TWI760400B - System for using different chains to test differential signal and method thereof - Google Patents

Abstract

A system for using different chains to test differential signal and a method thereof are provided. By setting up two chains for two components on a circuit board, pushing test data of each of the two chains to each of the two chains sequentially in accordance with flow direction between the two chains for the two components generate output data, and determining a test result based on the test data of the two chains and the output data, the system and the method can use common way to test all kind of component on circuit board, and can achieve the effect of stable testing differential signal for all kind of component on circuit board.

Description

System and method for testing differential circuits with different scan chains

A circuit board testing system and method, particularly a system and method for testing differential circuits with different scan chains.

In recent years, the use of differential circuits on circuit boards to connect different electronic components has become very popular. Therefore, how to accurately test the differential circuits between two electronic components has become one of the urgent problems for manufacturers to solve.

Generally speaking, the test method of differential line is usually to perform functional test to check whether the differential signal can work normally. However, passing the functional test only means that the differential signal can be received and transmitted normally. If a certain pin of an electronic component such as "Tx_p" or "Rx_n" is open or the capacitor is soldered or even shorted, the differential signal may still be transmitted as usual, that is That said, the functional test doesn't test every line in the differential line, so the test reliability is not good.

In view of this, some manufacturers have proposed a test method using a Joint Test Action Group (JTAG) to test the connection between two electronic components by using a standard test access port and a boundary scan structure on the electronic components. differential line. However, there are usually different testing methods for different electronic components, which increases the testing cost.

To sum up, it can be seen that there has been a long-standing problem in the prior art that different testing methods need to be selected for different electronic components, so it is necessary to propose improved technical means to solve this problem.

In view of the problem in the prior art that different testing methods need to be selected for different electronic components, the present invention discloses a system and method for testing differential circuits with different scan chains, wherein:

The system for testing differential circuits with different scan chains disclosed in the present invention is used for testing a target circuit board. The target circuit board includes two electronic components and the two electronic components are electrically connected. The system disclosed by the present invention at least comprises: a signal input module; a test value definition module for defining the test values of the first scan chain and the second scan chain, the first scan chain and the second scan chain respectively correspond to two electronic components different electronic components; test data generation module for generating test data of the first scan chain and second scan chain respectively; scan chain initialization module for using the first scan chain and the second scan chain respectively through the signal input module The test value of the two scan chains initializes the first scan chain and the second scan chain; the circuit test module is used to sequentially push the first scan chain through the signal input module according to the data flow between the first scan chain and the second scan chain The test data of the chain and the second scan chain are sent to the first scan chain and the second scan chain; the signal acquisition module is used to obtain the result data; the result judgment module is used to obtain the result data according to the first scan chain and the second scan chain. Test data and result data to judge test results.

The method for testing differential circuits with different scan chains disclosed in the present invention is used to test a target circuit board. The target circuit board includes two electronic components, and the two electronic components are electrically connected. The steps of the method at least include: defining a first scan chain and a second scan chain. The test values of the two scan chains, the first scan chain and the second scan chain correspond to different electronic components of the two electronic components respectively; the first scan chain and the second scan chain are respectively used to initialize the first scan chain through the signal input module. The scan chain and the second scan chain; respectively generate test data corresponding to the first scan chain and the second scan chain; according to the data flow between the first scan chain and the second scan chain, the first scan chain and the second scan chain are sequentially pushed through the signal input module The test data of the scan chain and the second scan chain are sent to the first scan chain and the second scan chain, and the result data is obtained by the signal acquisition module; the test result is judged according to the test data and the result data of the first scan chain and the second scan chain .

The system and method disclosed in the present invention are as above, and the difference between the present invention and the prior art lies in that the present invention establishes scan chains for two electronic components on the target circuit board, and pushes the two scan chains in sequence according to the data flow between the two scan chains The test data is sent to the two scan chains, so that after the electronic components generate the result data, the test results are judged according to the test data and the result data of the two scan chains, so as to solve the problems existing in the prior art and achieve stable differential signals for all electronic components. Technical efficacy of the test.

The features and implementations of the present invention will be described in detail below in conjunction with the drawings and examples, and the content is sufficient to enable any person skilled in the relevant art to easily and fully understand the technical means applied to solve the technical problems of the present invention and implement them accordingly, thereby achieving The effect that the present invention can achieve.

The invention can detect whether the circuit connecting two electronic components on the target circuit board is normal. The electronic components mentioned in the present invention are usually integrated circuits, but the present invention is not limited thereto.

First, the system operation of the present invention is described with reference to “FIG. 1” of the system architecture diagram of the present invention for testing differential circuits with different scan chains. As shown in "FIG. 1", the system of the present invention includes a signal input module 110, a signal acquisition module 120, a test value definition module 150, a test data generation module 160, a scan chain initialization module 170, and a line test module The group 180, and the result judgment module 190.

The signal input module 110 is responsible for pushing the signal to the electronic components on the circuit board. The above circuit board can be the target circuit board to be tested, or it can be a sample circuit board that has been confirmed to work normally. Among them, the model, specification and configuration of the sample circuit board and the target circuit board are exactly the same, that is, the sample circuit board and the target circuit board are the same circuit board.

The signal input module 110 may include one or more input elements, and the input element may be a one-dimensional or multi-dimensional shift register, but the invention is not limited thereto. The input element can be connected to the electronic element on the target circuit board through a specific pin or a specific connection point of the electronic element.

Each input element included in the signal input module 110 can be connected with one or more electronic elements on the same target circuit board. When the input element is only connected with one electronic element, the input element can push a group of signals to the connected Among the electronic components, when the input component is connected with multiple electronic components, the input component can select one electronic component from the connected electronic components, and push a group of signals to the selected electronic component.

The signal acquisition module 120 is responsible for acquiring the signals generated by the electronic components on the circuit board. The above circuit board can be the target circuit board to be tested, or it can be a sample circuit board that has been confirmed to work normally. However, the signal acquisition module 120 and the signal input module 110 need to be connected to the electronic components on the same circuit board at the same time.

Similar to the signal input module 110 , the signal acquisition module 120 may include one or more acquisition elements, and the acquisition element may be a one-dimensional or multi-dimensional displacement register, but the invention is not limited thereto. The acquisition element can be connected to the electronic element on the target circuit board through a specific pin or a specific contact of the electronic element on the target circuit board.

Each acquisition component included in the signal acquisition module 120 can be connected to one or more electronic components on the same target circuit board. When the acquisition component is only connected to one electronic component, the acquisition component can receive all the connected electronic components. When the acquisition element is connected with a plurality of electronic elements, the acquisition element can select one electronic element from the connected electronic elements and receive a group of signals generated by the selected electronic element.

It should be noted that, in the present invention, an electronic component on the target circuit board, an input component in the signal input module 110 connected to the electronic component, and a signal acquisition module 120 connected to the electronic component An acquisition element can form a scan chain corresponding to the electronic element, that is to say, a scan chain corresponds to an electronic element on the target circuit board, and the scan chain contains the corresponding electronic element, the corresponding electronic element The input element to which the element is connected, and the acquisition element that is connected to the corresponding electronic element. Since in the present invention, the target circuit board includes two or more electronic components, therefore, in the present invention, at least two scan chains are included, which are called "first scan chain" and "second scan chain" respectively ". In addition, the electronic components corresponding to the first scan chain and the second scan chain are intended to be referred to as "first electronic components" and "second electronic components" in the present invention.

The test value definition module 150 is responsible for defining test values of the scan chains (the first scan chain and the second scan chain). In the present invention, "first test value" and "second test value" are also used to represent the test value of the first scan chain and the test value of the second scan chain, respectively.

The test value definition module 150 can transmit the test command to the sample components on the sample circuit board through the signal input module 110, and can obtain the sample data from the sample components on the sample circuit board through the signal acquisition module 120, and use the obtained The sample data is defined as the test value of the scan chain. The test value definition module 150 can also define the default value as the test value of the scan chain. The model and specification of the sample component and the second electronic component are the same, and the location and function of the sample component on the sample circuit board are the same as the location and function of the second electronic component on the target circuit board.

The test data generating module 160 is responsible for generating test data corresponding to the scan chains (the first scan chain and the second scan chain). For example, the test data generation module 160 can read the corresponding test data according to the identification data of the target circuit board, the identification data of the first electronic component, and the identification data of the second electronic component, but the test data generation module 160 generates the test data The form of information is not limited to the above.

The scan chain initialization module 170 is responsible for initializing the first scan chain using the first test value through the signal input module 110 , and is also responsible for initializing the second scan chain using the second test value through the signal input module 110 .

To be more specific, the scan chain initialization module 170 can firstly transmit the sample (SAMPLE) command, the test value definition module 150 and the first test value defined by the module 150 in sequence through the signal input module 110 (send again). , the test (EXTEST) command, and the first test value (sent for the third time) are pushed to the first electronic component, and the sampling data is obtained from the first electronic component through the signal acquisition module 120, and the obtained sampling data is used as a new and push the new first test value and the pulse (EXTEST_PULSE) command to the first electronic element in sequence through the signal input module 110, and then, the scan chain initialization module 170 can repeat the acquisition mode through the signal The sampling data obtained by the group 120 is used as the new first test value, and the changed new first test value is sent to the first electronic component through the signal input module 110, and the first electronic component is sent through the signal acquisition module 120. The element obtains sampling data several times, thereby initializing the first scan chain. Similarly, the scan chain initialization module 170 can also use the above process of initializing the first scan chain, and the sampling command, the second test value, the second test value, the test command, and the second test value are sequentially transmitted through the signal input module 110 , the sampling data (the new second test value) and the pulse command are pushed to the second electronic element, and the sampling data as the new second test value is repeatedly pushed several times, thereby initializing the second scan chain.

The scan chain initialization module 170 can also sequentially push the test (EXTEST) command and the new first test value pushed to the first scan chain through the signal input module 110 after the line test module 180 completes the test. the first scan chain, so that the first scan chain is restored to the initialized state. Similarly, the scan chain initialization module 170 can also sequentially push the test command and the new second test value pushed to the second scan chain to the signal input module 110 after the line test module 180 completes the test. The second scan chain restores the second scan chain to an initialized state.

The circuit test module 180 is responsible for sequentially generating the test data generated by the module 160 through the signal input module 110 according to the data flow between the electronic components corresponding to the first scan chain and the electronic components corresponding to the second scan chain. Test data of a scan chain and a second scan chain are pushed to the first scan chain and the second scan chain. For example, to test whether the data or signal sent from the first electronic component to the second electronic component is correct, the line test module 180 can first push the test data of the first scan chain to the second electronic component through the signal input module 110. One scan chain, and then push the test data of the second scan chain to the second scan chain. On the contrary, to test whether the data or signal sent from the second electronic element to the first electronic element is correct, the circuit test module 180 The test data of the second scan chain may be pushed to the second scan chain through the signal input module 110 first, and then the test data of the first scan chain may be pushed to the first scan chain.

It is worth mentioning that the line test module 180 pushes the test data to the scan chains (the first scan chain and the second scan chain) through the signal input module 110, and only changes the signal of the pin to be tested, not the test data. The signal of the pin will not be changed, so as to ensure that the test data pushed by the circuit test module 180 to the scan chain conforms to the actual working logic of the motherboard, and avoid unexpected data generated by electronic components or unexpected signals such as power failure of the motherboard. condition.

The line test module 180 is also responsible for obtaining the result data through the signal obtaining module 120 . The result data obtained by the circuit test module 180 includes the output result of the first electronic component and the output result of the second electronic component.

In some embodiments, it may happen that the electronic component (such as the second electronic component) that obtains the test data pushed by the line test module 180 through the signal input module 110 later obtains the test data first, and first obtains the test data. The electronic components (such as the first electronic component) of the test data pushed by the group 180 through the signal input module 110 have not yet generated output signals, or the output signals generated by the electronic components that first obtained the test data pushed by the circuit test module 180 have not yet been generated. It is transmitted to the electronic device that obtains the test data later, resulting in the situation that the electronic device that obtains the test data later produces an unknown result. Therefore, the circuit test module 180 can push the test of the first scan chain/second scan chain according to the previous time. The sequence of data, the test data of the first scan chain/second scan chain generated by the test data generation module 160 is pushed to the first scan chain/second scan chain again through the signal input module 110, so as to avoid the above-mentioned first scan chain. The problem of out-of-sync data or signal between electronic components and second electronic components.

The result judgment module 190 is responsible for the test data of the first scan chain and the test data of the second scan chain pushed by the line test module 180 through the signal input module 110 , and the line test module 180 obtains the data of the module 120 through the signal. The obtained result data is used to judge the test result.

Next, an embodiment is used to explain the operation system and method of the present invention, and please refer to "FIG. 2" for the flowchart of the method for testing differential circuits with different scan chains in the present invention. In this embodiment, it is assumed that the target circuit board is a motherboard, the first electronic component is a SATA control chip, the second electronic component is a PCH chip, and there is a bidirectional differential circuit between the first electronic component and the second electronic component, but The present invention is not limited to this.

When using the present invention to test the circuit between the first electronic element and the second electronic element, the test value of the first scan chain and the second scan chain can be defined through the test value definition module 150 (step 310 ). In this embodiment, it is assumed that the test value definition module 150 can define the test value of the first scan chain by using a default value, for example, all the bits defining the test value of the first scan chain are 1. In addition, the signal input module 110 and the signal acquisition module 120 can be connected to the sample device first, so that the test value definition module 150 can push the test command to the sample device on the sample circuit board through the signal input module 110, The acquisition module 120 acquires sample data from the sample components on the sample circuit board, so as to define the sample data acquired through the signal acquisition module 120 as the test value of the second scan chain.

After the test value definition module 150 defines the test values of the first scan chain and the second scan chain (step 310 ), the scan chain initialization module 170 may use the first test value defined by the test value definition module 150 to initialize the first scan chain The scan chain may be initialized using the second test value defined by the test value definition module 150 (step 320). In this embodiment, the scan chain initialization module 170 can respectively perform the following steps on the first scan chain and the second scan chain: first, the sampling command, the test value of the scan chain, and the test value of the scan chain are transmitted through the signal input module 110 . , the test command, and the test value of the scan chain are sequentially pushed to the electronic components corresponding to the scan chain, and the sampling data output by the electronic components corresponding to the scan chain is obtained through the signal acquisition module 120. The data is used as a new test value, and the new test value and pulse command are sequentially pushed to the electronic components corresponding to the scan chain through the signal input module 110 again. The sampling data output by the electronic component is replaced with the last obtained sampling data again, and the new test value is pushed to the electronic component corresponding to the scan chain through the signal input module 110. Finally, the above-mentioned obtaining and The sampling data output by the electronic element corresponding to the scan chain is pushed to the electronic element corresponding to the scan chain as a new test value for a certain number of steps, thereby initializing the first scan chain and the second scan chain.

Also, after the test value definition module 150 defines the test values of the first scan chain and the second scan chain (step 310 ), the test data generation module 160 can respectively generate test data of the first scan chain and the second scan chain (step 310 ). 330).

In practice, the scan chain initialization module 170 and the test data generation module 160 are not executed in a sequential order, that is to say, the scan chain initialization module 170 can also generate the first scan chain before the test data generation module 160 After the test data of the second scan chain is obtained (step 330 ), the first scan chain and the second scan chain are respectively initialized by using the first test value and the second test value (step 320 ).

The scan chain initialization module 170 uses the first test value and the second test value to initialize the first scan chain and the second scan chain respectively (step 320 ), and the test data generation module 160 generates the first scan chain and the second scan chain After the test data (step 330), the circuit test module 180 can sequentially push the first scan chain and the second scan chain through the signal input module 110 according to the data flow between the first electronic element and the second electronic element. The test data is sent to the first scan chain and the second scan chain (step 350), so that the result determination module 190 can obtain the result data including the signals output by the first electronic component and the second electronic component through the signal acquisition module 120 (step 350). 360). In this embodiment, since there is a two-way circuit between the first electronic element and the second electronic element, that is, the lines used for transmitting and receiving data or signals between the first electronic element and the second electronic element are not shared. Therefore, the circuit test module 180 needs to test the circuit flowing from the first electronic component to the second electronic component, and also needs to test the circuit flowing from the second electronic component to the first electronic component. Assuming that after the test fixture is connected to the SATA slot on the target circuit board, the circuit test module 180 will first test the circuit flowing from the first electronic component to the second electronic component, then the circuit test module 180 can first pass the signal input module 110 pushes the test data of the first scan chain to the first scan chain, and then pushes the test data of the second scan chain to the second scan chain through the signal input module 110 . The test data of the scan chain allows the data transmitted by the test tool to pass through the first electronic component and then be sent to the second electronic component, so that the result judgment module 190 can obtain the output from the first electronic component through the signal acquisition module 120 respectively. The signal, similarly, the second electronic component can pass the data from the first electronic component through the second electronic component according to the received test data of the second scan chain, so that the result judgment module 190 can pass the signal acquisition module 120 The signals output by the second electronic components are obtained respectively. Then, the circuit test module 180 can continue to test the circuit flowing from the second electronic component to the first electronic component. The circuit test module 180 can push the test data of the second scan chain to the second scan chain through the signal input module 110 first. Then, the test data of the first scan chain is pushed to the first scan chain through the signal input module 110. After that, the result judgment module 190 can respectively obtain the signals output by the first electronic component and the second electronic component through the signal acquisition module 120. , and use the signal obtained after pushing the test data of the first scan chain and the signal obtained after pushing the test data of the second scan chain as the result data.

After the result judging module 190 obtains the result data through the signal obtaining module 120 (step 360 ), the test can be judged according to the obtained result data and the test data generating module 160 to generate the test data of the first scan chain and the second scan chain result (step 370).

To sum up, it can be seen that the difference between the present invention and the prior art lies in establishing scan chains for two electronic components on the target circuit board, and sequentially pushing the test data of the two scan chains to the two scan chains according to the data flow between the two scan chains. Two scan chains, so that after the electronic components generate the result data, the technical means of judging the test results according to the test data and the result data of the two scan chains, this technical means can solve the need to select different tests for different electronic components in the prior art Therefore, the technical effect of stably performing differential signal testing on all electronic components is achieved.

In the above embodiment, the circuit test module 180 sequentially pushes the test data of the first scan chain and the second scan chain to the first scan chain through the signal input module 110 according to the data flow direction between the first electronic element and the second electronic element. After one scan chain and the second scan chain (step 350 ), the circuit test module 180 can push the test data of the first scan chain and the second scan chain to the first scan chain and the second scan chain in sequence again, and then The result judging module 190 obtains result data including the signals output by the first electronic component and the second electronic component through the signal obtaining module 120 (step 360 ).

In addition, in the above-mentioned embodiment, if not only the circuit between the two electronic components of the target circuit board is tested, the result judgment module 190 obtains the circuit including the first electronic component and the second electronic component through the signal acquisition module 120. After outputting the result data of the signal (step 360 ), the scan chain initialization module 170 can push the test command and the first test value to the first scan chain through the signal input module 110 , so that the first scan chain can return to the first scan chain. In the initial state, the test command and the second test value can also be pushed to the second scan chain through the signal input module 110, so as to return the second scan chain to the initial state (step 380).

Furthermore, the method for testing differential circuits with different scan chains of the present invention can be implemented in hardware, software, or a combination of hardware and software, and can also be implemented in a centralized manner in a computer system or with different components dispersed in several mutuals. Lianzhi's computer system is implemented in a decentralized manner.

Although the embodiments disclosed in the present invention are as above, the above-mentioned contents are not intended to directly limit the scope of the patent protection of the present invention. Any person with ordinary knowledge in the technical field to which the present invention pertains, without departing from the spirit and scope disclosed by the present invention, makes slight modifications to the form and details of the implementation of the present invention, all belong to the patent protection of the present invention scope. The scope of patent protection of the present invention shall still be defined by the appended patent application scope.

110‧‧‧Signal input module 120‧‧‧Signal acquisition module 150‧‧‧Test value definition module 160‧‧‧Test data generation module 170‧‧‧Scan chain initialization module 180‧‧‧Line test module Set 190‧‧‧Result Judgment Module Step 310‧‧‧Define Test Values of the First Scan Chain and Second Scan Chain Step 320‧‧‧Use the test values of the first scan chain and the second scan chain to initialize the first scan chain and the second scan chain step 330‧‧‧generate the test data of the first scan chain and the second scan chain step 350‧‧‧ according to the data flow between the first scan chain and the second scan chain, push the first scan chain in sequence and the test data of the second scan chain to the first scan chain and the second scan chain Step 360‧‧‧obtain the result data Step 370‧‧‧ determine the test result according to the test data and the result data of the first scan chain and the second scan chain Step 380‧‧‧sequentially push the test command and the test values of the first scan chain and the second scan chain to the first scan chain and the second scan chain

FIG. 1 is a schematic diagram of a system for testing differential circuits with different scan chains according to the present invention. FIG. 2 is a flowchart of a method for testing differential circuits with different scan chains according to the present invention.

Step 310‧‧‧Define the test values of the first scan chain and the second scan chain

Step 320‧‧‧Initialize the first scan chain and the second scan chain using the test values of the first scan chain and the second scan chain

Step 330‧‧‧generate test data of the first scan chain and the second scan chain

Step 350‧‧‧sequentially push the test data of the first scan chain and the second scan chain to the first scan chain and the second scan chain according to the data flow direction between the first scan chain and the second scan chain

Step 360‧‧‧Get the result data

Step 370‧‧‧Determine the test result according to the test data and result data of the first scan chain and the second scan chain

Step 380‧‧‧sequentially push the test command and the test values of the first scan chain and the second scan chain to the first scan chain and the second scan chain

Claims (10)

A method for testing differential circuits with different scan chains is used to test a target circuit board, the target circuit board includes two electronic components, and the two electronic components are electrically connected, and the method at least includes the following steps: defining a first scan chain and a test value of a second scan chain, the first scan chain and the second scan chain respectively correspond to different electronic components of the two electronic components; using the first scan chain and the second scan chain through a signal input module initializing the first scan chain and the second scan chain with the test value of the chain; generating test data corresponding to the first scan chain and the second scan chain respectively; according to the relationship between the first scan chain and the second scan chain Data flow direction, push the test data of the first scan chain and the second scan chain to the first scan chain and the second scan chain in sequence through the signal input module, and obtain a result data through a signal acquisition module ; and judge the test result according to the test data of the first scan chain and the second scan chain and the result data. The method for testing differential circuits with different scan chains as described in claim 1, wherein the step of defining the test value of the first scan chain is the same as sending a test command to a sample circuit board through the signal input module After the device, a sample data output by the sample device is received through the signal acquisition module, and the sample data is defined as the test value of the first scan chain. The method for testing differential circuits with different scan chains as described in claim 1, wherein the first scan chain and the second scan chain are initialized through the signal input module using the test values of the first scan chain and the second scan chain The step of the second scan chain is to sequentially transmit a sampling command once, a test value corresponding to the first scan chain/the second scan chain twice, a test command, and a time corresponding to the first scan chain through the signal input module. After the test value corresponding to the scan chain/the second scan chain is sent to the electronic component corresponding to the first scan chain/the second scan chain, the signal acquisition module receives the corresponding test value from the first scan chain/the second scan chain A sampled data output by the corresponding electronic component, and after the sampled data is used as the test value, the test value and a pulse corresponding to the first scan chain/the second scan chain are sequentially input through the signal input module The command is sent to the electronic element corresponding to the first scan chain/the second scan chain, and the sampling data received by the signal input module from the electronic element corresponding to the first scan chain/the second scan chain is repeated As the test value, the test value is transmitted to the electronic components corresponding to the first scan chain/the second scan chain through the signal input module. The method for testing differential circuits with different scan chains as described in claim 1, wherein the first scan is sequentially pushed through the signal input module according to the data flow between the first scan chain and the second scan chain The step of sending the test data of the first scan chain and the second scan chain to the first scan chain and the second scan chain further includes pushing the test data of the first scan chain and the second scan chain to the second scan chain again through the signal input module. Steps of the first scan chain and the second scan chain. The method for testing differential circuits with different scan chains as described in claim 1, wherein after the step of obtaining the result data through the signal acquisition module, the method further includes respectively pushing a test through the signal input module Steps of commanding, testing values of the first scan chain and the second scan chain to the first scan chain and the second scan chain. A system for testing differential circuits with different scan chains is used to test a target circuit board, the target circuit board includes two electronic components, and the two electronic components are electrically connected, the system at least includes: a signal input module; a test a value definition module for defining test values of a first scan chain and a second scan chain, the first scan chain and the second scan chain are respectively corresponding to different electronic components in the two electronic components; a test data generation a module for generating test data corresponding to the first scan chain and the second scan chain; a scan chain initialization module for using the first scan chain and the second scan chain through the signal input module The test value initializes the first scan chain and the second scan chain; a line test module is used for sequentially pushing through the signal input module according to the data flow between the first scan chain and the second scan chain The test data of the first scan chain and the second scan chain are sent to the first scan chain and the second scan chain; a signal acquisition module is used to obtain a result data; and a result judgment module is used according to The test data of the first scan chain and the second scan chain and the result data determine the test result. The system for testing differential circuits with different scan chains as described in claim 6, wherein the test value definition module is a sample data definition obtained by the signal acquisition module from a sample component of a sample circuit board is the test value of the first scan chain, wherein the sample data is generated by the sample element according to a test command sent by the signal input module. The system for testing differential circuits with different scan chains as described in claim 6, wherein the scan chain initialization module sequentially transmits a sampling command once, twice with the first scan chain through the signal input module / A test value corresponding to the second scan chain, a test command, and a test value corresponding to the first scan chain/the second scan chain to the electronic components corresponding to the first scan chain/the second scan chain , and obtain a sampled data from the electronic components corresponding to the first scan chain/the second scan chain through the signal acquisition module, use the sampled data as the test value, and use the signal input module to sequentially The test value and a pulse command corresponding to the first scan chain/the second scan chain are transmitted to the electronic components corresponding to the first scan chain/the second scan chain, and the signal acquisition module is repeatedly sent from and The sampling data obtained by the electronic components corresponding to the first scan chain/the second scan chain is used as the test value, and the changed test value is transmitted to the first scan chain/the test value through the signal input module Electronic components corresponding to the second scan chain. The system for testing differential circuits with different scan chains as described in claim 6, wherein the circuit test module is further used to push the test of the first scan chain and the second scan chain again through the signal input module data to the first scan chain and the second scan chain. The system for testing differential circuits with different scan chains as described in claim 6, wherein the scan chain initialization module is further used to push a test command, the first scan chain/the second scan chain through the signal input module The test value of the scan chain is to the first scan chain/the second scan chain.

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