TWI799895B - Plasma treatment device - Google Patents
Plasma treatment device Download PDFInfo
- Publication number
- TWI799895B TWI799895B TW110122231A TW110122231A TWI799895B TW I799895 B TWI799895 B TW I799895B TW 110122231 A TW110122231 A TW 110122231A TW 110122231 A TW110122231 A TW 110122231A TW I799895 B TWI799895 B TW I799895B
- Authority
- TW
- Taiwan
- Prior art keywords
- treatment device
- plasma treatment
- plasma
- treatment
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32623—Mechanical discharge control means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67069—Apparatus for fluid treatment for etching for drying etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/32—Processing objects by plasma generation
- H01J2237/33—Processing objects by plasma generation characterised by the type of processing
- H01J2237/334—Etching
- H01J2237/3343—Problems associated with etching
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Drying Of Semiconductors (AREA)
- Plasma Technology (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202010844507.0 | 2020-08-20 | ||
CN202010844507.0A CN114078680B (en) | 2020-08-20 | 2020-08-20 | Plasma processing apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
TW202209405A TW202209405A (en) | 2022-03-01 |
TWI799895B true TWI799895B (en) | 2023-04-21 |
Family
ID=80282084
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW110122231A TWI799895B (en) | 2020-08-20 | 2021-06-17 | Plasma treatment device |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN114078680B (en) |
TW (1) | TWI799895B (en) |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1425187A (en) * | 1999-11-18 | 2003-06-18 | 东京电子有限公司 | Method and apparatus for ionized physical vapor deposition |
US20040262540A1 (en) * | 2002-01-22 | 2004-12-30 | Tokyo Electron Limited | Surface treating device and surface treating method |
TW200807553A (en) * | 2006-06-20 | 2008-02-01 | Sosul Co Ltd | Plasma etching chamber |
TW200939377A (en) * | 2007-07-27 | 2009-09-16 | Mattson Tech Inc | Advanced multi-workpiece processing chamber |
TW201108349A (en) * | 2009-03-24 | 2011-03-01 | Lam Res Corp | Method and apparatus for reduction of voltage potential spike during dechucking |
CN111466009A (en) * | 2017-12-15 | 2020-07-28 | 朗姆研究公司 | Toroidal structures and systems for use in plasma chambers |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3131865B2 (en) * | 1994-09-05 | 2001-02-05 | 東京エレクトロン株式会社 | Plasma film forming equipment |
JP3931578B2 (en) * | 2001-03-30 | 2007-06-20 | 信越半導体株式会社 | Vapor growth equipment |
KR20100004857A (en) * | 2008-07-03 | 2010-01-13 | 주성엔지니어링(주) | Dry etching apparatus |
JP5398358B2 (en) * | 2009-05-29 | 2014-01-29 | 三菱重工業株式会社 | Substrate support structure and plasma processing apparatus |
US9719169B2 (en) * | 2010-12-20 | 2017-08-01 | Novellus Systems, Inc. | System and apparatus for flowable deposition in semiconductor fabrication |
US9287147B2 (en) * | 2013-03-14 | 2016-03-15 | Applied Materials, Inc. | Substrate support with advanced edge control provisions |
JP6069654B2 (en) * | 2013-03-29 | 2017-02-01 | Sppテクノロジーズ株式会社 | Plasma processing stage for substrate to be processed and plasma processing apparatus using the same |
US10950477B2 (en) * | 2015-08-07 | 2021-03-16 | Applied Materials, Inc. | Ceramic heater and esc with enhanced wafer edge performance |
CN107154332B (en) * | 2016-03-03 | 2019-07-19 | 中微半导体设备(上海)股份有限公司 | A kind of plasma processing apparatus and method |
CN110610841B (en) * | 2018-06-14 | 2022-01-28 | 中微半导体设备(上海)股份有限公司 | Plasma confinement assembly and processing device thereof |
KR102487930B1 (en) * | 2018-07-23 | 2023-01-12 | 삼성전자주식회사 | Substrate support apparatus and plasma processing apparatus having the same |
KR102134391B1 (en) * | 2018-10-18 | 2020-07-15 | 세메스 주식회사 | Substrate processing apparatus |
CN111326389B (en) * | 2018-12-17 | 2023-06-16 | 中微半导体设备(上海)股份有限公司 | Capacitively coupled plasma etching equipment |
-
2020
- 2020-08-20 CN CN202010844507.0A patent/CN114078680B/en active Active
-
2021
- 2021-06-17 TW TW110122231A patent/TWI799895B/en active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1425187A (en) * | 1999-11-18 | 2003-06-18 | 东京电子有限公司 | Method and apparatus for ionized physical vapor deposition |
US20040262540A1 (en) * | 2002-01-22 | 2004-12-30 | Tokyo Electron Limited | Surface treating device and surface treating method |
TW200807553A (en) * | 2006-06-20 | 2008-02-01 | Sosul Co Ltd | Plasma etching chamber |
TW200939377A (en) * | 2007-07-27 | 2009-09-16 | Mattson Tech Inc | Advanced multi-workpiece processing chamber |
TW201108349A (en) * | 2009-03-24 | 2011-03-01 | Lam Res Corp | Method and apparatus for reduction of voltage potential spike during dechucking |
CN111466009A (en) * | 2017-12-15 | 2020-07-28 | 朗姆研究公司 | Toroidal structures and systems for use in plasma chambers |
Also Published As
Publication number | Publication date |
---|---|
CN114078680B (en) | 2023-09-29 |
TW202209405A (en) | 2022-03-01 |
CN114078680A (en) | 2022-02-22 |
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