TWI764072B - Semi-anechoic chamber and floor structure thereof - Google Patents
Semi-anechoic chamber and floor structure thereofInfo
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- TWI764072B TWI764072B TW108147532A TW108147532A TWI764072B TW I764072 B TWI764072 B TW I764072B TW 108147532 A TW108147532 A TW 108147532A TW 108147532 A TW108147532 A TW 108147532A TW I764072 B TWI764072 B TW I764072B
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Abstract
Description
本發明係有關一種半電波暗室,特別是關於一種半電波暗室的地板結構。The present invention relates to a semi-anechoic chamber, in particular to a floor structure of the semi-anechoic chamber.
電子裝置可能受到周遭的電磁波干擾而無法正常正作,為解決電磁干擾問題,通常在產品上市前都會進行電磁相容性(ElectroMagnetic Compatibility; EMC)測試,此測試通常要於符合要求的實驗室中進行,例如半電波暗室。Electronic devices may be interfered by surrounding electromagnetic waves and cannot function normally. To solve the problem of electromagnetic interference, electromagnetic compatibility (ElectroMagnetic Compatibility; EMC) tests are usually carried out before products are put on the market. This test is usually performed in a laboratory that meets the requirements carried out, for example, in a semi-anechoic chamber.
圖1顯示傳統半電波暗室100的上視圖,其為由牆面102、天花板(圖中未示)及地板所形成的六面體空間,其中牆面102及天花板上有吸收電磁波的材料以避免電磁波被牆面102或天花板反射而影響測試結果,地板是由多個反射板104拼接而成,用以模擬無限大的金屬接地面,半電波暗室100會有一電磁波發射區106供設置電磁波發射裝置以及一電磁波接收區108供設置電磁波接收裝置,當電磁波發射區106中的電磁波發射裝置(圖中未示)發出的電磁波發射到反射板104時,會被反射板104反射,同時反射板104上會產生電流I1,電流I1會流向牆面102,再經由牆面102流向地面GND。圖2顯示圖1的半電波暗室100的局部剖面圖,每一個反射板104包括一絕緣層1044及二金屬層1042及1046分別在絕緣層1044的二側,反射板104之間是利用一上板110、一下板112及一螺絲114形成的接合結構來連接,牆面102上有一L型支撐架116用以支撐相鄰的反射板104,鄰接牆面102的反射板104可利用一金屬線118將金屬層1042連接至牆面102,支撐架116及金屬線118皆可使反射板104上的電流流向牆面102。如圖2所示,當圖1中的其中一個反射板104上產生電流I1時,電流I1將透過反射板104之間的接合結構流向鄰近的反射板104,最後流向牆面102,再經由牆面102流向地面GND。FIG. 1 shows a top view of a conventional
然而,傳統半電波暗室100讓電流I1流向四周牆面102,再透過牆面102流向地面GND的方式,造成較差的接地效果,進而影響了低頻(例如30MHz~300MHz)特性的測試。However, the conventional
本發明的目的之一,在於提出一種半電波暗室的地板結構。One of the objectives of the present invention is to provide a floor structure of a semi-anechoic chamber.
本發明的目的之一,在於提出一種改善接地效果的半電波暗室。One of the objectives of the present invention is to provide a semi-anechoic chamber with improved grounding effect.
根據本發明,一種半電波暗室的地板結構包括一反射板具有一第一金屬層、一第二金屬層及一絕緣層。該絕緣層在該第一金屬層及該第二金屬層之間,且該絕緣層具有一通孔,該第一金屬層上的電流可經由該通孔流向該第二金屬層。該地板結構更包括一接地架構連接該第二金屬層,以使該第二金屬層上的電流流向地面。According to the present invention, a floor structure of a semi-anechoic chamber includes a reflector having a first metal layer, a second metal layer and an insulating layer. The insulating layer is between the first metal layer and the second metal layer, and the insulating layer has a through hole through which the current on the first metal layer can flow to the second metal layer. The floor structure further includes a ground structure connected to the second metal layer, so that the current on the second metal layer flows to the ground.
根據本發明,一種半電波暗室的地板結構包括一通孔及一接地架構,該接地架構電性連接該通孔及一地面。該地板結構上電流經該通孔及該接地架構流向該地面。According to the present invention, a floor structure of a semi-anechoic chamber includes a through hole and a ground structure, and the ground structure is electrically connected to the through hole and a ground. Current on the floor structure flows to the ground through the through hole and the ground structure.
根據本發明,一種半電波暗室包括多個反射板及多個接地架構,該多個接地架構分別連接該多個反射板,以使該多個反射板上的電流流向地面。由於每一個反射板可經由與其連接的接地架構連接至地面,故該半電板暗室具有較佳的接地效果,可改善低頻特性的測試。According to the present invention, a semi-anechoic chamber includes a plurality of reflection plates and a plurality of ground structures, and the plurality of ground structures are respectively connected to the plurality of reflection plates, so that the currents on the plurality of reflection plates flow to the ground. Since each reflector can be connected to the ground through the grounding structure connected thereto, the semi-electric darkroom has a better grounding effect, which can improve the test of low frequency characteristics.
圖3顯示本發明的半電波暗室的地板結構200,圖4顯示圖3中AA’方向的剖面圖。參照圖3及圖4,地板結構200包括反射板202及接地架構206,反射板202具有二金屬層2022及2026及一絕緣層2024,絕緣層2024是在二金屬層2022及2026之間,絕緣層2024具有通孔204,金屬層2022及2026透過通孔204連接以使金屬層2022上的電流I1能流向金屬層2026,金屬層2022及2026可以是但不限於鍍鋅鋼板,絕緣層2024可以是但不限於木板。接地架構206連接反射板202,用以使反射板202上的電流I1流向地面GND,在此實施例中,接地架構206是以一支撐架實現,該支撐架設置在地面GND上且用以支撐反射板202,支撐架連接反射板202的金屬層2026。當電磁波發射到反射板202時,反射板202的金屬層2022上會產生電流I1,電流I1經由通孔204流向金屬層2026後,再通過支撐架(接地架構206)流向地面GND。在一實施例中,通孔204中可填入導電材料,以使金屬層2022電性連接金屬層2026。在一實施例中 ,可利用一螺絲經通孔204將反射板202固定在支撐架上,而金屬層2022可透過該螺絲電性連接金屬層2026。FIG. 3 shows the
在圖4的實施例中,反射板202為三層結構,但本發明並不限於此,例如可在金屬層2022及2026之間加入更多的絕緣層,或者將反射板202修改為單層的金屬板。此外,圖3及圖4中通孔204及接地架構206的數量及位置也可以依需求改變。In the embodiment shown in FIG. 4 , the
圖5顯示本發明半電波暗室300的第一實施例,其包括多個反射板202拼接成半電波暗室300的地板,半電波暗室300有一電磁波發射區304供設置電磁波發射裝置以及一電磁波接收區306供設置電磁波接收裝置,當有電磁波發射到反射板202時,反射板202會反射電磁波,同時反射板202上會產生電流I1。每一個反射板202各自連接一接地架構206(如圖4所示),使得每一個反射板202上的電流I1能透過與其連接的接地架構206流向地面GND,電流I1不用先流向牆面302後,再流向地面GND,故本發明的半電波暗室300具有較好的接地效果,可改善低頻特性的測試。在圖5的半電波暗室300中,反射板202可以如圖4所示為一多層結構,也可以是單層的金屬板。圖6顯示圖5中部分區域的剖面圖,如圖6所示,本發明反射板202上的電流I1除了可以透過通孔 204及接地架構206流向地面GND之外,也可以透過與反射板202鄰接的牆面302流向地面GND,相較於習知技術,本發明能提供更多的電流路徑讓反射板202上的電流I1流向地面GND,具有較佳的接地效果。FIG. 5 shows the first embodiment of the
如圖5所示,每一個反射板202可透過與其連接的接地架構206讓電流I1流向地面,因此本發明的半電波暗室300不用像傳統半電波暗室100一樣,地板必需完全由反射板104拼接而成,以使電流I1可以流向牆面102,進而流向地面。圖7顯示本發明半電波暗室300的第二實施例,在此實施例中,半電波暗室300的地板並非全由反射板202構成,反射板202僅設置在電磁波發射區304及電磁波接收區306之間的區域。圖8顯示本發明半電波暗室300的第三實施例,在此實施例中,反射板202只設置在主要反射區308、310、312及314。主要反射區在目前的規範中有清楚定義,例如ANSI C63.4之 5.3節,本領域的技術人員可以判斷出半電波暗室300中的主要反射區的位置。As shown in FIG. 5 , each
在目前的規範中,半電波暗室的正規化場地衰減值(Normalized Site Attenuation; NSA)的誤差必需在+/-4dB以內,而傳統的半電波暗室100的NSA的誤差大約在+/-3.5dB,但本發明的半電波暗室300的NSA的誤差可以降低到+/-2.5dB,故相較於傳統的半電波暗室100,本發明的半電波暗室300具有更好的功效。In the current specification, the normalized site attenuation (NSA) error of the semi-anechoic chamber must be within +/-4dB, while the NSA error of the traditional
以上對於本發明之較佳實施例所作的敘述係為闡明之目的,而無意限定本發明精確地為所揭露的形式,基於以上的教導或從本發明的實施例學習而作修改或變化是可能的,實施例係為解說本發明的原理以及讓熟習該項技術者以各種實施例利用本發明在實際應用上而選擇及敘述,本發明的技術思想企圖由之後的申請專利範圍及其均等來決定。The above description of the preferred embodiments of the present invention is for illustrative purposes, and is not intended to limit the present invention to the exact form disclosed. Modifications or changes are possible based on the above teachings or learning from the embodiments of the present invention. The embodiments are selected and described in order to illustrate the principle of the present invention and to allow those familiar with the technology to use the present invention in practical applications with various embodiments. Decide.
100:半電波暗室 102:牆面 104:反射板 1042:金屬層 1044:絕緣層 1046:金屬層 106:電磁波發射區 108:電磁波接收區 110:上板 112:下板 114:螺絲 116:支撐架 118:金屬線 200:地板結構 202:反射板 2022:金屬層 2024:絕緣層 2026:金屬層 204:通孔 206:接地架構 300:半電波暗室 302:牆面 304:電磁波發射區 306:電磁波接收區 308:主要反射區 310:主要反射區 312:主要反射區 314:主要反射區100: Semi-anechoic chamber 102: Walls 104: Reflector 1042: Metal Layer 1044: Insulation layer 1046: Metal Layer 106: Electromagnetic wave emission area 108: Electromagnetic wave receiving area 110: Upper board 112: Lower board 114: Screws 116: Support frame 118: Metal Wire 200: Floor Structure 202: Reflector 2022: Metal Layers 2024: Insulation 2026: Metal Layers 204: Through hole 206: Grounding Architecture 300: Semi-anechoic chamber 302: Wall 304: Electromagnetic wave emission area 306: Electromagnetic wave receiving area 308: Main reflection area 310: Main reflection area 312: Main reflection area 314: Main reflection area
圖1顯示傳統半電波暗室的上視圖。 圖2顯示傳統半電波暗室的局部剖面圖。 圖3顯示本發明的地板結構。 圖4顯示圖3中AA’方向的剖面圖。 圖5顯示本發明半電波暗室的第一實施例。 圖6顯示圖5中部分區域的剖面圖。 圖7顯示本發明半電波暗室的第二實施例。 圖8顯示本發明半電波暗室的第三實施例。Figure 1 shows a top view of a conventional semi-anechoic chamber. Figure 2 shows a partial cross-sectional view of a conventional semi-anechoic chamber. Figure 3 shows the floor structure of the present invention. Fig. 4 shows a cross-sectional view in the direction AA' of Fig. 3 . Fig. 5 shows the first embodiment of the semi-anechoic chamber of the present invention. FIG. 6 shows a cross-sectional view of a portion of the area in FIG. 5 . Figure 7 shows a second embodiment of the semi-anechoic chamber of the present invention. FIG. 8 shows a third embodiment of the semi-anechoic chamber of the present invention.
200:地板結構200: Floor Structure
202:反射板202: Reflector
2022:金屬層2022: Metal Layers
2024:絕緣層2024: Insulation
2026:金屬層2026: Metal Layers
204:通孔204: Through hole
206:接地架構206: Grounding Architecture
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Citations (5)
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TWM379283U (en) * | 2009-11-20 | 2010-04-21 | Inventec Corp | Electromagnetic wave dark room |
CN202837416U (en) * | 2012-07-10 | 2013-03-27 | 中国兵器工业新技术推广研究所 | System for testing shielding performance of cables |
CN103543342A (en) * | 2012-07-10 | 2014-01-29 | 中国兵器工业新技术推广研究所 | Method and system for testing shielding performance of cable |
CN104350816A (en) * | 2012-06-07 | 2015-02-11 | 大自达电线股份有限公司 | Shield film and shield printed wiring board |
CN205643552U (en) * | 2016-04-19 | 2016-10-12 | 东莞市全测电子科技有限公司 | A anechoic chamber for electron electric appliances testing |
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2019
- 2019-12-25 TW TW108147532A patent/TWI764072B/en active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
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TWM379283U (en) * | 2009-11-20 | 2010-04-21 | Inventec Corp | Electromagnetic wave dark room |
CN104350816A (en) * | 2012-06-07 | 2015-02-11 | 大自达电线股份有限公司 | Shield film and shield printed wiring board |
CN202837416U (en) * | 2012-07-10 | 2013-03-27 | 中国兵器工业新技术推广研究所 | System for testing shielding performance of cables |
CN103543342A (en) * | 2012-07-10 | 2014-01-29 | 中国兵器工业新技术推广研究所 | Method and system for testing shielding performance of cable |
CN205643552U (en) * | 2016-04-19 | 2016-10-12 | 东莞市全测电子科技有限公司 | A anechoic chamber for electron electric appliances testing |
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