TWI746101B - Electronic device and thermal controlling method for solid state disk thereof - Google Patents
Electronic device and thermal controlling method for solid state disk thereof Download PDFInfo
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本發明是有關於一種電子裝置及其溫度控制方法,且特別是有關於一種電子裝置及其固態硬碟的溫度控制方法。 The present invention relates to an electronic device and a temperature control method thereof, and more particularly to a temperature control method of an electronic device and a solid state hard disk.
NVMe固態硬碟已成為市場主流,固態硬碟具有高效能但同時也產生一些過熱的問題。目前在固態硬碟中已有溫控調頻(Thermal Throttling)機制,透過主機控制熱管理(HCTM)的兩個溫度參數來使固態硬碟降溫。但是主機控制熱管理的兩個溫度參數為廠商預設值(Default),而各家廠商的廠商預設值(例如82℃及84℃)通常比固態硬碟的安全溫度(通常約為70℃)還高。也就是說當固態硬碟的溫度超過安全溫度時,才會根據主機控制熱管理的兩個溫度參數使固態硬碟進行降溫。換句話說,各家廠商的廠商預設值僅適用於某些使用情境,例如短時間內的固態硬碟存取。若固態硬碟長時間處在運作狀態,還是會造成固態硬碟的溫度一直處在安全溫度之上。 NVMe solid-state hard drives have become the mainstream of the market. Solid-state hard drives have high performance but also have some overheating problems. At present, there is a Thermal Throttling mechanism in the solid state drive, which cools the solid state drive through two temperature parameters of the host controlled thermal management (HCTM). However, the two temperature parameters used by the host to control thermal management are the factory default values (Default), and the factory default values of each manufacturer (such as 82°C and 84°C) are usually lower than the safe temperature of the solid state drive (usually about 70°C). ) Is still high. That is to say, when the temperature of the solid state drive exceeds the safe temperature, the solid state drive will be cooled according to the two temperature parameters of the thermal management controlled by the host. In other words, the manufacturer's default values of each manufacturer are only applicable to certain usage scenarios, such as solid-state drive access in a short period of time. If the solid state drive is kept in operation for a long time, the temperature of the solid state drive will still be above the safe temperature.
另外,雖然目前在NVMe規範中,系統可透過設定功能(Set Feature)指令將主機控制熱管理的兩個溫度參數設定成低於廠商預設值。但僅透過系統設定主機控制熱管理的兩個溫度參數對固態硬碟降溫進行降溫的方式無法適用於某些使用情境,例如長時間內的固態硬碟存取或固態硬碟在高於室溫(例如40℃)的環境中使用...等,此些使用情境仍會造成固態硬碟的溫度一直處在安全溫度之上。如此,對於固態硬碟的壽命與其儲存的資料將會造成嚴重的威脅。 In addition, although currently in the NVMe specification, the system can set the two temperature parameters of the host to control thermal management to be lower than the manufacturer's preset values through the Set Feature command. However, the method of cooling the solid-state drive only through the two temperature parameters of the system setting host to control thermal management cannot be applied to certain usage scenarios, such as long-term solid-state drive access or solid-state drive that is higher than room temperature. (For example, 40°C), etc., etc., these usage scenarios will still cause the temperature of the solid state drive to always be above the safe temperature. In this way, it will pose a serious threat to the life of the solid state drive and its stored data.
因此,如何改善上述缺點,提供一個更有效率的溫度控制方法,已成為業界努力的方向。 Therefore, how to improve the above shortcomings and provide a more efficient temperature control method has become the direction of the industry's efforts.
本發明係有關於一種電子裝置及其固態硬碟的溫度控制方法,其設置三個階段的降溫,可依據不同的階段主動設定固態硬碟的電源狀態(power state)來有效的對固態硬碟進行降溫。 The present invention relates to an electronic device and a temperature control method for a solid state hard disk. It sets three stages of cooling, and can actively set the power state of the solid state disk according to different stages to effectively control the solid state disk. Cool down.
根據本發明之第一方面,提出一種固態硬碟之溫度控制方法。固態硬碟的溫度控制方法包括以下步驟:透過電子裝置之一中央處理器以一第一頻率發出複數個第一指令。透過固態硬碟之一控制器接收此些第一指令,並依據此些第一指令回傳固態硬碟之複數個當前溫度至中央處理器。透過中央處理器依據此些當前溫度決定以一第一階段、一第二階段或一第三階段對該固 態硬碟降溫,並依據該第一階段、該第二階段或該第三階段發出一第二指令設定該固態硬碟之一電源狀態。 According to the first aspect of the present invention, a temperature control method of a solid state drive is provided. The temperature control method of the solid state hard disk includes the following steps: a central processing unit of the electronic device sends out a plurality of first commands at a first frequency. Receive these first commands through a controller of the solid state hard disk, and return a plurality of current temperatures of the solid state hard disk to the central processing unit according to the first commands. According to the current temperature, the central processing unit decides whether to use a first stage, a second stage or a third stage The temperature of the solid state hard disk is reduced, and a second command is issued according to the first stage, the second stage, or the third stage to set a power state of the solid state hard disk.
根據本發明之第二方面,提出一種電子裝置。電子裝置包括一中央處理器及一固態硬碟。固態硬碟包括一控制器。中央處理器用以以一第一頻率發出複數個第一指令。控制器用以接收該些第一指令,並依據該些第一指令回傳該固態硬碟之複數個當前溫度至該中央處理器。該中央處理器依據該些當前溫度決定以一第一階段、一第二階段或一第三階段對該固態硬碟降溫,並依據該第一階段、該第二階段或該第三階段發出一第二指令設定該固態硬碟之一電源狀態。 According to the second aspect of the present invention, an electronic device is provided. The electronic device includes a central processing unit and a solid state hard disk. The solid state drive includes a controller. The central processing unit is used for issuing a plurality of first commands at a first frequency. The controller is used for receiving the first commands, and returning a plurality of current temperatures of the solid state drive to the central processing unit according to the first commands. The central processing unit decides to cool the solid state drive in a first stage, a second stage, or a third stage according to the current temperatures, and sends out a The second command sets a power state of the solid state drive.
為了對本發明之上述及其他方面有更佳的瞭解,下文特舉實施例,並配合所附圖式詳細說明如下: In order to have a better understanding of the above and other aspects of the present invention, the following specific examples are given in conjunction with the accompanying drawings to describe in detail as follows:
100,300:電子裝置 100,300: electronic devices
110,310:中央處理器 110,310: central processing unit
200,400:固態硬碟 200,400: solid state drive
210,410:控制器 210,410: Controller
CMD1:第一指令 CMD1: The first command
CMD2:第二指令 CMD2: Second instruction
S110~S130,S1310~S1380:步驟 S110~S130, S1310~S1380: steps
第1圖繪示繪示電子裝置之示意圖。 Figure 1 shows a schematic diagram of an electronic device.
第2圖繪示根據一實施例之具有固態硬碟之電子裝置的示意圖 Figure 2 shows a schematic diagram of an electronic device with a solid state drive according to an embodiment
第3圖繪示根據本發明一實施例之固態硬碟之溫度控制方法的流程圖。 FIG. 3 shows a flowchart of a temperature control method of a solid state drive according to an embodiment of the present invention.
第4圖繪示根據本發明一實施例之步驟S130的子步驟的流程圖。 FIG. 4 shows a flowchart of the sub-steps of step S130 according to an embodiment of the present invention.
請參照第1圖,其繪示電子裝置100之示意圖。電子裝置100包括一中央處理器110及一固態硬碟200。中央處理器110耦接固態硬碟200,可對固態硬碟200進行資料存取。電子裝置100例如是一筆記型電腦、一桌上型電腦、一平板電腦、一智慧型手機或多媒體裝置。中央處理器110例如是一單核心或多核心的處理器、特殊用途的微處理器或特殊應用積體電路。
Please refer to FIG. 1, which shows a schematic diagram of the electronic device 100. The electronic device 100 includes a
固態硬碟200包括一控制器210。固態硬碟200支援NVMe。控制器210例如是控制晶片、嵌入式控制器或特殊應用積體電路。控制器210可對中央處理器110發送的指令進行回應,以及設定固態硬碟200的電源狀態(power state)。
The solid state drive 200 includes a
表一為固態硬碟200的電源狀態及效能的對應關係。電源狀態包括五種電源狀態PS0至PS4。每個電源狀態PS0至PS4對應不同的效能。電源狀態PS0至PS2為工作狀態,PS3至PS4為睡眠狀態。表一中所顯示的電源狀態及效能的對應關係為一範例,可依照不同的固態硬碟廠商而具有不同的設置。但一般來說,可以確定的是電源狀態PS0至PS4的效能依序越來越低。 Table 1 shows the corresponding relationship between the power state and performance of the solid state drive 200. The power state includes five power states PS0 to PS4. Each power state PS0 to PS4 corresponds to a different performance. The power states PS0 to PS2 are working states, and PS3 to PS4 are sleeping states. The corresponding relationship between power status and performance shown in Table 1 is an example, and different settings can be set according to different solid state drive manufacturers. But generally speaking, it can be determined that the performance of the power states PS0 to PS4 is successively lower and lower.
在NVMe規範中,正常使用狀況下,固態硬碟200的電源狀態為PS0。當固態硬碟200的當前溫度超過主機控制熱管理(HCTM)的第一溫度參數(TMT1)時,會進行第一次降溫,此時控制器210將固態硬碟200的電源狀態設定為PS1,以減少固態硬碟200的效能,以進行降溫。當固態硬碟200的當前溫度超過主機控制熱管理的第二溫度參數(TMT2)時,會進行第二次降溫,此時控制器210將固態硬碟200的電源狀態設定為PS2,以再次減少固態硬碟200的效能,以進行降溫。而當固態硬碟200的當前溫度回到第一溫度參數之下時,此時控制器210將固態硬碟200的電源狀態設定回PS0。換句話說,對於固態硬碟200的電源狀態設定是被動的。然而,這並無法應付固態硬碟200的各種使用情境。
In the NVMe specification, under normal use conditions, the power state of the solid state drive 200 is PS0. When the current temperature of the solid state drive 200 exceeds the first temperature parameter (TMT1) of the host controlled thermal management (HCTM), the temperature will be cooled for the first time. At this time, the
有鑑於此,本發明提供一種固態硬碟的溫度控制方法,可改善前述缺點。 In view of this, the present invention provides a temperature control method for a solid state hard disk, which can improve the aforementioned shortcomings.
請參照第2及3圖。第2圖繪示根據一實施例之具有固態硬碟400之電子裝置300的示意圖。第3圖繪示根據本發明一實施例之固態硬碟400之溫度控制方法的流程圖。第2圖之元件與第1圖之元件類似,在此不多贅述。第2圖與第1圖之不同之處在於,中央處理器310可發送第一指令CMD1及第二指令
CMD2至固態硬碟400,以週期性地監控固態硬碟400的當前溫度並使控制器410設定固態硬碟400的電源狀態。
Please refer to Figures 2 and 3. FIG. 2 is a schematic diagram of an electronic device 300 with a solid state drive 400 according to an embodiment. FIG. 3 shows a flowchart of a temperature control method of a solid state drive 400 according to an embodiment of the invention. The elements in Fig. 2 are similar to those in Fig. 1, so I won’t repeat them here. The difference between Figure 2 and Figure 1 is that the
在步驟S110中,中央處理器310以一第一頻率發出複數個第一指令CMD1至固態硬碟400,用以詢問固態硬碟400的當前溫度。在一實施例中,第一頻率例如為每5分鐘發出一次第一指令CMD1,以詢問固態硬碟400的當前溫度。值得注意的是,發出第一指令CMD1的頻率不以此為限,可依照不同使用情境而有不同設計,例如中央處理器310可每3分鐘發出一次第一指令CMD1或每6分鐘發出一次第一指令CMD1。
In step S110, the
在步驟S120中,固態硬碟400之控制器410接收第一指令CMD1,並依據第一指令CMD1回傳固態硬碟400之複數個當前溫度至中央處理器310。更進一步來說,由於中央處理器310以第一頻率依序發出複數個第一指令CMD1,因此控制器410實質上也以第一頻率依據第一指令CMD1依序回傳固態硬碟400之複數個當前溫度至中央處理器310。
In step S120, the
在步驟S130中,中央處理器310依據此些當前溫度決定以一第一階段、一第二階段或一第三階段對固態硬碟400降溫,並依據第一階段、第二階段或第三階段發出一第二指令CMD2設定固態硬碟400之一電源狀態。請參考第4圖。第4圖繪示根據本發明一實施例之步驟S130的子步驟的流程圖。步驟S130的包括步驟S1310至S1380。
In step S130, the
在步驟S1310中,中央處理器310計算此些當前溫
度中連續超過一安全溫度的當前溫度的一數量。在一實施例中,由於固態硬碟400在70℃以下可以正常運作,而超過70℃可能會對固態硬碟400造成損壞,因此,在此實施例中之安全溫度可為70℃,但不以此為限,可依照實際的情況調整。舉例來說,若控制器410每5分鐘依據第一指令CMD1依序回傳固態硬碟400之複數個當前溫度分別為65℃、68℃、72℃、75℃、74℃,則中央處理器310計算此些當前溫度中連續超過70℃的當前溫度的數量為3。
In step S1310, the
接著,在步驟S1320,中央處理器310將此數量與一門檻值比較,以決定以第一階段、第二階段或第三階段對固態硬碟400降溫。在一實施例中,門檻值為3,但不以此為限,可依照實際的情況調整。當此數量未達到此門檻值時,進入步驟S1330,決定以第一階段對固態硬碟400降溫;當此數量等於此門檻值時,進入步驟S1340,決定以第二階段對固態硬碟400降溫;當此數量超過此門檻值時,進入步驟S1350,決定以第三階段對固態硬碟400降溫。
Next, in step S1320, the
以上述例子來說,中央處理器310計算此些當前溫度中連續超過70℃的當前溫度的數量為3,而門檻值為3,因此,進入步驟S1340,中央處理器310決定以第二階段對固態硬碟400降溫。
Taking the above example, the
在步驟S1340之後,進入步驟S1370,在第二階段降溫中,中央處理器310發出第二指令CMD2設定固態硬碟400
之電源狀態為一電源狀態PS1,並設定一主機控制熱管理的一第一溫度參數及一第二溫度參數。在一實施例中,設定的第一溫度參數及第二溫度參數低於廠商預設值,例如設定第一溫度參數為67℃及第二溫度參數為69℃,其皆低於廠商預設值82℃及84℃。以上述例子來說,在此步驟中,由於當前溫度中連續超過安全溫度的當前溫度的數量等於門檻值,中央處理器310判斷固態硬碟400有因為高溫而造成損壞的危險,因此透過設定固態硬碟400之電源狀態為電源狀態PS1並搭配設定一主機控制熱管理的一第一溫度參數及一第二溫度參數以有效的對固態硬碟400進行降溫。
After step S1340, proceed to step S1370. During the second stage of cooling, the
在步驟S1330之後,進入步驟S1360,在第一階段降溫中,中央處理器310判斷固態硬碟400是否閒置超過一時間,當固態硬碟400閒置超過此時間時,中央處理器310發出第二指令CMD2設定固態硬碟400之電源狀態為一電源狀態PS1。在一實施例中,此時間可為4分鐘,但不以此為限,可依照實際的情況調整。在此步驟中,由於當前溫度中連續超過安全溫度的當前溫度的數量未達到門檻值,中央處理器310判斷固態硬碟400並未有因為高溫而造成損壞的危險,因此,可使固態硬碟400處於電源狀態PS0,而不用降低效能。唯有當固態硬碟400閒置超過一時間時,代表固態硬碟400未在使用中,此時中央處理器310才發出第二指令CMD2設定固態硬碟400之電源狀態為電源狀態PS1,趁閒置期間降低效能,有效地減少固態硬碟400的當前溫
度。
After step S1330, proceed to step S1360. In the first stage of cooling, the
在步驟S1350之後,進入步驟S1380,在第三階段降溫中,中央處理器310發出第二指令CMD2設定固態硬碟400之電源狀態為一電源狀態PS2,並以一第二頻率發出第一指令CMD1,以使控制器410接收第一指令CMD1,依據第一指令CMD1回傳固態硬碟400之當前溫度至中央處理器310。在一實施例中,第二頻率高於第一頻率。在此步驟中,由於當前溫度中連續超過安全溫度的當前溫度的數量超過門檻值,中央處理器310判斷固態硬碟400有因為高溫而造成損壞的危險,因此,此時中央處理器310發出第二指令CMD2設定固態硬碟400之電源狀態為電源狀態PS2,並提高發出第一指令CMD1的頻率。因為電源狀態PS2屬於低效能,會嚴重影響使用者感受,所以透過更頻繁的獲得固態硬碟400的當前溫度,能夠在溫度回到正常值的時候將效能恢復。
After step S1350, proceed to step S1380. In the third stage of cooling, the
如此一來,電子裝置300可依據固態硬碟400的多個當前溫度判斷不同的使用情境,以進行三個階段的降溫,並依據不同的階段主動設定固態硬碟400的電源狀態以減少效能,來有效的達到降溫的目的。因此,相較於先前技術僅透過主機控制熱管理的兩個溫度參數對固態硬碟進行降溫的方式,本案所提出之方法更適用於多種使用情境,且可更有效率的降低固態硬碟400的溫度。 In this way, the electronic device 300 can determine different usage scenarios based on the multiple current temperatures of the solid state drive 400 to cool down in three stages, and automatically set the power state of the solid state drive 400 according to different stages to reduce performance. To effectively achieve the purpose of cooling down. Therefore, compared with the prior art that only uses the two temperature parameters of the host to control thermal management to cool the solid state drive, the method proposed in this case is more suitable for a variety of usage scenarios, and can reduce the solid state drive 400 more efficiently. temperature.
綜上所述,雖然本發明已以實施例揭露如上,然其 並非用以限定本發明。本發明所屬技術領域中具有通常知識者,在不脫離本發明之精神和範圍內,當可作各種之更動與潤飾。因此,本發明之保護範圍當視後附之申請專利範圍所界定者為準。 To sum up, although the present invention has been disclosed as above in embodiments, its It is not intended to limit the present invention. Those with ordinary knowledge in the technical field to which the present invention belongs can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the protection scope of the present invention shall be subject to those defined by the attached patent application scope.
S110,S120,S130:步驟 S110, S120, S130: steps
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Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4461187B1 (en) * | 2008-12-24 | 2010-05-12 | 株式会社東芝 | Nonvolatile semiconductor memory drive device, information processing device, and storage area management method in nonvolatile semiconductor memory drive device |
US20160004294A1 (en) * | 2013-03-14 | 2016-01-07 | Seagate Technology Llc | Device power control |
CN106909313A (en) * | 2015-12-22 | 2017-06-30 | 株式会社东芝 | Accumulator system and control method |
US20180046408A1 (en) * | 2016-08-09 | 2018-02-15 | Seagate Technology Llc | Active power management |
CN107894941A (en) * | 2017-11-14 | 2018-04-10 | 郑州云海信息技术有限公司 | A kind of SSD Working state monitoring devices and method |
CN108052292A (en) * | 2017-12-25 | 2018-05-18 | 成都信息工程大学 | A kind of high-temperature protection method of solid state disk |
US10078455B2 (en) * | 2016-01-20 | 2018-09-18 | Microsoft Technology Licensing, Llc | Predicting solid state drive reliability |
CN108573721A (en) * | 2017-03-13 | 2018-09-25 | 三星电子株式会社 | With temperature controlled storage system and its operating method |
TW201928688A (en) * | 2017-12-15 | 2019-07-16 | 宏碁股份有限公司 | Solid state disk |
-
2020
- 2020-08-03 TW TW109126244A patent/TWI746101B/en active
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4461187B1 (en) * | 2008-12-24 | 2010-05-12 | 株式会社東芝 | Nonvolatile semiconductor memory drive device, information processing device, and storage area management method in nonvolatile semiconductor memory drive device |
US20160004294A1 (en) * | 2013-03-14 | 2016-01-07 | Seagate Technology Llc | Device power control |
CN106909313A (en) * | 2015-12-22 | 2017-06-30 | 株式会社东芝 | Accumulator system and control method |
US10078455B2 (en) * | 2016-01-20 | 2018-09-18 | Microsoft Technology Licensing, Llc | Predicting solid state drive reliability |
US20180046408A1 (en) * | 2016-08-09 | 2018-02-15 | Seagate Technology Llc | Active power management |
CN108573721A (en) * | 2017-03-13 | 2018-09-25 | 三星电子株式会社 | With temperature controlled storage system and its operating method |
CN107894941A (en) * | 2017-11-14 | 2018-04-10 | 郑州云海信息技术有限公司 | A kind of SSD Working state monitoring devices and method |
TW201928688A (en) * | 2017-12-15 | 2019-07-16 | 宏碁股份有限公司 | Solid state disk |
CN108052292A (en) * | 2017-12-25 | 2018-05-18 | 成都信息工程大学 | A kind of high-temperature protection method of solid state disk |
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