TWI701977B - Circuit board testing device - Google Patents
Circuit board testing device Download PDFInfo
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- TWI701977B TWI701977B TW108115442A TW108115442A TWI701977B TW I701977 B TWI701977 B TW I701977B TW 108115442 A TW108115442 A TW 108115442A TW 108115442 A TW108115442 A TW 108115442A TW I701977 B TWI701977 B TW I701977B
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Abstract
Description
本發明與電路板的測試有關,特別是指兼具快速更換以及保護待測電路板功能的一種電路板測試裝置。 The present invention is related to the testing of circuit boards, and particularly refers to a circuit board testing device that has the functions of quick replacement and protection of the circuit board to be tested.
關於電路板的測試,特別是與晶圓有關的電路板測試,必須將待測電路板疊置於測試機台的機台電路板上,並使待測電路板底面的連接器與機台電路板頂面的對接連接器彼此可插拔地對接,如此即可對待測電路板頂面上的待測電子元件進行測試。 Regarding circuit board testing, especially circuit board testing related to wafers, the circuit board to be tested must be stacked on the machine circuit board of the test machine, and the connector on the bottom of the circuit board to be tested must be connected to the machine circuit The butting connectors on the top surface of the board are pluggably connected to each other, so that the electronic components to be tested on the top surface of the circuit board to be tested can be tested.
測試結束後,還必須將待測電路板自機台電路板拆除,但因為兩電路板之間有多對連接器彼此對接,導致難以順利拆除,每每損及造價動輒淤二、三拾萬新台幣的待測電路板。 After the test is over, the circuit board to be tested must be removed from the circuit board of the machine. However, because there are multiple pairs of connectors between the two circuit boards that are connected to each other, it is difficult to remove it smoothly. Every time it is damaged and the cost is two to three ten thousand new The circuit board to be tested in Taiwan dollars.
現有為了保護造價高昂的待測電路板,都會在待測電路板的一面加裝一保護框,以在拆除時只要針對保護框施力,就能在不損及待測電路板的情況下順利拆除待測電路板。 In order to protect the expensive circuit board to be tested, a protective frame is installed on one side of the circuit board to be tested, so that as long as force is applied to the protective frame when removing, it can be smoothly without damaging the circuit board to be tested. Remove the circuit board to be tested.
然而,保護框又不易自待測電路板拆下,拆除保護框費時費工,導致每一片待測電路板都需加裝一保護框,保護框的造價也要五萬元新台幣,從而造成電路板的測試成本居高不下。 However, the protective frame is not easy to remove from the circuit board to be tested. It takes time and labor to remove the protective frame. As a result, each circuit board to be tested needs to be equipped with a protective frame. The cost of the protective frame is NT$50,000. The cost of circuit board testing remains high.
本發明的目的在於提供一種電路板測試裝置,既能快速更換不同的待測電路板,又能在更換中保護待測電路板以及避免對接連接器損壞。 The object of the present invention is to provide a circuit board testing device, which can not only quickly replace different circuit boards to be tested, but also protect the circuit boards to be tested during replacement and avoid damage to the docking connector.
為了達成上述目的,本發明係提供一種電路板測試裝置,用於具有連接器的待測電路板,該測試裝置包括:一固定座,設置有對應於所述連接器的一對接連接器且固接有複數限位柱;以及一活動座,活動設置於該固定座上且設有複數限位孔,各該限位柱活動穿插於各該限位孔,該活動座依據各該限位柱而相對於該固定座在一高處和一低處之間位移,該對接連接器自該活動座裸露;其中,該活動座位於該低處,所述待測電路板設置於該活動座上,所述連接器電性對接該對接連接器;該活動座經由外力而帶著所述待測電路板位移至該高處,所述連接器順勢自該對接連接器卸離。 In order to achieve the above object, the present invention provides a circuit board testing device for a circuit board to be tested with a connector. The testing device includes: a fixing seat provided with a mating connector corresponding to the connector and fixed A plurality of limit posts are connected; and a movable seat, which is movably arranged on the fixed seat and is provided with a plurality of limit holes, each of the limit posts movably penetrates each of the limit holes, and the movable seat is based on each of the limit posts With respect to the fixed seat being displaced between a high place and a low place, the docking connector is exposed from the movable seat; wherein the movable seat is located at the low place, and the circuit board to be tested is arranged on the movable seat The connector is electrically connected to the mating connector; the movable seat carries the circuit board to be tested to the height through external force, and the connector is detached from the mating connector.
相較於先前技術,本發明具有以下功效:既能快速更換不同的待測電路板,又能在更換中保護待測電路板以及避免對接連接器損壞,因此具有降低測試成本、節省測試成本的效果。 Compared with the prior art, the present invention has the following effects: not only can quickly replace different circuit boards to be tested, but also can protect the circuit boards to be tested during the replacement and avoid damage to the docking connector, thus reducing test costs and saving test costs. effect.
100:測試裝置 100: test device
1:固定座 1: fixed seat
11:固定元件 11: fixed components
12:固定孔 12: Fixing hole
13:第一穿孔 13: first perforation
131:強化套筒 131: Strengthening sleeve
14:第一開口 14: First opening
2:活動座 2: movable seat
21:凹部 21: recess
22:限位孔 22: Limit hole
221:階層 221: Class
23:第二穿孔 23: second piercing
24:第二開口 24: second opening
3:限位柱 3: limit column
31:固定端部 31: fixed end
32:凸部 32: convex
4:定位柱 4: positioning column
41:大徑段 41: Large diameter section
42:小徑段 42: Trail section
5:機台電路板 5: Machine circuit board
51:對接連接器 51: Docking connector
6:卸離工具 6: Unloading tool
61:第一作用臂 61: first acting arm
62:第二作用臂 62: second arm
621:抵接部 621: contact
800:機台 800: machine
900:待測電路板 900: circuit board to be tested
901:待測面 901: surface to be tested
9:連接器 9: Connector
D:頂高距離 D: Top height distance
H:高處 H: high place
L:低處 L: Low
圖1為本發明測試裝置的立體分解圖。 Figure 1 is a three-dimensional exploded view of the testing device of the present invention.
圖2為本發明依據圖1將固定座組裝於測試組件上的立體圖。 FIG. 2 is a perspective view of assembling the fixing base on the test assembly according to FIG. 1 according to the present invention.
圖3為本發明依據圖2將活動座組裝於固定座上的立體圖。 FIG. 3 is a perspective view of the movable seat assembled on the fixed seat according to FIG. 2 according to the present invention.
圖4為本發明依據圖3將待測電路板組裝於活動座上的立體圖。 FIG. 4 is a perspective view of assembling the circuit board to be tested on the movable seat according to FIG. 3 according to the present invention.
圖5為本發明測試裝置於組合後的剖視圖。 Figure 5 is a cross-sectional view of the test device of the present invention after being assembled.
圖6為本發明測試裝置中的卸離工具的立體圖。 Fig. 6 is a perspective view of the removal tool in the testing device of the present invention.
圖7為本發明測試裝置於卸離待測電路板前的剖視圖。 Figure 7 is a cross-sectional view of the testing device of the present invention before being removed from the circuit board to be tested.
圖8為本發明測試裝置於卸離待測電路板後的剖視圖。 8 is a cross-sectional view of the testing device of the present invention after the circuit board to be tested is removed.
有關本發明的詳細說明和技術內容,配合圖式說明如下,然而所附圖式僅提供參考與說明用,非用以限制本發明。 The detailed description and technical content of the present invention are described as follows in conjunction with the drawings. However, the drawings are only provided for reference and description, and are not intended to limit the present invention.
如圖1所示,本發明提供一種電路板測試裝置,主要安裝於測試機的機台800上,以供測試待測電路板900,待測電路板900的底面具有連接器9。
As shown in FIG. 1, the present invention provides a circuit board testing device, which is mainly installed on a
如圖1至圖5所示,本發明電路板測試裝置(以下簡稱測試裝置100)包括:一固定座、一活動座2以及複數限位柱3,較佳還包括複數定位柱4和一機台電路板5。其中,機台電路板5的頂面具有對應於連接器9的對接連接器51。
As shown in Figures 1 to 5, the circuit board testing device of the present invention (hereinafter referred to as the testing device 100) includes: a fixed seat, a
固定座1固定於機台電路板5上(見圖2),且固定座1固接有複數限位柱3,各限位柱3直立於固定座1的頂面,以利於導引活動座2位移。
The fixed
活動座2可活動地設置於固定座1上(見圖3),且活動座2設有對應於各限位柱3的複數限位孔22,使各限位柱3活動穿插於各限位孔22內,換言之,在這種情況下,各限位柱22僅為單純柱體,並未對活動座2產生限制,所以活動座2可以自固定座1拆下。藉由各限位柱22的導引,活動座2將能相對於固定座1在一高處H(見圖8)和一低處L(見圖7)之間直線位移,進而確保待測電路板900的快速拆組。
The
對接連接器51係能以各種可行的結構自活動座2裸露,於本實施例中則是藉由開口,例如在固定座1設有對應於對接連接器51的第一開口14,在活動座2設有對應於第一開口14的第二開口24,使對接連接器51能夠對應第一開口14和第二開口24自活動座2裸露。
The
藉此,如圖5所示,當活動座2朝靠近固定座1的方向位移至低處L時,將待測電路板900疊設於活動座2上,並使連接器9經由第二開口24而可組卸地電性對接裸露的對接連接器51,此時即可如圖4或圖5所示對待測電路板900的頂面(待測面901)進行測試;如圖8所示,當活動座2經由外力而帶著待測電路板900朝遠離固定座1的方向位移至高處H時,由於高處H與低處L之間彼此相距一頂高距離D,利用此頂高距離D,連接器9將能順勢自對接連接器51卸離。如此達成快速拆組不同的待測電路板900的效果,進而不會再如習知那樣必須在每一待測電路板900加裝一個保護框,從而具有降低測試成本、節省測試成本的效果。
Thereby, as shown in FIG. 5, when the
必須說明的是,各限位柱3可對應對接連接器51配置,以具有精準定位的效果,從而保證連接器9能準確對接對接連接器51。舉例而言,可將一部分限位柱3對應一部分對接連接器51圍繞或局部圍繞,另一部分限位柱3則對應另一部分對接連接器51圍繞或局部圍繞。
It must be noted that each
為了限制活動座2不至於從固定座1脫離,可將各限位柱3遠離固定座1的部分受到各限位孔22的限制,使活動座2無法自各限位柱3脫離,進而限制活動座2不會從固定座1脫離。於本實施例中,如圖5和圖8所示,限位柱3遠離固定座1的上端部係形成側向外擴的一凸部32,下端部則為一固定端部31;限位孔22係為的一階層穿孔,因此具有在孔內側向內凸的一階層221。組裝時,各限位柱3先穿插各限位孔22,再以固定端部31固定於固定座1。如此一來,當活動座2位於如圖5所示的低處L時,各凸部32遠離於各階層221而具有供活動座2位移的距離;當活動座2位移至如圖8所示的高處H時,活動座2的各階層221將會因為受到各凸部32的擋止,以限制活動座2不至於從固定座1脫離。至於固定座1用以供限位柱3固定的結構,如圖所示則是在固定座1設有對應於各限位孔22的複數固定孔12,使限位柱3的固定端部31可組卸地固定於固定座1的固定孔12。
In order to prevent the
為了讓受到活動座2帶動的待測電路板900也能在被帶動中受到導引,可將複數定位柱4固定並凸出於待測電路板900的底面,固定座1和活動座2則分別設有彼此對應的複數第一穿孔13和複數第二穿孔23,每一第一穿孔13和每一第二穿孔23對應於每一定位柱4。如此一來,當待測電路板900疊設於活動座2上時,每一定位柱4將活動穿插於每一第一穿孔13和每一第二穿孔23,使活動座2能同時受到各限位柱3和各定位柱4的導引而相對於固定座1位移,也使待測電路板900能受到各定位柱4的導引而跟隨位移,進而更加確保連接器9能精準對接對接連接器51,也能更加確保待測電路板900的快速拆組。
In order to allow the
詳細而言,定位柱4具有一大徑段41和一小徑段42,大徑段41位於小徑段42與待測電路板900的底面之間。如圖5所示,大徑段41的外徑適配於第一穿孔13和第二穿孔23的內徑,使大徑段41可滑移地插接於第二穿孔23內(或是可滑移地插接於第二穿孔23和局部的第一穿孔13內,圖中未示),小徑段42則伸入第一穿孔13內(或是伸入第一穿孔13和局部的第二穿孔23內,圖中未示)。
In detail, the
為了確保第二穿孔23(或第一穿孔13和第二穿孔23)不會被定位柱4磨損,可強化孔內結構,於本實施例中則是在每一第一穿孔13內套固有一強化套筒131,並使強化套筒131的一部分凸出於第一穿孔13,每一第二穿孔23內則活動套接有每一強化套筒131的所述凸出部分,待測電路板900上的各定位柱4則活動穿插於各強化套筒131內。必須說明的是,前述大徑段41的外徑係適配於強化套筒131的中空部的內徑,使大徑段41可滑移地插接於強化套筒131內,並使前述小徑段42伸入強化套筒131內。其中,強化套筒131可為例如金屬等的耐磨耗材質製成。
In order to ensure that the second perforation 23 (or the
本發明並不限定連接器9和對接連接器51的數量,當欲藉由前述開口來裸露對接連接器51時,可以一個大型開口對應一共同區域裡的許多對接連接器51,於本實施例中則採一個開口對一個對接連接器51的方式,如圖所示就是
以一個第一開口14和第二開口24共同對應於一個對接連接器51。且,各對接連接器51係在固定座1的頂面上排列成至少一陣列,如圖1所示則是排列成兩個相同或彼此對稱的陣列,以利不同待測電路板使用,例如:待測電路板A選用圖1中的左排對接連接器51,待測電路板B則選用圖1中的右排對接連接器51。
The present invention does not limit the number of
在圖式未繪示的其它實施例中,限位柱3固接在固定座1的結構,可以是將限位柱3的一端一體成型於固定座1,當需要利用限位柱3限制住活動座2不致於脫離時,則還可再將分離式的凸部32以加工組裝方式組裝於限位柱3的另一端。此外,前述固定座1也可以是機台電路板5,所以固定座1本身就已電性配置有對接連接器51,且在此種實施例中,固定座1並不需要開設前述第一開口14,電性配置於固定座1上的對接連接器51則僅經由第二開口24裸露,換言之,本發明測試裝置100在此種實施例中僅包括:定位柱4、限位柱3、活動座2以及改自機台電路板的固定座1。
In other embodiments not shown in the drawings, the structure in which the
至於固定座1的固定,可藉由如圖1所示的多數固定元件11(例如螺絲或鉚釘等)將固定座1固定於機台電路板5上,或是將固定座1經由機台電路板5固定於機台800上。
As for the fixing of the fixing
如圖6至圖8所示,此外,本發明測試裝置100還可包括至少一卸離工具6,或是還可包括圖中未示的一卸離機構,至於活動座2相鄰於固定座1的底面則可凹設有做為卸離用的複數凹部21。以卸離工具6為例,使用者操作卸離工具6對應凹部21伸入並抵接於活動座2的底面,並以固定座1為支點(見圖8)如翹翹板般動作而將活動座2頂起至高處H。於本實施例中,卸離工具6的作用臂支撐於固定座1的周邊,作用臂的兩端則分別供使用者施力以及供對應凹部21伸入,且作用臂較佳包含一第一作用臂61以及自第一作用臂61一端叉開的二第二作用臂62,各第二作用臂62的臂端則具有用以伸入凹部21並抵接於活動座2底面的抵接部621。
As shown in FIGS. 6 to 8, in addition, the
以卸離機構為例,可為任何不需使用者施力的機器,且卸離機構係可帶動具有類似於卸離工具6的結構去頂起活動座2。
Taking the unloading mechanism as an example, it can be any machine that does not require the user's force, and the unloading mechanism can drive a structure similar to the
本發明所能達成的效果:能快速更換供不同的待測電路板900,且能在更換中保護待測電路板900以及避免對接連接器51損壞,進而具有降低測試成本、節省測試成本的效果。
The effect that can be achieved by the present invention: it can quickly replace the
綜上所述,本發明電路板測試裝置,確可達到預期的使用目的,並解決現有技術的缺失,確具新穎性和進步性,符合發明專利申請要件,爰依專利法提出申請,敬請詳查並賜准本案專利,以保障發明人之權利。 In summary, the circuit board testing device of the present invention can indeed achieve the intended purpose of use and solve the deficiencies of the existing technology. It is indeed novel and progressive, and meets the requirements for invention patent applications. Please apply in accordance with the Patent Law. Investigate and grant the patent in this case to protect the rights of the inventor.
以上所述者,僅為本發明之較佳可行實施例而已,非因此即侷限本發明之專利範圍,舉凡運用本發明說明書及圖式內容所為之等效結構變化,均理同包含於本發明之權利範圍內,合予陳明。 The above are only the preferred and feasible embodiments of the present invention, and are not limited to the scope of the present invention. Any equivalent structural changes made by using the description and drawings of the present invention are all included in the present invention. Within the scope of the rights, he shall be Chen Ming.
100:測試裝置 100: test device
1:固定座 1: fixed seat
12:固定孔 12: Fixing hole
13:第一穿孔 13: first perforation
131:強化套筒 131: Strengthening sleeve
2:活動座 2: movable seat
21:凹部 21: recess
22:限位孔 22: Limit hole
221:階層 221: Class
23:第二穿孔 23: second piercing
3:限位柱 3: limit column
31:固定端部 31: fixed end
32:凸部 32: convex
4:定位柱 4: positioning column
41:大徑段 41: Large diameter section
42:小徑段 42: Trail section
5:機台電路板 5: Machine circuit board
800:機台 800: machine
900:待測電路板 900: circuit board to be tested
901:待測面 901: surface to be tested
L:低處 L: Low
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW108115442A TWI701977B (en) | 2019-05-03 | 2019-05-03 | Circuit board testing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW108115442A TWI701977B (en) | 2019-05-03 | 2019-05-03 | Circuit board testing device |
Publications (2)
Publication Number | Publication Date |
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TWI701977B true TWI701977B (en) | 2020-08-11 |
TW202042602A TW202042602A (en) | 2020-11-16 |
Family
ID=73003084
Family Applications (1)
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TW108115442A TWI701977B (en) | 2019-05-03 | 2019-05-03 | Circuit board testing device |
Country Status (1)
Country | Link |
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TW (1) | TWI701977B (en) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101356644A (en) * | 2006-02-10 | 2009-01-28 | 温德克工业股份有限公司 | Electronic assembly with detachable components |
TWI641839B (en) * | 2017-08-18 | 2018-11-21 | 中華精測科技股份有限公司 | Detection device |
TWM575866U (en) * | 2018-10-24 | 2019-03-21 | 東宸精密股份有限公司 | Solid-state disk card test fixture |
-
2019
- 2019-05-03 TW TW108115442A patent/TWI701977B/en active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101356644A (en) * | 2006-02-10 | 2009-01-28 | 温德克工业股份有限公司 | Electronic assembly with detachable components |
TWI641839B (en) * | 2017-08-18 | 2018-11-21 | 中華精測科技股份有限公司 | Detection device |
TWM575866U (en) * | 2018-10-24 | 2019-03-21 | 東宸精密股份有限公司 | Solid-state disk card test fixture |
Also Published As
Publication number | Publication date |
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TW202042602A (en) | 2020-11-16 |
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