TWI701977B - Circuit board testing device - Google Patents

Circuit board testing device Download PDF

Info

Publication number
TWI701977B
TWI701977B TW108115442A TW108115442A TWI701977B TW I701977 B TWI701977 B TW I701977B TW 108115442 A TW108115442 A TW 108115442A TW 108115442 A TW108115442 A TW 108115442A TW I701977 B TWI701977 B TW I701977B
Authority
TW
Taiwan
Prior art keywords
circuit board
seat
diameter section
movable seat
connector
Prior art date
Application number
TW108115442A
Other languages
Chinese (zh)
Other versions
TW202042602A (en
Inventor
陳文祺
Original Assignee
陳文祺
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 陳文祺 filed Critical 陳文祺
Priority to TW108115442A priority Critical patent/TWI701977B/en
Application granted granted Critical
Publication of TWI701977B publication Critical patent/TWI701977B/en
Publication of TW202042602A publication Critical patent/TW202042602A/en

Links

Images

Landscapes

  • Tests Of Electronic Circuits (AREA)

Abstract

A circuit board testing device includes a fixed seat and a movable seat movable relative to the fixed seat. a coupling connector and a limiting column are arranged on the fixed seat. The movable seat is arranged on the fixed seat and a limiting hole is defined thereon, and the limiting column is inserted in the limiting hole, so that the movable seat is guided by the limiting column. A tested circuit board is stacked on the movable seat so that a connector thereof is coupled with the coupling connector. When an external force is applied to the movable seat, the movable seat will be moved with the tested circuit board away from the fixed seat, so that the connector is meanwhile detached from the coupling connector. Thereby, various tested circuit boards could be replaced quickly and the coupling connector is prevented from damage caused by replacing. Accordingly, the test cost is reduced.

Description

電路板測試裝置 Circuit board testing device

本發明與電路板的測試有關,特別是指兼具快速更換以及保護待測電路板功能的一種電路板測試裝置。 The present invention is related to the testing of circuit boards, and particularly refers to a circuit board testing device that has the functions of quick replacement and protection of the circuit board to be tested.

關於電路板的測試,特別是與晶圓有關的電路板測試,必須將待測電路板疊置於測試機台的機台電路板上,並使待測電路板底面的連接器與機台電路板頂面的對接連接器彼此可插拔地對接,如此即可對待測電路板頂面上的待測電子元件進行測試。 Regarding circuit board testing, especially circuit board testing related to wafers, the circuit board to be tested must be stacked on the machine circuit board of the test machine, and the connector on the bottom of the circuit board to be tested must be connected to the machine circuit The butting connectors on the top surface of the board are pluggably connected to each other, so that the electronic components to be tested on the top surface of the circuit board to be tested can be tested.

測試結束後,還必須將待測電路板自機台電路板拆除,但因為兩電路板之間有多對連接器彼此對接,導致難以順利拆除,每每損及造價動輒淤二、三拾萬新台幣的待測電路板。 After the test is over, the circuit board to be tested must be removed from the circuit board of the machine. However, because there are multiple pairs of connectors between the two circuit boards that are connected to each other, it is difficult to remove it smoothly. Every time it is damaged and the cost is two to three ten thousand new The circuit board to be tested in Taiwan dollars.

現有為了保護造價高昂的待測電路板,都會在待測電路板的一面加裝一保護框,以在拆除時只要針對保護框施力,就能在不損及待測電路板的情況下順利拆除待測電路板。 In order to protect the expensive circuit board to be tested, a protective frame is installed on one side of the circuit board to be tested, so that as long as force is applied to the protective frame when removing, it can be smoothly without damaging the circuit board to be tested. Remove the circuit board to be tested.

然而,保護框又不易自待測電路板拆下,拆除保護框費時費工,導致每一片待測電路板都需加裝一保護框,保護框的造價也要五萬元新台幣,從而造成電路板的測試成本居高不下。 However, the protective frame is not easy to remove from the circuit board to be tested. It takes time and labor to remove the protective frame. As a result, each circuit board to be tested needs to be equipped with a protective frame. The cost of the protective frame is NT$50,000. The cost of circuit board testing remains high.

本發明的目的在於提供一種電路板測試裝置,既能快速更換不同的待測電路板,又能在更換中保護待測電路板以及避免對接連接器損壞。 The object of the present invention is to provide a circuit board testing device, which can not only quickly replace different circuit boards to be tested, but also protect the circuit boards to be tested during replacement and avoid damage to the docking connector.

為了達成上述目的,本發明係提供一種電路板測試裝置,用於具有連接器的待測電路板,該測試裝置包括:一固定座,設置有對應於所述連接器的一對接連接器且固接有複數限位柱;以及一活動座,活動設置於該固定座上且設有複數限位孔,各該限位柱活動穿插於各該限位孔,該活動座依據各該限位柱而相對於該固定座在一高處和一低處之間位移,該對接連接器自該活動座裸露;其中,該活動座位於該低處,所述待測電路板設置於該活動座上,所述連接器電性對接該對接連接器;該活動座經由外力而帶著所述待測電路板位移至該高處,所述連接器順勢自該對接連接器卸離。 In order to achieve the above object, the present invention provides a circuit board testing device for a circuit board to be tested with a connector. The testing device includes: a fixing seat provided with a mating connector corresponding to the connector and fixed A plurality of limit posts are connected; and a movable seat, which is movably arranged on the fixed seat and is provided with a plurality of limit holes, each of the limit posts movably penetrates each of the limit holes, and the movable seat is based on each of the limit posts With respect to the fixed seat being displaced between a high place and a low place, the docking connector is exposed from the movable seat; wherein the movable seat is located at the low place, and the circuit board to be tested is arranged on the movable seat The connector is electrically connected to the mating connector; the movable seat carries the circuit board to be tested to the height through external force, and the connector is detached from the mating connector.

相較於先前技術,本發明具有以下功效:既能快速更換不同的待測電路板,又能在更換中保護待測電路板以及避免對接連接器損壞,因此具有降低測試成本、節省測試成本的效果。 Compared with the prior art, the present invention has the following effects: not only can quickly replace different circuit boards to be tested, but also can protect the circuit boards to be tested during the replacement and avoid damage to the docking connector, thus reducing test costs and saving test costs. effect.

100:測試裝置 100: test device

1:固定座 1: fixed seat

11:固定元件 11: fixed components

12:固定孔 12: Fixing hole

13:第一穿孔 13: first perforation

131:強化套筒 131: Strengthening sleeve

14:第一開口 14: First opening

2:活動座 2: movable seat

21:凹部 21: recess

22:限位孔 22: Limit hole

221:階層 221: Class

23:第二穿孔 23: second piercing

24:第二開口 24: second opening

3:限位柱 3: limit column

31:固定端部 31: fixed end

32:凸部 32: convex

4:定位柱 4: positioning column

41:大徑段 41: Large diameter section

42:小徑段 42: Trail section

5:機台電路板 5: Machine circuit board

51:對接連接器 51: Docking connector

6:卸離工具 6: Unloading tool

61:第一作用臂 61: first acting arm

62:第二作用臂 62: second arm

621:抵接部 621: contact

800:機台 800: machine

900:待測電路板 900: circuit board to be tested

901:待測面 901: surface to be tested

9:連接器 9: Connector

D:頂高距離 D: Top height distance

H:高處 H: high place

L:低處 L: Low

圖1為本發明測試裝置的立體分解圖。 Figure 1 is a three-dimensional exploded view of the testing device of the present invention.

圖2為本發明依據圖1將固定座組裝於測試組件上的立體圖。 FIG. 2 is a perspective view of assembling the fixing base on the test assembly according to FIG. 1 according to the present invention.

圖3為本發明依據圖2將活動座組裝於固定座上的立體圖。 FIG. 3 is a perspective view of the movable seat assembled on the fixed seat according to FIG. 2 according to the present invention.

圖4為本發明依據圖3將待測電路板組裝於活動座上的立體圖。 FIG. 4 is a perspective view of assembling the circuit board to be tested on the movable seat according to FIG. 3 according to the present invention.

圖5為本發明測試裝置於組合後的剖視圖。 Figure 5 is a cross-sectional view of the test device of the present invention after being assembled.

圖6為本發明測試裝置中的卸離工具的立體圖。 Fig. 6 is a perspective view of the removal tool in the testing device of the present invention.

圖7為本發明測試裝置於卸離待測電路板前的剖視圖。 Figure 7 is a cross-sectional view of the testing device of the present invention before being removed from the circuit board to be tested.

圖8為本發明測試裝置於卸離待測電路板後的剖視圖。 8 is a cross-sectional view of the testing device of the present invention after the circuit board to be tested is removed.

有關本發明的詳細說明和技術內容,配合圖式說明如下,然而所附圖式僅提供參考與說明用,非用以限制本發明。 The detailed description and technical content of the present invention are described as follows in conjunction with the drawings. However, the drawings are only provided for reference and description, and are not intended to limit the present invention.

如圖1所示,本發明提供一種電路板測試裝置,主要安裝於測試機的機台800上,以供測試待測電路板900,待測電路板900的底面具有連接器9。 As shown in FIG. 1, the present invention provides a circuit board testing device, which is mainly installed on a machine 800 of a testing machine for testing a circuit board 900 to be tested. The circuit board 900 has a connector 9 on the bottom surface.

如圖1至圖5所示,本發明電路板測試裝置(以下簡稱測試裝置100)包括:一固定座、一活動座2以及複數限位柱3,較佳還包括複數定位柱4和一機台電路板5。其中,機台電路板5的頂面具有對應於連接器9的對接連接器51。 As shown in Figures 1 to 5, the circuit board testing device of the present invention (hereinafter referred to as the testing device 100) includes: a fixed seat, a movable seat 2 and a plurality of limit posts 3, preferably further includes a plurality of positioning posts 4 and a machine台circuit board5. Wherein, the top surface of the machine circuit board 5 has a mating connector 51 corresponding to the connector 9.

固定座1固定於機台電路板5上(見圖2),且固定座1固接有複數限位柱3,各限位柱3直立於固定座1的頂面,以利於導引活動座2位移。 The fixed base 1 is fixed on the machine circuit board 5 (see Figure 2), and the fixed base 1 is fixedly connected with a plurality of limit posts 3, and each limit post 3 is erected on the top surface of the fixed base 1 to facilitate guiding the movable base 2 displacement.

活動座2可活動地設置於固定座1上(見圖3),且活動座2設有對應於各限位柱3的複數限位孔22,使各限位柱3活動穿插於各限位孔22內,換言之,在這種情況下,各限位柱22僅為單純柱體,並未對活動座2產生限制,所以活動座2可以自固定座1拆下。藉由各限位柱22的導引,活動座2將能相對於固定座1在一高處H(見圖8)和一低處L(見圖7)之間直線位移,進而確保待測電路板900的快速拆組。 The movable seat 2 can be movably arranged on the fixed seat 1 (see Figure 3), and the movable seat 2 is provided with a plurality of limit holes 22 corresponding to the limit posts 3, so that the limit posts 3 can be inserted into the limit positions. In the hole 22, in other words, in this case, each limiting column 22 is only a simple column, and does not restrict the movable seat 2, so the movable seat 2 can be removed from the fixed seat 1. With the guidance of each limit post 22, the movable base 2 will be able to linearly shift between a high point H (see Figure 8) and a low point L (see Figure 7) relative to the fixed base 1, thereby ensuring the to-be-tested Quick disassembly of the circuit board 900.

對接連接器51係能以各種可行的結構自活動座2裸露,於本實施例中則是藉由開口,例如在固定座1設有對應於對接連接器51的第一開口14,在活動座2設有對應於第一開口14的第二開口24,使對接連接器51能夠對應第一開口14和第二開口24自活動座2裸露。 The docking connector 51 can be exposed from the movable base 2 in various feasible structures. In this embodiment, the opening is used. For example, the fixed base 1 is provided with a first opening 14 corresponding to the docking connector 51. 2 is provided with a second opening 24 corresponding to the first opening 14 so that the docking connector 51 can correspond to the first opening 14 and the second opening 24 to be exposed from the movable seat 2.

藉此,如圖5所示,當活動座2朝靠近固定座1的方向位移至低處L時,將待測電路板900疊設於活動座2上,並使連接器9經由第二開口24而可組卸地電性對接裸露的對接連接器51,此時即可如圖4或圖5所示對待測電路板900的頂面(待測面901)進行測試;如圖8所示,當活動座2經由外力而帶著待測電路板900朝遠離固定座1的方向位移至高處H時,由於高處H與低處L之間彼此相距一頂高距離D,利用此頂高距離D,連接器9將能順勢自對接連接器51卸離。如此達成快速拆組不同的待測電路板900的效果,進而不會再如習知那樣必須在每一待測電路板900加裝一個保護框,從而具有降低測試成本、節省測試成本的效果。 Thereby, as shown in FIG. 5, when the movable base 2 is displaced to the lower position L in the direction close to the fixed base 1, the circuit board 900 to be tested is stacked on the movable base 2, and the connector 9 passes through the second opening 24 and the exposed docking connector 51 can be assembled and detached electrically, and then the top surface of the circuit board 900 to be tested (surface to be tested 901) can be tested as shown in Figure 4 or Figure 5; as shown in Figure 8 , When the movable seat 2 is moved to the height H with the circuit board 900 to be tested by external force in a direction away from the fixed seat 1, since the height H and the lower part L are separated from each other by a height distance D, use this height Distance D, the connector 9 will be able to detach from the docking connector 51 along the way. In this way, the effect of quickly disassembling different circuit boards 900 to be tested is achieved, and a protective frame is no longer required to be installed on each circuit board 900 to be tested as in the prior art, thereby reducing test costs and saving test costs.

必須說明的是,各限位柱3可對應對接連接器51配置,以具有精準定位的效果,從而保證連接器9能準確對接對接連接器51。舉例而言,可將一部分限位柱3對應一部分對接連接器51圍繞或局部圍繞,另一部分限位柱3則對應另一部分對接連接器51圍繞或局部圍繞。 It must be noted that each limit post 3 can be configured corresponding to the mating connector 51 to have a precise positioning effect, thereby ensuring that the connector 9 can accurately mating to the mating connector 51. For example, a part of the limiting post 3 can be surrounded or partially surrounded by a part of the docking connector 51, and another part of the limiting post 3 can be surrounded or partially surrounded by another part of the docking connector 51.

為了限制活動座2不至於從固定座1脫離,可將各限位柱3遠離固定座1的部分受到各限位孔22的限制,使活動座2無法自各限位柱3脫離,進而限制活動座2不會從固定座1脫離。於本實施例中,如圖5和圖8所示,限位柱3遠離固定座1的上端部係形成側向外擴的一凸部32,下端部則為一固定端部31;限位孔22係為的一階層穿孔,因此具有在孔內側向內凸的一階層221。組裝時,各限位柱3先穿插各限位孔22,再以固定端部31固定於固定座1。如此一來,當活動座2位於如圖5所示的低處L時,各凸部32遠離於各階層221而具有供活動座2位移的距離;當活動座2位移至如圖8所示的高處H時,活動座2的各階層221將會因為受到各凸部32的擋止,以限制活動座2不至於從固定座1脫離。至於固定座1用以供限位柱3固定的結構,如圖所示則是在固定座1設有對應於各限位孔22的複數固定孔12,使限位柱3的固定端部31可組卸地固定於固定座1的固定孔12。 In order to prevent the movable seat 2 from detaching from the fixed seat 1, the part of the limit posts 3 away from the fixed seat 1 can be restricted by the limit holes 22, so that the movable seat 2 cannot be separated from the limit posts 3, thereby restricting movement The seat 2 will not detach from the fixed seat 1. In this embodiment, as shown in Figures 5 and 8, the upper end of the limiting post 3 away from the fixing seat 1 forms a convex portion 32 that expands laterally outward, and the lower end is a fixed end 31; The hole 22 is a level of perforation, and therefore has a level 221 convex inward from the inside of the hole. When assembling, each limiting post 3 first penetrates each limiting hole 22, and then is fixed to the fixing base 1 by a fixed end 31. In this way, when the movable seat 2 is located at the low position L as shown in FIG. 5, each convex portion 32 is far away from each level 221 and has a distance for the movable seat 2 to be displaced; when the movable seat 2 is displaced as shown in FIG. When the height H is high, each level 221 of the movable seat 2 will be blocked by the protrusions 32 to restrict the movable seat 2 from being separated from the fixed seat 1. As for the structure of the fixing seat 1 for fixing the limit post 3, as shown in the figure, the fixing seat 1 is provided with a plurality of fixing holes 12 corresponding to each limit hole 22, so that the fixed end 31 of the limit post 3 It is detachably fixed to the fixing hole 12 of the fixing base 1.

為了讓受到活動座2帶動的待測電路板900也能在被帶動中受到導引,可將複數定位柱4固定並凸出於待測電路板900的底面,固定座1和活動座2則分別設有彼此對應的複數第一穿孔13和複數第二穿孔23,每一第一穿孔13和每一第二穿孔23對應於每一定位柱4。如此一來,當待測電路板900疊設於活動座2上時,每一定位柱4將活動穿插於每一第一穿孔13和每一第二穿孔23,使活動座2能同時受到各限位柱3和各定位柱4的導引而相對於固定座1位移,也使待測電路板900能受到各定位柱4的導引而跟隨位移,進而更加確保連接器9能精準對接對接連接器51,也能更加確保待測電路板900的快速拆組。 In order to allow the circuit board 900 to be tested driven by the movable base 2 to be guided while being driven, a plurality of positioning posts 4 can be fixed and protrude from the bottom surface of the circuit board 900 to be tested. The fixed base 1 and the movable base 2 are A plurality of first perforations 13 and a plurality of second perforations 23 corresponding to each other are respectively provided, and each first perforation 13 and each second perforation 23 corresponds to each positioning pillar 4. In this way, when the circuit board 900 to be tested is stacked on the movable base 2, each positioning column 4 will movably penetrate through each first through hole 13 and each second through hole 23, so that the movable base 2 can be simultaneously The guide of the limit posts 3 and the positioning posts 4 is displaced relative to the fixing base 1, so that the circuit board 900 to be tested can be guided by the positioning posts 4 and follow the displacement, thereby ensuring that the connector 9 can be accurately mated and docked. The connector 51 can also ensure the quick disassembly of the circuit board 900 to be tested.

詳細而言,定位柱4具有一大徑段41和一小徑段42,大徑段41位於小徑段42與待測電路板900的底面之間。如圖5所示,大徑段41的外徑適配於第一穿孔13和第二穿孔23的內徑,使大徑段41可滑移地插接於第二穿孔23內(或是可滑移地插接於第二穿孔23和局部的第一穿孔13內,圖中未示),小徑段42則伸入第一穿孔13內(或是伸入第一穿孔13和局部的第二穿孔23內,圖中未示)。 In detail, the positioning pillar 4 has a large diameter section 41 and a small diameter section 42, and the large diameter section 41 is located between the small diameter section 42 and the bottom surface of the circuit board 900 to be tested. As shown in Figure 5, the outer diameter of the large diameter section 41 is adapted to the inner diameters of the first through hole 13 and the second through hole 23, so that the large diameter section 41 can be slidably inserted into the second through hole 23 (or can be Slidingly inserted into the second perforation 23 and the partial first perforation 13, not shown in the figure, the small diameter section 42 extends into the first perforation 13 (or extends into the first perforation 13 and the partial first perforation 13). Inside the two perforations 23, not shown in the figure).

為了確保第二穿孔23(或第一穿孔13和第二穿孔23)不會被定位柱4磨損,可強化孔內結構,於本實施例中則是在每一第一穿孔13內套固有一強化套筒131,並使強化套筒131的一部分凸出於第一穿孔13,每一第二穿孔23內則活動套接有每一強化套筒131的所述凸出部分,待測電路板900上的各定位柱4則活動穿插於各強化套筒131內。必須說明的是,前述大徑段41的外徑係適配於強化套筒131的中空部的內徑,使大徑段41可滑移地插接於強化套筒131內,並使前述小徑段42伸入強化套筒131內。其中,強化套筒131可為例如金屬等的耐磨耗材質製成。 In order to ensure that the second perforation 23 (or the first perforation 13 and the second perforation 23) will not be worn out by the positioning column 4, the inner structure of the hole can be strengthened. In this embodiment, each first perforation 13 is inherently sheathed. Strengthen the sleeve 131, and make a part of the strengthened sleeve 131 protrude from the first through hole 13, and the protruding part of each strengthened sleeve 131 is movably sleeved in each second through hole 23, and the circuit board to be tested The positioning posts 4 on the 900 are movably inserted into the strengthening sleeves 131. It must be noted that the outer diameter of the aforementioned large-diameter section 41 is adapted to the inner diameter of the hollow portion of the strengthening sleeve 131, so that the large-diameter section 41 can be slidably inserted into the strengthening sleeve 131, and the aforementioned small diameter The diameter section 42 extends into the strengthening sleeve 131. The strengthening sleeve 131 can be made of wear-resistant materials such as metal.

本發明並不限定連接器9和對接連接器51的數量,當欲藉由前述開口來裸露對接連接器51時,可以一個大型開口對應一共同區域裡的許多對接連接器51,於本實施例中則採一個開口對一個對接連接器51的方式,如圖所示就是 以一個第一開口14和第二開口24共同對應於一個對接連接器51。且,各對接連接器51係在固定座1的頂面上排列成至少一陣列,如圖1所示則是排列成兩個相同或彼此對稱的陣列,以利不同待測電路板使用,例如:待測電路板A選用圖1中的左排對接連接器51,待測電路板B則選用圖1中的右排對接連接器51。 The present invention does not limit the number of connectors 9 and mating connectors 51. When it is desired to expose the mating connectors 51 through the aforementioned openings, a large opening can correspond to many mating connectors 51 in a common area. In this embodiment In the middle, an opening is used to connect the connector 51, as shown in the figure. A first opening 14 and a second opening 24 jointly correspond to a mating connector 51. Moreover, the mating connectors 51 are arranged in at least one array on the top surface of the fixing base 1. As shown in FIG. 1, they are arranged in two identical or symmetrical arrays to facilitate the use of different circuit boards under test, for example : The circuit board A to be tested uses the left-row docking connector 51 in Figure 1 and the circuit board B to be tested uses the right-row docking connector 51 in Figure 1.

在圖式未繪示的其它實施例中,限位柱3固接在固定座1的結構,可以是將限位柱3的一端一體成型於固定座1,當需要利用限位柱3限制住活動座2不致於脫離時,則還可再將分離式的凸部32以加工組裝方式組裝於限位柱3的另一端。此外,前述固定座1也可以是機台電路板5,所以固定座1本身就已電性配置有對接連接器51,且在此種實施例中,固定座1並不需要開設前述第一開口14,電性配置於固定座1上的對接連接器51則僅經由第二開口24裸露,換言之,本發明測試裝置100在此種實施例中僅包括:定位柱4、限位柱3、活動座2以及改自機台電路板的固定座1。 In other embodiments not shown in the drawings, the structure in which the limit post 3 is fixed to the fixing base 1 may be that one end of the limit post 3 is integrally formed on the fixing base 1. When the limit post 3 is required to limit When the movable seat 2 is not detached, the separate convex portion 32 can be assembled on the other end of the limiting column 3 by processing and assembling. In addition, the aforementioned fixing base 1 may also be a machine circuit board 5, so the fixing base 1 itself is already electrically configured with a mating connector 51, and in this embodiment, the fixing base 1 does not need to have the aforementioned first opening 14. The docking connector 51 electrically arranged on the fixing base 1 is only exposed through the second opening 24. In other words, the test device 100 of the present invention only includes: the positioning column 4, the limiting column 3, and the movable Base 2 and fixed base 1 modified from the circuit board of the machine.

至於固定座1的固定,可藉由如圖1所示的多數固定元件11(例如螺絲或鉚釘等)將固定座1固定於機台電路板5上,或是將固定座1經由機台電路板5固定於機台800上。 As for the fixing of the fixing base 1, the fixing base 1 can be fixed to the machine circuit board 5 by a plurality of fixing elements 11 (such as screws or rivets, etc.) as shown in FIG. 1, or the fixing base 1 can be passed through the machine circuit The board 5 is fixed on the machine table 800.

如圖6至圖8所示,此外,本發明測試裝置100還可包括至少一卸離工具6,或是還可包括圖中未示的一卸離機構,至於活動座2相鄰於固定座1的底面則可凹設有做為卸離用的複數凹部21。以卸離工具6為例,使用者操作卸離工具6對應凹部21伸入並抵接於活動座2的底面,並以固定座1為支點(見圖8)如翹翹板般動作而將活動座2頂起至高處H。於本實施例中,卸離工具6的作用臂支撐於固定座1的周邊,作用臂的兩端則分別供使用者施力以及供對應凹部21伸入,且作用臂較佳包含一第一作用臂61以及自第一作用臂61一端叉開的二第二作用臂62,各第二作用臂62的臂端則具有用以伸入凹部21並抵接於活動座2底面的抵接部621。 As shown in FIGS. 6 to 8, in addition, the testing device 100 of the present invention may further include at least one unloading tool 6, or may also include a unloading mechanism not shown in the figure. As for the movable seat 2 adjacent to the fixed seat The bottom surface of 1 can be recessed with a plurality of recesses 21 for detachment. Taking the release tool 6 as an example, the user operates the release tool 6 to extend into and abut against the bottom surface of the movable seat 2 corresponding to the recess 21, and use the fixed seat 1 as a fulcrum (see FIG. 8) to act like a seesaw. The movable seat 2 is raised to the height H. In this embodiment, the effective arm of the removal tool 6 is supported on the periphery of the fixed base 1, and the two ends of the effective arm are respectively provided for the user to apply force and the corresponding recess 21 to extend into, and the effective arm preferably includes a first The acting arm 61 and the two second acting arms 62 diverged from one end of the first acting arm 61, the arm end of each second acting arm 62 has an abutting portion for extending into the recess 21 and abutting against the bottom surface of the movable seat 2 621.

以卸離機構為例,可為任何不需使用者施力的機器,且卸離機構係可帶動具有類似於卸離工具6的結構去頂起活動座2。 Taking the unloading mechanism as an example, it can be any machine that does not require the user's force, and the unloading mechanism can drive a structure similar to the unloading tool 6 to lift the movable seat 2.

本發明所能達成的效果:能快速更換供不同的待測電路板900,且能在更換中保護待測電路板900以及避免對接連接器51損壞,進而具有降低測試成本、節省測試成本的效果。 The effect that can be achieved by the present invention: it can quickly replace the circuit board 900 to be tested for different, and can protect the circuit board 900 to be tested and avoid damage to the docking connector 51 during the replacement, thereby having the effect of reducing test costs and saving test costs .

綜上所述,本發明電路板測試裝置,確可達到預期的使用目的,並解決現有技術的缺失,確具新穎性和進步性,符合發明專利申請要件,爰依專利法提出申請,敬請詳查並賜准本案專利,以保障發明人之權利。 In summary, the circuit board testing device of the present invention can indeed achieve the intended purpose of use and solve the deficiencies of the existing technology. It is indeed novel and progressive, and meets the requirements for invention patent applications. Please apply in accordance with the Patent Law. Investigate and grant the patent in this case to protect the rights of the inventor.

以上所述者,僅為本發明之較佳可行實施例而已,非因此即侷限本發明之專利範圍,舉凡運用本發明說明書及圖式內容所為之等效結構變化,均理同包含於本發明之權利範圍內,合予陳明。 The above are only the preferred and feasible embodiments of the present invention, and are not limited to the scope of the present invention. Any equivalent structural changes made by using the description and drawings of the present invention are all included in the present invention. Within the scope of the rights, he shall be Chen Ming.

100:測試裝置 100: test device

1:固定座 1: fixed seat

12:固定孔 12: Fixing hole

13:第一穿孔 13: first perforation

131:強化套筒 131: Strengthening sleeve

2:活動座 2: movable seat

21:凹部 21: recess

22:限位孔 22: Limit hole

221:階層 221: Class

23:第二穿孔 23: second piercing

3:限位柱 3: limit column

31:固定端部 31: fixed end

32:凸部 32: convex

4:定位柱 4: positioning column

41:大徑段 41: Large diameter section

42:小徑段 42: Trail section

5:機台電路板 5: Machine circuit board

800:機台 800: machine

900:待測電路板 900: circuit board to be tested

901:待測面 901: surface to be tested

L:低處 L: Low

Claims (10)

一種電路板測試裝置,用於具有連接器的待測電路板,該測試裝置包括:一固定座,設置有對應於所述連接器的一對接連接器且固接有複數限位柱;以及一活動座,活動設置於該固定座上且設有複數限位孔,各該限位柱活動穿插於各該限位孔,該活動座依據各該限位柱而相對於該固定座在一高處和一低處之間位移,該對接連接器自該活動座裸露,各該限位柱遠離該固定座的部分係受限於各該限位孔而維持該活動座無法自各該限位柱脫離;其中,該活動座位於該低處,所述待測電路板設置於該活動座上,所述連接器電性對接該對接連接器;該活動座經由外力而帶著所述待測電路板位移至該高處,所述連接器順勢自該對接連接器卸離。 A circuit board test device for a circuit board to be tested with a connector, the test device comprising: a fixing seat provided with a mating connector corresponding to the connector and fixedly connected with a plurality of limit posts; and a The movable seat is movably arranged on the fixed seat and is provided with a plurality of limit holes, each of the limit posts movably penetrates through each of the limit holes, and the movable seat is at a height relative to the fixed seat according to each limit post. The butt connector is exposed from the movable seat, and the part of each of the limit posts away from the fixed seat is limited by the limit holes and the movable seat cannot be maintained from the limit posts. Detached; wherein the movable seat is located at the low position, the circuit board to be tested is arranged on the movable seat, and the connector is electrically connected to the docking connector; the movable seat carries the circuit to be tested through external force The board is displaced to the height, and the connector is detached from the mating connector. 如請求項1所述之電路板測試裝置,其中該固定座係為一機台電路板。 The circuit board testing device according to claim 1, wherein the fixing base is a machine circuit board. 如請求項1所述之電路板測試裝置,還包括一機台電路板,該機台電路板具有該對接連接器,該固定座固定於該機台電路板上且設有一第一開口,該活動座設有對應於該第一開口的一第二開口,該對接連接器對應該第一開口和該第二開口自該活動座裸露。 The circuit board testing device according to claim 1, further comprising a machine circuit board, the machine circuit board has the docking connector, the fixing base is fixed on the machine circuit board and is provided with a first opening, the The movable seat is provided with a second opening corresponding to the first opening, and the mating connector corresponds to the first opening and the second opening is exposed from the movable seat. 如請求項1所述之電路板測試裝置,其中該各該限位孔係為具有一階層的一階層穿孔,各該限位柱遠離該固定座的部分則形成一凸部,該階層受到該凸部的擋止。 The circuit board testing device according to claim 1, wherein each of the limiting holes is a layered perforation having a layer, and a portion of each of the limiting posts away from the fixing seat forms a convex portion, and the layer is affected by the Protruding stop. 如請求項1所述之電路板測試裝置,還包括複數定位柱,該固定座和該活動座分別設有彼此對應的複數第一穿孔和複數第二穿孔,各該定位柱固 定於所述待測電路板,每一該定位柱活動穿插於每一該第一穿孔和每一該第二穿孔,該活動座依據各該限位柱和各該定位柱而相對於該固定座位移。 The circuit board testing device according to claim 1, further comprising a plurality of positioning posts, the fixed base and the movable base are respectively provided with a plurality of first perforations and a plurality of second perforations corresponding to each other, each of the positioning posts is fixed Fixed on the circuit board to be tested, each positioning post is movably inserted through each of the first through holes and each of the second through holes, and the movable seat is fixed relative to each of the limit posts and each of the positioning posts. Seat displacement. 如請求項5所述之電路板測試裝置,其中每一該定位柱具有一大徑段和一小徑段,該大徑段位於該小徑段與所述待測電路板之間,該大徑段的外徑適配於該第一穿孔和該第二穿孔的內徑,該大徑段可滑移地插接於該第二穿孔內或可滑移地插接於該第二穿孔和局部的該第一穿孔內,該小徑段伸入該第一穿孔內或伸入該第一穿孔和局部的該第二穿孔內。 The circuit board test device according to claim 5, wherein each of the positioning posts has a large diameter section and a small diameter section, the large diameter section is located between the small diameter section and the circuit board to be tested, and the large diameter section The outer diameter of the diameter section is adapted to the inner diameter of the first perforation and the second perforation, and the large diameter section is slidably inserted into the second perforation or slidably inserted into the second perforation and In the partial first perforation, the small diameter section extends into the first perforation or into the first perforation and the partial second perforation. 如請求項5所述之電路板測試裝置,其中每一該第一穿孔內還套固有一強化套筒,每一該第二穿孔內則活動套接有每一該強化套筒凸出於每一該第一穿孔的部分,每一該定位柱活動穿插於每一該強化套筒內。 The circuit board testing device according to claim 5, wherein each of the first through holes is also sheathed with a strengthening sleeve, and each of the second through holes is movably sleeved with each of the strengthening sleeves protruding from each A part of the first perforation, each of the positioning pillars movably penetrates into each of the strengthening sleeves. 如請求項7所述之電路板測試裝置,其中每一該定位柱具有一大徑段和一小徑段,該大徑段位於該小徑段與所述待測電路板之間,該大徑段的外徑適配於該強化套筒的中空部的內徑,該大徑段可滑移地插接於該強化套筒內,該小徑段伸入該強化套筒內。 The circuit board test device according to claim 7, wherein each of the positioning posts has a large diameter section and a small diameter section, the large diameter section is located between the small diameter section and the circuit board to be tested, and the large diameter section The outer diameter of the diameter section is adapted to the inner diameter of the hollow part of the strengthening sleeve, the large diameter section is slidably inserted into the strengthening sleeve, and the small diameter section extends into the strengthening sleeve. 如請求項1所述之電路板測試裝置,還包括至少一卸離工具,該活動座相鄰於該固定座的一面凹設有複數凹部,該卸離工具對應該凹部抵接且以該固定座為支點而頂起該活動座至該高處。 The circuit board testing device according to claim 1, further comprising at least one removal tool, a surface of the movable seat adjacent to the fixed seat is recessed with a plurality of recesses, and the removal tool corresponds to the recess and contacts with the fixed seat. The seat is a fulcrum and the movable seat is lifted to the height. 如請求項1所述之電路板測試裝置,其中該對接連接器設置為多數,該多數對接連接器在該固定座上排列成至少一陣列,各該對接連接器電性對接於各所述連接器。 The circuit board testing device according to claim 1, wherein the mating connectors are arranged in a plurality, the plurality of mating connectors are arranged in at least one array on the fixing base, and each mating connector is electrically connected to each of the connections Device.
TW108115442A 2019-05-03 2019-05-03 Circuit board testing device TWI701977B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW108115442A TWI701977B (en) 2019-05-03 2019-05-03 Circuit board testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW108115442A TWI701977B (en) 2019-05-03 2019-05-03 Circuit board testing device

Publications (2)

Publication Number Publication Date
TWI701977B true TWI701977B (en) 2020-08-11
TW202042602A TW202042602A (en) 2020-11-16

Family

ID=73003084

Family Applications (1)

Application Number Title Priority Date Filing Date
TW108115442A TWI701977B (en) 2019-05-03 2019-05-03 Circuit board testing device

Country Status (1)

Country Link
TW (1) TWI701977B (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101356644A (en) * 2006-02-10 2009-01-28 温德克工业股份有限公司 Electronic assembly with detachable components
TWI641839B (en) * 2017-08-18 2018-11-21 中華精測科技股份有限公司 Detection device
TWM575866U (en) * 2018-10-24 2019-03-21 東宸精密股份有限公司 Solid-state disk card test fixture

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101356644A (en) * 2006-02-10 2009-01-28 温德克工业股份有限公司 Electronic assembly with detachable components
TWI641839B (en) * 2017-08-18 2018-11-21 中華精測科技股份有限公司 Detection device
TWM575866U (en) * 2018-10-24 2019-03-21 東宸精密股份有限公司 Solid-state disk card test fixture

Also Published As

Publication number Publication date
TW202042602A (en) 2020-11-16

Similar Documents

Publication Publication Date Title
US10041974B2 (en) Probe head of vertical probe card
JP6149060B2 (en) Vertical probe module and its columnar support
US10466295B2 (en) Electrical test fixture
JP2005265658A (en) Probe device adaptable to a plurality of types of testers
TW201544821A (en) Test apparatus
US20160345453A1 (en) Fixing apparatus and electronic device having same
TWI701977B (en) Circuit board testing device
JPWO2017168468A1 (en) Electrode tip removal device
TW201346272A (en) Assembly-type probe card
CN102928685B (en) Base board checking device and substrate inspecting method
KR20160128668A (en) Probe for testing LED and Contact device having it
US9933641B2 (en) Connector disengagement apparatus and inspection system for liquid crystal display module
KR101624981B1 (en) Socket For Testing Electronics
US20050151550A1 (en) Circuit board testing jig
US10079124B2 (en) Keycap and keyboard apparatus
KR102198301B1 (en) Socket board assembly
TWI720769B (en) Test equipment and movably connected mechanism thereof
WO2003075418A1 (en) Connector connecting/disconnecting tool
TWI712809B (en) Testing apparatus
KR200426244Y1 (en) Jig for connector cable insertion
KR102498019B1 (en) Socket assembly
US7597369B2 (en) Clamp tool for circuit board
JP2007263630A (en) Inspection tool and inspection unit for printed circuit board
KR102654985B1 (en) Chip-fixing device for a socket
JP6395209B2 (en) Cable misconnection prevention jig and cable misconnection prevention method