TWI810859B - Package inspection apparatus and tray structure thereof - Google Patents

Package inspection apparatus and tray structure thereof Download PDF

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Publication number
TWI810859B
TWI810859B TW111110737A TW111110737A TWI810859B TW I810859 B TWI810859 B TW I810859B TW 111110737 A TW111110737 A TW 111110737A TW 111110737 A TW111110737 A TW 111110737A TW I810859 B TWI810859 B TW I810859B
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packaging
inspection machine
module
carrying
package
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TW111110737A
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TW202339100A (en
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陳家豪
藍育海
楊豐瑞
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南茂科技股份有限公司
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Priority to CN202210533102.4A priority patent/CN116840252A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67288Monitoring of warpage, curvature, damage, defects or the like
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10Measuring as part of the manufacturing process
    • H01L22/12Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/20Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/20Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
    • H01L22/24Optical enhancement of defects or not directly visible states, e.g. selective electrolytic deposition, bubbles in liquids, light emission, colour change

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Supplying Of Containers To The Packaging Station (AREA)

Abstract

A package inspection apparatus includes a carrying platform, a tray, an image capturing module and a light source module. The carrying platform includes a base and a backlight module disposed on the base. The try is disposed on the backlight module and includes a plurality of carrying units for carrying a plurality of package structures respectively. Each of the carrying units includes a plurality of grooves exposing a peripheral region of the corresponding package structure. The image capturing module is disposed over the carrying platform and configured to capture an image of at least a part of the package structures. The light source module is disposed between the image capturing module and the carrying platform.

Description

封裝檢測機台及其托盤結構Packaging inspection machine and its tray structure

本揭露是有關於一種檢測機台及其托盤結構,且特別是有關於一種封裝檢測機台及其承載用之托盤結構。The present disclosure relates to a testing machine and its tray structure, and in particular to a package testing machine and its supporting tray structure.

半導體封裝技術包含有許多封裝形態,其中薄型小尺寸封裝(Thin Small Outline Package, TSOP)形態是目前IC封裝中應用非常廣泛的一種封裝形式,於習知薄型小尺寸封裝的製作方法中是先將晶片設置於載體上(例如是引腳框架)進行電性連接之後,再藉由封裝膠體來包覆部分引腳框架以及晶片,而於封裝膠體的周圍形成對外電性連接之引腳,之後再裁切形成單體化後,採用SMT技術(表面安裝技術)直接附著在印刷電路板的表面。Semiconductor packaging technology includes many packaging forms, among which Thin Small Outline Package (TSOP) form is a very widely used packaging form in IC packaging at present. In the conventional manufacturing method of thin small After the chip is placed on the carrier (such as a lead frame) for electrical connection, part of the lead frame and the chip are covered by the encapsulant, and pins for external electrical connection are formed around the encapsulant, and then After cutting into a single body, it is directly attached to the surface of the printed circuit board using SMT technology (surface mount technology).

然而,當封裝膠體包覆引腳框架時,因引腳框架的引腳直接接觸封裝膠體,而易使得封裝膠體溢膠至引腳的下表面及引腳之間的間隙,進而影響引腳框架的電性可靠度。因此,於製作過程中,必須注意封裝膠體是否出現溢膠現象及溢膠是否超出容許範圍。以往前述的檢測工作係透過人工以目視方式執行,但此種方式不僅耗費人力,且執行上缺乏客觀的標準,故有待進一步檢討,並謀求可行的解決方案。However, when the encapsulant covers the lead frame, since the leads of the lead frame directly contact the encapsulant, it is easy for the encapsulant to overflow to the lower surface of the pin and the gap between the leads, thereby affecting the lead frame. electrical reliability. Therefore, during the production process, it is necessary to pay attention to whether the encapsulant has overflowed glue and whether the overflowed glue exceeds the allowable range. In the past, the above-mentioned inspection work was carried out manually and visually, but this method is not only labor-intensive, but also lacks objective standards in the implementation, so it needs further review and seeks a feasible solution.

本揭露提供一種封裝檢測機台及其托盤結構,其可自動檢測出封裝結構的溢膠程度,並可提升檢測的精確率。The disclosure provides a packaging inspection machine and its tray structure, which can automatically detect the degree of glue overflow of the packaging structure, and can improve the detection accuracy.

本揭露的一種封裝檢測機台,其包括承載台、托盤、影像擷取模組以及光源模組。承載台包括基座以及背光模組設置於基座上。托盤設置於背光模組上並包括多個承載單元,分別用以承載多個封裝結構,其中各承載單元包括暴露對應的封裝結構的一周緣區域的多個溝槽。影像擷取模組設置於承載台上方並用以擷取至少部分多個封裝結構的影像。光源模組設置於影像擷取模組與承載台之間。A packaging inspection machine disclosed in the present disclosure includes a carrier platform, a tray, an image capture module, and a light source module. The carrying platform includes a base and the backlight module is arranged on the base. The tray is disposed on the backlight module and includes a plurality of carrying units for carrying a plurality of packaging structures respectively, wherein each carrying unit includes a plurality of grooves exposing a peripheral area of the corresponding packaging structure. The image capturing module is arranged above the carrying platform and is used for capturing at least part of the images of the plurality of packaging structures. The light source module is arranged between the image capture module and the carrying platform.

本揭露的一種封裝檢測機台用之托盤結構,托盤用以設置於背光模組上並包括多個承載單元,其中多個承載單元分別用以承載多個封裝結構,且各該承載單元包括暴露對應的封裝結構的一周緣區域的多個溝槽。The present disclosure discloses a tray structure for a package inspection machine. The tray is used for setting on the backlight module and includes a plurality of carrying units, wherein the plurality of carrying units are respectively used to carry a plurality of packaging structures, and each of the carrying units includes an exposed Corresponding to a plurality of grooves in a peripheral region of the packaging structure.

基於上述,本揭露的封裝檢測機台的承載台設置有背光模組,用以承載封裝結構的托盤設置於背光模組上,並且,封裝檢測機台的托盤結構包括多個承載單元,且各個承載單元包括用以暴露對應的封裝結構的周緣區域(例如對應於封裝結構的外引腳處)的多個溝槽。如此配置,托盤下方的背光模組所提供的面光源可經由溝槽而透出,因而可進一步照亮封裝結構的至少周緣區域,以提高封裝結構與背景的明暗對比度,以利封裝檢測機台對其影像擷取模組所擷取的影像的判讀,進而可提升封裝檢測機台對影像判讀的正確率。Based on the above, the carrying platform of the packaging inspection machine of the present disclosure is provided with a backlight module, and the tray for carrying the packaging structure is arranged on the backlight module, and the tray structure of the packaging inspection machine includes a plurality of carrying units, and each The carrying unit includes a plurality of grooves for exposing peripheral regions of the corresponding packaging structure (for example, corresponding to outer leads of the packaging structure). With such a configuration, the surface light source provided by the backlight module under the tray can penetrate through the groove, thereby further illuminating at least the peripheral area of the package structure, so as to improve the light and dark contrast between the package structure and the background, and to facilitate the package inspection machine. The interpretation of the image captured by its image capture module can further improve the accuracy of the image interpretation of the package inspection machine.

有關本揭露之前述及其他技術內容、特點與功效,在以下配合參考圖式之各實施例的詳細說明中,將可清楚的呈現。以下實施例中所提到的方向用語,例如:「上」、「下」、「前」、「後」、「左」、「右」等,僅是參考附加圖式的方向。因此,使用的方向用語是用來說明,而並非用來限制本揭露。並且,在下列各實施例中,相同或相似的元件將採用相同或相似的標號。The aforementioned and other technical contents, features and effects of the present disclosure will be clearly presented in the following detailed descriptions of the embodiments with reference to the drawings. The directional terms mentioned in the following embodiments, such as "upper", "lower", "front", "rear", "left", "right", etc., are only referring to the directions of the attached drawings. Accordingly, the directional terms used are for illustration, not for limitation of the present disclosure. Also, in the following embodiments, the same or similar components will be given the same or similar symbols.

圖1是依照本揭露的一實施例的一種封裝檢測機台的示意圖。請參照圖1,在一些實施例中,封裝檢測機台100可包括承載台110、托盤120、影像擷取模組130以及光源模組140。在一實施例中,封裝檢測機台100可例如為自動光學檢查(Automated Optical Inspection, AOI)機台。在本實施例中,承載台110更可包括基座112以及設置於基座112上的背光模組114。以本實施例而言,背光模組114可例如配置於承載台110上。進一步來說,承載台110的基座112可例如具有設置凹槽1121,以將背光模組114配置於基座112的設置凹槽1121內,而封裝結構也可設置於此設置凹槽1121內並承放於背光模組114上。如此配置,封裝檢測機台100可藉由位於承載台110的背光模組114提供由下朝上出光的面光源,以利影像擷取模組130及/或人眼來檢視封裝結構的缺陷(defect)狀況。FIG. 1 is a schematic diagram of a package inspection machine according to an embodiment of the present disclosure. Please refer to FIG. 1 , in some embodiments, the package inspection machine 100 may include a carrier table 110 , a tray 120 , an image capture module 130 and a light source module 140 . In one embodiment, the package inspection machine 100 may be, for example, an automated optical inspection (Automated Optical Inspection, AOI) machine. In this embodiment, the carrying platform 110 may further include a base 112 and a backlight module 114 disposed on the base 112 . In this embodiment, the backlight module 114 can be disposed on the carrying platform 110 , for example. Further, the base 112 of the carrier 110 may have, for example, a setting groove 1121, so that the backlight module 114 is disposed in the setting groove 1121 of the base 112, and the packaging structure may also be set in the setting groove 1121. And placed on the backlight module 114 . With such a configuration, the packaging inspection machine 100 can provide a surface light source from the bottom to the top through the backlight module 114 located on the carrier 110, so that the image capture module 130 and/or human eyes can inspect the defects of the packaging structure ( defect) situation.

在一實施例中,承載台110可以作為封裝檢測機台100的承載主體,以供多個封裝結構(例如圖3所示的封裝結構200)放置於其上。在一些實施例中,承載台110更可耦接例如機械手臂、高度調整機構、滑軌、轉台、螺桿、馬達及/或汽缸等可驅動連接元件移動或旋轉的各種類型的機械構件之組合,使放置於承載台110上的封裝結構200升降、移動及/或旋轉。In an embodiment, the carrying platform 110 may serve as a carrying body of the package inspection machine 100 for placing multiple package structures (such as the package structure 200 shown in FIG. 3 ) thereon. In some embodiments, the carrying platform 110 can be further coupled to a combination of various types of mechanical components that can drive the connecting elements to move or rotate, such as a robot arm, a height adjustment mechanism, a slide rail, a turntable, a screw, a motor, and/or a cylinder. Lifting, moving and/or rotating the packaging structure 200 placed on the carrier platform 110 .

在一些實施例中,影像擷取模組130可移動地設於承載台110上方,並用以擷取封裝結構200的至少部分的影像。舉例而言,影像擷取模組130可以是相機、攝影機等裝置,影像擷取模組130並可以包括影像感測器(例如,電荷耦合裝置(Charge Coupled Device,CCD)、互補式金氧半導體(Complementary Metal-Oxide-Semiconductor,CMOS)等)、光學鏡頭、影像控制電路等元件。於本實施例中,影像擷取模組130的光學鏡頭可包括魚眼鏡頭。在此,魚眼鏡頭是指視角接近或等於180°的鏡頭。這類鏡頭的焦距極短,一般來說16公釐或焦距更短的鏡頭通常即可認為是魚眼鏡頭。當然,本揭露並不以此為限,影像擷取模組130的鏡頭規格(例如,取像光圈、倍率、焦距、取像可視角度、影像感測器大小等)及數量可依據實際需求而調整。In some embodiments, the image capturing module 130 is movably disposed above the carrying platform 110 and used for capturing at least a part of the image of the package structure 200 . For example, the image capture module 130 can be a device such as a camera, a video camera, etc., and the image capture module 130 can also include an image sensor (for example, a charge coupled device (Charge Coupled Device, CCD), a complementary metal oxide semiconductor (Complementary Metal-Oxide-Semiconductor, CMOS), etc.), optical lens, image control circuit and other components. In this embodiment, the optical lens of the image capture module 130 may include a fisheye lens. Here, a fisheye lens refers to a lens whose viewing angle is close to or equal to 180°. The focal length of this type of lens is extremely short. Generally speaking, a lens with a focal length of 16mm or shorter can usually be considered a fisheye lens. Of course, the present disclosure is not limited thereto, and the lens specifications (for example, image capture aperture, magnification, focal length, image capture viewing angle, image sensor size, etc.) and quantity of the image capture module 130 can be adjusted according to actual needs. Adjustment.

在一些實施例中,光源模組140設置於影像擷取模組130與承載台110之間。進一步而言,光源模組140可活動地設置於承載台110上方,並且,光源模組140可以是同軸光源、背光光源、環形光源、半球狀光源、條形光源、點光源、條形光源所組成可旋轉邊框光源等各類型光源。在一些實施例中,光源模組140可相對於承載台110進行一軸、二軸或更多軸的運動。舉例而言,光源模組140可相對承載台110升降、移動、及/或旋轉。此外,光源模組140的數量可依據實際需求而調整,且光源模組140所提供的亮度分布也可能調整。In some embodiments, the light source module 140 is disposed between the image capture module 130 and the carrying platform 110 . Further, the light source module 140 can be movably arranged above the carrying platform 110, and the light source module 140 can be a coaxial light source, a backlight light source, a ring light source, a hemispherical light source, a bar light source, a point light source, a bar light source, etc. Various types of light sources such as rotatable border light sources are formed. In some embodiments, the light source module 140 can move about one, two or more axes relative to the carrying platform 110 . For example, the light source module 140 can be lifted, moved, and/or rotated relative to the carrying platform 110 . In addition, the number of light source modules 140 can be adjusted according to actual needs, and the brightness distribution provided by the light source modules 140 can also be adjusted.

圖2是依照本揭露的一實施例的一種封裝檢測機台的托盤的示意圖。圖3是依照本揭露的一實施例的一種應用於封裝檢測機台的封裝結構的示意圖。請同時參照圖1至圖3,在一些實施例中,托盤120設置於背光模組114上,並且,托盤120可包括多個承載單元122,其分別用以承載多個封裝結構200。在一實施例中,各個承載單元122包括一開口1222以及多個溝槽1221,其中,開口1222用以暴露對應的封裝結構200的中心區域,而溝槽1221則用以暴露對應的封裝結構200的周緣區域。在本實施例中,溝槽1221可分別環繞開口1222的至少相對兩側。如此配置,托盤120下方的背光模組114所提供的面光源可經由溝槽1221而透出,並可進一步照亮封裝結構200的周緣區域,以利上方的影像擷取模組130進行判別。FIG. 2 is a schematic diagram of a tray of a package inspection machine according to an embodiment of the present disclosure. FIG. 3 is a schematic diagram of a package structure applied to a package inspection machine according to an embodiment of the present disclosure. Please refer to FIG. 1 to FIG. 3 at the same time. In some embodiments, the tray 120 is disposed on the backlight module 114 , and the tray 120 may include a plurality of carrying units 122 for carrying a plurality of packaging structures 200 respectively. In one embodiment, each carrying unit 122 includes an opening 1222 and a plurality of grooves 1221, wherein the opening 1222 is used to expose the central area of the corresponding packaging structure 200, and the groove 1221 is used to expose the corresponding packaging structure 200 surrounding area. In this embodiment, the trenches 1221 can respectively surround at least two opposite sides of the opening 1222 . With such a configuration, the surface light source provided by the backlight module 114 below the tray 120 can penetrate through the groove 1221 and further illuminate the peripheral area of the package structure 200 to facilitate the identification by the image capture module 130 above.

具體而言,在本實施例中,封裝結構200可如圖3所示包括封裝膠體210以及由封裝膠體210往外延伸的多個外引腳220。在一實施例中,封裝結構200可為薄型小尺寸封裝(Thin small outline package, TSOP),其可包括引腳框架(lead frame)及包封引腳框架的封裝膠體210,其中,引腳框架包括晶片座以及所述多個外引腳220,晶片座包封於封裝膠體210內並用以設置晶片,外引腳220則可延伸至封裝膠體210外。一般而言,在此封裝結構200的製作過程中,由於封裝膠體210容易溢膠至外引腳220的下表面及外引腳220之間的間隙,進而影響封裝結構200的電性可靠度。因此,必須利用封裝檢測機台100檢測封裝膠體210是否出現溢膠現象及溢膠的程度是否超出容許範圍。Specifically, in this embodiment, the encapsulation structure 200 may include an encapsulant 210 and a plurality of external leads 220 extending from the encapsulant 210 as shown in FIG. 3 . In one embodiment, the packaging structure 200 can be a thin small outline package (Thin small outline package, TSOP), which can include a lead frame (lead frame) and an encapsulating compound 210 encapsulating the lead frame, wherein the lead frame Including the chip seat and the plurality of external pins 220 , the chip seat is encapsulated in the encapsulant 210 for disposing the chip, and the external leads 220 can extend out of the encapsulant 210 . Generally speaking, during the manufacturing process of the package structure 200 , the encapsulation compound 210 is easy to overflow to the lower surface of the outer leads 220 and the gap between the outer leads 220 , thereby affecting the electrical reliability of the package structure 200 . Therefore, it is necessary to use the package inspection machine 100 to detect whether the encapsulant 210 is overflowing and whether the extent of the overflow exceeds the allowable range.

有鑑於此,在本實施例中,各承載單元122的多個溝槽1221可用以暴露對應的封裝結構200的周緣區域(例如對應於封裝結構200的外引腳220處),也就是說,承載單元122的開口1222可對應於封裝膠體210,而溝槽1221則可對應至少部分的外引腳122。如此配置,托盤120下方的背光模組114所提供的面光源可經由溝槽1221而透出,因而可進一步照亮封裝結構200的外引腳220附近的區域,以利封裝檢測機台100對影像擷取模組130所擷取的影像的判讀。此外,在本實施例中,托盤120的顏色可為淺色,具體來說,托盤120的顏色的色階可與封裝膠體210的顏色的色階相差約20階以上,以進一步提高外引腳220之間的封裝膠體210(若有)與背景的明暗對比度,進而提升封裝檢測機台100對影像判讀的正確率。In view of this, in this embodiment, the plurality of grooves 1221 of each carrying unit 122 can be used to expose the peripheral area of the corresponding package structure 200 (for example, corresponding to the outer pin 220 of the package structure 200), that is, The opening 1222 of the carrying unit 122 may correspond to the encapsulant 210 , and the groove 1221 may correspond to at least part of the external pins 122 . With such a configuration, the surface light source provided by the backlight module 114 under the tray 120 can penetrate through the groove 1221, thereby further illuminating the area near the outer pins 220 of the packaging structure 200, so as to facilitate the packaging inspection machine 100 to Interpretation of images captured by the image capture module 130 . In addition, in this embodiment, the color of the tray 120 can be light. Specifically, the color gradation of the tray 120 can differ from the color gradation of the encapsulant 210 by more than 20 steps, so as to further improve the quality of the external pins. The light-dark contrast between the packaging colloid 210 (if any) and the background between 220 , thereby improving the correct rate of image interpretation by the packaging inspection machine 100 .

圖4是圖3的封裝結構的局部放大示意圖。在一實施例中,請參照圖1及圖4,影像擷取模組130用以擷取至少相鄰兩個外引腳220的影像(例如圖4所示之影像)。並且,封裝檢測機台100更可如圖1所示包括處理器150,其耦接影像擷取模組130,以依據影像擷取模組130所擷取的影像來判斷位於相鄰兩個外引腳220之間的溢膠的封裝膠體212的最大溢膠深度L1與外引腳110的長度L2的比例是否大於預設比例。在本實施例中,預設比例可例如約為25%。也就是說,若處理器150判斷出最大溢膠深度L1與外引腳110的長度L2的比例實質上大於25%時,則處理器150決定此封裝結構200的缺陷大於可接受範圍而據此做出判讀結果(例如判定此封裝結構不合格(fail)),並可在後續對其進行例如丟棄等異常處理。FIG. 4 is a partially enlarged schematic view of the package structure in FIG. 3 . In one embodiment, please refer to FIG. 1 and FIG. 4 , the image capture module 130 is used to capture images of at least two adjacent outer pins 220 (such as the image shown in FIG. 4 ). Moreover, the package inspection machine 100 may further include a processor 150 as shown in FIG. Whether the ratio of the maximum glue overflow depth L1 of the overflowing encapsulant 212 between the pins 220 to the length L2 of the outer lead 110 is greater than a preset ratio. In this embodiment, the preset ratio may be about 25%, for example. That is to say, if the processor 150 determines that the ratio of the maximum glue overflow depth L1 to the length L2 of the outer lead 110 is substantially greater than 25%, the processor 150 determines that the defect of the package structure 200 is greater than the acceptable range and accordingly Make an interpretation result (such as judging that the encapsulation structure is unqualified (fail)), and then perform exception handling such as discarding it.

圖5至圖7是依照本揭露的不同實施例的封裝檢測機台的承載單元的示意圖。在此必須說明的是,本實施例的封裝檢測機台100的承載單元122與前述實施例相似,因此,本實施例沿用前述實施例的元件標號與部分內容,其中採用相同的標號來表示相同或近似的元件,並且省略了相同技術內容的說明。關於省略部分的說明可參考前述實施例,本實施例不再重複贅述。以下將針對本實施例的封裝檢測機台100的承載單元122與前述實施例的差異做說明。5 to 7 are schematic views of the carrying unit of the package inspection machine according to different embodiments of the present disclosure. It must be noted here that the carrying unit 122 of the packaging inspection machine 100 of this embodiment is similar to the previous embodiment, therefore, this embodiment follows the component numbers and part of the content of the previous embodiment, wherein the same number is used to indicate the same or similar elements, and descriptions of the same technical content are omitted. For the description of the omitted part, reference may be made to the foregoing embodiments, and this embodiment will not be repeated. The difference between the carrying unit 122 of the packaging inspection machine 100 of this embodiment and the previous embodiments will be described below.

在一些實施例中,承載單元122的溝槽1221可依產品特性而具有各種不同的配置。舉例而言,請先參照圖5,在本實施例中,對應於封裝結構的形狀,承載單元122可對應具有一對長邊1223以及一對短邊1224,溝槽1221可至少沿著彼此相對的兩長邊1223而設置,以暴露如圖3所示的封裝結構200中沿著相對兩長邊設置的外引腳122,使下方的背光模組114所提供的面光源可經由溝槽1221而透出,以照亮封裝結構200的外引腳220附近的區域。進一步而言,每個溝槽1221可沿對應的長邊1223延伸,並可於長邊1223的相對兩端處分別朝短邊1224的中心處延伸。在本實施例中,多個溝槽1221可呈對稱設置且彼此之間相隔特定距離。In some embodiments, the groove 1221 of the bearing unit 122 can have various configurations according to product characteristics. For example, please refer to FIG. 5 first. In this embodiment, corresponding to the shape of the package structure, the carrying unit 122 can have a pair of long sides 1223 and a pair of short sides 1224, and the grooves 1221 can at least be opposite to each other along the The two long sides 1223 are arranged to expose the outer pins 122 arranged along the two opposite long sides in the package structure 200 shown in FIG. and shine through to illuminate the area near the outer leads 220 of the package structure 200 . Further, each groove 1221 can extend along the corresponding long side 1223 , and can extend from opposite ends of the long side 1223 toward the center of the short side 1224 respectively. In this embodiment, the plurality of grooves 1221 may be arranged symmetrically with a certain distance therebetween.

請再參照圖6,在一實施例中,封裝結構的外引腳可例如沿著相對兩短邊設置。相應地,用以承載上述封裝結構的承載單元122a的溝槽1221a可至少沿著彼此相對的兩短邊1224而設置,以暴露沿著此封裝結構的相對兩短邊設置的外引腳。進一步而言,每個溝槽1221a可沿對應的短邊1224延伸,並可於短邊1224的相對兩端處分別朝長邊1223的中心處延伸。在本實施例中,多個溝槽1221a可呈對稱設置且彼此之間相隔特定距離。Referring to FIG. 6 again, in an embodiment, the external leads of the package structure may be disposed along two opposite short sides, for example. Correspondingly, the groove 1221a for carrying the carrying unit 122a of the package structure can be disposed at least along two short sides 1224 opposite to each other, so as to expose the external leads disposed along the two opposite short sides of the package structure. Further, each groove 1221 a can extend along the corresponding short side 1224 , and can extend from opposite ends of the short side 1224 toward the center of the long side 1223 respectively. In this embodiment, the plurality of grooves 1221a may be arranged symmetrically with a certain distance therebetween.

請再參照圖7,在一實施例中,封裝結構的外引腳可例如沿著封裝結構的每個側邊設置,例如是分別沿著一對長邊及一對短邊設置。相應地,用以承載上述封裝結構的承載單元122b的溝槽1221b可分別沿著彼此相對的兩長邊1223以及兩短邊1224而設置,以暴露沿著此封裝結構的各個側邊設置的外引腳。進一步而言,每個溝槽1221b彼此之間可相隔特定距離。Referring to FIG. 7 again, in an embodiment, the external leads of the package structure may be arranged along each side of the package structure, for example, arranged along a pair of long sides and a pair of short sides respectively. Correspondingly, the grooves 1221b for carrying the carrying unit 122b of the above-mentioned packaging structure can be respectively arranged along the two long sides 1223 and the two short sides 1224 opposite to each other, so as to expose the external parts arranged along each side of the packaging structure. pin. Further, each groove 1221b may be separated from each other by a specific distance.

圖8是依照本揭露的一實施例的封裝檢測機台的光源模組的示意圖。請參照圖1及圖8,在本實施例中,光源模組140可為半球狀擴散光源。具體而言,本實施例的光源模組140具有半球形的反射式擴散燈罩,多個光源142設置於此半球形的燈罩內,並使光源(例如發光二極體)142朝上照射於半球形燈罩,如此,光源142所發出的光線經過擴散燈罩的漫射,在光源142的下方形成一個均勻的照明區域,與一般的直射式光源照明的效果有明顯的不同。在本實施例中,光源模組140可具有開口144,使設置於上方的影像擷取模組130可經由此開口144擷取封裝結構的影像。在這樣的配置下,以此光源模組140進行照射,可使影像擷取模組130所擷取的影像無明顯的陰影,光滑面亦無強烈的反射光,可以避免取像時受到陰影或反光的影響,因而可降低影像處理的難度。FIG. 8 is a schematic diagram of a light source module of a package inspection machine according to an embodiment of the present disclosure. Please refer to FIG. 1 and FIG. 8 , in this embodiment, the light source module 140 can be a hemispherical diffused light source. Specifically, the light source module 140 of this embodiment has a hemispherical reflective diffuser lampshade, a plurality of light sources 142 are arranged in the hemispherical lampshade, and the light sources (such as light emitting diodes) 142 illuminate the hemisphere upwards. Shaped lampshade, in this way, the light emitted by the light source 142 is diffused by the diffuser lampshade to form a uniform lighting area under the light source 142, which is obviously different from the general direct light source lighting effect. In this embodiment, the light source module 140 may have an opening 144 so that the image capture module 130 disposed above can capture an image of the package structure through the opening 144 . Under such a configuration, the light source module 140 illuminates the image captured by the image capture module 130 without obvious shadows, and the smooth surface does not have strong reflected light, which can avoid shadows or shadows when capturing images. The influence of reflection can reduce the difficulty of image processing.

綜上所述,本揭露的封裝檢測機台的承載台設置有背光模組,用以承載封裝結構的托盤設置於背光模組上,並且,封裝檢測機台的托盤結構包括多個承載單元,且各個承載單元包括用以暴露對應的封裝結構的周緣區域(例如對應於封裝結構的外引腳處)的多個溝槽。如此配置,托盤下方的背光模組所提供的面光源可經由溝槽而透出,因而可進一步照亮封裝結構的至少周緣區域,以提高封裝結構與背景的明暗對比度,以利封裝檢測機台對其影像擷取模組所擷取的影像的判讀,進而可提升封裝檢測機台對影像判讀的正確率。To sum up, the supporting platform of the packaging inspection machine of the present disclosure is provided with a backlight module, and the tray for carrying the packaging structure is arranged on the backlight module, and the tray structure of the packaging inspection machine includes a plurality of carrying units, And each carrying unit includes a plurality of grooves for exposing the peripheral area of the corresponding packaging structure (for example, corresponding to the outer pins of the packaging structure). With such a configuration, the surface light source provided by the backlight module under the tray can penetrate through the groove, thereby further illuminating at least the peripheral area of the package structure, so as to improve the light and dark contrast between the package structure and the background, and to facilitate the package inspection machine. The interpretation of the image captured by its image capture module can further improve the accuracy of the image interpretation of the package inspection machine.

100:封裝檢測機台 110:承載台 112:基座 1121:設置凹槽 114:背光模組 120:托盤 122、122a、122b:承載單元 1221、1221a、1221b:溝槽 1222:開口 1223:長邊 1224:短邊 130:影像擷取模組 140:光源模組 142:光源 144:開口 150:處理器 200:封裝結構 210:封裝膠體 220:外引腳 L1:最大溢膠深度 L2:長度 100: Package inspection machine 110: bearing platform 112: base 1121: set the groove 114:Backlight module 120: tray 122, 122a, 122b: carrying unit 1221, 1221a, 1221b: grooves 1222: opening 1223: long side 1224: short side 130: Image capture module 140:Light source module 142: light source 144: opening 150: Processor 200: package structure 210: Packaging Colloid 220: external pin L1: maximum glue overflow depth L2: Length

圖1是依照本揭露的一實施例的一種封裝檢測機台的示意圖。 圖2是依照本揭露的一實施例的一種封裝檢測機台的托盤的示意圖。 圖3是依照本揭露的一實施例的一種應用於封裝檢測機台的封裝結構的示意圖。 圖4是圖3的封裝結構的局部放大示意圖。 圖5至圖7是依照本揭露的不同實施例的封裝檢測機台的承載單元的示意圖。 圖8是依照本揭露的一實施例的封裝檢測機台的光源模組的示意圖。 FIG. 1 is a schematic diagram of a package inspection machine according to an embodiment of the present disclosure. FIG. 2 is a schematic diagram of a tray of a package inspection machine according to an embodiment of the present disclosure. FIG. 3 is a schematic diagram of a package structure applied to a package inspection machine according to an embodiment of the present disclosure. FIG. 4 is a partially enlarged schematic view of the package structure in FIG. 3 . 5 to 7 are schematic views of the carrying unit of the package inspection machine according to different embodiments of the present disclosure. FIG. 8 is a schematic diagram of a light source module of a package inspection machine according to an embodiment of the present disclosure.

100:封裝檢測機台 100: Package inspection machine

110:承載台 110: bearing platform

112:基座 112: base

1121:設置凹槽 1121: set the groove

114:背光模組 114:Backlight module

120:托盤 120: tray

130:影像擷取模組 130: Image capture module

140:光源模組 140:Light source module

142:光源 142: light source

144:開口 144: opening

150:處理器 150: Processor

Claims (8)

一種封裝檢測機台,包括:一承載台,其包括一基座以及設置於該基座上的一背光模組;一托盤,設置於該背光模組上並包括多個承載單元,其中該多個承載單元分別用以承載多個封裝結構,且各該承載單元包括暴露對應的封裝結構的多個外引腳處的多個溝槽,且各該封裝結構包括一封裝膠體以及由該封裝膠體往外延伸的多個外引腳;一影像擷取模組,設置於該承載台上方並用以擷取至少部分該多個封裝結構的影像;一處理器,耦接該影像擷取模組,並用以判讀該影像擷取模組所擷取的影像;以及一光源模組,設置於該影像擷取模組與該承載台之間。 A package inspection machine platform, comprising: a carrying platform, which includes a base and a backlight module set on the base; a tray, set on the backlight module and including a plurality of carrying units, wherein the multiple Each of the carrying units is used to carry a plurality of packaging structures, and each of the carrying units includes a plurality of grooves exposing a plurality of outer pins of the corresponding packaging structure, and each of the packaging structures includes a packaging compound and the packaging compound. A plurality of external pins extending outward; an image capture module, arranged above the carrying platform and used to capture at least part of the images of the plurality of packaging structures; a processor, coupled to the image capture module, and used to judge the image captured by the image capture module; and a light source module is arranged between the image capture module and the carrying platform. 如請求項1所述的封裝檢測機台,其中各該承載單元更包括一開口,用以暴露對應的封裝結構的一中心區域,該多個溝槽分別環繞該開口的至少相對兩側。 The packaging inspection machine as claimed in claim 1, wherein each of the carrying units further includes an opening for exposing a central area of the corresponding packaging structure, and the grooves respectively surround at least two opposite sides of the opening. 如請求項1所述的封裝檢測機台,其中各該承載單元更包括對應該封裝膠體的一開口,且該多個溝槽對應至少部分的該多個外引腳。 The package inspection machine as claimed in claim 1, wherein each of the carrying units further includes an opening corresponding to the encapsulant, and the plurality of grooves correspond to at least part of the plurality of external leads. 如請求項1所述的封裝檢測機台,其中該影像擷取模組用以擷取該多個外引腳的至少相鄰兩個的影像。 The package inspection machine as claimed in claim 1, wherein the image capture module is used to capture at least two adjacent images of the plurality of external leads. 如請求項1所述的封裝檢測機台,其中該托盤的顏色的一色階與該封裝膠體的顏色的一色階相差20階以上。 The package inspection machine as claimed in Claim 1, wherein a color level of the tray is different from a color level of the encapsulant by more than 20 levels. 如請求項1所述的封裝檢測機台,其中該光源模組包括半球狀擴散光源。 The packaging inspection machine as claimed in claim 1, wherein the light source module includes a hemispherical diffused light source. 如請求項1所述的封裝檢測機台,其中該影像擷取模組的鏡頭包括魚眼鏡頭。 The package inspection machine as claimed in item 1, wherein the lens of the image capture module includes a fisheye lens. 一種封裝檢測機台用之托盤結構,包括:一托盤,用以設置於一背光模組上並包括多個承載單元,其中該多個承載單元分別用以承載多個封裝結構,且各該承載單元包括暴露對應的封裝結構的多個外引腳處的多個溝槽。 A tray structure for a packaging inspection machine, comprising: a tray for being arranged on a backlight module and including a plurality of carrying units, wherein the plurality of carrying units are respectively used to carry a plurality of packaging structures, and each of the carrying units A cell includes a plurality of trenches at a plurality of outer pins exposing a corresponding package structure.
TW111110737A 2022-03-23 2022-03-23 Package inspection apparatus and tray structure thereof TWI810859B (en)

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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103264846B (en) * 2012-11-30 2016-01-20 上海中航光电子有限公司 A kind of wrapping pallet of liquid crystal indicator and packing method
TW201810737A (en) * 2015-10-16 2018-03-16 南韓商首爾偉傲世有限公司 Compact light emitting diode chip

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103264846B (en) * 2012-11-30 2016-01-20 上海中航光电子有限公司 A kind of wrapping pallet of liquid crystal indicator and packing method
TW201810737A (en) * 2015-10-16 2018-03-16 南韓商首爾偉傲世有限公司 Compact light emitting diode chip

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