TWI787675B - Management method of testing fixture applying in testing procedure - Google Patents

Abstract

A management method of testing fixtures applying in testing procedure comprises bonding a plurality of electronic tags to a plurality of testing fixtures, obtaining a plurality of data respectively stored in the electronic tags by a reading device, obtaining the data from the reading device and obtaining a plurality of times of use respectively associated with the plurality of data from a storing device by a processor, determining whether each of the plurality of times of use is not over a threshold, executing a testing procedure to an object under test with the testing fixtures if each of the plurality of times of use is not over the threshold, and generating a plurality of updated times of use according to the plurality of times of use and respectively replacing the plurality of times of use in the storing device with the plurality of updated times of use by the processor.

Description

Management method of testing fixtures applied in testing process

The present invention relates to a management method of testing fixtures, in particular to a management method of testing fixtures applied in testing process.

In the production line of the factory, it is often necessary to use testing fixtures such as test pieces and test objects to test the products to be tested. Since inspection jigs are usually reusable, their management is necessary in factories.

The test fixture can be, for example, a memory, and the object under test can be, for example, a server motherboard. The production line of the memory can issue spare parts through the warehouse, and the operator will send the test parts on the main board of the server to the production line to facilitate functional testing. In the early parts testing, such as the identity identification method of memory, the production line and warehouse recorded the registration data with 1D and 2D barcodes and serial numbers. At present, there is a background management system that uses the method of binding fixtures and machines to count the number of times each test component is tested on the machine and register the manufacturing process. However, it is difficult to record these for testing during the production of server motherboards. The number of plugging and unplugging of the memory of the motherboard function. If the memory is plugged and pulled out too many times, its metal contacts (commonly known as gold fingers) are likely to break and cause abnormalities. In addition, its control bottleneck lies in the fact that the number of memories used by a server motherboard can be as many as 32 and densely arranged, and optical scanning equipment cannot quickly scan barcode information at one time. In addition, the memory will be separated from the motherboard after the test, and the memory is usually disassembled by the factory staff and then reflowed to any different testing machine for testing. However, if the management of a large number of memory spare parts is not accurate enough, memory abnormalities will occur in the middle of the function test, which will lead to a lot of waste of production test time, and even cause a serious shortage of single-day production.

In addition, the conventional memory management system is limited by the unit of "group", and a group can have multiple memories, for example, it is used for the detection of the DUT. However, this management method cannot effectively manage individual memories. If any memory in a group is damaged or fails, the staff often needs to check one by one, which also leads to a lot of waste of production and testing time.

In view of the above, the present invention provides a management method for testing fixtures used in testing processes, including: combining multiple testing fixtures with multiple electronic tags; using a reading device to obtain multiple Data; use a processing device to obtain the data from the reading device, and obtain a plurality of usage times values respectively associated with the data from a storage device; use the processing device to determine whether the usage times values do not exceed one Threshold; when the values of the number of uses do not exceed the threshold, use the detection fixtures to perform a detection process on an object under test; and after performing the detection process, use the processing device to generate a plurality of updated usage times values, and replace the usage times values in the storage device with the updated usage times values.

To sum up, with the management method of the detection fixtures applied in the detection process of the present invention, the management of these detection fixtures can be achieved separately, and at the same time, it can be ensured that the number of times of use of the detection fixtures used in the detection process does not exceed the set of this threshold.

The above description of the disclosure and the following description of the implementation are used to demonstrate and explain the spirit and principle of the present invention, and provide a further explanation of the patent application scope of the present invention.

The detailed features and advantages of the present invention are described in detail below in the implementation mode, and its content is enough to make any person familiar with the related art understand the technical content of the present invention and implement it accordingly, and according to the content disclosed in this specification, the scope of the patent application and the drawings , anyone skilled in the art can easily understand the purpose and advantages of the present invention. The following examples are to further describe the concept of the present invention in detail, but not to limit the scope of the present invention in any way.

Please refer to Figure 1 and Figure 2. The present invention provides a management method for testing fixtures used in the testing process. In accordance with the spirit of the invention, the device block diagram in FIG. 1 and the flow chart in FIG. 2 are used to describe an embodiment of the present invention below. FIG. 1 shows a detection jig 10 , a reading device 20 , a processing device 30 and a storage device 40 . Wherein, the processing device 30 is connected to the reading device 20 and the storage device 40 . The testing jig 10 can be any jig used to assist and assist the testing process, and in this embodiment, it is realized by memory. The reading device 20 may include a device for acquiring or receiving data of an object. The reading device 20 may be, for example, a device with an antenna, and the present invention is not limited thereto. The processing device 30 can be used to receive external data and perform subsequent actions based on judgments, and can be, for example, a personal computer, a system on chip (SOC), a microcontroller (microcontroller unit, MCU) or an embedded control device (embedded controller, EC), etc. The storage device 40 can be used for reading and writing data. Here, FIG. 1 simply shows the necessary elements for executing the flowchart of FIG. 2 , and the flowchart will be described in detail below. Among them, the inspection fixture management method of the inspection process of the present invention can be applied to the manufacturing inspection process of servers or vehicle-mounted electronic products.

Please refer to Figure 2. The management method of the detection jig applied to the detection process according to an embodiment of the present invention includes the following steps: step S1, combining multiple detection jigs 10 with multiple electronic tags; step S2, using the reading device 20 to obtain the stored A plurality of data on these electronic tags; step S3, obtain these data from reading device 20 with processing device 30, and obtain from storage device 40 a plurality of usage times values associated with these data respectively; Step S4, with The processing device 30 determines whether any of the usage counts does not exceed a threshold. If any one of these use times exceeds the threshold, proceed to step S41 to generate a replacement notification with the processing device 30; if these use times do not exceed a threshold, proceed to step S5 to utilize these detection The jig 10 executes a detection process for the object to be tested. Finally, step S6 is executed, so that the processing device 30 generates a plurality of updated usage times according to the usage times, and replaces the usage times in the storage device 40 with the updated usage times.

An embodiment of the present invention is applied, for example, to the detection process of the mainboard. In the example of the flow chart in Figure 2, the detection fixture 10 can be a memory, such as a dual in-line memory module (dual in- line memory module, DIMM), etc. The electronic tag herein may be an electronic tag using a radio frequency identification system (radio frequency identification, RFID), which may be a wireless communication IC chip, etc., and the present invention is not limited thereto. Specifically, the detection jigs 10 in step S1 can be combined with an electronic tag, so that there is a corresponding relationship between each detection jig 10 and the combined electronic tag. Each of the electronic tags stores data that can be used for identification.

In step S2, the reading device 20 can obtain a plurality of signals of these electronic tags with the antenna included in it, and then the reading device 20 can generate a plurality of data respectively related to these signals according to these signals, wherein these The information can be serial number, sequence code or identification code...etc.

The implementation method of step S2 can further refer to FIG. 3 , but it is only a way to realize step S2, and is not intended to limit the way to realize step 2. The components in FIG. 3 include the detection jig 10 , the carrier plate 50 and the antenna 21 of the reading device 20 . Although the electronic tag is not shown in FIG. 3 , it can be known from the above paragraphs that the detection jigs 10 here are respectively combined with an electronic tag. The tray 50 can be made of Bakelite here, and has several areas A (although four areas A are shown here, but the present invention is not limited thereto, in practice, the areas that the tray 50 has can be adjusted according to different situations or needs. The number is greater than, less than or equal to 4), and the detection jigs 10 are respectively arranged in each area A (the present invention does not limit the number of detection jigs 10 in each area A in Figure 3 here, and it can be used according to different situations in practice. or the number of testing fixtures 10 in the demand definition area A). Antennas 21 are respectively provided below each area A. The present invention does not limit the combination of antenna 21 and the components in this figure. In one embodiment of the present invention, antenna 21 can be combined with carrier plate 50 and each corresponding area A (It can be at the inner bottom end or one side of the carrier plate 50 . . . etc.), the antenna 21 in FIG. 3 is combined with the inner bottom end of the carrier plate 50 . By dividing several areas A in the carrier plate 50 , and each area A corresponds to the antenna 21 used for obtaining data, the situation that the distance between the antenna and the detection fixture is too large and the signal is too attenuated can be avoided. In addition, the relative distance, angle, etc. between each antenna 21 and the corresponding area A can be adjusted according to the actual data acquisition situation. In other embodiments, the antenna can be arranged above, below or on one side of the moving line of the carrier plate 50 instead of being fixed on the carrier plate 50 .

In step S3, after receiving the data, the processing device 30 connected to the reading device 20 and the storage device 40 may request the storage device 40 to access the usage times associated with the data. Specifically, the number of times of use is preferably an integer value that is a non-negative integer. Since the electronic tag is combined with the testing jig 10 , the integer value can be regarded as recording the number of times the testing jig 10 is used.

In addition, in order to ensure that all the data of the testing jig 10 can be obtained, in step S3, after the processing device 30 obtains the data from the reading device 20, it can first judge whether the total quantity of the data conforms to a detection quantity value, And only after the total quantity of the data meets the detection quantity value, the use count values respectively associated with the data are obtained from the storage device 40 . For example, if there are 32 detection jigs 10 required to perform the detection, the number of detections can be preset to be 32, and then the processing device 30 determines that the quantity of the data associated with the detection jigs 10 is consistent After the value is 32, the usage count values are obtained from the storage device 40 .

In step S4 , the processing device 30 judges whether any of the usage counts does not exceed a threshold. In practice, the detection jig 10 has a certain damage rate, and it is more likely to be damaged due to excessive use after being used for several times. It can be known through observation, experiments, etc. that after a threshold value is exceeded, the damage rate of the detection fixture 10 is greatly increased, and the threshold value can be defined as the threshold value or slightly smaller than the threshold value. The present invention does not limit the numerical setting of the threshold value. However, the threshold needs to be greater than the initial setting value of the number of usage times (the initial setting value may be 0, for example).

The replacement notification in step S41 can be implemented in various ways, such as a bell notification on the factory production line, a push notification on the electronic device of the relevant personnel, or an alarm information on the back-end server, etc. In practice, in an environment such as a factory, when the staff receives the replacement notice, the staff can learn the data that exceeds the number of uses and the corresponding detection fixture 10, and then use this information to associate the data with the data. The detection jig 10 is replaced with a new detection jig. After replacement, the process of an embodiment of the present invention can be restarted from step S1.

The detection process in step S5 can be various detection processes of the analyte using the detection jig 10 , which is not limited in the present invention. An example will be given below for a detailed description.

Step S6 is a step of updating the values of the usage times after the execution of the detection process is completed. In practice, the processing device 30 can add 1 to each of these usage counts to generate a plurality of updated usage counts, which means that each of the testing fixtures 10 is used in the testing process once. Afterwards, the processing device 30 uses the updated usage times to update the usage times in the storage device 40 respectively.

In practice, after step S6 is executed, the detection jig 10 can continue to be used in the detection process until the number of times associated with the detection jig 10 exceeds the threshold. In this way, the management of the detection jig 10 can be achieved.

Please refer to Figure 4. Fig. 4 is a detailed process of another embodiment of the present invention, in which step S5 includes step S51, the detection fixtures 10 are combined with the object to be tested, and the processing device 30 establishes the relationship between these data and the object to be tested Binding of the identity code; and step S52 , after obtaining the sensed value of the object under test combined with the detection jig 10 with a machine tool, output and notify to the processing device 30 . In addition, after step S6 is executed, step S7 is executed to unbind the data and the identity code.

The object under test in step S51 can be, for example, a motherboard, and the testing fixture 10 can be, for example, a memory. The object under test has an identity code for recording or management, etc. After combining the detection fixture 10 with the object under test, the processing device 30 can bind these data with the identity code to represent the detection fixture 10 At this time, it is used for the detection of the object under test, so as to strengthen the management of the detection fixture 10 .

The tool in step S52 may be a device for testing the object to be tested. The sensed value can be any value detected by the detection process of the object under test, such as voltage value, current value or various signals, data, etc., and the present invention does not limit the detection process. After the detection is completed (for example, the implement obtains the sensed value), the implement may output a notification to the processing device 30 . After the processing device 30 receives the notification, proceed to step S6.

In step S7, after the processing device 30 updates the usage times to the storage device 40, the binding of the data and the identity code is released, which means that the use of the detection fixtures 10 by the object under test is over. Detection process.

In one embodiment of the present invention, the server of the present invention can be used for artificial intelligence (English: Artificial Intelligence, referred to as AI) computing, edge computing (edge computing), and can also be used as a 5G server, cloud server or vehicle Internet server use.

In an embodiment of the present invention, the vehicle-mounted electronic product of the present invention can be applied to vehicle-mounted devices, such as self-driving cars, electric cars, or semi-autonomous cars.

To sum up, with the management method of the testing fixtures applied to the testing process of the present invention, in the testing process, the data stored in the electronic tags respectively correspond to the testing fixtures, and the processing device judges the After the number of times of use does not exceed a threshold, the detection process is performed on the object under test by using the detection fixtures. Finally, after the detection process is executed, a plurality of updated usage times values are generated according to the usage times values, and the usage times values in the storage device are respectively replaced by the updated usage times values. In this way, it is possible to manage the testing fixtures separately, and at the same time ensure that the number of times of use of the testing fixtures used in the testing process does not exceed the set threshold.

Although the present invention is disclosed by the aforementioned embodiments, they are not intended to limit the present invention. Without departing from the spirit and scope of the present invention, all changes and modifications are within the scope of patent protection of the present invention. For the scope of protection defined by the present invention, please refer to the appended scope of patent application.

10: Detection fixture 20: Reading device 21: Antenna 30: Processing device 40: storage device 50: carrier disk A: area S1~S6: steps

FIG. 1 is a device block diagram of an embodiment of the present invention. FIG. 2 is a flow chart of a method for managing inspection fixtures applied in an inspection process according to an embodiment of the present invention. FIG. 3 is a schematic diagram of some components of an embodiment of the present invention. FIG. 4 is a detailed flow chart of a method for managing inspection fixtures applied to the inspection process according to an embodiment of the present invention.

S1~S6: steps

Claims (5)

A method for managing detection fixtures applied to a detection process, comprising: combining multiple detection fixtures with multiple electronic tags; setting these detection fixtures on a carrier plate, wherein the carrier plate has multiple areas, and The detection fixtures are arranged in the areas; a plurality of signals are obtained with a plurality of antennas respectively corresponding to the areas, and the reading device is used to generate the data respectively associated with the signals; with a The processing device obtains the data from the reading device, and obtains a plurality of use-time values respectively associated with the data from a storage device; the processing device judges whether the use-time values do not exceed a threshold; in the When none of the usage times exceeds the threshold, use the testing fixtures to perform a detection process on an object under test; and after performing the detection process, use the processing device to generate a plurality of updated usage and replace the usage times in the storage device with the updated usage times. The management method of testing fixtures applied to the testing process as described in claim 1, wherein the processing device obtains the data from the reading device, and obtains the usage data associated with the data from the storage device The number of times includes: using the processing device to obtain the data from the reading device; using the processing device to determine whether the total quantity of the data meets a detection quantity value; and when the total quantity of the data meets the detection quantity value , obtaining the usage times values respectively associated with the data from the storage device. The management method of the detection fixture applied to the detection process as described in claim 1 further includes: When any one of the usage times exceeds the threshold, a replacement notification is generated by the processing means. The management method of testing fixtures applied to testing process as described in claim 1, wherein the testing process includes: combining these testing fixtures with the object to be tested, and creating the data and the testing tool by the processing device Binding of an identity code of the test object; and outputting a notification to the processing device after obtaining a sensing value of the test object combined with the detection jigs with a machine, and using the processing device according to the Generating the updated usage times values includes: after the processing device receives the notification, adding 1 to the usage times values to generate the updated usage times values. According to the management method of testing fixtures applied to the testing process as described in claim 4, after replacing the usage times in the storage device with the updated usage times, the method further includes: releasing the data Binding to that identity code.

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