TWI829898B - Method for manufacturing metal components with metal layers - Google Patents

Method for manufacturing metal components with metal layers Download PDF

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TWI829898B
TWI829898B TW109109832A TW109109832A TWI829898B TW I829898 B TWI829898 B TW I829898B TW 109109832 A TW109109832 A TW 109109832A TW 109109832 A TW109109832 A TW 109109832A TW I829898 B TWI829898 B TW I829898B
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metal layer
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TW202043549A (en
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小鍛冶快允
佐藤牧子
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日商納美仕有限公司
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    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/34Pretreatment of metallic surfaces to be electroplated
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C22/00Chemical surface treatment of metallic material by reaction of the surface with a reactive liquid, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals
    • C23C22/05Chemical surface treatment of metallic material by reaction of the surface with a reactive liquid, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using aqueous solutions
    • C23C22/60Chemical surface treatment of metallic material by reaction of the surface with a reactive liquid, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using aqueous solutions using alkaline aqueous solutions with pH greater than 8
    • C23C22/63Treatment of copper or alloys based thereon
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C28/00Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C28/00Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
    • C23C28/30Coatings combining at least one metallic layer and at least one inorganic non-metallic layer
    • C23C28/34Coatings combining at least one metallic layer and at least one inorganic non-metallic layer including at least one inorganic non-metallic material layer, e.g. metal carbide, nitride, boride, silicide layer and their mixtures, enamels, phosphates and sulphates
    • C23C28/345Coatings combining at least one metallic layer and at least one inorganic non-metallic layer including at least one inorganic non-metallic material layer, e.g. metal carbide, nitride, boride, silicide layer and their mixtures, enamels, phosphates and sulphates with at least one oxide layer
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D11/00Electrolytic coating by surface reaction, i.e. forming conversion layers
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/60Electroplating characterised by the structure or texture of the layers
    • C25D5/605Surface topography of the layers, e.g. rough, dendritic or nodular layers
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal
    • H05K3/382Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal
    • H05K3/384Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal by plating

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Electrochemistry (AREA)
  • Mechanical Engineering (AREA)
  • Inorganic Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Chemical & Material Sciences (AREA)
  • Electroplating Methods And Accessories (AREA)
  • Other Surface Treatments For Metallic Materials (AREA)
  • Manufacturing Of Printed Wiring (AREA)

Abstract

本發明之目的係提供一種新穎的具有金屬層之金屬構件的製造方法。本案具有金屬層之金屬構件的製造方法,包含第一步驟及第二步驟,該第一步驟係藉由氧化處理,在金屬構件的至少一部分表面形成厚度為平均400nm以下且具有微細凹凸形狀之氧化物層,該第二步驟係在該氧化物層上藉由電鍍處理形成該金屬層。 The object of the present invention is to provide a novel method for manufacturing metal components with metal layers. The manufacturing method of a metal component with a metal layer in this case includes a first step and a second step. The first step is to form an oxidation layer with an average thickness of 400 nm or less and a fine uneven shape on at least part of the surface of the metal component through an oxidation treatment. The second step is to form the metal layer on the oxide layer by electroplating.

Description

具有金屬層之金屬構件的製造方法 Method for manufacturing metal components with metal layers

本發明係關於具有金屬層之金屬構件的製造方法。 The present invention relates to a method of manufacturing a metal member having a metal layer.

用於印刷佈線板之銅箔需要與樹脂之密著性。為了提升此密著性,已有藉由蝕刻等將銅箔表面粗化,即藉由所謂的錨定效應(anchor effect)以提升機械性黏著力的方法。然而,由印刷佈線板之高密度化或在高頻帶之傳輸損失的觀點而言,銅箔表面亦需要平坦化。為了滿足上述相反的要求,已開發出進行氧化步驟及還原步驟等之銅表面處理方法(參照專利文獻1)。根據該方法,係將銅箔前處理,浸漬於含有氧化劑之藥水,藉此使銅箔表面氧化形成氧化銅(CuO)之凹凸後,浸漬於含有還原劑之藥水以使氧化銅還原,一部分形成氧化亞銅(Cu2O),藉此調整表面的凹凸。此外,另開發有在氧化步驟中添加界面活性分子的方法作為利用氧化及/或還原之銅箔處理的密著性改善方法(參照專利文獻2)、在還原步驟後使用胺基噻唑系化合物等在銅箔表面形成保護皮膜的方法(參照專利文獻3)。 Copper foil used for printed wiring boards requires good adhesion to resin. In order to improve this adhesion, the surface of the copper foil has been roughened by etching, which is a method of improving mechanical adhesion through the so-called anchor effect. However, from the viewpoint of high density of printed wiring boards or transmission loss in high frequency bands, the copper foil surface also needs to be planarized. In order to satisfy the above-mentioned contradictory requirements, a copper surface treatment method that performs an oxidation step, a reduction step, and the like has been developed (see Patent Document 1). According to this method, the copper foil is pre-treated and immersed in a solution containing an oxidizing agent to oxidize the surface of the copper foil to form irregularities of copper oxide (CuO), and then immersed in a solution containing a reducing agent to reduce the copper oxide and partially form Cuprous oxide (Cu 2 O), thereby adjusting the unevenness of the surface. In addition, a method of adding interface active molecules in the oxidation step has been developed as a method for improving the adhesion of copper foil treatment by oxidation and/or reduction (see Patent Document 2), and the use of aminothiazole-based compounds after the reduction step, etc. A method of forming a protective film on the surface of copper foil (see Patent Document 3).

一般而言,金屬的氧化物與未被氧化之金屬相比,其電阻較大。例如,純銅的電阻率為1.7×10-8(Ωm),相較於此,氧化銅的電阻率為1~10(Ωm),氧化亞銅的電阻率為1×106~1×107(Ωm),氧化銅、氧化亞銅的導電性皆比純銅差。因此,為了粗化銅箔表面而使用氧化處理的情況下,其鍍敷方法不使用電鍍,而係使用導電性不佳時亦可處理之化學鍍(亦稱為無電解鍍)(參照專利文獻4)。另一方面,藉由電鍍使銅粒子附著於銅箔, 以使銅箔表面粗化的情況下,由於銅箔表面不存在氧化物,故藉由再度進行電鍍,可以在銅箔的粗化處理面鍍敷其他金屬(專利文獻5、6)。 Generally speaking, metal oxides have a greater resistance than unoxidized metals. For example, the resistivity of pure copper is 1.7×10 -8 (Ωm). Compared with this, the resistivity of copper oxide is 1~10(Ωm), and the resistivity of cuprous oxide is 1×10 6 ~1×10 7 (Ωm), the conductivity of copper oxide and cuprous oxide is worse than that of pure copper. Therefore, when oxidation treatment is used to roughen the surface of copper foil, the plating method does not use electroplating, but uses electroless plating (also called electroless plating) that can handle even when the conductivity is poor (refer to patent documents 4). On the other hand, when copper particles are adhered to copper foil by electroplating to roughen the surface of the copper foil, since there are no oxides on the surface of the copper foil, the roughening treatment of the copper foil can be completed by performing electroplating again. The surface is plated with other metals (Patent Documents 5 and 6).

鍍敷皮膜被要求能承受使用及環境,具有在實用上不發生阻礙之程度的密著性。其手段已知有去除金屬表面的氧化物層以增強金屬鍵,且進行表面粗化以使應力分散並確保密著性(非專利文獻1)。 The plating film is required to be able to withstand use and the environment, and to have adhesion to a level that does not hinder practical use. As a means, known methods include removing the oxide layer on the metal surface to strengthen the metal bond and roughening the surface to disperse stress and ensure adhesion (Non-Patent Document 1).

專利文獻1為國際公開WO2014/126193號公報;專利文獻2為日本特表2013-534054號公報;專利文獻3為日本特開平8-97559號公報;專利文獻4為日本特開2000-151096號公報;專利文獻5為日本特許5764700號公報;專利文獻6為日本特許4948579號公報。 Patent document 1 is International Publication No. WO2014/126193; Patent document 2 is Japanese Patent Application Publication No. 2013-534054; Patent document 3 is Japanese Patent Application Publication No. 8-97559; Patent document 4 is Japanese Patent Application Publication No. 2000-151096 ; Patent document 5 is Japanese Patent No. 5764700; Patent document 6 is Japanese Patent No. 4948579.

非專利文獻1為森河務、中出卓男、橫井昌幸著「鍍敷皮膜的密著性及其改善方法」。 Non-patent document 1 is "Adhesion of plating film and its improvement method" written by Morikawa Mu, Nakade Takuo, and Yokoi Masayuki.

本發明之目的係提供一種新穎的具有金屬層之金屬構件的製造方法。 The object of the present invention is to provide a novel method for manufacturing metal components with metal layers.

一般而言金屬與鍍金屬層之密著性已知係藉由金屬鍵來確保密著性,若金屬的界面存在有氧化物層,則會阻礙金屬與鍍金屬之金屬鍵,而難以得到密著性。因此,通常在金屬表面存在有氧化物層的情況下,由於通電性不佳及難以得到金屬箔與鍍金屬層之密著性等理由,不會直接進行電鍍,而是先以酸處理等去除氧化物後進行。又,若金屬平滑,則應力傳遞至金屬與鍍金屬的界面並集中,容易產生界面剝離。另一方面,在凹凸的界面係與平滑的表面不同,沒有傳遞應力之明確的面。能量傳遞時被認為其一部分使鍍金屬或金屬變形,因而消耗能量,密著力提高。本發明人致力研究的結果得到,藉由使氧化物層為平均400nm以下,將通電性惡劣及金屬鍵被阻礙 之影響控制在最小限度,且藉由具有微細凹凸形狀,能夠以錨定效應提高金屬構件與鍍金屬的密著力,成功地在該氧化物層表面以電鍍披覆金屬。 Generally speaking, it is known that the adhesion between metal and metal-plated layer is ensured by metal bonds. If there is an oxide layer at the interface of the metal, it will hinder the metal bond between the metal and the metal-plated layer, making it difficult to obtain tightness. Attachment. Therefore, usually when there is an oxide layer on the metal surface, due to reasons such as poor electrical conductivity and difficulty in obtaining adhesion between the metal foil and the metallized layer, electroplating is not performed directly, but is first removed by acid treatment, etc. After oxidation. In addition, if the metal is smooth, stress is transmitted to the interface between the metal and the metal plating and is concentrated, easily causing interface peeling. On the other hand, unlike a smooth surface, the uneven interface does not have a clear surface for transmitting stress. When energy is transferred, it is considered that part of it deforms the plated metal or the metal, thereby consuming energy and improving the adhesion. As a result of intensive research by the present inventors, it was found that by making the oxide layer have an average thickness of 400 nm or less, electrical conductivity will be poor and metal bonds will be hindered. The influence is kept to a minimum, and by having a fine concave and convex shape, the adhesion between the metal component and the plated metal can be improved by the anchoring effect, and the metal can be successfully electroplated on the surface of the oxide layer.

因此,本發明的主要態樣如下: Therefore, the main aspects of the present invention are as follows:

〔1〕一種具有金屬層之金屬構件的製造方法,包含第一步驟及第二步驟,該第一步驟係藉由氧化處理,在金屬構件的至少一部分表面形成厚度為平均400nm以下且具有微細凹凸形狀之氧化物層,該第二步驟係在該氧化物層上藉由電鍍處理形成該金屬層。 [1] A method of manufacturing a metal member with a metal layer, including a first step and a second step. The first step is to form an average thickness of 400 nm or less and fine unevenness on at least part of the surface of the metal member through oxidation treatment. The second step is to form the metal layer on the oxide layer by electroplating.

〔2〕如〔1〕之具有金屬層之金屬構件的製造方法,其中,該第二步驟中電解處理的電流密度為5A/dm2以下。 [2] The method for manufacturing a metal member having a metal layer according to [1], wherein the current density of the electrolytic treatment in the second step is 5 A/dm 2 or less.

〔3〕如〔1〕或〔2〕之具有金屬層之金屬構件的製造方法,其中,該金屬構件為銅構件,該金屬層為銅以外之金屬的層。 [3] The method of manufacturing a metal member having a metal layer according to [1] or [2], wherein the metal member is a copper member and the metal layer is a layer of a metal other than copper.

〔4〕如〔3〕之具有金屬層之金屬構件的製造方法,其中,該銅以外之金屬為選自由錫、銀、鋅、鋁、鈦、鉍、鉻、鐵、鈷、鎳、鈀、金及鉑組成之群組中至少一種之金屬。 [4] The method of manufacturing a metal member with a metal layer according to [3], wherein the metal other than copper is selected from tin, silver, zinc, aluminum, titanium, bismuth, chromium, iron, cobalt, nickel, palladium, At least one metal from the group consisting of gold and platinum.

〔5〕如〔1〕至〔4〕中任一項之具有金屬層之金屬構件的製造方法,其中,該第一步驟後形成有該氧化物層之表面的Ra為0.035μm以上且0.115μm以下。 [5] The method for manufacturing a metal member having a metal layer according to any one of [1] to [4], wherein the Ra of the surface on which the oxide layer is formed after the first step is 0.035 μm or more and 0.115 μm. the following.

〔6〕如〔1〕至〔5〕中任一項之具有金屬層之金屬構件的製造方法,其中,該第一步驟後形成有該氧化物層之表面的Rz為0.25μm以上且1.00μm以下。 [6] The method for manufacturing a metal member having a metal layer according to any one of [1] to [5], wherein the Rz of the surface on which the oxide layer is formed after the first step is 0.25 μm or more and 1.00 μm. the following.

〔7〕如〔1〕至〔6〕中任一項之具有金屬層之金屬構件的製造方法,其中,該金屬層於垂直方向的平均厚度為20nm以上且80nm以下。 [7] The method for manufacturing a metal member having a metal layer according to any one of [1] to [6], wherein the average thickness of the metal layer in the vertical direction is 20 nm or more and 80 nm or less.

〔8〕如〔1〕至〔7〕中任一項之具有金屬層之金屬構件的製造方法,其中,該第二步驟後形成有該金屬層之表面的Ra為0.02μm以上且0.20μm以 下。 [8] The method of manufacturing a metal member having a metal layer according to any one of [1] to [7], wherein Ra of the surface on which the metal layer is formed after the second step is 0.02 μm or more and 0.20 μm or less. Down.

〔9〕如〔1〕至〔8〕中任一項之具有金屬層之金屬構件的製造方法,其中,該第二步驟後形成有該金屬層之表面的Rz為0.2μm以上且1.4μm以下。 [9] The method for manufacturing a metal member having a metal layer according to any one of [1] to [8], wherein Rz of the surface on which the metal layer is formed after the second step is 0.2 μm or more and 1.4 μm or less. .

〔10〕如〔1〕至〔9〕中任一項之具有金屬層之金屬構件的製造方法,其中,該第二步驟後形成有該金屬層之表面的耐色變色△E*ab為15以下。 [10] The method for manufacturing a metal member with a metal layer according to any one of [1] to [9], wherein the discoloration resistance ΔE*ab of the surface on which the metal layer is formed after the second step is 15 the following.

〔第1圖〕氧化處理後之實施例1及比較例1以掃描式電子顯微鏡(SEM)觀察之截面影像(倍率50000倍)。 [Figure 1] Cross-sectional images of Example 1 and Comparative Example 1 after oxidation treatment observed with a scanning electron microscope (SEM) (magnification: 50,000 times).

〔第2圖〕實施例(○)及比較例(◆)中,氧化物層的厚度與剝離強度之關係圖。 [Figure 2] A graph showing the relationship between the thickness of the oxide layer and the peel strength in Example (○) and Comparative Example (◆).

〔第3圖〕實施例(○)及比較例(◆)中,氧化物層的厚度與耐熱劣化率之關係圖。 [Figure 3] A graph showing the relationship between the thickness of the oxide layer and the heat resistance degradation rate in Example (○) and Comparative Example (◆).

〔第4圖〕實施例(○)及比較例(◆)中,氧化物層的厚度與耐熱變色△E*ab之關係圖。 [Figure 4] The relationship between the thickness of the oxide layer and the heat discoloration resistance ΔE*ab in Example (○) and Comparative Example (◆).

以下使用附加圖式詳細地說明本發明的較佳實施形態,但不限定於此。又,根據本說明書的記載,發明所屬技術領域中具有通常知識者係明瞭本發明的目的、特徵、優點及其構思,發明所屬技術領域中具有通常知識者可容易地根據本說明書的記載重現本發明。以下記載之發明的實施形態及具體實施例等,係表示本發明的較佳實施態樣,用於例示及說明,不用以限定本發明。發明所屬技術領域中具有通常知識者係明瞭,在本說明書所揭 示之本發明的意圖及範圍內,可基於本說明書的記載進行各種修飾。 Preferred embodiments of the present invention will be described in detail below using additional drawings, but are not limited thereto. Furthermore, from the description of this specification, a person with ordinary knowledge in the technical field to which the invention belongs will understand the purpose, characteristics, advantages and concepts of the present invention, and a person with ordinary knowledge in the technical field to which the invention belongs can easily reproduce it based on the description of this specification. invention. The embodiments and specific examples of the invention described below represent preferred embodiments of the invention and are used for illustration and explanation and are not intended to limit the invention. It would be obvious to a person with ordinary knowledge in the technical field to which the invention belongs. Various modifications can be made based on the description of this specification within the intention and scope of the present invention.

具有金屬層之金屬構件的製造方法:本發明之一實施態樣係具有金屬層之金屬構件的製造方法,包含第一步驟及第二步驟,該第一步驟係藉由氧化處理,在金屬構件的表面形成厚度為平均400nm以下且具有微細凹凸形狀之氧化物層,該第二步驟係在該氧化物層上藉由電鍍處理形成該金屬層。金屬構件係包含金屬作為構造的一部分之材料,所包含的金屬不特別限定,可舉例如鈦、鈮、不鏽鋼、鉭、鎳、鋅、鋁、銅、銀、金、白金等。金屬構件可為由銅形成的構件,亦可為由銅以外之物質形成的構件,也可為在由銅以外之物形成的構件表面設有銅層者,施以銅鍍者亦可。此構件的形狀不特別限定,例如可為箔狀、粒子狀、粉狀,金屬構件亦包含以銅為主成分之電解銅箔、壓延銅箔、附載體銅箔等銅箔、銅粒子、銅粒、銅線、銅板、銅製導線架等,但不限定於此。金屬構件的厚度不特別限定,可電鍍之厚度為佳,較佳為0.1μm以上且100μm以下,更佳為0.5μm以上且50μm以下。 Method for manufacturing a metal component with a metal layer: One embodiment of the present invention is a method for manufacturing a metal component with a metal layer, including a first step and a second step. The first step is to oxidize the metal component on the metal component. An oxide layer with an average thickness of less than 400 nm and a fine uneven shape is formed on the surface. The second step is to form the metal layer on the oxide layer by electroplating. The metal member is a material containing metal as a part of the structure. The metal contained is not particularly limited, and examples thereof include titanium, niobium, stainless steel, tantalum, nickel, zinc, aluminum, copper, silver, gold, platinum, and the like. The metal member may be a member made of copper or a member made of a substance other than copper, or a member made of a substance other than copper may have a copper layer on its surface, or may be copper plated. The shape of this member is not particularly limited. For example, it can be in the form of foil, granular, or powder. The metal member also includes copper foil such as electrolytic copper foil, rolled copper foil, and copper foil with a carrier, copper particles, and copper as the main component. pellets, copper wires, copper plates, copper lead frames, etc., but are not limited to these. The thickness of the metal member is not particularly limited, but a thickness that can be electroplated is preferred. It is preferably 0.1 μm or more and 100 μm or less, and more preferably 0.5 μm or more and 50 μm or less.

首先,第一步驟中,藉由將金屬構件氧化處理,在金屬構件表面形成氧化物層。形成方法不特別限定,可使用氧化劑來形成,亦可藉由加熱處理或陽極氧化來形成。此氧化步驟之前不需要蝕刻等粗化處理步驟,但亦可進行。可進行脫脂清洗,或進行鹼處理以防止酸被帶入氧化步驟。鹼處理的方法不特別限定,較佳可用0.1~10g/L之鹼性水溶液,更佳可用1~2g/L之鹼性水溶液,鹼性水溶液例如氫氧化鈉水溶液,於30~50℃處理0.5~2分鐘程度即可。 First, in the first step, the metal component is oxidized to form an oxide layer on the surface of the metal component. The formation method is not particularly limited and may be formed using an oxidizing agent, heat treatment or anodizing. This oxidation step does not need to be preceded by a roughening step such as etching, but may be performed. It can be degreased and cleaned, or it can be treated with an alkali to prevent acids from being carried into the oxidation step. The method of alkali treatment is not particularly limited. It is better to use an alkaline aqueous solution of 0.1~10g/L, and more preferably an alkaline aqueous solution of 1~2g/L. The alkaline aqueous solution, such as sodium hydroxide aqueous solution, is treated at 30~50°C for 0.5 ~2 minutes is enough.

氧化劑不特別限定,例如可使用亞氯酸鈉、次氯酸鈉、氯酸鉀、過氯酸鉀、過硫酸鉀等水溶液。氧化劑中可添加各種添加劑(例如磷酸三鈉十二水合物這樣的磷酸鹽)或表面活性分子。表面活性分子可舉例如紫質、紫質大環、擴張紫質、縮環紫質、紫質直鏈聚合物、紫質夾心配位錯合物、紫 質陣列、矽烷、四有機基-矽烷、胺基乙基-胺基丙基-三甲氧基矽烷、(3-胺基丙基)三甲氧基矽烷、(1-[3-(三甲氧基矽基)丙基]尿素)(1-[3-(Trimethoxysilyl)propyl]urea)、(3-胺基丙基)三乙氧基矽烷、(3-環氧丙基氧丙基)三甲氧基矽烷、(3-氯丙基)三甲氧基矽烷、(3-環氧丙基氧丙基)三甲氧基矽烷、二甲基二氯矽烷、3-(三甲氧基矽基)丙基甲基丙烯酸酯、乙基三乙醯氧基矽烷、三乙氧基(異丁基)矽烷、三乙氧基(辛基)矽烷、參(2-甲氧基乙氧基)(乙烯基)矽烷、氯三甲基矽烷、甲基三氯矽烷、四氯化矽、四乙氧基矽烷、苯基三甲氧基矽烷、氯三乙氧基矽烷、乙烯基-三甲氧基矽烷、胺、糖等。氧化處理液例如可使用包含30g/L以上~200g/L以下之亞氯酸鈉、40g/L以下之氫氧化鈉、8g/L以上~40g/L以下之氫氧化鉀、10g/L以下之3-環氧丙基氧丙基三甲氧基矽烷之水溶液。 The oxidizing agent is not particularly limited, and for example, aqueous solutions such as sodium chlorite, sodium hypochlorite, potassium chlorate, potassium perchlorate, and potassium persulfate can be used. Various additives (for example, phosphates such as trisodium phosphate dodecahydrate) or surface-active molecules can be added to the oxidizing agent. Examples of surface-active molecules include rhodopsin, rhodopsin macrocycle, expanded rhodopsin, contracted cyclic rhodopsin, linear rhodopsin polymers, rhodopsin sandwich coordination complexes, rhodopsin Mass array, silane, tetraorgano-silane, aminoethyl-aminopropyl-trimethoxysilane, (3-aminopropyl)trimethoxysilane, (1-[3-(trimethoxysilane (1-[3-(Trimethoxysilyl)propyl]urea), (3-aminopropyl)triethoxysilane, (3-epoxypropyloxypropyl)trimethoxysilane , (3-chloropropyl)trimethoxysilane, (3-epoxypropyloxypropyl)trimethoxysilane, dimethyldichlorosilane, 3-(trimethoxysilyl)propylmethacrylic acid Ester, ethyltriethyloxysilane, triethoxy(isobutyl)silane, triethoxy(octyl)silane, ginseng(2-methoxyethoxy)(vinyl)silane, chlorine Trimethylsilane, methyltrichlorosilane, silicon tetrachloride, tetraethoxysilane, phenyltrimethoxysilane, chlorotriethoxysilane, vinyl-trimethoxysilane, amines, sugars, etc. For example, the oxidation treatment liquid may contain sodium chlorite of 30 g/L to 200 g/L, sodium hydroxide of 40 g/L or less, potassium hydroxide of 8 g/L to 40 g/L, and potassium hydroxide of 10 g/L or less. Aqueous solution of 3-epoxypropyloxypropyltrimethoxysilane.

氧化反應條件不特別限定,氧化劑的液溫較佳為40~95℃,更佳為45~80℃。反應時間較佳為0.5~30分,更佳為1~10分。 The oxidation reaction conditions are not particularly limited. The liquid temperature of the oxidizing agent is preferably 40 to 95°C, more preferably 45 to 80°C. The reaction time is preferably 0.5 to 30 minutes, more preferably 1 to 10 minutes.

第一步驟中,可用溶解劑將藉由氧化處理形成之氧化物層溶解,以調整氧化物層表面的凹凸部。 In the first step, the oxide layer formed by the oxidation treatment can be dissolved with a dissolving agent to adjust the uneven portions on the surface of the oxide layer.

於本步驟使用之溶解劑不特別限定,較佳為螯合劑,特別是生物分解性螯合劑等,可舉例如乙二胺四乙酸、二羥乙基甘胺酸、L-麩胺酸二乙酸四鈉、乙二胺-N,N’-二琥珀酸、3-羥基-2,2’-亞胺基二琥珀酸鈉、甲基甘胺酸二乙酸三鈉、天門冬胺酸二乙酸四鈉、N-(2-羥基乙基)亞胺基二乙酸二鈉、葡萄糖酸鈉等。 The dissolving agent used in this step is not particularly limited. Preferably it is a chelating agent, especially a biodegradable chelating agent. Examples include ethylenediaminetetraacetic acid, dihydroxyethylglycine, and L-glutamic acid diacetic acid. Tetrasodium, ethylenediamine-N,N'-disuccinic acid, sodium 3-hydroxy-2,2'-iminodisuccinate, trisodium methylglycine diacetate, tetrasodium aspartic acid diacetate Sodium, disodium N-(2-hydroxyethyl)iminodiacetate, sodium gluconate, etc.

溶解劑的pH值不特別限定,較佳為鹼性,更佳為pH8.0~10.5,又較佳為pH9.0~10.5,又更佳為pH9.8~10.2。 The pH value of the dissolving agent is not particularly limited, but it is preferably alkaline, more preferably pH 8.0~10.5, further preferably pH 9.0~10.5, further preferably pH 9.8~10.2.

第一步驟中,使氧化物層的厚度平均為400nm以下。較佳為平均200nm以下,更佳為平均160nm以下,或平均90nm以下。並且,氧化 物層的厚度較佳為平均20nm以上,更佳為平均30nm以上,又較佳為平均40nm以上。此外,氧化物層的厚度為400nm以下之區域的比例不特別限定,較佳係50%以上區域為400nm以下,更佳係70%以上區域為400nm以下,又較佳係90%以上區域為400nm以下,又更佳係95%以上區域為400nm以下,進一步較佳係幾乎100%之區域為400nm以下。氧化物層的厚度之比例如可藉由連續電化學還原法(SERA)由10×10cm面積中的10個測定點來算出。 In the first step, the thickness of the oxide layer is made to be 400 nm or less on average. The average thickness is preferably 200 nm or less, more preferably 160 nm or less, or 90 nm or less. And, oxidation The thickness of the physical layer is preferably an average of 20 nm or more, more preferably an average of 30 nm or more, and still more preferably an average of 40 nm or more. In addition, the proportion of the area where the thickness of the oxide layer is 400 nm or less is not particularly limited, but more preferably 50% or more of the area is 400 nm or less, more preferably 70% or more of the area is 400 nm or less, and more preferably 90% or more of the area is 400 nm. below, more preferably, more than 95% of the area is 400 nm or less, and still more preferably, almost 100% of the area is 400 nm or less. The thickness ratio of the oxide layer can be calculated from 10 measurement points in an area of 10×10 cm, for example, by the continuous electrochemical reduction method (SERA).

氧化銅的算數平均粗度(Ra)較佳為0.01μm以上,更佳為0.04μm以上,又,較佳為0.20μm以下,更佳為0.060μm以下。氧化銅的最大高度粗度(Rz)較佳為0.2μm以上,更佳為0.4μm以上,又,較佳為1.0μm以下,更佳為0.50μm以下。在此,最大高度粗度(Rz)係表示基準長度l中,輪廓曲線(y=Z(x))的峰高Zp之最大值與谷深Zv之最大值的和。算數平均粗度(Ra)係表示基準長度l中,以下式表示之輪廓曲線(y=Z(x))中Z(x)(即峰高及谷深)之絕對值的平均值。 The arithmetic mean roughness (Ra) of copper oxide is preferably 0.01 μm or more, more preferably 0.04 μm or more, and preferably 0.20 μm or less, more preferably 0.060 μm or less. The maximum height roughness (Rz) of copper oxide is preferably 0.2 μm or more, more preferably 0.4 μm or more, and preferably 1.0 μm or less, more preferably 0.50 μm or less. Here, the maximum height roughness (Rz) represents the sum of the maximum value of the peak height Zp and the maximum value of the valley depth Zv of the contour curve (y=Z(x)) in the reference length l. The arithmetic mean roughness (Ra) represents the average value of the absolute values of Z(x) (that is, peak height and valley depth) in the profile curve (y=Z(x)) expressed by the following formula in the reference length l.

Figure 109109832-A0305-02-0008-1
Figure 109109832-A0305-02-0008-1

表面粗度Ra、Rz係根據JIS B 0601:2000(基於國際標準ISO4287-1997)規定之方法算出。 Surface roughness Ra and Rz are calculated according to the method specified in JIS B 0601:2000 (based on international standard ISO4287-1997).

接著,第二步驟中,對第一步驟中形成之氧化物層進行電鍍處理,形成金屬層。用於電鍍處理的金屬,只要是與金屬構件之金屬不同則不特別限定,較佳為選自由錫、銀、鋅、鋁、鈦、鉍、鉻、鐵、鈷、鎳、鈀、金及鉑組成之群組中至少一種之金屬或該等之合金。特別是金屬構件為銅的情況下,為了具有耐熱性,較佳用耐熱性比銅高之金屬,例如鎳、鈀、金及鉑或該等之合金。 Then, in the second step, the oxide layer formed in the first step is electroplated to form a metal layer. The metal used for electroplating is not particularly limited as long as it is different from the metal of the metal component, but is preferably selected from tin, silver, zinc, aluminum, titanium, bismuth, chromium, iron, cobalt, nickel, palladium, gold and platinum. At least one metal from the group or their alloys. Especially when the metal member is copper, in order to have heat resistance, it is preferable to use a metal with higher heat resistance than copper, such as nickel, palladium, gold, platinum or alloys thereof.

以電鍍形成之金屬層於垂直方向的平均厚度不特別限定,較佳為10nm以上,更佳為15nm以上,又較佳為20nm以上。並且,較佳為100nm以下,更佳為70nm以下,又較佳為50nm以下。或者,以電鍍形成之金屬層的金屬量,以單位面積之金屬重量表示時,較佳為15μg/cm2以上,更佳為18μg/cm2以上,又較佳為20μg/cm2以上。另,較佳為100μg/cm2以下,更佳為80μg/cm2以下,又較佳為50μg/cm2以下。金屬層於垂直方向的平均厚度係可以將形成金屬層之金屬以酸性溶液溶解,藉由ICP分析測定金屬量,將其測定量除以金屬構件之面積來算出。或者,亦可藉由將具有金屬層之金屬構件本身溶解,僅偵測並測定形成金屬層之金屬的量來算出。 The average thickness of the metal layer formed by electroplating in the vertical direction is not particularly limited, but is preferably 10 nm or more, more preferably 15 nm or more, and still more preferably 20 nm or more. Furthermore, the thickness is preferably 100 nm or less, more preferably 70 nm or less, and still more preferably 50 nm or less. Alternatively, the metal amount of the metal layer formed by electroplating, expressed in terms of metal weight per unit area, is preferably 15 μg/cm 2 or more, more preferably 18 μg/cm 2 or more, and still more preferably 20 μg/cm 2 or more. In addition, it is preferably 100 μg/cm 2 or less, more preferably 80 μg/cm 2 or less, and still more preferably 50 μg/cm 2 or less. The average thickness of the metal layer in the vertical direction can be calculated by dissolving the metal forming the metal layer in an acidic solution, measuring the amount of metal by ICP analysis, and dividing the measured amount by the area of the metal member. Alternatively, it can also be calculated by dissolving the metal member having the metal layer itself and detecting and measuring only the amount of metal forming the metal layer.

電鍍需要電荷以使氧化物層的一部分氧化物還原,因此,例如對銅箔鍍鎳的情況下,為了使其厚度在較佳範圍內,對於用電鍍處理之金屬構件的單位面積,較佳給予15C/dm2以上~90C/dm2以下之電荷。又,電流密度較佳為5A/dm2以下。若電流密度過高則鍍敷會集中於凸部,難以均一地電鍍。此外,可以改變鍍敷過程中的電流至氧化物層的一部分氧化物還原為止。又,藉由鍍敷之金屬來適當地調整至規定的厚度。鎳鍍及鎳合金鍍可舉例如純鎳、鎳銅合金、鎳鉻合金、鎳鈷合金、鎳鋅合金、鎳錳合金、鎳鉛合金、鎳磷合金等。鍍敷離子的供給劑係可使用例如硫酸鎳、氨基磺酸鎳、氯化鎳、溴化鎳、氧化鋅、氯化鋅、二胺二氯鈀、硫酸鐵、氯化鐵、無水鉻酸、氯化鉻、硫酸鉻鈉、硫酸銅、焦磷酸銅、硫酸鈷、硫酸錳、次磷酸鈉等。包含pH緩衝劑或光澤劑等之其他添加劑可使用例如硼酸、醋酸鎳、檸檬酸、檸檬酸鈉、檸檬酸銨、甲酸鉀、蘋果酸、蘋果酸鈉、氫氧化鈉、氫氧化鉀、碳酸鈉、氯化銨、氰化鈉、酒石酸鉀鈉、硫氰酸鉀、硫酸、鹽酸、氯化鉀、硫酸銨、氯化銨、硫酸鉀、硫酸鈉、硫氰酸鈉、硫代硫酸鈉、溴酸鉀、焦磷酸鉀、乙二胺、硫酸鎳銨、硫代硫酸鈉、氟矽酸、氟矽酸鈉、硫酸鍶、甲酚磺酸、β-萘酚、糖精、1,3,6- 萘三磺酸、萘二磺酸鈉、萘三磺酸鈉、磺胺、亞磺酸、1,4-丁炔二醇、香豆素、十二烷基硫酸鈉等。鎳鍍的建浴組成較佳可包含例如硫酸鎳(100g/L以上~350g/L以下)、氨基磺酸鎳(100g/L以上~600g/L以下)、氯化鎳(0g/L以上~300g/L以下)及該等之混合物,亦可包含檸檬酸鈉(0g/L以上~100g/L以下)或硼酸(0g/L以上~60g/L以下)作為添加劑。 Electroplating requires an electric charge to reduce a part of the oxide of the oxide layer. Therefore, for example, when plating copper foil with nickel, in order to keep the thickness within a preferred range, it is better to give the unit area of the metal member processed by electroplating Charge above 15C/dm 2 ~ below 90C/dm 2 . Moreover, the current density is preferably 5 A/dm 2 or less. If the current density is too high, plating will be concentrated on the convex parts, making it difficult to achieve uniform plating. Furthermore, the current during plating can be varied until a portion of the oxide of the oxide layer is reduced. In addition, it is appropriately adjusted to the specified thickness by plating the metal. Examples of nickel plating and nickel alloy plating include pure nickel, nickel-copper alloy, nickel-chromium alloy, nickel-cobalt alloy, nickel-zinc alloy, nickel-manganese alloy, nickel-lead alloy, nickel-phosphorus alloy, and the like. Examples of the supplying agent for plating ions include nickel sulfate, nickel sulfamate, nickel chloride, nickel bromide, zinc oxide, zinc chloride, palladium diamine dichloride, ferric sulfate, ferric chloride, anhydrous chromic acid, Chromium chloride, sodium chromium sulfate, copper sulfate, copper pyrophosphate, cobalt sulfate, manganese sulfate, sodium hypophosphite, etc. Other additives including pH buffers or gloss agents may be used, such as boric acid, nickel acetate, citric acid, sodium citrate, ammonium citrate, potassium formate, malic acid, sodium malate, sodium hydroxide, potassium hydroxide, and sodium carbonate. , ammonium chloride, sodium cyanide, potassium sodium tartrate, potassium thiocyanate, sulfuric acid, hydrochloric acid, potassium chloride, ammonium sulfate, ammonium chloride, potassium sulfate, sodium sulfate, sodium thiocyanate, sodium thiosulfate, potassium bromate , potassium pyrophosphate, ethylenediamine, nickel ammonium sulfate, sodium thiosulfate, fluorosilicic acid, sodium fluorosilicate, strontium sulfate, cresolsulfonic acid, β-naphthol, saccharin, 1,3,6-naphthalene trisulfate Sulfonic acid, sodium naphthalene disulfonate, sodium naphthalene trisulfonate, sulfonamide, sulfinic acid, 1,4-butynediol, coumarin, sodium lauryl sulfate, etc. The preferred bath composition for nickel plating can include, for example, nickel sulfate (above 100g/L~350g/L), nickel sulfamate (above 100g/L~600g/L), nickel chloride (above 0g/L~ 300g/L or less) and mixtures thereof may also contain sodium citrate (0g/L or more to 100g/L or less) or boric acid (0g/L or more to 60g/L or less) as additives.

電解處理後之表面的算數平均粗度(Ra)較佳為0.02μm以上,更佳為0.04μm以上,又,較佳為0.20μm以下,更佳為0.060μm以下。電解處理後之表面的最大高度粗度(Rz)較佳為0.2μm以上,更佳為0.4μm以上,又,較佳為1.4μm以下,更佳為0.50μm以下。又,氧化處理後之Ra與鍍金屬處理後之Ra的比值(氧化處理後之Ra/鍍金屬處理後之Ra)所表示之表面粗度的變化較佳為0.7以上~1.3以下,氧化處理後之Rz與鍍金屬處理後之Rz的比值(氧化處理後之Rz/鍍金屬處理及耦合處理後之Rz)較佳為0.8以上~1.2以下。此比值越接近1則表示電鍍形成之金屬層的厚度越均一。 The arithmetic mean roughness (Ra) of the surface after electrolytic treatment is preferably 0.02 μm or more, more preferably 0.04 μm or more, and preferably 0.20 μm or less, more preferably 0.060 μm or less. The maximum height roughness (Rz) of the surface after electrolytic treatment is preferably 0.2 μm or more, more preferably 0.4 μm or more, and preferably 1.4 μm or less, more preferably 0.50 μm or less. In addition, the change in surface roughness expressed by the ratio of Ra after oxidation treatment to Ra after metal plating (Ra after oxidation treatment/Ra after metal plating treatment) is preferably 0.7 or more and 1.3 or less. The ratio of Rz to Rz after metal plating (Rz after oxidation treatment/Rz after metal plating and coupling treatment) is preferably from 0.8 to 1.2. The closer this ratio is to 1, the more uniform the thickness of the metal layer formed by electroplating is.

像這樣,藉由對金屬構件進行第一步驟及第二步驟,可以製造具有金屬層之金屬構件,以此製造方法製造的具有金屬層之金屬構件,與樹脂之密著性及耐熱性優異。 In this way, by performing the first step and the second step on the metal member, a metal member having a metal layer can be produced. The metal member having a metal layer produced by this production method has excellent adhesion to resin and excellent heat resistance.

本發明之一實施態樣中,藉由顏色變化△E*ab評價以此製造方法製造的具有金屬層之金屬構件的耐熱性時,15以下即可,較佳為10以下。顏色變化△E*ab可用習知方法測定。例如,可以在測定熱處理前之金屬構件的色差(L*、a*、b*)後,放入225℃之烘箱30分鐘,測定熱處理後之金屬構件的色差,算出△E*ab。 In one embodiment of the present invention, when the heat resistance of the metal member with the metal layer manufactured by this manufacturing method is evaluated by color change ΔE*ab, it is 15 or less, preferably 10 or less. The color change ΔE*ab can be measured by conventional methods. For example, after measuring the color difference (L*, a*, b*) of the metal member before heat treatment, place it in an oven at 225°C for 30 minutes, measure the color difference of the metal member after heat treatment, and calculate ΔE*ab.

另,能夠對以此製造方法製造的具有金屬層之金屬構件,進行使用矽烷耦合劑等之耦合處理或使用苯并三唑類等之防鏽處理。 In addition, the metal member having the metal layer produced by this manufacturing method can be subjected to coupling treatment using a silane coupling agent or the like or anti-rust treatment using benzotriazoles or the like.

又,能夠對以此製造方法製造的具有金屬層之金屬構件積層樹 脂基材,以製作積層體。本發明之一實施態樣中,所製作之積層體在耐熱測試的劣化率為45%以下即可,較佳為30%以下、20%以下或10%以下。耐熱測試的劣化率可用習知方法來測定。例如,可以由測定耐熱測試前後的剝離強度,其剝離強度之差除以耐熱測試前的剝離強度所得到比例來表示。 Furthermore, the metal member having the metal layer manufactured by this manufacturing method can be laminated. Grease base material to make laminates. In one embodiment of the present invention, the deterioration rate of the produced laminate in the heat resistance test is 45% or less, preferably 30% or less, 20% or less, or 10% or less. The deterioration rate of the heat resistance test can be measured by conventional methods. For example, it can be expressed as a ratio obtained by measuring the peel strength before and after the heat resistance test and dividing the difference in peel strength by the peel strength before the heat resistance test.

具有金屬層之金屬構件的利用方法:以本發明之製造方法製造的具有金屬層之金屬構件,其金屬構件為銅的情況下,可用於印刷佈線板所使用之銅箔、於基板配線之銅線、LIB負極集電體用之銅箔等。例如,將印刷佈線板所使用之銅箔的表面以本發明之製造方法粗化處理,與樹脂黏著成層狀,藉此製作積層板以用於製造印刷佈線板。此情況下的樹脂種類不特別限定,較佳為聚苯醚、環氧樹脂、PPO、PBO、PTFE、LCP或TPPI。又例如,將LIB負極集電體用之銅箔以本發明之製造方法粗化處理,藉此可提升銅箔與負極材料之密著性,可得到容量劣化少之良好的鋰離子電池。鋰離子電池用之負極集電體可依照習知方法來製造。例如,調製含有碳系活性物質之負極材料,使其分散於溶劑或水形成活性物質漿料。將此活性物質漿料塗佈於經本發明之製造方法粗化的銅箔後,使溶劑或水蒸發而乾燥。之後壓製,再度乾燥後將負極集電體成形為所需形狀。此外,負極材料亦可包含理論容量比碳系活性物質大之矽或矽化合物、鍺、錫或鉛等。又,電解質係除了將鋰鹽溶解於有機溶劑之有機電解液以外,亦可使用由聚乙二醇或聚偏二氟乙烯等形成之聚合物。以本發明之製造方法粗化表面的銅箔,除了用於鋰離子電池以外,亦可適用於鋰離子聚合物電池。 Utilization method of metal member with metal layer: The metal member with metal layer produced by the manufacturing method of the present invention, when the metal member is copper, can be used as copper foil used in printed wiring boards and copper in substrate wiring. wire, copper foil for LIB negative electrode current collector, etc. For example, the surface of the copper foil used for printed wiring boards is roughened by the manufacturing method of the present invention, and is bonded with resin to form a layer, thereby producing a laminate for use in manufacturing printed wiring boards. The type of resin in this case is not particularly limited, but is preferably polyphenylene ether, epoxy resin, PPO, PBO, PTFE, LCP or TPPI. For another example, by roughening the copper foil used for the LIB negative electrode current collector by the manufacturing method of the present invention, the adhesion between the copper foil and the negative electrode material can be improved, and a good lithium ion battery with less capacity degradation can be obtained. The negative electrode current collector used in lithium ion batteries can be manufactured according to conventional methods. For example, a negative electrode material containing a carbon-based active material is prepared and dispersed in a solvent or water to form an active material slurry. This active material slurry is applied to the copper foil roughened by the manufacturing method of the present invention, and then the solvent or water is evaporated and dried. After that, it is pressed and dried again to form the negative electrode current collector into the desired shape. In addition, the negative electrode material may also include silicon or silicon compounds, germanium, tin or lead, etc., which have a larger theoretical capacity than the carbon-based active material. In addition, as the electrolyte, in addition to an organic electrolyte solution in which a lithium salt is dissolved in an organic solvent, a polymer made of polyethylene glycol, polyvinylidene fluoride, or the like can also be used. In addition to being used in lithium-ion batteries, the copper foil whose surface is roughened by the manufacturing method of the present invention can also be used in lithium-ion polymer batteries.

(實施例)<1.製造具有金屬層之金屬構件>:實施例1~9及比較例1~4使用DR-WS(古河電工股份有限公司製,厚度18μm)銅箔。又,實施例及比較例中,分別以相同條件製作數個測試片。 (Examples) <1. Manufacturing a metal member with a metal layer>: Examples 1 to 9 and Comparative Examples 1 to 4 used DR-WS (manufactured by Furukawa Electric Co., Ltd., thickness 18 μm) copper foil. In addition, in the examples and comparative examples, several test pieces were produced under the same conditions.

(1)前處理:〔鹼脫脂處理〕將銅箔浸漬於液溫50℃、40g/L 之氫氧化鈉水溶液中1分鐘後,進行水洗。 (1) Pretreatment: [Alkali degreasing treatment] Immerse the copper foil in a liquid temperature of 50°C and 40g/L After 1 minute in the sodium hydroxide aqueous solution, wash with water.

〔酸洗處理〕將經過鹼脫脂處理之銅箔浸漬於液溫25℃、10重量%之硫酸水溶液中2分鐘後,進行水洗。 [Pickling treatment] The copper foil that has been subjected to alkali degreasing treatment is immersed in a 10% by weight sulfuric acid aqueous solution with a liquid temperature of 25°C for 2 minutes, and then washed with water.

〔預浸處理〕將經過酸洗處理之銅箔浸漬於液溫40℃、氫氧化鈉(NaOH)1.2g/L之預浸用藥液中1分鐘。 [Pre-soaking treatment] Immerse the pickled copper foil in a pre-soaking solution with a liquid temperature of 40°C and sodium hydroxide (NaOH) 1.2g/L for 1 minute.

(2)氧化處理(第一步驟):將經過鹼處理之銅箔根據第1表記載之條件,使用氧化處理用水溶液進行氧化處理。經過該等處理後水洗銅箔。評價方法係於之後的<2.氧化處理後之試料的評價>敘述,如第1圖所示,根據氧化銅層的厚度,其表面的凹凸之形狀或大小係大幅變化。 (2) Oxidation treatment (first step): The alkali-treated copper foil is oxidized using an oxidation treatment aqueous solution according to the conditions described in Table 1. After these treatments, the copper foil is washed with water. The evaluation method is described later in <2. Evaluation of Samples After Oxidation Treatment>. As shown in Figure 1, the shape or size of the unevenness on the surface of the copper oxide layer greatly changes depending on the thickness of the copper oxide layer.

(3)電鍍處理:對經過氧化處理之銅箔,根據第1表記載之條件進行電鍍處理。比較例2及比較例3即使進行電鍍3分鐘後仍無鎳析出。 (3) Electroplating treatment: The oxidized copper foil is subjected to electroplating treatment according to the conditions described in Table 1. In Comparative Examples 2 and 3, no nickel was precipitated even after electroplating for 3 minutes.

(4)耦合處理:對經過電鍍處理之銅箔,根據第1表記載之條件進行耦合處理。 (4) Coupling treatment: Coupling treatment is performed on the electroplated copper foil according to the conditions recorded in Table 1.

<2.氧化處理後之試料的評價>:(1)氧化銅厚度之測定:使用QC-100(ECI製),用以下的電解液藉由連續電化學還原法(SERA)測定銅箔表面之氧化銅的厚度。 <2. Evaluation of samples after oxidation treatment>: (1) Measurement of copper oxide thickness: Use QC-100 (manufactured by ECI) and measure the thickness of the copper foil surface by the continuous electrochemical reduction method (SERA) using the following electrolyte solution The thickness of copper oxide.

電解液(pH=8.4) Electrolyte (pH=8.4)

硼酸6.18g/L;四硼酸鈉9.55g/L Boric acid 6.18g/L; sodium tetraborate 9.55g/L

具體而言,使用口徑0.32cm之墊片,於90μA/cm2之電流密度使用上述電解液時,判斷電位由-0.85V以上至-0.6V為止為氧化銅(CuO)的波峰。 Specifically, when using a gasket with a diameter of 0.32cm and using the above-mentioned electrolyte at a current density of 90μA/ cm2 , the potential was judged to be the peak of copper oxide (CuO) from more than -0.85V to -0.6V.

(2)算出Ra及Rz:將氧化處理後之銅箔使用共軛焦掃描式電子顯微鏡OPTELICS H1200(Lasertec股份有限公司製)測定銅箔的表面形狀,根據JIS B 0601:2001規定之方法算出Ra及Rz。測定條件:掃描寬度為100μm、掃描類型為Area、光源為藍光、Cut-off值為1/5。接物鏡x100、 目鏡x14、數位變焦x1、Z間距設為10nm,取得3個位置之資料,計算其平均值作為各實施例及各比較例之Ra及Rz。實施例6及比較例1~3無法算出,故表上記載為N.D.。 (2) Calculate Ra and Rz: Use a conjugate focal scanning electron microscope OPTELICS H1200 (manufactured by Lasertec Co., Ltd.) to measure the surface shape of the oxidized copper foil, and calculate Ra according to the method specified in JIS B 0601:2001. and Rz. Measurement conditions: scanning width is 100 μm, scanning type is Area, light source is blue light, and Cut-off value is 1/5. With objective lens x100, The eyepiece x14, the digital zoom x1, and the Z pitch were set to 10 nm. Data were obtained at three positions, and the average value was calculated as Ra and Rz for each example and each comparative example. Example 6 and Comparative Examples 1 to 3 cannot be calculated, so they are recorded as N.D. in the table.

<3.電鍍及耦合處理後的試料之評價>(1)算出鎳量:鎳之垂直方向的平均厚度的測定方法,例如將銅構件溶解於12%硝酸,將所得之液使用ICP發射光譜裝置5100 SVDV ICP-OES(Agilent Technologies公司製)測定金屬成分的濃度,藉由考慮金屬密度、金屬層的表面積來算出層狀之金屬層的厚度。 <3. Evaluation of samples after electroplating and coupling treatment> (1) Calculate the amount of nickel: The method of measuring the average thickness of nickel in the vertical direction, for example, dissolve the copper component in 12% nitric acid, and use the resulting liquid with an ICP emission spectrometer. 5100 SVDV ICP-OES (manufactured by Agilent Technologies) measures the concentration of metal components and calculates the thickness of the layered metal layer by considering the metal density and the surface area of the metal layer.

(2)算出Ra及Rz:將電鍍及耦合處理後之銅箔使用共軛焦掃描式電子顯微鏡OPTELICS H1200(Lasertec股份有限公司製)測定銅箔的表面形狀,根據JIS B 0601:2001規定之方法算出Ra及Rz。測定條件:掃描寬度為100μm、掃描類型為Area、光源為藍光、Cut-off值為1/5。接物鏡x100、目鏡x14、數位變焦x1、Z間距設為10nm,取得3個位置之資料,Ra及Rz為3個位置之平均值。 (2) Calculate Ra and Rz: Use a conjugate focal scanning electron microscope OPTELICS H1200 (manufactured by Lasertec Co., Ltd.) to measure the surface shape of the copper foil after electroplating and coupling treatment, according to the method specified in JIS B 0601:2001 Calculate Ra and Rz. Measurement conditions: scanning width is 100 μm, scanning type is Area, light source is blue light, and Cut-off value is 1/5. Connect the objective lens x100, the eyepiece x14, the digital zoom x1, and set the Z spacing to 10nm, and obtain the data of three positions. Ra and Rz are the average values of the three positions.

(3)積層體的熱處理前後之剝離強度測定:對於電鍍及耦合處理後之銅箔,製作積層體並測定熱處理前後之剝離強度。又,測定剝離強度時以目視確認剝離面,確認鍍敷層有無剝離。首先,對於各銅箔,將包含PPE作為樹脂之MEGTRON6(Panasonic公司製)於真空中以加壓壓力2.9MPa、溫度210℃、加壓時間120分鐘之條件進行加熱壓製以積層,各得到兩個測定試料。對於各一個測定試料,為了得知其對熱之耐性,係進行耐熱處理(177℃、10日)。之後,對於各個經過熱處理之試料及未經過熱處理之試料,進行90°剝離測試(日本工業規格(JIS)C5016),求出剝離強度(kgf/cm)。耐熱劣化率係將所測定之耐熱測試前後的剝離強度差除以耐熱測試前的剝離強度所得到比例而算出。上述使用MEGTRON6作為預浸體, 但使用MEGTRON4等其他市售預浸體亦幾乎不會發生銅箔造成的劣化,可得到同樣的熱處理前後之密著性。 (3) Measurement of the peel strength of the laminated body before and after heat treatment: For the copper foil after electroplating and coupling treatment, a laminated body was produced and the peel strength before and after heat treatment was measured. In addition, when measuring the peeling strength, the peeling surface was visually confirmed to confirm whether the plating layer was peeled off. First, for each copper foil, MEGTRON6 (manufactured by Panasonic Corporation) containing PPE as a resin was heat-pressed and laminated in a vacuum under the conditions of a pressurizing pressure of 2.9 MPa, a temperature of 210° C., and a pressurizing time of 120 minutes, and two sheets each were obtained. Measure the sample. Each measurement sample was subjected to heat-resistant treatment (177° C., 10 days) in order to determine its heat resistance. Thereafter, a 90° peel test (Japanese Industrial Standard (JIS) C5016) was performed on each of the heat-treated samples and the non-heat-treated samples to determine the peel strength (kgf/cm). The heat resistance deterioration rate is calculated as a ratio obtained by dividing the measured difference in peel strength before and after the heat resistance test by the peel strength before the heat resistance test. The above uses MEGTRON6 as the prepreg, However, when using other commercially available prepregs such as MEGTRON4, almost no deterioration caused by copper foil occurs, and the same adhesion before and after heat treatment can be obtained.

(4)算出銅箔的熱處理前後之顏色變化:電鍍及耦合處理後之銅箔的耐熱性亦以顏色變化來評價。具體而言,於225℃之烘箱進行熱處理30分鐘,由△E*ab評價前後的顏色變化。測定熱處理前之銅箔的色差(L*、a*、b*)後,放入225℃之烘箱30分鐘,測定熱處理後之銅箔的色差,根據下式算出△E*ab。 (4) Calculate the color change of copper foil before and after heat treatment: The heat resistance of copper foil after electroplating and coupling treatment is also evaluated by color change. Specifically, heat treatment was performed in an oven at 225° C. for 30 minutes, and the color change before and after was evaluated by ΔE*ab. After measuring the color difference (L*, a*, b*) of the copper foil before heat treatment, place it in an oven at 225°C for 30 minutes, measure the color difference of the copper foil after heat treatment, and calculate ΔE*ab according to the following formula.

△E*ab=[(△L*)2+(△a*)2+(△b*)2]1/2 △E*ab=[(△L * ) 2 +(△a * ) 2 +(△b * ) 2 ] 1/2

第1表

Figure 109109832-A0305-02-0015-2
Figure 109109832-A0305-02-0016-3
Table 1
Figure 109109832-A0305-02-0015-2
Figure 109109832-A0305-02-0016-3

像這樣,氧化銅的厚度在502nm以上的情況下無法電鍍(比較例2、比較例3)。又,即使是可電鍍之氧化銅的厚度,當氧化銅的厚度比400nm厚時,無法得到鍍敷層與金屬構件之密著性而發生剝離(比較例1)。相較於此,氧化銅的厚度為400nm以下之實施例1~9中,有得到鍍敷層與金屬構件之密著性,且與樹脂之密著性及耐熱性優異。此外,電流密度大於5A/dm2的情況下,耐熱性低(比較例4),相較於此,電流密度小於5A/dm2之實施例1~9中與樹脂之密著性及耐熱性優異。 In this way, when the thickness of copper oxide is 502 nm or more, electroplating cannot be performed (Comparative Example 2, Comparative Example 3). Furthermore, even if the thickness of copper oxide is electroplatable, when the thickness of copper oxide is thicker than 400 nm, adhesion between the plating layer and the metal member cannot be obtained and peeling occurs (Comparative Example 1). In comparison, in Examples 1 to 9 in which the thickness of the copper oxide was 400 nm or less, adhesion between the plating layer and the metal member was obtained, and adhesion to the resin and heat resistance were excellent. In addition, when the current density is greater than 5A/ dm2 , the heat resistance is low (Comparative Example 4). In contrast, in Examples 1 to 9 where the current density is less than 5A/ dm2 , the adhesion to the resin and the heat resistance are Excellent.

產業利用性:根據本發明,可提供新穎的具有金屬層之金屬構件的製造方法。 Industrial Applicability: According to the present invention, a novel method for manufacturing a metal member having a metal layer can be provided.

Claims (10)

一種具有金屬層之金屬構件的製造方法,包含第一步驟及第二步驟,該第一步驟係藉由氧化處理,在金屬構件的至少一部分表面形成厚度為平均400nm以下且具有微細凹凸形狀之氧化物層,該第二步驟係在該氧化物層上藉由電鍍處理形成該金屬層。 A method of manufacturing a metal member with a metal layer, including a first step and a second step. The first step is to form an oxidation layer with an average thickness of 400 nm or less and a fine uneven shape on at least part of the surface of the metal member through an oxidation treatment. The second step is to form the metal layer on the oxide layer by electroplating. 如請求項1之具有金屬層之金屬構件的製造方法,其中,該第二步驟中電解處理的電流密度為5A/dm2以下。 The method for manufacturing a metal component with a metal layer as claimed in claim 1, wherein the current density of the electrolytic treatment in the second step is 5 A/dm 2 or less. 如請求項1或2之具有金屬層之金屬構件的製造方法,其中,該金屬構件為銅構件,該金屬層為銅以外之金屬的層。 The method for manufacturing a metal component with a metal layer as claimed in claim 1 or 2, wherein the metal component is a copper component and the metal layer is a layer of a metal other than copper. 如請求項3之具有金屬層之金屬構件的製造方法,其中,該銅以外之金屬為選自由錫、銀、鋅、鋁、鈦、鉍、鉻、鐵、鈷、鎳、鈀、金及鉑組成之群組中至少一種之金屬。 The method of manufacturing a metal component with a metal layer according to claim 3, wherein the metal other than copper is selected from the group consisting of tin, silver, zinc, aluminum, titanium, bismuth, chromium, iron, cobalt, nickel, palladium, gold and platinum. At least one metal in the group. 如請求項1或2之具有金屬層之金屬構件的製造方法,其中,該第一步驟後形成有該氧化物層之表面的Ra為0.035μm以上且0.115μm以下。 The method of manufacturing a metal member with a metal layer as claimed in claim 1 or 2, wherein the Ra of the surface on which the oxide layer is formed after the first step is 0.035 μm or more and 0.115 μm or less. 如請求項1或2之具有金屬層之金屬構件的製造方法,其中,該第一步驟後形成有該氧化物層之表面的Rz為0.25μm以上且1.00μm以下。 The method for manufacturing a metal member with a metal layer as claimed in claim 1 or 2, wherein the Rz of the surface on which the oxide layer is formed after the first step is 0.25 μm or more and 1.00 μm or less. 如請求項1或2之具有金屬層之金屬構件的製造方法,其中,該金屬層於垂直方向的平均厚度為20nm以上且80nm以下。 The method for manufacturing a metal component with a metal layer as claimed in claim 1 or 2, wherein the average thickness of the metal layer in the vertical direction is 20 nm or more and 80 nm or less. 如請求項1或2之具有金屬層之金屬構件的製造方法,其中,該第二步驟後形成有該金屬層之表面的Ra為0.02μm以上且0.20μm以下。 The manufacturing method of a metal member with a metal layer as claimed in claim 1 or 2, wherein the Ra of the surface on which the metal layer is formed after the second step is 0.02 μm or more and 0.20 μm or less. 如請求項1或2之具有金屬層之金屬構件的製造方法,其中,該第二步驟後形成有該金屬層之表面的Rz為0.2μm以上且1.4μm以下。 The manufacturing method of a metal member with a metal layer as claimed in claim 1 or 2, wherein the Rz of the surface on which the metal layer is formed after the second step is 0.2 μm or more and 1.4 μm or less. 如請求項1或2之具有金屬層之金屬構件的製造方法,其中, 該第二步驟後形成有該金屬層之表面的耐熱變色△E*ab為15以下。 The manufacturing method of a metal component with a metal layer as claimed in claim 1 or 2, wherein, The heat-resistant discoloration ΔE*ab of the surface on which the metal layer is formed after the second step is 15 or less.
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