TWI760870B - Soldering process monitoring system and method - Google Patents
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Description
本案係關於一種焊錫製程監控系統及方法,尤指一種可即時了解焊錫品質的焊錫製程監控系統及方法。This case is about a soldering process monitoring system and method, especially a soldering process monitoring system and method that can instantly understand the soldering quality.
焊錫製程係利用高溫加熱狀態的烙鐵頭來熔化熔點較低的焊料金屬,從而連接金屬工件。焊錫品質與製程中的細節息息相關,包含烙鐵是否確實熔錫以及烙鐵的熔錫量及殘錫量是否與預期相符。The soldering process uses a soldering iron tip heated at a high temperature to melt solder metal with a lower melting point, thereby connecting metal workpieces. The quality of the solder is closely related to the details in the process, including whether the soldering iron actually melts the tin and whether the amount of molten tin and residual tin of the soldering iron is as expected.
現有技術中,需在結束焊錫製程後,方能透過自動光學檢查(AOI)等視覺設備進行檢測,以確認其焊錫品質。然而,現有技術並無法在焊錫過程中對其品質進行即時監控及調整,將影響焊錫製程的稼動效率。此外,進行品質檢測的視覺設備費用高昂,導致成本提升。In the prior art, after the soldering process is completed, inspection can be performed by visual equipment such as automatic optical inspection (AOI) to confirm the soldering quality. However, the existing technology cannot monitor and adjust the quality of the soldering process in real time, which will affect the operation efficiency of the soldering process. In addition, the high cost of vision equipment for quality inspection results in increased costs.
因此,如何發展一種可改善上述習知技術之焊錫製程監控系統及方法,實為目前迫切之需求。Therefore, how to develop a soldering process monitoring system and method that can improve the above-mentioned conventional technology is an urgent need.
本案之目的在於提供一種焊錫製程監控系統及方法,其係於焊錫過程中,通過烙鐵之端部的溫度變化來監控焊錫品質,因此在焊錫品質不佳時可即時得知並調整,有效提升焊錫製程的品質穩定性及稼動效率。此外,本案無需利用額外的視覺設備來進行品質檢測,可節省成本。The purpose of this case is to provide a soldering process monitoring system and method, which monitors the soldering quality through the temperature change of the end of the soldering iron during the soldering process, so that when the soldering quality is not good, it can be immediately known and adjusted, and the soldering can be effectively improved. Process quality stability and operating efficiency. In addition, in this case, there is no need to use additional visual equipment for quality inspection, which can save costs.
為達上述目的,本案提供一種焊錫製程監控系統,包含送錫單元、烙鐵、溫度感測單元及處理單元。送錫單元架構於提供錫料。烙鐵具有端部,其中端部被加熱以於接觸錫料時熔化錫料。在端部接觸錫料後的第一時間段內,端部的溫度共下降第一變化量,而在端部與錫料相接觸之過程中,端部的溫度共下降第二變化量。溫度感測單元架構於感測烙鐵的端部的溫度,以獲取多筆溫度資訊。處理單元連接於溫度感測單元,以接收該些溫度資訊,並依據該些溫度資訊計算取得該第一變化量及第二變化量。處理單元計算取得端部的溫度在第一時間段內的溫度下降速度,並將溫度下降速度及第二變化量分別與第一參考值及第二參考值進行比較,且依據比較結果輸出監控訊號。In order to achieve the above purpose, the present application provides a soldering process monitoring system, which includes a tin feeding unit, a soldering iron, a temperature sensing unit and a processing unit. The tin feeding unit is structured to provide tin material. Soldering irons have tips where the tips are heated to melt the tin material when it contacts it. During the first time period after the end portion contacts the tin material, the temperature of the end portion decreases by the first change amount, and during the process of the end portion being in contact with the tin material, the temperature of the end portion decreases by the second change amount. The temperature sensing unit is constructed to sense the temperature of the end of the soldering iron to obtain multiple pieces of temperature information. The processing unit is connected to the temperature sensing unit to receive the temperature information, and calculate and obtain the first change amount and the second change amount according to the temperature information. The processing unit calculates and obtains the temperature drop rate of the temperature of the end portion in the first time period, and compares the temperature drop rate and the second variation with the first reference value and the second reference value respectively, and outputs a monitoring signal according to the comparison result. .
為達上述目的,本案另提供一種焊錫製程監控方法,包含步驟:(a) 持續感測烙鐵之端部的溫度;(b) 加熱端部,並將錫料與端部相接觸,其中在端部接觸錫料後的第一時間段內,感測端部的溫度以取得多筆溫度資訊;(c) 依據該些溫度資訊計算取得第一時間段內溫度下降的第一變化量,以及計算取得第一時間段內的溫度下降速度;(d) 比較溫度下降速度及第一參考值,並依據比較結果輸出第一監控訊號;(e) 將錫料與端部相分離,其中在端部與錫料相接觸之過程中,感測端部的溫度並取得多筆溫度資訊;以及 (f) 依據該些溫度資訊計算取得端部溫度下降的第二變化量,且比較第二變化量及第二參考值,並依據比較結果輸出第二監控訊號。In order to achieve the above purpose, the present application further provides a method for monitoring a soldering process, comprising the steps of: (a) continuously sensing the temperature of the tip of the soldering iron; (b) heating the tip and contacting the tip with a tin material, wherein at the tip In the first time period after the part contacts the tin material, the temperature of the end part is sensed to obtain a plurality of pieces of temperature information; (c) according to the temperature information, the first change of the temperature drop in the first time period is calculated and obtained, and the calculation Obtain the temperature drop rate in the first time period; (d) compare the temperature drop rate with the first reference value, and output the first monitoring signal according to the comparison result; (e) separate the tin material from the end, wherein the end In the process of contacting with the tin material, the temperature of the end is sensed and a plurality of pieces of temperature information are obtained; and (f) according to the temperature information, a second variation of the temperature drop of the end is obtained by calculating and comparing the second variation and The second reference value is outputted according to the comparison result.
體現本案特徵與優點的一些典型實施例將在後段的說明中詳細敘述。應理解的是本案能夠在不同的態樣上具有各種的變化,其皆不脫離本案之範圍,且其中的說明及圖示在本質上係當作說明之用,而非架構於限制本案。Some typical embodiments embodying the features and advantages of the present case will be described in detail in the description of the latter paragraph. It should be understood that this case can have various changes in different aspects, all of which do not depart from the scope of this case, and the descriptions and diagrams therein are essentially for illustration purposes rather than limiting the present case.
第1圖係為本案較佳實施例之焊錫製程監控系統的結構示意圖。如第1圖所示,焊錫製程監控系統包含送錫單元1、烙鐵2、溫度感測單元3及處理單元7。送錫單元1係架構於提供錫料11。烙鐵2具有端部21,其中端部21係被加熱以於接觸錫料11時熔化錫料11。溫度感測單元3係採接觸或非接觸方式感測烙鐵2端部21的溫度;溫度感測單元3連接處理單元7,溫度感測單元3將感測取得之烙鐵2端部21的溫度資訊傳送給處理單元7處理。於一些實施例中,焊錫製程監控系統還包含溫度控制器4,溫度控制器4連接於烙鐵2,並架構於控制烙鐵2之端部21的溫度。FIG. 1 is a schematic structural diagram of a soldering process monitoring system according to a preferred embodiment of the present invention. As shown in FIG. 1 , the soldering process monitoring system includes a
以應用於印刷電路板的焊錫製程為例,本案之焊錫製程監控系統的具體監控方式係示例說明如下。Taking the soldering process applied to the printed circuit board as an example, the specific monitoring method of the soldering process monitoring system in this case is explained as follows.
在焊錫製程中,電子元件之針腳5穿過印刷電路板之焊點6,並通過焊錫來熔接針腳5及焊點6。焊錫過程之動作分解請參閱第2圖,其中係示例出焊錫過程中不同時間點的動作狀態,依序為動作狀態 (a)、(b)、(c)、(d) 及 (e)。在焊錫過程中,烙鐵2之端部21的溫度變化係如第3圖所示,且第3圖中亦標示出各個動作狀態所對應之時間點或時間段。In the soldering process, the
首先,在預備動作時,烙鐵2之端部21與送錫單元1所提供之錫料11均未接觸焊點6 (如第1圖所示),此時可預先對端部21進行加熱。First, during the preparatory action, neither the
接著,如動作狀態 (a) 所示,烙鐵2之端部21碰觸焊點6,並將端部21的溫度維持在高溫狀態,且焊點6之溫度亦隨之上升。此時,送錫單元1所提供之錫料11仍與端部21及焊點6維持一定距離。Then, as shown in the operating state (a), the
接著,如動作狀態 (b) 所示,送錫單元1提供錫料11,使錫料11接觸端部21或焊點6,在動作狀態 (b) 所對應之時間點後,接觸端部21或焊點6之錫料11被高溫所熔化,端部21的溫度因錫料11熔化而下降。其中,在錫料11接觸端部21或焊點6後的第一時間段Δt1內,端部21的溫度共下降第一變化量T1,此第一變化量T1可由溫度感測單元3通過感測端部21的溫度後傳送給處理單元7多筆不同時間量測之溫度資訊,並經由處理單元7計算取得,且處理單元7可進一步計算取得端部21在第一時間段Δt1內的溫度下降速度,其中溫度下降速度等於第一變化量T1除以第一時間段Δt1。第一時間段Δt1可例如但不限於等於一個單位時間。由於可能發生端部21正常熔錫、未熔錫或冷焊等情況,且各個情況所對應的溫度下降速度互不相同,因此處理單元7可將溫度下降速度與第一參考值比較,並依據比較結果輸出第一監控訊號,其中第一監控訊號係反映端部21是否確實熔化錫料。Next, as shown in the action state (b), the
接著,如動作狀態 (c) 所示,送錫單元1持續提供錫料11,端部21的溫度持續下降。Next, as shown in the operating state (c), the
而後,如動作狀態 (d) 所示,送錫單元1之出錫量已達到預設錫量,送錫單元1停止提供錫料11,使錫料11與端部21及焊點6相分離。在錫料11與端部21或焊點6相接觸之過程中,端部21的溫度共下降第二變化量T2,此第二變化量T2可由溫度感測單元3通過感測端部21的溫度後傳送給處理單元7多筆不同時間量測之溫度資訊,並經由處理單元7計算取得。由於第二變化量T2與端部21所熔化之錫料11的總量相關,故處理單元7可將第二變化量T2與第二參考值比較,並依據比較結果輸出第二監控訊號,其中第二監控訊號係反映端部21所熔化之錫料11的總量是否與預設熔錫量相符。Then, as shown in the action state (d), the tin output from the
最後,如動作狀態 (e) 所示,在端部21與焊點6相分離時,端部21的溫度會開始上升,且先前熔化之錫料11可能有部分會殘留於端部21上。Finally, as shown in the action state (e), when the
藉此,在焊錫製程中,可通過端部21的溫度變化即時判斷是否有缺錫或漏焊等問題,從而監控焊錫品質,且在焊錫品質不佳時可通過監控訊號即時得知並進行相應調整,有效提升焊錫製程的品質穩定性及稼動效率。此外,本案無需利用額外的視覺設備來進行品質檢測,可節省成本。In this way, in the soldering process, the temperature change of the
另外,在動作狀態 (d) 所對應之時間點後的第二時間段Δt2內,即錫料11與端部21或焊點6相分離後的第二時間段Δt2內,端部21的溫度共上升第三變化量T3,此第三變化量T3可由溫度感測單元3通過感測端部21的溫度後傳送給處理單元7多筆不同時間量測之溫度資訊,並經由處理單元7計算取得,溫度感測單元3再將上述溫度資訊傳送至處理單元7,且處理單元7可進一步計算取得端部21在第二時間段Δt2內的溫度回升速度,其中溫度回升速度等於第三變化量T3除以第二時間段Δt2。第二時間段Δt2可例如但不限於等於一個單位時間。溫度回升速度與殘留於端部21上之錫料11的總量相關,且殘留於端部21上之錫料11的總量會影響到焊點6上的有效著錫量。因此,處理單元7可將溫度回升速度與第三參考值比較,並依據比較結果輸出第三監控訊號,其中第三監控訊號係反映殘留於端部21上之錫料的總量是否與預設殘錫量相符,藉此可推估焊點6上的有效著錫量,並進而判斷是否有缺焊或漏焊等問題。In addition, within the second time period Δt2 after the time point corresponding to the action state (d), that is, within the second time period Δt2 after the
前述之第一參考值、第二參考值及第三參考值可通過統計理想之焊錫製程狀態下的溫度下降速度、第二變化量及溫度回升速度來獲得,且參考值與其對應溫度變化速度或變化量之間的比較方式亦可依實際需求而定。以下係說明一具體示例。The aforementioned first reference value, second reference value and third reference value can be obtained by counting the temperature drop rate, the second change amount and the temperature recovery rate under the ideal solder process state, and the reference value and its corresponding temperature change rate or The comparison method between the changes can also be determined according to the actual needs. A specific example is described below.
在相同針腳及焊點的條件下,進行三十次以上的焊錫製程,在每次的焊錫過程中,烙鐵2之端部21均正常熔錫,熔錫量共為5mm,且端部21上均無殘留之錫料。紀錄所有焊錫製程中的溫度下降速度V1、第二變化量T2及溫度回升速度V2於表一。Under the conditions of the same pins and solder joints, the soldering process is carried out more than 30 times. During each soldering process, the
表一
根據表1,可通過等式 (1) 及 (2) 計算獲得溫度下降速度V1、第二變化量T2及溫度回升速度V2的平均值及標準差如表二所示。 (1) (2) 其中, x為目標數值 (即為溫度下降速度V1、第二變化量T2或溫度回升速度V2), 為目標數值之平均值, n為實驗總次數, i代表次序, x i 為相應次序時的目標數值,σ為目標數值的標準差。通過計算獲得的溫度下降速度V1、第二變化量T2及溫度回升速度V2的平均值及標準差係列出於表二。 According to Table 1, the average value and standard deviation of the temperature drop speed V1, the second variation T2 and the temperature recovery speed V2 can be obtained through equations (1) and (2), as shown in Table 2. (1) (2) Among them, x is the target value (that is, the temperature drop speed V1, the second change amount T2 or the temperature recovery speed V2), is the average value of the target value, n is the total number of experiments, i represents the order, x i is the target value in the corresponding order, and σ is the standard deviation of the target value. The average and standard deviation series of the temperature drop speed V1, the second change amount T2 and the temperature recovery speed V2 obtained through calculation are shown in Table 2.
表二
根據表2,可將第一參考值、第二參考值及第三參考值分別設定為溫度下降速度V1、第二變化量T2及溫度回升速度V2的平均值、及,對應之標準差分別為 σ
V1、σ
T2及 σ
V2。而往後在監控焊錫製程時,即可以參考值為基準進行比較,並根據對應標準差設定容許的誤差範圍。舉例而言,於焊錫過程中,若V1 ≦+ 3σ
V1時,則代表烙鐵2之端部21正常熔錫;在預設熔錫量同為5mm的情況下,若+ 3σ
T2≧ T2 ≧- 3σ
T2,則代表端部21之熔錫量正常;若V2≧- 3σ
V2,則代表端部21上無殘留錫料。當然,實際比較方式並不以此為限,可依實際需求進行調整。
According to Table 2, the first reference value, the second reference value and the third reference value can be set as the average value of the temperature drop speed V1, the second change amount T2 and the temperature recovery speed V2, respectively, and the corresponding standard deviations are σ V1 , σ T2 and σ V2 . In the future, when monitoring the soldering process, the reference value can be compared as a benchmark, and the allowable error range can be set according to the corresponding standard deviation. For example, during the soldering process, if V1 ≦+ 3σ V1 , it means that the
第4圖係為本案較佳實施例之焊錫製程監控方法的流程示意圖,其中焊錫製程監控方法可適用於第1圖所示之焊錫製程監控系統。如第4圖所示,焊錫製程監控方法包含下列步驟。FIG. 4 is a schematic flowchart of a solder process monitoring method according to a preferred embodiment of the present invention, wherein the solder process monitoring method can be applied to the solder process monitoring system shown in FIG. 1 . As shown in Figure 4, the solder process monitoring method includes the following steps.
首先,於步驟S1中,持續感測烙鐵2之端部21的溫度。First, in step S1, the temperature of the
接著,於步驟S2中,加熱端部21,並將錫料11與端部21相接觸,其中在端部21接觸錫料11後的第一時間段Δt1內,溫度感測單元3感測端部21的溫度,並將所感測之多筆溫度資訊傳送給處理單元7。Next, in step S2 , the
於步驟S3中,處理單元7依據多筆溫度資訊計算取得端部21溫度下降的第一變化量T1,以及計算取得端部21的溫度在第一時間段Δt1內的溫度下降速度。In step S3, the
接著,於步驟S4中,處理單元7比較溫度下降速度及第一參考值,並依據比較結果輸出第一監控訊號,其中第一監控訊號係反映端部21是否確實熔化錫料11。Next, in step S4 , the
而後,於步驟S5中,將錫料11與端部21相分離,其中在端部21與錫料11相接觸之過程中,溫度感測單元3持續感測端部21的溫度,並將所感測之多筆溫度資訊傳送給處理單元7。Then, in step S5, the
最後,於步驟S6中,處理單元7依據多筆溫度資訊計算取得端部21溫度下降的第二變化量T2,且比較第二變化量T2及第二參考值,並依據比較結果輸出第二監控訊號,其中第二監控訊號係反映端部21所熔化之錫料11的總量是否與預設熔錫量相符。Finally, in step S6, the
此外,在步驟S5中將端部21與錫料11相分離後的第二時間段Δt2內,端部21的溫度上升。於一些實施例中,焊錫製程監控方法還包含步驟S7:在端部21與錫料11相分離後的第二時間段Δt2內,溫度感測單元3感測端部21的溫度,並將所感測之多筆溫度資訊傳送給處理單元7;以及步驟S8:處理單元7依據多筆溫度資訊計算取得端部21溫度上升的第三變化量T3,並計算取得端部21在第二時間段Δt2內的溫度回升速度,且比較溫度回升速度與第三參考值,以依據比較結果輸出第三監控訊號。在端部21與錫料11相分離後,端部21所熔化之錫料11部分殘留於端部21上,而第三監控訊號係反映殘留於端部21上之錫料的總量是否與預設殘錫量相符。In addition, in the second time period Δt2 after the
綜上所述,本案提供一種焊錫製程監控系統及方法,其係於焊錫過程中,通過烙鐵之端部的溫度變化來監控焊錫品質,因此在焊錫品質不佳時可即時得知並調整,有效提升焊錫製程的品質穩定性及稼動效率。此外,本案無需利用額外的視覺設備來進行品質檢測,可節省成本。To sum up, the present application provides a soldering process monitoring system and method, which monitors the soldering quality through the temperature change of the end of the soldering iron during the soldering process. Therefore, when the soldering quality is not good, it can be immediately known and adjusted, which is effective. Improve the quality stability and operation efficiency of the soldering process. In addition, in this case, there is no need to use additional visual equipment for quality inspection, which can save costs.
須注意,上述僅是為說明本案而提出之較佳實施例,本案不限於所述之實施例,本案之範圍由如附專利申請範圍決定。且本案得由熟習此技術之人士任施匠思而為諸般修飾,然皆不脫如附專利申請範圍所欲保護者。It should be noted that the above-mentioned preferred embodiments are only proposed to illustrate the present case, and the present case is not limited to the described embodiments, and the scope of the present case is determined by the scope of the appended patent application. And this case can be modified by Shi Jiangsi, a person who is familiar with this technology, but none of them can be protected as attached to the scope of the patent application.
1:送錫單元 11:錫料 2:烙鐵 21:端部 3:溫度感測單元 4:溫度控制器 5:針腳 6:焊點 7:處理單元 (a)、(b)、(c)、(d)、(e) :動作狀態 Δt1:第一時間段 Δt2:第二時間段 T1:第一變化量 T2:第二變化量 T3:第三變化量 V1:溫度下降速度 V2:溫度回升速度 、、:平均值 σ V1、σ T2、σ V2:標準差 S1、S2、S3、S4、S5、S6、S7、S8:步驟 1: Tin feeding unit 11: Tin material 2: Soldering iron 21: End 3: Temperature sensing unit 4: Temperature controller 5: Pin 6: Solder joint 7: Processing unit (a), (b), (c), (d), (e): Action state Δt1: First time period Δt2: Second time period T1: First change amount T2: Second change amount T3: Third change amount V1: Temperature drop speed V2: Temperature recovery speed , : Mean value σ V1 , σ T2 , σ V2 : Standard deviation S1, S2, S3, S4, S5, S6, S7, S8: Step
第1圖係為本案較佳實施例之焊錫製程監控系統的結構示意圖。FIG. 1 is a schematic structural diagram of a soldering process monitoring system according to a preferred embodiment of the present invention.
第2圖係為焊錫過程之動作分解示意圖。Figure 2 is an exploded schematic diagram of the action of the soldering process.
第3圖係為烙鐵之端部於焊錫過程中的溫度變化示意圖。Figure 3 is a schematic diagram of the temperature change of the tip of the soldering iron during the soldering process.
第4圖係為本案較佳實施例之焊錫製程監控方法的流程示意圖。FIG. 4 is a schematic flowchart of a method for monitoring a soldering process according to a preferred embodiment of the present invention.
1:送錫單元 11:錫料 2:烙鐵 21:端部 3:溫度感測單元 4:溫度控制器 5:針腳 6:焊點 7:處理單元 1: Tin delivery unit 11: Tin material 2: Soldering iron 21: End 3: Temperature sensing unit 4: Temperature controller 5: Pin 6: Solder joints 7: Processing unit
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