TWI759447B - Paste composition for solar cells - Google Patents
Paste composition for solar cells Download PDFInfo
- Publication number
- TWI759447B TWI759447B TW107109708A TW107109708A TWI759447B TW I759447 B TWI759447 B TW I759447B TW 107109708 A TW107109708 A TW 107109708A TW 107109708 A TW107109708 A TW 107109708A TW I759447 B TWI759447 B TW I759447B
- Authority
- TW
- Taiwan
- Prior art keywords
- aluminum
- silicon
- powder
- paste composition
- solar cell
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- 239000000203 mixture Substances 0.000 title claims abstract description 64
- 239000000843 powder Substances 0.000 claims abstract description 71
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 70
- 239000010703 silicon Substances 0.000 claims abstract description 70
- CSDREXVUYHZDNP-UHFFFAOYSA-N alumanylidynesilicon Chemical compound [Al].[Si] CSDREXVUYHZDNP-UHFFFAOYSA-N 0.000 claims abstract description 57
- 229910000676 Si alloy Inorganic materials 0.000 claims abstract description 53
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 44
- 238000002161 passivation Methods 0.000 claims abstract description 34
- 239000004020 conductor Substances 0.000 claims abstract description 33
- 239000011521 glass Substances 0.000 claims abstract description 32
- 239000013078 crystal Substances 0.000 claims abstract description 30
- 238000000034 method Methods 0.000 claims description 26
- 238000000576 coating method Methods 0.000 claims description 18
- 239000011248 coating agent Substances 0.000 claims description 16
- 238000005245 sintering Methods 0.000 claims description 4
- 238000006243 chemical reaction Methods 0.000 abstract description 31
- 238000010304 firing Methods 0.000 abstract description 20
- 230000003068 static effect Effects 0.000 abstract description 11
- 238000012360 testing method Methods 0.000 abstract description 11
- 230000007423 decrease Effects 0.000 abstract description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 69
- 239000000758 substrate Substances 0.000 description 33
- 239000004065 semiconductor Substances 0.000 description 23
- 229910052782 aluminium Inorganic materials 0.000 description 14
- 238000009689 gas atomisation Methods 0.000 description 14
- 238000011156 evaluation Methods 0.000 description 12
- 239000012535 impurity Substances 0.000 description 11
- 230000000052 comparative effect Effects 0.000 description 10
- -1 for example Substances 0.000 description 10
- 229910045601 alloy Inorganic materials 0.000 description 9
- 239000000956 alloy Substances 0.000 description 9
- 229910052751 metal Inorganic materials 0.000 description 8
- 239000002184 metal Substances 0.000 description 8
- 229920005989 resin Polymers 0.000 description 8
- 239000011347 resin Substances 0.000 description 8
- 238000000889 atomisation Methods 0.000 description 5
- 229910015902 Bi 2 O 3 Inorganic materials 0.000 description 4
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 4
- 150000001875 compounds Chemical class 0.000 description 4
- 229910052698 phosphorus Inorganic materials 0.000 description 4
- 239000011574 phosphorus Substances 0.000 description 4
- 238000005215 recombination Methods 0.000 description 4
- 230000006798 recombination Effects 0.000 description 4
- 239000002904 solvent Substances 0.000 description 4
- 229910052581 Si3N4 Inorganic materials 0.000 description 3
- 239000000654 additive Substances 0.000 description 3
- AZDRQVAHHNSJOQ-UHFFFAOYSA-N alumane Chemical group [AlH3] AZDRQVAHHNSJOQ-UHFFFAOYSA-N 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 3
- 238000001816 cooling Methods 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 3
- 238000001035 drying Methods 0.000 description 3
- 239000003112 inhibitor Substances 0.000 description 3
- 238000002844 melting Methods 0.000 description 3
- 230000008018 melting Effects 0.000 description 3
- 239000002923 metal particle Substances 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 238000007650 screen-printing Methods 0.000 description 3
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 239000001856 Ethyl cellulose Substances 0.000 description 2
- ZZSNKZQZMQGXPY-UHFFFAOYSA-N Ethyl cellulose Chemical compound CCOCC1OC(OC)C(OCC)C(OCC)C1OC1C(O)C(O)C(OC)C(CO)O1 ZZSNKZQZMQGXPY-UHFFFAOYSA-N 0.000 description 2
- XUMBMVFBXHLACL-UHFFFAOYSA-N Melanin Chemical compound O=C1C(=O)C(C2=CNC3=C(C(C(=O)C4=C32)=O)C)=C2C4=CNC2=C1C XUMBMVFBXHLACL-UHFFFAOYSA-N 0.000 description 2
- 239000004698 Polyethylene Substances 0.000 description 2
- 239000002202 Polyethylene glycol Substances 0.000 description 2
- 239000004721 Polyphenylene oxide Substances 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 229910052797 bismuth Inorganic materials 0.000 description 2
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229920001249 ethyl cellulose Polymers 0.000 description 2
- 235000019325 ethyl cellulose Nutrition 0.000 description 2
- 239000001307 helium Substances 0.000 description 2
- 229910052734 helium Inorganic materials 0.000 description 2
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 2
- 229920000570 polyether Polymers 0.000 description 2
- 229920000573 polyethylene Polymers 0.000 description 2
- 229920001223 polyethylene glycol Polymers 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 239000002994 raw material Substances 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 239000003566 sealing material Substances 0.000 description 2
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 description 2
- ODCMOZLVFHHLMY-UHFFFAOYSA-N 1-(2-hydroxyethoxy)hexan-2-ol Chemical compound CCCCC(O)COCCO ODCMOZLVFHHLMY-UHFFFAOYSA-N 0.000 description 1
- VXQBJTKSVGFQOL-UHFFFAOYSA-N 2-(2-butoxyethoxy)ethyl acetate Chemical compound CCCCOCCOCCOC(C)=O VXQBJTKSVGFQOL-UHFFFAOYSA-N 0.000 description 1
- KXGFMDJXCMQABM-UHFFFAOYSA-N 2-methoxy-6-methylphenol Chemical compound [CH]OC1=CC=CC([CH])=C1O KXGFMDJXCMQABM-UHFFFAOYSA-N 0.000 description 1
- QCAHUFWKIQLBNB-UHFFFAOYSA-N 3-(3-methoxypropoxy)propan-1-ol Chemical compound COCCCOCCCO QCAHUFWKIQLBNB-UHFFFAOYSA-N 0.000 description 1
- 229920000178 Acrylic resin Polymers 0.000 description 1
- 239000004925 Acrylic resin Substances 0.000 description 1
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- 229910021364 Al-Si alloy Inorganic materials 0.000 description 1
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- 239000000020 Nitrocellulose Substances 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- 239000004696 Poly ether ether ketone Substances 0.000 description 1
- 229930182556 Polyacetal Natural products 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 239000004743 Polypropylene Substances 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- 239000004372 Polyvinyl alcohol Substances 0.000 description 1
- 229920001328 Polyvinylidene chloride Polymers 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 229920001807 Urea-formaldehyde Polymers 0.000 description 1
- 150000007513 acids Chemical class 0.000 description 1
- 229920000122 acrylonitrile butadiene styrene Polymers 0.000 description 1
- 125000001931 aliphatic group Chemical group 0.000 description 1
- 229920000180 alkyd Polymers 0.000 description 1
- 239000002518 antifoaming agent Substances 0.000 description 1
- 239000003963 antioxidant agent Substances 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- QVQLCTNNEUAWMS-UHFFFAOYSA-N barium oxide Inorganic materials [Ba]=O QVQLCTNNEUAWMS-UHFFFAOYSA-N 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- ODINCKMPIJJUCX-UHFFFAOYSA-N calcium oxide Inorganic materials [Ca]=O ODINCKMPIJJUCX-UHFFFAOYSA-N 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 239000007822 coupling agent Substances 0.000 description 1
- 150000001913 cyanates Chemical class 0.000 description 1
- 235000014113 dietary fatty acids Nutrition 0.000 description 1
- MTHSVFCYNBDYFN-UHFFFAOYSA-N diethylene glycol Chemical class OCCOCCO MTHSVFCYNBDYFN-UHFFFAOYSA-N 0.000 description 1
- 229940028356 diethylene glycol monobutyl ether Drugs 0.000 description 1
- 239000000194 fatty acid Substances 0.000 description 1
- 229930195729 fatty acid Natural products 0.000 description 1
- 150000004665 fatty acids Chemical class 0.000 description 1
- 238000011049 filling Methods 0.000 description 1
- HDNHWROHHSBKJG-UHFFFAOYSA-N formaldehyde;furan-2-ylmethanol Chemical compound O=C.OCC1=CC=CO1 HDNHWROHHSBKJG-UHFFFAOYSA-N 0.000 description 1
- 239000007849 furan resin Substances 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 239000012948 isocyanate Substances 0.000 description 1
- 238000007561 laser diffraction method Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229920001220 nitrocellulos Polymers 0.000 description 1
- JCGNDDUYTRNOFT-UHFFFAOYSA-N oxolane-2,4-dione Chemical compound O=C1COC(=O)C1 JCGNDDUYTRNOFT-UHFFFAOYSA-N 0.000 description 1
- 239000005011 phenolic resin Substances 0.000 description 1
- 229920001568 phenolic resin Polymers 0.000 description 1
- BSPSZRDIBCCYNN-UHFFFAOYSA-N phosphanylidynetin Chemical compound [Sn]#P BSPSZRDIBCCYNN-UHFFFAOYSA-N 0.000 description 1
- 150000003014 phosphoric acid esters Chemical class 0.000 description 1
- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 1
- 229920002037 poly(vinyl butyral) polymer Polymers 0.000 description 1
- 229920001230 polyarylate Polymers 0.000 description 1
- 229920001707 polybutylene terephthalate Polymers 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 229920002530 polyetherether ketone Polymers 0.000 description 1
- 229920000139 polyethylene terephthalate Polymers 0.000 description 1
- 239000005020 polyethylene terephthalate Substances 0.000 description 1
- 239000009719 polyimide resin Substances 0.000 description 1
- 238000006116 polymerization reaction Methods 0.000 description 1
- 239000004926 polymethyl methacrylate Substances 0.000 description 1
- 229920006324 polyoxymethylene Polymers 0.000 description 1
- 229920001955 polyphenylene ether Polymers 0.000 description 1
- 229920001155 polypropylene Polymers 0.000 description 1
- 229920000136 polysorbate Polymers 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 1
- 239000004810 polytetrafluoroethylene Substances 0.000 description 1
- 229920002689 polyvinyl acetate Polymers 0.000 description 1
- 239000011118 polyvinyl acetate Substances 0.000 description 1
- 229920002451 polyvinyl alcohol Polymers 0.000 description 1
- 239000004800 polyvinyl chloride Substances 0.000 description 1
- 229920000915 polyvinyl chloride Polymers 0.000 description 1
- 239000005033 polyvinylidene chloride Substances 0.000 description 1
- 238000010248 power generation Methods 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000011863 silicon-based powder Substances 0.000 description 1
- 229920002050 silicone resin Polymers 0.000 description 1
- IATRAKWUXMZMIY-UHFFFAOYSA-N strontium oxide Inorganic materials [O-2].[Sr+2] IATRAKWUXMZMIY-UHFFFAOYSA-N 0.000 description 1
- JBQYATWDVHIOAR-UHFFFAOYSA-N tellanylidenegermanium Chemical compound [Te]=[Ge] JBQYATWDVHIOAR-UHFFFAOYSA-N 0.000 description 1
- 229920002803 thermoplastic polyurethane Polymers 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- 239000013008 thixotropic agent Substances 0.000 description 1
- 229920006337 unsaturated polyester resin Polymers 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- 239000011800 void material Substances 0.000 description 1
- 239000001993 wax Substances 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
- XLOMVQKBTHCTTD-UHFFFAOYSA-N zinc oxide Inorganic materials [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 1
- ZFZQOKHLXAVJIF-UHFFFAOYSA-N zinc;boric acid;dihydroxy(dioxido)silane Chemical compound [Zn+2].OB(O)O.O[Si](O)([O-])[O-] ZFZQOKHLXAVJIF-UHFFFAOYSA-N 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/042—PV modules or arrays of single PV cells
- H01L31/048—Encapsulation of modules
- H01L31/0481—Encapsulation of modules characterised by the composition of the encapsulation material
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C8/00—Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
- C03C8/14—Glass frit mixtures having non-frit additions, e.g. opacifiers, colorants, mill-additions
- C03C8/18—Glass frit mixtures having non-frit additions, e.g. opacifiers, colorants, mill-additions containing free metals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/14—Conductive material dispersed in non-conductive inorganic material
- H01B1/16—Conductive material dispersed in non-conductive inorganic material the conductive material comprising metals or alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/20—Conductive material dispersed in non-conductive organic material
- H01B1/22—Conductive material dispersed in non-conductive organic material the conductive material comprising metals or alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B13/00—Apparatus or processes specially adapted for manufacturing conductors or cables
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022408—Electrodes for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/022425—Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
- H01L31/022441—Electrode arrangements specially adapted for back-contact solar cells
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/036—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/06—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers
- H01L31/068—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers the potential barriers being only of the PN homojunction type, e.g. bulk silicon PN homojunction solar cells or thin film polycrystalline silicon PN homojunction solar cells
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- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/186—Particular post-treatment for the devices, e.g. annealing, impurity gettering, short-circuit elimination, recrystallisation
- H01L31/1868—Passivation
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/547—Monocrystalline silicon PV cells
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
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- Chemical & Material Sciences (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Dispersion Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Sustainable Development (AREA)
- Sustainable Energy (AREA)
- Manufacturing & Machinery (AREA)
- Crystallography & Structural Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Inorganic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Geochemistry & Mineralogy (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Photovoltaic Devices (AREA)
- Conductive Materials (AREA)
- Glass Compositions (AREA)
Abstract
本發明提供一種太陽電池用膏狀組成物,其係適用在對於鈍化膜之開口部的直徑為100μm以下,開口部的總面積為結晶系太陽電池單元之面積的0.5~5%之結晶系太陽電池單元的情況下,可達成優異的轉換效率,同時抑制燒成後之電極層界面中的孔洞的發生,可進一步地抑制靜態機械負載試驗後之轉換效率的下降率。 The present invention provides a paste composition for solar cells, which is suitable for crystalline solar cells where the diameter of the opening of the passivation film is 100 μm or less, and the total area of the openings is 0.5 to 5% of the area of the crystalline solar cell. In the case of a battery cell, excellent conversion efficiency can be achieved, and the occurrence of voids in the electrode layer interface after firing can be suppressed, and the rate of decrease in conversion efficiency after a static mechanical load test can be further suppressed.
本發明,具體而言,提供一種含有玻璃粉末、有機載體及導電性材料之太陽電池用膏狀組成物,用於對具有設置開口部之鈍化膜之結晶系太陽電池單元形成p+層之用途,其特徵係:(1)前述開口部的直徑為100μm以下,前述開口部的總面積為前述結晶系太陽電池單元之面積的0.5~5%;(2)前述導電性材料,含有鋁粉末及具有長徑5μm以下之矽的初晶之鋁-矽合金粉末。 Specifically, the present invention provides a paste composition for solar cells containing glass powder, an organic vehicle, and a conductive material for forming a p + layer in a crystalline solar cell having a passivation film provided with openings , which is characterized by: (1) the diameter of the opening is 100 μm or less, and the total area of the opening is 0.5 to 5% of the area of the crystalline solar cell; (2) the conductive material contains aluminum powder and A primary crystal aluminum-silicon alloy powder with a long diameter of 5 μm or less of silicon.
Description
本發明係關於一種太陽電池用膏狀組成物,特別係關於目的為對於具有鈍化膜之結晶系太陽電池單元形成p+層的太陽電池用膏狀組成物,且前述鈍化膜係以雷射照射等設置開口部。本發明更具體地係有關於一種太陽電池用膏狀組成物,其適用在對於開口部的直徑為100μm以下,開口部的總面積為結晶系太陽電池單元之面積的0.5~5%之結晶系太陽電池單元。 The present invention relates to a paste composition for solar cells, in particular to a paste composition for solar cells for the purpose of forming a p + layer on a crystalline solar cell having a passivation film, wherein the passivation film is irradiated with a laser etc. to provide openings. More specifically, the present invention relates to a paste composition for a solar cell, which is suitable for a crystal system in which the diameter of the opening is 100 μm or less, and the total area of the opening is 0.5 to 5% of the area of the crystal system solar cell. solar cell unit.
近年,以提升結晶系太陽電池單元的轉換效率(發電效率)、信賴性等為目的,執行了各種研究開發,其中之一的PERC型高轉換效率單元備受矚目。其單元背面具有氮化矽、氧化矽、氧化鋁等所形成之鈍化膜。 In recent years, various research and development have been carried out for the purpose of improving the conversion efficiency (power generation efficiency) and reliability of crystalline solar cells, and one of them, PERC-type high conversion efficiency cells, has attracted attention. The back of the unit has a passivation film formed by silicon nitride, silicon oxide, aluminum oxide, etc.
PERC型高轉換效率單元,例如係具備鋁為主成分的電極層構造。此電極層(特別是背面電極層),例如係藉由將鋁為主體的膏狀組成物塗佈成圖案形狀以覆蓋鈍化膜之開口部,因應需求乾燥後,燒成而形成。例如,專利文獻1,已揭露一種膏狀組成物,其係含有鋁粉末、鋁-矽合金粉末、矽粉末、玻璃粉末及有機載體。此外,已知將電極層的構成做適當的設計,可以提高PERC型高轉換效率單元的轉換效率。 The PERC type high conversion efficiency cell has, for example, an electrode layer structure mainly composed of aluminum. The electrode layer (especially the back electrode layer) is formed by, for example, coating an aluminum-based paste composition in a pattern shape to cover the opening of the passivation film, drying as required, and then firing. For example,
又,近年在更加提高PERC型高轉換效率單元的轉換效率之 方法上,目前正在研究藉由縮小鈍化膜之開口部的面積、增加鈍化膜的面積,抑制電子及孔洞之再結合。 In addition, in recent years, in order to further improve the conversion efficiency of PERC type high conversion efficiency cells, research is currently underway to suppress the recombination of electrons and holes by reducing the area of the opening of the passivation film and increasing the area of the passivation film.
【專利文獻1】日本特開2013-143499號公報 [Patent Document 1] Japanese Patent Application Laid-Open No. 2013-143499
然而,使用傳統膏狀組成物形成的電極層,特別係開口部的直徑為100μm以下,對於開口部的總面積為結晶系太陽電池單元之面積的0.5~5%之結晶系太陽電池單元,其提升轉換效率上還有改善的空間。另外,除了在電極層界面中生成被稱為孔洞的空隙的情況外,還存在靜態機械負載試驗後之轉換效率的下降率達3%以上之問題。在電極層界面中生成孔洞的情況下,增加阻抗的同時,可能成為降低結晶系太陽電池單元之長期信賴性之原因。 However, in the electrode layer formed using the conventional paste composition, especially the diameter of the opening is 100 μm or less, and the total area of the opening is 0.5~5% of the area of the crystalline solar cell. There is still room for improvement in improving the conversion efficiency. In addition, in addition to the case where voids called voids are formed in the electrode layer interface, there is also a problem that the conversion efficiency decreases by 3% or more after the static mechanical load test. In the case where voids are formed in the interface of the electrode layer, the increase in resistance may be the cause of reducing the long-term reliability of the crystalline solar cell.
本發明,係鑑於上述技術背景而成者,目的在於提供一種太陽電池用膏狀組成物,其係即使適用在對於鈍化膜之開口部的直徑為100μm以下,開口部的總面積為結晶系太陽電池單元之面積的0.5~5%之結晶系太陽電池單元的情況下,亦可達成優異的轉換效率,同時抑制燒成後之電極層界面中的孔洞的發生,可進一步地抑制靜態機械負載試驗後之轉換效率的下降率。本發明之又一目的在於提供一種方法,其係使用該太陽電池 用膏狀組成物形成背面電極。 The present invention is made in view of the above-mentioned technical background, and an object of the present invention is to provide a paste-like composition for solar cells, which is applied even when the diameter of the openings to the passivation film is 100 μm or less, and the total area of the openings is crystalline solar cells. In the case of a crystalline solar cell with an area of 0.5~5% of the cell area, excellent conversion efficiency can also be achieved, and at the same time, the occurrence of voids in the electrode layer interface after firing can be suppressed, and the static mechanical load test can be further suppressed. The rate of decrease in conversion efficiency after that. Another object of the present invention is to provide a method for forming a back electrode using the paste composition for solar cells.
本發明人為達到上述目的而反覆深入研究的結果,發現含有特定之導電性材料的膏狀組成物可達成上述目的,從而完成本發明。 The inventors of the present invention, as a result of intensive research to achieve the above-mentioned object, found that a paste-like composition containing a specific conductive material can achieve the above-mentioned object, thereby completing the present invention.
亦即,本發明係關於下述之太陽電池用膏狀組成物。 That is, the present invention relates to the following paste composition for solar cells.
1.一種太陽電池用膏狀組成物,其係含有玻璃粉末、有機載體及導電性材料,用於對具有設置開口部之鈍化膜之結晶系太陽電池單元形成p+層之用途,其特徵係:(1)前述開口部的直徑為100μm以下,前述開口部的總面積為前述結晶系太陽電池單元之面積的0.5~5%;(2)前述導電性材料,含有鋁粉末及具有長徑5μm以下之矽的初晶之鋁-矽合金粉末。 1. A paste-like composition for solar cells, which contains glass powder, an organic carrier and a conductive material, and is used for the purpose of forming a p + layer for a crystalline solar cell unit with a passivation film provided with an opening, which is characterized by: : (1) The diameter of the opening is 100 μm or less, and the total area of the opening is 0.5 to 5% of the area of the crystalline solar cell; (2) The conductive material contains aluminum powder and has a long diameter of 5 μm The primary crystal of the following silicon is an aluminum-silicon alloy powder.
2.如上述項1所記載之太陽電池用膏狀組成物,其中,相對於前述鋁粉末100質量份,含有前述鋁-矽合金粉末40~700質量份、前述玻璃粉末0.1~15質量份,及前述有機載體20~45質量份。 2. The paste composition for solar cells according to the
3.如上述項1或2所記載之太陽電池用膏狀組成物,其中,前述開口部的直徑為20~100μm。 3. The paste composition for solar cells according to the
4.一種結晶系太陽電池單元的背面電極之形成方法,其係具有對具有設置開口部之鈍化膜之結晶系太陽電池單元,為了覆蓋前述開口部,以含有玻璃粉末、有機載體及導電性材料之太陽電池用膏狀組成物塗佈而形成塗膜之步驟1,以及, 將前述塗膜以700~900℃燒成之步驟2,其特徵係:(1)前述開口部的直徑為100μm以下,前述開口部的總面積為前述結晶系太陽電池單元之面積的0.5~5%;(2)前述導電性材料,含有鋁粉末及具有長徑5μm以下之矽的初晶之鋁-矽合金粉末。 4. A method for forming a back electrode of a crystalline solar cell, comprising: a crystalline solar cell having a passivation film provided with an opening, in order to cover the opening, to contain glass powder, an organic carrier and a conductive material The
5.如上述項4所記載之背面電極之形成方法,其中,相對於前述鋁粉末100質量份,含有前述鋁-矽合金粉末40~700質量份、前述玻璃粉末0.1~15質量份,及前述有機載體20~45質量份。 5. The method for forming a back electrode according to the above item 4, wherein 40 to 700 parts by mass of the aluminum-silicon alloy powder, 0.1 to 15 parts by mass of the glass powder, and the aforementioned 100 parts by mass of the aluminum powder are contained. 20-45 parts by mass of organic carrier.
6.如上述項4或5所記載之背面電極的形成方法,其中,前述開口部的直徑為20~100μm。 6. The method for forming a back surface electrode according to the
根據本發明之太陽電池用膏狀組成物,即使在結晶系太陽電池單元(特別係PERC型高轉換效率單元)中,適用在對於鈍化膜之開口部的直徑為100μm以下,開口部的總面積為結晶系太陽電池單元之面積的0.5~5%之結晶系太陽電池單元的情況下,亦可達成優異的轉換效率,同時抑制燒成後之電極層界面中的孔洞的發生,可進一步地抑制靜態機械負載試驗後之轉換效率的下降率。 According to the paste composition for solar cells of the present invention, even in a crystalline solar cell (especially a PERC type high conversion efficiency cell), the diameter of the opening of the passivation film is 100 μm or less, and the total area of the opening is 100 μm or less. In the case of a crystalline solar cell with an area of 0.5 to 5% of the area of the crystalline solar cell, excellent conversion efficiency can also be achieved, and the occurrence of voids in the electrode layer interface after firing can be suppressed further. Decreased rate of conversion efficiency after static mechanical load test.
1‧‧‧矽半導體基板 1‧‧‧Silicon semiconductor substrate
2‧‧‧n型不純物層 2‧‧‧n-type impurity layer
3‧‧‧反射防止膜(鈍化膜) 3‧‧‧Anti-reflection film (passivation film)
4‧‧‧柵電極 4‧‧‧Gate electrode
5‧‧‧電極層 5‧‧‧Electrode layer
6‧‧‧合金層 6‧‧‧Alloy layer
7‧‧‧p+層 7‧‧‧p + layer
8‧‧‧背面電極 8‧‧‧Back electrode
9‧‧‧接觸孔 9‧‧‧Contact hole
10‧‧‧膏狀組成物 10‧‧‧Paste composition
【圖1】表示PERC型太陽電池單元之斷面構造的一例之代表圖;(a)為其實施型態的一例,(b)為其實施型態的另一例。 [FIG. 1] A representative diagram showing an example of a cross-sectional structure of a PERC type solar cell; (a) is an example of its implementation, and (b) is another example of its implementation.
【圖2】表示實施例及比較例中所製作之電極構造的斷面之代表圖。 FIG. 2 is a representative view showing the cross section of the electrode structure produced in the example and the comparative example.
【圖3】表示藉由電子顯微鏡觀察鋁粉末及鋁-矽合金粉末的表面之觀察影像的圖式。詳細為(a)矽含有量20原子%之鋁-矽合金粉末、(b)鋁粉末、(c)矽含有量15原子%之鋁-矽合金粉末。 FIG. 3 is a diagram showing an observation image of the surface of the aluminum powder and the aluminum-silicon alloy powder observed by an electron microscope. The details are (a) aluminum-silicon alloy powder with a silicon content of 20 atomic %, (b) aluminum powder, and (c) aluminum-silicon alloy powder with a silicon content of 15 atomic %.
以下,詳細說明本發明之太陽電池用膏狀組成物。又,本說明書中,除非特別說明,「~」所示之範圍,係意指「以上、以下」。 Hereinafter, the paste composition for solar cells of the present invention will be described in detail. In addition, in this specification, unless otherwise specified, the range shown by "~" means "above, below."
本發明之太陽電池用膏狀組成物,例如,可用於形成結晶系太陽電池單元的電極。結晶系太陽電池單元並未特別限定,可列舉例如PERC(射極純化及背面電極太陽電池Passivated emitter and rear cell)型高轉換效率單元(以下,稱作「PERC型太陽電池單元」。)。本發明之太陽電池用膏狀組成物,例如,可用於形成PERC型太陽電池單元的背面電極。以下,本發明之膏狀組成物,亦可單以「膏狀組成物」記載。 The paste composition for solar cells of the present invention can be used, for example, to form electrodes of crystalline solar cells. The crystalline solar cell is not particularly limited, and examples thereof include a PERC (Passivated emitter and rear cell) type high conversion efficiency cell (hereinafter, referred to as "PERC type solar cell"). The paste composition for solar cells of the present invention can be used, for example, to form a back electrode of a PERC type solar cell. Hereinafter, the paste composition of the present invention may be simply described as "paste composition".
首先,說明PERC型太陽電池單元之構造之一例。 First, an example of the structure of a PERC type solar cell will be described.
1.PERC型太陽電池單元 1. PERC type solar cell unit
圖1(a)、(b)為PERC型太陽電池單元之一般的斷面構造之代表圖。PERC型太陽電池單元,作為構成要素可具備:矽半導體基板1、n型不純物層2、反射防止膜(鈍化膜)3、柵電極4、電極層(背面電極層)5、合金層6、p+層7。 1(a) and (b) are representative views of the general cross-sectional structure of a PERC type solar cell. The PERC type solar cell may include, as constituent elements: a
矽半導體基板1並無特別限定,例如,使用厚度為180~250μm之p型矽基板。 The
n型不純物層2,係設置於矽半導體基板1之受光面側。n 型不純物層2之厚度,例如,係0.3~0.6μm。 The n-type impurity layer 2 is disposed on the light-receiving surface side of the
反射防止膜3及柵電極4,係設置於n型不純物層2之表面。反射防止膜3,例如,亦稱作氮化矽膜所形成之鈍化膜。反射防止膜3,藉由起到所謂的鈍化膜的作用,則可抑制矽半導體基板1之表面之電子的再結合,其結果,可減少發生之載體的再結合率。藉此,可提高PERC型太陽電池單元之轉換效率。 The anti-reflection film 3 and the gate electrode 4 are provided on the surface of the n-type impurity layer 2 . The antireflection film 3 is, for example, also called a passivation film formed of a silicon nitride film. By functioning as a so-called passivation film, the antireflection film 3 can suppress the recombination of electrons on the surface of the
反射防止膜(鈍化膜)3,亦設置於矽半導體基板1之背面側,亦即,設置於與前述受光面相反側之面。此外,將此背面側之反射防止膜3貫通,且,削除矽半導體基板1之背面的一部份而形成之接觸孔(本發明之開口部),係形成於矽半導體基板1之背面側。 The antireflection film (passivation film) 3 is also provided on the back surface side of the
電極層5,係形成為通過前述接觸孔與矽半導體基板1接觸者。電極層5,係藉由本發明之膏狀組成物而形成之部材,且形成為所定之圖案形狀。如圖1(a)之形態,電極層5,亦可形成為覆蓋PERC型太陽電池單元之背面全體者,或,如圖1(b)之形態,亦可形成為覆蓋接觸孔及其附近者。電極層5之主成分為鋁,電極層5為鋁電極層。 The
電極層5,例如,藉由將膏狀組成物塗佈為所定之圖案形狀、燒成而形成。塗佈方法並無特別限定,可列舉例如,絲網印刷等習知的方法。塗佈膏狀組成物後,視需要進行乾燥後,例如,藉由超過鋁之熔點(約660℃)的溫度進行短時間燒成,從而形成電極層5。 The
本發明,燒成溫度係超過鋁之熔點(約660℃)的溫度即可,約700~900℃為佳,約780~900℃更佳。燒成時間係在形成期望的電極層5之範圍內因應燒成溫度做適當的設定。 In the present invention, the firing temperature may be a temperature exceeding the melting point of aluminum (about 660°C), preferably about 700-900°C, more preferably about 780-900°C. The firing time is appropriately set according to the firing temperature within the range where the desired
經過如此燒成,膏狀組成物所含之鋁會擴散於矽半導體基板1之內部。藉此,電極層5與矽半導體基板1之間,可形成鋁-矽(Al-Si)合金層(合金層6),同時,藉由鋁原子之擴散,形成不純物層之p+層7。 After such firing, the aluminum contained in the paste composition diffuses inside the
p+層7,可得到防止電子的再結合、提升生成載體之收集效率之效果,亦即,可得到BSF(Back Surface Field)效果。 The p + layer 7 can prevent the recombination of electrons and improve the collection efficiency of the generated carrier, that is, the BSF (Back Surface Field) effect can be obtained.
前述電極層5與合金層6所形成之電極,係圖1所示之背面電極8。因此,背面電極8,係使用膏狀組成物而形成者,例如,藉由塗佈以覆蓋背面側之反射防止膜(鈍化膜3)所設置的接觸孔9(開口部),因應需求乾燥後,燒成,可形成背面電極8。 The electrode formed by the
於此,藉由使用本發明之膏狀組成物形成背面電極8,即使適用在對於鈍化膜之開口部的直徑為100μm以下(較佳為20~100μm),開口部的總面積為結晶系太陽電池單元之面積的0.5~5%(特別是2~4%、進一步為2.5~3.5%)之結晶系太陽電池單元的情況下,亦可達成優異的轉換效率,同時抑制燒成後之電極層界面中的孔洞的發生,可進一步地抑制靜態機械負載試驗後之轉換效率的下降率。 Here, by forming the
2.膏狀組成物 2. Paste composition
本發明之膏狀組成物係含有玻璃粉末、有機載體及導電性材料,用於對具有設置開口部之鈍化膜之結晶系太陽電池單元形成p+層之用途,其特徵係:(1)前述開口部的直徑為100μm以下,前述開口部的總面積為前述結晶系太陽電池單元之面積的0.5~5%;(2)前述導電性材料,含有鋁粉末及具有長徑5μm以下之矽的初晶 之鋁-矽合金粉末。 The paste composition of the present invention contains glass powder, an organic carrier and a conductive material, and is used for forming a p + layer on a crystalline solar cell having a passivation film provided with an opening, and is characterized by: (1) the above The diameter of the opening is 100 μm or less, and the total area of the opening is 0.5 to 5% of the area of the crystalline solar cell; (2) the conductive material contains aluminum powder and silicon with a long diameter of 5 μm or less. Crystalline aluminum-silicon alloy powder.
如上述,藉由使用膏狀組成物,可形成PERC型太陽電池單元等之太陽電池單元之背面電極。亦即,本發明之膏狀組成物,係可用於形成太陽電池用背面電極,且該太陽電池用背面電極係通過形成於矽基板上之鈍化膜所設置之開口部(接觸孔)而與矽基板電接觸。此外,藉由本發明之膏狀組成物,即使適用在對於結晶系太陽電池單元(特別係PERC型太陽電池單元)中鈍化膜之開口部的直徑為100μm以下,開口部的總面積為結晶系太陽電池單元之面積的0.5~5%之結晶系太陽電池單元的情況下,亦可達成優異的轉換效率,同時抑制燒成後之電極層界面中孔洞的發生,可進一步地抑制靜態機械負載試驗後之轉換效率的下降率。 As described above, by using the paste composition, the back electrode of a solar cell such as a PERC type solar cell can be formed. That is, the paste-like composition of the present invention can be used to form a back surface electrode for a solar cell, and the back surface electrode for a solar cell is connected to a silicon substrate through an opening (contact hole) provided in a passivation film formed on a silicon substrate. The substrates are in electrical contact. In addition, with the paste composition of the present invention, even if the diameter of the opening of the passivation film is 100 μm or less for crystalline solar cells (especially PERC type solar cells), the total area of the openings is 100 μm or less. In the case of a crystalline solar cell with an area of 0.5~5% of the cell area, excellent conversion efficiency can also be achieved, and at the same time, the occurrence of voids in the electrode layer interface after firing can be suppressed, and the static mechanical load test can be further suppressed. The rate of decrease of the conversion efficiency.
膏狀組成物係含有玻璃粉末、有機載體及導電性材料(金屬粒子)作為構成成分。此外,由於膏狀組成物含有導電性材料(金屬粒子),膏狀組成物的塗膜燒成並形成之燒結體,發揮與矽基板電連結之導電性。 The paste composition contains glass powder, an organic vehicle, and a conductive material (metal particle) as constituent components. In addition, since the paste composition contains a conductive material (metal particles), the sintered body formed by firing the coating film of the paste composition exhibits conductivity to be electrically connected to the silicon substrate.
(導電性材料) (conductive material)
本發明中,導電性材料,係含有鋁粉末及具有長徑5μm以下之矽的初晶之鋁-矽合金粉末。 In the present invention, the conductive material is an aluminum-silicon alloy powder containing aluminum powder and primary crystals of silicon having a major diameter of 5 μm or less.
上述鋁粉末係指沒有形成合金的鋁,但不排除無法避免的雜質及原料來源之微量的添加元素之存在。 The above-mentioned aluminum powder refers to aluminum that has not been alloyed, but the existence of unavoidable impurities and trace addition elements from raw material sources is not excluded.
本發明使用的鋁-矽合金粉末係表示鋁及矽的合金,但不排除鋁及矽中之無法避免的雜質及原料來源之微量的添加元素之存在。本發明中,該鋁-矽合金中矽含有量12~30原子%為佳,17~25原子%更佳。藉由導電性材料中含有如此之鋁-矽合金粉末,燒成膏狀組成物的塗膜時,抑制 膏狀組成物中的鋁與矽基板中的矽過度反應,可抑制電極層界面(詳細來說為電極層與矽基板間的界面)中的孔洞的發生。 The aluminum-silicon alloy powder used in the present invention refers to an alloy of aluminum and silicon, but the existence of unavoidable impurities in aluminum and silicon and trace addition elements from raw materials are not excluded. In the present invention, the silicon content in the aluminum-silicon alloy is preferably 12-30 atomic %, more preferably 17-25 atomic %. By containing such an aluminum-silicon alloy powder in the conductive material, when the coating film of the paste composition is fired, the excessive reaction between the aluminum in the paste composition and the silicon in the silicon substrate can be suppressed, and the electrode layer interface can be suppressed (details). The occurrence of holes in the interface between the electrode layer and the silicon substrate).
本發明使用的鋁-矽合金粉末,其特徵係具有長徑5μm以下(亦即,超過0μm,5μm以下)之矽的初晶。藉由導電性材料中含有如此之鋁-矽合金粉末,電極層的阻抗降低,可達成優異的轉換效率,且可抑制靜態機械負載試驗後之轉換效率的下降率。初晶的長徑為5μm即可,但以1~5μm為佳、2~5μm更佳。 The aluminum-silicon alloy powder used in the present invention is characterized by having primary crystals of silicon with a major diameter of 5 μm or less (ie, more than 0 μm and 5 μm or less). By including such an aluminum-silicon alloy powder in the conductive material, the resistance of the electrode layer is reduced, an excellent conversion efficiency can be achieved, and the reduction rate of the conversion efficiency after a static mechanical load test can be suppressed. The major diameter of the primary crystal may be 5 μm, but is preferably 1 to 5 μm, more preferably 2 to 5 μm.
鋁-矽合金粉末的初晶之有無及初晶的形狀,係可藉由光學顯微鏡觀察鋁-矽合金粉末的斷面來確定。 The presence or absence of primary crystals of the aluminum-silicon alloy powder and the shape of the primary crystals can be determined by observing the cross-section of the aluminum-silicon alloy powder with an optical microscope.
圖3表示鋁粉末及鋁-矽合金的粉末的一例於光學顯微鏡下之觀察圖像。以(a)示出矽含有量20原子%之鋁-矽合金粉末的斷面之觀察圖像中可觀察到矽的初晶為不定形的灰色點。相對於此,以(b)示出之鋁粉末(不含矽)及以(c)示出矽含有量15原子%之鋁-矽合金粉末的斷面之觀察圖像中無法觀察到矽的初晶。 FIG. 3 shows an example of an observation image of an aluminum powder and an aluminum-silicon alloy powder under an optical microscope. In the observation image of (a) a cross section of an aluminum-silicon alloy powder having a silicon content of 20 atomic %, the primary crystal of silicon is observed as an amorphous gray dot. On the other hand, in the observation images of the cross section of the aluminum powder (without silicon) shown in (b) and the aluminum-silicon alloy powder with a silicon content of 15 atomic % shown in (c), no silicon can be observed. first crystal.
得到具有長徑5μm以下的初晶之鋁-矽合金粉末之方法並未特別限定,可列舉例如,於矽含有量12原子%以上、較佳為12~30原子%之鋁-矽合金的熔融金屬中添加0.05原子%以上磷(P)之霧化法,或者該熔融金屬一邊以103K/s以上的速度快速冷卻一邊進行霧化法之方法。若為快速冷卻法,為使初晶的長徑在5μm以下,霧化法的快速冷卻速度在103K/s以上為佳。其他,可列舉例如用氦(He)、氬(Ar)等惰性氣體將鋁-矽合金粉末霧化之方法。 The method for obtaining the primary crystal aluminum-silicon alloy powder having a major diameter of 5 μm or less is not particularly limited, and for example, melting of an aluminum-silicon alloy with a silicon content of 12 atomic % or more, preferably 12 to 30 atomic % is exemplified. Atomization method in which 0.05 atomic % or more of phosphorus (P) is added to the metal, or an atomization method in which the molten metal is rapidly cooled at a rate of 103 K/s or more. In the case of the rapid cooling method, the rapid cooling rate of the atomization method is preferably 103 K/s or more so that the major diameter of the primary crystal is 5 μm or less. Others include, for example, a method of atomizing an aluminum-silicon alloy powder with an inert gas such as helium (He) and argon (Ar).
對於鋁粉末並未特別限定鋁-矽合金含量,相對於鋁粉末100 質量份,鋁-矽合金粉末的含有量為40~700質量份為佳,40~250質量份更佳。 The aluminum-silicon alloy content of the aluminum powder is not particularly limited, but the content of the aluminum-silicon alloy powder is preferably 40 to 700 parts by mass, more preferably 40 to 250 parts by mass, relative to 100 parts by mass of the aluminum powder.
導電性材料(鋁粉末及鋁-矽合金粉末)的形狀沒有特別限定,例如:球狀、橢圓狀、不定形狀、鱗片狀、纖維狀等之任一者皆可。若導電性材料的形狀為球狀,則藉由膏狀組成物所形成之前述電極層5中,導電性材料的充填性增加,從而有效地降低電阻。 The shape of the conductive material (aluminum powder and aluminum-silicon alloy powder) is not particularly limited, and for example, any of spherical, elliptical, indeterminate, scaly, and fibrous shapes may be used. When the shape of the conductive material is spherical, in the
此外,導電性材料的形狀為球性之情形下,在藉由膏狀組成物所形成之前述電極層5中,由於矽半導體基板1和導電性材料的接點增加,容易形成良好的BSF層。球狀之情形,根據雷射繞射法測量之平均粒子徑係1~10μm的範圍為佳。 In addition, when the shape of the conductive material is spherical, in the
又,在不阻害本發明之效果的範圍內,視需要可容許含有鋁粉末及鋁-矽合金粉末以外之其他金屬粒子。此等之導電性材料,任一者皆可藉由氣體霧化法等習知的方法製造。 Moreover, in the range which does not inhibit the effect of this invention, it is permissible to contain other metal particles other than aluminum powder and aluminum-silicon alloy powder as needed. Any of these conductive materials can be produced by a conventional method such as a gas atomization method.
(玻璃粉末) (glass powder)
玻璃粉末,係發揮幫助導電性材料與矽的反應,以及,導電性材料本身的燒結之作用。 The glass powder plays a role in assisting the reaction between the conductive material and silicon and the sintering of the conductive material itself.
玻璃粉末並未特別限定,例如,用於形成太陽電池單元之電極層之膏狀組成物所含習知的玻璃成分。玻璃粉末之具體例,可列舉選自鉛(Pb)、鉍(Bi)、釩(V)、硼(B)、矽(Si)、錫(Sn)、磷(P)以及鋅(Zn)所成群中至少1種。此外,可使用含有鉛之玻璃粉末,或者,鉍系、釩系、錫-磷系、硼矽酸鋅系、鹼性硼矽酸系等之無鉛之玻璃粉末。特別係考量對於人體之影響,理想為使用無鉛之玻璃粉末。 The glass powder is not particularly limited, and for example, a conventional glass component contained in a paste composition for forming an electrode layer of a solar cell. Specific examples of the glass powder include those selected from the group consisting of lead (Pb), bismuth (Bi), vanadium (V), boron (B), silicon (Si), tin (Sn), phosphorus (P), and zinc (Zn). At least 1 species in the group. In addition, lead-containing glass powders, or lead-free glass powders such as bismuth-based, vanadium-based, tin-phosphorus-based, zinc borosilicate-based, and alkaline borosilicate-based glass powders can be used. In particular, considering the impact on the human body, it is ideal to use lead-free glass powder.
具體之玻璃粉末,可含有選自B2O3、Bi2O3、ZnO、SiO2、Al2O3、BaO、CaO、SrO、V2O5、Sb2O3、WO3、P2O5及TeO2所成群中至少1種之成分。例如,玻璃粉末中,亦可將B2O3成分與Bi2O3成分之莫耳比(B2O3/Bi2O3)為0.8以上4.0以下之玻璃料,及V2O5成分與BaO成分之莫耳比(V2O5/BaO)為1.0以上2.5以下之玻璃料組合。 The specific glass powder may contain B 2 O 3 , Bi 2 O 3 , ZnO, SiO 2 , Al 2 O 3 , BaO, CaO, SrO, V 2 O 5 , Sb 2 O 3 , WO 3 , P 2 A component of at least one of the groups of O 5 and TeO 2 . For example, in the glass powder, a glass frit whose molar ratio (B 2 O 3 /Bi 2 O 3 ) of the B 2 O 3 component and the Bi 2 O 3 component is 0.8 or more and 4.0 or less, and the V 2 O 5 component may be used. It is combined with a glass frit whose molar ratio (V 2 O 5 /BaO) of the BaO component is 1.0 or more and 2.5 or less.
玻璃粉末之軟化點,例如,可為750℃以下。玻璃粉末所含粒子之平均粒徑,例如,可為1~3μm。 The softening point of the glass powder may be, for example, 750° C. or lower. The average particle diameter of the particles contained in the glass powder may be, for example, 1 to 3 μm.
膏狀組成物中所含玻璃粉末之含有量,例如,相對於導電性材料100質量份,在0.5~40質量份為佳。特別係相對於鋁粉末100質量份,在0.1~15質量份為佳。此情況下,矽半導體基板1及反射防止膜3(鈍化膜)之密著性良好,此外,電阻亦難以增大。 The content of the glass powder contained in the paste composition is preferably, for example, 0.5 to 40 parts by mass with respect to 100 parts by mass of the conductive material. In particular, it is preferably 0.1 to 15 parts by mass with respect to 100 parts by mass of the aluminum powder. In this case, the adhesion between the
(有機載體) (organic carrier)
有機載體,視需要可使用各種添加劑及樹脂溶解於溶劑內之材料。或者,亦可未含溶劑,而直接將樹脂本身作為有機載體使用。 As the organic carrier, various additives and resin-dissolved materials in a solvent can be used as needed. Alternatively, the resin itself may be used as an organic vehicle without containing a solvent.
溶劑,可使用習知的種類,具體而言,可列舉:二乙二醇單丁醚、二乙二醇單丁醚乙酸酯、二丙二醇單甲醚等。 As a solvent, a well-known kind can be used, Specifically, diethylene glycol monobutyl ether, diethylene glycol monobutyl ether acetate, dipropylene glycol monomethyl ether, etc. are mentioned.
各種添加劑,例如,可使用抗氧化劑、腐蝕抑制劑、消泡劑、增黏劑、賦黏劑、耦合劑、靜電賦予劑、聚合禁止劑、觸變性劑、沉澱防止劑等。具體而言,例如,可使用聚乙二醇酯化合物、聚乙二醇醚化合物、聚氧乙烯脫水山梨糖醇酯化合物、脫水山梨糖醇烷基酯化合物、脂肪族多元羧酸化合物、磷酸酯化合物、聚酯酸之醯胺胺鹽、氧化聚乙烯系化合物、脂肪酸醯胺蠟等。 Various additives, for example, antioxidants, corrosion inhibitors, antifoaming agents, tackifiers, tackifiers, coupling agents, electrostatic imparting agents, polymerization inhibitors, thixotropic agents, precipitation inhibitors, etc. can be used. Specifically, for example, polyethylene glycol ester compounds, polyethylene glycol ether compounds, polyoxyethylene sorbitan ester compounds, sorbitan alkyl ester compounds, aliphatic polycarboxylic acid compounds, phosphoric acid esters can be used Compounds, amide amine salts of polyester acids, oxidized polyethylene compounds, fatty acid amide waxes, etc.
樹脂可使用習知的種類,可將乙基纖維素、硝化纖維素、聚乙烯醇縮丁醛、酚醛樹脂、黑色素樹脂、尿素樹脂、二甲苯樹脂、醇酸樹脂、不飽和聚酯樹脂、丙烯酸樹脂、聚醯亞胺樹脂、呋喃樹脂、胺基甲酸酯樹脂、異氰酸酯化合物、氰酸鹽化合物等之熱固性樹脂、聚乙烯、聚丙烯、聚苯乙烯、ABS樹脂、聚甲基丙烯酸甲酯、聚氯乙烯、聚偏二氯乙烯、聚乙酸乙烯酯、聚乙烯醇、聚縮醛、聚碳酸酯、聚對苯二甲酸乙二酯、聚對苯二甲酸丁二醇酯、聚苯醚、聚碸、聚醯亞胺、聚醚碸、聚芳酯、聚醚醚酮、聚四氟乙烯、矽樹脂等二種以上組合使用。 As the resin, conventional types can be used, such as ethyl cellulose, nitrocellulose, polyvinyl butyral, phenolic resin, melanin resin, urea resin, xylene resin, alkyd resin, unsaturated polyester resin, acrylic resin Resins, polyimide resins, furan resins, urethane resins, isocyanate compounds, cyanate compounds and other thermosetting resins, polyethylene, polypropylene, polystyrene, ABS resin, polymethyl methacrylate, Polyvinyl chloride, polyvinylidene chloride, polyvinyl acetate, polyvinyl alcohol, polyacetal, polycarbonate, polyethylene terephthalate, polybutylene terephthalate, polyphenylene ether, Two or more kinds of polyether, polyimide, polyether, polyarylate, polyether ether ketone, polytetrafluoroethylene, and silicone resin are used in combination.
有機載體所含樹脂、溶劑、各種添加劑之比率可任意調整,例如,可與習知的有機載體相同之成分比。 The ratios of resin, solvent and various additives contained in the organic vehicle can be adjusted arbitrarily, for example, the same composition ratio as the conventional organic vehicle can be used.
有機載體之含有比率並無特別限定,例如,根據具有良好印刷性之觀點,相對於導電性材料100質量份,在10~500質量份為佳,在20~45質量份特佳。又,特別係相對於鋁粉末100質量份,在10~500質量份為佳,在20~45質量份特佳。 The content ratio of the organic vehicle is not particularly limited. For example, from the viewpoint of having good printability, it is preferably 10 to 500 parts by mass, and particularly preferably 20 to 45 parts by mass, with respect to 100 parts by mass of the conductive material. Moreover, it is especially preferable that it is 10-500 mass parts with respect to 100 mass parts of aluminum powders, and it is especially preferable that it is 20-45 mass parts.
本發明之膏狀組成物,例如,可適用於形成太陽電池單元之電極層(特別係如圖1所示之PERC型太陽電池單元之背面電極8)。因此,本發明之膏狀組成物,亦可用作太陽電池背面電極形成劑。 The paste composition of the present invention is suitable for, for example, forming an electrode layer of a solar cell (especially, the
3.背面電極的形成方法 3. Forming method of back electrode
本發明之結晶系太陽電池單元的背面電極(圖1的背面電極8)之形成方法,其係具有對具有設置開口部的鈍化膜之結晶系太陽電池單元,為了覆蓋前述開口部,以含有玻璃粉末、有機載體及導電性材料之太陽電池用膏狀組成物塗佈而形成塗膜之步驟1,以及,有將前述塗膜以700~900℃燒成之 步驟2,其特徵係:(1)前述開口部的直徑為100μm以下,前述開口部的總面積為前述結晶系太陽電池單元之面積的0.5~5%;(2)前述導電性材料,含有鋁粉末及具有長徑5μm以下之矽的初晶之鋁-矽合金粉末。 The method for forming the back electrode (the
關於結晶系太陽電池單元及太陽電池用膏狀組成物,基本上如同前述,設置於鈍化膜的開口部之直徑為100μm以下中,以20~100μm為佳,開口部通常以雷射照射等形成。 Regarding the crystalline solar cell and the paste composition for solar cells, basically as described above, the diameter of the opening provided in the passivation film is 100 μm or less, preferably 20 to 100 μm, and the opening is usually formed by laser irradiation or the like. .
本發明之背面電極之形成方法,步驟1中,對具有設置開口部的鈍化膜之結晶系太陽電池單元,為了覆蓋前述開口部,藉由塗佈太陽電池膏狀組成物而形成塗膜。 In the method for forming a back electrode of the present invention, in
形成膏狀組成物的塗膜時,可施行絲網印刷等習知的塗工方法。塗膜的厚度,可因應燒成後的背面電極的厚度設定,但以鈍化膜的平面部(開口部之外)為基準5~40μm程度為佳。 When forming the coating film of the paste composition, a conventional coating method such as screen printing can be performed. The thickness of the coating film can be set according to the thickness of the back surface electrode after firing, but is preferably about 5 to 40 μm based on the flat portion (outside the opening) of the passivation film.
藉由步驟1形成塗膜後,在步驟2中,塗膜以700~900℃燒成。燒成溫度為700~900℃即可,但780~900℃左右較佳。 After forming the coating film in
藉由燒成,膏狀組成物所含之鋁,會擴散於矽半導體基板1之內部,電極層5與矽半導體基板1之間,可形成鋁-矽(Al-Si)合金層(合金層6),同時,藉由鋁原子之擴散,形成不純物層之p+層7。 By firing, the aluminum contained in the paste composition diffuses inside the
以下,參照實施例及比較例具體說明本發明,惟本發明並未限定為此等實施例。 Hereinafter, the present invention will be specifically described with reference to Examples and Comparative Examples, but the present invention is not limited to these Examples.
實施例1 Example 1
(膏狀組成物的調製) (Preparation of paste composition)
使用已知的分散裝置(分散器),將導電性材料100質量份,其係使由氣體霧化法生成之鋁粉末、由相同氣體霧化法生成之具有長徑2.0μm的矽的初晶之鋁-矽合金粉末,調整為40質量%:60質量%,與B2O3-Bi2O3-SrO-BaO-Sb2O3=40/40/10/5/5(mol%)的玻璃粉1.5質量份,於溶解乙基纖維素之丁基二甘醇之樹脂液35質量份膏狀化。 Using a known dispersing apparatus (disperser), 100 parts by mass of a conductive material, which is an aluminum powder produced by a gas atomization method, and a primary crystal of silicon having a long diameter of 2.0 μm produced by the same gas atomization method The aluminum-silicon alloy powder is adjusted to 40% by mass: 60% by mass, and B 2 O 3 -Bi 2 O 3 -SrO-BaO-Sb 2 O 3 =40/40/10/5/5 (mol%) 1.5 parts by mass of the glass frit was made into a paste in 35 parts by mass of the resin solution of butyl diethylene glycol dissolving ethyl cellulose.
此外,具有長徑2.0μm的矽的初晶之鋁-矽合金粉末,係於矽含有量20原子%之鋁-矽合金的熔融金屬中添加0.01%的P(磷)以霧化法調製而成。 In addition, the primary crystal aluminum-silicon alloy powder of silicon with a long diameter of 2.0 μm was prepared by adding 0.01% of P (phosphorus) to the molten metal of the aluminum-silicon alloy with a silicon content of 20 atomic % by the atomization method. become.
(太陽電池單元之燒成基板的製作) (Fabrication of fired substrates for solar cells)
評估用之太陽電池單元之燒成基板如以下而製作。 The fired substrate of the solar cell for evaluation was produced as follows.
首先,如圖2之(A)所示,首先,準備厚度為160μm之矽半導體基板1(阻抗值3Ω.cm。背面側包含鈍化膜)。並且,如圖2之(B)所示,使用波長為532nm之YAG雷射作為雷射振盪器,為了使開口部的總面積形成為單元全體的3.1%,以間隔500μm形成直徑50μm的接觸孔9。此外,在單元全體中開口部的總面積,係一個開口的半徑的平方和乘以π,除以相鄰開口部間的距離(間距)所計算的。 First, as shown in FIG. 2(A), first, a silicon semiconductor substrate 1 (resistance value of 3 Ω·cm, including a passivation film on the back surface side) having a thickness of 160 μm is prepared. Furthermore, as shown in FIG. 2(B), a YAG laser with a wavelength of 532 nm was used as the laser oscillator, and contact holes with a diameter of 50 μm were formed at intervals of 500 μm in order to make the total area of the openings 3.1% of the entire cell. 9. In addition, the total area of the openings in the entire cell is calculated by multiplying the sum of the squares of the radii of one opening by π and dividing by the distance (pitch) between adjacent openings.
再者,圖2中未以圖示出鈍化膜,而以被包含在矽半導體基板1中來處理,鈍化膜為矽半導體基板1之背面側中包含30nm之氧化鋁層及100nm之氮化矽層的積層體。 Furthermore, the passivation film is not shown in FIG. 2 , but is processed by being included in the
接著,如圖2之(C)所示,為包覆背面全體(形成接觸孔9之側的面),將上述所得之膏狀組成物10於矽半導體基板1之表面上,使用網 版印刷機,印刷成1.0~1.1g/pc。接著,雖未顯示圖式,於受光面印刷由習知的技術作成之Ag膏。 Next, as shown in FIG. 2(C), in order to cover the entire rear surface (the surface on the side where the contact holes 9 are formed), the
之後,使用設定為800℃之紅外線傳送帶爐進行燒成。藉由此燒成,如圖2之(D)所示,形成電極層5,此外,進行此燒成時藉由鋁在矽半導體基板1之內部擴散,使電極層5與矽半導體基板1之間形成Al-Si之合金層6,且同時藉由鋁原子之擴散形成不純物層之p+層(BSF層)7。藉此,製作評估用之燒成基板。 After that, firing was performed using an infrared conveyor furnace set at 800°C. By this firing, as shown in FIG. 2(D), the
(太陽電池單元之評估) (Assessment of Solar Cells)
關於所得到之太陽電池單元之評估,係使用WACOM電創的太陽光模擬器(solar simulator):WXS-156S-10、I-V測定裝置:使用IV15040-10實施I-V測定。Eff為21.5%以上即合格。 About the evaluation of the obtained solar cell, I-V measurement was implemented using the solar simulator (solar simulator) of WACOM electric company: WXS-156S-10, I-V measurement apparatus: IV15040-10 was used. Eff is 21.5% or more to pass.
(孔洞「Void」的評估) (Evaluation of the hole "Void")
關於孔洞的評估,燒成基板的斷面以光學顯微鏡(200倍)觀察,評估矽半導體1及電極層5間的界面中孔洞的有無。未觀察到孔洞者評估為合格(○),觀察到孔洞者評估為不合格(×) Regarding the evaluation of voids, the cross section of the fired substrate was observed with an optical microscope (200 times), and the presence or absence of voids in the interface between the
(靜態機械負載試驗後的轉換效率之降低率) (Decreased rate of conversion efficiency after static mechanical load test)
靜態機械負載試驗後的轉換效率之降低率係依據IEC61215確定。具體而言,將2400Pa的靜態負載於水平設置的模組之表面及背面進行1小時,以此重複3個週期,之後使用太陽光模擬器進行轉換效率的測定,並計算試驗前後的降低率。此外,模組為將密封材夾入玻璃及背墊之間,在密封材中將太陽電池單元串聯排列製作而成。 The reduction rate of conversion efficiency after static mechanical load test is determined according to IEC61215. Specifically, a static load of 2400 Pa was applied to the front and back surfaces of the horizontally installed modules for 1 hour, and the cycle was repeated for 3 cycles. After that, the conversion efficiency was measured using a solar simulator, and the reduction rate before and after the test was calculated. In addition, the module is made by sandwiching the sealing material between the glass and the back pad, and arranging the solar cells in series in the sealing material.
各評估結果如下述表1所示。 The respective evaluation results are shown in Table 1 below.
實施例2 Example 2
除了使用為了使開口部的總面積成為單元全體的3.1%,以間隔300μm形成直徑30μm的接觸孔9之單元之外,其餘如同實施例1作成,進行評估。 The evaluation was performed as in Example 1 except that a cell in which contact holes 9 with a diameter of 30 μm were formed at intervals of 300 μm so that the total area of the openings was 3.1% of the entire cell was used.
實施例3 Example 3
除了使用為了使開口部的總面積成為單元全體的3.1%,以間隔700μm形成直徑70μm的接觸孔之單元之外,其餘如同實施例1作成,進行評估。 The evaluation was performed as in Example 1, except that a cell in which contact holes with a diameter of 70 μm were formed at intervals of 700 μm so that the total area of the openings was 3.1% of the entire cell was used.
實施例4 Example 4
除了將藉由氣體霧化法生成之鋁粉末及同樣以氣體霧化法生成之具有長徑4.0μm的矽的初晶之鋁-矽合金粉末,調整成30質量%:70質量%以外,其餘如同實施例1調製膏狀組成物,進行評估。 Except that the aluminum powder produced by the gas atomization method and the primary crystal aluminum-silicon alloy powder of silicon having a long diameter of 4.0 μm produced by the gas atomization method were adjusted to 30 mass %: 70 mass %, the rest As in Example 1, a paste composition was prepared and evaluated.
此外,具有長徑4.0μm的矽的初晶之鋁-矽合金粉末,係於矽含有量23原子%之鋁-矽合金之熔融金屬中,以103K/Sec之冷卻速度霧化調製而成。 In addition, the primary crystal aluminum-silicon alloy powder of silicon with a long diameter of 4.0 μm is prepared by atomization in a molten metal of aluminum-silicon alloy with a silicon content of 23 atomic % at a cooling rate of 103K/Sec.
實施例5 Example 5
除了將藉由氣體霧化法生成之鋁粉末及同樣以氣體霧化法生成之具有長徑5.0μm的矽的初晶之鋁-矽合金粉末,調整成50質量%:50質量%以外,其餘如同實施例1調製膏狀組成物,進行評估。 Except that the aluminum powder produced by the gas atomization method and the primary crystal aluminum-silicon alloy powder of silicon having a long diameter of 5.0 μm produced by the gas atomization method are adjusted to 50% by mass: 50% by mass, the rest As in Example 1, a paste composition was prepared and evaluated.
此外,具有長徑5.0μm的矽的初晶之鋁-矽合金粉末,係於矽含有量25原子%之鋁-矽合金之熔融金屬中,使用氦氣霧化調製而成。 In addition, the primary crystal aluminum-silicon alloy powder of silicon with a long diameter of 5.0 μm was prepared by atomizing a molten metal of aluminum-silicon alloy with a silicon content of 25 atomic % using helium gas.
比較例1 Comparative Example 1
除了僅使用藉由氣體霧化法生成之鋁粉末,其餘如同實施例1調製膏 狀組成物,進行評估。亦即,比較例1中未使用具有矽的初晶之鋁-矽合金粉末。 A paste composition was prepared as in Example 1, except that only the aluminum powder produced by the gas atomization method was used, and the evaluation was carried out. That is, in Comparative Example 1, the aluminum-silicon alloy powder having the primary crystal of silicon was not used.
比較例2 Comparative Example 2
除了將藉由氣體霧化法生成之鋁粉末及同樣以氣體霧化法生成之具有長徑7.0μm的矽的初晶之鋁-矽合金粉末,調整成50質量%:50質量%以外,其餘如同實施例1調製膏狀組成物,進行評估。 Except that the aluminum powder produced by the gas atomization method and the primary crystal aluminum-silicon alloy powder of silicon having a long diameter of 7.0 μm produced by the gas atomization method were adjusted to 50 mass %: 50 mass %, the rest As in Example 1, a paste composition was prepared and evaluated.
此外,具有長徑7.0μm的矽的初晶之鋁-矽合金粉末,係於矽含有量35原子%之鋁-矽合金之熔融金屬中,添加0.005%的P(磷)霧化調製而成。 In addition, the primary crystal aluminum-silicon alloy powder of silicon with a long diameter of 7.0 μm is prepared by adding 0.005% of P (phosphorus) to the molten metal of the aluminum-silicon alloy with a silicon content of 35 atomic %. .
比較例3 Comparative Example 3
除了將藉由氣體霧化法生成之鋁粉末及同樣以氣體霧化法生成之具有長徑10.0μm的矽的初晶之鋁-矽合金粉末,調整成50質量%:50質量%以外,其餘如同實施例1調製膏狀組成物,進行評估。 Except that the aluminum powder produced by the gas atomization method and the primary crystal aluminum-silicon alloy powder of silicon having a long diameter of 10.0 μm produced by the gas atomization method were adjusted to 50% by mass: 50% by mass, the rest As in Example 1, a paste composition was prepared and evaluated.
此外,具有長徑10.0μm的矽的初晶之鋁-矽合金粉末,係於矽含有量40原子%之鋁-矽合金之熔融金屬霧化調製而成。 In addition, the primary crystal aluminum-silicon alloy powder of silicon with a long diameter of 10.0 μm was prepared by atomizing a molten metal of an aluminum-silicon alloy with a silicon content of 40 atomic %.
比較例4 Comparative Example 4
除了將藉由氣體霧化法生成之鋁粉末及同樣以氣體霧化法生成之具有長徑6.0μm的矽的初晶之鋁-矽合金粉末,調整成50質量%:50質量%以外,其餘如同實施例1調製膏狀組成物,進行評估。 Except that the aluminum powder produced by the gas atomization method and the primary crystal aluminum-silicon alloy powder of silicon having a long diameter of 6.0 μm produced by the gas atomization method were adjusted to 50% by mass: 50% by mass, the rest As in Example 1, a paste composition was prepared and evaluated.
此外,具有長徑6.0μm的矽的初晶之鋁-矽合金粉末,係於矽含有量35原子%之鋁-矽合金之熔融金屬霧化調製而成。 In addition, the primary crystal aluminum-silicon alloy powder of silicon with a long diameter of 6.0 μm was prepared by atomizing a molten metal of an aluminum-silicon alloy with a silicon content of 35 atomic %.
比較例5 Comparative Example 5
除了使用為了使開口部的總面積成為單元全體的3.1%,以間隔1100μm形成直徑110μm的接觸孔9之單元之外,其餘如同實施例1作成,進行評估。 The evaluation was performed as in Example 1, except that a cell in which contact holes 9 with a diameter of 110 μm were formed at intervals of 1100 μm so that the total area of the openings was 3.1% of the entire cell was used.
比較例6 Comparative Example 6
除了使用為了使開口部的總面積成為單元全體的0.4%,以間隔1400μm形成直徑50μm的接觸孔9之單元之外,其餘如同實施例1作成,進行評估。 The evaluation was performed as in Example 1 except that a cell in which contact holes 9 with a diameter of 50 μm were formed at intervals of 1400 μm so that the total area of the openings was 0.4% of the entire cell was used.
比較例7 Comparative Example 7
除了使用為了使開口部的總面積成為單元全體的6.1%,以間隔360μm形成直徑50μm的接觸孔9之單元之外,其餘如同實施例1作成,進行評估。 The evaluation was performed as in Example 1, except that a cell in which contact holes 9 with a diameter of 50 μm were formed at intervals of 360 μm so that the total area of the openings was 6.1% of the entire cell was used.
從表1的結果可明顯看出,藉由使用本發明之導電性材料,即使適用在對於鈍化膜之開口部的直徑為100μm以下,開口部的總面積為結晶系太陽電池單元之面積的0.5~5%之結晶系太陽電池單元的情況下,亦可達成優異的轉換效率(Eff為22.0%以上),同時抑制燒成後之電極層界面中的孔洞的發生,可進一步地抑制靜態機械負載試驗後之轉換效率的下降率(下降率未達3%)。 As is apparent from the results in Table 1, by using the conductive material of the present invention, even if the diameter of the opening to the passivation film is 100 μm or less, the total area of the opening is 0.5 of the area of the crystalline solar cell. In the case of ~5% crystalline solar cells, excellent conversion efficiency (Eff is 22.0% or more) can also be achieved, and at the same time, the occurrence of voids in the electrode layer interface after firing can be suppressed, and static mechanical load can be further suppressed. The rate of decrease in conversion efficiency after the test (the rate of decrease did not reach 3%).
1‧‧‧矽半導體基板 1‧‧‧Silicon semiconductor substrate
2‧‧‧n型不純物層 2‧‧‧n-type impurity layer
3‧‧‧反射防止膜(鈍化膜) 3‧‧‧Anti-reflection film (passivation film)
4‧‧‧柵電極 4‧‧‧Gate electrode
5‧‧‧電極層 5‧‧‧Electrode layer
6‧‧‧合金層 6‧‧‧Alloy layer
7‧‧‧p+層 7‧‧‧p + layer
8‧‧‧背面電極 8‧‧‧Back electrode
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JP2013143499A (en) * | 2012-01-11 | 2013-07-22 | Toyo Aluminium Kk | Paste composition |
WO2013115076A1 (en) * | 2012-02-02 | 2013-08-08 | 東洋アルミニウム株式会社 | Paste composition |
CN103985769A (en) * | 2013-02-07 | 2014-08-13 | 茂迪股份有限公司 | solar cell and module thereof |
US20160108500A1 (en) * | 2014-10-15 | 2016-04-21 | Hyundai Motor Company | Alloy for die-cast vehicle parts and method for manufacturing the same |
WO2016178386A1 (en) * | 2015-05-01 | 2016-11-10 | 東洋アルミニウム株式会社 | Aluminum paste composition for perc solar cell |
Also Published As
Publication number | Publication date |
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TW201836162A (en) | 2018-10-01 |
WO2018180441A1 (en) | 2018-10-04 |
CN110462845A (en) | 2019-11-15 |
CN110462845B (en) | 2023-01-13 |
JP7173960B2 (en) | 2022-11-16 |
KR102485772B1 (en) | 2023-01-05 |
JPWO2018180441A1 (en) | 2020-02-06 |
KR20190125971A (en) | 2019-11-07 |
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