TWI766025B - Active ester compound and curable composition - Google Patents

Active ester compound and curable composition Download PDF

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TWI766025B
TWI766025B TW107117766A TW107117766A TWI766025B TW I766025 B TWI766025 B TW I766025B TW 107117766 A TW107117766 A TW 107117766A TW 107117766 A TW107117766 A TW 107117766A TW I766025 B TWI766025 B TW I766025B
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active ester
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佐藤泰
河崎顕人
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日商迪愛生股份有限公司
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Abstract

本發明之目的在於提供一種硬化物於高溫條件下之彈性模數低之活性酯化合物、含有其之硬化性組成物、其硬化物、半導體密封材料及印刷配線基板。具體而言,本發明提供一種活性酯化合物、含有其之硬化性組成物、其硬化物、半導體密封材料及印刷配線基板,該活性酯化合物係二羥基苯化合物(a1)與芳香族單羧酸或其酸鹵化物(acid halide)(a2)之酯化物,上述二羥基苯化合物(a1)為1,2-二羥基苯化合物或1,3-二羥基苯化合物。 An object of the present invention is to provide an active ester compound having a low elastic modulus of a cured product under high temperature conditions, a curable composition containing the same, a cured product thereof, a semiconductor sealing material, and a printed wiring board. Specifically, the present invention provides an active ester compound, a curable composition containing the same, a cured product thereof, a semiconductor sealing material, and a printed wiring board, the active ester compound being a dihydroxybenzene compound (a1) and an aromatic monocarboxylic acid or an ester product of an acid halide (a2) thereof, wherein the dihydroxybenzene compound (a1) is a 1,2-dihydroxybenzene compound or a 1,3-dihydroxybenzene compound.

Description

活性酯化合物及硬化性組成物 Active ester compound and curable composition

本發明係關於一種高溫條件下之彈性模數低之活性酯化合物、含有其之硬化性組成物、其硬化物、半導體密封材料及印刷配線基板。 The present invention relates to an active ester compound with a low elastic modulus under high temperature conditions, a curable composition containing the same, a cured product thereof, a semiconductor sealing material, and a printed wiring board.

於半導體或多層印刷基板等所使用之絕緣材料之技術領域中,伴隨著各種電子構件之薄型化或小型化,要求開發出匹配該等市場動向之新穎樹脂材料。作為對半導體密封材料所要求之性能,為了提高回流焊性而要求高溫條件下之彈性模數低。此外,硬化物之耐熱性或耐吸濕性當然重要,作為訊號之高速化及高頻化對策,重要的是硬化物之介電常數及介電損耗正切值低,就高溫條件下之可靠性而言,重要的是玻璃轉移溫度(Tg)等物性不會變化,作為伴隨著薄型化之翹曲或變形對策,硬化收縮率或線膨脹係數低等亦較重要。 In the technical field of insulating materials used in semiconductors, multilayer printed circuit boards, etc., along with thinning and miniaturization of various electronic components, it is required to develop novel resin materials that match these market trends. As a performance required for a semiconductor sealing material, in order to improve reflow solderability, a low elastic modulus under high temperature conditions is required. In addition, the heat resistance or moisture absorption resistance of the cured product is of course important. As a countermeasure to increase the speed and frequency of signals, it is important that the dielectric constant and dielectric loss tangent of the cured product are low, which is important for reliability under high temperature conditions. In other words, it is important that the physical properties such as glass transition temperature (Tg) do not change, and it is also important that the curing shrinkage and the coefficient of linear expansion are low as measures against warpage and deformation accompanying thinning.

作為硬化物之耐熱性或介電特性等優異之樹脂材料,已知有使用異酞酸二(1-萘基酯)作為環氧樹脂之硬化劑之技術(參照下述專利文獻1)。專利文獻1所記載之環氧樹脂組成物藉由使用異酞酸二(α-萘基酯)作為環氧樹脂硬化劑,而與使用苯酚酚醛清漆樹脂之類的習知型環氧樹脂硬化劑之情形相比,硬化物之介電常數或介電損耗正切之值確實較低,但硬化物於高溫條件下之彈性模數並未滿足近年來所要求之等級。又,由於熔融黏度高,故而於半導體密封材料等要求熔融黏度低之用途中使用存在限制。 As a resin material excellent in the heat resistance and dielectric properties of the cured product, a technique using bis(1-naphthyl isophthalate) as a curing agent for epoxy resins is known (refer to the following Patent Document 1). The epoxy resin composition described in Patent Document 1 is different from conventional epoxy resin hardeners such as phenol novolac resins by using di(α-naphthyl isophthalate) as the epoxy resin hardener. Compared with the previous case, the value of the dielectric constant or the dielectric loss tangent of the cured product is indeed lower, but the elastic modulus of the cured product under high temperature conditions does not meet the level required in recent years. In addition, since the melt viscosity is high, there is a limitation in use in applications requiring low melt viscosity, such as a semiconductor sealing material.

[先前技術文獻] [Prior Art Literature]

[專利文獻] [Patent Literature]

[專利文獻1]日本特開2003-82063號公報 [Patent Document 1] Japanese Patent Laid-Open No. 2003-82063

因此,本發明所欲解決之課題在於提供一種高溫條件下之彈性模數低之活性酯化合物、含有其之硬化性組成物、其硬化物、半導體密封材料及印刷配線基板。 Therefore, the subject to be solved by the present invention is to provide an active ester compound having a low elastic modulus under high temperature conditions, a curable composition containing the same, a cured product thereof, a semiconductor sealing material, and a printed wiring board.

本發明人等為了解決上述課題經潛心研究後,結果發現為1,2-二羥基苯化合物或1,3-二羥基苯化合物與芳香族單羧酸或其酸鹵化物(acid halide)之二酯化物的活性酯化合物不僅硬化物於高溫條件下之彈性模數低,而且熔融黏度亦低,從而完成本發明。 The inventors of the present invention, as a result of diligent research in order to solve the above-mentioned problems, found that a 1,2-dihydroxybenzene compound or a 1,3-dihydroxybenzene compound and an aromatic monocarboxylic acid or its acid halide are the second The active ester compound of the esterified product not only has a low elastic modulus under high temperature conditions, but also has a low melt viscosity, thereby completing the present invention.

即,本發明係關於一種活性酯化合物,其係二羥基苯化合物(a1)與芳香族單羧酸或其酸鹵化物(a2)之酯化物,上述二羥基苯化合物(a1)為1,2-二羥基苯化合物或1,3-二羥基苯化合物。 That is, the present invention relates to an active ester compound which is an ester product of a dihydroxybenzene compound (a1) and an aromatic monocarboxylic acid or its acid halide (a2), wherein the dihydroxybenzene compound (a1) is 1,2 - a dihydroxybenzene compound or a 1,3-dihydroxybenzene compound.

本發明進而係關於一種硬化性組成物,其含有上述活性酯化合物及硬化劑。 The present invention further relates to a curable composition containing the above-mentioned active ester compound and a curing agent.

本發明進而係關於一種硬化物,其係上述硬化性組成物之硬化物。 The present invention further relates to a cured product which is a cured product of the above-mentioned curable composition.

本發明進而係關於一種半導體密封材料,其係使用上述硬化性組成物而成。 The present invention further relates to a semiconductor sealing material using the above curable composition.

本發明進而係關於一種印刷配線基板,其係使用上述硬化性組 成物而成。 The present invention further relates to a printed wiring board using the above curable composition.

根據本發明,可提供一種硬化物於高溫條件下之彈性模數低之活性酯化合物、含有其之硬化性組成物、其硬化物、半導體密封材料及印刷配線基板。 According to the present invention, an active ester compound having a low elastic modulus of a cured product under high temperature conditions, a curable composition containing the same, a cured product thereof, a semiconductor sealing material, and a printed wiring board can be provided.

圖1係實施例1中所獲得之活性酯化合物(1)之GPC線圖。 FIG. 1 is a GPC diagram of the active ester compound (1) obtained in Example 1. FIG.

以下,對本發明詳細地進行說明。 Hereinafter, the present invention will be described in detail.

本發明之活性酯化合物之特徵在於:其係二羥基苯化合物(a1)與芳香族單羧酸或其酸鹵化物(a2)之酯化物,上述二羥基苯化合物(a1)為1,2-二羥基苯化合物或1,3-二羥基苯化合物。 The active ester compound of the present invention is characterized in that it is an ester product of a dihydroxybenzene compound (a1) and an aromatic monocarboxylic acid or its acid halide (a2), and the dihydroxybenzene compound (a1) is a 1,2- Dihydroxybenzene compound or 1,3-dihydroxybenzene compound.

上述二羥基苯化合物(a1)可列舉:1,2-二羥基苯、1,3-二羥基苯及於該等之芳香環上具有1個或多個取代基之二羥基苯化合物。上述取代基例如可列舉:脂肪族烴基、烷氧基、鹵素原子、芳基、芳烷基等。上述脂肪族烴基可為直鏈型及支鏈型之任一種,結構中亦可具有不飽和鍵。具體而言,可列舉:甲基、乙基、丙基、丁基、戊基、己基等烷基;環己基等環烷基;乙烯基、烯丙基、炔丙基等含不飽和鍵之基等。上述烷氧基可列舉:甲氧基、乙氧基、丙氧基、丁氧基等。上述鹵素原子可列舉:氟原子、氯原子、溴原子等。上述芳基可列舉:苯基、萘基、蒽基及於該等之芳香核上取代有上述脂肪族烴基或烷氧基、鹵素原子等之結構部位等。上述芳烷基可列舉:苄基、苯基乙基、萘基甲基、萘基乙基及於該等之芳香核上取代有上述烷基或烷氧基、鹵素 原子等之結構部位等。上述二羥基苯化合物(a1)可單獨地使用1種,亦可併用2種以上。 As said dihydroxybenzene compound (a1), 1, 2- dihydroxy benzene, 1, 3- dihydroxy benzene, and the dihydroxy benzene compound which has one or more substituents in these aromatic rings are mentioned. As said substituent, an aliphatic hydrocarbon group, an alkoxy group, a halogen atom, an aryl group, an aralkyl group, etc. are mentioned, for example. The above-mentioned aliphatic hydrocarbon group may be either a straight chain type or a branched chain type, and may have an unsaturated bond in the structure. Specifically, alkyl groups such as methyl, ethyl, propyl, butyl, pentyl, and hexyl; cycloalkyl groups such as cyclohexyl; Base et al. As said alkoxy group, a methoxy group, an ethoxy group, a propoxy group, a butoxy group, etc. are mentioned. As said halogen atom, a fluorine atom, a chlorine atom, a bromine atom, etc. are mentioned. Examples of the above-mentioned aryl group include a phenyl group, a naphthyl group, an anthracenyl group, and a structural site in which the above-mentioned aliphatic hydrocarbon group, an alkoxy group, a halogen atom, and the like are substituted on these aromatic nuclei. Examples of the above-mentioned aralkyl group include benzyl group, phenylethyl group, naphthylmethyl group, naphthylethyl group, and structural moieties in which the above-mentioned alkyl group, alkoxy group, halogen atom, etc. are substituted on the aromatic nucleus thereof. The said dihydroxybenzene compound (a1) may be used individually by 1 type, and may use 2 or more types together.

上述芳香族單羧酸或其酸鹵化物(a2)可列舉:苯羧酸、萘羧酸、於該等之芳香核上具有1個或多個脂肪族烴基、烷氧基、鹵素原子、芳基、芳烷基等取代基之化合物及該等之酸鹵化物等。該等可單獨地使用1種,亦可併用2種以上。其中,就成為硬化物於高溫條件下之彈性模數低,且硬化性等亦優異之活性酯化合物之方面而言,較佳為苯羧酸或其鹵化物。因此,作為本發明之活性酯化合物之更佳結構,可列舉下述結構式(1-1)或(1-2)所表示者。 Examples of the above-mentioned aromatic monocarboxylic acid or its acid halide (a2) include benzenecarboxylic acid, naphthalenecarboxylic acid, one or more aliphatic hydrocarbon groups, alkoxy groups, halogen atoms, aromatic Compounds of substituents such as radicals, aralkyls, etc., and acid halides of these, etc. These may be used individually by 1 type, and may use 2 or more types together. Among them, benzenecarboxylic acid or a halide thereof is preferable in terms of becoming an active ester compound having a low modulus of elasticity under high temperature conditions and excellent curability of the cured product. Therefore, as a more preferable structure of the active ester compound of this invention, what is represented by following structural formula (1-1) or (1-2) is mentioned.

Figure 107117766-A0202-12-0004-2
Figure 107117766-A0202-12-0004-2

(式中,R1分別獨立地為脂肪族烴基、烷氧基、鹵素原子、芳基、芳烷基之任一者,可鍵結於形成苯環之任一碳原子;R2分別獨立地為脂肪族烴基、烷氧基、鹵素原子、芳基、芳烷基之任一者,可鍵結於形成苯環之任一碳原子;m為0或1~4之整數,n為0或1~5之整數) (in the formula, R 1 are each independently any one of aliphatic hydrocarbon group, alkoxy group, halogen atom, aryl group, aralkyl group, and can be bonded to any carbon atom forming a benzene ring; R 2 are each independently It is any one of aliphatic hydrocarbon group, alkoxy group, halogen atom, aryl group and aralkyl group, and can be bonded to any carbon atom forming a benzene ring; m is 0 or an integer from 1 to 4, and n is 0 or Integer from 1 to 5)

上述二羥基苯化合物(a1)與芳香族單羧酸或其酸鹵化物(a2)之反應,例如可藉由在鹼觸媒之存在下於40~65℃左右之溫度條件下進行加熱攪拌之方法進行。反應亦可視需要於有機溶劑中進行。又,亦可於反應結束後,視需要藉由水洗或再沈澱等對反應產物進行精製。 The reaction of the above-mentioned dihydroxybenzene compound (a1) with an aromatic monocarboxylic acid or its acid halide (a2) can be carried out, for example, by heating and stirring at a temperature of about 40 to 65°C in the presence of an alkali catalyst. method to proceed. The reaction can also be carried out in an organic solvent as required. Moreover, after completion|finish of reaction, you may refine|purify a reaction product by water washing, reprecipitation, etc. as needed.

上述鹼觸媒例如可列舉:氫氧化鈉、氫氧化鉀、三乙胺、吡啶 等。該等可分別單獨地使用,亦可併用2種以上。又,亦可以3.0~30%左右之水溶液之形式使用。其中,較佳為觸媒能力高之氫氧化鈉或氫氧化鉀。 Examples of the above-mentioned alkali catalyst include sodium hydroxide, potassium hydroxide, triethylamine, pyridine and the like. These may be used independently, respectively, and may use 2 or more types together. In addition, it can also be used in the form of an aqueous solution of about 3.0 to 30%. Among them, sodium hydroxide or potassium hydroxide with high catalytic ability is preferable.

上述有機溶劑例如可列舉:丙酮、甲基乙基酮、甲基異丁基酮、環己酮等酮溶劑;乙酸乙酯、乙酸丁酯、乙酸賽璐蘇(cellosolve acetate)、丙二醇一甲醚乙酸酯、卡必醇乙酸酯等乙酸酯溶劑;賽璐蘇、丁基卡必醇等卡必醇溶劑;甲苯、二甲苯等芳香族烴溶劑;二甲基甲醯胺、二甲基乙醯胺、N-甲基吡咯啶酮等。該等可分別單獨地使用,亦可以2種以上之混合溶劑之形式使用。 Examples of the organic solvent include ketone solvents such as acetone, methyl ethyl ketone, methyl isobutyl ketone, and cyclohexanone; ethyl acetate, butyl acetate, cellosolve acetate, and propylene glycol monomethyl ether. Acetate solvents such as acetate and carbitol acetate; carbitol solvents such as cellulose and butyl carbitol; aromatic hydrocarbon solvents such as toluene and xylene; dimethylformamide, dimethylformamide, etc. Ethylacetamide, N-methylpyrrolidone, etc. These may be used independently, respectively, and may be used as a mixed solvent of 2 or more types.

關於上述二羥基苯化合物(a1)與芳香族單羧酸或其酸鹵化物(a2)之反應比例,就以高產率獲得目標之活性酯化合物之方面而言,較佳為相對於上述二羥基苯化合物(a1)所具有之羥基之合計1莫耳,上述芳香族單羧酸或其酸鹵化物(a2)成為0.95~1.05莫耳的比例。 The reaction ratio of the above-mentioned dihydroxybenzene compound (a1) with the aromatic monocarboxylic acid or its acid halide (a2) is preferably a ratio relative to the above-mentioned dihydroxyl group in terms of obtaining the target active ester compound in high yield The above-mentioned aromatic monocarboxylic acid or its acid halide (a2) is in a ratio of 0.95 to 1.05 mol based on the total of 1 mol of the hydroxyl groups contained in the benzene compound (a1).

上述活性酯化合物之熔融黏度較佳為依據ASTM D4287,利用ICI黏度計所測得之於150℃之值為0.01~50dPa‧s之範圍,更佳為0.01~5dPa‧s之範圍,尤佳為0.01~0.1dPa‧s之範圍。 The melt viscosity of the above-mentioned active ester compound is preferably in the range of 0.01~50dPa·s, more preferably in the range of 0.01~5dPa·s, and particularly preferably in the range of 0.01~50dPa·s as measured by ICI viscometer at 150°C according to ASTM D4287. The range of 0.01~0.1dPa‧s.

本發明之硬化性組成物亦可將上述本發明之活性酯化合物與其他活性酯化合物一併含有。作為上述其他活性酯化合物,可列舉:於分子結構中具有1個酚性羥基之化合物與芳香族多羧酸或其酸鹵化物之酯化物;多羥基萘與芳香族單羧酸或其酸鹵化物之酯化物;於分子結構中具有1個酚性羥基之化合物、芳香族多羧酸或其酸鹵化物及於分子結構中具有2個以上之酚性羥基之化合物之酯化物;芳香族多羧酸或其酸鹵化物、於分子結構中具有2個以上之酚性羥基之化合物及芳香族單羧酸或其酸鹵化物之酯化物等。 The curable composition of the present invention may contain the above-mentioned active ester compound of the present invention together with other active ester compounds. Examples of the above-mentioned other active ester compounds include: esters of a compound having one phenolic hydroxyl group in the molecular structure and an aromatic polycarboxylic acid or its acid halide; polyhydroxynaphthalene and an aromatic monocarboxylic acid or its acid halide Esterates of compounds; esters of compounds having one phenolic hydroxyl group in the molecular structure, aromatic polycarboxylic acids or acid halides thereof, and compounds having two or more phenolic hydroxyl groups in the molecular structure; aromatic polycarboxylic acids Carboxylic acid or its acid halide, a compound having two or more phenolic hydroxyl groups in its molecular structure, an esterified product of an aromatic monocarboxylic acid or its acid halide, and the like.

於使用上述其他活性酯化合物之情形時,就充分發揮本發明所起到之效果之方面而言,本發明之活性酯化合物相對於本發明之活性酯化合物 與其他活性酯化合物之合計之比例,較佳為80質量%以上,更佳為90質量%以上。又,本發明之活性酯化合物與其他活性酯化合物之調配物之熔融黏度較佳為0.01~50dPa‧s之範圍,更佳為0.01~5dPa‧s之範圍,尤佳為0.01~0.1dPa‧s之範圍。調配物之熔融黏度係依據ASTM D4287,利用ICI黏度計所測得之於150℃之值。 In the case of using the above-mentioned other active ester compounds, the ratio of the active ester compound of the present invention to the total of the active ester compound of the present invention and the other active ester compounds in terms of fully exerting the effects of the present invention, Preferably it is 80 mass % or more, More preferably, it is 90 mass % or more. In addition, the melt viscosity of the formulation of the active ester compound of the present invention and other active ester compounds is preferably in the range of 0.01-50 dPa·s, more preferably in the range of 0.01-5 dPa·s, particularly preferably in the range of 0.01-0.1 dPa·s range. The melt viscosity of the formulation is measured at 150°C using an ICI viscometer in accordance with ASTM D4287.

本發明之硬化性組成物含有上述之活性酯化合物及硬化劑。上述硬化劑只要為可與上述活性酯化合物反應之化合物即可,並無特別限定,可應用各種化合物。作為硬化劑之一例,例如可列舉環氧樹脂。 The curable composition of the present invention contains the above-mentioned active ester compound and a curing agent. The above-mentioned curing agent is not particularly limited as long as it is a compound capable of reacting with the above-mentioned active ester compound, and various compounds can be applied. As an example of a hardening|curing agent, an epoxy resin is mentioned, for example.

上述環氧樹脂例如可列舉:苯酚酚醛清漆型環氧樹脂、甲酚酚醛清漆型環氧樹脂、萘酚酚醛清漆型環氧樹脂、雙酚酚醛清漆型環氧樹脂、聯苯酚酚醛清漆型環氧樹脂、雙酚型環氧樹脂、聯苯型環氧樹脂、三苯酚甲烷型環氧樹脂、四苯酚乙烷型環氧樹脂、二環戊二烯-苯酚加成反應型環氧樹脂、苯酚芳烷基型環氧樹脂、萘酚芳烷基型環氧樹脂等。 Examples of the above epoxy resins include phenol novolak epoxy resins, cresol novolak epoxy resins, naphthol novolak epoxy resins, bisphenol novolak epoxy resins, and biphenol novolak epoxy resins. Resin, bisphenol type epoxy resin, biphenyl type epoxy resin, triphenolmethane type epoxy resin, tetraphenolethane type epoxy resin, dicyclopentadiene-phenol addition reaction type epoxy resin, phenol aromatic Alkyl type epoxy resin, naphthol aralkyl type epoxy resin, etc.

於本發明之硬化性組成物中,上述活性酯化合物與硬化劑之調配比例並無特別限定,可視所需之硬化物性能等適當進行調整。作為將環氧樹脂用作硬化劑之情形之調配之一例,較佳為相對於硬化性組成物中之環氧基之合計1莫耳,上述活性酯化合物中之官能基之合計成為0.7~1.5莫耳的比例。 In the curable composition of the present invention, the mixing ratio of the above-mentioned active ester compound and the curing agent is not particularly limited, and may be appropriately adjusted depending on the desired properties of the cured product. As an example of preparation in the case of using an epoxy resin as a curing agent, it is preferable that the total of the functional groups in the active ester compound is 0.7 to 1.5 per mol of the total epoxy groups in the curable composition. Molar ratio.

本發明之硬化性組成物亦可進而含有其他樹脂成分。其他樹脂成分例如可列舉:二胺基二苯基甲烷、二伸乙基三胺、三伸乙基四胺、二胺基二苯基碸、異佛爾酮二胺、咪唑、BF3-胺錯合物、胍衍生物等胺化合物;二氰二胺(dicyandiamide)、由次亞麻油酸之二聚物與乙二胺合成之聚醯胺樹脂等醯胺化合物;鄰苯二甲酸酐、偏苯三甲酸酐(trimellitic anhydride)、焦蜜石酸二酐、順丁烯二酸酐、四氫鄰苯二甲酸酐、甲基四氫鄰苯二甲酸酐、甲基耐地酸酐(methylnadic acid anhydride)、六氫鄰苯二甲酸酐、甲基六氫鄰苯二甲酸 酐等酸酐;氰酸酯樹脂;雙馬來亞醯胺樹脂;苯并

Figure 107117766-A0202-12-0007-6
樹脂;苯乙烯-順丁烯二酸酐樹脂;以二烯丙基雙酚或三聚異氰酸三烯丙酯(triallyl isocyanurate)為代表之含烯丙基之樹脂;多磷酸酯或磷酸酯-碳酸酯共聚物等。該等可分別單獨地使用,亦可併用2種以上。該等其他樹脂成分之調配比例並無特別限定,可視所需之硬化物性能等適當進行調整。 The curable composition of the present invention may further contain other resin components. As other resin components, for example, diaminodiphenylmethane, diethylenetriamine, triethylenetetramine, diaminodiphenylene, isophoronediamine, imidazole, and BF3-amine zirconium can be mentioned. amine compounds such as compounds and guanidine derivatives; dicyandiamide, polyamide resins synthesized from dimers of hypolinoleic acid and ethylenediamine, and other amide compounds; phthalic anhydride, trimethylene Trimellitic anhydride, pyrometic dianhydride, maleic anhydride, tetrahydrophthalic anhydride, methyltetrahydrophthalic anhydride, methylnadic acid anhydride, hexahydrophthalic anhydride Anhydrides such as hydrogen phthalic anhydride and methylhexahydrophthalic anhydride; cyanate ester resin; bismaleimide resin; benzoic acid
Figure 107117766-A0202-12-0007-6
resin; styrene-maleic anhydride resin; allyl-containing resin represented by diallyl bisphenol or triallyl isocyanurate; polyphosphate or phosphate- carbonate copolymers, etc. These may be used independently, respectively, and may use 2 or more types together. The blending ratio of these other resin components is not particularly limited, and may be appropriately adjusted depending on the desired properties of the cured product.

本發明之硬化性組成物亦可視需要含有硬化促進劑、阻燃劑、無機質填充材、矽烷偶合劑、脫模劑、顏料、乳化劑等各種添加劑。 The curable composition of the present invention may also contain various additives such as a curing accelerator, a flame retardant, an inorganic filler, a silane coupling agent, a mold release agent, a pigment, and an emulsifier as necessary.

上述硬化促進劑例如可列舉:磷系化合物、三級胺、咪唑化合物、吡啶化合物、有機酸金屬鹽、路易斯酸、胺錯鹽等。其中,就硬化性、耐熱性、電特性、耐濕可靠性等優異之方面而言,磷系化合物中較佳為三苯基膦,三級胺中較佳為1,8-二氮雜雙環-[5.4.0]-十一烯(DBU),咪唑化合物中較佳為2-乙基-4-甲基咪唑,吡啶化合物中較佳為4-二甲胺基吡啶。 Examples of the above-mentioned curing accelerator include phosphorus-based compounds, tertiary amines, imidazole compounds, pyridine compounds, organic acid metal salts, Lewis acids, ammonium zirconium salts, and the like. Among them, among phosphorus-based compounds, triphenylphosphine is preferable, and among tertiary amines, 1,8-diazabicyclo is preferable in terms of being excellent in curability, heat resistance, electrical properties, and moisture resistance reliability. -[5.4.0]-undecene (DBU), among the imidazole compounds, 2-ethyl-4-methylimidazole is preferred, and among the pyridine compounds, 4-dimethylaminopyridine is preferred.

上述阻燃劑例如可列舉:紅磷、磷酸一銨、磷酸二銨、磷酸三銨、多磷酸銨等磷酸銨、磷醯胺等無機磷化合物;磷酸酯化合物、膦酸化合物、次膦酸(phosphinic acid)化合物、氧化膦(phosphine oxide)化合物、磷烷(phosphorane)化合物、有機系含氮磷化合物、9,10-二氫-9-氧雜-10-磷雜菲-10-氧化物、10-(2,5-二羥基苯基)-10H-9-氧雜-10-磷雜菲-10-氧化物、10-(2,7-二羥基萘基)-10H-9-氧雜-10-磷雜菲-10-氧化物等環狀有機磷化合物,及使其與環氧樹脂或酚樹脂等化合物反應所得之衍生物等有機磷化合物;三

Figure 107117766-A0202-12-0007-7
化合物、三聚氰酸(cyanuric acid)化合物、異三聚氰酸化合物、啡噻
Figure 107117766-A0202-12-0007-8
等氮系阻燃劑;聚矽氧油、聚矽氧橡膠、聚矽氧樹脂等聚矽氧系阻燃劑;金屬氫氧化物、金屬氧化物、金屬碳酸鹽化合物、金屬粉、硼化合物、低熔點玻璃等無機阻燃劑等。於使用該等阻燃劑之情形時,較佳為硬化性組成物中0.1~20質量%之範圍。 Examples of the flame retardant include: red phosphorus, ammonium phosphates such as monoammonium phosphate, diammonium phosphate, triammonium phosphate, and ammonium polyphosphate; inorganic phosphorus compounds such as phosphamide; phosphate ester compounds, phosphonic acid compounds, phosphinic acid ( phosphinic acid) compound, phosphine oxide (phosphine oxide) compound, phosphine (phosphorane) compound, organic nitrogen-containing phosphorus compound, 9,10-dihydro-9-oxa-10-phosphaphenanthrene-10-oxide, 10-(2,5-Dihydroxyphenyl)-10H-9-oxa-10-phosphaphenanthrene-10-oxide, 10-(2,7-dihydroxynaphthyl)-10H-9-oxa - Cyclic organophosphorus compounds such as 10-phosphaphenanthrene-10-oxide, and organophosphorus compounds such as derivatives obtained by reacting them with compounds such as epoxy resins or phenol resins; III
Figure 107117766-A0202-12-0007-7
Compounds, cyanuric acid compounds, isocyanuric acid compounds, phenothia
Figure 107117766-A0202-12-0007-8
Nitrogen-based flame retardants; polysiloxane-based flame retardants such as polysiloxane oil, polysiloxane rubber, and polysiloxane resin; metal hydroxides, metal oxides, metal carbonate compounds, metal powders, boron compounds, Inorganic flame retardants such as low melting point glass, etc. When these flame retardants are used, the range of 0.1 to 20 mass % in the curable composition is preferable.

上述無機質填充材係例如於將本發明之硬化性組成物用於半導體密封材料用途之情形時等進行調配。上述無機質填充材例如可列舉:熔融二氧化矽、結晶二氧化矽、氧化鋁、氮化矽、氫氧化鋁等。其中,就能夠更多地調配無機質填充材之方面而言,較佳為上述熔融二氧化矽。上述熔融二氧化矽可使用破碎狀、球狀之任一種,為了提高熔融二氧化矽之調配量,且抑制硬化性組成物之熔融黏度之上升,較佳為主要使用球狀者。為了進一步提高球狀二氧化矽之調配量,較佳適當地調整球狀二氧化矽之粒度分佈。其填充率較佳為以硬化性組成物100質量份中0.5~95質量份之範圍進行調配。 The above-mentioned inorganic filler is prepared, for example, when the curable composition of the present invention is used for a semiconductor sealing material. Examples of the above-mentioned inorganic filler include fused silica, crystalline silica, alumina, silicon nitride, aluminum hydroxide, and the like. Among them, the above-mentioned fused silica is preferable in terms of being able to mix more inorganic fillers. The above-mentioned fused silica can be either crushed or spherical. In order to increase the amount of fused silica to be blended and suppress the increase in the melt viscosity of the curable composition, spherical ones are preferably used. In order to further increase the compounding amount of spherical silica, it is better to appropriately adjust the particle size distribution of spherical silica. The filling rate is preferably prepared in the range of 0.5 to 95 parts by mass in 100 parts by mass of the curable composition.

此外,於將本發明之硬化性組成物用於導電膏等用途之情形時,可使用銀粉或銅粉等導電性填充劑。 Furthermore, when the curable composition of the present invention is used for applications such as conductive pastes, conductive fillers such as silver powder or copper powder can be used.

如以上所詳細說明,本發明之活性酯化合物及含有其之硬化性組成物具有硬化物於高溫條件下之彈性模數低之特徵。此外,對樹脂材料所要求之其他一般要求性能亦充分高,如向通用有機溶劑之溶解性、或耐熱性、耐吸水性、低硬化收縮性、介電特性等亦優異且熔融黏度低等。因此,除印刷配線基板或半導體密封材料、抗蝕劑材料等電子材料用途以外,亦可廣泛地應用於塗料或接著劑、成型品等用途。 As described above in detail, the active ester compound of the present invention and the curable composition containing the same are characterized in that the cured product has a low modulus of elasticity under high temperature conditions. In addition, other general requirements required for resin materials are also sufficiently high, such as solubility in general-purpose organic solvents, or heat resistance, water absorption resistance, low curing shrinkage, dielectric properties, etc. Excellent and low melt viscosity. Therefore, in addition to printed wiring boards, semiconductor sealing materials, resist materials, and other electronic material applications, it can be widely used in applications such as paints, adhesives, and molded articles.

於將本發明之硬化性組成物用於印刷配線基板用途或增層接著膜用途之情形時,一般較佳為調配有機溶劑並進行稀釋而使用。上述有機溶劑可列舉:甲基乙基酮、丙酮、二甲基甲醯胺、甲基異丁基酮、甲氧基丙醇、環己酮、甲基賽璐蘇、乙基二乙二醇乙酸酯、丙二醇一甲醚乙酸酯等。有機溶劑之種類或調配量可視硬化性組成物之使用環境而適當調整,例如於印刷配線板用途中,較佳為甲基乙基酮、丙酮、二甲基甲醯胺等沸點為160℃以下之極性溶劑,較佳為以非揮發分成為40~80質量%之比例使用。於增層接著膜用途中,較佳為使用丙酮、甲基乙基酮、環己酮等酮溶劑;乙酸乙酯、乙酸丁酯、乙酸 賽璐蘇、丙二醇一甲醚乙酸酯、卡必醇乙酸酯等乙酸酯溶劑;賽璐蘇、丁基卡必醇等卡必醇溶劑;甲苯、二甲苯等芳香族烴溶劑;二甲基甲醯胺、二甲基乙醯胺、N-甲基吡咯啶酮等,較佳為以非揮發分成為30~60質量%之比例使用。 When the curable composition of the present invention is used for a printed wiring board application or a build-up adhesive film application, it is generally preferable to prepare and dilute an organic solvent for use. The above-mentioned organic solvent includes methyl ethyl ketone, acetone, dimethylformamide, methyl isobutyl ketone, methoxypropanol, cyclohexanone, methyl cellulose, ethyl diethylene glycol Acetate, propylene glycol monomethyl ether acetate, etc. The type or compounding amount of the organic solvent can be appropriately adjusted depending on the use environment of the curable composition. For example, in the application of printed wiring boards, methyl ethyl ketone, acetone, dimethylformamide, etc., preferably have a boiling point below 160°C The polar solvent is preferably used in a proportion of 40 to 80% by mass of nonvolatile content. In the application of build-up adhesive film, it is preferable to use ketone solvents such as acetone, methyl ethyl ketone, cyclohexanone; ethyl acetate, butyl acetate, cellulose acetate, propylene glycol monomethyl ether acetate, carbitol Acetate solvents such as alcohol acetate; carbitol solvents such as cellulose and butyl carbitol; aromatic hydrocarbon solvents such as toluene and xylene; dimethylformamide, dimethylacetamide, N - Methylpyrrolidone etc., it is preferable to use it in the ratio which becomes 30-60 mass % of nonvolatile content.

又,使用本發明之硬化性組成物製造印刷配線基板之方法例如可列舉如下方法:將硬化性組成物含浸於補強基材中,使之硬化而獲得預浸體,將其與銅箔重疊,進行加熱壓接。上述補強基材可列舉:紙、玻璃布、玻璃不織布、聚芳醯胺(aramid)紙、聚芳醯胺布、玻璃氈、玻璃粗紗布等。硬化性組成物之含浸量並無特別限定,通常較佳以預浸體中之樹脂成分成為20~60質量%之方式進行製備。 Moreover, the method of manufacturing a printed wiring board using the curable composition of the present invention includes, for example, a method of impregnating a reinforcing base material with the curable composition, curing it to obtain a prepreg, and stacking it with a copper foil, Perform heat crimping. Examples of the reinforcing base material include paper, glass cloth, glass nonwoven fabric, aramid paper, aramid cloth, glass mat, glass roving, and the like. The impregnation amount of the curable composition is not particularly limited, but it is usually preferably prepared so that the resin component in the prepreg is 20 to 60 mass %.

於將本發明之硬化性組成物用於半導體密封材料用途之情形時,一般較佳為調配無機質填充材。半導體密封材料例如可使用擠出機、捏合機、輥等將調配物進行混合而製備。關於使用所獲得之半導體密封材料將半導體封裝進行成型之方法,例如可列舉:使用澆鑄成型或轉移成形機、射出成型機等將該半導體密封材料進行成形,進而於50~200℃之溫度條件下進行2~10小時加熱之方法,藉由此種方法,可獲得作為成形物之半導體裝置。 When the curable composition of the present invention is used for a semiconductor sealing material, it is generally preferable to prepare an inorganic filler. The semiconductor sealing material can be prepared by mixing the formulation using, for example, an extruder, a kneader, a roll, or the like. As a method of molding a semiconductor package using the obtained semiconductor sealing material, for example, the semiconductor sealing material is molded using a casting molding, a transfer molding machine, an injection molding machine, etc., and the semiconductor sealing material is further formed at a temperature of 50 to 200° C. A method of heating for 2 to 10 hours, and by this method, a semiconductor device as a molded product can be obtained.

[實施例] [Example]

繼而,藉由實施例、比較例對本發明具體地進行說明。實施例中之「份」及「%」之記載只要無特別說明,則為質量基準。 Next, the present invention will be specifically described with reference to Examples and Comparative Examples. The descriptions of "parts" and "%" in the examples are the quality standards unless otherwise specified.

◆熔融黏度測定法 ◆Melt viscosity measurement method

於本案實施例中,活性酯化合物之熔融黏度係依據ASTM D4287,利用ICI黏度計測定150℃之熔融黏度所得。 In the examples of this case, the melt viscosity of the active ester compound is obtained by measuring the melt viscosity at 150°C with an ICI viscometer according to ASTM D4287.

實施例1 活性酯化合物(1)之製造 Example 1 Production of active ester compound (1)

於安裝有溫度計、滴液漏斗、冷凝管、分餾管、攪拌器之燒瓶中添加間苯二酚110g及甲基異丁基酮1000g,一面對系統內於減壓下進行氮氣置換一面進 行溶解。繼而,添加苯甲醯氯218g,一面對系統內於減壓下進行氮氣置換一面進行溶解。添加四丁基溴化銨0.5g,一面吹送氮氣,一面將系統內控制為60℃以下,歷時3小時滴加20%氫氧化鈉水溶液420g。滴加結束後,直接繼續攪拌1小時進行反應。反應結束後,靜置反應混合物,進行分液,去除水層。於殘留之有機層中添加水,進行約15分鐘攪拌混合後,靜置混合物,進行分液,去除水層。將該操作反覆進行至水層之pH值成為7後,利用傾析器脫水將水分及甲苯去除,獲得活性酯化合物(1)。活性酯化合物(1)之熔融黏度為0.02dPa‧s。 Add 110 g of resorcinol and 1000 g of methyl isobutyl ketone to a flask equipped with a thermometer, dropping funnel, condenser tube, fractionation tube, and stirrer, and dissolve the system while replacing it with nitrogen under reduced pressure. . Next, 218 g of benzyl chloride was added, and the inside of the system was substituted with nitrogen under reduced pressure and dissolved. 0.5 g of tetrabutylammonium bromide was added, and while blowing nitrogen, the system was controlled to be below 60°C, and 420 g of a 20% aqueous sodium hydroxide solution was added dropwise over 3 hours. After the dropwise addition, the stirring was continued for 1 hour and the reaction was carried out. After the completion of the reaction, the reaction mixture was left to stand for liquid separation, and the aqueous layer was removed. Water was added to the remaining organic layer, and after stirring and mixing for about 15 minutes, the mixture was left to stand for liquid separation, and the aqueous layer was removed. After repeating this operation until the pH value of the water layer became 7, the water and toluene were removed by dehydration with a decanter to obtain an active ester compound (1). The melt viscosity of the active ester compound (1) was 0.02 dPa·s.

實施例2 活性酯化合物(2)之製造 Example 2 Production of active ester compound (2)

於安裝有溫度計、滴液漏斗、冷凝管、分餾管、攪拌器之燒瓶中添加鄰苯二酚110g及甲基異丁基酮1000g,一面對系統內於減壓下進行氮氣置換一面進行溶解。繼而添加苯甲醯氯218g,一面對系統內於減壓下進行氮氣置換一面進行溶解。添加四丁基溴化銨0.5g,一面吹送氮氣,一面將系統內控制為60℃以下,歷時3小時滴加20%氫氧化鈉水溶液420g。滴加結束後,直接繼續攪拌1小時進行反應。反應結束後,靜置反應混合物,進行分液,去除水層。於殘留之有機層中添加水,進行約15分鐘攪拌混合後,靜置混合物,進行分液,去除水層。將該操作反覆進行至水層之pH值成為7後,利用傾析器脫水將水分及甲苯去除,獲得活性酯化合物(2)。活性酯化合物(2)之熔融黏度為0.02dPa‧s。 Add 110 g of catechol and 1000 g of methyl isobutyl ketone to a flask equipped with a thermometer, dropping funnel, condenser tube, fractionation tube, and stirrer, and dissolve the system while replacing it with nitrogen under reduced pressure. . Next, 218 g of benzyl chloride was added, and the system was dissolved while purging the system with nitrogen under reduced pressure. 0.5 g of tetrabutylammonium bromide was added, and while blowing nitrogen, the system was controlled to be below 60°C, and 420 g of a 20% aqueous sodium hydroxide solution was added dropwise over 3 hours. After the dropwise addition, the stirring was continued for 1 hour and the reaction was carried out. After the completion of the reaction, the reaction mixture was left to stand for liquid separation, and the aqueous layer was removed. Water was added to the remaining organic layer, and after stirring and mixing for about 15 minutes, the mixture was left to stand for liquid separation, and the aqueous layer was removed. After repeating this operation until the pH value of the water layer became 7, the water and toluene were removed by dehydration with a decanter, and an active ester compound (2) was obtained. The melt viscosity of the active ester compound (2) was 0.02 dPa·s.

實施例3 活性酯化合物(3)之製造 Example 3 Production of active ester compound (3)

於安裝有溫度計、滴液漏斗、冷凝管、分餾管、攪拌器之燒瓶中添加第三丁基鄰苯二酚166g及甲基異丁基酮1100g,一面對系統內於減壓下進行氮氣置換一面進行溶解。繼而添加苯甲醯氯218g,一面對系統內於減壓下進行氮氣置換一面進行溶解。添加四丁基溴化銨0.6g,一面吹送氮氣,一面將系統內控制 為60℃以下,歷時3小時滴加20%氫氧化鈉水溶液420g。滴加結束後,直接繼續攪拌1小時進行反應。反應結束後,靜置反應混合物,進行分液,去除水層。於殘留之有機層中添加水,進行約15分鐘攪拌混合後,靜置混合物,進行分液,去除水層。將該操作反覆進行至水層之pH值成為7後,利用傾析器脫水將水分及甲苯去除,獲得活性酯化合物(3)。活性酯化合物(3)之熔融黏度為0.02dPa‧s。 Add 166 g of tertiary butyl catechol and 1100 g of methyl isobutyl ketone to a flask equipped with a thermometer, dropping funnel, condenser tube, fractionation tube, and stirrer, and conduct nitrogen gas under reduced pressure in the system. Displace one side to dissolve. Next, 218 g of benzyl chloride was added, and the system was dissolved while purging the system with nitrogen under reduced pressure. 0.6 g of tetrabutylammonium bromide was added, and while blowing nitrogen gas, the system was controlled to be below 60°C, and 420 g of a 20% aqueous sodium hydroxide solution was added dropwise over 3 hours. After the dropwise addition, the stirring was continued for 1 hour and the reaction was carried out. After the completion of the reaction, the reaction mixture was left to stand for liquid separation, and the aqueous layer was removed. Water was added to the remaining organic layer, and after stirring and mixing for about 15 minutes, the mixture was left to stand for liquid separation, and the aqueous layer was removed. After repeating this operation until the pH value of the water layer became 7, water and toluene were removed by dehydration with a decanter, and an active ester compound (3) was obtained. The melt viscosity of the active ester compound (3) was 0.02 dPa·s.

比較製造例1 活性酯化合物(1')之製造 Comparative Production Example 1 Production of Active Ester Compound (1')

於安裝有溫度計、滴液漏斗、冷凝管、分餾管、攪拌器之燒瓶中添加間苯二甲醯氯202g及甲苯1250g,一面對系統內於減壓下進行氮氣置換一面進行溶解。繼而,添加1-萘酚288g,一面對系統內於減壓下進行氮氣置換一面進行溶解。添加四丁基溴化銨0.6g,一面吹送氮氣,一面將系統內控制為60℃以下,歷時3小時滴加20%氫氧化鈉水溶液420g。滴加結束後,直接繼續攪拌1小時進行反應。反應結束後,靜置反應混合物,進行分液,去除水層。於殘留之有機層中添加水,進行約15分鐘攪拌混合後,靜置混合物,進行分液,去除水層。將該操作反覆進行至水層之pH值成為7後,利用傾析器脫水將水分及甲苯去除,獲得活性酯化合物(1')。活性酯化合物(1')之熔融黏度為0.65dPa‧s。 202 g of isophthalic chloride and 1250 g of toluene were added to a flask equipped with a thermometer, dropping funnel, condenser, fractionation tube, and agitator, and dissolved while displacing the system with nitrogen under reduced pressure. Next, 288 g of 1-naphthol was added, and it melt|dissolved while nitrogen-substituting the inside of the system under reduced pressure. 0.6 g of tetrabutylammonium bromide was added, and while blowing nitrogen, the system was controlled to be below 60° C., and 420 g of a 20% aqueous sodium hydroxide solution was added dropwise over 3 hours. After the dropwise addition, the stirring was continued for 1 hour and the reaction was carried out. After the completion of the reaction, the reaction mixture was left to stand for liquid separation, and the aqueous layer was removed. Water was added to the remaining organic layer, and after stirring and mixing for about 15 minutes, the mixture was left to stand for liquid separation, and the aqueous layer was removed. After repeating this operation until the pH value of the water layer became 7, water and toluene were removed by dehydration with a decanter, and an active ester compound (1') was obtained. The melt viscosity of the active ester compound (1') was 0.65 dPa·s.

實施例4~6及比較例1 Examples 4 to 6 and Comparative Example 1

以下述表1所示之比例調配各成分以製造硬化性組成物。使硬化性組成物流入至模框中,使用壓製機,於175℃之溫度下進行10分鐘成型。自模框中取出成型物,於175℃之溫度下使之硬化5小時而獲得硬化物。對於硬化物,以下述要領進行評價試驗。將結果示於表1。 Each component was blended in the ratio shown in the following Table 1 to manufacture a curable composition. The curable composition was poured into a mold frame, and molding was performed at a temperature of 175° C. for 10 minutes using a press. The molded product was taken out from the mold frame and hardened at a temperature of 175° C. for 5 hours to obtain a hardened product. About the hardened|cured material, the evaluation test was performed by the following method. The results are shown in Table 1.

高溫條件下之儲存彈性模數之測定 Determination of storage elastic modulus at high temperature

自上述硬化物切出5mm×54mm×2.4mm尺寸之試片。針對試片,使用黏彈性測定裝置(Rheometric公司製造之「固體黏彈性測定裝置RSAII」),於矩形 張力法、頻率1Hz、升溫溫度3℃/分鐘之條件測定260℃之儲存彈性模數。 A test piece having a size of 5 mm×54 mm×2.4 mm was cut out from the above-mentioned cured product. For the test piece, a viscoelasticity measuring device (“solid viscoelasticity measuring device RSAII” manufactured by Rheometric Corporation) was used to measure the storage elastic modulus at 260°C under the conditions of a rectangular tension method, a frequency of 1 Hz, and a heating temperature of 3°C/min.

高溫條件下之彎曲彈性模數及彎曲應變之測定 Determination of Flexural Modulus of Elasticity and Flexural Strain at High Temperature

自上述硬化物切出25mm×70mm×2.4mm尺寸之試片。針對試片,使用萬能材料試驗機(英斯特朗公司製造之「5582型」),於試驗速度1.0mm/分鐘、試驗溫度260℃之條件下測定彎曲彈性模數及彎曲應變。 A test piece having a size of 25 mm×70 mm×2.4 mm was cut out from the above-mentioned cured product. With respect to the test piece, the flexural modulus of elasticity and flexural strain were measured under the conditions of a test speed of 1.0 mm/min and a test temperature of 260° C. using a universal testing machine (“Model 5582” manufactured by Instron Corporation).

Figure 107117766-A0202-12-0012-5
Figure 107117766-A0202-12-0012-5

環氧樹脂(*1):甲酚酚醛清漆型環氧樹脂(DIC股份有限公司製造之「N-655-EXP-S」,環氧當量202g/當量) Epoxy resin (*1): cresol novolak type epoxy resin (“N-655-EXP-S” manufactured by DIC Co., Ltd., epoxy equivalent 202 g/equivalent)

Claims (4)

一種硬化性組成物,其含有活性酯化合物及硬化劑,該活性酯化合物係二羥基苯化合物(a1)與芳香族單羧酸或其酸鹵化物(acid halide)(a2)之酯化物,該二羥基苯化合物(a1)為1,2-二羥基苯化合物或1,3-二羥基苯化合物,且該活性酯化合物具有下述結構式(1-1)或(1-2)所表示之分子結構,
Figure 107117766-A0305-02-0014-1
(式中,R1分別獨立地為脂肪族烴基、烷氧基、鹵素原子、芳基、芳烷基之任一者,可鍵結於形成苯環之任一碳原子;R2分別獨立地為脂肪族烴基、烷氧基、鹵素原子、芳基、芳烷基之任一者,可鍵結於形成苯環之任一碳原子;m為0或1~4之整數,n為0或1~5之整數)。
A curable composition comprising an active ester compound and a curing agent, the active ester compound being an ester compound of a dihydroxybenzene compound (a1) and an aromatic monocarboxylic acid or its acid halide (a2), the The dihydroxybenzene compound (a1) is a 1,2-dihydroxybenzene compound or a 1,3-dihydroxybenzene compound, and the active ester compound is represented by the following structural formula (1-1) or (1-2) Molecular Structure,
Figure 107117766-A0305-02-0014-1
(in the formula, R 1 are each independently any one of aliphatic hydrocarbon group, alkoxy group, halogen atom, aryl group, aralkyl group, and can be bonded to any carbon atom forming a benzene ring; R 2 are each independently It is any one of aliphatic hydrocarbon group, alkoxy group, halogen atom, aryl group and aralkyl group, and can be bonded to any carbon atom forming a benzene ring; m is 0 or an integer from 1 to 4, and n is 0 or an integer from 1 to 5).
一種硬化物,其係請求項1所述之硬化性組成物的硬化物。 A cured product of the curable composition of claim 1. 一種半導體密封材料,其係使用請求項1所述之硬化性組成物而成。 A semiconductor sealing material using the curable composition of claim 1. 一種印刷配線基板,其係使用請求項1所述之硬化性組成物而成。 A printed wiring board using the curable composition of claim 1.
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