TWI807177B - Load port - Google Patents

Load port Download PDF

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Publication number
TWI807177B
TWI807177B TW109108769A TW109108769A TWI807177B TW I807177 B TWI807177 B TW I807177B TW 109108769 A TW109108769 A TW 109108769A TW 109108769 A TW109108769 A TW 109108769A TW I807177 B TWI807177 B TW I807177B
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Taiwan
Prior art keywords
pin
plate
port
container
docking
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TW109108769A
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Chinese (zh)
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TW202039345A (en
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加加見欣也
松田清二
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日商平田機工股份有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67772Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving removal of lid, door, cover
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67259Position monitoring, e.g. misposition detection or presence detection
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67766Mechanical parts of transfer devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67775Docking arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67778Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Robotics (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Glass Compositions (AREA)
  • Paper (AREA)
  • Exchange Systems With Centralized Control (AREA)

Abstract

A load port includes a first pin projecting on a dock plate and provided on the dock plate so as to be pushed down, and a first detection unit provided on the base portion and configured to detect that the dock plate is located at a first position. The first detection unit includes a movable member capable of displacing in a moving direction of the dock plate, and a first sensor configured to detect the displacement of the movable member. The movable member is arranged at a position to abut against the first pin that is in a pushed down state in a process in which the dock plate moves from a second position to the first position.

Description

裝載埠load port

本發明關於一種裝載埠。 The present invention relates to a loading port.

已知一種像是FOUP的容器,其儲存像是半導體晶圓的基板。這樣的容器在被設置於處理設施中的裝載埠中被打開/關閉,以放入或取出容器中的基板。裝載埠設置有其上放置有容器的對接板(dock plate)、以及被構造來移動對接板的機構。將其上放置有容器的對接板移動到預定位置,從而打開/關閉容器。 A container such as a FOUP is known which stores substrates such as semiconductor wafers. Such containers are opened/closed in a load port provided in a processing facility to put in or take out substrates in the container. The loadport is provided with a dock plate on which the container is placed, and a mechanism configured to move the dock plate. The docking plate on which the container is placed is moved to a predetermined position, thereby opening/closing the container.

裝載埠被連接並附接到基板輸送設備,基板輸送設備包括被構造成輸送基板的基板輸送機器人。裝載埠包括在基板輸送設備的工作空間與外部之間分隔的埠 板。形成在埠板中的開口部分可藉由埠門而自由地被打開/關閉。如果在FOUP未與埠板的開口部分對接的狀態下意外地打開開口部分,則工作空間暴露於外部。在這種情況下,在埠門的移動期間,異物可能不期望地被捕捉在埠板和埠門之間。還需要避免基板輸送機器人的一部分在其操作時從開口部分突出。 The loadport is connected and attached to a substrate transfer apparatus including a substrate transfer robot configured to transfer a substrate. The load port includes a port separated between the workspace of the substrate handling equipment and the outside plate. The opening portion formed in the port plate can be freely opened/closed by the port door. If the opening portion is accidentally opened in a state where the FOUP is not butted against the opening portion of the port plate, the work space is exposed to the outside. In this case, foreign objects may be undesirably caught between the port plate and the port door during movement of the port door. It is also necessary to prevent a part of the substrate transfer robot from protruding from the opening portion while it is operating.

日本專利公開第2002-110756號揭露了一種裝載埠,在此裝載埠中採用雙重結構,雙重結構包括被構造成打開/關閉埠板的開口部分的門、以及另一個門,且防止這些門同時地打開。此外,日本專利第3954714號揭露了一種裝載埠,其在檢測到匣(cassette)被放置在裝載埠上的條件下打開埠板的開口部分。 Japanese Patent Laid-Open No. 2002-110756 discloses a loading port in which a double structure including a door configured to open/close an opening portion of a port plate and another door is employed and the doors are prevented from being simultaneously opened. Furthermore, Japanese Patent No. 3954714 discloses a loading port that opens an opening portion of a port plate under the condition of detecting that a cassette is placed on the loading port.

因此,有必要可靠地防止裝載埠和基板輸送機器人(基板輸送設備)的意外驅動,以確保周邊(periphery)的安全性。為了確保周邊的安全性,考慮使用一種方法,在此方法中,藉由複數個感測器來檢測裝載埠的各個部分的狀態,且僅在檢測結果滿足預定條件的情況下,才允許驅動埠門和基板輸送機器人。然而,感測器數量的增加導致成本的增加。 Therefore, it is necessary to reliably prevent accidental driving of the load port and the substrate transfer robot (substrate transfer device) to ensure the safety of the perimeter. In order to ensure the safety of the perimeter, a method is considered in which the status of various parts of the load port is detected by a plurality of sensors, and the port door and the substrate transfer robot are allowed to be driven only if the detection results satisfy predetermined conditions. However, an increase in the number of sensors leads to an increase in cost.

本發明的目的是提供一種裝載埠,其包括被構造成檢測容器存在於對接板上且對接板被定位在對接位置的機構。 It is an object of the present invention to provide a loadport comprising a mechanism configured to detect the presence of a container on a docking plate and that the docking plate is positioned in a docking position.

根據本發明的一個面向,提供了一種裝載埠,其包括:埠板,包括開口部分,通過開口部分能夠放入和取出基板;放置台,儲存基板的容器被放置在放置台上;埠門,能夠打開/關閉開口部分並保持容器的門部分;以及驅動機構,構造成執行埠門的打開/關閉操作,其中,放置台包括:基部部分;對接板,容器被放置在對接板上;移動機構,被設置在基部部分上,且被構造成支撐對接板並使對接板在第一位置和第二位置之間移動,第一位置靠近埠板之埠門可保持門部分的側部,第二位置遠離埠板;第一銷,其在對接板上突出並設置在對接板上,以便被向下推動;及第一檢測單元,被設置基部部分上且構造成檢測對接板被定位在第一位置,第一檢測單元包括:可動構件,能夠在對接板藉由移動機構移動的移動方向上相對於基部部分位移;及第一感測器,其被構造成檢測可動構件的位移,且在對接板從第二位置移動到第一位 置的過程中,可動構件被佈置在抵靠於處於被向下推動狀態之第一銷的位置處。 According to an aspect of the present invention, there is provided a loading port, which includes: a port plate including an opening portion through which substrates can be put in and out; a placement table on which containers storing substrates are placed; a port door capable of opening/closing the opening portion and a door portion holding the container; and a driving mechanism configured to perform opening/closing operations of the port door, wherein the placement table includes: a base portion; The board moves between a first position close to the port door of the port plate to hold the side of the door portion and a second position away from the port plate; a first pin protruding over the butt plate and provided on the butt plate so as to be pushed downward; and a first detection unit provided on the base portion and configured to detect that the butt plate is positioned at the first position, the first detection unit includes: a movable member displaceable relative to the base portion in a moving direction in which the butt plate is moved by the moving mechanism; and a first sensor configured to detect displacement of the movable member , and the docking plate moves from the second position to the first position During the positioning process, the movable member is arranged at a position abutting against the first pin in the pushed-down state.

根據本發明的另一個面向,提供了一種裝載埠,其包括:埠板,包括開口部分,通過開口部分能夠取出和放入基板;放置台,儲存基板的容器被放置在放置台上;埠門,能夠打開/關閉開口部分並保持容器的門部分;以及驅動機構,其構造成執行埠門的打開/關閉操作,其中,放置台包括:基部部分;對接板,容器被放置在對接板上;移動機構,被設置在基部部分上,且被構造成支撐對接板並使對接板在第一位置和第二位置之間移動,第一位置靠近埠板之埠門可保持門部分的一側部,第二位置遠離埠板;第一銷,在對接板上突出且被設置在對接板上,以便被向下推動;及第一檢測單元,被設置在基部部分上且被構造成檢測對接板被定位在第一位置,且第一檢測單元包括非接觸式感測器,其在對接板從第二位置移動到第一位置的過程中檢測處於被向下推動狀態的第一銷。 According to another aspect of the present invention, there is provided a loading port, which includes: a port plate including an opening portion through which substrates can be taken out and put in; a placement table on which containers storing substrates are placed; a port door capable of opening/closing the opening portion and a door portion holding the containers; and a driving mechanism configured to perform opening/closing operations of the port door, wherein the placement table includes: a base portion; The butt plate moves between a first position close to the port door of the port plate to hold a side portion of the door portion and a second position away from the port plate; a first pin protruding from the butt plate and provided on the butt plate so as to be pushed down; and a first detection unit disposed on the base portion and configured to detect that the butt plate is positioned at the first position, and the first detection unit includes a non-contact sensor that detects the first pin in a pushed down state during movement of the butt plate from the second position to the first position.

從例示性實施例的以下描述(參照所附圖式),本發明的更多特徵將變得清楚明瞭。 Further features of the invention will become apparent from the following description of exemplary embodiments, with reference to the accompanying drawings.

1:裝載埠 1: Load port

1a:控制單元 1a: Control unit

1b:通信線路 1b: Communication line

1c:感測器組 1c: Sensor group

2:埠板 2: port board

2a:開口部分 2a: Opening part

3:放置台 3: place table

4:支撐部分 4: Support part

5:容器 5: container

6:基板輸送機器人 6: Substrate delivery robot

7:基部部分 7: Base part

8:移動機構 8: Mobile mechanism

9:第一檢測單元 9: The first detection unit

9a:托架 9a: Bracket

10:第二檢測單元 10: Second detection unit

10a:第二感測器 10a: Second sensor

11:第三檢測單元 11: The third detection unit

11a:第三感測器 11a: The third sensor

12:感測器 12: Sensor

12a:柱塞 12a: plunger

13:檢測單元 13: Detection unit

13a:檢測目標 13a: Detect target

14:檢測單元 14: Detection unit

14a:發光元件 14a: Light emitting element

14b:光接收元件 14b: Light receiving element

30:對接板 30: Butt plate

31:定位銷 31: Locating pin

32a:止動件 32a: stopper

32F:第二銷 32F: Second pin

32L:第三銷 32L: The third pin

32R:第一銷 32R: first pin

33:操作面板 33: Operation panel

34:驅動機構 34: Driving mechanism

35:支撐部分 35: Support part

35a:內部空間 35a: Internal space

35b:彈性構件 35b: Elastic member

36:凹部部分 36: Concave part

37:板片彈簧 37: Plate spring

37a:感測器觸件 37a: Sensor contacts

38:螺栓 38: Bolt

40:驅動機構 40: Driving mechanism

41:埠門 41: port gate

42:連接構件 42: Connecting components

43:台構件 43: Taiwan component

44:致動器 44: Actuator

45:滾珠螺桿軸 45: Ball screw shaft

47:馬達 47: motor

48:滾珠螺母 48: Ball nut

50:容器主體 50: container body

50a:開口部分 50a: opening part

51:蓋 51: cover

60:端接器 60: terminator

61:鉸接臂 61: Articulated arm

62:驅動單元 62: Drive unit

80:導軌構件 80: rail components

81:滑動件 81: Slider

81a:接合構件 81a: Joining member

81b:立柱 81b: column

81c:連接部分 81c: Connection part

82:驅動機構 82: Driving mechanism

90:第一感測器 90:First sensor

90a:輸入軸 90a: input shaft

91:可動構件 91: Movable components

91a:輥部分 91a: roller part

820:驅動單元 820: drive unit

820a:馬達 820a: motor

820b:輸出軸 820b: output shaft

821:臂構件 821: arm member

822:凸輪從動件 822: Cam follower

823:凸輪板 823: Cam plate

823a:接合構件 823a: Joining member

823b:凸輪槽 823b: Cam groove

823c:連接部分 823c: connection part

824:桿件 824: Rod

825:止動件 825: stopper

826:彈性構件 826: elastic member

H1:附接孔 H1: Attachment hole

H2:附接孔 H2: Attachment hole

L1:下端位置 L1: Lower position

L2:光的軌道 L2: Orbit of light

PA:基板輸送設備 PA: substrate conveying equipment

PP:側部 PP: side

S:工作空間 S: workspace

ST1:狀態 ST1: state

ST2:狀態 ST2: state

ST11:狀態 ST11: Status

ST12:狀態 ST12: Status

ST21:狀態 ST21: Status

ST22:狀態 ST22: Status

S1~S9:步驟 S1~S9: steps

W:基板 W: Substrate

Y1:旋轉中心線 Y1: Centerline of rotation

θ1:傾斜角度 θ1: tilt angle

θ2:傾斜角度 θ2: tilt angle

θ3:傾斜角度 θ3: tilt angle

θ4:傾斜角度 θ4: tilt angle

[圖1]是顯示根據本發明的實施例之裝載埠的外觀的視圖;[圖2]是顯示圖1所示的裝載埠之內部機構和使用範例的視圖;[圖3A]及[圖3B]是顯示對接板的位移模式的視圖;[圖4]是對接板上的銷佈置的說明性視圖;[圖5]是對接板的移動機構等的說明性視圖;[圖6]是對接板的移動機構等的說明性視圖;[圖7A]是檢測單元的說明性視圖;[圖7B]是沿圖7A中的線A-A所截取之截面圖;[圖7C]是檢測單元的操作的說明性視圖;[圖8A]是檢測單元的透視圖;[圖8B]是銷支撐部分的截面圖;[圖9A]至[圖9D]是圖8A所示的檢測單元的操 作的說明性視圖;[圖10A]及[圖10B]是顯示控制單元的處理範例的流程圖;[圖11A]至[圖11D]是另一個使用範例中的之圖8A所示的檢測單元的操作的說明性視圖;[圖12A]至[圖12D]是另一個範例的檢測單元的操作的說明性視圖;[圖13]是顯示容器被放置為傾斜狀態的範例的視圖;[圖14]是顯示在容器被放置為傾斜狀態的情況下之檢測單元的檢測的範例的視圖;[圖15]是位置調整托架的透視圖;[圖16]是檢測單元的另一個範例的說明性視圖;以及[圖17]]是檢測單元的又另一個範例的說明性視圖。 [FIG. 1] is a view showing the appearance of a loading port according to an embodiment of the present invention; [FIG. 2] is a view showing an internal mechanism and an example of use of the loading port shown in FIG. 1; [FIG. 3A] and [FIG. 3B] are views showing a displacement mode of a docking plate; [FIG. 4] is an explanatory view of a pin arrangement on a docking board; [FIG. 7B] is a sectional view taken along the line A-A in FIG. 7A; [FIG. 7C] is an explanatory view of the operation of the detection unit; [FIG. 8A] is a perspective view of the detection unit; [FIG. 8B] is a cross-sectional view of the pin support portion; [FIG. 10A] and [FIG. 10B] are flow charts showing an example of the processing of the control unit; [FIG. 11A] to [FIG. 11D] are explanatory views of the operation of the detection unit shown in FIG. 8A in another example of use; [FIG. 12A] to [FIG. 12D] are explanatory views of the operation of the detection unit of another example; [FIG. 13] is a view showing an example in which the container is placed in an inclined state; [FIG. 15] is a perspective view of a position adjustment bracket; [FIG. 16] is an explanatory view of another example of the detection unit; and [FIG. 17]] is an explanatory view of still another example of the detection unit.

在下文中,將參照所附圖式詳細描述實施例。需注意的是,以下實施例並非意圖限制所請求發明之 範疇,且本發明並不限於需要實施例中所描述的特徵的所有組合的發明。實施例中所描述的多個特徵中的兩個或更多個特徵可被適當地組合。此外,將相同的標號賦予相同或相似的配置,且省略其冗餘描述。 Hereinafter, embodiments will be described in detail with reference to the accompanying drawings. It should be noted that the following examples are not intended to limit the scope of the claimed invention category, and the present invention is not limited to inventions requiring all combinations of features described in the embodiments. Two or more of the features described in the embodiments may be combined as appropriate. Also, the same reference numerals are assigned to the same or similar configurations, and redundant descriptions thereof are omitted.

<第一實施例> <First embodiment>

<設備概述> <Device Overview>

圖1是顯示根據本發明的實施例的裝載埠1的外觀的視圖。圖2是顯示裝載埠1的內部機構和使用範例的視圖。在圖式中,箭頭X和Y指示彼此正交的水平方向,且箭頭Z指示垂直方向。此外,PP表示埠板2在X方向上的側部。這些箭頭的含義亦同樣適用於其他圖式。 FIG. 1 is a view showing the appearance of a loading port 1 according to an embodiment of the present invention. FIG. 2 is a view showing an internal mechanism of the load port 1 and an example of use. In the drawings, arrows X and Y indicate horizontal directions orthogonal to each other, and arrow Z indicates a vertical direction. In addition, PP represents the side portion of the port plate 2 in the X direction. The meanings of these arrows also apply to other drawings.

裝載埠1是打開/關閉像是FOUP的容器5的設備。容器5包括盒狀的容器主體50,在容器主體的側部部分中具有用於放入或取出像是半導體晶圓的基板W之開口部分50a;以及蓋(門)51,其可拆卸地附接於開口部分50a並關閉開口部分50a。需注意的是,圖2顯示蓋51被裝載埠1移除且基板輸送機器人6可接近容器5中的基板W的狀態(打開狀態)。 The loadport 1 is a device for opening/closing a container 5 like a FOUP. The container 5 includes a box-shaped container main body 50 having an opening portion 50a for putting in or taking out a substrate W such as a semiconductor wafer in a side portion of the container main body; and a cover (door) 51 detachably attached to the opening portion 50a and closing the opening portion 50a. It should be noted that FIG. 2 shows a state in which the cover 51 is removed by the loadport 1 and the substrate transfer robot 6 can access the substrate W in the container 5 (open state).

裝載埠1包括埠板2、容器5被放置於其上的放置台3、以及支撐放置台3的支撐部分4。埠板2是沿Z方向延伸的板狀體。埠板2包括開口部分2a,被移除的蓋51可在X方向上通過此開口部分2a。至少一個裝載埠1被附接到包括輸送基板W之基板輸送機器人6的基板輸送設備PA。基板輸送機器人6執行將基板W從裝載埠1上的容器5卸載、以及將基板W裝載到裝載埠1上的容器5中。基板輸送機器人6包括端接器60,其保持基板W;鉸接臂61,其保持端接器60,以使其能夠至少自由地向前和向後移動;以及驅動單元62,其使鉸接臂61向前/向後移動、旋轉、及向上/向下移動。在上述打開狀態中,當使基板輸送機器人6進入與基板輸送設備(基板輸送模組)PA連通的容器主體50時,執行基板W的卸載和裝載。 The loading port 1 includes a port plate 2 , a placement table 3 on which a container 5 is placed, and a support portion 4 that supports the placement table 3 . The port plate 2 is a plate-shaped body extending in the Z direction. The port plate 2 includes an opening portion 2a through which the removed cover 51 can pass in the X direction. At least one load port 1 is attached to a substrate transfer apparatus PA including a substrate transfer robot 6 that transfers a substrate W. As shown in FIG. The substrate transfer robot 6 performs unloading of the substrate W from the container 5 on the load port 1 and loading of the substrate W into the container 5 on the load port 1 . The substrate transfer robot 6 includes a terminator 60 that holds the substrate W; an articulated arm 61 that holds the terminator 60 so that it can move at least freely forward and backward; and a drive unit 62 that moves the articulated arm 61 forward/backward, rotates, and moves up/down. In the above-described open state, when the substrate transfer robot 6 is brought into the container main body 50 communicating with the substrate transfer apparatus (substrate transfer module) PA, unloading and loading of the substrate W is performed.

放置台3包括容器5被放置於其上的對接板30。對接板30設置有複數個定位銷31,其在定位容器5的同時支撐容器5;以及複數個檢測銷(第二銷32F、第三銷32L及第一銷32R),其被構造成檢測容器5的存在。放置台3包括使對接板30在X方向上位移的驅動機構34。此外,放置台3在其前表面上具有操作面板33。操作者可透過操作 面板33進行裝載埠1的設置及操作指令。 The placement table 3 comprises a docking plate 30 on which the container 5 is placed. The butt plate 30 is provided with a plurality of positioning pins 31 that support the container 5 while positioning the container 5 , and a plurality of detection pins (second pin 32F, third pin 32L, and first pin 32R) configured to detect the presence of the container 5 . The placing table 3 includes a drive mechanism 34 for displacing the butt plate 30 in the X direction. Furthermore, the placement stand 3 has an operation panel 33 on its front surface. The operator can operate through The panel 33 carries out setting and operation commands of the loading port 1 .

支撐部分4是具有長方體形狀的中空體。支撐部分4被設置有驅動機構40。驅動機構40執行埠門41的打開/關閉操作。埠門41打開/關閉開口部分2a,並還保持容器5的蓋51且執行容器5的打開/關閉操作。驅動機構40包括被構造成使保持蓋51的埠門41在關閉位置、後退位置、及打開位置(圖2所示的打開狀態中的位置)之間移動的機構,在關閉位置中,蓋51關閉開口部分50a,在後退位置中,蓋51穿過開口部分2a後退,在打開位置中,蓋51後退到開口部分2a的下邊緣的下側。埠門41包括,例如,夾持機構,且埠門41因此可夾持並保持蓋51。此外,埠門41被設置有操作機構(閂鎖鑰匙),其操作被包含在蓋51中的鎖定機構之打開/關閉。這可將蓋51從容器主體50拆卸以及將蓋51附接到容器主體50。 The support portion 4 is a hollow body having a cuboid shape. The supporting part 4 is provided with a drive mechanism 40 . The drive mechanism 40 performs an opening/closing operation of the port door 41 . The port door 41 opens/closes the opening portion 2 a, and also holds the lid 51 of the container 5 and performs opening/closing operations of the container 5 . The driving mechanism 40 includes a mechanism configured to move the port door 41 holding the cover 51 between a closed position in which the cover 51 closes the opening portion 50a, a retracted position in which the cover 51 closes the opening portion 50a, and an open position in which the cover 51 retracts to the lower side of the lower edge of the opening portion 2a, and an open position. The port door 41 includes, for example, a clamping mechanism, and the port door 41 can thus clamp and hold the cover 51 . In addition, the port door 41 is provided with an operating mechanism (latch key) that operates opening/closing of a locking mechanism included in the cover 51 . This can detach the lid 51 from the container body 50 and attach the lid 51 to the container body 50 .

驅動機構40具有以下佈置。亦即,埠門41被由在Z方向上延伸的連接構件42支撐。連接構件42被由台構件43支撐,以能夠在X方向上滑動,且藉由致動器44(例如,滾珠螺桿(ball screw)、或電動汽缸)在X方向上移動。此外,與沿垂直方向延伸的滾珠螺桿軸45接合的滾珠螺母 48被固定到台構件43。當滾珠螺桿軸45藉由馬達47而被旋轉時,埠門41、連接構件42、及台構件43整體地向上或向下運動。 The drive mechanism 40 has the following arrangement. That is, the port gate 41 is supported by the connection member 42 extending in the Z direction. The connecting member 42 is supported by the table member 43 so as to be slidable in the X direction, and is moved in the X direction by an actuator 44 (for example, a ball screw or an electric cylinder). In addition, the ball nut engaged with the ball screw shaft 45 extending in the vertical direction 48 is fixed to the table member 43 . When the ball screw shaft 45 is rotated by the motor 47, the port door 41, the connection member 42, and the table member 43 move upward or downward integrally.

利用上述結構,驅動機構40可在X方向及Z方向上移動埠門41。因此,蓋51在關閉位置、後退位置、及打開位置之間移動。需注意的是,使埠門41移動的機構不限於此,且可採用各種機構。 With the above structure, the driving mechanism 40 can move the port door 41 in the X direction and the Z direction. Accordingly, the cover 51 moves among a closed position, a retracted position, and an open position. It is to be noted that the mechanism for moving the port gate 41 is not limited thereto, and various mechanisms may be employed.

裝載埠1被設置有控制單元1a。控制單元1a包括,例如,由CPU所表示的處理單元、像是RAM和ROM的儲存單元、外部設備與處理單元之間的輸入/輸出介面、以及經由通信線路1b與像是主機的電腦或周邊設備(基板輸送設備PA、基板輸送機器人6等等)進行通信的通信介面。驅動機構34、致動器44和馬達47由控制單元1a所控制。此外,被包括在感測器組1c中的每一個感測器的檢測結果或操作者經由操作面板33的操作藉由控制單元1a來識別。感測器組1c包括第二感測器10a、第三感測器11a及第一感測器90等,其將在後面被描述。 The loading port 1 is provided with a control unit 1a. The control unit 1a includes, for example, a processing unit represented by a CPU, a storage unit such as a RAM and a ROM, an input/output interface between an external device and the processing unit, and a communication interface for communicating with a computer such as a host computer or a peripheral device (substrate transfer apparatus PA, substrate transfer robot 6, etc.) via a communication line 1b. The drive mechanism 34, the actuator 44 and the motor 47 are controlled by the control unit 1a. In addition, the detection result of each sensor included in the sensor group 1c or the operator's operation via the operation panel 33 is recognized by the control unit 1a. The sensor group 1c includes a second sensor 10a, a third sensor 11a, a first sensor 90, etc., which will be described later.

<對接板的位移模式> <Displacement mode of docking plate>

圖3A及圖3B是顯示對接板30的位移模式的視圖,且是裝載埠1的平面圖。在此實施例中,驅動機構34可在X方向上移動對接板30。 3A and 3B are views showing displacement modes of the docking plate 30 and are plan views of the loading port 1 . In this embodiment, the drive mechanism 34 can move the docking plate 30 in the X direction.

圖3A顯示對接板30被定位於在X方向上相對於埠板2最靠近PP側部的位置(在下文中,也被稱作對接位置)的狀態。容器5的打開/關閉在對接位置處被執行。圖3B顯示對接板30被定位在距離埠板2最遠的位置(在下文中,也被稱作傳送位置)的狀態。在傳送位置處執行將容器5裝載到對接板30上、以及將容器5從對接板30卸載。 FIG. 3A shows a state where the butt plate 30 is positioned at a position closest to the PP side with respect to the port plate 2 in the X direction (hereinafter, also referred to as a butt position). The opening/closing of the container 5 is performed at the docking position. FIG. 3B shows a state where the butt plate 30 is positioned at the position farthest from the port plate 2 (hereinafter, also referred to as a transfer position). The loading and unloading of the containers 5 onto the docking plate 30 and the unloading of the containers 5 from the docking plate 30 are performed at the transfer position.

<移動機構的結構> <Structure of moving mechanism>

將描述驅動機構34的結構。圖4是對接板30和驅動機構34的平面圖。圖5是穿過對接板30觀看之驅動機構34的平面圖。圖6是驅動機構34的右側視圖。所有圖式均顯示對接板30被定位在對接位置處的狀態。 The structure of the drive mechanism 34 will be described. FIG. 4 is a plan view of the docking plate 30 and the drive mechanism 34 . FIG. 5 is a plan view of the drive mechanism 34 looking through the docking plate 30 . FIG. 6 is a right side view of the drive mechanism 34 . All figures show the state where the docking plate 30 is positioned at the docking position.

驅動機構34包括基部部分7以及移動機構8。基部部分7是用於整個驅動機構34的支撐體,且在本實施例中為板狀構件。 The drive mechanism 34 includes a base portion 7 and a movement mechanism 8 . The base portion 7 is a support for the entire drive mechanism 34, and is a plate-shaped member in this embodiment.

移動機構8被佈置在基部部分7和對接板30之 間。移動機構8包括導軌構件80、以及在導軌構件80上移動的滑動件81。在Y方向上之基部部分7的中心處,導軌構件80沿X方向延伸且被固定到基部部分7。滑動件81透過複數個立柱81b支撐對接板30,且與對接板30一起移動。滑動件81的移動範圍對應於對接位置和傳送位置之間的範圍,此範圍是對接板30在X方向上的移動範圍。滑動件81與導軌構件80接合,且被固定在沿著導軌構件80滑動的複數個接合構件81a上。 The movement mechanism 8 is arranged between the base part 7 and the docking plate 30 between. The moving mechanism 8 includes a rail member 80 and a slider 81 that moves on the rail member 80 . At the center of the base portion 7 in the Y direction, a rail member 80 extends in the X direction and is fixed to the base portion 7 . The sliding member 81 supports the butt plate 30 through a plurality of columns 81 b, and moves together with the butt plate 30 . The moving range of the slider 81 corresponds to the range between the docking position and the transfer position, and this range is the moving range of the docking plate 30 in the X direction. The slider 81 is engaged with the rail member 80 and is fixed to a plurality of engaging members 81 a that slide along the rail member 80 .

移動機構8包括驅動機構82。驅動機構82是使滑動件81在X方向上移動的機構。驅動機構82包括驅動單元820。驅動單元820包括作為驅動源的馬達820a,且馬達820a的驅動力經由驅動單元820中的傳動機構(齒輪機構、皮帶傳動機構等等)被傳遞到輸出軸820b。輸出軸820b繞著Z方向上的軸線旋轉。臂構件821的一個端部部分被固定至輸出軸820b。凸輪從動件822被設置在臂構件821的另一個端部部分處。隨著輸出軸820b旋轉,臂構件821在X-Y平面上樞轉。 The moving mechanism 8 includes a drive mechanism 82 . The drive mechanism 82 is a mechanism that moves the slider 81 in the X direction. The drive mechanism 82 includes a drive unit 820 . The driving unit 820 includes a motor 820a as a driving source, and the driving force of the motor 820a is transmitted to the output shaft 820b via a transmission mechanism (gear mechanism, belt transmission mechanism, etc.) in the driving unit 820 . The output shaft 820b rotates around an axis in the Z direction. One end portion of the arm member 821 is fixed to the output shaft 820b. A cam follower 822 is provided at the other end portion of the arm member 821 . As the output shaft 820b rotates, the arm member 821 pivots on the X-Y plane.

移動機構8包括凸輪板823。凸輪板823被固定在接合構件823a上,此接合構件823a與導軌構件80接合 並沿著導軌構件80滑動。凸輪板823包括凸輪槽823b。凸輪槽823b是在Y方向上延伸的通孔。凸輪從動件822與凸輪槽823b接合。當凸輪從動件822根據臂構件821的樞轉移動而相對於作為中心的輸出軸820b以弧形軌跡移動時,凸輪板823在X方向上移動。 The moving mechanism 8 includes a cam plate 823 . The cam plate 823 is fixed on an engaging member 823a which engages with the rail member 80 And slide along the rail member 80 . The cam plate 823 includes cam grooves 823b. The cam groove 823b is a through hole extending in the Y direction. The cam follower 822 engages with the cam groove 823b. The cam plate 823 moves in the X direction when the cam follower 822 moves in an arcuate trajectory relative to the output shaft 820b as the center according to the pivotal movement of the arm member 821 .

凸輪板823包括連接部分823c,且滑動件81包括連接部分81c。連接部分823c和81c是連接凸輪板823和滑動件81的部分。凸輪板823和滑動件81可剛性地被連接。然而,在此實施例中,彈性構件826被插置於凸輪板823和滑動件81之間,且彈性構件826緩衝了它們之間的驅動力傳遞。亦即,凸輪板823和滑動件81可在X方向上相對於彼此位移。因此,例如,即使當將凸輪板823移動到對接位置時異物被夾在埠板2和容器5之間,彈性構件也會彈性地變形,使得僅施加絕不會傷害操作者之預定值或更小的負載。此外,在此同時,容器5、凸輪板823和滑動件81不再能夠在移動靠近埠板2的方向上位移。因此,可確保操作安全。 The cam plate 823 includes a connecting portion 823c, and the slider 81 includes a connecting portion 81c. The connection portions 823c and 81c are portions that connect the cam plate 823 and the slider 81 . The cam plate 823 and slider 81 may be rigidly connected. However, in this embodiment, the elastic member 826 is interposed between the cam plate 823 and the slider 81, and the elastic member 826 buffers the driving force transmission therebetween. That is, the cam plate 823 and the slider 81 are displaceable relative to each other in the X direction. Therefore, for example, even if a foreign matter is caught between the port plate 2 and the container 5 when the cam plate 823 is moved to the docking position, the elastic member is elastically deformed so that only a predetermined value or less of a load that never injures the operator is applied. Furthermore, at the same time, the container 5 , the cam plate 823 and the slider 81 can no longer be displaced in the direction of moving closer to the port plate 2 . Therefore, safe operation can be ensured.

彈性構件826可為橡膠或類似物,且在此實施例中為螺旋彈簧。桿件824被插入到連接部分823c和81c 以及彈性構件826中。每一個連接部分823c和81c為在Z方向豎立的垂直壁,且包括孔,桿件824被插入此孔中。在桿件824的每一個端部部分處設置有止動件825。彈性構件826在連接部分823c和81c分開的方向上產生偏壓力,且連接部分823c和81c可在兩個止動件825的範圍內彼此移動靠近或移動遠離。亦即,凸輪板823和滑動件81可在兩個止動件825的範圍內彼此移動靠近或移動遠離。正常情況下,由於彈性構件826的偏壓力,它們藉由兩個止動件825之間的距離而彼此分開,且僅當某些外部負載作用時,它們才能彼此移動靠近。 The elastic member 826 may be rubber or the like, and in this embodiment is a coil spring. The rod 824 is inserted into the connection parts 823c and 81c And in the elastic member 826 . Each connecting portion 823c and 81c is a vertical wall standing in the Z direction, and includes a hole into which the rod 824 is inserted. A stopper 825 is provided at each end portion of the rod 824 . The elastic member 826 generates a biasing force in a direction in which the connecting parts 823c and 81c are separated, and the connecting parts 823c and 81c can move closer to or away from each other within the range of the two stoppers 825 . That is, the cam plate 823 and the slider 81 can move closer to or away from each other within the range of the two stoppers 825 . Normally, they are separated from each other by the distance between the two stoppers 825 due to the biasing force of the elastic member 826, and they can move closer to each other only when some external load acts.

對接板30被設置有三個檢測銷(第二銷32F、第三銷32L及第一銷32R)。第二銷32F、第三銷32L及第一銷32R是被構造成檢測容器5是否存在(被放置)於對接板30上的存在感測器(presence sensor)。當容器5被適當地放置在對接板30上時,所有的檢測銷(第二銷32F、第三銷32L及第一銷32R)被向下推動。第二銷32F、第三銷32L及第一銷32R被佈置成在對接板30的平面圖中被定位在銳角三角形的頂點處(圖4)。如果容器5被不適當地放置為傾斜狀態或被放置在偏離位置處,第二銷32F、第三銷32L及第一銷 32R中的至少一個未被向下推動到將由隨後所描述的感測器檢測到檢測銷的位置。 The butt plate 30 is provided with three detection pins (a second pin 32F, a third pin 32L, and a first pin 32R). The second pin 32F, the third pin 32L, and the first pin 32R are presence sensors configured to detect whether the container 5 is present (placed) on the docking plate 30 . When the container 5 is properly placed on the docking plate 30, all the detection pins (the second pin 32F, the third pin 32L and the first pin 32R) are pushed down. The second pin 32F, the third pin 32L, and the first pin 32R are arranged so as to be positioned at vertices of an acute triangle in plan view of the butt plate 30 ( FIG. 4 ). If the container 5 is improperly placed in an inclined state or placed in a deviated position, the second pin 32F, the third pin 32L and the first pin At least one of 32R is not pushed down to a position where the detection pin will be detected by a sensor described later.

在對接板30的下表面上設置有檢測第二銷32F的向下推動之第二感測器10a。第二銷32F及第二感測器10a形成第二檢測單元10,其被構造成檢測容器5是否被放置。第二檢測單元10的細節將參照圖7A至圖7C在後面被描述。在對接板30的下表面上設置有檢測第三銷32L的向下推動之第三感測器11a。第三銷32L及第三感測器11a形成第三檢測單元11,其被構造成檢測容器5是否被放置。第三檢測單元11的佈置與第二檢測單元10相同。第一銷32R的向下推動藉由第一檢測單元9來檢測。第一檢測單元9藉由托架9a被固定至基部部分7。將參照圖9A至圖10D來描述第一檢測單元9的細節。 On the lower surface of the butting plate 30, a second sensor 10a for detecting the downward pushing of the second pin 32F is provided. The second pin 32F and the second sensor 10a form the second detection unit 10 configured to detect whether the container 5 is placed. Details of the second detection unit 10 will be described later with reference to FIGS. 7A to 7C . On the lower surface of the butting plate 30, a third sensor 11a for detecting the downward pushing of the third pin 32L is provided. The third pin 32L and the third sensor 11a form a third detection unit 11 configured to detect whether the container 5 is placed. The arrangement of the third detection unit 11 is the same as that of the second detection unit 10 . The downward pushing of the first pin 32R is detected by the first detection unit 9 . The first detection unit 9 is fixed to the base portion 7 by means of a bracket 9a. Details of the first detection unit 9 will be described with reference to FIGS. 9A to 10D .

將參照圖7A至圖7C描述第二檢測單元10的佈置。圖7A是第二銷32F附近之對接板30的仰視圖,且圖7B是沿著圖7A中的線A-A所截取的截面圖。L形的凹部部分36被形成在對接板30的下表面中,且第二銷32F在凹部部分36中延伸穿過對接板30。L形的板片彈簧37被佈置在凹部部分36中,且僅板片彈簧37的一個端部分藉由螺栓38 被固定至對接板30。亦即,板片彈簧37是懸臂支撐的(cantilever-supported)。第二銷32F的下端抵靠於板片彈簧37的中間部分(在本實施例中,板片彈簧37的彎曲部分)。板片彈簧37作用為向上偏壓第二銷32F的復位彈簧。 The arrangement of the second detection unit 10 will be described with reference to FIGS. 7A to 7C . FIG. 7A is a bottom view of butt plate 30 near second pin 32F, and FIG. 7B is a cross-sectional view taken along line A-A in FIG. 7A. An L-shaped recess portion 36 is formed in the lower surface of the butt plate 30 , and the second pin 32F extends through the butt plate 30 in the recess portion 36 . An L-shaped leaf spring 37 is arranged in the recess portion 36, and only one end portion of the leaf spring 37 is connected by a bolt 38. is secured to the butt plate 30 . That is, the leaf spring 37 is cantilever-supported. The lower end of the second pin 32F abuts against the middle portion of the leaf spring 37 (in this embodiment, the bent portion of the leaf spring 37 ). The plate spring 37 functions as a return spring that biases the second pin 32F upward.

板片彈簧37的另一個端部分被彎曲,且形成感測器觸件(sensor dog)37a。第二感測器10a是光遮斷器(photo interrupter)並檢測在光接收元件與發光元件之間存在感測器觸件37a。需注意的是,作為第二感測器10a,亦可採用除了光遮斷器以外的感測器(例如,包括槓桿形致動器的微動開關感測器)。另外,亦可採用不使用板片彈簧37的結構,且可將光遮斷器和微動開關感測器一起使用。 The other end portion of the leaf spring 37 is bent, and a sensor dog 37a is formed. The second sensor 10a is a photo interrupter and detects the presence of the sensor contact 37a between the light receiving element and the light emitting element. It should be noted that, as the second sensor 10a, a sensor other than a photointerrupter (for example, a micro switch sensor including a lever-shaped actuator) may also be used. In addition, the structure which does not use the plate spring 37 is also possible, and a photointerrupter and a micro switch sensor can be used together.

圖7C顯示第二銷32F被向下推動的狀態。當容器5被適當地放置在對接板30上時,第二銷32F藉由容器5的重量而被向下推動,如圖7C所示。因此,板片彈簧37也被向下推動,感測器觸件37a進入光接收元件和發光元件之間,且第二感測器10a對此進行檢測。當容器5從對接板30被卸載時,第二銷32F藉由板片彈簧37的彈性偏壓力而返回到圖7B所示的位置。 FIG. 7C shows a state where the second pin 32F is pushed down. When the container 5 is properly placed on the docking plate 30, the second pin 32F is pushed down by the weight of the container 5, as shown in Fig. 7C. Accordingly, the plate spring 37 is also pushed downward, the sensor contact 37a enters between the light receiving element and the light emitting element, and the second sensor 10a detects this. When the container 5 is unloaded from the docking plate 30 , the second pin 32F is returned to the position shown in FIG. 7B by the elastic biasing force of the leaf spring 37 .

將參照圖8A描述第一檢測單元9。第一檢測單元9包括第一感測器90及可動構件91,且作用為安全機構或安全部件,其被構造成防止裝載埠1或基板輸送機器人6的意外操作。 The first detection unit 9 will be described with reference to FIG. 8A . The first detection unit 9 includes a first sensor 90 and a movable member 91 , and functions as a safety mechanism or safety component configured to prevent accidental operation of the loadport 1 or the substrate transfer robot 6 .

在此實施例中,第一感測器90是旋轉限位開關(rotary limit switch)。第一感測器90包括微動開關,且藉由微動開關的開關機構來打開/關閉電路(電接點被接通/斷開)。當外力被施加到可動構件91且輸入軸90a繞著平行於預定Y方向之旋轉中心線Y1旋轉預定角度時,微動開關藉由形成在輸入軸90a上的凸輪機構及抵靠於凸輪機構且可在X方向上移動的柱塞而被偏壓並接通。第一感測器90包括彈性構件,其經由柱塞將輸入軸90a偏壓到OFF位置。為此原因,當被施加到可動構件91的外力被移除時,輸入軸90a回到OFF位置,其為初始位置。 In this embodiment, the first sensor 90 is a rotary limit switch. The first sensor 90 includes a micro switch, and the circuit is turned on/off (the electrical contact is turned on/off) by the switch mechanism of the micro switch. When an external force is applied to the movable member 91 and the input shaft 90a is rotated by a predetermined angle around a rotation center line Y1 parallel to the predetermined Y direction, the micro switch is biased and turned on by a cam mechanism formed on the input shaft 90a and a plunger abutting against the cam mechanism and movable in the X direction. The first sensor 90 includes a resilient member that biases the input shaft 90a to the OFF position via a plunger. For this reason, when the external force applied to the movable member 91 is removed, the input shaft 90a returns to the OFF position, which is the initial position.

可動構件91是槓桿構件,其具有被固定到輸入軸90a的一個端部部分,且能夠繞著旋轉中心線Y1樞轉。可動構件91包括被可旋轉地設置在另一個端部部分處的輥部分91a。當外力被施加到可動構件91且可動構件91在X方向上向PP側位移(傾斜)預定量或更多時,第一感測 器90被打開。第一檢測單元9被附接至基部部分7等,使得輥部分91a在Y方向上的位置變得與第一銷32R在Y方向上的位置相同。需注意的是,作為可動構件91,亦可採用不包括輥部分91a的結構。 The movable member 91 is a lever member which has one end portion fixed to the input shaft 90 a and is capable of pivoting about the rotation center line Y1 . The movable member 91 includes a roller portion 91a rotatably provided at the other end portion. When an external force is applied to the movable member 91 and the movable member 91 is displaced (tilted) to the PP side in the X direction by a predetermined amount or more, the first sensing device 90 is opened. The first detection unit 9 is attached to the base portion 7 and the like so that the position of the roller portion 91 a in the Y direction becomes the same as the position of the first pin 32R in the Y direction. It is to be noted that, as the movable member 91, a structure not including the roller portion 91a may also be employed.

圖8B是顯示第一銷32R的支撐結構的截面圖。不同於其餘的第二銷32F和第三銷32L,第一銷32R是在軸向方向上的長度為長的之銷。支撐第一銷32R之管狀的支撐部分35被固定到對接板30。彈性構件35b被佈置在支撐部分35的內部空間35a中。在此實施例中,彈性構件35b是被安裝在第一銷32R上的螺旋彈簧。第一銷32R延伸穿過對接板30及支撐部分35。此外,止動件32a被固定到第一銷32R。止動件32a總是藉由彈性構件35b被向上偏壓。 FIG. 8B is a sectional view showing the supporting structure of the first pin 32R. Unlike the remaining second pin 32F and third pin 32L, the first pin 32R is a pin whose length in the axial direction is long. A tubular support portion 35 supporting the first pin 32R is fixed to the butt plate 30 . The elastic member 35b is arranged in the inner space 35a of the support portion 35 . In this embodiment, the elastic member 35b is a coil spring mounted on the first pin 32R. The first pin 32R extends through the butt plate 30 and the support portion 35 . Furthermore, the stopper 32a is fixed to the first pin 32R. The stopper 32a is always biased upward by the elastic member 35b.

圖9A至圖9D是第一銷32R和第一檢測單元9的操作的說明性視圖。如圖9D所示,輥部分91a被佈置為抵靠於被向下推動的第一銷32R。在此實施例中,如圖9B所示,輥部分91a被佈置成甚至抵靠於未被向下推動的第一銷32R。然而,由於抵接部分不同,可動構件91的位移量(傾斜角度)亦不同。 9A to 9D are explanatory views of the operation of the first pin 32R and the first detection unit 9 . As shown in FIG. 9D , the roller portion 91 a is arranged to abut against the first pin 32R pushed downward. In this embodiment, as shown in FIG. 9B , the roller portion 91 a is arranged to abut against even the first pin 32R that is not pushed down. However, the displacement amount (inclination angle) of the movable member 91 is also different depending on the contact portion.

圖9A顯示對接板30被定位在傳送位置處的狀態。容器5不存在(未被放置)於對接板30上,且藉由上述彈性構件35b的偏壓,第一銷32R被定位在初始位置處。可動構件91被定位在初始位置處。圖9B顯示對接板30已經從圖9A中的狀態被移動到對接位置的狀態。容器5未被放置在對接板30上,且藉由上述彈性構件35b的偏壓,第一銷32R仍被定位在初始位置處。當第一銷32R抵靠於輥部分91a時,可動構件91在X方向上從初始位置朝埠板2的側部稍微傾斜。由於第一銷32R的下端輕微地抵靠於輥部分91a的中心的上側,可動構件91並未大幅地傾斜,且傾斜角度θ1為小的。在此同時,可動構件91的第一感測器90未被打開且保持關閉。 FIG. 9A shows a state where the butt plate 30 is positioned at the transfer position. The container 5 is not present (not placed) on the butt plate 30, and by the bias of the above-mentioned elastic member 35b, the first pin 32R is positioned at the initial position. The movable member 91 is positioned at the initial position. FIG. 9B shows a state where the docking plate 30 has been moved from the state in FIG. 9A to the docking position. The container 5 is not placed on the butt plate 30, and the first pin 32R is still positioned at the initial position by the bias of the above-mentioned elastic member 35b. When the first pin 32R abuts against the roller portion 91a, the movable member 91 is slightly inclined from the initial position toward the side of the port plate 2 in the X direction. Since the lower end of the first pin 32R abuts slightly on the upper side of the center of the roller portion 91a, the movable member 91 is not greatly inclined, and the inclination angle θ1 is small. At the same time, the first sensor 90 of the movable member 91 is not turned on and remains off.

圖9C顯示對接板30被定位在傳送位置的狀態。圖9C假設容器5適當地存在於對接板30上的狀態。第一銷32R藉由容器5的重量而被向下推動,且從支撐部分35向下的突出量為大的。圖9D顯示對接板30已經從圖9C中的狀態被移動到對接位置的狀態。當第一銷32R抵靠於輥部分91a時,可動構件91在X方向上從初始位置朝埠板2的側部傾斜。由於第一銷32R以與輥部分91a的中心相同的高 度深深地抵靠於輥部分91a,可動構件91的傾斜角度θ2(>θ1)為大的。在此同時,可動構件91的第一感測器90被打開。 FIG. 9C shows a state where the butt plate 30 is positioned at the transfer position. FIG. 9C assumes a state where the container 5 properly exists on the butt plate 30 . The first pin 32R is pushed downward by the weight of the container 5, and the downward protrusion amount from the support portion 35 is large. FIG. 9D shows a state where the docking plate 30 has been moved from the state in FIG. 9C to the docking position. When the first pin 32R abuts against the roller portion 91a, the movable member 91 is inclined from the initial position toward the side of the port plate 2 in the X direction. Since the first pin 32R has the same height as the center of the roller portion 91a The angle of inclination θ2 (>θ1) of the movable member 91 is large if the angle of inclination θ2 (>θ1) of the movable member 91 is deeply pressed against the roller portion 91a. At the same time, the first sensor 90 of the movable member 91 is turned on.

如上所述,根據此實施例的第一檢測單元9,不僅能夠檢測容器5是否存在(被適當地放置)於對接板30上,且還能夠檢測容器5是否存在於對接板30上且對接板30是否被定位在對接位置。由於可藉由一個第一檢測單元9檢測到兩種狀態,能夠以相對較低的成本檢測容器5在對接板30上的放置以及對接板30的位置。 As described above, according to the first detection unit 9 of this embodiment, it is possible not only to detect whether the container 5 exists (is properly placed) on the docking plate 30, but also to detect whether the container 5 exists on the docking plate 30 and whether the docking plate 30 is positioned at the docking position. Since two states can be detected by one first detection unit 9 , the placement of the container 5 on the butt plate 30 and the position of the butt plate 30 can be detected at relatively low cost.

第一檢測單元9被佈置為對應於第一銷32R。第一銷32R是三個檢測銷(第二銷32F、第三銷32L及第一銷32R)中的被佈置在埠板2的側上且在與對接板30移動方向交叉的Y方向上被間隔開的第三銷32L和第一銷32R中的一者。第一銷32R被佈置在容易檢測在對接板30上被放置為傾斜狀態的容器的位置處。因此,當藉由第一檢測單元9檢測此第一銷32R時,容器5放置檢測的可靠性可被增加。 The first detection unit 9 is arranged to correspond to the first pin 32R. The first pin 32R is one of the third pin 32L and the first pin 32R which are arranged on the side of the port plate 2 and spaced apart in the Y direction intersecting the moving direction of the butt plate 30 among the three detection pins (the second pin 32F, the third pin 32L, and the first pin 32R). The first pin 32R is arranged at a position where it is easy to detect a container placed in an inclined state on the butting plate 30 . Therefore, when this first pin 32R is detected by the first detection unit 9 , the reliability of container 5 placement detection can be increased.

此外,由於第一檢測單元9檢測被佈置於在Y方向上靠近對接板30的一個端側的位置處之第一銷32R,第一檢測單元9可被佈置於在Y方向上靠近基部部分7上的 一個端側的位置處。在基部部分7在Y方向上的一個端側上,形成有其他機構存在的相對較少的自由空間,且第一檢測單元9可被佈置在此自由空間內。當然,第一檢測單元9可被佈置為對應於第三銷32L,或可被佈置為對應於第二銷32F。 Furthermore, since the first detecting unit 9 detects the first pin 32R arranged at a position close to one end side of the butt plate 30 in the Y direction, the first detecting unit 9 can be arranged near the base portion 7 in the Y direction. at one end position. On one end side of the base portion 7 in the Y direction, there is formed a relatively little free space where other mechanisms exist, and the first detection unit 9 can be arranged in this free space. Of course, the first detection unit 9 may be arranged to correspond to the third pin 32L, or may be arranged to correspond to the second pin 32F.

應注意的是,在此實施例中,第一感測器90在圖9B所示的狀態下未被打開。作為第一感測器90,可使用包括複數個ON接點且在圖9B所示的狀態及圖9D所示的狀態之間選擇性地被打開的感測器。在圖9B所示的狀態下,在容器5未被放置在對接板30上的狀態下,控制單元1a可識別出對接板30已經被移動到對接位置。 It should be noted that in this embodiment, the first sensor 90 is not turned on in the state shown in FIG. 9B . As the first sensor 90, a sensor including a plurality of ON contacts and selectively turned on between the state shown in FIG. 9B and the state shown in FIG. 9D can be used. In the state shown in FIG. 9B , in a state where the container 5 is not placed on the docking plate 30 , the control unit 1 a can recognize that the docking plate 30 has been moved to the docking position.

<控制單元的處理範例> <Processing example of the control unit>

將描述控制單元1a的處理範例。如果埠板2的開口部分2a被不必要地打開,工作空間S被暴露於外部,且例如,基板輸送機器人6的端接器60不期望地突出到外部。同樣對於埠門41,如果埠門41在埠門41的移動期間被暴露於外部,異物不期望地被捕捉埠板2和埠門41之間。 An example of processing by the control unit 1a will be described. If the opening portion 2a of the port plate 2 is unnecessarily opened, the work space S is exposed to the outside, and, for example, the terminator 60 of the substrate transfer robot 6 undesirably protrudes to the outside. Also with the port door 41 , if the port door 41 is exposed to the outside during the movement of the port door 41 , foreign matter is undesirably caught between the port plate 2 and the port door 41 .

在此實施例中,在容器5適當地存在於對接 板30上且對接板30被定位在對接位置處的至少一個條件下,埠門41被移動。據此,即使打開開口部分2a,容器5也存在於開口部分2a的前面並關閉開口部分2a。這可防止埠門41和工作空間S被暴露於外部。圖10A及圖10B是顯示控制單元1a的處理範例的流程圖。 In this embodiment, the container 5 is suitably present in the docking The port door 41 is moved under at least one condition that the docking plate 30 is positioned in the docking position on the plate 30 . According to this, even if the opening portion 2a is opened, the container 5 exists in front of the opening portion 2a and closes the opening portion 2a. This prevents the port door 41 and the work space S from being exposed to the outside. 10A and 10B are flowcharts showing an example of processing by the control unit 1a.

例如,當在將容器5被放置在對接板30上的狀態下執行埠門41的打開操作時,執行圖10A所示的處理範例。打開操作的指令從,例如,主機經由通信線路1b被發送到控制單元1a。 For example, when the opening operation of the port door 41 is performed in a state where the container 5 is placed on the docking plate 30, the processing example shown in FIG. 10A is executed. An instruction for an opening operation is sent from, for example, a host computer to the control unit 1a via the communication line 1b.

在步驟S1中,獲取感測器組1c中的預定感測器的檢測結果。預定感測器至少包括第二感測器10a、第三感測器11a及第一感測器90。在步驟S2中,確定在步驟S1中所獲取的檢測結果是否為預定的檢測結果。在此處,檢測結果為預定的檢測結果意味著至少第二感測器10a、第三感測器11a及第一感測器90都打開的條件,亦即,容器5適當地存在於對接板30上且對接板30已經從傳送位置被移動到對接位置。如果在步驟S2中檢測結果是預定的檢測結果,則處理前進到步驟S3。如果檢測結果不是預定的檢測結果,則處理前進到步驟S4。 In step S1, detection results of predetermined sensors in the sensor group 1c are acquired. The predetermined sensors include at least the second sensor 10 a , the third sensor 11 a and the first sensor 90 . In step S2, it is determined whether the detection result acquired in step S1 is a predetermined detection result. Here, the detection result being a predetermined detection result means a condition that at least the second sensor 10a, the third sensor 11a, and the first sensor 90 are all turned on, that is, the container 5 is properly present on the docking plate 30 and the docking plate 30 has been moved from the transfer position to the docking position. If the detection result is a predetermined detection result in step S2, the process proceeds to step S3. If the detection result is not the predetermined detection result, the process proceeds to step S4.

在步驟S4中,執行錯誤處理。在此處,例如,經由通信線路1b將表示未滿足操作條件的通知發送到主機。或者,藉由語音或顯示器將警告通知給操作者。 In step S4, error handling is performed. Here, for example, a notification indicating that the operation condition is not satisfied is sent to the host computer via the communication line 1b. Alternatively, the warning is notified to the operator by voice or display.

在步驟S3中,埠門41的操作許可信號被發送到控制單元1a。據此,使埠門41保持蓋51並移動到打開位置。由於在步驟S2中確認容器5適當地存在於對接板30上,且開口部分2a在對接位置處被關閉,埠門41和工作空間S不會在操作期間被暴露於外部。亦即,由於開口部分2a藉由容器5而被關閉,工作空間S不會經由開口部分2a被暴露於外部。 In step S3, an operation permission signal of the port gate 41 is sent to the control unit 1a. Accordingly, the port door 41 is caused to hold the cover 51 and move to the open position. Since it is confirmed in step S2 that the container 5 is properly present on the docking plate 30, and the opening portion 2a is closed at the docking position, the port door 41 and the working space S are not exposed to the outside during operation. That is, since the opening portion 2a is closed by the container 5, the work space S is not exposed to the outside through the opening portion 2a.

在步驟S5中,獲取感測器組1c中的預定感測器的檢測結果。這主要目標在於操作確認。預定感測器至少包括檢測埠門41是否已經被移動到打開位置的感測器。第二感測器10a、第三感測器11a及第一感測器90的檢測結果可再次被涵蓋,儘管它們被包含在步驟S1中的檢測結果獲取目標中。 In step S5, detection results of predetermined sensors in the sensor group 1c are acquired. The main goal of this is operational validation. The predetermined sensors include at least a sensor that detects whether the port door 41 has been moved to the open position. The detection results of the second sensor 10a, the third sensor 11a, and the first sensor 90 can be covered again, although they are included in the detection result acquisition target in step S1.

當在將容器5被放置在對接板30上的狀態下執行埠門41的關閉操作時,同樣應用圖10A所示的處理範例。關閉操作的指令從,例如,主機通過通信線路1b傳送 到控制單元1a。 The processing example shown in FIG. 10A is also applied when the closing operation of the port door 41 is performed in a state where the container 5 is placed on the abutment plate 30 . The command to close the operation is transmitted from, for example, the host computer via the communication line 1b to control unit 1a.

在步驟S1中,獲取感測器組1c中的預定感測器的檢測結果。預定感測器至少包括第二感測器10a、第三感測器11a及第一感測器90。在步驟S2中,確定在步驟S1中所獲取的檢測結果是否為預定的檢測結果。在此處,檢測結果為預定的檢測結果意味著至少第二感測器10a、第三感測器11a及第一感測器90都打開的條件,亦即,容器5適當地存在於對接板30上且對接板30已經從傳送位置被移動到對接位置。如果在步驟S2中檢測結果是預定的檢測結果,則處理前進到步驟S3。如果檢測結果不是預定的檢測結果,則處理前進到步驟S4。 In step S1, detection results of predetermined sensors in the sensor group 1c are acquired. The predetermined sensors include at least the second sensor 10 a , the third sensor 11 a and the first sensor 90 . In step S2, it is determined whether the detection result acquired in step S1 is a predetermined detection result. Here, the detection result being a predetermined detection result means a condition that at least the second sensor 10a, the third sensor 11a, and the first sensor 90 are all turned on, that is, the container 5 is properly present on the docking plate 30 and the docking plate 30 has been moved from the transfer position to the docking position. If the detection result is a predetermined detection result in step S2, the process proceeds to step S3. If the detection result is not the predetermined detection result, the process proceeds to step S4.

在步驟S3中,埠門41的操作許可信號被發送到控制單元1a。據此,埠門41被移動到關閉位置。由於在步驟S2中確認容器5適當地存在於對接板30上,且開口部分2a在對接位置處被關閉,埠門41和工作空間S不會在操作期間被暴露於外部。亦即,由於開口部分2a藉由容器5而被關閉,防止埠門41捕捉異物。 In step S3, an operation permission signal of the port gate 41 is sent to the control unit 1a. Accordingly, the port door 41 is moved to the closed position. Since it is confirmed in step S2 that the container 5 is properly present on the docking plate 30, and the opening portion 2a is closed at the docking position, the port door 41 and the working space S are not exposed to the outside during operation. That is, since the opening portion 2a is closed by the container 5, the port door 41 is prevented from catching foreign matter.

在步驟S5中,獲取感測器組1c中的預定感測器的檢測結果。預定感測器至少包括檢測埠門41是否已經 被移動到關閉位置的感測器。第二感測器10a、第三感測器11a及第一感測器90的檢測結果可再次被涵蓋,儘管它們被包含在步驟S1中的檢測結果獲取目標中。 In step S5, detection results of predetermined sensors in the sensor group 1c are acquired. The predetermined sensors include at least detecting whether the port gate 41 has Sensor moved to closed position. The detection results of the second sensor 10a, the third sensor 11a, and the first sensor 90 can be covered again, although they are included in the detection result acquisition target in step S1.

例如,當在將容器5被放置在對接板30上的狀態下執行基板輸送機器人6的操作時,執行圖10B所示的處理範例。操作的指令從,例如,主機被傳送到基板輸送機器人6的控制單元。 For example, when the operation of the substrate transfer robot 6 is performed in a state where the container 5 is placed on the docking plate 30 , the processing example shown in FIG. 10B is executed. Instructions for operations are transmitted from, for example, a host computer to the control unit of the substrate transfer robot 6 .

在步驟S6中,獲取感測器組1c中的預定感測器的檢測結果。預定感測器至少包括第二感測器10a、第三感測器11a及第一感測器90。在步驟S7中,確定在步驟S6中所獲取的檢測結果是否為預定的檢測結果。如果檢測結果是預定的檢測結果,則處理前進到步驟S8。如果檢測結果不是預定的檢測結果,則處理前進到步驟S9。在步驟S9中,執行錯誤處理。這與步驟S4中的處理相同。 In step S6, detection results of predetermined sensors in the sensor group 1c are acquired. The predetermined sensors include at least the second sensor 10 a , the third sensor 11 a and the first sensor 90 . In step S7, it is determined whether the detection result acquired in step S6 is a predetermined detection result. If the detection result is a predetermined detection result, the process proceeds to step S8. If the detection result is not the predetermined detection result, the process proceeds to step S9. In step S9, error handling is performed. This is the same as the processing in step S4.

在步驟S8中,基板輸送機器人6的操作許可信號經由通信線路1b被發送到基板輸送機器人6的控制單元、或主機。據此,開始基板輸送機器人6的操作。由於基板輸送機器人6的操作至少僅在開口部分2a藉由容器5而被關閉的狀態下才被允許,能夠確保周邊的安全性。 In step S8, an operation permission signal of the substrate transfer robot 6 is transmitted to the control unit of the substrate transfer robot 6 or the host computer via the communication line 1b. Accordingly, the operation of the substrate transfer robot 6 is started. Since the operation of the substrate transfer robot 6 is allowed at least only in a state where the opening portion 2a is closed by the container 5, the safety of the periphery can be ensured.

需注意的是,即使未放置容器5,如果埠門41被定位在關閉位置處,亦可發送基板輸送機器人6的操作許可信號。在此實施例中,如果由於某種原因而檢測到在埠門41被定位在打開位置的狀態下未放置容器5,則可執行錯誤處理,以禁止基板輸送機器人6的操作。 It should be noted that even if the container 5 is not placed, if the port door 41 is positioned at the closed position, the operation permission signal of the substrate transfer robot 6 can be sent. In this embodiment, if for some reason it is detected that the container 5 is not set in the state where the port door 41 is positioned at the open position, error processing may be performed to prohibit the operation of the substrate transfer robot 6 .

<第二實施例> <Second Embodiment>

在第一實施例中,在圖9B所示的狀態中,第一檢測單元9被佈置為使得未被向下推動的第一銷32R抵靠於輥部分91a。然而,第一檢測單元9可被佈置成使得第一銷32R並未抵靠。圖11A至圖11D是顯示範例之第一銷32R和第一檢測單元9的操作的說明性視圖。 In the first embodiment, in the state shown in FIG. 9B , the first detection unit 9 is arranged such that the first pin 32R that is not pushed down abuts against the roller portion 91 a. However, the first detection unit 9 may be arranged such that the first pin 32R does not abut. 11A to 11D are explanatory views showing the operations of the first pin 32R and the first detection unit 9 of an example.

圖11A顯示對接板30被定位在傳送位置的狀態。容器5未被放置在對接板30上,且第一銷32R藉由上述彈性構件35b的偏壓而被定位在初始位置處。可動構件91被定位在初始位置處。圖11B顯示對接板30已經從圖11A中的狀態被移動到對接位置的狀態。容器5未被放置在對接板30上,且藉由上述彈性構件35b的偏壓,第一銷32R仍被定位在初始位置處。第一銷32R未抵靠於輥部分91a,且 可動構件91仍被定位在初始位置處。在此同時,第一感測器90未被打開且保持關閉。 FIG. 11A shows a state where the butt plate 30 is positioned at the transfer position. The container 5 is not placed on the butt plate 30, and the first pin 32R is positioned at the initial position by the bias of the above-mentioned elastic member 35b. The movable member 91 is positioned at the initial position. FIG. 11B shows a state where the docking plate 30 has been moved from the state in FIG. 11A to the docking position. The container 5 is not placed on the butt plate 30, and the first pin 32R is still positioned at the initial position by the bias of the above-mentioned elastic member 35b. The first pin 32R does not abut against the roller portion 91a, and The movable member 91 is still positioned at the initial position. At the same time, the first sensor 90 is not turned on and remains off.

圖11C顯示對接板30被定位在傳送位置的狀態。圖11C假設容器5被放置在對接板30上的狀態。第一銷32R藉由容器5的重量而被向下推動,且從支撐部分35向下的突出量為大的。圖11D顯示對接板30已經從圖11C中的狀態被移動到對接位置的狀態。當第一銷32R深深地抵靠於輥部分91a時,可動構件91在X方向上從初始位置朝PP側傾斜一傾斜角度θ3(

Figure 109108769-A0305-02-0031-1
θ2)。在此同時,可動構件91的第一感測器90被打開。 FIG. 11C shows a state where the docking plate 30 is positioned at the transfer position. FIG. 11C assumes a state where the container 5 is placed on the docking plate 30 . The first pin 32R is pushed downward by the weight of the container 5, and the downward protrusion amount from the support portion 35 is large. FIG. 11D shows the state where the docking plate 30 has been moved from the state in FIG. 11C to the docking position. When the first pin 32R deeply abuts against the roller portion 91a, the movable member 91 is inclined in the X direction from the initial position toward the PP side by an inclination angle θ3(
Figure 109108769-A0305-02-0031-1
θ2). At the same time, the first sensor 90 of the movable member 91 is turned on.

<第三實施例> <Third embodiment>

在第一實施例中,旋轉限位開關被使用來作為第一感測器90。然而,可使用線性運動限位開關。圖12A至圖12D是顯示範例之操作的說明性視圖。在圖12A至圖12D所示的範例中,感測器12被使用來代替第一感測器90。感測器12為線性運動限位開關,其被構造成檢測作為可動構件之柱塞12a的X方向位移。 In the first embodiment, a rotary limit switch is used as the first sensor 90 . However, linear motion limit switches can be used. 12A to 12D are explanatory views showing the operation of the example. In the example shown in FIGS. 12A to 12D , the sensor 12 is used instead of the first sensor 90 . The sensor 12 is a linear motion limit switch configured to detect the X-direction displacement of the plunger 12a as the movable member.

圖12A顯示對接板30被定位在傳送位置的狀 態。容器5未被放置在對接板30上,且藉由上述彈性構件35b的偏壓,第一銷32R被定位在初始位置處。柱塞12a被定位在初始位置處。圖12B顯示對接板30已經從圖12A中的狀態被移動到對接位置的狀態。容器5未被放置在對接板30上,且藉由上述彈性構件35b的偏壓,第一銷32R仍被定位在初始位置處。由於在Z方向上的偏移,第一銷32R未抵靠於柱塞12a,且柱塞12a仍被定位在初始位置處。感測器12未被打開。 Figure 12A shows the state of the docking plate 30 being positioned in the transfer position. state. The container 5 is not placed on the butt plate 30, and by the bias of the above-mentioned elastic member 35b, the first pin 32R is positioned at the initial position. The plunger 12a is positioned at the initial position. FIG. 12B shows the state where the docking plate 30 has been moved from the state in FIG. 12A to the docking position. The container 5 is not placed on the butt plate 30, and the first pin 32R is still positioned at the initial position by the bias of the above-mentioned elastic member 35b. Due to the offset in the Z direction, the first pin 32R does not abut against the plunger 12a, and the plunger 12a is still positioned at the initial position. Sensor 12 is not turned on.

圖12C顯示對接板30被定位在傳送位置的狀態。圖12C假設容器5被放置在對接板30上的狀態。第一銷32R藉由容器5的重量而被向下推動,且從支撐部分35向下的突出量為大的。圖12D顯示對接板30已經從圖12C中的狀態被移動到對接位置的狀態。當第一銷32R抵靠於柱塞12a時,柱塞12a在X方向上從初始位置朝向埠板2的側部位移。感測器12被打開以檢測容器5被放置在對接板30上,以及對接板30被定位在對接位置處。 FIG. 12C shows a state where the docking plate 30 is positioned at the transfer position. FIG. 12C assumes a state where the container 5 is placed on the docking plate 30 . The first pin 32R is pushed downward by the weight of the container 5, and the downward protrusion amount from the support portion 35 is large. Figure 12D shows the state where the docking plate 30 has been moved from the state in Figure 12C to the docking position. When the first pin 32R abuts against the plunger 12a, the plunger 12a is displaced from the initial position toward the side of the port plate 2 in the X direction. The sensor 12 is switched on to detect that the container 5 is placed on the docking plate 30 and that the docking plate 30 is positioned in the docking position.

<第四實施例> <Fourth Embodiment>

如第一實施例中所述,如果容器5在對接板30上被放 置為傾斜狀態,第二銷32F、第三銷32L及第一銷32R中的至少一個未被向下推動。因此,這種不適當的放置狀態被檢測到。然而,例如,如果容器5的傾斜為小的,第一銷32R可能被向下推動一些程度。圖13顯示出一個範例。參照圖13,被以兩點鏈線指示的容器5顯示了被適當地放置在對接板30上的容器5的範例,且被以實線指示的容器5顯示了被放置同時在Y方向上傾斜(在圖13中,左側朝下,且右側朝上)的容器5的範例。 As described in the first embodiment, if the container 5 is placed on the docking plate 30 Put in the inclined state, at least one of the second pin 32F, the third pin 32L, and the first pin 32R is not pushed downward. Therefore, this inappropriate placement state is detected. However, for example, if the inclination of the container 5 is small, the first pin 32R may be pushed down to some degree. Figure 13 shows an example. Referring to FIG. 13 , a container 5 indicated by a two-dot chain line shows an example of a container 5 properly placed on the docking plate 30, and a container 5 indicated by a solid line shows an example of a container 5 placed while being tilted in the Y direction (left side down and right side up in FIG. 13 ).

圖14顯示在容器5被放置同時在Y方向上傾斜(如圖13所示)且第一銷32R被向下推動的情況下之第一檢測單元9的行為。兩點鏈線L1指示在容器5被適當地放置在對接板30上的情況下第一銷32R的下端的位置的軌跡。 FIG. 14 shows the behavior of the first detection unit 9 in the case where the container 5 is placed while being tilted in the Y direction (as shown in FIG. 13 ) and the first pin 32R is pushed down. The two-dot chain line L1 indicates the locus of the position of the lower end of the first pin 32R in the case where the container 5 is properly placed on the docking plate 30 .

狀態ST1顯示對接板30被定位在傳送位置處的狀態。容器5(未顯示)在對接板30上被放置為傾斜狀態,且第一銷32R的下端未到達下端位置L1。 The state ST1 shows a state where the butt plate 30 is positioned at the transfer position. The container 5 (not shown) is placed in an inclined state on the butt plate 30, and the lower end of the first pin 32R does not reach the lower end position L1.

狀態ST2顯示對接板30已經從狀態ST1被移動到對接位置的狀態。當第一銷32R抵靠於輥部分91a時,可動構件91在X方向上從初始位置朝向埠板2的側部僅傾斜一傾斜角度θ4。 State ST2 shows a state where docking plate 30 has been moved from state ST1 to the docking position. When the first pin 32R abuts against the roller portion 91a, the movable member 91 is inclined by only an inclination angle θ4 from the initial position toward the side of the port plate 2 in the X direction.

當容器5的傾斜落在允許範圍內時,基板W的傳送沒有問題。然而,如果容器5的傾斜超過允許範圍,可能發生問題,使得基板輸送機器人6的端接器60無法適當地傳送基板W。因此,較佳的是,區分出容器5之允許基板W的傳送的傾斜。例如,如果可動構件91的傾斜角度為θ4(<θ2),第一感測器90不會產生ON信號。然而,根據第一檢測單元9的個體差異或附接誤差,對於每一個裝載埠1,第一銷32R的向下推動量及第一感測器90在此處被打開之可動構件91的傾斜角度在某些情況下不具有預定的關係。 When the inclination of the container 5 falls within the allowable range, there is no problem in the conveyance of the substrate W. However, if the inclination of the container 5 exceeds the allowable range, a problem may occur such that the terminator 60 of the substrate transfer robot 6 cannot transfer the substrate W properly. Therefore, it is preferable to distinguish the inclination of the container 5 that allows the transfer of the substrate W. For example, if the tilt angle of the movable member 91 is θ4 (<θ2), the first sensor 90 will not generate an ON signal. However, depending on individual differences or attachment errors of the first detection unit 9, for each loading port 1, the downward pushing amount of the first pin 32R and the inclination angle of the movable member 91 at which the first sensor 90 is opened do not have a predetermined relationship in some cases.

因此,可提供用於第一檢測單元9的位置調整機構。當可針對每一個裝載埠1調整第一檢測單元9的位置時,可將第一銷32R的向下推動量及第一感測器90在此處被打開之可動構件91的傾斜角度調整為預定的值,且能夠可靠地檢測出處於超過不允許的傾斜範圍的姿勢之容器5被放置在對接板30上。 Therefore, a position adjustment mechanism for the first detection unit 9 can be provided. When the position of the first detection unit 9 can be adjusted for each loading port 1, the downward pushing amount of the first pin 32R and the inclination angle of the movable member 91 at which the first sensor 90 is opened can be adjusted to predetermined values, and it is possible to reliably detect that the container 5 placed on the docking plate 30 is in a posture exceeding the permissible inclination range.

位置調整機構可為任何機構。作為範例,托架9a具有附接位置調整功能的結構為簡單的。圖15是具有位置調整功能的托架9a的透視圖。 The position adjustment mechanism can be any mechanism. As an example, the structure in which the bracket 9a has the attachment position adjustment function is simple. Fig. 15 is a perspective view of the bracket 9a having a position adjustment function.

托架9a是L形的金屬配件,且包括用於將第一檢測單元9附接到托架9a的附接孔H1、以及用於將托架9a附接到基部部分7的附接孔H2。在第一檢測單元9中,在第一感測器90的情況下,形成有螺紋孔(未顯出)。在螺釘被插入附接孔H1內並緊固至螺紋孔時,第一檢測單元9被固定至托架9a。螺紋孔(未顯示)亦形成在基部部分7中。當螺釘透過附接孔H2被緊固至螺紋孔時,托架9a被固定至基部部分7。 The bracket 9 a is an L-shaped metal fitting, and includes an attachment hole H1 for attaching the first detection unit 9 to the bracket 9 a , and an attachment hole H2 for attaching the bracket 9 a to the base portion 7 . In the first detection unit 9, in the case of the first sensor 90, a screw hole (not shown) is formed. When a screw is inserted into the attachment hole H1 and fastened to the threaded hole, the first detection unit 9 is fixed to the bracket 9a. Threaded holes (not shown) are also formed in the base portion 7 . When a screw is fastened to the threaded hole through the attachment hole H2 , the bracket 9 a is fixed to the base portion 7 .

附接孔H1是在Z方向上延伸的長孔。因此,能夠調整第一檢測單元9相對於托架9a在Z方向上的附接位置。附接孔H2是在X方向上延伸的長孔。因此,能夠調整托架9a相對於基部部分7在X方向上的附接位置。因此,能夠調整第一檢測單元9相對於第一銷32R在Z方向和X方向上的位置。 The attachment hole H1 is a long hole extending in the Z direction. Therefore, it is possible to adjust the attachment position of the first detection unit 9 in the Z direction with respect to the bracket 9a. The attachment hole H2 is a long hole extending in the X direction. Therefore, it is possible to adjust the attachment position of the bracket 9 a in the X direction with respect to the base portion 7 . Therefore, it is possible to adjust the position of the first detection unit 9 in the Z direction and the X direction with respect to the first pin 32R.

當調整第一檢測單元9的位置時,第一檢測單元9經由托架9a被暫時地固定至基部部分7。作為測試,有意地將處於超過不允許的傾斜範圍的姿勢之容器5放置在對接板30上,並監測當對接板30從傳送位置被移動到對接位置時之第一感測器90的輸出。如果第一感測器90輸出 ON信號,第一檢測單元9的位置為不適當的。因此,例如,朝PP側調整第一檢測單元9在X方向上的位置。或者,降低第一檢測單元9在Z方向上的位置。 When the position of the first detection unit 9 is adjusted, the first detection unit 9 is temporarily fixed to the base portion 7 via the bracket 9 a. As a test, the container 5 is intentionally placed on the docking plate 30 in a posture beyond the permissible range of inclination, and the output of the first sensor 90 is monitored when the docking plate 30 is moved from the transfer position to the docking position. If the first sensor 90 outputs ON signal, the position of the first detection unit 9 is inappropriate. Therefore, for example, the position of the first detection unit 9 in the X direction is adjusted toward the PP side. Alternatively, lower the position of the first detection unit 9 in the Z direction.

另外,作為測試,將處於允許傾斜範圍內的正常姿勢之容器5放置在對接板30上,並監測當對接板30從傳送位置被移動到對接位置時之第一感測器90的輸出。如果第一感測器90未輸出ON信號,第一檢測單元9的位置為不適當的。因此,例如,朝與PP側相反的一側調整第一檢測單元9在X方向上的位置。或者,升高第一檢測單元9在Z方向上的位置。因此,可適當地調整第一檢測單元9的位置,且可更可靠地檢測容器5以不適當的姿勢被放置之狀態。 In addition, as a test, the container 5 in a normal posture within the allowable tilt range is placed on the docking plate 30, and the output of the first sensor 90 when the docking plate 30 is moved from the transfer position to the docking position is monitored. If the first sensor 90 does not output an ON signal, the position of the first detection unit 9 is inappropriate. Therefore, for example, the position of the first detection unit 9 in the X direction is adjusted toward the side opposite to the PP side. Alternatively, the position of the first detection unit 9 in the Z direction is raised. Therefore, the position of the first detection unit 9 can be appropriately adjusted, and the state in which the container 5 is placed in an inappropriate posture can be more reliably detected.

<第五實施例> <Fifth Embodiment>

在上述實施例中,作為第一檢測單元9,採用了與第一銷32R接觸之接觸式檢測單元。但是,亦可採用非接觸式檢測單元。圖16顯示代替第一檢測單元9的非接觸式檢測單元13。 In the above-described embodiments, as the first detection unit 9, a contact type detection unit that contacts the first pin 32R is employed. However, a non-contact detection unit may also be used. FIG. 16 shows a non-contact detection unit 13 instead of the first detection unit 9 .

檢測單元13為非接觸式感測器,例如,近接 感測器,其檢測檢測目標13a的接近性,且為,例如,磁式近接感測器、靜電電容式近接感測器、或電磁感應式近接感測器。雖然檢測目標13a被一體地設置在第一銷32R的下端部分處,但較佳地,檢測目標13a被與第一銷32R一體地設置,且由與第一銷32R相同的金屬製成,例如,鐵或鋁,或者,根據以下近接感測器的類型,僅檢測目標13a由磁鐵製成。 The detection unit 13 is a non-contact sensor, for example, a proximity The sensor detects the proximity of the detection target 13a, and is, for example, a magnetic proximity sensor, an electrostatic capacitive proximity sensor, or an electromagnetic induction proximity sensor. Although the detection target 13a is provided integrally at the lower end portion of the first pin 32R, preferably, the detection target 13a is provided integrally with the first pin 32R and is made of the same metal as the first pin 32R, for example, iron or aluminum, or, depending on the type of the proximity sensor below, only the detection target 13a is made of a magnet.

磁式近接感測器由舌簧開關(reed switch)、霍耳元件(hall element)或磁阻元件所構成。當使用由舌簧開關所構成的磁式近接感測器時,檢測目標13a由磁鐵製成,且由於磁引力藉由舌簧開關的物理操作來檢測檢測目標13a的接近性。當使用由霍耳元件或磁阻元件所構成的磁式近接感測器時,基於磁場或磁通量的變化來檢測磁鐵的檢測目標13a的接近性。 The magnetic proximity sensor is composed of a reed switch, a hall element or a magnetoresistive element. When a magnetic proximity sensor composed of a reed switch is used, the detection target 13a is made of a magnet, and the proximity of the detection target 13a is detected by physical operation of the reed switch due to magnetic attraction. When a magnetic proximity sensor composed of a Hall element or a magnetoresistive element is used, the proximity of the detection target 13a of the magnet is detected based on a change in the magnetic field or magnetic flux.

靜電電容式近接感測器包括檢測電極、以及作為檢測檢測電極的電容變化之電路的振盪電路(oscillating circuit)。由於檢測電極的電容在檢測目標13a靠近電路時改變,振盪電路可藉由檢測電極的電容的變化來檢測金屬的檢測目標13a的接近性。 The capacitive proximity sensor includes detection electrodes and an oscillating circuit as a circuit for detecting capacitance changes of the detection electrodes. Since the capacitance of the detection electrode changes when the detection target 13 a approaches the circuit, the oscillation circuit can detect the proximity of the metal detection target 13 a through the change in the capacitance of the detection electrode.

電磁感應式近接感測器包括產生交變磁場(alternating magnetic field)的檢測線圈。當金屬導體的檢測目標13a接近交變磁場時,在金屬導體中產生渦電流(eddy current),以衰減(damp)或停止感測器中的振盪電路的振盪,從而檢測到接近電磁感應式近接感測器的檢測目標13a。 The electromagnetic induction proximity sensor includes a detection coil that generates an alternating magnetic field. When the detection target 13a of the metal conductor is close to the alternating magnetic field, an eddy current (eddy current) is generated in the metal conductor to attenuate (damp) or stop the oscillation of the oscillation circuit in the sensor, thereby detecting the detection target 13a approaching the electromagnetic induction proximity sensor.

狀態ST11顯示在容器5未被放置在對接板30上的狀態(第一銷32R未被向下推動的狀態)下對接板30已經被移動到對接位置的情況。由於檢測目標13a和檢測單元13在Z方向上為分開的,檢測目標13a未被檢測單元13檢測到。因此,確定容器5未被適當地放置。 The state ST11 shows a case where the butting plate 30 has been moved to the docking position in a state where the container 5 is not placed on the butting plate 30 (a state where the first pin 32R is not pushed down). Since the detection target 13 a and the detection unit 13 are separated in the Z direction, the detection target 13 a is not detected by the detection unit 13 . Therefore, it was determined that the container 5 was not properly set.

狀態ST12顯示在容器5被適當地放置在對接板30上的狀態(第一銷32R被向下推動的狀態)下對接板30已經被移動到對接位置的情況。由於檢測目標13a和檢測單元13為鄰近的,檢測目標13a被檢測單元13檢測到。因此,確定容器5被適當地放置。 The state ST12 shows a case where the butting plate 30 has been moved to the docking position in a state where the container 5 is properly placed on the butting plate 30 (a state where the first pin 32R is pushed down). Since the detection target 13 a and the detection unit 13 are adjacent, the detection target 13 a is detected by the detection unit 13 . Therefore, it was determined that the container 5 was properly placed.

如果檢測單元13是根據檢測目標13a的接近程度而輸出檢測信號的感測器,亦可檢測到的是,在第四實施例中所描述之容器5被放置同時在Y方向上傾斜、以及第一銷32R未被充分向下推動的狀態。 If the detection unit 13 is a sensor that outputs a detection signal according to the proximity of the detection target 13a, it can also be detected that the container 5 described in the fourth embodiment is placed while being inclined in the Y direction, and the state in which the first pin 32R is not sufficiently pushed down.

圖17顯示代替第一檢測單元9的另一個非接觸式檢測單元14。圖17是視線方向不同於圖16的視圖。圖17顯示從在X方向上的視線觀察的第一銷32R的周邊。檢測單元14為包括發光元件14a及光接收元件14b的光學感測器,且為,例如,光遮斷器。兩點鏈線L2指示來自發光元件14a的光的軌道(orbit)。 FIG. 17 shows another non-contact detection unit 14 instead of the first detection unit 9 . FIG. 17 is a view in which the viewing direction is different from that of FIG. 16 . FIG. 17 shows the periphery of the first pin 32R viewed from a line of sight in the X direction. The detection unit 14 is an optical sensor including a light emitting element 14a and a light receiving element 14b, and is, for example, a photointerrupter. A two-dot chain line L2 indicates an orbit of light from the light emitting element 14a.

狀態ST21顯示在容器5未被放置在對接板30上的狀態(第一銷32R未被向下推動的狀態)下對接板30已經被移動到對接位置的情況。由於第一銷32R未遮擋光的軌道L2,檢測單元14未檢測到第一銷32R。因此,確定容器5未被適當地放置。 The state ST21 shows a case where the butting plate 30 has been moved to the docking position in a state where the container 5 is not placed on the butting plate 30 (a state where the first pin 32R is not pushed down). Since the first pin 32R does not block the track L2 of light, the detection unit 14 does not detect the first pin 32R. Therefore, it was determined that the container 5 was not properly set.

狀態ST22顯示在容器5被適當地放置在對接板30上的狀態(第一銷32R被向下推動的狀態)下對接板30已經被移動到對接位置的情況。由於第一銷32R遮擋光的軌道L2,檢測單元14檢測到第一銷32R。因此,確定容器5被適當地放置。 The state ST22 shows a case where the butting plate 30 has been moved to the docking position in a state where the container 5 is properly placed on the butting plate 30 (a state where the first pin 32R is pushed down). Since the first pin 32R blocks the track L2 of light, the detection unit 14 detects the first pin 32R. Therefore, it was determined that the container 5 was properly placed.

如果檢測單元14是根據第一銷32R對光的軌道L2的遮擋程度(光接收元件14b的光接收量的程度)而輸出檢測信號的感測器,亦可檢測到的是,在第四實施例中 所描述之容器5被放置同時在Y方向上傾斜、以及第一銷32R未被充分向下推動的狀態。 If the detection unit 14 is a sensor that outputs a detection signal according to the degree of blocking of the light track L2 by the first pin 32R (the degree of the light receiving amount of the light receiving element 14b), it can also be detected that in the fourth embodiment A state is described in which the container 5 is placed while being inclined in the Y direction, and the first pin 32R is not sufficiently pushed down.

本發明不限於前述實施例,且在本發明的精神內,各種變型/改變為可能的。 The present invention is not limited to the foregoing embodiments, and various modifications/changes are possible within the spirit of the present invention.

7:基部部分 7: Base part

8:移動機構 8: Mobile mechanism

9:檢測單元 9: Detection unit

9a:托架 9a: Bracket

10a:感測器 10a: Sensor

30:對接板 30: Butt plate

31:定位銷 31: Locating pin

32F:檢測銷 32F: detection pin

32R:檢測銷 32R: detection pin

34:驅動機構 34: Driving mechanism

35:支撐部分 35: Support part

80:導軌構件 80: rail components

81:滑動件 81: Slider

81a:接合構件 81a: Joining member

81b:立柱 81b: column

81c:連接部分 81c: Connection part

82:驅動機構 82: Driving mechanism

90:感測器 90: sensor

91:可動構件 91: Movable components

91a:輥部分 91a: roller part

820:驅動單元 820: drive unit

820a:馬達 820a: motor

820b:輸出軸 820b: output shaft

821:臂構件 821: arm member

822:凸輪從動件 822: Cam follower

823:凸輪板 823: Cam plate

PP:側部 PP: side

Claims (14)

一種裝載埠,包括: 埠板,包括開口部分,通過該開口部分能夠放入和取出基板; 放置台,儲存該基板的容器被放置在該放置台上; 埠門,能夠打開/關閉該開口部分並保持該容器的門部分;以及 驅動機構,被構造成執行該埠門的打開/關閉操作, 其中,該放置台包括: 基部部分; 對接板,該容器被放置在該對接板上; 移動機構,被設置在該基部部分上,且被構造成支撐該對接板並使該對接板在第一位置及第二位置之間移動,該第一位置靠近該埠板之該埠門能保持該門部分的一側部,該第二位置遠離該埠板; 第一銷,在該對接板上突出並設置在該對接板上,以便被向下推動;及 第一檢測單元,被設置在該基部部分上且被構造成檢測該對接板被定位在該第一位置, 該第一檢測單元包括: 可動構件,能夠藉由該移動機構在該對接板的移動方向上相對於該基部部分位移;及第一感測器,被構造成檢測該可動構件的位移,並且 在該對接板從該第二位置移動到該第一位置的過程中,該可動構件被佈置在抵靠於處於被向下推動狀態之該第一銷的位置處。A loadport comprising: a port plate including an opening portion through which a substrate can be inserted and removed; a placing table on which the container for storing the substrate is placed; A port door capable of opening/closing the opening portion and holding the door portion of the container; and a driving mechanism configured to perform an opening/closing operation of the port door, Among them, the placement table includes: base part; a docking plate on which the container is placed; a movement mechanism disposed on the base portion and configured to support the docking plate and move the docking plate between a first position close to the port plate retaining a side of the door portion and a second position remote from the port plate; a first pin protruding from and disposed on the butt plate so as to be pushed downward; and a first detection unit, disposed on the base portion and configured to detect that the docking plate is positioned in the first position, The first detection unit includes: a movable member capable of being displaced relative to the base portion in a moving direction of the docking plate by the moving mechanism; and a first sensor configured to detect the displacement of the movable member, and During movement of the abutment plate from the second position to the first position, the movable member is arranged in a position against the first pin in a pushed-down state. 如請求項1之裝載埠,還包括控制單元,該控制單元被構造成基於該第一感測器的檢測結果來確定該對接板是否已經到達該第一位置,且作為一個條件當確定該對接板已經到達該第一位置時,驅動該驅動機構。The loading port according to claim 1, further comprising a control unit configured to determine whether the docking plate has reached the first position based on the detection result of the first sensor, and drive the driving mechanism as a condition when it is determined that the docking plate has reached the first position. 如請求項1之裝載埠,還包括: 第二檢測單元,被構造成檢測該容器是否被放置在該對接板上;及 第三檢測單元,被構造成檢測該容器是否被放置在該對接板上, 其中,該第二檢測單元包括: 第二銷,在該對接板上突出並設置在該對接板上,以便被向下推動;及 第二感測器,被支撐在該對接板上且被構造成檢測該第二銷已經被向下推動,並且 該第三檢測單元包括: 第三銷,在該對接板上突出並設置在該對接板上,以便被向下推動;及 第三感測器,被支撐在該對接板上且被構造成檢測該第三銷已經被推動。As for the loading port of claim 1, it also includes: a second detection unit configured to detect whether the container is placed on the docking plate; and a third detection unit configured to detect whether the container is placed on the docking plate, Wherein, the second detection unit includes: a second pin protruding from and disposed on the butt plate so as to be pushed downward; and a second sensor, supported on the docking plate and configured to detect that the second pin has been pushed downward, and The third detection unit includes: a third pin protruding from and disposed on the butt plate so as to be pushed downward; and A third sensor is supported on the docking plate and configured to detect that the third pin has been pushed. 如請求項3之裝載埠,其中, 該第一銷、該第二銷及該第三銷中的兩個銷在該移動方向上被佈置在該埠板的一側上,同時在與該移動方向交叉的方向上被分開, 除了該兩個銷以外的其餘的銷相較於該兩個銷在該移動方向上被佈置在距離該埠板更遠的位置處,並且 在該對接板的平面視圖中,該第一銷、該第二銷及該第三銷被佈置成被定位在一銳角三角形的頂點處。Such as the loading port of claim 3, wherein, two of the first pin, the second pin, and the third pin are arranged on one side of the port plate in the moving direction while being separated in a direction crossing the moving direction, The rest of the pins except the two pins are arranged farther from the port plate in the direction of movement than the two pins, and In a plan view of the butt plate, the first pin, the second pin and the third pin are arranged to be positioned at the vertices of an acute triangle. 如請求項4之裝載埠,其中,該第一銷是該兩個銷中的一個。The load port of claim 4, wherein the first pin is one of the two pins. 如請求項3之裝載埠,還包括控制單元,該控制單元被構造成基於該第一感測器的檢測結果來確定該對接板是否已經到達該第一位置,且在確定該對接板已經到達該第一位置的至少一個條件下,驅動該驅動機構, 其中,當該第二感測器檢測到該第二銷的向下推動、該第三感測器檢測到該第三銷的向下推動、且該第一感測器檢測到該對接板被定位在該第一位置時,該控制單元藉由該驅動機構來開始該埠門的該打開/關閉操作。The loading port according to claim 3, further comprising a control unit configured to determine whether the docking plate has reached the first position based on the detection result of the first sensor, and drive the drive mechanism under at least one condition that determines that the docking plate has reached the first position, Wherein, when the second sensor detects the downward push of the second pin, the third sensor detects the downward push of the third pin, and the first sensor detects that the docking plate is positioned at the first position, the control unit starts the opening/closing operation of the port door through the driving mechanism. 如請求項3之裝載埠,還包括控制單元,該控制單元被構造成基於該第一感測器的檢測結果來確定該對接板是否已經到達該第一位置,且在確定該對接板已經到達該第一位置的至少一個條件下,驅動該驅動機構, 其中,在該埠板的該側部上設有基板輸送模組,且在該基板輸送模組中設有基板輸送機器人,該基板輸送機器人被構造成經由該開口部分在該基板輸送模組和該容器之間放入或取出該基板,並且 當該第二感測器檢測到該第二銷的向下推動、該第三感測器檢測到該第三銷的向下推動、且該第一感測器檢測到該對接板被定位在該第一位置時,該控制單元發送用於允許該基板輸送機器人操作的信號。The loading port according to claim 3, further comprising a control unit configured to determine whether the docking plate has reached the first position based on the detection result of the first sensor, and drive the drive mechanism under at least one condition that determines that the docking plate has reached the first position, Wherein, a substrate transfer module is provided on the side of the port plate, and a substrate transfer robot is provided in the substrate transfer module, the substrate transfer robot is configured to put in or take out the substrate between the substrate transfer module and the container through the opening portion, and When the second sensor detects the downward push of the second pin, the third sensor detects the downward push of the third pin, and the first sensor detects that the docking plate is positioned at the first position, the control unit sends a signal for allowing the substrate transfer robot to operate. 一種裝載埠,包括: 埠板,包括開口部分,通過該開口部分能夠放入和取出基板; 放置台,儲存該基板的容器被放置在該放置台上; 埠門,能夠打開/關閉該開口部分並保持該容器的門部分;以及 驅動機構,被構造成執行該埠門的打開/關閉操作, 其中,該放置台包括: 基部部分; 對接板,該容器被放置在該對接板上; 移動機構,被設置在該基部部分上,且被構造成支撐該對接板並使該對接板在第一位置和第二位置之間移動,該第一位置靠近該埠板之該埠門能保持該門部分的一側部,該第二位置遠離該埠板; 第一銷,在該對接板上突出並設置在該對接板上,以便被向下推動;及 第一檢測單元,被設置在該基部部分上且被構造成檢測該對接板被定位在該第一位置,並且 該第一檢測單元包括非接觸式感測器,在該對接板從該第二位置移動到該第一位置的過程中,該非接觸式感測器檢測處於被向下推動狀態的該第一銷。A loadport comprising: a port plate including an opening portion through which a substrate can be inserted and removed; a placing table on which the container for storing the substrate is placed; A port door capable of opening/closing the opening portion and holding the door portion of the container; and a driving mechanism configured to perform an opening/closing operation of the port door, Among them, the placement table includes: base part; a docking plate on which the container is placed; a movement mechanism disposed on the base portion and configured to support the docking plate and move the docking plate between a first position proximate to the port plate retaining a side of the door portion and a second position remote from the port plate; a first pin protruding from and disposed on the butt plate so as to be pushed downward; and a first detection unit disposed on the base portion and configured to detect that the docking plate is positioned at the first position, and The first detection unit includes a non-contact sensor that detects the first pin in a state of being pushed down during the process of the butt plate moving from the second position to the first position. 如請求項8之裝載埠,還包括控制單元,該控制單元被構造成基於該非接觸式感測器的檢測結果來確定該對接板是否已經到達該第一位置,並作為一個條件當確定該對接板已經到達該第一位置時,驅動該驅動機構。The loading port as claimed in claim 8, further comprising a control unit configured to determine whether the docking plate has reached the first position based on the detection result of the non-contact sensor, and drive the driving mechanism as a condition when it is determined that the docking plate has reached the first position. 如請求項8之裝載埠,還包括: 第二檢測單元,被構造成檢測該容器是否被放置在該對接板上;以及 第三檢測單元,被構造成檢測該容器是否被放置在該對接板上, 其中,該第二檢測單元包括: 第二銷,在該對接板上突出並設置在該對接板上,以便被向下推動;及 第二感測器,被支撐在該對接板上且被構造成檢測該第二銷已經被向下推動,並且 該第三檢測單元包括: 第三銷,在該對接板上突出並設置在該對接板上,以便被向下推動;及 第三感測器,被支撐在該對接板上且被構造成檢測該第三銷已經被推動。Such as the loading port of claim item 8, it also includes: a second detection unit configured to detect whether the container is placed on the docking plate; and a third detection unit configured to detect whether the container is placed on the docking plate, Wherein, the second detection unit includes: a second pin protruding from and disposed on the butt plate so as to be pushed downward; and a second sensor, supported on the docking plate and configured to detect that the second pin has been pushed downward, and The third detection unit includes: a third pin protruding from and disposed on the butt plate so as to be pushed downward; and A third sensor is supported on the docking plate and configured to detect that the third pin has been pushed. 如請求項10之裝載埠,其中, 該第一銷、該第二銷及該第三銷中的兩個銷在該對接板的該移動方向上被佈置在該埠板的一側上,同時在與該移動方向交叉的方向上被分開, 除了該兩個銷以外的其餘的銷相較於該兩個銷在該移動方向上被佈置在距離該埠板更遠的位置處,並且 在該對接板的平面視圖中,該第一銷、該第二銷及該第三銷被佈置成被定位在一銳角三角形的頂點處。Such as the loading port of claim item 10, wherein, Two of the first pin, the second pin, and the third pin are arranged on one side of the port plate in the moving direction of the butting plate while being separated in a direction crossing the moving direction, The rest of the pins except the two pins are arranged farther from the port plate in the direction of movement than the two pins, and In a plan view of the butt plate, the first pin, the second pin and the third pin are arranged to be positioned at the vertices of an acute triangle. 如請求項11之裝載埠,其中,該第一銷是該兩個銷中的一個。The load port of claim 11, wherein the first pin is one of the two pins. 如請求項10之裝載埠,還包括控制單元,該控制單元被構造成基於該非接觸式感測器的檢測結果來確定該對接板是否已經到達該第一位置,且在確定該對接板已經到達該第一位置的至少一個條件下,驅動該驅動機構, 其中,當該第二感測器檢測到該第二銷的向下推動、該第三感測器檢測到該第三銷的向下推動、且該非接觸式感測器檢測到該對接板被定位在該第一位置時,該控制單元藉由該驅動機構來開始該埠門的該打開/關閉操作。The loading port according to claim 10, further comprising a control unit configured to determine whether the docking plate has reached the first position based on the detection result of the non-contact sensor, and drive the driving mechanism under at least one condition that determines that the docking plate has reached the first position, Wherein, when the second sensor detects the downward push of the second pin, the third sensor detects the downward push of the third pin, and the non-contact sensor detects that the docking plate is positioned at the first position, the control unit starts the opening/closing operation of the port door through the driving mechanism. 如請求項10之裝載埠,還包括控制單元,該控制單元被構造成基於該非接觸式感測器的檢測結果來確定該對接板是否已經到達該第一位置,且在確定該對接板已經到達該第一位置的至少一個條件下,驅動該驅動機構, 其中,在該埠板的該側部上設有基板輸送模組,且在該基板輸送模組中設有基板輸送機器人,該基板輸送機器人被構造成經由該開口部分在該基板輸送模組和該容器之間放入或取出該基板,並且 當該第二感測器檢測到該第二銷的向下推動、該第三感測器檢測到該第三銷的向下推動、且該非接觸式感測器檢測到該對接板被定位在該第一位置時,該控制單元發送用於允許該基板輸送機器人操作的信號。The loading port according to claim 10, further comprising a control unit configured to determine whether the docking plate has reached the first position based on the detection result of the non-contact sensor, and drive the driving mechanism under at least one condition that determines that the docking plate has reached the first position, Wherein, a substrate transfer module is provided on the side of the port plate, and a substrate transfer robot is provided in the substrate transfer module, the substrate transfer robot is configured to put in or take out the substrate between the substrate transfer module and the container through the opening portion, and When the second sensor detects the downward push of the second pin, the third sensor detects the downward push of the third pin, and the non-contact sensor detects that the docking plate is positioned at the first position, the control unit sends a signal for allowing the substrate transfer robot to operate.
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Publication number Priority date Publication date Assignee Title
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Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003142551A (en) * 2001-11-02 2003-05-16 Hirata Corp Placement apparatus
TW200733289A (en) * 2005-07-11 2007-09-01 Brooks Automation Inc Load port module
JP2009200200A (en) * 2008-02-21 2009-09-03 Tdk Corp Method of closing sealed container lid, and system for opening and closing sealed container lid
KR20110024474A (en) * 2009-09-02 2011-03-09 주식회사 싸이맥스 Stage moving device
JP2013219159A (en) * 2012-04-07 2013-10-24 Hirata Corp Carry-in/out apparatus and carry-in/out method of container for housing substrate
US8596312B2 (en) * 2010-03-05 2013-12-03 Sinfonia Technology Co., Ltd. Gas charging apparatus, gas discharging apparatus, gas charging method, and gas discharging method
US9786534B2 (en) * 2013-09-09 2017-10-10 Sinfonia Technology Co., Ltd. Efem

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4093206B2 (en) * 2004-05-18 2008-06-04 村田機械株式会社 Transport vehicle system
KR100706250B1 (en) * 2005-07-07 2007-04-12 삼성전자주식회사 Apparatus and method for manufacturing semiconductor devices
KR100707881B1 (en) * 2005-09-23 2007-04-13 삼성전자주식회사 System and method for transferring substrates and method for aligning substrates
JP5211808B2 (en) * 2008-04-01 2013-06-12 株式会社安川電機 Load port and semiconductor manufacturing apparatus having the same
JP2011181817A (en) * 2010-03-03 2011-09-15 Hitachi Kokusai Electric Inc Substrate processing apparatus
TWM600933U (en) * 2020-05-07 2020-09-01 鈦昇科技股份有限公司 Wafer loading and unloading machine

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003142551A (en) * 2001-11-02 2003-05-16 Hirata Corp Placement apparatus
TW200733289A (en) * 2005-07-11 2007-09-01 Brooks Automation Inc Load port module
JP2009200200A (en) * 2008-02-21 2009-09-03 Tdk Corp Method of closing sealed container lid, and system for opening and closing sealed container lid
KR20110024474A (en) * 2009-09-02 2011-03-09 주식회사 싸이맥스 Stage moving device
US8596312B2 (en) * 2010-03-05 2013-12-03 Sinfonia Technology Co., Ltd. Gas charging apparatus, gas discharging apparatus, gas charging method, and gas discharging method
JP2013219159A (en) * 2012-04-07 2013-10-24 Hirata Corp Carry-in/out apparatus and carry-in/out method of container for housing substrate
US9786534B2 (en) * 2013-09-09 2017-10-10 Sinfonia Technology Co., Ltd. Efem

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