material, the first adhesive composition can be applied on the first intermediate layer to directly form the first adhesive layer. agent layer. In this way, when any one composition is used to form a continuous two-layer laminated structure, another composition can be applied on the layer formed of the aforementioned composition to form a new layer. Among these two layers, it is preferable that the layer laminated later is formed in advance on another release film using the aforementioned composition so that the exposed surface of the formed layer is opposite to the side in contact with the release film. The exposed surfaces of the remaining layers that have been formed are bonded together to form a continuous two-layer laminated structure. At this time, the composition is preferably applied to the release-treated surface of the release film. After the laminated structure is formed, the release film can be removed if necessary.
例如,於製造於第1基材上積層第1黏著劑層且於前述第1黏著劑層上積層熱硬化性樹脂層而成之第1保護膜形成用片(第1支撐片為第1基材及第1黏著劑層之積層物之第1保護膜形成用片)之情形時,於第1基材上塗敷第1黏著劑組成物,視需要使之乾燥,藉此於第1基材上預先積層第1黏著劑層,另行於剝離膜上塗敷熱硬化性樹脂層形成用組成物,視需要使之乾燥,藉此於剝離膜上預先形成熱硬化性樹脂層,使該熱硬化性樹脂層的露出面與已積層於第1基材上之第1黏著劑層的露出面貼合,將熱硬化性樹脂層積層於第1黏著劑層上,藉此獲得第1保護膜形成用片。 另外,例如於製造於第1基材上積層第1中間層且於前述第1中間層上積層第1黏著劑層而成之第1支撐片之情形時,於第1基材上塗敷第1中間層形成用組成物,視需要使之乾燥或照射能量線,藉此於第1基材上預先積層第1中間層,另行於剝離膜上塗敷第1黏著劑組成物,視需要使之乾燥,藉此於剝離膜上預先形成第1黏著劑層,使該第1黏著劑層的露出面與已積層於第1基材上之第1中間層的露出面貼合,將第1黏著劑層積層於第1中間層上,藉此獲得第1支撐片。該情形時,例如進而另行於剝離膜上塗敷熱硬化性樹脂層形成用組成物,視需要使之乾燥,藉此於剝離膜上預先形成硬化性樹脂層,使該硬化性樹脂層的露出面與已積層於第1中間層上之第1黏著劑層的露出面貼合,將熱硬化性樹脂層積層於第1黏著劑層上,藉此獲得第1保護膜形成用片。For example, a first protective film forming sheet (the first support sheet is the first base material) is manufactured by laminating a first adhesive layer on a first base material and laminating a thermosetting resin layer on the first adhesive layer. When the first protective film forming sheet is a laminate of a material and a first adhesive layer), apply the first adhesive composition on the first base material and dry it if necessary, thereby coating the first base material The first adhesive layer is preliminarily laminated on the release film, and a thermosetting resin layer-forming composition is separately applied to the release film and dried if necessary, thereby forming a thermosetting resin layer on the release film in advance to make the thermosetting resin layer The exposed surface of the resin layer is bonded to the exposed surface of the first adhesive layer laminated on the first base material, and the thermosetting resin layer is laminated on the first adhesive layer to obtain the first protective film. piece. In addition, for example, when manufacturing a first support sheet in which a first intermediate layer is laminated on a first base material and a first adhesive layer is laminated on the first intermediate layer, the first support sheet is coated on the first base material. The composition for forming the intermediate layer is preliminarily laminated on the first base material by drying or irradiating energy rays as necessary, and the first adhesive composition is separately applied to the release film and dried as necessary. , whereby a first adhesive layer is formed in advance on the release film, and the exposed surface of the first adhesive layer is bonded to the exposed surface of the first intermediate layer laminated on the first base material, and the first adhesive layer is The first intermediate layer is laminated to obtain a first support sheet. In this case, for example, a thermosetting resin layer-forming composition is further separately applied to the release film and dried if necessary, thereby forming a curable resin layer on the release film in advance so that the exposed surface of the curable resin layer The exposed surface of the first adhesive layer laminated on the first intermediate layer is bonded together, and a thermosetting resin layer is laminated on the first adhesive layer, thereby obtaining a first protective film forming sheet.
此外,於第1基材上積層第1黏著劑層或第1中間層之情形時,如上所述,亦可代替於第1基材上塗敷第1黏著劑組成物或第1中間層形成用組成物之方法,而是於剝離膜上塗敷第1黏著劑組成物或第1中間層形成用組成物,視需要使之乾燥或照射能量線,藉此於剝離膜上預先形成第1黏著劑層或第1中間層,使這些層的露出面與第1基材的一表面貼合,藉此將第1黏著劑層或第1中間層積層於第1基材上。 任一方法中,剝離膜均於形成目標積層結構後的任意時間點移除即可。In addition, when the first adhesive layer or the first intermediate layer is laminated on the first base material, as mentioned above, the first adhesive composition or the first intermediate layer forming agent may be applied instead of the first base material. The method of forming a composition is to apply the first adhesive composition or the first intermediate layer forming composition on the release film, dry it or irradiate it with energy rays if necessary, thereby preforming the first adhesive on the release film. layer or the first intermediate layer, and the exposed surfaces of these layers are bonded to a surface of the first base material, thereby laminating the first adhesive layer or the first intermediate layer on the first base material. In either method, the release film can be removed at any time point after the target multilayer structure is formed.
如此,構成第1保護膜形成用片之第1基材以外的層均可以預先形成於剝離膜上,再貼合於目標層的表面之方法進行積層,因此視需要適宜選擇採用此種步驟之層,製造第1保護膜形成用片即可。In this way, the layers other than the first base material constituting the first protective film forming sheet can be formed on the release film in advance and then laminated by bonding them to the surface of the target layer. Therefore, it is appropriate to select the method of adopting this step as necessary. layer to produce the first protective film forming sheet.
此外,第1保護膜形成用片通常以於該片中之與第1支撐片為相反側的最表層(例如熱硬化性樹脂層)的面貼合有剝離膜之狀態保管。因此,亦可藉由下述方式而獲得第1保護膜形成用片:於該剝離膜(較佳為該剝離膜的剝離處理面)上塗敷熱硬化性樹脂層形成用組成物等用以形成構成最表層之層之組成物,視需要使之乾燥,藉此於剝離膜上預先形成構成最表層之層,以上述任一種方法於該層之與剝離膜接觸之側為相反側的露出面上積層剩餘各層,不移除剝離膜而保持貼合狀態不變。In addition, the first protective film forming sheet is usually stored in a state where a release film is bonded to the surface of the outermost layer (for example, the thermosetting resin layer) of the sheet that is opposite to the first support sheet. Therefore, the first protective film-forming sheet can also be obtained by applying a thermosetting resin layer-forming composition or the like on the release film (preferably the release-treated surface of the release film) to form the first protective film-forming sheet. The composition constituting the layer constituting the outermost layer is dried if necessary, whereby the layer constituting the outermost layer is preliminarily formed on the release film, and the exposed surface of the layer is opposite to the side in contact with the release film using any of the above methods. The remaining layers of the laminated layer remain attached without removing the peeling film.
作為第1支撐片,亦可使用市售品。As the first support piece, a commercially available product can also be used.
◇附第1保護膜之工件加工物之製造方法 使用本發明的一實施形態的熱硬化性樹脂膜或第1保護膜形成用片之情形時的附第1保護膜之工件加工物之製造方法具有以下之步驟:於工件中之具有突狀電極之面(亦即突狀電極形成面)貼附熱硬化性樹脂膜之步驟(本說明書中,有時簡稱為「貼附步驟」);使貼附後的前述熱硬化性樹脂膜熱硬化而形成第1保護膜之步驟(本說明書中,有時簡稱為「第1保護膜形成步驟」);對前述工件,自前述工件之具備前述第1保護膜之側,經由前述第1保護膜照射雷射光,藉此於前述工件的內部形成改質層之步驟(本說明書中,有時簡稱為「改質層形成步驟」);以及將形成前述改質層後的前述工件沿相對於前述工件的電路面呈平行的方向來與前述第1保護膜一起進行擴展,藉此於前述改質層之部位分割前述工件,並且切斷前述第1保護膜,獲得附第1保護膜之工件加工物,前述附第1保護膜之工件加工物係具備工件加工物、及形成於前述工件加工物中之具有前述突狀電極之面(亦即突狀電極形成面)之第1保護膜之步驟(本說明書中,有時簡稱為「分割及切斷步驟」)。 以下,一邊參照圖式,一邊對前述製造方法詳細地進行說明。◇Method for manufacturing workpiece with first protective film When using the thermosetting resin film or the first protective film forming sheet according to one embodiment of the present invention, a method for manufacturing a workpiece with a first protective film has the following steps: having a protruding electrode in the workpiece The step of attaching a thermosetting resin film to the surface (that is, the protruding electrode formation surface) (in this specification, sometimes referred to as the "attachment step"); the attached thermosetting resin film is thermally cured to The step of forming the first protective film (sometimes referred to as the "first protective film forming step" in this specification); irradiating the workpiece through the first protective film from the side of the workpiece having the first protective film Laser light is used to form a modified layer inside the workpiece (sometimes referred to as the "modified layer forming step" in this specification); and the edge of the workpiece after the modified layer is formed relative to the workpiece The circuit surface is expanded in a parallel direction together with the first protective film, thereby dividing the workpiece at the location of the modified layer, and cutting the first protective film to obtain a workpiece with a first protective film. ( In this manual, it may be referred to as "dividing and cutting steps"). Hereinafter, the aforementioned manufacturing method will be described in detail with reference to the drawings.
圖5A至圖5C及圖6A至圖6B係用於以示意方式說明前述附第1保護膜之工件加工物之製造方法之放大剖視圖。此處,對使用圖2所示之第1保護膜形成用片1之情形時的製造方法進行說明。5A to 5C and 6A to 6B are enlarged cross-sectional views for schematically explaining the method of manufacturing the workpiece with the first protective film. Here, the manufacturing method in the case of using the 1st protective film formation sheet 1 shown in FIG. 2 is demonstrated.
[貼附步驟]
前述貼附步驟中,如圖5A所示,於工件90的突狀電極形成面(亦即突狀電極91的表面91a及工件90的電路面90a)貼附熱硬化性樹脂膜12。藉由進行本步驟,從而熱硬化性樹脂膜12於所存在之複數個突狀電極91間展開,密接於突狀電極形成面,並且覆蓋突狀電極91的表面91a、尤其是工件90的電路面90a的附近部位的表面91a,將突狀電極91埋入,且能夠成為被覆這些區域之狀態。進而,藉由進行本步驟,突狀電極91之包含頭頂部910之上部貫通熱硬化性樹脂膜12,自熱硬化性樹脂膜12突出。[Attach steps]
In the aforementioned attaching step, as shown in FIG. 5A , the
貼附步驟中,例如亦可單獨使用熱硬化性樹脂膜12,但較佳為使用如此處所示之具備第1支撐片101、及設置於第1支撐片101上之熱硬化性樹脂膜12而構成之第1保護膜形成用片1。如後所述,於將工件90的內面90b進行研削之情形時,作為第1支撐片101,可使用背面研削用表面保護帶。In the attaching step, for example, the
貼附步驟中,於使用如此處所示之第1保護膜形成用片1之情形時,將第1保護膜形成用片1中的熱硬化性樹脂膜12貼附於工件90的突狀電極形成面,藉此將第1保護膜形成用片1本身貼附於工件90的突狀電極形成面即可。In the attaching step, when using the first protective film forming sheet 1 as shown here, the
此外,本說明書中,有時將如此處所示之於工件的突狀電極形成面貼附第1保護膜形成用片而構成之結構體稱為「第1積層結構體」。圖5A中,作為第1積層結構體201,顯示了於工件90的突狀電極形成面貼附第1保護膜形成用片1而構成之結構體。In addition, in this specification, the structure in which the first protective film forming sheet is attached to the protruding electrode formation surface of the workpiece as shown here may be referred to as the "first laminated structure". In FIG. 5A , as the first laminated structure 201 , there is shown a structure in which the first protective film forming sheet 1 is attached to the protruding electrode forming surface of the workpiece 90 .
貼附步驟中,將熱硬化性樹脂膜12中與工件90對向之側的露出面(本說明書中,有時稱為「第1面」)12a壓接於工件90的突狀電極形成面(亦即突狀電極91的表面91a及工件90的電路面90a),藉此能夠將熱硬化性樹脂膜12貼附於突狀電極形成面。In the attaching step, the exposed surface 12a of the
貼附步驟中,較佳為將熱硬化性樹脂膜12一邊加熱一邊貼附於突狀電極形成面。藉此,於熱硬化性樹脂膜12與突狀電極形成面之間、亦即熱硬化性樹脂膜12與工件90的電路面90a之間、以及熱硬化性樹脂膜12與突狀電極91的表面91a之間之任一處,均能夠進一步抑制產生空隙部。另外,能夠進一步抑制在突狀電極91之包含頭頂部910之上部殘留熱硬化性樹脂膜12,最終能夠進一步抑制在該上部殘留第1保護膜。In the attaching step, it is preferable to attach the
貼附時的熱硬化性樹脂膜12的加熱溫度只要不為過度高溫即可,例如較佳為60℃至100℃。此處,所謂「過度高溫」,意指例如熱硬化性樹脂膜12進行熱硬化等表現出熱硬化性樹脂膜12目標外的作用之溫度。The heating temperature of the
於將熱硬化性樹脂膜12貼附於突狀電極形成面時,對熱硬化性樹脂膜12所施加之壓力(本說明書中,有時稱為「貼附壓力」)較佳為0.3MPa至1MPa。When the
於藉由貼附步驟形成第1積層結構體201後,亦可將該第1積層結構體201直接用於後續步驟,視需要亦可藉由將工件90的背面90b進行研削而調節工件90的厚度。除了工件90的厚度不同之方面以外,將工件90的背面90b進行研削後的第1積層結構體201亦成為圖5A所示之狀態。After the first laminated structure 201 is formed through the attachment step, the first laminated structure 201 can also be directly used in subsequent steps. If necessary, the back surface 90b of the workpiece 90 can also be ground to adjust the surface area of the workpiece 90 . thickness. In addition to the difference in thickness of the workpiece 90, the first laminated structure 201 after grinding the back surface 90b of the workpiece 90 is also in the state shown in FIG. 5A.
可以使用研磨機之方法等公知的方法將工件90的背面90b進行研削。The back surface 90b of the workpiece 90 can be ground using a known method such as a grinder.
於將工件90的背面90b進行研削之前及進行研削之後的工件90之除了突狀電極91以外之部位的厚度如上文所說明。The thickness of the parts of the workpiece 90 other than the protruding electrode 91 before and after grinding the back surface 90b of the workpiece 90 is as described above.
於藉由貼附步驟形成第1積層結構體201後,自第1積層結構體201中的熱硬化性樹脂膜12移除第1支撐片101。於將工件90的背面90b進行研削之情形時,較佳為於該研削後,移除第1支撐片101。
藉由進行此種步驟,獲得如圖5B所示,於工件90的突狀電極形成面具備熱硬化性樹脂膜12,且不具備第1支撐片101而構成之第2積層結構體(換言之,附熱硬化性樹脂膜之工件)202。
第2積層結構體202中,突狀電極91之包含頭頂部910之上部貫通熱硬化性樹脂膜12而突出且露出。After the first laminated structure 201 is formed through the attachment step, the first supporting sheet 101 is removed from the
於第1黏著劑層13為能量線硬化性之情形時,較佳為藉由照射能量線使第1黏著劑層13硬化,使第1黏著劑層13的黏著性降低後,自熱硬化性樹脂膜12移除第1支撐片101。When the first
[第1保護膜形成步驟]
前述第1保護膜形成步驟中,使貼附後的熱硬化性樹脂膜12熱硬化,如圖5C所示,形成第1保護膜12'。
於形成第1積層結構體201之情形時,第1保護膜形成步驟可於移除第1支撐片101後進行。
另外,於將工件90的背面90b進行研削之情形時,第1保護膜形成步驟可於前述背面90b之研削後進行。
藉由進行本步驟,獲得於工件90的突狀電極形成面具備第1保護膜12'而構成之第3積層結構體(換言之,附第1保護膜之工件)203。圖5C中,符號12a'表示第1保護膜12'中之與工件90之接觸面(本說明書中,有時稱為「第1面」)。[First protective film formation step]
In the aforementioned first protective film forming step, the attached
關於熱硬化性樹脂膜12的硬化條件,只要第1保護膜12'成為能夠充分地發揮該第1保護膜12'的功能之程度的硬化度,則並無特別限定,根據熱硬化性樹脂膜12的種類適宜選擇即可。
例如,熱硬化性樹脂膜12之熱硬化時的加熱溫度及加熱時間如上文所說明。
於熱硬化性樹脂膜12之熱硬化時,亦可將硬化性樹脂膜12進行加壓,該情形時的加壓壓力較佳為0.3MPa至1MPa。The curing conditions of the
圖5B所示之第2積層結構體(附熱硬化性樹脂膜之工件)202中,於突狀電極91之包含頭頂部910之上部殘留熱硬化性樹脂膜12之情況得到抑制。因此,本步驟結束後,於突狀電極91的前述上部殘留第1保護膜12'之情況亦得到抑制。In the second laminated structure (workpiece with thermosetting resin film) 202 shown in FIG. 5B , the
[改質層形成步驟]
前述改質層形成步驟中,如圖6A所示,對工件90,自該工件90之具備第1保護膜12'之側,經由第1保護膜12'照射雷射光R,藉此於工件90的內部形成改質層900。
於改質層形成步驟後,進行後述之工件90之分割(亦即切割),因此改質層形成步驟較佳為於第3積層結構體(附第1保護膜之工件)203中之工件90的背面90b貼附切割片或第2保護膜形成用片後進行。[Modification layer formation step]
In the aforementioned modified layer forming step, as shown in FIG. 6A , the workpiece 90 is irradiated with the laser light R from the side of the workpiece 90 having the first
此外,本說明書中,有時將如此於工件的突狀電極形成面具備第1保護膜,於工件的背面具備切割片或第2保護膜形成用片而構成之結構體稱為「第4積層結構體」。
進而,有時將具有於第4積層結構體中的工件的內部形成有改質層之構成之結構體稱為「第5積層結構體」。
圖6A中,作為第5積層結構體205,顯示了於工件90的突狀電極形成面具備第1保護膜12',於工件90的背面90b具備第2保護膜形成用片8,於工件90的內部形成改質層900而構成之結構體。In addition, in this specification, the structure in which the first protective film is provided on the protruding electrode formation surface of the workpiece, and the cutting sheet or the second protective film forming sheet is provided on the back surface of the workpiece may be referred to as "the fourth laminate". Structure".
Furthermore, a structure having a structure in which a modified layer is formed inside the workpiece in the fourth laminated structure may be called a "fifth laminated structure".
In FIG. 6A , as the fifth laminated structure 205 , the first
此處所示之第2保護膜形成用片8係具備第2基材81、設置於第2基材81上之第2黏著劑層83、及設置於第2黏著劑層83上之樹脂層(樹脂膜)82而構成。 第2基材81及第2黏著劑層83之積層體係第2支撐片801。 因此,可謂第2保護膜形成用片8具備第2支撐片801、及設置於第2支撐片801的一面801a上(第2黏著劑層83的一面83a上)之樹脂層(樹脂膜)82。The second protective film forming sheet 8 shown here includes a second base material 81, a second adhesive layer 83 provided on the second base material 81, and a resin layer provided on the second adhesive layer 83. (resin film) 82. The second supporting sheet 801 of the lamination system of the second base material 81 and the second adhesive layer 83. Therefore, it can be said that the second protective film forming sheet 8 includes the second support sheet 801 and the resin layer (resin film) 82 provided on one side 801a of the second support sheet 801 (on one side 83a of the second adhesive layer 83). .
樹脂層(樹脂膜)82係用以於工件90的背面90b形成第2保護膜。第2保護膜係被覆工件90的背面90b而進行保護。更具體而言,第2保護膜係防止於工件之分割時或於用以將藉由工件之分割所獲得之工件加工物進行封裝而製造目標基板裝置之前,於工件加工物產生龜裂。The resin layer (resin film) 82 is used to form a second protective film on the back surface 90b of the workpiece 90. The second protective film covers and protects the back surface 90b of the workpiece 90. More specifically, the second protective film prevents cracks from occurring in the workpiece when the workpiece is divided or before the workpiece obtained by dividing the workpiece is packaged to manufacture a target substrate device.
樹脂層82可僅具有熱硬化性及能量線硬化性之任一特性,亦可具有雙方特性,還可不具有雙方特性。於樹脂層82為硬化性(亦即具有熱硬化性及能量線硬化性之至少一特性)之情形時,該樹脂層82之硬化物為第2保護膜。於樹脂層82為非硬化性(亦即不具有熱硬化性及能量線硬化性之雙方特性)之情形時,視為於樹脂層82貼附於工件90的背面90b之階段設置有第2保護膜。The resin layer 82 may have only one of thermosetting properties and energy ray curing properties, may have both properties, or may not have both properties. When the resin layer 82 is curable (that is, it has at least one of thermosetting properties and energy ray curing properties), the cured product of the resin layer 82 is the second protective film. When the resin layer 82 is non-hardening (that is, it does not have both the characteristics of thermosetting and energy ray curing), it is considered that the second protection is provided at the stage when the resin layer 82 is attached to the back surface 90b of the workpiece 90 membrane.
第2黏著劑層83與第1黏著劑層13同樣地,可為能量線硬化性及非能量線硬化性之任一種。為能量線硬化性之第2黏著劑層83能夠容易地調節該第2黏著劑層83之硬化前及硬化後之物性。Like the first
第2基材81例如亦可與上文所說明之第1保護膜形成用片中的第1基材(例如,第1保護膜形成用片1中的第1基材11)相同。The second base material 81 may be, for example, the same as the first base material in the first protective film forming sheet (for example, the
前述製造方法中,作為第2保護膜形成用片,亦可使用第2保護膜形成用片8以外的片。 前述製造方法中,並不限於第2保護膜形成用片8,作為第2保護膜形成用片,可使用公知的片。 同樣地,前述製造方法中,作為切割片,可使用公知的切割片。In the aforementioned manufacturing method, a sheet other than the second protective film forming sheet 8 may be used as the second protective film forming sheet. In the aforementioned manufacturing method, the second protective film forming sheet is not limited to the second protective film forming sheet 8 , and a known sheet can be used as the second protective film forming sheet. Similarly, in the aforementioned manufacturing method, a known dicing sheet can be used as the dicing sheet.
改質層形成步驟中,於工件90的內部中成為工件90之分割部位之特定的區域設定焦點,以朝該焦點聚焦之方式照射雷射光R。藉由該雷射光R之照射,於照射區域形成改質層900。In the modified layer forming step, a focus is set on a specific region of the divided portion of the workpiece 90 inside the workpiece 90, and the laser light R is irradiated to focus on the focus. By irradiating the laser light R, a modified layer 900 is formed in the irradiated area.
於熱硬化性樹脂膜12及第1保護膜12'具有對於波長1342nm之光之透過性,較佳為熱硬化性樹脂膜12及第1保護膜12'對於波長1342nm之光之透過率如上文所說明般高之情形時,波長1342nm之雷射光良好地透過第1保護膜12'。因此,即使對工件90自該工件90之具備第1保護膜12'之側經由第1保護膜12'照射雷射光R,亦能夠於工件90的內部良好地形成改質層900。The
[分割及切斷步驟] 前述分割及切斷步驟中,將形成改質層900後的工件90與第1保護膜12'一起,換言之將第5積層結構體205沿相對於該工件90的電路面90a平行的方向(圖6A中,箭頭E之方向)進行擴展,藉此於改質層900之部位分割工件90,並且切斷第1保護膜12'。藉此,如圖6B所示,獲得具備工件加工物9、及形成於工件加工物9的突狀電極形成面(亦即突狀電極91的表面91a及工件加工物9的電路面9a)之第1保護膜(切斷後之第1保護膜120')之附第1保護膜之工件加工物990。 藉由進行本步驟,獲得於突狀電極形成面具備切斷後之第1保護膜120'之工件加工物9(亦即附第1保護膜之工件加工物990)於第2支撐片801上複數個(大量)排列之狀態的第6積層結構體206。圖6B中,符號120a'表示切斷後之第1保護膜120'中之與工件加工物9之接觸面(本說明書中,有時稱為「第1面」),符號9b表示工件加工物9的背面。[Separation and cutting steps] In the aforementioned dividing and cutting steps, the workpiece 90 after the modified layer 900 is formed is placed together with the first protective film 12', in other words, the fifth laminated structure 205 is moved in a direction parallel to the circuit surface 90a of the workpiece 90 (Fig. In 6A, the direction of arrow E) expands, thereby dividing the workpiece 90 at the modified layer 900 and cutting the first protective film 12'. Thereby, as shown in FIG. 6B , a device including the workpiece 9 and the protruding electrode forming surface formed on the workpiece 9 (that is, the surface 91 a of the protruding electrode 91 and the circuit surface 9 a of the workpiece 9 ) is obtained. A workpiece 990 with a first protective film (the cut first protective film 120 ′). By performing this step, the workpiece 9 having the cut first protective film 120' on the protruding electrode formation surface (that is, the workpiece 990 with the first protective film) is obtained and placed on the second support piece 801. The sixth laminated structure 206 is arranged in a state of (a large number of). In FIG. 6B , the symbol 120 a ′ represents the contact surface (sometimes referred to as “the first surface” in this specification) with the workpiece 9 in the cut first protective film 120 ′, and the symbol 9 b represents the workpiece 9 The back.
藉由第1保護膜12'由滿足前述X值的合計值之條件之熱硬化性樹脂膜12所形成,於分割及切斷步驟中,能夠將第1保護膜12'容易地切斷。結果,能夠以高效率製造於突狀電極形成面具備切斷後之第1保護膜120'之工件加工物9。本步驟中,第1保護膜12'沿著工件90之分割部位被切斷,最終成為沿著工件加工物9的外周被切斷之狀態。Since the first protective film 12' is formed of the
於分割及切斷步驟中,前述擴展較佳為於-15℃至5℃之溫度條件下進行。藉由擴展時的溫度為前述上限值以下,第1保護膜12'之切斷變得更容易。藉由擴展時的溫度為前述下限值以上,能避免過度冷卻。In the dividing and cutting steps, the aforementioned expansion is preferably performed at a temperature of -15°C to 5°C. When the temperature during expansion is below the upper limit, cutting of the first protective film 12' becomes easier. By keeping the temperature during expansion above the aforementioned lower limit, excessive cooling can be avoided.
此處,顯示了藉由進行前述分割及切斷步驟,亦將第2保護膜形成用片8中的樹脂層82切斷之情形,但樹脂層82之切斷亦可於分割及切斷步驟後藉由公知的方法另行進行。圖6B中,於切斷後之樹脂層82標附符號820。另外,此處顯示了將樹脂層82切斷之情形,但亦可於樹脂層82之階段不切斷,而是切斷使該樹脂層82硬化而獲得之第2保護膜。Here, the resin layer 82 in the second protective film forming sheet 8 is also cut by performing the aforementioned dividing and cutting steps. However, the resin layer 82 may also be cut during the dividing and cutting steps. It is then carried out separately by known methods. In FIG. 6B , the resin layer 82 after cutting is marked with a symbol 820 . In addition, although the resin layer 82 is shown to be cut here, it is also possible to cut the second protective film obtained by hardening the resin layer 82 without cutting it at the stage of the resin layer 82 .
前述製造方法中,樹脂層82或第2保護膜係與第1保護膜12'之情形同樣地,沿著工件90之分割部位被切斷。 此外,本說明書中,即便於前述樹脂層被切斷後,只要維持第2支撐片及前述樹脂層(換言之,第2支撐片及切斷後之前述樹脂層)之積層結構,則亦將該積層結構稱為「第2保護膜形成用片」。In the aforementioned manufacturing method, the resin layer 82 or the second protective film is cut along the dividing portion of the workpiece 90 in the same manner as the first protective film 12'. In addition, in this specification, even after the aforementioned resin layer is cut, as long as the laminated structure of the second support sheet and the aforementioned resin layer (in other words, the second support piece and the aforementioned resin layer after cutting) is maintained, the laminated structure is also referred to as It is called "the second protective film forming sheet".
◇基板裝置之製造方法 於藉由上述之製造方法獲得附第1保護膜之工件加工物(換言之,第6積層結構體)後,藉由公知的方法將該附第1保護膜之工件加工物覆晶連接於基板的電路面後,製成封裝體,藉由使用該封裝體,能夠製造目標基板裝置(省略圖示)。於使用附第1保護膜之半導體晶片之情形時,於製作半導體封裝體後,藉由使用該半導體封裝體,能夠製造目標半導體裝置。另外,於使用具備第1保護膜及第2保護膜之半導體晶片之情形時,能夠將這些附保護膜之半導體晶片進行覆晶連接,製造目標半導體裝置。 [實施例]◇Manufacturing method of substrate device After the workpiece processed with the first protective film (in other words, the sixth laminated structure) is obtained by the above-mentioned manufacturing method, the workpiece processed with the first protective film is flip-chip connected to the substrate by a known method. After the circuit surface is formed, a package is formed, and by using this package, a target substrate device (not shown) can be manufactured. When a semiconductor wafer with a first protective film is used, a target semiconductor device can be manufactured by using the semiconductor package after fabricating the semiconductor package. In addition, when a semiconductor wafer provided with a first protective film and a second protective film is used, these semiconductor wafers with protective films can be flip-chip connected to manufacture a target semiconductor device. [Example]
以下,藉由具體的實施例對本發明更詳細地進行說明。其中,本發明完全不受限於以下所示之實施例。 此外,對於以下所示之比較例中所製造之各目標物,方便起見,標附與實施例中所製造之各目標物相同的名稱。Hereinafter, the present invention will be described in more detail through specific examples. However, the present invention is not limited to the examples shown below at all. In addition, for the sake of convenience, each object produced in the comparative example shown below is given the same name as each object produced in the example.
以下顯示用於製造熱硬化性樹脂層形成用組成物之成分。 [聚合物成分(A)] (A)-1:聚乙烯醇縮丁醛(積水化學工業公司製造的「S-LEC SV-10」,重量平均分子量65000、玻璃轉移溫度66℃) (A)-2:聚乙烯醇縮丁醛(積水化學工業公司製造的「S-LEC BL-10」,重量平均分子量25000、玻璃轉移溫度59℃) (A)-3:使丙烯酸正丁酯(55質量份)、丙烯酸甲酯(10質量份)、甲基丙烯酸縮水甘油酯(20質量份)及丙烯酸2-羥基乙酯(15質量份)進行共聚而成之丙烯酸樹脂(重量平均分子量800000、玻璃轉移溫度-28℃)。 [熱硬化性成分(B)] ・環氧樹脂(B1) (B1)-1:雙酚A型環氧樹脂(DIC公司製造的「EXA-4810-1000」,環氧當量404g/eq至412g/eq) (B1)-2:二環戊二烯型環氧樹脂(DIC公司製造的「EPICLON HP-7200」,環氧當量265g/eq) (B1)-3:液狀改性環氧樹脂(三菱化學公司製造的「YX7110」,環氧當量962g/eq) (B1)-4:液狀雙酚A型環氧樹脂及丙烯酸橡膠微粒子之混合物(日本觸媒公司製造的「BPA328」,環氧當量235g/eq) (B1)-5:固形雙酚A型環氧樹脂(三菱化學公司製造的「Epikote 1055」,分子量1600、軟化點93℃、環氧當量800g/eq至900g/eq) (B1)-6:二環戊二烯型環氧樹脂(日本化藥公司製造的「XD-1000-L」,環氧當量248g/eq) ・熱硬化劑(B2) (B2)-1:酚醛清漆型酚樹脂(昭和電工公司製造的「Shonol BRG-556」,羥基當量104g/eq) (B2)-2:雙氰胺(ADEKA公司製造的「Adeka Hardener EH-3636AS」,固體分散型潛伏性硬化劑、活性氫量21g/eq) [硬化促進劑(C)] (C)-1:2-苯基-4,5-二羥基甲基咪唑(四國化成工業公司製造的「Curezol 2PHZ」) [填充材料(D)] (D)-1:二氧化矽填料(Admatechs公司製造的「YA050C-MKK」,平均粒徑0.05μm) (D)-2:二氧化矽填料(Admatechs公司製造的「SC2050MA」,以環氧系化合物進行了表面修飾之二氧化矽填料,平均粒徑500nm) (D)-3:二氧化矽填料(TATSUMORI公司製造的「SV-10」,平均粒徑8μm) [偶合劑(E)] (E)-1:矽烷偶合劑(三菱化學公司製造的「MKC Silicate MSEP2」加成有γ-縮水甘油氧基丙基三甲氧基矽烷之矽酸鹽化合物) [著色劑(I)] (I)-1:碳黑(三菱化學公司製造的「MA-600B」)The components used for producing the composition for forming a thermosetting resin layer are shown below. [Polymer component (A)] (A)-1: Polyvinyl butyral ("S-LEC SV-10" manufactured by Sekisui Chemical Industry Co., Ltd., weight average molecular weight 65000, glass transition temperature 66°C) (A)-2: Polyvinyl butyral ("S-LEC BL-10" manufactured by Sekisui Chemical Industry Co., Ltd., weight average molecular weight 25000, glass transition temperature 59°C) (A)-3: n-butyl acrylate (55 parts by mass), methyl acrylate (10 parts by mass), glycidyl methacrylate (20 parts by mass) and 2-hydroxyethyl acrylate (15 parts by mass) Copolymerized acrylic resin (weight average molecular weight 800,000, glass transition temperature -28°C). [Thermosetting ingredient (B)] ・Epoxy resin (B1) (B1)-1: Bisphenol A type epoxy resin ("EXA-4810-1000" manufactured by DIC Corporation, epoxy equivalent 404g/eq to 412g/eq) (B1)-2: Dicyclopentadiene-type epoxy resin ("EPICLON HP-7200" manufactured by DIC Corporation, epoxy equivalent 265g/eq) (B1)-3: Liquid modified epoxy resin ("YX7110" manufactured by Mitsubishi Chemical Corporation, epoxy equivalent 962g/eq) (B1)-4: A mixture of liquid bisphenol A-type epoxy resin and acrylic rubber particles ("BPA328" manufactured by Nippon Shokubai Co., Ltd., epoxy equivalent 235g/eq) (B1)-5: Solid bisphenol A type epoxy resin ("Epikote 1055" manufactured by Mitsubishi Chemical Corporation, molecular weight 1600, softening point 93°C, epoxy equivalent weight 800g/eq to 900g/eq) (B1)-6: Dicyclopentadiene-type epoxy resin ("XD-1000-L" manufactured by Nippon Kayaku Co., Ltd., epoxy equivalent 248g/eq) ・Thermal hardener (B2) (B2)-1: Novolak type phenol resin ("Shonol BRG-556" manufactured by Showa Denko Co., Ltd., hydroxyl equivalent weight: 104 g/eq) (B2)-2: Dicyandiamide ("Adeka Hardener EH-3636AS" manufactured by ADEKA, solid dispersion latent hardener, active hydrogen content 21g/eq) [Harding accelerator (C)] (C)-1: 2-phenyl-4,5-dihydroxymethylimidazole ("Curezol 2PHZ" manufactured by Shikoku Chemical Industry Co., Ltd.) [Filling material (D)] (D)-1: Silica filler ("YA050C-MKK" manufactured by Admatechs, average particle size 0.05 μm) (D)-2: Silica filler ("SC2050MA" manufactured by Admatechs, a silica filler surface-modified with an epoxy compound, average particle size 500nm) (D)-3: Silica filler ("SV-10" manufactured by TATSUMORI Co., Ltd., average particle size 8 μm) [Coupling agent (E)] (E)-1: Silane coupling agent ("MKC Silicate MSEP2" manufactured by Mitsubishi Chemical Corporation, a silicate compound to which γ-glycidoxypropyltrimethoxysilane is added) [Color(I)] (I)-1: Carbon black ("MA-600B" manufactured by Mitsubishi Chemical Corporation)
[實施例1] [熱硬化性樹脂膜以及第1保護膜形成用片之製造] [熱硬化性樹脂層形成用組成物之製造] 將聚合物成分(A)-1(9.9質量份)、環氧樹脂(B1)-1(37.8質量份)、環氧樹脂(B1)-2(25.0質量份)、熱硬化劑(B2)-1(18.1質量份)、硬化促進劑(C)-1(0.2質量份)及填充材料(D)-1(9.0質量份)進行混合,進而以甲基乙基酮進行稀釋,於23℃進行攪拌,藉此製備上述之甲基乙基酮以外之6成分之合計濃度為55質量%之熱硬化性樹脂層形成用組成物(III-1)。這些成分及這些成分的含量示於表1。此外,表1中的含有成分一欄記載為「-」時,表示熱硬化性樹脂層形成用組成物不含有該成分。另外,表1中的所謂「全部種類的熱硬化性成分的合計含量之比例(質量%)」,意指「熱硬化性樹脂膜中的全部種類的熱硬化性成分的合計含量相對於熱硬化性樹脂膜的總質量之比例」。[Example 1] [Production of thermosetting resin film and first protective film forming sheet] [Production of composition for forming thermosetting resin layer] Polymer component (A)-1 (9.9 parts by mass), epoxy resin (B1)-1 (37.8 parts by mass), epoxy resin (B1)-2 (25.0 parts by mass), thermosetting agent (B2)- 1 (18.1 parts by mass), hardening accelerator (C)-1 (0.2 parts by mass) and filler (D)-1 (9.0 parts by mass) were mixed, diluted with methyl ethyl ketone, and carried out at 23°C By stirring, a thermosetting resin layer-forming composition (III-1) in which the total concentration of the above-mentioned six components other than methyl ethyl ketone was 55% by mass was prepared. These ingredients and their contents are shown in Table 1. In addition, when "-" is written in the column of contained components in Table 1, it means that the composition for forming a thermosetting resin layer does not contain this component. In addition, the "proportion of the total content of all types of thermosetting components (mass %)" in Table 1 means "the total content of all types of thermosetting components in the thermosetting resin film relative to the ratio of the total content of thermosetting components Ratio of the total mass of the plastic resin film."
[熱硬化性樹脂膜之製造] 使用聚對苯二甲酸乙二酯製膜的單面藉由聚矽氧處理進行了剝離處理之剝離膜(琳得科公司製造的「SP-PET381031」,厚度38μm),於該剝離膜的前述剝離處理面塗敷上述所獲得之熱硬化性樹脂層形成用組成物(III-1),於100℃乾燥2分鐘,藉此製作厚度30μm之熱硬化性樹脂膜。[Manufacture of thermosetting resin film] A release film ("SP-PET381031" manufactured by Lintec Co., Ltd., thickness 38 μm) made of polyethylene terephthalate and subjected to release treatment by polysiloxane treatment on one side. The thermosetting resin layer-forming composition (III-1) obtained above was applied to the peeling-treated surface and dried at 100° C. for 2 minutes to prepare a thermosetting resin film with a thickness of 30 μm.
[第1保護膜形成用片之製造] 繼而,於所獲得之熱硬化性樹脂膜的露出面(換言之,與具備前述剝離膜之側為相反側的面)貼合背面研削用表面保護帶(琳得科公司製造的「Adwill E-8180HR」)的一面,藉此製作第1保護膜形成用片。前述表面保護帶相當於第1支撐片。[Manufacturing of the first protective film forming sheet] Next, a surface protective tape for back grinding ("Adwill E-8180HR manufactured by Lintec Corporation") was bonded to the exposed surface of the obtained thermosetting resin film (in other words, the surface opposite to the side provided with the release film). ”) to prepare the first protective film forming sheet. The aforementioned surface protection tape corresponds to the first support piece.
[附第1保護膜之半導體晶片之製造] 自上述所獲得之第1保護膜形成用片中的熱硬化性樹脂膜移除前述剝離膜,使藉此產生之熱硬化性樹脂膜的露出面(換言之,與具備前述表面保護帶之側為相反側的面)壓接於半導體晶圓的凸塊形成面,藉此於半導體晶圓的凸塊形成面貼附第1保護膜形成用片。此時,第1保護膜形成用片之貼附係使用貼附裝置(滾筒式貼合機,琳得科公司製造的「RAD-3510 F/12」),於工作台溫度90℃、貼附速度2mm/sec、貼附壓力0.5MPa之條件下,一邊將熱硬化性樹脂膜加熱一邊進行。作為半導體晶圓,使用凸塊的高度為210μm、凸塊的寬度為250μm、相鄰的凸塊間的距離為400μm、且凸塊以外之部位的厚度為750μm之半導體晶圓。 藉由以上步驟,獲得於半導體晶圓的凸塊形成面貼附第1保護膜形成用片而構成之第1積層結構體。[Manufacture of semiconductor wafer with first protective film] The peeling film is removed from the thermosetting resin film in the first protective film forming sheet obtained above, and the exposed surface of the thermosetting resin film thus produced (in other words, the side provided with the surface protective tape) is The opposite side) is pressed against the bump formation surface of the semiconductor wafer, whereby the first protective film forming sheet is attached to the bump formation surface of the semiconductor wafer. At this time, the first protective film forming sheet was attached using an attachment device (drum type laminating machine, "RAD-3510 F/12" manufactured by Lintec Co., Ltd.) at a workbench temperature of 90°C. The thermosetting resin film is heated at a speed of 2mm/sec and a bonding pressure of 0.5MPa. As a semiconductor wafer, a semiconductor wafer having a bump height of 210 μm, a bump width of 250 μm, a distance between adjacent bumps of 400 μm, and a thickness of 750 μm in parts other than the bumps was used. Through the above steps, a first laminated structure in which the first protective film forming sheet is attached to the bump formation surface of the semiconductor wafer is obtained.
繼而,使用研磨機(DISCO公司製造的「DGP8760」),將所獲得之第1積層結構體中的半導體晶圓中之與凸塊形成面為相反側的面(背面)進行研削。此時,將前述背面研削至半導體晶圓之除了凸塊以外之部位的厚度成為250μm。Next, the surface (back surface) of the semiconductor wafer in the obtained first laminated structure that is opposite to the bump formation surface was ground using a grinder ("DGP8760" manufactured by DISCO). At this time, the back surface of the semiconductor wafer was ground to a thickness of 250 μm except for the bumps.
繼而,將前述表面保護帶(換言之,第1支撐片)自第1積層結構體中的熱硬化性樹脂膜移除。 藉由以上步驟,獲得於半導體晶圓的凸塊形成面具備熱硬化性樹脂膜而構成之第2積層結構體(附熱硬化性樹脂膜之半導體晶圓)。Next, the surface protection tape (in other words, the first supporting sheet) is removed from the thermosetting resin film in the first laminated structure. Through the above steps, a second laminated structure (semiconductor wafer with thermosetting resin film) in which the bump formation surface of the semiconductor wafer is provided with a thermosetting resin film is obtained.
繼而,使用熱硬化裝置(琳得科公司製造的「RAD-9100 m/12」),將上述所獲得之第2積層結構體中的熱硬化性樹脂膜於處理溫度130℃、處理壓力0.5MPa、處理時間2小時之條件下進行加熱加壓處理,藉此使之熱硬化而形成第1保護膜。 藉由以上步驟,獲得於半導體晶圓的凸塊形成面具備第1保護膜而構成之第3積層結構體(換言之,附第1保護膜之半導體晶圓)。Next, using a thermosetting apparatus ("RAD-9100 m/12" manufactured by Lintec Corporation), the thermosetting resin film in the second laminated structure obtained above was cured at a processing temperature of 130° C. and a processing pressure of 0.5 MPa. , perform heat and pressure treatment under the conditions of a treatment time of 2 hours, thereby thermally hardening it to form a first protective film. Through the above steps, a third laminated structure having a first protective film on the bump formation surface of the semiconductor wafer (in other words, a semiconductor wafer with a first protective film) is obtained.
繼而,於所獲得之第3積層結構體中的半導體晶圓的前述背面(換言之,研削面)貼附切割帶(琳得科公司製造的「Adwill D-841」),藉此獲得於半導體晶圓的凸塊形成面具備第1保護膜,於前述背面具備切割帶而構成之第4積層結構體。前述切割帶相當於第2支撐片。Next, a dicing tape ("Adwill D-841" manufactured by Lintec Corporation) was attached to the back surface (in other words, the grinding surface) of the semiconductor wafer in the obtained third multilayer structure, thereby obtaining the semiconductor wafer. A fourth laminated structure having a first protective film on a round bump formation surface and a dicing tape on the back surface. The aforementioned cutting tape corresponds to the second support piece.
繼而,使用切割裝置(DISCO公司製造的「DFL7361」),對第4積層結構體中的半導體晶圓,以朝設定於該半導體晶圓的內部之焦點聚焦之方式,自該半導體晶圓之具備第1保護膜之側,經由第1保護膜照射雷射光,藉此於半導體晶圓的內部形成改質層。此時,雷射光的波長設為1342nm,輸出設為0.7W,頻率設為90kHz。 藉由以上步驟,獲得於第4積層結構體中的半導體晶圓的內部形成有改質層之構成之第5積層結構體。Next, using a cutting device ("DFL7361" manufactured by DISCO Corporation), the semiconductor wafer in the fourth multilayer structure is focused toward a focal point set inside the semiconductor wafer, from which the semiconductor wafer has The side of the first protective film is irradiated with laser light through the first protective film, thereby forming a modified layer inside the semiconductor wafer. At this time, the wavelength of the laser light is set to 1342nm, the output is set to 0.7W, and the frequency is set to 90kHz. Through the above steps, a fifth laminated structure in which a modified layer is formed inside the semiconductor wafer in the fourth laminated structure is obtained.
繼而,於0℃之環境下,將形成該改質層後的半導體晶圓(換言之,第5積層結構體),沿相對於該半導體晶圓的電路面呈平行的方向,與第1保護膜一起擴展,藉此於改質層之部位分割半導體晶圓,並且沿著半導體晶圓之分割部位切斷第1保護膜。此時,使用分離擴片機(Die Separator)(DISCO公司製造的「DDS2300」),將第5積層結構體中的第2支撐片載置於分離擴片機中的工作台上,並且將第5積層結構體的周緣部予以固定,以該狀態於頂起速度50mm/sec、頂起量20mm之條件下將工作台頂起,藉此將半導體晶圓及第1保護膜擴展。所獲得之半導體晶片的大小為2mm×2mm。 藉由以上步驟,獲得於凸塊形成面具備切斷後之第1保護膜之半導體晶片(亦即附第1保護膜之半導體晶片)於第2支撐片(換言之,前述切割帶)上複數個(大量)排列之狀態的第6積層結構體。Then, in an environment of 0° C., the semiconductor wafer after the modified layer is formed (in other words, the fifth laminated structure) is placed in contact with the first protective film in a direction parallel to the circuit surface of the semiconductor wafer. By expanding together, the semiconductor wafer is divided at the modified layer portion, and the first protective film is cut along the divided portion of the semiconductor wafer. At this time, using a Die Separator ("DDS2300" manufactured by DISCO Corporation), the second support piece in the fifth laminated structure is placed on the table in the die Separator, and the second support piece is placed on the table of the die Separator. 5. The peripheral portion of the laminated structure is fixed, and in this state, the worktable is lifted up at a lifting speed of 50 mm/sec and a lifting amount of 20 mm, thereby spreading the semiconductor wafer and the first protective film. The size of the obtained semiconductor wafer is 2mm×2mm. Through the above steps, a semiconductor wafer having a cut first protective film on the bump formation surface (that is, a semiconductor wafer with a first protective film) is obtained on the second support sheet (in other words, the aforementioned dicing tape). The sixth layered structure in a state of arrangement (a large number of).
[熱硬化性樹脂膜之評價] [在凸塊的上部之熱硬化性樹脂膜之殘留抑制性之確認] 於上述之附第1保護膜之半導體晶片之製造時,自半導體晶圓的凸塊形成面側,使用掃描式電子顯微鏡(KEYENCE公司製造的「VE-9800」),將加速電壓設為5keV,觀察第1積層結構體。並且,依據下述評價基準,評價在第1積層結構體中的凸塊的上部之熱硬化性樹脂膜之殘留抑制性。結果示於表1。 [評價基準] A:能夠確認凸塊與熱硬化性樹脂膜之交界,能夠確認於凸塊的上部未殘留熱硬化性樹脂膜。 B:未能確認凸塊與熱硬化性樹脂膜之交界,能夠確認於凸塊的上部殘留有熱硬化性樹脂膜。[Evaluation of thermosetting resin film] [Confirmation of the residual inhibitory properties of the thermosetting resin film on the upper part of the bump] During the production of the above-mentioned semiconductor wafer with the first protective film, a scanning electron microscope ("VE-9800" manufactured by KEYENCE Corporation) was used from the bump formation surface side of the semiconductor wafer, and the acceleration voltage was set to 5keV. Observe the first laminated structure. Furthermore, based on the following evaluation criteria, the residual suppressive property of the thermosetting resin film on the upper portion of the bump in the first laminated structure was evaluated. The results are shown in Table 1. [Evaluation criteria] A: The boundary between the bump and the thermosetting resin film can be confirmed, and it can be confirmed that no thermosetting resin film remains on the upper part of the bump. B: The boundary between the bump and the thermosetting resin film was not confirmed, and it was confirmed that the thermosetting resin film remained on the upper part of the bump.
[熱硬化性樹脂膜對於光之透過率之測定] 變更熱硬化性樹脂層形成用組成物(III-1)的塗敷量,除了該方面以外,以與上述之熱硬化性樹脂膜之製造時相同的方法,製造5片試驗用之熱硬化性樹脂膜(厚度40μm)。 繼而,將這些5片試驗用之熱硬化性樹脂膜於這些膜的厚度方向上進行積層,藉此獲得積層膜(厚度200μm)。 繼而,使用分光光度計(SHIMADZU公司製造的「UV-VIS-NIR SPECTROPHOTOMETER UV-3600」),對該積層膜測定波長1342nm之光之透過率。結果示於表1。[Measurement of light transmittance of thermosetting resin film] Except for changing the coating amount of the thermosetting resin layer-forming composition (III-1), the same method as in the production of the above-mentioned thermosetting resin film was used to prepare 5 pieces of thermosetting test pieces. Resin film (thickness 40μm). Next, these five thermosetting resin films for testing were laminated in the thickness direction of these films to obtain a laminated film (thickness: 200 μm). Next, a spectrophotometer ("UV-VIS-NIR SPECTROPHOTOMETER UV-3600" manufactured by SHIMADZU Corporation) was used to measure the transmittance of light with a wavelength of 1342 nm for this laminated film. The results are shown in Table 1.
[第1保護膜之評價] [半導體晶圓的分割性之評價] 使用數位顯微鏡(KEYENCE公司製造的「VH-Z100」),將上述所獲得之第6積層結構體自該第6積層結構體的第1保護膜側進行觀察。此時,作為觀察區域,選擇第2支撐片中之相當於附第1保護膜之半導體晶片之排列面中之中央部之第1區域、以及處於相對於第1區域成為點對稱之周緣部側之位置且距離第1區域為同等之第2區域、第3區域、第4區域及第5區域之合計5區域。這些5區域均設為於假定半導體晶圓正常分割時,包含以5列5行25個之附第1保護膜之半導體晶片之區域。另外,以於連結第2區域與第3區域之第1線段的大致中央部存在第1區域,於連結第4區域與第5區域之第2線段的大致中央部存在第1區域,且沿順時針方向依序存在第2區域、第4區域、第3區域及第5區域之方式,選擇這些5區域。第1線段與第2線段成為相互正交。並且,觀察這些5區域,依據下述評價基準,評價半導體晶圓的分割性。結果示於表1。 [評價基準] A:於5區域全部(第1區域至第5區域之全部區域)中,半導體晶圓被正常分割。 B:於至少1區域(第1區域至第5區域之至少任一區域)中,存在半導體晶圓未被正常分割之部位。[Evaluation of the first protective film] [Evaluation of divisibility of semiconductor wafers] The sixth laminated structure obtained above was observed from the first protective film side of the sixth laminated structure using a digital microscope ("VH-Z100" manufactured by KEYENCE Corporation). At this time, as the observation area, the first area in the second support sheet corresponding to the central portion of the arrangement surface of the semiconductor wafers with the first protective film and the peripheral portion side that is point symmetrical with respect to the first area are selected. The location and distance from the first area are equal to the 2nd area, 3rd area, 4th area and 5th area, a total of 5 areas. These five regions are all regions including 25 semiconductor wafers with a first protective film in 5 columns and 5 rows, assuming that the semiconductor wafer is normally divided. In addition, the first region exists approximately at the center of the first line segment connecting the second region and the third region, and the first region exists approximately at the center of the second line segment connecting the fourth region and the fifth region. Select these 5 areas so that there are 2nd area, 4th area, 3rd area and 5th area in order in the clockwise direction. The first line segment and the second line segment become orthogonal to each other. Furthermore, these five regions were observed, and the divisibility of the semiconductor wafer was evaluated based on the following evaluation criteria. The results are shown in Table 1. [Evaluation criteria] A: The semiconductor wafer is normally divided in all 5 areas (all areas from the 1st area to the 5th area). B: In at least one region (at least any one of the first region to the fifth region), there is a portion where the semiconductor wafer is not normally divided.
[第1保護膜的切斷性之評價] 於上述之半導體晶圓的分割性之評價時,同時依據下述評價基準,評價第1保護膜的切斷性。結果示於表1。 [評價基準] A:於5區域全部(第1區域至第5區域之全部區域)中,第1保護膜被正常切斷。 B:於至少1區域(第1區域至第5區域之至少任一區域)中,存在第1保護膜未被正常切斷之部位。[Evaluation of cutability of the first protective film] During the above-mentioned evaluation of the separability of the semiconductor wafer, the cutting property of the first protective film was also evaluated based on the following evaluation criteria. The results are shown in Table 1. [Evaluation criteria] A: In all 5 areas (all areas from the 1st area to the 5th area), the first protective film is cut off normally. B: In at least one area (at least any one of the first area to the fifth area), there is a portion where the first protective film is not cut normally.
[第1保護膜的斷裂強度之測定] 變更熱硬化性樹脂層形成用組成物(III-1)的塗敷量,除了該方面以外,以與上述之熱硬化性樹脂膜之製造時相同的方法,製造試驗用之熱硬化性樹脂膜(厚度40μm)。 繼而,將該試驗用之熱硬化性樹脂膜於130℃加熱2小時,藉此使之熱硬化。 繼而,自該硬化物(亦即第1保護膜),切出大小為20mm×130mm之切片,將該切片設為試片。 使用萬能拉伸試驗機(島津製作所公司製造的「Autograph AG-IS」),將夾具間距離設為80mm,將拉伸速度設為200mm/min,將前述試片沿相對於前述試片的表面呈平行的方向藉由夾具拉伸,測定此時的前述試片的最大應力,採用該最大應力作為第1保護膜的斷裂強度。結果示於表1。[Measurement of breaking strength of the first protective film] Except for changing the coating amount of the thermosetting resin layer-forming composition (III-1), a thermosetting resin film for testing was produced in the same manner as in the production of the above-mentioned thermosetting resin film. (Thickness 40μm). Next, the thermosetting resin film for this test was heated at 130° C. for 2 hours, thereby thermally curing it. Then, a slice of 20 mm×130 mm was cut out from the hardened material (that is, the first protective film), and the slice was used as a test piece. A universal tensile testing machine ("Autograph AG-IS" manufactured by Shimadzu Corporation) was used, the distance between the clamps was set to 80 mm, the tensile speed was set to 200 mm/min, and the test piece was placed along the surface of the test piece. The test piece is stretched in a parallel direction by a clamp, and the maximum stress of the test piece at this time is measured, and the maximum stress is used as the breaking strength of the first protective film. The results are shown in Table 1.
[比較例1] [熱硬化性樹脂膜以及第1保護膜形成用片之製造] [熱硬化性樹脂層形成用組成物之製造] 將聚合物成分(A)-2(10.0質量份)、環氧樹脂(B1)-2(30.0質量份)、環氧樹脂(B1)-3(33.0質量份)、熱硬化劑(B2)-1(16.0質量份)、硬化促進劑(C)-1(0.2質量份)及填充材料(D)-1(11.0質量份)進行混合,進而以甲基乙基酮進行稀釋,於23℃進行攪拌,藉此製備上述之甲基乙基酮以外之6成分之合計濃度為55質量%之樹脂層形成用組成物。這些成分及這些成分的含量示於表1。[Comparative example 1] [Production of thermosetting resin film and first protective film forming sheet] [Production of composition for forming thermosetting resin layer] Polymer component (A)-2 (10.0 parts by mass), epoxy resin (B1)-2 (30.0 parts by mass), epoxy resin (B1)-3 (33.0 parts by mass), thermosetting agent (B2)- 1 (16.0 parts by mass), hardening accelerator (C)-1 (0.2 parts by mass) and filler (D)-1 (11.0 parts by mass) were mixed, diluted with methyl ethyl ketone, and carried out at 23°C The mixture was stirred to prepare a resin layer-forming composition in which the total concentration of the above-mentioned six components other than methyl ethyl ketone was 55% by mass. These ingredients and their contents are shown in Table 1.
[熱硬化性樹脂膜以及第1保護膜形成用片之製造] 使用上述所獲得之樹脂層形成用組成物作為樹脂層形成用組成物,除了該方面以外,以與實施例1之情形相同的方法,製造熱硬化性樹脂膜以及第1保護膜形成用片。[Production of thermosetting resin film and first protective film forming sheet] A thermosetting resin film and a first protective film-forming sheet were produced in the same manner as in Example 1 except for using the resin layer-forming composition obtained above as the resin layer-forming composition.
[附第1保護膜之半導體晶片之製造] 使用上述所獲得之第1保護膜形成用片作為第1保護膜形成用片,除了該方面以外,以與實施例1之情形相同的方法,嘗試製造附第1保護膜之半導體晶片(換言之,第6積層結構體)。[Manufacture of semiconductor wafer with first protective film] Using the first protective film-forming sheet obtained above as the first protective film-forming sheet, an attempt was made to manufacture a semiconductor wafer with a first protective film (in other words, in the same manner as in Example 1 except for this point). 6th layered structure).
[熱硬化性樹脂膜以及第1保護膜之評價] 針對本比較例中所製造之熱硬化性樹脂膜以及第1保護膜,以與實施例1之情形相同的方法進行評價。結果示於表1。[Evaluation of thermosetting resin film and first protective film] The thermosetting resin film and the first protective film produced in this comparative example were evaluated in the same manner as in Example 1. The results are shown in Table 1.
[比較例2] [熱硬化性樹脂膜以及第1保護膜形成用片之製造] [熱硬化性樹脂層形成用組成物之製造] 將聚合物成分(A)-3(21.0質量份)、環氧樹脂(B1)-4(10.0質量份)、環氧樹脂(B1)-5(2.0質量份)、環氧樹脂(B1)-6(5.6質量份)、熱硬化劑(B2)-2(0.5質量份)、硬化促進劑(C)-1(0.5質量份)、填充材料(D)-2(6.0質量份)、填充材料(D)-3(54.0質量份)、偶合劑(E)-1(0.4質量份)及著色劑(I)-1(1.9質量份)進行混合,進而以甲基乙基酮進行稀釋,於23℃進行攪拌,藉此製備上述之甲基乙基酮以外之10成分之合計濃度為55質量%之樹脂層形成用組成物。這些成分及這些成分的含量示於表1。[Comparative example 2] [Production of thermosetting resin film and first protective film forming sheet] [Production of composition for forming thermosetting resin layer] Polymer component (A)-3 (21.0 parts by mass), epoxy resin (B1)-4 (10.0 parts by mass), epoxy resin (B1)-5 (2.0 parts by mass), epoxy resin (B1)- 6 (5.6 parts by mass), thermal hardener (B2)-2 (0.5 parts by mass), hardening accelerator (C)-1 (0.5 parts by mass), filling material (D)-2 (6.0 parts by mass), filling material (D)-3 (54.0 parts by mass), coupling agent (E)-1 (0.4 parts by mass) and coloring agent (I)-1 (1.9 parts by mass) were mixed, diluted with methyl ethyl ketone, and By stirring at 23° C., a resin layer-forming composition in which the total concentration of the 10 components other than the above-mentioned methyl ethyl ketone was 55% by mass was prepared. These ingredients and their contents are shown in Table 1.
[熱硬化性樹脂膜以及第1保護膜形成用片之製造] 使用上述所獲得之樹脂層形成用組成物作為樹脂層形成用組成物,除了該方面以外,以與實施例1之情形相同的方法,製造熱硬化性樹脂膜以及第1保護膜形成用片。[Production of thermosetting resin film and first protective film forming sheet] A thermosetting resin film and a first protective film-forming sheet were produced in the same manner as in Example 1 except for using the resin layer-forming composition obtained above as the resin layer-forming composition.
[附第1保護膜之半導體晶片之製造] 使用上述所獲得之第1保護膜形成用片作為第1保護膜形成用片,除了該方面以外,以與實施例1之情形相同的方法,嘗試製造附第1保護膜之半導體晶片(換言之,第6積層結構體)。[Manufacture of semiconductor wafer with first protective film] Using the first protective film-forming sheet obtained above as the first protective film-forming sheet, an attempt was made to manufacture a semiconductor wafer with a first protective film (in other words, in the same manner as in Example 1 except for this point). 6th layered structure).
[熱硬化性樹脂膜以及第1保護膜之評價] 針對本比較例中所製造之熱硬化性樹脂膜以及第1保護膜,以與實施例1之情形相同的方法進行評價。結果示於表1。[Evaluation of thermosetting resin film and first protective film] The thermosetting resin film and the first protective film produced in this comparative example were evaluated in the same manner as in Example 1. The results are shown in Table 1.
[表1]
由上述結果可明顯看出,實施例1之熱硬化性樹脂膜於貼附於半導體晶圓的凸塊形成面時,能夠抑制在凸塊的上部之殘留,具有較佳的特性。 實施例1之熱硬化性樹脂膜中的全部種類的熱硬化性成分的合計含量相對於熱硬化性樹脂膜的總質量之比例為80.9質量%。From the above results, it is obvious that the thermosetting resin film of Example 1 can suppress residues on the upper portion of the bump when it is attached to the bump formation surface of the semiconductor wafer, and has better characteristics. The ratio of the total content of all types of thermosetting components in the thermosetting resin film of Example 1 to the total mass of the thermosetting resin film was 80.9 mass %.
另外,實施例1中,半導體晶圓的分割性良好。 實施例1之熱硬化性樹脂膜對於波長1342nm之光之透過率高,結果由該膜所形成之第1保護膜之光之透過率亦同樣高,於經由第1保護膜對半導體晶圓照射雷射光時,能夠於半導體晶圓的內部良好地形成改質層。In addition, in Example 1, the divisibility of the semiconductor wafer was good. The thermosetting resin film of Example 1 has a high transmittance for light with a wavelength of 1342 nm. As a result, the light transmittance of the first protective film formed from the film is also high. When the semiconductor wafer is irradiated through the first protective film When irradiating laser light, the modified layer can be well formed inside the semiconductor wafer.
另外,實施例1中,第1保護膜的切斷性良好。 實施例1中,X值的合計值為296(={408×37.8/(37.8+25.0+18.1)}+{265×25.0/(37.8+25.0+18.1)}+{104×18.1/(37.8+25.0+18.1)})g/eq,第1保護膜的斷裂強度為45MPa。In addition, in Example 1, the cutting property of the first protective film was good. In Example 1, the total value of 37.8+25.0+18.1)})g/eq, the breaking strength of the first protective film is 45MPa.
相對於此,比較例1中,第1保護膜的切斷性差。 比較例1中,X值的合計值為524(={265×30.0/(30.0+33.0+16.0)}+{962×33.0/(30.0+33.0+16.0)}+{104×16.0/(30.0+33.0+16.0)})g/eq,第1保護膜的斷裂強度為60MPa。On the other hand, in Comparative Example 1, the cutting property of the first protective film was poor. In Comparative Example 1, the total value of 30.0+33.0+16.0)})g/eq, the breaking strength of the first protective film is 60MPa.
比較例2之熱硬化性樹脂膜於貼附於半導體晶圓的凸塊形成面時,無法抑制在凸塊的上部之殘留,特性差。 比較例2之熱硬化性樹脂膜中的全部種類的熱硬化性成分的合計含量相對於熱硬化性樹脂膜的總質量之比例為17.8質量%。When the thermosetting resin film of Comparative Example 2 was attached to the bump-forming surface of the semiconductor wafer, it was unable to prevent the film from remaining on the upper portion of the bump and had poor characteristics. The ratio of the total content of all types of thermosetting components in the thermosetting resin film of Comparative Example 2 to the total mass of the thermosetting resin film was 17.8 mass %.
另外,比較例2中,半導體晶圓的分割性差。 比較例2之熱硬化性樹脂膜對於波長1342nm之光之透過率低,結果由該膜所形成之第1保護膜之光之透過率亦同樣低,於經由第1保護膜對半導體晶圓照射雷射光時,未能於半導體晶圓的內部適當地形成改質層。結果,未能正常地分割半導體晶圓。 比較例2中,未能切斷第1保護膜,但無法判斷第1保護膜本身的特性對該結果造成何種程度的影響,第1保護膜的切斷性無法評價。其中,由於第1保護膜的斷裂強度小為25MPa,故而推測未能切斷第1保護膜之原因主要在於半導體晶圓的分割性差。 [產業可利用性]In addition, in Comparative Example 2, the divisibility of the semiconductor wafer was poor. The thermosetting resin film of Comparative Example 2 has low transmittance for light with a wavelength of 1342 nm. As a result, the light transmittance of the first protective film formed from this film is also low. When the semiconductor wafer is irradiated through the first protective film When irradiating laser light, the modified layer cannot be properly formed inside the semiconductor wafer. As a result, the semiconductor wafer cannot be divided properly. In Comparative Example 2, the first protective film could not be cut, but it could not be determined to what extent the characteristics of the first protective film itself affected the result, and the cutability of the first protective film could not be evaluated. Among them, since the breaking strength of the first protective film is as low as 25 MPa, it is speculated that the reason why the first protective film cannot be cut is mainly due to poor separability of the semiconductor wafer. [Industrial Availability]
本發明能夠用於製造覆晶安裝方法中所使用之於連接墊部具有突狀電極之工件加工物等。The present invention can be used to manufacture workpieces having protruding electrodes on connection pads used in flip-chip mounting methods.
1,2,3:第1保護膜形成用片 8:第2保護膜形成用片 9:工件加工物 9a:工件加工物的電路面 9b:工件加工物的背面 11:第1基材 11a:第1基材的一面 12:熱硬化性樹脂層(熱硬化性樹脂膜) 12a:熱硬化性樹脂層(熱硬化性樹脂膜)的第1面 12':第1保護膜 12a':第1保護膜的第1面 13:第1黏著劑層 13a:第1黏著劑層的一面 14:第1中間層 81:第2基材 82:樹脂層(樹脂膜) 83:第2黏著劑層 83a:第2黏著劑層的一面 90:工件 90a:工件的電路面 90b:工件的背面 91:突狀電極 91a:突狀電極的表面 101,102,103:第1支撐片 101a,102a,103a:第1支撐片的表面 120':切斷後之第1保護膜 120a':切斷後之第1保護膜的第1面 201:第1積層結構體 202:第2積層結構體 203:第3積層結構體 205:第5積層結構體 206:第6積層結構體 801:第2支撐片 801a:第2支撐片的一面 820:切斷後之樹脂層 900:改質層 910:頭頂部 990:附第1保護膜之工件加工物 D91 :距離 H91 :高度 R:雷射光 T90 :厚度 W91 :寬度1, 2, 3: First protective film forming sheet 8: Second protective film forming sheet 9: Workpiece processed object 9a: Circuit surface of the workpiece processed object 9b: Back surface of the workpiece processed object 11: First base material 11a: One side 12 of the first base material: thermosetting resin layer (thermosetting resin film) 12a: first side 12' of the thermosetting resin layer (thermosetting resin film): first protective film 12a': first 1st side of protective film 13: 1st adhesive layer 13a: 1st adhesive layer side 14: 1st intermediate layer 81: 2nd base material 82: Resin layer (resin film) 83: 2nd adhesive layer 83a : one side of the second adhesive layer 90: workpiece 90a: circuit surface of the workpiece 90b: back side of the workpiece 91: protruding electrode 91a: surface of the protruding electrode 101, 102, 103: first supporting piece 101a, 102a, 103a: first supporting piece Surface 120': first protective film after cutting 120a': first side of the first protective film after cutting 201: first laminated structure 202: second laminated structure 203: third laminated structure 205: third 5 laminated structure 206: 6th laminated structure 801: 2nd supporting piece 801a: One side of the 2nd supporting piece 820: Resin layer after cutting 900: Modified layer 910: Head top 990: Workpiece with first protective film Processed object D 91 : Distance H 91 : Height R: Laser light T 90 : Thickness W 91 : Width
[圖1]係以示意方式表示使用本發明的一實施形態的硬化性樹脂膜而於突狀電極形成面形成有第1保護膜之狀態的一例之剖視圖。 [圖2]係以示意方式表示本發明的一實施形態的第1保護膜形成用片的一例之剖視圖。 [圖3]係以示意方式表示本發明的一實施形態的第1保護膜形成用片的另一例之剖視圖。 [圖4]係以示意方式表示本發明的一實施形態的第1保護膜形成用片的又一例之剖視圖。 [圖5A]係用於以示意方式說明使用本發明的一實施形態的第1保護膜形成用片之情形時的附第1保護膜之工件加工物之製造方法之放大剖視圖。 [圖5B]係用於以示意方式說明使用本發明的一實施形態的第1保護膜形成用片之情形時的附第1保護膜之工件加工物之製造方法之放大剖視圖。 [圖5C]係用於以示意方式說明使用本發明的一實施形態的第1保護膜形成用片之情形時的附第1保護膜之工件加工物之製造方法之放大剖視圖。 [圖6A]係用於以示意方式說明使用本發明的一實施形態的第1保護膜形成用片之情形時的附第1保護膜之工件加工物之製造方法之放大剖視圖。 [圖6B]係用於以示意方式說明使用本發明的一實施形態的第1保護膜形成用片之情形時的附第1保護膜之工件加工物之製造方法之放大剖視圖。1 is a cross-sectional view schematically showing an example of a state in which a first protective film is formed on a protruding electrode formation surface using a curable resin film according to an embodiment of the present invention. 2 is a cross-sectional view schematically showing an example of the first protective film forming sheet according to one embodiment of the present invention. [Fig. 3] Fig. 3 is a cross-sectional view schematically showing another example of the first protective film forming sheet according to one embodiment of the present invention. [Fig. 4] Fig. 4 is a cross-sectional view schematically showing another example of the first protective film forming sheet according to one embodiment of the present invention. 5A is an enlarged cross-sectional view schematically illustrating a method of manufacturing a workpiece with a first protective film when using the first protective film forming sheet according to one embodiment of the present invention. 5B is an enlarged cross-sectional view schematically illustrating a method of manufacturing a workpiece with a first protective film when using the first protective film forming sheet according to one embodiment of the present invention. 5C is an enlarged cross-sectional view schematically illustrating a method of manufacturing a workpiece with a first protective film when using the first protective film forming sheet according to one embodiment of the present invention. 6A is an enlarged cross-sectional view schematically illustrating a method of manufacturing a workpiece with a first protective film when using the first protective film forming sheet according to one embodiment of the present invention. 6B is an enlarged cross-sectional view schematically illustrating a method of manufacturing a workpiece with a first protective film when using the first protective film forming sheet according to one embodiment of the present invention.
1:第1保護膜形成用片 1: First protective film forming sheet
11:第1基材 11: 1st base material
12:熱硬化性樹脂層(熱硬化性樹脂膜) 12: Thermosetting resin layer (thermosetting resin film)
13:第1黏著劑層 13: 1st adhesive layer
13a:第1黏著劑層的一面 13a: One side of the first adhesive layer
101:第1支撐片 101: 1st support piece
101a:第1支撐片的表面 101a: Surface of the first support piece
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CN102637651A (en) * | 2011-02-15 | 2012-08-15 | 日东电工株式会社 | Film for forming protective layer |
CN108140567A (en) * | 2015-11-04 | 2018-06-08 | 琳得科株式会社 | Curable resin film and the 1st protective film formation piece |
WO2018147097A1 (en) * | 2017-02-09 | 2018-08-16 | リンテック株式会社 | Curable resin film and sheet for forming first protective film |
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