TWI756970B - Level status detector - Google Patents

Level status detector Download PDF

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TWI756970B
TWI756970B TW109143129A TW109143129A TWI756970B TW I756970 B TWI756970 B TW I756970B TW 109143129 A TW109143129 A TW 109143129A TW 109143129 A TW109143129 A TW 109143129A TW I756970 B TWI756970 B TW I756970B
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terminal
coupled
transistor
circuit
potential state
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TW109143129A
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TW202221336A (en
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彭天雲
蔡賢皇
陳智聖
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立積電子股份有限公司
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Priority to US17/138,785 priority Critical patent/US11609249B2/en
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Publication of TWI756970B publication Critical patent/TWI756970B/en
Publication of TW202221336A publication Critical patent/TW202221336A/en
Priority to US18/110,865 priority patent/US11899048B2/en

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    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10Regulating voltage or current
    • G05F1/46Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/56Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
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  • Automation & Control Theory (AREA)
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Abstract

A level status detector includes an input terminal, a voltage drop circuit, a pull-down circuit, a loading circuit, a transistor, a pull-up circuit, a first output terminal, and a second output terminal. The voltage drop circuit is coupled to the input terminal. The pull-down circuit is coupled to the voltage drop circuit and a first reference voltage terminal. The loading circuit is coupled to a second reference voltage terminal . The transistor has a first terminal coupled to the loading circuit, a second terminal coupled to the first reference voltage terminal, and a control terminal coupled to the voltage drop circuit. The pull-up circuit is coupled to the second reference voltage terminal and the voltage drop circuit. The first output terminal is coupled to the first terminal of the transistor for outputting a first status detection signal. The second output terminal is coupled to the voltage drop circuit for outputting a second status detection signal.

Description

電位狀態判別裝置 Potential state discriminating device

本發明係有關於一種電位狀態判別裝置,特別是指一種能夠判斷浮接狀態的電位狀態判別裝置。 The present invention relates to a potential state judging device, in particular to a potential state judging device capable of judging a floating state.

在電子電路的設計中,常會透過電位狀態判別裝置來判斷特定節點的電位狀態,或是判斷與特定節點有關的電路或元件的狀態。然而,在先前技術中,電位狀態判別裝置只能夠判斷特定的固定電位,而無法判斷特定節點是否處在浮接(floating)狀態,因此限制了電位狀態判別裝置的應用範圍。 In the design of electronic circuits, the potential state of a specific node is often judged by a potential state judging device, or the state of a circuit or element related to a specific node is judged. However, in the prior art, the potential state identification device can only determine a specific fixed potential, but cannot determine whether a specific node is in a floating state, thus limiting the application range of the potential state identification device.

本發明之一實施例提供一種電位狀態判別裝置,電位狀態判別裝置包含輸入端、壓降電路、下拉電路、負載電路、電晶體、上拉電路、第一輸出端及第二輸出端。 An embodiment of the present invention provides a potential state judging device, which includes an input terminal, a voltage drop circuit, a pull-down circuit, a load circuit, a transistor, a pull-up circuit, a first output terminal and a second output terminal.

壓降電路具有第一端及第二端,壓降電路的第一端耦接於輸入端。下拉電路具有第一端及第二端,下拉電路的第一端耦接於壓降電路之第二端,而下拉電路的第二端耦接於第一參考電壓端。負載電路具有第一端及第二端,負載電路的第一端耦接於第二參考電壓端。電晶體具有第一端、第二端及控制端,電晶體的第一端耦接於負載電路之第二端,電晶體的第二端耦接於第一參考電壓 端。上拉電路具有第一端及第二端,上拉電路的第一端耦接於第二參考電壓端,而上拉電路的第二端耦接於壓降電路之第一端。 The voltage drop circuit has a first end and a second end, and the first end of the voltage drop circuit is coupled to the input end. The pull-down circuit has a first end and a second end, the first end of the pull-down circuit is coupled to the second end of the voltage drop circuit, and the second end of the pull-down circuit is coupled to the first reference voltage end. The load circuit has a first end and a second end, and the first end of the load circuit is coupled to the second reference voltage end. The transistor has a first end, a second end and a control end, the first end of the transistor is coupled to the second end of the load circuit, and the second end of the transistor is coupled to the first reference voltage end. The pull-up circuit has a first end and a second end, the first end of the pull-up circuit is coupled to the second reference voltage end, and the second end of the pull-up circuit is coupled to the first end of the voltage drop circuit.

第一輸出端耦接於電晶體之第一端,用以輸出第一狀態判別訊號,而第二輸出端用以輸出第二狀態判別訊號。電晶體之控制端係耦接於壓降電路之第二端且第二輸出端係耦接於壓降電路之第一端,或電晶體之控制端係耦接於壓降電路之第一端且第二輸出端係耦接於壓降電路之第二端。 The first output terminal is coupled to the first terminal of the transistor for outputting the first state discrimination signal, and the second output terminal is used for outputting the second state discrimination signal. The control end of the transistor is coupled to the second end of the voltage drop circuit and the second output end is coupled to the first end of the voltage drop circuit, or the control end of the transistor is coupled to the first end of the voltage drop circuit And the second output terminal is coupled to the second terminal of the voltage drop circuit.

第一狀態判別訊號及第二狀態判別訊號係用以判斷輸入端之電位狀態。 The first state discriminating signal and the second state discriminating signal are used to judge the potential state of the input terminal.

100、200、300、400、500、600、700、800:電位狀態判別裝置 100, 200, 300, 400, 500, 600, 700, 800: Potential state discrimination device

110、410、510、810:壓降電路 110, 410, 510, 810: Voltage drop circuit

120、420、520、820:下拉電路 120, 420, 520, 820: pull-down circuit

130、354、430、454、530、754、830、854:負載電路 130, 354, 430, 454, 530, 754, 830, 854: Load circuit

140、440、540、840:上拉電路 140, 440, 540, 840: pull-up circuit

250、350、450、650、750、850:邏輯電路 250, 350, 450, 650, 750, 850: Logic circuits

352、452:反及閘 352, 452: Reverse and gate

460、860:內部電路 460, 860: Internal circuit

462、862:開關電路 462, 862: switch circuit

464、864:功能電路 464, 864: functional circuit

752、852:反或閘 752, 852: anti-OR gate

CS1、CS2、CS3:電流源 CS1, CS2, CS3: Current Sources

DA、D1、D2、D3:二極體 DA, D1, D2, D3: Diodes

DU1、DU2、DU3:二極體單元 DU1, DU2, DU3: Diode unit

ID:偵測電流 I D : Detection current

IL1、IL2:負載電流 I L1 , I L2 : load current

IN:輸入端 IN: input terminal

M1A、M1B、M2、M3、M4、M5、M6A、M6B、M7A、M7B、M8、M9:電晶體 M1A, M1B, M2, M3, M4, M5, M6A, M6B, M7A, M7B, M8, M9: Transistor

OUT1、OUT2:輸出端 OUT1, OUT2: output terminal

RA、RB、R1、R2、R3:電阻 RA, RB, R1, R2, R3: Resistors

VN1、VN2:參考電壓端 VN1, VN2: reference voltage terminals

SIGD1、SIGD2:狀態判別訊號 SIG D1 , SIG D2 : Status discrimination signal

SIGctrl:控制訊號 SIG ctrl : control signal

第1圖為本發明一實施例之電位狀態判別裝置的示意圖。 FIG. 1 is a schematic diagram of a potential state discriminating device according to an embodiment of the present invention.

第2圖為本發明另一實施例之電位狀態判別裝置的示意圖。 FIG. 2 is a schematic diagram of a potential state judging device according to another embodiment of the present invention.

第3圖為本發明另一實施例之電位狀態判別裝置的示意圖。 FIG. 3 is a schematic diagram of a potential state judging device according to another embodiment of the present invention.

第4圖為本發明一實施例之電位狀態判別裝置的應用示意圖。 FIG. 4 is a schematic diagram of the application of the potential state discriminating device according to an embodiment of the present invention.

第5圖為本發明另一實施例之電位狀態判別裝置的示意圖。 FIG. 5 is a schematic diagram of a potential state judging device according to another embodiment of the present invention.

第6圖為本發明另一實施例之電位狀態判別裝置的示意圖。 FIG. 6 is a schematic diagram of a potential state judging device according to another embodiment of the present invention.

第7圖為本發明另一實施例之電位狀態判別裝置的示意圖。 FIG. 7 is a schematic diagram of a potential state judging device according to another embodiment of the present invention.

第8圖為本發明另一實施例之電位狀態判別裝置的應用示意圖。 FIG. 8 is a schematic diagram of an application of a potential state discriminating device according to another embodiment of the present invention.

第1圖為本發明一實施例之電位狀態判別裝置100的示意圖。電位狀態判別裝置100包含輸入端IN、輸出端OUT1、輸出端OUT2、壓降電路110、下拉電路120、負載電路130、電晶體M1A及上拉電路140。 FIG. 1 is a schematic diagram of a potential state discriminating device 100 according to an embodiment of the present invention. The potential state discrimination device 100 includes an input terminal IN, an output terminal OUT1 , an output terminal OUT2 , a voltage drop circuit 110 , a pull-down circuit 120 , a load circuit 130 , a transistor M1A, and a pull-up circuit 140 .

壓降電路110具有第一端及第二端,壓降電路110的第一端耦接於輸入端IN。當電流通過壓降電路110時,壓降電路110會在其第一端及第二端之間對應地產生壓降。 The voltage drop circuit 110 has a first terminal and a second terminal, and the first terminal of the voltage drop circuit 110 is coupled to the input terminal IN. When the current passes through the voltage drop circuit 110 , the voltage drop circuit 110 will correspondingly generate a voltage drop between the first end and the second end of the voltage drop circuit 110 .

下拉電路120具有第一端及第二端,下拉電路120的第一端耦接於壓降電路110之第二端,而下拉電路120之第二端耦接於參考電壓端VN1。 The pull-down circuit 120 has a first end and a second end. The first end of the pull-down circuit 120 is coupled to the second end of the voltage drop circuit 110 , and the second end of the pull-down circuit 120 is coupled to the reference voltage end VN1 .

負載電路130具有第一端及第二端,負載電路130的第一端耦接於參考電壓端VN2。 The load circuit 130 has a first terminal and a second terminal, and the first terminal of the load circuit 130 is coupled to the reference voltage terminal VN2.

電晶體M1A具有第一端、第二端及控制端。電晶體M1A的第一端耦接於負載電路130之第二端,電晶體M1A的第二端耦接於參考電壓端VN1,而電晶體M1A的控制端耦接於壓降電路110之第二端。 The transistor M1A has a first terminal, a second terminal and a control terminal. The first end of the transistor M1A is coupled to the second end of the load circuit 130 , the second end of the transistor M1A is coupled to the reference voltage end VN1 , and the control end of the transistor M1A is coupled to the second end of the voltage drop circuit 110 end.

上拉電路140具有第一端及第二端,上拉電路140的第一端耦接於參考電壓端VN2,而上拉電路140的第二端耦接於壓降電路110之第一端。在本發明的部分實施例中,參考電壓端VN2所提供的電壓可高於參考電壓端VN1所提供的電壓。舉例來說,參考電壓端VN2所提供的電壓可例如但不限於是系統中的操作電壓,而參考電壓端VN1所提供的電壓則可例如但不限於是系統中的接地電壓。 The pull-up circuit 140 has a first end and a second end, the first end of the pull-up circuit 140 is coupled to the reference voltage terminal VN2 , and the second end of the pull-up circuit 140 is coupled to the first end of the voltage drop circuit 110 . In some embodiments of the present invention, the voltage provided by the reference voltage terminal VN2 may be higher than the voltage provided by the reference voltage terminal VN1. For example, the voltage provided by the reference voltage terminal VN2 may be, for example, but not limited to, the operating voltage in the system, and the voltage provided by the reference voltage terminal VN1 may be, for example, but not limited to, the ground voltage in the system.

輸出端OUT1耦接於電晶體M1A之第一端,並可用以輸出狀態判別訊號SIGD1。輸出端OUT2耦接於壓降電路110之第一端,並可用以輸出狀態判別訊號SIGD2。電位狀態判別裝置100可根據輸入端IN之電位狀態輸出不同電壓的狀態判別訊號SIGD1及SIGD2。也就是說,狀態判別訊號SIGD1及SIGD2可用以判斷輸入端IN之電位狀態。在本發明的部分實施例中,輸入端IN可耦接於特定節點,藉以判斷特定節點的電位狀態,或是判斷與特定節點有關的電路或元件的狀態。 The output terminal OUT1 is coupled to the first terminal of the transistor M1A, and can be used for outputting the state discrimination signal SIG D1 . The output terminal OUT2 is coupled to the first terminal of the voltage drop circuit 110 , and can be used for outputting the state discrimination signal SIG D2 . The potential state identification device 100 can output state identification signals SIG D1 and SIG D2 of different voltages according to the potential state of the input terminal IN. That is to say, the state determination signals SIG D1 and SIG D2 can be used to determine the potential state of the input terminal IN. In some embodiments of the present invention, the input terminal IN can be coupled to a specific node, so as to determine the potential state of the specific node, or to determine the state of a circuit or element related to the specific node.

舉例來說,當輸入端IN的電位狀態是處於浮接(floating)狀態時,在產生適當大小之偵測電流ID的情況下,偵測電流ID會流經上拉電路140、 壓降電路110及下拉電路120,上拉電路140將對應地產生壓降,輸出端OUT2的電壓可視為參考電壓端VN2所提供的電壓與上拉電路140所產生的壓降之差值,此時輸出端OUT2將輸出具有高電壓的狀態判別訊號SIGD2。電晶體M1A的控制端所接收到的電壓可視為由壓降電路110及下拉電路120對輸出端OUT2的電壓進行分壓後的電壓,因此電晶體M1A的控制端會接收偏低的電壓,使得電晶體M1A被截止。在此情況下,輸出端OUT1的電壓可視為參考電壓端VN2所提供的電壓,因此輸出端OUT1同樣會輸出具有高電壓的狀態判別訊號SIGD1For example, when the potential state of the input terminal IN is in a floating state, the detection current ID will flow through the pull-up circuit 140 and the voltage drop under the condition that the detection current ID of an appropriate magnitude is generated. The circuit 110 and the pull-down circuit 120, the pull-up circuit 140 will correspondingly generate a voltage drop, and the voltage of the output terminal OUT2 can be regarded as the difference between the voltage provided by the reference voltage terminal VN2 and the voltage drop generated by the pull-up circuit 140. At this time, the output The terminal OUT2 will output a state discrimination signal SIG D2 with a high voltage. The voltage received by the control terminal of the transistor M1A can be regarded as a voltage obtained by dividing the voltage of the output terminal OUT2 by the voltage drop circuit 110 and the pull-down circuit 120. Therefore, the control terminal of the transistor M1A will receive a low voltage, so that Transistor M1A is turned off. In this case, the voltage of the output terminal OUT1 can be regarded as the voltage provided by the reference voltage terminal VN2, so the output terminal OUT1 also outputs the state discrimination signal SIG D1 with a high voltage.

然而,當輸入端IN的電位狀態是處於高電壓狀態時,在產生適當大小之偵測電流ID的情況下,電晶體M1A的控制端所接收到的電壓可視為由壓降電路110及下拉電路120對輸入端IN的高電壓進行分壓後的電壓,使得電晶體M1A的控制端處於偏高的電壓,因此電晶體M1A被導通。此時,輸出端OUT1的電壓會被電晶體M1A拉低至接近參考電壓端VN1所提供的電壓,因此輸出端OUT1將輸出具有低電壓的狀態判別訊號SIGD1。此外,輸出端OUT2的電壓將由輸入端IN的高電壓主導,因此輸出端OUT2將輸出具有高電壓的狀態判別訊號SIGD2However, when the potential state of the input terminal IN is in a high voltage state, the voltage received by the control terminal of the transistor M1A can be regarded as the voltage received by the voltage drop circuit 110 and the pull-down circuit 110 under the condition that the detection current ID of an appropriate magnitude is generated. The circuit 120 divides the high voltage of the input terminal IN, so that the control terminal of the transistor M1A is at a high voltage, so the transistor M1A is turned on. At this time, the voltage of the output terminal OUT1 will be pulled down by the transistor M1A to be close to the voltage provided by the reference voltage terminal VN1 , so the output terminal OUT1 will output the state discrimination signal SIG D1 with a low voltage. In addition, the voltage of the output terminal OUT2 will be dominated by the high voltage of the input terminal IN, so the output terminal OUT2 will output the state discrimination signal SIG D2 with a high voltage.

再者,當輸入端IN的電位狀態是處於低電壓狀態時,在產生適當大小之偵測電流ID的情況下,電晶體M1A的控制端所接收到的電壓可視為由壓降電路110及下拉電路120對輸入端IN的低電壓進行分壓後的電壓,使得電晶體M1A的控制端處於偏低的電壓,因此電晶體M1A被截止。在此情況下,輸出端OUT1的電壓可視為參考電壓端VN2所提供的電壓,因此輸出端OUT1將輸出具有高電壓的狀態判別訊號SIGD1。此外,輸出端OUT2的電壓將由輸入端IN的低電壓主導,因此輸出端OUT2將輸出具有低電壓的狀態判別訊號SIGD2Furthermore, when the potential state of the input terminal IN is in a low voltage state, the voltage received by the control terminal of the transistor M1A can be regarded as being generated by the voltage drop circuit 110 and the The pull-down circuit 120 divides the low voltage of the input terminal IN, so that the control terminal of the transistor M1A is at a low voltage, so the transistor M1A is turned off. In this case, the voltage of the output terminal OUT1 can be regarded as the voltage provided by the reference voltage terminal VN2, so the output terminal OUT1 will output the state discrimination signal SIG D1 with a high voltage. In addition, the voltage of the output terminal OUT2 will be dominated by the low voltage of the input terminal IN, so the output terminal OUT2 will output the state discrimination signal SIG D2 with a low voltage.

如此一來,透過狀態判別訊號SIGD1及SIGD2就可以判斷輸入端IN之電位狀態。也就是說,當狀態判別訊號SIGD1及SIGD2皆為高電壓時,表示輸入端IN的電位狀態是處於浮接狀態。而當狀態判別訊號SIGD1及SIGD2為相異的電壓 時,則表示輸入端IN的電位狀態是處於高電壓或低電壓狀態。 In this way, the potential state of the input terminal IN can be determined through the state determination signals SIG D1 and SIG D2 . That is to say, when the state discrimination signals SIG D1 and SIG D2 are both high voltages, it indicates that the potential state of the input terminal IN is in a floating state. When the state discrimination signals SIG D1 and SIG D2 are at different voltages, it indicates that the potential state of the input terminal IN is in a high voltage state or a low voltage state.

偵測電流ID的電流值可設計為在輸入端IN的電位狀態是處於高電壓狀態時,能促使電晶體M1A的控制端提升至足夠高的電壓以導通電晶體M1A,並且在輸入端IN的電位狀態是處於低電壓狀態或處於浮接狀態時,能促使電晶體M1A的控制端調整至偏低的電壓以截止電晶體M1A。在本發明的部分實施例中,可透過適當地設計上拉電路140、壓降電路110及下拉電路120,藉以產生適當大小之偵測電流IDThe current value of the detection current ID can be designed such that when the potential state of the input terminal IN is in a high voltage state, the control terminal of the transistor M1A can be boosted to a high enough voltage to turn on the transistor M1A, and the input terminal IN is in a high voltage state. When the potential state of the transistor M1A is in a low voltage state or in a floating state, the control terminal of the transistor M1A can be adjusted to a low voltage to turn off the transistor M1A. In some embodiments of the present invention, the pull-up circuit 140 , the voltage-drop circuit 110 and the pull-down circuit 120 can be appropriately designed to generate the detection current ID of an appropriate magnitude .

第2圖為本發明另一實施例之電位狀態判別裝置200的示意圖。電位狀態判別裝置200與電位狀態判別裝置100具有相似的結構並且可以根據相似的原理操作,然而電位狀態判別裝置200還可包含邏輯電路250。 FIG. 2 is a schematic diagram of a potential state discriminating device 200 according to another embodiment of the present invention. The potential state discriminating device 200 and the potential state discriminating device 100 have similar structures and may operate according to similar principles, however, the potential state discriminating device 200 may further include a logic circuit 250 .

邏輯電路250可耦接於輸出端OUT1及OUT2,用以根據狀態判別訊號SIGD1及SIGD2產生與輸入端IN之電位狀態有關的控制訊號SIGctrl。也就是說,透過邏輯電路250,電位狀態判別裝置200可根據輸入端IN之電位狀態輸出不同電壓的控制訊號SIGctrl,並藉以判斷輸入端IN的電位狀態。 The logic circuit 250 can be coupled to the output terminals OUT1 and OUT2 for generating the control signal SIG ctrl related to the potential state of the input terminal IN according to the state discrimination signals SIG D1 and SIG D2 . That is to say, through the logic circuit 250 , the potential state judging device 200 can output the control signal SIG ctrl of different voltages according to the potential state of the input terminal IN, so as to judge the potential state of the input terminal IN.

第3圖為本發明另一實施例之電位狀態判別裝置300的示意圖。電位狀態判別裝置300與電位狀態判別裝置200具有相似的結構並且可以根據相似的原理操作,然而電位狀態判別裝置300的邏輯電路350可包含反及閘(NAND gate)352及負載電路354。 FIG. 3 is a schematic diagram of a potential state judging device 300 according to another embodiment of the present invention. The potential state discriminating device 300 and the potential state discriminating device 200 have similar structures and may operate according to similar principles, however, the logic circuit 350 of the potential state discriminating device 300 may include a NAND gate 352 and a load circuit 354 .

反及閘352具有第一輸入端、第二輸入端及輸出端,反及閘352的第一輸入端耦接於輸出端OUT1,反及閘352的第二輸入端耦接於輸出端OUT2,而反及閘352的輸出端用以輸出控制訊號SIGctrlThe inversion gate 352 has a first input terminal, a second input terminal and an output terminal. The first input terminal of the inversion gate 352 is coupled to the output terminal OUT1, and the second input terminal of the inversion gate 352 is coupled to the output terminal OUT2. The output terminal of the inverse gate 352 is used for outputting the control signal SIG ctrl .

負載電路354具有第一端及第二端,負載電路354之第一端耦接於參考電壓端VN2,而負載電路354之第二端耦接於反及閘352的輸出端。 The load circuit 354 has a first terminal and a second terminal, the first terminal of the load circuit 354 is coupled to the reference voltage terminal VN2 , and the second terminal of the load circuit 354 is coupled to the output terminal of the inverter gate 352 .

電位狀態判別裝置300可根據輸入端IN之電位狀態輸出不同電壓的 控制訊號SIGctrl。舉例來說,根據第1圖,當輸入端IN的電位狀態是處於浮接狀態時,輸出端OUT1會輸出具有高電壓的狀態判別訊號SIGD1,且輸出端OUT2會輸出具有高電壓的狀態判別訊號SIGD2。如此一來,反及閘352的輸出端將輸出具有低電壓的控制訊號SIGctrlThe potential state discriminating device 300 can output the control signal SIG ctrl of different voltages according to the potential state of the input terminal IN. For example, according to FIG. 1, when the potential state of the input terminal IN is in a floating state, the output terminal OUT1 will output a high-voltage state discrimination signal SIG D1 , and the output terminal OUT2 will output a high-voltage state discrimination signal Signal SIG D2 . In this way, the output terminal of the inversion gate 352 will output the control signal SIG ctrl with a low voltage.

此外,當輸入端IN的電位狀態是處於高電壓狀態時,輸出端OUT1會輸出具有低電壓的狀態判別訊號SIGD1,且輸出端OUT2會輸出具有高電壓的狀態判別訊號SIGD2。如此一來,反及閘352的輸出端將輸出具有高電壓的控制訊號SIGctrlIn addition, when the potential state of the input terminal IN is in a high voltage state, the output terminal OUT1 outputs a state discrimination signal SIG D1 with a low voltage, and the output terminal OUT2 outputs a state discrimination signal SIG D2 with a high voltage. In this way, the output end of the inversion gate 352 will output the control signal SIG ctrl with a high voltage.

再者,當輸入端IN的電位狀態是處於低電壓狀態時,輸出端OUT1會輸出具有高電壓的狀態判別訊號SIGD1,且輸出端OUT2會輸出具有低電壓的狀態判別訊號SIGD2。如此一來,反及閘352的輸出端也將輸出具有高電壓的控制訊號SIGctrlFurthermore, when the potential state of the input terminal IN is in a low voltage state, the output terminal OUT1 outputs a state discrimination signal SIG D1 with a high voltage, and the output terminal OUT2 outputs a state discrimination signal SIG D2 with a low voltage. In this way, the output terminal of the inversion gate 352 will also output the control signal SIG ctrl with a high voltage.

也就是說,透過控制訊號SIGctrl就可以判斷輸入端IN的電位狀態。在第3圖中,當控制訊號SIGctrl為低電壓時,表示輸入端IN的電位狀態是處於浮接狀態。而當控制訊號SIGctrl為高電壓時,則表示輸入端IN的電位狀態是處於高電壓或低電壓狀態。在本發明的其他實施例中,邏輯電路350也可能利用其他的邏輯運算來產生控制訊號SIGctrl,以配合系統實際操作的需求。 That is to say, the potential state of the input terminal IN can be judged through the control signal SIG ctrl . In Figure 3, when the control signal SIG ctrl is at a low voltage, it means that the potential state of the input terminal IN is in a floating state. When the control signal SIG ctrl is at a high voltage, it indicates that the potential state of the input terminal IN is in a high voltage or a low voltage state. In other embodiments of the present invention, the logic circuit 350 may also utilize other logic operations to generate the control signal SIG ctrl to meet the actual operation requirements of the system.

第4圖為本發明一實施例之電位狀態判別裝置400的應用示意圖。電位狀態判別裝置400可為第3圖之電位狀態判別裝置300的實施態樣之一,並可根據相似的原理操作。電位狀態判別裝置400可包含輸入端IN、輸出端OUT1、輸出端OUT2、壓降電路410、下拉電路420、負載電路430、電晶體M1A、上拉電路440及邏輯電路450。 FIG. 4 is a schematic diagram of an application of a potential state discriminating device 400 according to an embodiment of the present invention. The potential state discriminating device 400 may be one of the implementations of the potential state discriminating device 300 in FIG. 3 , and may operate according to a similar principle. The potential state discriminating device 400 may include an input terminal IN, an output terminal OUT1 , an output terminal OUT2 , a voltage drop circuit 410 , a pull-down circuit 420 , a load circuit 430 , a transistor M1A, a pull-up circuit 440 and a logic circuit 450 .

壓降電路410可包含至少一電晶體、至少一二極體、至少一電阻或前述三項之任意組合,而下拉電路420可包含至少一電晶體、至少一二極體、至 少一電阻或前述三項之任意組合。舉例來說,在第4圖中,壓降電路410可包含彼此串聯的電阻RA及二極體DA,而下拉電路420可包含電阻RB。在本發明其他實施例中,二極體DA可替換為以二極體方式連接的電晶體。 The voltage drop circuit 410 may include at least one transistor, at least one diode, at least one resistor, or any combination of the foregoing three, while the pull-down circuit 420 may include at least one transistor, at least one diode, to One less resistor or any combination of the above three. For example, in FIG. 4, the voltage drop circuit 410 may include a resistor RA and a diode DA in series with each other, while the pull-down circuit 420 may include a resistor RB. In other embodiments of the present invention, the diode DA may be replaced by a transistor connected in a diode manner.

在本發明的部分實施例中,負載電路430可包含電流源CS1,而電流源CS1可包含至少一電晶體、至少一二極體、至少一電阻或前述三項之任意組合。舉例來說,在第4圖中,電流源CS1可包含電晶體M2及電阻R1。 In some embodiments of the present invention, the load circuit 430 may include a current source CS1, and the current source CS1 may include at least one transistor, at least one diode, at least one resistor, or any combination of the foregoing three. For example, in Figure 4, current source CS1 may include transistor M2 and resistor R1.

電晶體M2可以是場效電晶體(Field Effect Transistor,FET)。在本發明的部分實施例中,電晶體M2可為空乏型(depletion mode,D-mode)假晶高速電子移動電晶體(pseudomorphic high electron mobility transistor,PHEMT)。電晶體M2具有第一端、第二端及控制端,電晶體M2之第一端耦接於負載電路430之第一端。電阻R1具有第一端及第二端,電阻R1之第一端耦接於電晶體M2之第二端,電阻R1之第二端可直接或間接耦接於電晶體M2之控制端及負載電路430之第二端。以電阻R1之第二端直接耦接於電晶體M2之控制端及負載電路430之第二端,且負載電路430之第二端的電壓被拉低(亦即此時輸出端OUT1輸出具有低電壓的狀態判別訊號SIGD1)為例,電晶體M2的控制端為接收偏低的電壓,使得電晶體M2被導通。電晶體M2的第二端的電壓可視為輸出端OUT1的電壓減去電晶體M2的控制端和第二端之間的電壓差。而流經電流源CS1的負載電流IL1可視為電晶體M2的第二端的電壓除以電阻R1的阻值。由於電阻R1的阻值與負載電流IL1的電流值成反比關係,因此,可透過選擇具有大阻值的電阻R1(例如1MΩ)以使負載電流IL1減少(例如小於1μA),從而降低電位狀態判別裝置400的漏電流及耗電。然而,大阻值的電阻R1會佔據電位狀態判別裝置400較多的電路面積(例如電流源CS1的電路面積會增加為原電路面積的1倍)。 The transistor M2 may be a field effect transistor (Field Effect Transistor, FET). In some embodiments of the present invention, the transistor M2 may be a depletion mode (D-mode) pseudomorphic high electron mobility transistor (PHEMT). The transistor M2 has a first terminal, a second terminal and a control terminal. The first terminal of the transistor M2 is coupled to the first terminal of the load circuit 430 . The resistor R1 has a first end and a second end, the first end of the resistor R1 is coupled to the second end of the transistor M2, and the second end of the resistor R1 can be directly or indirectly coupled to the control end of the transistor M2 and the load circuit The second end of 430. The second end of the resistor R1 is directly coupled to the control end of the transistor M2 and the second end of the load circuit 430, and the voltage of the second end of the load circuit 430 is pulled down (that is, the output end OUT1 has a low voltage at this time. The state discrimination signal SIG D1 ) is taken as an example, the control terminal of the transistor M2 receives a low voltage, so that the transistor M2 is turned on. The voltage of the second terminal of the transistor M2 can be regarded as the voltage of the output terminal OUT1 minus the voltage difference between the control terminal and the second terminal of the transistor M2. The load current I L1 flowing through the current source CS1 can be regarded as the voltage of the second terminal of the transistor M2 divided by the resistance value of the resistor R1 . Since the resistance value of the resistor R1 is inversely proportional to the current value of the load current IL1, the load current IL1 can be reduced (eg less than 1μA) by selecting a resistor R1 with a large resistance value (eg 1MΩ), thereby reducing the potential Leakage current and power consumption of the state determination device 400 . However, the resistor R1 with a large resistance value will occupy more circuit area of the potential state determination device 400 (for example, the circuit area of the current source CS1 will be increased to 1 times the original circuit area).

為改善上述情況,電流源CS1還可包含二極體單元DU1。二極體單元 DU1具有第一端及第二端,二極體單元DU1的第一端耦接於電阻R1之第二端,二極體單元DU1的第二端耦接於電晶體M2之控制端及負載電路430之第二端。亦即,電阻R1之第二端間接耦接於電晶體M2之控制端及負載電路430之第二端。二極體單元DU1可包含至少一電晶體、至少一二極體或前述二項之任意組合。在本發明的部分實施例中,可選用具有較小尺寸的至少一電晶體及/或至少一二極體。舉例來說,在第4圖中,二極體單元DU1可包含電晶體M3及二極體D1。電晶體M3具有第一端、第二端及控制端,電晶體M3的第一端耦接於二極體單元DU1之第一端。二極體D1具有第一端及第二端,二極體D1的第一端耦接於電晶體M3之第二端,而二極體D1的第二端耦接於二極體單元DU1之第二端。此外,電晶體M3可以二極體的方式連接(diode connected)。在本發明的部分實施例中,電阻R1、電晶體M3及二極體D1可用於限流。如此一來,當負載電路430之第二端的電壓被拉低時,電晶體M2的控制端為接收偏低的電壓,使得電晶體M2被導通。電晶體M2的第二端的電壓可視為輸出端OUT1的電壓減去電晶體M2的控制端和第二端之間的電壓差。而流經電流源CS1的負載電流IL1可視為電晶體M2的第二端的電壓減去電晶體M3與二極體D1所產生的壓降後再除以電阻R1的阻值。換句話說,相較於利用具有大阻值的電阻R1以減少負載電流IL1(例如小於1μA)之作法,透過設置二極體單元DU1,不僅可選擇具有較小阻值的電阻R1(例如0.4MΩ)以減少負載電流IL1(例如小於1μA),還可降低電流源CS1於電位狀態判別裝置400中所需佔據的電路面積(例如電流源CS1的電路面積會增加為原電路面積的0.4倍)。在本發明其他實施例中,可根據所需的負載電流IL1的電流值設計二極體單元DU1。 To improve the above situation, the current source CS1 may further include a diode unit DU1. The diode unit DU1 has a first end and a second end, the first end of the diode unit DU1 is coupled to the second end of the resistor R1, and the second end of the diode unit DU1 is coupled to the control of the transistor M2 terminal and the second terminal of the load circuit 430 . That is, the second end of the resistor R1 is indirectly coupled to the control end of the transistor M2 and the second end of the load circuit 430 . The diode unit DU1 may include at least one transistor, at least one diode, or any combination of the foregoing two. In some embodiments of the present invention, at least one transistor and/or at least one diode with smaller dimensions may be selected. For example, in Figure 4, diode unit DU1 may include transistor M3 and diode D1. The transistor M3 has a first terminal, a second terminal and a control terminal, and the first terminal of the transistor M3 is coupled to the first terminal of the diode unit DU1. The diode D1 has a first end and a second end, the first end of the diode D1 is coupled to the second end of the transistor M3, and the second end of the diode D1 is coupled to the diode unit DU1 second end. In addition, the transistor M3 may be diode connected. In some embodiments of the present invention, the resistor R1 , the transistor M3 and the diode D1 can be used for current limiting. In this way, when the voltage of the second terminal of the load circuit 430 is pulled down, the control terminal of the transistor M2 receives the low voltage, so that the transistor M2 is turned on. The voltage of the second terminal of the transistor M2 can be regarded as the voltage of the output terminal OUT1 minus the voltage difference between the control terminal and the second terminal of the transistor M2. The load current IL1 flowing through the current source CS1 can be regarded as the voltage at the second end of the transistor M2 minus the voltage drop generated by the transistor M3 and the diode D1, and then divided by the resistance value of the resistor R1. In other words, compared to using the resistor R1 with a large resistance value to reduce the load current IL1 (eg, less than 1 μA), by arranging the diode unit DU1 , not only the resistor R1 with a smaller resistance value (eg, less than 1 μA) can be selected 0.4MΩ) to reduce the load current I L1 (for example, less than 1 μA), and also reduce the circuit area occupied by the current source CS1 in the potential state discrimination device 400 (for example, the circuit area of the current source CS1 will be increased to 0.4 of the original circuit area) times). In other embodiments of the present invention, the diode unit DU1 can be designed according to the required current value of the load current IL1 .

在本發明的部分實施例中,上拉電路440可包含電流源CS2,而電流源CS2可包含至少一電晶體、至少一二極體、至少一電阻或前述三項之任意組合。舉例來說,在第4圖中,電流源CS2可包含電晶體M4及電阻R2。 In some embodiments of the present invention, the pull-up circuit 440 may include a current source CS2, and the current source CS2 may include at least one transistor, at least one diode, at least one resistor, or any combination of the foregoing three. For example, in Figure 4, current source CS2 may include transistor M4 and resistor R2.

電晶體M4可以是FET。在本發明的部分實施例中,電晶體M4可為D-mode PHEMT。電晶體M4具有第一端、第二端及控制端,電晶體M4之第一端耦接於上拉電路440之第一端。電阻R2具有第一端及第二端,電阻R2之第一端耦接於電晶體M4之第二端,電阻R2之第二端可直接或間接耦接於電晶體M4之控制端及上拉電路440之第二端。以電阻R2之第二端直接耦接於電晶體M4之控制端及上拉電路440之第二端,且上拉電路440之第二端的電壓被拉低(亦即此時輸入端IN的電位狀態是處於低電壓狀態)為例,電晶體M4的控制端為接收偏低的電壓,使得電晶體M4被導通。電晶體M4的第二端的電壓可視為輸入端IN的電壓減去電晶體M4的控制端和第二端之間的電壓差。而流經電流源CS2的偵測電流ID可視為電晶體M4的第二端的電壓除以電阻R2的阻值。由於電阻R2的阻值與偵測電流ID的電流值成反比關係,因此,可透過選擇具有大阻值的電阻R2(例如1MΩ)以使偵測電流ID減少(例如小於1μA),從而降低電位狀態判別裝置400的漏電流及耗電。然而,大阻值的電阻R2會佔據電位狀態判別裝置400較多的電路面積(例如電流源CS2的電路面積會增加為原電路面積的1倍)。 Transistor M4 may be an FET. In some embodiments of the present invention, the transistor M4 may be a D-mode PHEMT. The transistor M4 has a first terminal, a second terminal and a control terminal. The first terminal of the transistor M4 is coupled to the first terminal of the pull-up circuit 440 . The resistor R2 has a first terminal and a second terminal, the first terminal of the resistor R2 is coupled to the second terminal of the transistor M4, and the second terminal of the resistor R2 can be directly or indirectly coupled to the control terminal and the pull-up terminal of the transistor M4 the second end of the circuit 440 . The second end of the resistor R2 is directly coupled to the control end of the transistor M4 and the second end of the pull-up circuit 440, and the voltage of the second end of the pull-up circuit 440 is pulled down (that is, the potential of the input end IN at this time). The state is in a low voltage state) as an example, the control terminal of the transistor M4 receives a low voltage, so that the transistor M4 is turned on. The voltage of the second terminal of the transistor M4 can be regarded as the voltage of the input terminal IN minus the voltage difference between the control terminal and the second terminal of the transistor M4. The detection current ID flowing through the current source CS2 can be regarded as the voltage of the second terminal of the transistor M4 divided by the resistance value of the resistor R2. Since the resistance of the resistor R2 is inversely proportional to the current value of the detection current ID, the detection current ID can be reduced (eg, less than 1 μA) by selecting a resistor R2 with a large resistance value (eg, 1MΩ), thereby reducing the detection current ID (eg, less than 1 μA ). The leakage current and power consumption of the potential state determination device 400 are reduced. However, the resistor R2 with a large resistance value will occupy more circuit area of the potential state determination device 400 (for example, the circuit area of the current source CS2 will be increased to 1 times the original circuit area).

為改善上述情況,電流源CS2還可包含二極體單元DU2。二極體單元DU2具有第一端及第二端,二極體單元DU2的第一端耦接於電阻R2之第二端,二極體單元DU2的第二端耦接於電晶體M4之控制端及上拉電路440之第二端。亦即,電阻R2之第二端間接耦接於電晶體M4之控制端及上拉電路440之第二端。二極體單元DU2可包含至少一電晶體、至少一二極體或前述二項之任意組合。在本發明的部分實施例中,可選用具有較小尺寸的至少一電晶體及/或至少一二極體。舉例來說,在第4圖中,二極體單元DU2可包含電晶體M5及二極體D2。電晶體M5具有第一端、第二端及控制端,電晶體M5之第一端耦接於二極體單元DU2之第一端。二極體D2具有第一端及第二端,二極體D2之第一端耦接於電晶體M5之第二端,而二極體D2之第二端耦接於二極體單元DU2之第二端。此外,電晶體 M5可以二極體的方式連接。在本發明的部分實施例中,電阻R2、電晶體M5及二極體D2可用於限流。如此一來,當上拉電路440之第二端的電壓被拉低時,電晶體M4的控制端為接收偏低的電壓,使得電晶體M4被導通。電晶體M4的第二端的電壓可視為輸入端IN的電壓減去電晶體M4的控制端和第二端之間的電壓差。而流經電流源CS2的偵測電流ID可視為電晶體M4的第二端的電壓減去電晶體M5與二極體D2所產生的壓降後再除以電阻R2的阻值。換句話說,相較於利用具有大阻值的電阻R2以減少偵測電流ID(例如小於1μA)之作法,透過設置二極體單元DU2,不僅可選擇具有較小阻值的電阻R2(例如0.4MΩ)以減少偵測電流ID(例如小於1μA),還可降低電流源CS2於電位狀態判別裝置400中所需佔據的電路面積(例如電流源CS2的電路面積會增加為原電路面積的0.4倍)。在本發明其他實施例中,可根據所需的偵測電流ID的電流值設計二極體單元DU2。 To improve the above situation, the current source CS2 may further include a diode unit DU2. The diode unit DU2 has a first end and a second end, the first end of the diode unit DU2 is coupled to the second end of the resistor R2, and the second end of the diode unit DU2 is coupled to the control of the transistor M4 terminal and the second terminal of the pull-up circuit 440 . That is, the second end of the resistor R2 is indirectly coupled to the control end of the transistor M4 and the second end of the pull-up circuit 440 . The diode unit DU2 may include at least one transistor, at least one diode, or any combination of the foregoing two. In some embodiments of the present invention, at least one transistor and/or at least one diode with smaller dimensions may be selected. For example, in Figure 4, diode unit DU2 may include transistor M5 and diode D2. The transistor M5 has a first terminal, a second terminal and a control terminal, and the first terminal of the transistor M5 is coupled to the first terminal of the diode unit DU2. The diode D2 has a first end and a second end, the first end of the diode D2 is coupled to the second end of the transistor M5, and the second end of the diode D2 is coupled to the diode unit DU2 second end. Furthermore, the transistor M5 may be connected in a diode manner. In some embodiments of the present invention, resistor R2, transistor M5 and diode D2 may be used for current limiting. In this way, when the voltage of the second terminal of the pull-up circuit 440 is pulled down, the control terminal of the transistor M4 receives the low voltage, so that the transistor M4 is turned on. The voltage of the second terminal of the transistor M4 can be regarded as the voltage of the input terminal IN minus the voltage difference between the control terminal and the second terminal of the transistor M4. The detection current ID flowing through the current source CS2 can be regarded as the voltage at the second end of the transistor M4 minus the voltage drop generated by the transistor M5 and the diode D2 , and then divided by the resistance value of the resistor R2. In other words, compared to using the resistor R2 with a large resistance value to reduce the detection current ID (eg, less than 1 μA ), by arranging the diode unit DU2, not only the resistor R2 with a small resistance value can be selected ( For example, 0.4MΩ ) to reduce the detection current ID (for example, less than 1μA), and also to reduce the circuit area occupied by the current source CS2 in the potential state discrimination device 400 (for example, the circuit area of the current source CS2 will be increased to the original circuit area) 0.4 times). In other embodiments of the present invention, the diode unit DU2 can be designed according to the required current value of the detection current ID.

邏輯電路450可包含反及閘452及負載電路454。反及閘452可包含電晶體M6A及電晶體M7A。電晶體M6A具有第一端、第二端及控制端,電晶體M6A之第一端耦接於反及閘452之輸出端,而電晶體M6A之控制端耦接於反及閘452之第一輸入端。電晶體M7A具有第一端、第二端及控制端,電晶體M7A之第一端耦接於電晶體M6A之第二端,電晶體M7A之第二端耦接於參考電壓端VN1,而電晶體M7A之控制端耦接於反及閘452之第二輸入端。 Logic circuit 450 may include inverting gate 452 and load circuit 454 . Inverter gate 452 may include transistor M6A and transistor M7A. The transistor M6A has a first terminal, a second terminal and a control terminal. The first terminal of the transistor M6A is coupled to the output terminal of the inverting gate 452 , and the control terminal of the transistor M6A is coupled to the first terminal of the inverting and gate 452 . input. The transistor M7A has a first terminal, a second terminal and a control terminal, the first terminal of the transistor M7A is coupled to the second terminal of the transistor M6A, the second terminal of the transistor M7A is coupled to the reference voltage terminal VN1, and the power The control terminal of the crystal M7A is coupled to the second input terminal of the inverting gate 452 .

此外,在本發明的部分實施例中,負載電路454可包含電流源CS3,而電流源CS3可包含至少一電晶體、至少一二極體、至少一電阻或前述三項之任意組合。舉例來說,在第4圖中,電流源CS3可包含電晶體M8及電阻R3。 In addition, in some embodiments of the present invention, the load circuit 454 may include a current source CS3, and the current source CS3 may include at least one transistor, at least one diode, at least one resistor, or any combination of the foregoing three. For example, in Figure 4, current source CS3 may include transistor M8 and resistor R3.

電晶體M8可以是FET。在本發明的部分實施例中,電晶體M8可為D-mode PHEMT。電晶體M8具有第一端、第二端及控制端,電晶體M8之第一端耦接於負載電路454之第一端。電阻R3具有第一端及第二端,電阻R3之第一端耦接於電晶體M8之第二端,電阻R3之第二端可直接或間接耦接於電晶體M8之控制 端及負載電路454之第二端。以電阻R3之第二端直接耦接於電晶體M8之控制端及負載電路454之第二端,且負載電路454之第二端的電壓被拉低(亦即此時反及閘452的輸出端輸出具有低電壓的控制訊號SIGctrl)為例,電晶體M8的控制端為接收偏低的電壓,使得電晶體M8被導通。電晶體M8的第二端的電壓可視為反及閘452之輸出端的電壓減去電晶體M8的控制端和第二端之間的電壓差。而流經電流源CS3的負載電流IL2可視為電晶體M8的第二端的電壓除以電阻R3的阻值。由於電阻R3的阻值與負載電流IL2的電流值成反比關係,因此,可透過選擇具有大阻值的電阻R3(例如1MΩ)以使負載電流IL2減少(例如小於1μA),從而降低電位狀態判別裝置400的漏電流及耗電。然而,大阻值的電阻R3會佔據電位狀態判別裝置400較多的電路面積(例如電流源CS3的電路面積會增加為原電路面積的1倍)。 Transistor M8 may be an FET. In some embodiments of the present invention, the transistor M8 may be a D-mode PHEMT. The transistor M8 has a first terminal, a second terminal and a control terminal. The first terminal of the transistor M8 is coupled to the first terminal of the load circuit 454 . The resistor R3 has a first end and a second end, the first end of the resistor R3 is coupled to the second end of the transistor M8, and the second end of the resistor R3 can be directly or indirectly coupled to the control end of the transistor M8 and the load circuit The second end of 454. The second end of the resistor R3 is directly coupled to the control end of the transistor M8 and the second end of the load circuit 454, and the voltage of the second end of the load circuit 454 is pulled down (that is, the output end of the gate 452 is reversed at this time. Taking the output of the control signal SIG ctrl with a low voltage as an example, the control terminal of the transistor M8 receives the low voltage, so that the transistor M8 is turned on. The voltage at the second terminal of transistor M8 can be regarded as the voltage at the output terminal of inverting gate 452 minus the voltage difference between the control terminal and the second terminal of transistor M8. The load current IL2 flowing through the current source CS3 can be regarded as the voltage of the second terminal of the transistor M8 divided by the resistance value of the resistor R3. Since the resistance value of the resistor R3 is inversely proportional to the current value of the load current IL2, the load current IL2 can be reduced (eg less than 1μA) by selecting a resistor R3 with a large resistance value (eg 1MΩ), thereby reducing the potential Leakage current and power consumption of the state determination device 400 . However, the resistor R3 with a large resistance value will occupy more circuit area of the potential state determination device 400 (for example, the circuit area of the current source CS3 will be increased to 1 times the original circuit area).

為改善上述情況,電流源CS3還可包含二極體單元DU3。二極體單元DU3具有第一端及第二端,二極體單元DU3的第一端耦接於電阻R3之第二端,二極體單元DU3的第二端耦接於電晶體M8之控制端及負載電路454之第二端。亦即,電阻R3之第二端間接耦接於電晶體M8之控制端及負載電路454之第二端。二極體單元DU3可包含至少一電晶體、至少一二極體或前述二項之任意組合。在本發明的部分實施例中,可選用具有較小尺寸的至少一電晶體及/或至少一二極體。舉例來說,在第4圖中,二極體單元DU3可包含電晶體M9及二極體D3。電晶體M9具有第一端、第二端及控制端,電晶體M9之第一端耦接於二極體單元DU3之第一端。二極體D3具有第一端及第二端,二極體D3之第一端耦接於電晶體M9之第二端,而二極體D3之第二端耦接於二極體單元DU3之第二端。此外,電晶體M9可以二極體的方式連接。在本發明的部分實施例中,電阻R3、電晶體M9及二極體D3可用於限流。如此一來,當負載電路454之第二端的電壓被拉低時,電晶體M8的控制端為接收偏低的電壓,使得電晶體M8被導通。電晶體M8的第二端的 電壓可視為反及閘452之輸出端的電壓減去電晶體M8的控制端和第二端之間的電壓差。而流經電流源CS3的負載電流IL2可視為電晶體M8的第二端的電壓減去電晶體M9與二極體D3所產生的壓降後再除以電阻R3的阻值。換句話說,相較於利用具有大阻值的電阻R3以減少負載電流IL2(例如小於1μA)之作法,透過設置二極體單元DU3,不僅可選擇具有較小阻值的電阻R3(例如0.4MΩ)以減少負載電流IL2(例如小於1μA),還可降低電流源CS3於電位狀態判別裝置400中所需佔據的電路面積(例如電流源CS3的電路面積會增加為原電路面積的0.4倍)。在本發明其他實施例中,可根據所需的負載電流IL2的電流值設計二極體單元DU3。 To improve the above situation, the current source CS3 may further include a diode unit DU3. The diode unit DU3 has a first end and a second end, the first end of the diode unit DU3 is coupled to the second end of the resistor R3, and the second end of the diode unit DU3 is coupled to the control of the transistor M8 terminal and the second terminal of the load circuit 454 . That is, the second end of the resistor R3 is indirectly coupled to the control end of the transistor M8 and the second end of the load circuit 454 . The diode unit DU3 may include at least one transistor, at least one diode, or any combination of the foregoing two. In some embodiments of the present invention, at least one transistor and/or at least one diode with smaller dimensions may be selected. For example, in Figure 4, diode unit DU3 may include transistor M9 and diode D3. The transistor M9 has a first terminal, a second terminal and a control terminal, and the first terminal of the transistor M9 is coupled to the first terminal of the diode unit DU3. The diode D3 has a first end and a second end, the first end of the diode D3 is coupled to the second end of the transistor M9, and the second end of the diode D3 is coupled to the diode unit DU3 second end. In addition, the transistor M9 may be connected in a diode manner. In some embodiments of the present invention, resistor R3, transistor M9 and diode D3 may be used for current limiting. In this way, when the voltage of the second terminal of the load circuit 454 is pulled down, the control terminal of the transistor M8 receives the low voltage, so that the transistor M8 is turned on. The voltage at the second terminal of transistor M8 can be regarded as the voltage at the output terminal of inverting gate 452 minus the voltage difference between the control terminal and the second terminal of transistor M8. The load current IL2 flowing through the current source CS3 can be regarded as the voltage at the second end of the transistor M8 minus the voltage drop generated by the transistor M9 and the diode D3, and then divided by the resistance value of the resistor R3. In other words, compared to using the resistor R3 with a large resistance value to reduce the load current IL2 (eg, less than 1 μA), by arranging the diode unit DU3 , not only the resistor R3 with a smaller resistance value (eg, less than 1 μA) can be selected 0.4MΩ) to reduce the load current I L2 (for example, less than 1 μA), and also reduce the circuit area occupied by the current source CS3 in the potential state discrimination device 400 (for example, the circuit area of the current source CS3 will be increased to 0.4 of the original circuit area) times). In other embodiments of the present invention, the diode unit DU3 can be designed according to the required current value of the load current IL2.

在第4圖中,當輸入端IN的電位狀態是處於浮接狀態時,狀態判別訊號SIGD1及SIGD2皆會具有高電壓,使得電晶體M6A及M7A被導通。反及閘452之輸出端的電壓會被電晶體M6A及M7A拉低至接近參考電壓端VN1所提供的電壓,因此反及閘452的輸出端將輸出具有低電壓的控制訊號SIGctrlIn FIG. 4 , when the potential state of the input terminal IN is in a floating state, the state discrimination signals SIG D1 and SIG D2 both have high voltages, so that the transistors M6A and M7A are turned on. The voltage of the output terminal of the inverting gate 452 will be pulled down to be close to the voltage provided by the reference voltage terminal VN1 by the transistors M6A and M7A, so the output terminal of the inverting gate 452 will output the control signal SIG ctrl with a low voltage.

當輸入端IN的電位狀態是處於高電壓狀態時,狀態判別訊號SIGD1會具有低電壓,且狀態判別訊號SIGD2會具有高電壓,使得電晶體M6A被截止,而電晶體M7A被導通。反及閘452之輸出端的電壓可視為參考電壓端VN2所提供的電壓,因此反及閘452的輸出端將輸出具有高電壓的控制訊號SIGctrlWhen the potential state of the input terminal IN is in a high voltage state, the state determination signal SIG D1 has a low voltage, and the state determination signal SIG D2 has a high voltage, so that the transistor M6A is turned off and the transistor M7A is turned on. The voltage of the output terminal of the inversion gate 452 can be regarded as the voltage provided by the reference voltage terminal VN2, so the output terminal of the inversion gate 452 will output the control signal SIG ctrl with a high voltage.

當輸入端IN的電位狀態是處於低電壓狀態時,狀態判別訊號SIGD1會具有高電壓,且狀態判別訊號SIGD2會具有低電壓,使得電晶體M6A被導通,而電晶體M7A被截止。反及閘452之輸出端的電壓可視為參考電壓端VN2所提供的電壓,因此反及閘452的輸出端也將輸出具有高電壓的控制訊號SIGctrlWhen the potential state of the input terminal IN is in a low voltage state, the state determination signal SIG D1 has a high voltage, and the state determination signal SIG D2 has a low voltage, so that the transistor M6A is turned on and the transistor M7A is turned off. The voltage of the output terminal of the inverting gate 452 can be regarded as the voltage provided by the reference voltage terminal VN2, so the output terminal of the inverting gate 452 will also output the control signal SIG ctrl with a high voltage.

在本發明的部分實施例中,電位狀態判別裝置400可將控制訊號SIGctrl提供給內部電路460使用。在此情況下,電位狀態判別裝置400中的邏輯電路450可耦接於內部電路460。內部電路460可包含開關電路462及功能電路464。開關電路462耦接於邏輯電路450,而功能電路464耦接於開關電路462。 功能電路464可用來執行特定的功能。舉例來說,控制訊號SIGctrl還可用以切換內部電路460的操作狀態。當控制訊號SIGctrl具有低電壓時,開關電路462可被截止,進而禁能(disable)功能電路464。當控制訊號SIGctrl具有高電壓時,開關電路462可被導通,進而致能(enable)功能電路464,以使功能電路464得以執行特定的功能。在本發明的部分實施例中,電位狀態判別裝置400及內部電路460可設置於同一晶片(chip)中,而電位狀態判別裝置400的輸入端IN可耦接於該晶片的特定接腳(pin),藉以判斷特定接腳的電位狀態。 In some embodiments of the present invention, the potential state determination device 400 can provide the control signal SIG ctrl to the internal circuit 460 for use. In this case, the logic circuit 450 in the potential state discriminating device 400 can be coupled to the internal circuit 460 . Internal circuits 460 may include switch circuits 462 and function circuits 464 . The switch circuit 462 is coupled to the logic circuit 450 , and the function circuit 464 is coupled to the switch circuit 462 . Functional circuitry 464 may be used to perform specific functions. For example, the control signal SIG ctrl can also be used to switch the operation state of the internal circuit 460 . When the control signal SIG ctrl has a low voltage, the switch circuit 462 can be turned off, thereby disabling the function circuit 464 . When the control signal SIG ctrl has a high voltage, the switch circuit 462 can be turned on, thereby enabling the function circuit 464 so that the function circuit 464 can perform a specific function. In some embodiments of the present invention, the potential state discriminating device 400 and the internal circuit 460 may be disposed in the same chip, and the input terminal IN of the potential state discriminating device 400 may be coupled to a specific pin (pin) of the chip. ) to determine the potential state of a specific pin.

在本發明其他實施例中,電位狀態判別裝置400所輸出的控制訊號SIGctrl也可能以其他的方式被其他電路所使用,或與其他電路直接作動,而不限應用於控制內部電路460。 In other embodiments of the present invention, the control signal SIG ctrl output by the potential state judging device 400 may also be used by other circuits in other ways, or act directly with other circuits, and is not limited to controlling the internal circuit 460 .

第5圖為本發明另一實施例之電位狀態判別裝置500的示意圖。電位狀態判別裝置500與電位狀態判別裝置100具有相似的結構並可根據類似的原理操作。電位狀態判別裝置500可包含輸入端IN、輸出端OUT1、輸出端OUT2、壓降電路510、下拉電路520、負載電路530、電晶體M1B及上拉電路540。且電晶體M1B之控制端可耦接於壓降電路510之第一端,而輸出端OUT2則可耦接於壓降電路510之第二端。 FIG. 5 is a schematic diagram of a potential state judging device 500 according to another embodiment of the present invention. The potential state discriminating device 500 and the potential state discriminating device 100 have similar structures and operate according to similar principles. The potential state discriminating device 500 may include an input terminal IN, an output terminal OUT1 , an output terminal OUT2 , a voltage drop circuit 510 , a pull-down circuit 520 , a load circuit 530 , a transistor M1B and a pull-up circuit 540 . And the control end of the transistor M1B can be coupled to the first end of the voltage drop circuit 510 , and the output end OUT2 can be coupled to the second end of the voltage drop circuit 510 .

在第5圖的實施例中,電位狀態判別裝置500亦可根據輸入端IN之電位狀態輸出不同電壓的狀態判別訊號SIGD1及SIGD2。也就是說,狀態判別訊號SIGD1及SIGD2可用以判斷輸入端IN之電位狀態。在本發明的部分實施例中,輸入端IN可耦接於特定節點,藉以判斷特定節點的電位狀態,或是判斷與特定節點有關的電路或元件的狀態。 In the embodiment of FIG. 5 , the potential state discriminating device 500 can also output state discriminating signals SIG D1 and SIG D2 of different voltages according to the potential state of the input terminal IN. That is to say, the state determination signals SIG D1 and SIG D2 can be used to determine the potential state of the input terminal IN. In some embodiments of the present invention, the input terminal IN can be coupled to a specific node, so as to determine the potential state of the specific node, or to determine the state of a circuit or element related to the specific node.

舉例來說,當輸入端IN的電位狀態是處於浮接狀態時,在產生適當大小之偵測電流ID的情況下,偵測電流ID會流經上拉電路540、壓降電路510及下拉電路520,上拉電路540將對應地產生壓降,電晶體M1B的控制端所接收到 的電壓可視為參考電壓端VN2所提供的電壓與上拉電路540所產生的壓降之差值,因此電晶體M1B的控制端會接收偏高的電壓,使得電晶體M1B被導通。此時,輸出端OUT1的電壓會被電晶體M1B拉低至接近參考電壓端VN1所提供的電壓,因此輸出端OUT1將輸出具有低電壓的狀態判別訊號SIGD1。此外,輸出端OUT2的電壓可視為由壓降電路510及下拉電路520對電晶體M1B的控制端的電壓進行分壓後的電壓,因此輸出端OUT2同樣會輸出具有低電壓的狀態判別訊號SIGD2For example, when the potential state of the input terminal IN is in a floating state, the detection current ID will flow through the pull-up circuit 540 , the voltage drop circuit 510 and the The pull-down circuit 520 and the pull-up circuit 540 will correspondingly generate a voltage drop. The voltage received by the control terminal of the transistor M1B can be regarded as the difference between the voltage provided by the reference voltage terminal VN2 and the voltage drop generated by the pull-up circuit 540. Therefore, the control terminal of the transistor M1B will receive a high voltage, so that the transistor M1B is turned on. At this time, the voltage of the output terminal OUT1 will be pulled down by the transistor M1B to be close to the voltage provided by the reference voltage terminal VN1 , so the output terminal OUT1 will output the state discrimination signal SIG D1 with a low voltage. In addition, the voltage of the output terminal OUT2 can be regarded as a voltage obtained by dividing the voltage of the control terminal of the transistor M1B by the voltage drop circuit 510 and the pull-down circuit 520 . Therefore, the output terminal OUT2 also outputs a low-voltage state discrimination signal SIG D2 .

當輸入端IN的電位狀態是處於高電壓狀態時,電晶體M1B的控制端所接收到的電壓為輸入端IN的高電壓,使得電晶體M1B被導通。此時,輸出端OUT1的電壓會被電晶體M1B拉低至接近參考電壓端VN1所提供的電壓,因此輸出端OUT1將輸出具有低電壓的狀態判別訊號SIGD1。在產生適當大小之偵測電流ID的情況下,輸出端OUT2的電壓可視為由壓降電路510及下拉電路520對輸入端IN的高電壓進行分壓後的電壓,使得輸出端OUT2會輸出具有高電壓的狀態判別訊號SIGD2When the potential state of the input terminal IN is in a high voltage state, the voltage received by the control terminal of the transistor M1B is the high voltage of the input terminal IN, so that the transistor M1B is turned on. At this time, the voltage of the output terminal OUT1 will be pulled down by the transistor M1B to be close to the voltage provided by the reference voltage terminal VN1 , so the output terminal OUT1 will output the state discrimination signal SIG D1 with a low voltage. When the detection current ID of an appropriate magnitude is generated, the voltage of the output terminal OUT2 can be regarded as a voltage obtained by dividing the high voltage of the input terminal IN by the voltage drop circuit 510 and the pull-down circuit 520, so that the output terminal OUT2 will output The state discrimination signal SIG D2 with high voltage.

再者,當輸入端IN的電位狀態是處於低電壓狀態時,電晶體M1B的控制端所接收到的電壓為輸入端IN的低電壓,使得電晶體M1B被截止。在此情況下,輸出端OUT1的電壓可視為參考電壓端VN2所提供的電壓,因此輸出端OUT1會輸出具有高電壓的狀態判別訊號SIGD1。在產生適當大小之偵測電流ID的情況下,輸出端OUT2的電壓可視為由壓降電路510及下拉電路520對輸入端IN的低電壓進行分壓後的電壓,使得輸出端OUT2會輸出具有低電壓的狀態判別訊號SIGD2Furthermore, when the potential state of the input terminal IN is in a low voltage state, the voltage received by the control terminal of the transistor M1B is the low voltage of the input terminal IN, so that the transistor M1B is turned off. In this case, the voltage of the output terminal OUT1 can be regarded as the voltage provided by the reference voltage terminal VN2, so the output terminal OUT1 will output the state discrimination signal SIG D1 with a high voltage. When the detection current ID of an appropriate magnitude is generated, the voltage of the output terminal OUT2 can be regarded as a voltage obtained by dividing the low voltage of the input terminal IN by the voltage drop circuit 510 and the pull-down circuit 520, so that the output terminal OUT2 will output The state discrimination signal SIG D2 has a low voltage.

如此一來,透過狀態判別訊號SIGD1及SIGD2就可以判斷輸入端IN之電位狀態。也就是說,當狀態判別訊號SIGD1及SIGD2皆為低電壓時,表示輸入端IN的電位狀態是處於浮接狀態。而當狀態判別訊號SIGD1及SIGD2為相異的電壓時,則表示輸入端IN的電位狀態是處於高電壓或低電壓狀態。 In this way, the potential state of the input terminal IN can be determined through the state determination signals SIG D1 and SIG D2 . That is to say, when the state discrimination signals SIG D1 and SIG D2 are both low voltages, it indicates that the potential state of the input terminal IN is in a floating state. When the state discrimination signals SIG D1 and SIG D2 are at different voltages, it indicates that the potential state of the input terminal IN is in a high voltage state or a low voltage state.

偵測電流ID的電流值可設計為在輸入端IN的電位狀態是處於高電壓狀態時,能促使輸出端OUT2具有高電壓,並且在輸入端IN的電位狀態是處於低電壓或浮接狀態時,能促使輸出端OUT2具有低電壓。除此之外,在輸入端IN的電位狀態是處於浮接狀態時,還能促使電晶體M1B的控制端提升至足夠高的電壓以導通電晶體M1B。在本發明的部分實施例中,可透過適當地設計上拉電路540、壓降電路510及下拉電路520,藉以產生適當大小之偵測電流IDThe current value of the detection current ID can be designed to cause the output terminal OUT2 to have a high voltage when the potential state of the input terminal IN is in a high voltage state, and the potential state of the input terminal IN is in a low voltage or floating state , the output terminal OUT2 can be caused to have a low voltage. Besides, when the potential state of the input terminal IN is in a floating state, the control terminal of the transistor M1B can also be raised to a high enough voltage to turn on the transistor M1B. In some embodiments of the present invention, the pull-up circuit 540 , the voltage-drop circuit 510 and the pull-down circuit 520 can be appropriately designed to generate the detection current ID of an appropriate magnitude .

第6圖為本發明另一實施例之電位狀態判別裝置600的示意圖。電位狀態判別裝置600與電位狀態判別裝置500具有相似的結構並可根據類似的原理操作,然而電位狀態判別裝置600還可包含邏輯電路650。 FIG. 6 is a schematic diagram of a potential state judging device 600 according to another embodiment of the present invention. The potential state discriminating device 600 and the potential state discriminating device 500 have similar structures and operate according to similar principles, however, the potential state discriminating device 600 may further include a logic circuit 650 .

邏輯電路650可耦接於輸出端OUT1及OUT2,用以根據狀態判別訊號SIGD1及SIGD2產生與輸入端IN之電位狀態有關的控制訊號SIGctrl。也就是說,透過邏輯電路650,電位狀態判別裝置600可根據輸入端IN之電位狀態輸出不同電壓的控制訊號SIGctrl,並藉以判斷輸入端IN的電位狀態。 The logic circuit 650 can be coupled to the output terminals OUT1 and OUT2 for generating the control signal SIG ctrl related to the potential state of the input terminal IN according to the state discrimination signals SIG D1 and SIG D2 . That is to say, through the logic circuit 650, the potential state judging device 600 can output the control signal SIG ctrl of different voltages according to the potential state of the input terminal IN, so as to judge the potential state of the input terminal IN.

第7圖為本發明另一實施例之電位狀態判別裝置700的示意圖。電位狀態判別裝置700與電位狀態判別裝置600具有相似的結構並可根據類似的原理操作,然而電位狀態判別裝置700中的邏輯電路750可包含反或閘(NOR gate)752及負載電路754。 FIG. 7 is a schematic diagram of a potential state judging device 700 according to another embodiment of the present invention. The potential state discriminating device 700 and the potential state discriminating device 600 have similar structures and operate according to similar principles. However, the logic circuit 750 in the potential state discriminating device 700 may include a NOR gate 752 and a load circuit 754 .

反或閘752具有第一輸入端、第二輸入端及輸出端,反或閘752之第一輸入端耦接於輸出端OUT1,反或閘752之第二輸入端耦接於輸出端OUT2,而反或閘752之輸出端可輸出控制訊號SIGctrlThe inverse OR gate 752 has a first input terminal, a second input terminal and an output terminal. The first input terminal of the inverse OR gate 752 is coupled to the output terminal OUT1, and the second input terminal of the inverse OR gate 752 is coupled to the output terminal OUT2. The output terminal of the inverse OR gate 752 can output the control signal SIG ctrl .

負載電路754具有第一端及第二端,負載電路754之第一端耦接於參考電壓端VN2,而負載電路754之第二端耦接於反或閘752的輸出端。 The load circuit 754 has a first terminal and a second terminal, the first terminal of the load circuit 754 is coupled to the reference voltage terminal VN2 , and the second terminal of the load circuit 754 is coupled to the output terminal of the inverse OR gate 752 .

電位狀態判別裝置700可根據輸入端IN之電位狀態輸出不同電壓的控制訊號SIGctrl。舉例來說,根據第5圖,當輸入端IN的電位狀態是處於浮接狀 態時,輸出端OUT1會輸出具有低電壓的狀態判別訊號SIGD1,且輸出端OUT2會輸出具有低電壓的狀態判別訊號SIGD2。如此一來,反或閘752的輸出端將輸出具有高電壓的控制訊號SIGctrlThe potential state discriminating device 700 can output the control signal SIG ctrl of different voltages according to the potential state of the input terminal IN. For example, according to FIG. 5, when the potential state of the input terminal IN is in a floating state, the output terminal OUT1 will output a low-voltage state discrimination signal SIG D1 , and the output terminal OUT2 will output a low-voltage state discrimination signal Signal SIG D2 . In this way, the output terminal of the inverse-OR gate 752 will output the control signal SIG ctrl with a high voltage.

此外,當輸入端IN的電位狀態是處於高電壓狀態時,輸出端OUT1會輸出具有低電壓的狀態判別訊號SIGD1,且輸出端OUT2會輸出具有高電壓的狀態判別訊號SIGD2。如此一來,反或閘752的輸出端將輸出具有低電壓的控制訊號SIGctrlIn addition, when the potential state of the input terminal IN is in a high voltage state, the output terminal OUT1 outputs a state discrimination signal SIG D1 with a low voltage, and the output terminal OUT2 outputs a state discrimination signal SIG D2 with a high voltage. In this way, the output terminal of the inverse-OR gate 752 will output the control signal SIG ctrl with a low voltage.

再者,當輸入端IN的電位狀態是處於低電壓狀態時,輸出端OUT1會輸出具有高電壓的狀態判別訊號SIGD1,且輸出端OUT2會輸出具有低電壓的狀態判別訊號SIGD2。如此一來,反或閘752的輸出端也將輸出具有低電壓的控制訊號SIGctrlFurthermore, when the potential state of the input terminal IN is in a low voltage state, the output terminal OUT1 outputs a state discrimination signal SIG D1 with a high voltage, and the output terminal OUT2 outputs a state discrimination signal SIG D2 with a low voltage. In this way, the output terminal of the inverse OR gate 752 will also output the control signal SIG ctrl with a low voltage.

也就是說,透過控制訊號SIGctrl就可以判斷輸入端IN的電位狀態。在第7圖中,當控制訊號SIGctrl為高電壓時,表示輸入端IN的電位狀態是處於浮接狀態。而當控制訊號SIGctrl為低電壓時,則表示輸入端IN的電位狀態是處於高電壓或低電壓狀態。在本發明的其他實施例中,邏輯電路750也可能利用其他的邏輯運算來產生控制訊號SIGctrl,以配合系統實際操作的需求。 That is to say, the potential state of the input terminal IN can be judged through the control signal SIG ctrl . In FIG. 7, when the control signal SIG ctrl is at a high voltage, it means that the potential state of the input terminal IN is in a floating state. When the control signal SIG ctrl is at a low voltage, it indicates that the potential state of the input terminal IN is in a high voltage or a low voltage state. In other embodiments of the present invention, the logic circuit 750 may also use other logic operations to generate the control signal SIG ctrl to meet the actual operation requirements of the system.

第8圖為本發明另一實施例之電位狀態判別裝置800的應用示意圖。電位狀態判別裝置800可為第7圖之電位狀態判別裝置700的實施態樣之一,並可根據類似的原理操作。電位狀態判別裝置800可包含輸入端IN、輸出端OUT1、輸出端OUT2、壓降電路810、下拉電路820、負載電路830、電晶體M1B、上拉電路840、邏輯電路850。在本發明的部分實施例中,電位狀態判別裝置800中的邏輯電路850還可耦接於內部電路860,控制訊號SIGctrl還可用以切換內部電路860的操作狀態。 FIG. 8 is a schematic diagram of an application of a potential state judging device 800 according to another embodiment of the present invention. The potential state judging device 800 can be one of the implementations of the potential state judging device 700 in FIG. 7 , and can operate according to a similar principle. The potential state discrimination device 800 may include an input terminal IN, an output terminal OUT1 , an output terminal OUT2 , a voltage drop circuit 810 , a pull-down circuit 820 , a load circuit 830 , a transistor M1B, a pull-up circuit 840 , and a logic circuit 850 . In some embodiments of the present invention, the logic circuit 850 in the potential state identification device 800 can also be coupled to the internal circuit 860 , and the control signal SIG ctrl can also be used to switch the operation state of the internal circuit 860 .

在第8圖的實施例中,壓降電路810可與壓降電路410以相同結構來 實作,下拉電路820可與下拉電路420以相同結構來實作,負載電路830可與負載電路430以相同結構來實作,上拉電路840可與上拉電路440以相同的結構來實作,而內部電路860可與內部電路460以相同的結構來實作,故不贅述。 In the embodiment shown in FIG. 8, the voltage drop circuit 810 and the voltage drop circuit 410 can be constructed in the same structure. In practice, the pull-down circuit 820 can be implemented with the same structure as the pull-down circuit 420 , the load circuit 830 can be implemented with the same structure as the load circuit 430 , and the pull-up circuit 840 can be implemented with the same structure as the pull-up circuit 440 . , and the internal circuit 860 can be implemented with the same structure as the internal circuit 460 , so it is not repeated here.

邏輯電路850可包含反或閘852及負載電路854。反或閘852可包含電晶體M6B及電晶體M7B。電晶體M6B具有第一端、第二端及控制端,電晶體M6B之第一端耦接於反或閘852之輸出端,電晶體M6B之第二端耦接於參考電壓端VN1,而電晶體M6B之控制端耦接於反或閘852之第一輸入端。電晶體M7B具有第一端、第二端及控制端,電晶體M7B之第一端耦接於電晶體M6B之第一端,電晶體M7B之第二端耦接於參考電壓端VN1,而電晶體M7B之控制端耦接於反或閘852之第二輸入端。在第8圖的實施例中,負載電路854可與負載電路454以相同的結構來實作,故不贅述。 Logic circuit 850 may include inverse OR gate 852 and load circuit 854 . Inverse OR gate 852 may include transistor M6B and transistor M7B. The transistor M6B has a first terminal, a second terminal and a control terminal. The first terminal of the transistor M6B is coupled to the output terminal of the inverse OR gate 852, the second terminal of the transistor M6B is coupled to the reference voltage terminal VN1, and the power The control terminal of the crystal M6B is coupled to the first input terminal of the inverse-OR gate 852 . The transistor M7B has a first terminal, a second terminal and a control terminal, the first terminal of the transistor M7B is coupled to the first terminal of the transistor M6B, the second terminal of the transistor M7B is coupled to the reference voltage terminal VN1, and the power The control terminal of the crystal M7B is coupled to the second input terminal of the inverse-OR gate 852 . In the embodiment shown in FIG. 8 , the load circuit 854 and the load circuit 454 can be implemented with the same structure, and thus are not described in detail.

在第8圖中,當輸入端IN的電位狀態是處於浮接狀態時,狀態判別訊號SIGD1及SIGD2皆會具有低電壓,使得電晶體M6B及M7B被截止。反或閘852之輸出端的電壓可視為參考電壓端VN2所提供的電壓,因此反或閘852的輸出端將輸出具有高電壓的控制訊號SIGctrlIn FIG. 8, when the potential state of the input terminal IN is in a floating state, the state discrimination signals SIG D1 and SIG D2 both have low voltages, so that the transistors M6B and M7B are turned off. The voltage of the output terminal of the inverse OR gate 852 can be regarded as the voltage provided by the reference voltage terminal VN2, so the output terminal of the inverse OR gate 852 will output the control signal SIG ctrl with a high voltage.

當輸入端IN的電位狀態是處於高電壓狀態時,狀態判別訊號SIGD1會具有低電壓,且狀態判別訊號SIGD2會具有高電壓,使得電晶體M6B被截止,而電晶體M7B被導通。反或閘852之輸出端的電壓會被電晶體M7B拉低至接近參考電壓端VN1所提供的電壓,因此反或閘852的輸出端將輸出具有低電壓的控制訊號SIGctrlWhen the potential state of the input terminal IN is in a high voltage state, the state determination signal SIG D1 has a low voltage, and the state determination signal SIG D2 has a high voltage, so that the transistor M6B is turned off and the transistor M7B is turned on. The voltage of the output terminal of the inverse OR gate 852 will be pulled down by the transistor M7B to be close to the voltage provided by the reference voltage terminal VN1 , so the output terminal of the inverse OR gate 852 will output the control signal SIG ctrl with a low voltage.

當輸入端IN的電位狀態是處於低電壓狀態時,狀態判別訊號SIGD1會具有高電壓,且狀態判別訊號SIGD2會具有低電壓,使得電晶體M6B被導通,而電晶體M7B被截止。反或閘852之輸出端的電壓會被電晶體M6B拉低至接近參考電壓端VN1所提供的電壓,因此反或閘852的輸出端也將輸出具有低電壓的控制 訊號SIGctrlWhen the potential state of the input terminal IN is in a low voltage state, the state determination signal SIG D1 has a high voltage, and the state determination signal SIG D2 has a low voltage, so that the transistor M6B is turned on and the transistor M7B is turned off. The voltage of the output terminal of the inverse OR gate 852 will be pulled down by the transistor M6B to be close to the voltage provided by the reference voltage terminal VN1 , so the output terminal of the inverse OR gate 852 will also output the control signal SIG ctrl with a low voltage.

在本發明的部分實施例中,不論是第1圖或第5圖中的狀態判別訊號SIGD1及SIGD2,或者是第2圖、第3圖、第6圖或第7圖中的控制訊號SIGctrl,除了用以判斷輸入端IN之電位狀態外,亦可提供給其他電路所使用,或與其他電路直接作動,例如狀態判別訊號SIGD1及SIGD2或者是控制訊號SIGctrl可用於控制其後端電路。 In some embodiments of the present invention, whether it is the state discrimination signals SIG D1 and SIG D2 in Fig. 1 or Fig. 5, or the control signals in Fig. 2, Fig. 3, Fig. 6 or Fig. 7 SIG ctrl , in addition to judging the potential state of the input terminal IN, can also be used by other circuits, or act directly with other circuits, such as the state judging signals SIG D1 and SIG D2 or the control signal SIG ctrl can be used to control its back-end circuit.

在本發明的部分實施例中,可根據不同的應用或根據系統的需求,選擇性地設置邏輯電路。舉例來說,當電位狀態判別裝置的後端電路為單端輸入時,可設置邏輯電路,如第2圖、第3圖、第4圖、第6圖、第7圖或第8圖。而當電位狀態判別裝置的後端電路為雙端輸入時,則可省略邏輯電路,如第1圖或第5圖。 In some embodiments of the present invention, logic circuits may be selectively provided according to different applications or according to system requirements. For example, when the back-end circuit of the potential state judging device is single-ended input, a logic circuit such as Figure 2, Figure 3, Figure 4, Figure 6, Figure 7 or Figure 8 can be provided. And when the back-end circuit of the potential state judging device is a double-terminal input, the logic circuit can be omitted, as shown in FIG. 1 or FIG. 5 .

電晶體M1A、M1B、M3、M5、M9、M6A、M7A、M6B或M7B可以是FET。在本發明的部分實施例中,電晶體M1A、M1B、M3、M5、M9、M6A、M7A、M6B或M7B可為增強型(enhancement mode,E-mode)PHEMT。當電晶體為E-mode PHEMT,並且以二極體的方式連接時,電晶體的控制端可耦接於其第一端,例如第4圖或第8圖中的電晶體M3、M5及M9。然而當電晶體為D-mode PHEMT,並且以二極體的方式連接時,則電晶體之控制端將可耦接於其第二端。電晶體M1A至M9的第一端可為汲極,第二端可為源極,控制端可為閘極。上述電晶體可使用砷化鎵(GaAs)製程。 Transistors M1A, M1B, M3, M5, M9, M6A, M7A, M6B or M7B may be FETs. In some embodiments of the present invention, the transistors M1A, M1B, M3, M5, M9, M6A, M7A, M6B or M7B may be an enhancement mode (E-mode) PHEMT. When the transistor is an E-mode PHEMT and is connected in the form of a diode, the control end of the transistor can be coupled to its first end, such as transistors M3, M5 and M9 in Figure 4 or Figure 8 . However, when the transistor is a D-mode PHEMT and is connected by a diode, the control terminal of the transistor can be coupled to the second terminal thereof. The first terminals of the transistors M1A to M9 may be drain electrodes, the second terminals may be source electrodes, and the control terminals may be gate electrodes. The above transistors can be fabricated using a gallium arsenide (GaAs) process.

綜上所述,本發明之實施例所提供的電位狀態判別裝置能夠判斷某一特定節點的電位狀態,例如是否為浮接狀態、高電壓狀態或低電壓狀態。如此一來,就能夠增加可供判別的電位狀態,使得電路設計更具彈性,也擴展了電位狀態判別裝置的應用範圍。 To sum up, the device for determining the potential state provided by the embodiments of the present invention can determine the potential state of a specific node, such as whether it is a floating state, a high voltage state or a low voltage state. In this way, it is possible to increase the potential states that can be discriminated, which makes the circuit design more flexible, and also expands the application range of the potential state discriminating device.

以上所述僅為本發明之較佳實施例,凡依本發明申請專利範圍所做之均等變化與修飾,皆應屬本發明之涵蓋範圍。 The above descriptions are only preferred embodiments of the present invention, and all equivalent changes and modifications made according to the scope of the patent application of the present invention shall fall within the scope of the present invention.

100:電位狀態判別裝置 100: Potential state discrimination device

110:壓降電路 110: Voltage drop circuit

120:下拉電路 120: pull-down circuit

130:負載電路 130: Load circuit

140:上拉電路 140: Pull-up circuit

M1A:電晶體 M1A: Transistor

ID:偵測電流 I D : Detection current

IN:輸入端 IN: input terminal

OUT1、OUT2:輸出端 OUT1, OUT2: output terminal

SIGD1、SIGD2:狀態判別訊號 SIG D1 , SIG D2 : Status discrimination signal

VN1、VN2:參考電壓端 VN1, VN2: reference voltage terminals

Claims (19)

一種電位狀態判別裝置,包含:一輸入端;一壓降電路,具有一第一端耦接於該輸入端,及一第二端;一下拉電路,具有一第一端耦接於該壓降電路之該第二端,及一第二端耦接於一第一參考電壓端;一第一負載電路,具有一第一端耦接於一第二參考電壓端,及一第二端;一第一電晶體,具有一第一端耦接於該第一負載電路之該第二端,一第二端耦接於該第一參考電壓端,及一控制端;一上拉電路,具有一第一端耦接於該第二參考電壓端,及一第二端耦接於該壓降電路之該第一端;一第一輸出端,耦接於該第一電晶體之該第一端,用以輸出一第一狀態判別訊號;及一第二輸出端,用以輸出一第二狀態判別訊號,其中該第一電晶體之該控制端係耦接於該壓降電路之該第二端且該第二輸出端係耦接於該壓降電路之該第一端,或該第一電晶體之該控制端係耦接於該壓降電路之該第一端且該第二輸出端係耦接於該壓降電路之該第二端;其中該第一狀態判別訊號及該第二狀態判別訊號係用以判斷該輸入端之一電位狀態;其中該壓降電路包含至少一電晶體、至少一二極體、至少一電阻或前述三項之任意組合。 A potential state judging device, comprising: an input end; a voltage drop circuit with a first end coupled to the input end and a second end; a pull-down circuit with a first end coupled to the voltage drop The second end of the circuit and a second end are coupled to a first reference voltage end; a first load circuit has a first end coupled to a second reference voltage end, and a second end; a The first transistor has a first end coupled to the second end of the first load circuit, a second end coupled to the first reference voltage end, and a control end; a pull-up circuit has a A first end is coupled to the second reference voltage end, and a second end is coupled to the first end of the voltage drop circuit; a first output end is coupled to the first end of the first transistor , for outputting a first state discrimination signal; and a second output terminal for outputting a second state discrimination signal, wherein the control terminal of the first transistor is coupled to the second voltage drop circuit terminal and the second output terminal is coupled to the first terminal of the voltage drop circuit, or the control terminal of the first transistor is coupled to the first terminal of the voltage drop circuit and the second output terminal is coupled to the second end of the voltage drop circuit; wherein the first state discriminating signal and the second state discriminating signal are used to judge a potential state of the input end; wherein the voltage drop circuit includes at least one transistor , at least one diode, at least one resistor, or any combination of the foregoing three. 如請求項1所述之電位狀態判別裝置,其中該下拉電路包含至少一電晶體、至少一二極體、至少一電阻或前述三項之任意組合。 The potential state discrimination device of claim 1, wherein the pull-down circuit comprises at least one transistor, at least one diode, at least one resistor, or any combination of the foregoing three items. 如請求項1所述之電位狀態判別裝置,其中該第一負載電路包含一第一電流源。 The potential state judging device of claim 1, wherein the first load circuit includes a first current source. 如請求項3所述之電位狀態判別裝置,其中該第一電流源包含至少一電晶體、至少一二極體、至少一電阻或前述三項之任意組合。 The potential state discrimination device according to claim 3, wherein the first current source comprises at least one transistor, at least one diode, at least one resistor or any combination of the foregoing three items. 如請求項3所述之電位狀態判別裝置,其中該第一電流源包含:一第二電晶體,具有一第一端耦接於該第一負載電路之該第一端,一第二端,及一控制端;一第一電阻,具有一第一端耦接於該第二電晶體之該第二端,及一第二端;及一第一二極體單元,具有一第一端耦接於該第一電阻之該第二端,及一第二端耦接於該第二電晶體之該控制端及該第一負載電路之該第二端。 The electrical potential state judging device of claim 3, wherein the first current source comprises: a second transistor having a first end coupled to the first end of the first load circuit, a second end, and a control terminal; a first resistor with a first terminal coupled to the second terminal of the second transistor, and a second terminal; and a first diode unit with a first terminal coupled The second terminal is connected to the first resistor, and a second terminal is coupled to the control terminal of the second transistor and the second terminal of the first load circuit. 如請求項1所述之電位狀態判別裝置,其中該上拉電路包含一第二電流源。 The potential state discrimination device of claim 1, wherein the pull-up circuit includes a second current source. 如請求項6所述之電位狀態判別裝置,其中該第二電流源包含至少一電晶體、至少一二極體、至少一電阻或前述三項之任意組合。 The potential state discrimination device of claim 6, wherein the second current source comprises at least one transistor, at least one diode, at least one resistor, or any combination of the foregoing three items. 如請求項6所述之電位狀態判別裝置,其中該第二電流源包含: 一第三電晶體,具有一第一端耦接於該上拉電路之該第一端,一第二端,及一控制端;一第二電阻,具有一第一端耦接於該第三電晶體之該第二端,及一第二端;及一第二二極體單元,具有一第一端耦接於該第二電阻之該第二端,及一第二端耦接於該第三電晶體之該控制端及該上拉電路之該第二端。 The potential state judging device as claimed in claim 6, wherein the second current source comprises: a third transistor having a first end coupled to the first end of the pull-up circuit, a second end, and a control end; a second resistor having a first end coupled to the third The second end of the transistor, and a second end; and a second diode unit, having a first end coupled to the second end of the second resistor, and a second end coupled to the second end The control terminal of the third transistor and the second terminal of the pull-up circuit. 如請求項1所述之電位狀態判別裝置,另包含:一邏輯電路,耦接於該第一輸出端及該第二輸出端,用以根據該第一狀態判別訊號及該第二狀態判別訊號產生一控制訊號,其中該控制訊號與該輸入端之該電位狀態有關。 The electrical potential state judging device according to claim 1, further comprising: a logic circuit, coupled to the first output end and the second output end, for judging the signal according to the first state and the second state judging signal A control signal is generated, wherein the control signal is related to the potential state of the input terminal. 如請求項9所述之電位狀態判別裝置,其中當該第一電晶體之該控制端係耦接於該壓降電路之該第二端,且該第二輸出端係耦接於該壓降電路之該第一端時,該邏輯電路包含:一反及閘,具有一第一輸入端耦接於該第一輸出端,一第二輸入端耦接於該第二輸出端,及一輸出端用以輸出該控制訊號。 The electrical potential state judging device as claimed in claim 9, wherein the control terminal of the first transistor is coupled to the second terminal of the voltage drop circuit, and the second output terminal is coupled to the voltage drop When the first end of the circuit is used, the logic circuit includes: an inverting and gate, having a first input end coupled to the first output end, a second input end coupled to the second output end, and an output The terminal is used to output the control signal. 如請求項10所述之電位狀態判別裝置,其中該邏輯電路另包含:一第二負載電路,具有一第一端耦接於該第二參考電壓端,及一第二端耦接於該反及閘之該輸出端。 The potential state discrimination device of claim 10, wherein the logic circuit further comprises: a second load circuit having a first end coupled to the second reference voltage end, and a second end coupled to the inverter and the output terminal of the gate. 如請求項11所述之電位狀態判別裝置,其中該反及閘包含:一第四電晶體,具有一第一端耦接於該反及閘之該輸出端,一第二端,及一 控制端耦接於該反及閘之該第一輸入端;及一第五電晶體,具有一第一端耦接於該第四電晶體之該第二端,一第二端耦接於該第一參考電壓端,及一控制端耦接於該反及閘之該第二輸入端。 The device for determining a potential state of claim 11, wherein the inverter gate comprises: a fourth transistor having a first end coupled to the output end of the inverter gate, a second end, and a The control end is coupled to the first input end of the inverting gate; and a fifth transistor has a first end coupled to the second end of the fourth transistor, and a second end coupled to the fourth transistor The first reference voltage terminal and a control terminal are coupled to the second input terminal of the inverter. 如請求項9所述之電位狀態判別裝置,其中當該第一電晶體之該控制端係耦接於該壓降電路之該第一端,且該第二輸出端係耦接於該壓降電路之該第二端時,該邏輯電路包含:一反或閘,具有一第一輸入端耦接於該第一輸出端,一第二輸入端耦接於該第二輸出端,及一輸出端用以輸出該控制訊號。 The potential state discrimination device as claimed in claim 9, wherein the control terminal of the first transistor is coupled to the first terminal of the voltage drop circuit, and the second output terminal is coupled to the voltage drop At the second end of the circuit, the logic circuit includes: an inverting OR gate, having a first input end coupled to the first output end, a second input end coupled to the second output end, and an output The terminal is used to output the control signal. 如請求項13所述之電位狀態判別裝置,其中該邏輯電路另包含:一第二負載電路,具有一第一端耦接於該第二參考電壓端,及一第二端耦接於該反或閘之該輸出端。 The electrical potential state judging device of claim 13, wherein the logic circuit further comprises: a second load circuit having a first end coupled to the second reference voltage end, and a second end coupled to the inverter or the output of the gate. 如請求項14所述之電位狀態判別裝置,其中該反或閘包含:一第四電晶體,具有一第一端耦接於該反或閘之該輸出端,一第二端耦接於該第一參考電壓端,及一控制端耦接於該反或閘之該第一輸入端;及一第五電晶體,具有一第一端耦接於該第四電晶體之該第一端,一第二端耦接於該第一參考電壓端,及一控制端耦接於該反或閘之該第二輸入端。 The device for determining a potential state of claim 14, wherein the inverse-OR gate comprises: a fourth transistor having a first end coupled to the output end of the inverse-OR gate, and a second end coupled to the inverse-OR gate a first reference voltage terminal, and a control terminal coupled to the first input terminal of the inverse OR gate; and a fifth transistor having a first terminal coupled to the first terminal of the fourth transistor, A second terminal is coupled to the first reference voltage terminal, and a control terminal is coupled to the second input terminal of the inverse OR gate. 如請求項11或14所述之電位狀態判別裝置,其中該第二負載電路包含一第三電流源,該第三電流源包含至少一電晶體、至少一二極體、至少一電阻或前述三項之任意組合。 The potential state discrimination device according to claim 11 or 14, wherein the second load circuit includes a third current source, and the third current source includes at least one transistor, at least one diode, at least one resistor, or the aforementioned three any combination of items. 如請求項11或14所述之電位狀態判別裝置,其中該第二負載電路包含一第三電流源,該第三電流源包含:一第六電晶體,具有一第一端耦接於該第二負載電路之該第一端,一第二端,及一控制端;一第三電阻,具有一第一端耦接於該第六電晶體之該第二端,及一第二端;及一第三二極體單元,具有一第一端耦接於該第三電阻之該第二端,及一第二端耦接於該第六電晶體之該控制端及該第二負載電路之該第二端。 The electrical potential state judging device according to claim 11 or 14, wherein the second load circuit includes a third current source, and the third current source includes: a sixth transistor having a first end coupled to the first The first end, a second end, and a control end of two load circuits; a third resistor having a first end coupled to the second end of the sixth transistor, and a second end; and a third diode unit, having a first end coupled to the second end of the third resistor, and a second end coupled to the control end of the sixth transistor and the second load circuit the second end. 如請求項9所述之電位狀態判別裝置,其中:該邏輯電路還耦接於一內部電路,該控制訊號還用以切換該內部電路的一操作狀態。 The electrical potential state judging device as claimed in claim 9, wherein: the logic circuit is further coupled to an internal circuit, and the control signal is further used to switch an operation state of the internal circuit. 如請求項1所述之電位狀態判別裝置,其中該輸入端之該電位狀態包含一浮接狀態。 The potential state judging device according to claim 1, wherein the potential state of the input terminal includes a floating state.
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