TWI756970B - Level status detector - Google Patents
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- TWI756970B TWI756970B TW109143129A TW109143129A TWI756970B TW I756970 B TWI756970 B TW I756970B TW 109143129 A TW109143129 A TW 109143129A TW 109143129 A TW109143129 A TW 109143129A TW I756970 B TWI756970 B TW I756970B
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- G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
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- G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
- G05F1/56—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
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Abstract
Description
本發明係有關於一種電位狀態判別裝置,特別是指一種能夠判斷浮接狀態的電位狀態判別裝置。 The present invention relates to a potential state judging device, in particular to a potential state judging device capable of judging a floating state.
在電子電路的設計中,常會透過電位狀態判別裝置來判斷特定節點的電位狀態,或是判斷與特定節點有關的電路或元件的狀態。然而,在先前技術中,電位狀態判別裝置只能夠判斷特定的固定電位,而無法判斷特定節點是否處在浮接(floating)狀態,因此限制了電位狀態判別裝置的應用範圍。 In the design of electronic circuits, the potential state of a specific node is often judged by a potential state judging device, or the state of a circuit or element related to a specific node is judged. However, in the prior art, the potential state identification device can only determine a specific fixed potential, but cannot determine whether a specific node is in a floating state, thus limiting the application range of the potential state identification device.
本發明之一實施例提供一種電位狀態判別裝置,電位狀態判別裝置包含輸入端、壓降電路、下拉電路、負載電路、電晶體、上拉電路、第一輸出端及第二輸出端。 An embodiment of the present invention provides a potential state judging device, which includes an input terminal, a voltage drop circuit, a pull-down circuit, a load circuit, a transistor, a pull-up circuit, a first output terminal and a second output terminal.
壓降電路具有第一端及第二端,壓降電路的第一端耦接於輸入端。下拉電路具有第一端及第二端,下拉電路的第一端耦接於壓降電路之第二端,而下拉電路的第二端耦接於第一參考電壓端。負載電路具有第一端及第二端,負載電路的第一端耦接於第二參考電壓端。電晶體具有第一端、第二端及控制端,電晶體的第一端耦接於負載電路之第二端,電晶體的第二端耦接於第一參考電壓 端。上拉電路具有第一端及第二端,上拉電路的第一端耦接於第二參考電壓端,而上拉電路的第二端耦接於壓降電路之第一端。 The voltage drop circuit has a first end and a second end, and the first end of the voltage drop circuit is coupled to the input end. The pull-down circuit has a first end and a second end, the first end of the pull-down circuit is coupled to the second end of the voltage drop circuit, and the second end of the pull-down circuit is coupled to the first reference voltage end. The load circuit has a first end and a second end, and the first end of the load circuit is coupled to the second reference voltage end. The transistor has a first end, a second end and a control end, the first end of the transistor is coupled to the second end of the load circuit, and the second end of the transistor is coupled to the first reference voltage end. The pull-up circuit has a first end and a second end, the first end of the pull-up circuit is coupled to the second reference voltage end, and the second end of the pull-up circuit is coupled to the first end of the voltage drop circuit.
第一輸出端耦接於電晶體之第一端,用以輸出第一狀態判別訊號,而第二輸出端用以輸出第二狀態判別訊號。電晶體之控制端係耦接於壓降電路之第二端且第二輸出端係耦接於壓降電路之第一端,或電晶體之控制端係耦接於壓降電路之第一端且第二輸出端係耦接於壓降電路之第二端。 The first output terminal is coupled to the first terminal of the transistor for outputting the first state discrimination signal, and the second output terminal is used for outputting the second state discrimination signal. The control end of the transistor is coupled to the second end of the voltage drop circuit and the second output end is coupled to the first end of the voltage drop circuit, or the control end of the transistor is coupled to the first end of the voltage drop circuit And the second output terminal is coupled to the second terminal of the voltage drop circuit.
第一狀態判別訊號及第二狀態判別訊號係用以判斷輸入端之電位狀態。 The first state discriminating signal and the second state discriminating signal are used to judge the potential state of the input terminal.
100、200、300、400、500、600、700、800:電位狀態判別裝置 100, 200, 300, 400, 500, 600, 700, 800: Potential state discrimination device
110、410、510、810:壓降電路 110, 410, 510, 810: Voltage drop circuit
120、420、520、820:下拉電路 120, 420, 520, 820: pull-down circuit
130、354、430、454、530、754、830、854:負載電路 130, 354, 430, 454, 530, 754, 830, 854: Load circuit
140、440、540、840:上拉電路 140, 440, 540, 840: pull-up circuit
250、350、450、650、750、850:邏輯電路 250, 350, 450, 650, 750, 850: Logic circuits
352、452:反及閘 352, 452: Reverse and gate
460、860:內部電路 460, 860: Internal circuit
462、862:開關電路 462, 862: switch circuit
464、864:功能電路 464, 864: functional circuit
752、852:反或閘 752, 852: anti-OR gate
CS1、CS2、CS3:電流源 CS1, CS2, CS3: Current Sources
DA、D1、D2、D3:二極體 DA, D1, D2, D3: Diodes
DU1、DU2、DU3:二極體單元 DU1, DU2, DU3: Diode unit
ID:偵測電流 I D : Detection current
IL1、IL2:負載電流 I L1 , I L2 : load current
IN:輸入端 IN: input terminal
M1A、M1B、M2、M3、M4、M5、M6A、M6B、M7A、M7B、M8、M9:電晶體 M1A, M1B, M2, M3, M4, M5, M6A, M6B, M7A, M7B, M8, M9: Transistor
OUT1、OUT2:輸出端 OUT1, OUT2: output terminal
RA、RB、R1、R2、R3:電阻 RA, RB, R1, R2, R3: Resistors
VN1、VN2:參考電壓端 VN1, VN2: reference voltage terminals
SIGD1、SIGD2:狀態判別訊號 SIG D1 , SIG D2 : Status discrimination signal
SIGctrl:控制訊號 SIG ctrl : control signal
第1圖為本發明一實施例之電位狀態判別裝置的示意圖。 FIG. 1 is a schematic diagram of a potential state discriminating device according to an embodiment of the present invention.
第2圖為本發明另一實施例之電位狀態判別裝置的示意圖。 FIG. 2 is a schematic diagram of a potential state judging device according to another embodiment of the present invention.
第3圖為本發明另一實施例之電位狀態判別裝置的示意圖。 FIG. 3 is a schematic diagram of a potential state judging device according to another embodiment of the present invention.
第4圖為本發明一實施例之電位狀態判別裝置的應用示意圖。 FIG. 4 is a schematic diagram of the application of the potential state discriminating device according to an embodiment of the present invention.
第5圖為本發明另一實施例之電位狀態判別裝置的示意圖。 FIG. 5 is a schematic diagram of a potential state judging device according to another embodiment of the present invention.
第6圖為本發明另一實施例之電位狀態判別裝置的示意圖。 FIG. 6 is a schematic diagram of a potential state judging device according to another embodiment of the present invention.
第7圖為本發明另一實施例之電位狀態判別裝置的示意圖。 FIG. 7 is a schematic diagram of a potential state judging device according to another embodiment of the present invention.
第8圖為本發明另一實施例之電位狀態判別裝置的應用示意圖。 FIG. 8 is a schematic diagram of an application of a potential state discriminating device according to another embodiment of the present invention.
第1圖為本發明一實施例之電位狀態判別裝置100的示意圖。電位狀態判別裝置100包含輸入端IN、輸出端OUT1、輸出端OUT2、壓降電路110、下拉電路120、負載電路130、電晶體M1A及上拉電路140。
FIG. 1 is a schematic diagram of a potential state
壓降電路110具有第一端及第二端,壓降電路110的第一端耦接於輸入端IN。當電流通過壓降電路110時,壓降電路110會在其第一端及第二端之間對應地產生壓降。
The
下拉電路120具有第一端及第二端,下拉電路120的第一端耦接於壓降電路110之第二端,而下拉電路120之第二端耦接於參考電壓端VN1。
The pull-
負載電路130具有第一端及第二端,負載電路130的第一端耦接於參考電壓端VN2。
The
電晶體M1A具有第一端、第二端及控制端。電晶體M1A的第一端耦接於負載電路130之第二端,電晶體M1A的第二端耦接於參考電壓端VN1,而電晶體M1A的控制端耦接於壓降電路110之第二端。
The transistor M1A has a first terminal, a second terminal and a control terminal. The first end of the transistor M1A is coupled to the second end of the
上拉電路140具有第一端及第二端,上拉電路140的第一端耦接於參考電壓端VN2,而上拉電路140的第二端耦接於壓降電路110之第一端。在本發明的部分實施例中,參考電壓端VN2所提供的電壓可高於參考電壓端VN1所提供的電壓。舉例來說,參考電壓端VN2所提供的電壓可例如但不限於是系統中的操作電壓,而參考電壓端VN1所提供的電壓則可例如但不限於是系統中的接地電壓。
The pull-
輸出端OUT1耦接於電晶體M1A之第一端,並可用以輸出狀態判別訊號SIGD1。輸出端OUT2耦接於壓降電路110之第一端,並可用以輸出狀態判別訊號SIGD2。電位狀態判別裝置100可根據輸入端IN之電位狀態輸出不同電壓的狀態判別訊號SIGD1及SIGD2。也就是說,狀態判別訊號SIGD1及SIGD2可用以判斷輸入端IN之電位狀態。在本發明的部分實施例中,輸入端IN可耦接於特定節點,藉以判斷特定節點的電位狀態,或是判斷與特定節點有關的電路或元件的狀態。
The output terminal OUT1 is coupled to the first terminal of the transistor M1A, and can be used for outputting the state discrimination signal SIG D1 . The output terminal OUT2 is coupled to the first terminal of the
舉例來說,當輸入端IN的電位狀態是處於浮接(floating)狀態時,在產生適當大小之偵測電流ID的情況下,偵測電流ID會流經上拉電路140、
壓降電路110及下拉電路120,上拉電路140將對應地產生壓降,輸出端OUT2的電壓可視為參考電壓端VN2所提供的電壓與上拉電路140所產生的壓降之差值,此時輸出端OUT2將輸出具有高電壓的狀態判別訊號SIGD2。電晶體M1A的控制端所接收到的電壓可視為由壓降電路110及下拉電路120對輸出端OUT2的電壓進行分壓後的電壓,因此電晶體M1A的控制端會接收偏低的電壓,使得電晶體M1A被截止。在此情況下,輸出端OUT1的電壓可視為參考電壓端VN2所提供的電壓,因此輸出端OUT1同樣會輸出具有高電壓的狀態判別訊號SIGD1。
For example, when the potential state of the input terminal IN is in a floating state, the detection current ID will flow through the pull-
然而,當輸入端IN的電位狀態是處於高電壓狀態時,在產生適當大小之偵測電流ID的情況下,電晶體M1A的控制端所接收到的電壓可視為由壓降電路110及下拉電路120對輸入端IN的高電壓進行分壓後的電壓,使得電晶體M1A的控制端處於偏高的電壓,因此電晶體M1A被導通。此時,輸出端OUT1的電壓會被電晶體M1A拉低至接近參考電壓端VN1所提供的電壓,因此輸出端OUT1將輸出具有低電壓的狀態判別訊號SIGD1。此外,輸出端OUT2的電壓將由輸入端IN的高電壓主導,因此輸出端OUT2將輸出具有高電壓的狀態判別訊號SIGD2。
However, when the potential state of the input terminal IN is in a high voltage state, the voltage received by the control terminal of the transistor M1A can be regarded as the voltage received by the
再者,當輸入端IN的電位狀態是處於低電壓狀態時,在產生適當大小之偵測電流ID的情況下,電晶體M1A的控制端所接收到的電壓可視為由壓降電路110及下拉電路120對輸入端IN的低電壓進行分壓後的電壓,使得電晶體M1A的控制端處於偏低的電壓,因此電晶體M1A被截止。在此情況下,輸出端OUT1的電壓可視為參考電壓端VN2所提供的電壓,因此輸出端OUT1將輸出具有高電壓的狀態判別訊號SIGD1。此外,輸出端OUT2的電壓將由輸入端IN的低電壓主導,因此輸出端OUT2將輸出具有低電壓的狀態判別訊號SIGD2。
Furthermore, when the potential state of the input terminal IN is in a low voltage state, the voltage received by the control terminal of the transistor M1A can be regarded as being generated by the
如此一來,透過狀態判別訊號SIGD1及SIGD2就可以判斷輸入端IN之電位狀態。也就是說,當狀態判別訊號SIGD1及SIGD2皆為高電壓時,表示輸入端IN的電位狀態是處於浮接狀態。而當狀態判別訊號SIGD1及SIGD2為相異的電壓 時,則表示輸入端IN的電位狀態是處於高電壓或低電壓狀態。 In this way, the potential state of the input terminal IN can be determined through the state determination signals SIG D1 and SIG D2 . That is to say, when the state discrimination signals SIG D1 and SIG D2 are both high voltages, it indicates that the potential state of the input terminal IN is in a floating state. When the state discrimination signals SIG D1 and SIG D2 are at different voltages, it indicates that the potential state of the input terminal IN is in a high voltage state or a low voltage state.
偵測電流ID的電流值可設計為在輸入端IN的電位狀態是處於高電壓狀態時,能促使電晶體M1A的控制端提升至足夠高的電壓以導通電晶體M1A,並且在輸入端IN的電位狀態是處於低電壓狀態或處於浮接狀態時,能促使電晶體M1A的控制端調整至偏低的電壓以截止電晶體M1A。在本發明的部分實施例中,可透過適當地設計上拉電路140、壓降電路110及下拉電路120,藉以產生適當大小之偵測電流ID。
The current value of the detection current ID can be designed such that when the potential state of the input terminal IN is in a high voltage state, the control terminal of the transistor M1A can be boosted to a high enough voltage to turn on the transistor M1A, and the input terminal IN is in a high voltage state. When the potential state of the transistor M1A is in a low voltage state or in a floating state, the control terminal of the transistor M1A can be adjusted to a low voltage to turn off the transistor M1A. In some embodiments of the present invention, the pull-up
第2圖為本發明另一實施例之電位狀態判別裝置200的示意圖。電位狀態判別裝置200與電位狀態判別裝置100具有相似的結構並且可以根據相似的原理操作,然而電位狀態判別裝置200還可包含邏輯電路250。
FIG. 2 is a schematic diagram of a potential state
邏輯電路250可耦接於輸出端OUT1及OUT2,用以根據狀態判別訊號SIGD1及SIGD2產生與輸入端IN之電位狀態有關的控制訊號SIGctrl。也就是說,透過邏輯電路250,電位狀態判別裝置200可根據輸入端IN之電位狀態輸出不同電壓的控制訊號SIGctrl,並藉以判斷輸入端IN的電位狀態。
The
第3圖為本發明另一實施例之電位狀態判別裝置300的示意圖。電位狀態判別裝置300與電位狀態判別裝置200具有相似的結構並且可以根據相似的原理操作,然而電位狀態判別裝置300的邏輯電路350可包含反及閘(NAND gate)352及負載電路354。
FIG. 3 is a schematic diagram of a potential
反及閘352具有第一輸入端、第二輸入端及輸出端,反及閘352的第一輸入端耦接於輸出端OUT1,反及閘352的第二輸入端耦接於輸出端OUT2,而反及閘352的輸出端用以輸出控制訊號SIGctrl。
The
負載電路354具有第一端及第二端,負載電路354之第一端耦接於參考電壓端VN2,而負載電路354之第二端耦接於反及閘352的輸出端。
The
電位狀態判別裝置300可根據輸入端IN之電位狀態輸出不同電壓的
控制訊號SIGctrl。舉例來說,根據第1圖,當輸入端IN的電位狀態是處於浮接狀態時,輸出端OUT1會輸出具有高電壓的狀態判別訊號SIGD1,且輸出端OUT2會輸出具有高電壓的狀態判別訊號SIGD2。如此一來,反及閘352的輸出端將輸出具有低電壓的控制訊號SIGctrl。
The potential state
此外,當輸入端IN的電位狀態是處於高電壓狀態時,輸出端OUT1會輸出具有低電壓的狀態判別訊號SIGD1,且輸出端OUT2會輸出具有高電壓的狀態判別訊號SIGD2。如此一來,反及閘352的輸出端將輸出具有高電壓的控制訊號SIGctrl。
In addition, when the potential state of the input terminal IN is in a high voltage state, the output terminal OUT1 outputs a state discrimination signal SIG D1 with a low voltage, and the output terminal OUT2 outputs a state discrimination signal SIG D2 with a high voltage. In this way, the output end of the
再者,當輸入端IN的電位狀態是處於低電壓狀態時,輸出端OUT1會輸出具有高電壓的狀態判別訊號SIGD1,且輸出端OUT2會輸出具有低電壓的狀態判別訊號SIGD2。如此一來,反及閘352的輸出端也將輸出具有高電壓的控制訊號SIGctrl。
Furthermore, when the potential state of the input terminal IN is in a low voltage state, the output terminal OUT1 outputs a state discrimination signal SIG D1 with a high voltage, and the output terminal OUT2 outputs a state discrimination signal SIG D2 with a low voltage. In this way, the output terminal of the
也就是說,透過控制訊號SIGctrl就可以判斷輸入端IN的電位狀態。在第3圖中,當控制訊號SIGctrl為低電壓時,表示輸入端IN的電位狀態是處於浮接狀態。而當控制訊號SIGctrl為高電壓時,則表示輸入端IN的電位狀態是處於高電壓或低電壓狀態。在本發明的其他實施例中,邏輯電路350也可能利用其他的邏輯運算來產生控制訊號SIGctrl,以配合系統實際操作的需求。
That is to say, the potential state of the input terminal IN can be judged through the control signal SIG ctrl . In Figure 3, when the control signal SIG ctrl is at a low voltage, it means that the potential state of the input terminal IN is in a floating state. When the control signal SIG ctrl is at a high voltage, it indicates that the potential state of the input terminal IN is in a high voltage or a low voltage state. In other embodiments of the present invention, the
第4圖為本發明一實施例之電位狀態判別裝置400的應用示意圖。電位狀態判別裝置400可為第3圖之電位狀態判別裝置300的實施態樣之一,並可根據相似的原理操作。電位狀態判別裝置400可包含輸入端IN、輸出端OUT1、輸出端OUT2、壓降電路410、下拉電路420、負載電路430、電晶體M1A、上拉電路440及邏輯電路450。
FIG. 4 is a schematic diagram of an application of a potential state
壓降電路410可包含至少一電晶體、至少一二極體、至少一電阻或前述三項之任意組合,而下拉電路420可包含至少一電晶體、至少一二極體、至
少一電阻或前述三項之任意組合。舉例來說,在第4圖中,壓降電路410可包含彼此串聯的電阻RA及二極體DA,而下拉電路420可包含電阻RB。在本發明其他實施例中,二極體DA可替換為以二極體方式連接的電晶體。
The
在本發明的部分實施例中,負載電路430可包含電流源CS1,而電流源CS1可包含至少一電晶體、至少一二極體、至少一電阻或前述三項之任意組合。舉例來說,在第4圖中,電流源CS1可包含電晶體M2及電阻R1。
In some embodiments of the present invention, the
電晶體M2可以是場效電晶體(Field Effect Transistor,FET)。在本發明的部分實施例中,電晶體M2可為空乏型(depletion mode,D-mode)假晶高速電子移動電晶體(pseudomorphic high electron mobility transistor,PHEMT)。電晶體M2具有第一端、第二端及控制端,電晶體M2之第一端耦接於負載電路430之第一端。電阻R1具有第一端及第二端,電阻R1之第一端耦接於電晶體M2之第二端,電阻R1之第二端可直接或間接耦接於電晶體M2之控制端及負載電路430之第二端。以電阻R1之第二端直接耦接於電晶體M2之控制端及負載電路430之第二端,且負載電路430之第二端的電壓被拉低(亦即此時輸出端OUT1輸出具有低電壓的狀態判別訊號SIGD1)為例,電晶體M2的控制端為接收偏低的電壓,使得電晶體M2被導通。電晶體M2的第二端的電壓可視為輸出端OUT1的電壓減去電晶體M2的控制端和第二端之間的電壓差。而流經電流源CS1的負載電流IL1可視為電晶體M2的第二端的電壓除以電阻R1的阻值。由於電阻R1的阻值與負載電流IL1的電流值成反比關係,因此,可透過選擇具有大阻值的電阻R1(例如1MΩ)以使負載電流IL1減少(例如小於1μA),從而降低電位狀態判別裝置400的漏電流及耗電。然而,大阻值的電阻R1會佔據電位狀態判別裝置400較多的電路面積(例如電流源CS1的電路面積會增加為原電路面積的1倍)。
The transistor M2 may be a field effect transistor (Field Effect Transistor, FET). In some embodiments of the present invention, the transistor M2 may be a depletion mode (D-mode) pseudomorphic high electron mobility transistor (PHEMT). The transistor M2 has a first terminal, a second terminal and a control terminal. The first terminal of the transistor M2 is coupled to the first terminal of the
為改善上述情況,電流源CS1還可包含二極體單元DU1。二極體單元
DU1具有第一端及第二端,二極體單元DU1的第一端耦接於電阻R1之第二端,二極體單元DU1的第二端耦接於電晶體M2之控制端及負載電路430之第二端。亦即,電阻R1之第二端間接耦接於電晶體M2之控制端及負載電路430之第二端。二極體單元DU1可包含至少一電晶體、至少一二極體或前述二項之任意組合。在本發明的部分實施例中,可選用具有較小尺寸的至少一電晶體及/或至少一二極體。舉例來說,在第4圖中,二極體單元DU1可包含電晶體M3及二極體D1。電晶體M3具有第一端、第二端及控制端,電晶體M3的第一端耦接於二極體單元DU1之第一端。二極體D1具有第一端及第二端,二極體D1的第一端耦接於電晶體M3之第二端,而二極體D1的第二端耦接於二極體單元DU1之第二端。此外,電晶體M3可以二極體的方式連接(diode connected)。在本發明的部分實施例中,電阻R1、電晶體M3及二極體D1可用於限流。如此一來,當負載電路430之第二端的電壓被拉低時,電晶體M2的控制端為接收偏低的電壓,使得電晶體M2被導通。電晶體M2的第二端的電壓可視為輸出端OUT1的電壓減去電晶體M2的控制端和第二端之間的電壓差。而流經電流源CS1的負載電流IL1可視為電晶體M2的第二端的電壓減去電晶體M3與二極體D1所產生的壓降後再除以電阻R1的阻值。換句話說,相較於利用具有大阻值的電阻R1以減少負載電流IL1(例如小於1μA)之作法,透過設置二極體單元DU1,不僅可選擇具有較小阻值的電阻R1(例如0.4MΩ)以減少負載電流IL1(例如小於1μA),還可降低電流源CS1於電位狀態判別裝置400中所需佔據的電路面積(例如電流源CS1的電路面積會增加為原電路面積的0.4倍)。在本發明其他實施例中,可根據所需的負載電流IL1的電流值設計二極體單元DU1。
To improve the above situation, the current source CS1 may further include a diode unit DU1. The diode unit DU1 has a first end and a second end, the first end of the diode unit DU1 is coupled to the second end of the resistor R1, and the second end of the diode unit DU1 is coupled to the control of the transistor M2 terminal and the second terminal of the
在本發明的部分實施例中,上拉電路440可包含電流源CS2,而電流源CS2可包含至少一電晶體、至少一二極體、至少一電阻或前述三項之任意組合。舉例來說,在第4圖中,電流源CS2可包含電晶體M4及電阻R2。
In some embodiments of the present invention, the pull-up
電晶體M4可以是FET。在本發明的部分實施例中,電晶體M4可為D-mode PHEMT。電晶體M4具有第一端、第二端及控制端,電晶體M4之第一端耦接於上拉電路440之第一端。電阻R2具有第一端及第二端,電阻R2之第一端耦接於電晶體M4之第二端,電阻R2之第二端可直接或間接耦接於電晶體M4之控制端及上拉電路440之第二端。以電阻R2之第二端直接耦接於電晶體M4之控制端及上拉電路440之第二端,且上拉電路440之第二端的電壓被拉低(亦即此時輸入端IN的電位狀態是處於低電壓狀態)為例,電晶體M4的控制端為接收偏低的電壓,使得電晶體M4被導通。電晶體M4的第二端的電壓可視為輸入端IN的電壓減去電晶體M4的控制端和第二端之間的電壓差。而流經電流源CS2的偵測電流ID可視為電晶體M4的第二端的電壓除以電阻R2的阻值。由於電阻R2的阻值與偵測電流ID的電流值成反比關係,因此,可透過選擇具有大阻值的電阻R2(例如1MΩ)以使偵測電流ID減少(例如小於1μA),從而降低電位狀態判別裝置400的漏電流及耗電。然而,大阻值的電阻R2會佔據電位狀態判別裝置400較多的電路面積(例如電流源CS2的電路面積會增加為原電路面積的1倍)。
Transistor M4 may be an FET. In some embodiments of the present invention, the transistor M4 may be a D-mode PHEMT. The transistor M4 has a first terminal, a second terminal and a control terminal. The first terminal of the transistor M4 is coupled to the first terminal of the pull-up
為改善上述情況,電流源CS2還可包含二極體單元DU2。二極體單元DU2具有第一端及第二端,二極體單元DU2的第一端耦接於電阻R2之第二端,二極體單元DU2的第二端耦接於電晶體M4之控制端及上拉電路440之第二端。亦即,電阻R2之第二端間接耦接於電晶體M4之控制端及上拉電路440之第二端。二極體單元DU2可包含至少一電晶體、至少一二極體或前述二項之任意組合。在本發明的部分實施例中,可選用具有較小尺寸的至少一電晶體及/或至少一二極體。舉例來說,在第4圖中,二極體單元DU2可包含電晶體M5及二極體D2。電晶體M5具有第一端、第二端及控制端,電晶體M5之第一端耦接於二極體單元DU2之第一端。二極體D2具有第一端及第二端,二極體D2之第一端耦接於電晶體M5之第二端,而二極體D2之第二端耦接於二極體單元DU2之第二端。此外,電晶體
M5可以二極體的方式連接。在本發明的部分實施例中,電阻R2、電晶體M5及二極體D2可用於限流。如此一來,當上拉電路440之第二端的電壓被拉低時,電晶體M4的控制端為接收偏低的電壓,使得電晶體M4被導通。電晶體M4的第二端的電壓可視為輸入端IN的電壓減去電晶體M4的控制端和第二端之間的電壓差。而流經電流源CS2的偵測電流ID可視為電晶體M4的第二端的電壓減去電晶體M5與二極體D2所產生的壓降後再除以電阻R2的阻值。換句話說,相較於利用具有大阻值的電阻R2以減少偵測電流ID(例如小於1μA)之作法,透過設置二極體單元DU2,不僅可選擇具有較小阻值的電阻R2(例如0.4MΩ)以減少偵測電流ID(例如小於1μA),還可降低電流源CS2於電位狀態判別裝置400中所需佔據的電路面積(例如電流源CS2的電路面積會增加為原電路面積的0.4倍)。在本發明其他實施例中,可根據所需的偵測電流ID的電流值設計二極體單元DU2。
To improve the above situation, the current source CS2 may further include a diode unit DU2. The diode unit DU2 has a first end and a second end, the first end of the diode unit DU2 is coupled to the second end of the resistor R2, and the second end of the diode unit DU2 is coupled to the control of the transistor M4 terminal and the second terminal of the pull-up
邏輯電路450可包含反及閘452及負載電路454。反及閘452可包含電晶體M6A及電晶體M7A。電晶體M6A具有第一端、第二端及控制端,電晶體M6A之第一端耦接於反及閘452之輸出端,而電晶體M6A之控制端耦接於反及閘452之第一輸入端。電晶體M7A具有第一端、第二端及控制端,電晶體M7A之第一端耦接於電晶體M6A之第二端,電晶體M7A之第二端耦接於參考電壓端VN1,而電晶體M7A之控制端耦接於反及閘452之第二輸入端。
此外,在本發明的部分實施例中,負載電路454可包含電流源CS3,而電流源CS3可包含至少一電晶體、至少一二極體、至少一電阻或前述三項之任意組合。舉例來說,在第4圖中,電流源CS3可包含電晶體M8及電阻R3。
In addition, in some embodiments of the present invention, the
電晶體M8可以是FET。在本發明的部分實施例中,電晶體M8可為D-mode PHEMT。電晶體M8具有第一端、第二端及控制端,電晶體M8之第一端耦接於負載電路454之第一端。電阻R3具有第一端及第二端,電阻R3之第一端耦接於電晶體M8之第二端,電阻R3之第二端可直接或間接耦接於電晶體M8之控制
端及負載電路454之第二端。以電阻R3之第二端直接耦接於電晶體M8之控制端及負載電路454之第二端,且負載電路454之第二端的電壓被拉低(亦即此時反及閘452的輸出端輸出具有低電壓的控制訊號SIGctrl)為例,電晶體M8的控制端為接收偏低的電壓,使得電晶體M8被導通。電晶體M8的第二端的電壓可視為反及閘452之輸出端的電壓減去電晶體M8的控制端和第二端之間的電壓差。而流經電流源CS3的負載電流IL2可視為電晶體M8的第二端的電壓除以電阻R3的阻值。由於電阻R3的阻值與負載電流IL2的電流值成反比關係,因此,可透過選擇具有大阻值的電阻R3(例如1MΩ)以使負載電流IL2減少(例如小於1μA),從而降低電位狀態判別裝置400的漏電流及耗電。然而,大阻值的電阻R3會佔據電位狀態判別裝置400較多的電路面積(例如電流源CS3的電路面積會增加為原電路面積的1倍)。
Transistor M8 may be an FET. In some embodiments of the present invention, the transistor M8 may be a D-mode PHEMT. The transistor M8 has a first terminal, a second terminal and a control terminal. The first terminal of the transistor M8 is coupled to the first terminal of the
為改善上述情況,電流源CS3還可包含二極體單元DU3。二極體單元DU3具有第一端及第二端,二極體單元DU3的第一端耦接於電阻R3之第二端,二極體單元DU3的第二端耦接於電晶體M8之控制端及負載電路454之第二端。亦即,電阻R3之第二端間接耦接於電晶體M8之控制端及負載電路454之第二端。二極體單元DU3可包含至少一電晶體、至少一二極體或前述二項之任意組合。在本發明的部分實施例中,可選用具有較小尺寸的至少一電晶體及/或至少一二極體。舉例來說,在第4圖中,二極體單元DU3可包含電晶體M9及二極體D3。電晶體M9具有第一端、第二端及控制端,電晶體M9之第一端耦接於二極體單元DU3之第一端。二極體D3具有第一端及第二端,二極體D3之第一端耦接於電晶體M9之第二端,而二極體D3之第二端耦接於二極體單元DU3之第二端。此外,電晶體M9可以二極體的方式連接。在本發明的部分實施例中,電阻R3、電晶體M9及二極體D3可用於限流。如此一來,當負載電路454之第二端的電壓被拉低時,電晶體M8的控制端為接收偏低的電壓,使得電晶體M8被導通。電晶體M8的第二端的
電壓可視為反及閘452之輸出端的電壓減去電晶體M8的控制端和第二端之間的電壓差。而流經電流源CS3的負載電流IL2可視為電晶體M8的第二端的電壓減去電晶體M9與二極體D3所產生的壓降後再除以電阻R3的阻值。換句話說,相較於利用具有大阻值的電阻R3以減少負載電流IL2(例如小於1μA)之作法,透過設置二極體單元DU3,不僅可選擇具有較小阻值的電阻R3(例如0.4MΩ)以減少負載電流IL2(例如小於1μA),還可降低電流源CS3於電位狀態判別裝置400中所需佔據的電路面積(例如電流源CS3的電路面積會增加為原電路面積的0.4倍)。在本發明其他實施例中,可根據所需的負載電流IL2的電流值設計二極體單元DU3。
To improve the above situation, the current source CS3 may further include a diode unit DU3. The diode unit DU3 has a first end and a second end, the first end of the diode unit DU3 is coupled to the second end of the resistor R3, and the second end of the diode unit DU3 is coupled to the control of the transistor M8 terminal and the second terminal of the
在第4圖中,當輸入端IN的電位狀態是處於浮接狀態時,狀態判別訊號SIGD1及SIGD2皆會具有高電壓,使得電晶體M6A及M7A被導通。反及閘452之輸出端的電壓會被電晶體M6A及M7A拉低至接近參考電壓端VN1所提供的電壓,因此反及閘452的輸出端將輸出具有低電壓的控制訊號SIGctrl。
In FIG. 4 , when the potential state of the input terminal IN is in a floating state, the state discrimination signals SIG D1 and SIG D2 both have high voltages, so that the transistors M6A and M7A are turned on. The voltage of the output terminal of the inverting
當輸入端IN的電位狀態是處於高電壓狀態時,狀態判別訊號SIGD1會具有低電壓,且狀態判別訊號SIGD2會具有高電壓,使得電晶體M6A被截止,而電晶體M7A被導通。反及閘452之輸出端的電壓可視為參考電壓端VN2所提供的電壓,因此反及閘452的輸出端將輸出具有高電壓的控制訊號SIGctrl。
When the potential state of the input terminal IN is in a high voltage state, the state determination signal SIG D1 has a low voltage, and the state determination signal SIG D2 has a high voltage, so that the transistor M6A is turned off and the transistor M7A is turned on. The voltage of the output terminal of the
當輸入端IN的電位狀態是處於低電壓狀態時,狀態判別訊號SIGD1會具有高電壓,且狀態判別訊號SIGD2會具有低電壓,使得電晶體M6A被導通,而電晶體M7A被截止。反及閘452之輸出端的電壓可視為參考電壓端VN2所提供的電壓,因此反及閘452的輸出端也將輸出具有高電壓的控制訊號SIGctrl。
When the potential state of the input terminal IN is in a low voltage state, the state determination signal SIG D1 has a high voltage, and the state determination signal SIG D2 has a low voltage, so that the transistor M6A is turned on and the transistor M7A is turned off. The voltage of the output terminal of the inverting
在本發明的部分實施例中,電位狀態判別裝置400可將控制訊號SIGctrl提供給內部電路460使用。在此情況下,電位狀態判別裝置400中的邏輯電路450可耦接於內部電路460。內部電路460可包含開關電路462及功能電路464。開關電路462耦接於邏輯電路450,而功能電路464耦接於開關電路462。
功能電路464可用來執行特定的功能。舉例來說,控制訊號SIGctrl還可用以切換內部電路460的操作狀態。當控制訊號SIGctrl具有低電壓時,開關電路462可被截止,進而禁能(disable)功能電路464。當控制訊號SIGctrl具有高電壓時,開關電路462可被導通,進而致能(enable)功能電路464,以使功能電路464得以執行特定的功能。在本發明的部分實施例中,電位狀態判別裝置400及內部電路460可設置於同一晶片(chip)中,而電位狀態判別裝置400的輸入端IN可耦接於該晶片的特定接腳(pin),藉以判斷特定接腳的電位狀態。
In some embodiments of the present invention, the potential
在本發明其他實施例中,電位狀態判別裝置400所輸出的控制訊號SIGctrl也可能以其他的方式被其他電路所使用,或與其他電路直接作動,而不限應用於控制內部電路460。
In other embodiments of the present invention, the control signal SIG ctrl output by the potential
第5圖為本發明另一實施例之電位狀態判別裝置500的示意圖。電位狀態判別裝置500與電位狀態判別裝置100具有相似的結構並可根據類似的原理操作。電位狀態判別裝置500可包含輸入端IN、輸出端OUT1、輸出端OUT2、壓降電路510、下拉電路520、負載電路530、電晶體M1B及上拉電路540。且電晶體M1B之控制端可耦接於壓降電路510之第一端,而輸出端OUT2則可耦接於壓降電路510之第二端。
FIG. 5 is a schematic diagram of a potential
在第5圖的實施例中,電位狀態判別裝置500亦可根據輸入端IN之電位狀態輸出不同電壓的狀態判別訊號SIGD1及SIGD2。也就是說,狀態判別訊號SIGD1及SIGD2可用以判斷輸入端IN之電位狀態。在本發明的部分實施例中,輸入端IN可耦接於特定節點,藉以判斷特定節點的電位狀態,或是判斷與特定節點有關的電路或元件的狀態。
In the embodiment of FIG. 5 , the potential state
舉例來說,當輸入端IN的電位狀態是處於浮接狀態時,在產生適當大小之偵測電流ID的情況下,偵測電流ID會流經上拉電路540、壓降電路510及下拉電路520,上拉電路540將對應地產生壓降,電晶體M1B的控制端所接收到
的電壓可視為參考電壓端VN2所提供的電壓與上拉電路540所產生的壓降之差值,因此電晶體M1B的控制端會接收偏高的電壓,使得電晶體M1B被導通。此時,輸出端OUT1的電壓會被電晶體M1B拉低至接近參考電壓端VN1所提供的電壓,因此輸出端OUT1將輸出具有低電壓的狀態判別訊號SIGD1。此外,輸出端OUT2的電壓可視為由壓降電路510及下拉電路520對電晶體M1B的控制端的電壓進行分壓後的電壓,因此輸出端OUT2同樣會輸出具有低電壓的狀態判別訊號SIGD2。
For example, when the potential state of the input terminal IN is in a floating state, the detection current ID will flow through the pull-up
當輸入端IN的電位狀態是處於高電壓狀態時,電晶體M1B的控制端所接收到的電壓為輸入端IN的高電壓,使得電晶體M1B被導通。此時,輸出端OUT1的電壓會被電晶體M1B拉低至接近參考電壓端VN1所提供的電壓,因此輸出端OUT1將輸出具有低電壓的狀態判別訊號SIGD1。在產生適當大小之偵測電流ID的情況下,輸出端OUT2的電壓可視為由壓降電路510及下拉電路520對輸入端IN的高電壓進行分壓後的電壓,使得輸出端OUT2會輸出具有高電壓的狀態判別訊號SIGD2。
When the potential state of the input terminal IN is in a high voltage state, the voltage received by the control terminal of the transistor M1B is the high voltage of the input terminal IN, so that the transistor M1B is turned on. At this time, the voltage of the output terminal OUT1 will be pulled down by the transistor M1B to be close to the voltage provided by the reference voltage terminal VN1 , so the output terminal OUT1 will output the state discrimination signal SIG D1 with a low voltage. When the detection current ID of an appropriate magnitude is generated, the voltage of the output terminal OUT2 can be regarded as a voltage obtained by dividing the high voltage of the input terminal IN by the
再者,當輸入端IN的電位狀態是處於低電壓狀態時,電晶體M1B的控制端所接收到的電壓為輸入端IN的低電壓,使得電晶體M1B被截止。在此情況下,輸出端OUT1的電壓可視為參考電壓端VN2所提供的電壓,因此輸出端OUT1會輸出具有高電壓的狀態判別訊號SIGD1。在產生適當大小之偵測電流ID的情況下,輸出端OUT2的電壓可視為由壓降電路510及下拉電路520對輸入端IN的低電壓進行分壓後的電壓,使得輸出端OUT2會輸出具有低電壓的狀態判別訊號SIGD2。
Furthermore, when the potential state of the input terminal IN is in a low voltage state, the voltage received by the control terminal of the transistor M1B is the low voltage of the input terminal IN, so that the transistor M1B is turned off. In this case, the voltage of the output terminal OUT1 can be regarded as the voltage provided by the reference voltage terminal VN2, so the output terminal OUT1 will output the state discrimination signal SIG D1 with a high voltage. When the detection current ID of an appropriate magnitude is generated, the voltage of the output terminal OUT2 can be regarded as a voltage obtained by dividing the low voltage of the input terminal IN by the
如此一來,透過狀態判別訊號SIGD1及SIGD2就可以判斷輸入端IN之電位狀態。也就是說,當狀態判別訊號SIGD1及SIGD2皆為低電壓時,表示輸入端IN的電位狀態是處於浮接狀態。而當狀態判別訊號SIGD1及SIGD2為相異的電壓時,則表示輸入端IN的電位狀態是處於高電壓或低電壓狀態。 In this way, the potential state of the input terminal IN can be determined through the state determination signals SIG D1 and SIG D2 . That is to say, when the state discrimination signals SIG D1 and SIG D2 are both low voltages, it indicates that the potential state of the input terminal IN is in a floating state. When the state discrimination signals SIG D1 and SIG D2 are at different voltages, it indicates that the potential state of the input terminal IN is in a high voltage state or a low voltage state.
偵測電流ID的電流值可設計為在輸入端IN的電位狀態是處於高電壓狀態時,能促使輸出端OUT2具有高電壓,並且在輸入端IN的電位狀態是處於低電壓或浮接狀態時,能促使輸出端OUT2具有低電壓。除此之外,在輸入端IN的電位狀態是處於浮接狀態時,還能促使電晶體M1B的控制端提升至足夠高的電壓以導通電晶體M1B。在本發明的部分實施例中,可透過適當地設計上拉電路540、壓降電路510及下拉電路520,藉以產生適當大小之偵測電流ID。
The current value of the detection current ID can be designed to cause the output terminal OUT2 to have a high voltage when the potential state of the input terminal IN is in a high voltage state, and the potential state of the input terminal IN is in a low voltage or floating state , the output terminal OUT2 can be caused to have a low voltage. Besides, when the potential state of the input terminal IN is in a floating state, the control terminal of the transistor M1B can also be raised to a high enough voltage to turn on the transistor M1B. In some embodiments of the present invention, the pull-up
第6圖為本發明另一實施例之電位狀態判別裝置600的示意圖。電位狀態判別裝置600與電位狀態判別裝置500具有相似的結構並可根據類似的原理操作,然而電位狀態判別裝置600還可包含邏輯電路650。
FIG. 6 is a schematic diagram of a potential
邏輯電路650可耦接於輸出端OUT1及OUT2,用以根據狀態判別訊號SIGD1及SIGD2產生與輸入端IN之電位狀態有關的控制訊號SIGctrl。也就是說,透過邏輯電路650,電位狀態判別裝置600可根據輸入端IN之電位狀態輸出不同電壓的控制訊號SIGctrl,並藉以判斷輸入端IN的電位狀態。
The
第7圖為本發明另一實施例之電位狀態判別裝置700的示意圖。電位狀態判別裝置700與電位狀態判別裝置600具有相似的結構並可根據類似的原理操作,然而電位狀態判別裝置700中的邏輯電路750可包含反或閘(NOR gate)752及負載電路754。
FIG. 7 is a schematic diagram of a potential
反或閘752具有第一輸入端、第二輸入端及輸出端,反或閘752之第一輸入端耦接於輸出端OUT1,反或閘752之第二輸入端耦接於輸出端OUT2,而反或閘752之輸出端可輸出控制訊號SIGctrl。
The inverse OR
負載電路754具有第一端及第二端,負載電路754之第一端耦接於參考電壓端VN2,而負載電路754之第二端耦接於反或閘752的輸出端。
The
電位狀態判別裝置700可根據輸入端IN之電位狀態輸出不同電壓的控制訊號SIGctrl。舉例來說,根據第5圖,當輸入端IN的電位狀態是處於浮接狀
態時,輸出端OUT1會輸出具有低電壓的狀態判別訊號SIGD1,且輸出端OUT2會輸出具有低電壓的狀態判別訊號SIGD2。如此一來,反或閘752的輸出端將輸出具有高電壓的控制訊號SIGctrl。
The potential state
此外,當輸入端IN的電位狀態是處於高電壓狀態時,輸出端OUT1會輸出具有低電壓的狀態判別訊號SIGD1,且輸出端OUT2會輸出具有高電壓的狀態判別訊號SIGD2。如此一來,反或閘752的輸出端將輸出具有低電壓的控制訊號SIGctrl。
In addition, when the potential state of the input terminal IN is in a high voltage state, the output terminal OUT1 outputs a state discrimination signal SIG D1 with a low voltage, and the output terminal OUT2 outputs a state discrimination signal SIG D2 with a high voltage. In this way, the output terminal of the inverse-
再者,當輸入端IN的電位狀態是處於低電壓狀態時,輸出端OUT1會輸出具有高電壓的狀態判別訊號SIGD1,且輸出端OUT2會輸出具有低電壓的狀態判別訊號SIGD2。如此一來,反或閘752的輸出端也將輸出具有低電壓的控制訊號SIGctrl。
Furthermore, when the potential state of the input terminal IN is in a low voltage state, the output terminal OUT1 outputs a state discrimination signal SIG D1 with a high voltage, and the output terminal OUT2 outputs a state discrimination signal SIG D2 with a low voltage. In this way, the output terminal of the inverse OR
也就是說,透過控制訊號SIGctrl就可以判斷輸入端IN的電位狀態。在第7圖中,當控制訊號SIGctrl為高電壓時,表示輸入端IN的電位狀態是處於浮接狀態。而當控制訊號SIGctrl為低電壓時,則表示輸入端IN的電位狀態是處於高電壓或低電壓狀態。在本發明的其他實施例中,邏輯電路750也可能利用其他的邏輯運算來產生控制訊號SIGctrl,以配合系統實際操作的需求。
That is to say, the potential state of the input terminal IN can be judged through the control signal SIG ctrl . In FIG. 7, when the control signal SIG ctrl is at a high voltage, it means that the potential state of the input terminal IN is in a floating state. When the control signal SIG ctrl is at a low voltage, it indicates that the potential state of the input terminal IN is in a high voltage or a low voltage state. In other embodiments of the present invention, the
第8圖為本發明另一實施例之電位狀態判別裝置800的應用示意圖。電位狀態判別裝置800可為第7圖之電位狀態判別裝置700的實施態樣之一,並可根據類似的原理操作。電位狀態判別裝置800可包含輸入端IN、輸出端OUT1、輸出端OUT2、壓降電路810、下拉電路820、負載電路830、電晶體M1B、上拉電路840、邏輯電路850。在本發明的部分實施例中,電位狀態判別裝置800中的邏輯電路850還可耦接於內部電路860,控制訊號SIGctrl還可用以切換內部電路860的操作狀態。
FIG. 8 is a schematic diagram of an application of a potential
在第8圖的實施例中,壓降電路810可與壓降電路410以相同結構來
實作,下拉電路820可與下拉電路420以相同結構來實作,負載電路830可與負載電路430以相同結構來實作,上拉電路840可與上拉電路440以相同的結構來實作,而內部電路860可與內部電路460以相同的結構來實作,故不贅述。
In the embodiment shown in FIG. 8, the
邏輯電路850可包含反或閘852及負載電路854。反或閘852可包含電晶體M6B及電晶體M7B。電晶體M6B具有第一端、第二端及控制端,電晶體M6B之第一端耦接於反或閘852之輸出端,電晶體M6B之第二端耦接於參考電壓端VN1,而電晶體M6B之控制端耦接於反或閘852之第一輸入端。電晶體M7B具有第一端、第二端及控制端,電晶體M7B之第一端耦接於電晶體M6B之第一端,電晶體M7B之第二端耦接於參考電壓端VN1,而電晶體M7B之控制端耦接於反或閘852之第二輸入端。在第8圖的實施例中,負載電路854可與負載電路454以相同的結構來實作,故不贅述。
Logic circuit 850 may include inverse OR
在第8圖中,當輸入端IN的電位狀態是處於浮接狀態時,狀態判別訊號SIGD1及SIGD2皆會具有低電壓,使得電晶體M6B及M7B被截止。反或閘852之輸出端的電壓可視為參考電壓端VN2所提供的電壓,因此反或閘852的輸出端將輸出具有高電壓的控制訊號SIGctrl。
In FIG. 8, when the potential state of the input terminal IN is in a floating state, the state discrimination signals SIG D1 and SIG D2 both have low voltages, so that the transistors M6B and M7B are turned off. The voltage of the output terminal of the inverse OR
當輸入端IN的電位狀態是處於高電壓狀態時,狀態判別訊號SIGD1會具有低電壓,且狀態判別訊號SIGD2會具有高電壓,使得電晶體M6B被截止,而電晶體M7B被導通。反或閘852之輸出端的電壓會被電晶體M7B拉低至接近參考電壓端VN1所提供的電壓,因此反或閘852的輸出端將輸出具有低電壓的控制訊號SIGctrl。
When the potential state of the input terminal IN is in a high voltage state, the state determination signal SIG D1 has a low voltage, and the state determination signal SIG D2 has a high voltage, so that the transistor M6B is turned off and the transistor M7B is turned on. The voltage of the output terminal of the inverse OR
當輸入端IN的電位狀態是處於低電壓狀態時,狀態判別訊號SIGD1會具有高電壓,且狀態判別訊號SIGD2會具有低電壓,使得電晶體M6B被導通,而電晶體M7B被截止。反或閘852之輸出端的電壓會被電晶體M6B拉低至接近參考電壓端VN1所提供的電壓,因此反或閘852的輸出端也將輸出具有低電壓的控制
訊號SIGctrl。
When the potential state of the input terminal IN is in a low voltage state, the state determination signal SIG D1 has a high voltage, and the state determination signal SIG D2 has a low voltage, so that the transistor M6B is turned on and the transistor M7B is turned off. The voltage of the output terminal of the inverse OR
在本發明的部分實施例中,不論是第1圖或第5圖中的狀態判別訊號SIGD1及SIGD2,或者是第2圖、第3圖、第6圖或第7圖中的控制訊號SIGctrl,除了用以判斷輸入端IN之電位狀態外,亦可提供給其他電路所使用,或與其他電路直接作動,例如狀態判別訊號SIGD1及SIGD2或者是控制訊號SIGctrl可用於控制其後端電路。 In some embodiments of the present invention, whether it is the state discrimination signals SIG D1 and SIG D2 in Fig. 1 or Fig. 5, or the control signals in Fig. 2, Fig. 3, Fig. 6 or Fig. 7 SIG ctrl , in addition to judging the potential state of the input terminal IN, can also be used by other circuits, or act directly with other circuits, such as the state judging signals SIG D1 and SIG D2 or the control signal SIG ctrl can be used to control its back-end circuit.
在本發明的部分實施例中,可根據不同的應用或根據系統的需求,選擇性地設置邏輯電路。舉例來說,當電位狀態判別裝置的後端電路為單端輸入時,可設置邏輯電路,如第2圖、第3圖、第4圖、第6圖、第7圖或第8圖。而當電位狀態判別裝置的後端電路為雙端輸入時,則可省略邏輯電路,如第1圖或第5圖。 In some embodiments of the present invention, logic circuits may be selectively provided according to different applications or according to system requirements. For example, when the back-end circuit of the potential state judging device is single-ended input, a logic circuit such as Figure 2, Figure 3, Figure 4, Figure 6, Figure 7 or Figure 8 can be provided. And when the back-end circuit of the potential state judging device is a double-terminal input, the logic circuit can be omitted, as shown in FIG. 1 or FIG. 5 .
電晶體M1A、M1B、M3、M5、M9、M6A、M7A、M6B或M7B可以是FET。在本發明的部分實施例中,電晶體M1A、M1B、M3、M5、M9、M6A、M7A、M6B或M7B可為增強型(enhancement mode,E-mode)PHEMT。當電晶體為E-mode PHEMT,並且以二極體的方式連接時,電晶體的控制端可耦接於其第一端,例如第4圖或第8圖中的電晶體M3、M5及M9。然而當電晶體為D-mode PHEMT,並且以二極體的方式連接時,則電晶體之控制端將可耦接於其第二端。電晶體M1A至M9的第一端可為汲極,第二端可為源極,控制端可為閘極。上述電晶體可使用砷化鎵(GaAs)製程。 Transistors M1A, M1B, M3, M5, M9, M6A, M7A, M6B or M7B may be FETs. In some embodiments of the present invention, the transistors M1A, M1B, M3, M5, M9, M6A, M7A, M6B or M7B may be an enhancement mode (E-mode) PHEMT. When the transistor is an E-mode PHEMT and is connected in the form of a diode, the control end of the transistor can be coupled to its first end, such as transistors M3, M5 and M9 in Figure 4 or Figure 8 . However, when the transistor is a D-mode PHEMT and is connected by a diode, the control terminal of the transistor can be coupled to the second terminal thereof. The first terminals of the transistors M1A to M9 may be drain electrodes, the second terminals may be source electrodes, and the control terminals may be gate electrodes. The above transistors can be fabricated using a gallium arsenide (GaAs) process.
綜上所述,本發明之實施例所提供的電位狀態判別裝置能夠判斷某一特定節點的電位狀態,例如是否為浮接狀態、高電壓狀態或低電壓狀態。如此一來,就能夠增加可供判別的電位狀態,使得電路設計更具彈性,也擴展了電位狀態判別裝置的應用範圍。 To sum up, the device for determining the potential state provided by the embodiments of the present invention can determine the potential state of a specific node, such as whether it is a floating state, a high voltage state or a low voltage state. In this way, it is possible to increase the potential states that can be discriminated, which makes the circuit design more flexible, and also expands the application range of the potential state discriminating device.
以上所述僅為本發明之較佳實施例,凡依本發明申請專利範圍所做之均等變化與修飾,皆應屬本發明之涵蓋範圍。 The above descriptions are only preferred embodiments of the present invention, and all equivalent changes and modifications made according to the scope of the patent application of the present invention shall fall within the scope of the present invention.
100:電位狀態判別裝置 100: Potential state discrimination device
110:壓降電路 110: Voltage drop circuit
120:下拉電路 120: pull-down circuit
130:負載電路 130: Load circuit
140:上拉電路 140: Pull-up circuit
M1A:電晶體 M1A: Transistor
ID:偵測電流 I D : Detection current
IN:輸入端 IN: input terminal
OUT1、OUT2:輸出端 OUT1, OUT2: output terminal
SIGD1、SIGD2:狀態判別訊號 SIG D1 , SIG D2 : Status discrimination signal
VN1、VN2:參考電壓端 VN1, VN2: reference voltage terminals
Claims (19)
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US17/138,785 US11609249B2 (en) | 2020-11-23 | 2020-12-30 | Voltage state detector |
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070057698A1 (en) * | 2003-09-17 | 2007-03-15 | Verbauwhede Ingrid M | Dynamic and differential cmos logic with signal-independent power consumption to withstand differential power analysis |
TWI610527B (en) * | 2015-08-18 | 2018-01-01 | 力旺電子股份有限公司 | Power system with detecting function |
US20180267567A1 (en) * | 2017-03-17 | 2018-09-20 | Richtek Technology Corporation | Operation mode determination circuit and method thereof |
TWI707542B (en) * | 2019-10-21 | 2020-10-11 | 立錡科技股份有限公司 | Interface control circuit and control method thereof |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
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US5543786A (en) * | 1994-10-18 | 1996-08-06 | United Microelectronics Corp. | Keyboard scanning circuit |
CN1224842C (en) * | 2001-09-27 | 2005-10-26 | 义隆电子股份有限公司 | Joint connection state detecting circuit of integrated circuit |
US7271624B2 (en) * | 2005-06-29 | 2007-09-18 | Broadcom Corporation | Low-power supply voltage level detection circuit and method |
TW200708750A (en) * | 2005-07-22 | 2007-03-01 | Koninkl Philips Electronics Nv | Testable integrated circuit, system in package and test instruction set |
CN101465842B (en) * | 2007-12-21 | 2012-05-23 | 瑞昱半导体股份有限公司 | Enactment method of integrated circuit as well as circuit and application thereof |
US9292113B2 (en) * | 2014-05-26 | 2016-03-22 | Pixart Imaging (Penang) Sdn. Bhd. | Driving circuit with fault detection and optical input device having the same |
TWI654509B (en) * | 2018-01-03 | 2019-03-21 | 立積電子股份有限公司 | Reference voltage generator |
CN111965511A (en) * | 2020-07-06 | 2020-11-20 | 国网宁夏电力有限公司检修公司 | Method, system and medium for detecting fault of thyristor circuit |
-
2020
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Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070057698A1 (en) * | 2003-09-17 | 2007-03-15 | Verbauwhede Ingrid M | Dynamic and differential cmos logic with signal-independent power consumption to withstand differential power analysis |
TWI610527B (en) * | 2015-08-18 | 2018-01-01 | 力旺電子股份有限公司 | Power system with detecting function |
US20180267567A1 (en) * | 2017-03-17 | 2018-09-20 | Richtek Technology Corporation | Operation mode determination circuit and method thereof |
CN108628426A (en) * | 2017-03-17 | 2018-10-09 | 立锜科技股份有限公司 | Operation mode decision circuitry and its method |
TWI707542B (en) * | 2019-10-21 | 2020-10-11 | 立錡科技股份有限公司 | Interface control circuit and control method thereof |
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