五、新型說明： 【新型所屬之技術領域】 4創作係有關於—種電波暗室，更詳而言之，係關於 種可進行全電波測試及半電波測試的電波暗室。 【先前技術】 就現有的電磁兼容測試而言，電磁兼容測試會於電波 暗室（anechoic chamber)進行，電波暗室内係安裝用以降低 •内表面電波反射的吸波材料，例如吸波泡棉。於不同的電 •磁兼容（EMC)測試的實施過程中，所使用的電波暗室又分 為兩種，即全電波暗室（fully anechoic chamber)和半電波 暗室（semi-anechoic chamber)，所述全電波暗室是指暗室 内之表面全部安裝吸波材料，而所述半電波暗室是指除於 暗室内之地面上安裝反射接地平板外，其餘表面均安裳吸 波材料。 由此可知’如果要同時滿足全電波測試和半電波測气 的需要，就要分別建造前述兩種暗室，但此舉會產生費必 龐大的缺失，或者移動吸波材料以撮放出所需的暗二用 式，但透過此種方式改造暗室會浪費大量的時間和二=形 此外，由於吸波材料很容易因為擺效的誤 造 ， 認場地之特性不穩定’以導致輻射貴、 電波剩 惠誤差大，進而批 試的不準讀性。 &成項 是故，如何設計一種可兼具全番 戈凌測試及半電 的電波暗室，以避免上述之種種缺生 實為相關領 者目前亟待解決之課題。 、 M379283 【新型内容】 鑒於上述習知技術之缺點，本創作的主要目的在於提 一種電波暗室，以解決現有技術中存在的分別建造兩種暗 室要耗費鉅資或者改造暗室又消耗人力和時間，且又易導 致測試不穩定等問題。 為達上述目的及其他相關目的，本創作提供一種電波 暗室，係應用於電磁兼容(EMC)測試實驗中，係包括：測 試室，具有一地板及五面具有吸波材料的吸波牆而形成一 測試空間，該測試空間中設有測試旋轉台以及放置於該測 試旋轉台上的測試桌，該測試桌上放置待測設備；天線， 係與該待測設備最大直徑外緣相距一預定距離；以及移動 吸波單元，設置於該測試旋轉台與天線之間的區域，具有 吸波材料、用以承載該吸波材料的基板、以及裝設於該基 板上之滾動體，通過該移動吸波單元實現全/半電波暗室之 間的切換。 於本創作之電波暗室之一實施例中，該移動吸波單元 與該吸波牆上的吸波材料為吸波泡棉。該移動吸波單元的 吸波材料、基板以及滾動體之總高度為一小於或等於30cm 之預設值。該地板為反射接地平板。 另外，於提供半電波暗室環境時，推移開該移動吸波 單元以露出在該測試旋轉台與天線之間的地板區域，該露 出的地板區域的縱向長度大於或等於該待測設備之最大直 徑。 如上所述，本創作之電波暗室包括測試室、移動吸波 M379283 早Γ、以及天線。藉由在暗室内設置可方便推移的移動吸 波單元，以提供全電波暗室環境或半電波暗室環境，如此 設計’不僅省卻了現有技術中需要分別建造兩種不同暗室 ^生的#用’亦避免了因改造暗室而產生的大量人力和 =間成本’且同時使測試環境參數—致而確保了測試的穩 定性。 〜 【實施方式】 …以下係藉由特定的具體實例說明本創作之技術内 二之人士可由本說明書所揭示之内容輕易地 :創作之其他優點與功效。本創作亦可藉由其他不同 々具體實例加以施行或應用，本說明書中的各項細節亦可 土於不同賴與剌，在不，轉本創作 修飾與變更。 τ卜進仃各種 請荼閲第1 ®至第3圖，第丨圖係為本創作之 波暗室環境之俯視示意圖；第2圖係為本創； 電波暗室提供半電波暗室環境之俯視亍音本創作之 熹， 主衣兄&冊視不思圖。需要說明的 1圖至第3圖均為簡化之示意圖式，而僅以 ^兄明本創作之基本構想，遂圖式中僅顯 ^ 製，盆實Π二際’广之讀數目、形狀及尺寸繪 意之變各兀件之型態、數量及比例可為—種隨 試卓進一干本創作之电波暗室用以放置待測設備的測 進仃電磁兼容(EMC)測試時，可提供全電波暗室 «79283 =半電波暗室兩種暗室環境供測試人㈣擇，具體地，本 谁:乍之電波暗室係用以對放置於測試桌112上的待測設備 二EMI、CE、RE等測試項目的電波測試作業，該電波 曰室包括測試室1、移動吸波單元3以及天線1】4。 …該測試室1具有一地板】】、天線114、以及五面具有 吸波材料】3的级波牆】2’該些吸波膽12係圍繞該地板】】 ^形成—測試空間UG，該測試空間11G中設有測試旋轉 口/13以及放置於該測試旋轉台n3上的測試桌⑴，該 、'式桌112上放置待測設備2，該待測設備2周圍區域為 測試區域，所述的測試區域即習稱的靜場區域。另外，該 地板U係為反射接地平板以提供設置符合法規要求的半 電波暗室。 該測試室】上用以圍繞該地板n以形成該測試空間 10之多個吸波牆12上設有吸波材料13，該吸波材料13 例如為吸波、泡棉，且為達到良好的吸波性，該吸波材料13 具有呈鋸齒狀之截面’如第2圖所示。 請參閱第2圖，該移動吸波單元3具有吸波材料31、 ^板32、以及滾動體33。該基板32係用以承載該吸波材 料Μ。該滾動體33係裳設於該基板32上，以通過該滾動 體33而將該移動吸波單元3推移至該測試空間㈣内的適 當位置’進而得提供全電波暗室環境、或半電波暗室環境。 此外，將該測試旋轉台與天線之間的區域定義為吸波單元 放置區域’藉以決^全電波暗室環境中該移動吸波單元3 應擺放的位置。 M379283 :第2圖戶斤示，該吸波材料料31、基板％、以及滾 動肢33之總高度η Λ —褚刊·/古认丄— 吸咕i一 為預⑦值，於本實施例中，該移動 3的吸波材料31、基板32、以及滾動體％之總 :度為小於或等於3Gem’以符合現行法規對電波暗室的要 衣，但不以此為限，仍可 動吸波單元3的總高度。以的以適當改變該移 2〜彳114°又於該吸波單％放置區域背離該待測設備 2—的-側’亦即與該待測設備2的最大直徑外緣相距一預 疋距離u。於本實施例中，該預定距離历，且體 而言’該天線m的相位中心至該待測設備2的最大直徑 :緣的最小距離為3m，以符合現行法規對電波暗室的要 氺’但不以此為限。 於本實施例中，該吸波膽12上的吸波材料u為吸波 泡棉，該移動吸波單元3的吸波材料31亦為吸波泡棉。 需說明的是’由於該移動吸波單元3具有複數滾動體 ，以使其推移起來料时便省力，㈣Η了現有技 射存在的搬運吸波材料而需耗費大量的時間和人力等問 題。 欲構建全電波暗室時’可如第】圖所示，將該移動吸 波早兀3朝圖式箭頭方向Α推移至該吸波單元放置區域 中’以遮_待測設襟2與天線114間的地板區域，進而 達到全電波暗室所要求的測試環境需求標準。 …欲構建半電波暗室時，如第3圖所示，可將該移動吸 皮單兀〕自邊吸波單兀放置區域中朝圖式箭頭方向㈣移 7 I y厶 開，以使移動吸波單元3,完全離開吸波單元放置區域，以 露出為反射接地平板的該地，進而達到半電波暗室所 要求的測試環境需求標準。應說明的是，於提供半電波暗 室環境時’係推移開該移動吸波單元3，，以露出在該測試 ί轉台113與天線114之間的地板區域，該露出的地板區 -、的縱向長度L2應大於或等於該待測設備之最大直徑 D’以符合現行法規對半電波暗室的測試環境要求。 綜上所述，本創作之用於電磁兼容（EMc)測試實驗之 電=室包括測試室、移動吸波單元、以及天線。藉由在 測減室内設置可方便推移的移動吸波單元，以提供全電 T環境或半電波暗環境，如此設計，不僅省卻了現有技術 中需要分別建造兩種不同暗室而產生的費用，亦可避免因 改1至而產生的大量人力和時間成本’同時可提供一致 性的環境參數而確保測試的穩定性。 上述實施霞麻性制本财之原理及其功效 非用於限财㈣。任㈣習此項技藝之人士均可在不遠 背本創作之精神及㈣下，對±述實_進行修倚與改 變’此’舉凡所屬技術領域巾具有通常 本創：所揭示之精神與技料想下所完成之—切等效= 或改4，仍應由後述之申鱗圍所涵蓋。 【圖式簡單說明】 第1圖係為本創作之電波暗室提供全電 俯視示意圖； 王衣兄疋· 第2圖知為本創作之電波暗室之移動吸波單元側視 M379283 圖；以及 第3圖係為本創作之電波暗室提供半電波暗室環境之 . 俯視示意圖。 ，【主要元件符號說明】 1 測試室 11 地板 110 測試空間 112 測試桌 113 測試旋轉台 114 天線 12 吸波牆 13 ' 31 吸波封料 2 待測設備 3 ' 3， 移動吸波單元 32 基板 33 滚動體 L1 預定距離 L2 縱向長度 Η 總高度 D 待測設備最大直徑 A、Β 箭頭方向V. New description: [New technology field] 4 The authoring department has a kind of anechoic chamber, and more specifically, it is a kind of anechoic chamber that can perform full-wave test and half-wave test. [Prior Art] For the existing electromagnetic compatibility test, the electromagnetic compatibility test is performed in an anechoic chamber, and the anechoic chamber is installed to reduce the absorbing material of the inner surface electric wave reflection, such as absorbing foam. During the implementation of different electro-magnetic compatibility (EMC) tests, the anechoic chambers used are divided into two types, namely a fully anechoic chamber and a semi-anechoic chamber. The anechoic chamber refers to all the absorbing materials installed on the surface of the dark room, and the semi-anechoic chamber refers to the absorbing material of the other surface except for the installation of the reflective grounding plate on the ground in the dark room. It can be seen that 'if both the full-wave test and the half-wave test are required, the two types of darkrooms are built separately, but this will result in a huge loss, or the movement of the absorbing material to release the required Dark two-use, but transforming the darkroom in this way wastes a lot of time and the second shape. In addition, because the absorbing material is easily created due to the misuse of the effect, the characteristics of the site are unstable, resulting in expensive radiation and residual radio waves. The error is large, and the test is not allowed to read. It is a matter of course, how to design a anechoic chamber that can be used for all-going Goling testing and semi-electricity to avoid the above-mentioned various shortcomings is a problem that the relevant leaders need to solve now. M379283 [New content] In view of the above-mentioned shortcomings of the prior art, the main purpose of the present invention is to provide an anechoic chamber to solve the problem of constructing two kinds of darkrooms in the prior art, which requires a large amount of money or a darkroom, and consumes manpower and time. And it is easy to cause problems such as unstable test. For the above purposes and other related purposes, the present invention provides an anechoic chamber for use in electromagnetic compatibility (EMC) testing experiments, including: a test chamber having a floor and five absorbing walls with absorbing materials. a test space, wherein the test space is provided with a test rotary table and a test table placed on the test rotary table, the test table is placed with the device to be tested; and the antenna is spaced apart from the outer diameter of the largest diameter of the device to be tested by a predetermined distance And a mobile absorbing unit disposed in the region between the test turret and the antenna, having a absorbing material, a substrate for carrying the absorbing material, and a rolling body mounted on the substrate, by which the suction The wave unit enables switching between full/semi-acoustic darkrooms. In one embodiment of the anechoic chamber of the present invention, the mobile absorbing unit and the absorbing material on the absorbing wall are absorbing foam. The total height of the absorbing material, the substrate and the rolling elements of the moving absorbing unit is a preset value of less than or equal to 30 cm. The floor is a reflective ground plane. In addition, when the semi-anechoic chamber environment is provided, the moving absorbing unit is removed to expose a floor area between the test rotating table and the antenna, and the longitudinal length of the exposed floor area is greater than or equal to the maximum diameter of the device to be tested. . As mentioned above, the anechoic chamber of the present invention includes a test chamber, a mobile absorbing wave M379283, and an antenna. By providing a mobile absorbing unit that can be easily moved in the dark room to provide a full anechoic chamber environment or a semi-anechoic chamber environment, the design 'not only eliminates the need to separately construct two different darkrooms in the prior art. The large amount of labor and cost incurred by the modification of the darkroom is avoided, and at the same time the test environment parameters are ensured to ensure the stability of the test. 〜 实施 实施 实施 实施 实施 实施 实施 实施 实施 实施 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 The creation may also be carried out or applied by other different concrete examples. The details in this specification may also differ from each other in the context of the creation and modification of the creation. τ 仃 仃 仃 荼 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第The title of this creation, the main brother & album does not think. The 1st to the 3rd drawings to be explained are simplified schematic diagrams, and only the basic concept of the creation of the brothers, the figure is only shown in the figure, and the number and shape of the readings are The type, quantity and proportion of each dimension can be made into The anechoic chamber «79283 = half-anechoic darkroom environment for the tester (4), specifically, who: 乍 电 暗 darkroom is used to test the EMI, CE, RE, etc. of the device under test placed on the test table 112 The radio wave test operation of the project includes a test chamber 1, a mobile absorbing unit 3, and an antenna 1]. ...the test chamber 1 has a floor], an antenna 114, and a five-sided wave wall with a absorbing material] 3] The absorbing tube 12 surrounds the floor]] forming a test space UG, The test space 11G is provided with a test rotating port/13 and a test table (1) placed on the test rotating table n3. The device to be tested 2 is placed on the table 112, and the area around the device under test 2 is a test area. The test area described is the known static field area. In addition, the floor U is a reflective ground plane to provide a semi-anechoic chamber that meets regulatory requirements. The absorbing material 13 is disposed on the plurality of absorbing walls 12 for forming the test space 10 around the floor n, and the absorbing material 13 is, for example, absorbing wave, foam, and is good. Absorbing, the absorbing material 13 has a zigzag cross section as shown in Fig. 2. Referring to FIG. 2, the mobile absorbing unit 3 has an absorbing material 31, a plate 32, and rolling elements 33. The substrate 32 is used to carry the absorbing material cartridge. The rolling element 33 is disposed on the substrate 32, and the moving absorbing unit 3 is pushed to the appropriate position in the test space (4) by the rolling body 33 to provide a full anechoic chamber environment or a semi-anechoic chamber. surroundings. Further, the area between the test turntable and the antenna is defined as the absorbing unit placement area </ RTI> to determine the position at which the mobile absorbing unit 3 should be placed in the full anechoic chamber environment. M379283: Figure 2 shows that the absorbing material material 31, the substrate %, and the total height η of the rolling limb 33 Λ 褚 · / / / / 丄 丄 丄 丄 咕 丄 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一The total of the absorbing material 31, the substrate 32, and the rolling element % of the moving 3 is less than or equal to 3 Gem' to comply with the current regulations for the anechoic chamber, but not limited thereto, still movable absorbing The total height of unit 3. In order to appropriately change the shift 2~彳114° and the side of the absorbing single % placement area away from the side of the device under test 2—that is, a predetermined distance from the outer edge of the largest diameter of the device under test 2 u. In this embodiment, the predetermined distance is, and the body's phase center of the antenna m to the maximum diameter of the device under test 2: the minimum distance of the edge is 3 m, in order to comply with the current regulations on the anechoic chamber' But not limited to this. In the present embodiment, the absorbing material u on the absorbing tube 12 is a absorbing foam, and the absorbing material 31 of the moving absorbing unit 3 is also a absorbing foam. It should be noted that the movement absorbing unit 3 has a plurality of rolling elements to save labor when it is loaded, and (4) it takes a lot of time and labor to carry the absorbing material existing in the prior art. When constructing a full anechoic chamber, as shown in the figure, the moving absorbing wave is moved forward in the direction of the arrow to the absorbing unit placement area to cover the 襟2 and the antenna 114. The area of the floor, in turn, meets the test environment requirements required for a full anechoic chamber. ...To construct a semi-anechoic chamber, as shown in Fig. 3, the moving suction unit can be moved from the side of the side absorbing unit to the direction of the arrow (4) by 7 I y to make the movement suck. The wave unit 3 completely leaves the absorbing unit placement area to expose the ground which is the grounded slab, thereby meeting the test environment requirements required for the semi-anechoic chamber. It should be noted that when the semi-anechoic chamber environment is provided, the mobile absorbing unit 3 is removed to expose the floor area between the test illuminator 113 and the antenna 114, the exposed floor area-, the longitudinal direction. The length L2 should be greater than or equal to the maximum diameter D' of the device under test to comply with the current regulatory requirements for a semi-anechoic chamber. In summary, the electric=chamber for the electromagnetic compatibility (EMc) test experiment of the present invention includes a test chamber, a mobile absorbing unit, and an antenna. By providing a mobile absorbing unit that can be easily moved in the measuring and reducing room to provide an all-electric T environment or a semi-radio-dark environment, the design not only eliminates the cost of separately constructing two different darkrooms in the prior art, but also It can avoid the large amount of labor and time cost caused by the change to 1 ' while providing consistent environmental parameters to ensure the stability of the test. The above principles and functions of the implementation of Xiafei system are not used to limit wealth (4). Anyone who has studied this skill can do not hesitate to devote himself to the spirit of creation and (4), and to make a refusal to change and change the 'technical field'. If the technique is to be completed, the cut-off equivalent = or change to 4 should still be covered by Shen Yuanwei, which will be described later. [Simple description of the diagram] The first picture is a schematic view of the full-electricity of the anechoic chamber of the creation; Wang Yixiong·························· The diagram provides a semi-anechoic chamber environment for the anechoic chamber of the creation. , [Main component symbol description] 1 Test room 11 Floor 110 Test space 112 Test table 113 Test rotary table 114 Antenna 12 Absorbing wall 13 ' 31 Absorbing seal 2 Device to be tested 3 ' 3, Moving absorbing unit 32 Substrate 33 Rolling element L1 predetermined distance L2 longitudinal length Η total height D maximum diameter of the device to be tested A, 箭头 arrow direction