TWI822069B - Battery roll testing method with imaging systems - Google Patents

Abstract

Disclosed herein is a method, comprising capturing a first image of a first perimeter portion of a first end of a battery roll, wherein the first perimeter portion comprises a first electrode, wherein the battery roll comprises an anode layer, a cathode layer, and an electrolyte layer which is sandwiched between and in direct physical contact with the anode layer and the cathode layer, wherein the anode layer, the cathode layer, and the electrolyte layer are rolled about an axis resulting in the battery roll, and wherein the first electrode is electrically connected to a first layer which is the anode layer or the cathode layer; and identifying a first defect of the battery roll related to the first electrode based on the first image.

Description

Battery roll testing method using imaging system

The present invention relates to a battery roll testing method using an imaging system.

A radiation detector is a device that measures the properties of radiation. Examples of properties may include the intensity, phase, and spatial distribution of polarization of the radiation. The radiation measured by the radiation detector may be radiation that has been transmitted through the object. The radiation measured by the radiation detector may be electromagnetic radiation, such as infrared light, visible light, ultraviolet light, X-rays or gamma rays. Radiation can also be of other types, such as alpha and beta rays. An imaging system may include one or more image sensors, each of which may have one or more radiation detectors.

Disclosed herein is a method comprising capturing a first image of a first peripheral portion of a first end of a battery roll, wherein the first peripheral portion includes a first electrode, and wherein the battery roll includes an anode layer, a cathode layer and an electrolyte layer, the electrolyte layer is sandwiched between the anode layer and the cathode layer and is connected to the anode layer. layer and the cathode layer are in direct physical contact, wherein the anode layer, the cathode layer and the electrolyte layer are rolled around a shaft to obtain the battery roll, and wherein the first electrode is electrically connected to the a layer, the first layer being the anode layer or the cathode layer; and identifying a first defect of the battery roll associated with the first electrode based on the first image.

In one aspect, said capturing the first image is performed using an image sensor.

In one aspect, the battery roll further includes a separation layer such that one of the anode layer and the cathode layer is sandwiched between the electrolyte layer and the separation layer.

In one aspect, the battery roll has a cylindrical shape.

In one aspect, the first image is captured using radiation that has been transmitted through the first electrode and the first peripheral portion.

In one aspect, the radiation includes X-ray photons.

In one aspect, each of the X-ray photons has an energy of at least 100 KeV.

In one aspect, the radiation is part of a cone beam.

In one aspect, the cell roll has a cylindrical shape and the radiation beam used to capture the first image and intersect the first electrode and image sensor is perpendicular to the axis containing the axis and to The plane where the first electrode intersects.

In one aspect, the first end of the battery roll is not entirely in the first image.

In one aspect, the first defect includes an electrical disconnection between the first electrode and the first layer.

In one aspect, the first defect includes a short circuit between the first electrode and a second layer that is not the first layer and is either the anode layer or the cathode layer.

In one aspect, the method further includes capturing a second image of a second peripheral portion of the first end of the battery roll, wherein the second peripheral portion includes a second electrode, and wherein the A second electrode is electrically connected to the anode layer or the anode layer; and identifying a second defect of the battery roll associated with the second electrode based on the second image.

In one aspect, the battery roll has a cylindrical shape, wherein the capturing the second image includes rotating the battery roll about the axis, and wherein capturing the second image in conjunction with the second electrode The radiation beam intersecting the image sensor is perpendicular to a plane containing the axis and intersecting the second electrode.

In one aspect, the method further includes capturing a third image of a third peripheral portion of the second end of the battery roll, wherein the third peripheral portion includes a third electrode, and wherein the third Three electrodes are electrically connected to the anode layer or the anode layer; and a third defect of the battery roll associated with the third electrode is identified based on the third image.

In one aspect, the second end of the battery roll is not entirely in the third image.

In one aspect, the first peripheral portion includes a fourth electrode, wherein the fourth electrode is electrically connected to the anode layer or the cathode layer, and wherein the fourth electrode is not electrically connected to the first One layer.

In one aspect, the first defect includes a short circuit between the first electrode and the fourth electrode.

In one aspect, the method further includes capturing additional images, wherein the battery roll has a cylindrical shape, and wherein points of the perimeter of the first end of the battery roll are at least in the first image. and one of the additional images, and wherein the radiation beam used to capture the image and intersect the point and the same image sensor is substantially perpendicular to the axis containing the axis and The plane intersecting the point.

In one aspect, the method further includes rotating the battery roll about the axis, wherein the first image and the additional image are captured while the battery roll rotates about the axis.

In one aspect, the method further includes capturing additional images such that points around the first end of the battery roll are in at least one of the first image and the additional image. in the image; and rotating the battery roll about the axis, wherein the first image and the additional image are captured while the battery roll rotates about the axis.

100: Radiation detector

110: Radiation absorbing layer

111: First doped region

112:Eigen region

113: Second doping region

114: Discrete area

119A, 119B: Electrical contacts

120: Electronic device layer

121: Electronic systems

130: Filling material

131:Through hole

150: Graph element/sensing element

190: Valid area

195: Surrounding area

500:Package

510:Printed circuit board

512:Area

514:Joining wire

600:Image sensor

650:System PCB

688:Dead zone

700:Battery layer stacking

710: Anode layer

712: First electrode

720:Electrolyte layer

730:Cathode layer

732: Second electrode

740:Separation layer

790:shaft

800:Battery roll

810:First end

812, 832: Peripheral parts

812i:Image

819:Periphery

820:Second end

900: Imaging system

910: Radiation source

912: Radiation Beam

1100:Flowchart

1110, 1120: steps

Figure 1 schematically shows a radiation detector according to an embodiment.

Figure 2 schematically shows a simplified cross-sectional view of a radiation detector according to an embodiment.

Figure 3 schematically shows a detailed cross-section of a radiation detector according to an embodiment Figure.

Figure 4 schematically shows a detailed cross-sectional view of a radiation detector according to an alternative embodiment.

Figure 5 schematically shows a top view of a package including a radiation detector and a printed circuit board (PCB) according to an embodiment.

Figure 6A schematically shows a cross-sectional view of an image sensor including the package of Figure 5 mounted to a system PCB (Printed Circuit Board), according to an embodiment.

Figure 6B schematically shows a top view of an image sensor according to an alternative embodiment.

Figure 7 schematically shows a perspective view of a cell layer stack according to an embodiment.

Figure 8 schematically shows a perspective view of a battery roll according to an embodiment.

Figure 9 schematically shows a perspective view of an imaging system according to an embodiment.

10A-10B schematically illustrate an imaging system in operation according to an embodiment.

Figure 11 shows a flow chart summarizing the operation of the imaging system.

Figures 12A-13B schematically illustrate an imaging system in operation according to various embodiments.

radiation detector

As an example, Figure 1 schematically shows a radiation detector 100. Radiation detector 100 may include an array of primitives 150 (also referred to as sensing elements 150). the array This may be a rectangular array (as shown in Figure 1), a honeycomb array, a hexagonal array, or any other suitable array. The primitive 150 array in the example of Figure 1 has 4 columns and 7 rows; however, in general, the primitive 150 array can have any number of rows and any number of columns.

Each primitive 150 may be configured to detect radiation incident thereon from a radiation source (not shown) and may be configured to measure properties of the radiation (eg, energy, wavelength, and frequency of the particles). Radiation can include particles such as photons and subatomic particles. Each primitive 150 may be configured to count the number of radiation particles incident thereon whose energy falls within a plurality of energy intervals over a period of time. All primitives 150 may be configured to count the number of radiation particles incident thereon in multiple energy intervals over the same period of time. When the incident radiation particles are of similar energy, the primitive 150 may simply be configured to count the number of radiation particles incident thereon over a period of time without measuring the energy of the individual radiation particles.

Each primitive 150 may have its own analog-to-digital converter (ADC) configured to digitize an analog signal representing the energy of an incident radiation particle to a digital signal, or to digitize an analog signal representing the total energy of multiple incident radiation particles. Analog signals are digitized into digital signals. Primitives 150 may be configured for parallel operations. For example, while one primitive 150 is measuring incoming radiation particles, another primitive 150 may be waiting for the radiation particles to arrive. Primitives 150 may not necessarily be individually addressable.

The radiation detector 100 described herein may be used in applications such as X-ray telescopes, X-ray mammography, industrial X-ray defect detection, X-ray microscopy or microradiography, X-ray casting inspection, X-ray non-destructive testing, X-ray weld inspection, X-ray digital subtraction angiography, etc. Using the radiation detector 100 instead of a photographic background Plates, photographic film, PSP plates, X-ray image intensifiers, scintillator or other semiconductor X-ray detectors may also be suitable.

Figure 2 schematically shows a simplified cross-sectional view of the radiation detector 100 of Figure 1 along line 2-2, according to an embodiment. Specifically, the radiation detector 100 may include a radiation absorbing layer 110 and an electronics layer 120 (which may include one or more ASICs or application specific integrated circuits) for processing or analyzing electrical signals generated in the radiation absorbing layer 110 by incident radiation. . Radiation detector 100 may or may not include scintillator (not shown). Radiation absorbing layer 110 may include semiconductor materials such as silicon, germanium, GaAs, CdTe, CdZnTe, or combinations thereof. The semiconductor material can have a high quality attenuation coefficient for the radiation of interest.

Figure 3 schematically shows a detailed cross-sectional view along line 2-2 of the radiation detector 100 of Figure 1 as an example. Specifically, the radiation absorbing layer 110 may include one or more diodes (eg, p-i-n or p-n) formed from one or more discrete regions 114 of the first doped region 111 , the second doped region 113 . The second doped region 113 may be separated from the first doped region 111 by an optional intrinsic region 112 . Discrete regions 114 may be separated from each other by first doped regions 111 or intrinsic regions 112 . The first doped region 111 and the second doped region 113 may have opposite types of doping (eg, region 111 is p-type and region 113 is n-type, or region 111 is n-type and region 113 is p-type). In the example of FIG. 3 , each discrete region 114 of the second doped region 113 forms a diode with the first doped region 111 and the optional intrinsic region 112 . That is, in the example of FIG. 3 , the radiation absorbing layer 110 has a plurality of diodes (more specifically, 7 diodes corresponding to 7 primitives 150 in one column of the array of FIG. 1 , for simplicity, FIG. Only those of 3 are marked Two primitives 150). Multiple diodes may have electrical contact 119A as a common (common) electrode. The first doped region 111 may also have discrete portions.

Electronics layer 120 may include electronic systems 121 suitable for processing or interpreting signals generated by radiation incident on radiation absorbing layer 110 . Electronic system 121 may include analog circuits such as filter networks, amplifiers, integrators, and comparators, or digital circuits such as microprocessors and memories. Electronic system 121 may include one or more ADCs (Analog-to-Digital Converters). Electronic system 121 may include elements that are common to drawing elements 150 or elements that are specific to a single drawing element 150 . For example, electronic system 121 may include an amplifier dedicated to each picture element 150 and a microprocessor shared among all picture elements 150 . Electronic system 121 may be electrically connected to primitive 150 through via 131 . The spaces between the vias may be filled with filling material 130 , which may increase the mechanical stability of the connection of the electronic device layer 120 to the radiation absorbing layer 110 . Other bonding techniques may connect electronic system 121 to primitive 150 without using vias 131 .

When radiation from a radiation source (not shown) strikes the radiation absorbing layer 110 including a diode, the radiation particles may be absorbed and generate one or more charge carriers (eg, electrons, holes) through a variety of mechanisms. Charge carriers can drift to one of the electrodes of the diode under an electric field. The electric field may be an external electric field. Electrical contact 119B may include discrete portions, each discrete portion being in electrical contact with discrete region 114 . The term "electrical contact" may be used interchangeably with the word "electrode". In embodiments, the charge carriers may drift in all directions such that the charge carriers generated by a single radiating particle are not substantially shared by two different discrete regions 114 (herein "substantially not shared by..." ..shared” This means that less than 2%, less than 0.5%, less than 0.1% or less than 0.01% of these charge carriers flow to a different discrete region 114) compared to the remaining charge carriers. Charge carriers generated by radiation particles incident around the footprint of one of the discrete regions 114 are substantially not shared with another of the discrete regions 114 . Primitives 150 associated with discrete region 114 may be the area surrounding discrete region 114 in which substantially all (greater than 98%, greater than 99.5%, greater than 99.9%, or greater than 99.99%) are produced by radiation particles incident therein. of charge carriers flow to discrete regions 114 . That is, less than 2%, less than 1%, less than 0.1%, or less than 0.01% of these charge carriers flow through primitive 150 .

Figure 4 schematically shows a detailed cross-sectional view of the radiation detector 100 of Figure 1 along line 2-2 according to an alternative embodiment. More specifically, radiation absorbing layer 110 may include resistors of semiconductor materials such as silicon, germanium, GaAs, CdTe, CdZnTe, or combinations thereof, but not diodes. The semiconductor material can have a high quality attenuation coefficient for the radiation of interest. In embodiments, electronic device layer 120 of FIG. 4 is similar in structure and function to electronic device layer 120 of FIG. 3 .

When radiation strikes the radiation absorbing layer 110, which includes a resistor but not a diode, it can be absorbed and generate one or more charge carriers through a variety of mechanisms. Radiating particles can produce anywhere from 10 to 100,000 charge carriers. Charge carriers can drift to electrical contacts 119A and 119B under the electric field. The electric field may be an external electric field. Electrical contacts 119B may include discrete portions. In embodiments, the charge carriers may drift in all directions such that the charge carriers generated by a single radiated particle are not substantially shared by two different discrete portions of electrical contact 119B (herein "substantially not" "Shared" means that less than 2%, less than 0.5%, less than 0.1% or less than 0.01% of these charge carriers flow to one compared to the rest of the charge carriers Different discrete portions). Charge carriers generated by radiating particles incident around the footprint of one of the discrete portions of electrical contact 119B are substantially not shared with another of the discrete portions of electrical contact 119B. A primitive 150 associated with a discrete portion of electrical contact 119B may be a region surrounding the discrete portion in which substantially all (greater than 98%, greater than 99.5%, greater than 99.9%, or greater than 99.99%) of charge carriers flow to discrete portions of electrical contact 119B. That is, less than 2%, less than 0.5%, less than 0.1%, or less than 0.01% of these charge carriers flow to discrete portions of electrical contact 119B. A primitive associated with a discrete portion of contact 119B.

Radiation detector packaging

Figure 5 schematically shows a top view of a package 500 including a radiation detector 100 and a printed circuit board (PCB) 510. The term "PCB" as used herein is not limited to a specific material. For example, a PCB may include semiconductors. Radiation detector 100 may be mounted to PCB 510. For clarity, the wiring between radiation detector 100 and PCB 510 is not shown. PCB 510 may have one or more radiation detectors 100 . PCB 510 may have areas 512 not covered by radiation detector 100 (eg, to accommodate bond wires 514). Radiation detector 100 may have an active area 190 in which primitive 150 (FIG. 1) is located. Radiation detector 100 may have a peripheral area 195 near an edge of radiation detector 100 . Perimeter region 195 has no primitives 150, and radiation detector 100 does not detect radiation particles incident on perimeter region 195.

image sensor

Figure 6 schematically shows a cross-sectional view of an image sensor 600 according to an embodiment. Image sensor 600 may include one or more packages 500 of FIG. 5 mounted to system PCB 650. As an example, Figure 6A shows two packages 500. The electrical connection between PCB 510 and system PCB 650 may be accomplished through bond wires 514 . To accommodate bond wires 514 on PCB 510 , PCB 510 may have areas 512 that are not covered by radiation detector 100 . To accommodate bond wires 514 on system PCB 650, there may be gaps between packages 500. The gap may be about 1 mm or more. Radiation particles incident on perimeter area 195, area 512, or gaps cannot be detected by package 500 on system PCB 650. The dead zone of a radiation detector (eg, radiation detector 100) is an area of the radiation receiving surface of the radiation detector upon which radiation particles incident on it cannot be detected by the radiation detector. The dead zone of a package (eg, package 500) is the area of the radiation-receiving surface of the package upon which radiation particles incident on it cannot be detected by one or more radiation detectors in the package. In the example shown in FIGS. 5 and 6A , the dead area of package 500 includes perimeter area 195 and area 512 . The dead zone (e.g., 688) of an image sensor (e.g., image sensor 600) having a set of packages (e.g., packages 500 mounted on the same PCB and arranged in the same layer or in different layers) includes The combination of the dead space of each package in the group and the gaps between each package.

In embodiments, the radiation detector 100 (FIG. 1) operating by itself may be considered an image sensor. In an embodiment, package 500 (FIG. 5) operating by itself may be considered an image sensor.

The image sensor 600 including the radiation detector 100 may have a radiation detection The dead zone 688 within the active area 190 of the detector 100. However, the image sensor 600 can capture multiple partial images of an object or scene (not shown), and then these captured partial images can be spliced to form an image of the entire object or scene.

The term "image" in this specification is not limited to the spatial distribution of radiation properties (eg intensity). For example, the term "image" may also include a spatial distribution of density of a substance or element.

Figure 6B schematically illustrates a top view of an image sensor 600 according to an alternative embodiment. In this alternative embodiment, the image sensor 600 may include a plurality of radiation detectors 100 arranged in an overlapping manner such that there are no dead zones 688 within the active area 190 of the radiation detectors 100 ( Figure 6A). For simplicity, only the active area 190 of the radiation detector 100 is shown in Figure 6B.

Cell layer stacking

Figure 7 schematically shows a perspective view of a cell layer stack 700 according to an embodiment. In embodiments, cell layer stack 700 may include an anode layer 710 , an electrolyte layer 720 , and a cathode layer 730 , wherein electrolyte layer 720 is sandwiched between and physically directly connected to anode layer 710 and cathode layer 730 . get in touch with. In embodiments, anode layer 710, electrolyte layer 720, and cathode layer 730 may form a lithium ion battery.

In embodiments, cell layer stack 700 may further include (A) a first electrode 712 electrically connected to anode layer 710 , and (B) a second electrode 732 electrically connected to cathode layer 730 .

In embodiments, cell layer stack 700 may also include a separation layer 740 such that The cathode layer 730 is sandwiched between the electrolyte layer 720 and the separation layer 740. In embodiments, separation layer 740 may include an insulator.

In embodiments, battery layer stack 700 may be rolled about axis 790, resulting in battery roll 800 (FIG. 8). Referring to Figure 8, the battery roll 800 may have a cylindrical shape as shown. In embodiments, the battery roll 800 may have a first end 810 and a second end 820 as shown.

Imaging system setup

Figure 9 schematically shows a perspective view of an imaging system 900 according to an embodiment. In embodiments, imaging system 900 may include radiation source 910 and image sensor 600 .

In embodiments, the battery roll 800 may be arranged such that the peripheral portion 812 of the first end 810 of the battery roll 800 is located between the radiation source 910 and the image sensor 600 . In embodiments, perimeter portion 812 may include a section of perimeter 819 of first end 810 of battery roll 800 . In embodiments, first electrode 712 may be part of perimeter portion 812 .

In embodiments, radiation source 910 may generate radiation beam 912 directed first toward peripheral portion 812 and then toward image sensor 600 . Radiation beam 912 may be used to image peripheral portion 812 (including first electrode 712). In embodiments, the radiation beam 912 may be X-rays with high energy (eg, each X-ray photon of the radiation beam 912 may have an energy of at least 100 KeV). In embodiments, radiation beam 912 may be a cone beam.

In an embodiment, during imaging of peripheral portion 812, with the first electrode At least one radiation ray (not shown) of the radiation beam 912 intersecting the image sensor 600 is perpendicular to a plane that (a) contains the axis 790 and (b) intersects the first electrode 712 .

Imaging of first peripheral portion 812

Figure 10A shows a side view of battery roll 800. In embodiments, an image 812i of the peripheral portion 812 (including the first electrode 712) may be captured using radiation from the radiation beam 912 that has been transmitted through the peripheral portion 812 (including the first electrode 712) (FIG. 10B). In an embodiment, image sensor 600 may capture image 812i (FIG. 10B).

In an embodiment, the first end 810 of the battery roll 800 is not entirely in the image 812i. In other words, some portion of first end 810 is not captured in image 812i.

First defect identification

In embodiments, a first defect of the battery roll 800 associated with the first electrode 712 may be identified based on the image 812i of the peripheral portion 812 (FIG. 10B).

For example, referring to FIGS. 7 and 10A-10B , a first defect of the battery roll 800 associated with the first electrode 712 may include an electrical disconnection between the first electrode 712 and the anode layer 710 . As another example, a first defect of battery roll 800 associated with first electrode 712 may include a short circuit between first electrode 712 and cathode layer 730 . As another example, the first defect of the battery roll 800 associated with the first electrode 712 may include both (A) an electrical disconnection between the first electrode 712 and the anode layer 710 and (B) an electrical disconnection between the first electrode 712 and the cathode layer. short circuit between 730.

Summary flow chart

Figure 11 shows a summary of the imaging system 900 described above (Figures 9-10B). Flowchart of operations 1100. In step 1110, a first image of a first peripheral portion of the first end of the battery roll is captured. For example, in the embodiment described above, an image 812i of the peripheral portion 812 of the first end 810 of the battery roll 800 is captured.

Additionally, also in step 1110, the first peripheral portion includes a first electrode. For example, in the above-described embodiment, the peripheral portion 812 includes the first electrode 712 .

Additionally, also in step 1110, the battery roll includes an anode layer, a cathode layer, and an electrolyte layer sandwiched between and in direct physical contact with the anode and cathode layers. For example, in the above embodiment, the battery roll 800 includes an anode layer 710, a cathode layer 730, and an electrolyte layer 720. The electrolyte layer 720 is sandwiched between the anode layer 710 and the cathode layer 730 and is in direct physical contact with the anode layer 710 and the cathode layer 730. .

In addition, also in step 1110, the anode layer, the cathode layer and the electrolyte layer are rolled around the shaft, thereby obtaining a battery roll. For example, in the above-described embodiment, the anode layer 710, the cathode layer 730, and the electrolyte layer 720 are rolled around the axis 790, thereby obtaining the battery roll 800.

Additionally, also in step 1110, the first electrode is electrically connected to the first layer, which is the anode layer or the cathode layer. For example, in the above-described embodiment, the first electrode 712 is electrically connected to the anode layer 710 .

In step 1120, a first defect of the battery roll associated with the first electrode is identified based on the first image. For example, in the embodiment described above, a first defect of the battery roll 800 associated with the first electrode 712 is identified based on the image 812i.

Imaging of second peripheral portion 832

In an embodiment, referring to FIG. 10A , after image sensor 600 captures image 812i ( FIG. 10B ) of peripheral portion 812 (including first electrode 712 ), battery roll 800 may rotate counterclockwise about axis 790 until including The peripheral portion 832 of the second electrode 732 is located between the radiation source 910 and the image sensor 600, as shown in FIG. 12A. Perimeter portion 832 may include a section of perimeter 819 of first end 810 of battery roll 800 .

Then, in an embodiment, referring to FIG. 12A , images 832i ( Figure 12B). In an embodiment, image sensor 600 may capture image 832i (FIG. 12B).

In an embodiment, during capture of image 832i of peripheral portion 832, at least one radiation ray (not shown) of radiation beam 912 intersecting second electrode 732 and image sensor 600 is perpendicular to (a) the inclusion axis 790 and (b) the plane intersecting the second electrode 732 .

In an embodiment, the first end 810 of the battery roll 800 is not entirely in the image 832i (Fig. 12B). In other words, some portion of first end 810 is not captured in image 832i.

Second defect identification

In embodiments, a second defect of the battery roll 800 associated with the second electrode 732 may be identified based on the image 832i of the peripheral portion 832 (FIG. 12B).

For example, referring to FIGS. 7 and 12A-12B , the second defect of the battery roll 800 associated with the second electrode 732 may include the second electrode 732 and the cathode layer 730 electrical disconnection between. As another example, the second defect of the battery roll 800 associated with the second electrode 732 may include a short circuit between the second electrode 732 and the anode layer 710 . As another example, the second defect of the battery roll 800 associated with the second electrode 732 may include both (A) an electrical disconnection between the second electrode 732 and the cathode layer 730 and (B) an electrical disconnection between the second electrode 732 and the anode layer. 710 short circuit.

Alternative embodiment

The first electrode is close to the second electrode

In the above embodiment, referring to Figure 10A, the first electrode 712 and the second electrode 732 are far away from each other, so two different images 812i and 832i are required to identify defects associated with the electrodes 712 and 732, respectively. In an alternative embodiment, referring to FIG. 13A , first electrode 712 and second electrode 732 may be proximate to each other such that peripheral portion 812 includes both electrodes 712 and 732 . The image 812i of the peripheral portion 812 of Fig. 13A is as shown in Fig. 13B.

As a result, both the first defect of the battery roll 800 associated with the electrode 712 and the second defect of the battery roll 800 associated with the electrode 732 can be identified based on the image 812i of FIG. 13B. In this alternative embodiment, in addition to the electrical disconnections and short circuits described above, a first defect of the battery roll 800 associated with the first electrode 712 and a second defect of the battery roll 800 associated with the second electrode 732 may Includes a short circuit between electrodes 712 and 732.

Two electrodes at opposite ends of the battery roll

In the embodiment described above, referring to Figure 9, electrodes 712 and 732 are both on the same end of battery roll 800 (ie, first end 810). In an alternative embodiment, electrode 712 and 732 can be on different ends of the battery roll 800. For example, the first electrode 712 may be on the first end 810 of the battery roll 800 and the second electrode 732 may be on the second end 820 of the battery roll 800 .

In this case, after capturing image 812i (FIG. 10B) as described above, battery roll 800 may be rotated 90 degrees about a vertical axis (not shown) and then rotated about axis 790 such that second electrode 732 and its corresponding The peripheral portion 832 is located between the radiation source 910 and the image sensor 600 for imaging. In embodiments, imaging of the second electrode 732 and its corresponding peripheral portion 832 may be similar to the imaging of the first electrode 712 and its corresponding peripheral portion 812 described above.

Multiple electrodes for each of the anode and cathode layers

In the above-described embodiment, referring to FIGS. 7 and 10A , each of the anode layer 710 and the cathode layer 730 has a single electrode. For example, anode layer 710 has a single electrode (ie, first electrode 712) and cathode layer 730 has a single electrode (ie, second electrode 732). In alternative embodiments, each of the anode layer 710 and the cathode layer 730 may have multiple electrodes. In this case, imaging of each electrode and its corresponding peripheral portion may be similar to the imaging of the first electrode 712 and its corresponding peripheral portion 812 described above.

Scan the entire perimeter

In the above-described embodiment, referring to FIG. 10A, peripheral portions 812 and 832 are scanned in turn. Alternatively, the entire perimeter 819 can be scanned. Specifically, in an embodiment, when the image sensor 600 captures multiple images of the peripheral portion of the first end 810 of the battery roll 800 , the battery roll 800 may rotate about the axis 790 . In the embodiment, each The perimeter section includes a section of perimeter 819.

In an embodiment, each point of perimeter 819 is located in at least one of the plurality of images captured by image sensor 600 . Additionally, in an embodiment, for each point of perimeter 819, the radiation rays of radiation beam 912 used to capture an image of that point and intersect that point and image sensor 600 are substantially perpendicular to (a) The plane that contains axis 790 and (b) intersects this point. Here, "substantially vertical" means vertical or almost vertical.

The anode layer and the cathode layer exchange positions

In the above embodiment, referring to FIG. 7 , from bottom to top are the anode layer 710 , the electrolyte layer 720 , the cathode layer 730 and the separation layer 740 . In alternative embodiments, anode layer 710 and cathode layer 730 may swap their respective positions in cell layer stack 700. In other words, in Figure 7, from bottom to top there will be the cathode layer 730, the electrolyte layer 720, the anode layer 710 and the separation layer 740.

Although various aspects and embodiments have been disclosed herein, other aspects and embodiments will be apparent to those skilled in the art. The various aspects and embodiments disclosed herein are for purposes of illustration and not limitation, with the true scope and spirit being indicated by the appended claims.

600:Image sensor

712: First electrode

732: Second electrode

790:shaft

800:Battery roll

810:First end

812: Peripheral parts

819:Periphery

820:Second end

900: Imaging system

910: Radiation source

912: Radiation Beam

Claims (21)

A battery roll testing method using an imaging system, including: capturing a first image of a first peripheral portion of the first end of the battery roll, wherein the first peripheral portion includes a first electrode, wherein the battery roll includes an anode layer, a cathode layer and an electrolyte layer, the electrolyte layer being sandwiched between the anode layer and the cathode layer and in direct physical contact with the anode layer and the cathode layer, wherein the anode layer, the cathode layer and the electrolyte layer are rolled around a shaft to obtain the battery roll, Wherein, the first electrode is electrically connected to a first layer, and the first layer is the anode layer or the cathode layer; and A first defect of the battery roll associated with the first electrode is identified based on the first image. The battery roll testing method using an imaging system as claimed in claim 1, wherein the capturing of the first image is performed using an image sensor. The battery roll testing method using an imaging system as claimed in claim 1, wherein the battery roll further includes a separation layer, such that one of the anode layer and the cathode layer is sandwiched between the electrolyte layer and the separation layer. between layers. The battery roll testing method using an imaging system as claimed in claim 1, wherein the battery roll has a cylindrical shape. The battery roll testing method using an imaging system as claimed in claim 1, wherein the first image is captured using radiation that has been transmitted through the first electrode and the first peripheral portion. The battery roll testing method using an imaging system as claimed in claim 5, wherein the radiation includes X-ray photons. The battery roll testing method using an imaging system as claimed in claim 6, wherein each of the X-ray photons has an energy of at least 100 KeV. The battery roll testing method using an imaging system as claimed in claim 5, wherein the radiation is part of a cone beam. Battery roll testing method using an imaging system as described in claim 5, Wherein, the battery roll has a cylindrical shape, and wherein the radiation beam used to capture the first image and intersect the first electrode and image sensor is perpendicular to a plane containing the axis and intersecting the first electrode. The battery roll testing method using an imaging system as claimed in claim 9, wherein the first end of the battery roll is not entirely in the first image. The battery roll testing method using an imaging system as claimed in claim 1, wherein the first defect includes electrical disconnection between the first electrode and the first layer. The battery roll testing method using an imaging system as claimed in claim 1, wherein the first defect includes a short circuit between the first electrode and a second layer, and the second layer is not the first layer, and is the anode layer or the cathode layer. The battery roll testing method using an imaging system as described in request 1, further comprising: capturing a second image of a second peripheral portion of the first end of the battery roll, wherein the second peripheral portion includes a second electrode, and wherein the second electrode is electrically connected to the anode layer or the cathode layer; and A second defect of the battery roll associated with the second electrode is identified based on the second image. Battery roll testing method using an imaging system as described in claim 13, Wherein, the battery roll has a cylindrical shape, wherein said capturing the second image includes rotating said battery roll about said axis, and wherein the radiation beam used to capture the second image and intersect the second electrode and image sensor is perpendicular to a plane containing the axis and intersecting the second electrode. The battery roll testing method using an imaging system as described in request 1, further comprising: capturing a third image of a third peripheral portion of the second end of the battery roll, wherein the third peripheral portion includes a third electrode, Wherein, the third electrode is electrically connected to the anode layer or the cathode layer; and A third defect of the battery roll associated with the third electrode is identified based on the third image. The battery roll testing method using an imaging system as claimed in claim 15, wherein the second end of the battery roll is not entirely in the third image. Battery roll testing method using an imaging system as described in claim 1, wherein the first peripheral portion includes a fourth electrode, wherein the fourth electrode is electrically connected to the anode layer or the cathode layer, and Wherein, the fourth electrode is not electrically connected to the first layer. The battery roll testing method using an imaging system as claimed in claim 17, wherein the first defect includes a short circuit between the first electrode and the fourth electrode. A battery roll testing method using an imaging system as described in claim 1, further comprising capturing additional images, Wherein, the battery roll has a cylindrical shape, Wherein, each point around the first end of the battery roll is in at least one of the first image and the additional image, and wherein the radiation beam used to capture the image and intersect the point and the same image sensor is substantially perpendicular to a plane containing the axis and intersecting the point. The battery roll testing method using an imaging system as claimed in claim 19, further comprising rotating the battery roll around the axis, wherein the first image and the battery roll are captured while the battery roll is rotating around the axis. Describe the attached images. The battery roll testing method using an imaging system as described in request 1, further comprising: Capturing additional images such that points around the first end of the battery roll are in at least one of the first image and the additional image; and The battery roll is rotated about the axis, wherein the first image and the additional image are captured as the battery roll rotates about the axis.

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