TWI718064B - A method for conveying a group of electronic components during pick and place process - Google Patents
A method for conveying a group of electronic components during pick and place process Download PDFInfo
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- TWI718064B TWI718064B TW109117432A TW109117432A TWI718064B TW I718064 B TWI718064 B TW I718064B TW 109117432 A TW109117432 A TW 109117432A TW 109117432 A TW109117432 A TW 109117432A TW I718064 B TWI718064 B TW I718064B
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
- H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
- H05K13/0812—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines the monitoring devices being integrated in the mounting machine, e.g. for monitoring components, leads, component placement
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/04—Mounting of components, e.g. of leadless components
- H05K13/0404—Pick-and-place heads or apparatus, e.g. with jaws
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
- H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
- H05K13/0813—Controlling of single components prior to mounting, e.g. orientation, component geometry
Abstract
Description
本發明涉及一種在取放程序中搬運一組電子元件的方法,此方法藉由以下來實現:藉由包含多個拾取頭的一取放裝置將該組電子元件放置在一特定位置;其中該特定位置是一巢形件,該巢形件分別與至少四個巢形件側壁相隔一預定的XY偏移值;藉由至少一預準視覺檢測系統對該組電子元件拍攝至少一影像,以相對於該些巢形件側壁判斷該組電子元件中每個電子元件的XY位置;若該組電子元件中所有電子元件的XY位置相對於該些巢形件側壁是在一預設偏移值內時,由至少一對準器模組讓該組電子元件中每個電子元件彼此對齊;以及若該組電子元件中任一電子元件的XY位置相對於該些巢形件側壁不在一預設偏移值內時,由至少一拾取機構拾取該組電子元件並移到至少一廢料槽,或者由一使用者利用不同的預設偏移值重新檢測該組電子元件中受影響的電子元件。 The present invention relates to a method for transporting a group of electronic components in a pick-and-place procedure. The method is realized by: placing the group of electronic components at a specific position by a pick-and-place device including a plurality of pick-up heads; The specific position is a nest-shaped piece, and the nest-shaped piece is separated from at least four side walls of the nest-shaped piece by a predetermined XY offset value; at least one image of the group of electronic components is taken by at least one pre-aligned visual inspection system to Determine the XY position of each electronic component in the group of electronic components relative to the side walls of the nests; if the XY position of all the electronic components in the group of electronic components is a preset offset value relative to the side walls of the nests When internally, at least one aligner module is used to align each electronic component in the group of electronic components with each other; and if the XY position of any electronic component in the group of electronic components is not at a preset value relative to the side walls of the nests When the offset value is within the offset value, the group of electronic components is picked up by at least one picking mechanism and moved to at least one waste slot, or a user uses a different preset offset value to re-detect the affected electronic components in the group of electronic components.
眾所周知的是,傳統的取放程序和分類程序有嚴重的缺點,就是例如晶粒或單顆成型的封裝體等的電子元件是藉由一取放機構各別地拾取並轉移,因而導致每小時單位產能(UPH)低的問題。此外,轉換不同尺寸或類型的電子元件所需的時間也會導致低產量工序。 It is well known that the traditional pick-and-place procedures and sorting procedures have serious shortcomings. For example, electronic components such as dies or single-molded packages are picked up and transferred by a pick-and-place mechanism. The problem of low unit production capacity (UPH). In addition, the time required to convert electronic components of different sizes or types can also lead to low-yield processes.
鄭某等人於美國公告專利US7,190,446B1揭露了一種處理例如半導體封裝體的電子元件的裝置與方法。如此專利所指出的,多個單顆成型的封裝 體是各別地從一帶體上拾取並放置在位於一轉盤的某個區段的支撐體上。利用位於裝載位置和卸載位置之間的一第一光學系統來檢測由支撐體所支撐的電子裝置的第一表面,同時或然後利用位於裝載位置和卸載位置之間的一第二光學系統檢測由支撐體所支撐的此電子裝置上相反於第一表面的第二表面。最後,這些封裝體會被旋轉至一區段,以藉由一卸載臂各別地拾取,同時將這些封裝體分別地轉移到不同的卸載裝置。在此情況下,各別拾取並轉移封裝體會拖慢整個程序,因而導致每小時單位產能(UPH)低的問題以及低產量製程。 Zheng et al. disclosed a device and method for processing electronic components, such as semiconductor packages, in the US Published Patent No. 7,190,446B1. As pointed out in this patent, multiple single molded packages The bodies are individually picked up from a belt body and placed on a support body located in a certain section of a turntable. A first optical system located between the loading position and the unloading position is used to detect the first surface of the electronic device supported by the support, while or then a second optical system located between the loading position and the unloading position is used to detect the The second surface of the electronic device supported by the support is opposite to the first surface. Finally, the packages are rotated to a section to be picked up by an unloading arm, and the packages are transferred to different unloading devices. In this case, picking up and transferring the packages individually will slow down the entire process, resulting in the problem of low unit productivity per hour (UPH) and low-volume manufacturing processes.
如羅某於美國公告專利US6,446,354B1所揭露的一種處理機系統,其裝設有:一裝載單元,用以裝載存放在匣盒內的至少其中一條帶體;一牽引機單元,用以在牽引機吸持器處由裝載單元托著此帶體;一帶體傳輸單元,用以在托著之後以一吸持方式固定其吸持頭,以及用以將此帶體移到一切割裝置,使該帶體切割成多個單獨的封裝裝置;一封裝清潔單元,用以在藉由吸真空力將這些單獨的封裝裝置固定並維持在其上之後,透過一刷子和一氣體噴嘴對這些單獨的封裝裝置進行清除工作;一封裝乾燥單元,用以在清除完畢之後,對這些單獨的封裝裝置進行乾燥工作;一封裝體存放單元,用以在乾燥完成之後進行移動並存放;一封裝拾取單元,用以保持以及排列這些單獨的封裝裝置,以供品質檢測,封裝拾取單元安裝於封裝體存放單元的一側;一視覺檢測手段,用以檢測這些單獨的封裝裝置的品質;以及一封裝托盤存放單元,用以藉由吸真空力使這些單獨的封裝裝置C保持在其上,以將這些單獨的封裝裝置安置於封裝存放單元上,封裝托盤存放單元用以傳輸已包含有根據檢測結果被加以分類之單獨封裝裝置於其上的托盤。此方法拾取頭設計複雜且需要使用數個馬達在Z軸方向上驅動各別的真空吸盤。 For example, a processor system disclosed by Luo in the US Patent No. 6,446,354B1 is equipped with: a loading unit for loading at least one of the belts stored in the cassette; a tractor unit for The belt is supported by the loading unit at the suction holder of the tractor; a belt transmission unit is used to fix the holding head in a sucking manner after being supported, and to move the belt to a cutting device , The tape is cut into a plurality of individual packaging devices; a packaging cleaning unit is used to fix and maintain these individual packaging devices by a vacuum force, and then apply a brush and a gas nozzle to these A separate packaging device is used for cleaning; a packaging drying unit is used to dry these separate packaging devices after the cleaning is completed; a package storage unit is used to move and store after the drying is completed; a package pickup A unit for holding and arranging these individual packaging devices for quality inspection, the package picking unit is installed on one side of the package storage unit; a visual inspection means for testing the quality of these individual packaging devices; and a package The tray storage unit is used to hold the individual packaging devices C on the packaging storage unit by the vacuum force, so as to place the individual packaging devices on the packaging storage unit, and the packaging tray storage unit is used to transmit the test results that contain the basis The tray on which the individually packaged devices are classified. In this method, the design of the pick-up head is complicated and requires several motors to drive separate vacuum chucks in the Z-axis direction.
因此,若能取得一種在取放程序中一次性地轉移一組電子元件的方法,此方法可克服每小時單位產能(UPH)低的問題以及藉由降低或省去轉換電子元件所需的時間來改善製程,同時此方法還可迎合單一取放程序中多種尺寸或類型的電子元件(例如晶片或晶粒)的需求,將有助於減輕這些缺點。 Therefore, if a method of transferring a group of electronic components in the pick-and-place process can be obtained, this method can overcome the problem of low unit productivity per hour (UPH) and by reducing or eliminating the time required to convert electronic components To improve the manufacturing process, this method can also cater to the needs of multiple sizes or types of electronic components (such as wafers or dies) in a single pick and place process, which will help alleviate these shortcomings.
因此,本發明主要目的在於提供一種在取放程序中搬運一組電子元件的方法,該方法旨在藉由一次性地拾取該些電子元件來克服每小時單位產能(UPH)低的問題。 Therefore, the main purpose of the present invention is to provide a method for handling a group of electronic components in a pick-and-place procedure, which aims to overcome the problem of low unit productivity per hour (UPH) by picking up the electronic components at once.
本發明另一目的在於提供一種在取放程序中搬運一組電子元件的方法,該方法可迎合單一取放程序中不同尺寸和不同類型的電子元件的需求。 Another object of the present invention is to provide a method for handling a group of electronic components in a pick-and-place procedure, which can meet the needs of electronic components of different sizes and types in a single pick-and-place procedure.
本發明再一目的在於提供一種在取放程序中搬運一組電子元件的方法,該方法可改善生產量。 Another object of the present invention is to provide a method for handling a group of electronic components in a pick-and-place procedure, which can improve throughput.
本發明再一目的在於提供一種在取放程序中搬運一組電子元件的方法,該方法可降低或省略用來轉換不同尺寸或不同類型的電子元件所需的時間。 Another object of the present invention is to provide a method for handling a group of electronic components in a pick-and-place procedure, which can reduce or omit the time required to convert electronic components of different sizes or types.
透過理解以下對本發明的詳細描述或在實際實踐本發明後,本發明的其他目的將變得顯而易見。 Other objects of the present invention will become apparent after understanding the following detailed description of the present invention or after actually practicing the present invention.
根據本發明較佳實施例提供以下內容:一種在取放程序中搬運一組電子元件的方法(1)包含以下步驟:(i)藉由包含多個拾取頭的一取放裝置將該組電子元件放置在一特定位置;其特徵在於 該特定位置是一巢形件,該巢形件分別與至少四個巢形件側壁相隔一預定的XY偏移量;該方法於該步驟(i)之後更包含以下步驟:(ii)藉由至少一預準視覺檢測系統對該組電子元件拍攝至少一影像,以相對於該些巢形件側壁,判斷該組電子元件中的每個電子元件的XY位置;(iii)若相對於該些巢形件側壁,該組電子元件中所有電子元件的XY位置是在一預設偏移值時,至少一對準器模組使該組電子元件的每個電子元件彼此對準;(iv)若相對於該些巢形件側壁,該組電子元件中任一電子元件的XY位置不在一預設偏移值時,至少一拾取機構會拾取該組電子元件並移動到至少一廢料槽,或者由一使用者以不同的預設偏移值重新檢測該組電子元件中受影響的電子元件。 According to a preferred embodiment of the present invention, the following content is provided: a method for handling a group of electronic components in a pick-and-place procedure (1) includes the following steps: (i) the group of electronic components is transferred by a pick-and-place device including multiple pick-up heads The component is placed in a specific position; it is characterized by The specific position is a nest, and the nest is separated from the side walls of at least four nests by a predetermined XY offset; after the step (i), the method further includes the following steps: (ii) by At least one pre-aligned visual inspection system shoots at least one image of the group of electronic components to determine the XY position of each electronic component in the group of electronic components relative to the side walls of the nest-shaped elements; (iii) if relative to the On the side wall of the nest, when the XY positions of all electronic components in the group of electronic components are at a preset offset value, at least one aligner module aligns each electronic component of the group of electronic components with each other; (iv) If the XY position of any electronic component in the group of electronic components is not a preset offset value relative to the side walls of the nest-shaped elements, at least one picking mechanism will pick up the group of electronic components and move to at least one waste slot, or A user re-detects the affected electronic components in the group of electronic components with different preset offset values.
102:電子元件 102: electronic components
109:巢形件 109: Nest
111:巢形件側壁 111: Nest side wall
2:對準器模組 2: Aligner module
201:第一Y軸對準器支臂 201: First Y-axis aligner arm
203:第二Y軸對準器支臂 203: Second Y-axis aligner arm
205:第一X軸對準器支臂 205: First X-axis aligner arm
207:第二X軸對準器支臂 207: Second X-axis aligner arm
209:Y軸致動器 209: Y-axis actuator
211:X軸致動器 211: X-axis actuator
213:Z軸致動器 213: Z-axis actuator
401:S型末端 401: S type end
403:S型末端 403: S-type end
在結合以下附圖研讀詳細描述之後,將發現本發明的其他觀點及其優點:圖1顯示本發明示範性的方法流程;圖2-A顯示本發明包含一X軸致動器的範例示意圖(前視圖);圖2-B顯示本發明包含一Y軸致動器的範例示意圖(側視圖);圖3-A顯示本發明在取放程序中對齊一組電子元件的範例方法;圖3-B顯示本發明在取放程序中對齊一組電子元件的另一種範例方法;圖4-A顯示本發明在取放程序中對齊一組電子元件的範例方法;以及 圖4-B顯示本發明在取放程序中對齊一組電子元件的範例方法。 After studying the detailed description in conjunction with the following drawings, you will find other viewpoints and advantages of the present invention: Figure 1 shows an exemplary method flow of the present invention; Figure 2-A shows an exemplary schematic diagram of the present invention including an X-axis actuator ( Front view); Fig. 2-B shows an exemplary schematic diagram (side view) of the present invention including a Y-axis actuator; Fig. 3-A shows an exemplary method of aligning a group of electronic components in the pick-and-place procedure of the present invention; Fig. 3- B shows another exemplary method of aligning a group of electronic components in the pick-and-place procedure of the present invention; Figure 4-A shows an exemplary method of aligning a group of electronic components in the pick-and-place procedure of the present invention; and Fig. 4-B shows an exemplary method of aligning a group of electronic components in the pick-and-place procedure of the present invention.
在下面的詳細描述中,闡述了許多具體細節以便提供對本發明的透徹理解。但是,本領域普通技術人員將理解,可以在沒有這些具體細節的情況下實踐本發明。在其他情況下,沒有詳細描述眾所周知的方法,過程和/或元件,以免使本發明不清楚。 In the following detailed description, many specific details are set forth in order to provide a thorough understanding of the present invention. However, those of ordinary skill in the art will understand that the present invention can be practiced without these specific details. In other cases, well-known methods, procedures and/or elements are not described in detail so as not to obscure the present invention.
從下面僅以示例方式參考附圖進行的本發明實施例的描述中,將更清楚地理解本發明,這些附圖未按比例繪製。 The present invention will be understood more clearly from the following description of the embodiments of the present invention, which is made by way of example only with reference to the accompanying drawings, which are not drawn to scale.
如在本公開和本文的專利申請範圍中所使用的,單數形式“一個”,“一種”和“該”可包括複數指示物,除非上下文清楚地指示或另外指出。 As used in the present disclosure and the scope of patent applications herein, the singular forms "a", "an" and "the" may include plural indicators unless the context clearly dictates or otherwise indicates.
在本說明書的整個公開和專利申請範圍中,單詞“包括”及其變體,例如“包括”和“包含”,是指“包括但不限於”,並且並非用以排除例如其他元件,整數或步驟。“示例性”是指“一個示例”,並且不旨在傳達較佳或理想實施例的指示,“諸如”不是限制性的,而是用於說明目的。 Throughout the scope of the disclosure and patent application of this specification, the word "including" and its variants, such as "including" and "including", means "including but not limited to" and is not used to exclude other elements, integers, or step. "Exemplary" means "an example," and is not intended to convey an indication of a preferred or ideal embodiment, "such as" is not limiting, but is used for illustrative purposes.
請參照圖1,所呈現的是在取放程序中搬運一組電子元件(102)的示範性方法(1)流程。此方法(1)是藉由以下內容來執行:(i)藉由包含多個拾取頭的一取放裝置將該組電子元件(102)放置在一特定位置上(101);其中該特定位置是一巢形件(109),巢形件(109)分別與至少四個巢形件側壁(111)相隔一預定的XY偏移量,相對於該些巢形件側壁的該預定的XY偏移是在200μm到300μm的範圍內(311);(ii)藉由至少一預準視覺檢測系統對該組電子元件(102)拍攝至少一影像,以相對於該些巢形件側壁(111),判斷該組電子元件中每個電子元件(102)的XY位 置(103),其中該些巢形件側壁(111)具有範圍在0.1mm到1.0mm的固定厚度;(iii)若相對於該些巢形件側壁(111),該組電子元件中所有電子元件(102)的XY位置是在預設偏移值內時,至少一對準器模組(2)會使該組電子元件中每個電子元件(102)彼此對齊(105),其中該些電子元件(102)的尺寸範圍是介於2x2mm到7x7mm之間;(iv)若相對於該些巢形件側壁(111),該組電子元件中任一電子元件(102)的XY位置不在預設偏移值內時,至少一拾取機構會拾取該組電子元件(102)並移到至少一廢料槽,或者一使用者會以不同的預設偏移值重新檢測該組電子元件(102)中受影響的電子元件(102)(107)。 Please refer to FIG. 1, which shows the flow of an exemplary method (1) for handling a group of electronic components (102) in a pick-and-place procedure. This method (1) is performed by the following: (i) Place the set of electronic components (102) on a specific position (101) by a pick-and-place device including multiple pick-up heads; where the specific position It is a nest-shaped piece (109), the nest-shaped piece (109) is separated from at least four nest-shaped piece side walls (111) by a predetermined XY offset, relative to the predetermined XY offset of the nest-shaped side walls The shift is in the range of 200 μm to 300 μm (311); (ii) at least one image is taken of the group of electronic components (102) by at least one pre-aligned visual inspection system, so as to be relative to the side walls of the nests (111) , To determine the XY position of each electronic component (102) in the group of electronic components Set (103), wherein the side walls (111) of the nests have a fixed thickness ranging from 0.1mm to 1.0mm; (iii) relative to the side walls (111) of the nests, all the electronic components in the group of electronic components When the XY position of the component (102) is within the preset offset value, at least one aligner module (2) will align each electronic component (102) in the group of electronic components with each other (105), wherein the The size range of the electronic component (102) is between 2x2mm and 7x7mm; (iv) If relative to the side wall (111) of the nest-shaped element, the XY position of any electronic component (102) in the group of electronic components is not in the expected When the offset value is set, at least one picking mechanism will pick up the group of electronic components (102) and move to at least one waste bin, or a user will re-detect the group of electronic components (102) with a different preset offset value The affected electronic components (102)(107).
在此情況下,重新檢測該些電子元件(102)後,相對於該些巢形件側壁(111),該組電子元件中任一電子元件(102)的XY位置仍不在預設偏移值內時,該使用者將重新檢視預設偏移值,或者實際地調整該些電子元件(102)的對位。使用者通常可設定重新檢測的循環次數。若到達限制次數時,將自動丟棄這些電子元件(102)。 In this case, after re-detecting the electronic components (102), the XY position of any electronic component (102) in the group of electronic components is still not at the preset offset value with respect to the side walls (111) of the nest-shaped elements When it is internal, the user will review the preset offset value or actually adjust the alignment of the electronic components (102). The user can usually set the number of retest cycles. If the limit is reached, these electronic components will be automatically discarded (102).
如圖2-A和圖2-B所示,該對準器模組(2)包含可沿正Y軸方向移動的至少一第一和第二Y軸對準器支臂(201、203)以及可沿正X軸方向移動的至少一第一和第二X軸對準器支臂(205、207)。該第一和第二Y軸對準器支臂(201、203)是由一Y軸致動器(209)驅動,該第一和第二X軸對準器支臂(205、207)是由一X軸致動器(211)驅動。該第一和第二Y軸對準器支臂(201、203)以及該第一和第二X軸對準器支臂(205、207)可設置成一佈局,使得該第一Y軸對準器支臂(201)可面向該第二Y軸對準器支臂(203)的一相反側,該第一X軸對準器支臂(205)可面向該第二X軸對準器支臂(207)的一相反側。此外,該第一和第二Y軸對準器支臂(201、203)以及該第一和第二X軸對準器支臂(205、207)是面向該些電子元件(102)。該對 準器模組(2)更進一步包含一Z軸致動器(213),Z軸致動器(213)用以驅動對準器模組(2)沿Z軸方向移動。 As shown in Figure 2-A and Figure 2-B, the aligner module (2) includes at least one first and second Y-axis aligner arms (201, 203) that can move along the positive Y-axis direction And at least one first and second X-axis aligner arms (205, 207) that can move along the positive X-axis direction. The first and second Y-axis aligner arms (201, 203) are driven by a Y-axis actuator (209), and the first and second X-axis aligner arms (205, 207) are Driven by an X-axis actuator (211). The first and second Y-axis aligner arms (201, 203) and the first and second X-axis aligner arms (205, 207) can be arranged in a layout such that the first Y-axis is aligned The support arm (201) may face an opposite side of the second Y-axis aligner support arm (203), and the first X-axis aligner support arm (205) may face the second X-axis aligner support The opposite side of the arm (207). In addition, the first and second Y-axis aligner arms (201, 203) and the first and second X-axis aligner arms (205, 207) face the electronic components (102). The pair The aligner module (2) further includes a Z-axis actuator (213), and the Z-axis actuator (213) is used to drive the aligner module (2) to move along the Z-axis direction.
為進一步執行步驟(iii),即若相對於該些巢形件側壁(111),該組電子元件中所有的電子元件(102)的XY位置是在一預設偏移值內時,至少一對準器模組(2)會使這組電子元件中的每個電子元件(102)彼此對齊(105),步驟(iii)更包含以下子步驟:(a)藉由一Z軸致動器(213)驅動該對準器模組(2)由一第一Z軸位置移動至一預設第二Z軸位置,該預設第二Z軸位置較佳地是低於該些電子元件(102)的底面(301),例如該第一和第二Y軸對準器支臂的S型末端(401)的底面以及該兩個X軸對準器支臂的S型末端(403)低於底面of該組電子元件(102)的底面,如圖4-A和圖4-B所示;(b)藉由一Y軸致動器(209)驅動位於該巢形件(109)上方的該第一Y軸對準器支臂(201),以藉由該第一Y軸對準器支臂(201)讓該些電子元件(102)的Y軸偏移和角度對齊(303);(c)藉由一X軸致動器(211)驅動位於該巢形件(109)左側的該第一X軸對準器支臂(205),使該第一X軸對準器支臂(205)讓該些電子元件(102)的X軸偏移和角度對齊(305);(d)藉由該Y軸致動器(209)驅動位於該巢形件(109)下方的該第二Y軸對準器支臂(203),使該第二Y軸對準器支臂(203)讓該些電子元件(102)的Y軸偏移和角度對齊(307);(e)藉由該X軸致動器(211)驅動位於該巢形件(109)右側的該第二X軸對準器支臂(207),使該第二X軸對準器支臂(207)讓該些電子元件(102)的X軸偏移和角度對齊(309);(f)使該第一和第二Y軸對準器支臂(201、203)以及該第一和第二X軸對準器支臂(205、207)回到一預備位置(311);(g)使該對準器模組(2)回到該第一Z軸位置(313);最後,(h)若該些電子元件(102)通過一對位視覺檢測,就透過一致動器(未繪示)驅動該多個拾取頭,使該多個拾取頭一次性地拾取該些電子元件(102)並放置於一輸出載具(315),如圖3-A所示。 To further perform step (iii), that is, if the XY positions of all the electronic components (102) in the group of electronic components are within a preset offset value with respect to the side walls (111) of the nest-shaped elements, at least one The aligner module (2) aligns each electronic component (102) in the group of electronic components (105) with each other. Step (iii) further includes the following sub-steps: (a) By means of a Z-axis actuator (213) Drive the aligner module (2) from a first Z axis position to a preset second Z axis position, the preset second Z axis position is preferably lower than the electronic components ( 102) bottom surface (301), for example, the bottom surface of the S-shaped end (401) of the first and second Y-axis aligner arms and the S-shaped end (403) of the two X-axis aligner arms are lower On the bottom surface of the bottom surface of the group of electronic components (102), as shown in Figure 4-A and Figure 4-B; (b) Driven by a Y-axis actuator (209) above the nest (109) The first Y-axis aligner arm (201) of the first Y-axis aligner arm (201) allows the Y-axis offset and angular alignment of the electronic components (102) (303) (C) Drive the first X-axis aligner arm (205) on the left side of the nest (109) by an X-axis actuator (211), so that the first X-axis aligner supports The arm (205) allows the X-axis offset and angular alignment of the electronic components (102) (305); (d) the Y-axis actuator (209) drives the nest member (109) The second Y-axis aligner arm (203) enables the second Y-axis aligner arm (203) to offset and angularly align the Y-axis of the electronic components (102) (307); (e) The second X-axis aligner arm (207) located on the right side of the nest (109) is driven by the X-axis actuator (211) to make the second X-axis aligner arm (207) Make the X-axis offset and angular alignment of the electronic components (102) (309); (f) make the first and second Y-axis aligner arms (201, 203) and the first and second X The axis aligner arm (205, 207) returns to a preparation position (311); (g) returns the aligner module (2) to the first Z-axis position (313); finally, (h) If the electronic components (102) pass the one-to-one visual inspection, the multiple pickup heads are driven through an actuator (not shown), so that the multiple pickup heads pick up the electronic components (102) at a time and Place it on an output vehicle (315), as shown in Figure 3-A.
在另一種佈局中,如圖3-B所示,所述步驟(e)(即透過該X軸致動器(211)驅動位於該巢形件(109)右側的該第二X軸對準器支臂(207),以藉由該第二X軸對準器支臂(207)讓該些電子元件(102)的X軸偏移和角度對齊(309))可在步驟(d)(即透過該Y軸致動器(209)驅動位於該巢形件(109)下方的該第二Y軸對準器支臂(203),使該第二Y軸對準器支臂(203)讓該些電子元件(102)的Y軸偏移和角度對齊(307))之前、在步驟(b)(即透過一Y軸致動器(209)驅動位於該巢形件(109)上方的該第一Y軸對準器支臂(201),使該第一Y軸對準器支臂(201)讓該些電子元件(102)的Y軸偏移和角度對齊(303))之後執行。同時,步驟(d)(即透過該Y軸致動器(209)驅動位於該巢形件(109)下方的該第二Y軸對準器支臂(203),使該第二Y軸對準器支臂(203)讓該些電子元件(102)的Y軸偏移和角度對齊(307))之後接續步驟(c)(即透過一X軸致動器(211)驅動位於該巢形件(109)左側的該第一X軸對準器支臂(205),使該第一X軸對準器支臂(205)讓該些電子元件(102)的X軸偏移和角度對齊(305)),以下子步驟如圖3-A中所列舉的範例。該第一和第二Y軸對準器支臂(201、203)以及該第一和第二X軸對準器支臂(205、207)包含彈簧加載式對準器支臂、氣壓式對準器支臂、音圈馬達(voice coil actuator)等。並且,所述方法更包含轉換該第一和第二Y軸對準器支臂(201、203)的長度以及該第一和第二X軸對準器支臂(205、207)的長度,以迎合單一取放程序中多種尺寸或多種類型的電子元件(102)。 In another layout, as shown in Fig. 3-B, the step (e) (that is, the second X-axis aligned on the right side of the nest (109) is driven by the X-axis actuator (211) The second X-axis aligner arm (207) allows the X-axis offset and angular alignment (309) of the electronic components (102) to be performed in step (d)( That is, the second Y-axis aligner arm (203) located under the nest (109) is driven by the Y-axis actuator (209) to make the second Y-axis aligner arm (203) Before allowing the Y-axis offset and angular alignment (307) of the electronic components (102)), in step (b) (i.e., drive the nest member (109) through a Y-axis actuator (209) The first Y-axis aligner arm (201) is executed after the first Y-axis aligner arm (201) allows the Y-axis offset and angular alignment of the electronic components (102) (303)) . At the same time, step (d) (that is, drive the second Y-axis aligner arm (203) under the nest (109) through the Y-axis actuator (209), so that the second Y-axis is aligned The calibrator arm (203) allows the Y-axis offset and angular alignment (307) of the electronic components (102)), followed by step (c) (i.e., through an X-axis actuator (211) driving the nest-shaped The first X-axis aligner arm (205) on the left side of the component (109) enables the first X-axis aligner arm (205) to align the X-axis offset and angle of the electronic components (102) (305)), the following sub-steps are as shown in Figure 3-A. The first and second Y-axis aligner arms (201, 203) and the first and second X-axis aligner arms (205, 207) include spring-loaded aligner arms and pneumatic alignment Calibrator arm, voice coil actuator, etc. And, the method further includes converting the lengths of the first and second Y-axis aligner arms (201, 203) and the lengths of the first and second X-axis aligner arms (205, 207), To cater to electronic components (102) of multiple sizes or multiple types in a single pick-and-place procedure.
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CN108284443A (en) * | 2017-01-10 | 2018-07-17 | 欧姆龙株式会社 | Image processing system and processing unit, the pick-up method of workpiece and recording medium |
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