TWI696022B - Pixel array substrate - Google Patents

Pixel array substrate Download PDF

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TWI696022B
TWI696022B TW107136329A TW107136329A TWI696022B TW I696022 B TWI696022 B TW I696022B TW 107136329 A TW107136329 A TW 107136329A TW 107136329 A TW107136329 A TW 107136329A TW I696022 B TWI696022 B TW I696022B
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conductive pattern
contact window
impedance adjustment
conductive
pixel array
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TW107136329A
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Chinese (zh)
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TW202016633A (en
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呂家慶
黃信瑋
梁勝淵
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友達光電股份有限公司
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Abstract

A pixel array substrate including a substrate, a plurality of pixel structures, a plurality of signal lines, a plurality of impedance adjusting structures and a plurality of fan-out lines is provided. The signal lines are disposed on the substrate and electrically connected to the pixel structures. The impedance adjusting structures are electrically connected to the signal lines and the fan-out lines. Each of the impedance adjusting structures includes a first conductive pattern, a first insulation layer, a second conductive pattern, a second insulation layer and a third conductive pattern. The first insulation layer has a first contact window. The second insulation layer has a third contact window. The third conductive pattern is electrically connected to the first conductive pattern and the second conductive pattern via the first contact window and the third contact window, respectively. The area of the vertical projection of at least one of the first contact window and the third contact window increases with the impedance adjusting structure being away from an imaginary line.

Description

畫素陣列基板Pixel array substrate

本發明是有關於一種畫素陣列基板,且特別是有關於一種應用於顯示裝置的畫素陣列基板。 The invention relates to a pixel array substrate, and in particular to a pixel array substrate applied to a display device.

隨著顯示面板的應用普及,舉凡居家電視、電競螢幕、戶外的大型看板、賣場的公共訊息屏幕、甚至是可攜式或穿戴式的電子裝置等,都可見其蹤跡。近幾年,顯示面板除了主流尺寸不斷地提升外,因應消費者對於高階電子產品的需求,具窄邊框的顯示面板更是許多面板廠所積極發展的重點項目之一。 With the popularization of display panels, home TVs, e-sports screens, large outdoor billboards, public information screens in stores, and even portable or wearable electronic devices are all visible. In recent years, in addition to increasing the mainstream size of display panels, in response to consumer demand for high-end electronic products, display panels with narrow bezels are one of the key projects actively developed by many panel manufacturers.

在具窄邊框的顯示面板中,其畫素陣列基板上用於連接驅動元件(例如是覆晶軟板、閘極驅動元件)與訊號線(例如是資料線、掃描線)的扇出走線,其延伸長度不同而阻抗差異更加明顯,進而造成顯示不良(mura)的問題。 In a display panel with a narrow bezel, the pixel array substrate is used to connect the fan-out traces of the driving elements (such as flip-flops, gate driving elements) and signal lines (such as data lines and scanning lines), The different extension lengths make the difference in impedance more obvious, which in turn causes the problem of mura.

本發明提供一種畫素陣列基板,電路阻抗匹配佳。 The invention provides a pixel array substrate with good circuit impedance matching.

本發明的畫素陣列基板,包括基板、多個畫素結構、多 條訊號線、多個阻抗調整結構、多條扇出走線以及多個接墊。基板具有依序排列的主動區、轉接區、扇出區以及接墊區。多個畫素結構設置於基板的主動區。多條訊號線電性連接多個畫素結構,且由主動區延伸至轉接區。多個阻抗調整結構設置於基板的轉接區,且電性連接多條訊號線。每一阻抗調整結構包括第一導電圖案、第一絕緣層、第二導電圖案、第二絕緣層以及第三導電圖案。第一導電圖案設置於基板上。第一絕緣層設置於第一導電圖案上,且具有重疊於第一導電圖案的第一接觸窗。第二導電圖案設置於第一絕緣層上。第二絕緣層設置於第二導電圖案上,且具有重疊於第一接觸窗之第二接觸窗以及重疊於第二導電圖案的第三接觸窗。第三導電圖案設置於第二絕緣層上,且透過第一接觸窗、第二接觸窗以及第三接觸窗電性連接第一導電圖案與第二導電圖案。多條扇出走線設置於基板的扇出區,電性連接多個阻抗調整結構,且排列於虛擬線的兩側。每一阻抗調整結構的第一接觸窗與第三接觸窗其中至少一者的垂直投影的面積隨著阻抗調整結構遠離虛擬線而增加。多個接墊設置於基板的接墊區,且電性連接多條扇出走線。 The pixel array substrate of the present invention includes a substrate, multiple pixel structures, multiple Multiple signal lines, multiple impedance adjustment structures, multiple fan-out traces, and multiple pads. The substrate has an active area, a transition area, a fan-out area and a pad area arranged in sequence. Multiple pixel structures are disposed in the active area of the substrate. Multiple signal lines are electrically connected to multiple pixel structures, and extend from the active area to the transition area. Multiple impedance adjustment structures are disposed in the transfer area of the substrate, and are electrically connected to multiple signal lines. Each impedance adjustment structure includes a first conductive pattern, a first insulating layer, a second conductive pattern, a second insulating layer, and a third conductive pattern. The first conductive pattern is disposed on the substrate. The first insulating layer is disposed on the first conductive pattern and has a first contact window overlapping the first conductive pattern. The second conductive pattern is disposed on the first insulating layer. The second insulating layer is disposed on the second conductive pattern, and has a second contact window overlapping the first contact window and a third contact window overlapping the second conductive pattern. The third conductive pattern is disposed on the second insulating layer, and electrically connects the first conductive pattern and the second conductive pattern through the first contact window, the second contact window, and the third contact window. Multiple fan-out traces are provided in the fan-out area of the substrate, are electrically connected to multiple impedance adjustment structures, and are arranged on both sides of the virtual line. The area of the vertical projection of at least one of the first contact window and the third contact window of each impedance adjustment structure increases as the impedance adjustment structure moves away from the virtual line. A plurality of pads are disposed in the pad area of the substrate, and are electrically connected to a plurality of fan-out traces.

本發明的畫素陣列基板,包括基板、多個畫素結構、多條訊號線、多條扇出走線以及多個阻抗調整結構。基板具有依序排列的主動區、轉接區以及扇出區。多個畫素結構設置於基板的主動區。多條訊號線電性連接多個畫素結構,且由主動區延伸至 轉接區。多條扇出走線設置於基板的扇出區並電性連接於驅動元件。多條扇出走線在第一方向上依序排列。每一扇出走線具有阻抗,且多條扇出走線的阻抗沿著第一方向遞減。多個阻抗調整結構設置於基板的轉接區,且電性連接多條訊號線以及多條扇出走線。每一阻抗調整結構包括第一導電圖案、第一絕緣層、第二導電圖案、第二絕緣層以及第三導電圖案。第一導電圖案設置於基板上。第一絕緣層設置於第一導電圖案上,且具有重疊於第一導電圖案的第一接觸窗。第二導電圖案設置於第一絕緣層上。第二絕緣層設置於第二導電圖案上,且具有重疊於第一接觸窗的第二接觸窗以及重疊於第二導電圖案的第三接觸窗。第三導電圖案設置於第二絕緣層上,且透過第一接觸窗、第二接觸窗以及第三接觸窗電性連接第一導電圖案與第二導電圖案。每一阻抗調整結構的第一接觸窗與第三接觸窗其中至少一者的垂直投影的面積沿著第一方向的相反方向而遞增。 The pixel array substrate of the present invention includes a substrate, multiple pixel structures, multiple signal lines, multiple fan-out traces, and multiple impedance adjustment structures. The substrate has an active area, a transition area and a fan-out area arranged in sequence. Multiple pixel structures are disposed in the active area of the substrate. Multiple signal lines are electrically connected to multiple pixel structures and extend from the active area to Transit area. Multiple fan-out traces are provided in the fan-out area of the substrate and electrically connected to the driving element. Multiple fan-out traces are arranged in sequence in the first direction. Each fan-out trace has an impedance, and the impedance of multiple fan-out traces decreases along the first direction. Multiple impedance adjustment structures are provided in the transfer area of the substrate, and are electrically connected to multiple signal lines and multiple fan-out traces. Each impedance adjustment structure includes a first conductive pattern, a first insulating layer, a second conductive pattern, a second insulating layer, and a third conductive pattern. The first conductive pattern is disposed on the substrate. The first insulating layer is disposed on the first conductive pattern and has a first contact window overlapping the first conductive pattern. The second conductive pattern is disposed on the first insulating layer. The second insulating layer is disposed on the second conductive pattern, and has a second contact window overlapping the first contact window and a third contact window overlapping the second conductive pattern. The third conductive pattern is disposed on the second insulating layer, and electrically connects the first conductive pattern and the second conductive pattern through the first contact window, the second contact window, and the third contact window. The area of the vertical projection of at least one of the first contact window and the third contact window of each impedance adjustment structure increases along the opposite direction of the first direction.

基於上述,在本發明的實施例的畫素陣列基板中,連接於扇出走線及訊號線之間的阻抗調整結構,藉由各導電圖案間之接觸窗的大小及彼此間的距離調整,使對應不同扇出走線的阻抗調整結構具有不同的阻抗,以補償不同扇出走線之間的阻抗差異。藉此,上述畫素陣列基板的顯示裝置不易出現因阻抗差異造成之顯示不良(mura)的問題。 Based on the above, in the pixel array substrate of the embodiment of the present invention, the impedance adjustment structure connected between the fan-out wiring and the signal line is adjusted by the size of the contact window between the conductive patterns and the distance between each other. The impedance adjustment structures corresponding to different fan-out traces have different impedances to compensate for the difference in impedance between different fan-out traces. Therefore, the display device of the pixel array substrate is less prone to display mura problems due to impedance differences.

為讓本發明的上述特徵和優點能更明顯易懂,下文特舉 實施例,並配合所附圖式作詳細說明如下。 In order to make the above features and advantages of the present invention more obvious and understandable, The embodiments are described in detail in conjunction with the attached drawings as follows.

10、10A~10E:畫素陣列基板 10.10A~10E: Pixel array substrate

11:基板 11: substrate

11a:側邊 11a: side

12:電子元件 12: Electronic components

110:第一導電圖案 110: first conductive pattern

120、120A、120B:第二導電圖案 120, 120A, 120B: second conductive pattern

120op:開口 120op: opening

120s:側壁 120s: side wall

130、130A、130B:第三導電圖案 130, 130A, 130B: third conductive pattern

130a:第一導電部 130a: the first conductive part

130b:第二導電部 130b: Second conductive part

130c:第三導電部 130c: Third conductive part

140:第四導電圖案 140: fourth conductive pattern

210:第一絕緣層 210: first insulating layer

410、410-1、410-n:第一接觸窗 410, 410-1, 410-n: the first contact window

420、420-1、420-n:第二接觸窗 420, 420-1, 420-n: second contact window

430、430-1、430-n:第三接觸窗 430, 430-1, 430-n: third contact window

440、440-1、440-n:第四接觸窗 440, 440-1, 440-n: fourth contact window

450、450-1、450-n:第五接觸窗 450, 450-1, 450-n: fifth contact window

220:第二絕緣層 220: second insulating layer

AA:主動區 AA: Active area

BL:接墊區 BL: Pad area

BP:接墊 BP: pad

C:虛擬線 C: virtual line

D1、D2:方向 D1, D2: direction

FL、FL-1~FL-n、FL-n+1~FL-m、FLA、FLA-1~FLA-n、FLB、FLB-1~FLB-n、FLB-n+1~FLB-m:扇出走線 FL, FL-1~FL-n, FL-n+1~FL-m, FLA, FLA-1~FLA-n, FLB, FLB-1~FLB-n, FLB-n+1~FLB-m: Fan out trace

FLAa:第一導線 FLAa: first wire

FLAb:第二導線 FLAb: second wire

FO:扇出區 FO: Fan-out area

I:區域 I: area

L1、L1-1、L1-n:第一距離 L1, L1-1, L1-n: the first distance

L2、L2-1、L2-n:第二距離 L2, L2-1, L2-n: second distance

PE:畫素電極 PE: pixel electrode

PX:畫素結構 PX: pixel structure

300、300-1~300-n、300-n+1~300-m、300A-1~300A-n、300B-1~300B-n、300C-1~300C-n、300D-1~300D-n:阻抗調整結構 300, 300-1~300-n, 300-n+1~300-m, 300A-1~300A-n, 300B-1~300B-n, 300C-1~300C-n, 300D-1~300D- n: impedance adjustment structure

R1、R2、R1(1)、R1(n)、R2(1)、R2(n)、R1(m)、R2(m):阻抗 R1, R2, R1(1), R1(n), R2(1), R2(n), R1(m), R2(m): impedance

SLX、SLY、SLY1~SLYn、SLYn+1~SLYm:訊號線 SLX, SLY, SLY1~SLYn, SLYn+1~SLYm: signal line

T:主動元件 T: Active component

TR:轉接區 TR: transit area

W1、W1-1、W1-n:寬度 W1, W1-1, W1-n: width

圖1為本發明之第一實施例的畫素陣列基板的示意圖。 FIG. 1 is a schematic diagram of a pixel array substrate according to a first embodiment of the invention.

圖2為圖1之多條扇出走線的阻抗分布示意圖。 FIG. 2 is a schematic diagram of impedance distribution of multiple fan-out traces of FIG. 1.

圖3為圖1之多個阻抗調整結構的阻抗分布示意圖。 FIG. 3 is a schematic diagram of the impedance distribution of the multiple impedance adjustment structures of FIG. 1.

圖4為圖1之畫素陣列基板的局部區域I的放大示意圖。 FIG. 4 is an enlarged schematic view of the local area I of the pixel array substrate of FIG. 1.

圖5為圖4之一阻抗調整結構的示意圖。 FIG. 5 is a schematic diagram of an impedance adjustment structure of FIG. 4.

圖6為圖4之另一阻抗調整結構的示意圖。 6 is a schematic diagram of another impedance adjustment structure of FIG. 4.

圖7為圖5之阻抗調整結構的剖面示意圖。 7 is a schematic cross-sectional view of the impedance adjustment structure of FIG. 5.

圖8為本發明之第二實施例的畫素陣列基板的局部區域的放大示意圖。 8 is an enlarged schematic view of a partial area of a pixel array substrate according to a second embodiment of the invention.

圖9為圖8之一阻抗調整結構的示意圖。 9 is a schematic diagram of one of the impedance adjustment structures of FIG. 8.

圖10為圖8之另一阻抗調整結構的示意圖。 FIG. 10 is a schematic diagram of another impedance adjustment structure of FIG. 8.

圖11為圖9之阻抗調整結構的剖面示意圖。 11 is a schematic cross-sectional view of the impedance adjustment structure of FIG. 9.

圖12為本發明之第三實施例的畫素陣列基板的局部區域的放大示意圖。 12 is an enlarged schematic view of a partial area of a pixel array substrate according to a third embodiment of the invention.

圖13為圖12之一阻抗調整結構的示意圖。 13 is a schematic diagram of an impedance adjustment structure of FIG.

圖14為圖12之另一阻抗調整結構的示意圖。 14 is a schematic diagram of another impedance adjustment structure of FIG. 12.

圖15為本發明之第四實施例的畫素陣列基板的局部區域的 放大示意圖。 15 is a partial area of the pixel array substrate of the fourth embodiment of the present invention Enlarge the schematic.

圖16為圖15之一阻抗調整結構的示意圖。 FIG. 16 is a schematic diagram of an impedance adjustment structure of FIG. 15.

圖17為圖15之另一阻抗調整結構的示意圖。 17 is a schematic diagram of another impedance adjustment structure of FIG. 15.

圖18為圖16之阻抗調整結構的剖面示意圖。 18 is a schematic cross-sectional view of the impedance adjustment structure of FIG. 16.

圖19為本發明之第五實施例的畫素陣列基板的局部區域的放大示意圖。 19 is an enlarged schematic view of a partial area of a pixel array substrate of a fifth embodiment of the invention.

圖20為圖19之一阻抗調整結構的示意圖。 FIG. 20 is a schematic diagram of an impedance adjustment structure of FIG. 19.

圖21為圖19之另一阻抗調整結構的示意圖。 21 is a schematic diagram of another impedance adjustment structure of FIG. 19.

圖22為圖19之一阻抗調整結構的剖面示意圖。 22 is a schematic cross-sectional view of one of the impedance adjustment structures of FIG. 19.

圖23為本發明之第六實施例的畫素陣列基板的示意圖。 23 is a schematic diagram of a pixel array substrate according to a sixth embodiment of the invention.

圖24為圖23之多條扇出走線的阻抗分布示意圖。 FIG. 24 is a schematic diagram of impedance distribution of multiple fan-out traces of FIG. 23.

圖25為圖23之多個阻抗調整結構的阻抗分布示意圖。 FIG. 25 is a schematic diagram of the impedance distribution of the multiple impedance adjustment structures of FIG. 23.

現將詳細地參考本發明的示範性實施例,示範性實施例的實例說明於所附圖式中。只要有可能,相同元件符號在圖式和描述中用來表示相同或相似部分。 Reference will now be made in detail to exemplary embodiments of the present invention, examples of which are illustrated in the accompanying drawings. Wherever possible, the same element symbols are used in the drawings and description to denote the same or similar parts.

在附圖中,為了清楚起見,放大了層、膜、面板、區域等的厚度。在整個說明書中,相同的附圖標記表示相同的元件。應當理解,當諸如層、膜、區域或基板的元件被稱為在另一元件”上”或”連接到”另一元件時,其可以直接在另一元件上或與另 一元件連接,或者中間元件可以也存在。相反,當元件被稱為”直接在另一元件上”或”直接連接到”另一元件時,不存在中間元件。如本文所使用的,”連接”可以指物理及/或電性連接。再者,”電性連接”或”耦合”係可為二元件間存在其它元件。 In the drawings, the thickness of layers, films, panels, regions, etc., are exaggerated for clarity. Throughout the specification, the same reference numerals denote the same elements. It should be understood that when an element such as a layer, film, region, or substrate is referred to as being “on” or “connected to” another element, it can be directly on the other element or be connected to another element. An element is connected, or an intermediate element may also be present. In contrast, when an element is referred to as being "directly on" or "directly connected to" another element, there are no intervening elements present. As used herein, "connected" may refer to physical and/or electrical connections. Furthermore, "electrical connection" or "coupling" may be that there are other elements between the two elements.

本文使用的”約”、”近似”、或”實質上”包括所述值和在本領域普通技術人員確定的特定值的可接受的偏差範圍內的平均值,考慮到所討論的測量和與測量相關的誤差的特定數量(例如:測量系統及/或製程誤差的限制)。例如,”約”可以表示在所述值的一個或多個標準偏差內,或±30%、±20%、±10%、±5%內。再者,本文使用的“約”、”近似”或“實質上”可依光學性質、蝕刻性質或其它性質,來選擇較可接受的偏差範圍或標準偏差,而可不用一個標準偏差適用全部性質。 As used herein, "about", "approximately", or "substantially" includes the stated value and the average value within an acceptable deviation range for a particular value determined by one of ordinary skill in the art, taking into account the measurements and A specific amount of measurement-related errors (eg, measurement system and/or process error limits). For example, "about" may mean within one or more standard deviations of the stated value, or within ±30%, ±20%, ±10%, ±5%. Furthermore, as used herein, "about", "approximately", or "substantially" can be based on optical properties, etching properties, or other properties to select a more acceptable range of deviation or standard deviation, and one standard deviation can be applied to all properties .

除非另有定義,本文使用的所有術語(包括技術和科學術語)具有與本發明所屬領域的普通技術人員通常理解的相同的含義。將進一步理解的是,諸如在通常使用的字典中定義的那些術語應當被解釋為具有與它們在相關技術和本發明的上下文中的含義一致的含義,並且將不被解釋為理想化的或過度正式的意義,除非本文中明確地這樣定義。 Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by those of ordinary skill in the art to which this invention belongs. It will be further understood that terms such as those defined in commonly used dictionaries should be interpreted as having meanings consistent with their meanings in the context of the relevant technology and the present invention, and will not be interpreted as idealized or excessive Formal meaning unless explicitly defined as such in this article.

圖1為本發明之第一實施例的畫素陣列基板的示意圖。圖2為圖1之多條扇出走線的阻抗分布示意圖。圖3為圖1之多個阻抗調整結構的阻抗分布示意圖。為清楚呈現起見,圖1簡化 了圖4中阻抗調整結構300及扇出走線FL,而圖1未繪示圖4之阻抗調整結構300的細部結構(例如:第一接觸窗410、第三接觸窗430等)以及圖4之部分扇出走線FL的細部結構(例如:扇出走線FL-n的彎折段)。 FIG. 1 is a schematic diagram of a pixel array substrate according to a first embodiment of the invention. FIG. 2 is a schematic diagram of impedance distribution of multiple fan-out traces of FIG. 1. FIG. 3 is a schematic diagram of the impedance distribution of the multiple impedance adjustment structures of FIG. 1. For clarity, Figure 1 is simplified 4 illustrates the impedance adjustment structure 300 and the fan-out trace FL, and FIG. 1 does not show the detailed structure of the impedance adjustment structure 300 of FIG. 4 (eg, the first contact window 410, the third contact window 430, etc.) and FIG. Detail structure of the partial fan-out trace FL (for example: the bent section of the fan-out trace FL-n).

請參照圖1,在本實施例中,畫素陣列基板10包括基板11及多條訊號線SLX、SLY。基板11具有依序排列的主動區AA、轉接區TR、扇出區FO以及接墊區BL。多條訊號線SLY由基板11的主動區AA延伸至轉接區TR。舉例而言,在本實施例中,多條訊號線SLX例如是多條掃描線(scan line),多條訊號線SLY例如是多條資料線(data line),但本發明不限於此,根據其他的實施例,多條訊號線SLX也可以是多條資料線,而多條訊號線SLY也可以是多條掃描線。 Please refer to FIG. 1. In this embodiment, the pixel array substrate 10 includes a substrate 11 and a plurality of signal lines SLX and SLY. The substrate 11 has an active area AA, a transition area TR, a fan-out area FO and a pad area BL arranged in this order. The multiple signal lines SLY extend from the active area AA of the substrate 11 to the transition area TR. For example, in this embodiment, the multiple signal lines SLX are, for example, multiple scan lines, and the multiple signal lines SLY are, for example, multiple data lines, but the present invention is not limited to this. In other embodiments, the multiple signal lines SLX may also be multiple data lines, and the multiple signal lines SLY may also be multiple scan lines.

在本實施例中,多條訊號線SLX在方向D2上依序排列於基板11的主動區AA,且多條訊號線SLX在方向D1上延伸。多條訊號線SLY包括在方向D1上依序排列於基板11之主動區AA的多條訊號線SLY1~SLYn、SLYn+1~SLYm,且多條訊號線SLY在方向D2上延伸,其中n、m為正整數,且n小於m。方向D1與方向D2交錯。舉例而言,在本實施例中,方向D1實質上垂直於方向D2,但本發明不以此為限。 In this embodiment, a plurality of signal lines SLX are sequentially arranged in the active area AA of the substrate 11 in the direction D2, and a plurality of signal lines SLX extend in the direction D1. The plurality of signal lines SLY includes a plurality of signal lines SLY1~SLYn, SLYn+1~SLYm sequentially arranged in the active area AA of the substrate 11 in the direction D1, and the plurality of signal lines SLY extend in the direction D2, where n, m is a positive integer, and n is less than m. The direction D1 is interleaved with the direction D2. For example, in this embodiment, the direction D1 is substantially perpendicular to the direction D2, but the invention is not limited thereto.

在本實施例中,畫素陣列基板10更包括多個畫素結構PX,設置於基板11的主動區AA。每一畫素結構PX具有主動元 件T及電性連接至主動元件T的畫素電極PE。詳細而言,每一畫素結構PX的主動元件T分別與對應的一條訊號線SLX及對應的一條訊號線SLY電性連接。在本實施例中,畫素結構PX的主動元件T可以是頂部閘極型薄膜電晶體(top-gate TFT)。然而,本發明不以此為限,根據其他的實施例,畫素結構PX的主動元件T也可是底部閘極型薄膜電晶體(bottom-gate TFT)或其他適當型式的薄膜電晶體。在本實施例中,畫素電極PE例如是穿透式電極,而穿透式電極的材質包括金屬氧化物,例如:銦錫氧化物、銦鋅氧化物、鋁錫氧化物、鋁鋅氧化物、或其他合適的氧化物、或者是上述至少兩者之堆疊層。然而,本發明不限於此,在其他實施例中,畫素電極PE也可以是反射式電極、或反射式電極與穿透式電極的組合。 In this embodiment, the pixel array substrate 10 further includes a plurality of pixel structures PX, which are disposed in the active area AA of the substrate 11. Each pixel structure PX has an active element The element T and the pixel electrode PE electrically connected to the active element T. In detail, the active element T of each pixel structure PX is electrically connected to a corresponding signal line SLX and a corresponding signal line SLY, respectively. In this embodiment, the active element T of the pixel structure PX may be a top-gate thin film transistor (top-gate TFT). However, the present invention is not limited to this. According to other embodiments, the active element T of the pixel structure PX may also be a bottom-gate thin film transistor (bottom-gate TFT) or other suitable types of thin film transistors. In this embodiment, the pixel electrode PE is, for example, a transmissive electrode, and the material of the transmissive electrode includes metal oxides, such as indium tin oxide, indium zinc oxide, aluminum tin oxide, aluminum zinc oxide , Or other suitable oxides, or a stacked layer of at least two of the above. However, the present invention is not limited to this. In other embodiments, the pixel electrode PE may also be a reflective electrode, or a combination of a reflective electrode and a transmissive electrode.

在本實施例中,畫素陣列基板10更包括多條扇出走線FL,設置於基板11的扇出區FO,且朝扇出區FO的兩側延伸至接墊區BL及轉接區TR。多條扇出走線FL沿方向D1依序排列於基板11的扇出區FO。扇出區FO可具有一虛擬線C;更詳而言之,在本實施例中,與一個電子元件12電性連接的多條扇出走線FL-1~FL-m可選擇性地具有一虛擬線C;也就是說,多條扇出走線FL-1~FL-m是排列於一虛擬線C的兩側。在一實施例中,扇出走線FL-1~FL-m可選擇性地對虛擬線C呈鏡像排列,但不以此為限。在本實施例中,與一個電子元件12電性連接的多條扇出走線 FL-1~FL-m的數量可選擇性地為偶數,而扇出走線FL-1~Fn及FLn+1~Fm可對稱地設置於虛擬線C的兩側。然而,本發明不以此為限,根據另一實施例,與一個電子元件12電性連接的多條扇出走線FL-1~FL-m的數量也可以是奇數;根據又一實施例,與一個電子元件12電性連接的扇出走線FL-1~FL-m也可以非對稱的方式排列,以下將於後續段落配合其它圖式舉例說明之。 In this embodiment, the pixel array substrate 10 further includes a plurality of fan-out traces FL, which are disposed in the fan-out area FO of the substrate 11 and extend to the pad area BL and the transfer area TR toward both sides of the fan-out area FO . A plurality of fan-out traces FL are sequentially arranged in the fan-out area FO of the substrate 11 along the direction D1. The fan-out area FO may have a virtual line C; more specifically, in this embodiment, a plurality of fan-out traces FL-1~FL-m electrically connected to one electronic component 12 may optionally have a Virtual line C; that is to say, multiple fan-out traces FL-1~FL-m are arranged on both sides of a virtual line C. In one embodiment, the fan-out traces FL-1~FL-m can selectively mirror the virtual line C, but not limited to this. In this embodiment, multiple fan-out traces electrically connected to one electronic component 12 The number of FL-1~FL-m can be optionally even, and the fan-out traces FL-1~Fn and FLn+1~Fm can be symmetrically arranged on both sides of the virtual line C. However, the invention is not limited to this. According to another embodiment, the number of the plurality of fan-out traces FL-1~FL-m electrically connected to one electronic component 12 may also be an odd number; according to another embodiment, The fan-out traces FL-1~FL-m electrically connected to an electronic component 12 can also be arranged in an asymmetrical manner. The following paragraphs will illustrate with other drawings.

請參照圖1及圖2,在本實施例中,多條扇出走線FL於扇出區FO的延伸長度彼此不同,且具有不同的阻抗R1。舉例而言,扇出走線FL的延伸長度隨著扇出走線FL遠離虛擬線C而增加,其中離虛擬線C最遠的扇出走線FL-1(或扇出走線FL-m),因其延伸長度最長而具有最大的阻抗R1(1);離虛擬線C最近的扇出走線FL-n(或扇出走線FL-n+1、或在虛擬線C上的扇出走線),因其延伸長度最短而具有最小的阻抗R1(n),但本發明不以此為限。在本實施例中,遠離虛擬線C且對虛擬線C呈對稱的扇出走線FL-1及扇出走線FL-m具有實質上相等的阻抗R1(1),鄰近虛擬線C且對虛擬線C呈對稱的扇出走線FL-n及扇出走線FL-n+1具有實質上相等的阻抗R1(n),其中R1(n)-R1(1)=-△R;位於扇出走線FL-1及扇出走線FL-n(或扇出走線FL-n+1及扇出走線FL-m)之間的扇出走線FL的阻抗R1與扇出走線FL遠離虛擬線C的程度呈現一正相關;在本實施例中是以一線性正相關(positive linear relationship)呈現,但本發明不以此為限,在其他實施例中,可 以一曲線性正相關呈現。 Please refer to FIGS. 1 and 2. In this embodiment, the extension lengths of the plurality of fan-out traces FL in the fan-out area FO are different from each other, and have different impedances R1. For example, the extension length of the fan-out trace FL increases as the fan-out trace FL moves away from the virtual line C, where the fan-out trace FL-1 (or fan-out trace FL-m) farthest from the virtual line C is due to The longest extension has the largest impedance R1(1); the fan-out trace FL-n (or fan-out trace FL-n+1 or fan-out trace on virtual line C) closest to virtual line C, because of its The extension length is the shortest and has the smallest impedance R1(n), but the invention is not limited thereto. In this embodiment, the fan-out trace FL-1 and the fan-out trace FL-m, which are far from the virtual line C and symmetrical to the virtual line C, have substantially equal impedance R1(1), and are adjacent to the virtual line C and opposite the virtual line C is symmetrical fan-out trace FL-n and fan-out trace FL-n+1 have substantially equal impedance R1(n), where R1(n)-R1(1)=-△R; located in fan-out trace FL The impedance R1 of the fan-out trace FL between -1 and the fan-out trace FL-n (or fan-out trace FL-n+1 and fan-out trace FL-m) and the degree of the fan-out trace FL away from the virtual line C show a Positive correlation; in this embodiment, a positive linear relationship (positive linear relationship) is presented, but the present invention is not limited to this, in other embodiments, may Presented with a curvilinear positive correlation.

在本實施例中,基於導電性的考量,訊號線SLX、訊號線SLY及扇出走線FL的材料一般是使用金屬材料。然而,本發明不以此為限,根據其他的實施例,訊號線SLX、訊號線SLY及扇出走線FL也可使用其他導電材料,例如:合金、金屬材料的氮化物、金屬材料的氧化物、金屬材料的氮氧化物、或其他合適的材料、或是金屬材料與其他導電材料的堆疊層。 In this embodiment, based on the consideration of conductivity, the materials of the signal line SLX, the signal line SLY, and the fan-out trace FL are generally metal materials. However, the present invention is not limited to this. According to other embodiments, the signal line SLX, the signal line SLY, and the fan-out trace FL can also use other conductive materials, such as alloys, nitrides of metal materials, and oxides of metal materials. , Nitrogen oxides of metal materials, or other suitable materials, or stacked layers of metal materials and other conductive materials.

請參照圖1,在本實施例中,畫素陣列基板10更包括多個阻抗調整結構300,設置於基板11的轉接區TR。多個阻抗調整結構300電性連接於多條訊號線SLY及多條扇出走線FL之間。具體而言,在本實施例中,多個阻抗調整結構300沿方向D1依序排列於轉接區TR,且每一阻抗調整結構300分別與對應的一條訊號線SLY及對應的一條扇出走線FL電性連接。舉例而言,阻抗調整結構300-1連接於扇出走線FL-1與訊號線SLY1之間,阻抗調整結構300-2連接於扇出走線FL-2與訊號線SLY2之間,阻抗調整結構300-n連接於扇出走線FL-n與訊號線SLYn之間,但本發明不以此為限。 Please refer to FIG. 1. In this embodiment, the pixel array substrate 10 further includes a plurality of impedance adjustment structures 300 disposed in the transition region TR of the substrate 11. The multiple impedance adjustment structures 300 are electrically connected between the multiple signal lines SLY and the multiple fan-out traces FL. Specifically, in this embodiment, a plurality of impedance adjustment structures 300 are sequentially arranged in the transition area TR along the direction D1, and each impedance adjustment structure 300 is respectively associated with a corresponding signal line SLY and a corresponding fan-out trace FL is electrically connected. For example, the impedance adjustment structure 300-1 is connected between the fan-out trace FL-1 and the signal line SLY1, the impedance adjustment structure 300-2 is connected between the fan-out trace FL-2 and the signal line SLY2, and the impedance adjustment structure 300 -n is connected between the fan-out trace FL-n and the signal line SLYn, but the invention is not limited to this.

請參照圖1及圖3,在本實施例中,多個阻抗調整結構300具有不同大小的阻抗R2。舉例而言,阻抗調整結構300的阻抗R2隨著阻抗調整結構300遠離虛擬線C而減少,其中離虛擬線C最遠的阻抗調整結構300-1(或阻抗調整結構300-m)具有最小 的阻抗R2(1),離虛擬線C最近的阻抗調整結構300-n(或阻抗調整結構300-n+1、或在虛擬線C上的阻抗調整結構)具有最大的阻抗R2(n),但本發明不以此為限。在本實施例中,離虛擬線C最遠且對虛擬線C呈對稱的阻抗調整結構300-1及阻抗調整結構300-m具有實質上相等的阻抗R2(1),離虛擬線C最近的阻抗調整結構300-n及阻抗調整結構300-n+1具有實質上相等的阻抗R2(n),其中R2(n)-R2(1)=△R;位於阻抗調整結構300-1及阻抗調整結構300-n(或阻抗調整結構300-n+1及阻抗調整結構300-m)之間的阻抗調整結構300的阻抗R2與阻抗調整結構300遠離虛擬線C的程度呈現一負相關;在本實施例中是以一線性負相關(negative linear relationship)呈現,但本發明不以此為限,在其他實施例中,可以一曲線性負相關呈現。 Please refer to FIGS. 1 and 3. In this embodiment, the multiple impedance adjustment structures 300 have different sizes of impedance R2. For example, the impedance R2 of the impedance adjustment structure 300 decreases as the impedance adjustment structure 300 moves away from the virtual line C, where the impedance adjustment structure 300-1 (or the impedance adjustment structure 300-m) farthest from the virtual line C has the smallest The impedance R2(1), the impedance adjustment structure 300-n closest to the virtual line C (or the impedance adjustment structure 300-n+1, or the impedance adjustment structure on the virtual line C) has the largest impedance R2(n), However, the invention is not limited to this. In this embodiment, the impedance adjustment structure 300-1 and the impedance adjustment structure 300-m which are farthest from the virtual line C and symmetrical to the virtual line C have substantially equal impedance R2(1), and the closest to the virtual line C Impedance adjustment structure 300-n and impedance adjustment structure 300-n+1 have substantially equal impedance R2(n), where R2(n)-R2(1)=△R; located in impedance adjustment structure 300-1 and impedance adjustment The impedance R2 of the impedance adjustment structure 300 between the structure 300-n (or the impedance adjustment structure 300-n+1 and the impedance adjustment structure 300-m) and the degree of the impedance adjustment structure 300 away from the virtual line C show a negative correlation; In the embodiment, a negative linear relationship is presented, but the invention is not limited to this. In other embodiments, a negative curve relationship may be presented.

請參照圖1、圖2及圖3,在本實施例中,畫素陣列基板10的每一扇出走線FL與對應的一個阻抗調整結構300的阻抗總和R1+R2實質上相等。舉例而言,連接於彼此的扇出走線FL-1及阻抗調整結構300-1(或連接於彼此的扇出走線FL-m及阻抗調整結構300-m)的阻抗總和R1(1)+R2(1)實質上等於連接於彼此的扇出走線FL-n及阻抗調整結構300-n(或連接於彼此的扇出走線FL-n+1及阻抗調整結構300-n+1)的阻抗總和R1(n)+R2(n),即R1(n)+R2(n)=(R1(1)-△R)+(△R+R2(1))=R1(1)+R2(1)。因此,透過阻抗調整結構300的設置能補償多條扇出走線FL之間的阻抗差 異,以改善因扇出走線FL的阻抗差異所造成的顯示不良(mura)問題。 Please refer to FIGS. 1, 2 and 3. In this embodiment, each fan-out trace FL of the pixel array substrate 10 and the impedance sum R1+R2 of a corresponding impedance adjustment structure 300 are substantially equal. For example, the sum of the impedance R1(1)+R2 of the fan-out trace FL-1 and the impedance adjustment structure 300-1 (or the fan-out trace FL-m and the impedance adjustment structure 300-m connected to each other) connected to each other (1) Substantially equal to the sum of the impedances of the fan-out traces FL-n and the impedance adjustment structure 300-n connected to each other (or the fan-out traces FL-n+1 and the impedance adjustment structure 300-n+1 connected to each other) R1(n)+R2(n), namely R1(n)+R2(n)=(R1(1)-△R)+(△R+R2(1))=R1(1)+R2(1) . Therefore, the impedance adjustment structure 300 can compensate for the impedance difference between the fan-out traces FL In order to improve the problem of mura caused by the impedance difference of the fan-out trace FL.

請參照圖1,在本實施例中,畫素陣列基板10更包括多個接墊BP,沿方向D1依序排列於基板11的接墊區BL,且電性連接多條扇出走線FL。舉例而言,在本實施例中,畫素陣列基板10更包括多個電子元件12,沿方向D1依序設置於基板11的一側邊11a,且透過與多個接墊BP的接合,電性連接至多條扇出走線FL。 Referring to FIG. 1, in this embodiment, the pixel array substrate 10 further includes a plurality of pads BP, which are sequentially arranged in the pad area BL of the substrate 11 along the direction D1, and are electrically connected to a plurality of fan-out traces FL. For example, in the present embodiment, the pixel array substrate 10 further includes a plurality of electronic components 12, which are sequentially arranged on one side 11a of the substrate 11 along the direction D1, and through the bonding with the plurality of pads BP, the Sexually connected to multiple fan-out traces FL.

在本實施例中,接墊BP的材料一般是使用金屬材料,但本發明不以此為限。根據其他的實施例,接墊BP也可使用其他導電材料,例如:合金、金屬材料的氮化物、金屬材料的氧化物、金屬材料的氮氧化物、或其他合適的材料、或是金屬材料與其他導電材料的堆疊層。在本實施例中,電子元件12例如包括軟性電路板(flexible printed circuit board),電子元件12更可選擇性地包括驅動晶片而為一驅動元件,所述驅動元件可以覆晶薄膜封裝(chip on film,COF)的方式將驅動晶片整合至軟性電路板。然而,本發明不以此為限,根據其他的實施例,驅動晶片也可利用捲帶式接合(Tape Automated Bonding,TAB)技術整合至軟性電路板,也就是說,軟性電路板也可採用捲帶式封裝(Tape Carrier Package,TCP)。需說明的是,本發明並不限制電子元件12一定要包括驅動晶片,根據其他的實施例,電子元件12也可以是不具 有驅動晶片的軟性電路板。 In this embodiment, the material of the pad BP is generally a metal material, but the invention is not limited thereto. According to other embodiments, the pad BP may also use other conductive materials, such as alloys, nitrides of metal materials, oxides of metal materials, oxides of metal materials, or other suitable materials, or metal materials and Stacked layers of other conductive materials. In this embodiment, the electronic component 12 includes, for example, a flexible printed circuit board, and the electronic component 12 may optionally include a driving chip to be a driving component, and the driving component may be packaged on a chip on chip film, COF) to integrate the driver chip into the flexible circuit board. However, the present invention is not limited to this. According to other embodiments, the driver chip can also be integrated into the flexible circuit board using tape automated bonding (TAB) technology, that is, the flexible circuit board can also be rolled Tape Carrier Package (TCP). It should be noted that the present invention does not limit that the electronic component 12 must include a driver chip. According to other embodiments, the electronic component 12 may not include There is a flexible circuit board that drives the chip.

以下將針對阻抗調整結構300的不同實施方式進行說明,其他相同或相似的構件以相同或相似的符號表示,並省略了相同技術內容的說明。關於省略部分的說明可參考第一實施例,以下說明將不再重述。 Hereinafter, different embodiments of the impedance adjustment structure 300 will be described, and other identical or similar components are denoted by the same or similar symbols, and the description of the same technical content is omitted. The description of the omitted parts can refer to the first embodiment, and the following description will not be repeated.

圖4為圖1之畫素陣列基板的局部區域I的放大示意圖。圖5為圖4之一阻抗調整結構的示意圖。圖6為圖4之另一阻抗調整結構的示意圖。圖7為圖5之阻抗調整結構的剖面示意圖。特別是,圖5及圖6可分別對應於圖4中的阻抗調整結構300-1及阻抗調整結構300-n。圖7可對應於圖5的剖線A-A’。 FIG. 4 is an enlarged schematic view of the local area I of the pixel array substrate of FIG. 1. FIG. 5 is a schematic diagram of an impedance adjustment structure of FIG. 4. 6 is a schematic diagram of another impedance adjustment structure of FIG. 4. 7 is a schematic cross-sectional view of the impedance adjustment structure of FIG. 5. In particular, FIGS. 5 and 6 may correspond to the impedance adjustment structure 300-1 and the impedance adjustment structure 300-n in FIG. 4, respectively. Fig. 7 may correspond to the section line A-A' of Fig. 5.

請參照圖4、圖5及圖7,在本實施例中,連接於訊號線SLY及扇出走線FL之間的每一阻抗調整結構300包括第一導電圖案110、第一絕緣層210及第二導電圖案120。第一導電圖案110設置於基板11上,且電性連接於對應的一條扇出走線FL。第一絕緣層210設置於第一導電圖案110上,且具有重疊於第一導電圖案110的第一接觸窗410。第二導電圖案120設置於第一絕緣層210上,且電性連接於對應的一條訊號線SLY。舉例而言,在本實施例中,第二導電圖案120可重疊於部分的第一導電圖案110,但本發明不以此為限。 Referring to FIGS. 4, 5 and 7, in this embodiment, each impedance adjustment structure 300 connected between the signal line SLY and the fan-out trace FL includes a first conductive pattern 110, a first insulating layer 210 and a second Second conductive pattern 120. The first conductive pattern 110 is disposed on the substrate 11 and electrically connected to a corresponding fan-out trace FL. The first insulating layer 210 is disposed on the first conductive pattern 110 and has a first contact window 410 overlapping the first conductive pattern 110. The second conductive pattern 120 is disposed on the first insulating layer 210 and is electrically connected to a corresponding signal line SLY. For example, in this embodiment, the second conductive pattern 120 may overlap a portion of the first conductive pattern 110, but the invention is not limited thereto.

在本實施例中,每一阻抗調整結構300更包括第二絕緣層220及第三導電圖案130。第二絕緣層220設置於第二導電圖案 120上,且具有重疊於第一接觸窗410的第二接觸窗420以及重疊於第二導電圖案120的第三接觸窗430。第三導電圖案130設置於第二絕緣層220上,且透過第一接觸窗410、第二接觸窗420以及第三接觸窗430電性連接第一導電圖案110與第二導電圖案120。舉例而言,在本實施例中,第一絕緣層210的第一接觸窗410與第二絕緣層220的第二接觸窗420切齊,第三導電圖案130透過第一接觸窗410及第二接觸窗420電性連接第一導電圖案110,第三導電圖案130透過第二絕緣層220的第三接觸窗430電性連接第二導電圖案120,但本發明不以此為限。 In this embodiment, each impedance adjustment structure 300 further includes a second insulating layer 220 and a third conductive pattern 130. The second insulating layer 220 is disposed on the second conductive pattern 120, and has a second contact window 420 overlapping the first contact window 410 and a third contact window 430 overlapping the second conductive pattern 120. The third conductive pattern 130 is disposed on the second insulating layer 220, and is electrically connected to the first conductive pattern 110 and the second conductive pattern 120 through the first contact window 410, the second contact window 420, and the third contact window 430. For example, in this embodiment, the first contact window 410 of the first insulating layer 210 is aligned with the second contact window 420 of the second insulating layer 220, and the third conductive pattern 130 passes through the first contact window 410 and the second The contact window 420 is electrically connected to the first conductive pattern 110, and the third conductive pattern 130 is electrically connected to the second conductive pattern 120 through the third contact window 430 of the second insulating layer 220, but the invention is not limited thereto.

請參照圖4、圖5及圖6,在本實施例中,每一阻抗調整結構300的第一接觸窗410與第三接觸窗430中的至少一者於基板11上之垂直投影的面積隨著阻抗調整結構300遠離虛擬線C而增加。舉例而言,連接於訊號線SLY1及扇出走線FL-1之間的阻抗調整結構300-1(即遠離虛擬線C的阻抗調整結構)的第一接觸窗410-1及第三接觸窗430-1於基板11上之垂直投影的面積分別大於連接於訊號線SLYn及扇出走線FL-n之間的阻抗調整結構300-n(即鄰近虛擬線C的阻抗調整結構)的第一接觸窗410-n及第三接觸窗430-n於基板11上之垂直投影的面積,但本發明不以此為限。 4, 5 and 6, in this embodiment, the area of the vertical projection of at least one of the first contact window 410 and the third contact window 430 of each impedance adjustment structure 300 on the substrate 11 varies The impedance adjustment structure 300 increases away from the virtual line C. For example, the first contact window 410-1 and the third contact window 430 of the impedance adjustment structure 300-1 (that is, the impedance adjustment structure away from the virtual line C) connected between the signal line SLY1 and the fan-out trace FL-1 -1 The area of the vertical projection on the substrate 11 is larger than the first contact window of the impedance adjustment structure 300-n (that is, the impedance adjustment structure adjacent to the virtual line C) connected between the signal line SLYn and the fan-out trace FL-n The area of the vertical projection of 410-n and the third contact window 430-n on the substrate 11, but the invention is not limited thereto.

在本實施例中,每一阻抗調整結構300的第一接觸窗410於基板11上的垂直投影與第三接觸窗430於基板11上的垂直投 影具有第一距離L1,且第一距離L1隨著阻抗調整結構300遠離虛擬線C而減少。具體而言,在本實施例中,連接於訊號線SLY1及扇出走線FL-1之間的阻抗調整結構300-1(即遠離虛擬線C的阻抗調整結構)的第一接觸窗410-1及第三接觸窗430-1於基板11上的兩垂直投影之間的第一距離L1-1小於連接於訊號線SLYn及扇出走線FL-n之間的阻抗調整結構300-n(即鄰近虛擬線C的阻抗調整結構)的第一接觸窗410-n及第三接觸窗430-n於基板11上的兩垂直投影之間的第一距離L1-n。 In this embodiment, the vertical projection of the first contact window 410 of each impedance adjustment structure 300 on the substrate 11 and the vertical projection of the third contact window 430 on the substrate 11 The shadow has a first distance L1, and the first distance L1 decreases as the impedance adjustment structure 300 moves away from the virtual line C. Specifically, in this embodiment, the first contact window 410-1 of the impedance adjustment structure 300-1 (ie, the impedance adjustment structure away from the virtual line C) connected between the signal line SLY1 and the fan-out trace FL-1 The first distance L1-1 between the two vertical projections of the third contact window 430-1 on the substrate 11 is smaller than the impedance adjustment structure 300-n (i.e., adjacent to the signal line SLYn and the fan-out trace FL-n The first contact window 410-n and the third contact window 430-n of the impedance adjustment structure of the virtual line C) are the first distance L1-n between two vertical projections on the substrate 11.

在本實施例中,每一阻抗調整結構300的第二接觸窗420(或第一接觸窗410)及第三接觸窗430在方向D1上排列。也就是說,每一阻抗調整結構300的第一接觸窗410於基板11上的垂直投影與第三接觸窗430於基板11上的垂直投影在方向D1上具有第一距離L1,但本發明不以此為限。 In this embodiment, the second contact window 420 (or the first contact window 410) and the third contact window 430 of each impedance adjustment structure 300 are arranged in the direction D1. That is to say, the vertical projection of the first contact window 410 on the substrate 11 of each impedance adjustment structure 300 and the vertical projection of the third contact window 430 on the substrate 11 have a first distance L1 in the direction D1, but the invention does not This is the limit.

在本實施例中,相較於鄰近虛擬線C的阻抗調整結構300-n,遠離虛擬線C的阻抗調整結構300-1的第一接觸窗410-1及第三接觸窗430-1於基板11上的兩垂直投影具有較大的面積,且兩垂直投影的間距(即第一距離L1-1)較小,使得遠離虛擬線C之阻抗調整結構300-1的阻抗R2(1)小於鄰近虛擬線C之阻抗調整結構300-n的阻抗R2(n)。也就是說,阻抗調整結構300-1~300-n中的任一者可根據其遠離虛擬線C的程度,調整第一接觸窗410及第三接觸窗430於基板11上的垂直投影之面積大小與間距(即 第一距離L1),使其具有如圖3所示的阻抗R2分佈。 In this embodiment, compared to the impedance adjustment structure 300-n adjacent to the virtual line C, the first contact window 410-1 and the third contact window 430-1 of the impedance adjustment structure 300-1 far from the virtual line C are on the substrate The two vertical projections on 11 have a larger area, and the distance between the two vertical projections (that is, the first distance L1-1) is smaller, so that the impedance R2(1) of the impedance adjustment structure 300-1 away from the virtual line C is smaller than the adjacent The impedance adjustment structure 300-n of the virtual line C has an impedance R2(n). In other words, any one of the impedance adjusting structures 300-1~300-n can adjust the area of the vertical projection of the first contact window 410 and the third contact window 430 on the substrate 11 according to the degree of being away from the virtual line C Size and spacing (ie The first distance L1) makes it have the impedance R2 distribution as shown in FIG. 3.

舉例而言,在本實施例中,阻抗調整結構300的第一導電圖案110與訊號線SLX可選擇性地屬於同一膜層,第二導電圖案120與訊號線SLY可選擇性地屬於同一膜層,第三導電圖案130與畫素電極PE可選擇性地屬於同一膜層,以避免生產成本因阻抗調整結構300的設置而增加,但本發明不以此為限。特別一提的是,在本實施例中,第三導電圖案130(例如是銦錫氧化物)的電阻率(electrical resistivity)可大於第一導電圖案110(例如是金屬)及第二導電圖案120(例如是金屬)的電阻率,藉由調整電阻率大的第三導電圖案130之主要部的長度(即第一距離L1)能增加阻抗調整結構300之阻抗R2的調整裕度。然而,本發明不限於此,根據其他的實施例,第三導電圖案130的電阻率也可小於或等於第一導電圖案110及第二導電圖案120的電阻率。 For example, in this embodiment, the first conductive pattern 110 of the impedance adjustment structure 300 and the signal line SLX can selectively belong to the same film layer, and the second conductive pattern 120 and the signal line SLY can selectively belong to the same film layer The third conductive pattern 130 and the pixel electrode PE can selectively belong to the same film layer to avoid an increase in production cost due to the arrangement of the impedance adjustment structure 300, but the invention is not limited to this. In particular, in this embodiment, the electrical resistivity of the third conductive pattern 130 (eg, indium tin oxide) may be greater than that of the first conductive pattern 110 (eg, metal) and the second conductive pattern 120 By adjusting the resistivity of the metal (for example, metal), the adjustment margin of the impedance R2 of the impedance adjustment structure 300 can be increased by adjusting the length (ie, the first distance L1) of the main portion of the third conductive pattern 130 having a large resistivity. However, the present invention is not limited to this. According to other embodiments, the resistivity of the third conductive pattern 130 may also be less than or equal to that of the first conductive pattern 110 and the second conductive pattern 120.

在本實施例中,第一導電圖案110及第二導電圖案120的材料包括金屬材料、金屬材料的氮化物、金屬材料的氧化物、金屬材料的氮氧化物、合金、或其他合適的材料、或是金屬材料與其他導電材料的堆疊層。第三導電圖案130的材料包括金屬氧化物,例如:銦錫氧化物、銦鋅氧化物、鋁錫氧化物、鋁鋅氧化物、或其他合適的氧化物、或者是上述至少兩者之堆疊層。然而,本發明不限於此,根據其他的實施例,第三導電圖案130的材料也可以是金屬材料、金屬材料的氮化物、金屬材料的氧化物、金 屬材料的氮氧化物、合金、或其他合適的材料、或是金屬材料與其他導電材料的堆疊層。在本實施例中,第一絕緣層210及第二絕緣層220的材料包括無機材料(例如:氧化矽、氮化矽、氮氧化矽、其他合適的材料、或上述至少二種材料的堆疊層)、有機材料、或其他合適的材料、或上述之組合。 In this embodiment, the materials of the first conductive pattern 110 and the second conductive pattern 120 include metal materials, nitrides of metal materials, oxides of metal materials, oxynitrides of metal materials, alloys, or other suitable materials, Or a stack of metal materials and other conductive materials. The material of the third conductive pattern 130 includes metal oxides, such as indium tin oxide, indium zinc oxide, aluminum tin oxide, aluminum zinc oxide, or other suitable oxides, or a stacked layer of at least two of the above . However, the present invention is not limited to this. According to other embodiments, the material of the third conductive pattern 130 may also be a metal material, a nitride of a metal material, an oxide of a metal material, or gold Nitrogen oxides, alloys, or other suitable materials, or stacked layers of metallic materials and other conductive materials. In this embodiment, the materials of the first insulating layer 210 and the second insulating layer 220 include inorganic materials (for example: silicon oxide, silicon nitride, silicon oxynitride, other suitable materials, or stacked layers of at least two materials ), organic materials, or other suitable materials, or a combination of the above.

圖8為本發明之第二實施例的畫素陣列基板10A的局部區域的放大示意圖。圖9為圖8之一阻抗調整結構的示意圖。圖10為圖8之另一阻抗調整結構的示意圖。圖11為圖9之阻抗調整結構的剖面示意圖。特別是,圖9及圖10可分別對應於圖8的阻抗調整結構300A-1及阻抗調整結構300A-n。圖11可對應於圖9的剖線B-B’。 8 is an enlarged schematic view of a partial area of the pixel array substrate 10A of the second embodiment of the invention. 9 is a schematic diagram of one of the impedance adjustment structures of FIG. 8. FIG. 10 is a schematic diagram of another impedance adjustment structure of FIG. 8. 11 is a schematic cross-sectional view of the impedance adjustment structure of FIG. 9. In particular, FIGS. 9 and 10 may correspond to the impedance adjustment structure 300A-1 and the impedance adjustment structure 300A-n of FIG. 8, respectively. Fig. 11 may correspond to the section line B-B' of Fig. 9.

請參照圖8至圖11,本實施例的阻抗調整結構300A與第一實施例的阻抗調整結構300的差異在於:本實施例的阻抗調整結構300A的第二導電圖案120A具有重疊於第一絕緣層210的第一接觸窗410的開口120op,第二絕緣層220的第二接觸窗420重疊於第二導電圖案120A的開口120op。舉例而言,在本實施例中,第一絕緣層210的第一接觸窗410於基板11上的垂直投影及第二絕緣層220的第二接觸窗420於基板11上的垂直投影可位於第二導電圖案120A的開口120op於基板11上的垂直投影以內。第二導電圖案120A具有定義開口120op的側壁120s(繪示於圖11),且第二絕緣層220可覆蓋側壁120s,但本發明不以此為限。 8 to 11, the difference between the impedance adjustment structure 300A of this embodiment and the impedance adjustment structure 300 of the first embodiment is that the second conductive pattern 120A of the impedance adjustment structure 300A of this embodiment overlaps the first insulation The opening 120op of the first contact window 410 of the layer 210 and the second contact window 420 of the second insulating layer 220 overlap the opening 120op of the second conductive pattern 120A. For example, in this embodiment, the vertical projection of the first contact window 410 of the first insulating layer 210 on the substrate 11 and the vertical projection of the second contact window 420 of the second insulating layer 220 on the substrate 11 may be located at the The opening 120 op of the two conductive patterns 120A is within the vertical projection on the substrate 11. The second conductive pattern 120A has a side wall 120s (shown in FIG. 11) defining the opening 120op, and the second insulating layer 220 can cover the side wall 120s, but the invention is not limited thereto.

在本實施例中,第二絕緣層220還具有重疊於第二導電圖案120A的第四接觸窗440。第二絕緣層220的第三接觸窗430及第四接觸窗440分別位於第二接觸窗420的兩側。舉例而言,本實施例之阻抗調整結構300A的第三接觸窗430、第二接觸窗420及第四接觸窗440於基板11上的多個垂直投影在方向D1上排列,且第三接觸窗430及第四接觸窗440可選擇性地以對稱的方式設置在第二接觸窗420的兩側,但本發明不以此為限。在本實施例中,第三導電圖案130更透過第二絕緣層220的第四接觸窗440與第二導電圖案120A電性連接。也就是說,相較於第一實施例,本實施例之阻抗調整結構300A的第三導電圖案130透過第二絕緣層220的第三接觸窗430及第四接觸窗440與第二導電圖案120A電性連接,藉此,可進一步增加阻抗調整結構300A的阻抗R2調整裕度。 In this embodiment, the second insulating layer 220 further has a fourth contact window 440 overlapping the second conductive pattern 120A. The third contact window 430 and the fourth contact window 440 of the second insulating layer 220 are located on both sides of the second contact window 420, respectively. For example, a plurality of vertical projections of the third contact window 430, the second contact window 420, and the fourth contact window 440 on the substrate 11 of the impedance adjustment structure 300A of this embodiment are arranged in the direction D1, and the third contact window The 430 and the fourth contact window 440 may be selectively disposed on both sides of the second contact window 420 in a symmetrical manner, but the invention is not limited thereto. In this embodiment, the third conductive pattern 130 is electrically connected to the second conductive pattern 120A through the fourth contact window 440 of the second insulating layer 220. That is, compared to the first embodiment, the third conductive pattern 130 of the impedance adjusting structure 300A of this embodiment passes through the third contact window 430 and the fourth contact window 440 of the second insulating layer 220 and the second conductive pattern 120A The electrical connection can further increase the impedance R2 adjustment margin of the impedance adjustment structure 300A.

圖12為本發明之第三實施例的畫素陣列基板10B的局部區域的放大示意圖。圖13為圖12之一阻抗調整結構的示意圖。圖14為圖12之另一阻抗調整結構的示意圖。特別是,圖13及圖14可分別對應於圖12中的阻抗調整結構300B-1及阻抗調整結構300B-n。 FIG. 12 is an enlarged schematic view of a partial area of the pixel array substrate 10B of the third embodiment of the invention. 13 is a schematic diagram of an impedance adjustment structure of FIG. 14 is a schematic diagram of another impedance adjustment structure of FIG. 12. In particular, FIGS. 13 and 14 may correspond to the impedance adjustment structure 300B-1 and the impedance adjustment structure 300B-n in FIG. 12, respectively.

請參照圖12至圖14,本實施例的阻抗調整結構300B與第二實施例的阻抗調整結構300A的差異在於:本實施例之阻抗調整結構300B的第一接觸窗410、第三接觸窗430及第四接觸窗440 係在方向D2上排列。也就是說,本實施例的畫素陣列基板10B可透過調整第一接觸窗410及第三接觸窗430在方向D2上的間距(即第一距離L1),使阻抗調整結構300B-1~300B-n具有不同的阻抗R2大小。 12 to 14, the difference between the impedance adjustment structure 300B of this embodiment and the impedance adjustment structure 300A of the second embodiment lies in: the first contact window 410 and the third contact window 430 of the impedance adjustment structure 300B of this embodiment And the fourth contact window 440 The system is arranged in the direction D2. In other words, the pixel array substrate 10B of this embodiment can adjust the spacing between the first contact window 410 and the third contact window 430 in the direction D2 (ie, the first distance L1) to make the impedance adjustment structures 300B-1~300B -n has different magnitudes of impedance R2.

圖15為本發明之第四實施例的畫素陣列基板10C的局部區域的放大示意圖。圖16為圖15之一阻抗調整結構的示意圖。圖17為圖15之另一阻抗調整結構的示意圖。圖18為圖16之阻抗調整結構300C-1的剖面示意圖。特別是,圖16及圖17可分別對應於圖15中的阻抗調整結構300C-1及阻抗調整結構300C-n。圖18可對應於圖16的剖線C-C’。 15 is an enlarged schematic view of a partial area of the pixel array substrate 10C of the fourth embodiment of the present invention. FIG. 16 is a schematic diagram of an impedance adjustment structure of FIG. 15. 17 is a schematic diagram of another impedance adjustment structure of FIG. 15. 18 is a schematic cross-sectional view of the impedance adjustment structure 300C-1 of FIG. 16. In particular, FIGS. 16 and 17 may correspond to the impedance adjustment structure 300C-1 and the impedance adjustment structure 300C-n in FIG. 15, respectively. Fig. 18 may correspond to the section line C-C' of Fig. 16.

請參照圖15至圖18,本實施例的阻抗調整結構300C與第三實施例的阻抗調整結構300B的差異在於:本實施例之阻抗調整結構300C的第一導電圖案110未重疊於第二導電圖案120B,且第一導電圖案110與第二導電圖案120B在方向D2上排列。在本實施例中,阻抗調整結構300C-1~300C-n中的任一者可根據其遠離虛擬線C的程度,調整重疊於第一導電圖案110的第一接觸窗410及重疊於第二導電圖案120B的第三接觸窗430於基板11上的兩垂直投影之面積大小與間距(即第一距離L1),使其具有如圖3所示的阻抗R2分佈。 15-18, the difference between the impedance adjustment structure 300C of this embodiment and the impedance adjustment structure 300B of the third embodiment is that the first conductive pattern 110 of the impedance adjustment structure 300C of this embodiment does not overlap the second conductive Pattern 120B, and the first conductive pattern 110 and the second conductive pattern 120B are arranged in the direction D2. In this embodiment, any one of the impedance adjustment structures 300C-1 to 300C-n can adjust the first contact window 410 overlapping the first conductive pattern 110 and the second overlap according to the degree of being away from the virtual line C The area and distance (ie, the first distance L1) of the two perpendicular projections of the third contact window 430 of the conductive pattern 120B on the substrate 11 have the impedance R2 distribution as shown in FIG. 3.

在本實施例中,第三導電圖案130A包括第一導電部130a、第二導電部130b以及第三導電部130c。第一導電部130a 重疊於第一導電圖案110。第二導電部130b重疊於第二導電圖案120B。第三導電部130c連接第一導電部130a及第二導電部130b。舉例而言,在本實施例中,第三導電部130c可指位於第一導電部130a與第二導電部130b之間且未重疊於第一導電圖案110及第二導電圖案120B的部分第三導電圖案130A。然而,本發明不限於此,根據其他的實施例,第三導電部130c也可部分重疊於第一導電圖案110及第二導電圖案120中的至少一者。 In this embodiment, the third conductive pattern 130A includes a first conductive portion 130a, a second conductive portion 130b, and a third conductive portion 130c. The first conductive portion 130a Overlap with the first conductive pattern 110. The second conductive portion 130b overlaps the second conductive pattern 120B. The third conductive portion 130c connects the first conductive portion 130a and the second conductive portion 130b. For example, in this embodiment, the third conductive portion 130c may refer to a portion of the third portion between the first conductive portion 130a and the second conductive portion 130b that does not overlap the first conductive pattern 110 and the second conductive pattern 120B Conductive pattern 130A. However, the present invention is not limited to this. According to other embodiments, the third conductive portion 130c may also partially overlap at least one of the first conductive pattern 110 and the second conductive pattern 120.

請參照圖15、圖16及圖17,在本實施例中,部分的第三導電圖案130A在方向D1上具有寬度W1,且寬度W1隨著阻抗調整結構300C遠離虛擬線C而增加。然而,本發明不限於此,根據其他的實施例,第三導電圖案130A的寬度W1沿著方向D1而遞減。具體而言,在本實施例中,遠離虛擬線C的阻抗調整結構300C-1的第三導電部130c在方向D1上具有較大的寬度W1-1,因此遠離虛擬線C的阻抗調整結構300C-1具有較小的阻抗R2(1),而鄰近虛擬線C的阻抗調整結構300C-n的第三導電部130c在方向D1上具有較小的寬度W1-n,因此阻抗調整結構300C-n具有較大的阻抗R2(n)。相較於第三實施例的阻抗調整結構300B,本實施例的阻抗調整結構300C還可藉由改變第三導電部130c的寬度W1,以進一步增加阻抗調整結構300C的阻抗R2調整裕度。 15, 16 and 17, in this embodiment, part of the third conductive pattern 130A has a width W1 in the direction D1, and the width W1 increases as the impedance adjustment structure 300C moves away from the virtual line C. However, the present invention is not limited to this. According to other embodiments, the width W1 of the third conductive pattern 130A decreases along the direction D1. Specifically, in this embodiment, the third conductive portion 130c of the impedance adjustment structure 300C-1 away from the virtual line C has a larger width W1-1 in the direction D1, so the impedance adjustment structure 300C away from the virtual line C -1 has a smaller impedance R2(1), and the third conductive portion 130c of the impedance adjustment structure 300C-n adjacent to the virtual line C has a smaller width W1-n in the direction D1, so the impedance adjustment structure 300C-n Has a large impedance R2(n). Compared to the impedance adjustment structure 300B of the third embodiment, the impedance adjustment structure 300C of this embodiment can further increase the impedance R2 adjustment margin of the impedance adjustment structure 300C by changing the width W1 of the third conductive portion 130c.

圖19為本發明之第五實施例的畫素陣列基板10C的局部區域的放大示意圖。圖20為圖19之一阻抗調整結構的示意圖。 圖21為圖19之另一阻抗調整結構的示意圖。圖22為圖19之一阻抗調整結構的剖面示意圖。特別是,圖20及圖21可分別對應於圖19中的阻抗調整結構300D-1及阻抗調整結構300D-n。圖22可對應於圖19的剖線D-D’。 FIG. 19 is an enlarged schematic view of a partial area of the pixel array substrate 10C of the fifth embodiment of the invention. FIG. 20 is a schematic diagram of an impedance adjustment structure of FIG. 19. 21 is a schematic diagram of another impedance adjustment structure of FIG. 19. 22 is a schematic cross-sectional view of one of the impedance adjustment structures of FIG. 19. In particular, FIGS. 20 and 21 may correspond to the impedance adjustment structure 300D-1 and the impedance adjustment structure 300D-n in FIG. 19, respectively. Fig. 22 may correspond to the section line D-D' of Fig. 19.

請參照圖19至圖22,本實施例的阻抗調整結構300D與第二實施例的阻抗調整結構300A的差異在於:本實施例的阻抗調整結構300D更包括第四導電圖案140,設置於第一絕緣層210上且與第二導電圖案120A結構上分離。第二絕緣層220還具有重疊於第四導電圖案140的第五接觸窗450。第三導電圖案130B透過第五接觸窗450電性連接第四導電圖案140。舉例而言,在本實施例中,第二導電圖案120A與第四導電圖案140在方向D2上排列,但本發明不以此為限。 Referring to FIGS. 19-22, the difference between the impedance adjustment structure 300D of this embodiment and the impedance adjustment structure 300A of the second embodiment is that the impedance adjustment structure 300D of this embodiment further includes a fourth conductive pattern 140 disposed on the first The insulating layer 210 is structurally separated from the second conductive pattern 120A. The second insulating layer 220 also has a fifth contact window 450 overlapping the fourth conductive pattern 140. The third conductive pattern 130B is electrically connected to the fourth conductive pattern 140 through the fifth contact window 450. For example, in this embodiment, the second conductive pattern 120A and the fourth conductive pattern 140 are arranged in the direction D2, but the invention is not limited thereto.

特別一提的是,本實施例之畫素陣列基板10D的每一扇出走線FLA包括重疊的第一導線FLAa及第二導線FLAb,也就是說,本實施例的扇出走線FLA-1~FLA-n為多層結構。詳細而言,扇出走線FLA的第一導線FLAa的一端與阻抗調整結構300D的第一導電圖案110直接連接,扇出走線FLA的第二導線FLAb的一端與阻抗調整結構300D的第二導電圖案120A直接連接,且扇出走線FLA的第一導線FLAa及第二導線FLAb透過阻抗調整結構300D的第三導電圖案130B彼此電性連接。舉例而言,在本實施例中,扇出走線FLA的第一導線FLAa與阻抗調整結構300D的第 一導電圖案110可形成於同一第一導電層,扇出走線FLA的第二導線FLAb與阻抗調整結構300D的第二導電圖案120A可形成於同一第二導電層,但本發明不以此為限。另外,在本實施例中,阻抗調整結構300D的第四導電圖案140與訊號線SLY可形成於同一第二導電層且直接連接。 In particular, each fan-out trace FLA of the pixel array substrate 10D of this embodiment includes overlapping first and second conductors FLAa and FLAb, that is, the fan-out trace FLA-1 of this embodiment FLA-n is a multilayer structure. In detail, one end of the first lead FLAa of the fan-out trace FLA is directly connected to the first conductive pattern 110 of the impedance adjustment structure 300D, and one end of the second lead FLAb of the fan-out trace FLA is connected to the second conductive pattern of the impedance adjustment structure 300D 120A is directly connected, and the first wire FLAa and the second wire FLAb of the fan-out trace FLA are electrically connected to each other through the third conductive pattern 130B of the impedance adjustment structure 300D. For example, in this embodiment, the first wire FLAa of the fan-out trace FLA and the first A conductive pattern 110 may be formed on the same first conductive layer. The second conductive line FLAb of the fan-out trace FLA and the second conductive pattern 120A of the impedance adjustment structure 300D may be formed on the same second conductive layer, but the invention is not limited to this . In addition, in this embodiment, the fourth conductive pattern 140 of the impedance adjustment structure 300D and the signal line SLY may be formed on the same second conductive layer and directly connected.

在本實施例中,第三導電圖案130B的配置與第四實施例中的第三導電圖案130A的配置相似。具體而言,本實施例的第三導電圖案130B包括第一導電部130a、第二導電部130b及第三導電部130c。第一導電部130a與第二導電圖案120A重疊。第二導電部130b與第四導電圖案140重疊。第三導電部130c連接第一導電部130a和第二導電部130b。多條訊號線SLY1~SLYn在方向D1上排列,第二導電圖案120A與第四導電圖案140在方向D2上排列,方向D2與方向D1交錯,阻抗調整結構300D的第三導電部130c在方向D1上具有寬度W1,寬度W1隨著阻抗調整結構300D遠離虛擬線C而遞增。多個阻抗調整結構300D的寬度W1沿著方向D1而遞減。以下將就本實施例的阻抗調整結構300D與第二實施例的阻抗調整結構300A的差異處做進一步的說明。 In this embodiment, the configuration of the third conductive pattern 130B is similar to the configuration of the third conductive pattern 130A in the fourth embodiment. Specifically, the third conductive pattern 130B of this embodiment includes a first conductive portion 130a, a second conductive portion 130b, and a third conductive portion 130c. The first conductive portion 130a overlaps with the second conductive pattern 120A. The second conductive portion 130b overlaps the fourth conductive pattern 140. The third conductive portion 130c connects the first conductive portion 130a and the second conductive portion 130b. A plurality of signal lines SLY1~SLYn are arranged in the direction D1, the second conductive pattern 120A and the fourth conductive pattern 140 are arranged in the direction D2, the direction D2 and the direction D1 are staggered, and the third conductive portion 130c of the impedance adjustment structure 300D is in the direction D1 The upper portion has a width W1, and the width W1 increases as the impedance adjustment structure 300D moves away from the virtual line C. The width W1 of the plurality of impedance adjustment structures 300D decreases along the direction D1. The difference between the impedance adjustment structure 300D of this embodiment and the impedance adjustment structure 300A of the second embodiment will be further described below.

請參照圖19、圖20及圖21,在本實施例中,第一接觸窗410於基板11上的垂直投影與第五接觸窗450於基板11上的垂直投影具有第二距離L2,且第二距離L2隨著阻抗調整結構300D遠離虛擬線C而減少。具體而言,在本實施例中,遠離虛擬 線C的阻抗調整結構300D-1的第二距離L2-1小於鄰近虛擬線C的阻抗調整結構300D-n的第二距離L2-n。舉例而言,在本實施例中,阻抗調整結構300D的第五接觸窗450於基板11上的垂直投影面積隨著阻抗調整結構300D遠離虛擬線C而增加,但本發明不以此為限。根據其他的實施例,每一阻抗調整結構300D的第五接觸窗450於基板11上的垂直投影面積沿著方向D1而遞減。 19, 20 and 21, in this embodiment, the vertical projection of the first contact window 410 on the substrate 11 and the vertical projection of the fifth contact window 450 on the substrate 11 have a second distance L2, and The second distance L2 decreases as the impedance adjustment structure 300D moves away from the virtual line C. Specifically, in this embodiment, away from virtual The second distance L2-1 of the impedance adjustment structure 300D-1 of the line C is smaller than the second distance L2-n of the impedance adjustment structure 300D-n of the adjacent virtual line C. For example, in this embodiment, the vertical projection area of the fifth contact window 450 of the impedance adjustment structure 300D on the substrate 11 increases as the impedance adjustment structure 300D moves away from the virtual line C, but the invention is not limited to this. According to other embodiments, the vertical projection area of the fifth contact window 450 of each impedance adjustment structure 300D on the substrate 11 decreases along the direction D1.

整體而言,在本實施例之阻抗調整結構300D-1~300D-n中,遠離虛擬線C的阻抗調整結構300D-1具有較短的第二距離L2-1及在基板11上之投影面積較大的第五接觸窗450-1,因此遠離虛擬線C的阻抗調整結構300D-1具有較小的阻抗R2(1),而鄰近虛擬線C的阻抗調整結構300D-n具有較長的第二距離L2-n及在基板11上之投影面積較小的第五接觸窗450-n,因此鄰近虛擬線C的阻抗調整結構300D-n具有較大的阻抗R2(n)。特別是,相較於第二實施例的阻抗調整結構300A,本實施例的阻抗調整結構300D藉由調整第二距離L2、第五接觸窗450的大小以及第三導電部130c的寬度W1,可進一步增加阻抗調整結構300D的阻抗R2調整裕度。 Overall, in the impedance adjustment structures 300D-1 to 300D-n of this embodiment, the impedance adjustment structure 300D-1 far from the virtual line C has a shorter second distance L2-1 and the projected area on the substrate 11 The larger fifth contact window 450-1, so the impedance adjustment structure 300D-1 far from the virtual line C has a smaller impedance R2(1), and the impedance adjustment structure 300D-n adjacent to the virtual line C has a longer The two distances L2-n and the fifth contact window 450-n with a smaller projection area on the substrate 11, the impedance adjustment structure 300D-n adjacent to the virtual line C has a larger impedance R2(n). In particular, compared to the impedance adjustment structure 300A of the second embodiment, the impedance adjustment structure 300D of this embodiment can adjust the second distance L2, the size of the fifth contact window 450, and the width W1 of the third conductive portion 130c. The impedance R2 adjustment margin of the impedance adjustment structure 300D is further increased.

圖23為本發明之第六實施例的畫素陣列基板的示意圖。圖24為圖23之多條扇出走線的阻抗分布示意圖。圖25為圖23之多個阻抗調整結構的阻抗分布示意圖。請參照圖23,在本實施例中,畫素陣列基板10E與第一實施例的畫素陣列基板10的差異 在於:畫素陣列基板10E的多條扇出走線FLB-1~FLB-m在扇出區FO的走線長度沿著方向D1遞減,也就是說,扇出走線FLB-1~FLB-m的阻抗R1沿著方向D1而遞減。另外,阻抗調整結構300的第一接觸窗(未繪示)與第三接觸窗(未繪示)中的至少一者於基板11上的垂直投影面積沿著方向D1遞減,也就是說,阻抗調整結構300-1~300-m的阻抗R2沿著方向D1而遞增。 23 is a schematic diagram of a pixel array substrate according to a sixth embodiment of the invention. FIG. 24 is a schematic diagram of impedance distribution of multiple fan-out traces of FIG. 23. FIG. 25 is a schematic diagram of the impedance distribution of the multiple impedance adjustment structures of FIG. 23. 23, in this embodiment, the difference between the pixel array substrate 10E and the pixel array substrate 10 of the first embodiment The reason is that the length of the plurality of fan-out traces FLB-1~FLB-m of the pixel array substrate 10E in the fan-out area FO decreases along the direction D1, that is, the fan-out traces FLB-1~FLB-m The impedance R1 decreases along the direction D1. In addition, the vertical projection area of at least one of the first contact window (not shown) and the third contact window (not shown) on the substrate 11 of the impedance adjustment structure 300 decreases along the direction D1, that is, the impedance The impedance R2 of the adjustment structures 300-1~300-m increases along the direction D1.

特別一提的是,在本實施例之畫素陣列基板10E與第一實施例之畫素陣列基板10中,相同或相似的元件以相同或相似的符號表示,並省略了相同技術內容的說明。關於省略部分的說明可參考第一實施例,於此將不再重述。以下將就本實施例的畫素陣列基板10E與第一實施例的畫素陣列基板10的差異處做進一步的說明。 In particular, in the pixel array substrate 10E of this embodiment and the pixel array substrate 10 of the first embodiment, the same or similar elements are denoted by the same or similar symbols, and the description of the same technical content is omitted . The description of the omitted parts can refer to the first embodiment, and will not be repeated here. The differences between the pixel array substrate 10E of this embodiment and the pixel array substrate 10 of the first embodiment will be further described below.

請參照圖23及圖24,在本實施例中,扇出走線FLB-1~FLB-m不具有虛擬線(如圖1所繪示的虛擬線C),也就是說,連接於同一電子元件12的扇出走線FLB-1~FLB-m係以不對稱的方式排列於基板11的扇出區FO。舉例而言,扇出走線FLB中的扇出走線FLB-1的延伸長度最長,因而具有最大的阻抗R1(1),扇出走線FLB中的扇出走線FLB-m的延伸長度最短,因而具有最小的阻抗R1(m),其中R1(m)-R1(1)=-△R,但本發明不以此為限。在本實施例中,扇出走線FLB的阻抗R1與扇出走線FLB在方向D1上遠離扇出走線FLB-1的程度,呈現一線性負相關,但 本發明不以此為限。 Please refer to FIGS. 23 and 24. In this embodiment, the fan-out traces FLB-1~FLB-m do not have virtual lines (virtual line C as shown in FIG. 1), that is, they are connected to the same electronic component The fan-out traces 12 of FLB-1 to FLB-m are arranged in the fan-out area FO of the substrate 11 in an asymmetric manner. For example, the fan-out trace FLB-1 in the fan-out trace FLB has the longest extension length and thus has the largest impedance R1(1), and the fan-out trace FLB-m in the fan-out trace FLB has the shortest extension length and thus has The minimum impedance R1(m), where R1(m)-R1(1)=-△R, but the invention is not limited to this. In this embodiment, the impedance R1 of the fan-out trace FLB and the degree to which the fan-out trace FLB is away from the fan-out trace FLB-1 in the direction D1 show a linear negative correlation, but The invention is not limited to this.

請參照圖23及圖25,在本實施例中,阻抗調整結構300的阻抗R2與阻抗調整結構300在方向D1上遠離阻抗調整結構300-1的程度,呈現一線性正相關,且R2(m)-R2(1)=△R,但本發明不以此為限。在本實施例中,畫素陣列基板10E的每一扇出走線FLB與對應的一個阻抗調整結構300的阻抗總和R1+R2實質上相等。具體而言,連接於彼此的扇出走線FLB-1及阻抗調整結構300-1的阻抗總和R1(1)+R2(1)實質上等於連接於彼此的扇出走線FLB-m及阻抗調整結構300-m的阻抗總和R1(m)+R2(m),即R1(m)+R2(m)=(R1(1)-△R)+(△R+R2(1))=R1(1)+R2(1)。因此,透過阻抗調整結構300的設置能補償多條扇出走線FLB之間的阻抗差異,以改善因扇出走線FLB的阻抗差異所造成的顯示不良(mura)問題。 Please refer to FIGS. 23 and 25. In this embodiment, the impedance R2 of the impedance adjustment structure 300 and the impedance adjustment structure 300 are far away from the impedance adjustment structure 300-1 in the direction D1, showing a linear positive correlation, and R2(m )-R2(1)=△R, but the invention is not limited to this. In this embodiment, each fan-out trace FLB of the pixel array substrate 10E and the impedance sum R1+R2 of the corresponding impedance adjustment structure 300 are substantially equal. Specifically, the sum of the impedances R1(1)+R2(1) of the fan-out traces FLB-1 and the impedance adjustment structure 300-1 connected to each other is substantially equal to the fan-out traces FLB-m and the impedance adjustment structure connected to each other 300-m impedance sum R1(m)+R2(m), that is R1(m)+R2(m)=(R1(1)-△R)+(△R+R2(1))=R1(1 )+R2(1). Therefore, the impedance adjustment structure 300 can compensate for the impedance difference between the plurality of fan-out traces FLB, so as to improve the mura problem caused by the impedance difference between the fan-out traces FLB.

綜上所述,在本發明的實施例的畫素陣列基板中,連接於扇出走線及訊號線之間的阻抗調整結構,藉由各導電圖案間之接觸窗的大小及彼此間的距離調整,使對應不同扇出走線的阻抗調整結構具有不同的阻抗,以補償不同扇出走線之間的阻抗差異。藉此,上述畫素陣列基板的顯示裝置不易出現因阻抗差異造成之顯示不良(mura)的問題。 In summary, in the pixel array substrate of the embodiment of the present invention, the impedance adjustment structure connected between the fan-out wiring and the signal line is adjusted by the size of the contact window between each conductive pattern and the distance between each other So that the impedance adjustment structures corresponding to different fan-out traces have different impedances to compensate for the difference in impedance between different fan-out traces. Therefore, the display device of the pixel array substrate is less prone to display mura problems due to impedance differences.

雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的 精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。 Although the present invention has been disclosed as above by the embodiments, it is not intended to limit the present invention. Any person with ordinary knowledge in the technical field of the art will not deviate from the present invention. Within the spirit and scope, some changes and modifications can be made, so the scope of protection of the present invention shall be subject to the scope defined in the appended patent application.

10:畫素陣列基板 11:基板 110:第一導電圖案 120:第二導電圖案 130:第三導電圖案 300、300-1~300-n:阻抗調整結構 410:第一接觸窗 430:第三接觸窗 AA:主動區 BL:接墊區 BP:接墊 C:虛擬線 D1、D2:方向 FL、FL-1~FL-n:扇出走線 FO:扇出區 I:區域 PE:畫素電極 PX:畫素結構 SLX、SLY、SLY1~SLYn:訊號線 T:主動元件 TR:轉接區10: Pixel array substrate 11: Substrate 110: First conductive pattern 120: Second conductive pattern 130: Third conductive pattern 300, 300-1~300-n: Impedance adjustment structure 410: First contact window 430: Third Contact window AA: Active area BL: Pad area BP: Pad C: Virtual lines D1, D2: Direction FL, FL-1~FL-n: Fan-out trace FO: Fan-out area I: Area PE: Pixel electrode PX: pixel structure SLX, SLY, SLY1~SLYn: signal line T: active component TR: transfer area

Claims (22)

一種畫素陣列基板,包括: 一基板,具有依序排列的一主動區、一轉接區、一扇出區以及一接墊區; 多個畫素結構,設置於該基板的該主動區; 多條訊號線,電性連接該些畫素結構,且由該主動區延伸至該轉接區; 多個阻抗調整結構,設置於該基板的該轉接區,且電性連接該些訊號線,各該阻抗調整結構包括: 一第一導電圖案,設置於該基板上; 一第一絕緣層,設置於該第一導電圖案上,且具有重疊於該第一導電圖案的一第一接觸窗; 一第二導電圖案,設置於該第一絕緣層上; 一第二絕緣層,設置於該第二導電圖案上,且具有重疊於該第一接觸窗之一第二接觸窗以及重疊於該第二導電圖案的一第三接觸窗;以及 一第三導電圖案,設置於該第二絕緣層上,且透過該第一接觸窗、該第二接觸窗以及該第三接觸窗電性連接該第一導電圖案與該第二導電圖案; 多條扇出走線,設置於該基板的該扇出區,電性連接該些阻抗調整結構,且排列於一虛擬線的兩側,其中各該阻抗調整結構之該第一接觸窗與該第三接觸窗其中至少一者的垂直投影的面積隨著該阻抗調整結構遠離該虛擬線而遞增;以及 多個接墊,設置於該基板的該接墊區,且電性連接該些扇出走線。A pixel array substrate includes: a substrate having an active area, a transition area, a fan-out area and a pad area arranged in sequence; a plurality of pixel structures are disposed in the active area of the substrate; A plurality of signal lines are electrically connected to the pixel structures and extend from the active area to the transition area; a plurality of impedance adjustment structures are provided in the transition area of the substrate and are electrically connected to the signal lines Each of the impedance adjustment structures includes: a first conductive pattern disposed on the substrate; a first insulating layer disposed on the first conductive pattern and having a first contact window overlapping the first conductive pattern A second conductive pattern disposed on the first insulating layer; a second insulating layer disposed on the second conductive pattern and having a second contact window overlapping the first contact window and overlapping the A third contact window of the second conductive pattern; and a third conductive pattern, disposed on the second insulating layer, and electrically connected to the first contact window, the second contact window, and the third contact window The first conductive pattern and the second conductive pattern; a plurality of fan-out traces, disposed in the fan-out area of the substrate, electrically connected to the impedance adjustment structures, and arranged on both sides of a virtual line, wherein each of the impedances The area of the vertical projection of at least one of the first contact window and the third contact window of the adjustment structure increases as the impedance adjustment structure moves away from the virtual line; and a plurality of pads are provided on the pad of the substrate Area, and are electrically connected to the fan-out traces. 如申請專利範圍第1項所述的畫素陣列基板,其中各該阻抗調整結構之該第一接觸窗的垂直投影與該第三接觸窗的垂直投影具有一第一距離,各該阻抗調整結構的該第一距離隨著該阻抗調整結構遠離該虛擬線而遞減。The pixel array substrate according to item 1 of the patent application scope, wherein the vertical projection of the first contact window of each of the impedance adjustment structures and the vertical projection of the third contact window have a first distance, and each of the impedance adjustment structures The first distance decreases with the impedance adjustment structure away from the virtual line. 如申請專利範圍第1項所述的畫素陣列基板,其中該第一導電圖案重疊於該第二導電圖案,該第二導電圖案還具有重疊於該第一接觸窗的一開口,該第二絕緣層的該第二接觸窗還重疊於該第二導電圖案的該開口。The pixel array substrate of claim 1, wherein the first conductive pattern overlaps the second conductive pattern, the second conductive pattern further has an opening overlapping the first contact window, the second The second contact window of the insulating layer also overlaps the opening of the second conductive pattern. 如申請專利範圍第3項所述的畫素陣列基板,其中該第一絕緣層之該第一接觸窗的垂直投影及該第二絕緣層之該第二接觸窗的垂直投影位於該第二導電圖案之該開口的垂直投影以內,該第二導電圖案具有定義該開口的一側壁,而該第二絕緣層覆蓋該側壁。The pixel array substrate of claim 3, wherein the vertical projection of the first contact window of the first insulating layer and the vertical projection of the second contact window of the second insulating layer are located on the second conductive Within the vertical projection of the opening of the pattern, the second conductive pattern has a side wall that defines the opening, and the second insulating layer covers the side wall. 如申請專利範圍第1項所述的畫素陣列基板,其中該第二絕緣層還具有重疊於該第二導電圖案的一第四接觸窗,該第三接觸窗與該第四接觸窗分別位於該第二接觸窗的兩側,該第三導電圖案更透過該第四接觸窗與該第二導電圖案電性連接。The pixel array substrate as described in item 1 of the patent application range, wherein the second insulating layer further has a fourth contact window overlapping the second conductive pattern, the third contact window and the fourth contact window are located respectively On both sides of the second contact window, the third conductive pattern is electrically connected to the second conductive pattern through the fourth contact window. 如申請專利範圍第1項所述的畫素陣列基板,其中各該阻抗調整結構之該第一接觸窗及該第三接觸窗在一第一方向上排列,且該些訊號線在該第一方向上排列。The pixel array substrate as described in item 1 of the patent application range, wherein the first contact window and the third contact window of each impedance adjustment structure are arranged in a first direction, and the signal lines are at the first Arranged in the direction. 如申請專利範圍第1項所述的畫素陣列基板,其中各該阻抗調整結構之該第一接觸窗及該第三接觸窗在一第一方向上排列,該些訊號線在一第二方向上排列,而該第一方向與該第二方向交錯。The pixel array substrate according to item 1 of the patent application scope, wherein the first contact window and the third contact window of each impedance adjustment structure are arranged in a first direction, and the signal lines are in a second direction The first direction and the second direction are staggered. 如申請專利範圍第1項所述的畫素陣列基板,其中各該阻抗調整結構更包括: 一第四導電圖案,該第一導電圖案與該第二導電圖案重疊,該第四導電圖案設置於該第一絕緣層上且與該第二導電圖案結構上分離,其中該第二絕緣層還具有重疊於該第四導電圖案的一第五接觸窗,該第三導電圖案透過該第一接觸窗、該第二接觸窗以及該第五接觸窗電性連接該第一導電圖案與該第四導電圖案。The pixel array substrate as described in item 1 of the patent scope, wherein each of the impedance adjustment structures further includes: a fourth conductive pattern, the first conductive pattern overlaps with the second conductive pattern, and the fourth conductive pattern is disposed on On the first insulating layer and separated from the second conductive pattern structure, wherein the second insulating layer further has a fifth contact window overlapping the fourth conductive pattern, the third conductive pattern penetrates the first contact window , The second contact window and the fifth contact window are electrically connected to the first conductive pattern and the fourth conductive pattern. 如申請專利範圍第8項所述的畫素陣列基板,其中各該阻抗調整結構之該第一接觸窗及該第三接觸窗在一第一方向上排列,該第二導電圖案與該第四導電圖案在一第三方向上排列,該第三方向與該第一方向交錯。The pixel array substrate as described in item 8 of the patent application range, wherein the first contact window and the third contact window of each impedance adjustment structure are arranged in a first direction, the second conductive pattern and the fourth The conductive patterns are arranged in a third direction, and the third direction is staggered with the first direction. 如申請專利範圍8項所述的畫素陣列基板,其中各該阻抗調整結構之該第一接觸窗的垂直投影與該第五接觸窗的垂直投影具有一第二距離,各該阻抗調整結構的該第二距離隨著該阻抗調整結構遠離該虛擬線而遞減。The pixel array substrate as described in item 8 of the patent application, wherein the vertical projection of the first contact window of each of the impedance adjustment structures and the vertical projection of the fifth contact window have a second distance, and each of the impedance adjustment structures The second distance decreases as the impedance adjustment structure moves away from the virtual line. 如申請專利範圍第8項所述的畫素陣列基板,其中各該阻抗調整結構之該第五接觸窗的垂直投影的面積隨著該阻抗調整結構遠離該虛擬線而遞增。The pixel array substrate as described in item 8 of the patent application range, wherein the area of the vertical projection of the fifth contact window of each of the impedance adjustment structures increases as the impedance adjustment structure moves away from the virtual line. 如申請專利範圍第8項所述的畫素陣列基板,其中該第三導電圖案包括:     一第一導電部,與該第二導電圖案重疊;     一第二導電部,與該第四導電圖案重疊;以及     一第三導電部,連接該第一導電部和該第二導電部;     其中該些訊號線在一第一方向上排列,第二導電圖案與該第四導電圖案在一第三方向上排列,該第三方向與該第一方向交錯,該第三導電部在該第一方向上具有一寬度,該寬度隨著該阻抗調整結構遠離該虛擬線而遞增。The pixel array substrate as described in item 8 of the patent application range, wherein the third conductive pattern includes: a first conductive portion overlapping the second conductive pattern; a second conductive portion overlapping the fourth conductive pattern ; And a third conductive portion connecting the first conductive portion and the second conductive portion; wherein the signal lines are arranged in a first direction, and the second conductive pattern and the fourth conductive pattern are arranged in a third direction The third direction intersects the first direction, the third conductive portion has a width in the first direction, and the width increases as the impedance adjustment structure moves away from the virtual line. 如申請專利範圍第1項所述的畫素陣列基板,其中該第一導電圖案未重疊於該第二導電圖案。The pixel array substrate as described in item 1 of the patent application range, wherein the first conductive pattern does not overlap the second conductive pattern. 如申請專利範圍第13項所述的畫素陣列基板,其中該第三導電圖案包括:     一第一導電部,與該第一導電圖案重疊;     一第二導電部,與該第二導電圖案重疊;以及     一第三導電部,連接該第一導電部和該第二導電部;     其中該些訊號線在一第一方向上排列,該第一導電圖案與該第二導電圖案在一第四方向上排列,該第四方向與該第一方向交錯,該第三導電部在該第一方向上具有一寬度,該寬度隨著該阻抗調整結構遠離該虛擬線而遞增。The pixel array substrate as described in item 13 of the patent application range, wherein the third conductive pattern includes: a first conductive portion overlapping the first conductive pattern; a second conductive portion overlapping the second conductive pattern ; And a third conductive portion connecting the first conductive portion and the second conductive portion; wherein the signal lines are arranged in a first direction, the first conductive pattern and the second conductive pattern are in a fourth direction Arranged upward, the fourth direction intersects the first direction, the third conductive portion has a width in the first direction, and the width increases as the impedance adjustment structure moves away from the virtual line. 一種畫素陣列基板,包括: 一基板,具有依序排列的一主動區、一轉接區以及一扇出區; 多個畫素結構,設置於該基板的該主動區; 多條訊號線,電性連接該些畫素結構,且由該主動區延伸至該轉接區; 多條扇出走線,設置於該基板的該扇出區並電性連接於一驅動元件,其中該些扇出走線在一第一方向上依序排列,各該扇出走線具有一阻抗,且該些扇出走線的該阻抗沿著該第一方向遞減;以及 多個阻抗調整結構,設置於該基板的該轉接區,且電性連接該些訊號線以及該些扇出走線,各該阻抗調整結構包括: 一第一導電圖案,設置於該基板上; 一第一絕緣層,設置於該第一導電圖案上,且具有重疊於該第一導電圖案的一第一接觸窗; 一第二導電圖案,設置於該第一絕緣層上; 一第二絕緣層,設置於該第二導電圖案上,且具有重疊於該第一接觸窗之一第二接觸窗以及重疊於該第二導電圖案的一第三接觸窗;以及 一第三導電圖案,設置於該第二絕緣層上,且透過該第一接觸窗、該第二接觸窗以及該第三接觸窗電性連接該第一導電圖案與該第二導電圖案;其中各該阻抗調整結構之該第一接觸窗與該第三接觸窗其中至少一者的垂直投影面積沿著該第一方向的相反方向而遞增。A pixel array substrate includes: a substrate having an active area, a transition area and a fan-out area arranged in sequence; a plurality of pixel structures disposed in the active area of the substrate; a plurality of signal lines, The pixel structures are electrically connected and extend from the active area to the transition area; a plurality of fan-out traces are provided in the fan-out area of the substrate and electrically connected to a driving element, wherein the fan-out traces The lines are sequentially arranged in a first direction, each of the fan-out traces has an impedance, and the impedance of the fan-out traces decreases along the first direction; and a plurality of impedance adjustment structures are provided on the substrate The transfer area is electrically connected to the signal lines and the fan-out traces. Each of the impedance adjustment structures includes: a first conductive pattern disposed on the substrate; a first insulating layer disposed on the first conductive On the pattern, and having a first contact window overlapping the first conductive pattern; a second conductive pattern, disposed on the first insulating layer; a second insulating layer, disposed on the second conductive pattern, and A second contact window overlapping the first contact window and a third contact window overlapping the second conductive pattern; and a third conductive pattern disposed on the second insulating layer and passing through the first The contact window, the second contact window and the third contact window are electrically connected to the first conductive pattern and the second conductive pattern; wherein at least one of the first contact window and the third contact window of each impedance adjustment structure The vertical projection area of the person increases along the direction opposite to the first direction. 如申請專利範圍第15項所述的畫素陣列基板,其中各該阻抗調整結構之該第一接觸窗的垂直投影與該第三接觸窗的垂直投影具有一第一距離,該第一距離沿著該第一方向而遞增。The pixel array substrate according to item 15 of the patent application range, wherein the vertical projection of the first contact window and the vertical projection of the third contact window of each impedance adjustment structure have a first distance, the first distance is along Increasing in this first direction. 如申請專利範圍第15項所述的畫素陣列基板,其中各該阻抗調整結構更包括: 一第四導電圖案,該第一導電圖案與該第二導電圖案重疊,該第四導電圖案設置於該第一絕緣層上且與該第二導電圖案結構上分離,其中該第二絕緣層還具有重疊於該第四導電圖案的一第五接觸窗,該第三導電圖案透過該第一接觸窗、該第二接觸窗以及該第五接觸窗電性連接該第一導電圖案與該第四導電圖案。The pixel array substrate of claim 15 of the patent application, wherein each of the impedance adjustment structures further includes: a fourth conductive pattern, the first conductive pattern overlaps with the second conductive pattern, and the fourth conductive pattern is disposed on On the first insulating layer and separated from the second conductive pattern structure, wherein the second insulating layer further has a fifth contact window overlapping the fourth conductive pattern, the third conductive pattern penetrates the first contact window , The second contact window and the fifth contact window are electrically connected to the first conductive pattern and the fourth conductive pattern. 如申請專利範圍17項所述的畫素陣列基板,其中各該阻抗調整結構之該第一接觸窗的垂直投影與該第五接觸窗的垂直投影具有一第二距離,該第二距離沿著該第一方向遞增。The pixel array substrate of claim 17 of the patent application, wherein the vertical projection of the first contact window and the vertical projection of the fifth contact window of each impedance adjustment structure have a second distance, the second distance is along The first direction is increasing. 如申請專利範圍第17項所述的畫素陣列基板,其中各該阻抗調整結構之該第五接觸窗的面積沿著該第一方向而遞減。The pixel array substrate as described in Item 17 of the patent application range, wherein the area of the fifth contact window of each of the impedance adjusting structures decreases along the first direction. 如申請專利範圍第17項所述的畫素陣列基板,其中該第三導電圖案包括:     一第一導電部,與該第二導電圖案重疊;     一第二導電部,與該第四導電圖案重疊;以及     一第三導電部,連接該第一導電部和該第二導電部;     其中第二導電圖案與該第四導電圖案在一第三方向上排列,該第三方向與該第一方向交錯,該第三導電部在該第一方向上具有一寬度,該寬度沿著該第一方向而遞減。The pixel array substrate as described in Item 17 of the patent application range, wherein the third conductive pattern includes: a first conductive portion overlapping the second conductive pattern; a second conductive portion overlapping the fourth conductive pattern And a third conductive portion connecting the first conductive portion and the second conductive portion; wherein the second conductive pattern and the fourth conductive pattern are arranged in a third direction, and the third direction is interleaved with the first direction, The third conductive portion has a width in the first direction, and the width decreases along the first direction. 如申請專利範圍第15項所述的畫素陣列基板,其中該第一導電圖案未重疊於該第二導電圖案。The pixel array substrate as recited in item 15 of the patent application range, wherein the first conductive pattern does not overlap the second conductive pattern. 如申請專利範圍第21項所述的畫素陣列基板,其中該第三導電圖案包括:     一第一導電部,與該第一導電圖案重疊;     一第二導電部,與該第二導電圖案重疊;以及     一第三導電部,連接該第一導電部和該第二導電部;     其中該第一導電圖案與該第二導電圖案在一第四方向上排列,該第四方向與該第一方向交錯,該第三導電部在該第一方向上具有一寬度,該寬度沿著該第一方向而遞減。The pixel array substrate of claim 21, wherein the third conductive pattern includes: a first conductive portion overlapping the first conductive pattern; a second conductive portion overlapping the second conductive pattern ; And a third conductive portion connecting the first conductive portion and the second conductive portion; wherein the first conductive pattern and the second conductive pattern are arranged in a fourth direction, the fourth direction and the first direction Interleaved, the third conductive portion has a width in the first direction, and the width decreases along the first direction.
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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI397736B (en) * 2009-10-13 2013-06-01 Au Optronics Corp Active device arry substrate and display device
TWI571989B (en) * 2014-01-28 2017-02-21 友達光電股份有限公司 Display substrate
TW201818394A (en) * 2016-11-09 2018-05-16 元太科技工業股份有限公司 Display device, pixel array substrate and line array structure
TWI631400B (en) * 2017-07-21 2018-08-01 元太科技工業股份有限公司 Pixel array substrate

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI397736B (en) * 2009-10-13 2013-06-01 Au Optronics Corp Active device arry substrate and display device
TWI571989B (en) * 2014-01-28 2017-02-21 友達光電股份有限公司 Display substrate
TW201818394A (en) * 2016-11-09 2018-05-16 元太科技工業股份有限公司 Display device, pixel array substrate and line array structure
TWI631400B (en) * 2017-07-21 2018-08-01 元太科技工業股份有限公司 Pixel array substrate

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