TWI800435B - Continuous inspection method and continuous inspection device for optical display panel, and continuous manufacturing method and continuous manufacturing system for optical display panel - Google Patents

Continuous inspection method and continuous inspection device for optical display panel, and continuous manufacturing method and continuous manufacturing system for optical display panel Download PDF

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Publication number
TWI800435B
TWI800435B TW111128580A TW111128580A TWI800435B TW I800435 B TWI800435 B TW I800435B TW 111128580 A TW111128580 A TW 111128580A TW 111128580 A TW111128580 A TW 111128580A TW I800435 B TWI800435 B TW I800435B
Authority
TW
Taiwan
Prior art keywords
continuous
display panel
optical display
continuous manufacturing
inspection device
Prior art date
Application number
TW111128580A
Other languages
Chinese (zh)
Other versions
TW202246861A (en
Inventor
田壺宏和
村上洋介
Original Assignee
日商日東電工股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by 日商日東電工股份有限公司 filed Critical 日商日東電工股份有限公司
Publication of TW202246861A publication Critical patent/TW202246861A/en
Application granted granted Critical
Publication of TWI800435B publication Critical patent/TWI800435B/en

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1303—Apparatus specially adapted to the manufacture of LCDs
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Manufacturing & Machinery (AREA)
  • Engineering & Computer Science (AREA)
  • Liquid Crystal (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
TW111128580A 2018-01-10 2018-12-12 Continuous inspection method and continuous inspection device for optical display panel, and continuous manufacturing method and continuous manufacturing system for optical display panel TWI800435B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2018001647A JP7051445B2 (en) 2018-01-10 2018-01-10 Continuous inspection method and continuous inspection device for optical display panel, and continuous manufacturing method and continuous manufacturing system for optical display panel.
JP2018-001647 2018-01-10

Publications (2)

Publication Number Publication Date
TW202246861A TW202246861A (en) 2022-12-01
TWI800435B true TWI800435B (en) 2023-04-21

Family

ID=67188586

Family Applications (2)

Application Number Title Priority Date Filing Date
TW107144767A TWI785165B (en) 2018-01-10 2018-12-12 Continuous inspection method and continuous inspection device for optical display panel, and continuous manufacturing method and continuous manufacturing system for optical display panel
TW111128580A TWI800435B (en) 2018-01-10 2018-12-12 Continuous inspection method and continuous inspection device for optical display panel, and continuous manufacturing method and continuous manufacturing system for optical display panel

Family Applications Before (1)

Application Number Title Priority Date Filing Date
TW107144767A TWI785165B (en) 2018-01-10 2018-12-12 Continuous inspection method and continuous inspection device for optical display panel, and continuous manufacturing method and continuous manufacturing system for optical display panel

Country Status (4)

Country Link
JP (1) JP7051445B2 (en)
KR (1) KR20190085467A (en)
CN (1) CN110018582B (en)
TW (2) TWI785165B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7030914B1 (en) * 2020-08-27 2022-03-07 花王株式会社 Manufacturing method of sheet-shaped member

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004170495A (en) * 2002-11-18 2004-06-17 Micronics Japan Co Ltd Method and device for inspecting substrate for display
JP2013246059A (en) * 2012-05-25 2013-12-09 Sharp Corp Defect inspection apparatus and defect inspection method
JP2016121981A (en) * 2014-12-24 2016-07-07 日東電工株式会社 Transmission type defect inspection device and defect inspection method
TW201734460A (en) * 2014-06-27 2017-10-01 應用材料股份有限公司 Linear inspection system

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001349839A (en) * 2000-06-07 2001-12-21 Sumitomo Chem Co Ltd Inspection method for polarizing film defect
JP4228778B2 (en) * 2003-05-21 2009-02-25 ウシオ電機株式会社 Pattern inspection device
KR100922616B1 (en) * 2007-10-24 2009-10-21 주식회사 아바코 Film inspection system
JP2009282385A (en) * 2008-05-23 2009-12-03 Nitto Denko Corp Method of manufacturing optical display device
JP2010101692A (en) * 2008-10-22 2010-05-06 Kyodo Printing Co Ltd Method and device for inspecting sheetlike article
KR101300132B1 (en) * 2011-01-31 2013-08-26 삼성코닝정밀소재 주식회사 Apparatus for detecting particle in flat glass and detecting method using same
JP4921597B1 (en) * 2011-03-18 2012-04-25 日東電工株式会社 Liquid crystal display panel continuous manufacturing system, liquid crystal display panel continuous manufacturing method, inspection apparatus and inspection method
KR101324015B1 (en) * 2011-08-18 2013-10-31 바슬러 비전 테크놀로지스 에이지 Apparatus and method for detecting the surface defect of the glass substrate
JP6156820B2 (en) * 2013-08-22 2017-07-05 住友化学株式会社 Defect inspection apparatus, optical member manufacturing system, and optical display device production system
TWI628429B (en) * 2016-12-27 2018-07-01 住華科技股份有限公司 Defect inspection system and defect inspection method

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004170495A (en) * 2002-11-18 2004-06-17 Micronics Japan Co Ltd Method and device for inspecting substrate for display
JP2013246059A (en) * 2012-05-25 2013-12-09 Sharp Corp Defect inspection apparatus and defect inspection method
TW201734460A (en) * 2014-06-27 2017-10-01 應用材料股份有限公司 Linear inspection system
JP2016121981A (en) * 2014-12-24 2016-07-07 日東電工株式会社 Transmission type defect inspection device and defect inspection method

Also Published As

Publication number Publication date
TWI785165B (en) 2022-12-01
TW201930981A (en) 2019-08-01
KR20190085467A (en) 2019-07-18
JP2019120848A (en) 2019-07-22
TW202246861A (en) 2022-12-01
JP7051445B2 (en) 2022-04-11
CN110018582B (en) 2023-04-28
CN110018582A (en) 2019-07-16

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