TWI733257B - Substrate treating apparatus - Google Patents
Substrate treating apparatus Download PDFInfo
- Publication number
- TWI733257B TWI733257B TW108143060A TW108143060A TWI733257B TW I733257 B TWI733257 B TW I733257B TW 108143060 A TW108143060 A TW 108143060A TW 108143060 A TW108143060 A TW 108143060A TW I733257 B TWI733257 B TW I733257B
- Authority
- TW
- Taiwan
- Prior art keywords
- heat treatment
- frame
- substrate
- movable member
- processing apparatus
- Prior art date
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
Abstract
本發明之基板處理裝置1具備第1框架46、可動構件51a1、熱處理部37a1及搬送機構34a1。可動構件51a1受第1框架46支持。可動構件51a1可相對於第1框架46移動。熱處理部37a1受可動構件51a1支持。搬送機構34a1受可動構件51a1支持。藉由可動構件51a1相對於第1框架46移動,熱處理部37a1相對於第1框架46移動。藉由可動構件51a1相對於第1框架46移動,熱處理部37a1與搬送機構34a1一體地移動。 The substrate processing apparatus 1 of the present invention includes a first frame 46, a movable member 51a1, a heat treatment portion 37a1, and a conveying mechanism 34a1. The movable member 51a1 is supported by the first frame 46. The movable member 51a1 is movable relative to the first frame 46. The heat treatment portion 37a1 is supported by the movable member 51a1. The transport mechanism 34a1 is supported by the movable member 51a1. As the movable member 51a1 moves relative to the first frame 46, the heat treatment portion 37a1 moves relative to the first frame 46. As the movable member 51a1 moves with respect to the first frame 46, the heat treatment portion 37a1 and the conveying mechanism 34a1 move integrally.
Description
本發明係關於一種對基板進行處理之基板處理裝置。基板例如為半導體晶圓、液晶顯示器用基板、有機EL(Electroluminescence,電致發光)用基板、FPD(Flat Panel Display,平板顯示器)用基板、光顯示器用基板、磁碟用基板、光碟用基板、磁光碟用基板、光罩用基板及太陽電池用基板。 The present invention relates to a substrate processing device for processing substrates. The substrates are, for example, semiconductor wafers, substrates for liquid crystal displays, substrates for organic EL (Electroluminescence), substrates for FPD (Flat Panel Display), substrates for optical displays, substrates for magnetic disks, substrates for optical disks, Substrates for magneto-optical discs, substrates for photomasks, and substrates for solar cells.
專利文獻1揭示有一種基板處理裝置。以下,藉由劃括號來標記專利文獻1中所記載之符號。基板處理裝置(1)具備熱處理區塊(BA)。熱處理區塊(BA)具備搬送空間(AA)、主搬送機構(TAR)及主搬送機構(TAL)。主搬送機構(TAR)與主搬送機構(TAL)設置於搬送空間(AA)中。主搬送機構(TAR)與主搬送機構(TAL)分別搬送基板。熱處理區塊(BA)具備2個熱處理單元(HAR)及2個熱處理單元(HAL)。熱處理單元(HAR)配置於搬送空間(AA)之右方。熱處理單元(HAL)配置於搬送空間(AA)之左方。2個熱處理單元(HAR)以排列於上下方向之方式配置。2個熱處理單元(HAL)以排列於上下方向之方式配置。主搬送機構(TAR)進出熱處理單元(HAR)。主
搬送機構(TAL)進出熱處理單元(HAL)。
熱處理區塊(BA)進而具備框架(FA)。框架(FA)支持主搬送機構(TAR)、主搬送機構(TAL)、熱處理單元(HAR)及熱處理單元(HAL)。 The heat treatment block (BA) further has a frame (FA). The frame (FA) supports the main transport mechanism (TAR), the main transport mechanism (TAL), the heat treatment unit (HAR) and the heat treatment unit (HAL).
[專利文獻1] [Patent Document 1]
日本專利特開2017-41588號公報 Japanese Patent Laid-Open No. 2017-41588
要求能夠容易地進行基板處理裝置之維護。此處,維護例如意味著包含基板處理裝置之檢查、保養、調整、修理及修繕等。 It is required to be able to easily maintain the substrate processing equipment. Here, maintenance means, for example, including inspection, maintenance, adjustment, repair, and repair of the substrate processing apparatus.
另一方面,為了提高基板處理裝置之處理量,有時會增加設置於基板處理裝置之要素(例如熱處理單元或搬送機構)之數量。設置於基板處理裝置之要素之數量越多,則基板處理裝置之維護性越重要。或者,為了提高基板處理裝置之處理量,有時會提高設置於基板處理裝置之要素之密度。設置於基板處理裝置之要素之密度越高,則基板處理裝置之維護性越重要。 On the other hand, in order to increase the throughput of the substrate processing apparatus, the number of elements (such as a heat treatment unit or a transport mechanism) provided in the substrate processing apparatus may be increased. The greater the number of elements provided in the substrate processing device, the more important the maintenance of the substrate processing device. Or, in order to increase the throughput of the substrate processing apparatus, the density of the elements provided in the substrate processing apparatus may be increased. The higher the density of the elements installed in the substrate processing device, the more important the maintenance of the substrate processing device.
本發明係鑒於此種情況而完成者,其目的在於提供一種能夠容易地 進行基板處理裝置之維護之基板處理裝置。 The present invention was completed in view of this situation, and its purpose is to provide a method that can easily Substrate processing equipment for maintenance of substrate processing equipment.
本發明為了達成此種目的,採用如下構成。即,本發明係一種基板處理裝置,其具備:第1框架;第1可動構件,其受上述第1框架支持,且可相對於上述第1框架移動;第1熱處理部,其受上述第1可動構件支持,對基板進行熱處理;及第1搬送機構,其受上述第1可動構件支持,向上述第1熱處理部搬送基板;且藉由上述第1可動構件相對於上述第1框架移動,上述第1熱處理部與上述第1搬送機構一體地相對於上述第1框架移動。 In order to achieve such an object, the present invention adopts the following configuration. That is, the present invention is a substrate processing apparatus that includes: a first frame; a first movable member supported by the first frame and movable relative to the first frame; and a first heat treatment section that is supported by the first frame. Supported by a movable member to heat the substrate; and a first transport mechanism, which is supported by the first movable member and transports the substrate to the first heat treatment section; and by the first movable member moving relative to the first frame, the The first heat treatment unit moves relative to the first frame integrally with the first conveying mechanism.
第1可動構件受第1框架支持。第1熱處理部受第1可動構件支持。第1可動構件可相對於第1框架移動。藉由第1可動構件相對於第1框架移動,第1熱處理部相對於第1框架移動。因此,能夠容易地進行第1熱處理部之維護。此處,維護例如意味著包含第1熱處理部之檢查、保養、調整、修理及修繕等。 The first movable member is supported by the first frame. The first heat treatment part is supported by the first movable member. The first movable member can move relative to the first frame. As the first movable member moves relative to the first frame, the first heat treatment portion moves relative to the first frame. Therefore, the maintenance of the first heat treatment section can be easily performed. Here, maintenance means, for example, including inspection, maintenance, adjustment, repair, and repair of the first heat treatment section.
第1搬送機構受第1可動構件支持。藉由第1可動構件相對於第1框架移動,第1熱處理部與第1搬送機構一體地移動。因此,能夠於第1可動構件相對於第1框架移動時,將第1熱處理部與第1搬送機構之相對位置保持為固定。因此,能夠於將第1熱處理部與第1搬送機構之相對位置保持為固定之狀態下,進行第1熱處理部之維護。因此,無需於每次進行第1熱處理部之維護時,調整第1熱處理部與第1搬送機構之相對位置。即,能夠更容 易地進行第1熱處理部之維護。 The first transport mechanism is supported by the first movable member. As the first movable member moves with respect to the first frame, the first heat treatment unit and the first conveying mechanism move integrally. Therefore, when the first movable member moves with respect to the first frame, the relative position of the first heat treatment portion and the first conveying mechanism can be kept fixed. Therefore, the maintenance of the first heat treatment part can be performed while keeping the relative position of the first heat treatment part and the first conveying mechanism in a fixed state. Therefore, there is no need to adjust the relative position of the first heat treatment part and the first conveying mechanism every time the maintenance of the first heat treatment part is performed. That is, it can be more The maintenance of the first heat treatment department is carried out in a remote location.
如上所述,根據本基板處理裝置,能夠容易地進行基板處理裝置之維護。 As described above, according to this substrate processing apparatus, the maintenance of the substrate processing apparatus can be easily performed.
於上述基板處理裝置中,較佳為藉由上述第1可動構件相對於上述第1框架移動,上述第1熱處理部相對於上述第1框架於水平方向上移動。第1熱處理部可不與其他構件干涉地相對於第1框架移動。 In the substrate processing apparatus, it is preferable that the first movable member moves relative to the first frame, and the first heat treatment section moves in a horizontal direction relative to the first frame. The first heat treatment part can move relative to the first frame without interfering with other members.
於上述基板處理裝置中,較佳為藉由上述第1可動構件相對於上述第1框架移動,上述第1熱處理部可移動至上述第1熱處理部之至少一部分位於上述第1框架之外部之第1維護位置。藉由第1可動構件相對於第1框架移動,第1熱處理部可移動至第1維護位置。於第1熱處理部處於第1維護位置時,第1熱處理部之至少一部分位於第1框架之外部。因此,可容易地使第1熱處理部移動至第1維護位置。於第1熱處理部處於第1維護位置時,第1熱處理部之至少一部分位於第1框架之外部。因此,於第1熱處理部處於第1維護位置時,能夠容易地進行第1熱處理部之維護。 In the substrate processing apparatus, it is preferable that the first movable member moves relative to the first frame, and the first heat treatment section can be moved to the first heat treatment section where at least a part of the first heat treatment section is located outside the first frame. 1Maintenance position. By the movement of the first movable member with respect to the first frame, the first heat treatment part can be moved to the first maintenance position. When the first heat treatment part is in the first maintenance position, at least a part of the first heat treatment part is located outside the first frame. Therefore, the first heat treatment section can be easily moved to the first maintenance position. When the first heat treatment part is in the first maintenance position, at least a part of the first heat treatment part is located outside the first frame. Therefore, when the first heat treatment part is at the first maintenance position, the maintenance of the first heat treatment part can be easily performed.
於上述基板處理裝置中,較佳為於上述第1熱處理部處於上述第1維護位置時,上述第1可動構件受上述第1框架支持。於第1熱處理部處於第1維護位置時,第1熱處理部經由第1可動構件受第1框架支持。因此,能夠更容易地進行第1熱處理部之維護。 In the substrate processing apparatus, it is preferable that the first movable member is supported by the first frame when the first heat treatment section is in the first maintenance position. When the first heat treatment part is in the first maintenance position, the first heat treatment part is supported by the first frame via the first movable member. Therefore, the maintenance of the first heat treatment part can be performed more easily.
於上述基板處理裝置中,較佳為藉由上述第1可動構件相對於上述第1框架移動,上述第1熱處理部可移動至用以供上述第1熱處理部對基板進行熱處理之第1處理位置。據此,可容易地使第1熱處理部移動至第1處理位置。因此,可容易地使第1熱處理部於第1維護位置與第1處理位置之間移動。如上所述,藉由第1可動構件相對於第1框架移動,第1熱處理部與第1搬送機構一體地移動。因此,於第1可動構件移動至第1處理位置時,亦可將第1熱處理部與第1搬送機構之相對位置保持為固定。總而言之,於將第1熱處理部與第1搬送機構之相對位置保持為固定之狀態下,可容易地使第1熱處理部於第1維護位置與第1處理位置之間移動。 In the substrate processing apparatus, it is preferable that the first movable member moves relative to the first frame, and the first heat treatment section can be moved to a first processing position for the first heat treatment section to heat the substrate. . According to this, the first heat treatment section can be easily moved to the first treatment position. Therefore, the first heat treatment section can be easily moved between the first maintenance position and the first treatment position. As described above, by the movement of the first movable member with respect to the first frame, the first heat treatment unit and the first conveying mechanism move integrally. Therefore, when the first movable member is moved to the first processing position, the relative position of the first heat treatment portion and the first conveying mechanism may be kept fixed. In short, in a state where the relative position of the first heat treatment part and the first conveying mechanism is kept fixed, the first heat treatment part can be easily moved between the first maintenance position and the first treatment position.
於上述基板處理裝置中,較佳為上述第1熱處理部處於上述第1維護位置時位於上述第1框架之外部之上述第1熱處理部之部分,大於上述第1熱處理部處於上述第1處理位置時位於上述第1框架之外部之上述第1熱處理部之部分。於第1熱處理部處於第1維護位置時,能夠容易地進行第1熱處理部之維護。於第1熱處理部處於第1處理位置時,第1熱處理部能夠適當地對基板進行熱處理。 In the substrate processing apparatus, it is preferable that a portion of the first heat treatment part located outside the first frame when the first heat treatment part is at the first maintenance position is larger than the part of the first heat treatment part at the first treatment position The part of the first heat-treated part located outside the first frame. When the first heat treatment part is in the first maintenance position, the maintenance of the first heat treatment part can be easily performed. When the first heat treatment part is at the first treatment position, the first heat treatment part can appropriately heat-treat the substrate.
於上述基板處理裝置中,較佳為於上述第1熱處理部處於上述第1處理位置時,上述第1熱處理部全部位於上述第1框架之內部。於第1熱處理部處於第1處理位置時,第1熱處理部能夠進一步適當地對基板進行熱處理。 In the substrate processing apparatus, it is preferable that when the first heat treatment part is at the first treatment position, all the first heat treatment parts are located inside the first frame. When the first heat treatment part is at the first treatment position, the first heat treatment part can further appropriately heat-treat the substrate.
於上述基板處理裝置中,較佳為上述第1熱處理部處於上述第1處理 位置時,上述第1可動構件受上述第1框架支持。於第1熱處理部處於第1處理位置時,第1熱處理部經由第1可動構件受第1框架支持。因此,第1熱處理部能夠進一步適當地對基板進行熱處理。 In the substrate processing apparatus, it is preferable that the first heat treatment section is in the first treatment In the position, the first movable member is supported by the first frame. When the first heat treatment part is at the first treatment position, the first heat treatment part is supported by the first frame via the first movable member. Therefore, the first heat treatment section can further appropriately heat the substrate.
於上述基板處理裝置中,較佳為上述第1搬送機構具備:第1導軌部,其固定於上述第1可動構件,且於水平方向上延伸;第1水平移動部,其受上述第1導軌部支持,且可相對於上述第1導軌部於水平方向移動;第1臂部,其受上述第1水平移動部支持,且可相對於上述第1水平移動部繞第1軸線旋轉;及第1保持部,其固定於上述第1臂部,且保持基板;且上述第1軸線與上下方向平行,於俯視下,上述第1軸線相對於上述第1水平移動部之相對位置為固定,於俯視下,上述第1保持部與上述第1軸線之距離為固定。 In the substrate processing apparatus, it is preferable that the first transport mechanism includes: a first rail portion fixed to the first movable member and extending in a horizontal direction; and a first horizontal moving portion supported by the first rail Part supported and movable in a horizontal direction relative to the first rail part; a first arm part supported by the first horizontal moving part and rotatable about a first axis relative to the first horizontal moving part; and 1 holding portion, which is fixed to the first arm portion and holds the substrate; and the first axis is parallel to the vertical direction, and when viewed from above, the relative position of the first axis with respect to the first horizontal moving portion is fixed, and In a plan view, the distance between the first holding portion and the first axis is constant.
第1搬送機構具備第1導軌部、第1水平移動部、第1臂部及第1保持部。第1導軌部固定於第1可動構件。第1水平移動部受第1導軌部支持。第1臂部受第1水平移動部支持。第1保持部固定於第1臂部。如此,第1導軌部、第1水平移動部、第1臂部及第1保持部直接或間接地受第1可動構件支持。因此,第1可動構件能夠良好地支持第1搬送機構。 The first transport mechanism includes a first rail portion, a first horizontal movement portion, a first arm portion, and a first holding portion. The first rail part is fixed to the first movable member. The first horizontal moving part is supported by the first rail part. The first arm is supported by the first horizontal moving part. The first holding portion is fixed to the first arm portion. In this way, the first rail portion, the first horizontal moving portion, the first arm portion, and the first holding portion are directly or indirectly supported by the first movable member. Therefore, the first movable member can support the first transport mechanism well.
第1水平移動部可相對於第1導軌部於水平方向上移動。因此,第1保持部可相對於第1導軌部於水平方向上移動。第1臂部可相對於第1水平移動部繞第1軸線旋轉。因此,第1保持部可相對於第1水平移動部繞第1軸線旋轉。因此,第1保持部能夠良好地進出第1熱處理部。 The first horizontal moving part can move in the horizontal direction with respect to the first rail part. Therefore, the first holding portion can move in the horizontal direction with respect to the first rail portion. The first arm portion is rotatable about the first axis with respect to the first horizontal moving portion. Therefore, the first holding portion can rotate about the first axis with respect to the first horizontal moving portion. Therefore, the first holding portion can enter and exit the first heat treatment portion well.
於俯視下,第1軸線相對於第1水平移動部之相對位置為固定。因此,第1臂部受第1水平移動部支持之構造簡單。第1保持部固定於第1臂部。進而,於俯視下,第1保持部與第1軸線之距離為固定。因此,第1保持部受第1臂部支持之構造簡單。如此,第1搬送機構構造簡單。因此,能夠有效地減小俯視下之第1搬送機構之設置空間。 In a plan view, the relative position of the first axis with respect to the first horizontal moving part is fixed. Therefore, the structure in which the first arm portion is supported by the first horizontal moving portion is simple. The first holding portion is fixed to the first arm portion. Furthermore, in a plan view, the distance between the first holding portion and the first axis is constant. Therefore, the structure in which the first holding portion is supported by the first arm portion is simple. In this way, the structure of the first transport mechanism is simple. Therefore, the installation space of the first transport mechanism in a plan view can be effectively reduced.
於上述基板處理裝置中,較佳為上述第1搬送機構具備第1垂直移動部,該第1垂直移動部受上述第1水平移動部支持,且可相對於上述第1水平移動部於上下方向移動,上述第1臂部經由上述第1垂直移動部受上述第1水平移動部支持。藉由第1垂直移動部相對於第1水平移動部於上下方向移動,第1臂部及第1保持部相對於第1水平移動部於上下方向移動。因此,第1保持部能夠進一步良好地進出第1熱處理部。 In the substrate processing apparatus, it is preferable that the first conveying mechanism includes a first vertical moving part supported by the first horizontal moving part and capable of moving up and down relative to the first horizontal moving part. When moving, the first arm part is supported by the first horizontal moving part via the first vertical moving part. As the first vertical moving part moves in the vertical direction relative to the first horizontal moving part, the first arm part and the first holding part move in the vertical direction relative to the first horizontal moving part. Therefore, the first holding portion can enter and exit the first heat treatment portion more satisfactorily.
於上述基板處理裝置中,較佳為上述基板處理裝置具備:第2框架,其與上述第1框架連結;第2可動構件,其受上述第2框架支持,且可相對於上述第2框架移動;第2熱處理部,其受上述第2可動構件支持,對基板進行熱處理;及第2搬送機構,其受上述第2可動構件支持,向上述第2熱處理部搬送基板;且藉由上述第2可動構件相對於上述第2框架移動,上述第2熱處理部與上述第2搬送機構一體地相對於上述第2框架移動。 In the substrate processing apparatus, it is preferable that the substrate processing apparatus includes: a second frame connected to the first frame; and a second movable member supported by the second frame and movable relative to the second frame ; A second heat treatment section, which is supported by the second movable member, heat-treating the substrate; and a second transport mechanism, which is supported by the second movable member, and transports the substrate to the second heat treatment section; and by the second The movable member moves relative to the second frame, and the second heat treatment unit moves relative to the second frame integrally with the second conveying mechanism.
第2可動構件受第2框架支持。第2熱處理部受第2可動構件支持。第2可動構件可相對於第2框架移動。藉由第2可動構件相對於第2框架移動, 第2熱處理部相對於第2框架移動。因此,能夠容易地進行第2熱處理部之維護。 The second movable member is supported by the second frame. The second heat treatment part is supported by the second movable member. The second movable member can move relative to the second frame. By moving the second movable member relative to the second frame, The second heat treatment part moves with respect to the second frame. Therefore, the maintenance of the second heat treatment section can be easily performed.
第2搬送機構受第2可動構件支持。藉由第2可動構件相對於第2框架移動,第2熱處理部與第2搬送機構一體地移動。因此,於第2可動構件相對於第2框架移動時,可將第2熱處理部與第2搬送機構之相對位置保持為固定。因此,可於將第2熱處理部與第2搬送機構之相對位置保持為固定之狀態下,進行第2熱處理部之維護。因此,無需於每次進行第2熱處理部之維護,調整第2熱處理部與第2搬送機構之相對位置。即,能夠進一步容易地進行第2熱處理部之維護。 The second transport mechanism is supported by the second movable member. As the second movable member moves with respect to the second frame, the second heat treatment unit and the second conveying mechanism move integrally. Therefore, when the second movable member moves with respect to the second frame, the relative position of the second heat treatment part and the second conveying mechanism can be kept fixed. Therefore, the maintenance of the second heat treatment part can be performed while keeping the relative position of the second heat treatment part and the second conveying mechanism in a fixed state. Therefore, it is not necessary to perform maintenance of the second heat treatment part every time, and adjust the relative position of the second heat treatment part and the second conveying mechanism. That is, the maintenance of the second heat treatment part can be performed more easily.
如上所述,根據本基板處理裝置,能夠進一步容易地進行基板處理裝置之維護。 As described above, according to this substrate processing apparatus, the maintenance of the substrate processing apparatus can be further easily performed.
進而,基板處理裝置除具備第1熱處理部以外,還具備第2熱處理部。因此,能夠良好地提高基板處理裝置之處理量。 Furthermore, the substrate processing apparatus includes a second heat treatment unit in addition to the first heat treatment unit. Therefore, the throughput of the substrate processing apparatus can be improved well.
於上述基板處理裝置中,較佳為上述第2框架配置於與上述第1框架相同之高度位置,上述第1搬送機構配置於上述第1熱處理部與上述第2框架之間,上述第2搬送機構配置於上述第2熱處理部與上述第1框架之間。換言之,第1框架與第2框架以排列於水平方向之方式配置。第1熱處理部、第1搬送機構、第2搬送機構及第2熱處理部以依序排列之方式配置。藉此,能夠高效率地設置第1、第2熱處理部與第1、第2搬送機構。 In the substrate processing apparatus, it is preferable that the second frame is arranged at the same height position as the first frame, the first conveying mechanism is arranged between the first heat treatment section and the second frame, and the second conveying The mechanism is arranged between the second heat treatment section and the first frame. In other words, the first frame and the second frame are arranged in a horizontal direction. The first heat treatment part, the first conveying mechanism, the second conveying mechanism, and the second heat treatment part are arranged in order. Thereby, the 1st, 2nd heat processing part and the 1st, 2nd conveyance mechanism can be installed efficiently.
於上述基板處理裝置中,較佳為將自上述第2框架朝向上述第1框架之方向設為第1方向,將與上述第1方向相反之方向設為第2方向,藉由上述第1可動構件相對於上述第1框架移動,上述第1熱處理部可相對於上述第1框架朝上述第1方向移動,藉由上述第2可動構件相對於上述第2框架移動,上述第2熱處理部可相對於上述第2框架朝上述第2方向移動。於第1熱處理部相對於第1框架朝第1方向移動時,第1熱處理部遠離第2框架。因此,第1熱處理部可不與第2框架干涉地移動。於第2熱處理部相對於第2框架朝第2方向移動時,第2熱處理部遠離第1框架。因此,第2熱處理部可不與第1框架干涉地移動。 In the substrate processing apparatus, it is preferable that the direction from the second frame to the first frame is set as the first direction, and the direction opposite to the first direction is set as the second direction, and the first movable The member moves relative to the first frame, the first heat-treated portion can move in the first direction relative to the first frame, and the second movable member moves relative to the second frame, and the second heat-treated portion can be moved relative to the second frame. Move in the second direction on the second frame. When the first heat treatment part moves in the first direction with respect to the first frame, the first heat treatment part is away from the second frame. Therefore, the first heat treatment portion can move without interfering with the second frame. When the second heat treatment part moves in the second direction with respect to the second frame, the second heat treatment part is away from the first frame. Therefore, the second heat treatment part can move without interfering with the first frame.
於上述基板處理裝置中,較佳為藉由上述第1可動構件相對於上述第1框架移動,上述第1可動構件可將上述第1熱處理部之至少一部分自上述第1框架朝上述第1方向拉出,藉由上述第2可動構件相對於上述第2框架移動,上述第2可動構件可將上述第2熱處理部之至少一部分自上述第2框架朝上述第2方向拉出。藉由第1可動構件相對於第1框架移動,可將第1熱處理部之至少一部分自第1框架朝第1方向拉出。因此,能夠容易地進行第1熱處理部之維護。同樣地,藉由第2可動構件相對於第2框架移動,可將第2熱處理部之至少一部分自第2框架朝第2方向拉出。因此,能夠容易地進行第2熱處理部之維護。 In the substrate processing apparatus, it is preferable that the first movable member moves relative to the first frame, and the first movable member can move at least a part of the first heat treatment portion from the first frame toward the first direction When the second movable member moves relative to the second frame, the second movable member can pull at least a part of the second heat treatment portion from the second frame in the second direction. By moving the first movable member with respect to the first frame, at least a part of the first heat treatment portion can be pulled out from the first frame in the first direction. Therefore, the maintenance of the first heat treatment section can be easily performed. Similarly, by moving the second movable member relative to the second frame, at least a part of the second heat treatment portion can be pulled out from the second frame in the second direction. Therefore, the maintenance of the second heat treatment section can be easily performed.
於上述基板處理裝置中,較佳為上述第2框架具有與上述第1框架相同之形狀。能夠容易地製造第1框架與第2框架。因此,能夠容易地製造基 板處理裝置。 In the substrate processing apparatus, it is preferable that the second frame has the same shape as the first frame. The first frame and the second frame can be easily manufactured. Therefore, the base can be easily manufactured 板处理装置。 Plate processing device.
於上述基板處理裝置中,較佳為上述第2框架可與上述第1框架分離。據此,能夠容易地製造基板處理裝置。 In the substrate processing apparatus, it is preferable that the second frame is separable from the first frame. According to this, the substrate processing apparatus can be easily manufactured.
例如,可將基板處理裝置之製造分為以下之第1、第2、第3作業。 For example, the manufacturing of the substrate processing apparatus can be divided into the following first, second, and third operations.
‧將第1可動構件、第1熱處理部及第1搬送機構安裝於第1框架之第1作業 ‧The first task of installing the first movable member, the first heat treatment part and the first conveying mechanism on the first frame
‧將第2可動構件、第2熱處理部及第2搬送機構安裝於第2框架之第2作業 ‧The second task of installing the second movable member, the second heat treatment part and the second conveying mechanism on the second frame
‧連結第1框架與第2框架之第3作業 ‧The third task of connecting the first frame and the second frame
此處,可分別於不同場所及不同時刻進行第1作業、第2作業及第3作業。因此,能夠容易地製造基板處理裝置。 Here, the first task, the second task, and the third task can be performed in different places and at different times. Therefore, the substrate processing apparatus can be easily manufactured.
於上述基板處理裝置中,較佳為上述第2搬送機構配置於與上述第1搬送機構左右對稱之位置,上述第2熱處理部配置於與上述第1熱處理部左右對稱之位置。第1搬送機構及第1熱處理部之配置與第2搬送機構及第2熱處理部之配置左右對稱。因此,能夠進一步容易地執行基板處理裝置之設計及製造。 In the substrate processing apparatus, it is preferable that the second conveying mechanism is arranged at a position symmetrical with the first conveying mechanism, and the second heat treatment section is arranged at a position symmetrical with the first heat treatment section. The arrangement of the first conveying mechanism and the first heat treatment part is symmetrical to the arrangement of the second conveying mechanism and the second heat treatment part. Therefore, the design and manufacture of the substrate processing apparatus can be performed more easily.
於上述基板處理裝置中,較佳為上述基板處理裝置具備:第3可動構件,其受上述第1框架支持,且可相對於上述第1框架移動;第3熱處理部,其受上述第3可動構件支持,對基板進行熱處理;及第3搬送機構,其 受上述第3可動構件支持,向上述第3熱處理部搬送基板;且上述第3可動構件可與上述第1可動構件獨立地相對於上述第1框架移動,藉由上述第3可動構件相對於上述第1框架移動,上述第3熱處理部與上述第3搬送機構一體地相對於上述第1框架移動。 In the above-mentioned substrate processing apparatus, it is preferable that the above-mentioned substrate processing apparatus includes: a third movable member supported by the first frame and movable relative to the first frame; and a third heat treatment section that is supported by the third movable member. Component support, heat treatment of the substrate; and the third conveying mechanism, which Supported by the third movable member, the substrate is conveyed to the third heat treatment section; and the third movable member is movable relative to the first frame independently of the first movable member, and the third movable member is relative to the The first frame moves, and the third heat treatment unit moves relative to the first frame integrally with the third conveying mechanism.
第3可動構件受第1框架支持。第3熱處理部受第3可動構件支持。第3可動構件可相對於第1框架移動。藉由第3可動構件相對於第1框架移動,第3熱處理部相對於第1框架移動。因此,能夠容易地進行第3熱處理部之維護。 The third movable member is supported by the first frame. The third heat treatment part is supported by the third movable member. The third movable member can move relative to the first frame. As the third movable member moves relative to the first frame, the third heat treatment portion moves relative to the first frame. Therefore, the maintenance of the third heat treatment section can be easily performed.
第3搬送機構受第3可動構件支持。藉由第3可動構件相對於第1框架移動,第3熱處理部與第3搬送機構一體地移動。因此,於第3可動構件相對於第1框架移動時,可將第3熱處理部與第3搬送機構之相對位置保持為固定。因此,可於將第3熱處理部與第3搬送機構之相對位置保持為固定之狀態下,進行第3熱處理部之維護。因此,無需於每次進行第3熱處理部之維護時,調整第3熱處理部與第3搬送機構之相對位置。即,能夠更容易地進行第3熱處理部之維護。 The third conveying mechanism is supported by the third movable member. As the third movable member moves with respect to the first frame, the third heat treatment unit and the third conveying mechanism move integrally. Therefore, when the third movable member moves with respect to the first frame, the relative position of the third heat treatment part and the third conveying mechanism can be kept fixed. Therefore, the maintenance of the third heat treatment part can be performed while keeping the relative position of the third heat treatment part and the third conveying mechanism in a fixed state. Therefore, it is not necessary to adjust the relative position of the third heat treatment part and the third conveying mechanism every time the maintenance of the third heat treatment part is performed. That is, the maintenance of the third heat treatment part can be performed more easily.
如上所述,根據本基板處理裝置,能夠容易地進行基板處理裝置之維護。 As described above, according to this substrate processing apparatus, the maintenance of the substrate processing apparatus can be easily performed.
進而,第3可動構件可與第1可動構件獨立地相對於第1框架移動。因此,可使第1熱處理部與第3熱處理部個別地移動。因此,例如,能夠容易 地進行第1熱處理部及第3熱處理部之僅一者之維護。或者,能夠容易地進行第1熱處理部及第3熱處理部之兩者之維護。 Furthermore, the third movable member can move relative to the first frame independently of the first movable member. Therefore, the first heat treatment part and the third heat treatment part can be moved separately. So, for example, it can easily Perform maintenance of only one of the first heat treatment section and the third heat treatment section. Alternatively, it is possible to easily perform maintenance of both the first heat treatment part and the third heat treatment part.
進而,基板處理裝置除具備第1熱處理部以外,還具備第3熱處理部。因此,能夠良好地提高基板處理裝置之處理量。 Furthermore, the substrate processing apparatus includes a third heat treatment unit in addition to the first heat treatment unit. Therefore, the throughput of the substrate processing apparatus can be improved well.
於上述基板處理裝置中,較佳為上述第3熱處理部配置於上述第1熱處理部之上方,上述第3搬送機構配置於上述第1搬送機構之上方。可減小俯視下之第1熱處理部與第3熱處理部之設置空間。可減小俯視下之第1搬送機構與第3搬送機構之設置空間。因此,可減小基板處理裝置之佔據面積。 In the substrate processing apparatus, it is preferable that the third heat treatment section is disposed above the first heat treatment section, and the third conveyance mechanism is disposed above the first conveyance mechanism. The installation space of the first heat treatment part and the third heat treatment part in the plan view can be reduced. It can reduce the installation space of the first conveying mechanism and the third conveying mechanism in the top view. Therefore, the area occupied by the substrate processing apparatus can be reduced.
於上述基板處理裝置中,較佳為上述基板處理裝置具備:引導部,其固定於上述第1框架;及滑動部,其固定於上述第1可動構件,且由上述引導部導引。由於基板處理裝置具備引導部及滑動部,故而第1可動構件可相對於第1框架良好地移動。 In the substrate processing apparatus, it is preferable that the substrate processing apparatus includes a guide part fixed to the first frame; and a sliding part fixed to the first movable member and guided by the guide part. Since the substrate processing apparatus includes the guide portion and the sliding portion, the first movable member can move well with respect to the first frame.
根據本發明,能夠容易地進行基板處理裝置之維護。 According to the present invention, the maintenance of the substrate processing apparatus can be easily performed.
1:基板處理裝置 1: Substrate processing equipment
11:儲存部 11: Storage Department
13:架板 13: shelf board
15:載具搬送機構 15: Vehicle transport mechanism
16a:導軌部 16a: Rail part
16b:水平移動部 16b: Horizontal moving part
16c:垂直移動部 16c: Vertical movement part
16d:第1臂部 16d: 1st arm
16e:第2臂部 16e: 2nd arm
16f:保持部 16f: Holding part
16g:垂直移動部 16g: Vertical moving part
16h:第1臂部 16h: 1st arm
16i:第2臂部 16i: 2nd arm
16j:保持部 16j: holding part
21:移載傳送部 21: Transfer and transfer department
22a:載具載置部 22a: Vehicle loading department
22a1:載具載置部 22a1: Vehicle loading section
22a2:載具載置部 22a2: Vehicle loading section
22b:載具載置部 22b: Vehicle loading section
22b1:載具載置部 22b1: Vehicle loading section
22b2:載具載置部 22b2: Vehicle loading section
23:搬送空間 23: Transport space
24:框架 24: Frame
25:移載傳送用搬送機構 25: Conveying mechanism for transfer and transfer
26a:搬送機構 26a: Transport mechanism
26b:搬送機構 26b: Transport mechanism
27a:支柱 27a: Pillar
27b:垂直移動部 27b: Vertical movement part
27c:旋轉部 27c: Rotating part
27d、27e:保持部 27d, 27e: holding part
31:熱處理區塊 31: Heat treatment block
32:搬送空間 32: Transport space
33:熱處理用搬送機構 33: Conveying mechanism for heat treatment
34a1:搬送機構(第1搬送機構) 34a1: Transport mechanism (1st transport mechanism)
34a2:搬送機構(第3搬送機構) 34a2: Transport mechanism (3rd transport mechanism)
34a3:搬送機構 34a3: Transport mechanism
34a4:搬送機構 34a4: Transport mechanism
34b1:搬送機構(第2搬送機構) 34b1: Transport mechanism (2nd transport mechanism)
34b2:搬送機構(第4搬送機構) 34b2: Transport mechanism (4th transport mechanism)
34b3:搬送機構 34b3: Transport mechanism
34b4:搬送機構 34b4: Transport mechanism
35a:導軌部(第1導軌部、第2導軌部) 35a: Rail part (1st rail part, 2nd rail part)
35b:水平移動部(第1水平移動部、第2水平移動部) 35b: Horizontal moving part (1st horizontal moving part, 2nd horizontal moving part)
35c:垂直移動部(第1垂直移動部、第2垂直移動部) 35c: Vertical movement part (1st vertical movement part, 2nd vertical movement part)
35d:臂部(第1臂部、第2臂部) 35d: Arm (1st arm, 2nd arm)
35e:保持部(第1保持部、第2保持部) 35e: holding part (first holding part, second holding part)
35f:臂部(第1臂部、第2臂部) 35f: Arm (1st arm, 2nd arm)
35g:保持部(第1保持部、第2保持部) 35g: holding part (first holding part, second holding part)
37a1:熱處理部(第1熱處理部) 37a1: Heat treatment section (1st heat treatment section)
37a2:熱處理部(第3熱處理部) 37a2: Heat treatment section (3rd heat treatment section)
37a3:熱處理部 37a3: Heat treatment department
37a4:熱處理部 37a4: Heat treatment department
37b1:熱處理部(第2熱處理部) 37b1: Heat treatment section (Second heat treatment section)
37b2:熱處理部(第4熱處理部) 37b2: Heat treatment section (4th heat treatment section)
37b3:熱處理部 37b3: Heat treatment department
37b4:熱處理部 37b4: Heat treatment department
38a1:熱處理單元(第1熱處理單元) 38a1: Heat treatment unit (1st heat treatment unit)
38a2:熱處理單元(第3熱處理單元) 38a2: Heat treatment unit (3rd heat treatment unit)
38a3:熱處理單元 38a3: heat treatment unit
38a4:熱處理單元 38a4: heat treatment unit
38b1:熱處理單元(第2熱處理單元) 38b1: Heat treatment unit (2nd heat treatment unit)
38b2:熱處理單元(第4熱處理單元) 38b2: Heat treatment unit (4th heat treatment unit)
38b3:熱處理單元 38b3: Heat treatment unit
38b4:熱處理單元 38b4: Heat treatment unit
39a:第1平板 39a: the first plate
39b:第2平板 39b: 2nd plate
41a1:檢查部 41a1: Inspection Department
41a2:檢查部 41a2: Inspection Department
41a3:檢查部 41a3: Inspection Department
41a4:檢查部 41a4: Inspection Department
41b1:檢查部 41b1: Inspection Department
41b2:檢查部 41b2: Inspection Department
41b3:檢查部 41b3: Inspection Department
41b4:檢查部 41b4: Inspection Department
42a1:檢查單元 42a1: Inspection unit
42a2-42a4:檢查單元 42a2-42a4: Inspection unit
42b1-42b4:檢查單元 42b1-42b4: Inspection unit
43a:平板 43a: Tablet
43b:攝像部 43b: Camera Department
45:框架 45: Frame
46:第1框架
46:
47:第2框架
47:
48a:基座部 48a: Base
48b:支柱 48b: Pillar
48c:桿 48c: Rod
48d:空間(第1框架/第2框架之內部) 48d: Space (the interior of the 1st frame/the 2nd frame)
51a1:可動構件(第1可動構件) 51a1: movable member (the first movable member)
51a2:可動構件(第3可動構件) 51a2: movable member (third movable member)
51a3:可動構件 51a3: movable member
51a4:可動構件 51a4: movable member
51b1:可動構件(第2可動構件) 51b1: Movable member (2nd movable member)
51b2:可動構件(第4可動構件) 51b2: movable member (4th movable member)
51b3:可動構件 51b3: movable member
51b4:可動構件 51b4: movable member
52a:底板 52a: bottom plate
52b:支柱 52b: Pillar
52c:擱板 52c: shelf
52d:壁部 52d: Wall
52e:槽 52e: Slot
52f:頂板 52f: top plate
55:引導部 55: Guidance
56:滑動部 56: Sliding part
57a1:電氣裝置部 57a1: Electrical Equipment Department
57a2-57a4:電氣裝置部 57a2-57a4: Electrical Equipment Department
57b1-57b4:電氣裝置部 57b1-57b4: Electrical Equipment Department
61:液體處理區塊 61: Liquid processing block
62:框架 62: Frame
63:搬送空間 63: Transport space
64a:搬送空間 64a: Transport space
64b:搬送空間 64b: Transport space
65:間隔壁 65: next wall
67:液體處理用搬送機構 67: Conveying mechanism for liquid handling
68a:搬送機構 68a: Transport mechanism
68b:搬送機構 68b: Transport mechanism
69a:支柱 69a: Pillar
69b:支柱 69b: Pillar
69c:垂直移動部 69c: Vertical movement part
69d:水平移動部 69d: Horizontal moving part
69e:旋轉部 69e: Rotating part
69f:保持部 69f: holding part
69g:保持部 69g: holding part
71:液體處理部 71: Liquid Handling Department
72:液體處理部 72: Liquid Handling Department
72L:液體處理部 72L: Liquid Handling Department
72R:液體處理部 72R: Liquid Handling Department
73:液體處理部 73: Liquid Handling Department
73L:液體處理部 73L: Liquid Handling Department
73R:液體處理部 73R: Liquid Handling Department
74:液體處理單元 74: Liquid handling unit
75a:旋轉保持部 75a: Rotation holding part
75b:噴嘴 75b: nozzle
75c:承杯 75c: Cup
76:腔室 76: Chamber
81:前載置部 81: Front loading department
82a1:載置部(第1前載置部) 82a1: Placement part (first front placement part)
82a2:載置部(第3前載置部) 82a2: Placement part (3rd front placement part)
82a3:載置部 82a3: Placement part
82a4:載置部 82a4: Placement part
82b1:載置部(第2前載置部) 82b1: Placement part (2nd front placement part)
82b2:載置部(第4前載置部) 82b2: Placement part (4th front placement part)
82b3:載置部 82b3: Placement part
82b4:載置部 82b4: Placement part
83:後載置部 83: Rear loading part
84a1:載置部(第1後載置部) 84a1: Placement part (1st rear placement part)
84a2:載置部(第3後載置部) 84a2: Placement part (3rd rear placement part)
84a3:載置部 84a3: Placement part
84a4:載置部 84a4: Placement part
84b1:載置部(第2後載置部) 84b1: Placement part (second rear placement part)
84b2:載置部(第4後載置部) 84b2: Placement part (4th rear placement part)
84b3:載置部 84b3: Placement part
84b4:載置部 84b4: Placement part
85:平板 85: tablet
85a:平板 85a: Tablet
85b:平板 85b: Tablet
91:控制部 91: Control Department
A16d:旋轉軸線 A16d: axis of rotation
A16e:旋轉軸線 A16e: axis of rotation
A27c:旋轉軸線 A27c: Rotation axis
A35:旋轉軸線 A35: Rotation axis
A35d:旋轉軸線(第1軸線、第2軸線) A35d: Rotation axis (1st axis, 2nd axis)
A35f:旋轉軸線(第1軸線、第2軸線) A35f: Rotation axis (1st axis, 2nd axis)
A69e:旋轉軸線 A69e: axis of rotation
AHP:疏水化處理單元 AHP: Hydrophobic treatment unit
Ba:搬送機構34a1可搬送基板W之區域 Ba: The area where the transport mechanism 34a1 can transport the substrate W
Bb:搬送機構34b1可搬送基板W之區域 Bb: The area where the transport mechanism 34b1 can transport the substrate W
C:載具 C: Vehicle
CP:冷卻單元 CP: Cooling unit
Da:於大致前後方向上相鄰之2個第1中心點之間之距離 Da: The distance between two adjacent first center points in the approximate front and rear direction
Db:於大致前後方向上相鄰之2個第2中心點之間之距離 Db: The distance between two adjacent second center points in the roughly front-to-back direction
E:假想線 E: imaginary line
e1:點 e1: point
e2:點 e2: point
e3:點 e3: point
e4:點 e4: point
e5:點 e5: point
e6:點 e6: point
e7:點 e7: point
F2:假想線 F2: imaginary line
Ga1:熱處理單元38a1之第1中心點 Ga1: The first center point of the heat treatment unit 38a1
Gb1:熱處理單元38b1之第2中心點 Gb1: The second center point of the heat treatment unit 38b1
HP:加熱單元 HP: heating unit
J:搬送空間之中心點 J: The center point of the transport space
K:假想面 K: imaginary face
L1:寬度方向上之搬送空間32之長度
L1: The length of the conveying
L2:前後方向上之搬送空間32之長度
L2: The length of the
La:前後方向上之1個熱處理單元38a1之長度 La: The length of one heat treatment unit 38a1 in the front and rear direction
Lb:前後方向上之1個熱處理單元38b1之長度 Lb: The length of one heat treatment unit 38b1 in the front and rear direction
Pa1:處理位置(第1處理位置) Pa1: Processing position (1st processing position)
Pa2:處理位置(第3處理位置) Pa2: Processing position (3rd processing position)
Pa3:處理位置 Pa3: Processing position
Pa4:處理位置 Pa4: Processing position
Pb1:處理位置(第2處理位置) Pb1: Processing position (2nd processing position)
Pb2:處理位置(第4處理位置) Pb2: Processing position (4th processing position)
Pb3:處理位置 Pb3: Processing location
Pb4:處理位置 Pb4: Processing location
Qa1:維護位置(第1維護位置) Qa1: Maintenance position (1st maintenance position)
Qa2:維護位置(第3維護位置) Qa2: Maintenance position (3rd maintenance position)
Qa3:處理位置 Qa3: Processing location
Qa4:處理位置 Qa4: Processing location
Qb1:維護位置(第2維護位置) Qb1: Maintenance position (2nd maintenance position)
Qb2:維護位置(第4維護位置) Qb2: Maintenance position (4th maintenance position)
Qb3:處理位置 Qb3: Processing location
Qb4:處理位置 Qb4: Processing location
r:基板之半徑 r: the radius of the substrate
U1、U2、U3:熱處理單元 U1, U2, U3: heat treatment unit
V2:平板中心點 V2: Flat center point
W:基板 W: substrate
X:前後方向 X: front and rear direction
Y:寬度方向 Y: width direction
Z:上下方向 Z: Up and down direction
為了說明發明而圖示了目前認為較佳之若干個形態,但要理解發明並不限定於圖示般之構成及方案。 In order to illustrate the invention, several forms that are currently considered preferable are illustrated, but it should be understood that the invention is not limited to the illustrated constitution and scheme.
圖1係實施形態之基板處理裝置之俯視圖。 Fig. 1 is a plan view of the substrate processing apparatus of the embodiment.
圖2係表示基板處理裝置之右部構成之右側視圖。 Fig. 2 is a right side view showing the structure of the right part of the substrate processing apparatus.
圖3係表示寬度方向上之基板處理裝置之中央部構成之右側視圖。 Fig. 3 is a right side view showing the structure of the central part of the substrate processing apparatus in the width direction.
圖4係表示基板處理裝置之左部構成之左側視圖。 Fig. 4 is a left side view showing the structure of the left part of the substrate processing apparatus.
圖5係移載傳送部之前視圖。 Figure 5 is a front view of the transfer and transfer section.
圖6係表示移載傳送部之內部構成之前視圖。 Fig. 6 is a front view showing the internal structure of the transfer conveying unit.
圖7係熱處理區塊之前視圖。 Figure 7 is a front view of the heat treatment block.
圖8係熱處理區塊之放大俯視圖。 Figure 8 is an enlarged top view of the heat treatment block.
圖9係例示熱處理部之維護位置之俯視圖。 Fig. 9 is a plan view illustrating the maintenance position of the heat treatment unit.
圖10係例示熱處理部之維護位置之前視圖。 Fig. 10 is a front view illustrating the maintenance position of the heat treatment part.
圖11A係第1框架與第2框架之俯視圖,圖11B係第1框架與第2框架之前視圖,圖11C係第1框架之右側視圖。 Fig. 11A is a top view of the first frame and the second frame, Fig. 11B is a front view of the first frame and the second frame, and Fig. 11C is a right side view of the first frame.
圖12A係可動構件之俯視圖,圖12B係可動構件之前視圖,圖12C係可動構件之右側視圖。 Fig. 12A is a plan view of the movable member, Fig. 12B is a front view of the movable member, and Fig. 12C is a right side view of the movable member.
圖13係模式性地表示基板所通過之基板處理裝置之要素之圖。 FIG. 13 is a diagram schematically showing the elements of the substrate processing apparatus through which the substrate passes.
圖14A-14R係表示搬送機構之動作例之俯視圖。 14A-14R is a plan view showing an example of the operation of the conveying mechanism.
以下,參照圖式來說明本發明之基板處理裝置。 Hereinafter, the substrate processing apparatus of the present invention will be described with reference to the drawings.
圖1係實施形態之基板處理裝置之俯視圖。基板處理裝置1對基板(例如半導體晶圓)W進行處理。
Fig. 1 is a plan view of the substrate processing apparatus of the embodiment. The
基板W例如為半導體晶圓、液晶顯示器用基板、有機EL(Electroluminescence)用基板、FPD(Flat Panel Display)用基板、光顯示器用基板、磁碟用基板、光碟用基板、磁光碟用基板、光罩用基板及太陽電池用基板。基板W具有較薄之平板形狀。基板W於俯視下具有大致圓形狀。 The substrate W is, for example, a semiconductor wafer, a substrate for liquid crystal displays, a substrate for organic EL (Electroluminescence), a substrate for FPD (Flat Panel Display), a substrate for optical display, a substrate for magnetic disks, a substrate for optical disks, a substrate for magneto-optical disks, and optical disks. Cover substrate and solar cell substrate. The substrate W has a thin flat plate shape. The substrate W has a substantially circular shape in a plan view.
基板處理裝置1具備儲存部11、移載傳送部21、熱處理區塊31及液體處理區塊61。儲存部11保管複數個載具C。載具C收容複數片基板W。載具C例如為FOUP(front opening unified pod,前開式晶圓盒)。移載傳送部21自載具C搬出基板W,且向載具C搬入基板W。熱處理區塊31對基板W進行熱處理。液體處理區塊61對基板W進行液體處理。
The
儲存部11與移載傳送部21連接。載具C於儲存部11與移載傳送部21之間被搬送。移載傳送部21與熱處理區塊31連接。基板W於移載傳送部21與熱處理區塊31之間被搬送。熱處理區塊31與液體處理區塊61連接。基板W於熱處理區塊31與液體處理區塊61之間被搬送。
The
儲存部11、移載傳送部21、熱處理區塊31及液體處理區塊61以依序排列成1行之方式配置。將儲存部11、移載傳送部21、熱處理區塊31及液體處理區塊61排列之方向稱為「前後方向X」。前後方向X水平。將前後方向X中自液體處理區塊61朝向儲存部11之方向稱為「前方」。將與前方相反之方向稱為「後方」。將與前後方向X正交之水平方向稱為「寬度方向
Y」或「側方」。將「寬度方向Y」之一方向適宜地稱為「右方」。將與右方相反之方向稱為「左方」。將垂直方向稱為「上下方向Z」。上下方向Z與前後方向X正交,且與寬度方向Y正交。於各圖中,適宜地示出前、後、右、左、上、下作為參考。
The
基板處理裝置1進而具備前載置部81及後載置部83。前載置部81配置於移載傳送部21與熱處理區塊31之間。前載置部81供載置基板W。基板W經由前載置部81於移載傳送部21與熱處理區塊31之間被搬送。後載置部83配置於熱處理區塊31與液體處理區塊61之間。後載置部83供載置基板W。基板W經由後載置部83於熱處理區塊31與液體處理部61之間被搬送。
The
以下說明儲存部11、移載傳送部21、熱處理區塊31、液體處理區塊61、前載置部81及後載置部83。
The
參照圖1-4。圖2係表示基板處理裝置1之右部構成之右側視圖。圖3係表示寬度方向Y上之基板處理裝置1之中央部構成之右側視圖。圖4係表示基板處理裝置1之左部構成之左側視圖。
Refer to Figure 1-4. FIG. 2 is a right side view showing the structure of the right part of the
儲存部11具備複數個架板13。各架板13供載置複數個載具C。架板13具有大致水平之板形狀。複數個架板13以排列於上下方向Z之方式配置。
The
根據載具C之狀況,可將載具C分類為若干個類別。例如,載具C被分類為於儲存部11與未圖示之外部搬送機構之間交接之載具C(稱為「前一種載具C」)、及除此之外之載具C(稱為「後一種載具C」)。此處,外部搬送機構係基板處理裝置1之外部機器。外部搬送機構搬送載具C。外部搬送機構例如設置於儲存部11之上方。外部搬送機構例如為OHT(Overhead Hoist Transfer,高架提昇傳輸小車)。前一種載具C進而被分類為儲存部11自外部搬送機構接收之載具C、及儲存部11交遞至外部搬送機構之載具C。後一種載具C進而被分類為收容未處理之基板W之載具C、未收容基板W之載具C、及收容已處理之基板W之載具C。
According to the condition of the vehicle C, the vehicle C can be classified into several categories. For example, the carrier C is classified into the carrier C (referred to as the "previous type of carrier C") that is transferred between the
亦可針對上述載具C之每種類別,改變載置於架板13之載具C之位置。
It is also possible to change the position of the carrier C placed on the
儲存部11具備搬送載具C之載具搬送機構15。載具搬送機構15配置於架板13與移載傳送部21之間。載具搬送機構15可將載具C載置於架板13,且可獲取架板13上之載具C。進而,載具搬送機構15可於架板13與移載傳送部21之間搬送載具C。
The
載具搬送機構15具備導軌部16a、水平移動部16b、垂直移動部16c、第1臂部16d、第2臂部16e及保持部16f。導軌部16a設置為固定。導軌部16a於大致寬度方向Y上延伸。水平移動部16b受導軌部16a支持。水平移動部16b可相對於導軌部16a於大致寬度方向Y上移動。水平移動部16b於大致上下方向Z上延伸。垂直移動部16c受水平移動部16b支持。垂直移動
部16c可相對於水平移動部16b於大致上下方向Z上移動。第1臂部16d受垂直移動部16c支持。第1臂部16d可相對於垂直移動部16c繞旋轉軸線A16d旋轉。旋轉軸線A16d係與大致上下方向Z平行之假想線。第2臂部16e受第1臂部16d支持。第2臂部16e可相對於第1臂部16d繞旋轉軸線A16e旋轉。旋轉軸線A16e係與大致上下方向Z平行之假想線。保持部16f受第2臂部16e支持。保持部16f保持1個載具C。具體而言,保持部16f固持載具C之上部。
The
參照圖2-4。載具搬送機構15進而具備垂直移動部16g、第1臂部16h、第2臂部16i及保持部16j。垂直移動部16g、第1臂部16h、第2臂部16i及保持部16j分別具有與垂直移動部16c、第1臂部16d、第2臂部16e及保持部16f大致相同之形狀及構造。垂直移動部16g受水平移動部16b支持。垂直移動部16g可與垂直移動部16c獨立地動作。第1臂部16h受垂直移動部16g支持。第2臂部16i受第1臂部16h支持。保持部16j受第2臂部16i支持。
Refer to Figure 2-4. The
參照圖1-5。圖5係移載傳送部21之前視圖。移載傳送部21具備載具載置部22a1、22a2、22b1、22b2。於載具載置部22a1、22a2、22b1、22b2分別載置有1個載具C。
Refer to Figure 1-5. FIG. 5 is a front view of the transfer and transfer
載具載置部22a1、22a2以排列於上下方向Z之方式配置。載具載置部22a2配置於載具載置部22a1之上方。載具載置部22b1、22b2以排列於上 下方向Z之方式配置。載具載置部22b2配置於載具載置部22b1之上方。載具載置部22a1配置於與載具載置部22b1大致相同之高度位置。載具載置部22a1、22b1以排列於寬度方向Y之方式配置。載具載置部22a1配置於載具載置部22b1之右方。載具載置部22a2配置於與載具載置部22b2大致相同之高度位置。載具載置部22a2、22b2以排列於寬度方向Y之方式配置。載具載置部22a2配置於載具載置部22b2之右方。 The carrier mounting parts 22a1, 22a2 are arranged so as to be arranged in the vertical direction Z. The carrier placing portion 22a2 is disposed above the carrier placing portion 22a1. The carrier placement parts 22b1, 22b2 are arranged on the It is arranged in the downward direction Z. The carrier placing portion 22b2 is arranged above the carrier placing portion 22b1. The carrier placing portion 22a1 is arranged at a height position that is substantially the same as that of the carrier placing portion 22b1. The carrier mounting parts 22a1, 22b1 are arranged so as to be arranged in the width direction Y. The carrier placing portion 22a1 is arranged on the right of the carrier placing portion 22b1. The carrier placing portion 22a2 is arranged at a height position that is substantially the same as that of the carrier placing portion 22b2. The carrier mounting parts 22a2, 22b2 are arranged so as to be arranged in the width direction Y. The carrier placing portion 22a2 is arranged on the right of the carrier placing portion 22b2.
於不區分載具載置部22a1、22a2之情形時,記載為「載具載置部22a」。於不區分載具載置部22b1、22b2之情形時,記載為「載具載置部22b」。
When not distinguishing between the carrier placing parts 22a1 and 22a2, it is described as "
載具載置部22a、22b配置於載具搬送機構15之後方。載具搬送機構15可將載具C載置於載具載置部22a、22b。載具搬送機構15可獲取載具載置部22a、22b上之載具C。
The
參照圖1-4、6。圖6係表示移載傳送部21之內部構成之前視圖。移載傳送部21具備搬送空間23。搬送空間23配置於載具載置部22a、22b之後方。搬送空間23具有大致箱形狀。搬送空間23於俯視、側視及前視下為大致矩形。
Refer to Figures 1-4 and 6. FIG. 6 is a front view showing the internal structure of the
移載傳送部21具備框架24。框架24被設置為搬送空間23之骨架(skeleton)。框架24劃定搬送空間23之形狀。框架24例如為金屬製。
The
移載傳送部21具備移載傳送用搬送機構25。移載傳送用搬送機構25設置於搬送空間23中。移載傳送用搬送機構25於載置於載具載置部22a、22b之載具C與熱處理區塊31之間搬送基板W。
The
移載傳送用搬送機構25具備2個搬送機構26a、26b。搬送機構26b配置於與搬送機構26a大致相同之高度位置。搬送機構26a、26b以排列於寬度方向Y之方式配置。搬送機構26b配置於搬送機構26a之左方。搬送機構26a配置於載具載置部22a之後方。搬送機構26b配置於載具載置部22b之後方。搬送機構26a於載置於載具載置部22a之載具C與熱處理區塊31之間搬送基板W。搬送機構26b於載置於載具載置部22b之載具C與熱處理區塊31之間搬送基板W。搬送機構26b可與搬送機構26a獨立地搬送基板W。
The
搬送機構26a具備支柱27a、垂直移動部27b、旋轉部27c及保持部27d、27e。支柱27a支持於框架24。支柱27a固定於框架24。支柱27a無法相對於框架24移動。支柱27a於大致上下方向Z上延伸。垂直移動部27b支持於支柱27a。垂直移動部27b可相對於支柱27a於大致上下方向Z上移動。垂直移動部27b無法相對於支柱27a於大致水平方向上移動。旋轉部27c支持於垂直移動部27b。旋轉部27c可相對於垂直移動部27b繞旋轉軸線A27c旋轉。旋轉軸線A27c係與大致上下方向Z平行之假想線。保持部27d、27e支持於旋轉部27c。保持部27d、27e可相對於旋轉部27c進退移動。更具體而言,保持部27d、27e可於由旋轉部27c之朝向決定之水平之一方向上往復移動。水平之一方向例如為旋轉軸線A27c之徑向。保持部27d、27e可相互獨立地進退移動。保持部27d、27e分別將1片基板W以水
平姿勢保持。
The conveying
如此,保持部27d、27e可於上下方向Z上平行移動。保持部27d、27e可繞旋轉軸線A27c旋轉。保持部27d、27e可相對於旋轉部27c進退移動。
In this way, the holding
搬送機構26b除為左右對稱之方面以外,具有與搬送機構26a大致相同之構造及形狀。即,搬送機構26b具備支柱27a、垂直移動部27b、旋轉部27c及保持部27d、27e。
The conveying
如此,於本說明書中,於不同要素具有相同構造之情形時,藉由對該構造標註共通之符號而省略詳細之說明。 As such, in this specification, when different elements have the same structure, the detailed description is omitted by denoting the structure with a common symbol.
參照圖1-4、7。圖7係熱處理區塊31之前視圖。熱處理區塊31具有大致箱形狀。熱處理區塊31於俯視、側視及前視下為大致矩形。
Refer to Figures 1-4 and 7. FIG. 7 is a front view of the
熱處理區塊31具備搬送空間32及熱處理用搬送機構33。熱處理用搬送機構33設置於搬送空間32中。熱處理用搬送機構33搬送基板W。
The
熱處理用搬送機構33具備複數個(例如8個)搬送機構34a1、34a2、34a3、34a4、34b1、34b2、34b3、34b4。於不區分搬送機構34a1-
34a4、34b1-34b4之情形時,將搬送機構34a1-34a4、34b1-34b4統稱為搬送機構34。搬送機構34分別搬送基板W。
The
熱處理區塊31具備複數個(例如8個)熱處理部37a1、37a2、37a3、37a4、37b1、37b2、37b3、37b4。於不區分熱處理部37a1-37a4、37b1-37b4之情形時,將熱處理部37a1-37a4、37b1-37b4統稱為熱處理部37。熱處理部37分別對基板W進行熱處理。
The
熱處理部37a1具備複數個(例如7個)熱處理單元38a1。同樣地,熱處理部37a2-37a4、37b1-37b4分別具備複數個(例如7個)熱處理單元38a2-38a4、38b1-38b4。於不區分熱處理單元38a1-38a4、38b1-38b4之情形時,將熱處理單元38a1-38a4、38b1-38b4統稱為熱處理單元38。熱處理單元38分別對1片基板W進行熱處理。 The heat treatment unit 37a1 includes a plurality of (for example, 7) heat treatment units 38a1. Similarly, the heat treatment units 37a2-37a4, 37b1-37b4 are provided with a plurality of (for example, 7) heat treatment units 38a2-38a4, 38b1-38b4, respectively. When the heat treatment units 38a1-38a4 and 38b1-38b4 are not distinguished, the heat treatment units 38a1-38a4 and 38b1-38b4 are collectively referred to as the heat treatment unit 38. The heat treatment unit 38 heats one substrate W, respectively.
熱處理區塊31具備複數個(例如8個)檢查部41a1、41a2、41a3、41a4、41b1、41b2、41b3、41b4。於不區分檢查部41a1-41a4、41b1-41b4之情形時,將檢查部41a1-41a4、41b1-41b4統稱為檢查部41。檢查部41檢查基板W。
The
檢查部41a1具備1個檢查單元42a1。同樣地,檢查部41a2-41a4、41b1-41b4分別具備1個檢查單元42a2-42a4、42b1-42b4。於不區分檢查單元42a1-42a4、42b1-42b4之情形時,將檢查單元42a1-42a4、42b1-42b4統稱為檢查單元42。檢查單元42檢查1片基板W。 The inspection unit 41a1 includes one inspection unit 42a1. Similarly, the inspection units 41a2-41a4, 41b1-41b4 each include one inspection unit 42a2-42a4, 42b1-42b4. When the inspection units 42a1-42a4 and 42b1-42b4 are not distinguished, the inspection units 42a1-42a4 and 42b1-42b4 are collectively referred to as the inspection unit 42. The inspection unit 42 inspects one substrate W.
搬送機構34a1向熱處理部37a1搬送基板W。搬送機構34a1不向熱處理部37a1以外之熱處理部37搬送基板W。對於熱處理部37a1,主要由搬送機構34a1搬送基板W。具體而言,搬送機構34a1向熱處理單元38a搬送基板W。同樣地,搬送機構34a2-34a4、34b1-34b4分別向熱處理部37a2-37a4、37b1-34b4搬送基板W。具體而言,搬送機構34a2-34a4、34b1-34b4分別向熱處理單元38a2-38a4、38b1-38b4搬送基板W。 The transport mechanism 34a1 transports the substrate W to the heat treatment unit 37a1. The conveyance mechanism 34a1 does not convey the substrate W to the heat treatment part 37 other than the heat treatment part 37a1. With respect to the heat treatment portion 37a1, the substrate W is mainly transported by the transport mechanism 34a1. Specifically, the transport mechanism 34a1 transports the substrate W to the heat treatment unit 38a. Similarly, the transport mechanisms 34a2-34a4, 34b1-34b4 transport the substrate W to the heat treatment sections 37a2-37a4, 37b1-34b4, respectively. Specifically, the conveyance mechanisms 34a2-34a4, 34b1-34b4 convey the substrate W to the heat treatment units 38a2-38a4, 38b1-38b4, respectively.
搬送機構34a1將基板W搬送至檢查部41a1。搬送機構34a1不向檢查部41a1以外之檢查部41搬送基板W。對於檢查部41a1,主要由搬送機構34a1搬送基板W。具體而言,搬送機構34a向檢查單元42a1搬送基板W。同樣地,搬送機構34a2-34a4、34b1-34b4分別向檢查部41a2-41a4、41b1-41b4搬送基板W。具體而言,搬送機構34a2-34a4、34b1-34b4分別向檢查單元42a2-42a4、42b1-42b4搬送基板W。 The transport mechanism 34a1 transports the substrate W to the inspection section 41a1. The transport mechanism 34a1 does not transport the substrate W to the inspection unit 41 other than the inspection unit 41a1. With regard to the inspection unit 41a1, the substrate W is mainly transported by the transport mechanism 34a1. Specifically, the transport mechanism 34a transports the substrate W to the inspection unit 42a1. Similarly, the transport mechanisms 34a2-34a4, 34b1-34b4 transport the substrate W to the inspection sections 41a2-41a4, 41b1-41b4, respectively. Specifically, the transport mechanisms 34a2-34a4, 34b1-34b4 transport the substrate W to the inspection units 42a2-42a4, 42b1-42b4, respectively.
對搬送空間32、熱處理用搬送機構33、熱處理部37及檢查部41之配置進行說明。
The arrangement of the
參照圖1。搬送空間32於俯視下配置於寬度方向Y上之熱處理區塊31之中央部。搬送空間32於俯視下具有大致矩形形狀。搬送空間32於大致前後方向X上延伸。搬送空間32與移載傳送部21之搬送空間23相接。搬送空間32配置於搬送機構26a之左方且後方。搬送空間32配置於搬送機構
26b之右方且後方。
Refer to Figure 1. The conveying
圖8係熱處理區塊31之放大俯視圖。寬度方向Y上之搬送空間32之長度L1例如為基板W之半徑r之5倍以下。長度L1為基板W之半徑r之4倍以上。長度L1比前後方向X上之搬送空間32之長度L2短。如此,長度L1相對較小。
FIG. 8 is an enlarged top view of the
參照圖7、8。搬送空間32具有位於搬送空間32之中心之假想之中心點J。圖7、8表示通過中心點J且與寬度方向Y正交之假想面K。搬送機構34a1-34a4配置於假想面K之右方。搬送機構34b1-34b4配置於假想面K之左方。
Refer to Figures 7 and 8. The
搬送機構34b1配置於與搬送機構34a1大致相同之高度位置。搬送機構34a1、34b1以排列於寬度方向Y之方式配置。搬送機構34b1配置於搬送機構34a1之左方。搬送機構34b1配置於與搬送機構34a1左右對稱之位置。具體而言,搬送機構34b1配置於相對於假想面K與搬送機構34a1左右對稱之位置。 The conveying mechanism 34b1 is arranged at a height position that is substantially the same as that of the conveying mechanism 34a1. The conveyance mechanisms 34a1, 34b1 are arranged so as to be aligned in the width direction Y. The conveying mechanism 34b1 is arranged on the left of the conveying mechanism 34a1. The conveying mechanism 34b1 is arranged at a position symmetrical to the conveying mechanism 34a1. Specifically, the conveying mechanism 34b1 is arranged at a position that is bilaterally symmetrical to the conveying mechanism 34a1 with respect to the virtual plane K.
搬送機構34a2、34b2之相對位置關係與搬送機構34a1、34b1之相對位置關係相同。搬送機構34a3、34b3之相對位置關係與搬送機構34a1、34b1之相對位置關係相同。搬送機構34a4、34b4之相對位置關係與搬送機構34a1、34b1之相對位置關係相同。 The relative positional relationship of the conveying mechanisms 34a2, 34b2 is the same as the relative positional relationship of the conveying mechanisms 34a1, 34b1. The relative positional relationship of the conveying mechanisms 34a3, 34b3 is the same as the relative positional relationship of the conveying mechanisms 34a1, 34b1. The relative positional relationship of the conveying mechanisms 34a4 and 34b4 is the same as the relative positional relationship of the conveying mechanisms 34a1 and 34b1.
參照圖7。搬送機構34a2、34b2配置於搬送機構34a1、34b1之上方。搬送機構34a3、34b3配置於搬送機構34a2、34b2之上方。搬送機構34a4、34b4配置於搬送機構34a3、34b3之上方。 Refer to Figure 7. The conveying mechanisms 34a2, 34b2 are arranged above the conveying mechanisms 34a1, 34b1. The conveying mechanisms 34a3, 34b3 are arranged above the conveying mechanisms 34a2, 34b2. The conveying mechanisms 34a4 and 34b4 are arranged above the conveying mechanisms 34a3 and 34b3.
搬送機構34a1-34a4以排列於上下方向Z之方式配置。搬送機構34a2於俯視下與搬送機構34a1重疊。搬送機構34a3於俯視下與搬送機構34a1重疊。搬送機構34a4於俯視下與搬送機構34a1重疊。 The conveyance mechanisms 34a1-34a4 are arranged so as to be arranged in the vertical direction Z. The conveying mechanism 34a2 overlaps with the conveying mechanism 34a1 in a plan view. The conveying mechanism 34a3 overlaps with the conveying mechanism 34a1 in a plan view. The conveying mechanism 34a4 overlaps with the conveying mechanism 34a1 in a plan view.
搬送機構34b1-34b4以排列於上下方向Z之方式配置。搬送機構34b2於俯視下與搬送機構34b1重疊。搬送機構34b3於俯視下與搬送機構34b1重疊。搬送機構34b4於俯視下與搬送機構34b1重疊。 The conveying mechanisms 34b1-34b4 are arranged so as to be arranged in the vertical direction Z. The conveying mechanism 34b2 overlaps with the conveying mechanism 34b1 in a plan view. The conveying mechanism 34b3 overlaps with the conveying mechanism 34b1 in a plan view. The conveying mechanism 34b4 overlaps with the conveying mechanism 34b1 in a plan view.
參照圖1、2、4、7、8。熱處理部37a1、搬送空間32及熱處理部37b1以依序排列於大致寬度方向Y之方式配置。換言之,搬送空間32於大致寬度方向Y上配置於熱處理部37a1與熱處理部37b1之間。同樣地,熱處理部37a2、搬送空間32及熱處理部37b2以依序排列於大致寬度方向Y之方式配置。熱處理部37a3、搬送空間32及熱處理部37b3以依序排列於大致寬度方向Y之方式配置。熱處理部37a4、搬送空間32與熱處理部37b4以依序排列於大致寬度方向Y之方式配置。
Refer to Figures 1, 2, 4, 7, and 8. The heat treatment part 37a1, the
具體而言,熱處理部37a1-37a4配置於搬送空間32之右方之位置。熱處理部37b1-37b4配置於搬送空間32之左方之位置。
Specifically, the heat treatment portion 37a1-37a4 is arranged at a position on the right of the conveying
參照圖7。熱處理部37a1配置於與搬送機構34a1大致相同之高度位置。熱處理部37a1配置為與搬送機構34a1於大致寬度方向Y上並排。熱處理部37a1配置於搬送機構34a1之右方之位置。同樣地,熱處理部37a2-37a4分別配置於與搬送機構34a2-34a4大致相同之高度位置。熱處理部37a2-37a4分別配置為與搬送機構34a2-34a4於大致寬度方向Y上並排。熱處理部37a2-37a4分別配置於搬送機構34a2-34a4之右方之位置。 Refer to Figure 7. The heat treatment portion 37a1 is arranged at a height position that is substantially the same as that of the conveying mechanism 34a1. The heat treatment portion 37a1 is arranged to line up with the conveying mechanism 34a1 in the substantially width direction Y. The heat treatment part 37a1 is arranged at a position on the right of the conveying mechanism 34a1. Similarly, the heat treatment portions 37a2-37a4 are respectively arranged at substantially the same height positions as the conveying mechanism 34a2-34a4. The heat treatment parts 37a2-37a4 are respectively arranged to line up with the conveying mechanism 34a2-34a4 in the substantially width direction Y. The heat treatment parts 37a2-37a4 are respectively arranged at positions on the right of the conveying mechanism 34a2-34a4.
熱處理部37b1配置於與搬送機構34b1大致相同之高度位置。熱處理部37b1配置為與搬送機構34b1於大致寬度方向Y上並排。熱處理部37b1配置於搬送機構34b1之左方之位置。同樣地,熱處理部37b2-37b4分別配置於與搬送機構34b2-34b4大致相同之高度位置。熱處理部37b2-37b4分別配置為與搬送機構34b2-34b4於大致寬度方向Y上並排。熱處理部37b2-37b4分別配置於搬送機構34b2-34b4之左方之位置。 The heat treatment portion 37b1 is arranged at a height position that is substantially the same as that of the conveying mechanism 34b1. The heat treatment portion 37b1 is arranged to be parallel to the conveying mechanism 34b1 in the substantially width direction Y. The heat treatment part 37b1 is arranged on the left side of the conveying mechanism 34b1. Similarly, the heat treatment parts 37b2-37b4 are respectively arranged at substantially the same height positions as the conveying mechanism 34b2-34b4. The heat treatment portions 37b2-37b4 are respectively arranged to line up with the conveying mechanism 34b2-34b4 in the substantially width direction Y. The heat treatment parts 37b2-37b4 are respectively arranged at positions on the left of the conveying mechanism 34b2-34b4.
熱處理部37a1、搬送機構34a1、搬送機構34b1及熱處理部37b1以依序排列於大致寬度方向Y之方式配置。同樣地,熱處理部37a2、搬送機構34a2、搬送機構34b2及熱處理部37b2以依序排列於大致寬度方向Y之方式配置。熱處理部37a3、搬送機構34a3、搬送機構34b3及熱處理部37b3以依序排列於大致寬度方向Y之方式配置。熱處理部37a4、搬送機構34a4、搬送機構34b4及熱處理部37b4以依序排列於大致寬度方向Y之方式配置。 The heat treatment part 37a1, the conveyance mechanism 34a1, the conveyance mechanism 34b1, and the heat treatment part 37b1 are arranged so as to be sequentially arranged in the substantially width direction Y. Similarly, the heat treatment part 37a2, the conveyance mechanism 34a2, the conveyance mechanism 34b2, and the heat treatment part 37b2 are arranged so as to be sequentially arranged in the substantially width direction Y. The heat treatment part 37a3, the conveyance mechanism 34a3, the conveyance mechanism 34b3, and the heat treatment part 37b3 are arranged so as to be sequentially arranged in the substantially width direction Y. The heat treatment part 37a4, the conveyance mechanism 34a4, the conveyance mechanism 34b4, and the heat treatment part 37b4 are arranged so as to be sequentially arranged in the substantially width direction Y.
參照圖2、7。熱處理部37a1-37a4以排列於上下方向Z之方式配置。熱處理部37a2配置於熱處理部37a1之上方。熱處理部37a3配置於熱處理 部37a2之上方。熱處理部37a4配置於熱處理部37a3之上方。熱處理部37a2於俯視下與熱處理部37a1重疊。熱處理部37a3於俯視下與熱處理部37a1重疊。熱處理部37a4於俯視下與熱處理部37a1重疊。 Refer to Figures 2 and 7. The heat treatment portions 37a1-37a4 are arranged so as to be aligned in the vertical direction Z. The heat treatment part 37a2 is arranged above the heat treatment part 37a1. The heat treatment part 37a3 is arranged in the heat treatment Above section 37a2. The heat treatment part 37a4 is arranged above the heat treatment part 37a3. The heat treatment part 37a2 overlaps with the heat treatment part 37a1 in a plan view. The heat treatment part 37a3 overlaps with the heat treatment part 37a1 in a plan view. The heat treatment portion 37a4 overlaps the heat treatment portion 37a1 in a plan view.
參照圖4、7。熱處理部37b1-37b4以排列於上下方向Z之方式配置。熱處理部37b2配置於熱處理部37b1之上方。熱處理部37b3配置於熱處理部37b2之上方。熱處理部37b4配置於熱處理部37b3之上方。熱處理部37b2於俯視下與熱處理部37b1重疊。熱處理部37b3於俯視下與熱處理部37b1重疊。熱處理部37b4於俯視下與熱處理部37b1重疊。 Refer to Figures 4 and 7. The heat treatment portions 37b1-37b4 are arranged so as to be aligned in the vertical direction Z. The heat treatment part 37b2 is arranged above the heat treatment part 37b1. The heat treatment part 37b3 is arranged above the heat treatment part 37b2. The heat treatment part 37b4 is arranged above the heat treatment part 37b3. The heat treatment part 37b2 overlaps with the heat treatment part 37b1 in a plan view. The heat treatment portion 37b3 overlaps the heat treatment portion 37b1 in a plan view. The heat treatment portion 37b4 overlaps the heat treatment portion 37b1 in a plan view.
參照圖7。熱處理部37b1配置於與熱處理部37a1大致相同之高度位置。熱處理部37b1隔著搬送空間32與熱處理部37a1相向。熱處理部37b1配置於與熱處理部37a1左右對稱之位置。具體而言,熱處理部37b1配置於相對於假想面K與熱處理部37a1左右對稱之位置。
Refer to Figure 7. The heat treatment part 37b1 is arranged at a height position substantially the same as that of the heat treatment part 37a1. The heat treatment part 37b1 faces the heat treatment part 37a1 with the
熱處理部37a2、37b2之相對位置關係與熱處理部37a1、37b1之相對位置關係相同。熱處理部37a3、37b3之相對位置關係與熱處理部37a1、37b1之相對位置關係相同。熱處理部37a4、37b4之相對位置關係與熱處理部37a1、37b1之相對位置關係相同。 The relative positional relationship of the heat treatment portions 37a2, 37b2 is the same as the relative positional relationship of the heat treatment portions 37a1, 37b1. The relative positional relationship of the heat treatment portions 37a3, 37b3 is the same as the relative positional relationship of the heat treatment portions 37a1, 37b1. The relative positional relationship of the heat treatment portions 37a4, 37b4 is the same as the relative positional relationship of the heat treatment portions 37a1, 37b1.
參照圖1、2、4。檢查部41a1-41a4配置於搬送空間32之右方之位置。檢查部41b1-41b4配置於搬送空間32之左方之位置。
Refer to Figures 1, 2, and 4. The inspection part 41a1-41a4 is arrange|positioned at the position of the right of the
雖然省略了圖示,但檢查部41a1-41a4、41b1-41b4分別配置於與搬送機構34a1-34a4、34b1-34b4大致相同之高度位置。檢查部41a1-41a4分別配置於搬送機構34a1-34a4之右方。檢查部41b1-41b4分別配置於搬送機構34b1-34b4之左方。 Although illustration is omitted, the inspection parts 41a1-41a4, 41b1-41b4 are arranged at substantially the same height positions as the conveying mechanisms 34a1-34a4, 34b1-34b4, respectively. The inspection parts 41a1-41a4 are respectively arranged on the right of the conveying mechanism 34a1-34a4. The inspection parts 41b1-41b4 are respectively arranged on the left of the conveying mechanism 34b1-34b4.
檢查部41a1-41a4以排列於上下方向Z之方式配置。檢查部41b1-41b4以排列於上下方向Z之方式配置。 The inspection parts 41a1-41a4 are arranged so as to be arranged in the vertical direction Z. The inspection parts 41b1-41b4 are arranged so as to be arranged in the vertical direction Z.
檢查部41b1配置於與檢查部41a1大致相同之高度位置。檢查部41b1隔著搬送空間32與檢查部41a1相向。檢查部41b1配置於與檢查部41a1左右對稱之位置。具體而言,檢查部41b1配置於相對於假想面K與檢查部41a1左右對稱之位置。
The inspection part 41b1 is arrange|positioned at substantially the same height position as the inspection part 41a1. The inspection part 41b1 faces the inspection part 41a1 across the
檢查部41a2、41b2之相對位置關係與檢查部41a1、41b1之相對位置關係相同。檢查部41a3、41b3之相對位置關係與檢查部41a1、41b1之相對位置關係相同。檢查部41a4、41b4之相對位置關係與檢查部41a1、41b1之相對位置關係相同。 The relative positional relationship of the inspection parts 41a2, 41b2 is the same as the relative positional relationship of the inspection parts 41a1, 41b1. The relative positional relationship of the inspection parts 41a3 and 41b3 is the same as the relative positional relationship of the inspection parts 41a1 and 41b1. The relative positional relationship of the inspection parts 41a4 and 41b4 is the same as the relative positional relationship of the inspection parts 41a1 and 41b1.
參照圖8。複數個(例如2個或3個)熱處理單元38a1以排列於大致前後方向X之方式配置。複數個(例如2個或3個)熱處理單元38b1以排列於大致前後方向X之方式配置。 Refer to Figure 8. A plurality of (for example, 2 or 3) heat treatment units 38a1 are arranged so as to be arranged in substantially the front-rear direction X. A plurality of (for example, two or three) heat treatment units 38b1 are arranged so as to be arranged substantially in the front-rear direction X.
前後方向X上之1個熱處理單元38a1之長度La為基板W之半徑r之3倍 以下。長度La大於基板W之半徑r之2倍。 The length La of one heat treatment unit 38a1 in the front-rear direction X is 3 times the radius r of the substrate W the following. The length La is greater than twice the radius r of the substrate W.
熱處理單元38a1分別具有位於熱處理單元38a1之中心之假想之第1中心點Ga1。於大致前後方向X上相鄰之2個第1中心點Ga1之間之距離Da為基板W之半徑r之3倍以下。距離Da大於基板W之半徑r之2倍。 The heat treatment units 38a1 each have an imaginary first center point Ga1 located at the center of the heat treatment unit 38a1. The distance Da between two adjacent first center points Ga1 in the substantially front-rear direction X is less than 3 times the radius r of the substrate W. The distance Da is greater than twice the radius r of the substrate W.
前後方向X上之1個熱處理單元38b1之長度Lb為基板W之半徑r之3倍以下。長度Lb大於基板W之半徑r之2倍。長度Lb與長度La大致相等。 The length Lb of one heat treatment unit 38b1 in the front-rear direction X is less than 3 times the radius r of the substrate W. The length Lb is greater than twice the radius r of the substrate W. The length Lb is approximately equal to the length La.
熱處理單元38b1分別具有位於熱處理單元38b1之中心之假想之第2中心點Gb1。於大致前後方向X上相鄰之2個第2中心點Gb1之間之距離Db為基板W之半徑r之3倍以下。距離Db大於基板W之半徑r之2倍。距離Db與距離Da大致相等。 The heat treatment units 38b1 each have an imaginary second center point Gb1 located at the center of the heat treatment unit 38b1. The distance Db between two adjacent second center points Gb1 in the substantially front-rear direction X is less than 3 times the radius r of the substrate W. The distance Db is greater than twice the radius r of the substrate W. The distance Db is approximately equal to the distance Da.
參照圖2。複數個(例如2個或3個)熱處理單元38a1以排列於大致上下方向Z之方式配置。 Refer to Figure 2. A plurality of (for example, two or three) heat treatment units 38a1 are arranged so as to be arranged in a substantially vertical direction Z.
複數個熱處理單元38a1與1個檢查單元42a1於側視下配置為矩陣狀。例如,複數個熱處理單元38a1與1個檢查單元42a1於前後方向X上配置為3行,且於上下方向Z上配置為3段。檢查單元42a1於俯視下與至少1個以上之熱處理單元38a1重疊。 The plurality of heat treatment units 38a1 and one inspection unit 42a1 are arranged in a matrix in a side view. For example, a plurality of heat treatment units 38a1 and one inspection unit 42a1 are arranged in three rows in the front-rear direction X, and are arranged in three stages in the vertical direction Z. The inspection unit 42a1 overlaps with at least one heat treatment unit 38a1 in a plan view.
參照圖4。複數個(例如2個或3個)熱處理單元38b1以排列於大致上下 方向Z之方式配置。 Refer to Figure 4. A plurality of (e.g. 2 or 3) heat treatment units 38b1 are arranged approximately up and down Configuration in the direction Z.
複數個熱處理單元38b1與1個檢查單元42b1於側視下配置為矩陣狀。例如,複數個熱處理單元38b1與1個檢查單元42b1於前後方向X上配置為3行,且於上下方向Z上配置為3段。檢查單元42b1於俯視下與至少1個以上之熱處理單元38b1重疊。 The plurality of heat treatment units 38b1 and one inspection unit 42b1 are arranged in a matrix in a side view. For example, a plurality of heat treatment units 38b1 and one inspection unit 42b1 are arranged in three rows in the front-rear direction X, and are arranged in three stages in the vertical direction Z. The inspection unit 42b1 overlaps with at least one heat treatment unit 38b1 in a plan view.
熱處理單元38a2、38a3、38a4分別與熱處理單元38a1同樣地配置。熱處理單元38b2、38b3、38b4分別與熱處理單元38b1同樣地配置。檢查單元42a2、42a3、42a4分別與檢查單元42a1同樣地配置。檢查單元42b2、42b3、42b4分別與檢查單元42b1同樣地配置。 The heat treatment units 38a2, 38a3, and 38a4 are respectively arranged in the same manner as the heat treatment unit 38a1. The heat treatment units 38b2, 38b3, and 38b4 are respectively arranged in the same manner as the heat treatment unit 38b1. The inspection units 42a2, 42a3, and 42a4 are respectively arranged in the same manner as the inspection unit 42a1. The inspection units 42b2, 42b3, and 42b4 are respectively arranged in the same manner as the inspection unit 42b1.
參照圖3、8來說明搬送機構34a1之構造。搬送機構34a1具備導軌部35a、水平移動部35b、垂直移動部35c、臂部35d及保持部35e。導軌部35a設置為固定。導軌部35a於大致水平方向上延伸。具體而言,導軌部35a於大致前後方向X上延伸。導軌部35a自較第1中心點Ga1中之任一個靠前方之位置延伸至較第1中心點Ga1中之任一個靠後方之位置。水平移動部35b支持於導軌部35a。水平移動部35b可相對於導軌部35a於大致水平方向上移動。具體而言,水平移動部35b可相對於導軌部35a於大致前後方向X上移動。水平移動部35b於大致上下方向Z上延伸。上下方向Z上之水平移動部35b之長度比前後方向X上之導軌部35a之長度短。垂直移動部35c支持於水平移動部35b。垂直移動部35c可相對於水平移動部35b於大
致上下方向Z上移動。垂直移動部35c自水平移動部35b向右方突出。臂部35d支持於垂直移動部35c。臂部35d可相對於垂直移動部35c繞旋轉軸線A35d旋轉。旋轉軸線A35d係與大致上下方向Z平行之假想線。旋轉軸線A35d例如通過臂部35d。旋轉軸線A35d例如位於水平移動部35b之右方。臂部35d自垂直移動部35c於水平方向上延伸。保持部35e支持於臂部35d。保持部35e固定於臂部35d。旋轉軸線A35d未通過保持部35e。保持部35e配置於偏離旋轉軸線A35d之位置。保持部35e將1片基板W以水平姿勢保持。
The structure of the transport mechanism 34a1 will be described with reference to FIGS. 3 and 8. The conveyance mechanism 34a1 includes a
搬送機構34a1進而具備臂部35f及保持部35g。臂部35f與保持部35g分別具有與臂部35d及保持部35e大致相同之形狀及構造。臂部35f配置於臂部35d之下方。臂部35f支持於垂直移動部35c。臂部35f可相對於垂直移動部35c繞旋轉軸線A35f旋轉。旋轉軸線A35f係與大致上下方向Z平行之假想線。旋轉軸線A35f位於與旋轉軸線A35d相同之軸線上。臂部35f可與臂部35d獨立地旋轉。保持部35g固定於臂部35f。
The transport mechanism 34a1 further includes an
如此,保持部35e、35g分別可於前後方向X及上下方向Z上平行移動。進而,保持部35e、35g分別可繞旋轉軸線A35d旋轉。但是,保持部35e、35g均無法於寬度方向Y上平行移動。
In this way, the holding
圖8表示於俯視下通過旋轉軸線A35d且與大致前後方向X平行之假想線E。假想線E通過旋轉軸線A35f。於俯視下,旋轉軸線A35d、A35f於假想線E上移動。於俯視下,旋轉軸線A35d、A35f無法移動至偏離假想線E 之位置。 FIG. 8 shows an imaginary line E passing through the rotation axis A35d and substantially parallel to the front-rear direction X in a plan view. The imaginary line E passes through the rotation axis A35f. In a plan view, the rotation axes A35d and A35f move on the imaginary line E. In the top view, the rotation axis A35d and A35f cannot move to deviate from the imaginary line E 的的位置。 The location.
於俯視下,旋轉軸線A35d相對於水平移動部35b之相對位置為固定,且於俯視下,保持部35e與旋轉軸線A35d之距離為固定。因此,搬送機構34a1之構造簡單。以下進行具體說明。
In a plan view, the relative position of the rotation axis A35d with respect to the horizontal moving
於俯視下,旋轉軸線A35d相對於水平移動部35b之相對位置為固定。例如,即便臂部35d相對於水平移動部35b繞旋轉軸線A35d旋轉,旋轉軸線A35d於俯視下亦保持在水平移動部35b之右方之位置。因此,水平移動部35b支持臂部35d之構造相對簡單。於俯視下,保持部35e與旋轉軸線A35d之距離為固定。例如,即便臂部35d相對於水平移動部35b及垂直移動部35c繞旋轉軸線A35d旋轉,保持部35e與旋轉軸線A35d之距離亦保持為固定。因此,臂部35d支持保持部35e之構造相對簡單。
In a plan view, the relative position of the rotation axis A35d with respect to the horizontal moving
同樣地,於俯視下,旋轉軸線A35f相對於水平移動部35b之相對位置為固定,且於俯視下,保持部35g與旋轉軸線A35f之距離為固定。因此,即便著眼於保持部35g,搬送機構34a1之構造亦較簡單。具體而言,水平移動部35b支持臂部35f之構造相對簡單,且臂部35f支持保持部35g之構造亦相對簡單。
Similarly, in a plan view, the relative position of the rotation axis A35f with respect to the horizontal moving
搬送機構34a2-34a4分別具有與搬送機構34a1大致相同之構造。搬送機構34b1-34b4除為左右對稱之方面以外,各自具有與搬送機構34a1大致相同之構造及形狀。 The conveying mechanisms 34a2-34a4 have substantially the same structure as the conveying mechanism 34a1, respectively. The conveying mechanisms 34b1-34b4 each have substantially the same structure and shape as the conveying mechanism 34a1, except that they are bilaterally symmetrical.
搬送機構34a1可相對於熱處理單元38a1於大致前後方向X上移動。更具體而言,搬送機構34a1之水平移動部35b、垂直移動部35c、臂部35d、保持部35e、臂部35f及保持部35g可相對於熱處理單元38a1於大致前後方向X上移動。同樣地,搬送機構34a2-34a4、34b1-34b4分別可相對於熱處理單元38a2-38a4、38b1-38b4於大致前後方向X移動。
The conveyance mechanism 34a1 is movable in substantially the front-rear direction X with respect to the heat treatment unit 38a1. More specifically, the horizontal moving
搬送機構34a1可相對於檢查單元42a1於大致前後方向X移動。同樣地,搬送機構34a2-34a4、34b1-34b4分別可相對於檢查單元42a2-42a4、42b1-42b4於大致前後方向X上移動。 The transport mechanism 34a1 is movable in the substantially front-rear direction X with respect to the inspection unit 42a1. Similarly, the conveyance mechanisms 34a2-34a4, 34b1-34b4 are respectively movable in the substantially front-rear direction X with respect to the inspection units 42a2-42a4, 42b1-42b4.
各搬送機構34分別可相互獨立地於大致前後方向X上移動。具體而言,搬送機構34a1-34a4、34b1-34b4之水平移動部35b分別可相互獨立地於大致前後方向X移動。例如,搬送機構34a1可與搬送機構34a1以外之搬送機構34獨立地於大致前後方向X移動。
Each conveyance mechanism 34 can move in substantially the front-rear direction X independently of each other. Specifically, the horizontal moving
圖8模式性地表示搬送機構34a1可搬送基板W之區域Ba。圖8模式性地表示搬送機構34b1可搬送基板W之區域Bb。區域Ba、Bb各自具有於前後方向X上較長之橢圓形狀。例如,前後方向X上之區域Ba之長度大於寬度方向Y上之區域Ba之長度。熱處理部37a1配置於區域Ba之內部。熱處理部37b1配置於區域Bb之內部。熱處理部37b1配置於區域Ba之外部。熱處理部37a1配置於區域Bb之外部。 FIG. 8 schematically shows the area Ba where the transfer mechanism 34a1 can transfer the substrate W. FIG. 8 schematically shows the area Bb where the substrate W can be transported by the transport mechanism 34b1. The regions Ba and Bb each have an elliptical shape that is long in the front-rear direction X. For example, the length of the area Ba in the front-rear direction X is greater than the length of the area Ba in the width direction Y. The heat treatment part 37a1 is arranged inside the area Ba. The heat treatment portion 37b1 is arranged inside the area Bb. The heat treatment part 37b1 is arranged outside the area Ba. The heat treatment portion 37a1 is arranged outside the area Bb.
搬送機構34a2、34a3、34a4可搬送基板W之區域於俯視下與區域Ba大致相同。搬送機構34b2、34b3、34b4可搬送基板W之區域於俯視下與區域Bb大致相同。 The area where the transport mechanisms 34a2, 34a3, and 34a4 can transport the substrate W is substantially the same as the area Ba in a plan view. The area where the transport mechanisms 34b2, 34b3, and 34b4 can transport the substrate W is substantially the same as the area Bb in a plan view.
搬送機構34a1係本發明中之第1搬送機構之例。搬送機構34b1係本發明中之第2搬送機構之例。搬送機構34a2係本發明中之第3搬送機構之例。搬送機構34b2係本發明中之第4搬送機構之例。 The conveying mechanism 34a1 is an example of the first conveying mechanism in the present invention. The transport mechanism 34b1 is an example of the second transport mechanism in the present invention. The conveying mechanism 34a2 is an example of the third conveying mechanism in the present invention. The transport mechanism 34b2 is an example of the fourth transport mechanism in the present invention.
搬送機構34a1之導軌部35a係本發明中之第1導軌部之例。搬送機構34a1之水平移動部35b係本發明中之第1水平移動部之例。搬送機構34a1之垂直移動部35c係本發明中之第1垂直移動部之例。搬送機構34a1之臂部35d、35f係本發明中之第1臂部之例。搬送機構34a1之旋轉軸線A35d、A35f係本發明中之第1軸線之例。搬送機構34a1之保持部35e、35g係本發明中之第1保持部之例。
The
搬送機構34b1之導軌部35a係本發明中之第2導軌部之例。搬送機構34b1之水平移動部35b係本發明中之第2水平移動部之例。搬送機構34b1之垂直移動部35c係本發明中之第2垂直移動部之例。搬送機構34b1之臂部35d、35f係本發明中之第2臂部之例。搬送機構34b1之旋轉軸線A35d、A35f係本發明中之第2軸線之例。搬送機構34b1之保持部35e、35g係本發明中之第2保持部之例。
The
參照圖1說明熱處理單元38之構造。再者,熱處理單元38a1-38a4、38b1-38b4之構造基本上大致相同。 The structure of the heat treatment unit 38 will be described with reference to FIG. 1. Furthermore, the structures of the heat treatment units 38a1-38a4 and 38b1-38b4 are basically the same.
熱處理單元38具備第1平板39a。第1平板39a具有大致圓盤形狀。將1片基板W載置於第1平板39a。例如,搬送機構34a1可將基板W載置於熱處理單元38a1之第1平板39a。搬送機構34a1可獲取熱處理單元38a1之第1平板39a上之基板W。
The heat treatment unit 38 includes a first
熱處理單元38具備第2平板39b。第2平板39b設置於與第1平板39a大致相同之高度位置。第1平板39a與第2平板39b以排列於大致寬度方向Y之方式配置。第2平板39b具有大致圓盤形狀。將1片基板W載置於第2平板39b。
The heat treatment unit 38 includes a second
熱處理單元38具備未圖示之局部搬送機構。局部搬送機構於第1平板39a與第2平板39b之間搬送基板W。
The heat treatment unit 38 is provided with a local conveying mechanism (not shown). The local transport mechanism transports the substrate W between the first
熱處理單元38具備未圖示之第1調溫部。第1調溫部安裝於第1平板39a及局部搬送機構中之至少任一者。於將第1調溫部安裝於第1平板39a之情形時,第1調溫部調整第1平板39a上之基板W之溫度。於將第1調溫部安裝於局部搬送機構之情形時,第1調溫部調整保持於局部搬送機構之基板W之溫度。第1調溫部將基板W調整為第1溫度。第1調溫部例如將基板W冷卻。第1調溫部例如為熱交換器。熱交換器例如具有供熱媒(冷卻水)流動之流路。
The heat treatment unit 38 includes a first temperature adjustment unit not shown. The first temperature control unit is attached to at least any one of the first
熱處理單元38具備未圖示之第2調溫部。第2調溫部安裝於第2平板39b。第2調溫部調整第2平板39b上之基板W之溫度。第2調溫部將基板W調整為高於第1溫度之第2溫度。第2調溫部例如將基板W加熱。第2調溫部例如為加熱器。
The heat treatment unit 38 includes a second temperature adjustment unit not shown. The second temperature control unit is attached to the second
如上所述,熱處理部37分別對基板W進行熱處理。更詳細而言,熱處理部37a1對基板W進行之熱處理包含疏水化處理、加熱處理及冷卻處理。疏水化處理係一面向基板W供給包含六甲基二矽氮烷(HMDS:Hexamethyldisilazane)之處理氣體,一面將基板W調整為特定之溫度之處理。疏水化處理係為了提高基板W與塗膜之密接性而進行。加熱處理係將基板W加熱。冷卻處理係將基板W冷卻。 As described above, the heat treatment section 37 heats the substrate W, respectively. In more detail, the heat treatment performed on the substrate W by the heat treatment unit 37a1 includes a hydrophobization treatment, a heating treatment, and a cooling treatment. The hydrophobization treatment is a treatment in which a processing gas containing hexamethyldisilazane (HMDS: Hexamethyldisilazane) is supplied to the substrate W and the substrate W is adjusted to a specific temperature. The hydrophobization treatment is performed in order to improve the adhesion between the substrate W and the coating film. The heating process heats the substrate W. The cooling process cools the substrate W.
熱處理部37b1對基板W進行之熱處理包含疏水化處理、加熱處理及冷卻處理。如此,熱處理部37b1對基板W進行之熱處理與熱處理部37a1對基板W進行之熱處理相同。 The heat treatment performed by the heat treatment section 37b1 on the substrate W includes hydrophobization treatment, heating treatment, and cooling treatment. In this way, the heat treatment performed on the substrate W by the heat treatment portion 37b1 is the same as the heat treatment performed on the substrate W by the heat treatment portion 37a1.
熱處理部37a2-37a4、37b2-37b4對基板W進行之熱處理包含疏水化處理、加熱處理及冷卻處理。如此,熱處理部37a2-37a4、37b2-37b4對基板W進行之熱處理與熱處理部37a1對基板W進行之熱處理相同。 The heat treatment of the substrate W by the heat treatment sections 37a2-37a4 and 37b2-37b4 includes hydrophobization treatment, heating treatment, and cooling treatment. In this way, the heat treatment of the substrate W by the heat treatment parts 37a2-37a4 and 37b2-37b4 is the same as the heat treatment of the substrate W by the heat treatment part 37a1.
參照圖2。如上所述,熱處理部37a1具備複數個(例如7個)熱處理單元38a1。此處,1個以上之熱處理單元38a1相當於進行疏水化處理之疏水 化處理單元AHP。其他1個以上之熱處理單元38a1相當於進行加熱處理之加熱單元HP。其餘之1個以上之熱處理單元38a1相當於進行冷卻處理之冷卻單元CP。例如,熱處理部37a1具備2個疏水化處理單元AHP、4個加熱單元HP及1個冷卻單元CP。 Refer to Figure 2. As described above, the heat treatment section 37a1 includes a plurality of (for example, seven) heat treatment units 38a1. Here, more than one heat treatment unit 38a1 is equivalent to the hydrophobic Chemical processing unit AHP. The other one or more heat treatment units 38a1 are equivalent to the heating unit HP for heat treatment. The remaining one or more heat treatment units 38a1 are equivalent to the cooling unit CP for cooling treatment. For example, the heat treatment unit 37a1 includes two hydrophobization treatment units AHP, four heating units HP, and one cooling unit CP.
參照圖2、4。同樣地,熱處理部37a2-37a4、37b1-37b4分別具備2個疏水化處理單元AHP、4個加熱單元HP、1個冷卻單元CP及熱處理單元38。 Refer to Figures 2 and 4. Similarly, the heat treatment parts 37a2-37a4, 37b1-37b4 are provided with two hydrophobization treatment units AHP, four heating units HP, one cooling unit CP, and heat treatment unit 38, respectively.
熱處理單元38之構造於疏水化處理單元AHP、加熱單元HP與冷卻單元CP之間可為不同。例如,疏水化處理單元AHP可進而具備向第2平板39b上之基板W供給處理氣體之氣體供給部。例如,冷卻單元CP亦可不具備第2平板39b、局部搬送機構及第2調溫部。
The structure of the heat treatment unit 38 may be different among the hydrophobization treatment unit AHP, the heating unit HP, and the cooling unit CP. For example, the hydrophobization treatment unit AHP may further include a gas supply unit for supplying processing gas to the substrate W on the second
此處,可將熱處理分類為預處理與後處理。預處理係對進行液體處理前之基板W進行之熱處理。後處理係對進行液體處理後之基板W進行之熱處理。液體處理係於液體處理區塊61中對基板W進行之處理。熱處理部37a1對基板W進行之熱處理可包含預處理及後處理。預處理可包含上述疏水化處理。後處理可包含上述熱處理及冷卻處理。同樣地,熱處理部37a2-37a4、37b1-37b4對基板W進行之熱處理亦可分別包含預處理及後處理。
Here, the heat treatment can be classified into pre-treatment and post-treatment. The pretreatment is a heat treatment performed on the substrate W before liquid treatment. The post-treatment is a heat treatment performed on the substrate W after the liquid treatment. The liquid treatment is the treatment performed on the substrate W in the
熱處理部37a1係本發明中之第1熱處理部之例。熱處理部37b1係本發 明中之第2熱處理部之例。熱處理部37a2係本發明中之第3熱處理部之例。熱處理部37b2係本發明中之第4熱處理部之例。 The heat treatment part 37a1 is an example of the first heat treatment part in the present invention. The heat treatment part 37b1 is the original hair An example of the second heat treatment section in Ming Dynasty. The heat treatment part 37a2 is an example of the third heat treatment part in the present invention. The heat treatment part 37b2 is an example of the fourth heat treatment part in the present invention.
熱處理單元38a1係本發明中之第1熱處理單元之例。熱處理單元38b1係本發明中之第2熱處理單元之例。熱處理單元38a2係本發明中之第3熱處理單元之例。熱處理單元38b2係本發明中之第4熱處理單元之例。 The heat treatment unit 38a1 is an example of the first heat treatment unit in the present invention. The heat treatment unit 38b1 is an example of the second heat treatment unit in the present invention. The heat treatment unit 38a2 is an example of the third heat treatment unit in the present invention. The heat treatment unit 38b2 is an example of the fourth heat treatment unit in the present invention.
參照圖1說明檢查單元42之構造。再者,檢查單元42a1-42a4、42b1-42b4之構造大致相同。 The structure of the inspection unit 42 will be described with reference to FIG. 1. Furthermore, the structures of the inspection units 42a1-42a4 and 42b1-42b4 are substantially the same.
檢查單元42具備平板43a。平板43a具有大致圓盤形狀。將1片基板W載置於平板43a。例如,搬送機構34a1可將基板W載置於檢查單元42a1之平板43a。搬送機構34a1可獲取檢查單元42a1之平板43a上之基板W。
The inspection unit 42 includes a
檢查單元42具備攝像部43b。攝像部43b例如配置於平板43a之上方。攝像部43b拍攝平板43a上之基板W之上表面。
The inspection unit 42 includes an
檢查單元42亦可具備未圖示之驅動部。驅動部使平板43a與攝像部43b中之至少任一者移動,而改變平板43a與攝像部43b之相對位置。藉由驅動部改變平板43a與攝像部43b之相對位置,能夠改變由攝像部43b拍攝之基板W之上表面之範圍。
The inspection unit 42 may also include a drive unit not shown. The driving unit moves at least one of the
檢查單元42基於由攝像部43b拍攝之圖像,檢查基板W之上表面。以下例示由檢查單元42進行之檢查之內容。
The inspection unit 42 inspects the upper surface of the substrate W based on the image taken by the
‧測定基板W之上表面之形狀 ‧Measure the shape of the upper surface of the substrate W
‧特定出基板W之上表面之狀態 ‧Specify the state of the upper surface of the substrate W
‧檢測基板W之上表面之缺陷 ‧Detect defects on the upper surface of substrate W
此處,基板W之上表面意味著包含基板W之上表面自身、形成於基板W之上表面之塗膜、及形成於基板W之上表面之圖案中之至少任一個。上述「測定基板W之上表面之形狀」例如包含測定、檢查形成於基板W之上表面之塗膜之膜厚,或測定、檢查基板W之切邊寬度。 Here, the upper surface of the substrate W means at least any one of the upper surface of the substrate W itself, the coating film formed on the upper surface of the substrate W, and the pattern formed on the upper surface of the substrate W. The aforementioned "measurement of the shape of the upper surface of the substrate W" includes, for example, measuring and inspecting the film thickness of the coating film formed on the upper surface of the substrate W, or measuring and inspecting the width of the cut edge of the substrate W.
參照圖1、7。圖1、7表示處於處理位置之熱處理部37。處理位置係用於對基板W進行熱處理之熱處理部37之位置。 Refer to Figures 1 and 7. Figures 1 and 7 show the heat treatment section 37 in the treatment position. The processing position is the position of the heat treatment portion 37 for heat-treating the substrate W.
將熱處理部37a1之處理位置適宜地稱為處理位置Pa1。同樣地,將熱處理部37a2-37a4、37b1-37b4之處理位置分別適宜地稱為處理位置Pa2-Pa4、Pb1-Pb4。 The processing position of the heat treatment portion 37a1 is appropriately referred to as a processing position Pa1. Similarly, the processing positions of the heat treatment portions 37a2-37a4, 37b1-37b4 are appropriately referred to as processing positions Pa2-Pa4, Pb1-Pb4, respectively.
圖9係例示熱處理部37之維護位置之俯視圖。圖10係例示熱處理部37之維護位置之前視圖。維護位置係用於進行熱處理部37之維護之熱處理部37之位置。維護例如意味著包含熱處理部37之檢查、保養、調整、修理及修繕等。各熱處理部37以可移動至處理位置與維護位置之方式設置。 FIG. 9 is a plan view illustrating the maintenance position of the heat treatment unit 37. FIG. 10 is a front view illustrating the maintenance position of the heat treatment part 37. FIG. The maintenance position is the position of the heat treatment part 37 for performing maintenance of the heat treatment part 37. Maintenance means, for example, including inspection, maintenance, adjustment, repair, and repair of the heat treatment unit 37. Each heat treatment part 37 is installed so that it can move to a processing position and a maintenance position.
將熱處理部37a1之維護位置適宜地稱為維護位置Qa1。同樣地,將熱處理部37a2-37a4、37b1-37b4之維護位置分別適宜地稱為維護位置Qa2-Qa4、Qb1-Qb4。 The maintenance position of the heat treatment portion 37a1 is appropriately referred to as a maintenance position Qa1. Similarly, the maintenance positions of the heat treatment parts 37a2-37a4, 37b1-37b4 are appropriately referred to as maintenance positions Qa2-Qa4, Qb1-Qb4, respectively.
處理位置Pa1係本發明中之第1處理位置之例。處理位置Pb1、Pa2、Pb2分別為本發明中之第2、第3、第4處理位置之例。維護位置Qa1係本發明中之第1維護位置之例。維護位置Qb1、Qa2、Qb2分別為本發明中之第2、第3、第4維護位置之例。 The processing position Pa1 is an example of the first processing position in the present invention. The processing positions Pb1, Pa2, and Pb2 are respectively examples of the second, third, and fourth processing positions in the present invention. The maintenance position Qa1 is an example of the first maintenance position in the present invention. The maintenance positions Qb1, Qa2, and Qb2 are respectively examples of the second, third, and fourth maintenance positions in the present invention.
以下,說明熱處理部37、搬送機構34及檢查部41之支持構造。 Hereinafter, the support structure of the heat treatment unit 37, the transport mechanism 34, and the inspection unit 41 will be described.
參照圖1-4、7、8。熱處理區塊31具備框架45。框架45被設置為熱處理區塊31之骨架(skeleton)。框架45劃定熱處理區塊31之形狀。框架45例如為金屬製。
Refer to Figures 1-4, 7, and 8. The
框架45包含第1框架46及第2框架47。第2框架47配置於與第1框架46大致相同之高度位置。第1框架46與第2框架47以排列於水平方向之方式配置。具體而言,第1框架46與第2框架47以排列於寬度方向Y之方式配置。第2框架47配置於第1框架46之左方。第1框架46劃定熱處理區塊31之右部之形狀。第2框架47劃定熱處理區塊31之左部之形狀。
The
第1框架46支持搬送機構34a1-34a4、熱處理部37a1-37a4及檢查部41a1-41a4。第2框架47支持搬送機構34b1-34b4、熱處理部37b1-37b4及
檢查部41b1-41b4。
The
圖11A係第1框架與第2框架之俯視圖。圖11B係第1框架與第2框架之前視圖。圖11C係第1框架之右側視圖。第1框架46與第2框架47於前視下具有左右對稱之形狀。第1框架46與第2框架47於俯視下分別具有大致矩形形狀。
Fig. 11A is a top view of the first frame and the second frame. Fig. 11B is a front view of the first frame and the second frame. Figure 11C is a right side view of the first frame. The
第1框架46具備基座部48a。基座部48a具有大致水平之板形狀或箱形狀。基座部48a於俯視下具有大致矩形形狀。
The
第1框架46具有複數個(例如4個)支柱48b。支柱48b分別與基座部48a連接。支柱48b分別自基座部48a向上方延伸。
The
第1框架46包含桿48c。桿48c配置於較基座部48a高之位置。桿48c將支柱48b彼此連結。桿48c於大致水平方向上延伸。
The
第1框架46具備空間48d。空間48d由基座部48a、支柱48b及桿48c劃分。空間48d具有大致長方體形狀。
The
第2框架47具有與第1框架46相同之構造。第2框架47具有與第1框架46相同之形狀。第2框架47相當於使第1框架46繞與上下方向Z平行之軸芯旋轉180度所得之構成。第2框架47包含基座部48a、支柱48b、桿48c及空間48d。
The
第1框架46之空間48d係本發明中之「第1框架46之內部」之例。第1框架46之空間48d之外部係本發明中之「第1框架46之外部」之例。第2框架47之空間48d係本發明中之「第2框架47之內部」之例。第2框架47之空間48d之外部係本發明中之「第2框架47之外部」之例。
The
第2框架47與第1框架46連結。具體而言,第2框架47之基座部48a與第1框架46之基座部48a連結。
The
更具體而言,第1框架46之基座部48a具有位於較第1框架46之支柱48b更靠左方之左部。第2框架47之基座部48a具有位於較第2框架47之支柱48b更靠右方之右部。第2框架47之基座部48a之右部與第1框架46之基座部48a之左部連結。第2框架47之支柱48b不與第1框架46之支柱48b接觸。第2框架47之支柱48b配置於第1框架46之支柱48b之左方。
More specifically, the
第2框架47可與第1框架46分離。
The
搬送空間32形成於第1框架46與第2框架47之間。具體而言,搬送空間32形成於第1框架46之左方且第2框架47之右方。更詳細而言,搬送空間32形成於第1框架46之支柱48b之左方且較第2框架47之支柱48b更靠右方。
The
參照圖2-4、7、9、10。熱處理區塊31具備複數個(例如8個)可動構
件51a1、51a2、51a3、51a4、51b1、51b2、51b3、51b4。於不區分可動構件51a1-51a4、51b1-51b4之情形時,將可動構件51a1-51a4、51b1-51b4統稱為可動構件51。
Refer to Figures 2-4, 7, 9, and 10. The
可動構件51a1-51a4支持於第1框架46。可動構件51a1-51a4可相對於第1框架46移動。可動構件51b1-51b4支持於第2框架47。可動構件51b1-51b4可相對於第2框架47移動。
The movable members 51a1-51a4 are supported by the
熱處理區塊31具備複數個引導部55及複數個滑動部56。引導部55固定於第1框架46及第2框架47。引導部55例如固定於第1框架46及第2框架47之桿48c。滑動部56個別地固定於可動構件51a1-51a4、51b1-51b4。各滑動部56僅固定於可動構件51a1-51a4、51b1-51b4中之任一者。各滑動部56支持於引導部55。固定於可動構件51a1-51a4之滑動部56由固定於第1框架46之引導部55支持。經由引導部55與滑動部56,可動構件51a1-51a4支持於第1框架46。固定於可動構件51b1-51b4之滑動部56由固定於第2框架47之引導部55支持。經由引導部55與滑動部56,可動構件51b1-51b4支持於第2框架47。
The
各滑動部56可相對於引導部55移動。具體而言,滑動部56可相對於引導部55滑動。滑動部56例如可相對於引導部55於大致寬度方向Y上移動。藉由滑動部56相對於引導部55移動,各可動構件51相對於框架45移動。例如,藉由固定於可動構件51a1之滑動部56相對於引導部55移動,可動構件51a1相對於第1框架46移動。例如,藉由固定於可動構件51b1之
滑動部56相對於引導部55移動,可動構件51b1相對於第2框架47移動。
Each sliding
各滑動部56可相互獨立地相對於引導部55移動。因此,各可動構件51可相互獨立地相對於第1框架46及第2框架47中之至少任一者移動。
The sliding
圖12A係可動構件51a1之俯視圖。圖12B係可動構件51a1之前視圖。圖12C係可動構件51a1之右側視圖。以下,說明可動構件51a1之構造。 Fig. 12A is a plan view of the movable member 51a1. Fig. 12B is a front view of the movable member 51a1. Fig. 12C is a right side view of the movable member 51a1. Hereinafter, the structure of the movable member 51a1 is demonstrated.
可動構件51a1具備底板52a。底板52a具有大致水平之板形狀。底板52a於俯視下具有大致矩形形狀。上述滑動部56例如固定於底板52a。
The movable member 51a1 includes a
可動構件51具備複數個(例如4個)支柱52b。支柱52b分別與底板52a連接。支柱52b分別自底板52a向上方延伸。
The
可動構件51具備複數個(例如2個)擱板52c。各擱板52c配置於底板52a之上方。各擱板52c支持於支柱52b。各擱板52c具有大致水平之板形狀。各擱板52c於俯視下較底板52a小。
The
可動構件51具備複數個壁部52d。壁部52d與擱板52c連接。壁部52d具有大致垂直之板形狀。具體而言,壁部52d具有與前後方向X大致垂直之板形狀。擱板52c與壁部52d將底板52a之上方之空間分成複數個(例如9個)小空間(槽)52e。複數個槽52e於側視下配置為矩陣狀。
The
可動構件51具備1個頂板52f。頂板52f配置於擱板52c之上方。頂板52f配置於槽52e之上方。頂板52f支持於支柱52b。頂板52f具有大致水平之板形狀。頂板52f於俯視下較底板52a小。頂板52f於俯視下具有與擱板52c大致相同之寬度。
The
可動構件51a2-51a4、51b1-51b4具備與可動構件51a1大致相同之構造。 The movable members 51a2-51a4 and 51b1-51b4 have substantially the same structure as the movable member 51a1.
參照圖2、7、9、10。可動構件51a1支持熱處理部37a1。具體而言,熱處理單元38a1設置於可動構件51a1之底板52a上及擱板52c上。各熱處理單元38a1配置於1個槽52e中。各熱處理單元38a1於俯視下與擱板52c及頂板52f重疊。
Refer to Figures 2, 7, 9, 10. The movable member 51a1 supports the heat treatment portion 37a1. Specifically, the heat treatment unit 38a1 is provided on the
參照圖3、7、9、10。可動構件51a1支持搬送機構34a1。具體而言,搬送機構34a1設置於可動構件51a1之底板52a上。搬送機構34a1於俯視下不與擱板52c及頂板52f重疊。更詳細而言,搬送機構34a1之導軌部35a設置於可動構件51a1之底板52a上。搬送機構34a1之導軌部35a於俯視下不與擱板52c及頂板52f重疊。搬送機構34a1之導軌部35a固定於第1可動構件51a1(具體而言為底板52a)。
Refer to Figures 3, 7, 9, and 10. The movable member 51a1 supports the conveying mechanism 34a1. Specifically, the conveyance mechanism 34a1 is provided on the
參照圖2。可動構件51a1支持檢查部41a1。例如,1個檢查單元42a1載置於可動構件51a1之擱板52c上。檢查單元42a1配置於1個槽52e中。檢查單元42a1於俯視下與擱板52c及頂板52f重疊。
Refer to Figure 2. The movable member 51a1 supports the inspection part 41a1. For example, one inspection unit 42a1 is placed on the
熱處理區塊31具備電氣裝置部57a1。可動構件51a1支持電氣裝置部57a1。例如,電氣裝置部57a1載置於可動構件51a1之擱板52c上。電氣裝置部57a1配置於可動構件51a1之1個槽52e中。電氣裝置部57a1於俯視下與擱板52c及頂板52f重疊。
The
此處,電氣裝置部57a1係與搬送機構34a1、熱處理部37a1及檢查部41a1中之至少任一者相關聯之電氣零件。電氣裝置部57a1例如對搬送機構34a1、熱處理部37a1及檢查部41a1中之至少任一者進行電氣控制。電氣裝置部57a1例如對搬送機構34a1、熱處理部37a1及檢查部41a1中之至少任一者供給電力。 Here, the electric device part 57a1 is an electric component associated with at least any one of the conveyance mechanism 34a1, the heat treatment part 37a1, and the inspection part 41a1. The electric device part 57a1 electrically controls at least any one of the conveyance mechanism 34a1, the heat treatment part 37a1, and the inspection part 41a1, for example. The electric device part 57a1 supplies electric power to at least any one of the conveyance mechanism 34a1, the heat processing part 37a1, and the inspection part 41a1, for example.
參照圖2、4、7、9、10。同樣地,可動構件51a2-51a4、51b1-51b4分別支持熱處理部37a2-37a4、37b1-37b4、搬送機構34a2-34a4、34b1-34b4及檢查部41a2-41a4、41b1-41b4。 Refer to Figures 2, 4, 7, 9, 10. Similarly, the movable members 51a2-51a4, 51b1-51b4 respectively support the heat treatment parts 37a2-37a4, 37b1-37b4, the conveying mechanisms 34a2-34a4, 34b1-34b4, and the inspection parts 41a2-41a4, 41b1-41b4.
熱處理區塊31具備電氣裝置部57a2-57a4、57b1-57b4。可動構件51a2-51a4、51b1-51b4分別支持電氣裝置部57a2-57a4、57b1-57b4。於不區分電氣裝置部57a1-57a4、57b1-57b4之情形時,將電氣裝置部57a1-57a4、57b1-57b4統稱為電氣裝置部57。
The
如上所述,第1框架46經由可動構件51a1支持搬送機構34a1、熱處理部37a1、檢查部41a1及電氣裝置部57a1。同樣地,第1框架46經由可動構
件51a2-51a4支持搬送機構34a2-34a4、熱處理部37a2-37a4、檢查部41a2-41a4及電氣裝置部57a2-57a4。第2框架47經由可動構件51b1-51b4支持搬送機構34b1-34b4、熱處理部37b1-37b4、檢查部41b1-41b4及電氣裝置部57b1-57b4。
As described above, the
熱處理部37a1配置於較搬送機構34a1更遠離第2框架47之位置。搬送機構34a1配置於熱處理部37a1與第2框架47之間。具體而言,搬送機構34a1於寬度方向Y上配置於熱處理部37a1與第2框架47之間。同樣地,熱處理部37a2-37a4配置於較搬送機構34a2-34a4更遠離第2框架47之位置。搬送機構34a2-34a4配置於熱處理部37a2-37a4與第2框架47之間。
The heat treatment part 37a1 is arranged at a position farther from the
熱處理部37b1配置於較搬送機構34b1更遠離第1框架46之位置。搬送機構34b1配置於熱處理部37b1與第1框架46之間。具體而言,搬送機構34b1於寬度方向Y上配置於熱處理部37b1與第1框架46之間。同樣地,熱處理部37b2-37b4配置於較搬送機構34b2-34b4更遠離第1框架46之位置。搬送機構34b2-34b4配置於熱處理部37b2-37b4與第1框架46之間。
The heat treatment portion 37b1 is arranged at a position farther from the
參照圖1、7、9、10。藉由可動構件51a1相對於第1框架46移動,熱處理部37a1相對於第1框架46移動。具體而言,藉由可動構件51a1相對於第1框架46移動,熱處理部37a1相對於第1框架46於大致水平方向上移動。更具體而言,藉由可動構件51a1相對於第1框架46移動,熱處理部37a1相對於第1框架46於大致寬度方向Y上移動。
Refer to Figures 1, 7, 9, 10. As the movable member 51a1 moves relative to the
藉由可動構件51a1相對於第1框架46移動,熱處理部37a1與搬送機構34a1、檢查部41a1及電氣裝置部57a1一體地移動。
As the movable member 51a1 moves with respect to the
藉由可動構件51a1相對於第1框架46移動,熱處理部37a1可移動至處理位置Pa1與維護位置Qa1。再者,於熱處理部37a1移動至處理位置Pa1及維護位置Qa1時,可動構件51a1未自第1框架46脫離,而保持為支持於第1框架46之狀態。因此,第1框架46可經由可動構件51a1於處理位置Pa1支持熱處理部37a1。進而,第1框架46可經由可動構件51a1於維護位置Qa1支持熱處理部37a1。
By moving the movable member 51a1 with respect to the
維護位置Qa1係與處理位置Pa1大致相同之高度位置。維護位置Qa1為處理位置Pa1之右方。藉由熱處理部37a1向右方移動,熱處理部37a1可自處理位置Pa1移動至維護位置Qa1。藉由熱處理部37a1向左方移動,熱處理部37a1可自維護位置Qa1移動至處理位置Pa1。 The maintenance position Qa1 is substantially the same height position as the processing position Pa1. The maintenance position Qa1 is to the right of the processing position Pa1. By moving the heat treatment part 37a1 to the right, the heat treatment part 37a1 can move from the treatment position Pa1 to the maintenance position Qa1. By moving the heat treatment part 37a1 to the left, the heat treatment part 37a1 can be moved from the maintenance position Qa1 to the treatment position Pa1.
於熱處理部37a1處於處理位置Pa1時,所有熱處理部37a1均位於第1框架46之空間48d。即,於熱處理部37a1處於處理位置Pa1時,所有熱處理部37a1均位於第1框架46之內部。
When the heat treatment part 37a1 is at the treatment position Pa1, all the heat treatment parts 37a1 are located in the
於熱處理部37a1處於維護位置Qa1時,熱處理部37a1之至少一部分位於第1框架46之空間48d之外部。即,於熱處理部37a1處於維護位置Qa1時,熱處理部37a1之至少一部分位於第1框架46之外部。於熱處理部37a1處於維護位置Qa1時位於第1框架46之外部之熱處理部37a1之部分較於熱
處理部37a1處於處理位置Pa1時位於第1框架46之外部之熱處理部37a1之部分大。於熱處理部37a1處於維護位置Qa1時,熱處理部37a1之至少一部分位於第1框架46之右方。較佳為於熱處理部37a1處於維護位置Qa1時,熱處理部37a1之一半以上位於第1框架46之外部。
When the heat treatment part 37a1 is in the maintenance position Qa1, at least a part of the heat treatment part 37a1 is located outside the
再者,於熱處理部37a1處於維護位置Qa1時,所有熱處理部37a1均位於第2框架47之外部。即便於熱處理部37a1處於處理位置Pa1時,所有熱處理部37a1亦均位於第2框架47之外部。
Furthermore, when the heat treatment part 37a1 is at the maintenance position Qa1, all the heat treatment parts 37a1 are located outside the
再次對可動構件51a1與熱處理部37a1進行說明。將自第2框架47朝向第1框架46之方向稱為第1方向。於本實施形態中,第1方向為右方。藉由可動構件51a1相對於第1框架46移動,熱處理部37a1可相對於第1框架46朝第1方向移動。藉由可動構件51a1相對於第1框架46移動,可動構件51a1可將熱處理部37a1之至少一部分自第1框架46朝第1方向拉出。
The movable member 51a1 and the heat treatment portion 37a1 will be described again. The direction from the
於熱處理部37a1處於處理位置Pa1時,所有檢查部41a1均位於第1框架46之內部。於熱處理部37a1處於處理位置Pa1時,所有電氣裝置部57a1均位於第1框架46之內部。於熱處理部37a1處於維護位置Qa1時,檢查部41a1之至少一部分位於第1框架46之外部。於熱處理部37a1處於維護位置Qa1時,電氣裝置部57a1之至少一部分位於第1框架46之外部。
When the heat treatment part 37a1 is at the treatment position Pa1, all the inspection parts 41a1 are located inside the
藉由可動構件51b1相對於第2框架47移動,熱處理部37b1相對於第2框架47移動。具體而言,藉由可動構件51b1相對於第2框架47移動,熱處
理部37b1相對於第2框架47於大致水平方向上移動。更具體而言,藉由可動構件51b1相對於第2框架47移動,熱處理部37b1相對於第2框架47於大致寬度方向Y上移動。
As the movable member 51b1 moves relative to the
藉由可動構件51b1相對於第2框架47移動,熱處理部37b1與搬送機構34b1、檢查部41b1及電氣裝置部57b1一體地移動。
As the movable member 51b1 moves with respect to the
藉由可動構件51b1相對於第2框架47移動,熱處理部37b1可移動至處理位置Pb1與維護位置Qb1。再者,於熱處理部37b1移動至處理位置Pb1及維護位置Qb1時,可動構件51b1未自第2框架47脫離,而保持為支持於第2框架47之狀態。因此,第2框架47可經由可動構件51b1於處理位置Pb1支持熱處理部37b1。進而,第2框架47可經由可動構件51b1於維護位置Qb1支持熱處理部37b1。
By moving the movable member 51b1 with respect to the
維護位置Qb1係與處理位置Pb1大致相同之高度位置。維護位置Qb1為處理位置Pb1之左方。藉由熱處理部37b1向左方移動,熱處理部37b1可自處理位置Pb1移動至維護位置Qb1。藉由熱處理部37b1向右方移動,熱處理部37b1可自維護位置Qb1移動至處理位置Pb1。 The maintenance position Qb1 is substantially the same height position as the processing position Pb1. The maintenance position Qb1 is to the left of the processing position Pb1. By moving the heat treatment part 37b1 to the left, the heat treatment part 37b1 can be moved from the treatment position Pb1 to the maintenance position Qb1. By moving the heat treatment part 37b1 to the right, the heat treatment part 37b1 can be moved from the maintenance position Qb1 to the treatment position Pb1.
於熱處理部37b1處於處理位置Pb1時,所有熱處理部37b1均位於第2框架47之內部。
When the heat treatment part 37b1 is at the treatment position Pb1, all the heat treatment parts 37b1 are located inside the
於熱處理部37b1處於維護位置Qb1時,熱處理部37b1之至少一部分
位於第2框架47之外部。如此,於熱處理部37b1處於維護位置Qa1時位於第2框架47之外部之熱處理部37b1之部分較於熱處理部37b1處於處理位置Pb1時位於第2框架47之外部之熱處理部37b1之部分大。於熱處理部37b1處於維護位置Qb1時,熱處理部37b1之至少一部分位於第2框架47之左方。較佳為於熱處理部37b1處於維護位置Qb1時,熱處理部37b1之一半以上位於第2框架47之外部。
When the heat treatment part 37b1 is at the maintenance position Qb1, at least a part of the heat treatment part 37b1
Located outside the
再者,於熱處理部37b1處於維護位置Qb1時,所有熱處理部37b1均位於第1框架46之外部。於熱處理部37b1處於處理位置Pb1時,所有熱處理部37b1亦均位於第1框架46之外部。
Furthermore, when the heat treatment part 37b1 is at the maintenance position Qb1, all the heat treatment parts 37b1 are located outside the
再次對可動構件51b1與熱處理部37b1進行說明。將與第1方向相反之方向稱為第2方向。於本實施形態中,第2方向為左方。藉由可動構件51b1相對於第2框架47移動,熱處理部37b1可相對於第2框架47朝第2方向移動。藉由可動構件51b1相對於第2框架47移動,可動構件51b1可將熱處理部37b1之至少一部分自第2框架47朝第2方向拉出。
The movable member 51b1 and the heat treatment portion 37b1 will be described again. The direction opposite to the first direction is referred to as the second direction. In this embodiment, the second direction is the left. As the movable member 51b1 moves relative to the
於熱處理部37b1處於處理位置Pb1時,所有檢查部41b1均位於第2框架47之內部。於熱處理部37b1處於處理位置Pb1時,所有電氣裝置部57b1均位於第2框架47之內部。於熱處理部37b1處於維護位置Qb1時,檢查部41b1之至少一部分位於第2框架47之外部。於熱處理部37b1處於維護位置Qb1時,電氣裝置部57b1之至少一部分位於第2框架47之外部。
When the heat treatment part 37b1 is at the treatment position Pb1, all the inspection parts 41b1 are located inside the
可動構件51a2-51a4與可動構件51a1同樣地移動。可動構件51b2-51b4與可動構件51b1同樣地移動。 The movable members 51a2-51a4 move in the same manner as the movable member 51a1. The movable members 51b2-51b4 move in the same manner as the movable member 51b1.
熱處理部37a2-37a4與熱處理部37a1同樣地移動。維護位置Qa2位於維護位置Qa1之上方。維護位置Qa3位於維護位置Qa2之上方。維護位置Qa4位於維護位置Qa3之上方。 The heat treatment part 37a2-37a4 moves in the same manner as the heat treatment part 37a1. The maintenance position Qa2 is located above the maintenance position Qa1. The maintenance position Qa3 is located above the maintenance position Qa2. The maintenance position Qa4 is located above the maintenance position Qa3.
熱處理部37b2-37b4與熱處理部37b1同樣地移動。維護位置Qb2位於維護位置Qb1之上方。維護位置Qb3位於維護位置Qb2之上方。維護位置Qb4位於維護位置Qb3之上方。 The heat treatment part 37b2-37b4 moves in the same manner as the heat treatment part 37b1. The maintenance position Qb2 is located above the maintenance position Qb1. The maintenance position Qb3 is located above the maintenance position Qb2. The maintenance position Qb4 is located above the maintenance position Qb3.
熱處理部37a1-37a4、37b1-37b4可相互獨立地移動。熱處理部37a1-37a4、37b1-37b4可互不干涉地移動至維護位置Qa1-Qa4、Qb1-Qb4。 The heat treatment parts 37a1-37a4, 37b1-37b4 can move independently of each other. The heat treatment parts 37a1-37a4, 37b1-37b4 can move to the maintenance positions Qa1-Qa4, Qb1-Qb4 without interfering with each other.
可動構件51a1係本發明中之第1可動構件之例。可動構件51b1係本發明中之第2可動構件之例。可動構件51a2係本發明中之第3可動構件之例。可動構件51b2係本發明中之第4可動構件之例。 The movable member 51a1 is an example of the first movable member in the present invention. The movable member 51b1 is an example of the second movable member in the present invention. The movable member 51a2 is an example of the third movable member in the present invention. The movable member 51b2 is an example of the fourth movable member in the present invention.
參照圖1-4。液體處理區塊61具有大致箱形狀。液體處理區塊61於俯視及側視下為大致矩形。雖然省略了圖示,但液體處理區塊61於前視下亦為大致矩形。
Refer to Figure 1-4. The
液體處理區塊61具有框架62。框架62被設置為液體處理區塊61之骨架(skeleton)。框架62劃定液體處理區塊61之形狀。框架62例如為金屬製。
The
液體處理區塊61具備搬送空間63。搬送空間63於俯視下配置於寬度方向Y上之液體處理區塊61之中央部。搬送空間63於大致前後方向X上延伸。搬送空間63與熱處理區塊31之搬送空間32相接。
The
液體處理區塊61具備液體處理用搬送機構67。液體處理用搬送機構67設置於搬送空間63中。即,液體處理用搬送機構67配置於熱處理用搬送機構33之後方。液體處理用搬送機構67搬送基板W。
The
參照圖3。搬送空間63具備2個搬送空間64a、64b。搬送空間64b配置於搬送空間64a之上方。
Refer to Figure 3. The
液體處理區塊61具備間隔壁65。間隔壁65具有水平之板形狀。間隔壁65配置於搬送空間64a與搬送空間64b之邊界。間隔壁65將搬送空間64a與搬送空間64b隔開。
The
液體處理用搬送機構67包含2個搬送機構68a、68b。搬送機構68a、68b以排列於上下方向Z之方式配置。搬送機構68b配置於搬送機構68a之上方。搬送機構68a設置於搬送空間64a中。搬送機構68a配置於間隔壁65之下方。搬送機構68b設置於搬送空間64b中。搬送機構68b配置於間隔壁
65之上方。搬送機構68a、68b分別搬送基板W。搬送機構68a可與搬送機構68b獨立地搬送基板W。
The liquid
參照圖1、3。搬送機構68a具備支柱69a、69b、垂直移動部69c、水平移動部69d、旋轉部69e及保持部69f、69g。支柱69a、69b支持於框架62。支柱69a、69b固定於框架62。支柱69a、69b無法相對於框架62移動。支柱69b配置於與支柱69a大致相同之高度位置。支柱69a、69b以排列於大致前後方向X之方式配置。支柱69a配置於搬送空間64a之左前部。支柱69b配置於搬送空間64a之左後部。支柱69a、69b於上下方向Z上延伸。垂直移動部69c支持於支柱69a、69b。垂直移動部69c可相對於支柱69a、69b於大致上下方向Z上移動。垂直移動部69c於大致前後方向X上延伸。水平移動部69d支持於垂直移動部69c。水平移動部69d可相對於垂直移動部69c於大致前後方向X上移動。旋轉部69e支持於水平移動部69d。旋轉部69e可相對於水平移動部69d繞旋轉軸線A69e旋轉。旋轉軸線A69e係與大致上下方向Z平行之假想線。旋轉軸線A69e例如位於水平移動部69d之右方。保持部69f、69g支持於旋轉部69e。保持部69f、69g可相對於旋轉部69e進退移動。更具體而言,保持部69f、69g可於由旋轉部69e之朝向決定之水平之一方向上往復移動。水平之一方向例如為旋轉軸線A69e之徑向。保持部69f、69g可相互獨立地進退移動。保持部69f、69g分別將1片基板W以水平姿勢保持。
Refer to Figures 1 and 3. The
如此,保持部69f、69g可於前後方向X及上下方向Z上平行移動。保持部69f、69g可繞旋轉軸線A69e旋轉。保持部69f、69g可相對於旋轉部
69e進退移動。
In this way, the holding
搬送機構68b具有與搬送機構68a大致相同之構造。即,搬送機構68b具備支柱69a、69b、垂直移動部69c、水平移動部69d、旋轉部69e及保持部69f、69g。
The conveying
參照圖1。液體處理區塊61具備液體處理部71。液體處理部71配置於搬送空間63之側方。液體處理部71配置於與液體處理用搬送機構67鄰接之位置。液體處理部71配置於與液體處理用搬送機構67大致相同之高度位置。液體處理部71配置於與液體處理用搬送機構67於大致寬度方向Y上並排之位置。具體而言,液體處理部71配置於液體處理用搬送機構67之右方之位置及液體處理用搬送機構67之左方之位置。
Refer to Figure 1. The
參照圖8。液體處理部71配置於熱處理用搬送機構33可搬送基板W之區域之外部。液體處理部71配置於區域Ba之外部。具體而言,下述旋轉保持部75a配置於區域Ba之外部。液體處理部71配置於區域Bb之外部。具體而言,下述旋轉保持部75a配置於區域Bb之外部。同樣地,液體處理部71配置於搬送機構34a2-34a4、34b2-34b4可搬送基板W之區域之外部。
Refer to Figure 8. The
液體處理部71對基板W進行液體處理。液體處理係向基板W供給處理液之處理。液體處理例如為塗佈處理。處理液例如為塗膜材料。塗佈處理係對基板W塗佈塗膜材料,於基板W上形成塗膜之處理。塗膜材料例如為抗蝕劑膜材料。塗膜例如為抗蝕劑膜。
The
參照圖1-4。液體處理部71具備複數個(例如2個)液體處理部72、73。液體處理部72配置於與搬送機構68a大致相同之高度位置。液體處理部72配置於間隔壁65之下方。液體處理部73配置於與搬送機構68b大致相同之高度位置。液體處理部73配置於間隔壁65之上方。搬送機構68a將基板W搬送至液體處理部72。搬送機構68b將基板W搬送至液體處理部73。
Refer to Figure 1-4. The
液體處理部72配置於與搬送機構68a鄰接之位置。液體處理部72具備配置於搬送機構68a之右方之液體處理部72R、及配置於搬送機構68a之左方之液體處理部72L。液體處理部73配置於與搬送機構68b鄰接之位置。液體處理部73具備配置於搬送機構68b之右方之液體處理部73R、及配置於搬送機構68b之左方之液體處理部73L。
The
液體處理部72R、73R以排列於上下方向Z之方式配置。液體處理部73R配置於液體處理部72R之上方。液體處理部72L、73L以排列於上下方向Z之方式配置。液體處理部73L配置於液體處理部72L之上方。
The
液體處理部72R具備複數個(例如4個)液體處理單元74。液體處理部72R之液體處理單元74於前後方向X及上下方向Z上配置為矩陣狀。例如,2個液體處理單元74配置於液體處理部72R之下段。其餘之2個液體處理單元74配置於液體處理部72R之上段。配置於液體處理部72R之下段之2個液體處理單元74以排列於前後方向X之方式配置。配置於液體處理部72R之上段之2個液體處理單元74以排列於前後方向X之方式配置。配置於
液體處理部72R之上段之2個液體處理單元74於俯視下與配置於液體處理部72R之下段之2個液體處理單元74重疊。配置於液體處理部72R之下段之2個液體處理單元74收容於一個腔室76中。配置於液體處理部72R之上段之2個液體處理單元74收容於另一個腔室76中。
The
液體處理部72L具備複數個(例如4個)液體處理單元74。液體處理部72L之液體處理單元74除為左右對稱之方面以外,配置為與液體處理部72R之液體處理單元74相同。
The
液體處理部73R具備複數個(例如4個)液體處理單元74。液體處理部73R之液體處理單元74配置為與液體處理部72R之液體處理單元74相同。
The
液體處理部73L具備複數個(例如4個)液體處理單元74。液體處理部73L之液體處理單元74除為左右對稱之方面以外,配置為與液體處理部72R之液體處理單元74相同。
The
液體處理單元74具備旋轉保持部75a、噴嘴75b及承杯75c。旋轉保持部75a將1片基板W以水平姿勢保持。例如,搬送機構68a可將基板W載置於液體處理部72之液體處理單元74之旋轉保持部75a。例如,搬送機構68a可獲取液體處理部72之液體處理單元74之旋轉保持部75a上之基板W。旋轉保持部75a可使所保持之基板W繞與上下方向Z平行之軸線旋轉。噴嘴75b向基板W噴出處理液。處理液例如為塗佈液。噴嘴75b設置為可移動至處理位置與退避位置。處理位置為保持於旋轉保持部75a之基板W
之上方之位置。於噴嘴75b處於處理位置時,噴嘴75b於俯視下與保持於旋轉保持部75a之基板W重疊。於噴嘴75b處於退避位置時,噴嘴75b於俯視下不與保持於旋轉保持部75a之基板W重疊。承杯75c配置於旋轉保持部75a之周圍。承杯75c回收處理液。
The
參照圖1、3、6、8。前載置部81跨及移載傳送部21與熱處理區塊31配置。前載置部81跨及移載傳送部21之搬送空間23與熱處理區塊31之搬送空間32而配置。
Refer to Figures 1, 3, 6, and 8. The
前載置部81配置於移載傳送用搬送機構25之後方。前載置部81配置於搬送機構26a之左方且後方。前載置部81配置於搬送機構26b之右方且後方。移載傳送用搬送機構25於載具C與前載置部81之間搬送基板W。
The front mounting
前載置部81配置於熱處理用搬送機構33之前方。
The front mounting
前載置部81具備複數個(例如8個)載置部82a1、82a2、82a3、82a4、82b1、82b2、82b3、82b4。於不區分載置部82a1-82a4、82b1-82b4之情形時,將載置部82a1-82a4、82b1-82b4統稱為載置部82。各載置部82供載置基板W。移載傳送用搬送機構25可將基板W載置於各載置部82。具體而言,搬送機構26a、26b分別可將基板W載置於各載置部82。移載傳送用搬送機構25可獲取各載置部82上之基板W。具體而言,搬送機構26a、26b分別可獲取各載置部82上之基板W。
The front mounting
複數個載置部82以排列於大致上下方向Z之方式配置。載置部82b1於俯視下與載置部82a1重疊。同樣地,載置部82a2-82a4、82b2-82b4於俯視下與載置部82a1重疊。各載置部82配置於與假想面K交叉之位置(參照圖8)。
The plurality of placing
載置部82a2、82b2配置於載置部82a1、82b1之上方。載置部82a3、82b3配置於載置部82a2、82b2之上方。載置部82a4、82b4配置於載置部82a3、82b3之上方。 The placement portions 82a2 and 82b2 are arranged above the placement portions 82a1 and 82b1. The placement portions 82a3 and 82b3 are arranged above the placement portions 82a2 and 82b2. The placement portions 82a4 and 82b4 are arranged above the placement portions 82a3 and 82b3.
載置部82a1、82b1配置於與搬送機構34a1、34b1大致相同之高度位置。載置部82a1、82b1配置於搬送機構34a1之前方且左方。載置部82a1、82b1配置於搬送機構34b1之前方且右方。搬送機構34a1、34b1分別可將基板W載置於載置部82a1、82b1。搬送機構34a1、34b1分別可獲取載置部82a1、82b1上之基板W。 The mounting portions 82a1, 82b1 are arranged at substantially the same height positions as the conveying mechanisms 34a1, 34b1. The mounting portions 82a1 and 82b1 are arranged in front of and on the left of the conveying mechanism 34a1. The placing portions 82a1 and 82b1 are arranged in front of and on the right of the conveying mechanism 34b1. The conveyance mechanisms 34a1 and 34b1 can place the substrate W on the mounting portions 82a1 and 82b1, respectively. The conveying mechanisms 34a1 and 34b1 can respectively obtain the substrate W on the placing portions 82a1 and 82b1.
載置部82a2、82b2與搬送機構34a2、34b2之相對位置關係和載置部82a1、82b1與搬送機構34a1、34b1之相對位置關係相同。載置部82a3、82b3與搬送機構34a3、34b3之相對位置關係和載置部82a1、82b1與搬送機構34a1、34b1之相對位置關係相同。載置部82a4、82b4與搬送機構34a4、34b4之相對位置關係和載置部82a1、82b1與搬送機構34a1、34b1之相對位置關係相同。 The relative positional relationship between the placing portions 82a2, 82b2 and the conveying mechanisms 34a2, 34b2 is the same as the relative positional relationship between the placing portions 82a1, 82b1 and the conveying mechanisms 34a1, 34b1. The relative positional relationship between the placing portions 82a3 and 82b3 and the conveying mechanisms 34a3 and 34b3 is the same as the relative positional relationship between the placing portions 82a1 and 82b1 and the conveying mechanisms 34a1 and 34b1. The relative positional relationship between the placing portions 82a4 and 82b4 and the conveying mechanisms 34a4 and 34b4 is the same as the relative positional relationship between the placing portions 82a1 and 82b1 and the conveying mechanisms 34a1 and 34b1.
各載置部82具備複數個(例如2個)平板85。複數個平板85以排列於大致上下方向Z之方式配置。1片基板W載置於1個平板85上。因此,各載置部82可載置複數個基板W。
Each mounting
載置部82a1係本發明中之第1前載置部之例。載置部82b1係本發明中之第2前載置部之例。載置部82a2係本發明中之第3前載置部之例。載置部82b2係本發明中之第4前載置部之例。 The placement portion 82a1 is an example of the first front placement portion in the present invention. The placement portion 82b1 is an example of the second front placement portion in the present invention. The placement portion 82a2 is an example of the third front placement portion in the present invention. The placement portion 82b2 is an example of the fourth front placement portion in the present invention.
參照圖1、3、8。後載置部83跨及熱處理區塊31與液體處理區塊61而配置。後載置部83跨及熱處理區塊31之搬送空間32與液體處理區塊61之搬送空間63而配置。
Refer to Figures 1, 3 and 8. The
後載置部83配置於熱處理用搬送機構33之後方。後載置部83配置於液體處理用搬送機構67之前方。
The
後載置部83具備複數個(例如8個)載置部84a1、84a2、84a3、84a4、84b1、84b2、84b3、84b4。於不區分載置部84a1-84a4、84b1-84b4之情形時,將載置部84a1-84a4、84b1-84b4統稱為載置部84。各載置部84供載置基板W。液體處理用搬送機構67可將基板W載置於各載置部84。液體處理用搬送機構67可獲取各載置部84上之基板W。
The
複數個載置部84以排列於大致上下方向Z之方式配置。載置部84b1於 俯視下與載置部84a1重疊。同樣地,載置部84a2-84a4、84b2-84b4於俯視下與載置部84a1重疊。各載置部84配置於與假想面K交叉之位置(參照圖8)。 The plurality of placing parts 84 are arranged so as to be arranged in the substantially vertical direction Z. The placement part 84b1 is It overlaps with the placing part 84a1 in a plan view. Similarly, the placement portions 84a2-84a4 and 84b2-84b4 overlap the placement portion 84a1 in a plan view. Each placement part 84 is arrange|positioned at the position which cross|intersects the virtual plane K (refer FIG. 8).
載置部84a2、84b2配置於載置部84a1、84b1之上方。載置部84a3、84b3配置於載置部84a2、84b2之上方。載置部84a4、84b4配置於載置部84a3、84b3之上方。 The placing portions 84a2, 84b2 are arranged above the placing portions 84a1, 84b1. The placement portions 84a3 and 84b3 are arranged above the placement portions 84a2 and 84b2. The placement portions 84a4 and 84b4 are arranged above the placement portions 84a3 and 84b3.
載置部84a1、84b1配置於與搬送機構34a1、34b1大致相同之高度位置。載置部84a1、84b1配置於搬送機構34a1之後方且左方。載置部84a1、84b1配置於搬送機構34b1之後方且右方。搬送機構34a1、34b1分別可將基板W載置於載置部84a1、84b1。搬送機構34a1、34b1分別可獲取載置部84a1、84b1上之基板W。 The mounting portions 84a1, 84b1 are arranged at substantially the same height positions as the conveying mechanisms 34a1, 34b1. The mounting portions 84a1 and 84b1 are arranged behind and on the left of the conveying mechanism 34a1. The mounting portions 84a1 and 84b1 are arranged behind and on the right side of the conveying mechanism 34b1. The transport mechanisms 34a1 and 34b1 can respectively place the substrate W on the mounting portions 84a1 and 84b1. The conveying mechanisms 34a1 and 34b1 can respectively obtain the substrate W on the placing portions 84a1 and 84b1.
載置部84a2、84b2與搬送機構34a2、34b2之相對位置關係和載置部84a1、84b1與搬送機構34a1、34b1之相對位置關係相同。載置部84a3、84b3與搬送機構34a3、34b3之相對位置關係和載置部84a1、84b1與搬送機構34a1、34b1之相對位置關係相同。載置部84a4、84b4與搬送機構34a4、34b4之相對位置關係和載置部84a1、84b1與搬送機構34a1、34b1之相對位置關係相同。 The relative positional relationship between the placing portions 84a2, 84b2 and the conveying mechanisms 34a2, 34b2 is the same as the relative positional relationship between the placing portions 84a1, 84b1 and the conveying mechanisms 34a1, 34b1. The relative positional relationship between the placement portions 84a3 and 84b3 and the conveying mechanisms 34a3 and 34b3 is the same as the relative positional relationship between the placement portions 84a1 and 84b1 and the conveying mechanisms 34a1 and 34b1. The relative positional relationship between the placing portions 84a4 and 84b4 and the conveying mechanisms 34a4 and 34b4 is the same as the relative positional relationship between the placing portions 84a1 and 84b1 and the conveying mechanisms 34a1 and 34b1.
載置部84a1、84a2、84b1、84b2配置於與搬送機構68a大致相同之高度位置。載置部84a1、84a2、84b1、84b2配置於搬送機構68a之前方。
搬送機構68a可將基板W載置於載置部84a1、84a2、84b1、84b2。搬送機構68a可獲取載置部84a1、84a2、84b1、84b2上之基板W。
The mounting portions 84a1, 84a2, 84b1, and 84b2 are arranged at substantially the same height positions as the conveying
載置部84a3、84a4、84b3、84b4配置於與搬送機構68b大致相同之高度位置。載置部84a3、84a4、84b3、84b4配置於搬送機構68b之前方。搬送機構68b可將基板W載置於載置部84a3、84a4、84b3、84b4。搬送機構68b可獲取載置部84a3、84a4、84b3、84b4上之基板W。
The mounting portions 84a3, 84a4, 84b3, and 84b4 are arranged at substantially the same height positions as the conveying
各載置部84具有與載置部82大致相同之構造。具體而言,各載置部84具備複數個(例如2個)平板85。各載置部84可供載置複數個基板W。
Each placement portion 84 has substantially the same structure as the
載置部84a1係本發明中之第1後載置部之例。載置部84b1係本發明中之第2後載置部之例。載置部84a2係本發明中之第3後載置部之例。載置部84b2係本發明中之第4後載置部之例。 The placement portion 84a1 is an example of the first rear placement portion in the present invention. The placement portion 84b1 is an example of the second rear placement portion in the present invention. The placement portion 84a2 is an example of the third rear placement portion in the present invention. The placement portion 84b2 is an example of the fourth rear placement portion in the present invention.
參照圖1。基板處理裝置1具備控制部91。控制部91例如設置於移載傳送部21。控制部91控制儲存部11、移載傳送部21、熱處理區塊31及液體處理區塊61。更具體而言,控制部91控制載具搬送機構15、移載傳送用搬送機構25、熱處理用搬送機構33、熱處理部37、檢查部41、電氣裝置部57、液體處理用搬送機構67及液體處理部71。
Refer to Figure 1. The
控制部91係藉由執行各種處理之中央運算處理裝置(CPU(Central
Processing Unit,中央處理單元))、成為運算處理之作業區域之RAM(Random-Access Memory,隨機存取記憶體)、及固定磁碟等記憶媒體等而實現。記憶媒體中記憶有用於處理基板W之處理方案(處理程式)、或用於識別各基板W之資訊等各種資訊。
The
以下說明儲存部11與移載傳送部21之動作例、及移載傳送部21、熱處理區塊31與液體處理區塊61之動作例。
Hereinafter, an example of the operation of the
未圖示之外部搬送機構將收容未處理之基板W之載具C載置於架板13。載具搬送機構15將收容未處理之基板W之載具C自架板13載置於載具載置部22a。搬送機構26a自載具載置部22a上之載具C搬出基板W。搬送機構26a自載具載置部22a上之載具C搬出所有基板W後,載具搬送機構15自載具載置部22a向載具載置部22b搬送未收容基板W之載具C。此時,載具搬送機構15亦可將未收容基板W之載具C暫時載置於架板13。搬送機構26b將處理過之基板W搬入至載具載置部22b上之載具C。其後,載具搬送機構15自載具載置部22b向架板13搬送收容處理過之基板W之載具C。外部搬送機構自架板13獲取收容處理過之基板W之載具C。
An external transport mechanism (not shown) places the carrier C containing the unprocessed substrate W on the
圖13係模式性地表示基板W所通過之基板處理裝置1之要素(例如搬送機構或處理部)之圖。
FIG. 13 is a diagram schematically showing elements (for example, a conveying mechanism or a processing section) of the
搬送機構26a將基板W自載具載置部22a上之載具C搬送至載置部82a1-82a4、82b1-82b4。例如,搬送機構26a可每次將1片基板W載置於各載置部82。例如,搬送機構26a亦可每次將2片基板W載置於各載置部82。例如,搬送機構26a亦可將2片基板W同時載置於各載置部82。
The
搬送機構34a1將基板W自載置部82a1搬送至熱處理單元38a1(具體而言為疏水化處理單元AHP)。熱處理部37a1之疏水化處理單元AHP對基板W進行疏水化處理。搬送機構34a1將基板W自熱處理部37a1之疏水化處理單元AHP搬送至載置部84a1。 The transport mechanism 34a1 transports the substrate W from the mounting portion 82a1 to the heat treatment unit 38a1 (specifically, the hydrophobization treatment unit AHP). The hydrophobization treatment unit AHP of the heat treatment section 37a1 performs hydrophobization treatment on the substrate W. The transport mechanism 34a1 transports the substrate W from the hydrophobization treatment unit AHP of the heat treatment section 37a1 to the placement section 84a1.
搬送機構34b1將基板W自載置部82b1搬送至熱處理單元38b1(具體而言為疏水化處理單元AHP)。熱處理部37b1之疏水化處理單元AHP對基板W進行疏水化處理。搬送機構34b1將基板W自熱處理部37b1之疏水化處理單元AHP搬送至載置部84b1。 The conveyance mechanism 34b1 conveys the substrate W from the mounting portion 82b1 to the heat treatment unit 38b1 (specifically, the hydrophobization treatment unit AHP). The hydrophobization treatment unit AHP of the heat treatment section 37b1 performs hydrophobization treatment on the substrate W. The conveyance mechanism 34b1 conveys the substrate W from the hydrophobization treatment unit AHP of the heat treatment section 37b1 to the placement section 84b1.
搬送機構34a2-34a4、34b2-34b4分別與搬送機構34a1、34b1同樣地搬送基板W。搬送機構34a1-34a4、34b1-34b4並行地動作。熱處理部37a2-37a4、37b2-37b4分別與熱處理部37a1、37b1同樣地對基板W進行熱處理。熱處理部37a1-37a4、37b1-37b4並行地動作。 The conveying mechanisms 34a2-34a4 and 34b2-34b4 convey the substrate W in the same manner as the conveying mechanisms 34a1 and 34b1, respectively. The conveying mechanisms 34a1-34a4 and 34b1-34b4 operate in parallel. The heat treatment parts 37a2-37a4 and 37b2-37b4 heat the substrate W in the same manner as the heat treatment parts 37a1 and 37b1, respectively. The heat treatment parts 37a1-37a4 and 37b1-37b4 operate in parallel.
搬送機構68a將基板W自載置部84a1、84a2、84b1、84b2搬送至液體處理部72。液體處理部72對基板W進行液體處理。搬送機構68a將基板
W自液體處理部72搬送至載置部84a1、84a2、84b1、84b2。
The conveying
搬送機構68b將基板W自載置部84a3、84a4、84b3、84b4搬送至液體處理部73。液體處理部73對基板W進行液體處理。搬送機構68b將基板W自液體處理部73搬送至載置部84a3、84a4、84b3、84b4。
The
搬送機構34a1將基板W自載置部84a1搬送至熱處理單元38a1(具體而言為加熱單元HP)。熱處理部37a1之加熱單元HP對基板W進行加熱處理。搬送機構34a1將基板W自熱處理部37a1之加熱單元HP搬送至其他熱處理單元38a1(具體而言為冷卻單元CP)。熱處理部37a1之冷卻單元CP對基板W進行冷卻處理。搬送機構34a1將基板W自熱處理部37a1之冷卻單元CP搬送至檢查部41a1。檢查部41a1檢查基板W。搬送機構34a1將基板W自檢查部41a1搬送至載置部82a1。 The conveyance mechanism 34a1 conveys the substrate W from the mounting portion 84a1 to the heat treatment unit 38a1 (specifically, the heating unit HP). The heating unit HP of the heat treatment portion 37a1 heats the substrate W. The transport mechanism 34a1 transports the substrate W from the heating unit HP of the heat treatment section 37a1 to the other heat treatment unit 38a1 (specifically, the cooling unit CP). The cooling unit CP of the heat treatment portion 37a1 performs cooling processing on the substrate W. The transport mechanism 34a1 transports the substrate W from the cooling unit CP of the heat treatment unit 37a1 to the inspection unit 41a1. The inspection unit 41a1 inspects the substrate W. The transport mechanism 34a1 transports the substrate W from the inspection section 41a1 to the placement section 82a1.
搬送機構34b1將基板W自載置部84b1搬送至熱處理單元38b1(具體而言為加熱單元HP)。熱處理部37b1之加熱單元HP對基板W進行加熱處理。搬送機構34b1將基板W自熱處理部37b1之加熱單元HP搬送至其他熱處理單元38b1(具體而言為冷卻單元CP)。熱處理部37b1之冷卻單元CP對基板W進行冷卻處理。搬送機構34b1將基板W自熱處理部37b1之冷卻單元CP搬送至檢查部41b1。檢查部41b1檢查基板W。搬送機構34b1將基板W自檢查部41b1搬送至載置部82b1。 The conveying mechanism 34b1 conveys the substrate W from the mounting portion 84b1 to the heat treatment unit 38b1 (specifically, the heating unit HP). The heating unit HP of the heat treatment portion 37b1 heats the substrate W. The transport mechanism 34b1 transports the substrate W from the heating unit HP of the heat treatment part 37b1 to the other heat treatment unit 38b1 (specifically, the cooling unit CP). The cooling unit CP of the heat treatment portion 37b1 cools the substrate W. The transport mechanism 34b1 transports the substrate W from the cooling unit CP of the heat treatment section 37b1 to the inspection section 41b1. The inspection unit 41b1 inspects the substrate W. The transport mechanism 34b1 transports the substrate W from the inspection section 41b1 to the placement section 82b1.
搬送機構34a2-34a4、34b2-34b4分別與搬送機構34a1、34b1同樣地 搬送基板W。搬送機構34a1-34a4、34b1-34b4並行地動作。熱處理部37a2-37a4、37b2-37b4分別與熱處理部37a1、37b1同樣地對基板W進行熱處理。熱處理部37a1-37a4、37b1-37b4並行地動作。檢查部41a2-41a4、41b2-41b4分別與檢查部41a1、41b1同樣地檢查基板W。檢查部41a1-41a4、41b1-41b4並行動作。 The conveying mechanisms 34a2-34a4, 34b2-34b4 are the same as the conveying mechanisms 34a1, 34b1, respectively The substrate W is transported. The conveying mechanisms 34a1-34a4 and 34b1-34b4 operate in parallel. The heat treatment parts 37a2-37a4 and 37b2-37b4 heat the substrate W in the same manner as the heat treatment parts 37a1 and 37b1, respectively. The heat treatment parts 37a1-37a4 and 37b1-37b4 operate in parallel. The inspection parts 41a2-41a4 and 41b2-41b4 inspect the substrate W in the same manner as the inspection parts 41a1 and 41b1, respectively. The inspection units 41a1-41a4 and 41b1-41b4 operate in parallel.
搬送機構26b自載置部82a1-82a4、82b1-82b4向載具載置部22b上之載具C搬送基板W。
The
圖14A-14R係表示搬送機構34a1之動作例之俯視圖。例示了搬送機構34a1進出載置部82a1、其次進出熱處理單元38a1之動作。圖14A-14R簡略地圖示搬送機構34a1。 14A-14R are plan views showing an example of the operation of the conveying mechanism 34a1. The operation of the conveyance mechanism 34a1 in and out of the placing portion 82a1 and the heat treatment unit 38a1 is shown as an example. 14A-14R schematically illustrate the conveying mechanism 34a1.
於以下說明中,為了區別排列於大致前後方向X之3個熱處理單元38a1,將該等熱處理單元38a1記載為熱處理單元U1、U2、U3。熱處理單元U2配置於熱處理單元U1之後方。熱處理單元U3配置於熱處理單元U2之後方。 In the following description, in order to distinguish the three heat treatment units 38a1 arranged in the substantially front-rear direction X, these heat treatment units 38a1 are described as heat treatment units U1, U2, U3. The heat treatment unit U2 is arranged behind the heat treatment unit U1. The heat treatment unit U3 is arranged behind the heat treatment unit U2.
於以下說明中,將旋轉軸線A35d、A35f簡記為旋轉軸線A35。旋轉軸線A35於俯視下於假想線E上移動。於圖14A-14R中,將逆時針方向旋轉簡記為「旋轉」。於圖14A-14R中,將順時針方向旋轉簡記為「旋轉」或「朝相反方向旋轉」。 In the following description, the rotation axes A35d and A35f are abbreviated as the rotation axis A35. The rotation axis A35 moves on the imaginary line E in a plan view. In Figures 14A-14R, the counterclockwise rotation is abbreviated as "rotation". In Figures 14A-14R, the clockwise rotation is abbreviated as "rotation" or "rotation in the opposite direction".
圖14A-14R表示假想線E上之點e1、e2、e3、e4、e5、e6、e7。點e1係旋轉軸線A35可移動之最前方之位置。點e7係旋轉軸線A35可移動之最後方之位置。點e4係於俯視下與熱處理單元U2於大致寬度方向Y上相向之位置。更具體而言,熱處理單元U2具有假想之平板中心點V2。平板中心點V2於俯視下位於熱處理單元U2之第1平板39a之中心。將於俯視下通過平板中心點V2且與大致寬度方向Y平行之假想線稱為假想線F2。點e4係於俯視下假想線E與假想線F2交叉之位置。
14A-14R show points e1, e2, e3, e4, e5, e6, and e7 on the imaginary line E. Point e1 is the most movable position of the rotation axis A35. Point e7 is the rearmost position where the rotation axis A35 can move. The point e4 is at a position facing the heat treatment unit U2 in the substantially width direction Y in a plan view. More specifically, the heat treatment unit U2 has an imaginary flat plate center point V2. The flat plate center point V2 is located at the center of the first
點e2、e3位於較點e1更靠後方且較點e4更靠前方。點e3位於較點e2更靠後方。點e5、e6位於較點e4更靠後方且較點e7更靠前方。點e6位於較點e5更靠後方。點e2、e6係根據旋轉軸線A35、保持部35e、35g與熱處理單元U2之位置關係而預先決定。點e3係根據旋轉軸線A35、保持部35e、35g與載置部82a1之位置關係而預先決定。點e5係根據旋轉軸線A35、保持部35e、35g與載置部84a1之位置關係而預先決定。
The points e2 and e3 are located farther back than the point e1 and farther forward than the point e4. Point e3 is located further behind point e2. The points e5 and e6 are located farther back than the point e4 and farther forward than the point e7. Point e6 is located farther behind than point e5. The points e2 and e6 are determined in advance based on the positional relationship between the rotation axis A35, the holding
於以下說明中,將載置部82a1所具備之2個平板85稱為平板85a、85b。基板W經由平板85a自移載傳送用搬送機構25被交遞至搬送機構34a1。基板W經由平板85b自搬送機構34a1被交遞至移載傳送用搬送機構25。
In the following description, the two
參照圖14A。旋轉軸線A35位於較點e3更靠後方。臂部35d朝向前方。保持部35e位於旋轉軸線A35之前方。臂部35f朝向與臂部35d相反之
方向。即,臂部35f朝向後方。保持部35g位於旋轉軸線A35之後方。保持部35e保持1片基板W。保持於保持部35e之基板W例如為處理過之基板W。保持於保持部35e之基板W例如為自檢查部41a1搬出之基板W。保持部35g未保持基板W。於載置部82a1之平板85b,未載置基板W。
Refer to Figure 14A. The rotation axis A35 is located further behind the point e3. The
參照圖14A-14D。水平移動部35b相對於導軌部35a朝前方移動。旋轉軸線A35通過點e3、e2前進至點e1。當旋轉軸線A35到達點e1時,水平移動部35b停止移動。
Refer to Figures 14A-14D. The horizontal moving
當旋轉軸線A35前進至點e3時,臂部35d不旋轉。藉此,旋轉軸線A35與保持部35e之相對位置關係未發生改變。保持部35e及保持於保持部35e之基板W朝前方平行移動。
When the rotation axis A35 advances to the point e3, the
當旋轉軸線A35自點e3前進至點e1時,臂部35d旋轉。藉此,當旋轉軸線A35自點e3前進至點e1時,保持部35e及保持於保持部35e之基板W朝前方且左方移動。
When the rotation axis A35 advances from the point e3 to the point e1, the
當旋轉軸線A35到達點e1時,臂部35d停止旋轉。當旋轉軸線A35位於點e1時,保持部35e位於旋轉軸線A35之前方且左方。當旋轉軸線A35位於點e1時,保持部35e及保持於保持部35e之基板W於俯視下與載置部82a1之平板85b重疊。當旋轉軸線A35位於點e1時,保持部35e將基板W載置於載置部82a1之平板85b。
When the rotation axis A35 reaches the point e1, the
當旋轉軸線A35通過點e3、e2並前進至點e1時,臂部35f不旋轉。藉此,旋轉軸線A35與保持部35g之相對位置關係未發生改變。保持部35g朝前方平行移動。
When the rotation axis A35 passes through the points e3 and e2 and advances to the point e1, the
參照圖14D-14E。水平移動部35b相對於導軌部35a朝後方移動。旋轉軸線A35自點e1後退。
Refer to Figures 14D-14E. The horizontal moving
當旋轉軸線A35自點e1後退時,臂部35d朝相反方向旋轉。藉此,保持部35e朝後方且右方移動。當保持部35e朝後方且右方移動時,保持部35e未保持基板W。保持部35e移動至不與載置部82a1重疊之位置。當旋轉軸線A35自點e1後退時,臂部35f不旋轉。藉此,保持部35g朝後方平行移動。
When the rotation axis A35 retreats from the point e1, the
參照圖14E-14F。垂直移動部35c相對於水平移動部35b於大致上下方向Z上移動。藉此,保持部35e、35g於大致上下方向Z上平行移動。保持部35e移動至與平板85a大致相同之高度位置。於平板85a上載置著1片基板W。平板85a上之基板W例如為未處理之基板W。
Refer to Figures 14E-14F. The vertical moving
參照圖14F-14G。水平移動部35b再次朝前方移動。旋轉軸線A35再次前進至點e1。當旋轉軸線A35到達點e1時,水平移動部35b停止移動。
Refer to Figures 14F-14G. The horizontal moving
當旋轉軸線A35前進至點e1時,臂部35d旋轉。藉此,於旋轉軸線A35前進至點e1時,保持部35e朝前方且左方移動。
When the rotation axis A35 advances to the point e1, the
當旋轉軸線A35到達點e1時,臂部35d停止旋轉。當旋轉軸線A35位於點e1時,保持部35e位於旋轉軸線A35之前方且左方。當旋轉軸線A35位於點e1時,保持部35e於俯視下與載置部82a1之平板85a重疊。當旋轉軸線A35位於點e1時,保持部35e獲取平板85a上之基板W。
When the rotation axis A35 reaches the point e1, the
當旋轉軸線A35前進至點e1時,臂部35f不旋轉。藉此,保持部35g朝前方平行移動。
When the rotation axis A35 advances to the point e1, the
參照圖14G-14K。水平移動部35b再次朝後方移動。旋轉軸線A35自點e1後退至點e4。當旋轉軸線A35到達點e4時,水平移動部35b停止移動。
Refer to Figure 14G-14K. The horizontal moving
當旋轉軸線A35自點e1後退至點e3時,臂部35d朝相反方向旋轉。藉此,保持部35e及保持於保持部35e之基板W朝後方且右方移動。
When the rotation axis A35 retreats from the point e1 to the point e3, the
當旋轉軸線A35到達點e3時,臂部35d停止旋轉。當旋轉軸線A35位於點e3時,臂部35d朝向前方。保持部35e位於旋轉軸線A35之前方。
When the rotation axis A35 reaches the point e3, the
當旋轉軸線A35自點e3後退至點e4時,臂部35d不旋轉。藉此,保持部35e及保持於保持部35e之基板W朝後方平行移動。
When the rotation axis A35 retreats from the point e3 to the point e4, the
當旋轉軸線A35自點e1後退至點e2時,臂部35f不旋轉。藉此,保持
部35g朝後方平行移動。
When the rotation axis A35 retreats from the point e1 to the point e2, the
當旋轉軸線A35自點e2後退至點e4時,臂部35f旋轉。藉此,保持部35g朝右方移動。更詳細而言,保持部35g沿著假想線F2移動。保持部35g一面繞旋轉軸線A35旋轉,一面自點e4沿著假想線F2朝右方移動。保持部35g自點e4沿著假想線F2向熱處理單元U2靠近。
When the rotation axis A35 retreats from the point e2 to the point e4, the
如此,水平移動部35b於大致前後方向X移動,並且臂部35f繞旋轉軸線A35旋轉,藉此,保持部35g朝向熱處理單元U2於大致寬度方向Y上直線地移動。
In this manner, the horizontal moving
當旋轉軸線A35到達點e4時,臂部35f停止旋轉。當旋轉軸線A35位於點e4時,臂部35f朝向右方。當旋轉軸線A35位於點e4時,保持部35g位於旋轉軸線A35之右方。當旋轉軸線A35位於點e4時,保持部35g於俯視下與熱處理單元U2之第1平板39a重疊。當旋轉軸線A35位於點e4時,保持部35g獲取熱處理單元U2之第1平板39a上之基板W。此處,熱處理單元U2之第1平板39a上之基板W例如為已由熱處理單元U2進行了處理之基板W。
When the rotation axis A35 reaches the point e4, the
參照圖14K-14M。水平移動部35b朝前方移動。旋轉軸線A35自點e4前進至點e2。當旋轉軸線A35到達點e2時,水平移動部35b停止向前方之移動。
Refer to Figures 14K-14M. The horizontal moving
當旋轉軸線A35自點e4前進至點e2時,臂部35d不旋轉。藉此,保持
部35e及保持於保持部35e之基板W朝前方平行移動。
When the rotation axis A35 advances from the point e4 to the point e2, the
當旋轉軸線A35自點e4前進至點e2時,臂部35f朝相反方向旋轉。藉此,保持部35g及保持於保持部35g之基板W朝左方移動。更詳細而言,保持部35g及保持於保持部35g之基板W沿著假想線F2移動。保持部35g及保持於保持部35g之基板W朝向點e4沿著假想線F2朝左方移動。保持部35g及保持於保持部35g之基板W沿著假想線F2遠離熱處理單元U2。於熱處理單元U2之第1平板39a,未載置基板W。
When the rotation axis A35 advances from the point e4 to the point e2, the
如此,水平移動部35b於大致前後方向X移動,並且臂部35f繞旋轉軸線A35旋轉,藉此,保持部35g以遠離熱處理單元U2之方式於大致寬度方向Y上直線地移動。藉此,保持於保持部35g之基板W亦以遠離熱處理單元U2之方式於大致寬度方向Y上直線地移動。
In this way, the horizontal moving
當旋轉軸線A35到達點e2時,臂部35f之反向旋轉結束。當旋轉軸線A35位於點e2時,臂部35f朝向後方。當旋轉軸線A35位於點e2時,保持部35g及保持於保持部35g之基板W位於旋轉軸線A35之後方。
When the rotation axis A35 reaches the point e2, the reverse rotation of the
參照圖14M-14N。水平移動部35b朝後方移動。旋轉軸線A35自點e2後退至點e6。
Refer to Figures 14M-14N. The horizontal moving
當旋轉軸線A35自點e2後退至點e6時,臂部35d不旋轉。藉此,保持部35e及保持於保持部35e之基板W朝後方平行移動。當旋轉軸線A35自點e2後退至點e6時,臂部35f不旋轉。藉此,保持部35g及保持於保持部35g之基板W朝後方平行移動。
When the rotation axis A35 retreats from the point e2 to the point e6, the
參照圖14N-14P。水平移動部35b朝前方移動。旋轉軸線A35自點e6前進至點e4。當旋轉軸線A35到達點e4時,水平移動部35b停止移動。
Refer to Figure 14N-14P. The horizontal moving
當旋轉軸線A35自點e6前進至點e4時,臂部35d朝相反方向旋轉。藉此,保持部35e及保持於保持部35e之基板W朝右方移動。更詳細而言,保持部35e及保持於保持部35e之基板W沿著假想線F2移動。保持部35e及保持於保持部35e之基板W自點e4沿著假想線F2朝右方移動。保持部35e及保持於保持部35e之基板W自點e4沿著假想線F2向熱處理單元U2靠近。
When the rotation axis A35 advances from the point e6 to the point e4, the
如此,水平移動部35b於大致前後方向X移動,並且臂部35d繞旋轉軸線A35旋轉,藉此,保持部35e朝向熱處理單元U2於大致寬度方向Y上直線地移動。藉此,使保持於保持部35e之基板W朝向熱處理單元U2於大致寬度方向Y上直線地移動。
In this manner, the horizontal moving
當旋轉軸線A35到達點e4時,臂部35d停止旋轉。當旋轉軸線A35位於點e4時,臂部35d朝向右方。當旋轉軸線A35位於點e4時,保持部35e及保持於保持部35e之基板W位於旋轉軸線A35之右方。當旋轉軸線A35位於點e4時,保持部35e及保持於保持部35e之基板W於俯視下與熱處理單元U2之第1平板39a重疊。保持部35e將基板W載置於熱處理單元U2之第1平板39a。
When the rotation axis A35 reaches the point e4, the
當旋轉軸線A35自點e6前進至點e4時,臂部35f不旋轉。藉此,保持部35g及保持於保持部35g之基板W朝前方平行移動。
When the rotation axis A35 advances from the point e6 to the point e4, the
參照圖14P-14R。水平移動部35b朝後方移動。旋轉軸線A35自點e4後退至點e6。
Refer to Figure 14P-14R. The horizontal moving
當旋轉軸線A35自點e4後退至點e6時,臂部35d旋轉。藉此,保持部35e朝左方移動。更詳細而言,保持部35e沿著假想線F2移動。保持部35e朝向點e4沿著假想線F2朝左方移動。保持部35e沿著假想線F2遠離熱處理單元U2。保持部35e未保持基板W。
When the rotation axis A35 retreats from the point e4 to the point e6, the
如此,水平移動部35b於大致前後方向X移動,並且臂部35d繞旋轉軸線A35旋轉,藉此,保持部35e以遠離熱處理單元U2之方式於大致寬度方向Y上直線地移動。
In this way, the horizontal moving
當旋轉軸線A35到達點e6時,臂部35d之旋轉結束。當旋轉軸線A35位於點e6時,臂部35d朝向前方。當旋轉軸線A35位於點e6時,保持部35e位於旋轉軸線A35之前方。
When the rotation axis A35 reaches the point e6, the rotation of the
當旋轉軸線A35自點e4後退至點e5時,臂部35f不旋轉。藉此,保持部35g及保持於保持部35g之基板W朝後方平行移動。
When the rotation axis A35 retreats from the point e4 to the point e5, the
當旋轉軸線A35自點e5後退至點e6時,臂部35f朝相反方向旋轉。藉此,保持部35g及保持於保持部35g之基板W朝左方且後方移動。
When the rotation axis A35 retreats from the point e5 to the point e6, the
其後,雖省略圖示,但搬送機構34a1向載置部84a1進出。例如,藉由水平移動部35b進一步朝後方移動,旋轉軸線A35後退至點e7。當旋轉軸線A35自點e5後退至點e7時,保持部35g朝相反方向旋轉。然後,當旋轉軸線A35位於點e7時,保持部35g將基板W載置於載置部84a1。
After that, although illustration is omitted, the conveying mechanism 34a1 moves in and out of the placing portion 84a1. For example, as the horizontal moving
搬送機構34a2-34a4、34b1-34b4亦與搬送機構34a1同樣地動作。 The conveying mechanisms 34a2-34a4 and 34b1-34b4 also operate in the same manner as the conveying mechanism 34a1.
於上述動作例中,搬送機構34a1自載置部82a1(平板85a)向熱處理單元38a1(U2)搬送了基板W(參照圖14F-14P)。但並不限於此。例如,搬送機構34a1可不將基板W載置於熱處理單元38a1上,而於載置部82a1與載置部84a1之間搬送基板W。
In the above-mentioned operation example, the conveyance mechanism 34a1 conveys the substrate W from the placement portion 82a1 (
為了方便起見,參照圖14A-14R,說明搬送機構34a1未將基板W載置於熱處理單元38a1上,而將基板W自載置部82a1搬送至載置部84a1之動作例。 For the sake of convenience, referring to FIGS. 14A-14R, an operation example of the transfer mechanism 34a1 that does not mount the substrate W on the heat treatment unit 38a1 but transfers the substrate W from the mounting portion 82a1 to the mounting portion 84a1 will be described.
首先,保持部35e獲取載置部82a1上之基板W(圖14F-14G)。其後,保持部35e移動至圖14N所示之位置。保持部35e及保持於保持部35e之基板W位於旋轉軸線A35之前方。
First, the holding
其次,於水平移動部35b向前方移動,並且臂部35d旋轉。藉此,保持於保持部35e之基板W沿著假想線F2向熱處理單元U2靠近(圖14N-14P)。當保持部35e到達圖14P所示之位置時,保持部35e未將基板W載置
於熱處理單元U2。保持部35e於第1平板39a之上方之空間保持著基板W。保持部35e及保持於保持部35e之基板W朝旋轉軸線A35之右方移動。
Next, the horizontal moving
其次,水平移動部35b進一步前進,並且臂部35d進一步旋轉。藉此,臂部35d及保持部35e進行與圖14K-14M所示之臂部35f及保持部35g大致相同之動作。保持於保持部35e之基板W沿著假想線F2遠離熱處理單元U2。保持部35e及保持於保持部35e之基板W朝旋轉軸線A35之後方移動。
Next, the horizontal moving
其後,水平移動部35b後退。藉此,保持部35e進出載置部84a1,將基板W載置於載置部84a1。
After that, the horizontal moving
如此,保持部35e可利用熱處理單元38a1所具有之空間,繞旋轉軸線A35回轉。保持部35e可不將基板W載置於熱處理單元38a1,而自旋轉軸線A35之前方位置移動至旋轉軸線A35之後方位置。因此,於保持部35e進出載置部82a1後,保持部35e可進出載置部84a1。因此,搬送機構34a1可不將基板W載置於熱處理單元38a1,而將基板W自載置部82a1搬送至載置部84a1。
In this way, the holding
藉由搬送機構34a1進行與上述動作例相反之程序,保持部35e可利用熱處理單元38a1所具有之空間,自旋轉軸線A35之後方位置移動至旋轉軸線A35之前方位置。因此,搬送機構34a1可不將基板W載置於熱處理單元38a1,而將基板W自載置部84a1搬送至載置部82a1。
By carrying out the procedure reverse to the above-mentioned operation example by the conveying mechanism 34a1, the holding
再者,臂部35d、35f分別可繞旋轉軸線A35旋轉約250度左右。
Furthermore, the
可動構件51a1支持於第1框架46。熱處理部37a1支持於可動構件51a1。可動構件51a1可相對於第1框架46移動。藉由可動構件51a1相對於第1框架46移動,熱處理部37a1相對於第1框架46移動。因此,能夠容易地進行熱處理部37a1之維護。
The movable member 51a1 is supported by the
搬送機構34a1支持於可動構件51a1。藉由可動構件51a1相對於第1框架46移動,熱處理部37a1與搬送機構34a1一體地移動。因此,可於可動構件51a1相對於第1框架46移動時,將熱處理部37a1與搬送機構34a1之相對位置保持為固定。因此,可於將熱處理部37a1與搬送機構34a1之相對位置保持為固定之狀態下,進行熱處理部37a1之維護。因此,無需於每次進行熱處理部37a1之維護時,調整熱處理部37a1與搬送機構34a1之相對位置。即,能夠更容易地進行熱處理部37a1之維護。
The conveyance mechanism 34a1 is supported by the movable member 51a1. As the movable member 51a1 moves with respect to the
如上所述,根據基板處理裝置1,能夠容易地進行基板處理裝置1之維護。
As described above, according to the
藉由可動構件51a1相對於第1框架46移動,熱處理部37a1相對於第1框架46於大致水平方向上移動。因此,熱處理部37a1可不與其他構件干涉地相對於第1框架46移動。例如,即便於其他構件配置於熱處理部37a1
之上方及下方中之至少任一方之情形時,熱處理部37a1亦可不與其他構件干涉地相對於第1框架46移動。
As the movable member 51a1 moves with respect to the
藉由可動構件51a1相對於第1框架46移動,熱處理部37a1可移動至維護位置Qa1。因此,能夠容易地使熱處理部37a1移動至維護位置Qa1。
As the movable member 51a1 moves with respect to the
於熱處理部37a1處於維護位置Qa1時,熱處理部37a1之至少一部分位於第1框架46之外部。因此,於熱處理部37a1處於維護位置Qa1時,能夠容易地進行熱處理部37a1之維護。
When the heat treatment part 37a1 is in the maintenance position Qa1, at least a part of the heat treatment part 37a1 is located outside the
於熱處理部37a1處於維護位置Qa1時,可動構件51a1支持於第1框架46。因此,於熱處理部37a1處於維護位置Qa1時,熱處理部37a1經由可動構件51a1支持於第1框架46。因此,能夠更容易地進行熱處理部37a1之維護。
When the heat treatment portion 37a1 is at the maintenance position Qa1, the movable member 51a1 is supported by the
藉由可動構件51a1相對於第1框架46移動,熱處理部37a1可移動至處理位置Pa1。因此,能夠容易地使熱處理部37a1移動至處理位置Pa1。因此,可於維護位置Qa1與處理位置Pa1之間容易地使熱處理部37a1移動。
As the movable member 51a1 moves relative to the
如上所述,藉由可動構件51a1相對於第1框架46移動,熱處理部37a1與搬送機構34a1一體地移動。因此,即便於可動構件51a1移動至處理位置Pa1時,亦可將熱處理部37a1與搬送機構34a1之相對位置保持為固定。總之,於將熱處理部37a1與搬送機構34a1之相對位置保持為固定之狀態
下,能夠容易地使熱處理部37a1於維護位置Qa1與處理位置Pa1之間移動。
As described above, as the movable member 51a1 moves with respect to the
於熱處理部37a1處於維護位置Qa1時位於第1框架46之外部之熱處理部37a1之部分較於熱處理部37a1處於處理位置Pa1時位於第1框架46之外部之熱處理部37a1之部分大。因此,於熱處理部37a1處於維護位置Qa1時,能夠容易地進行熱處理部37a1之維護。於熱處理部37a1處於處理位置Pa1時,熱處理部37a1能夠適當地對基板W進行熱處理。
The part of the heat treatment part 37a1 located outside the
於熱處理部37a1處於處理位置Pa1時,所有熱處理部37a1均位於第1框架46之內部。因此,於熱處理部37a1處於處理位置Pa1時,熱處理部37a1能夠更適當地對基板W進行熱處理。
When the heat treatment part 37a1 is at the treatment position Pa1, all the heat treatment parts 37a1 are located inside the
於熱處理部37a1處於處理位置Pa1時,可動構件51a1支持於第1框架46。因此,於熱處理部37a1處於處理位置Pa1時,熱處理部37a1經由可動構件51a1支持於第1框架46上。因此,熱處理部37a1能夠更適當地對基板W進行熱處理。
When the heat treatment portion 37a1 is at the treatment position Pa1, the movable member 51a1 is supported by the
關於搬送機構34a1,導軌部35a固定於可動構件51a1。水平移動部35b支持於導軌部35a。臂部35d、35f支持於水平移動部35b。保持部35e固定於臂部35d。保持部35g固定於臂部35f。如此,導軌部35a、水平移動部35b、臂部35d、35f、保持部35e、35g直接或間接地支持於可動構件51a1。因此,可動構件51a1能夠良好地支持搬送機構34a1。
Regarding the conveyance mechanism 34a1, the
水平移動部35b可相對於導軌部35a於大致水平方向上移動。因此,保持部35e、35g可相對於導軌部35a於大致水平方向上移動。臂部35d可相對於水平移動部35b繞旋轉軸線A35d旋轉。因此,保持部35e可相對於水平移動部35b繞旋轉軸線A35d旋轉。臂部35f可相對於水平移動部35b繞旋轉軸線A35f旋轉。因此,保持部35g可相對於水平移動部35b繞旋轉軸線A35f旋轉。因此,保持部35e、35g能夠良好地進出熱處理部37a1。
The horizontal moving
於俯視下,旋轉軸線A35d、A35f相對於水平移動部35b之相對位置固定。因此,臂部35d、35f支持於水平移動部35b之構造簡單。保持部35e、35g固定於臂部35d、35f。進而,於俯視下,保持部35e與旋轉軸線A35d之距離固定。於俯視下,保持部35g與旋轉軸線A35f之距離固定。因此,保持部35e、35g支持於臂部35d、35f之構造簡單。如此,搬送機構34a1之構造簡單。其結果,搬送機構34a1之尺寸相對較小。例如,臂部35d、35f之尺寸相對較小。因此,能夠有效地減小俯視下之搬送機構34a1之設置空間。因此,能夠有效地減小俯視下之搬送空間32之面積。
In a plan view, the relative positions of the rotation axes A35d and A35f with respect to the horizontal moving
順帶而言,搬送機構68a於俯視下,旋轉軸線A69e相對於水平移動部69d之相對位置固定,但於俯視下,保持部69f與旋轉軸線A69e之距離不固定。進而,於俯視下,保持部69g與旋轉軸線A69e之距離不固定。因此,搬送機構68a之構造相對複雜。以下進行具體說明。
Incidentally, when the conveying
於俯視下,旋轉軸線A69e相對於水平移動部69d之相對位置固定。
例如,即便旋轉部69e相對於水平移動部69d繞旋轉軸線A69e旋轉,旋轉軸線A69e於俯視下亦保持於水平移動部69d之右方之位置。因此,水平移動部69d支持旋轉部69e之構造相對簡單。但是,於俯視下保持部69f與旋轉軸線A69e之距離不固定。例如,於保持部69f相對於旋轉部69e進退移動時,保持部69f於俯視下向旋轉軸線A69e靠近或遠離旋轉軸線A69e。因此,旋轉部69e支持保持部69f之構造相對複雜。因此,旋轉部69e之尺寸相對較大。同樣地,於俯視下,保持部69g與旋轉軸線A69e之距離不固定。因此,旋轉部69e支持保持部69g之構造亦相對複雜。因此,旋轉部69e之尺寸更大。
In a plan view, the relative position of the rotation axis A69e with respect to the horizontal moving
搬送機構34b1具有與搬送機構34a1大致相同之構造。因此,搬送機構34b1之構造簡單。因此,能夠有效地減小俯視下之搬送機構34b1之設置空間。因此,能夠進一步有效地減小俯視下之搬送空間32之面積。
The conveying mechanism 34b1 has substantially the same structure as the conveying mechanism 34a1. Therefore, the structure of the transport mechanism 34b1 is simple. Therefore, the installation space of the conveying mechanism 34b1 in a plan view can be effectively reduced. Therefore, it is possible to further effectively reduce the area of the conveying
垂直移動部35c支持於水平移動部35b。垂直移動部35c可相對於水平移動部35b於大致上下方向Z上移動。臂部35d、35f經由垂直移動部35c支持於水平移動部35b。因此,藉由垂直移動部35c相對於水平移動部35b於大致上下方向Z上移動,臂部35d、35f及保持部35e、35g相對於水平移動部35b於大致上下方向Z上移動。因此,保持部35e、35g能夠更良好地進出熱處理部37a1。
The vertical moving
可動構件51b1支持於第2框架47。熱處理部37b1支持於可動構件51b1。可動構件51b1可相對於第2框架47移動。藉由可動構件51b1相對於
第2框架47移動,熱處理部37b1相對於第2框架47移動。因此,能夠容易地進行熱處理部37b1之維護。
The movable member 51b1 is supported by the
搬送機構34b1支持於可動構件51b1。藉由可動構件51b1相對於第2框架47移動,熱處理部37b1與搬送機構34b1一體地移動。因此,可於可動構件51b1相對於第2框架47移動時,將熱處理部37b1與搬送機構34b1之相對位置保持為固定。因此,可於將熱處理部37b1與搬送機構34b1之相對位置保持為固定之狀態下,進行熱處理部37b1之維護。因此,無需於每次進行熱處理部37b1之維護時,調整熱處理部37b1與搬送機構34b1之相對位置。即,能夠更容易地進行熱處理部37b1之維護。
The transport mechanism 34b1 is supported by the movable member 51b1. As the movable member 51b1 moves relative to the
如上所述,根據基板處理裝置1,能夠更容易地進行基板處理裝置1之維護。
As described above, according to the
基板處理裝置1除具備熱處理部37a1以外,還具備熱處理部37b1。因此,能夠良好地提高基板處理裝置1之處理量。
The
第2框架47配置於與第1框架46大致相同之高度位置。換言之,第1框架46與第2框架47以排列於大致水平方向之方式配置。搬送機構34a1配置於熱處理部37a1與第2框架47之間。搬送機構34b1配置於熱處理部37b1與第1框架46之間。換言之,熱處理部37a1、搬送機構34a1、搬送機構34b1及熱處理部37b1以依序排列於大致水平方向之方式配置。因此,能夠高效率地設置熱處理部37a1、37b1與搬送機構34a1、34b1。
The
第2框架47配置於第1框架46之左方。搬送機構34a1配置於熱處理部37a1之左方。搬送機構34b1配置於搬送機構34a1之左方。熱處理部37b1配置於搬送機構34b1之左方。因此,能夠高效率地設置熱處理部37a1、37b1與搬送機構34a1、34b1。
The
藉由可動構件51a1相對於第1框架46移動,熱處理部37a1可相對於第1框架46朝第1方向移動。於熱處理部37a1相對於第1框架46朝第1方向移動時,熱處理部37a1遠離第2框架47。因此,熱處理部37a1可不與第2框架47干涉地移動。
As the movable member 51a1 moves relative to the
熱處理部37a1配置於熱處理部37b1之右方。藉由可動構件51a1相對於第1框架46移動,熱處理部37a1可相對於第1框架46朝右方移動。藉由熱處理部37a1相對於第1框架46朝右方移動,熱處理部37a1遠離熱處理部37b1。因此,熱處理部37a1可不與熱處理部37b1干涉地移動。
The heat treatment part 37a1 is arranged to the right of the heat treatment part 37b1. As the movable member 51a1 moves relative to the
藉由可動構件51b1相對於第2框架47移動,熱處理部37b1可相對於第2框架47朝第2方向移動。於熱處理部37b1相對於第2框架47朝第2方向移動時,熱處理部37b1遠離第1框架46。因此,熱處理部37b1可不與第1框架46干涉地移動。
As the movable member 51b1 moves relative to the
熱處理部37b1配置於熱處理部37a1之左方。藉由可動構件51b1相對於第2框架47移動,熱處理部37b1可相對於第2框架47朝左方移動。藉由
熱處理部37b1相對於第2框架47朝左方移動,熱處理部37b1遠離熱處理部37a1。因此,熱處理部37b1可不與熱處理部37a1干涉地移動。
The heat treatment part 37b1 is arranged on the left of the heat treatment part 37a1. As the movable member 51b1 moves relative to the
藉由可動構件51a1相對於第1框架46移動,可動構件51a1可將熱處理部37a1之至少一部分自第1框架46朝第1方向拉出。因此,能夠容易地進行熱處理部37a1之維護。
By moving the movable member 51a1 with respect to the
藉由可動構件51b1相對於第2框架47移動,可動構件51b1可將熱處理部37b1之至少一部分自第2框架47朝第2方向拉出。因此,能夠容易地進行熱處理部37b1之維護。
By moving the movable member 51b1 with respect to the
藉由可動構件51b1相對於第2框架47移動,熱處理部37b1可移動至維護位置Qb1。因此,能夠容易地使熱處理部37b1移動至維護位置Qb1。
As the movable member 51b1 moves with respect to the
第2框架47配置於第1框架46之左方。於熱處理部37a1處於維護位置Qa1時,熱處理部37a1之至少一部分位於第1框架46之右方。因此,於熱處理部37a1處於第1維護位置Qa1時,熱處理部37a1之至少一部分位於第1框架46之外部且第2框架47之外部。因此,於熱處理部37a1處於維護位置Qa1時,能夠容易地進行熱處理部37a1之維護。
The
第1框架46配置於第2框架47之右方。於熱處理部37b1處於維護位置Qb1時,熱處理部37b1之至少一部分位於第2框架47之左方。因此,於熱處理部37b1處於維護位置Qb1時,熱處理部37b1之至少一部分位於第1框
架46之外部且第2框架47之外部。因此,可於熱處理部37b1處於維護位置Qb1時,容易地進行熱處理部37b1之維護。
The
第2框架47具有與第1框架46大致相同之形狀。因此,能夠容易地製造第1框架46與第2框架47。因此,能夠容易地製造基板處理裝置1。
The
第2框架47可與第1框架46分離。因此,能夠容易地製造基板處理裝置1。
The
例如,可將基板處理裝置1之製造分為以下之第1作業、第2作業及第3作業。
For example, the manufacturing of the
‧將可動構件51a1、熱處理部37a1及搬送機構34a1安裝於第1框架46之第1作業
‧The first task of installing the movable member 51a1, the heat treatment portion 37a1, and the conveying mechanism 34a1 on the
‧將可動構件51b1、熱處理部37b1及搬送機構34b1安裝於第2框架47之第2作業
‧The second task of installing the movable member 51b1, the heat treatment portion 37b1, and the conveying mechanism 34b1 on the
‧連結第1框架46與第2框架47之第3作業
‧The third task of connecting the
此處,可分別於不同場所及不同時刻進行第1作業、第2作業及第3作業。 Here, the first task, the second task, and the third task can be performed in different places and at different times.
因此,能夠容易地製造基板處理裝置1。
Therefore, the
搬送機構34b1配置於與搬送機構34a1左右對稱之位置。熱處理部37b1配置於與熱處理部37a1左右對稱之位置。因此,能夠更容易地進行基板處理裝置1之設計及製造。
The conveying mechanism 34b1 is arranged at a position symmetrical to the conveying mechanism 34a1. The heat treatment part 37b1 is arranged at a position symmetrical to the heat treatment part 37a1. Therefore, the design and manufacture of the
可動構件51a2支持於第1框架46。熱處理部37a2支持於可動構件51a2。可動構件51a2可相對於第1框架46移動。藉由可動構件51a2相對於第1框架46移動,熱處理部37a2相對於第1框架46移動。因此,能夠容易地進行熱處理部37a2之維護。
The movable member 51a2 is supported by the
搬送機構34a2支持於可動構件51a2。藉由可動構件51a2相對於第1框架46移動,熱處理部37a2與搬送機構34a2一體地移動。因此,於可動構件51a2相對於第1框架46移動時,可將熱處理部37a2與搬送機構34a2之相對位置保持為固定。因此,可於將熱處理部37a2與搬送機構34a2之相對位置保持為固定之狀態下,進行熱處理部37a2之維護。因此,無需於每次進行熱處理部37a2之維護時,調整熱處理部37a2與搬送機構34a2之相對位置。即,能夠更容易地進行熱處理部37a2之維護。
The conveyance mechanism 34a2 is supported by the movable member 51a2. As the movable member 51a2 moves with respect to the
如上所述,根據基板處理裝置1,能夠容易地進行基板處理裝置1之維護。
As described above, according to the
可動構件51a2可與可動構件51a1獨立地相對於第1框架46移動。因此,可使熱處理部37a1、37a2個別地移動。因此,例如能夠容易地進行熱處理部37a1、37a2之僅一者之維護。或者,能夠容易地進行熱處理部37a1、37a2之兩者之維護。
The movable member 51a2 is movable relative to the
基板處理裝置1除具備熱處理部37a1以外,還具備熱處理部37a2。因
此,能夠良好地提高基板處理裝置1之處理量。
The
熱處理部37a2配置於熱處理部37a1之上方。因此,可減小俯視下之熱處理部37a1、37a2之設置空間。搬送機構34a2配置於搬送機構34a1之上方。因此,可減小俯視下之搬送機構34a1、34a2之設置空間。因此,可減小基板處理裝置1之佔據面積。
The heat treatment part 37a2 is arranged above the heat treatment part 37a1. Therefore, the installation space of the heat treatment portions 37a1 and 37a2 in a plan view can be reduced. The conveying mechanism 34a2 is arranged above the conveying mechanism 34a1. Therefore, the installation space of the conveying mechanisms 34a1 and 34a2 in a plan view can be reduced. Therefore, the area occupied by the
引導部55固定於第1框架46。滑動部56固定於可動構件51a1。滑動部56由引導部55引導。因此,可動構件51a1可相對於第1框架46良好地移動。
The
於熱處理部37a1處於維護位置Qa1時,檢查部41a1之至少一部分位於第1框架46之外部。因此,可於熱處理部37a1處於維護位置Qa1時,容易地進行檢查部41a之維護。
When the heat treatment portion 37a1 is at the maintenance position Qa1, at least a part of the inspection portion 41a1 is located outside the
於熱處理部37a1處於維護位置Qa1時,電氣裝置部57a1之至少一部分位於第1框架46之外部。因此,可於熱處理部37a1處於維護位置Qa1時,容易地進行電氣裝置部57a1之維護。
When the heat treatment portion 37a1 is at the maintenance position Qa1, at least a part of the electric device portion 57a1 is located outside the
熱處理部37a1與搬送空間32以排列於大致寬度方向Y之方式配置。熱處理部37a1具備複數個熱處理單元38a1。熱處理單元38a1分別對1片基板W進行熱處理。搬送機構34a1向熱處理單元38a1搬送基板。此處,熱處理單元38a1以排列於大致前後方向X之方式配置。因此,可相對容易地增
加熱處理部37a1中所包含之熱處理單元38a1之數量。因此,熱處理部37a1能夠對相對較多之基板W並行地進行熱處理。因此,能夠良好地提高基板處理裝置1之處理量。
The heat treatment portion 37a1 and the
同樣地,熱處理部37b1與搬送空間32以排列於大致寬度方向Y之方式配置。更具體而言,搬送空間32於大致寬度方向Y上配置於熱處理部37a1與熱處理部37b1之間。熱處理部37b1具備複數個熱處理單元38b1。熱處理單元38b1分別對1片基板W進行熱處理。搬送機構34b1將基板W搬送至熱處理單元38b1。此處,熱處理單元38b1以排列於大致前後方向X之方式配置。因此,可相對容易地增加熱處理部37b1中所包含之熱處理單元38b1之數量。因此,熱處理部37b1能夠對相對較多之基板W並行地進行熱處理。因此,能夠良好地提高基板處理裝置1之處理量。
Similarly, the heat treatment portion 37b1 and the
此處,熱處理部37a1中所包含之熱處理單元38a1之數量為12個以下。因此,能夠良好地防止搬送機構34a1所負擔之基板W之搬送量變得過大。同樣地,熱處理部37b1中所包含之熱處理單元38a1之數量為12個以下。因此,能夠良好地防止搬送機構34b1所負擔之基板W之搬送量變得過大。 Here, the number of heat treatment units 38a1 included in the heat treatment part 37a1 is 12 or less. Therefore, it is possible to well prevent the transfer amount of the substrate W borne by the transfer mechanism 34a1 from becoming excessive. Similarly, the number of heat treatment units 38a1 included in the heat treatment portion 37b1 is 12 or less. Therefore, it is possible to well prevent the transfer amount of the substrate W borne by the transfer mechanism 34b1 from becoming excessive.
搬送機構34a1可相對於熱處理單元38a1於大致前後方向X上移動。因此,搬送機構34a1能夠良好地進出熱處理單元38a1。搬送機構34b1可相對於熱處理單元38b1於大致前後方向X上移動。因此,搬送機構34b1能夠良好地進出熱處理單元38b1。 The conveyance mechanism 34a1 is movable in substantially the front-rear direction X with respect to the heat treatment unit 38a1. Therefore, the transport mechanism 34a1 can enter and exit the heat treatment unit 38a1 well. The conveyance mechanism 34b1 is movable in substantially the front-rear direction X with respect to the heat treatment unit 38b1. Therefore, the transport mechanism 34b1 can enter and exit the heat treatment unit 38b1 well.
搬送機構34b1可與搬送機構34a1獨立地移動。因此,搬送機構34a1、34b1分別可高效率地進出熱處理單元38a1、38b1。 The conveying mechanism 34b1 can move independently of the conveying mechanism 34a1. Therefore, the conveying mechanisms 34a1, 34b1 can enter and exit the heat treatment units 38a1, 38b1 with high efficiency, respectively.
搬送機構34a1具備水平移動部35b、臂部35d、35f及保持部35e、35g。臂部35d、35f支持於水平移動部35b上。保持部35e、35g固定於臂部35d、35f。如此,保持部35e、35g間接地支持於水平移動部35b。水平移動部35b可相對於熱處理單元38a1於大致前後方向X上移動。因此,保持部35e、35g可相對於熱處理單元38a1於大致前後方向X上移動。臂部35d、35f可相對於水平移動部35b繞旋轉軸線A35d、A35f旋轉。因此,保持部35e、35g可相對於水平移動部35b繞旋轉軸線A35d、A35f旋轉。因此,保持部35e、35g能夠良好地進出熱處理單元38a1。
The conveyance mechanism 34a1 includes a horizontal moving
搬送機構34b1具有與搬送機構34a1大致相同之構造。因此,搬送機構34b1之保持部35e、35g能夠良好地進出熱處理單元38b1。
The conveying mechanism 34b1 has substantially the same structure as the conveying mechanism 34a1. Therefore, the holding
關於搬送機構34a1,藉由水平移動部35b於大致前後方向X上移動,保持部35e、35g於大致前後方向X上平行移動。藉由臂部35d繞旋轉軸線A35d旋轉,保持部35e繞旋轉軸線A35d旋轉。藉由臂部35f繞旋轉軸線A35f旋轉,保持部35g繞旋轉軸線A35f旋轉。此處,水平移動部35b於大致前後方向X移動,並且臂部35d繞旋轉軸線A35d旋轉,藉此使保持於保持部35e之基板W朝向熱處理單元38a1於大致寬度方向Y上直線地移動。同樣地,水平移動部35b於大致前後方向X移動,並且臂部35f繞旋轉軸線
A35f旋轉,藉此使保持於保持部35g之基板W朝向熱處理單元38a1於大致寬度方向Y上直線地移動。因此,即便於前後方向X上之1個熱處理單元38a1之長度La較短之情形時,搬送機構34a1亦能夠良好地將基板W搬送至熱處理單元38a1。
Regarding the conveyance mechanism 34a1, the holding
關於搬送機構34b1,水平移動部35b於大致前後方向X移動,並且臂部35d、35f繞旋轉軸線A35d、A35f旋轉,藉此,亦使保持於保持部35e、35g之基板W朝向熱處理單元38b1於大致寬度方向Y上直線地移動。因此,即便於前後方向X上之1個熱處理單元38b1之長度Lb較短之情形時,搬送機構34b1亦能夠良好地將基板W搬送至熱處理單元38b1。
Regarding the conveying mechanism 34b1, the horizontal moving
前後方向X上之1個熱處理單元38a1之長度La為基板W之半徑r之3倍以下。如此,熱處理單元38a1之尺寸相對較小。因此,能夠良好地減小熱處理單元38a1之設置空間。前後方向X上之1個熱處理單元38b1之長度Lb為基板W之半徑r之3倍以下。如此,熱處理單元38b1之尺寸相對較小。因此,能夠良好地降低熱處理單元38b1之設置空間。 The length La of one heat treatment unit 38a1 in the front-rear direction X is 3 times the radius r of the substrate W or less. As such, the size of the heat treatment unit 38a1 is relatively small. Therefore, the installation space of the heat treatment unit 38a1 can be reduced well. The length Lb of one heat treatment unit 38b1 in the front-rear direction X is less than 3 times the radius r of the substrate W. As such, the size of the heat treatment unit 38b1 is relatively small. Therefore, the installation space of the heat treatment unit 38b1 can be reduced satisfactorily.
如上所述,搬送機構34a1朝向熱處理單元38a1於大致寬度方向Y上直線地搬送基板W。因此,即便長度La為基板W之半徑r之3倍以下,搬送機構34a1亦能夠良好地將基板W搬送至熱處理單元38a1。同樣地,搬送機構34b1朝向熱處理單元38b1於大致寬度方向Y上直線地搬送基板W。因此,即便長度Lb為基板W之半徑r之3倍以下,搬送機構34b1亦能夠良好地將基板W搬送至熱處理單元38b1。 As described above, the transport mechanism 34a1 linearly transports the substrate W in the substantially width direction Y toward the heat treatment unit 38a1. Therefore, even if the length La is three times or less the radius r of the substrate W, the transport mechanism 34a1 can transport the substrate W to the heat treatment unit 38a1 well. Similarly, the transport mechanism 34b1 linearly transports the substrate W in the substantially width direction Y toward the heat treatment unit 38b1. Therefore, even if the length Lb is three times or less the radius r of the substrate W, the transport mechanism 34b1 can transport the substrate W to the heat treatment unit 38b1 well.
於大致前後方向X上相鄰之2個第1中心點Ga1之間之距離Da為基板W之半徑r之3倍以下。如此,距離Da相對較小。因此,熱處理單元38a1之尺寸相對較小,且排列於大致前後方向X之2個熱處理單元38a1相互近接。因此,能夠良好地減小熱處理單元38a1之設置空間。即,能夠良好地減小熱處理部37a1之設置空間。同樣地,於大致前後方向X上相鄰之2個第2中心點Gb1之間之距離Db為基板W之半徑r之3倍以下。如此,熱處理單元38b1之尺寸相對較小,且排列於大致前後方向X之2個熱處理單元38b1相互近接。因此,能夠良好地減小熱處理單元38b1之設置空間。即,能夠良好地減小熱處理部37b1之設置空間。因此,可減小基板處理裝置1之佔據面積。
The distance Da between two adjacent first center points Ga1 in the substantially front-rear direction X is less than 3 times the radius r of the substrate W. As such, the distance Da is relatively small. Therefore, the size of the heat treatment unit 38a1 is relatively small, and the two heat treatment units 38a1 arranged in the substantially front-rear direction X are close to each other. Therefore, the installation space of the heat treatment unit 38a1 can be reduced well. That is, the installation space of the heat treatment portion 37a1 can be reduced favorably. Similarly, the distance Db between two adjacent second center points Gb1 in the substantially front-rear direction X is less than 3 times the radius r of the substrate W. In this way, the size of the heat treatment unit 38b1 is relatively small, and the two heat treatment units 38b1 arranged in the substantially front-rear direction X are close to each other. Therefore, the installation space of the heat treatment unit 38b1 can be reduced satisfactorily. That is, the installation space of the heat treatment part 37b1 can be reduced favorably. Therefore, the area occupied by the
寬度方向Y上之搬送空間32之長度為基板W之半徑r之5倍以下。因此,可減小俯視下之搬送空間32之面積。因此,可減小基板處理裝置1之佔據面積。
The length of the
熱處理部37a1對基板W進行之熱處理包含預處理。熱處理部37b1對基板W進行之熱處理亦包含預處理。此處,預處理係對進行液體處理前之基板W進行之熱處理。因此,基板處理裝置1能夠高效率地對基板W進行預處理。
The heat treatment of the substrate W by the heat treatment section 37a1 includes pretreatment. The heat treatment of the substrate W by the heat treatment section 37b1 also includes pretreatment. Here, the pretreatment refers to the heat treatment performed on the substrate W before the liquid treatment. Therefore, the
熱處理部37a1對基板W進行之熱處理包含後處理。熱處理部37b1對基板W進行之熱處理亦包含後處理。此處,後處理係對進行了液體處理後
之基板W進行之熱處理。因此,基板處理裝置1能夠高效率地對基板W進行後處理。
The heat treatment performed on the substrate W by the heat treatment section 37a1 includes post-processing. The heat treatment of the substrate W by the heat treatment portion 37b1 also includes post-treatment. Here, the post-treatment is the liquid treatment
The substrate W is heat treated. Therefore, the
熱處理部37a1對基板W進行之熱處理包含疏水化處理。熱處理部37b1對基板W進行之熱處理亦包含疏水化處理。因此,基板處理裝置1能夠高效率地對基板W進行疏水化處理。
The heat treatment of the substrate W by the heat treatment section 37a1 includes a hydrophobization treatment. The heat treatment performed on the substrate W by the heat treatment portion 37b1 also includes a hydrophobization treatment. Therefore, the
熱處理部37a1對基板W進行之熱處理包含加熱處理。熱處理部37b1對基板W進行之熱處理亦包含加熱處理。因此,基板處理裝置1能夠高效率地對基板W進行加熱處理。
The heat treatment of the substrate W by the heat treatment section 37a1 includes heat treatment. The heat treatment of the substrate W by the heat treatment section 37b1 also includes heat treatment. Therefore, the
熱處理部37a1對基板W進行之熱處理包含冷卻處理。熱處理部37b1對基板W進行之熱處理亦包含冷卻處理。因此,基板處理裝置1能夠高效率地對基板W進行冷卻處理。
The heat treatment of the substrate W by the heat treatment section 37a1 includes cooling treatment. The heat treatment of the substrate W by the heat treatment section 37b1 also includes cooling treatment. Therefore, the
熱處理部37b1對基板W進行之熱處理與熱處理部37a1對基板W進行之熱處理相同。因此,基板處理裝置1能夠高效率地對基板W進行熱處理。
The heat treatment performed on the substrate W by the heat treatment section 37b1 is the same as the heat treatment performed on the substrate W by the heat treatment section 37a1. Therefore, the
載置部82a1與載置部82b1以排列於上下方向Z之方式配置。載置部82b1於俯視下與載置部82a1重疊。因此,可減小俯視下之載置部82a1、82b1之設置空間。因此,可減小基板處理裝置1之佔據面積。
The placing portion 82a1 and the placing portion 82b1 are arranged so as to be aligned in the vertical direction Z. The placement portion 82b1 overlaps the placement portion 82a1 in a plan view. Therefore, the installation space of the placing portions 82a1 and 82b1 in a plan view can be reduced. Therefore, the area occupied by the
液體處理部71配置於搬送機構34a1可搬送基板W之區域Ba之外部。如此,液體處理部71配置於搬送機構34a1無法進出之位置。因此,搬送機構34a1不向液體處理部71搬送基板W。因此,能夠良好地防止搬送機構34a1所負擔之基板W之搬送量變得過大。液體處理部71配置於搬送機構34b1可搬送基板W之區域Bb之外部。因此,搬送機構34b1不向液體處理部71搬送基板W。因此,能夠良好地防止搬送機構34b1所負擔之基板W之搬送量變得過大。
The
基板處理裝置1具備液體處理用搬送機構67。因此,可將基板W良好地搬送至液體處理部71。
The
液體處理用搬送機構67配置於搬送機構34a1之後方。因此,能夠良好地防止搬送機構34a1與液體處理用搬送機構67干涉。液體處理用搬送機構67配置於搬送機構34b1之後方。因此,能夠良好地防止搬送機構34b1與液體處理用搬送機構67干涉。
The liquid
液體處理部71配置於與液體處理用搬送機構67鄰接之位置。因此,液體處理用搬送機構67能夠容易地進出液體處理部71。
The
搬送機構34a2、34b2配置於搬送機構34a1、34a2之上方。因此,可減小俯視下之搬送機構34a1、34a2、34b1、34b2之設置空間。換言之,可減小俯視下之搬送空間32之設置面積。
The conveying mechanisms 34a2, 34b2 are arranged above the conveying mechanisms 34a1, 34a2. Therefore, the installation space of the conveying mechanisms 34a1, 34a2, 34b1, and 34b2 in a plan view can be reduced. In other words, the installation area of the conveying
熱處理部37a2於俯視下與熱處理部37a1重疊。因此,可減小俯視下之熱處理部37a1、37a2之設置空間。熱處理部37b2於俯視下與熱處理部37b1重疊。因此,可減小俯視下之熱處理部37b1、37b2之設置空間。 The heat treatment part 37a2 overlaps with the heat treatment part 37a1 in a plan view. Therefore, the installation space of the heat treatment portions 37a1 and 37a2 in a plan view can be reduced. The heat treatment part 37b2 overlaps with the heat treatment part 37b1 in a plan view. Therefore, the installation space of the heat treatment portions 37b1 and 37b2 in a plan view can be reduced.
熱處理部37a2與搬送空間32以排列於大致寬度方向Y之方式配置。熱處理部37a2具備複數個熱處理單元38a2。熱處理單元38a2分別對1片基板W進行熱處理。搬送機構34a2將基板W搬送至熱處理單元38a2。此處,熱處理單元38a2以排列於大致前後方向X之方式配置。因此,可相對容易地增加熱處理部37a2中所包含之熱處理單元38a2之數量。因此,熱處理部37a2能夠對相對較多之基板W並行地進行熱處理。因此,能夠良好地提高基板處理裝置1之處理量。
The heat treatment portion 37a2 and the
熱處理部37b2與搬送空間32以排列於大致寬度方向Y之方式配置。更具體而言,搬送空間32於大致寬度方向Y上配置於熱處理部37a2與熱處理部37b2之間。熱處理部37b2具備複數個熱處理單元38b2。熱處理單元38b2分別對1片基板W進行熱處理。搬送機構34b2將基板W搬送至熱處理單元38b2。熱處理單元38b2以排列於大致前後方向X之方式配置。因此,可相對容易地增加熱處理部37b2中所包含之熱處理單元38b2之數量。因此,熱處理部37b2能夠對相對較多之基板W並行地進行熱處理。因此,能夠良好地提高基板處理裝置1之處理量。
The heat treatment part 37b2 and the
熱處理部37a2、37b1、37b2對基板W進行之熱處理分別與熱處理部37a1對基板W進行之熱處理相同。因此,基板處理裝置1能夠高效率地對
基板W進行熱處理。
The heat treatment of the substrate W by the heat treatment sections 37a2, 37b1, and 37b2 is the same as the heat treatment of the substrate W by the heat treatment section 37a1, respectively. Therefore, the
載置部82a1、82a2、82b1、82b2以排列於大致上下方向Z之方式配置。載置部82a2、82b1、82b2於俯視下分別與載置部82a1重疊。因此,可減小俯視下之載置部82a1、82a2、82b1、82b2之設置空間。因此,可減小基板處理裝置1之佔據面積。
The mounting portions 82a1, 82a2, 82b1, and 82b2 are arranged so as to be aligned in the substantially vertical direction Z. The placement portions 82a2, 82b1, and 82b2 respectively overlap the placement portion 82a1 in a plan view. Therefore, the installation space of the placement portions 82a1, 82a2, 82b1, and 82b2 in a plan view can be reduced. Therefore, the area occupied by the
移載傳送用搬送機構25於載具C與載置部82a1之間搬送基板W。因此,可經由載置部82a1於移載傳送用搬送機構25與搬送機構34a1之間搬送基板W。例如,移載傳送用搬送機構25可將自載具C搬出之基板W交遞至搬送機構34a1。例如,移載傳送用搬送機構25可將自搬送機構34a1接收到之基板W搬入至載具C內。
The
同樣地,移載傳送用搬送機構25於載具C與載置部82b1之間搬送基板W。因此,可經由載置部82b1於移載傳送用搬送機構25與搬送機構34b1之間搬送基板W。移載傳送用搬送機構25於載具C與載置部82a2之間搬送基板W。因此,可經由載置部82a2於移載傳送用搬送機構25與搬送機構34a2之間搬送基板W。移載傳送用搬送機構25於載具C與載置部82b2之間搬送基板W。因此,可經由載置部82b2於移載傳送用搬送機構25與搬送機構34b2之間搬送基板W。
Similarly, the
液體處理部71配置於搬送機構34a2可搬送基板W之區域之外部。因此,搬送機構34a2不向液體處理部71搬送基板W。因此,能夠良好地防止
搬送機構34a2所負擔之基板W之搬送量變得過大。
The
液體處理部71配置於搬送機構34b2可搬送基板W之區域之外部。因此,搬送機構34b2不向液體處理部71搬送基板W。因此,能夠良好地防止搬送機構34b2所負擔之基板W之搬送量變得過大。
The
液體處理用搬送機構67配置於搬送機構34a2、34b2之後方。因此,能夠良好地防止搬送機構34a2、34b2與液體處理用搬送機構67干涉。
The liquid
液體處理部71配置於與液體處理用搬送機構67於大致寬度方向Y上並排之位置。因此,液體處理用搬送機構67能夠容易地進出液體處理部71。
The
載置部84a1、84a2、84b1、84b2以排列於大致上下方向Z之方式配置。載置部84a2、84b1、84b2於俯視下分別與載置部84a1重疊。因此,可減小俯視下之載置部84a1、84a2、84b1、84b2之設置空間。因此,可減小基板處理裝置1之佔據面積。
The mounting portions 84a1, 84a2, 84b1, and 84b2 are arranged so as to be aligned in the substantially vertical direction Z. The placement portions 84a2, 84b1, and 84b2 respectively overlap the placement portion 84a1 in a plan view. Therefore, the installation space of the placement portions 84a1, 84a2, 84b1, and 84b2 in a plan view can be reduced. Therefore, the area occupied by the
搬送機構34a1及液體處理用搬送機構67可將基板W載置於載置部84a1。因此,可經由載置部84a1於搬送機構34a1與液體處理用搬送機構67之間搬送基板W。例如,液體處理用搬送機構67可自搬送機構34a1接收基板W。例如,液體處理用搬送機構67可將基板W交遞至搬送機構34a1。
The transport mechanism 34a1 and the liquid
同樣地,搬送機構34b1及液體處理用搬送機構67可將基板W載置於載置部84b1。因此,可經由載置部84b1於搬送機構34b1與液體處理用搬送機構67之間搬送基板W。搬送機構34a2及液體處理用搬送機構67可將基板W載置於載置部84a2。因此,可經由載置部84a2於搬送機構34a2與液體處理用搬送機構67之間搬送基板W。搬送機構34b2及液體處理用搬送機構67可將基板W載置於載置部84b2。因此,可經由載置部84b2於搬送機構34b2與液體處理用搬送機構67之間搬送基板W。
Similarly, the transport mechanism 34b1 and the liquid
基板處理裝置1具備檢查部41a1-41a4、41b1-41b4。因此,基板處理裝置1能夠高效率地對基板W進行檢查。
The
本發明並不限於實施形態,能以如下方式變化實施。 The present invention is not limited to the embodiment, and can be modified and implemented as follows.
於上述實施形態中,熱處理用搬送機構33具備8個搬送機構34a1-34a4、34b1-34b4。但並不限於此。能夠適宜地變更熱處理用搬送機構33所具備之搬送機構34之數量。
In the above-described embodiment, the heat
於上述實施形態中,旋轉軸線A35f配置於與旋轉軸線A35d相同之位置。但並不限於此。例如,旋轉軸線A35f亦可配置於與旋轉軸線A35d不同之位置。 In the above embodiment, the rotation axis A35f is arranged at the same position as the rotation axis A35d. But it is not limited to this. For example, the rotation axis A35f may be arranged at a position different from the rotation axis A35d.
於上述實施形態中,基板處理裝置1具備8個熱處理部37a1-37a4、
37b1-37b4。但並不限於此。能夠適宜地變更基板處理裝置1所具備之熱處理部37之數量。
In the above embodiment, the
於上述實施形態中,熱處理部37a1具備7個熱處理單元38a1。但並不限於此。能夠適宜地變更熱處理部37a1所具備之熱處理單元38a1之數量。 In the above-mentioned embodiment, the heat treatment section 37a1 includes seven heat treatment units 38a1. But it is not limited to this. The number of heat treatment units 38a1 included in the heat treatment section 37a1 can be appropriately changed.
於上述實施形態中,作為熱處理部37a1對基板W進行之熱處理,例示了疏水化處理、加熱處理及冷卻處理。但並不限於此。能夠適宜地變更熱處理部37a1對基板W進行之熱處理之內容。例如,熱處理部37a1對基板W進行之熱處理亦可不包含疏水化處理、加熱處理及冷卻處理中之1個或2個。 In the above-mentioned embodiment, as the heat treatment performed by the heat treatment portion 37a1 on the substrate W, hydrophobization treatment, heating treatment, and cooling treatment are exemplified. But it is not limited to this. The content of the heat treatment performed on the substrate W by the heat treatment section 37a1 can be appropriately changed. For example, the heat treatment of the substrate W by the heat treatment section 37a1 may not include one or two of the hydrophobization treatment, heating treatment, and cooling treatment.
於上述實施形態中,熱處理部37b1對基板W進行之熱處理與熱處理部37a1對基板W進行之熱處理相同。但並不限於此。熱處理部37b1對基板W進行之熱處理亦可與熱處理部37a1對基板W進行之熱處理不同。 In the above-mentioned embodiment, the heat treatment performed on the substrate W by the heat treatment portion 37b1 is the same as the heat treatment performed on the substrate W by the heat treatment portion 37a1. But it is not limited to this. The heat treatment performed on the substrate W by the heat treatment portion 37b1 may be different from the heat treatment performed on the substrate W by the heat treatment portion 37a1.
於上述實施形態中,滑動部56固定於可動構件51a1之下部。但並不限於此。能將滑動部56固定於可動構件51a1之任意部位。例如,亦可將滑動部56固定於可動構件51a1之側部或上部。
In the above-mentioned embodiment, the sliding
於上述實施形態中,液體處理部71配置於與液體處理用搬送機構67於大致寬度方向Y上並排之位置。但並不限於此。例如,亦可將液體處理
部71配置於液體處理用搬送機構67之後方之位置。例如,亦可將液體處理部71配置於與液體處理用搬送機構67於大致寬度方向Y上並排之位置、及液體處理用搬送機構67之後方位置中之至少任一位置。
In the above-mentioned embodiment, the
於上述實施形態中,液體處理部71對基板W進行之塗佈處理係於基板W上形成抗蝕劑膜之處理。但並不限於此。塗佈處理亦可為於基板W上形成抗反射膜之處理。
In the above-mentioned embodiment, the coating process performed on the substrate W by the
於上述實施形態中,液體處理部71對基板W進行之液體處理為塗佈處理。但並不限於此。液體處理亦可為將基板W進行顯影之顯影處理。顯影處理係基板W對供給顯影液。液體處理亦可為清洗基板W之清洗處理。清洗處理係對基板W供給清洗液。
In the above-mentioned embodiment, the liquid treatment performed on the substrate W by the
於上述實施形態中,基板處理裝置1具備檢查部41。但並不限於此。例如,亦可省略檢查部41。
In the above-described embodiment, the
於上述實施形態中,可動構件51a1支持檢查部41a。但並不限於此。可動構件51a1亦可不支持檢查部41a。 In the above-mentioned embodiment, the movable member 51a1 supports the inspection part 41a. But it is not limited to this. The movable member 51a1 may not support the inspection part 41a.
於上述實施形態中,檢查部41a具備1個檢查單元42a1。但並不限於此。檢查部41a亦可具備複數個檢查單元42a1。 In the above-described embodiment, the inspection unit 41a includes one inspection unit 42a1. But it is not limited to this. The inspection unit 41a may include a plurality of inspection units 42a1.
對於上述實施形態及各變化實施形態,亦可進一步將各構成與其他 變化實施形態之構成進行置換或組合等而適宜地變更。 Regarding the above-mentioned embodiment and each modified embodiment, each configuration can be further combined with other The configuration of the embodiment is changed, replaced or combined, etc., to change as appropriate.
本發明可不脫離其思想或本質而以其他具體之形式實施,因此,作為表示發明範圍之內容,應參照所附加之申請專利範圍而非以上說明。 The present invention can be implemented in other specific forms without departing from its idea or essence. Therefore, as content indicating the scope of the invention, the appended patent scope should be referred to instead of the above description.
31:熱處理區塊 31: Heat treatment block
32:搬送空間 32: Transport space
33:熱處理用搬送機構 33: Conveying mechanism for heat treatment
34a1:搬送機構(第1搬送機構) 34a1: Transport mechanism (1st transport mechanism)
34a2:搬送機構(第3搬送機構) 34a2: Transport mechanism (3rd transport mechanism)
34a3:搬送機構 34a3: Transport mechanism
34a4:搬送機構 34a4: Transport mechanism
34b1:搬送機構(第2搬送機構) 34b1: Transport mechanism (2nd transport mechanism)
34b2:搬送機構(第4搬送機構) 34b2: Transport mechanism (4th transport mechanism)
34b3:搬送機構 34b3: Transport mechanism
34b4:搬送機構 34b4: Transport mechanism
37a1:熱處理部(第1熱處理部) 37a1: Heat treatment section (1st heat treatment section)
37a2:熱處理部(第3熱處理部) 37a2: Heat treatment section (3rd heat treatment section)
37a3:熱處理部 37a3: Heat treatment department
37a4:熱處理部 37a4: Heat treatment department
37b1:熱處理部(第2熱處理部) 37b1: Heat treatment section (Second heat treatment section)
37b2:熱處理部(第4熱處理部) 37b2: Heat treatment section (4th heat treatment section)
37b3:熱處理部 37b3: Heat treatment department
37b4:熱處理部 37b4: Heat treatment department
38a1:熱處理單元(第1熱處理單元) 38a1: Heat treatment unit (1st heat treatment unit)
38a2:熱處理單元(第3熱處理單元) 38a2: Heat treatment unit (3rd heat treatment unit)
38a3:熱處理單元 38a3: heat treatment unit
38a4:熱處理單元 38a4: heat treatment unit
38b1:熱處理單元(第2熱處理單元) 38b1: Heat treatment unit (2nd heat treatment unit)
38b2:熱處理單元(第4熱處理單元) 38b2: Heat treatment unit (4th heat treatment unit)
38b3:熱處理單元 38b3: Heat treatment unit
38b4:熱處理單元 38b4: Heat treatment unit
45:框架 45: Frame
46:第1框架
46:
47:第2框架
47:
48a:基座部 48a: Base
48b:支柱 48b: Pillar
48c:桿 48c: Rod
48d:空間(第1框架/第2框架之內部) 48d: Space (the interior of the 1st frame/the 2nd frame)
51a1:可動構件(第1可動構件) 51a1: movable member (the first movable member)
51a2:可動構件(第3可動構件) 51a2: movable member (third movable member)
51a3:可動構件 51a3: movable member
51a4:可動構件 51a4: movable member
51b1:可動構件(第2可動構件) 51b1: Movable member (2nd movable member)
51b2:可動構件(第4可動構件) 51b2: movable member (4th movable member)
51b3:可動構件 51b3: movable member
51b4:可動構件 51b4: movable member
55:引導部 55: Guidance
56:滑動部 56: Sliding part
Qa1:維護位置(第1維護位置) Qa1: Maintenance position (1st maintenance position)
Qa2:維護位置(第3維護位置) Qa2: Maintenance position (3rd maintenance position)
Qa3:處理位置 Qa3: Processing location
Qa4:處理位置 Qa4: Processing location
Qb1:維護位置(第2維護位置) Qb1: Maintenance position (2nd maintenance position)
Qb2:維護位置(第4維護位置) Qb2: Maintenance position (4th maintenance position)
Qb3:處理位置 Qb3: Processing location
Qb4:處理位置 Qb4: Processing location
X:前後方向 X: front and rear direction
Y:寬度方向 Y: width direction
Z:上下方向 Z: Up and down direction
Claims (20)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018225831A JP7115966B2 (en) | 2018-11-30 | 2018-11-30 | Substrate processing equipment |
JP2018-225831 | 2018-11-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW202029395A TW202029395A (en) | 2020-08-01 |
TWI733257B true TWI733257B (en) | 2021-07-11 |
Family
ID=70853778
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW108143060A TWI733257B (en) | 2018-11-30 | 2019-11-27 | Substrate treating apparatus |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP7115966B2 (en) |
TW (1) | TWI733257B (en) |
WO (1) | WO2020110682A1 (en) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW200935552A (en) * | 2007-12-28 | 2009-08-16 | Sokudo Co Ltd | Substrate treating apparatus |
US20130052599A1 (en) * | 2011-08-29 | 2013-02-28 | Tokyo Electron Limited | Substrate heat treatment device |
TW201413852A (en) * | 2012-08-29 | 2014-04-01 | Sokudo Co Ltd | Substrate processing apparatus and substrate processing method |
US20150227050A1 (en) * | 2014-02-10 | 2015-08-13 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method and apparatus for baking photoresist patterns |
TW201734231A (en) * | 2015-12-24 | 2017-10-01 | 愛森特有限公司 | Inter-back type deposition system with reduced footprint |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000021784A (en) | 1998-07-01 | 2000-01-21 | Tokyo Electron Ltd | Jig for transferring treating chamber and heater, and transferring method |
JP2004015019A (en) | 2002-06-11 | 2004-01-15 | Dainippon Screen Mfg Co Ltd | Substrate handling device |
JP2004087675A (en) | 2002-08-26 | 2004-03-18 | Dainippon Screen Mfg Co Ltd | Substrate treating device |
JP5449720B2 (en) | 2008-08-26 | 2014-03-19 | 株式会社Sokudo | Substrate processing equipment |
JP5667996B2 (en) | 2012-02-21 | 2015-02-12 | 東京エレクトロン株式会社 | Substrate processing equipment |
-
2018
- 2018-11-30 JP JP2018225831A patent/JP7115966B2/en active Active
-
2019
- 2019-11-11 WO PCT/JP2019/044109 patent/WO2020110682A1/en active Application Filing
- 2019-11-27 TW TW108143060A patent/TWI733257B/en active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW200935552A (en) * | 2007-12-28 | 2009-08-16 | Sokudo Co Ltd | Substrate treating apparatus |
US20130052599A1 (en) * | 2011-08-29 | 2013-02-28 | Tokyo Electron Limited | Substrate heat treatment device |
TW201413852A (en) * | 2012-08-29 | 2014-04-01 | Sokudo Co Ltd | Substrate processing apparatus and substrate processing method |
US20150227050A1 (en) * | 2014-02-10 | 2015-08-13 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method and apparatus for baking photoresist patterns |
TW201734231A (en) * | 2015-12-24 | 2017-10-01 | 愛森特有限公司 | Inter-back type deposition system with reduced footprint |
Also Published As
Publication number | Publication date |
---|---|
WO2020110682A1 (en) | 2020-06-04 |
JP7115966B2 (en) | 2022-08-09 |
JP2020088351A (en) | 2020-06-04 |
TW202029395A (en) | 2020-08-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US10290521B2 (en) | Substrate treating apparatus with parallel gas supply pipes and a gas exhaust pipe | |
JP2020188255A (en) | Wafer boat handling device, vertical batch furnace, and method | |
KR100618108B1 (en) | Substrate processing apparatus | |
KR20200064911A (en) | Substrate Processing Apparatus for Processing Substrates | |
CN107017182B (en) | Substrate processing apparatus | |
JP2019029627A (en) | Inspection system | |
TWI748290B (en) | Substrate treating apparatus | |
US10573546B2 (en) | Substrate treating apparatus | |
JP5817693B2 (en) | Substrate processing equipment | |
JP2020053427A (en) | Substrate processing apparatus | |
JP6033048B2 (en) | Liquid processing equipment | |
KR101965931B1 (en) | Substrate processing device | |
TWI733257B (en) | Substrate treating apparatus | |
KR101312252B1 (en) | Substrate cooling apparatus and substrate treating facility uncluding the unit | |
KR20170052333A (en) | Cooling unit, Apparatus for treating substrate, and method for treating substrate | |
US11049749B2 (en) | Substrate treating apparatus | |
US10269598B2 (en) | Substrate treating apparatus | |
US20230152704A1 (en) | Heat treatment apparatus | |
JP2021190441A (en) | Substrate processing apparatus and substrate processing method | |
KR20170079761A (en) | Transfer chamber, Apparatus for treating substrate, and method for trasnferring substrate | |
KR102504570B1 (en) | Apparatus for treating substrate | |
KR20200050039A (en) | Apparatus and Method for treating substrate | |
JPH1187464A (en) | Apparatus for treating substrates |