TWI758773B - connection device - Google Patents

Abstract

The connecting device includes: a device box provided with an insertion hole for the electric wire; a terminal for contacting the electric wire inserted into the insertion hole for the electric wire; and a locking spring for locking the electric wire and maintaining the contact state of the electric wire to the terminal. The locking spring has: a first leg portion fixed in the device case; a curved portion bent and extended from the first leg portion; and a second leg portion elastically connected to the first leg portion through the curved portion part, and is displaced according to the insertion of the wire into the wire insertion hole. Furthermore, the device case is provided with an insertion hole for the probe, which enables the probe to contact the bent portion of the locking spring.

Description

connection device

The present invention relates to a connection device including a push-in mechanism that not only inserts an electric wire into an insertion hole for electric wires, but also forms a firm connection state with the electric wire.

There are many switch devices including a push-in mechanism as an example of a connecting device. The push-in mechanism usually includes: a terminal contacted by the wire inserted into the wire insertion hole, and a locking spring that locks the wire to maintain the contact state of the wire to the terminal, and the locking spring includes: a fixed first A leg portion, a bent portion extending from the first leg portion, and a second leg portion, the second leg portion being a portion elastically connected to the first leg portion via the bent portion and inserted into the electric wire according to the electric wire It is displaced by being inserted into the hole (for example, refer to Patent Document 1).

On the other hand, in order to remove the wire in the push-in mechanism as described above, it is necessary to displace the second leg against the elastic force of the locking spring to release the locked state between the locking spring and the wire. Therefore, Patent Document 1 proposes a technique in which a tool insertion hole is provided separately from the wire insertion hole, and the second leg portion is pressed and displaced by a tool inserted into the tool insertion hole. [Prior Art Literature] [Patent Literature]

[Patent Document 1] Japanese Patent Laid-Open No. 2019-96470

[Problems to be Solved by Invention]

The switching devices described above are incorporated into various circuits via electrical wires. On the other hand, when a poor conduction occurs in the circuit after being incorporated into the circuit, it is necessary to check where the poor conduction occurs to determine the location of the occurrence. Therefore, it is also necessary to check the presence or absence of the poor conduction in the switching device. Therefore, in the case where the switch device has the above-mentioned tool insertion hole, the following method has been used: by inserting the probe connected to the tester into the tool insertion hole, the second pin of the locking spring (made of metal) is connected to contact with each other, so that the connection failure is checked by the locking spring.

In the case of removing the wire, as long as the locking state of the wire and the locking spring is released, the insertion degree of the tool when inserting the tool into the tool insertion hole is often the degree of pressing the tool slightly from the position when it first touched the second leg. degree. Therefore, there are few cases in which the locking spring is plastically deformed by the insertion of a tool when removing the electric wire. However, in the case where the tool insertion hole is also used for the inspection of poor conduction, there are many cases where the probe is strongly inserted to the depth in order to make sure that the probe comes into contact with the locking spring. Therefore, since the locking spring is plastically deformed by the insertion of the probe, there is a concern that the function of the locking spring (the function of locking the electric wire) is deteriorated.

Therefore, the objective of this invention is to provide the connection apparatus which can perform the inspection of a conduction defect without reducing the function of a latching spring. [means to solve the problem]

The connecting device of the present invention includes: a device box provided with an insertion hole for electric wires; a terminal for contacting the electric wire inserted into the insertion hole for electric wires; and a locking spring for locking the electric wire and maintaining the contact state of the electric wire to the terminal. The locking spring has: a first leg portion fixed in the device case; a curved portion bent and extended from the first leg portion; and a second leg portion elastically connected to the first leg portion through the curved portion part, and is displaced according to the insertion of the wire into the wire insertion hole. Furthermore, the device case is provided with an insertion hole for the probe, which enables the probe to contact the bent portion of the locking spring.

In the above-mentioned connecting device, the bending portion is a portion whose strength is increased by bending, so it is difficult to deform when an external force is applied. Furthermore, according to the above-mentioned connection device, the high-strength bent portion of the locking spring can be brought into contact with the probe through the insertion hole for the probe. Therefore, even if the probe is strongly inserted into the probe insertion hole, the locking spring is unlikely to be plastically deformed.

The above-mentioned connecting device may further include a first receiving portion which, on the back side of the curved portion, receives the pressing force of the probe generated when the probe inserted into the insertion hole for the probe contacts the curved portion of the locking spring. pressure. According to this configuration, when the probe is brought into contact with the curved portion of the locking spring, the pressing force of the probe is received by the first receiving portion on the back side of the curved portion. Therefore, the plastic deformation of the locking spring can be surely prevented.

In the above-mentioned connecting device, the insertion hole for the probe can be provided in the device box in a manner that not only the probe can contact the curved portion of the locking spring, but also the first leg portion of the locking spring can be contacted by the probe. middle. According to this configuration, the probe can also be brought into contact with the fixed first leg in the locking spring through the insertion hole for the probe.

The above-mentioned connecting device may further include a second receiving portion, which, on the back side of the first leg portion, receives this generated when the probe inserted into the insertion hole for the probe contacts the first leg portion of the locking spring. The pressure of the probe. According to this configuration, when the probe is brought into contact with the first leg portion of the locking spring, the pressing force of the probe is received by the second receiving portion on the back side of the first leg portion. Therefore, when the probe is pressed against the first leg portion, the plastic deformation of the locking spring can be surely prevented.

In the above-mentioned connecting device, in the device box, instead of the insertion hole for the probe, which can make contact between the probe and the bent portion of the locking spring, a probe that can make the contact between the probe and the first leg of the locking spring is provided. Needle with insertion hole. In addition, the connecting device may further include a receiving portion which, on the back side of the first leg portion, receives the pressing force of the probe generated when the probe inserted into the insertion hole for the probe is brought into contact with the first leg portion. pressure. According to this configuration, the probe can be brought into contact with the fixed first leg of the locking spring through the insertion hole for the probe. In addition, when the probe is brought into contact with the first leg portion of the locking spring, the pressing force of the probe is received by the receiving portion on the back side of the first leg portion. Therefore, even when the probe is inserted strongly into the probe insertion hole, the plastic deformation of the locking spring can be surely prevented. [Effect of invention]

According to the present invention, the connection device can be inspected for poor conduction without deteriorating the function of the locking spring.

[1] Embodiment Hereinafter, an embodiment in which the present invention is applied to a switchgear will be described. The switch device of this embodiment is connected between two wires W1 and W2 (refer to FIG. 3 ), and is a device for selectively switching the conduction and the blocking between them.

FIG. 1(A) and FIG. 1(B) are a front view and a bottom view conceptually showing the switch device of the present embodiment, respectively. Fig. 2(A) is a cross-sectional view taken along the line IIA-IIA of Fig. 1(B), and Fig. 2(B) is an enlarged view of the region IIB of Fig. 2(A). FIG. 3(A) is a cross-sectional view showing the connection state of the electric wires W1 and W2 to the switchgear, and FIG. 3(B) is an enlarged view of the IIIB region of FIG. 3(A). As shown in these figures, the switchgear includes a device box 1 . Furthermore, on the bottom surface 1a of the device box 1, wire insertion holes 11a and 11b for inserting the wires W1 and W2, respectively, are provided on the left and right. In addition, although it does not specifically limit, In this embodiment, two insertion holes 11a and 11b for electric wires are provided in each of the right and left (refer FIG.1(B)).

The switch device further includes: push-in mechanisms 2A and 2B, which not only insert the wires W1 and W2 into the wire insertion holes 11a and 11b, respectively, but also form a firm connection state with the wires W1 and W2; release mechanisms 3A and 3B are used for In order to release the firmly connected state with the electric wires W1 and W2 by the push-in mechanisms 2A and 2B respectively; and the switch mechanism 4 to switch the conduction and blocking between the two electric wires W1 and W2 (refer to FIG. 2(A) and Fig. 3(A)).

<Push-in mechanism> Inside the device box 1, spaces 10a and 10b are formed at the depths of the wire insertion holes 11a and 11b, respectively, and push mechanisms 2A and 2B are respectively constructed in the spaces 10a and 10b (see FIG. 2(A) ). Hereinafter, the configuration of the push-in mechanism 2A will be specifically described. In addition, in the present embodiment, the same components are used as the pushing mechanisms 2A and 2B. Therefore, regarding the structure of the push-in mechanism 2B, in the following description, referring to the drawings, the symbols "10a", "11a", "21A", "22A" and "W1" are replaced by "10b", "11b", "21B", "22B", and "W2" will be described.

The push-in mechanism 2A includes: a terminal 21A to which the electric wire W1 inserted into the electric wire insertion hole 11a contacts, and a locking spring 22A that locks the electric wire W1 and maintains the contact state of the electric wire W1 to the terminal 21A (see FIG. 2 ( B)).

Specifically, the terminal 21A is arranged in the space 10a such that, as shown in FIG. 3(B) , the electric wire W1 is inserted into the electric wire insertion hole 11a, and when the front end 101 of the electric wire W1 reaches the space 10a, One side (the left side in FIG. 3(B) ) of the side peripheral surface of the front end portion 101 is in surface contact. More specifically, the terminal 21A is located at a position on one side of the region where the front end portion 101 of the electric wire W1 in the space 10a is inserted, and is arranged along the region.

The locking spring 22A is formed of a conductive material (metal, etc.), and includes a first leg portion 221 fixed in the device box 1 , a curved portion 220 bent and extended from the first leg portion 221 , and a The bent portion 220 is a second leg portion 222 elastically connected to the first leg portion 221 .

More specifically, the locking spring 22A is arranged in a state in which the bent portion 220 faces the bottom surface 1a. Then, the holding part 23 for holding the locking spring 22A is fitted into the space 10a, and the end 221a of the first leg part 221 is engaged with the stop part 230 provided on the holding part 23, and the end 221a is opposed to the space The area where the front end portion 101 of the electric wire W1 in 10a is inserted is fixed at a position opposite to the terminal 21A. The second leg portion 222 extends from the bent portion 220 toward the terminal 21A so as to contact the front end portion 101 at the same time when the front end portion 101 of the electric wire W1 starts to be inserted into the above-mentioned region or immediately thereafter. In addition, the stop part 230 is not limited to the shape or structure shown in FIG. 2(B) as long as the first leg part 221 can be fixed in the space 10a, and can be deformed into other various shapes or structures.

Therefore, when the electric wire W1 is inserted into the electric wire insertion hole 11a, and the distal end portion 101 of the electric wire W1 begins to be inserted into the space 10a, the second leg portion 222 is pressed by the distal end portion 101, and thereby the second leg portion 222 is pressed against the first leg portion 221. Displacement in the direction in which the distance between them decreases. Thereby, a restoring force (elastic force) to return to the original position is generated in the second leg portion 222 , and this restoring force acts on the front end portion 101 of the electric wire W1 . Then, as shown in FIG. 3(B) , the front end portion 101 is further inserted into the space 10 a against the restoring force of the locking spring 22A, whereby the end portion 222 a of the second leg portion 222 faces the side of the front end portion 101 . Among the peripheral surfaces, the surfaces on the opposite side (right side in FIG. 3(B) ) of the terminals 21A are in contact with each other obliquely.

Thereby, the front end portion 101 is pressed against the terminal 21A by the restoring force of the locking spring 22A, and as a result, the contact between the front end portion 101 and the terminal 21A is assured. In addition, when the end portion 222a of the second leg portion 222 is in inclined contact with the side peripheral surface of the front end portion 101, when a force in the direction of pulling out from the wire insertion hole 11a is applied to the wire W1, the second The end portion 222a of the leg portion 222 is hooked on the side peripheral surface of the front end portion 101, and as a result, the movement of the front end portion 101 in the pulling-out direction is prevented. Therefore, according to the push-in mechanism 2A described above, the electric wire W1 is not only inserted into the electric wire insertion hole 11a, but also the front end portion 101 of the electric wire W1 and the terminal 21A are firmly connected.

＜Removal mechanism＞ The bottom surface 1a of the apparatus box 1 is provided with through-holes 12a and 12b communicating with the spaces 10a and 10b, respectively (refer to FIGS. 1(B) and 2(A) ). Specifically, the through-hole 12a is formed at a part of the second leg portion 222 of the locking spring 22A disposed in the space 10a (in this embodiment, it is closer to the front end portion 101 of the electric wire W1 in the second leg portion 222 than the front end portion 101 of the second leg portion 222). The contact portion is closer to the portion of the bent portion 220 ) facing the position, and is provided along the wire insertion hole 11 a (refer to FIG. 2(B) ). Similarly, the through-hole 12b is formed at a part of the second leg portion 222 of the locking spring 22B disposed in the space 10b (in this embodiment, the front end portion 101 of the electric wire W2 in the second leg portion 222 is in contact with the A portion closer to the portion of the bent portion 220 ) is disposed along the wire insertion hole 11b.

Furthermore, in the through-hole 12a, the release operation element 31 is inserted so as to protrude into the space 10a by being pushed in from the outside, and the release mechanism 3A is constituted by these. According to the release mechanism 3A as described above, when the front end portion 101 of the electric wire W1 and the terminal 21A are firmly connected by the push-in mechanism 2A, the release operating element 31 can be pushed in the The distal end portion of the release operating element 31 presses the second leg portion 222 of the locking spring 22A (see FIG. 4 ). Specifically, the second leg portion 222 can be displaced in a direction in which the distance between the second leg portion 222 and the first leg portion 221 decreases against the restoring force of the locking spring 22A. As described above, by displacing the second leg portion 222 , the hook of the second leg portion 222 on the side peripheral surface of the front end portion 101 is released. Thereby, the firmly connected state with the electric wire W1 by the push-in mechanism 2A is released, and as a result, the electric wire W1 can be pulled out from the insertion hole 11a for electric wires.

Similarly, in the through-hole 12b, the release operation element 31 is inserted so as to protrude into the space 10b by being pushed in from the outside, and the release mechanism 3B is constituted by these (refer to FIG. 2(A) ).

<Switch mechanism> Another space 10c isolated from the spaces 10a and 10b is formed in the center part of the inside of the apparatus box 1, and the switch mechanism 4 is constructed|assembled in this space 10c (refer FIG.2(A)). Specifically, the switch mechanism 4 includes fixed contacts 41A and 41B, movable contacts 42A and 42B, an operating element 43 , and a return spring 44 .

The fixed contacts 41A and 41B are contacts fixed in the device box 1 . In this embodiment, the conductive member 401A connected to the terminal 21A in the space 10a protrudes from the terminal 21A into the space 10c. Similarly, the conductive member 401B connected to the terminal 21B in the space 10b extends from the terminal 21B and protrudes into the space 10c. In addition, in FIG. 2(A), since this figure is a cross-sectional view, the conductive members 401A and 401B and the terminals 21A and 21B are shown as being separated from each other, but they are actually connected to each other. Furthermore, the fixed contacts 41A and 41B are respectively fixed to the front ends of the two conductive members 401A and 401B protruding in the space 10c.

The movable contacts 42A and 42B are respectively fixed at the positions opposite to the fixed contacts 41A and 41B by the conductive members 402 which make them conduct with each other (the upper position in FIG. 2(A) ). Moreover, the movable contacts 42A and 42B are in a state in which the conductive member 402 maintains the positional relationship with each other, and are in the open position separated from the fixed contacts 41A and 41B (see FIG. 2(A) ) and with the fixed contact 41A Between the closed position (not shown) in which 41B contacts, the operating element 43 protruding upward from the top surface 1 b of the device box 1 moves up and down according to the up and down movement.

Moreover, in this embodiment, the switch mechanism 4 is comprised so that the movable contacts 42A and 42B may become normally open contacts. Specifically, when the return spring 44 acts on the operation element 43 , the movable contacts 42A and 42B are always urged toward the open position via the operation element 43 .

<Structure for inspection> In addition to the above-mentioned mechanisms (the push-in mechanisms 2A and 2B, the release mechanisms 3A and 3B, and the switch mechanism 4 ), the switch device of the present embodiment further includes the following structure (structure for inspection): In the state in which the wires W1 and W2 are inserted into the wire (specifically, the state where the wires W1 and W2 are firmly connected by the push-in mechanisms 2A and 2B; see FIG. inspection.

In the present embodiment, the probe insertion holes 50a and 50b are provided on the bottom surface 1a of the device case 1 as a structure for inspection as described above (see FIGS. 1(B), 2(A) and 3(A) . ). Specifically, the probe insertion hole 50a is provided so as to face only the curved portion 220 of the locking spring 22A arranged in the space 10a. According to the above-described probe insertion hole 50a, as shown in FIG. 5, one of the two probes P1 and P2 (probe P2 not shown) connected to the tester (not shown) can be probed The needle P1 contacts only the bent portion 220 of the locking spring 22A. Likewise, the probe insertion hole 50b is provided so as to be able to face only the curved portion 220 of the locking spring 22B arranged in the space 10b. According to the insertion hole 50b for probes as described above, the other probe P2 connected to the tester can be brought into contact with only the bent portion 220 of the locking spring 22B.

Here, in a state where the push-in mechanisms 2A and 2B are firmly connected to the wires W1 and W2, the locking springs 22A and 22B are connected to the terminals 21A and 22B via the front end portions 101 of the wires W1 and W2, respectively. On state (refer to Figure 3(A)). Therefore, when a firm connection state as described above is formed, the terminals can be inspected using the latching springs 22A and 22B (ie, by bringing the probes P1 and P2 into contact with the latching springs 22A and 22B, respectively) Poor continuity between 21A and 21B. Furthermore, according to the structure for inspection mentioned above, the contact of the probes P1 and P2 to the locking springs 22A and 22B as described above can be performed.

In addition, since the bending portion 220 is a portion whose strength is improved by bending, it is difficult to deform even when an external force is applied. Furthermore, according to the above-mentioned structure for inspection, the probes P1 and P2 can be brought into contact with only the high-strength curved portions 220 of the locking springs 22A and 22B, respectively, through the probe insertion holes 50a and 50b. Therefore, even when the probes P1 and P2 are strongly inserted into the probe insertion holes 50a and 50b, respectively, the locking springs 22A and 22B are less likely to be plastically deformed. Therefore, in the switch device of the present embodiment, the function of the locking springs 22A and 22B (the function of locking the electric wire) is not degraded, and it is possible to check for poor conduction.

In the structure for inspection as described above, the switch device further includes first receiving portions 51A and 51B (see FIG. 2(A) ). Here, the first receiving portion 51A is on the back side of the curved portion 220 and receives the probe P1 generated when the probe P1 inserted into the probe insertion hole 50a comes into contact with the curved portion 220 (see FIG. 5 ). the pressing force. In this embodiment, the 1st receiving part 51A is provided in the holding|maintenance member 23 (refer FIG.2(B)) fitted in the space 10a. Likewise, the first receiving portion 51B is on the back side of the curved portion 220 and receives the pressing force of the probe P2 generated when the probe P2 inserted into the probe insertion hole 50b contacts the curved portion 220 . In the present embodiment, the first receiving portion 51B is provided on the holding member 23 fitted into the space 10b.

According to the first receiving portions 51A and 51B as described above, when the probes P1 and P2 are brought into contact with the curved portions 220 of the locking springs 22A and 22B, respectively, the pressing forces of the probes P1 and P2 are on the backside of the curved portions 220 , respectively. The side is received by the first receiving parts 51A and 51B. Therefore, the plastic deformation of the locking springs 22A and 22B can be surely prevented.

[2] Modifications [2-1] The first modification FIG. 6(A) is a cross-sectional view of the switchgear according to the first modification, and FIG. 6(B) is an enlarged view of the VIB region of FIG. 6(A). As shown in these figures, the probe insertion hole 50a may be provided in the device case 1 so that both the curved portion 220 and the first leg portion 221 of the locking spring 22A face each other. According to the insertion hole 50a for the probe as described above, not only can the probe P1 be brought into contact with the bent portion 220 of the locking spring 22A, but also the probe P1 can be fixed to the stop portion 230 as shown in FIG. 7 . The first leg portion 221 is in contact. Similarly, the insertion hole 50b for probes may be provided in the apparatus case 1 so that any one of the curved part 220 and the 1st leg part 221 of the locking spring 22B faces.

In the structure for inspection as described above, the switch device may further include second receiving portions 52A and 52B (see FIG. 6(A) ). Here, the second receiving portion 52A is located on the back side of the first leg portion 221, and receives the first leg portion 221 when the probe P1 inserted into the probe insertion hole 50a comes into contact with the first leg portion 221 (see FIG. 7 ). The pressing force of the probe P1. In this embodiment, 52 A of 2nd receiving parts are provided in the holding|maintenance member 23 (refer FIG.6(B)) fitted in the space 10a. Similarly, the second receiving portion 52B receives the pressing force of the probe P2 generated when the probe P2 inserted into the probe insertion hole 50b contacts the first leg portion 221 on the back side of the first leg portion 221 . In the present embodiment, the second receiving portion 52B is provided on the holding member 23 fitted into the space 10b.

According to the second receiving portions 52A and 52B as described above, when the probes P1 and P2 are brought into contact with the first leg portions 221 of the locking springs 22A and 22B, respectively, the pressing forces of the probes P1 and P2 are on the first leg respectively. The rear side of the portion 221 is received by the second receiving portions 52A and 52B. Therefore, when the probes P1 and P2 are pressed against the first leg portions 221 of the locking springs 22A and 22B, respectively, the plastic deformation of the locking springs 22A and 22B can be surely prevented.

[2-2] Second modification example FIG. 8(A) is a cross-sectional view of a switchgear according to a second modification example, and FIG. 8(B) is an enlarged view of a region VIIIB in FIG. 8(A). As shown in these figures, the probe insertion hole 50a may be provided in the device case 1 so as to face only the first leg portion 221 of the locking spring 22A. According to the above-described insertion hole 50a for the probe, as shown in FIG. 9, the probe P1 can be brought into contact with only the first leg portion 221. Likewise, the probe insertion hole 50b may be provided in the device case 1 so as to face only the first leg portion 221 of the locking spring 22B. According to the insertion hole 50b for probes as described above, the probes P2 can be brought into contact with only the first leg portion 221 .

In the structure for inspection as described above, the switch device may include the second receiving portions 52A and 52B (see FIGS. 8(A) and 8(B) ). On the other hand, the above-mentioned first receiving parts 51A and 51B may not exist.

[2-3] The third modification In the switchgear of the above-described embodiment and modification, a configuration in which at least one of the first receiving parts 51A and 51B and the second receiving parts 52A and 52B does not exist may be adopted, or a configuration in which all of them do not exist may be adopted. .

[2-4] Other modifications The configuration of each part of the switch device described above is not limited to the switch device, and can be applied to various connection devices including a push-in mechanism.

The descriptions of the above-described embodiments are illustrative in all respects, and should not be considered restrictive. The scope of the present invention is not the above-mentioned embodiments, but is disclosed by the scope of the patent application. Furthermore, the scope of the present invention includes the meaning equivalent to the scope of the patent application and all changes within the scope.

1: Device box 1a: Bottom surface 1b: top surface 2A, 2B: Push-in mechanism 3A, 3B: Release mechanism 4: switch mechanism 10a, 10b, 10c: Space 11a, 11b: Insertion holes for wires 12a, 12b: through holes 21A, 21B: Terminals 22A, 22B: locking spring 23: Hold Parts 31: Release operating element 41A, 41B: Fixed contacts 42A, 42B: Movable contact 43: Operating elements 44: Recovery Spring 50a, 50b: Insertion holes for probes 51A, 51B: The first receiving part 52A, 52B: The second receiving part P1, P2: Probes W1, W2: wires 101: Front end 220: Bending part 221: 1st foot 222: Leg 2 221a, 222a: end 230: Stay Department 401A, 401B, 402: Conductive members

1(A) and FIG. 1(B) are a front view and a bottom view conceptually showing the switchgear of this embodiment, respectively. [Fig. 2] Fig. 2(A) is a cross-sectional view taken along the line IIA-IIA of Fig. 1(B), and Fig. 2(B) is an enlarged view of the IIB region of Fig. 2(A). [FIG. 3] FIG. 3(A) is a sectional view showing the connection state of the electric wire and the switchgear, and FIG. 3(B) is an enlarged view of the IIIB area of FIG. 3(A). Fig. 4 is a cross-sectional view showing a state in which the firm connection state with the electric wire by the push-in mechanism is released. [ Fig. 5] Fig. 5 is a cross-sectional view showing a state in which a probe is inserted into the probe insertion hole in the switch device according to the embodiment. [ Fig. 6] Fig. 6(A) is a cross-sectional view of the switchgear according to the first modification, and Fig. 6(B) is an enlarged view of the VIB region of Fig. 6(A). [ Fig. 7] Fig. 7 is a cross-sectional view showing a state in which a probe is inserted into the probe insertion hole in the switch device according to the first modification. [ Fig. 8] Fig. 8(A) is a cross-sectional view of a switchgear according to a second modification, and Fig. 8(B) is an enlarged view of a region VIIIB in Fig. 8(A). [ Fig. 9] Fig. 9 is a cross-sectional view showing a state in which a probe is inserted into the probe insertion hole in the switch device according to the second modification.

1: Device box

1a: Bottom surface

1b: top surface

2A, 2B: Push-in mechanism

3A, 3B: Release mechanism

4: switch mechanism

10a, 10b, 10c: Space

11a, 11b: Insertion holes for wires

12a, 12b: through holes

21A, 21B: Terminals

22A, 22B: locking spring

23: Hold Parts

31: Release operating element

41A, 41B: Fixed contacts

42A, 42B: Movable contact

43: Operating elements

44: Recovery Spring

50a, 50b: Insertion holes for probes

51A, 51B: The first receiving part

220: Bending part

221: 1st foot

222: Leg 2

221a, 222a: end

230: Stay Department

401A, 401B, 402: Conductive members

Claims (4)

A connection device comprising: a device box provided with an insertion hole for electric wires; a terminal for contacting an electric wire inserted into the insertion hole for electric wires; and a locking spring for locking the electric wire and maintaining the contact state of the electric wire to the terminal The above-mentioned locking spring has: a first leg portion fixed in the device box; a bending portion, which is bent and extended from the first leg portion; and a second leg portion, which is connected to the first leg through the bending portion The part is elastically connected to the part, and is displaced according to the insertion of the electric wire into the insertion hole for the electric wire; the insertion hole for the probe is provided in the device box, which enables the contact of the probe to the bending part; in A first receiving portion is provided on the back side of the curved portion not facing the insertion hole for the probe, which receives the probe when inserted into the insertion hole for the probe, and a first receiving portion that faces the insertion hole for the probe. The pressing force of the probe generated when the surface of the curved portion is in contact. The connection device according to claim 1, wherein the insertion hole for the probe is provided in the device box in such a manner that not only the contact of the probe with the curved portion but also the contact of the probe with the first leg portion can be performed middle. The connection device according to claim 2, further comprising: a second receiving portion, on the back side of the first leg portion, for receiving a probe inserted into the probe insertion hole for contacting the first leg portion. The pressing force of the above-mentioned probe is generated. A connection device comprising: a device box provided with an insertion hole for electric wires; a terminal for contacting an electric wire inserted into the insertion hole for electric wires; and a locking spring for locking the electric wire and maintaining the contact state of the electric wire to the terminal ; The above-mentioned locking spring includes: a first leg part, fixed in the above-mentioned device box; a bending part, from the first leg part bent and extended; and a second leg portion, which is a part elastically connected to the first leg portion through the bent portion, and is displaced according to the insertion of the electric wire into the insertion hole for the electric wire; provided in the device box There is an insertion hole for the probe, which enables the contact of the probe to the first leg portion; and a second receiving portion is provided on the back side of the first leg portion not facing the insertion hole for the probe, which It withstands the pressing force of the probe generated when the probe inserted into the probe insertion hole comes into contact with the surface of the first leg portion facing the probe insertion hole.

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