TWI804485B - Insulation-coated conductive particle, anisotropic conductive film, method for producing anisotropic conductive film, bonded structure, and method for producing bonded structure - Google Patents

Insulation-coated conductive particle, anisotropic conductive film, method for producing anisotropic conductive film, bonded structure, and method for producing bonded structure Download PDF

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TWI804485B
TWI804485B TW107102936A TW107102936A TWI804485B TW I804485 B TWI804485 B TW I804485B TW 107102936 A TW107102936 A TW 107102936A TW 107102936 A TW107102936 A TW 107102936A TW I804485 B TWI804485 B TW I804485B
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particles
insulating
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adhesive layer
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TW201834091A (en
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森谷敏光
伊澤弘行
赤井邦彦
市村剛幸
田中勝
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日商力森諾科股份有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01BCABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B1/00Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
    • H01B1/20Conductive material dispersed in non-conductive organic material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01BCABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B5/00Non-insulated conductors or conductive bodies characterised by their form
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K9/00Use of pretreated ingredients
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J9/00Adhesives characterised by their physical nature or the effects produced, e.g. glue sticks
    • C09J9/02Electrically-conducting adhesives
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01BCABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B1/00Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01BCABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B13/00Apparatus or processes specially adapted for manufacturing conductors or cables
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01BCABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B13/00Apparatus or processes specially adapted for manufacturing conductors or cables
    • H01B13/0026Apparatus for manufacturing conducting or semi-conducting layers, e.g. deposition of metal
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01BCABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B5/00Non-insulated conductors or conductive bodies characterised by their form
    • H01B5/16Non-insulated conductors or conductive bodies characterised by their form comprising conductive material in insulating or poorly conductive material, e.g. conductive rubber
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/01Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts characterised by the form or arrangement of the conductive interconnection between the connecting locations
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R43/00Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K2201/00Specific properties of additives
    • C08K2201/001Conductive additives

Abstract

絕緣被覆導電粒子具備具有導電性的基材粒子、與被覆該基材粒子的表面的絕緣性微粒子,且具有每單位面積的絕緣性微粒子數少或為0的疏區域、與每單位面積的絕緣性微粒子數較疏區域更多的密區域。Insulation-coated conductive particles have conductive substrate particles, and insulating fine particles covering the surface of the substrate particles, and have a sparse region where the number of insulating fine particles per unit area is small or zero, and insulating particles per unit area. A dense area with more fine particles than a sparse area.

Description

絕緣被覆導電粒子、各向異性導電膜、各向異性導電膜的製造方法、連接結構體及連接結構體的製造方法Insulation-coated conductive particle, anisotropic conductive film, method for producing anisotropic conductive film, bonded structure, and method for producing bonded structure

本發明是有關於一種絕緣被覆導電粒子、各向異性導電膜、各向異性導電膜的製造方法、連接結構體及連接結構體的製造方法。 The present invention relates to an insulating coated conductive particle, an anisotropic conductive film, a manufacturing method of the anisotropic conductive film, a bonded structure and a method for manufacturing the bonded structure.

先前,例如於液晶顯示器與帶載封裝(Tape Carrier Package,TCP)的連接、柔性印刷基板(Flexible Printed Circuit,FPC)與TCP的連接、或者FPC與印刷配線板的連接中使用使導電粒子分散於接著劑膜中的各向異性導電膜。另外,於將半導體矽晶片安裝於基板的情況下,亦進行將半導體矽晶片直接安裝於基板的所謂的玻璃覆晶(Chip On Glass,COG)來代替先前的打線接合(wire bonding),此處亦使用各向異性導電膜。 Previously, for example, in the connection of liquid crystal display and tape carrier package (Tape Carrier Package, TCP), the connection of flexible printed circuit board (Flexible Printed Circuit, FPC) and TCP, or the connection of FPC and printed wiring board, conductive particles are dispersed in Anisotropic conductive film in adhesive film. In addition, in the case of mounting a semiconductor silicon chip on a substrate, a so-called Chip On Glass (COG) in which a semiconductor silicon chip is directly mounted on a substrate is also performed instead of the previous wire bonding. Anisotropic conductive films are also used.

近年來,隨著電子設備的發展,正進行配線的高密度化及電路的高功能化。其結果,要求如連接電極間的間隔例如為15μm以下的連接結構體,連接構件的凸塊電極亦實現小面積化。為了於經小面積化的凸塊連接中獲得穩定的電性連接,需要使充分個數的導電粒子介隔存在於凸塊電極與基板側的電路電極之間。 In recent years, along with the development of electronic equipment, the densification of wiring and the enhancement of functionality of circuits are progressing. As a result, there is a demand for a bonded structure in which the interval between the connection electrodes is, for example, 15 μm or less, and the area of the bump electrodes of the connection member is also reduced. In order to obtain a stable electrical connection in the small-area bump connection, a sufficient number of conductive particles needs to be interposed between the bump electrode and the circuit electrode on the substrate side.

針對此種課題,於專利文獻1及專利文獻2中提出如下內容:使導電粒子以一定比例偏在於基板側,並且使導電粒子以 均等間隔進行排列,藉此提高凸塊電極與電路電極的導電粒子的捕捉性,並且提高狹小化的相鄰的電路電極間的絕緣性。 In order to solve such a problem, Patent Document 1 and Patent Document 2 propose the following content: the conductive particles are biased to the substrate side at a certain ratio, and the conductive particles are By arranging them at equal intervals, the catchability of conductive particles of the bump electrodes and the circuit electrodes is improved, and the insulation between the narrowed adjacent circuit electrodes is improved.

[現有技術文獻] [Prior art literature] [專利文獻] [Patent Document]

[專利文獻1]日本專利特表2009-535843號公報 [Patent Document 1] Japanese Patent Application Laid-Open No. 2009-535843

[專利文獻2]日本專利特開2015-25104號公報 [Patent Document 2] Japanese Patent Laid-Open No. 2015-25104

然而,於所述先前的方法中,導電粒子以均等間隔進行排列,從而可提高導電粒子的捕捉性,並提高連接可靠性,但於電路連接時各向異性導電膜熔融並流動,因此以均等間隔進行排列的導電粒子亦有可能流動,存在產生相鄰的電路電極間的絕緣性降低的問題的擔憂。 However, in the above-mentioned prior method, the conductive particles are arranged at equal intervals, thereby improving the catchability of the conductive particles and improving the connection reliability, but the anisotropic conductive film melts and flows when the circuit is connected, so the uniform Conductive particles arranged at intervals may also flow, and there is a possibility that a problem of lowering the insulation between adjacent circuit electrodes may occur.

本發明的目的在於提供一種於具有對向的電極的電路構件彼此的連接中,可兼顧對向的電極間的連接可靠性的確保與電路構件內的相鄰的電極彼此的絕緣性的確保的絕緣被覆導電粒子及各向異性導電膜,各向異性導電膜的製造方法,以及可兼顧對向的電極間的連接可靠性與電路構件內的相鄰的電極彼此的絕緣性的連接結構體及連接結構體的製造方法。 An object of the present invention is to provide a method for connecting circuit members having opposing electrodes that can ensure both the reliability of the connection between the opposing electrodes and the insulation between adjacent electrodes in the circuit members. Insulation-coated conductive particles, anisotropic conductive film, method for producing the anisotropic conductive film, and a connection structure capable of achieving both connection reliability between opposing electrodes and insulation between adjacent electrodes in a circuit member, and A method of manufacturing a connected structure.

本發明提供一種第1絕緣被覆導電粒子,其具備具有導電性的基材粒子、與被覆該基材粒子的表面的絕緣性微粒子,且 具有每單位面積的絕緣性微粒子數少或為0的疏區域、與每單位面積的絕緣性微粒子數較疏區域更多的密區域。 The present invention provides a first insulating-coated conductive particle comprising a conductive substrate particle and insulating fine particles covering the surface of the substrate particle, and A sparse region having a small or zero number of insulating fine particles per unit area and a dense region having a larger number of insulating fine particles per unit area than the sparse region.

本發明的第1絕緣被覆導電粒子可藉由所述密區域來確保粒子彼此接觸時的絕緣性,並可藉由所述疏區域來確保導電特性。 In the first insulating-coated conductive particle of the present invention, insulation when the particles are in contact with each other can be ensured by the dense region, and electrical conductivity can be ensured by the sparse region.

本發明的第1絕緣被覆導電粒子可具有中心軸所通過的兩個所述疏區域,所述中心軸通過所述基材粒子的中心。 The first insulating-coated conductive particle of the present invention may have the two sparse regions through which a central axis passes through the center of the substrate particle.

此種絕緣被覆導電粒子於具有對向的電極的電路構件彼此的連接中,使兩個疏區域分別與對向的電極接觸,藉此可確保對向的電極間的連接可靠性,於接觸其他絕緣被覆導電粒子的情況下,可藉由所述密區域來確保絕緣性。 In the connection between the circuit members having the opposite electrodes, the insulation-coated conductive particles make the two sparse regions respectively contact the opposite electrodes, thereby ensuring the reliability of the connection between the opposite electrodes. In the case of insulating-coated conductive particles, insulation can be ensured by the dense regions.

另外,本發明提供一種第2絕緣被覆導電粒子,其是將具備具有導電性的基材粒子、與被覆該基材粒子的表面的絕緣性微粒子的複合粒子的、位於利用兩個平行的平面切割基材粒子時的兩個球冠區域的絕緣性微粒子的一部分或全部去除而成。 In addition, the present invention provides a second insulating-coated conductive particle, which is a composite particle comprising a conductive substrate particle and insulating fine particles covering the surface of the substrate particle, which is cut by two parallel planes. Part or all of the insulating fine particles in the two spherical cap regions of the substrate particles are removed.

本發明的第2絕緣被覆導電粒子於具有對向的電極的電路構件彼此的連接中,使絕緣性微粒子的一部分或全部被去除的兩個球冠區域分別與對向的電極接觸,從而可確保對向的電極間的連接可靠性,於與其他絕緣被覆導電粒子接觸時,可藉由位於球帶區域的絕緣性微粒子來確保絕緣性。 In the second insulating-coated conductive particle of the present invention, in the connection between circuit members having opposing electrodes, the two spherical cap regions from which a part or all of the insulating fine particles have been removed are respectively in contact with the opposing electrodes, thereby ensuring The connection reliability between the opposing electrodes can be ensured by the insulating fine particles located in the ball band region when they are in contact with other insulating coated conductive particles.

另外,本發明提供一種第3絕緣被覆導電粒子,其具備具有導電性的基材粒子、與被覆該基材粒子的表面的絕緣性微粒 子,絕緣性微粒子偏在於利用兩個平行的平面切割基材粒子時的球帶區域。 In addition, the present invention provides a third insulating-coated conductive particle comprising a conductive substrate particle and insulating fine particles covering the surface of the substrate particle. Particles, the insulating fine particles are partial to the spherical band region when cutting the substrate particles with two parallel planes.

本發明的第3絕緣被覆導電粒子於具有對向的電極的電路構件彼此的連接中,使兩個球冠區域分別與對向的電極接觸,從而可確保對向的電極間的連接可靠性,於與其他絕緣被覆導電粒子接觸時,可藉由偏在於球帶區域的絕緣性微粒子來確保絕緣性。 In the third insulating-coated conductive particle of the present invention, in the connection between circuit members having opposing electrodes, the two spherical cap regions are respectively in contact with the opposing electrodes, so that the connection reliability between the opposing electrodes can be ensured, When in contact with other insulating and coated conductive particles, the insulation can be ensured by the insulating particles that are biased in the ball zone area.

另外,本發明提供一種各向異性導電膜,其具備包含所述本發明的第1、第2或第3絕緣被覆導電粒子與接著劑成分的導電性接著劑層。 Also, the present invention provides an anisotropic conductive film comprising a conductive adhesive layer comprising the first, second, or third insulating-coated conductive particles of the present invention and an adhesive component.

根據本發明的各向異性導電膜,於具有對向的電極的電路構件彼此的連接中,可兼顧對向的電極間的連接可靠性的確保與電路構件內的相鄰的電極彼此的絕緣性的確保。 According to the anisotropic conductive film of the present invention, in the connection between circuit members having opposing electrodes, the insulation between adjacent electrodes in the circuit member can be ensured while taking into account the connection reliability between the opposing electrodes. ensure.

本發明的各向異性導電膜可包含具有中心軸所通過的兩個疏區域的所述本發明的第1絕緣被覆導電粒子,所述中心軸通過基材粒子的中心,該絕緣被覆導電粒子以通過基材粒子的中心且平行於導電性接著劑層的厚度方向的軸通過兩個疏區域的方式進行配置。 The anisotropic conductive film of the present invention may include the first insulating-coated conductive particle of the present invention having two sparse regions through which a central axis passes through the center of the substrate particle, and the insulating-coated conductive particle is An axis passing through the center of the substrate particle and parallel to the thickness direction of the conductive adhesive layer is arranged so as to pass through two sparse regions.

根據此種各向異性導電膜,於具有對向的電極的電路構件彼此的連接中,可使絕緣被覆導電粒子所具有的兩個疏區域分別更確實地與對向的電極接觸,於與其他絕緣被覆導電粒子接觸的情況下,可藉由彼此的密區域來確保絕緣性。藉此,可以更高 水準來兼顧對向的電極間的連接可靠性的確保、與電路構件內的相鄰的電極彼此的絕緣性的確保。 According to such an anisotropic conductive film, in the connection between circuit members having facing electrodes, the two sparse regions included in the insulating-coated conductive particles can be brought into contact with the facing electrodes more reliably, and can be connected with other electrodes. In the case where insulating-coated conductive particles are in contact, insulation can be ensured by mutual dense regions. In this way, higher Ensuring the reliability of the connection between the opposing electrodes and ensuring the insulation between adjacent electrodes in the circuit member are balanced.

本發明的各向異性導電膜可包含所述本發明的第2絕緣被覆導電粒子,該絕緣被覆導電粒子以通過基材粒子的中心且平行於導電性接著劑層的厚度方向的軸通過兩個球冠區域的方式進行配置。 The anisotropic conductive film of the present invention may include the second insulating-coated conductive particle of the present invention, the insulating-coated conductive particle passing through the center of the substrate particle and parallel to the thickness direction of the conductive adhesive layer through two axes. Configured in the form of a spherical cap area.

根據此種各向異性導電膜,於具有對向的電極的電路構件彼此的連接中,可使絕緣被覆導電粒子所具有的兩個球冠區域分別更確實地與對向的電極接觸,於與其他絕緣被覆導電粒子接觸的情況下,可藉由彼此的位於球帶區域的絕緣性微粒子來確保絕緣性。藉此,可以更高水準來兼顧對向的電極間的連接可靠性的確保、與電路構件內的相鄰的電極彼此的絕緣性的確保。 According to such an anisotropic conductive film, in the connection between circuit members having facing electrodes, the two spherical cap regions of the insulating-coated conductive particles can be brought into contact with the facing electrodes more reliably, and the In the case where other insulation-coated conductive particles are in contact, insulation can be ensured by mutual insulating fine particles located in the ball zone region. Thereby, securing of connection reliability between opposing electrodes and securing of insulation between adjacent electrodes in a circuit member can be achieved at a higher level.

本發明的各向異性導電膜可包含所述本發明的第2或第3絕緣被覆導電粒子,該絕緣被覆導電粒子以通過基材粒子的中心且平行於導電性接著劑層的厚度方向的軸與所述兩個平行的平面正交的方式進行配置。 The anisotropic conductive film of the present invention may include the second or third insulating-coated conductive particles of the present invention, and the insulating-coated conductive particles have an axis that passes through the center of the substrate particle and is parallel to the thickness direction of the conductive adhesive layer. Arranged so as to be orthogonal to the two parallel planes.

根據此種各向異性導電膜,於具有對向的電極的電路構件彼此的連接中,可使絕緣被覆導電粒子所具有的兩個球冠區域分別更確實地與對向的電極接觸,於與其他絕緣被覆導電粒子接觸的情況下,可藉由彼此的位於球帶區域的絕緣性微粒子來確保絕緣性。藉此,可以更高水準來兼顧對向的電極間的連接可靠性的確保、與電路構件內的相鄰的電極彼此的絕緣性的確保。 According to such an anisotropic conductive film, in the connection between circuit members having facing electrodes, the two spherical cap regions of the insulating-coated conductive particles can be brought into contact with the facing electrodes more reliably, and the In the case where other insulation-coated conductive particles are in contact, insulation can be ensured by mutual insulating fine particles located in the ball zone region. Thereby, securing of connection reliability between opposing electrodes and securing of insulation between adjacent electrodes in a circuit member can be achieved at a higher level.

另外,本發明提供一種各向異性導電膜的製造方法,其包括:準備具備具有導電性的基材粒子、與被覆該基材粒子的表面的絕緣性微粒子的複合粒子的步驟;將複合粒子收納至設有具有封閉端面的孔的粒子收納構件的孔中的步驟;將自孔露出的複合粒子的位於球冠區域的絕緣性微粒子的一部分或全部去除的步驟;使球冠區域的絕緣性微粒子被去除的複合粒子以球冠區域與第1接著劑層相接的方式自粒子收納構件移動至第1接著劑層上,並使複合粒子的絕緣性微粒子的一部分附著於粒子收納構件的封閉端面而去除,藉此於第1接著劑層上設置絕緣被覆導電粒子的步驟;以及將第2接著劑層貼合於第1接著劑層的配置有絕緣被覆導電粒子之側的步驟。 In addition, the present invention provides a method for producing an anisotropic conductive film, which includes the steps of: preparing composite particles including conductive substrate particles and insulating fine particles covering the surface of the substrate particles; storing the composite particles A step of entering the hole of the particle storage member provided with a hole with a closed end surface; a step of removing part or all of the insulating fine particles in the spherical cap region of the composite particles exposed from the hole; making the insulating fine particles in the spherical cap region The removed composite particles move from the particle storage member to the first adhesive layer in such a manner that the spherical cap region is in contact with the first adhesive layer, and part of the insulating fine particles of the composite particles adheres to the closed end surface of the particle storage member. removing the step of disposing the insulating-coated conductive particles on the first adhesive layer; and attaching the second adhesive layer to the side of the first adhesive layer on which the insulating-coated conductive particles are arranged.

根據本發明的各向異性導電膜的製造方法,可於第1接著劑層上設置具有絕緣性微粒子的一部分或全部被去除的兩個球冠區域的絕緣被覆導電粒子,將第2接著劑層貼合於第1接著劑層,藉此可簡便地形成包含絕緣被覆導電粒子的導電性接著劑層。於該導電性接著劑層中,可以通過基材粒子的中心且平行於導電性接著劑層的厚度方向的軸通過兩個球冠區域的方式配置絕緣被覆導電粒子。 According to the production method of the anisotropic conductive film of the present invention, the insulating coated conductive particles having two spherical cap regions in which a part or all of the insulating fine particles are removed can be provided on the first adhesive layer, and the second adhesive layer By sticking to the first adhesive layer, a conductive adhesive layer containing insulating-coated conductive particles can be easily formed. In this conductive adhesive layer, insulating-coated conductive particles may be arranged so that an axis parallel to the thickness direction of the conductive adhesive layer passing through the center of the substrate particle passes through two spherical cap regions.

另外,本發明的各向異性導電膜的製造方法中,藉由於粒子收納構件設置有規則地排列的孔,可有規則地排列各向異性導電膜內的絕緣被覆導電粒子。另外,藉由調整第1接著劑層及第2接著劑層的厚度,可形成以偏在於導電性接著劑層的兩主面 的其中一側的方式包含絕緣被覆導電粒子的導電性接著劑層。 In addition, in the method for producing an anisotropic conductive film of the present invention, by providing the particle storage member with regularly arranged holes, the insulating-coated conductive particles in the anisotropic conductive film can be regularly arranged. In addition, by adjusting the thickness of the first adhesive layer and the second adhesive layer, it can be formed so that the conductive adhesive layer is biased on both main surfaces of the conductive adhesive layer. One side of the method includes a conductive adhesive layer that insulates and coats conductive particles.

另外,本發明提供一種連接結構體,其具備:第1電路構件,具有凸塊電極;第2電路構件,具有與凸塊電極相對應的電路電極;以及所述本發明的第1、第2或第3絕緣被覆導電粒子,介隔於凸塊電極及電路電極之間並將凸塊電極及電路電極電性連接。 In addition, the present invention provides a connection structure comprising: a first circuit member having bump electrodes; a second circuit member having circuit electrodes corresponding to the bump electrodes; and the first and second aspects of the present invention. Or the third insulation-coated conductive particle is interposed between the bump electrode and the circuit electrode and electrically connected to the bump electrode and the circuit electrode.

本發明的連接結構體藉由所述本發明的第1、第2或第3絕緣被覆導電粒子而將凸塊電極及電路電極連接,因此可兼顧對向的電極間的連接可靠性與電路構件內的相鄰的電極彼此的絕緣性。 The connection structure of the present invention connects the bump electrodes and the circuit electrodes by using the first, second or third insulating-coated conductive particles of the present invention, so that both the connection reliability between the opposing electrodes and the circuit member can be achieved. Insulation between adjacent electrodes inside.

另外,本發明提供一種連接結構體的製造方法,其具有使所述本發明的各向異性導電膜或藉由所述本發明的各向異性導電膜的製造方法而獲得的各向異性導電膜介隔存在於具有凸塊電極的第1電路構件、與具有與凸塊電極相對應的電路電極的第2電路構件之間,並對第1電路構件與第2電路構件進行熱壓接的步驟。 In addition, the present invention provides a method for producing a bonded structure comprising the anisotropic conductive film of the present invention or an anisotropic conductive film obtained by the method for producing an anisotropic conductive film of the present invention. A step of thermocompression bonding the first circuit member and the second circuit member with a spacer between the first circuit member having bump electrodes and the second circuit member having circuit electrodes corresponding to the bump electrodes .

根據本發明的連接結構體的製造方法,可獲得兼顧對向的電極間的連接可靠性與電路構件內的相鄰的電極彼此的絕緣性的連接結構體。 According to the manufacturing method of the bonded structure of this invention, the bonded structure compatible with the connection reliability between opposing electrodes and the insulating property of the adjacent electrodes in a circuit member can be obtained.

根據本發明,可提供一種於具有對向的電極的電路構件彼此的連接中,可兼顧對向的電極間的連接可靠性的確保與電路 構件內的相鄰的電極彼此的絕緣性的確保的絕緣被覆導電粒子及各向異性導電膜,各向異性導電膜的製造方法,以及可兼顧對向的電極間的連接可靠性與電路構件內的相鄰的電極彼此的絕緣性的連接結構體及連接結構體的製造方法。 According to the present invention, it is possible to provide a circuit that can ensure the reliability of the connection between the opposing electrodes and ensure the connection reliability between the opposing electrodes in the connection between the circuit members having the opposing electrodes. Insulation-coated conductive particles and anisotropic conductive film for ensuring insulation between adjacent electrodes in a member, method for producing anisotropic conductive film, and connection reliability between opposing electrodes and circuit member The insulating bonded structure of adjacent electrodes and the manufacturing method of the bonded structure.

1:基材粒子 1: Substrate particles

2:絕緣性微粒子 2: Insulating fine particles

3:球冠區域 3: Ball crown area

5、7:本體部 5, 7: Main body

5a、7a:安裝面 5a, 7a: Mounting surface

6:凸塊電極 6: Bump electrode

8:電路電極 8: Circuit electrode

10:絕緣被覆導電粒子 10: Insulation coated conductive particles

11:帶有剝離膜的各向異性導電膜 11: Anisotropic conductive film with release film

12:剝離膜(脫模膜) 12: Peeling film (release film)

13:導電性接著劑層(各向異性導電膜) 13: Conductive adhesive layer (anisotropic conductive film)

13a:第1接著劑層 13a: The first adhesive layer

13b:第2接著劑層 13b: The second adhesive layer

20:複合粒子 20: Composite Particles

30:粒子收納構件 30: Particle storage component

32:孔 32: hole

50:連接結構體 50: Connection structure

52:第1電路構件 52: 1st circuit component

53:第2電路構件 53: Second circuit component

54:硬化物 54: Hardened

D:最短距離 D: the shortest distance

P:中心軸 P: central axis

P’:軸 P': axis

S:封閉端面 S: closed end face

X、Y:粒徑 X, Y: particle size

X’:最小徑 X': Minimum diameter

Y’:最大徑 Y': Maximum diameter

圖1(a)是表示本發明的絕緣被覆導電粒子的一實施形態的圖,圖1(b)是示意性地表示沿圖1(a)所示的中心軸P的剖面的圖。 FIG. 1( a ) is a diagram showing one embodiment of the insulating-coated conductive particle of the present invention, and FIG. 1( b ) is a diagram schematically showing a cross section along the central axis P shown in FIG. 1( a ).

圖2是對本發明的絕緣被覆導電粒子的最大徑及最小徑進行說明的圖。 Fig. 2 is a diagram illustrating the maximum diameter and minimum diameter of the insulating-coated conductive particles of the present invention.

圖3(a)是表示本發明的各向異性導電膜的一實施形態的示意性剖面圖,圖3(b)是各向異性導電膜的主要部分放大示意圖。 FIG. 3( a ) is a schematic cross-sectional view showing one embodiment of the anisotropic conductive film of the present invention, and FIG. 3( b ) is an enlarged schematic view of main parts of the anisotropic conductive film.

圖4(a)、圖4(b)是表示本發明的各向異性導電膜的製造步驟的示意性剖面圖。 4( a ) and FIG. 4( b ) are schematic cross-sectional views showing the manufacturing steps of the anisotropic conductive film of the present invention.

圖5(a)、圖5(b)、圖5(c)是表示圖4(a)、圖4(b)的後續步驟的示意性剖面圖。 5( a ), FIG. 5( b ), and FIG. 5( c ) are schematic cross-sectional views showing subsequent steps of FIG. 4( a ) and FIG. 4( b ).

圖6是表示經過圖5(a)、圖5(b)、圖5(c)的步驟而獲得的各向異性導電膜的示意性剖面圖。 Fig. 6 is a schematic cross-sectional view showing an anisotropic conductive film obtained through the steps of Fig. 5(a), Fig. 5(b) and Fig. 5(c).

圖7是表示絕緣被覆導電粒子的排列的例子的圖。 FIG. 7 is a diagram showing an example of an arrangement of insulating-coated conductive particles.

圖8是表示本發明的連接結構體的一實施形態的示意性剖面圖。 Fig. 8 is a schematic cross-sectional view showing an embodiment of the bonded structure of the present invention.

圖9是表示圖8所示的連接結構體的製造步驟的示意性剖面圖。 Fig. 9 is a schematic cross-sectional view showing a manufacturing step of the bonded structure shown in Fig. 8 .

圖10是表示圖9的後續步驟的示意性剖面圖。 FIG. 10 is a schematic cross-sectional view showing steps subsequent to FIG. 9 .

以下,一面參照圖式,一面對本發明的絕緣被覆導電粒子、各向異性導電膜、各向異性導電膜的製造方法、連接結構體及連接結構體的製造方法的較佳實施形態進行詳細說明。 Hereinafter, preferred embodiments of the insulation-coated conductive particles, the anisotropic conductive film, the method for manufacturing the anisotropic conductive film, the bonded structure, and the method for manufacturing the bonded structure of the present invention will be described in detail with reference to the drawings. illustrate.

[絕緣被覆導電粒子的構成] [Constitution of insulating coated conductive particles]

圖1(a)是表示本發明的絕緣被覆導電粒子的一實施形態的外觀的圖,圖1(b)是示意性地表示沿圖1(a)所示的中心軸P的剖面的圖。絕緣被覆導電粒子10是具備具有導電性的基材粒子1、與被覆基材粒子1的表面的絕緣性微粒子2來構成。中心軸P是指通過基材粒子1的中心的軸。 FIG. 1( a ) is a diagram showing the appearance of one embodiment of the insulating-coated conductive particle of the present invention, and FIG. 1( b ) is a diagram schematically showing a cross section along the central axis P shown in FIG. 1( a ). The insulating-coated conductive particle 10 is comprised including the substrate particle 1 which has electroconductivity, and the insulating fine particle 2 which coats the surface of the substrate particle 1. As shown in FIG. The central axis P refers to an axis passing through the center of the substrate particle 1 .

基材粒子1可為包含芯粒子與被覆芯粒子的表面的至少一部分的金屬層的芯殼型的粒子。例如可列舉藉由鍍敷並以金屬來被覆芯粒子而成者。 The substrate particle 1 may be a core-shell type particle including a core particle and a metal layer covering at least a part of the surface of the core particle. For example, those obtained by coating core particles with a metal by plating are mentioned.

芯粒子可使用金屬芯粒子、有機芯粒子及無機芯粒子的任一種。就導通性的方面而言,較佳為使用有機芯粒子。 As the core particles, any of metal core particles, organic core particles, and inorganic core particles can be used. In terms of conductivity, it is preferable to use organic core particles.

有機芯粒子的材質並無特別限定,例如可列舉:聚甲基丙烯酸甲酯、聚丙烯酸甲酯等丙烯酸樹脂、聚乙烯、聚丙烯、聚異丁烯、聚丁二烯等聚烯烴樹脂等。 The material of the organic core particles is not particularly limited, and examples thereof include acrylic resins such as polymethyl methacrylate and polymethyl acrylate, polyolefin resins such as polyethylene, polypropylene, polyisobutylene, and polybutadiene.

於藉由鍍敷等被覆有機芯粒子的情況下,作為其金屬, 可列舉:金、銀、銅、鉑、鋅、鐵、鈀、鎳、錫、鉻、鈦、鋁、鈷、鍺、鎘等金屬、銦錫氧化物(Indium Tin Oxide,ITO)、及焊料等金屬化合物等。 In the case of coating the core particle by plating etc., as its metal, Examples include metals such as gold, silver, copper, platinum, zinc, iron, palladium, nickel, tin, chromium, titanium, aluminum, cobalt, germanium, cadmium, indium tin oxide (Indium Tin Oxide, ITO), and solder, etc. metal compounds, etc.

被覆有機芯粒子的金屬層的結構並無特別限定,就導通性的方面而言,較佳為最外層為鎳層。另外,就導通性的方面而言,較佳為最外層具有突起(或凸部)。亦可進而於鎳層的內側設置銅等金屬層。 The structure of the metal layer covering the core particles is not particularly limited, but the outermost layer is preferably a nickel layer in terms of conductivity. In addition, from the viewpoint of conductivity, it is preferable that the outermost layer has protrusions (or protrusions). A metal layer such as copper may be further provided inside the nickel layer.

就可吸收連接的電極高度的不均的方面、及導通可靠性與絕緣可靠性的兼顧的觀點而言,基材粒子1的平均一次粒徑較佳為1μm以上且10μm以下,更佳為2μm以上且5μm以下,進而佳為2μm以上且3μm以下。 The average primary particle size of the substrate particle 1 is preferably 1 μm or more and 10 μm or less, more preferably 2 μm, from the viewpoint of absorbing the uneven height of the connected electrodes and balancing the conduction reliability and insulation reliability. Not less than 5 μm, and more preferably not less than 2 μm and not more than 3 μm.

絕緣性微粒子2可使用無機氧化物微粒子、有機微粒子等,可根據絕緣性及導通性等所期望的特性來適宜選擇。絕緣性微粒子2較佳為使用包括包含有機聚合物的芯微粒子、與被覆芯微粒子的表面的至少一部分的殼層的芯殼型的粒子。殼層的材質例如可列舉交聯聚矽氧烷。 As the insulating fine particles 2 , inorganic oxide fine particles, organic fine particles, etc. can be used, and can be appropriately selected according to desired characteristics such as insulation and conductivity. The insulating fine particle 2 is preferably a core-shell type particle including a core particle containing an organic polymer and a shell layer covering at least a part of the surface of the core particle. The material of the shell layer includes, for example, cross-linked polysiloxane.

就導通可靠性與絕緣可靠性的兼顧的觀點而言,絕緣性微粒子2的平均一次粒徑較佳為100nm以上且500nm以下,更佳為200nm以上且450nm以下,進而佳為250nm以上且350nm以下。特別是若絕緣性微粒子2的平均一次粒徑為250nm以上,則於具有對向的電極的電路構件間的連接中絕緣被覆導電粒子10彼此凝聚的情況下,亦容易充分地確保相鄰的電路電極間的絕緣 性,若為350nm以下,則即便絕緣性微粒子存在於後述的每單位面積的絕緣性微粒子數少的疏區域,亦容易充分地確保對向電路間的導通。 From the viewpoint of both conduction reliability and insulation reliability, the average primary particle size of the insulating fine particles 2 is preferably from 100 nm to 500 nm, more preferably from 200 nm to 450 nm, and still more preferably from 250 nm to 350 nm. . In particular, if the average primary particle size of the insulating fine particles 2 is 250 nm or more, it is easy to ensure sufficient adjacent circuits even when the insulating-coated conductive particles 10 are aggregated in the connection between circuit members having opposing electrodes. Insulation between electrodes When the thickness is 350 nm or less, even if insulating fine particles exist in a sparse region with a small number of insulating fine particles per unit area described later, it is easy to sufficiently secure conduction between opposing circuits.

本實施形態的絕緣被覆導電粒子10可具有每單位面積的絕緣性微粒子數少或為0的疏區域、與每單位面積的絕緣性微粒子數較疏區域更多的密區域。 The insulating-coated conductive particles 10 of this embodiment may have a sparse region with a small or zero number of insulating fine particles per unit area, and a dense region with a larger number of insulating fine particles per unit area than the sparse region.

如圖1(a)、圖1(b)所示,絕緣被覆導電粒子10較佳為具有中心軸P所通過的兩個所述疏區域,所述中心軸P通過所述基材粒子1的中心。換言之,絕緣被覆導電粒子10較佳為於利用兩個平行的平面切割基材粒子1時的兩個球冠區域具有疏區域,於球帶區域具有密區域。進而,換言之,絕緣被覆導電粒子10較佳為於利用兩個平行的平面切割基材粒子1時的球帶區域偏向存在有絕緣性微粒子2。 As shown in Figure 1(a) and Figure 1(b), the insulating coated conductive particles 10 preferably have two sparse regions through which the central axis P passes through the substrate particle 1. center. In other words, the insulation-coated conductive particles 10 preferably have sparse regions in the two spherical cap regions and dense regions in the spherical band region when the substrate particle 1 is cut by two parallel planes. Furthermore, in other words, in the insulating-coated conductive particles 10 , it is preferable that the insulating fine particles 2 exist in a biased manner in the spherical band region when the substrate particle 1 is cut with two parallel planes.

此種絕緣被覆導電粒子10可藉由將具備具有導電性的基材粒子1、與被覆該基材粒子1的表面的絕緣性微粒子2的複合粒子的、位於利用兩個平行的平面切割基材粒子1時的兩個球冠區域的絕緣性微粒子2的一部分或全部去除而獲得。 Such insulation-coated conductive particles 10 can be obtained by cutting the substrate with two parallel planes, which are composite particles comprising conductive substrate particles 1 and insulating fine particles 2 covering the surface of the substrate particles 1. The particles 1 are obtained by removing part or all of the insulating fine particles 2 in the two spherical cap regions.

再者,本實施形態中,疏區域與密區域的界限未必需要明確,可於疏區域與密區域之間設置每單位面積的絕緣性微粒子數較疏區域多且較密區域少的中間區域,亦可以每單位面積的絕緣性微粒子數自疏區域至密區域而增加的方式設置各自的區域。 Furthermore, in this embodiment, the boundary between the sparse area and the dense area does not necessarily need to be clear, and an intermediate area with more insulating particles per unit area than the sparse area and less dense area can be set between the sparse area and the dense area. Each region may be provided so that the number of insulating fine particles per unit area increases from the sparse region to the dense region.

就對向電路間的連接時的低電阻化的觀點而言,絕緣被 覆導電粒子10較佳為具有絕緣性微粒子2的粒子密度為0個/μm2~2.0個/μm2的疏區域,更佳為具有絕緣性微粒子2的粒子密度為0個/μm2~1.0個/μm2的疏區域,進而佳為具有絕緣性微粒子2的粒子密度為0個/μm2~0.5個/μm2的疏區域。另外,當將基材粒子1的表面積設為S0 μm2時,所述疏區域較佳為有0.5×S0 μm2以上,更佳為有0.7×S0 μm2以上。 From the viewpoint of lowering the resistance of the connection between opposing circuits, the insulating-coated conductive particles 10 preferably have a sparse region where the particle density of the insulating fine particles 2 is 0 particles/μm 2 to 2.0 particles/μm 2 . Preferably, it is a sparse region having a particle density of insulating fine particles 2 of 0 to 1.0 particles/μm 2 , and more preferably a region having a particle density of insulating fine particles 2 of 0 particles/μm 2 to 0.5 particles/μm 2 sparse area. In addition, when the surface area of the substrate particle 1 is defined as S 0 μm 2 , the sparse region is preferably at least 0.5×S 0 μm 2 , more preferably at least 0.7×S 0 μm 2 .

就鄰接的電路間的絕緣性提高的觀點而言,絕緣被覆導電粒子10較佳為具有絕緣性微粒子2的粒子密度為2.0個/μm2~5.0個/μm2的密區域,更佳為具有絕緣性微粒子2的粒子密度為2.5個/μm2~4.5個/μm2的密區域,進而佳為具有絕緣性微粒子2的粒子密度為3.0個/μm2~3.5個/μm2的密區域。另外,當將基材粒子的表面積設為S0 μm2時,所述密區域較佳為有0.2×S0 μm2以上,更佳為有0.3×S0 μm2以上。 From the viewpoint of improving the insulation between adjacent circuits, the insulating-coated conductive particles 10 preferably have a dense region with a particle density of insulating fine particles 2 of 2.0 particles/μm 2 to 5.0 particles/μm 2 , more preferably have a The particle density of the insulating fine particles 2 is a dense region of 2.5 particles/μm 2 to 4.5 particles/μm 2 , and more preferably a dense region having a particle density of the insulating fine particles 2 of 3.0 particles/μm 2 to 3.5 particles/μm 2 . In addition, when the surface area of the substrate particle is defined as S 0 μm 2 , the dense domain is preferably 0.2×S 0 μm 2 or more, more preferably 0.3×S 0 μm 2 or more.

疏區域及密區域的每單位面積的絕緣性微粒子數可藉由測量絕緣被覆導電粒子的掃描式電子顯微鏡(Scanning Electron Microscope,SEM)照片中的基材粒子1的中心部(將基材粒子1的外周圓的直徑的一半長度設為直徑且與該外周圓為同心圓狀的圓)處所存在的絕緣粒子數來測定。另外,絕緣性微粒子2的粒子密度可根據所述每單位面積的絕緣性微粒子數來算出。關於單位面積,當將基材粒子1的表面積設為S0 μm2時,可設定為0.04×S0 μm2~0.20×S0 μm2中的規定面積,亦可設定為0.17×S0 μm2The number of insulating fine particles per unit area in the sparse area and the dense area can be measured by measuring the central part of the substrate particle 1 in the scanning electron microscope (Scanning Electron Microscope, SEM) photo of the insulating coated conductive particle (the substrate particle 1 The length of half of the diameter of the outer peripheral circle is set as the diameter and is concentric with the outer peripheral circle) to measure the number of insulating particles present. In addition, the particle density of the insulating fine particles 2 can be calculated from the number of insulating fine particles per unit area. Regarding the unit area, when the surface area of the substrate particle 1 is S 0 μm 2 , it can be set to a predetermined area in the range of 0.04×S 0 μm 2 to 0.20×S 0 μm 2 , or can be set to 0.17×S 0 μm 2 .

就確保對向電路間的連接時的電極彼此與導電粒子直 接接觸的面積的觀點而言,絕緣被覆導電粒子10較佳為於基材粒子1的球冠區域包含0.05×S0 μm2以上的絕緣性微粒子數為0的區域,更佳為包含0.10×S0 μm2以上。 From the viewpoint of ensuring the direct contact area between the electrodes and the conductive particles during connection between opposing circuits, the insulating-coated conductive particles 10 preferably include 0.05×S 0 μm or more in the spherical cap region of the substrate particle 1. The region where the number of insulating fine particles is 0 preferably includes 0.10×S 0 μm 2 or more.

絕緣被覆導電粒子10的絕緣性微粒子2的被覆率較佳為35%~75%,更佳為40%~75%。再者,絕緣性微粒子的被覆率是指藉由對絕緣被覆導電粒子的SEM照片中的基材粒子1的中心部(將基材粒子1的外周圓的直徑的一半長度設為直徑且與該外周圓為同心圓狀的圓)進行分析而測定的值。具體而言,當將所述SEM照片中的基材粒子1的中心部的總表面積設為W(根據導電粒子的粒徑而算出的面積)、將所述SEM照片中的基材粒子1的中心部中分析為由絕緣性微粒子2被覆的部分的表面積設為P時,被覆率是表示為P/W×100(%)。再者,本實施形態中分析為所述被覆的部分的表面積P為根據絕緣被覆導電粒子的SEM照片200枚而求出的表面積的平均值。 The covering ratio of the insulating fine particles 2 of the insulating-coated conductive particles 10 is preferably 35% to 75%, more preferably 40% to 75%. Furthermore, the coverage rate of the insulating fine particles refers to the center portion of the substrate particle 1 in the SEM photograph of the insulating-coated conductive particle (the half length of the diameter of the outer circumference of the substrate particle 1 is defined as the diameter and the The outer peripheral circle is a concentric circle) and the measured value was analyzed. Specifically, when the total surface area of the central portion of the substrate particle 1 in the SEM photograph is W (the area calculated from the particle diameter of the conductive particle), the area of the substrate particle 1 in the SEM photograph is When the surface area of the central part analyzed to be covered with the insulating fine particles 2 is represented by P, the coverage rate is represented by P/W×100(%). In addition, the surface area P of the part analyzed as the said coating in this embodiment is the average value of the surface area calculated|required from 200 SEM photographs of the insulating coating|coated conductive particle.

就導通特性的觀點而言,絕緣被覆導電粒子10的最小徑X’較佳為基材粒子1的直徑以上且基材粒子1的直徑及絕緣性微粒子2的直徑的合計值以下。另外,就絕緣性的觀點而言,絕緣被覆導電粒子10的最大徑Y’較佳為基材粒子1的直徑及2×(絕緣性微粒子2的直徑)的合計值以上且基材粒子1的直徑及6×(絕緣性微粒子2的直徑)的合計值以下。再者,圖2表示圖1(b)所示的絕緣被覆導電粒子10的最小徑X’為基材粒子1的直徑,最大徑Y’為基材粒子1的直徑及2×(絕緣性微粒子的直徑)的合計 的情況。 From the viewpoint of conduction characteristics, the minimum diameter X' of the insulating-coated conductive particles 10 is preferably not less than the diameter of the substrate particle 1 and not more than the sum of the diameter of the substrate particle 1 and the diameter of the insulating fine particle 2. In addition, from the viewpoint of insulation, the maximum diameter Y' of the insulating-coated conductive particle 10 is preferably greater than or equal to the total value of the diameter of the substrate particle 1 and 2×(the diameter of the insulating fine particle 2), and the diameter of the substrate particle 1 The total value of the diameter and 6×(the diameter of the insulating fine particle 2) is less than or equal to. Furthermore, Fig. 2 shows that the minimum diameter X' of the insulating coating conductive particle 10 shown in Fig. diameter) total Case.

就兼顧導通性與絕緣性的觀點而言,絕緣被覆導電粒子10的最小徑X’與最大徑Y’之比X’/Y’較佳為0.4以上且0.9以下。藉由將X’/Y’設為0.4以上,即便於將電路構件的凸塊面積進行小面積化的情況下,亦容易確保絕緣被覆導電粒子10的捕捉性,藉由將X’/Y’設為0.9以下,容易將連接電阻進行低電阻化。 From the viewpoint of both conductivity and insulation, the ratio X'/Y' of the smallest diameter X' to the largest diameter Y' of the insulating-coated conductive particles 10 is preferably not less than 0.4 and not more than 0.9. By setting X'/Y' to be 0.4 or more, even when the bump area of the circuit member is reduced, it is easy to ensure the capture property of the insulating-coated conductive particles 10. By setting X'/Y' When it is 0.9 or less, it is easy to lower the connection resistance.

於製作所述般的絕緣被覆導電粒子10時,可使用各種方法。例如可列舉:(i)將基材粒子1填充至設有與基材粒子1的粒徑相同的間隙的平行板中,使絕緣性微粒子2附著於經填充的基材粒子1上的方法,(ii)準備由絕緣性微粒子2被覆基材粒子1的表面整體的複合粒子,將該複合粒子的絕緣性微粒子2的一部分去除的方法等。 Various methods can be used for producing the above-mentioned insulating-coated conductive particles 10 . For example, (i) a method in which substrate particles 1 are filled in a parallel plate having the same gap as the particle diameter of substrate particles 1, and insulating fine particles 2 are attached to the filled substrate particles 1, (ii) A method of preparing composite particles in which the entire surface of the substrate particle 1 is covered with the insulating fine particles 2 and removing a part of the insulating fine particles 2 of the composite particles.

(i)中使絕緣性微粒子2附著於基材粒子1上的方法例如可列舉:將基材粒子1與絕緣性微粒子2填充至平行板間後,使用有機溶劑或熱來使絕緣性微粒子2熔接於基材粒子1的方法。 The method of attaching the insulating fine particles 2 to the substrate particles 1 in (i) includes, for example, filling the space between the substrate particles 1 and the insulating fine particles 2 between parallel plates, and then using an organic solvent or heat to make the insulating fine particles 2 A method of fusing to the substrate particle 1.

(ii)中獲得由絕緣性微粒子2被覆基材粒子1的表面整體的複合粒子的方法例如可列舉:將聚乙烯亞胺等帶電處理材塗佈於基材粒子1,利用靜電力使絕緣性微粒子2附著的方法,導入能夠與基材粒子1及絕緣性微粒子2相互鍵結的官能基,藉由化學鍵結而獲得複合粒子的方法。另外,作為去除絕緣性微粒子2的一部分的手段,可列舉使用黏接帶等除去複合粒子的球冠區域的絕緣性微粒子2的方法作為簡便的方法。進而,後述的本發明 的各向異性導電膜的製造方法可於各向異性導電膜的製作中製作絕緣被覆導電粒子10,為特別有用的方法。 In (ii), the method of obtaining composite particles in which the entire surface of the substrate particle 1 is covered with insulating fine particles 2 includes, for example, applying a charging treatment material such as polyethyleneimine to the substrate particle 1, and using electrostatic force to make the insulating particle 1 The method of attaching the microparticles 2 is a method of introducing a functional group capable of bonding with the substrate particle 1 and the insulating microparticles 2 to obtain composite particles through chemical bonding. In addition, as a means of removing a part of the insulating fine particles 2 , a method of removing the insulating fine particles 2 in the spherical cap region of the composite particles using an adhesive tape or the like can be cited as a simple method. Furthermore, the present invention described later The method for producing an anisotropic conductive film is a particularly useful method for producing insulating-coated conductive particles 10 in the production of an anisotropic conductive film.

[各向異性導電膜的構成] [Structure of Anisotropic Conductive Film]

圖3(a)是表示本發明的各向異性導電膜的一實施形態的示意性剖面圖,圖3(b)是各向異性導電膜的主要部分放大示意圖。圖中所示的帶有剝離膜的各向異性導電膜11包含剝離膜12、與包含絕緣被覆導電粒子10及接著劑成分的導電性接著劑層(各向異性導電膜)13。絕緣被覆導電粒子10分散於導電性接著劑層13中。於本說明書中,亦有時將在以與厚度方向垂直的面切斷導電性接著劑層13時的剖面不包含絕緣被覆導電粒子10的區域稱為接著劑區域,將包含絕緣被覆導電粒子10的區域稱為導電區域。 FIG. 3( a ) is a schematic cross-sectional view showing one embodiment of the anisotropic conductive film of the present invention, and FIG. 3( b ) is an enlarged schematic view of main parts of the anisotropic conductive film. The anisotropic conductive film 11 with a release film shown in the figure includes a release film 12 and a conductive adhesive layer (anisotropic conductive film) 13 including an insulating-coated conductive particle 10 and an adhesive component. The insulating-coated conductive particles 10 are dispersed in the conductive adhesive layer 13 . In this specification, the region not including the insulating-coated conductive particles 10 in the cross section when the conductive adhesive layer 13 is cut in a plane perpendicular to the thickness direction may be referred to as an adhesive region, and the region including the insulating-coated conductive particles 10 may be referred to as an adhesive region. The region is called the conductive region.

剝離膜12例如可利用聚對苯二甲酸乙二酯(Polyethylene terephthalate,PET)、聚乙烯、聚丙烯等來形成。剝離膜12中可含有任意的填充劑。另外,可於剝離膜12的表面實施脫模處理或電漿處理等。 The peeling film 12 can be formed using polyethylene terephthalate (PET), polyethylene, polypropylene, etc., for example. Arbitrary fillers may be contained in the release film 12 . In addition, release treatment, plasma treatment, etc. may be performed on the surface of the release film 12 .

作為導電性接著劑層13中所含的接著劑成分,可列舉單體及硬化劑。單體可使用陽離子聚合性化合物、陰離子聚合性化合物或自由基聚合性化合物。作為陽離子聚合性化合物及陰離子聚合性化合物,可列舉環氧系化合物。 Examples of the adhesive component contained in the conductive adhesive layer 13 include monomers and curing agents. As a monomer, a cation polymerizable compound, an anion polymerizable compound or a radical polymerizable compound can be used. Examples of the cationically polymerizable compound and the anionically polymerizable compound include epoxy-based compounds.

作為環氧系化合物,可使用自表氯醇、與雙酚A、雙酚F或雙酚AD等雙酚化合物衍生的雙酚型環氧樹脂,自表氯醇、與苯酚酚醛清漆或甲酚酚醛清漆等酚醛清漆樹脂衍生的環氧酚醛清 漆樹脂,以及縮水甘油胺、縮水甘油醚、聯苯、脂環式等一分子內具有兩個以上的縮水甘油基的各種環氧化合物等。 As the epoxy-based compound, bisphenol-type epoxy resins derived from epichlorohydrin, bisphenol A, bisphenol F, or bisphenol AD and other bisphenol compounds can be used. Epoxy novolacs derived from novolac resins such as novolaks Lacquer resins, and various epoxy compounds having two or more glycidyl groups in one molecule, such as glycidylamine, glycidyl ether, biphenyl, and alicyclic.

作為自由基聚合性化合物,可使用具有藉由自由基進行聚合的官能基的化合物,例如可列舉(甲基)丙烯酸酯等丙烯酸單體、馬來醯亞胺化合物、苯乙烯衍生物等。自由基聚合性化合物可以單體或寡聚物的任一狀態而使用,亦可將單體與寡聚物混合而使用。 As the radically polymerizable compound, a compound having a functional group polymerizable by radicals can be used, and examples thereof include acrylic monomers such as (meth)acrylates, maleimide compounds, and styrene derivatives. The radically polymerizable compound may be used in any state of a monomer or an oligomer, or may be used in admixture of a monomer and an oligomer.

單體可單獨使用一種,亦可併用兩種以上。 A monomer may be used individually by 1 type, and may use 2 or more types together.

於使用環氧系化合物的情況下,作為硬化劑,可列舉:咪唑系、醯肼系、三氟化硼-胺錯合物、鋶鹽、胺醯亞胺、多胺的鹽、二氰二胺等。就延長可使用時間的方面而言,該些硬化劑較佳為藉由聚胺基甲酸酯系、聚酯系的高分子物質等加以被覆而進行微膠囊化。 In the case of using an epoxy-based compound, examples of the hardener include: imidazole-based, hydrazine-based, boron trifluoride-amine complexes, percilium salts, amidoimides, polyamine salts, dicyandiamide Amines etc. From the viewpoint of prolonging the usable time, these curing agents are preferably microencapsulated by being coated with a polyurethane-based or polyester-based high-molecular substance.

與環氧系化合物併用的硬化劑可根據目標的連接溫度、連接時間、保存穩定性等而適宜選定。就高反應性的方面而言,於製成包含環氧系化合物及硬化劑的組成物時,硬化劑較佳為其凝膠時間於規定的溫度下為10秒以內,就保存穩定性的方面而言,硬化劑較佳為與於40℃下在恆溫槽中保管10天後的組成物並無凝膠時間的差異。就此種方面而言,硬化劑較佳為鋶鹽。 The curing agent used together with the epoxy-based compound can be appropriately selected according to the target connection temperature, connection time, storage stability, and the like. In terms of high reactivity, when preparing a composition comprising an epoxy compound and a hardener, the hardener preferably has a gel time within 10 seconds at a specified temperature. In terms of storage stability In terms of curing agent, it is preferable that there is no difference in gel time from the composition stored in a thermostat at 40°C for 10 days. In this aspect, the hardening agent is preferably a columium salt.

於使用丙烯酸單體的情況下,作為硬化劑,可列舉過氧化化合物、偶氮系化合物等藉由加熱而分解並產生游離自由基者。 In the case of using an acrylic monomer, examples of the curing agent include those that decompose by heating to generate free radicals, such as peroxide compounds and azo compounds.

與丙烯酸單體併用的硬化劑可根據目標的連接溫度、連 接時間、保存穩定性等而適宜選定。就高反應性與保存穩定性的方面而言,硬化劑較佳為10小時半衰期的溫度為40℃以上且1分鐘半衰期的溫度為180℃以下的有機過氧化物或偶氮系化合物,更佳為10小時半衰期的溫度為60℃以上且1分鐘半衰期的溫度為170℃以下的有機過氧化物或偶氮系化合物。 The hardener used in combination with acrylic monomers can be selected according to the target joining temperature, continuous It can be selected according to the exposure time, storage stability, etc. In terms of high reactivity and storage stability, the curing agent is preferably an organic peroxide or an azo compound with a half-life of 10 hours at a temperature of 40° C. or higher and a half-life of 1 minute at a temperature of 180° C. or lower, more preferably An organic peroxide or an azo compound having a half-life of 10 hours at a temperature of 60° C. or higher and a half-life of 1 minute at a temperature of 170° C. or lower.

硬化劑可單獨使用一種,亦可併用兩種以上。導電性接著劑層13中可進而含有分解促進劑、抑制劑等。 A hardening agent may be used individually by 1 type, and may use 2 or more types together. The conductive adhesive layer 13 may further contain a decomposition accelerator, an inhibitor, and the like.

於使用環氧系化合物及丙烯酸單體的任一者的情況下,將連接時間設為10秒以下時亦獲得充分的反應率,就所述觀點而言,相對於單體與後述的膜形成材的合計100質量份,硬化劑的調配量較佳為設為0.1質量份~40質量份,更佳為設為1質量份~35質量份。若硬化劑的調配量為0.1質量份以上,則可獲得充分的反應率,且容易獲得良好的接著強度及小的連接電阻,若為40質量份以下,則容易防止導電性接著劑層13的流動性下降而連接電阻上昇的情況,且容易確保各向異性導電膜的保存穩定性。 In the case of using either an epoxy compound or an acrylic monomer, a sufficient reaction rate is obtained even when the connection time is set to 10 seconds or less. 100 parts by mass in total of the materials, the blending amount of the curing agent is preferably 0.1 parts by mass to 40 parts by mass, more preferably 1 part by mass to 35 parts by mass. If the compounding amount of the curing agent is 0.1 parts by mass or more, a sufficient reaction rate can be obtained, and it is easy to obtain good adhesive strength and small connection resistance, and if it is 40 parts by mass or less, it is easy to prevent the conductive adhesive layer 13 It is easy to ensure the storage stability of the anisotropic conductive film when the fluidity is lowered and the connection resistance is increased.

導電性接著劑層13亦可包含膜形成材。膜形成材為具有使包含所述單體及硬化劑的黏度低的組成物的操作容易的作用的聚合物。藉由使用膜形成材,可抑制膜容易開裂、破裂、發黏的情況,從而可獲得容易操作的各向異性導電膜11。 The conductive adhesive layer 13 may also contain a film forming material. The film-forming material is a polymer that functions to facilitate the handling of the low-viscosity composition containing the monomer and the curing agent. By using a film forming material, it is possible to suppress easy cracking, cracking, and stickiness of the film, and it is possible to obtain the anisotropic conductive film 11 which is easy to handle.

作為膜形成材,可較佳地使用熱塑性樹脂。例如可列舉:苯氧基樹脂、聚乙烯甲醛樹脂、聚苯乙烯樹脂、聚乙烯丁醛 樹脂、聚酯樹脂、聚醯胺樹脂、二甲苯樹脂、聚胺基甲酸酯樹脂、聚丙烯酸樹脂、聚酯胺基甲酸酯樹脂等。該些聚合物中亦可包含矽氧烷鍵或氟取代基。就接著強度、相容性、耐熱性、及機械強度的觀點而言,所述樹脂中較佳為使用苯氧基樹脂。 As a film forming material, a thermoplastic resin can be preferably used. For example, phenoxy resin, polyvinyl formaldehyde resin, polystyrene resin, polyvinyl butyral Resin, polyester resin, polyamide resin, xylene resin, polyurethane resin, polyacrylic resin, polyester urethane resin, etc. These polymers may also contain siloxane linkages or fluorine substituents. From the viewpoint of adhesive strength, compatibility, heat resistance, and mechanical strength, it is preferable to use a phenoxy resin among the resins.

所述熱塑性樹脂可單獨使用一種,亦可併用兩種以上。 These thermoplastic resins may be used alone or in combination of two or more.

熱塑性樹脂的分子量越大,越容易獲得膜形成性,另外,可範圍廣泛地來設定影響各向異性導電膜11的流動性的熔融黏度。熱塑性樹脂的重量平均分子量較佳為5000~150000,更佳為10000~80000。若熱塑性樹脂的重量平均分子量為5000以上,則容易獲得良好的膜形成性,若為150000以下,則容易獲得與其他成分的良好的相容性。 The greater the molecular weight of the thermoplastic resin, the easier it is to obtain film formability, and the melt viscosity that affects the fluidity of the anisotropic conductive film 11 can be set in a wide range. The weight average molecular weight of the thermoplastic resin is preferably from 5,000 to 150,000, more preferably from 10,000 to 80,000. When the weight average molecular weight of a thermoplastic resin is 5000 or more, favorable film formability will be acquired easily, and when it is 150000 or less, it will become easy to acquire favorable compatibility with other components.

再者,本發明中,重量平均分子量是指依照下述條件,藉由凝膠滲透層析儀(Gel Permeation Chromatograph,GPC)使用標準聚苯乙烯的校準曲線而測定的值。 Furthermore, in the present invention, the weight average molecular weight refers to a value measured by a gel permeation chromatography (Gel Permeation Chromatograph, GPC) using a calibration curve of standard polystyrene according to the following conditions.

(測定條件) (measurement conditions)

裝置:東曹(Tosoh)股份有限公司製造的GPC-8020 Device: GPC-8020 manufactured by Tosoh Co., Ltd.

檢測器:東曹股份有限公司製造的RI-8020 Detector: RI-8020 manufactured by Tosoh Co., Ltd.

管柱:日立化成股份有限公司製造的Gelpack GLA160S+GLA150S Column: Gelpack GLA160S+GLA150S manufactured by Hitachi Chemical Co., Ltd.

試樣濃度:120mg/3mL Sample concentration: 120mg/3mL

溶媒:四氫呋喃 Solvent: Tetrahydrofuran

注入量:60μL Injection volume: 60μL

壓力:2.94×106Pa(30kgf/cm2) Pressure: 2.94×106Pa (30kgf/cm 2 )

流量:1.00mL/min Flow: 1.00mL/min

以單體、硬化劑及膜形成材的總量為基準,膜形成材的調配量較佳為5質量%~80質量%,更佳為15質量%~70質量%。藉由將膜形成材的調配量設為5質量%以上,容易獲得良好的膜形成性,藉由設為80質量%以下,有導電性接著劑層13(特別是接著劑區域)顯示良好的流動性的傾向。 Based on the total amount of the monomer, hardener and film-forming material, the blending amount of the film-forming material is preferably 5% by mass to 80% by mass, more preferably 15% by mass to 70% by mass. By setting the blending amount of the film forming material to 5% by mass or more, it is easy to obtain good film formability, and by setting it to 80% by mass or less, the conductive adhesive layer 13 (especially the adhesive region) exhibits good performance. Mobility propensity.

另外,亦可進而於導電性接著劑層13中含有填充劑、軟化劑、促進劑、抗老化劑、著色劑、阻燃化劑、觸變劑、偶合劑、酚樹脂、三聚氰胺樹脂、異氰酸酯類等。 In addition, the conductive adhesive layer 13 may further contain fillers, softeners, accelerators, anti-aging agents, colorants, flame retardants, thixotropic agents, coupling agents, phenol resins, melamine resins, and isocyanates. wait.

於導電性接著劑層13含有填充劑的情況下,可進而期待連接可靠性的提昇。填充劑的最大徑較佳為未滿絕緣被覆導電粒子10的最小徑。相對於導電性接著劑層100體積份,導電性接著劑層13中的填充劑的含量較佳為5體積份~60體積份。若為該範圍,則容易獲得與添加量相符的可靠性提昇的效果。 When the conductive adhesive layer 13 contains a filler, improvement in connection reliability can be further expected. The maximum diameter of the filler is preferably less than the minimum diameter of the insulating-coated conductive particles 10 . The content of the filler in the conductive adhesive layer 13 is preferably 5 to 60 parts by volume relative to 100 parts by volume of the conductive adhesive layer. If it is this range, the effect of improving reliability corresponding to the addition amount is easy to be acquired.

本實施形態的導電性接著劑層(各向異性導電膜)13中,絕緣被覆導電粒子10較佳為偏在於導電性接著劑層13的兩主面的其中一面側。如圖3(b)所示,於絕緣被覆導電粒子10偏在於導電性接著劑層13的設有脫模膜12的一面側的情況下,絕緣被覆導電粒子10與其中一面的最短距離可大於0μm且為1μm以下。藉由將最短距離D設為所述範圍內,可抑制壓接時的絕緣被覆導電粒子10的流動,從而可提高絕緣被覆導電粒子10的 捕捉性能。 In the conductive adhesive layer (anisotropic conductive film) 13 of the present embodiment, it is preferable that the insulating-coated conductive particles 10 are located on one side of both main surfaces of the conductive adhesive layer 13 . As shown in Figure 3 (b), in the case where the insulating coated conductive particles 10 are biased towards the side of the conductive adhesive layer 13 on which the release film 12 is provided, the shortest distance between the insulating coated conductive particles 10 and one of the sides can be greater than 0 μm to 1 μm or less. By setting the shortest distance D within the above-mentioned range, the flow of the insulating-coated conductive particles 10 during crimping can be suppressed, thereby improving the performance of the insulating-coated conductive particles 10. capture performance.

另外,如圖3(b)所示,絕緣被覆導電粒子10較佳為以通過基材粒子1的中心且平行於導電性接著劑層13的厚度方向的軸P’通過兩個疏區域或絕緣性微粒子2的一部分或全部被去除的兩個球冠區域的方式配置,或者以平行的軸P’與所述兩個平行的平面(劃分兩個球冠區域及球帶區域的平面)正交的方式配置。於此種各向異性導電膜11中,絕緣被覆導電粒子10的軸P’的方向的粒徑X和與軸P’正交的方向的粒徑Y成為Y>X的關係。再者,於各向異性導電膜11為帶狀的情況下,與軸P’正交的方向亦可稱為其長邊方向。 In addition, as shown in FIG. 3( b ), the insulating-coated conductive particles 10 preferably pass through the center of the substrate particle 1 and the axis P' parallel to the thickness direction of the conductive adhesive layer 13 passes through two sparse regions or insulating regions. The two spherical cap regions in which a part or all of the permanent microparticles 2 are removed are arranged, or the parallel axis P' is perpendicular to the two parallel planes (the plane dividing the two spherical cap regions and the spherical zone region) way to configure. In such an anisotropic conductive film 11, the particle diameter X in the direction of the axis P' of the insulating-coated conductive particles 10 and the particle diameter Y in the direction perpendicular to the axis P' have a relationship of Y>X. Furthermore, when the anisotropic conductive film 11 is strip-shaped, the direction perpendicular to the axis P' may also be referred to as the longitudinal direction.

另外,所述粒徑X較佳為基材粒子1的直徑以上且基材粒子1的直徑及絕緣性微粒子2的直徑的合計值以下。於粒徑X滿足此種條件的情況下,絕緣被覆導電粒子10成為於以將軸P’設為垂線的兩個平行的平面進行切割時的兩個球冠區域的至少一者中具有不存在絕緣性微粒子2的區域的狀態。該情況下,於具有對向的電極的電路構件彼此的連接中,當在對向的電極間捕捉到絕緣被覆導電粒子10時,可抑制絕緣性微粒子2被夾持於絕緣被覆導電粒子10的基材粒子1與電極之間,容易進行低電阻連接。 In addition, the particle diameter X is preferably not less than the diameter of the substrate particle 1 and not more than the total value of the diameter of the substrate particle 1 and the diameter of the insulating fine particle 2 . When the particle size X satisfies such a condition, the insulating-coated conductive particle 10 has a non-existing particle in at least one of the two spherical cap regions when cutting on two parallel planes with the axis P' as a perpendicular line. The state of the region of the insulating fine particle 2. In this case, when the insulating coated conductive particles 10 are captured between the facing electrodes in the connection between circuit members having opposing electrodes, it is possible to suppress the insulating fine particles 2 from being held by the insulating coated conductive particles 10. Low-resistance connection between the substrate particle 1 and the electrode is easy.

另外,所述粒徑Y較佳為基材粒子1的直徑及2×(絕緣性微粒子2的直徑)的合計值以上且2×(基材粒子1的直徑)的值以下。於粒徑Y滿足此種條件的情況下,絕緣被覆導電粒子10於以將軸P’設為垂線的兩個平行的平面進行切割時的球帶區域 具有由絕緣性微粒子2被覆的區域,於具有對向的電極的電路構件彼此的連接中,即便發生絕緣被覆導電粒子10的凝聚,亦可較佳地抑制由凝聚粒子引起的短路。再者,粒徑Y越大,則對於短路的抑制而言越有效果,若為2×(基材粒子1的直徑)的值以下,則就導電性接著劑層13中的絕緣被覆導電粒子10的粒子密度的調整、及壓接時的導電性接著劑層13的流動性的控制的方面而言較佳。 In addition, the particle size Y is preferably not less than the sum of the diameter of the substrate particle 1 and 2×(the diameter of the insulating fine particle 2) and not more than the value of 2×(the diameter of the substrate particle 1). When the particle size Y satisfies this condition, the spherical band region when the insulating coated conductive particle 10 is cut on two parallel planes with the axis P' as a perpendicular line In the region covered with insulating fine particles 2 , even if aggregation of insulating-coated conductive particles 10 occurs during connection of circuit members having opposing electrodes, short circuit caused by the aggregated particles can be preferably suppressed. Furthermore, the larger the particle size Y, the more effective it is for the suppression of short circuits, and if it is below the value of 2×(the diameter of the substrate particle 1), the insulation-coated conductive particles in the conductive adhesive layer 13 will be more effective. It is preferable in terms of adjusting the particle density of 10 and controlling the fluidity of the conductive adhesive layer 13 during crimping.

另外,就兼顧導通性與絕緣性的觀點而言,所述粒徑X與所述粒徑Y之比X/Y較佳為0.4以上且0.9以下。若X/Y為0.4以上,則即便於將電路構件的凸塊面積進行小面積化的情況下,亦容易確保絕緣被覆導電粒子10的捕捉性,若X/Y為0.9以下,則容易將連接電阻進行低電阻化。 In addition, from the viewpoint of achieving both conductivity and insulation, the ratio X/Y of the particle size X to the particle size Y is preferably 0.4 or more and 0.9 or less. If X/Y is 0.4 or more, even when the bump area of the circuit member is reduced in size, it is easy to ensure the capture property of the insulating coating conductive particles 10, and if X/Y is 0.9 or less, it is easy to connect Resistors are reduced in resistance.

本實施形態的導電性接著劑層(各向異性導電膜)13中,較佳為絕緣被覆導電粒子的80%以上的平均值滿足所述條件。 In the conductive adhesive layer (anisotropic conductive film) 13 of the present embodiment, it is preferable that the average value of 80% or more of the insulating-coated conductive particles satisfy the above conditions.

所述粒徑X、所述粒徑Y、及最短距離D可藉由觀察沿通過絕緣被覆導電粒子10的基材粒子1的中心且平行於導電性接著劑層13的厚度方向的面切斷各向異性導電膜11時的剖面來確認。 The particle diameter X, the particle diameter Y, and the shortest distance D can be cut along the plane passing through the center of the substrate particle 1 of the insulating-coated conductive particle 10 and parallel to the thickness direction of the conductive adhesive layer 13 by observing The cross-section of the anisotropic conductive film 11 was confirmed.

剖面觀察時可利用聚焦離子束(Focus Ion Beam,FIB)、掃描式電子顯微鏡(SEM)、穿透式電子顯微鏡(Transmission Electron Microscope,TEM)等加工.觀察裝置。例如,可使用FIB來切削導電性接著劑層(各向異性導電膜)13的剖面,之後利用 SEM來進行觀察及測定。具體而言,使用導電性的碳帶而將帶有脫模膜的各向異性導電膜11的脫模膜12側固定於試樣加工.觀察用的夾具。之後,自導電性接著劑層(各向異性導電膜)13側實施鉑濺鍍處理,於導電性接著劑層(各向異性導電膜)13上形成10nm的鉑膜。使用聚焦離子束(FIB)自帶有脫模膜的各向異性導電膜11的導電性接著劑層13側實施加工,並利用掃描式電子顯微鏡(SEM)來觀察加工剖面。 The cross-section can be processed by using Focus Ion Beam (FIB), scanning electron microscope (SEM), transmission electron microscope (Transmission Electron Microscope, TEM), etc. Observation device. For example, FIB can be used to cut the cross section of the conductive adhesive layer (anisotropic conductive film) 13, and then use SEM for observation and measurement. Specifically, the release film 12 side of the anisotropic conductive film 11 with a release film was fixed to the sample processing using a conductive carbon tape. Fixtures for observation. Thereafter, platinum sputtering was performed from the conductive adhesive layer (anisotropic conductive film) 13 side to form a 10 nm platinum film on the conductive adhesive layer (anisotropic conductive film) 13 . The conductive adhesive layer 13 side of the anisotropic conductive film 11 with a release film was processed using a focused ion beam (FIB), and the processed cross section was observed with a scanning electron microscope (SEM).

導電性接著劑層(各向異性導電膜)13中的接著劑區域的厚度可適宜設定,例如滿足導電區域的所述最短距離D的與接著劑區域為相反側的接著劑區域的厚度可根據凸塊電極的高度來適宜設定。 The thickness of the adhesive region in the conductive adhesive layer (anisotropic conductive film) 13 can be appropriately set, for example, the thickness of the adhesive region on the opposite side to the adhesive region that satisfies the shortest distance D of the conductive region can be determined according to The height of the bump electrode is set appropriately.

各向異性導電膜亦可製成將不含有導電粒子的絕緣性接著劑層積層於導電性接著劑層13上的多層構成。 The anisotropic conductive film may also have a multilayer structure in which an insulating adhesive layer not containing conductive particles is laminated on the conductive adhesive layer 13 .

絕緣性接著劑層可與導電性接著劑層13同樣地含有所述的單體、硬化劑及膜形成材,亦可進而含有填充劑、軟化劑、促進劑、抗老化劑、著色劑、阻燃化劑、觸變劑、偶合劑、酚樹脂、三聚氰胺樹脂、異氰酸酯類等。 The insulating adhesive layer may contain the above-mentioned monomers, hardeners, and film-forming materials in the same manner as the conductive adhesive layer 13, and may further contain fillers, softeners, accelerators, anti-aging agents, colorants, and resists. Burning agent, thixotropic agent, coupling agent, phenol resin, melamine resin, isocyanate, etc.

藉由將絕緣性接著劑層積層於導電性接著劑層13,容易使各向異性導電膜中所含的絕緣被覆導電粒子10偏在於膜的其中一面側。該情況下,可形成包含來源於導電性接著劑層13的第1接著劑區域/導電區域/第2接著劑區域、與鄰接於第2接著劑區域且來源於絕緣性接著劑層的第3接著劑區域的各向異性導電膜。 另外,可藉由調節導電性接著劑層13與絕緣性接著劑層的熔融黏度的差,來任意地調整電路連接時的絕緣被覆導電粒子10及接著劑區域的流動性。 By laminating the insulating adhesive layer on the conductive adhesive layer 13, the insulating-coated conductive particles 10 contained in the anisotropic conductive film can be easily localized to one side of the film. In this case, a first adhesive region/conductive region/second adhesive region derived from the conductive adhesive layer 13, and a third adhesive region adjacent to the second adhesive region and derived from the insulating adhesive layer can be formed. Anisotropic conductive film in adhesive region. In addition, by adjusting the difference in melt viscosity between the conductive adhesive layer 13 and the insulating adhesive layer, the fluidity of the insulating-coated conductive particles 10 and the adhesive region during circuit connection can be adjusted arbitrarily.

作為調整方法,例如可列舉使具有規定的玻璃轉移溫度(Tg)的膜形成材含有於導電性接著劑層13及絕緣性接著劑層中。本實施形態中,較佳為使用Tg為60℃~180℃的熱塑性樹脂(特別是苯氧基樹脂)作為導電性接著劑層13中所含有的膜形成材,使用Tg為40℃~100℃的熱塑性樹脂(特別是苯氧基樹脂)作為絕緣性接著劑層中所含有的膜形成材。再者,玻璃轉移溫度可利用示差掃描熱量計(DSC)等熱物性測定裝置來測定。例如,於鋁製的樣品盤中秤量膜形成材,與空的鋁製樣品盤同時地測定,從而測量熱量的差。此時,於第1次的測定時,有因膜形成材的熔融等的影響而產生測定誤差的情況,因此較佳為根據第2次以後的測定資料來測定玻璃轉移溫度。 As an adjustment method, for example, including a film-forming material having a predetermined glass transition temperature (Tg) in the conductive adhesive layer 13 and the insulating adhesive layer is mentioned. In this embodiment, it is preferable to use a thermoplastic resin (especially phenoxy resin) with a Tg of 60°C to 180°C as the film forming material contained in the conductive adhesive layer 13, and to use a thermoplastic resin with a Tg of 40°C to 100°C. thermoplastic resin (especially phenoxy resin) as a film-forming material contained in the insulating adhesive layer. In addition, glass transition temperature can be measured with the thermophysical property measuring apparatuses, such as a differential scanning calorimeter (DSC). For example, a film-forming material is weighed in an aluminum sample pan, and it is measured simultaneously with an empty aluminum sample pan to measure the difference in heat. In this case, in the first measurement, measurement errors may occur due to the influence of melting of the film forming material, etc., so it is preferable to measure the glass transition temperature based on the second and subsequent measurement data.

絕緣被覆導電粒子10較佳為以有規則的排列而配置於導電性接著劑層13中。例如,於自導電性接著劑層13的厚度方向觀察時,較佳為以形成圖7所示的排列樣式的方式排列絕緣被覆導電粒子10。關於排列樣式,作為以直線連結絕緣被覆導電粒子10彼此時所含的形狀,可列舉正三邊形型、等腰三邊形型、正五邊形型、正方形型、長方形型、使該些樣式傾斜的排列樣式等。其中,正三邊形型的排列為能夠實現絕緣被覆導電粒子10的最密填充的樣式,且為用以增加於對向的電極間所捕捉到的絕緣被覆 導電粒子數而較佳的排列樣式。 The insulating coated conductive particles 10 are preferably disposed in the conductive adhesive layer 13 in a regular arrangement. For example, when viewed from the thickness direction of the conductive adhesive layer 13 , it is preferable to arrange the insulating-coated conductive particles 10 so as to form the arrangement pattern shown in FIG. 7 . Regarding the arrangement pattern, as the shape included when connecting the insulating coating conductive particles 10 with a straight line, regular triangle type, isosceles triangular type, regular pentagonal type, square type, rectangular type, and these patterns can be enumerated. Slanted arrangement styles, etc. Among them, the regular triangular arrangement is the pattern that can realize the densest packing of the insulating coating conductive particles 10, and is used to increase the insulating coating trapped between the opposite electrodes. The number of conductive particles and the better arrangement pattern.

絕緣被覆導電粒子10的粒子密度較佳為5000個/mm2以上且40000個/mm2以下。藉由滿足該條件,可更佳地兼顧對向的電極間的連接可靠性的確保、與電路構件內的相鄰的電極彼此的絕緣性的確保。 The particle density of the insulating-coated conductive particles 10 is preferably not less than 5000 particles/mm 2 and not more than 40000 particles/mm 2 . By satisfying this condition, securing of connection reliability between opposing electrodes and securing of insulation between adjacent electrodes in the circuit member can be achieved more favorably.

[各向異性導電膜的製造方法] [Manufacturing method of anisotropic conductive film]

其次,一面參照圖4(a)、圖4(b)~圖6,一面對本發明的各向異性導電膜的製造方法的一實施形態進行說明。 Next, one embodiment of the manufacturing method of the anisotropic conductive film of this invention is demonstrated, referring FIG. 4(a), FIG. 4(b) - FIG.

圖4(a)、圖4(b)~圖6中所示的本實施形態的各向異性導電膜的製造方法包括:步驟1,準備具備具有導電性的基材粒子1、與被覆該基材粒子1的表面的絕緣性微粒子2的複合粒子20;步驟2,將複合粒子20收納至設有具有封閉端面S的孔32的粒子收納構件30的孔32中(參照圖4(a));步驟3,將自孔32露出的複合粒子20的位於球冠區域3的絕緣性微粒子2的一部分或全部去除(參照圖4(b));步驟4,使球冠區域3的絕緣性微粒子2被去除的複合粒子20以球冠區域3側與第1接著劑層13a相接的方式自粒子收納構件30移動至第1接著劑層13a上,並使複合粒子20的絕緣性微粒子2的一部分附著於粒子收納構件30的封閉端面S而去除,藉此於第1接著劑層13a上設置絕緣被覆導電粒子10(參照圖5(a)及圖5(b));以及 步驟5,將第2接著劑層13b貼合於第1接著劑層13a的配置有絕緣被覆導電粒子10之側(參照圖5(c))。 The manufacturing method of the anisotropic conductive film of the present embodiment shown in Fig. 4 (a), Fig. 4 (b) ~ Fig. 6 includes: Step 1, prepare substrate particle 1 with conductivity, and coat this substrate Composite particles 20 of insulating fine particles 2 on the surface of the material particle 1; step 2, accommodate the composite particles 20 in the holes 32 of the particle storage member 30 provided with the holes 32 of the closed end surface S (refer to FIG. 4(a)) Step 3, a part or all of the insulating particles 2 located in the spherical cap region 3 of the composite particles 20 exposed from the holes 32 or all are removed (refer to FIG. 4 (b)); Step 4, make the insulating fine particles in the spherical cap region 3 The removed composite particles 20 move from the particle storage member 30 to the first adhesive layer 13a so that the spherical cap region 3 side is in contact with the first adhesive layer 13a, and the insulating fine particles 2 of the composite particles 20 Part of it is attached to the closed end surface S of the particle storage member 30 and removed, whereby the insulating-coated conductive particles 10 are provided on the first adhesive layer 13a (see FIG. 5(a) and FIG. 5(b)); and In step 5, the second adhesive layer 13b is bonded to the side of the first adhesive layer 13a on which the insulating-coated conductive particles 10 are arranged (see FIG. 5(c)).

可如所述(ii)的方法中說明般準備步驟1中的複合粒子20。 The composite particles 20 in step 1 can be prepared as described in the method of (ii) above.

作為步驟2中所使用的粒子收納構件30的材質,例如可列舉丙烯酸酯、甲基丙烯酸酯等自由基聚合性化合物的硬化物。作為孔32的形狀,只要為可收納複合粒子20且複合粒子20的球冠區域3可自粒子收納構件30中突出者即可,例如可列舉:圓柱、圓錐、角柱、角錐。作為封閉端面S的形狀,例如可列舉圓形形狀(球面狀)、多邊形形狀。 Examples of the material of the particle storage member 30 used in step 2 include cured products of radically polymerizable compounds such as acrylate and methacrylate. The shape of the hole 32 may be any shape that can accommodate the composite particle 20 and the spherical cap region 3 of the composite particle 20 can protrude from the particle storage member 30 , for example, a cylinder, a cone, a prism, and a pyramid. Examples of the shape of the closed end surface S include a circular shape (spherical shape) and a polygonal shape.

孔32較佳為以有規則的排列(例如,圖7所示的排列)進行設置,藉此可形成以所述排列樣式配置絕緣被覆導電粒子10的導電性接著劑層13。 The holes 32 are preferably arranged in a regular arrangement (for example, the arrangement shown in FIG. 7 ), so that the conductive adhesive layer 13 in which the insulating coated conductive particles 10 are arranged in the arrangement pattern can be formed.

作為將複合粒子20的位於球冠區域3的絕緣性微粒子2去除的方法,例如可列舉使用胺基甲酸酯橡膠製、金屬製等的刮刀進行刮擦的方法、使用刷毛等進行刮擦的方法。 As a method of removing the insulating fine particles 2 located in the spherical cap region 3 of the composite particle 20, for example, a method of scraping with a scraper made of urethane rubber or metal, and a method of scraping with a brush etc. method.

作為構成第1接著劑層13a的材料,可列舉所述導電性接著劑層13中所含的單體、硬化劑及膜形成材。第1接著劑層13a亦可進而含有填充劑、軟化劑、促進劑、抗老化劑、著色劑、阻燃化劑、觸變劑、偶合劑、酚樹脂、三聚氰胺樹脂、異氰酸酯類等。 As a material which comprises the 1st adhesive agent layer 13a, the monomer contained in the said electroconductive adhesive agent layer 13, a curing agent, and a film forming material are mentioned. The first adhesive layer 13a may further contain fillers, softeners, accelerators, anti-aging agents, colorants, flame retardants, thixotropic agents, coupling agents, phenol resins, melamine resins, isocyanates, and the like.

本實施形態中,如圖5(a)所示,可使用在剝離膜12 上形成第1接著劑層13a而成的積層體。第1接著劑層13a的厚度可根據凸塊電極的高度來適宜設定。 In this embodiment, as shown in Fig. 5(a), it can be used on the release film 12 A laminate in which the first adhesive layer 13a is formed. The thickness of the 1st adhesive layer 13a can be suitably set according to the height of a bump electrode.

另外,於第2接著劑層13b的貼合時,亦可使用在剝離膜12上形成第2接著劑層13b而成的積層體。第2接著劑層13b的厚度可根據凸塊電極的高度來適宜設定。作為構成第2接著劑層13b的材料,可列舉所述導電性接著劑層13中所含的單體、硬化劑及膜形成材。第2接著劑層13b亦可進而含有填充劑、軟化劑、促進劑、抗老化劑、著色劑、阻燃化劑、觸變劑、偶合劑、酚樹脂、三聚氰胺樹脂、異氰酸酯類等。 Moreover, when bonding the 2nd adhesive bond layer 13b, the laminated body which formed the 2nd adhesive bond layer 13b on the release film 12 can also be used. The thickness of the second adhesive layer 13b can be appropriately set according to the height of the bump electrode. As a material which comprises the 2nd adhesive agent layer 13b, the monomer contained in the said electroconductive adhesive agent layer 13, a curing agent, and a film forming material are mentioned. The second adhesive layer 13b may further contain fillers, softeners, accelerators, anti-aging agents, colorants, flame retardants, thixotropic agents, coupling agents, phenol resins, melamine resins, isocyanates, and the like.

作為貼合的方法,例如可列舉對接著劑一面加熱一面貼合的層壓方法。另外,若使用不僅進行加熱而且於減壓下進行層壓的真空加熱層壓機,則可於貼合時減少氣泡的捲入。 As a bonding method, the lamination method of bonding, heating an adhesive agent, for example is mentioned. In addition, if a vacuum heating laminator that performs lamination under reduced pressure in addition to heating is used, it is possible to reduce the entrainment of air bubbles during lamination.

經過所述步驟1~步驟5,可獲得圖6所示的具有剝離膜12、與包含絕緣被覆導電粒子10及接著劑成分的導電性接著劑層(各向異性導電膜)13、以及剝離膜12依序積層而成的積層結構的帶有剝離膜的各向異性導電膜。 Through steps 1 to 5, the conductive adhesive layer (anisotropic conductive film) 13 shown in FIG. 12 An anisotropic conductive film with a layered structure with a release film laminated sequentially.

本實施形態中,就使絕緣被覆導電粒子10偏在於導電性接著劑層13的其中一面側的觀點而言,較佳為將第1接著劑層13a的厚度Da與第2接著劑層13b的厚度Db之比Da/Db設為20/1~15/5。 In this embodiment, from the viewpoint of biasing the insulating-coated conductive particles 10 to one side of the conductive adhesive layer 13, it is preferable to set the thickness Da of the first adhesive layer 13a to the thickness Da of the second adhesive layer 13b. The ratio Da/Db of the thickness Db is set to 20/1 to 15/5.

[連接結構體的構成] [Constitution of connection structure]

圖8是表示本發明的連接結構體的一實施形態的示意性剖面 圖。如該圖所示,連接結構體50是具備相互對向的第1電路構件52及第2電路構件53、以及連接該些電路構件52、電路構件53的導電性接著劑層(各向異性導電膜)的硬化物54而構成。 Fig. 8 is a schematic cross section showing an embodiment of the bonded structure of the present invention picture. As shown in this figure, the bonded structure 50 is provided with a first circuit member 52 and a second circuit member 53 facing each other, and a conductive adhesive layer (anisotropic conductive layer) connecting these circuit members 52 and 53. Film) hardened product 54 and constituted.

第1電路構件52例如為帶載封裝(TCP)、印刷配線板、半導體矽晶片等。第1電路構件52於本體部5的安裝面5a側具有多個凸塊電極6。凸塊電極6例如俯視時視為矩形形狀,厚度例如為3μm以上且未滿18μm。凸塊電極6的形成材料中例如可使用Au等,較導電性接著劑層(各向異性導電膜)的硬化物54中所含的絕緣被覆導電粒子10而言更容易變形。再者,可於安裝面5a中未形成凸塊電極6的部分形成有絕緣層。 The first circuit member 52 is, for example, a tape carrier package (TCP), a printed wiring board, a semiconductor silicon chip, or the like. The first circuit member 52 has a plurality of bump electrodes 6 on the mounting surface 5 a side of the main body 5 . The bump electrode 6 is, for example, viewed as a rectangular shape in plan view, and has a thickness of, for example, 3 μm or more and less than 18 μm. Au etc. can be used for the formation material of the bump electrode 6, for example, and it deform|transforms more easily than the insulating-coated conductive particle 10 contained in the hardened|cured material 54 of a conductive adhesive layer (anisotropic conductive film). Furthermore, an insulating layer may be formed on a portion of the mounting surface 5a where the bump electrode 6 is not formed.

第2電路構件53例如為液晶顯示器中所使用的ITO、銦鋅氧化物(Indium Zinc Oxide,IZO)、或者利用金屬等形成有電路的玻璃基板或塑膠基板、柔性印刷基板(FPC)、陶瓷配線板等。如圖8所示,第2電路構件53於本體部7的安裝面7a側具有與凸塊電極6相對應的多個電路電極8。電路電極8與凸塊電極6同樣地,例如俯視時視為矩形形狀,厚度例如為100nm左右。電路電極8的表面例如是由選自金、銀、銅、錫、釕、銠、鈀、鋨、銥、鉑、銦錫氧化物(ITO)、及銦鋅氧化物(IZO)中的一種或兩種以上的材料所構成。再者,可於安裝面7a中未形成電路電極8的部分形成有絕緣層。 The second circuit member 53 is, for example, ITO used in a liquid crystal display, indium zinc oxide (Indium Zinc Oxide, IZO), or a glass substrate or a plastic substrate, a flexible printed circuit board (FPC), and a ceramic wiring formed with a circuit using metal or the like. board etc. As shown in FIG. 8 , the second circuit member 53 has a plurality of circuit electrodes 8 corresponding to the bump electrodes 6 on the mounting surface 7 a side of the main body portion 7 . Like the bump electrodes 6 , the circuit electrodes 8 have, for example, a rectangular shape in plan view, and have a thickness of, for example, about 100 nm. The surface of the circuit electrode 8 is, for example, made of one or more selected from gold, silver, copper, tin, ruthenium, rhodium, palladium, osmium, iridium, platinum, indium tin oxide (ITO), and indium zinc oxide (IZO). Composed of two or more materials. Furthermore, an insulating layer may be formed on a portion of the mounting surface 7a where the circuit electrode 8 is not formed.

硬化物54例如可使用圖3(a)所示的帶有剝離膜的各向異性導電膜11來形成,且可設為導電性接著劑層(各向異性導 電膜)13的硬化物。再者,本實施形態中,為了方便說明,將分散有絕緣被覆導電粒子10的層稱為導電性接著劑層13,但構成層的接著劑成分自身為非導電性。 The cured product 54 can be formed using, for example, the anisotropic conductive film 11 with a release film shown in FIG. electric film) 13 hardened. Furthermore, in this embodiment, for convenience of description, the layer in which the insulating-coated conductive particles 10 are dispersed is referred to as the conductive adhesive layer 13 , but the adhesive component itself constituting the layer is non-conductive.

絕緣被覆導電粒子10可成為偏在於第2電路構件53側的狀態,以藉由壓接而稍許扁平地變形的狀態介隔存在於凸塊電極6與電路電極8之間。藉此,可實現凸塊電極6與電路電極8之間的電性連接。另外,於鄰接的凸塊電極6、凸塊電極6間及鄰接的電路電極8、電路電極8間,絕緣被覆導電粒子10以形成圖案樣式的狀態隔開,從而可實現鄰接的凸塊電極6、凸塊電極6間及鄰接的電路電極8、電路電極8間的電性絕緣。 The insulating-coated conductive particles 10 may be in a state biased toward the second circuit member 53 , and may be interposed between the bump electrodes 6 and the circuit electrodes 8 in a state of being slightly deformed flat by crimping. Thereby, the electrical connection between the bump electrodes 6 and the circuit electrodes 8 can be realized. In addition, between the adjacent bump electrodes 6, between the bump electrodes 6 and the adjacent circuit electrodes 8, and between the circuit electrodes 8, the insulation-coated conductive particles 10 are separated in a patterned state, thereby realizing the formation of the adjacent bump electrodes 6. , Electrical insulation between bump electrodes 6 and adjacent circuit electrodes 8 , and between circuit electrodes 8 .

[連接結構體的製造方法] [Manufacturing method of bonded structure]

圖9及圖10是表示圖8所示的連接結構體的製造步驟的示意性剖面圖。於形成連接結構體50時,首先,將剝離膜12自帶有剝離膜的各向異性導電膜11剝離,與安裝面7a對向而將導電性接著劑層(各向異性導電膜)13層壓於第2電路構件53上。其次,如圖10所示,以凸塊電極6與電路電極8對向的方式,將第1電路構件52配置於層壓有導電性接著劑層(各向異性導電膜)13的第2電路構件53上。然後,一面對導電性接著劑層(各向異性導電膜)13進行加熱,一面於厚度方向對第1電路構件52與第2電路構件53進行加壓。 9 and 10 are schematic cross-sectional views showing steps of manufacturing the bonded structure shown in FIG. 8 . When forming the bonded structure 50, first, the release film 12 is peeled off from the anisotropic conductive film 11 with the release film, and the conductive adhesive layer (anisotropic conductive film) 13 layers are placed opposite to the mounting surface 7a. Press on the second circuit member 53 . Next, as shown in FIG. 10 , the first circuit member 52 is placed on the second circuit on which the conductive adhesive layer (anisotropic conductive film) 13 is laminated so that the bump electrodes 6 and the circuit electrodes 8 face each other. member 53. Then, the first circuit member 52 and the second circuit member 53 are pressed in the thickness direction while heating the conductive adhesive layer (anisotropic conductive film) 13 .

藉此,導電性接著劑層(各向異性導電膜)13的接著劑成分流動,凸塊電極6與電路電極8的距離縮短,絕緣被覆導電 粒子10進行咬合,於所述狀態下,導電性接著劑層13進行硬化。藉由導電性接著劑層13的硬化,於凸塊電極6與電路電極8電性連接,且鄰接的凸塊電極6、凸塊電極6彼此及鄰接的電路電極8、電路電極8彼此電性絕緣的狀態下,形成導電性接著劑層(各向異性導電膜)13的硬化物54,從而獲得圖8所示的連接結構體50。於所獲得的連接結構體50中,可利用導電性接著劑層(各向異性導電膜)13的硬化物54來充分地防止凸塊電極6與電路電極8之間的距離的經時變化,並且亦可確保電性特性的長期可靠性。 Thereby, the adhesive component of the conductive adhesive layer (anisotropic conductive film) 13 flows, the distance between the bump electrode 6 and the circuit electrode 8 is shortened, and the insulating coating is electrically conductive. The particles 10 are interlocked, and in this state, the conductive adhesive layer 13 is cured. By hardening the conductive adhesive layer 13, the bump electrodes 6 and the circuit electrodes 8 are electrically connected, and the adjacent bump electrodes 6, the bump electrodes 6, and the adjacent circuit electrodes 8, and the circuit electrodes 8 are electrically connected to each other. In an insulated state, a cured product 54 of the conductive adhesive layer (anisotropic conductive film) 13 is formed to obtain a bonded structure 50 shown in FIG. 8 . In the obtained bonded structure 50, the cured product 54 of the conductive adhesive layer (anisotropic conductive film) 13 can sufficiently prevent the temporal change in the distance between the bump electrode 6 and the circuit electrode 8, In addition, long-term reliability of electrical characteristics can be ensured.

再者,連接時的加熱溫度較佳為硬化劑中產生聚合活性種,並開始聚合單體的聚合的溫度以上。該加熱溫度例如為80℃~200℃,較佳為100℃~180℃。另外,加熱時間例如為0.1秒~30秒,較佳為1秒~20秒。若加熱溫度未滿80℃,則硬化速度變慢,若超過200℃,則容易進行不理想的副反應。另外,加熱時間未滿0.1秒時,無法充分地進行硬化反應,若超過30秒,則硬化物54的生產性降低,進而亦容易進行不理想的副反應。 Furthermore, the heating temperature at the time of connection is preferably higher than the temperature at which polymerization active species are generated in the curing agent and polymerization of the polymerization monomer is initiated. The heating temperature is, for example, 80°C to 200°C, preferably 100°C to 180°C. In addition, the heating time is, for example, 0.1 second to 30 seconds, preferably 1 second to 20 seconds. When the heating temperature is less than 80°C, the curing rate becomes slow, and when it exceeds 200°C, undesired side reactions tend to proceed. In addition, when the heating time is less than 0.1 second, the curing reaction cannot proceed sufficiently, and when it exceeds 30 seconds, the productivity of the cured product 54 decreases, and undesirable side reactions tend to proceed.

根據本實施形態的連接結構體的製造方法,藉由使用包含絕緣被覆導電粒子10的導電性接著劑層(各向異性導電膜)13,可獲得可兼顧對向的電極間的連接可靠性與電路構件內的相鄰的電極彼此的絕緣性的連接結構體。 According to the method of manufacturing the bonded structure of this embodiment, by using the conductive adhesive layer (anisotropic conductive film) 13 containing the insulating coated conductive particles 10, both the connection reliability and the An insulating connection structure between adjacent electrodes in a circuit member.

[實施例] [Example]

以下,藉由實施例及比較例更具體地說明本發明,但本發明並不限定於以下的實施例。 Hereinafter, although an Example and a comparative example demonstrate this invention more concretely, this invention is not limited to the following Example.

[接著劑層的形成] [Formation of Adhesive Layer]

利用以下所示的方法來分別形成接著劑層。 The adhesive layer was formed by the method shown below, respectively.

(接著劑層1) (adhesive layer 1)

在安裝有戴氏(Dimroth)冷卻管、氯化鈣管、及連接於攪拌馬達的聚四氟乙烯製的攪拌棒的3000mL的三口燒瓶中,將4,4'-(9-亞茀基)-二苯酚45g(日本西格瑪奧德里奇(Sigma-Aldrich Japan)股份有限公司製造)、及3,3',5,5'-四甲基聯苯酚二縮水甘油醚50g(三菱化學股份有限公司製造:YX-4000H)溶解於N-甲基吡咯啶酮1000mL中而製成反應液。向其中加入碳酸鉀21g,一面利用加熱包(mantle heater)加熱至110℃一面進行攪拌。攪拌3小時後,向放入有1000mL的甲醇的燒杯中滴加反應液,將所生成的沈澱物抽吸過濾,藉此進行濾取。利用300mL的甲醇將所濾取的沈澱物清洗3次,獲得75g的苯氧基樹脂a。 In a 3000mL three-necked flask equipped with a Dimroth cooling tube, a calcium chloride tube, and a Teflon stirring rod connected to a stirring motor, 4,4'-(9-Fremylene) -45 g of diphenol (manufactured by Sigma-Aldrich Japan Co., Ltd.), and 50 g of 3,3',5,5'-tetramethylbiphenol diglycidyl ether (manufactured by Mitsubishi Chemical Co., Ltd. : YX-4000H) was dissolved in 1000 mL of N-methylpyrrolidone to prepare a reaction solution. 21 g of potassium carbonate was added there, and it stirred, heating to 110 degreeC with the mantle heater. After stirring for 3 hours, the reaction solution was dropped into a beaker containing 1000 mL of methanol, and the generated precipitate was suction-filtered and collected by filtration. The filtered precipitate was washed three times with 300 mL of methanol to obtain 75 g of phenoxy resin a.

再者,依照下述的條件並利用凝膠滲透層析儀(GPC)來測定苯氧基樹脂a的分子量及分散度,結果以使用標準聚苯乙烯的標準曲線的聚苯乙烯換算計,Mn=15769、Mw=38045、Mw/Mn=2.413。 Furthermore, according to the following conditions and using gel permeation chromatography (GPC) to measure the molecular weight and dispersity of phenoxy resin a, the results are based on polystyrene conversion using the standard curve of standard polystyrene, Mn =15769, Mw=38045, Mw/Mn=2.413.

(測定條件) (measurement conditions)

裝置:東曹股份有限公司製造的GPC-8020 Device: GPC-8020 manufactured by Tosoh Co., Ltd.

檢測器:東曹股份有限公司製造的RI-8020 Detector: RI-8020 manufactured by Tosoh Co., Ltd.

管柱:日立化成股份有限公司製造的Gelpack GLA160S+GLA150S Column: Gelpack GLA160S+GLA150S manufactured by Hitachi Chemical Co., Ltd.

試樣濃度:120mg/3mL Sample concentration: 120mg/3mL

溶媒:四氫呋喃 Solvent: Tetrahydrofuran

注入量:60μL Injection volume: 60μL

壓力:2.94×106Pa(30kgf/cm2) Pressure: 2.94×106Pa (30kgf/cm 2 )

流量:1.00mL/min Flow: 1.00mL/min

另外,依照下述的條件來測定苯氧基樹脂a的玻璃轉移溫度,結果為160℃。 In addition, when the glass transition temperature of the phenoxy resin a was measured under the following conditions, it was 160°C.

(測定條件) (measurement conditions)

使用示差掃描熱量測定裝置(日本珀金埃爾默(PerkinElmer Japan)股份有限公司製造,Pyeis),於氮氣環境下,在昇溫速度:10℃/min、30℃~250℃的範圍下測定2次,將第2次的測定結果設為玻璃轉移溫度。 Using a differential scanning calorimetry device (manufactured by PerkinElmer Japan Co., Ltd., Pyeis), under a nitrogen atmosphere, measure twice at a heating rate: 10°C/min, in the range of 30°C to 250°C , let the second measurement result be the glass transition temperature.

其次,將50質量份的雙酚A型環氧樹脂(三菱化學公司製造:jER828)、5質量份的作為硬化劑的4-羥基苯基甲基苄基鋶六氟銻酸鹽、及50質量份的作為膜形成材的苯氧基樹脂a溶解於甲基乙基酮中並混合,從而製備接著劑膏。 Next, 50 parts by mass of bisphenol A type epoxy resin (manufactured by Mitsubishi Chemical Corporation: jER828), 5 parts by mass of 4-hydroxyphenylmethylbenzyl hexafluoroantimonate as a hardener, and 50 parts by mass Parts of phenoxy resin a as a film forming material were dissolved and mixed in methyl ethyl ketone to prepare an adhesive paste.

使用塗佈機將所獲得的接著劑膏塗佈於厚度50μm的PET樹脂膜上,於70℃下進行5分鐘熱風乾燥,藉此形成厚度為15μm的接著劑層1。 The obtained adhesive paste was coated on a PET resin film with a thickness of 50 μm using a coater, and dried with hot air at 70° C. for 5 minutes to form an adhesive layer 1 with a thickness of 15 μm.

(接著劑層2) (adhesive layer 2)

與接著劑層1的形成同樣地進行而形成厚度為0.8μm的接著劑層2。 The adhesive layer 2 having a thickness of 0.8 μm was formed in the same manner as the formation of the adhesive layer 1 .

(接著劑層3) (adhesive layer 3)

將45質量份的雙酚F型環氧樹脂(三菱化學公司製造:jER807)、5質量份的作為硬化劑的4-羥基苯基甲基苄基鋶六氟銻酸鹽、及55質量份的作為膜形成材的苯氧基樹脂YP-70(新日鐵住金化學公司製造)混合,從而製備接著劑膏。 45 parts by mass of bisphenol F-type epoxy resin (manufactured by Mitsubishi Chemical Corporation: jER807), 5 parts by mass of 4-hydroxyphenylmethylbenzyl hexafluoroantimonate as a hardener, and 55 parts by mass of Phenoxy resin YP-70 (manufactured by Nippon Steel & Sumikin Chemical Co., Ltd.) as a film forming material was mixed to prepare an adhesive paste.

使用塗佈機將所獲得的接著劑膏塗佈於厚度50μm的PET樹脂膜上,於70℃下進行5分鐘熱風乾燥,藉此形成厚度為15μm的接著劑層3。 The obtained adhesive paste was coated on a PET resin film with a thickness of 50 μm using a coater, and dried with hot air at 70° C. for 5 minutes to form an adhesive layer 3 with a thickness of 15 μm.

[複合粒子的製備] [Preparation of Composite Particles]

利用以下所示的方法而分別製備複合粒子。 Composite particles were respectively prepared by the methods shown below.

(基材粒子) (substrate particles)

於鹼性脫脂後利用酸來中和平均粒徑3.0μm的交聯聚苯乙烯粒子(樹脂微粒子)3g。繼而,將樹脂微粒子添加至調整為pH 6.0的陽離子性高分子液100mL中,於60℃下攪拌1小時後,利用直徑3μm的薄膜過濾器(密理博(Millipore)公司製造)加以過濾,並進行水洗。將水洗後的樹脂微粒子添加至含有8質量%的作為鈀觸媒的安美特尼奧加特(Atotech Neoganth)834(日本安美特(Atotech Japan)(股)製造,商品名)的鈀觸媒化液100mL中,於35℃下攪拌30分鐘後加以過濾,並進行水洗。 After alkaline degreasing, 3 g of crosslinked polystyrene particles (resin fine particles) with an average particle diameter of 3.0 μm were neutralized with acid. Next, the resin fine particles were added to 100 mL of a cationic polymer solution adjusted to pH 6.0, stirred at 60° C. for 1 hour, filtered through a membrane filter with a diameter of 3 μm (manufactured by Millipore), and wash. The resin microparticles after water washing were added to the palladium catalyst containing 8% by mass of Atotech Neoganth 834 (manufactured by Atotech Japan Co., Ltd., trade name) as a palladium catalyst. solution in 100 mL, stirred at 35°C for 30 minutes, filtered, and washed with water.

其次,將水洗後的樹脂微粒子添加至3g/L的次亞磷酸鈉液中,獲得表面經活性化的樹脂微粒子(樹脂芯粒子)。將該樹脂芯粒子、水1000mL、蘋果酸鈉(濃度20g/L)投入至2000mL 的玻璃燒杯中,進行超音波分散。繼而,利用氟製攪拌翼進行攪拌(600rpm)並將pH調整為5.5以下,將分散液加溫至80℃。使用定量泵以7ml/min向其中添加以(SEK670-0)/(SEK670-1)=1.8的比例混合作為無電解鍍鎳液的SEK670(日本卡尼真(Kanigen)股份有限公司,製品名)而成的初期薄膜鍍敷液,結果約30秒後開始還原反應,自浴中產生氣泡而浴整體自灰色變成黑色。之後,完成初期薄膜形成後,不間斷地以13ml/min同時添加將硫酸鎳(濃度224g/L)、及蘋果酸鈉(濃度305g/L)混合的增厚鍍敷液,與利用次亞磷酸鈉(濃度534g/L)、及氫氧化鈉(濃度34g/L)而混合的增厚鍍敷液這兩種液體。之後,進行攪拌至氣泡的產生停止為止,結果浴整體自黑色變化為灰色。藉由該鍍敷處理,可形成被覆樹脂芯粒子的鍍鎳層。藉由SEM來測定基材粒子的直徑,結果為直徑3.3μm。 Next, the water-washed resin fine particles were added to a 3 g/L sodium hypophosphite solution to obtain surface-activated resin fine particles (resin core particles). This resin core particle, water 1000mL, sodium malate (concentration 20g/L) drop into 2000mL Ultrasonic dispersion was carried out in a glass beaker. Next, the pH was adjusted to 5.5 or less by stirring (600 rpm) with a fluorine-made stirring blade, and the dispersion liquid was heated to 80°C. Use a quantitative pump to add thereto SEK670 (Japan Carney (Kanigen) Co., Ltd., product name) mixed with the ratio of (SEK670-0)/(SEK670-1)=1.8 as electroless nickel plating solution with 7ml/min As a result, the resulting initial thin film plating solution started a reduction reaction after about 30 seconds, bubbles were generated from the bath, and the bath as a whole changed from gray to black. Afterwards, after completing the formation of the initial film, add the thickening plating solution mixed with nickel sulfate (concentration 224g/L) and sodium malate (concentration 305g/L) simultaneously with 13ml/min without interruption, and utilize hypophosphorous acid Two kinds of thickening plating solution mixed with sodium (concentration: 534g/L) and sodium hydroxide (concentration: 34g/L). Thereafter, stirring was performed until generation of air bubbles ceased, and as a result, the entire bath changed from black to gray. By this plating treatment, a nickel plating layer covering the resin core particles can be formed. When the diameter of the substrate particle was measured by SEM, it was 3.3 μm in diameter.

(絕緣性微粒子) (insulating fine particles)

向500mL三口燒瓶中放入具有自由基聚合性雙鍵及烷氧基矽烷基的矽烷偶合劑(3-丙烯醯氧基丙基三甲氧基矽烷,信越化學工業(股)製造:KBM-5103)7.5g、甲基丙烯酸(和光純藥工業(股)製造)6.9g、丙烯酸甲酯(和光純藥工業(股)製造)4.1g、2,2'-偶氮雙(異丁腈)0.36g、及乙腈350g,並將該些混合。利用氮氣(100mL/min)花費1小時對溶存氧進行置換後,加熱至80℃並進行6小時聚合反應,從而獲得一次粒徑300nm的有機無機混合粒子。將包含該有機無機混合粒子的分散液放入至20mL 的容器中,以3000r.p.m.藉由30分鐘的離心分離(科庫森(Kokusan)股份有限公司製造:H-103N)來去除未反應的單體。進而追加20mL的甲醇,進行超音波分散而再次進行離心分離。向其中放入相對於羧基的量而為等莫耳的三乙胺作為硬化觸媒,追加甲醇進行超音波分散,並進行交聯反應。於再次的離心分離後,去除三乙胺,而使所獲得的絕緣性微粒子分散於甲醇中。 A silane coupling agent (3-acryloxypropyltrimethoxysilane, manufactured by Shin-Etsu Chemical Co., Ltd.: KBM-5103) having a radically polymerizable double bond and an alkoxysilyl group was put into a 500 mL three-neck flask 7.5 g, methacrylic acid (manufactured by Wako Pure Chemical Industries, Ltd.) 6.9 g, methyl acrylate (manufactured by Wako Pure Chemical Industries, Ltd.) 4.1 g, 0.36 g of 2,2'-azobis(isobutyronitrile) , and 350 g of acetonitrile, and these were mixed. After displacing dissolved oxygen with nitrogen gas (100 mL/min) for 1 hour, heating was carried out at 80° C. and polymerization was carried out for 6 hours to obtain organic-inorganic hybrid particles with a primary particle diameter of 300 nm. Put the dispersion containing the organic-inorganic hybrid particles into 20mL In a container, unreacted monomers were removed by centrifugation (manufactured by Kokusan Co., Ltd.: H-103N) at 3000 r.p.m. for 30 minutes. Furthermore, 20 mL of methanol was added, ultrasonic dispersion was performed, and centrifugation was performed again. Triethylamine was put therein in an equimolar amount relative to the amount of carboxyl groups as a curing catalyst, methanol was added thereto, ultrasonic dispersion was carried out, and a crosslinking reaction was carried out. After centrifugation again, triethylamine was removed, and the obtained insulating fine particles were dispersed in methanol.

(複合粒子1) (composite particle 1)

<於基材粒子形成表面官能基的步驟> <Step of Forming Surface Functional Groups on Substrate Particles>

將疏基乙酸(和光純藥工業股份有限公司製造,商品名)8mmol溶解於甲醇200ml中,並向其中加入10g的所述準備的基材粒子。使用安裝有直徑45mm的攪拌翼的三一馬達(Three-One Motor)(新東科學股份有限公司製造,商品名:BL3000)於室溫(25℃)下攪拌2小時,利用以甲醇清洗後的Φ3μm的薄膜過濾器(密理博(Millipore)公司製造:塗佈型薄膜過濾器)進行過濾,從而獲得10g具有羧基作為表面官能基的基材粒子。 8 mmol of mercaptoacetic acid (manufactured by Wako Pure Chemical Industries, Ltd., trade name) was dissolved in 200 ml of methanol, and 10 g of the above-prepared substrate particles were added thereto. Stir at room temperature (25° C.) for 2 hours using a Three-One Motor (Three-One Motor) (manufactured by Shinto Science Co., Ltd., trade name: BL3000) equipped with a stirring blade with a diameter of 45 mm, and use methanol after washing Φ3 μm membrane filter (manufactured by Millipore: coated membrane filter) was filtered to obtain 10 g of substrate particles having a carboxyl group as a surface functional group.

<使高分子電解質吸附於基材粒子的步驟> <Step of Adsorbing Polymer Electrolyte on Substrate Particles>

以超純水將包含重量平均分子量70000的聚乙烯亞胺的30質量%聚乙烯亞胺水溶液(和光純藥工業股份有限公司製造,商品名:30%聚乙烯亞胺P-70溶液)稀釋,獲得0.3質量%聚乙烯亞胺水溶液。於該0.3質量%聚乙烯亞胺水溶液中加入所述導入有羧基的基材粒子10g。於室溫(25℃)下攪拌15分鐘,利用Φ3μm的薄膜過濾器進行過濾,從而獲得作為高分子電解質的聚乙烯亞 胺吸附於表面的粒子。於超純水200g中混合該粒子並於室溫(25℃)下攪拌5分鐘,進行過濾。於該薄膜過濾器上以200g的超純水將過濾而獲得的粒子清洗2次,將未吸附於粒子的聚乙烯亞胺去除。 A 30 mass % polyethyleneimine aqueous solution (manufactured by Wako Pure Chemical Industries, Ltd., trade name: 30% polyethyleneimine P-70 solution) containing polyethyleneimine with a weight average molecular weight of 70000 was diluted with ultrapure water, A 0.3 mass % polyethyleneimine aqueous solution was obtained. 10 g of the above-mentioned carboxyl group-introduced substrate particles were added to the 0.3 mass % polyethyleneimine aqueous solution. Stir at room temperature (25° C.) for 15 minutes, and filter with a Φ3 μm membrane filter to obtain polyethylene oxide as a polymer electrolyte. Amines are adsorbed to the surface of particles. The particles were mixed with 200 g of ultrapure water, stirred at room temperature (25° C.) for 5 minutes, and filtered. The particles obtained by filtration were washed twice with 200 g of ultrapure water on the membrane filter to remove polyethyleneimine not adsorbed to the particles.

<由絕緣性微粒子被覆基材粒子的步驟> <Step of Coating Substrate Particles with Insulating Fine Particles>

對經聚乙烯亞胺吸附的基材粒子10g,一面滴加利用2-丙醇(和光純藥工業(股)製造)將所述準備的絕緣性微粒子稀釋而獲得的2質量%的絕緣性微粒子分散液50g,一面於室溫(25℃)下攪拌30分鐘,從而獲得包含基材粒子及被覆其的絕緣性微粒子的複合粒子1。將藉由過濾而取出的複合粒子1放入至重量平均分子量1000的矽酮寡聚物(日立化成覆膜砂(Hitachi Chemical Coated Sand)股份有限公司製造:SC-6000)50g與甲醇150g的混合液中,於室溫(25℃)下攪拌1小時而進行過濾。最後,將複合粒子放入至甲苯(和光純藥工業(股)製造)而攪拌3分鐘,並進行過濾。 To 10 g of substrate particles adsorbed by polyethyleneimine, 2% by mass of insulating fine particles obtained by diluting the prepared insulating fine particles with 2-propanol (manufactured by Wako Pure Chemical Industries, Ltd.) was added dropwise. While stirring 50 g of the dispersion liquid at room temperature (25° C.) for 30 minutes, composite particles 1 including substrate particles and insulating fine particles covering them were obtained. Composite particles 1 taken out by filtration were put into a mixture of 50 g of a silicone oligomer with a weight average molecular weight of 1000 (manufactured by Hitachi Chemical Coated Sand Co., Ltd.: SC-6000) and 150 g of methanol solution, stirred at room temperature (25° C.) for 1 hour, and filtered. Finally, the composite particles were put in toluene (manufactured by Wako Pure Chemical Industries, Ltd.), stirred for 3 minutes, and filtered.

<分級步驟> <grading steps>

於150℃、1小時的條件下對所獲得的複合粒子1進行真空乾燥。之後,利用旋回氣流式篩分分級機(清津(Seishin)企業股份有限公司)將凝聚物除去。 The obtained composite particles 1 were vacuum-dried at 150° C. for 1 hour. Thereafter, aggregates were removed using a cyclone airflow type sieve classifier (Seishin Enterprise Co., Ltd.).

(複合粒子2) (composite particle 2)

與複合粒子1同樣地進行而獲得具有羧基作為表面官能基的基材粒子10g。 10 g of substrate particles having a carboxyl group as a surface functional group were obtained in the same manner as in composite particle 1 .

以超純水將包含重量平均分子量70000的聚乙烯亞胺的30質量%聚乙烯亞胺水溶液(和光純藥工業股份有限公司製造,商品名:30%聚乙烯亞胺P-70溶液)稀釋,獲得0.3質量%聚乙烯亞胺水溶液。於該0.3質量%聚乙烯亞胺水溶液中加入10g所述導入有羧基的基材粒子。於室溫(25℃)下攪拌15分鐘,利用Φ5μm的薄膜過濾器進行過濾,從而獲得作為高分子電解質的聚乙烯亞胺吸附於表面的粒子。於超純水200g中混合該粒子並於室溫(25℃)下攪拌5分鐘,進行過濾。於該薄膜過濾器上以200g的超純水將過濾而獲得的粒子清洗2次,將未吸附於粒子的聚乙烯亞胺去除。 A 30 mass % polyethyleneimine aqueous solution (manufactured by Wako Pure Chemical Industries, Ltd., trade name: 30% polyethyleneimine P-70 solution) containing polyethyleneimine with a weight average molecular weight of 70000 was diluted with ultrapure water, A 0.3 mass % polyethyleneimine aqueous solution was obtained. 10 g of the above-mentioned carboxyl group-introduced substrate particles were added to the 0.3 mass % polyethyleneimine aqueous solution. The mixture was stirred at room temperature (25° C.) for 15 minutes, and filtered through a Φ5 μm membrane filter to obtain particles having polyethyleneimine as a polymer electrolyte adsorbed on the surface. The particles were mixed with 200 g of ultrapure water, stirred at room temperature (25° C.) for 5 minutes, and filtered. The particles obtained by filtration were washed twice with 200 g of ultrapure water on the membrane filter to remove polyethyleneimine not adsorbed to the particles.

對經聚乙烯亞胺吸附的10g的基材粒子,一面滴加利用2-丙醇(和光純藥工業(股)製造)將所述準備的絕緣性微粒子稀釋而獲得的2質量%的絕緣性微粒子分散液50g,一面於室溫(25℃)下攪拌30分鐘,從而獲得包含導電粒子及被覆其的絕緣性微粒子1的複合粒子2。將藉由過濾而取出的複合粒子2放入至重量平均分子量1000的矽酮寡聚物(日立化成覆膜砂(Hitachi Chemical Coated Sand)股份有限公司製造:SC-6000)50g與甲醇150g的混合液中,於室溫(25℃)下攪拌1小時而進行過濾。最後,將複合粒子放入至甲苯(和光純藥工業(股)製造)而攪拌3分鐘,並進行過濾。 To 10 g of substrate particles adsorbed by polyethyleneimine, 2% by mass of insulating fine particles obtained by diluting the prepared insulating fine particles with 2-propanol (manufactured by Wako Pure Chemical Industries, Ltd.) was added dropwise. While stirring 50 g of the fine particle dispersion liquid at room temperature (25° C.) for 30 minutes, composite particles 2 including conductive particles and insulating fine particles 1 covering them were obtained. Composite particles 2 taken out by filtration were put into a mixture of 50 g of a silicone oligomer with a weight average molecular weight of 1000 (manufactured by Hitachi Chemical Coated Sand Co., Ltd.: SC-6000) and 150 g of methanol solution, stirred at room temperature (25° C.) for 1 hour, and filtered. Finally, the composite particles were put in toluene (manufactured by Wako Pure Chemical Industries, Ltd.), stirred for 3 minutes, and filtered.

於150℃、1小時的條件下對所獲得的複合粒子2進行真空乾燥。之後,利用旋回氣流式篩分分級機(清津(Seishin) 企業股份有限公司)將凝聚物除去。 The obtained composite particles 2 were vacuum-dried at 150° C. for 1 hour. After that, using a cyclone airflow type sieving classifier (Seishin) Enterprise Co., Ltd.) to remove the condensate.

(複合粒子3) (composite particle 3)

與複合粒子1同樣地進行而獲得具有羧基作為表面官能基的基材粒子10g。 10 g of substrate particles having a carboxyl group as a surface functional group were obtained in the same manner as in composite particle 1 .

以超純水將包含重量平均分子量70000的聚乙烯亞胺的30質量%聚乙烯亞胺水溶液(和光純藥工業股份有限公司製造,商品名:30%聚乙烯亞胺P-70溶液)稀釋,獲得0.3質量%聚乙烯亞胺水溶液。於該0.3質量%聚乙烯亞胺水溶液中加入10g所述導入有羧基的基材粒子。於室溫(25℃)下攪拌15分鐘,利用Φ6μm的薄膜過濾器進行過濾,從而獲得作為高分子電解質的聚乙烯亞胺吸附於表面的粒子。於超純水200g中混合該粒子並於室溫(25℃)下攪拌5分鐘,進行過濾。於該薄膜過濾器上以200g的超純水將過濾而獲得的粒子清洗2次,將未吸附於粒子的聚乙烯亞胺去除。 A 30 mass % polyethyleneimine aqueous solution (manufactured by Wako Pure Chemical Industries, Ltd., trade name: 30% polyethyleneimine P-70 solution) containing polyethyleneimine with a weight average molecular weight of 70000 was diluted with ultrapure water, A 0.3 mass % polyethyleneimine aqueous solution was obtained. 10 g of the above-mentioned carboxyl group-introduced substrate particles were added to the 0.3 mass % polyethyleneimine aqueous solution. The mixture was stirred at room temperature (25° C.) for 15 minutes, and filtered through a Φ6 μm membrane filter to obtain particles having polyethyleneimine as a polymer electrolyte adsorbed on the surface. The particles were mixed with 200 g of ultrapure water, stirred at room temperature (25° C.) for 5 minutes, and filtered. The particles obtained by filtration were washed twice with 200 g of ultrapure water on the membrane filter to remove polyethyleneimine not adsorbed to the particles.

對經聚乙烯亞胺吸附的10g的基材粒子,一面滴加利用2-丙醇(和光純藥工業(股)製造)將絕緣性微粒子稀釋而獲得的2質量%的絕緣性微粒子分散液50g,一面於室溫(25℃)下攪拌30分鐘,從而獲得包含導電粒子及被覆其的絕緣性微粒子1的複合粒子3。將藉由過濾而取出的複合粒子3放入至重量平均分子量1000的矽酮寡聚物(日立化成覆膜砂(Hitachi Chemical Coated Sand)股份有限公司製造:SC-6000)50g與甲醇150g的混合液中,於室溫(25℃)下攪拌1小時而進行過濾。最後,將複合粒 子放入至甲苯(和光純藥工業(股)製造)而攪拌3分鐘,並進行過濾。 To 10 g of substrate particles adsorbed by polyethyleneimine, 50 g of a 2% by mass insulating fine particle dispersion obtained by diluting insulating fine particles with 2-propanol (manufactured by Wako Pure Chemical Industries, Ltd.) was added dropwise , while stirring at room temperature (25° C.) for 30 minutes, composite particles 3 including conductive particles and insulating fine particles 1 covering them were obtained. Composite particles 3 taken out by filtration were put into a mixture of 50 g of a silicone oligomer with a weight average molecular weight of 1000 (manufactured by Hitachi Chemical Coated Sand Co., Ltd.: SC-6000) and 150 g of methanol solution, stirred at room temperature (25° C.) for 1 hour, and filtered. Finally, the composite particles The mixture was put into toluene (manufactured by Wako Pure Chemical Industries, Ltd.), stirred for 3 minutes, and filtered.

於150℃、1小時的條件下對所獲得的複合粒子3進行真空乾燥。之後,利用旋回氣流式篩分分級機(清津(Seishin)企業股份有限公司)將凝聚物除去。 The obtained composite particles 3 were vacuum-dried at 150° C. for 1 hour. Thereafter, aggregates were removed using a cyclone airflow type sieve classifier (Seishin Enterprise Co., Ltd.).

[粒子收納構件的準備] [Preparation of particle storage member]

分別準備以下所示的粒子收納構件。 The particle storage members shown below were prepared respectively.

(粒子收納構件1) (Particle storage member 1)

以利用29000個/mm2的密度將具有封閉端面(底面)的圓筒形狀(直徑4.0μm,深度3.8μm)的孔排列為正三邊形型的方式設置於厚度5.0μm的藉由甲基丙烯酸酯的聚合而獲得的板上。 It is arranged in a methacrylic acid layer with a thickness of 5.0 μm in such a way that the holes in the shape of a cylinder (diameter 4.0 μm, depth 3.8 μm) with a closed end surface (bottom surface) are arranged in a regular triangle at a density of 29,000/mm 2 The plates obtained by the polymerization of esters.

(粒子收納構件2) (Particle storage member 2)

以利用20000個/mm2的密度將具有封閉端面(底面)的圓筒形狀(直徑4.0μm,深度3.8μm)的孔排列為正方形型的方式設置於厚度5.0μm的藉由甲基丙烯酸酯的聚合而獲得的板上。 Arrange the holes in the shape of a cylinder (diameter 4.0 μm, depth 3.8 μm) with a closed end surface (bottom surface) in a square shape at a density of 20,000/mm 2 on a methacrylate substrate with a thickness of 5.0 μm polymerization obtained on the plate.

(粒子收納構件3) (Particle storage member 3)

以利用25000個/mm2的密度將具有封閉端面(底面)的圓筒形狀(直徑4.6μm,深度3.8μm)的孔排列為正三邊形型的方式設置於厚度5.0μm的藉由甲基丙烯酸酯的聚合而獲得的板上。 It is arranged in a methacrylic acid layer with a thickness of 5.0 μm in such a way that the holes in the shape of a cylinder (diameter 4.6 μm, depth 3.8 μm) with a closed end surface (bottom surface) are arranged in a regular triangle at a density of 25,000 pieces/mm 2 The plates obtained by the polymerization of esters.

(粒子收納構件4) (Particle storage member 4)

以利用20000個/mm2的密度將具有封閉端面(底面)的圓筒形狀(直徑5.2μm,深度3.8μm)的孔排列為正三邊形型的方式 設置於厚度5.0μm的藉由甲基丙烯酸酯的聚合而獲得的板上。 It is arranged in a methacrylic acid layer with a thickness of 5.0 μm in such a way that the holes of the cylindrical shape (5.2 μm in diameter and 3.8 μm in depth) with a closed end surface (bottom surface) are arranged in a regular triangle at a density of 20,000/mm 2 The plates obtained by the polymerization of esters.

(粒子收納構件5) (Particle storage member 5)

以利用29000個/mm2的密度將具有封閉端面(底面)的圓筒形狀(直徑3.7μm,深度3.8μm)的孔排列為正三邊形型的方式設置於厚度5.0μm的藉由甲基丙烯酸酯的聚合而獲得的板上。 It is arranged in a methacrylic acid layer with a thickness of 5.0 μm in such a way that the holes in the shape of a cylinder (diameter 3.7 μm, depth 3.8 μm) with a closed end surface (bottom surface) are arranged in a regular triangle at a density of 29000/mm 2 The plates obtained by the polymerization of esters.

[各向異性導電膜的製作] [Production of anisotropic conductive film]

(實施例1) (Example 1)

與圖4(a)及圖4(b)中所示的方法同樣地進行,將複合粒子1收納至粒子收納構件1的孔中,使用端面水平的胺基甲酸酯橡膠製的刮刀來去除自孔中露出的複合粒子的位於球冠區域的絕緣性微粒子。再者,根據該操作,藉由利用SEM的觀察來確認於複合粒子的球冠區域設有54.7μm2的絕緣性微粒子數為0個的區域。 Perform the same method as shown in FIG. 4( a ) and FIG. 4( b ), store the composite particles 1 in the holes of the particle storage member 1, and remove them using a scraper made of urethane rubber with the end surface horizontal. Insulating fine particles located in the spherical cap region of the composite particles exposed from the pores. In addition, according to this operation, it was confirmed by SEM observation that a region where the number of insulating fine particles of 54.7 μm 2 is zero is provided in the spherical cap region of the composite particles.

其次,與圖5(a)及圖5(b)中所示的方法同樣地進行,於接著劑層1上設置以29000個/mm2的粒子密度配置為正三邊形型的絕緣被覆導電粒子。再者,此時,藉由絕緣性微粒子附著於粒子收納構件1的孔的底面,藉由利用SEM的觀察來確認於絕緣被覆導電粒子的與接著劑層1相接的部分的相反側設有47.9μm2的絕緣性微粒子數為0個的區域。 Next, proceed in the same manner as the method shown in FIG. 5(a) and FIG. 5(b), and arrange insulating-coated conductive particles arranged in a regular triangle at a particle density of 29,000/mm 2 on the adhesive layer 1. . Furthermore, at this time, by the adherence of insulating fine particles to the bottom surface of the hole of the particle storage member 1, it was confirmed by observation with an SEM that the insulating coating conductive particles are provided with A region where the number of insulating fine particles of 47.9 μm 2 is 0.

其次,利用加熱至40℃的熱輥層壓機將接著劑層2貼合於接著劑層1的配置有絕緣被覆導電粒子之側,從而獲得於兩個PET樹脂膜間設有導電性接著劑層的各向異性導電膜。 Next, the adhesive layer 2 is bonded to the side of the adhesive layer 1 on which the insulating coated conductive particles are disposed by using a hot roll laminator heated to 40° C., so that a conductive adhesive is provided between the two PET resin films. Layer anisotropic conductive film.

(實施例2) (Example 2)

使用粒子收納構件2,於接著劑層1上設置以20000個/mm2的粒子密度配置為正方形型的絕緣被覆導電粒子,除此以外,與實施例1同樣地進行而獲得各向異性導電膜。 The anisotropic conductive film was obtained in the same manner as in Example 1 except that the insulating coated conductive particles arranged in a square shape at a particle density of 20,000 particles/ mm2 were provided on the adhesive layer 1 using the particle storage member 2. .

(實施例3) (Example 3)

使用複合粒子2代替複合粒子1,且使用粒子收納構件3代替粒子收納構件1,除此以外,與實施例1同樣地進行而獲得各向異性導電膜。該情況下,亦可確認到於複合粒子的球冠區域設有50.2μm2的絕緣性微粒子數為0個的區域,且可確認到於絕緣被覆導電粒子的與接著劑層1相接的部分的相反側設有48.7μm2的絕緣性微粒子數為0個的區域。 Except having used the composite particle 2 instead of the composite particle 1, and having used the particle storage member 3 instead of the particle storage member 1, it carried out similarly to Example 1, and obtained the anisotropic conductive film. In this case, it can also be confirmed that there is a region where the number of insulating fine particles of 50.2 μm 2 is 0 in the spherical cap region of the composite particle, and it can be confirmed that the insulating coating conductive particle is in contact with the adhesive layer 1. On the opposite side, there is a region where the number of insulating fine particles of 48.7 μm 2 is 0.

(實施例4) (Example 4)

使用複合粒子3代替複合粒子1,且使用粒子收納構件4代替粒子收納構件1,除此以外,與實施例1同樣地進行而獲得各向異性導電膜。該情況下,亦可確認到於複合粒子的球冠區域設有53.3μm2的絕緣性微粒子數為0個的區域,且可確認到於絕緣被覆導電粒子的與接著劑層1相接的部分的相反側設有48.7μm2的絕緣性微粒子數為0個的區域。 Except having used the composite particle 3 instead of the composite particle 1, and having used the particle storage member 4 instead of the particle storage member 1, it carried out similarly to Example 1, and obtained the anisotropic conductive film. In this case, it can also be confirmed that there is a region where the number of insulating fine particles of 53.3 μm 2 is 0 in the spherical cap region of the composite particle, and it can be confirmed that the insulating coating conductive particle is in contact with the adhesive layer 1. On the opposite side, there is a region where the number of insulating fine particles of 48.7 μm 2 is 0.

(實施例5) (Example 5)

使用粒子收納構件5代替粒子收納構件1,除此以外,與實施例1同樣地進行而獲得各向異性導電膜。該情況下,亦可確認到於複合粒子的球冠區域設有52.6μm2的絕緣性微粒子數為0個 的區域,且可確認到於絕緣被覆導電粒子的與接著劑層1相接的部分的相反側設有47.9μm2的絕緣性微粒子數為0個的區域。 Except having used the particle storage member 5 instead of the particle storage member 1, it carried out similarly to Example 1, and obtained the anisotropic conductive film. In this case, it can also be confirmed that there is a region where the number of insulating fine particles of 52.6 μm 2 is 0 in the spherical cap region of the composite particle, and it can be confirmed that the portion of the insulating-coated conductive particle in contact with the adhesive layer 1 On the opposite side, there is a region where the number of insulating fine particles of 47.9 μm 2 is zero.

(實施例6) (Example 6)

使用接著劑層3代替接著劑層1,除此以外,與實施例1同樣地進行而獲得各向異性導電膜。 Except having used the adhesive bond layer 3 instead of the adhesive bond layer 1, it carried out similarly to Example 1, and obtained the anisotropic conductive film.

[各向異性導電膜的評價] [Evaluation of Anisotropic Conductive Film]

藉由FIB-SEM來對實施例1~實施例6的各向異性導電膜進行剖面加工及剖面觀察。再者,剖面觀察是於通過絕緣被覆導電粒子的基材粒子的中心且平行於導電性接著劑層的厚度方向的面中進行,測定此時的絕緣被覆導電粒子的平行於導電性接著劑層的厚度方向的方向上的粒徑X、和與導電性接著劑層的厚度方向正交的方向上的粒徑Y,並且測定絕緣被覆導電粒子與導電性接著劑層的其中一面的最短距離D。將結果示於表1中。 The cross-section processing and cross-sectional observation of the anisotropic conductive film of Example 1-Example 6 were performed by FIB-SEM. Furthermore, cross-sectional observation is carried out in a plane that passes through the center of the substrate particle of the insulating-coated conductive particle and is parallel to the thickness direction of the conductive adhesive layer to measure the thickness of the insulating-coated conductive particle parallel to the conductive adhesive layer. The particle size X in the thickness direction of the conductive adhesive layer and the particle size Y in the direction perpendicular to the thickness direction of the conductive adhesive layer, and the shortest distance D between the insulating coated conductive particles and one side of the conductive adhesive layer is measured . The results are shown in Table 1.

Figure 107102936-A0305-02-0042-1
Figure 107102936-A0305-02-0042-1

[連接結構體的製作] [Creation of connection structure]

作為第1電路構件,準備具有將凸塊電極排列為一排的直線排列結構的IC晶片(外形為2mm×20mm,厚度為0.55mm,凸塊電極的大小為100μm×30μm,凸塊電極間距離為8μm,凸塊電 極厚度為15μm)。另外,作為第2電路構件,準備於玻璃基板(康寧(Corning)公司製造:#1737,38mm×28mm,厚度0.3mm)的表面形成ITO的配線圖案(圖案寬度為21μm,電極間空間為17μm)而成者。 As the first circuit member, prepare an IC wafer having a linear arrangement structure in which bump electrodes are arranged in a row (the outer shape is 2 mm × 20 mm, the thickness is 0.55 mm, the size of the bump electrodes is 100 μm × 30 μm, the distance between the bump electrodes 8µm, bump electrical pole thickness of 15 μm). In addition, as a second circuit member, an ITO wiring pattern (pattern width: 21 μm, inter-electrode space: 17 μm) was prepared on the surface of a glass substrate (manufactured by Corning: #1737, 38 mm×28 mm, thickness 0.3 mm). become one.

將實施例1~實施例6的各向異性導電膜(2.5mm×25mm)的其中一PET樹脂膜剝離,使用包括包含陶瓷加熱器的載台(150mm×150mm)以及工具(3mm×20mm)的熱壓接裝置,於80℃、0.98MPa(10kgf/cm2)的條件下進行2秒鐘加熱及加壓,將導電性接著劑層貼附於玻璃基板上。 One of the PET resin films of the anisotropic conductive films (2.5mm×25mm) of Examples 1 to 6 was peeled off, and a stage (150mm×150mm) including a ceramic heater and a tool (3mm×20mm) were used. The thermocompression bonding device heats and presses for 2 seconds under the conditions of 80° C. and 0.98 MPa (10 kgf/cm 2 ), and attaches the conductive adhesive layer to the glass substrate.

其次,將各向異性導電膜的另一PET樹脂膜剝離,進行IC晶片的凸塊電極與玻璃基板的電路電極的對準後,使用包括包含陶瓷加熱器的載台(150mm×150mm)以及工具(3mm×20mm)的熱壓接裝置,於導電性接著劑層的實測最高達到溫度170℃、及利用凸塊電極的面積換算壓力70MPa的條件下進行5秒鐘加熱及加壓,從而獲得連接結構體。 Next, after peeling off the other PET resin film of the anisotropic conductive film and aligning the bump electrodes of the IC chip and the circuit electrodes of the glass substrate, a stage (150mm×150mm) including a ceramic heater and a tool are used to (3mm×20mm) thermocompression bonding device, heat and press for 5 seconds under the conditions of the measured maximum temperature of the conductive adhesive layer of 170°C and a pressure of 70MPa converted from the area of the bump electrode to obtain a connection structure.

[連接結構體的評價] [Evaluation of Linked Structure]

對所獲得的連接結構體評價凸塊電極與電路電極之間的連接電阻、及相鄰的電路電極間的絕緣電阻。再者,連接電阻的評價是利用四端子測定法來實施,且使用14個部位的測定的平均值。另外,絕緣電阻的評價是對連接結構體施加50V的電壓,一次性測定共計1440處的電路電極間的絕緣電阻。將結果示於表2中。 The connection resistance between a bump electrode and a circuit electrode, and the insulation resistance between adjacent circuit electrodes were evaluated about the obtained bonded structure. In addition, the evaluation of connection resistance was implemented by the four-probe measurement method, and the average value of the measurement of 14 places was used. In addition, in the evaluation of the insulation resistance, a voltage of 50 V was applied to the bonded structure, and the insulation resistance between the circuit electrodes at a total of 1440 points was measured at once. The results are shown in Table 2.

[表2]

Figure 107102936-A0305-02-0044-2
[Table 2]
Figure 107102936-A0305-02-0044-2

如表2所示,使用實施例1~實施例6的各向異性導電膜而製作的連接結構體的連接電阻值為1.2Ω以下,且具有充分的絕緣電阻。 As shown in Table 2, the bonded structures produced using the anisotropic conductive films of Examples 1 to 6 had a connection resistance value of 1.2Ω or less, and had sufficient insulation resistance.

1‧‧‧基材粒子 1‧‧‧Substrate particles

2‧‧‧絕緣性微粒子 2‧‧‧Insulating particles

10‧‧‧絕緣被覆導電粒子 10‧‧‧Insulation coated conductive particles

P‧‧‧中心軸 P‧‧‧central axis

Claims (17)

一種絕緣被覆導電粒子,其具備具有導電性的基材粒子、與被覆所述基材粒子的表面的絕緣性微粒子,且具有絕緣性微粒子數的密度為0~2.0個/μm2的疏區域、與絕緣性微粒子數的密度較所述疏區域更大的密區域,所述絕緣被覆導電粒子具有中心軸所通過的兩個所述疏區域,所述中心軸通過所述基材粒子的中心,當將所述基材粒子的表面積設為S0 μm2時,所述兩個疏區域包含0.10×S0 μm2以上的絕緣性微粒子數為0的區域。 An insulating-coated conductive particle comprising a conductive substrate particle and insulating fine particles covering the surface of the substrate particle, and having a sparse region with a density of insulating fine particles of 0 to 2.0 pieces/μm 2 , a dense region having a density of insulating fine particles higher than that of the sparse region, the insulating-coated conductive particle has two of the sparse regions through which a central axis passes through the center of the substrate particle, When the surface area of the substrate particle is S 0 μm 2 , the two sparse regions include a region where the number of insulating fine particles is 0.10×S 0 μm 2 or more. 如申請專利範圍第1項所述的絕緣被覆導電粒子,其中在所述兩個疏區域中,絕緣性微粒子數的密度為0個/μm2,且當將所述基材粒子的表面積設為S0 μm2時,所述兩個疏區域佔0.5×S0 μm2以上。 Insulation-coated conductive particles as described in item 1 of the scope of the patent application, wherein in the two sparse regions, the density of the number of insulating fine particles is 0/μm 2 , and when the surface area of the substrate particles is set to When S 0 μm 2 , the two sparse regions occupy more than 0.5×S 0 μm 2 . 如申請專利範圍第1項所述的絕緣被覆導電粒子,其中在所述密區域中,所述絕緣性微粒子的密度為2.0~5.0個/μm2The insulation-coated conductive particle according to claim 1, wherein in the dense region, the density of the insulating fine particles is 2.0-5.0 particles/μm 2 . 一種絕緣被覆導電粒子,其是對於具備具有導電性的基材粒子、與被覆所述基材粒子的表面的絕緣性微粒子的複合粒子,將位於利用兩個平行的平面切割所述基材粒子時的兩個球冠區域的所述絕緣性微粒子的一部分或全部去除而成,其中當將所述基材粒子的表面積設為S0 μm2時,所述兩個球冠區域包含0.10×S0 μm2以上的絕緣性微粒子數為0的區域。 An insulating-coated conductive particle, which is a composite particle including a conductive substrate particle and insulating fine particles covering the surface of the substrate particle, when the substrate particle is cut in two parallel planes Part or all of the insulating fine particles in the two spherical cap regions are removed, wherein when the surface area of the substrate particle is set as S 0 μm 2 , the two spherical cap regions contain 0.10×S 0 A region where the number of insulating fine particles of μm 2 or more is zero. 如申請專利範圍第4項所述的絕緣被覆導電粒子,其中在所述兩個球冠區域中,每單位面積的絕緣性微粒子數為0,且當將所述基材粒子的表面積設為S0 μm2時,所述兩個球冠區域佔0.5×S0 μm2以上。 Insulation-coated conductive particles as described in item 4 of the scope of the patent application, wherein in the two spherical cap regions, the number of insulating fine particles per unit area is 0, and when the surface area of the substrate particles is set as S 0 μm 2 , the two spherical cap regions occupy more than 0.5×S 0 μm 2 . 如申請專利範圍第4項所述的絕緣被覆導電粒子,其中在利用所述兩個平行的平面切割所述基材粒子時的球帶區域中,所述絕緣性微粒子的密度為2.0~5.0個/μm2The insulation-coated conductive particle as described in Claim 4 of the patent application, wherein the density of the insulating fine particles is 2.0 to 5.0 in the band region when the substrate particle is cut by the two parallel planes /μm 2 . 一種絕緣被覆導電粒子,其具備具有導電性的基材粒子、與被覆所述基材粒子的表面的絕緣性微粒子,所述絕緣性微粒子偏在於利用兩個平行的平面切割所述基材粒子時的球帶區域,當將所述基材粒子的表面積設為S0 μm2時,利用所述兩個平行的平面切割所述基材粒子時的兩個球冠區域包含0.10×S0 μm2以上的絕緣性微粒子數為0的區域。 An insulating-coated conductive particle comprising a conductive substrate particle and insulating fine particles covering the surface of the substrate particle, the insulating fine particles are biased when the substrate particle is cut in two parallel planes The area of the spherical zone, when the surface area of the substrate particle is set as S 0 μm 2 , the two spherical cap regions when the substrate particle is cut by the two parallel planes include 0.10×S 0 μm 2 The above region where the number of insulating fine particles is 0. 如申請專利範圍第7項所述的絕緣被覆導電粒子,其中在所述兩個球冠區域中,每單位面積的絕緣性微粒子數為0,且當將所述基材粒子的表面積設為S0 μm2時,所述兩個球冠區域佔0.5×S0 μm2以上。 Insulation-coated conductive particles as described in item 7 of the scope of the patent application, wherein in the two spherical cap regions, the number of insulating fine particles per unit area is 0, and when the surface area of the substrate particles is set as S 0 μm 2 , the two spherical cap regions occupy more than 0.5×S 0 μm 2 . 如申請專利範圍第7項所述的絕緣被覆導電粒子,其中在所述球帶區域中,所述絕緣性微粒子的密度為2.0~5.0個/μm2Insulation-coated conductive particles as described in claim 7 of the patent application, wherein the density of the insulating fine particles is 2.0-5.0 particles/μm 2 in the spherical region. 如申請專利範圍第1~9項中任一項所述的絕緣被覆導電粒子,其中個別的所述絕緣被覆導電粒子的最小徑X’與最大徑 Y’之比X’/Y’為0.4以上且0.9以下。 Insulation-coated conductive particles as described in any one of items 1 to 9 of the scope of the patent application, wherein the smallest diameter X' and the largest diameter of the individual insulating-coated conductive particles The ratio X'/Y' of Y' is not less than 0.4 and not more than 0.9. 一種各向異性導電膜,其具備包含如申請專利範圍第1項至第10項中任一項所述的絕緣被覆導電粒子與接著劑成分的導電性接著劑層。 An anisotropic conductive film comprising a conductive adhesive layer comprising insulating coated conductive particles and adhesive components as described in any one of claims 1 to 10 of the patent application. 如申請專利範圍第11項所述的各向異性導電膜,其包含如申請專利範圍第1項所述的絕緣被覆導電粒子,所述絕緣被覆導電粒子以通過所述基材粒子的中心且平行於所述導電性接著劑層的厚度方向的軸通過兩個所述疏區域的方式進行配置。 The anisotropic conductive film as described in item 11 of the scope of application for patents, which comprises the insulating coated conductive particles as described in item 1 of the scope of patent applications, the conductive particles of insulating coated coating pass through the center of the substrate particles and are parallel to An axis in the thickness direction of the conductive adhesive layer is arranged so as to pass through the two sparse regions. 如申請專利範圍第11項所述的各向異性導電膜,其包含如申請專利範圍第4項所述的絕緣被覆導電粒子,所述絕緣被覆導電粒子以通過所述基材粒子的中心且平行於所述導電性接著劑層的厚度方向的軸通過兩個所述球冠區域的方式進行配置。 The anisotropic conductive film as described in claim 11 of the patent application, which comprises the insulating coated conductive particles as described in claim 4, the insulating coated conductive particles pass through the center of the substrate particle and are parallel to The axis in the thickness direction of the conductive adhesive layer is arranged so as to pass through the two spherical cap regions. 如申請專利範圍第11項所述的各向異性導電膜,其包含如申請專利範圍第4項或第7項所述的絕緣被覆導電粒子,所述絕緣被覆導電粒子以通過所述基材粒子的中心且平行於所述導電性接著劑層的厚度方向的軸與所述兩個平行的平面正交的方式進行配置。 The anisotropic conductive film as described in claim 11 of the patent application, which comprises the insulating coated conductive particles as described in claim 4 or claim 7, the insulating coated conductive particles pass through the substrate particles The center of the conductive adhesive layer and the axis parallel to the thickness direction of the conductive adhesive layer are arranged so as to be perpendicular to the two parallel planes. 一種各向異性導電膜的製造方法,用來製造如申請專利範圍第11~14項中任一項所述的各向異性導電膜,其包括:準備具備具有導電性的基材粒子、與被覆所述基材粒子的表 面的絕緣性微粒子的複合粒子的步驟;將所述複合粒子收納至設有具有封閉端面的孔的粒子收納構件的所述孔中的步驟;將自所述孔中露出的所述複合粒子的位於球冠區域的所述絕緣性微粒子的一部分或全部去除的步驟;使球冠區域的絕緣性微粒子被去除的所述複合粒子以所述球冠區域側與所述第1接著劑層相接的方式自所述粒子收納構件移動至第1接著劑層上,並使所述複合粒子的所述絕緣性微粒子的一部分附著於所述粒子收納構件的所述封閉端面而去除,藉此於所述第1接著劑層上設置絕緣被覆導電粒子的步驟;以及將第2接著劑層貼合於所述第1接著劑層的配置有所述絕緣被覆導電粒子之側的步驟。 A method for manufacturing an anisotropic conductive film, which is used to manufacture an anisotropic conductive film as described in any one of the 11th to 14th items of the patent application, which includes: preparing substrate particles with conductivity, and coating The table of the substrate particle The steps of composite particles of insulating fine particles on the surface; the step of storing the composite particles in the holes of the particle storage member provided with holes that close the end faces; the steps of the composite particles exposed from the holes A step of removing part or all of the insulating fine particles located in the spherical cap region; making the composite particles from which the insulating fine particles in the spherical cap region have been removed contact the first adhesive layer at the spherical cap region side moving from the particle storage member to the first adhesive layer, and a part of the insulating fine particles of the composite particles are attached to the closed end surface of the particle storage member and removed, whereby the The step of providing the insulating-coated conductive particles on the first adhesive layer; and the step of attaching the second adhesive layer to the side of the first adhesive layer on which the insulating-coated conductive particles are arranged. 一種連接結構體,其具備:第1電路構件,具有凸塊電極;第2電路構件,具有與所述凸塊電極相對應的電路電極;以及如申請專利範圍第1項至第10項中任一項所述的絕緣被覆導電粒子,介隔存在於所述凸塊電極及所述電路電極之間並將所述凸塊電極及所述電路電極電性連接。 A connection structure comprising: a first circuit member having a bump electrode; a second circuit member having a circuit electrode corresponding to the bump electrode; The insulating-coated conductive particle according to one item exists between the bump electrode and the circuit electrode and electrically connects the bump electrode and the circuit electrode. 一種連接結構體的製造方法,其具有使如申請專利範圍第11項至第14項中任一項所述的各向異性導電膜或藉由如申請專利範圍第15項所述的方法而獲得的各向異性導電膜介隔存在於具有凸塊電極的第1電路構件、與具有與所述凸塊電極相對應的電 路電極的第2電路構件之間,並對所述第1電路構件與所述第2電路構件進行熱壓接的步驟。A method of manufacturing a connection structure, which has the anisotropic conductive film as described in any one of the 11th to 14th items of the patent application or is obtained by the method as described in the 15th item of the patent application The anisotropic conductive film exists between the first circuit member having the bump electrode and the electric circuit member corresponding to the bump electrode. between the second circuit members of the road electrodes, and thermocompression bonding the first circuit member and the second circuit member.
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