CN114637232A - Physical parameter generator - Google Patents

Physical parameter generator Download PDF

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Publication number
CN114637232A
CN114637232A CN202011490963.6A CN202011490963A CN114637232A CN 114637232 A CN114637232 A CN 114637232A CN 202011490963 A CN202011490963 A CN 202011490963A CN 114637232 A CN114637232 A CN 114637232A
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China
Prior art keywords
physical parameter
pin
parameter generator
generator
parameter information
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CN202011490963.6A
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CN114637232B (en
Inventor
陈志嘉
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Global Mixed Mode Technology Inc
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Global Mixed Mode Technology Inc
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Priority claimed from CN202011490963.6A external-priority patent/CN114637232B/en
Publication of CN114637232A publication Critical patent/CN114637232A/en
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    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00Programme-control systems
    • G05B19/02Programme-control systems electric
    • G05B19/04Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/042Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
    • G05B19/0423Input/output
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/20Pc systems
    • G05B2219/25Pc structure of the system
    • G05B2219/25257Microcontroller

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

A physical parameter generator is used for generating a physical parameter information. The physical parameter generator has a physical parameter unit, a current source and a functional pin. The physical parameter unit is coupled to the current source and used for generating an output signal, wherein the output signal is related to the physical parameter information. The current source is coupled to the functional pin for outputting the physical parameter information. When the functional pin is in a floating state, the physical parameter generator can generate the physical parameter information through the functional pin.

Description

Physical parameter generator
Technical Field
The present invention relates to a physical parameter generator, and more particularly, to a physical parameter generator capable of generating a physical parameter information through a functional pin.
Background
With the development of electronic engineering technology, complex circuits can be Integrated into an Integrated Circuit (Integrated Circuit). In order to configure more integrated circuits in a limited circuit board space, integrated circuit designers are often required to produce the desired functionality with a limited number of pins. Generally, a user can precisely control the characteristics and functions of the electronic device by retrieving physical parameter information. However, this means that additional pins are required in the integrated circuit to output the physical parameter information. Because the pin number can influence the packaging cost, the pin number can be reduced as much as possible on the premise of saving the cost so as to improve the competitiveness of the product. Therefore, how to use the existing pin to obtain the required physical parameter information is an important issue to be solved at present.
Disclosure of Invention
In view of the foregoing, it is an object of the present invention to provide a physical parameter generator capable of generating a physical parameter information through a function pin.
The physical parameter generator is provided according to the present invention. The physical parameter generator may be part of an integrated circuit. The physical parameter generator has a physical parameter unit, a current source and the functional pin. The physical parameter unit is coupled to the current source and used for generating an output signal, wherein the output signal is related to the physical parameter information. The current source is coupled to the functional pin for outputting the physical parameter information. When the functional pin is in a floating state, the physical parameter generator can generate the physical parameter information through the functional pin. When the functional pin is in a normal mode to execute a function, the physical parameter generator can output the physical parameter information through the functional pin. The physical parameter information may be related to a temperature, an acceleration, a rotation speed, or a pressure. The designer can design the physical parameter unit according to different applications, and further obtain the required physical parameter information.
The physical parameter unit has a bipolar transistor and an amplifying circuit. The bipolar transistor has an emitter, a base and a collector. The collector of the bipolar transistor is coupled to a voltage source. The base of the bipolar transistor is coupled to the amplifying circuit. The emitter of the bipolar transistor is coupled to a ground potential. The amplifying circuit is coupled to the bipolar transistor for generating the output signal. For example, when the amplification factor of the amplification circuit is 10, the output signal varies with temperature by a factor of about 20 mV/deg.C because the voltage difference between the base and the emitter varies with temperature by a factor of about 2 mV/deg.C.
When the functional pin is an enable pin and the enable pin is in a floating state, the enable pin is pulled up to the level of the output signal by the current source. At this time, the integrated circuit is started and simultaneously temperature information can be obtained by measuring the voltage of the enabling pin. When the functional pin is the enable pin and the enable pin is pulled down to a low level, the integrated circuit is turned off. Therefore, the enabling pin can provide required temperature information when executing an enabling function.
The invention has the advantage that the physical parameter information can be generated through the functional pin without adding an additional pin. In addition, the integrated circuit is not in a test mode when outputting the physical parameter information, so that the functional error of the integrated circuit caused by mistaken entering of the test mode can be avoided. When the functional pin is in a floating state, the physical parameter generator can generate the physical parameter information through the functional pin. When the function pin is in a normal mode to execute a function, the physical parameter generator can output the physical parameter information through the function pin. The physical parameter information may be related to a temperature, an acceleration, a rotation speed, or a pressure.
Drawings
FIG. 1 is a diagram illustrating a physical parameter generator according to an embodiment of the invention.
Fig. 2 is a schematic diagram of a physical parameter unit according to an embodiment of the invention.
Description of reference numerals: 10-a physical parameter generator; 100-physical parameter unit; vo-output signal; a CS-current source; FUN-functional pin; VCC-voltage source; GND-ground potential; 110-bipolar transistor; 120-an amplifying circuit.
Detailed Description
The objects, features, and advantages of the present invention will become more apparent from the following description. Preferred embodiments according to the present invention will be described in detail with reference to the accompanying drawings.
FIG. 1 is a diagram of a physical parameter generator 10 according to an embodiment of the invention. The physical parameter generator 10 may be part of an integrated circuit. The physical parameter generator 10 has a physical parameter unit 100, a current source CS and a functional pin FUN, wherein the physical parameter generator 10 generates a physical parameter information through the functional pin FUN. The physical parameter unit 100 is coupled to the current source CS for generating an output signal Vo, wherein the output signal Vo is related to the physical parameter information. The current source CS is coupled to the functional pin FUN for outputting the physical parameter information. When the functional pin FUN is in a floating state, the physical parameter generator 10 can generate the physical parameter information through the functional pin FUN. When the functional pin FUN performs a function in a normal mode, the physical parameter generator 10 can output the physical parameter information through the functional pin FUN at the same time. The physical parameter information may be related to a temperature, an acceleration, a rotation speed or a pressure. The designer can design the physical parameter unit 100 according to different applications, so as to obtain the required physical parameter information.
According to an embodiment of the present invention, the functional pin FUN may be an enable pin and the physical parameter unit 100 may be a temperature sensor. Fig. 2 is a schematic diagram of a physical parameter unit 100 according to an embodiment of the invention. The physical parameter unit 100 has a bipolar transistor 110 and an amplifying circuit 120. The bipolar transistor 110 has an emitter, a base and a collector. The collector of the bipolar transistor 131 is coupled to a voltage source VCC. The base of bipolar transistor 110 is coupled to amplifier circuit 120. The emitter of the bipolar transistor 131 is coupled to a ground potential GND. The amplifying circuit 120 is coupled to the bipolar transistor 110 for generating the output signal Vo. For example, when the amplification factor of the amplifying circuit 120 is 10, the voltage difference between the base and the emitter varies with temperature by a factor of about 2 mV/deg.C, and thus the output signal Vo varies with temperature by a factor of about 20 mV/deg.C. As shown in fig. 2, the bipolar transistor 110 may be an NPN type bipolar transistor. In addition, the output signal Vo is related to a physical parameter information, such as temperature.
Please refer to fig. 1 and fig. 2 simultaneously. When the functional pin FUN is an enable pin and the enable pin is in a floating state, the enable pin is pulled up to the level of the output signal Vo by the current source CS. At this time, the integrated circuit is started and temperature information can be obtained by measuring the voltage of the enable pin. When the functional pin FUN is the enable pin and the enable pin is pulled low to a low level, the integrated circuit is turned off. Therefore, the enabling pin can provide the required temperature information when executing the enabling function. Since most integrated circuits have an enable pin, the enable pin is selected for illustration.
An advantage of an embodiment of the present invention is that the generation of physical parameter information via the functional pins FUN can be achieved without adding additional pins. In addition, the integrated circuit is not in a test mode when outputting the physical parameter information, so that the functional error of the integrated circuit caused by mistakenly entering the test mode can be avoided. When the functional pin FUN is in a floating state, the physical parameter generator 10 can generate the physical parameter information through the functional pin FUN. When the functional pin FUN performs a function in a normal mode, the physical parameter generator 10 can output the physical parameter information through the functional pin FUN at the same time. The physical parameter information may be related to a temperature, an acceleration, a rotation speed, or a pressure. The designer can design the physical parameter unit 100 according to different applications, so as to obtain the required physical parameter information.
The above description is only a preferred embodiment of the present invention, and all equivalent changes and modifications made within the scope of the claims of the present invention should be covered by the present invention.

Claims (9)

1. A physical parameter generator for generating a physical parameter information, the physical parameter generator comprising:
a functional pin position;
a current source coupled to the functional pin for outputting the physical parameter information; and
and a physical parameter unit coupled to the current source for generating an output signal, wherein the output signal is related to the physical parameter information, and the physical parameter generator generates the physical parameter information through the functional pin when the functional pin is in a floating state.
2. The physical parameter generator of claim 1, wherein the physical parameter information is related to a temperature.
3. The physical parameter generator of claim 1, wherein the physical parameter generator simultaneously outputs the physical parameter information via the function pin when the function pin performs a function.
4. The physical parameter generator of claim 1, wherein the functional pin is an enable pin.
5. The physical parameter generator of claim 1, wherein the physical parameter unit comprises a bipolar transistor.
6. The physical parameter generator as claimed in claim 5, wherein the bipolar transistor is an NPN type bipolar transistor.
7. The physical parameter generator of claim 5, wherein the physical parameter unit further comprises an amplifying circuit coupled to the bipolar transistor for generating the output signal.
8. The physical parameter generator of claim 1, wherein the physical parameter generator is part of an integrated circuit.
9. The physical parameter generator of claim 8, wherein the integrated circuit is not in a test mode when outputting the physical parameter information.
CN202011490963.6A 2020-12-16 Physical parameter generator Active CN114637232B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202011490963.6A CN114637232B (en) 2020-12-16 Physical parameter generator

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202011490963.6A CN114637232B (en) 2020-12-16 Physical parameter generator

Publications (2)

Publication Number Publication Date
CN114637232A true CN114637232A (en) 2022-06-17
CN114637232B CN114637232B (en) 2024-06-21

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Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4323854A (en) * 1980-01-30 1982-04-06 Control Data Corporation Temperature compensated current source
CN1340750A (en) * 2000-08-31 2002-03-20 凌阳科技股份有限公司 Reference current source generating circuit with low temp coefficient
CN1497248A (en) * 2002-10-01 2004-05-19 沃福森微电子有限公司 Temp. measuring equipment and method
US20070004055A1 (en) * 2005-07-01 2007-01-04 Semiconductor Components Industries, Llc Method for regulating temperature and circuit therefor
CN1955703A (en) * 2005-10-24 2007-05-02 圆创科技股份有限公司 Temp. measuring circuit of corrected by translation conversion reference level
CN101013236A (en) * 2007-02-07 2007-08-08 友达光电股份有限公司 Adhesive structure and method for making same
CN101762338A (en) * 2008-12-24 2010-06-30 上海华虹Nec电子有限公司 Temperature sensor circuit and temperature signal processing method
CN101832822A (en) * 2009-03-10 2010-09-15 晨星软件研发(深圳)有限公司 Temperature sensing device and method proportional to absolute temperature (PTAT)
CN102589734A (en) * 2012-01-31 2012-07-18 钜泉光电科技(上海)股份有限公司 Temperature sensor
CN102638230A (en) * 2011-02-10 2012-08-15 启碁科技股份有限公司 Temperature compensation device and satellite signal receiving system
TW201245679A (en) * 2011-05-05 2012-11-16 Sunplus Technology Co Ltd Temperature sensing device
TW201515005A (en) * 2013-05-30 2015-04-16 Semiconductor Energy Lab Driving method of semiconductor device
CN107305147A (en) * 2016-04-22 2017-10-31 恩智浦美国有限公司 Temperature sensor and the temperature sensor calibration method with high accuracy
CN111835301A (en) * 2019-04-23 2020-10-27 立积电子股份有限公司 Power amplifier and temperature compensation method thereof
TWI764434B (en) * 2020-12-14 2022-05-11 致新科技股份有限公司 Physical parameter generator

Patent Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4323854A (en) * 1980-01-30 1982-04-06 Control Data Corporation Temperature compensated current source
CN1340750A (en) * 2000-08-31 2002-03-20 凌阳科技股份有限公司 Reference current source generating circuit with low temp coefficient
CN1497248A (en) * 2002-10-01 2004-05-19 沃福森微电子有限公司 Temp. measuring equipment and method
US20070004055A1 (en) * 2005-07-01 2007-01-04 Semiconductor Components Industries, Llc Method for regulating temperature and circuit therefor
CN1955703A (en) * 2005-10-24 2007-05-02 圆创科技股份有限公司 Temp. measuring circuit of corrected by translation conversion reference level
CN101013236A (en) * 2007-02-07 2007-08-08 友达光电股份有限公司 Adhesive structure and method for making same
CN101762338A (en) * 2008-12-24 2010-06-30 上海华虹Nec电子有限公司 Temperature sensor circuit and temperature signal processing method
CN101832822A (en) * 2009-03-10 2010-09-15 晨星软件研发(深圳)有限公司 Temperature sensing device and method proportional to absolute temperature (PTAT)
CN102638230A (en) * 2011-02-10 2012-08-15 启碁科技股份有限公司 Temperature compensation device and satellite signal receiving system
TW201245679A (en) * 2011-05-05 2012-11-16 Sunplus Technology Co Ltd Temperature sensing device
CN102589734A (en) * 2012-01-31 2012-07-18 钜泉光电科技(上海)股份有限公司 Temperature sensor
TW201515005A (en) * 2013-05-30 2015-04-16 Semiconductor Energy Lab Driving method of semiconductor device
CN107305147A (en) * 2016-04-22 2017-10-31 恩智浦美国有限公司 Temperature sensor and the temperature sensor calibration method with high accuracy
CN111835301A (en) * 2019-04-23 2020-10-27 立积电子股份有限公司 Power amplifier and temperature compensation method thereof
TWI764434B (en) * 2020-12-14 2022-05-11 致新科技股份有限公司 Physical parameter generator

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