TWI797977B - Package structure - Google Patents
Package structure Download PDFInfo
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- TWI797977B TWI797977B TW111103536A TW111103536A TWI797977B TW I797977 B TWI797977 B TW I797977B TW 111103536 A TW111103536 A TW 111103536A TW 111103536 A TW111103536 A TW 111103536A TW I797977 B TWI797977 B TW I797977B
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- sealing ring
- base
- upper cover
- package structure
- structure according
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- 238000007789 sealing Methods 0.000 claims abstract description 53
- 230000003014 reinforcing effect Effects 0.000 claims abstract description 52
- 238000004806 packaging method and process Methods 0.000 claims description 21
- 230000000295 complement effect Effects 0.000 claims description 4
- 230000002787 reinforcement Effects 0.000 description 11
- 239000000463 material Substances 0.000 description 8
- 239000010453 quartz Substances 0.000 description 7
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 7
- 235000012431 wafers Nutrition 0.000 description 7
- 239000003292 glue Substances 0.000 description 6
- 239000002184 metal Substances 0.000 description 6
- 229910052751 metal Inorganic materials 0.000 description 6
- 239000000919 ceramic Substances 0.000 description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 3
- 239000010931 gold Substances 0.000 description 3
- 239000007769 metal material Substances 0.000 description 3
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 229910000833 kovar Inorganic materials 0.000 description 2
- 229910001020 Au alloy Inorganic materials 0.000 description 1
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 229910001128 Sn alloy Inorganic materials 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 238000005728 strengthening Methods 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/04—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/10—Containers; Seals characterised by the material or arrangement of seals between parts, e.g. between cap and base of the container or between leads and walls of the container
Abstract
Description
本發明是有關於一種具有加強部的封裝結構。The invention relates to a packaging structure with a reinforcing part.
在目前的封裝結構中,基座(base)與上蓋(lid)之間常藉由接合材料(如金屬材料或玻璃料)以平面對平面的方式進行接合,然而,前述接合方式具有表面接合力較弱的問題,因此當有應力產生時基座與上蓋容易分離,進而提升封裝結構的損壞機率。In the current packaging structure, the base (base) and the lid (lid) are usually bonded in a plane-to-plane manner by bonding materials (such as metal materials or glass frit). However, the above-mentioned bonding methods have surface bonding force. Weaker problem, so when stress occurs, the base and the upper cover are easy to separate, thereby increasing the probability of damage to the package structure.
本發明提供一種封裝結構,可以提升接合力,降低其損壞機率。The invention provides a packaging structure, which can improve the bonding force and reduce the probability of damage.
本發明的一種封裝結構,包括基座、晶片、密封環、上蓋以及加強部。晶片設置於基座上並與基座電性連接。密封環設置於基座上。上蓋設置於密封環上且覆蓋晶片。加強部設置於基座或上蓋。密封環使封裝結構具有氣密空腔,且密封環包圍晶片與加強部。A packaging structure of the present invention includes a base, a chip, a sealing ring, an upper cover and a reinforcing part. The chip is arranged on the base and electrically connected with the base. The sealing ring is arranged on the base. The upper cover is arranged on the sealing ring and covers the wafer. The reinforcing part is arranged on the base or the upper cover. The sealing ring enables the packaging structure to have an airtight cavity, and the sealing ring surrounds the chip and the reinforcing part.
在本發明的一實施例中,上述的基座具有凹槽以及圍繞凹槽的框架。晶片位於凹槽內,且密封環設置於框架上。In an embodiment of the present invention, the above-mentioned base has a groove and a frame surrounding the groove. The wafer is located in the groove, and the sealing ring is arranged on the frame.
在本發明的一實施例中,上述的加強部的高度與密封環的高度的比值介於1/4至1/3之間。In an embodiment of the present invention, the ratio of the height of the reinforcing portion to the height of the sealing ring is between 1/4 and 1/3.
在本發明的一實施例中,上述的加強部的寬度與密封環的寬度的比值介於1/2至1/3之間。In an embodiment of the present invention, the ratio of the width of the reinforcing portion to the width of the sealing ring is between 1/2 to 1/3.
在本發明的一實施例中,上述的密封環包覆上蓋的部分側壁。In an embodiment of the present invention, the above-mentioned sealing ring covers part of the sidewall of the upper cover.
在本發明的一實施例中,上述的加強部凸設於上蓋或基座上。In an embodiment of the present invention, the above-mentioned reinforcement part is protruded on the upper cover or the base.
在本發明的一實施例中,上述的加強部嵌設於上蓋或基座內。In an embodiment of the present invention, the above-mentioned reinforcement part is embedded in the upper cover or the base.
在本發明的一實施例中,以俯視觀之,上述的加強部為對應密封環的封閉式環形輪廓。In an embodiment of the present invention, viewed from above, the above-mentioned reinforcing portion is a closed annular contour corresponding to the sealing ring.
在本發明的一實施例中,以俯視觀之,上述的加強部由多段輪廓所構成,且相鄰輪廓之間具有間隙,部分密封環位於間隙內。In an embodiment of the present invention, viewed from a top view, the above-mentioned reinforcing portion is formed of a plurality of contours, and there is a gap between adjacent contours, and part of the sealing ring is located in the gap.
在本發明的一實施例中,上述的加強部與密封環、上蓋或基座三者中之任一者為一體成型結構。In an embodiment of the present invention, the above-mentioned reinforcing part is integrally formed with any one of the sealing ring, the upper cover or the base.
基於上述,本發明藉由加強部的設計,增加基座與上蓋之接合面的接合表面積與表面接合強度,提升整體結構抵抗應力之能力,因此當有應力產生時基座與上蓋較不易分離,進而降低封裝結構的損壞機率。Based on the above, the present invention increases the joint surface area and surface joint strength of the joint surface of the base and the upper cover through the design of the reinforcement part, and improves the ability of the overall structure to resist stress. Therefore, when stress occurs, the base and the upper cover are less likely to be separated. Thus, the probability of damage to the packaging structure is reduced.
為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。In order to make the above-mentioned features and advantages of the present invention more comprehensible, the following specific embodiments are described in detail together with the accompanying drawings.
以下將參考圖式來全面地描述本發明的例示性實施例,但本發明還可按照多種不同形式來實施,且不應解釋為限於本文所述的實施例。在圖式中,為了清楚起見,各區域、部位及層的大小與厚度可不按實際比例繪製。為了方便理解,下述說明中相同的元件將以相同之符號標示來說明。Exemplary embodiments of the present invention will be fully described below with reference to the drawings, but the invention may also be embodied in many different forms and should not be construed as limited to the embodiments described herein. In the drawings, for the sake of clarity, the sizes and thicknesses of regions, parts and layers may not be drawn in actual scale. In order to facilitate understanding, the same components in the following description will be described with the same symbols.
本文所使用之方向用語(例如,上、下、右、左、前、後、頂部、底部)僅作為參看所繪圖式使用且不意欲暗示絕對定向。Directional terms (eg, up, down, right, left, front, back, top, bottom) as used herein are used pictorially by reference only and are not intended to imply absolute orientation.
除非另有定義,本文使用的所有術語(包括技術和科學術語)具有與本發明所屬領域的普通技術人員通常理解的相同的含義。Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.
圖1A、圖2A、圖3、圖4、圖5、圖6是本發明一些實施例的封裝結構的剖面示意圖。圖1B、圖1C是圖1A的一些實施例的俯視示意圖。圖2B、圖2C是圖2A的一些實施例的俯視示意圖。應說明的是,為了清楚說明,圖2B與圖2C省略繪示上蓋、膠與晶片。1A , 2A , 3 , 4 , 5 , and 6 are schematic cross-sectional views of packaging structures according to some embodiments of the present invention. FIG. 1B and FIG. 1C are schematic top views of some embodiments of FIG. 1A . 2B and 2C are schematic top views of some embodiments of FIG. 2A . It should be noted that, for clarity, FIG. 2B and FIG. 2C omit showing the upper cover, glue and chip.
請參考圖1A、圖1B與圖1C,本實施例的封裝結構100包括基座110、晶片120、密封環130、上蓋140以及加強部150,其中晶片120設置於基座110上並與基座110電性連接,密封環130設置於基座110上,上蓋140設置於密封環130上且覆蓋晶片120。此外,在本實施例中,加強部150設置於上蓋140,密封環130使封裝結構100具有氣密空腔C,且密封環130包圍晶片120與加強部150。據此,本實施例藉由加強部150的設計,增加基座110與上蓋140之接合面的接合表面積與表面接合強度,提升整體結構抵抗應力之能力,因此當有應力產生時基座110與上蓋140較不易分離,進而降低封裝結構100的損壞機率。進一步而言,在相同條件下,將具有加強部的封裝結構與不具有加強部的封裝結構進行測試施加外力100帕(Pa)比較同一位置的應力時,以最大應力位置來看,接合介面產生的應力(剪力)由61帕下降至44帕,證明本實施例藉由加強部150的設計可以有效地提升封裝結構100抵抗應力之能力。應說明的是,在其他實施例中會進一步說明加強部設置於基座之態樣。Please refer to FIG. 1A, FIG. 1B and FIG. 1C, the
在本實施例中,加強部150可以是凸設於上蓋140上,且加強部150可以是以凸塊形式設置,因此加強部150可以進一步阻擋由封裝結構100的邊緣而來的應力,但本發明不限於此,在其他實施例中,加強部150可以具有不同實施態樣。在此,加強部150可以是額外設置於上蓋140上的元件(材料例如是鎢(W)、石英、陶瓷或金屬(例如是Kovar Alloy)),但本發明不限於此。In this embodiment, the
在一些實施例中,加強部150的高度150h與密封環130的高度130h的比值介於1/4至1/3之間(如圖1A所示),且加強部150的寬度150w與密封環130的寬度130w的比值介於1/2至1/3之間(如圖1B與圖1C所示),但本發明不限於此,前述高度與寬度皆可以視實際設計上的需求進行調整。In some embodiments, the ratio of the
在一些實施例中,基座110的材料包括陶瓷、石英、PCB或金屬(例如是Kovar Alloy),而上蓋140的材料包括金屬(例如是鐵(Fe)、鈷(Co)或鎳(Ni))、石英、PCB或陶瓷。舉例而言,本實施例的封裝結構100係使用陶瓷基座110與金屬上蓋140之結構,因此上蓋140可以是平板狀,但本發明不限於此,在其他實施例中,基座110與上蓋140可以選擇其他材料所製成。此外,晶片120例如是石英晶片(quartz blank)或其他適宜的晶片,而密封環130的材料例如是金屬材料或玻璃料(glass frit),其中金屬材料例如是金/錫合金(Au/Sn)。In some embodiments, the material of the
在一些實施例中,基座110具有凹槽112以及圍繞凹槽112的框架114,晶片120位於凹槽112內,且密封環130設置於框架114上。在此,晶片120可以藉由膠(glue)160設置於凹槽112內的接合墊(mount pad)111上,其中膠160例如是銀膠,但本發明不限於此。In some embodiments, the
在一些實施例中,由於密封環130可以藉由加熱融化前述材料所形成,因此密封環130可以包覆上蓋140的部分側壁140s,但本發明不限於此。In some embodiments, since the
在一些實施例中,如圖1B所示,以俯視觀之,加強部150為對應密封環130的封閉式環形輪廓(例如是矩形輪廓),但本發明不限於此,在替代實施例中,如圖1C所示,在封裝結構100A中,以俯視觀之,加強部150A由多段輪廓所構成,且相鄰輪廓之間具有間隙150g,部分密封環130位於間隙150g內。In some embodiments, as shown in FIG. 1B , viewed from a top view, the reinforcing
在此必須說明的是,以下實施例沿用上述實施例的元件標號與部分內容,其中採用相同或近似的標號來表示相同或近似的元件,並且省略了相同技術內容的說明,關於省略部分的說明可參考前述實施例,下述實施例不再重複贅述。It must be noted here that the following embodiments continue to use the component numbers and part of the content of the above-mentioned embodiments, wherein the same or similar numbers are used to indicate the same or similar components, and the description of the same technical content is omitted, and the description of the omitted part Reference can be made to the aforementioned embodiments, and the following embodiments will not be repeated.
請參考圖2A,相較於圖1A的封裝結構100而言,本實施例的封裝結構200的加強部250凸設於基座110上。此外,在本實施例中,如圖2B所示,以俯視觀之,加強部250為對應密封環130的封閉式環形輪廓,但本發明不限於此,在替代實施例中,如圖2C所示,在封裝結構200A中,以俯視觀之,加強部250A由多段輪廓所構成,且相鄰輪廓之間具有間隙250g,部分密封環130位於間隙250g內,但本發明不限於此。Please refer to FIG. 2A . Compared with the
請參考圖3,相較於圖1A的封裝結構100而言,本實施例的封裝結構300的加強部350嵌設於上蓋340。進一步而言,加強部350可以藉由密封環330填入上蓋340的槽340a所形成,因此加強部350與密封環330可以是一體成型結構,但本發明不限於此。此外,嵌設的加強部350亦可以具有類似於加強部150之封閉式環形輪廓或多段輪廓的設置方式。Please refer to FIG. 3 . Compared with the
請參考圖4,相較於圖3的封裝結構300而言,本實施例的封裝結構400的加強部450嵌設於基座410。進一步而言,加強部450可以藉由密封環430填入基座410的框架414的槽414a所形成,因此加強部450與密封環430可以是一體成型結構,但本發明不限於此。此外,嵌設的加強部450亦可以具有類似於加強部250之封閉式環形輪廓或多段輪廓的設置方式。Please refer to FIG. 4 . Compared with the
請參考圖5,相較於圖2A的封裝結構200而言,本實施例的封裝結構500使用石英基座510與石英上蓋540之結構,因此上蓋540可以是倒U型。此外,本實施例的封裝結構500的加強部550可以是基座510藉由蝕刻方式所形成,因此加強部550與基座510可以是一體成型結構,換句話說,加強部550與基座510所使用的材料會相同,但本發明不限於此。Please refer to FIG. 5 . Compared with the
在本實施例中,基座510與上蓋540之間具有凹凸互補接合介面,亦即上蓋540上會有對應基座510的加強部的凹陷。此外,基座510與上蓋540之間的密封環530例如是使用金屬膜接合(metal film bonding),其中金屬例如是Au或AuSn,但本發明不限於此。In this embodiment, the
請參考圖6,相較於圖5的封裝結構500而言,本實施例的封裝結構600的基座610與上蓋640之間具有階梯狀(step)的凹凸互補接合介面。此外,本實施例的封裝結構600的加強部650可以是上蓋640藉由蝕刻方式所形成,因此加強部650與上蓋640可以是一體成型結構,換句話說,加強部650與上蓋640所使用的材料會相同,但本發明不限於此。Please refer to FIG. 6 . Compared with the
應說明的是,上述各個態樣的密封環皆可以包圍加強部,且本發明不限制上述實施態樣,只要封裝結構中具有設置於基座或上蓋的加強部,密封環使封裝結構具有氣密空腔,且密封環包圍晶片與加強部皆屬於本發明的保護範圍。It should be noted that the sealing rings in each of the above aspects can surround the reinforcing part, and the present invention is not limited to the above-mentioned embodiments, as long as the packaging structure has a reinforcing part disposed on the base or the upper cover, the sealing ring makes the packaging structure have an airtight The airtight cavity, and the sealing ring enclosing the chip and the reinforcing part all belong to the protection scope of the present invention.
綜上所述,本發明藉由加強部的設計(設置於基座或上蓋),增加基座與上蓋之接合面的接合表面積與表面接合強度,提升整體結構抵抗應力之能力,因此當有應力產生時基座與上蓋較不易分離,進而降低封裝結構的損壞機率。In summary, the present invention increases the joint surface area and surface joint strength of the joint surface of the base and the upper cover through the design of the reinforcing part (set on the base or the upper cover), and improves the ability of the overall structure to resist stress. Therefore, when there is a stress The base and the upper cover are less likely to be separated during production, thereby reducing the probability of damage to the packaging structure.
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed above with the embodiments, it is not intended to limit the present invention. Anyone with ordinary knowledge in the technical field may make some changes and modifications without departing from the spirit and scope of the present invention. The scope of protection of the present invention should be defined by the scope of the appended patent application.
100、100A、200、200A、300、400、500、600:封裝結構100, 100A, 200, 200A, 300, 400, 500, 600: package structure
110、410、510、610:基座110, 410, 510, 610: base
111:接合墊111: joint pad
112:凹槽112: Groove
114、414:框架114, 414: frame
120:晶片120: chip
130、330、430、530:密封環130, 330, 430, 530: sealing ring
140、340、540、640:上蓋140, 340, 540, 640: upper cover
140s:側壁140s: side wall
150、150A、250、250A、350、450、550、650:加強部150, 150A, 250, 250A, 350, 450, 550, 650: reinforcement
150g、250g:間隙150g, 250g: Gap
160:膠160: Glue
130h、150h:高度130h, 150h: height
130w、150w:寬度130w, 150w: width
340a、414a:槽340a, 414a: slots
C:氣密空腔C: airtight cavity
圖1A、圖2A、圖3、圖4、圖5、圖6是本發明一些實施例的封裝結構的剖面示意圖。 圖1B、圖1C是圖1A的一些實施例的俯視示意圖。 圖2B、圖2C是圖2A的一些實施例的俯視示意圖。 1A , 2A , 3 , 4 , 5 , and 6 are schematic cross-sectional views of packaging structures according to some embodiments of the present invention. FIG. 1B and FIG. 1C are schematic top views of some embodiments of FIG. 1A . 2B and 2C are schematic top views of some embodiments of FIG. 2A .
100:封裝結構 100: Package structure
110:基座 110: Base
112:凹槽 112: Groove
114:框架 114: frame
120:晶片 120: chip
130:密封環 130: sealing ring
140:上蓋 140: upper cover
140s:側壁 140s: side wall
150:加強部 150: Strengthening Department
160:膠 160: Glue
130h、150h:高度 130h, 150h: height
C:氣密空腔 C: airtight cavity
Claims (10)
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TW111103536A TWI797977B (en) | 2022-01-27 | 2022-01-27 | Package structure |
JP2022053340A JP7403570B2 (en) | 2022-01-27 | 2022-03-29 | package structure |
CN202210586721.XA CN116564898A (en) | 2022-01-27 | 2022-05-26 | Packaging structure |
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TW111103536A TWI797977B (en) | 2022-01-27 | 2022-01-27 | Package structure |
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TWI797977B true TWI797977B (en) | 2023-04-01 |
TW202331947A TW202331947A (en) | 2023-08-01 |
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Citations (2)
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US7378748B2 (en) * | 2003-09-03 | 2008-05-27 | Matsushita Electric Industrial Co., Ltd. | Solid-state imaging device and method for manufacturing the same |
US20100013041A1 (en) * | 2008-07-15 | 2010-01-21 | Micron Technology, Inc. | Microelectronic imager packages with covers having non-planar surface features |
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JP2001144571A (en) * | 1999-11-11 | 2001-05-25 | Tdk Corp | Piezoelectric vibrator component |
JP2002359535A (en) * | 2001-03-27 | 2002-12-13 | Seiko Epson Corp | Piezoelectric device |
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- 2022-01-27 TW TW111103536A patent/TWI797977B/en active
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US7378748B2 (en) * | 2003-09-03 | 2008-05-27 | Matsushita Electric Industrial Co., Ltd. | Solid-state imaging device and method for manufacturing the same |
US20100013041A1 (en) * | 2008-07-15 | 2010-01-21 | Micron Technology, Inc. | Microelectronic imager packages with covers having non-planar surface features |
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JP2023109664A (en) | 2023-08-08 |
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