TWI800259B - 基板處理方法及基板處理裝置 - Google Patents

基板處理方法及基板處理裝置 Download PDF

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Publication number
TWI800259B
TWI800259B TW111105387A TW111105387A TWI800259B TW I800259 B TWI800259 B TW I800259B TW 111105387 A TW111105387 A TW 111105387A TW 111105387 A TW111105387 A TW 111105387A TW I800259 B TWI800259 B TW I800259B
Authority
TW
Taiwan
Prior art keywords
substrate processing
processing apparatus
processing method
substrate
processing
Prior art date
Application number
TW111105387A
Other languages
English (en)
Chinese (zh)
Other versions
TW202249074A (zh
Inventor
柴田秀一
西出基
Original Assignee
日商斯庫林集團股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商斯庫林集團股份有限公司 filed Critical 日商斯庫林集團股份有限公司
Publication of TW202249074A publication Critical patent/TW202249074A/zh
Application granted granted Critical
Publication of TWI800259B publication Critical patent/TWI800259B/zh

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00Generating plasma; Handling plasma
    • H05H1/24Generating plasma

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Power Engineering (AREA)
  • Plasma & Fusion (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Weting (AREA)
  • Plasma Technology (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
TW111105387A 2021-02-26 2022-02-15 基板處理方法及基板處理裝置 TWI800259B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021029980A JP2022131171A (ja) 2021-02-26 2021-02-26 基板処理方法および基板処理装置
JP2021-029980 2021-02-26

Publications (2)

Publication Number Publication Date
TW202249074A TW202249074A (zh) 2022-12-16
TWI800259B true TWI800259B (zh) 2023-04-21

Family

ID=83048201

Family Applications (1)

Application Number Title Priority Date Filing Date
TW111105387A TWI800259B (zh) 2021-02-26 2022-02-15 基板處理方法及基板處理裝置

Country Status (3)

Country Link
JP (1) JP2022131171A (ja)
TW (1) TWI800259B (ja)
WO (1) WO2022181604A1 (ja)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201308494A (zh) * 2011-07-12 2013-02-16 Dainippon Screen Mfg 基板處理裝置及基板處理方法
US20130084709A1 (en) * 2011-09-29 2013-04-04 Masahiro Miyagi Substrate processing apparatus and substrate processing method
JP2017073467A (ja) * 2015-10-07 2017-04-13 株式会社Screenホールディングス 基板処理方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3869566B2 (ja) * 1998-11-13 2007-01-17 三菱電機株式会社 フォトレジスト膜除去方法および装置
JP2002053312A (ja) * 2000-08-09 2002-02-19 Sony Corp カロ酸発生装置、レジスト除去装置およびレジスト除去方法
JP7208814B2 (ja) * 2019-02-13 2023-01-19 株式会社Screenホールディングス 生成装置、基板処理装置、及び基板処理方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201308494A (zh) * 2011-07-12 2013-02-16 Dainippon Screen Mfg 基板處理裝置及基板處理方法
US20130084709A1 (en) * 2011-09-29 2013-04-04 Masahiro Miyagi Substrate processing apparatus and substrate processing method
JP2017073467A (ja) * 2015-10-07 2017-04-13 株式会社Screenホールディングス 基板処理方法

Also Published As

Publication number Publication date
TW202249074A (zh) 2022-12-16
WO2022181604A1 (ja) 2022-09-01
JP2022131171A (ja) 2022-09-07

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