TWI764434B

TWI764434B - Physical parameter generator

Info

Publication number: TWI764434B
Application number: TW109144141A
Authority: TW
Inventors: 陳志嘉
Original assignee: 致新科技股份有限公司
Priority date: 2020-12-14
Filing date: 2020-12-14
Publication date: 2022-05-11
Also published as: TW202223344A

Abstract

A physical parameter generator is configured to generate physical parameter information. The physical parameter generator comprises a physical parameter unit, a current source, and a function pin. The physical parameter unit is coupled to the current source for generating an output signal, where the output signal is related to the physical parameter information. The current source is coupled to the function pin for outputting the physical parameter information. When the function pin is in a floating state, the physical parameter generator may generate the physical parameter information by the function pin.

Description

physical parameter generator

本發明係關於一種物理參數產生器，特別是關於一種可藉由一功能腳位以產生一物理參數資訊之物理參數產生器。 The present invention relates to a physical parameter generator, in particular to a physical parameter generator capable of generating a physical parameter information through a function pin.

隨著電子工程技術的發展，複雜的電路可被整合成一積體電路(Integrated Circuit)。為了能在有限的電路板空間內配置更多的積體電路，積體電路設計者常被要求於有限的腳位數量下產生所需之功能。一般來說，使用者可藉由擷取物理參數資訊以精確地控制電子裝置之特性與功能。然而，這表示需要於積體電路中增加額外的腳位以輸出物理參數資訊。由於腳位數量會影響封裝成本，在節省成本前提下會盡量減少腳位數量以提升產品之競爭力。因此，如何善用現有腳位以獲得所需之物理參數資訊，實為目前所需解決之重要課題。 With the development of electronic engineering technology, complex circuits can be integrated into an integrated circuit (Integrated Circuit). In order to be able to configure more integrated circuits in limited circuit board space, integrated circuit designers are often required to produce the required functions with a limited number of pins. Generally, users can precisely control the characteristics and functions of electronic devices by capturing physical parameter information. However, this means that additional pins need to be added to the IC to output physical parameter information. Since the number of pins will affect the packaging cost, the number of pins will be reduced as much as possible to improve the competitiveness of the product under the premise of saving costs. Therefore, how to make good use of the existing pins to obtain the required physical parameter information is an important issue to be solved at present.

有鑑於前述問題，本發明之目的在於提供一種可藉由一功能腳位以產生一物理參數資訊之物理參數產生器。 In view of the aforementioned problems, an object of the present invention is to provide a physical parameter generator that can generate a physical parameter information through a function pin.

依據本發明提供該物理參數產生器。該物理參數產生器可為一積體電路之一部分。該物理參數產生器具有一物理參數單元、一電流源、以及該功能腳位。該物理參數單元耦合至該電流源，用以產生一輸出信號，其中該輸出信號相關於該物理參數資訊。該電流源耦合至該功能腳位，用以輸出該物理參數資訊。當該功能腳位處於一浮接狀態時，該物理參數產生器可藉由該功能腳位以產生該物理參數資訊。當該功能腳位於一正常模式下執行一功能時，該物理參數產生器可藉由該功能腳位同時輸出該物理參數資訊。該物理參數資訊可相關於一溫度、一加速度、一轉速、或一壓力。設計者可根據不同的應用以設計該物理參數單元，進而獲得所需之物理參數資訊。 The physical parameter generator is provided according to the present invention. The physical parameter generator may be part of an integrated circuit. The physical parameter generator has a physical parameter unit, a current source, and the function pin. The physical parameter unit is coupled to the current source for generating an output signal, wherein the output The signal is related to the physical parameter information. The current source is coupled to the function pin for outputting the physical parameter information. When the function pin is in a floating state, the physical parameter generator can generate the physical parameter information through the function pin. When the function pin is in a normal mode to perform a function, the physical parameter generator can simultaneously output the physical parameter information through the function pin. The physical parameter information can be related to a temperature, an acceleration, a rotational speed, or a pressure. The designer can design the physical parameter unit according to different applications, and then obtain the required physical parameter information.

該物理參數單元具有一雙載子電晶體與一放大電路。該雙載子電晶體具有一射極、一基極、以及一集極。該雙載子電晶體之集極耦合至一電壓源。該雙載子電晶體之基極耦合至該放大電路。該雙載子電晶體之射極耦合至一地面電位。該放大電路耦合至該雙載子電晶體，用以產生該輸出信號。舉例來說，當該放大電路之放大倍率為10時，由於基極與射極之電壓差會以約2mV/℃之因數而隨溫度變化，因而該輸出信號會以約20mV/℃之因數而隨溫度變化。 The physical parameter unit has a bipolar transistor and an amplifying circuit. The bipolar transistor has an emitter, a base, and a collector. The collector of the bipolar transistor is coupled to a voltage source. The base of the bipolar transistor is coupled to the amplifier circuit. The emitter of the bipolar transistor is coupled to a ground potential. The amplifying circuit is coupled to the bipolar transistor for generating the output signal. For example, when the magnification of the amplifier circuit is 10, since the voltage difference between the base and the emitter varies with temperature by a factor of about 2mV/°C, the output signal will vary by a factor of about 20mV/°C. varies with temperature.

當該功能腳位為一致能腳位且該致能腳位處於一浮接狀態時，該致能腳位會被該電流源拉高至該輸出信號之位準。此時該積體電路會被啟動且同時可藉由量測該致能腳位之電壓以獲得一溫度資訊。當該功能腳位為該致能腳位且該致能腳位被拉低至一低位準時，該積體電路會被關閉。因此，該致能腳位可於執行一致能功能時，同時提供所需之溫度資訊。 When the function pin is an enable pin and the enable pin is in a floating state, the enable pin is pulled up to the level of the output signal by the current source. At this time, the integrated circuit is activated and at the same time, a temperature information can be obtained by measuring the voltage of the enable pin. When the function pin is the enable pin and the enable pin is pulled down to a low level, the integrated circuit is turned off. Therefore, the enabling pin can simultaneously provide the required temperature information when performing an enabling function.

本發明的優點在於不需增加額外腳位的情形下而能實現藉由該功能腳位以產生該物理參數資訊。此外，該積體電路於輸出該物理參數資訊時並非處於一測試模式，如此可避免誤入該測試模式而造成該積體電路之功能錯誤。當該功能腳位處於一浮接狀態時，該物理參數產生器可藉由該功能腳位以產生該物理參數資訊。當該功能腳位於一正常模式下執行一功能時，該物理參數產生器可藉由該功能腳位同時輸出該物理參數資訊。該物理參數資訊可相關於一溫度、一加速度、一轉速、或一壓力。 The advantage of the present invention is that the physical parameter information can be generated by the function pin without adding additional pins. In addition, the integrated circuit is not in a test mode when outputting the physical parameter information, so as to avoid the function error of the integrated circuit caused by mistakenly entering the test mode. When the function pin is in a floating state, the physical parameter generator can generate the physical parameter information through the function pin. When the function pin is in a normal mode to perform a function, the physical parameter generator can simultaneously output the physical parameter information through the function pin. The physical parameter information may be related to a temperature, an acceleration, a rotational speed, or a pressure.

10:物理參數產生器 10: Physical parameter generator

100:物理參數單元 100: Physical parameter unit

Vo:輸出信號 Vo: output signal

CS:電流源 CS: Current Source

FUN:功能腳位 FUN: function pin

VCC:電壓源 VCC: voltage source

GND:地面電位 GND: ground potential

110:雙載子電晶體 110: two-carrier transistor

120:放大電路 120: Amplifier circuit

第1圖係本發明一實施例之物理參數產生器之示意圖。 FIG. 1 is a schematic diagram of a physical parameter generator according to an embodiment of the present invention.

第2圖係本發明一實施例之物理參數單元之示意圖。 FIG. 2 is a schematic diagram of a physical parameter unit according to an embodiment of the present invention.

下文中之說明將使本發明之目的、特徵、與優點更明顯。茲將參考圖式詳細說明依據本發明之較佳實施例。 The objects, features, and advantages of the present invention will become more apparent from the following description. Hereinafter, preferred embodiments according to the present invention will be described in detail with reference to the accompanying drawings.

第1圖係本發明一實施例之物理參數產生器10之示意圖。物理參數產生器10可為一積體電路之一部分。物理參數產生器10具有一物理參數單元100、一電流源CS、以及一功能腳位FUN，其中物理參數產生器10藉由功能腳位FUN以產生一物理參數資訊。物理參數單元100耦合至電流源CS，用以產生一輸出信號Vo，其中輸出信號Vo相關於物理參數資訊。電流源CS耦合至功能腳位FUN，用以輸出物理參數資訊。當功能腳位FUN處於一浮接狀態時，物理參數產生器10可藉由功能腳位FUN以產生物理參數資訊。當功能腳位FUN於一正常模式下執行一功能時，物理參數產生器10可藉由功能腳位FUN同時輸出物理參數資訊。物理參數資訊可相關於一溫度、一加速度、一轉速、或一壓力。設計者可根據不同的應用以設計物理參數單元100，進而獲得所需之物理參數資訊。 FIG. 1 is a schematic diagram of a physical parameter generator 10 according to an embodiment of the present invention. The physical parameter generator 10 may be part of an integrated circuit. The physical parameter generator 10 has a physical parameter unit 100, a current source CS, and a function pin FUN, wherein the physical parameter generator 10 generates a physical parameter information through the function pin FUN. The physical parameter unit 100 is coupled to the current source CS for generating an output signal Vo, wherein the output signal Vo is related to the physical parameter information. The current source CS is coupled to the function pin FUN for outputting physical parameter information. When the function pin FUN is in a floating state, the physical parameter generator 10 can generate physical parameter information through the function pin FUN. When the function pin FUN performs a function in a normal mode, the physical parameter generator 10 can simultaneously output physical parameter information through the function pin FUN. Physical parameter information can be related to a temperature, an acceleration, a rotational speed, or a pressure. The designer can design the physical parameter unit 100 according to different applications, and then obtain the required physical parameter information.

根據本發明之一實施例，功能腳位FUN可為一致能腳位而物理參數單元100可為一溫度感測器。第2圖係本發明一實施例之物理參數單元100之示意圖。物理參數單元100具有一雙載子電晶體110與一放大電路120。雙載子電晶體110具有一射極、一基極、以及一集極。雙載子電晶體131之集極耦合至一電壓源VCC。雙載子電晶體110之基極耦合至放大電路120。雙載子電晶體131之射極耦合至一地面電位GND。放大電路120耦合至雙載子電晶體110，用以產生輸出信號Vo。舉例來說，當放大電路120之放大倍率為10時，由於基極與射極之電壓差會以約2mV/℃之因數而隨溫度變化，因而輸出信號Vo會以約20mV/℃之因數而隨溫度變化。如第2圖所示，雙載子電晶體110可為一NPN型雙載子電晶體。此外，輸出信號Vo相關於一物理參數資訊，例如溫度。 According to an embodiment of the present invention, the functional pin FUN can be a functional pin and the physical parameter unit 100 can be a temperature sensor. FIG. 2 is a schematic diagram of a physical parameter unit 100 according to an embodiment of the present invention. The physical parameter unit 100 has a bipolar transistor 110 and an amplifier circuit 120 . The bipolar transistor 110 has an emitter, a base, and a collector. The collector of bipolar transistor 131 is coupled to a voltage source VCC. The base of bipolar transistor 110 is coupled to amplifier circuit 120 . Emitter of bipolar transistor 131 Coupled to a ground potential GND. The amplifier circuit 120 is coupled to the bipolar transistor 110 for generating the output signal Vo. For example, when the magnification of the amplifying circuit 120 is 10, since the voltage difference between the base and the emitter varies with temperature by a factor of about 2mV/°C, the output signal Vo will vary by a factor of about 20mV/°C. varies with temperature. As shown in FIG. 2, the bipolar transistor 110 may be an NPN bipolar transistor. In addition, the output signal Vo is related to a physical parameter information, such as temperature.

請同時參照第1圖與第2圖。當功能腳位FUN為致能腳位且致能腳位處於一浮接狀態時，致能腳位會被電流源CS拉高至輸出信號Vo之位準。此時積體電路會被啟動且同時可藉由量測致能腳位之電壓以獲得溫度資訊。當功能腳位FUN為致能腳位且致能腳位被拉低至一低位準時，積體電路會被關閉。因此，致能腳位可於執行一致能功能時，同時提供所需之溫度資訊。由於大部分之積體電路會設置一致能腳位，因此致能腳位被選擇拿來舉例說明。 Please refer to Figure 1 and Figure 2 at the same time. When the function pin FUN is an enable pin and the enable pin is in a floating state, the enable pin is pulled up to the level of the output signal Vo by the current source CS. At this time, the integrated circuit will be activated and at the same time, the temperature information can be obtained by measuring the voltage of the enable pin. When the function pin FUN is an enable pin and the enable pin is pulled down to a low level, the integrated circuit will be turned off. Therefore, the enabling pin can simultaneously provide the required temperature information when performing an enabling function. Since most of the integrated circuits have a single enable pin, the enable pin is chosen as an example.

本發明一實施例之優點在於不需增加額外腳位的情形下而能實現藉由功能腳位FUN以產生物理參數資訊。此外，積體電路於輸出物理參數資訊時並非處於一測試模式，如此可避免誤入測試模式而造成積體電路之功能錯誤。當功能腳位FUN處於一浮接狀態時，物理參數產生器10可藉由功能腳位FUN以產生物理參數資訊。當功能腳位FUN於一正常模式下執行一功能時，物理參數產生器10可藉由功能腳位FUN同時輸出物理參數資訊。物理參數資訊可相關於一溫度、一加速度、一轉速、或一壓力。設計者可根據不同的應用以設計物理參數單元100，進而獲得所需之物理參數資訊。 The advantage of an embodiment of the present invention is that the function pin FUN can be used to generate physical parameter information without adding additional pins. In addition, the integrated circuit is not in a test mode when outputting the physical parameter information, so as to avoid the function error of the integrated circuit caused by mistakenly entering the test mode. When the function pin FUN is in a floating state, the physical parameter generator 10 can generate physical parameter information through the function pin FUN. When the function pin FUN performs a function in a normal mode, the physical parameter generator 10 can simultaneously output physical parameter information through the function pin FUN. Physical parameter information can be related to a temperature, an acceleration, a rotational speed, or a pressure. The designer can design the physical parameter unit 100 according to different applications, and then obtain the required physical parameter information.

以上所述僅為本發明之較佳實施例，凡依本發明申請專利範圍所做之均等變化與修飾，皆應屬本發明之涵蓋範圍。 The above descriptions are only preferred embodiments of the present invention, and all equivalent changes and modifications made according to the scope of the patent application of the present invention shall fall within the scope of the present invention.

10:物理參數產生器 10: Physical parameter generator

100:物理參數單元 100: Physical parameter unit

Vo:輸出信號 Vo: output signal

CS:電流源 CS: Current Source

FUN:功能腳位 FUN: function pin

Claims

A physical parameter generator for generating physical parameter information, the physical parameter generator comprising: a functional pin; a current source coupled to the functional pin to output the physical parameter information; and a physical parameter unit coupled to to the current source to generate an output signal, wherein the output signal is related to the physical parameter information, when the function pin is in a floating state, the physical parameter generator generates the physical parameter information through the function pin .

The physical parameter generator as described in claim 1, wherein the physical parameter information is related to a temperature.

The physical parameter generator as described in claim 1, wherein when the function pin performs a function, the physical parameter generator simultaneously outputs the physical parameter information through the function pin.

The physical parameter generator as described in claim 1, wherein the function pin is an enable pin.

The physical parameter generator as described in claim 1, wherein the physical parameter unit comprises a two-carrier transistor.

The physical parameter generator as described in claim 5, wherein the bipolar transistor is an NPN bipolar transistor.

The physical parameter generator as described in claim 5, wherein the physical parameter unit further comprises an amplifying circuit, and the amplifying circuit is coupled to the bipolar transistor for generating the output signal.

The physical parameter generator as described in claim 1, wherein the physical parameter generator is a part of an integrated circuit.

The physical parameter generator as described in claim 8, wherein the integrated circuit is not in a test mode when outputting the physical parameter information.