TWI807749B - Bonding machine with horizontal correction function - Google Patents
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Description
本發明有關於一種具有水平校正功能的鍵合機台,可於使用的過程中量測壓合單元的水平,並即時調整壓合單元的水平。 The invention relates to a bonding machine with a level correction function, which can measure the level of the pressing unit during use and adjust the level of the pressing unit in real time.
積體電路技術的發展已經成熟,且目前電子產品朝向輕薄短小、高性能、高可靠性與智能化的趨勢發展。電子產品中的晶片會對電子產品的性能產生重要影響,其中前述性能部分相關於晶片的厚度。舉例來說,厚度較薄的晶片可以提高散熱效率、增加機械性能、提升電性以及減少封裝的體積及重量。 The development of integrated circuit technology has matured, and the current electronic products are developing towards the trend of light, thin and small, high performance, high reliability and intelligence. The wafer in an electronic product has a significant impact on the performance of the electronic product, where the aforementioned performance is partly related to the thickness of the wafer. For example, thinner chips can improve heat dissipation efficiency, increase mechanical performance, improve electrical performance, and reduce package volume and weight.
於半導體製程中,通常會在晶片的背面(即下表面)進行基板減薄製程、通孔蝕刻製程與背面金屬化製程。然而,在進行基板減薄的過程中,當基板的厚度過薄(例如,低於或等於150微米)時,可能會導致晶圓破片或使晶圓發生彎曲變形,從而使得晶片無法使用並降低晶片良率。 In the semiconductor manufacturing process, the substrate thinning process, via hole etching process and back metallization process are usually performed on the backside (ie, the lower surface) of the wafer. However, during the substrate thinning process, when the thickness of the substrate is too thin (for example, less than or equal to 150 micrometers), the wafer may be broken or warped, thereby making the wafer unusable and reducing the yield of the wafer.
因此,在進行基板減薄製程前會先進行鍵合製程,主要將黏合層設置在晶圓與載體(例如,藍寶石玻璃)之間,並透過壓合單元及載台壓合層疊的晶圓及載體,已完成晶圓及載體的鍵合。完成基板減薄製程後,進行解鍵合製程,以將晶圓與載體分離。 Therefore, before the substrate thinning process, the bonding process is performed first. The adhesive layer is mainly placed between the wafer and the carrier (for example, sapphire glass), and the laminated wafer and carrier are pressed through the pressing unit and the carrier, and the bonding of the wafer and the carrier is completed. After the substrate thinning process is completed, a debonding process is performed to separate the wafer from the carrier.
然而,鍵合機台在鍵合過程中壓合單元及載台之間若未保持水平,則可能會造成壓合單元及載台對晶圓及載體的壓合力度不均勻,導致 基板與載體之間的黏合層具有鍵合氣泡,以及使得鍵合後之晶圓的總厚度變異(TTV)不佳。 However, if the bonding unit and the carrier are not kept level during the bonding process, the bonding force of the bonding unit and the carrier to the wafer and the carrier may be uneven, resulting in The bonding layer between the substrate and the carrier has bonding bubbles and makes the total thickness variation (TTV) of the bonded wafer poor.
為了解決先前技術所面臨的問題,本發明提出一種新穎的具有水平校正功能的鍵合機台,可透過複數個距離量測單元量測壓合單元的水平,並依據量測的結果,即時調整壓合單元的水平。使得壓合單元及載台之間可持續保持水平,並對兩者之間的第一基板及第二基板施加均勻的壓合力度,以避免在第一基板及第二基板之間產生鍵合氣泡。 In order to solve the problems faced by the prior art, the present invention proposes a novel bonding machine with a level calibration function, which can measure the level of the pressing unit through a plurality of distance measuring units, and adjust the level of the pressing unit in real time according to the measurement results. The level between the pressing unit and the stage can be continuously maintained, and a uniform pressing force is applied to the first substrate and the second substrate between them, so as to avoid bonding bubbles between the first substrate and the second substrate.
本發明的一目的,在於提出一種具有水平校正功能的鍵合機台,主要包括一第一腔體、一第二腔體、一壓合單元、一載台、複數個水平調整單元及複數個距離量測單元,其中第一腔體用以連接第二腔體,並於兩者之間形成一密閉空間。 An object of the present invention is to provide a bonding machine with a level correction function, which mainly includes a first cavity, a second cavity, a pressing unit, a carrier, a plurality of level adjustment units and a plurality of distance measurement units, wherein the first cavity is used to connect to the second cavity, and a closed space is formed between the two.
壓合單元連接第一腔體,載台則連接第二腔體。載台的承載面用以承載層疊的第一基板及第二基板,而壓合單元則面對載台。壓合單元可用以相對載台位移,並用以壓合載台上第一基板及第二基板以形成一鍵合基板。 The pressing unit is connected to the first cavity, and the carrier is connected to the second cavity. The carrying surface of the stage is used for carrying the laminated first substrate and the second substrate, and the pressing unit faces the stage. The pressing unit can be used for displacement relative to the stage, and for pressing the first substrate and the second substrate on the stage to form a bonded substrate.
距離量測單元設置在第二腔體,並分別朝壓合單元發射感測光束。距離量測單元的數量可為三個,並用以量測壓合單元上不共線的三個點的距離。透過三個距離量測單元與壓合單元上三個不共線的點的距離差異,可判斷壓合單元的水平。 The distance measuring unit is arranged in the second cavity, and emits sensing light beams towards the pressing unit respectively. There can be three distance measuring units, and they are used to measure the distances of three points on the pressing unit that are not collinear. The level of the pressing unit can be judged by the distance difference between the three distance measuring units and the three non-collinear points on the pressing unit.
水平調整單元穿過第一腔體,其中水平調整單元的一端連接壓合單元,而另一端則位於第一腔體及密閉空間的外部。當壓合單元未維持水 平時,可透過位於密閉空間外的水平調整單元調整壓合單元,以調整壓合單元與載台的承載面的水平。 The level adjustment unit passes through the first cavity, wherein one end of the level adjustment unit is connected to the pressing unit, and the other end is located outside the first cavity and the closed space. When the pressing unit does not maintain water Normally, the pressing unit can be adjusted through the level adjustment unit located outside the confined space, so as to adjust the level of the pressing unit and the carrying surface of the carrier.
具體而言,本發明可透過距離量測單元的量測結果,判斷出壓合單元是否維持水平,並以水平調整單元即時調整壓合單元的水平。在量測及調整壓合單元水平的過程中,第一腔體及第二腔體之間的密閉空間可維持低壓或真空,以提高量測及調整壓合單元水平的準確度, 本發明的一目的,在於提出一種鍵合機台的水平校正方法,於低壓或真空環境下,鬆開連接壓合單元的水平調整單元,使得壓合單元完全貼合載台的承載面。透過三個距離量測單元量測與壓合單元之間的距離,以對三個距離量測單元進行歸零,並將水平調整單元旋緊以固定壓合單元的位置。 Specifically, the present invention can determine whether the pressing unit is maintained horizontally through the measurement result of the distance measuring unit, and adjust the level of the pressing unit in real time with the level adjusting unit. During the process of measuring and adjusting the level of the pressing unit, the closed space between the first cavity and the second cavity can maintain low pressure or vacuum to improve the accuracy of measuring and adjusting the level of the pressing unit. An object of the present invention is to provide a leveling method for a bonding machine platform, in which the leveling unit connected to the bonding unit is loosened in a low pressure or vacuum environment, so that the bonding unit is completely attached to the bearing surface of the carrier. The distance between the pressing unit and the pressing unit is measured through the three distance measuring units to reset the three distance measuring units to zero, and the horizontal adjustment unit is tightened to fix the position of the pressing unit.
而後三個距離量測單元可定時量測與壓合單元之間的距離,並透過量測的距離差異判斷壓合單元是否維持水平。若判斷壓合單元不水平,可再次鬆開連接壓合單元的水平調整單元,其中壓合單元會完全貼合載台的承載面,使得壓合單元水平載台的承載面。 Then the three distance measuring units can regularly measure the distance between the pressing unit and judge whether the pressing unit maintains a level through the measured distance difference. If it is judged that the pressing unit is not level, the level adjustment unit connected to the pressing unit can be released again, wherein the pressing unit will completely fit the bearing surface of the carrier, so that the pressing unit is horizontal to the bearing surface of the carrier.
透過本發明所述的水平校正方法,可於進行鍵合的過程中,持續量測壓合單元是否維持水平。當壓合單元不水平時,可透過水平調整單元即時調整,可有效防止第一基板及第二基板之間產生鍵合氣泡。 Through the level calibration method described in the present invention, it is possible to continuously measure whether the pressing unit maintains the level during the bonding process. When the pressing unit is not level, it can be adjusted in real time through the level adjustment unit, which can effectively prevent bonding air bubbles between the first substrate and the second substrate.
為了達到上述的目的,本發明提出一種具有水平校正功能的鍵合機台,包括:一第一腔體;一第二腔體,面對第一腔體,其中第一腔體用以連接第二腔體,並於第一腔體及第二腔體之間形成一密閉空間;一壓合單元,連接第一腔體;一載台,連接第二腔體,並包括一承載面朝向壓合 單元,其中承載面用以承載層疊的一第一基板及一第二基板;複數個水平調整單元,設置在第一腔體上,並包括一調整桿,其中調整桿穿過第一腔體,並連接壓合單元,而部分的調整桿位於密閉空間外部,並在第一腔體上形成一調整部;及複數個距離量測單元,設置在第二腔體上,並用以將一感測光束投射至壓合單元,以量測壓合單元與複數個距離量測單元之間的距離。 In order to achieve the above object, the present invention proposes a bonding machine with a level correction function, comprising: a first cavity; a second cavity facing the first cavity, wherein the first cavity is used to connect the second cavity and form a closed space between the first cavity and the second cavity; a pressing unit is connected to the first cavity; a carrier is connected to the second cavity and includes a bearing surface facing the bonding A unit, wherein the supporting surface is used to carry a stacked first substrate and a second substrate; a plurality of horizontal adjustment units are arranged on the first cavity, and include an adjustment rod, wherein the adjustment rod passes through the first cavity and is connected to the pressing unit, and part of the adjustment rod is located outside the closed space, and forms an adjustment part on the first cavity; distance.
本發明提出一種具有水平校正功能的鍵合機台的水平校正方法,包括:第一腔體連接第二腔體,並於第一腔體及第二腔體之間形成密閉空間;抽出密閉空間內的氣體,使得密閉空間為一低壓狀態或一真空狀態;鬆開複數個水平調整單元,使得壓合單元貼合載台的承載面;複數個距離量測單元量測與壓合單元之間的距離,並進行歸零;旋緊複數個水平調整單元,並固定壓合單元的位置;及複數個距離量測單元量測與壓合單元的距離,並確認壓合單元是否維持水平。 The present invention proposes a level calibration method for a bonding machine with a level calibration function, comprising: the first cavity is connected to the second cavity, and an airtight space is formed between the first cavity and the second cavity; the gas in the airtight space is drawn out, so that the airtight space is in a low-pressure state or a vacuum state; a plurality of level adjustment units are released, so that the pressing unit fits the bearing surface of the carrier; a plurality of distance measuring units measure the distance between the pressing unit and reset to zero; tighten the plurality of level adjustment units, and fix the pressing unit position; and a plurality of distance measuring units measure the distance from the pressing unit, and confirm whether the pressing unit is maintained horizontally.
所述的具有水平校正功能的鍵合機台,其中水平調整單元包括一吊掛桿,吊掛桿連接壓合單元。 In the bonding machine table with level correction function, the level adjustment unit includes a hanging rod connected to the pressing unit.
所述的具有水平校正功能的鍵合機台,其中水平調整單元包括一殼體,連接並固定在第一腔體上,而調整桿及吊掛桿則穿過殼體及第一腔體,並連接壓合單元,其中調整桿及吊掛桿分別經由一軸封單元連接殼體。 Said bonding machine with level correction function, wherein the level adjustment unit includes a housing, which is connected and fixed on the first cavity, while the adjustment rod and the suspension rod pass through the housing and the first cavity, and are connected to the pressing unit, wherein the adjustment rod and the suspension rod are respectively connected to the housing through a shaft seal unit.
所述的具有水平校正功能的鍵合機台,其中調整桿包括一連接部、一第一彈性部及一第一套筒,連接部的一端連接壓合單元,而連接部的另一端則經由第一彈性部連接調整部,其中第一套筒套設在第一彈性部的外部,第一套筒的一端連接壓合單元。 In the bonding machine with level correction function, the adjustment lever includes a connecting part, a first elastic part and a first sleeve, one end of the connecting part is connected to the pressing unit, and the other end of the connecting part is connected to the adjusting part via the first elastic part, wherein the first sleeve is set outside the first elastic part, and one end of the first sleeve is connected to the pressing unit.
所述的具有水平校正功能的鍵合機台,其中距離量測單元為一雷射測距儀。 Said bonding machine with level correction function, wherein the distance measurement unit is a laser range finder.
所述的具有水平校正功能的鍵合機台,其中距離量測單元的數量為三個或三個以上。 In the bonding machine with horizontal correction function, the number of distance measuring units is three or more.
所述的具有水平校正功能的鍵合機台,包括一壓合單元驅動器連接壓合單元,用以驅動壓合單元靠近或遠離載台,並以壓合單元壓合載台承載的第一基板及第二基板。 The bonding machine with horizontal correction function includes a pressing unit driver connected to the pressing unit, used to drive the pressing unit to approach or move away from the carrier, and use the pressing unit to press the first substrate and the second substrate carried by the carrier.
所述的具有水平校正功能的鍵合機台,其中複數個距離量測單元位於載台的周圍。 In the bonding machine table with horizontal correction function, a plurality of distance measuring units are located around the carrier.
所述的具有水平校正功能的鍵合機台,其中壓合單元包括複數個反射部對應複數個距離量測單元,複數個距離量測單元分別將感測光束投射到複數個反射部。 In the bonding machine with horizontal correction function, the bonding unit includes a plurality of reflective parts corresponding to a plurality of distance measurement units, and the plurality of distance measurement units respectively project sensing beams to the plurality of reflective parts.
10:具有水平校正功能的鍵合機台 10: Bonding machine with horizontal correction function
111:第一腔體 111: the first cavity
112:密閉空間 112: confined space
113:第二腔體 113: Second cavity
121:第一基板 121: The first substrate
123:第二基板 123: Second substrate
13:壓合單元 13: Lamination unit
131:壓合板 131:Plywood
133:連接板 133: Connection board
135:固定桿體 135: fixed rod body
137:反射部 137: Reflection Department
14:對準單元 14: Alignment unit
15:載台 15: Carrier
151:承載面 151: bearing surface
16:抽氣馬達 16: Air extraction motor
17:水平調整單元 17: Horizontal adjustment unit
171:調整桿 171: Adjustment lever
1711:調整部 1711: Adjustment Department
1713:第一彈性部 1713: First elastic part
1715:連接部 1715: connection part
1717:第一套筒 1717: First sleeve
172:軸封單元 172: Shaft seal unit
173:吊掛桿 173: hanging rod
1731:固定端 1731: fixed end
1733:第二彈性部 1733: Second elastic part
1735:連接端 1735: connection end
1737:第二套筒 1737: Second sleeve
175:殼體 175: Shell
1761:第一固定單元 1761: First fixed unit
1763:第二固定單元 1763: Second fixed unit
18:距離量測單元 18: Distance measurement unit
181:處理器 181: Processor
191:腔體驅動器 191: cavity driver
193:壓合單元驅動器 193:Pressing unit driver
L1:感測光束 L1: Sensing beam
[圖1]為本發明具有水平校正功能的鍵合機台一實施例的立體示意圖。 [ FIG. 1 ] is a three-dimensional schematic view of an embodiment of a bonding machine with a horizontal correction function according to the present invention.
[圖2]為本發明具有水平校正功能的鍵合機台一實施例的剖面示意圖。 [ FIG. 2 ] is a schematic cross-sectional view of an embodiment of a bonding machine with a horizontal correction function according to the present invention.
[圖3]為本發明具有水平校正功能的鍵合機台一實施例的部分剖面示意圖。 [ FIG. 3 ] is a schematic partial cross-sectional view of an embodiment of a bonding machine with a horizontal correction function according to the present invention.
[圖4]為本發明具有水平校正功能的鍵合機台的載台及距離量測單元一實施例的俯視圖。 [ FIG. 4 ] is a top view of an embodiment of a stage and a distance measuring unit of a bonding machine with a horizontal correction function according to the present invention.
[圖5]為本發明具有水平校正功能的鍵合機台的壓合單元一實施例的立體示意圖。 [ FIG. 5 ] is a three-dimensional schematic view of an embodiment of a bonding unit of a bonding machine with a horizontal correction function according to the present invention.
[圖6]為本發明鍵合機台的水平校正方法一實施例的步驟流程圖。 [ FIG. 6 ] is a flow chart of the steps of an embodiment of the level calibration method of the bonding machine of the present invention.
請參閱圖1及圖2,分別為本發明具有水平校正功能的鍵合機台一實施例的立體示意圖及剖面示意圖。如圖所示,具有水平校正功能的鍵合機台10包括一第一腔體111、一第二腔體113、一壓合單元13、一載台15、複數個水平調整單元17及複數個距離量測單元18,其中第一腔體111面對第二腔體113,且第一腔體111可相對於第二腔體113位移。
Please refer to FIG. 1 and FIG. 2 , which are respectively a schematic perspective view and a schematic cross-sectional view of an embodiment of a bonding machine with a horizontal correction function according to the present invention. As shown in the figure, the
如圖2所示,壓合單元13位於第一腔體111內,並且連接第一腔體111。載台15則位於第二腔體113內,並且連接第二腔體113。載台15的承載面151朝向壓合單元13。第一腔體111連接第二腔體113後,會在兩者之間形成一密閉空間112,而壓合單元13及載台15則位於密閉空間112內。
As shown in FIG. 2 , the
如圖1所示,在本發明一實施例中,第一腔體111可連接一腔體驅動器191,其中腔體驅動器191位於密閉空間112外部,並連接第一腔體111。腔體驅動器191用以驅動第一腔體111相對於第二腔體113位移,例如腔體驅動器191可以是線性致動件。
As shown in FIG. 1 , in an embodiment of the present invention, the
如圖3所示,第一腔體111或第二腔體113可設置一抽氣馬達16,其中抽氣馬達16流體連接密閉空間112,並用以抽出密閉空間112內的氣體,以降低密閉空間112內的壓力,使得密閉空間112維持真空或低壓狀態。
As shown in FIG. 3 , the
載台15的承載面151用以承載層疊的一第一基板121及一第二基板123,例如第一基板121為承載基板,而第二基板123為晶圓,其中第一基
板121及第二基板123之間具有一黏合層,以黏合第一基板121及第二基板123。
The carrying
如圖1所示,壓合單元驅動器193位於密閉空間112外部,並連接壓合單元13,例如壓合單元驅動器193可以是線性致動件。在完成第一基板121及第二基板123對位後,壓合單元驅動器193可驅動壓合單元13朝載台15的承載面151靠近,並壓合載台15承載的第一基板121及第二基板123,以完成第一基板121及第二基板123的鍵合。
As shown in FIG. 1 , the
如圖3所示,壓合單元13包括一壓合板131、一連接板133及複數個固定桿體135,其中連接板133透過固定桿體135連接壓合板131。壓合板131朝向載台15的承載面151,並用以壓合放置在載台15上的第一基板121及第二基板123。壓合單元13包括壓合板131、連接板133及固定桿體135僅為本發明一實施例,並非本發明權利範圍的限制。
As shown in FIG. 3 , the
複數個水平調整單元17設置於第一腔體111上,其中水平調整單元17穿過第一腔體111,並連接密閉空間112內的壓合單元13。水平調整單元17包括一調整桿171,其中調整桿171穿過第一腔體111,並連接壓合單元13。
A plurality of
調整桿171可包括一調整部1711及一連接部1715,其中部分的調整桿171設置在第一腔體111並且位於密閉空間112外外部而在第一腔體111上形成該調整部1711,而調整桿171位於密閉空間112內的部分形成該連接部1715,並用以連接壓合單元13。例如壓合單元13的連接板133朝向第一腔體111的表面可設置複數個螺孔,而連接部1715則包括一螺桿,並螺鎖在壓合單元13的螺孔內。當使用者轉動外露的調整桿171時,連接部1715亦會相
對於壓合單元13轉動,並改變進入螺孔的連接部1715的長度,以調整壓合單元13的水平高度。
The adjusting
在本發明一實施例中,調整桿171可包括一第一彈性部1713,其中連接部1715經由第一彈性部1713連接調整部1711,例如第一彈性部1713可為彈簧。當進入螺孔的連接部1715的長度增加時,壓合單元13會向上或朝第一腔體111的方向位移,並壓縮第一彈性部1713。當進入螺孔的連接部1715的長度減少時,壓合單元13會向下或朝遠離第一腔體111的方向位移,使得第一彈性部1713伸長。此外,第一彈性部1713的外部可套設一第一套筒1717,其中第一套筒1717的一端連接或固定在壓合單元13上,並隨著壓合單元13向下或向上位移。
In an embodiment of the present invention, the
在本發明另一實施例中,水平調整單元17可包括一吊掛桿173,其中吊掛桿173穿過第一腔體111,並連接壓合單元13。吊掛桿173的結構與調整桿171相似,並包括一固定端1731及一連接端1735,其中固定端1731為設置在第一腔體111及密閉空間112外的吊掛桿173,而連接端1735則位於密閉空間112內,並用以連接壓合單元13。此外可進一步在固定端1731及連接端1735之間設置一第二彈性部1733,並可在第二彈性部1733的外部套設一第二套筒1737,其中第二套筒1737的一端連接或固定在壓合單元13上。
In another embodiment of the present invention, the
當使用者透過調整桿171調整壓合單元13的水平時,吊掛桿173的第二彈性部1733亦會被壓縮或伸長,而第二套筒1737亦會隨著壓合單元13向下或向上位移。此外在本發明一實施例中,吊掛桿173的連接端1735可固定在壓合單元13上,使得吊掛桿173不會相對於壓合單元13轉動。在不同實施例中,吊掛桿173亦可被設計為可相對於壓合單元13轉動。
When the user adjusts the level of the
此外,水平調整單元17可包括一殼體175,連接並固定在第一腔體111上,而調整桿171及/或吊掛桿173則穿過殼體175及第一腔體111,固定在殼體175上,並連接壓合單元13。例如調整桿171及/或吊掛桿173可經由一軸封單元172及/或至少一軸承連接殼體175,使得調整桿171及/或吊掛桿173可相對於殼體175及第一腔體111轉動,並維持密閉空間112內的低壓或真空狀態。
In addition, the
具體而言,調整桿171的調整部1711及吊掛桿173的固定端1731,可分別經由一第一固定單元1761及一第二固定單元1763固定在殼體175上,使得調整桿171及/或吊掛桿173不會相對於殼體175及/或第一腔體111轉動,並固定壓合單元13的高度及水平,例如第一及第二固定單元1761/1763可以是螺帽。
Specifically, the adjusting
如圖2及圖3所示,複數個距離量測單元18設置在第二腔體113上,並朝向壓合單元13。各個距離量測單元18分別將一感測光束L1投射至壓合單元13,以量測壓合單元13與各個距離量測單元18之間的距離。
As shown in FIG. 2 and FIG. 3 , a plurality of
本發明所述的距離量測單元18可以是雷射測距儀,並以高精度的雷射測距儀為較佳,例如距離量測單元18可以是使用三角量測原理的雷射測距儀。
The
如圖4所示,本發明所述的距離量測單元18的數量可以是三個或三個以上,並設置在載台15的周圍。為了說明時的便利性,在本發明實施例中以三個距離量測單元18進行說明,在實際應用時距離量測單元18的數量亦可以大於三個。本發明的三個距離量測單元18不設置在同一直線上,
並分別將感測光束L1投射在壓合單元13或壓合板131的三個不共線的量測點上。
As shown in FIG. 4 , the number of
此外,在本發明一實施例中,可於載台15的承載面151上設置複數個對準單元14,其中複數個對準單元14可靠近或遠離載台15上的第一基板121及第二基板123,使得第二基板123對準第一基板121。
In addition, in an embodiment of the present invention, a plurality of
在本發明一實施例中,三個距離量測單元18以等距的方式設置在載台15的周圍。三個距離量測單元18以等距的方式設置僅為本發明一實施例,在不同實施例中三個距離量測單元18也可以不等距的方式設置在載台15的周圍。
In an embodiment of the present invention, three
如圖2、圖3及圖5所示,壓合單元13上可設置複數個反射部137,例如三個反射部137設置在壓合板131的周圍,並沿著壓合板131的徑向凸出。三個反射部137不會設置在同一直線上,並分別對應三個距離量測單元18,使得各個距離量測單元18可分別將感測光束L1投射至各個反射部137。
As shown in FIG. 2 , FIG. 3 and FIG. 5 , a plurality of reflecting
具體而言,三個距離量測單元18可分別量測與壓合板131上三個反射部137或三個量測點之間的距離。例如量測出壓合單元13與三個距離量測單元18之間的距離為第一距離、第二距離及第三距離,若第一距離、第二距離及第三距離相等,表示壓合單元13為水平。
Specifically, the three
反射部137並非本發明的必要構件,在實際應用時三個距離量測單元18可直接將感測光束L1投射在壓合板131的三個不共線的量測點上。
The
當第一距離、第二距離及/或第三距離之間的差大於一門檻值時,表示壓合單元13不水平,並可能導致壓合單元13及載台15對第一基板
121及第二基板123的壓合力度不均勻,造成第一基板121及第二基板123之間的黏合層具有鍵合氣泡。
When the difference between the first distance, the second distance and/or the third distance is greater than a threshold value, it means that the
在本發明一實施例中,複數個距離量測單元18可電性連接一處理器181或一電腦。處理器181用以接收各個距離量測單元18所量測的距離,並計算各個距離之間的差值是否大於門檻值。當任兩個距離的差值大於門檻值,處理器181可控制一警示單元發出警示訊號,例如警示單元可以是喇叭或發光二極體,並用以產生聲音或燈光,以提醒使用者調整壓合單元13及載台15之間的水平。
In an embodiment of the present invention, the plurality of
如圖6所示,為應用本發明實施例所述的具有水平校正功能的鍵合機台10的水平校正方法,請配合參閱圖1至圖5,首先透過腔體驅動器191驅動第一腔體111朝第二腔體113靠近,使得第一腔體111連接第二腔體113,並於第一腔體111及第二腔體113之間形成密閉空間112,步驟21所示。
As shown in FIG. 6, in order to apply the horizontal calibration method of the
透過抽氣馬達16抽出密閉空間112內的氣體,使得密閉空間112為一低壓狀態或一真空狀態,如步驟22所示。
The air in the
透過壓合單元驅動器193驅動壓合單元13朝載台15的方向靠近,並使得壓合單元13的壓合板131接觸載台15的承載面151。而後鬆開水平調整單元17,例如鬆開第一固定單元1761及第二固定單元1763,使得壓合板131完全貼合載台15的承載面151,如步驟23所示。
The
在進行本發明實施例所述的水平校正方法時,載台15的承載面151上未放置基板。因此將連接壓合單元13的水平調整單元17鬆開之後,壓合單元13的壓合板131會完全貼合載台15的承載面151,使得壓合板131與載
台15的承載面151為水平,例如壓合板131的壓合面平行載台15的承載面151。
When performing the horizontal calibration method described in the embodiment of the present invention, no substrate is placed on the carrying
此外密閉空間112維持真空或低壓的狀態下,可避免在壓合板131及載台15的承載面151之間存在其他的物質或微粒,可進一步確保壓合單元13完全貼合載台15的承載面151,並提高壓合單元13水平校正的精準度。
In addition, when the
複數個距離量測單元18量測與壓合單元13之間的距離,並進行歸零,如步驟24所示。例如當壓合單元13完全貼合載台15的承載面151時,將複數個距離量測單元18所量測的壓合單元13的距離定義為零,以完成各個距離量測單元18的歸零校正。
A plurality of
在完成複數個距離量測單元18的歸零後,可將水平調整單元17旋緊,以固定壓合單元13的位置,如步驟25所示。在實際應用時,步驟24及步驟25的順序可以交換,例如先固定壓合單元13,之後再進行距離量測單元18的歸零步驟。
After completing the zeroing of the plurality of
完成步驟25之後,便已經完成壓合單元13及載台15之間的水平調整及校正。可將第一基板121及第二基板123層疊放置在載台15的承載面151上,並透過壓合單元13壓合第一基板121及第二基板123,以進行第一基板121及第二基板123的鍵合。
After
具體而言,壓合單元13可遠離載台15,並上升至預備鍵合的位置。而後複數個距離量測單元18可再次量測與壓合單元13之間的距離,並確保水平調整單元17已確實固定壓合單元13,使得壓合單元13不會因為上下位移而無法維持水平或晃動。在確定壓合單元13已被水平調整單元17固
定後,便可將第一基板121及第二基板123放置在壓合單元13及載台15之間並進行鍵合。
Specifically, the
在使用具有水平校正功能的鍵合機台10進行鍵合的過程中,複數個距離量測單元18會量測與壓合單元13的壓合板131之間的距離,並由量測的結果確認壓合單元13與載台15之間是否維持水平,如步驟26所示。
During the bonding process using the
在實際應用時,複數個距離量測單元18可持續量測與壓合單元13之間的距離,亦可於一固定時間周期內量測與壓合單元13之間的距離。
In practical applications, the plurality of
當各個距離量測單元18中的任意兩個所量測的距離之間的差異大於門檻值,便表示壓合單元13未與載台15維持水平,並需要調整壓合單元13的水平,例如重複步驟21至步驟25。
When the difference between the distances measured by any two of the
以上所述者,僅為本發明之一較佳實施例而已,並非用來限定本發明實施之範圍,即凡依本發明申請專利範圍所述之形狀、構造、特徵及精神所為之均等變化與修飾,均應包括於本發明之申請專利範圍內。 What is described above is only one of the preferred embodiments of the present invention, and is not used to limit the scope of the present invention. That is, all equal changes and modifications made according to the shape, structure, characteristics and spirit described in the scope of the patent application of the present invention should be included in the scope of the patent application of the present invention.
10:具有水平校正功能的鍵合機台 10: Bonding machine with horizontal correction function
111:第一腔體 111: the first cavity
112:密閉空間 112: confined space
113:第二腔體 113: Second cavity
13:壓合單元 13: Lamination unit
137:反射部 137: Reflection Department
15:載台 15: Carrier
17:水平調整單元 17: Horizontal adjustment unit
18:距離量測單元 18: Distance measurement unit
L1:感測光束 L1: Sensing beam
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TWM623576U (en) * | 2021-09-07 | 2022-02-21 | 捷創科技股份有限公司 | Semiconductor testing device capable of detecting bonding state |
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