TWI770953B - Crystal growth furnace - Google Patents
Crystal growth furnace Download PDFInfo
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- TWI770953B TWI770953B TW110114519A TW110114519A TWI770953B TW I770953 B TWI770953 B TW I770953B TW 110114519 A TW110114519 A TW 110114519A TW 110114519 A TW110114519 A TW 110114519A TW I770953 B TWI770953 B TW I770953B
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/14—Heating of the melt or the crystallised materials
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
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Abstract
Description
本發明係與長晶爐有關;特別是指一種降低熔化矽料過程中所耗費的熱能的長晶爐。The present invention relates to a crystal growth furnace; in particular, it refers to a crystal growth furnace which reduces the heat energy consumed in the process of melting silicon material.
在典型的CZ法(Czochralski)製程中,係將矽料置於坩堝內,並將矽料在約1416℃之溫度熔化為液態矽後,將具預定結晶取向之矽晶種下降以接觸液態矽之表面,在適當地溫度控制下,液態矽在矽晶種上形成具有與該矽晶種所具預定結晶取向之單晶,接著,旋轉並慢慢提拉矽晶種及坩堝,以在矽晶種下方形成矽晶棒。In a typical CZ process (Czochralski) process, silicon material is placed in a crucible, and after the silicon material is melted into liquid silicon at a temperature of about 1416°C, a silicon seed with a predetermined crystallographic orientation is lowered to contact the liquid silicon On the surface, under proper temperature control, the liquid silicon forms a single crystal with the predetermined crystallographic orientation of the silicon seed crystal on the silicon seed crystal. A silicon ingot is formed under the seed crystal.
已知習用之長晶爐是透過設置於坩堝側邊之加熱器輸出熱能以熔化坩堝中之矽料,而習用之長晶爐之設置使得坩堝之熱能容易自坩堝上方開口逸散,進而造成大量熱能的損耗及增加加熱器輸出功率,除此之外,當坩堝內部溫度下降時,需耗費較長的時間熔化矽料,不僅影響到生產效率,也容易因為坩堝本體溫度分布不均勻而使得坩堝使用壽命縮短,進而造成生產成本的提升。因此,如何降低熔化矽料過程中加熱器所輸出之總功率以及如何使坩堝本體溫度均勻分布是亟待解決的問題。It is known that the conventional crystal growth furnace outputs thermal energy through a heater arranged on the side of the crucible to melt the silicon material in the crucible, and the setting of the conventional crystal growth furnace allows the heat energy of the crucible to easily escape from the opening above the crucible, thereby causing a large amount of In addition, when the internal temperature of the crucible drops, it takes a long time to melt the silicon material, which not only affects the production efficiency, but also easily causes the crucible to be caused by the uneven temperature distribution of the crucible body. The service life is shortened, which in turn leads to an increase in production costs. Therefore, how to reduce the total power output by the heater in the process of melting silicon material and how to distribute the temperature of the crucible body evenly are the problems to be solved urgently.
有鑑於此,本發明之目的在於提供一種長晶爐,於熔化坩堝中矽料的過程中能降低熔化矽料過程中加熱器所輸出之總功率以及使坩堝本體溫度均勻分布。In view of this, the purpose of the present invention is to provide a crystal growth furnace, which can reduce the total power output by the heater during the process of melting the silicon material in the crucible and make the temperature of the crucible body evenly distributed.
緣以達成上述目的,本發明提供的一種長晶爐,包括一爐體、一坩堝、一第一加熱裝置、一第二加熱裝置及一升降裝置,該坩堝設置於該爐體中,用以容置待熔化之固態原料,該坩堝具有一上開口;該第一加熱裝置設置於該坩堝的側邊外圍,用以對該坩堝加熱;該第二加熱裝置設置於該坩堝之該上開口上方,該第二加熱裝置包括一加熱器,該加熱器面對該坩堝的上開口;該升降裝置與該第二加熱裝置連接,該升降裝置能受控制地帶動該第二加熱裝置於一軸向方向上相對該坩堝上下移動。In order to achieve the above purpose, the present invention provides a crystal growth furnace, which includes a furnace body, a crucible, a first heating device, a second heating device and a lifting device, and the crucible is arranged in the furnace body for The crucible has an upper opening for accommodating solid raw materials to be melted; the first heating device is arranged on the side periphery of the crucible for heating the crucible; the second heating device is arranged above the upper opening of the crucible , the second heating device includes a heater, the heater faces the upper opening of the crucible; the lifting device is connected with the second heating device, the lifting device can be controlled to drive the second heating device in an axial direction The direction moves up and down relative to the crucible.
本發明之效果在於,進行熔化坩堝中之固態原料的步驟時,能透過控制該升降裝置帶動該第二加熱裝置於該軸向方向移動至接近該坩堝上方的位置,如此一來,能透過設置於該坩堝的側邊外圍之該第一加熱裝置以及設置於該坩堝之該上開口上方之該第二加熱裝置同時對該坩堝進行加熱,而使得該坩堝均勻受熱,藉此,不僅能改善習用之長晶爐之熱能容易自坩堝上方開口逸散,進而造成大量熱能的損耗及增加加熱器輸出功率的問題,還能改善坩堝本體溫度分布不均勻而使得坩堝使用壽命縮短的問題;當完成熔化坩堝中之固態原料的步驟後,能透過控制該升降裝置帶動該第二加熱裝置於該軸向方向移動至遠離該坩堝上方的位置,以利後續例如拉晶之作業。The effect of the present invention is that when the step of melting the solid raw material in the crucible is performed, the second heating device can be driven to move in the axial direction to a position close to the top of the crucible by controlling the lifting device. The first heating device on the side periphery of the crucible and the second heating device disposed above the upper opening of the crucible heat the crucible at the same time, so that the crucible is heated evenly, thereby not only improving the conventional The heat energy of the crystal growth furnace is easily dissipated from the opening above the crucible, thereby causing a large amount of heat energy loss and increasing the output power of the heater. It can also improve the uneven temperature distribution of the crucible body and shorten the service life of the crucible. After the step of solid raw material in the crucible, the lifting device can be controlled to drive the second heating device to move away from the top of the crucible in the axial direction, so as to facilitate subsequent operations such as crystal pulling.
為能更清楚地說明本發明,茲舉數較佳實施例並配合圖式詳細說明如後。請參圖1所示,為本發明第一較佳實施例之長晶爐1,包括一爐體10、一坩堝20、一第一加熱裝置40、一第二加熱裝置60及一升降裝置80,該坩堝20設置於該爐體10中,用以容置待熔化之固態矽原料S,該坩堝20具有一上開口201,該第一加熱裝置40設置於該坩堝20的側邊外圍,用以對該坩堝20加熱,該第二加熱裝置60設置於該坩堝20之該上開口201上方,該第二加熱裝置60包括一加熱器62,該加熱器62面對該坩堝20的上開口201,該升降裝置80與該第二加熱裝置60連接,該升降裝置80能受控制地帶動該第二加熱裝置60於一軸向方向X上相對該坩堝20上下移動。In order to explain the present invention more clearly, the preferred embodiments are listed and described in detail with the drawings as follows. Referring to FIG. 1 , a
藉此,於進行熔化坩堝中之固態矽原料S的步驟時,能透過控制該升降裝置80帶動該第二加熱裝置60於該軸向方向X移動至接近該坩堝20上方的位置,如此一來,能透過設置於該坩堝20的側邊外圍之該第一加熱裝置40以及設置於該坩堝20之該上開口201上方之該第二加熱裝置60同時對該坩堝20進行加熱,而使得該坩堝20均勻受熱並避免熱能自該坩堝20之該上開口201上方逸散,以有效降低該第一加熱裝置40及該第二加熱裝置60輸出之總輸出功率,並延長該坩堝20之使用壽命,除此之外,透過設置於該坩堝20之該上開口201上方之該第二加熱裝置60能加速該坩堝20中接近該上開口之固態矽原料S之熔化;當完成熔化坩堝20中之固態矽原料S的步驟後,能透過控制該升降裝置80帶動該第二加熱裝置60於該軸向方向X移動至遠離該坩堝20上方的位置,以利後續例如拉晶之作業。Therefore, when the step of melting the solid silicon raw material S in the crucible is performed, the
再說明的是,該升降裝置80包含一支架82及一吊線84,該吊線84連接該支架82,該加熱器62具有兩連接部621分別連接於該支架82,於本實施例中,該加熱器62為一石墨加熱器,該石墨加熱器於該軸向方向X上之厚度為15~25mm,較佳為16.5~22.5 mm,且如圖2所示,該石墨加熱器於該二連接部間具有複數個彎折的加熱段622。Again, the
請再配合圖1,該長晶爐1包含一熱遮罩90,設置於該爐體10中並位於該坩堝20上方,該熱遮罩90呈錐狀且底部具有一開口901,該開口901之開口面積小於該坩堝20之開口面積,該熱遮罩90於該開口901上方具有一通道T,該通道T連通該坩堝20內部,該第二加熱裝置60設置於該通道T中,藉此,透過該熱遮罩90能避免坩堝20內溶液的飛濺及熱能自該坩堝20之該上開口201上方逸散。Please refer to FIG. 1 again. The
請配合圖3,為本發明第二較佳實施例之長晶爐2,該長晶爐2具有與第一佳實施例之長晶爐1大致相同之結構,不同的是,該長晶爐2之該第二加熱裝置60包含一上蓋64,該上蓋64由包含鉬或石墨之材質製成,該上蓋64、該加熱器62及該坩堝20是於該軸向方向X上依序設置,該上蓋64連接於該升降裝置80之該支架82,且該吊線84而能受控制地帶動該上蓋64與該加熱器62相對該坩堝20於該軸向方向X同時上下移動,且該上蓋64為罩狀,該上蓋64具有一容置空間R,該加熱器62設置於該容置空間R中,藉此,能有效避免熱能自該加熱器62上方以及該坩堝20之該上開口201上方逸散。Please refer to FIG. 3 , which is a
進一步說明的是,該坩堝20於與該軸向方向X垂直的方向上具有一第一最大寬度D1,該上蓋64於與該軸向方向X垂直的方向上具有一第二最大寬度D2,該加熱器62於與該軸向方向X垂直的方向上具有一第三最大寬度D3,其中,該第一最大寬度D1與該第二最大寬度D2之比為1:0.4~1:0.8,較佳為1:0.45~1:0.7,該第一最大寬度D1與該第三最大寬度D3之寬度比為1:0.2~1:0.7,較佳為1:0.25~1:0.65,該第二最大寬度D2與該第三最大寬度D3之比為1:0.6~1:0.9,較佳為1:0.7~1:0.85,該上蓋64與該加熱器62間於該軸向方向X上具有一間距H,該坩堝20於該軸向方向X上之高度H1與該間距H之比為1:0.05~1:0.1,較佳為1:0.055~1:0.075,該上蓋64底部於該軸向方向X上與該熱遮罩90上表面間之最小距離H2小於或等於15mm,較佳為12 mm;該加熱器62與該坩堝20內熔化之固態矽原料S之液面間於該軸向方向X上具有一間距H3,該坩堝20於該軸向方向X上之高度H1與該間距H3之比為1:0.3~1:0.8,較佳為1:0.4~1:0.65。透過上述該坩堝20、該上蓋64及該加熱器62間之寬度比例的選擇,能提供較佳之加熱及防止熱能逸散之效果。It is further explained that the
續請參閱下列表1,為本發明與比較例之長晶爐3於熔化固態矽原料的過程中的總輸出功率及坩堝溫差下降百分比之比較列表,其中,所述總輸出功率下降百分比是根據比較例之長晶爐3與實施例1、2、3之長晶爐1、2熔化坩堝中之固態矽原料S之輸出總功率之差與比較例之長晶爐3輸出總功率的比率計算所得,石墨坩堝溫差下降百分比及石英坩堝溫差下降百分比是根據比較例之長晶爐3與實施例1、2、3之坩堝的最大溫差之差值與比較例之長晶爐3之坩堝3a的最大溫差值的比率計算所得。Please refer to Table 1 below, which is a comparison table of the total output power and the reduction percentage of the temperature difference of the crucible in the process of melting the solid silicon raw material between the
如圖5所示,比較例之長晶爐3僅於坩堝3a側邊外圍設置第一加熱裝置3b且未於坩堝3a上方設置第二加熱裝置,而實施例1是採用如圖1所示設置有加熱器62之長晶爐1,其總輸出功率下降百分比為10.32%、石墨坩堝溫差下降百分比為2.63%以及石英坩堝溫差下降百分比為2.45%。As shown in FIG. 5 , in the
實施例 2、3是採用如圖3所示設置有加熱器62及上蓋64之長晶爐2進行熔化固態矽原料S之製程,且於實施例2中,該上蓋64是採用包含石墨之材質製成,其總輸出功率下降百分比為15.65%、石墨坩堝溫差下降百分比為4.22%以及石英坩堝溫差下降百分比為3.67%,相較於實施例1之長晶爐1,實施例2之長晶爐2因於坩堝3a上方設置設置上蓋64,故更能有效降低總輸出功率及降低坩堝溫度;於實施例3中,該上蓋64是採用包含鉬之材質製成,其總輸出功率下降百分比24.09%、石墨坩堝溫差下降百分比為5.72%以及石英坩堝溫差下降百分比為4.84%,相較於實施例1、2之長晶爐,實施例3之長晶爐因設置包含熱傳導係數低之材質製成的上蓋64,能提供坩堝較好的保溫效果,因此更能有效降低總輸出功率及降低坩堝溫度。
根據表1所示,可知相較比較例之長晶爐3僅於坩堝3a側邊外圍設置第一加熱裝置3b且未於坩堝3a上方設置第二加熱裝置,採用如圖1所示設置有加熱器62之長晶爐1及如圖3所示設置有加熱器62及上蓋64之長晶爐2進行熔化固態矽原料S之製程能大幅降低總輸出功率,且能有效降低坩堝之溫度,提升坩堝使用壽命。As shown in Table 1, it can be seen that compared with the
表1
綜上所述,透過本發明之長晶爐,於進行熔化坩堝20中之固態矽原料S的步驟時,能控制該升降裝置80帶動該第二加熱裝置60於該軸向方向X移動至接近該坩堝20上方的位置,以透過設置於該坩堝20的側邊外圍之該第一加熱裝置40以及設置於該坩堝20之該上開口201上方之該第二加熱裝置60同時對該坩堝20進行加熱,而使得該坩堝20均勻受熱並避免熱能自該坩堝20之該上開口201上方逸散,達成有效降低該第一加熱裝置40及該第二加熱裝置60輸出之總輸出功率,及延長該坩堝20之使用壽命之功效,除此之外,透過設置於該坩堝20之該上開口201上方之該第二加熱裝置60還能達成加速該坩堝20中接近該上開口201之固態矽原料S之熔化的效果;而當完成熔化坩堝20中之固態矽原料S的步驟後,能透過控制該升降裝置80帶動該第二加熱裝置60於該軸向方向X移動至遠離該坩堝20上方的位置,以利後續進行例如拉晶之作業。To sum up, through the crystal growth furnace of the present invention, when the step of melting the solid silicon raw material S in the
以上所述僅為本發明較佳可行實施例而已,舉凡應用本發明說明書及申請專利範圍所為之等效變化,理應包含在本發明之專利範圍內。The above descriptions are only preferred feasible embodiments of the present invention, and any equivalent changes made by applying the description of the present invention and the scope of the patent application should be included in the patent scope of the present invention.
[本發明]
1,2:長晶爐
10:爐體
20:坩堝
201:上開口
40:第一加熱裝置
60:第二加熱裝置
62:加熱器
621:連接部
622:加熱段
64:上蓋
80:升降裝置
82:支架
84:吊線
90:熱遮罩
901:開口
D1:第一最大寬度
D2:第二最大寬度
D3:第三最大寬度
H:間距
H1:高度
H2:最小距離
H3:間距
R:容置空間
S:固態矽原料
T:通道
X:軸向方向
S:固態矽原料
[比較例]
3:長晶爐
3a:坩堝
3b:第一加熱裝置
S:固態矽原料
[this invention]
1,2: Crystal growth furnace
10: Furnace body
20: Crucible
201: upper opening
40: The first heating device
60: Second heating device
62: Heater
621: Connector
622: Heating section
64: upper cover
80: Lifting device
82: Bracket
84: hanging wire
90: Thermal Mask
901: Opening
D1: The first maximum width
D2: Second largest width
D3: The third maximum width
H: Spacing
H1: height
H2: Minimum distance
H3: Spacing
R: accommodation space
S: solid silicon raw material
T: channel
X: Axial direction
S: solid silicon raw material
[Comparative example]
3:
圖1為本發明第一較佳實施例之長晶爐的示意圖。 圖2為上述較佳實施例之加熱器的示意圖。 圖3為本發明第二較佳實施例之長晶爐的示意圖。 圖4為本發明第二較佳實施例之長晶爐部分構件放大示意圖。 圖5為比較例之長晶爐的示意圖。 FIG. 1 is a schematic diagram of a crystal growth furnace according to a first preferred embodiment of the present invention. FIG. 2 is a schematic diagram of the heater of the above preferred embodiment. 3 is a schematic diagram of a crystal growth furnace according to a second preferred embodiment of the present invention. 4 is an enlarged schematic view of some components of the crystal growth furnace according to the second preferred embodiment of the present invention. FIG. 5 is a schematic diagram of a crystal growth furnace of a comparative example.
1:長晶爐 1: Crystal growth furnace
10:爐體 10: Furnace body
201:上開口 201: upper opening
40:第一加熱裝置 40: The first heating device
60:第二加熱裝置 60: Second heating device
62:加熱器 62: Heater
80:升降裝置 80: Lifting device
82:支架 82: Bracket
84:吊線 84: hanging wire
90:熱遮罩 90: Thermal Mask
901:開口 901: Opening
D1:第一最大寬度 D1: The first maximum width
H1:高度 H1: height
S:固態矽原料 S: solid silicon raw material
T:通道 T: channel
X:軸向方向 X: Axial direction
Claims (10)
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Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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TWI405877B (en) * | 2007-12-25 | 2013-08-21 | Shinetsu Handotai Kk | Single crystal manufacturing apparatus and manufacturing method thereof |
CN105121713A (en) * | 2013-04-24 | 2015-12-02 | 胜高科技股份有限公司 | Method for producing single crystal, and method for producing silicon wafer |
CN109913939A (en) * | 2019-04-09 | 2019-06-21 | 西安奕斯伟硅片技术有限公司 | Heat shield assembly, crystal pulling furnace system and its working method |
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TWM475574U (en) * | 2013-08-30 | 2014-04-01 | Eversol Corp | Lateral multi-stage heating crystal growth furnace structure |
TW201508102A (en) * | 2013-08-30 | 2015-03-01 | Eversolcorporation | Construction of crystal growth furnace for lateral mobile heating |
CN103572365B (en) * | 2013-11-06 | 2017-01-11 | 青岛隆盛晶硅科技有限公司 | Ingot furnace with movable side heater and ingot production process |
CN103741212A (en) * | 2013-12-19 | 2014-04-23 | 镇江环太硅科技有限公司 | Crystal growth furnace and control method for thermal field of crystal growth furnace |
TWM485251U (en) * | 2014-04-03 | 2014-09-01 | Globalwafers Co Ltd | Crystal growth apparatus and thermal insulation cover thereof |
TWI551737B (en) * | 2014-08-07 | 2016-10-01 | Method for manufacturing polycrystalline silicon ingots | |
TWI546429B (en) * | 2015-07-09 | 2016-08-21 | 環球晶圓股份有限公司 | Crystal growth furnace and cooling tube of the same |
TWI614473B (en) * | 2015-07-20 | 2018-02-11 | 茂迪股份有限公司 | Equipment of crystal growth furnace |
CN110983429A (en) * | 2019-12-23 | 2020-04-10 | 西安奕斯伟硅片技术有限公司 | Single crystal furnace and monocrystalline silicon preparation method |
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Publication number | Priority date | Publication date | Assignee | Title |
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TWI405877B (en) * | 2007-12-25 | 2013-08-21 | Shinetsu Handotai Kk | Single crystal manufacturing apparatus and manufacturing method thereof |
CN105121713A (en) * | 2013-04-24 | 2015-12-02 | 胜高科技股份有限公司 | Method for producing single crystal, and method for producing silicon wafer |
CN109913939A (en) * | 2019-04-09 | 2019-06-21 | 西安奕斯伟硅片技术有限公司 | Heat shield assembly, crystal pulling furnace system and its working method |
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