TWI696945B - Module, electrical device and process to operate a module - Google Patents

Module, electrical device and process to operate a module Download PDF

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Publication number
TWI696945B
TWI696945B TW104113337A TW104113337A TWI696945B TW I696945 B TWI696945 B TW I696945B TW 104113337 A TW104113337 A TW 104113337A TW 104113337 A TW104113337 A TW 104113337A TW I696945 B TWI696945 B TW I696945B
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module
scanning mirror
primary beam
scanning
item
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TW104113337A
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Chinese (zh)
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TW201604745A (en
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賽巴斯堤安 萊斯
法蘭克 費雪
克里斯多福 戴爾夫斯
蓋爾 皮拉德
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德商羅伯特博斯奇股份有限公司
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/042Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by opto-electronic means
    • G06F3/0421Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by opto-electronic means by interrupting or reflecting a light beam, e.g. optical touch-screen
    • G06F3/0423Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by opto-electronic means by interrupting or reflecting a light beam, e.g. optical touch-screen using sweeping light beams, e.g. using rotating or vibrating mirror
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10Scanning systems
    • G02B26/101Scanning systems with both horizontal and vertical deflecting means, e.g. raster or XY scanners
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10Scanning systems
    • G02B26/105Scanning systems with one or more pivoting mirrors or galvano-mirrors
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/017Gesture based interaction, e.g. based on a set of recognized hand gestures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/10Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
    • H01S5/18Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
    • H01S5/183Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]

Abstract

本發明提出一種用於提供人機介面的模組,其中該模組適於對處於定位區中的物件進行定位,其中該模組適於產生初級射束,其中該模組具有一掃描鏡構造,其中該掃描鏡構造係可以某種方式得到控制,使得該初級射束大體沿位於該定位區內之照射面實施一掃描運動,其中該模組係採用某種配置方案,使得當透過該初級射束與該處於照射面中之物件的相互作用產生一次級訊號時,對該次級訊號進行偵測,其中該模組適於根據該次級訊號產生一定位資訊,其中該模組具有一用於產生該初級射束的光源以及一用於對該次級訊號進行偵測的光學偵測機構,其中該光源、該掃描鏡構造及該光學偵測機構係整合在該模組中。 The present invention provides a module for providing a human-machine interface, wherein the module is suitable for positioning objects in a positioning area, wherein the module is suitable for generating a primary beam, and the module has a scanning mirror structure , Where the scanning mirror structure can be controlled in a manner such that the primary beam performs a scanning movement generally along the irradiation surface located in the positioning area, wherein the module adopts a certain configuration scheme so that when passing through the primary When the beam interacts with the object in the irradiation surface to generate a primary signal, the secondary signal is detected. The module is adapted to generate positioning information based on the secondary signal. The module has a A light source for generating the primary beam and an optical detection mechanism for detecting the secondary signal, wherein the light source, the scanning mirror structure and the optical detection mechanism are integrated in the module.

Description

模組資訊電器和操作模組的方法 Module information appliance and method for operating module

本發明之出發點為一種如申請專利範圍第1項之前言所述的模組。 The starting point of the present invention is a module as described in the preamble to item 1 of the patent application scope.

用於提供人機介面的裝置已為吾人所知。 Devices for providing human-machine interfaces are known to me.

本發明之目的在於提出一種用於提供人機介面的模組,該模組具有相對緊密之結構形式並因而具有多種用途。 The object of the present invention is to propose a module for providing a human-machine interface, which has a relatively compact structure and thus has multiple uses.

與先前技術相比,如並列項所述的本發明之模組及本發明之方法的優點在於,提供一相對緊密且構造簡單,但又能相對精確且可靠地對用戶指令進行確定的模組。此外能夠極塊地對物件,特別是對手指進行定位,從而實現一可非常靈活地應用且特別是藉由採集用戶手勢來識別用戶指令的模組。以某種方式將光源、掃描鏡構造及光學偵測機構整合在單獨一個本發明之模組中,以便將該模組靈活地裝入多種不同的設備類型。由於採用模組化結構,可遵循模組化理念根據不同的要求更為靈活地對各組件或對整個模組進行調整。由於採用特別是包括微電機械系統(MEMS)的掃描鏡構造,與先前技術相比,本發明之模組的優勢在於:其為微型化 程度相對較高的、用於提供人機介面的模組。人機介面在此亦稱作Human-Machine-Interface(HMI),且該模組亦稱作HMI模組。 Compared with the prior art, the advantage of the module of the present invention and the method of the present invention as described in the parallel item is that it provides a relatively compact and simple structure, but can relatively accurately and reliably determine user instructions . In addition, the object can be positioned extremely, especially the finger, so as to realize a module that can be applied very flexibly and recognize user instructions by collecting user gestures. In a certain way, the light source, scanning mirror structure and optical detection mechanism are integrated into a single module of the present invention, so that the module can be flexibly incorporated into many different types of equipment. Due to the modular structure, the modular concept can be followed to adjust each component or the entire module more flexibly according to different requirements. Due to the use of a scanning mirror structure including a micro-electromechanical system (MEMS) in particular, compared with the prior art, the advantage of the module of the present invention is that it is miniaturized A relatively high-level module for providing human-machine interfaces. The human-machine interface is also referred to herein as Human-Machine-Interface (HMI), and the module is also referred to as an HMI module.

特定言之,人機介面係指一用戶介面,人可透過該用戶介面以某種方式與資訊電器及/或模組進行交互作用或輸入指令,從而對此資訊電器及/或模組進行控制及/或操作。該模組特別是用作針對資訊電器的指令發送器。該物件較佳為手指、筆或另一由用戶在定位區中予以放置及/或移動的物體。特定言之,定位在此係指對該物件相對該模組的位置座標進行確定,其中特別是根據該位置座標對該物件與該模組的距離及/或該物件相對該模組的速度進行偵測。特定言之,該初級射束與該物件的相互作用係指:該初級射束在該物件上被反射,使得該次級訊號為經反射之初級射束的能夠透過光學偵測機構偵測的部分。該光源較佳適於產生該射入定位區的初級射束,其中該初級射束例如包括可見光及/或紅外光。特定言之,該初級射束之(大致體沿照射面的)掃描運動係指該初級射束在該定位區之兩個定位極限間的柵格狀或行狀週期運動,其中特定言之,該初級射束為連續式或脈衝式光束。該光學偵測機構較佳適於對該次級訊號進行偵測,其中當該物件處於該照射面中時,特別是藉由該初級射束與該物件之相互作用來產生該次級訊號,從而可對該次級訊號進行偵測。 In particular, the human-machine interface refers to a user interface through which a person can interact with or input commands to the information appliances and/or modules in some way, thereby controlling the information appliances and/or modules And/or operation. The module is especially used as a command transmitter for information appliances. The object is preferably a finger, a pen, or another object placed and/or moved by the user in the positioning area. In particular, positioning here refers to determining the position coordinates of the object relative to the module, wherein the distance between the object and the module and/or the speed of the object relative to the module is specifically determined according to the position coordinates Detect. In particular, the interaction of the primary beam and the object means that the primary beam is reflected on the object so that the secondary signal is the reflected primary beam that can be detected by the optical detection mechanism section. The light source is preferably suitable for generating the primary beam entering the positioning area, wherein the primary beam includes, for example, visible light and/or infrared light. In particular, the scanning motion of the primary beam (approximately along the irradiation surface) refers to the grid-like or row-like periodic motion of the primary beam between the two positioning limits of the positioning area, where in particular, the The primary beam is a continuous or pulsed beam. The optical detection mechanism is preferably adapted to detect the secondary signal, wherein when the object is in the illuminated surface, the secondary signal is generated in particular by the interaction of the primary beam and the object, Therefore, the secondary signal can be detected.

本發明之有利設計方案及改進方案參閱附屬項及結合附圖所作的描述。 For advantageous design schemes and improvement schemes of the present invention, please refer to the accompanying items and the description made in conjunction with the drawings.

根據一種較佳改進方案,該掃描鏡構造係可被調節至一位於兩個最大偏轉位置間的位置,其中該掃描鏡構造係採用某種配置方案,使得該初級射束在該掃描運動期間在位於該定位區之兩個定位極限間的定位 平面內進行運動。 According to a preferred improvement, the scanning mirror structure can be adjusted to a position between two maximum deflection positions, wherein the scanning mirror structure adopts a certain configuration scheme so that the primary beam is Positioning between two positioning limits of the positioning area Exercise in the plane.

如此便能以較高之精度對該物件進行定位。特定言之,大體沿該照射面進行的掃描運動在此係指大致為單行式的掃描運動。 In this way, the object can be positioned with higher accuracy. In particular, the scanning movement substantially along the irradiation surface refers to a scanning movement which is substantially a single line.

根據另一較佳改進方案,該掃描鏡構造為微電機械系統(MEMS),其中該掃描鏡構造具有一微電機械掃描鏡元件,其中該掃描鏡元件具有一特別是可圍繞第一軸線及/或圍繞大體垂直於該第一軸線的第二軸線進行偏移的鏡構件,其中特定言之,該鏡構件可圍繞該第一及第二軸線進行偏移或僅可圍繞該第一軸線進行偏移。 According to another preferred improvement, the scanning mirror is configured as a microelectromechanical system (MEMS), wherein the scanning mirror configuration has a microelectromechanical scanning mirror element, wherein the scanning mirror element has a /Or a mirror member that is offset about a second axis that is substantially perpendicular to the first axis, where in particular, the mirror member can be offset about the first and second axes or can only be done about the first axis Offset.

如此便能提供一相對緊密,但又能相對精確及快速地對物件進行定位的模組。 In this way, a relatively tight module can be provided, which can locate the object relatively accurately and quickly.

根據另一較佳改進方案,該模組具有一廣角光學系統,其中該廣角光學系統或該擴展光學系統具有一凸面狀鏡面光學系統、一凹面狀鏡面光學系統、一DOE(Diffractive Optical Element,繞射光學元件)以及/或者一透鏡或透鏡系統。 According to another preferred improvement, the module has a wide-angle optical system, wherein the wide-angle optical system or the extended optical system has a convex mirror optical system, a concave mirror optical system, and a DOE (Diffractive Optical Element, around Optical element) and/or a lens or lens system.

如此便能藉由該廣角光學系統,透過該可動掃描鏡元件之偏轉位置的相對較小的偏轉或改變來產生相對較大之張角。藉此便能藉由單獨一個可動鏡構造精確並快速地對該物件進行定位。特定言之,該廣角光學系統係固定地整合在該模組中。 In this way, a relatively large opening angle can be generated by the wide-angle optical system through relatively small deflection or change of the deflection position of the movable scanning mirror element. In this way, the object can be accurately and quickly positioned by the construction of a single movable mirror. In particular, the wide-angle optical system is fixedly integrated in the module.

根據另一較佳改進方案,該模組具有另一整合在模組中的光源,其中該另一光源適於產生另一初級射束,其中該掃描鏡構造係採用某種配置方案,從而大體沿該定位區內的另一照射面實施另一掃描運動,其中該模組係採用某種配置方案,使得當透過該另一初級射束與該處於另一 照射面中之物件的相互作用產生另一次級訊號時,對該另一次級訊號進行偵測,其中該模組適於根據該另一次級訊號產生另一定位資訊。 According to another preferred improvement, the module has another light source integrated in the module, wherein the other light source is suitable for generating another primary beam, and the scanning mirror structure adopts a certain configuration scheme, so as to be roughly Perform another scanning movement along another irradiation surface in the positioning area, where the module adopts a certain configuration scheme so that when passing through the other primary beam and the When the interaction of the objects in the irradiation surface generates another secondary signal, the other secondary signal is detected, wherein the module is adapted to generate another positioning information according to the other secondary signal.

如此便能既在該照射面中,亦在該另一照射面中將該物件之定位精度進一步提高。 In this way, the positioning accuracy of the object can be further improved both in the irradiation surface and in the other irradiation surface.

根據另一較佳改進方案,- 該掃描鏡元件適於產生該掃描運動以及適於產生該另一掃描運動,或者- 該掃描鏡構造具有另一掃描鏡元件,其中,該掃描鏡元件適於產生該掃描運動,以及,該另一掃描鏡元件適於產生該另一掃描運動。 According to another preferred improvement,-the scanning mirror element is adapted to generate the scanning movement and to generate the other scanning movement, or-the scanning mirror configuration has another scanning mirror element, wherein the scanning mirror element is adapted The scanning motion is generated, and the other scanning mirror element is adapted to generate the other scanning motion.

如此便能以不同的方式實現兩個照射面,並從而根據不同的要求對該模組進行調整,藉此提高定位精度。 In this way, the two irradiation surfaces can be realized in different ways, and thus the module can be adjusted according to different requirements, thereby improving the positioning accuracy.

根據另一較佳改進方案,該照射面與該另一照射面係以相互平行之方式佈置,其中該照射面與該另一照射面沿一大體垂直於該照射面的投影方向重疊,其中特定言之,該照射面與該另一照射面完全重疊。此外根據另一較佳改進方案,該照射面與該另一照射面沿該投影方向間隔一照射距離,其中該照射距離較佳為0至50毫米,尤佳為1至5毫米,最佳為3毫米。 According to another preferred improvement, the irradiation surface and the other irradiation surface are arranged parallel to each other, wherein the irradiation surface and the other irradiation surface overlap along a projection direction substantially perpendicular to the irradiation surface, wherein In other words, the irradiation surface completely overlaps the other irradiation surface. In addition, according to another preferred improvement, the irradiation surface and the other irradiation surface are separated by an irradiation distance along the projection direction, wherein the irradiation distance is preferably 0 to 50 mm, particularly preferably 1 to 5 mm, and most preferably 3 mm.

如此便能進一步提高定位精度。此外特定言之,當使得該物件按時序接連穿過該照射面及該另一照射面時,可沿垂直於該照射面之投影方向對該物件之物件運動進行偵測。特定言之,如此便能對該物件之點擊或觸碰運動進行偵測。 In this way, the positioning accuracy can be further improved. In addition, in particular, when the object is caused to pass through the illuminating surface and the other illuminating surface in sequence, the object motion of the object can be detected in a projection direction perpendicular to the illuminating surface. In particular, in this way, the click or touch motion of the object can be detected.

根據另一較佳改進方案,該廣角光學系統與該照射面係沿大 體垂直於該照射面之投影方向佈置在不同的平面中。 According to another preferred improvement, the wide-angle optical system and the illuminated surface The bodies are arranged in different planes perpendicular to the projection direction of the illuminated surface.

藉此便能進一步增大該模組之結構形式的緊密度,因為該光源及該掃描鏡構造係以與該廣角光學系統重疊的方式佈置。 Thereby, the compactness of the structural form of the module can be further increased, because the light source and the scanning mirror structure are arranged in a manner overlapping with the wide-angle optical system.

根據另一較佳改進方案,該模組適於藉由飛行時間法及/或藉由強度測量來進行定位。 According to another preferred improvement, the module is suitable for positioning by time-of-flight method and/or by intensity measurement.

如此便能以精度及解析度相對較高的方式對該物體進行定位。 In this way, the object can be positioned with a relatively high accuracy and resolution.

根據另一較佳改進方案,該光學偵測機構包括一光學偵測元件,其中- 該光學偵測元件與該光源係整合在同一半導體雷射元件中,其中特定言之,該半導體元件為包含垂直腔的面射型雷射器(VCSEL)或包含外部垂直腔的面射型雷射器(VeCSEL),或者- 該光學偵測元件與該光源係以彼此分離之方式佈置,其中該光學偵測元件與該掃描鏡構造間隔一偏移距離,其中該偏移距離小於5厘米,較佳小於2厘米,最佳小於1厘米。 According to another preferred improvement, the optical detection mechanism includes an optical detection element, wherein-the optical detection element and the light source are integrated in the same semiconductor laser element, wherein in particular, the semiconductor element includes A vertical cavity surface-emitting laser (VCSEL) or a surface-emitting laser containing an external vertical cavity (VeCSEL), or-the optical detection element and the light source are arranged separately from each other, wherein the optical detection The measuring element and the scanning mirror structure are separated by an offset distance, wherein the offset distance is less than 5 cm, preferably less than 2 cm, and most preferably less than 1 cm.

如此便能實現該模組的一種更為緊密且更小的實施方式。 In this way, a more compact and smaller implementation of the module can be realized.

根據另一較佳改進方案,該資訊電器係可根據該定位資訊及/或該另一定位資訊而得到控制。 According to another preferred improvement, the information appliance can be controlled based on the positioning information and/or the other positioning information.

如此便能藉由一資訊電器使用該模組,從而在該資訊電器上提供人機介面。特定言之,該資訊電器為便攜型資訊電器、通信終端、膝上型電腦、筆記型電腦、個人電腦、電視或另一用於進行電子資料處理的設備。 In this way, the module can be used by an information appliance to provide a human-machine interface on the information appliance. Specifically, the information appliance is a portable information appliance, a communication terminal, a laptop computer, a notebook computer, a personal computer, a television, or another device for electronic data processing.

根據本發明之方法的一種較佳改進方案,在該第二操作步驟中,使得該朝向掃描鏡構造的初級射束以某種方式發生偏轉並朝向該廣角光學系統,從而透過該廣角光學系統使得該初級射束偏轉至該照射面。根據本發明,藉由該廣角光學系統便能將該初級射束所經過的角度選取得比該鏡構件之掃描角更大。該光源之射束整形光學系統較佳以某種方式與該廣角光學系統匹配,使得在該廣角光學系統後對該初級射束進行的射束整形的直徑不超過5毫米,較佳不超過3毫米,尤佳不超過1毫米,最佳不超過0.5毫米。 According to a preferred improvement of the method of the present invention, in the second operation step, the primary beam constructed toward the scanning mirror is deflected in a certain manner and toward the wide-angle optical system, thereby passing through the wide-angle optical system such that The primary beam is deflected to the irradiation surface. According to the present invention, the wide-angle optical system can select the angle through which the primary beam passes through to be larger than the scanning angle of the mirror member. The beam shaping optical system of the light source is preferably matched to the wide-angle optical system in a manner such that the diameter of the beam shaping of the primary beam after the wide-angle optical system does not exceed 5 mm, preferably does not exceed 3 Mm, particularly preferably not more than 1 mm, and best not more than 0.5 mm.

如此便能透過該掃描鏡構造之偏轉位置的相對較小的偏轉或改變來產生相對較大之張角。藉此便能藉由單獨一個可動鏡構造精確並快速地對該物件進行定位。 In this way, a relatively large opening angle can be generated through a relatively small deflection or change of the deflection position of the scanning mirror structure. In this way, the object can be accurately and quickly positioned by the construction of a single movable mirror.

本發明之實施例參閱附圖,下文將對此等實施例作進一步說明。 For the embodiments of the present invention, refer to the drawings, and these embodiments will be further described below.

1:資訊電器 1: Information appliances

2:模組 2: Module

2':模組底面 2': Module bottom

3:初級射束 3: primary beam

3':初級射束 3': primary beam

3":初級射束 3": primary beam

4:物件 4: Object

5:次級訊號 5: secondary signal

5':另一次級訊號 5': Another secondary signal

6:光源 6: Light source

6':另一光源 6': another light source

7:掃描鏡元件 7: Scanning mirror element

7':另一掃描鏡元件 7': another scanning mirror element

8:廣角光學系統 8: Wide-angle optical system

8':鏡面元件 8': Mirror element

8":另一鏡面元件 8": another mirror element

9:光學偵測機構 9: Optical detection mechanism

10:底座,支承面 10: base, bearing surface

11:照射距離 11: Irradiation distance

12:偏移距離 12: Offset distance

13:照射距離 13: Irradiation distance

21:第一子模組,光模組 21: The first sub-module, optical module

22:第二子模組,掃描模組 22: Second sub-module, scanning module

23:第三子模組,第一控制及/或偵測模組 23: Third submodule, first control and/or detection module

24:第四子模組,分析模組 24: Fourth sub-module, analysis module

25:第五子模組,第二控制及/或偵測模組 25: Fifth sub-module, second control and/or detection module

26:第六子模組,控制模組 26: Sixth sub-module, control module

27:第七子模組,相機模組 27: The seventh sub-module, camera module

28:第八子模組,通信模組 28: Eighth sub-module, communication module

30:照射面 30: Irradiated surface

30':另一照射面 30': another illuminated surface

71:鏡構件 71: Mirror component

100:主延伸平面 100: main extension plane

101:照射方向 101: Irradiation direction

101':第一照射方向 101': the first irradiation direction

101":第二照射方向 101": the second irradiation direction

103:投影方向 103: projection direction

圖1至7顯示本發明之不同實施方式中的模組,其中圖1為本發明之一種實施方式中的用於提供人機介面的模組2的示意圖。 1 to 7 show modules in different embodiments of the present invention. FIG. 1 is a schematic diagram of a module 2 for providing a human-machine interface in an embodiment of the present invention.

圖2顯示本發明之一種實施方式中的模組2。模組2具有用於產生初級射束3的光源6。 FIG. 2 shows the module 2 in an embodiment of the invention. The module 2 has a light source 6 for generating the primary beam 3.

圖3顯示本發明之一種實施方式中的模組2。 FIG. 3 shows the module 2 in an embodiment of the invention.

圖4顯示本發明之一種實施方式中的模組2。 FIG. 4 shows the module 2 in an embodiment of the invention.

圖5顯示本發明之一種實施方式中的模組2。 FIG. 5 shows the module 2 in an embodiment of the invention.

圖6顯示本發明之一種實施方式中的模組2。 FIG. 6 shows the module 2 in an embodiment of the invention.

圖7顯示本發明之一種實施方式中的模組2。 FIG. 7 shows the module 2 in an embodiment of the invention.

在各附圖中相同的部件總是用相同的元件符號表示,故此等部件通常僅被命名或述及一次。 In the drawings, the same components are always indicated by the same element symbols, so these components are usually named or mentioned only once.

圖1為本發明之一種實施方式中的用於提供人機介面的模組2的示意圖。根據該實施方式,模組2適於對佈置在呈照射面30方式的定位區中的物件4進行定位。模組2係採用某種配置方案,使得初級射束3大體沿照射面30實施掃描運動,其中,當初級射束3以產生次級訊號5的方式與處於照射面30中的物件4發生相互作用時,對次級訊號5進行偵測。舉例而言,當沿照射方向101將初級射束3射出並使其入射至物件4,以及當自模組2視之該物件係沿照射方向101處於照射面30中時,透過初級射束3在物件4上的反射產生次級訊號5。 FIG. 1 is a schematic diagram of a module 2 for providing a human-machine interface in an embodiment of the present invention. According to this embodiment, the module 2 is suitable for positioning objects 4 arranged in the positioning area in the manner of the irradiation surface 30. The module 2 adopts a certain configuration scheme, so that the primary beam 3 generally performs a scanning movement along the irradiation surface 30, wherein when the primary beam 3 interacts with the object 4 in the irradiation surface 30 in a manner to generate the secondary signal 5 When functioning, the secondary signal 5 is detected. For example, when the primary beam 3 is emitted along the irradiation direction 101 and is incident on the object 4, and when the object viewed from the module 2 is in the irradiation surface 30 along the irradiation direction 101, the primary beam 3 is transmitted The reflection on the object 4 generates the secondary signal 5.

模組2適於透過偵測次級訊號5來對物件4進行定位,其中根據距離偵測及/或強度偵測來對物件4進行定位,其中特別是透過飛行時間法來進行距離偵測以及/或者透過強度測量來進行強度偵測,其中該強度偵測包括對測得的次級訊號5之強度與參考強度進行強度比較。例如在參考測量中對該參考強度進行測量,並將該參考強度保存在模組2中。 The module 2 is suitable for positioning the object 4 by detecting the secondary signal 5, wherein the object 4 is positioned according to distance detection and/or intensity detection, in particular distance detection by time-of-flight method and /Or intensity detection through intensity measurement, where the intensity detection includes comparing the intensity of the measured secondary signal 5 with the reference intensity. For example, the reference intensity is measured in the reference measurement, and the reference intensity is stored in the module 2.

物件4之定位在此係指:對整個物件或僅對一物件部分(例如由初級射束3在物件4之物件表面上產生的投影點)進行位置確定,其中該位置確定係基於對模組2與物件4(或物件部分)之距離或間距的確定,以及/或者基於對該(與該物件部分關聯之)投影點相對另一(與另一物件 部分關聯之)投影點的位置的確定,其中特定言之,在掃描運動期間的不同時間點上產生該投影點及另一投影點。 The positioning of the object 4 here refers to: determining the position of the entire object or only a part of the object (for example, the projection point generated by the primary beam 3 on the surface of the object 4), wherein the position determination is based on the module 2 The determination of the distance or spacing from the object 4 (or object part), and/or based on the projection point (associated with the object part) relative to another (with another object) (Partially related) the determination of the position of the projection point, in particular, the projection point and another projection point are generated at different points in time during the scanning movement.

模組2較佳具有第一子模組21、第二子模組22、第三子模組23、第四子模組24、第五子模組25、第六子模組26、第七子模組27、第八子模組28及/或其他子模組。如此便能提供具模組化結構的模組2,其可根據模組化理念以與多個不同資訊電器及/或應用實例匹配的方式得到調整。 The module 2 preferably has a first submodule 21, a second submodule 22, a third submodule 23, a fourth submodule 24, a fifth submodule 25, a sixth submodule 26, a seventh Submodule 27, eighth submodule 28 and/or other submodules. In this way, a module 2 with a modular structure can be provided, which can be adjusted in a way that matches a plurality of different information appliances and/or application examples according to the modular concept.

根據模組2的一種示範性實施方式,第一子模組21為適於產生初級射束3及/或另一初級射束的光模組21,以及/或者,第二子模組22為適於產生該初級射束3之掃描運動及/或該另一初級射束3'之另一掃描運動的掃描模組22,以及/或者,第三子模組23為適於產生關於次級訊號5及/或另一次級訊號之偵測訊號的第一控制及/或偵測模組23,以及/或者,第四子模組24為用於產生定位資訊的分析模組24,以及/或者,第五子模組25為第二控制及/或偵測模組25,以及/或者,第六子模組26為用於對電源進行控制的控制模組26,以及/或者,第七子模組27為相機模組,以及/或者,第八子模組28為適於與資訊電器1進行通信及/或對資訊電器1進行資料傳輸的通信模組28。 According to an exemplary embodiment of the module 2, the first sub-module 21 is an optical module 21 suitable for generating the primary beam 3 and/or another primary beam, and/or the second sub-module 22 is A scanning module 22 suitable for generating the scanning motion of the primary beam 3 and/or another scanning motion of the other primary beam 3', and/or the third sub-module 23 is suitable for generating The first control and/or detection module 23 of the detection signal of the signal 5 and/or another secondary signal, and/or the fourth submodule 24 is an analysis module 24 for generating positioning information, and/or Alternatively, the fifth sub-module 25 is the second control and/or detection module 25, and/or, the sixth sub-module 26 is the control module 26 for controlling the power supply, and/or, the seventh The sub-module 27 is a camera module, and/or the eighth sub-module 28 is a communication module 28 suitable for communicating with the information appliance 1 and/or transmitting data to the information appliance 1.

圖2顯示本發明之一種實施方式中的模組2。模組2具有用於產生初級射束3的光源6。該光源較佳為雷射二極體,例如為面射型雷射器。特定言之,光源6所產生的初級射束3為可見光束3(即波長為380奈米(nm)至780奈米的光)或紅外(IR)光束3。 FIG. 2 shows the module 2 in an embodiment of the invention. The module 2 has a light source 6 for generating the primary beam 3. The light source is preferably a laser diode, such as a surface-emitting laser. In particular, the primary beam 3 generated by the light source 6 is a visible beam 3 (ie, light with a wavelength of 380 nanometers (nm) to 780 nanometers) or an infrared (IR) beam 3.

此處模組2具有包含呈微電機械掃描鏡元件7形式的掃描鏡 構造。特定言之,模組2係採用以下配置方案:透過掃描鏡構造使得初級射束3以某種方式發生偏轉,從而使得初級射束3大體沿(平坦的)照射面30延伸。微機械掃描鏡元件7係可被調節至位於(掃描鏡元件7的)兩個最大偏轉位置間的多個偏轉位置。在該二最大偏轉位置中的第一最大偏轉位置中,透過掃描鏡構造沿第一照射方向101'將初級射束3沿照射面30射出。在該二最大偏轉位置中的第二最大偏轉位置中,透過掃描鏡構造沿第二照射方向101"將初級射束3沿照射面30射出。在此,用第一照射方向101'及第二照射方向101"來定義定位區(照射面30)的定位極限101'、101"。特定言之,在本實施方式中,「定位區」與「照射面30」的含義相同。特定言之,微機械掃描鏡元件7的配置方式使得當對該掃描鏡元件7施加控制訊號時,掃描鏡元件7在該二最大偏轉位置間實施偏轉運動。特定言之,初級射束3為雷射束3,例如連續式雷射束3或脈衝式雷射束3。 Here the module 2 has a scanning mirror in the form of a microelectromechanical scanning mirror element 7 structure. In particular, the module 2 adopts the following configuration scheme: the primary beam 3 is deflected in a certain manner through the scanning mirror configuration, so that the primary beam 3 extends substantially along the (flat) irradiation surface 30. The micromechanical scanning mirror element 7 can be adjusted to a plurality of deflection positions between the two maximum deflection positions (of the scanning mirror element 7). In the first maximum deflection position among the two maximum deflection positions, the primary beam 3 is emitted along the irradiation surface 30 through the scanning mirror structure along the first irradiation direction 101 ′. In the second maximum deflection position among the two maximum deflection positions, the primary beam 3 is emitted along the irradiation surface 30 along the second irradiation direction 101" through the scanning mirror structure. Here, the first irradiation direction 101' and the second The irradiation direction 101" defines the positioning limits 101', 101" of the positioning area (irradiated surface 30). Specifically, in the present embodiment, the "positioned area" has the same meaning as the "irradiated surface 30". In particular, the arrangement of the micromechanical scanning mirror element 7 is such that when a control signal is applied to the scanning mirror element 7, the scanning mirror element 7 performs a deflection movement between the two maximum deflection positions. In particular, the primary beam 3 is a laser beam 3, such as a continuous laser beam 3 or a pulsed laser beam 3.

特定言之,在該掃描運動期間藉由一掃描頻率使得初級射束3進行運動,其中該掃描頻率與該掃描運動之掃描週期關聯。特定言之,在該掃描週期內,初級射束3以自第一定位極限101'(藉由元件符號為3'的初級射束示出)到達第二定位極限101"(藉由元件符號為3"的初級射束示出)再重回第一定位極限101'的方式進行掃描或偏移。該掃描頻率較佳為1至2000赫(Hz),尤佳為5至500赫,最佳為10至200赫。 In particular, the primary beam 3 is moved by a scanning frequency during the scanning movement, wherein the scanning frequency is related to the scanning period of the scanning movement. In particular, during this scan period, the primary beam 3 reaches the second positioning limit 101" (from the element symbol is as follows) from the first positioning limit 101' (shown by the elementary beam with element symbol 3') The 3" primary beam is shown) and then scanned or shifted back to the first positioning limit 101'. The scanning frequency is preferably 1 to 2000 Hertz (Hz), particularly preferably 5 to 500 Hertz, and most preferably 10 to 200 Hertz.

在位於掃描鏡元件7之最大偏轉位置之間的偏轉位置中,沿照射方向101將初級射束3射出。當物件4(例如用戶之手指4)以某種方式佈置在或處於照射面30中,使得物件4與照射面30接觸或相交時,透過初級射束3與物件4的相互作用(例如反射)來產生次級訊號5。舉例而言, 透過物件4之物件運動,物件4沿垂直於照射面30的投影方向103移入照射面30,使得物件4佈置在或處於照射面30中。在此情形下,當(在該掃描運動期間)沿照射方向101將初級射束3射出時,產生次級訊號5。 In the deflection position between the maximum deflection positions of the scanning mirror element 7, the primary beam 3 is emitted in the irradiation direction 101. When the object 4 (for example, the user's finger 4) is arranged or located in the irradiation surface 30 in such a way that the object 4 contacts or intersects with the irradiation surface 30, the primary beam 3 interacts with the object 4 (eg, reflection) To generate secondary signal 5. For example, Through the movement of the object 4, the object 4 moves into the irradiation surface 30 along the projection direction 103 perpendicular to the irradiation surface 30, so that the object 4 is arranged on or in the irradiation surface 30. In this case, when the primary beam 3 is emitted along the irradiation direction 101 (during the scanning movement), the secondary signal 5 is generated.

模組2包括適於對次級訊號5進行偵測的光學偵測機構9,其包含例如為光電二極體的光學偵測元件。根據一種替代性實施方式,特別是當該光源為VCSEL時,包含光源之光學偵測元件為單塊式整合。模組2較佳適於根據光學偵測元件所偵測的次級訊號5產生一偵測訊號。特定言之,模組2適於根據該偵測訊號產生一定位資訊。較佳地,模組2適於在對次級訊號5進行偵測的過程中,產生關於掃描鏡元件7之一偏轉位置的位置偵測訊號,從而根據該偵測訊號及該位置偵測訊號以經時間解析的方式產生該定位資訊。特定言之,該定位資訊包括關於物件4與模組2之距離的距離資訊,及/或關於物件4相對模組2之定向方向的定向資訊,及/或關於投影點在物件4之物件表面上的座標的位置座標。特定言之,模組2適於透過飛行時間法(英語:Time-of-Flight,TOF,Detection)及/或透過強度比較藉由經時間解析的分析對該物件進行定位。 The module 2 includes an optical detection mechanism 9 suitable for detecting the secondary signal 5, which includes an optical detection element such as a photodiode. According to an alternative embodiment, especially when the light source is a VCSEL, the optical detection element containing the light source is monolithically integrated. The module 2 is preferably adapted to generate a detection signal according to the secondary signal 5 detected by the optical detection element. In particular, the module 2 is adapted to generate positioning information according to the detection signal. Preferably, the module 2 is adapted to generate a position detection signal about a deflection position of the scanning mirror element 7 during the detection of the secondary signal 5, so as to detect the signal according to the detection signal and the position The positioning information is generated in a time-parsed manner. Specifically, the positioning information includes distance information about the distance between the object 4 and the module 2, and/or orientation information about the orientation direction of the object 4 relative to the module 2, and/or about the projection point on the object surface of the object 4 Position coordinates on the coordinates. In particular, the module 2 is suitable for locating the object through time-of-flight (TOF, Detection) and/or intensity comparison through time-analyzed analysis.

圖3顯示本發明之一種實施方式中的模組2。該圖示出一包含模組2及底座10的系統,其中模組2具有模組底面2',該模組底面貼靠在例如為工作台的底座10(支承面)上。在本實施方式中,支承面10主要沿平面100延伸。特定言之,模組2採用某種配置方案,使得在模組2藉由模組底面2'貼靠在支承面10上的情況下,照射面30與主延伸平面100大體相互平行,並且在支承面10與照射面30之間存在一(沿與照射面30垂直的投影方向103的)照射距離11。照射距離11較佳為0.1至10毫米(mm), 尤佳為0.5至5毫米,最佳為約1毫米。 FIG. 3 shows the module 2 in an embodiment of the invention. The figure shows a system including a module 2 and a base 10, wherein the module 2 has a module bottom surface 2', which bottom surface abuts against a base 10 (support surface) such as a workbench. In this embodiment, the support surface 10 mainly extends along the plane 100. In particular, the module 2 adopts a certain configuration scheme, so that when the module 2 abuts on the support surface 10 through the module bottom surface 2', the irradiation surface 30 and the main extension plane 100 are substantially parallel to each other, and There is an irradiation distance 11 (in the projection direction 103 perpendicular to the irradiation surface 30) between the support surface 10 and the irradiation surface 30. The irradiation distance 11 is preferably 0.1 to 10 millimeters (mm), It is particularly preferably 0.5 to 5 mm, and most preferably about 1 mm.

在圖3所示實施方式中,光源6、掃描鏡元件7及光學偵測元件係大體佈置在第一模組平面中,以及,廣角光學系統8係佈置在第二模組平面中,其中該第一與第二模組平面係大體平面平行且彼此間隔一定距離。如此便能提供構造極為緊密的模組2。作為替代方案,根據本發明,光源6、掃描鏡元件7、光學偵測元件(光學偵測機構9)及廣角光學系統8可佈置在共同一個模組平面中。 In the embodiment shown in FIG. 3, the light source 6, the scanning mirror element 7, and the optical detection element are generally arranged in the first module plane, and the wide-angle optical system 8 is arranged in the second module plane, wherein the The first and second module planes are substantially parallel and spaced apart from each other by a certain distance. In this way, it is possible to provide the module 2 with an extremely compact structure. As an alternative, according to the present invention, the light source 6, the scanning mirror element 7, the optical detection element (optical detection mechanism 9) and the wide-angle optical system 8 may be arranged in a common module plane.

圖4顯示本發明之一種實施方式中的模組2。該圖示出偏移距離12,其中該偏移距離自模組2之第一位置(模組2在該第一位置上將初級射束3射出)延伸至模組2之第二位置(模組2在該第二位置上對次級訊號5進行偵測)。第一位置例如與模組2之射束輸出區域對應,且第二位置例如與模組2之偵測區域對應,其中在該偵測區域內佈置有光學偵測元件(光學偵測機構9)。在本發明中,偏移距離12小於5厘米,較佳小於2厘米,最佳小於1厘米。 FIG. 4 shows the module 2 in an embodiment of the invention. The figure shows an offset distance 12, where the offset distance extends from the first position of the module 2 (the module 2 emits the primary beam 3 at the first position) to the second position of the module 2 (module Group 2 detects the secondary signal 5 at the second position). The first position corresponds to, for example, the beam output area of the module 2, and the second position corresponds to, for example, the detection area of the module 2, in which an optical detection element (optical detection mechanism 9) is arranged . In the present invention, the offset distance 12 is less than 5 cm, preferably less than 2 cm, and most preferably less than 1 cm.

圖5顯示本發明之一種實施方式中的模組2。在本實施方式中,模組2包括一光源6及另一光源6'。該另一光源6'適於產生另一初級射束3'。在此,掃描鏡構造適於產生該另一初級射束3'之大體沿另一照射面30'的另一掃描運動。在此透過照射面30及另一照射面30'構成定位區。特定言之,可藉由相同或不同的掃描頻率,以及/或者採用同步或異步的方式來實施該另一初級射束3'之另一掃描運動及該初級射束3之掃描運動。廣角光學系統8在此具有一鏡面元件8'及另一鏡面元件8"。透過掃描鏡元件7使得初級射束3朝向鏡面元件8',以及使得另一初級射束3'朝向另一鏡面元 件8"。在此,鏡面元件8'及另一鏡面元件8"係採用某種配置方案,從而在該掃描運動中沿照射面30將初級射束3射出,以及在該另一掃描運動中沿另一照射面30'將另一初級射束3'射出。在此,照射面30與另一照射面30'間隔一沿投影方向的照射距離13。 FIG. 5 shows the module 2 in an embodiment of the invention. In this embodiment, the module 2 includes a light source 6 and another light source 6'. The further light source 6'is suitable for generating another primary beam 3'. Here, the scanning mirror configuration is suitable for generating another scanning movement of the further primary beam 3'substantially along the other irradiation surface 30'. Here, the irradiated surface 30 and the other irradiated surface 30' form a positioning area. In particular, the other scanning motion of the other primary beam 3'and the scanning motion of the primary beam 3 may be implemented by the same or different scanning frequencies, and/or in a synchronous or asynchronous manner. The wide-angle optical system 8 here has a mirror element 8 ′ and another mirror element 8 ″. Through the scanning mirror element 7, the primary beam 3 is directed toward the mirror element 8 ′, and the other primary beam 3 ′ is directed toward another mirror element 8”. Here, the mirror element 8 ′ and the other mirror element 8 ″ adopt a certain configuration scheme, so that the primary beam 3 is emitted along the irradiation surface 30 during the scanning motion, and during the other scanning motion Another primary beam 3'is emitted along the other irradiation surface 30'. Here, the irradiation surface 30 is separated from the other irradiation surface 30 ′ by an irradiation distance 13 along the projection direction.

當物件4係佈置在照射面30中,且初級射束3與物件4發生相互作用時,產生次級訊號5並透過光學偵測元件(光學偵測機構9)對該次級訊號進行偵測。當物件4係佈置在另一照射面30'中,且該另一初級射束3'與物件4發生相互作用時,產生另一次級訊號5'並透過光學偵測元件(光學偵測機構9)對該另一次級訊號進行偵測。根據一種(未繪示的)替代性實施方式,特別是當光源6及另一光源6'為VCSEL時,透過光源6對次級訊號5進行偵測,以及,透過另一光源6'對另一次級訊號5'進行偵測。透過採用兩個(平坦且相互平行的)照射面30、30',可使得物件4具有相對較高之定位精度。 When the object 4 is arranged in the irradiation surface 30, and the primary beam 3 interacts with the object 4, a secondary signal 5 is generated and detected by the optical detection element (optical detection mechanism 9) . When the object 4 is arranged in another irradiation surface 30', and the other primary beam 3'interacts with the object 4, another secondary signal 5'is generated and passes through the optical detection element (optical detection mechanism 9) ) Detect the other secondary signal. According to an alternative embodiment (not shown), especially when the light source 6 and the other light source 6'are VCSELs, the secondary signal 5 is detected through the light source 6, and the other light source 6' Primary signal 5'is detected. By using two (flat and parallel) irradiation surfaces 30, 30', the object 4 can have a relatively high positioning accuracy.

圖6顯示本發明之一種實施方式中的模組2。該圖所示實施方式與圖5所示實施方式的區別在於,光源6及另一光源6'採用以下佈局或佈置方案:以某種方式對初級射束3及另一初級射束3'進行導引,從而大體沿照射面30將初級射束3射出,以及大體沿另一照射面30'將另一初級射束3'射出,其中初級射束3與另一初級射束3'自光源6或另一光源6'出發在大致相同的點上入射至掃描鏡元件7。廣角光學系統8例如採用自由形體。 FIG. 6 shows the module 2 in an embodiment of the invention. The difference between the embodiment shown in this figure and the embodiment shown in FIG. 5 is that the light source 6 and another light source 6'adopt the following layout or arrangement scheme: the primary beam 3 and another primary beam 3'are carried out in some way Guidance so that the primary beam 3 is emitted substantially along the irradiation surface 30 and another primary beam 3'is emitted generally along the other irradiation surface 30', wherein the primary beam 3 and the other primary beam 3'are from the light source 6 or another light source 6'is incident on the scanning mirror element 7 at approximately the same point. The wide-angle optical system 8 uses, for example, a free-form body.

圖7顯示本發明之一種實施方式中的模組2。在本實施方式中,模組2具有掃描鏡構造,其包含微電機械掃描鏡元件7、另一微電機械掃描鏡元件7'及廣角光學系統8。在此,照射面30與另一照射面30'係佈置 在相同的平面中,其中,透過掃描鏡元件使得初級射束3大體沿照射面30進行掃描運動,以及,透過另一掃描鏡元件使得另一初級射束3'大體沿另一照射面30'進行掃描運動。如此便能在對物件4進行定位時實現相對較高之角解析度。 FIG. 7 shows the module 2 in an embodiment of the invention. In this embodiment, the module 2 has a scanning mirror structure including a microelectromechanical scanning mirror element 7, another microelectromechanical scanning mirror element 7 ′, and a wide-angle optical system 8. Here, the irradiation surface 30 and the other irradiation surface 30' are arranged in series In the same plane, where the scanning beam element causes the primary beam 3 to generally perform a scanning movement along the irradiation surface 30, and the other scanning mirror element causes the other primary beam 3'to substantially along the other irradiation surface 30' Perform a scanning motion. In this way, a relatively high angular resolution can be achieved when positioning the object 4.

作為替代方案,光源6例如為VCSEL雙感測器,其中該VCSEL雙感測器適於產生初級射束3以及對次級訊號5進行偵測。 As an alternative, the light source 6 is, for example, a VCSEL dual sensor, wherein the VCSEL dual sensor is suitable for generating the primary beam 3 and detecting the secondary signal 5.

2:模組 2: Module

3:初級射束 3: primary beam

3':初級射束 3': primary beam

3":初級射束 3": primary beam

4:物件 4: Object

5:次級訊號 5: secondary signal

6:光源 6: Light source

7:掃描鏡元件 7: Scanning mirror element

8:廣角光學系統 8: Wide-angle optical system

9:光學偵測機構 9: Optical detection mechanism

101:照射方向 101: Irradiation direction

101':第一照射方向,第一定位極限 101': the first irradiation direction, the first positioning limit

101":第二照射方向,第二定位極限 101": Second irradiation direction, second positioning limit

103:投影方向 103: projection direction

Claims (21)

一種用於提供人機介面的模組(2),其中該模組(2)適於對處於定位區中的物件(4)進行定位,該定位區呈照射面(30)的方式,其中該模組(2)適於產生初級射束(3),其中該模組(2)具有一呈掃描鏡元件(7,7')形式的掃描鏡構造,其中該掃描鏡構造係可以控制成,使得該初級射束(3)大體沿該位於該照射面(30)實施一掃描運動,其中該模組(2)係採用某種配置方案,使得當透過該初級射束(3)與該處於照射面(30)中之物件(4)的相互作用產生一次級訊號(5)時,對該次級訊號(5)進行偵測,其中該模組(2)適於根據該次級訊號(5)產生一定位資訊,其特徵在於,該模組(2)具有一用於產生該初級射束(3)的光源(6)以及一用於對該次級訊號(5)進行偵測的光學偵測機構(9),其中該光源(6)、該掃描鏡構造及該光學偵測機構(9)係整合在該模組(2)中,其中該光學偵測機構(9)包括一光學偵測元件,其中該光學偵測元件與該光源(6)係整合在同一半導體雷射元件中,其中特定言之,該半導體元件為包含垂直腔的面射型雷射器(VCSEL)或包含外部垂直腔的面射型雷射器(VeCSEL),或者該光學偵測元件與該光源(6)係以彼此分離之方式佈置,其中該光學偵測元件與該掃描鏡構造間隔一偏移距離(12),其中該偏移距離(12)小於5厘米。 A module (2) for providing a human-machine interface, wherein the module (2) is suitable for positioning an object (4) in a positioning area, the positioning area is in a manner of illuminating a surface (30), wherein the The module (2) is suitable for generating a primary beam (3), wherein the module (2) has a scanning mirror structure in the form of a scanning mirror element (7, 7'), wherein the scanning mirror structure can be controlled as, Causing the primary beam (3) to perform a scanning movement generally along the irradiation surface (30), wherein the module (2) adopts a certain configuration scheme so that when the primary beam (3) passes through the When the primary signal (5) is generated by the interaction of the object (4) in the illuminated surface (30), the secondary signal (5) is detected, wherein the module (2) is adapted to the secondary signal (5) 5) Generate positioning information, characterized in that the module (2) has a light source (6) for generating the primary beam (3) and a detector for detecting the secondary signal (5) An optical detection mechanism (9), wherein the light source (6), the scanning mirror structure and the optical detection mechanism (9) are integrated in the module (2), wherein the optical detection mechanism (9) includes a An optical detection element, wherein the optical detection element and the light source (6) are integrated in the same semiconductor laser element, in particular, the semiconductor element is a surface-emitting laser (VCSEL) or a vertical cavity A surface-emitting laser (VeCSEL) containing an external vertical cavity, or the optical detection element and the light source (6) are arranged separately from each other, wherein the optical detection element and the scanning mirror structure are separated by an offset Distance (12), where the offset distance (12) is less than 5 cm. 如申請專利範圍第1項之模組(2),其中,該掃描鏡構造係可被調節至一位於兩個最大偏轉位置間的偏轉位置,其中該掃描鏡構造的配置方式使得該初級射束(3)在該掃描運動期間在位於該照射面(30)之 兩個定位極限(101',101")間的定位平面內進行運動。 For example, the module (2) of item 1 of the patent application scope, wherein the scanning mirror structure can be adjusted to a deflection position between two maximum deflection positions, wherein the scanning mirror structure is arranged such that the primary beam (3) During the scanning movement, the Movement takes place in the positioning plane between the two positioning limits (101', 101"). 如申請專利範圍第1或2項之模組(2),其中,該掃描鏡構造為微電機械系統(MEMS),其中該掃描鏡構造具有一微電機械掃描鏡元件(7),其中該掃描鏡元件(7)具有可偏轉的鏡構件(71)。 A module (2) as claimed in item 1 or 2 of the patent scope, wherein the scanning mirror structure is a micro-electromechanical system (MEMS), wherein the scanning mirror structure has a micro-electromechanical scanning mirror element (7), wherein the The scanning mirror element (7) has a deflectable mirror member (71). 如申請專利範圍第3項之模組(2),其中,該鏡構件(71)可經一第一軸線偏移及/或可繞一條大致垂直於該第一軸線的第二軸線偏移。 For example, the module (2) of claim 3, wherein the mirror member (71) can be offset via a first axis and/or can be offset about a second axis substantially perpendicular to the first axis. 如申請專利範圍第3項之模組(2),其中,該鏡構件(71)係可繞該第一軸線及該第二軸線偏移或任何繞該第一軸線偏移。 For example, the module (2) of claim 3, wherein the mirror member (71) can be offset around the first axis and the second axis or any offset around the first axis. 如前述申請專利範圍第1或第2項之模組,其中,該模組(2)具有一廣角光學系統(8),其中該廣角光學系統(8)具有一凸面狀鏡面光學系統、一凹面狀鏡面光學系統、一DOE(Diffractive Optical Element,繞射光學元件)及/或一透鏡,其中該廣角光學系統(8)較佳以某種方式與該光源之射束整形光學系統匹配,使得在該廣角光學系統(8)後方對該初級射束(3)進行的射束整形的直徑不超過5毫米。 A module as described in the first or second patent application, wherein the module (2) has a wide-angle optical system (8), wherein the wide-angle optical system (8) has a convex mirror optical system, a concave surface Mirror-like optical system, a DOE (Diffractive Optical Element, diffractive optical element) and/or a lens, wherein the wide-angle optical system (8) is preferably matched in some way to the beam shaping optical system of the light source so that The diameter of the beam shaping of the primary beam (3) behind the wide-angle optical system (8) does not exceed 5 mm. 如申請專利範圍第6項之模組(2),其中,該直徑不超過3毫米。 For example, the module (2) in item 6 of the patent application scope, in which the diameter does not exceed 3 mm. 如申請專利範圍第7項之模組(2),其中,該直徑不超過1毫米。 For example, the module (2) of item 7 of the patent application scope, in which the diameter does not exceed 1 mm. 如申請專利範圍第8項之模組(2),其中,該直徑不超過0.5毫米。 For example, the module (2) of item 8 of the patent scope, in which the diameter does not exceed 0.5 mm. 如申請專利範圍第1或2項之模組(2),其中,該模組(2)具有另一整合在模組(2)中的另一光源(6'),其中該另一光源(6')適於產生另一初級射束(3'),其中該掃描鏡構造的配置方式使得該另一初級射束(3')大體沿位於該定位區內的另一照射面(30')實施另一掃描運動,其中該模組(2)的配置方式使得當透過該另一初級射束(3')與該處 於另一照射面(30')中之物件(4)的相互作用產生另一次級訊號(5')時,對該另一次級訊號(5')進行偵測,其中該模組(2)適於根據該另一次級訊號(5')產生另一定位資訊。 For example, the module (2) of claim 1 or 2, wherein the module (2) has another light source (6') integrated in the module (2), wherein the other light source ( 6') is suitable for generating another primary beam (3'), wherein the scanning mirror is configured such that the other primary beam (3') is substantially along another illumination surface (30' located in the positioning area ) To implement another scanning movement, wherein the module (2) is arranged in such a way that when passing through the other primary beam (3') and the place When the interaction of the object (4) in the other irradiation surface (30') produces another secondary signal (5'), the other secondary signal (5') is detected, wherein the module (2) It is suitable for generating another positioning information according to the other secondary signal (5'). 如前述申請專利範圍第1或第2項之模組(2),其中該掃描鏡構造適於產生該掃描運動以及適於產生該另一掃描運動,或者該掃描鏡構造具有另一掃描鏡元件(7'),其中,該掃描鏡元件(7)適於產生該掃描運動,以及,該另一掃描鏡元件(7')適於產生另一掃描運動。 A module (2) as described in item 1 or 2 of the aforementioned patent application, wherein the scanning mirror structure is suitable for generating the scanning motion and for generating another scanning motion, or the scanning mirror structure has another scanning mirror element (7'), wherein the scanning mirror element (7) is adapted to generate the scanning motion, and the other scanning mirror element (7') is adapted to generate another scanning motion. 如申請專利範圍第1或2項之模組(2),其中,該照射面(30)與該另一照射面(30')係以相互平行之方式佈置,其中該照射面(30)與一個另外的一個照射面(30')沿一大體垂直於該照射面(30)的投影方向(103)重疊。 For example, the module (2) of claim 1 or 2, wherein the irradiation surface (30) and the other irradiation surface (30') are arranged parallel to each other, wherein the irradiation surface (30) and One additional irradiation surface (30') overlaps along a projection direction (103) that is substantially perpendicular to the irradiation surface (30). 如申請專利範圍第12項之模組(2),其中,該照射面(30)與該另一照射面(30')完全重疊。 A module (2) as claimed in item 12 of the patent scope, wherein the irradiation surface (30) completely overlaps with the other irradiation surface (30'). 如申請專利範圍第7項之模組(2),其中,該照射面(30)與該另一照射面(30')沿該投影方向(103)間隔一照射距離(13)。 A module (2) as claimed in item 7 of the patent scope, wherein the irradiation surface (30) and the other irradiation surface (30') are separated by an irradiation distance (13) along the projection direction (103). 如申請專利範圍第14項之模組(2),其中,該照射距離為0~50毫米。 For example, the module (2) of item 14 of the patent application scope, in which the irradiation distance is 0-50 mm. 如申請專利範圍第15項之模組(2),其中,該照射距離為1~5毫米。 For example, the module (2) of item 15 of the patent application scope, in which the irradiation distance is 1 to 5 mm. 如申請專利範圍第16項之模組(2),其中,該照射距離為3毫米。 For example, the module (2) of item 16 of the patent application scope, in which the irradiation distance is 3 mm. 如申請專利範圍第1或2項之模組(2),其中,該模組2適於透過飛行時間法及/或透過強度測量來進行定位。 For example, the module (2) of claim 1 or claim 2, wherein the module 2 is suitable for positioning by time-of-flight method and/or by intensity measurement. 如申請專利範圍第1項之模組(2),其中 該偏移距離(12)小於2厘米。 For example, the module (2) of item 1 of the patent application scope, in which The offset distance (12) is less than 2 cm. 如申請專利範圍第1項之模組(2),其中該偏移距離(12)小於1厘米。 For example, the module (2) of item 1 of the patent application scope, wherein the offset distance (12) is less than 1 cm. 一種包含如前述申請專利範圍第1~20項任一項所述之模組(2)的資訊電器(1),其中,該資訊電器(1)係可根據該定位資訊及/或該另一定位資訊而得到控制。 An information appliance (1) including the module (2) according to any one of the items 1 to 20 of the aforementioned patent application, wherein the information appliance (1) can be based on the positioning information and/or the other Position information to be controlled.
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Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101976605B1 (en) 2016-05-20 2019-05-09 이탁건 A electronic device and a operation method
CN110945517A (en) * 2017-07-27 2020-03-31 罗伯特·博世有限公司 Device for carrying out a detection function and method for operating such a device
CN109904718B (en) * 2019-03-25 2020-09-04 Oppo广东移动通信有限公司 Control system and control method of time-of-flight assembly and terminal

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020021287A1 (en) * 2000-02-11 2002-02-21 Canesta, Inc. Quasi-three-dimensional method and apparatus to detect and localize interaction of user-object and virtual transfer device
CN101571776A (en) * 2008-04-21 2009-11-04 株式会社理光 Electronics device having projector module
CN102402277A (en) * 2010-09-16 2012-04-04 联想(北京)有限公司 Electronic terminal and information input processing method
CN103299259A (en) * 2011-03-15 2013-09-11 株式会社尼康 Detection device, input device, projector, and electronic apparatus

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5525764A (en) * 1994-06-09 1996-06-11 Junkins; John L. Laser scanning graphic input system
US7050177B2 (en) * 2002-05-22 2006-05-23 Canesta, Inc. Method and apparatus for approximating depth of an object's placement onto a monitored region with applications to virtual interface devices
CN1701351A (en) * 2000-09-07 2005-11-23 卡尼斯塔公司 Quasi-three-dimensional method and apparatus to detect and localize interaction of user-object and virtual transfer device
WO2002054169A2 (en) * 2001-01-08 2002-07-11 Vkb Inc. A data input device
DE10319977A1 (en) * 2003-01-31 2004-08-19 Osram Opto Semiconductors Gmbh Optoelectronic sensor module
US8120754B2 (en) * 2009-02-19 2012-02-21 Northrop Grumman Systems Corporation Light detection and ranging apparatus
KR20100102774A (en) * 2009-03-12 2010-09-27 삼성전자주식회사 Touch sensing system and display apparatus employing the same
JP5646148B2 (en) * 2009-04-07 2014-12-24 船井電機株式会社 projector
LU91714B1 (en) * 2010-07-29 2012-01-30 Iee Sarl Active illumination scanning imager
JP5609566B2 (en) * 2010-11-10 2014-10-22 船井電機株式会社 projector
US20130069912A1 (en) * 2011-09-15 2013-03-21 Funai Electric Co., Ltd. Projector
JP5864177B2 (en) * 2011-09-15 2016-02-17 船井電機株式会社 Projector and projector system
TW201327324A (en) * 2011-12-23 2013-07-01 Azurewave Technologies Inc Optical touch control module

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020021287A1 (en) * 2000-02-11 2002-02-21 Canesta, Inc. Quasi-three-dimensional method and apparatus to detect and localize interaction of user-object and virtual transfer device
CN101571776A (en) * 2008-04-21 2009-11-04 株式会社理光 Electronics device having projector module
CN102402277A (en) * 2010-09-16 2012-04-04 联想(北京)有限公司 Electronic terminal and information input processing method
CN103299259A (en) * 2011-03-15 2013-09-11 株式会社尼康 Detection device, input device, projector, and electronic apparatus

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