TWI812930B - Carrier head and polishing device with the carrier head - Google Patents

Carrier head and polishing device with the carrier head Download PDF

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Publication number
TWI812930B
TWI812930B TW110107835A TW110107835A TWI812930B TW I812930 B TWI812930 B TW I812930B TW 110107835 A TW110107835 A TW 110107835A TW 110107835 A TW110107835 A TW 110107835A TW I812930 B TWI812930 B TW I812930B
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Taiwan
Prior art keywords
cavity
probe
carrying head
cavities
wafer
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TW110107835A
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Chinese (zh)
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TW202134000A (en
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徐俊成
尹影
蔣錫兵
戴豪
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大陸商北京晶亦精微科技股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/27Work carriers
    • B24B37/30Work carriers for single side lapping of plane surfaces
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/005Control means for lapping machines or devices
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B49/00Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
    • B24B49/16Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation taking regard of the load

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Grinding Of Cylindrical And Plane Surfaces (AREA)

Abstract

本發明關於於一種承載頭及具有該承載頭的拋光裝置,該承載頭包括:非柔性材質的本體,本體靠近待拋光晶圓的端部開設有多個凹腔,每個凹腔上設有與氣源連接的通氣孔;柔性膜固定連接在端部,適於與待拋光晶圓接觸。通過將本體設置為非柔性材質,使得在本體上開設多個凹腔比較方便,在凹腔上設置與氣源連接的通氣孔,使每個凹腔的氣壓控制較方便,由於在本體靠近待拋光晶圓的端部固定連接柔性膜,採用柔性膜與待拋光晶圓接觸,保證了柔性膜與待拋光晶圓的貼合度,由於無需在各腔室之間單獨設置密封機構,而是採用非柔性材質的本體直接開設凹腔配合柔性膜的形式保證各腔室的獨立控制,使承載頭的結構和製程製造較簡單。The present invention relates to a carrying head and a polishing device having the carrying head. The carrying head includes: a body made of non-flexible material. A plurality of concave cavities are opened in the end of the body close to the wafer to be polished, and each cavity is provided with a The vent hole is connected to the gas source; the flexible membrane is fixedly connected at the end and is suitable for contact with the wafer to be polished. By setting the body to be made of non-flexible material, it is more convenient to open multiple cavities on the body. Ventilation holes connected to the air source are provided on the cavity, making it more convenient to control the air pressure of each cavity. The end of the polished wafer is fixedly connected to the flexible film, and the flexible film is used to contact the wafer to be polished, ensuring the fit between the flexible film and the wafer to be polished. Since there is no need to set up a separate sealing mechanism between each chamber, instead The body of non-flexible material is used to directly open a concave cavity and a flexible membrane to ensure independent control of each cavity, making the structure and manufacturing process of the carrying head simpler.

Description

承載頭及具有該承載頭的拋光裝置Carrying head and polishing device having the same

本發明關於半導體製程之拋光技術領域,特別關於一種承載頭及具有該承載頭的拋光裝置。 The present invention relates to the technical field of polishing in semiconductor manufacturing processes, and in particular to a carrier head and a polishing device having the carrier head.

積體電路製程通常是指將導體、半導體、絕緣層以一定的製程順序沉積在特定的基板(如矽基晶圓)上。在製程中,CMP(Chemical Mechanical Polishing,化學機械拋光)裝置主要用於對晶圓在膜沉積製程後的微觀粗糙表面進行全域平坦化處理,以便進行後續的半導體製程。 The integrated circuit process usually refers to depositing conductors, semiconductors, and insulating layers on a specific substrate (such as a silicon-based wafer) in a certain process sequence. In the manufacturing process, CMP (Chemical Mechanical Polishing) equipment is mainly used to fully planarize the microscopically rough surface of the wafer after the film deposition process, so as to facilitate the subsequent semiconductor manufacturing process.

化學機械拋光裝置,是通過負壓吸附的方式將晶圓的一個面固定在承載頭上,並通過工位旋轉使另外一個面(即製程面)在製程中與拋光盤上的拋光墊相接觸,即其上的承載頭主要用於對晶圓進行吸附和施加壓力。現有技術中的承載頭通常採用多層膜隔離腔室技術,通過膜的凸起和褶皺等特徵將各腔室進行區域分割,並在不同的腔室區域根據製程需要通入不同的壓力值。以圖1所示的承載頭採用五區域腔室為例進行說明,該膜片通過在基體的基礎上形成凸起和褶皺來完成五區域的劃分,即通過邊緣的環形密封筋條形成第一密閉腔室1;通過臨近的環形密封筋條形成第二密封腔室2;通過再向內相鄰的環形密封筋條形成第三密閉腔室3;通過再向內相鄰的環形密封筋條形成第四密封腔室4;通過中心的環形密封筋條形成第五密封腔室5。 The chemical mechanical polishing device fixes one surface of the wafer on the carrier head through negative pressure adsorption, and rotates the station to make the other surface (the process surface) come into contact with the polishing pad on the polishing disk during the process. That is, the carrying head on it is mainly used to adsorb and apply pressure to the wafer. Carrier heads in the prior art usually use multi-layer membrane isolation chamber technology. Each chamber is divided into regions through features such as bulges and wrinkles of the membrane, and different pressure values are introduced into different chamber areas according to process requirements. Taking the load-bearing head shown in Figure 1 using a five-region chamber as an example to illustrate, the diaphragm completes the division of the five regions by forming protrusions and wrinkles on the basis of the base body, that is, the first ring-shaped sealing rib is formed through the edge. Sealed chamber 1; the second sealed chamber 2 is formed by the adjacent annular sealing ribs; the third sealed chamber 3 is formed by the adjacent annular sealing ribs inward; the third sealed chamber 3 is formed by the adjacent annular sealing ribs inward. The fourth sealing chamber 4 is formed; the fifth sealing chamber 5 is formed by the central annular sealing rib.

但是該結構的承載頭由於採用柔性膜來完成分割腔室,各 腔室之間需要設置密封以防止各腔室洩露,使得結構較複雜,且由於不同腔室的壓力可能不同,需要做到各腔室互不干擾,這又會給加工、製造帶來很大困難。 However, since the load-bearing head of this structure uses a flexible membrane to complete the division of the chamber, each Seals need to be installed between the chambers to prevent leakage in each chamber, making the structure more complex. And since the pressures of different chambers may be different, it is necessary to ensure that the chambers do not interfere with each other, which will bring great challenges to processing and manufacturing. difficulty.

緣是,本發明要解決的技術問題在於克服現有技術中的承載頭結構複雜,製程製造困難,從而提供一種結構相對簡單、製程製造簡單的承載頭及具有該承載頭的拋光裝置。 Therefore, the technical problem to be solved by the present invention is to overcome the complex structure and difficult manufacturing process of the load-bearing head in the prior art, thereby providing a load-bearing head with a relatively simple structure and simple manufacturing process and a polishing device having the load-bearing head.

本發明之一實施例提供一種承載頭,包括:本體,該本體為非柔性材質,且該本體靠近待拋光產品的端部開設有多個凹腔,每個該凹腔上設有通氣孔,該通氣孔適於與氣源連接;柔性膜,固定連接在該本體的該端部,適於與該待拋光產品接觸。在本發明的另一實施例中,該本體採用金屬材質。在本發明的另一實施例中,該本體為圓盤結構,該凹腔為環狀結構。在本發明的另一實施例中,沿徑向方向,由該本體的邊緣向該本體的中心方向,該凹腔的體積逐漸增大。在本發明的另一實施例中,複數個該凹腔的深度相同,沿該本體的邊緣向該本體的中心方向,該凹腔的底面積逐漸增大。在本發明的另一實施例中,至少一個該凹腔上設有複數個凸筋,該凸筋由該凹腔的底部向靠近該柔性膜的方向延伸,且該凸筋的延伸長度小於該凹腔的延伸長度。在本發明的另一實施例中,該柔性膜粘接在該本體上。在本發明的另一實施例中,該柔性膜為橡膠膜。在本發明的另一實施例中,該承載頭進一步包括:氣管,設於該本體遠離該柔性膜的一端,該氣管的一端與該通氣孔連接,另一端伸出該本體外,適於與該氣源連接。在本發明的另一實施例中,該氣管與該本體的側部之間設有密封裝置。在本發明的另一實施例中,該承載頭進一步包括:第一壓力感 測器,設於該通氣孔處,該第一壓力感測器與該凹腔一一對應設置;控制器,與該第一壓力感測器連接,適於控制該凹腔內的壓力。本發明的又一實施例中係關於一種拋光裝置,包括如上述的任一實施例的承載頭。 One embodiment of the present invention provides a carrying head, including: a body, the body is made of non-flexible material, and the body is provided with a plurality of cavities near the end of the product to be polished, and each cavity is provided with a ventilation hole. The vent hole is suitable for connecting to the air source; the flexible membrane is fixedly connected to the end of the body and is suitable for contacting the product to be polished. In another embodiment of the invention, the body is made of metal. In another embodiment of the present invention, the body is a disc structure, and the cavity is an annular structure. In another embodiment of the present invention, along the radial direction, from the edge of the body to the center of the body, the volume of the cavity gradually increases. In another embodiment of the present invention, the plurality of cavities have the same depth, and the bottom area of the cavities gradually increases along the edge of the body toward the center of the body. In another embodiment of the present invention, at least one of the recessed cavities is provided with a plurality of convex ribs, the convex ribs extend from the bottom of the recessed cavity in a direction close to the flexible film, and the extension length of the convex ribs is smaller than the The extended length of the cavity. In another embodiment of the invention, the flexible film is bonded to the body. In another embodiment of the invention, the flexible membrane is a rubber membrane. In another embodiment of the present invention, the carrying head further includes: an air tube located at an end of the body away from the flexible membrane. One end of the air tube is connected to the vent hole, and the other end extends out of the body and is suitable for connecting with the body. The air source is connected. In another embodiment of the invention, a sealing device is provided between the air tube and the side of the body. In another embodiment of the present invention, the carrying head further includes: a first pressure sense The sensor is arranged at the vent hole, and the first pressure sensor is arranged in one-to-one correspondence with the cavity; the controller is connected to the first pressure sensor and is suitable for controlling the pressure in the cavity. Another embodiment of the present invention relates to a polishing device, including a carrying head as in any of the above embodiments.

本發明所提供技術方案,具有如下優點: The technical solution provided by the present invention has the following advantages:

1.本發明提供的承載頭,通過將本體設置為非柔性材質,使得在本體上開設多個凹腔比較方便,通過在凹腔上設置與氣源連接的通氣孔,使得每個凹腔的氣壓控制較方便,各個凹腔互不干擾,通過在本體靠近待拋光產品的端部固定連接柔性膜,採用柔性膜與待拋光產品直接接觸,保證了柔性膜與待拋光產品的貼合度,由於無需在各腔室之間設置密封,而是採用非柔性材質的本體直接開設凹腔配合柔性膜的形式保證各腔室的獨立控制,且在通氣時非柔性的本體開設的凹腔也不會相互干擾,使得承載頭的結構比較簡單,製程製造比較簡單。 1. The carrying head provided by the present invention makes it more convenient to open multiple cavities on the body by configuring the main body to be made of non-flexible material. By arranging ventilation holes connected to the air source on the cavities, it is possible to make each cavity more flexible. The air pressure control is more convenient, and each cavity does not interfere with each other. The flexible film is fixedly connected to the end of the body close to the product to be polished, and the flexible film is in direct contact with the product to be polished, ensuring the fit between the flexible film and the product to be polished. Since there is no need to set up a seal between the chambers, the body of the non-flexible material is used to directly open the cavity and the flexible membrane is used to ensure the independent control of each chamber, and the cavity opened by the non-flexible body does not need to be ventilated during ventilation. They will interfere with each other, making the structure of the load-bearing head relatively simple and the manufacturing process relatively simple.

2.本發明提供的承載頭,通過將本體設置為金屬材質,使得本體的獲取簡單易得。加工性能也較好。 2. The carrying head provided by the present invention makes the main body simple and easy to obtain by configuring the main body to be made of metal. The processing performance is also better.

3.本發明提供的承載頭,通過將本體設置為圓盤結構,凹腔設置為環狀結構,使得凹腔的加工比較便捷。 3. In the carrying head provided by the present invention, the main body is configured as a disc structure and the cavity is configured as an annular structure, making the processing of the cavity more convenient.

4.本發明提供的承載頭,通過設置沿徑向方向,由本體的邊緣向中心方向,複數個凹腔的深度相同,底面積逐漸增大,如此可使得邊緣處的凹腔體積較小,進而對邊緣處壓力控制越精確,進而使得邊緣的柔性膜與待拋光產品的邊緣的貼合度更高,提高拋光效果。 4. The carrying head provided by the present invention is arranged along the radial direction, from the edge of the body to the center direction, the depth of the plurality of cavities is the same, and the bottom area gradually increases, so that the volume of the cavities at the edge can be made smaller. The more precise the pressure control at the edge is, the better the fit between the flexible film at the edge and the edge of the product to be polished will be, thereby improving the polishing effect.

5.本發明提供的承載頭,通過在凹腔上設置凸筋,且凸筋的延伸長度小於凹腔的延伸長度,能夠在凹腔內為真空的情況下對柔性膜進行支撐,避免由於柔性膜的變形量較大而導致待拋光產品損傷。 5. The load-bearing head provided by the present invention, by arranging convex ribs on the concave cavity, and the extension length of the convex ribs is smaller than the extension length of the concave cavity, can support the flexible film when the cavity is vacuum, avoiding The deformation of the film is large and causes damage to the product to be polished.

6.本發明提供的承載頭,通過將柔性膜粘接在本體上,使得柔性膜與本體的固定方式簡單可靠,且體積較小。 6. The carrying head provided by the present invention adheres the flexible film to the body, so that the flexible film and the body are fixed in a simple and reliable manner, and the volume is small.

7.本發明提供的承載頭,通過將柔性膜設置為橡膠膜,使得加工比較便捷,且成本較低。 7. In the load-bearing head provided by the present invention, the flexible membrane is configured as a rubber membrane, so that the processing is more convenient and the cost is lower.

8.本發明提供的承載頭,通過在氣管與本體的側部之間設置密封裝置,能夠增強了密封效果,防止了凹腔內氣體的外泄。 8. The carrying head provided by the present invention can enhance the sealing effect and prevent the leakage of gas in the cavity by arranging a sealing device between the trachea and the side of the body.

9.本發明提供的承載頭,通過設置控制器和在每個凹腔的通氣孔處均設置第一壓力感測器,使得每個凹腔內的壓力能夠自動單獨的被檢測到,各凹腔之間相互獨立,互不干擾。同時,通過設置第一壓力感測器,可以對每個凹腔內部的壓力進行控制,進而可以控制凹腔相對應的柔性膜與待拋光產品之間的接觸壓力,進而可以控制不同凹腔對於待拋光產品的剖光程度,從而更加靈活地把控最終獲得的待拋光產品在各個不同部位的拋光程度。 9. The load-bearing head provided by the present invention sets a controller and a first pressure sensor at the ventilation hole of each cavity, so that the pressure in each cavity can be automatically and individually detected. The cavities are independent of each other and do not interfere with each other. At the same time, by arranging the first pressure sensor, the pressure inside each cavity can be controlled, and the contact pressure between the flexible film corresponding to the cavity and the product to be polished can be controlled, and the impact of different cavities on the product to be polished can be controlled. The degree of polishing of the product to be polished can be more flexibly controlled in various parts of the final product to be polished.

1:第一密閉腔室 1: First sealed chamber

2:第二密閉腔室 2: Second sealed chamber

3:第三密閉腔室 3: The third sealed chamber

4:第四密閉腔室 4: The fourth sealed chamber

5:第五密閉腔室 5: The fifth sealed chamber

6:本體 6: Ontology

7:第一凹腔 7: First cavity

8:第二凹腔 8:Second cavity

9:第三凹腔 9: The third cavity

10:第四凹腔 10:The fourth cavity

11:第五凹腔 11:The fifth cavity

12:通氣孔 12:Vent hole

13:柔性膜 13:Flexible membrane

14:凸筋 14: convex ribs

15:氣管 15: Trachea

16:密封裝置 16:Sealing device

17:拋光墊 17: Polishing pad

18:壓蓋 18:Gland

19:探頭 19:Probe

20:彈簧 20:Spring

21:第一密封圈 21:First sealing ring

22:第二密封圈 22:Second sealing ring

23:傳感區域 23: Sensing area

24:晶圓 24:wafer

為了更清楚地說明本發明具體實施方式或現有技術中的技術方案,下面將對具體實施方式或現有技術描述中所需要使用的附圖作簡單地介紹,顯而易見地,下面描述中的附圖是本發明的一些實施方式,並非用以限制本發明的內容。 In order to more clearly explain the specific embodiments of the present invention or the technical solutions in the prior art, the drawings that need to be used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings in the following description are: Some embodiments of the present invention are not intended to limit the content of the present invention.

圖1為習知技術中的承載頭的結構剖視圖。 Figure 1 is a structural cross-sectional view of a carrying head in the prior art.

圖2為本發明的承載頭的結構剖視圖。 Figure 2 is a structural cross-sectional view of the carrying head of the present invention.

圖3為本發明的在對晶圓進行拋光時的部分結構剖視圖。 3 is a partial structural cross-sectional view of the present invention when polishing the wafer.

圖4為本發明的在對晶圓進行吸附時的部分結構剖視圖。 4 is a partial structural cross-sectional view of the present invention when adsorbing the wafer.

圖5為本發明的在對晶圓進行吸附時監測晶圓處於未吸附 狀態的部分結構剖視圖。 Figure 5 shows the monitoring method of the present invention when the wafer is not adsorbed when the wafer is adsorbed. Partial structural cutaway view of the state.

圖6為本發明的在對晶圓進行吸附時監測晶圓處於吸附狀態的部分結構剖視圖。 FIG. 6 is a partial structural cross-sectional view of the present invention for monitoring the adsorption state of the wafer when adsorbing the wafer.

為更清楚了解本創作之特徵、內容與優點及其所能達成之功效,茲將本創作配合附圖,並以實施例之表達形式詳細說明如下,而其中所使用之圖式,其主旨僅為示意及輔助說明書之用,故不應就所附之圖式的比例與配置關係解讀、侷限本創作的申請專利範圍。 In order to have a clearer understanding of the characteristics, content and advantages of this invention and the effects it can achieve, this invention is described in detail below in conjunction with the accompanying drawings and in the form of embodiments. The purpose of the diagrams used is only They are for illustration and auxiliary description purposes, so the proportions and configuration relationships of the attached drawings should not be interpreted to limit the patentable scope of this creation.

本文中的用語「一」或「一種」係用以敘述本創作之元件及成分。此術語僅為了敘述方便及給予本創作之基本觀念。此敘述應被理解為包括一種或至少一種,且除非明顯地另有所指,表示單數時亦包括複數。於申請專利範圍中和「包含」一詞一起使用時,該用語「一」可意謂一個或超過一個。此外,本文中的用語「或」其意同「及/或」。 The term "a" or "an" used herein is used to describe the elements and components of the invention. This terminology is only for convenience of description and to give the basic concept of this creation. This recitation should be understood to include one or at least one, and the singular also includes the plural unless it is expressly stated otherwise. When used with the word "comprising" in a patent application, the term "a" can mean one or more than one. In addition, the word "or" used in this article has the same meaning as "and/or".

除非另外規定,否則諸如「上方」、「下方」、「向上」、「左邊」、「右邊」、「向下」、「本體」、「底座」、「垂直」、「水平」、「側」、「較高」、「下部」、「上部」、「上方」、「下面」等空間描述係關於圖中所展示之方向加以指示。應理解,本文中所使用之空間描述僅出於說明之目的,且本文中所描述之結構之實際實施可以任何相對方向在空間上配置,此限制條件不會改變本發明實施例之優點。舉例來說,在一些實施例之描述中,提供「在」另一元件「上」之一元件可涵蓋前一元件直接在後一元件上(例如,與後一元件實體接觸)的狀況以及一或複數個介入元件位於前一元件與後一元件之間的狀況。 Unless otherwise specified, terms such as "above", "below", "up", "left", "right", "down", "body", "base", "vertical", "horizontal", "side" Spatial descriptions such as "higher", "lower", "upper", "above", and "below" indicate the direction shown in the figure. It should be understood that the spatial descriptions used herein are for illustrative purposes only, and that actual implementations of the structures described herein may be spatially configured in any relative orientation, and this limitation does not alter the advantages of embodiments of the invention. For example, in the description of some embodiments, providing that one element is "on" another element may cover situations where the former element is directly on (e.g., in physical contact with) the latter element, as well as when an element is "on" the latter element. Or a situation where multiple intervening components are located between the previous component and the following component.

如本文中所使用,術語「大致」、「實質上」、「實質 的」及「約」用以描述及考慮微小之變化。當與事件或情形結合使用時,該等術語可意指事件或情形明確發生之情況以及事件或情形極近似於發生之情況。 As used herein, the terms "substantially", "substantially", "substantially" "of" and "appropriate" are used to describe and consider small changes. When used in connection with an event or circumstance, these terms may mean both a definite occurrence of the event or circumstance and a close approximation of the occurrence of the event or circumstance.

如圖2至圖6所示,本實施例中提供了一種承載頭,包括:本體6和柔性膜13。 As shown in FIGS. 2 to 6 , this embodiment provides a carrying head, including: a body 6 and a flexible film 13 .

本體6為非柔性材質,且本體6靠近待拋光產品的端部開設有多個凹腔,每個凹腔上設有通氣孔12,通氣孔12適於與氣源連接;柔性膜13固定連接在本體6的端部,適於與待拋光產品接觸。 The body 6 is made of non-flexible material, and the end of the body 6 close to the product to be polished is provided with multiple cavities. Each cavity is provided with a ventilation hole 12, and the ventilation hole 12 is suitable for connecting to the air source; the flexible membrane 13 is fixedly connected The end of the body 6 is suitable for contact with the product to be polished.

本實施例中的承載頭用於對晶圓24進行吸附拋光,通過將本體6設置為非柔性材質,使得在本體6上開設多個凹腔比較方便,通過在凹腔上設置與氣源連接的通氣孔12,使得每個凹腔的氣壓控制較方便,各個凹腔互不干擾,通過在本體6靠近晶圓24的端部固定連接柔性膜13,採用柔性膜13與晶圓24直接接觸,保證了柔性膜13與晶圓24的貼合度,由於無需在各腔室之間設置密封,而是採用非柔性材質的本體6直接開設凹腔保證各腔室的獨立控制,且在通氣時非柔性的本體6開設的凹腔也不會相互干擾,使得承載頭的結構比較簡單,製程製造比較簡單。 The carrying head in this embodiment is used to adsorb and polish the wafer 24. By setting the body 6 to a non-flexible material, it is more convenient to open multiple cavities on the body 6. By setting the cavity on the cavity to connect to the gas source The ventilation hole 12 makes it easier to control the air pressure of each cavity, and the cavity does not interfere with each other. The flexible membrane 13 is fixedly connected to the end of the body 6 close to the wafer 24, and the flexible membrane 13 is used to directly contact the wafer 24. , ensuring the fit between the flexible film 13 and the wafer 24. Since there is no need to set a seal between the chambers, the body 6 of non-flexible material is used to directly open a concave cavity to ensure the independent control of each chamber, and during ventilation The cavities provided by the non-flexible body 6 will not interfere with each other, so that the structure of the carrying head is relatively simple and the manufacturing process is relatively simple.

本實施例中的本體6採用金屬材質。通過將本體6設置為金屬材質,使得本體6的獲取簡單易得。加工性能也較好。作為可變換的實施方式,也可以是,本體6採用非金屬材質,或者是,其他的非柔性材質均可。 The body 6 in this embodiment is made of metal. By configuring the body 6 to be made of metal, the body 6 is easy to obtain. The processing performance is also better. As an alternative embodiment, the body 6 can also be made of non-metallic material, or other non-flexible materials.

如圖2所示,本實施例中的本體6為圓盤結構,凹腔為環狀結構。通過將本體6設置為圓盤結構,凹腔設置為環狀結構,使得凹腔的加工比較便捷。作為可變換的實施方式,也可以是,本體6的橫截面為方 形結構,凹腔為條狀結構,沿本體6的長度方向依次開設多個凹腔。 As shown in Figure 2, the body 6 in this embodiment has a disc structure, and the cavity has an annular structure. By configuring the body 6 as a disc structure and the cavity as an annular structure, the processing of the cavity is made more convenient. As an alternative embodiment, the cross section of the body 6 can also be square. Shape structure, the cavity is a strip structure, and a plurality of cavity are opened sequentially along the length direction of the body 6.

沿徑向方向,由本體6的邊緣向本體6的中心方向,凹腔的體積逐漸增大。具體地,如圖2所示,複數個凹腔的深度相同,沿本體6的邊緣向本體6的中心方向,凹腔的底面積逐漸增大。通過設置沿徑向方向,由本體6的邊緣向中心方向,複數個凹腔的深度相同,底面積逐漸增大,如此可使得邊緣處的凹腔體積較小,進而對邊緣處壓力控制越精確,進而使得邊緣的柔性膜13與晶圓24的邊緣的貼合度更高,提高拋光效果。作為可變換的實施方式,也可以是,各凹腔的體積根據實際需要設置,如靠近中心的凹腔也和邊緣處的凹腔一樣體積設置的很小。 Along the radial direction, from the edge of the body 6 to the center of the body 6 , the volume of the cavity gradually increases. Specifically, as shown in FIG. 2 , the plurality of cavities have the same depth, and the bottom area of the cavities gradually increases along the edge of the body 6 toward the center of the body 6 . By arranging in the radial direction, from the edge of the body 6 to the center, the depths of the plurality of cavities are the same, and the bottom area gradually increases. This can make the volume of the cavities at the edges smaller, and thereby control the pressure at the edges more accurately. , thereby making the edge of the flexible film 13 and the edge of the wafer 24 more closely adhered, thereby improving the polishing effect. As a changeable implementation, the volume of each cavity may be set according to actual needs. For example, the volume of the cavity near the center may be set to be as small as the cavity at the edge.

本實施例中靠近本體6中心處的凹腔上設有凸筋14,最中心的凹腔上設置有兩個凸筋14,臨近的凹腔上設置有一個凸筋14,由凹腔的底部向靠近柔性膜13的方向延伸,且凸筋14的延伸長度小於凹腔的延伸長度。通過在凹腔上設置凸筋14,且凸筋14的延伸長度小於凹腔的延伸長度,能夠在凹腔內為真空的情況下對柔性膜13進行支撐,避免由於柔性膜13的變形量較大而導致晶圓24損傷。作為可變換的實施方式,也可以是,在空間允許的情況下,可以在多個凹腔上均設置凸筋14;或者是,每個凹腔上的凸筋14可根據實際需要具體設置。 In this embodiment, the concave cavity near the center of the body 6 is provided with convex ribs 14. The central concave cavity is provided with two convex ribs 14, and the adjacent concave cavity is provided with one convex rib 14. From the bottom of the concave cavity, Extending in a direction close to the flexible membrane 13 , the extension length of the ribs 14 is smaller than the extension length of the cavity. By arranging the convex ribs 14 on the concave cavity, and the extension length of the convex ribs 14 is smaller than the extension length of the concave cavity, the flexible membrane 13 can be supported when there is a vacuum in the cavity, and the flexible membrane 13 can be prevented from being deformed due to a large amount of deformation. Large enough to cause damage to the wafer 24 . As an alternative implementation, if space allows, the convex ribs 14 can be provided on multiple cavities; or, the convex ribs 14 on each cavity can be specifically set according to actual needs.

本實施例中的柔性膜13為橡膠膜,如矽膠,使得加工比較便捷,成本較低。且柔性膜13通過粘接的方式固定在本體6上,這樣使得柔性膜13與本體6的固定方式簡單可靠,體積較小。具體地,柔性膜13通過硫化橡膠粘接在本體6上。為了提高柔性膜13的適應能力,提高承載頭的功能範圍,還可以對柔性膜13進行優化,如改變柔性膜13的形狀,可為L形或Z形折角等形式、設置不同凹腔對應的柔性膜13厚度不同等。作 為可變換的實施方式,也可以是,柔性膜13採用其他類似性能的橡膠膜。 The flexible membrane 13 in this embodiment is a rubber membrane, such as silicone, which makes the processing more convenient and the cost lower. Moreover, the flexible film 13 is fixed on the body 6 by adhesion, which makes the fixing method of the flexible film 13 and the body 6 simple and reliable, and the volume is small. Specifically, the flexible membrane 13 is bonded to the body 6 through vulcanized rubber. In order to improve the adaptability of the flexible membrane 13 and improve the functional range of the load-bearing head, the flexible membrane 13 can also be optimized. For example, the shape of the flexible membrane 13 can be changed, such as L-shaped or Z-shaped corners, and different cavity corresponding to The thickness of the flexible membrane 13 varies. do As an alternative embodiment, the flexible membrane 13 may also be made of other rubber membranes with similar properties.

如圖5及圖6所示,為了便於與氣源連接,本實施例中的承載頭進一步包括氣管15,設於本體6遠離柔性膜13的一端,氣管15的一端與通氣孔12連接,另一端伸出本體6外,適於與氣源連接。其中氣管15從本體6的側部伸出本體6,且在氣管15要伸出本體6處於本體6之間設有密封裝置16,能夠增強了密封效果,防止了凹腔內氣體的外泄。具體地,本實施例中的密封裝置16為密封螺柱,用於堵塞邊緣加工孔。作為可變換的實施方式,也可以是,密封裝置16為密封圈,或者是不設置密封裝置16。 As shown in Figures 5 and 6, in order to facilitate connection with the air source, the carrying head in this embodiment further includes a trachea 15, which is located at one end of the body 6 away from the flexible membrane 13. One end of the trachea 15 is connected to the ventilation hole 12, and the other end of the trachea 15 is connected to the ventilation hole 12. One end extends out of the body 6 and is suitable for connection with the air source. The air pipe 15 protrudes from the side of the body 6, and a sealing device 16 is provided between the air pipe 15 and the body 6, which can enhance the sealing effect and prevent the leakage of gas in the cavity. Specifically, the sealing device 16 in this embodiment is a sealing stud, used to block the edge processing hole. As an alternative embodiment, the sealing device 16 may be a sealing ring, or the sealing device 16 may not be provided.

本實施例中的承載頭進一步包括:第一壓力感測器,設於通氣孔12處,第一壓力感測器與凹腔一一對應設置;控制器,與第一壓力感測器連接,適於控制凹腔內的壓力,其中,承載頭可進一步包括設置於本體6之第二壓力感測器,其包括壓蓋18、探頭19,設于壓蓋18和探頭19之間的彈簧20、密封圈等等。通過設置控制器和在每個凹腔的通氣孔12處均設置第一壓力感測器,使得每個凹腔內的壓力能夠自動單獨的被檢測到,各凹腔之間相互獨立,互不干擾,同時,通過設置第一壓力感測器,可以對每個凹腔內部的壓力進行控制,進而可以控制凹腔相對應的柔性膜13與晶圓24之間的接觸壓力,進而可以控制不同凹腔對於待拋光產品的剖光程度,從而更加靈活地把控最終獲得的晶圓24在各個不同部位的拋光程度。如圖5所示,該第二壓力感測器可設置於本體6中。根據圖5例式性的實施例,該第二壓力感測器之探頭19之一端部延伸進第四凹腔10內;該第二壓力感測器之傳感區域23與氣管15流體連接;該第二壓力感測器之探頭19可具有一法蘭,其抵靠於第二密封圈22上,彈簧20推抵探頭 19,使探頭19處於未受外力作用時,其該端部保持延伸進第四凹腔10內,並大致與本體6之端部齊平,在此狀態時稱為一自由狀態;在自由狀態時,探頭19的法藍與第二密封圈22隔絕傳感區域23與第四凹腔10之間的流體連接,即處於一非導通狀態。 The carrying head in this embodiment further includes: a first pressure sensor, located at the ventilation hole 12, and the first pressure sensor is arranged in one-to-one correspondence with the cavity; a controller, connected to the first pressure sensor, Suitable for controlling the pressure in the cavity, wherein the carrying head may further include a second pressure sensor provided on the body 6, which includes a pressure cover 18, a probe 19, and a spring 20 provided between the pressure cover 18 and the probe 19 , sealing rings, etc. By arranging the controller and arranging the first pressure sensor at the ventilation hole 12 of each cavity, the pressure in each cavity can be automatically and individually detected, and each cavity is independent of each other. Interference, at the same time, by setting the first pressure sensor, the pressure inside each cavity can be controlled, and then the contact pressure between the flexible film 13 corresponding to the cavity and the wafer 24 can be controlled, thereby controlling different The degree of polishing of the recessed cavity for the product to be polished allows for more flexible control of the degree of polishing at various locations of the finally obtained wafer 24 . As shown in FIG. 5 , the second pressure sensor can be disposed in the body 6 . According to the exemplary embodiment of Figure 5, one end of the probe 19 of the second pressure sensor extends into the fourth cavity 10; the sensing area 23 of the second pressure sensor is fluidly connected to the trachea 15; The probe 19 of the second pressure sensor may have a flange, which abuts against the second sealing ring 22 , and the spring 20 pushes against the probe. 19. When the probe 19 is not subjected to external force, its end remains extended into the fourth cavity 10 and is approximately flush with the end of the body 6. This state is called a free state; in the free state At this time, the flange of the probe 19 and the second sealing ring 22 isolate the fluid connection between the sensing area 23 and the fourth cavity 10, that is, it is in a non-conducting state.

本實施例中的承載頭以設置5個凹腔為例進行說明,由邊緣向中心分別為第一凹腔7、第二凹腔8、第三凹腔9、第四凹腔10和第五凹腔11,如圖3所示,在對晶圓24進行拋光製程時,通常來說由邊緣至中心的凹腔會各自施加2-10psi不等的充氣壓力,各凹腔對應的柔性膜13會在壓力作用下發生膨脹變形,膨脹後的柔性膜13會作用於晶圓24的背面並使晶圓24正面與拋光墊17緊密貼合,由於不同凹腔的壓力值通常不同,故各凹腔對應的柔性膜13變形量對於晶圓24施加的作用力也通常不同,這樣有利於對晶圓24正面的各區域的研磨量進行精准控制。 The load-carrying head in this embodiment is provided with five cavities as an example. From the edge to the center, they are the first cavity 7, the second cavity 8, the third cavity 9, the fourth cavity 10 and the fifth cavity. Cavity 11, as shown in Figure 3, when polishing the wafer 24, generally speaking, the cavity from the edge to the center will each apply an inflation pressure ranging from 2 to 10 psi, and the corresponding flexible film 13 of each cavity It will expand and deform under the action of pressure. The expanded flexible film 13 will act on the back of the wafer 24 and make the front of the wafer 24 closely fit with the polishing pad 17. Since the pressure values of different concave cavities are usually different, each concave cavity will have different pressure values. The deformation amount of the flexible film 13 corresponding to the cavity usually exerts different forces on the wafer 24 , which is beneficial to accurately controlling the grinding amount of each area on the front side of the wafer 24 .

如圖4所示,在對晶圓24進行搬運過程中,晶圓24首先脫離拋光墊17並與柔性膜13緊密貼合,而後通過通氣孔12對各凹腔施加負壓,各凹腔對應的柔性膜13在負壓作用下會發生收縮變形,故收縮後的柔性膜13會與晶圓24形成局部真空,局部真空會對晶圓24的背面進行吸附。 As shown in FIG. 4 , during the transportation of the wafer 24 , the wafer 24 is first separated from the polishing pad 17 and closely attached to the flexible film 13 , and then negative pressure is applied to each cavity through the vent hole 12 , and each cavity corresponds to The flexible film 13 will shrink and deform under the action of negative pressure, so the shrunk flexible film 13 will form a partial vacuum with the wafer 24, and the partial vacuum will adsorb the back side of the wafer 24.

在對晶圓24搬運過程中,需要對晶圓24的吸附狀態進行即時監測,本實施例通過對不同區域的壓力值相比較進行監測,以第二凹腔8和第四凹腔10為例進行說明,如圖5所示,在對區域體積較小的第二凹腔8施加較小的真空度(如-2psi)的壓力值然後與真空源斷開連接並保壓,通過第二凹腔8的第一壓力感測器(未示意)即時監測第二凹腔8的壓力值,同時在區域體積較大的第四凹腔10施加真空度較大的壓力值(如- 8psi),同時保持該區域與真空源保持連接狀態,並通過第四凹腔10處的第二壓力感測器(圖中示意)監測該區域的真空度是否呈負壓。在晶圓24未被吸附的情況下,柔性膜13處於正常平展狀態,第二壓力感測器的探頭19在壓蓋18及彈簧20的作用下處于自由狀態,同時在第一密封圈21和第二密封圈22的作用下,第四凹腔10與傳感區域23處於非導通狀態,此時第二凹腔8與第四凹腔10之間的壓力值差值較大。通過差值對比認為此時晶圓24處於未被吸附狀態。 During the transportation process of the wafer 24, the adsorption state of the wafer 24 needs to be monitored in real time. In this embodiment, the monitoring is performed by comparing the pressure values of different areas, taking the second cavity 8 and the fourth cavity 10 as an example. To illustrate, as shown in Figure 5, a smaller vacuum degree (such as -2 psi) is applied to the second cavity 8 with a smaller area, and then the pressure value is disconnected from the vacuum source and maintained at pressure, and the pressure is passed through the second cavity 8. The first pressure sensor (not shown) of the cavity 8 monitors the pressure value of the second cavity 8 in real time, and at the same time applies a pressure value with a larger vacuum degree (such as - 8 psi), while keeping the area connected to the vacuum source, and monitoring whether the vacuum degree of the area is negative through the second pressure sensor (shown in the figure) at the fourth cavity 10 . When the wafer 24 is not adsorbed, the flexible film 13 is in a normal flat state, and the probe 19 of the second pressure sensor is in a free state under the action of the gland 18 and the spring 20. At the same time, the first sealing ring 21 and Under the action of the second sealing ring 22, the fourth cavity 10 and the sensing area 23 are in a non-conducting state. At this time, the pressure value difference between the second cavity 8 and the fourth cavity 10 is large. Through difference comparison, it is considered that the wafer 24 is in an unadsorbed state at this time.

如圖6所示,在晶圓24被吸附的狀態下,晶圓24與柔性膜13緊密貼合,柔性膜13在受到真空吸附的作用下回產生壓力變形,柔性膜13的收縮會促使第二壓力感測器的探頭19處於收縮狀態,此時第二壓力感測器的探頭19與第二密封圈22之間會產生一定的間隙,則第二密封圈22處於失效狀態,無法起到密封作用,即傳感區域23與第四凹腔10相互連通而處於一導通狀態,由於第四凹腔10處於真空度較大的狀態下且第二凹腔8與真空源斷開,故第二凹腔8會由於通過氣管15與第四凹腔10相通,第二凹腔8的真空值會發生較大的變化(由-2psi變成-4psi),通過第二凹腔8的第一壓力感測器可監測到此時晶圓24處於吸附狀態。即,第二密封圈22,其在探頭19處於收縮狀態時使傳感區域23處於一導通狀態。 As shown in Figure 6, when the wafer 24 is adsorbed, the wafer 24 and the flexible film 13 are in close contact with each other. The flexible film 13 will produce pressure deformation under the action of vacuum adsorption. The shrinkage of the flexible film 13 will cause the second The probe 19 of the second pressure sensor is in a contracted state. At this time, there will be a certain gap between the probe 19 of the second pressure sensor and the second sealing ring 22. Then the second sealing ring 22 is in a failed state and cannot function. The sealing effect is that the sensing area 23 and the fourth cavity 10 are connected to each other and are in a conductive state. Since the fourth cavity 10 is in a state of relatively large vacuum and the second cavity 8 is disconnected from the vacuum source, the fourth cavity 8 is disconnected from the vacuum source. Since the second cavity 8 is connected to the fourth cavity 10 through the air pipe 15, the vacuum value of the second cavity 8 will change greatly (from -2psi to -4psi), and the first pressure of the second cavity 8 will The sensor can detect that the wafer 24 is in an adsorbed state at this time. That is, the second sealing ring 22 keeps the sensing area 23 in a conductive state when the probe 19 is in a contracted state.

本實施例中還提供了一種拋光裝置,包括如上述的承載頭,承載頭上的柔性膜13與設于下方拋光墊17上的晶圓24接觸,對晶圓24進行摩擦拋光。 This embodiment also provides a polishing device, which includes the above-mentioned carrying head. The flexible film 13 on the carrying head contacts the wafer 24 provided on the polishing pad 17 below to frictionally polish the wafer 24 .

以上所述之實施例僅係為說明本創作之技術思想及特點,其目的在使熟習此項技藝之人士能夠瞭解本創作之內容並據以實施,當不能以之限定本創作之專利範圍,依本創作所揭示之精神所作之均等變化或 修飾,仍應涵蓋在本創作之專利範圍內。 The above-mentioned embodiments are only for illustrating the technical ideas and characteristics of this invention. Their purpose is to enable those familiar with this art to understand the content of this invention and implement it accordingly. They should not be used to limit the patent scope of this invention. Equal changes made in accordance with the spirit revealed in this creation or Modifications should still be covered by the patent scope of this creation.

6:本體 6: Ontology

7:第一凹腔 7: First cavity

8:第二凹腔 8:Second cavity

9:第三凹腔 9: The third cavity

10:第四凹腔 10:The fourth cavity

11:第五凹腔 11:The fifth cavity

12:通氣孔 12:Vent hole

13:柔性膜 13:Flexible membrane

14:凸筋 14: convex ribs

Claims (9)

一種承載頭,包括:一本體(6),該本體(6)為非柔性材質,且該本體(6)靠近待拋光產品的端部開設有多個凹腔,每個該凹腔上設有複數個通氣孔(12),該複數個通氣孔(12)適於與氣源連接;一具延展性之柔性膜(13),固定連接在該本體(6)的該端部,適於與該待拋光產品接觸;一氣管(15),設於該本體(6)遠離該柔性膜(13)的一端,該氣管(15)的一端與該複數個通氣孔(12)連接,另一端伸出該本體(6)外,適於與該氣源連接;多個第一壓力感測器,設於該複數個通氣孔(12)處,該等第一壓力感測器與該等凹腔一一對應設置;一控制器,與該等第一壓力感測器連接,適於控制該凹腔內的壓力;及至少一第二壓力感測器,其設置於該本體(6)中,該第二壓力感測器包括:一探頭(19),其一端部延伸進該等凹腔之一者,與該本體(6)之該端部大致齊平,並具有一法藍於其上;一彈簧(20),其套設於該探頭(19)的外緣,並且該彈簧(20)的底端抵靠該探頭(19)之該法藍上;一壓蓋(18),其固定於該本體(6)上,且該彈簧(20)之頂端抵靠該壓蓋(18); 一第一密封圈(21),其套設於該探頭(19)的外緣,並位於該探頭(19)之該法藍上方,一傳感區域(23),其界定於該探頭(19)之該法藍與該第一密封圈(21)之間,並與該氣管流體連接;及至少一第二密封圈(22),其套設於該探頭(19)的外緣並位於該法藍下方;其中在該探頭(19)之該端部未受外力作用時,該探頭(19)之該端部保持延伸進該等凹腔,且該傳感區域(23)與該凹腔處於一非導通狀態,在該探頭(19)之該端部受外力作用時,該探頭(19)之該端部處於一收縮狀態,且該傳感區域(23)與該凹腔處於一導通狀態;其中沿徑向方向,由該本體(6)的邊緣向該本體(6)的中心方向,該凹腔的體積逐漸增大。 A carrying head, including: a body (6), the body (6) is made of non-flexible material, and the body (6) is provided with a plurality of recessed cavities near the end of the product to be polished, and each recessed cavity is provided with a A plurality of vent holes (12), the plurality of vent holes (12) are suitable for connection with the air source; a ductile flexible membrane (13) is fixedly connected to the end of the body (6), and is suitable for connection with the air source. The product to be polished is in contact with; an air tube (15) is located at one end of the body (6) away from the flexible film (13). One end of the air tube (15) is connected to the plurality of ventilation holes (12), and the other end extends Out of the body (6), it is suitable to be connected to the air source; a plurality of first pressure sensors are provided at the plurality of vent holes (12), and the first pressure sensors are connected to the cavity One-to-one correspondence is provided; a controller is connected to the first pressure sensors and is suitable for controlling the pressure in the cavity; and at least one second pressure sensor is arranged in the body (6), The second pressure sensor includes: a probe (19), one end of which extends into one of the cavities, is substantially flush with the end of the body (6), and has a flange on it. ; A spring (20), which is sleeved on the outer edge of the probe (19), and the bottom end of the spring (20) is against the flange of the probe (19); a gland (18), It is fixed on the body (6), and the top end of the spring (20) is against the gland (18); A first sealing ring (21) is set on the outer edge of the probe (19) and is located above the flange of the probe (19). A sensing area (23) is defined on the probe (19). ) between the flange and the first sealing ring (21) and fluidly connected to the trachea; and at least one second sealing ring (22), which is sleeved on the outer edge of the probe (19) and located on the Below the flange; when the end of the probe (19) is not acted upon by external force, the end of the probe (19) remains extended into the cavities, and the sensing area (23) is in contact with the cavities. In a non-conductive state, when the end of the probe (19) is acted upon by an external force, the end of the probe (19) is in a contracted state, and the sensing area (23) and the cavity are in a conductive state. state; wherein along the radial direction, from the edge of the body (6) to the center of the body (6), the volume of the cavity gradually increases. 如請求項1之承載頭,其中該本體(6)採用金屬材質。 For example, the carrying head of claim 1, wherein the body (6) is made of metal. 如請求項1之承載頭,其中該本體(6)為圓盤結構,該凹腔為環狀結構。 The carrying head of claim 1, wherein the body (6) has a disc structure and the cavity has an annular structure. 如請求項1之承載頭,其中複數個該凹腔的深度相同,沿該本體(6)的邊緣向該本體(6)的中心方向,該凹腔的底面積逐漸增大。 In the carrying head of claim 1, the depths of the plurality of cavities are the same, and the bottom area of the cavities gradually increases along the edge of the body (6) toward the center of the body (6). 如請求項1-4任一之承載頭,其中至少一個該凹腔上設有複數個凸筋(14),該凸筋(14)由該凹腔的底部向靠近該柔性膜(13)的方向延 伸,且該凸筋(14)的延伸長度小於該凹腔的延伸長度。 The load-bearing head according to any one of claims 1 to 4, wherein at least one of the concavities is provided with a plurality of convex ribs (14), and the convex ribs (14) extend from the bottom of the cavity to the side close to the flexible membrane (13). direction extension Stretch, and the extension length of the convex rib (14) is less than the extension length of the cavity. 如請求項5之承載頭,其中該柔性膜(13)粘接在該本體(6)上。 The carrying head of claim 5, wherein the flexible film (13) is bonded to the body (6). 如請求項1-4任一之承載頭,其中該柔性膜(13)為一橡膠膜。 The carrying head of any one of claims 1 to 4, wherein the flexible membrane (13) is a rubber membrane. 如請求項1-4之承載頭,其中該氣管(15)與該本體(6)的側部之間設有一密封裝置(16)。 The carrying head of claim 1-4, wherein a sealing device (16) is provided between the air pipe (15) and the side of the body (6). 一種拋光裝置,其包括如請求項1-8任一之承載頭。A polishing device, which includes a carrying head according to any one of claims 1-8.
TW110107835A 2020-03-10 2021-03-05 Carrier head and polishing device with the carrier head TWI812930B (en)

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