TWI695159B - Temperature measuring device, ambient temperature measuring method, and ambient temperature measuring program - Google Patents
Temperature measuring device, ambient temperature measuring method, and ambient temperature measuring program Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
- G01K1/20—Compensating for effects of temperature changes other than those to be measured, e.g. changes in ambient temperature
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K3/00—Thermometers giving results other than momentary value of temperature
- G01K3/08—Thermometers giving results other than momentary value of temperature giving differences of values; giving differentiated values
- G01K3/14—Thermometers giving results other than momentary value of temperature giving differences of values; giving differentiated values in respect of space
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/02—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using thermoelectric elements, e.g. thermocouples
- G01K7/10—Arrangements for compensating for auxiliary variables, e.g. length of lead
- G01K7/12—Arrangements with respect to the cold junction, e.g. preventing influence of temperature of surrounding air
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Abstract
端子溫度測定元件(30)配置於殼體(90)內之連接熱電偶(600)之端子之附近,第1內部溫度測定元件(31)與第2內部溫度測定元件(32)配置於殼體(90)內之相較端子溫度測定元件(30)更靠近發熱源之位置。第1內部溫度測定元件(31)之來自發熱源之熱影響、與第2內部溫度測定元件(32)之來自發熱源之熱影響之差會根據殼體(90)之姿勢而變化。主控制部(20)使用由3個溫度測定元件所測定之溫度而算出殼體(90)之周圍溫度。The terminal temperature measuring element (30) is arranged in the housing (90) in the vicinity of the terminal connected to the thermocouple (600), and the first internal temperature measuring element (31) and the second internal temperature measuring element (32) are arranged in the housing (90) is closer to the heat source than the terminal temperature measuring element (30). The difference between the thermal influence of the first internal temperature measuring element (31) from the heat source and the thermal influence of the second internal temperature measuring element (32) from the heat source varies according to the posture of the housing (90). The main control unit (20) uses the temperatures measured by the three temperature measuring elements to calculate the ambient temperature of the housing (90).
Description
本發明係關於一種使用有熱電偶之溫度測定裝置之周圍溫度之測定技術。The invention relates to a technique for measuring the surrounding temperature of a temperature measuring device using a thermocouple.
於測定並調整對象物或對象機器之溫度時,利用熱電偶之態樣例如於專利文獻1中有所揭示。When measuring and adjusting the temperature of an object or an object device, the use of a thermocouple is disclosed in Patent Document 1, for example.
專利文獻1之構成具備熱電偶與溫度調整裝置。熱電偶連接於溫度調整裝置之設置於殼體上之連接端子。The structure of Patent Document 1 includes a thermocouple and a temperature adjustment device. The thermocouple is connected to the connection terminal of the temperature adjustment device provided on the casing.
熱電偶配置於對象物或對象裝置。溫度調整裝置配置於與對象機器不同之位置。溫度調整裝置根據由熱電偶產生、且經由連接端子取得之電壓而算出溫度,且執行溫度之調整。The thermocouple is arranged on the object or the object device. The temperature adjustment device is arranged at a different position from the target device. The temperature adjustment device calculates the temperature based on the voltage generated by the thermocouple and obtained through the connection terminal, and performs temperature adjustment.
該情形時,算出之溫度會受到連接端子(冷接點)之溫度之影響。因此,於專利文獻1之構成中,於溫度調整裝置之殼體具備測定連接端子之溫度之溫度感測器。而且,溫度調整裝置藉由將由該溫度感測器測定之冷接點溫度與由熱電偶測定之溫度相加而算出對象物之溫度。 [先前技術文獻] [專利文獻]In this case, the calculated temperature will be affected by the temperature of the connection terminal (cold junction). Therefore, in the configuration of Patent Document 1, a temperature sensor that measures the temperature of the connection terminal is provided in the housing of the temperature adjustment device. Then, the temperature adjustment device calculates the temperature of the object by adding the temperature of the cold junction measured by the temperature sensor and the temperature measured by the thermocouple. [Prior Technical Literature] [Patent Literature]
[專利文獻1]日本專利特開2001-124636號公報[Patent Document 1] Japanese Patent Laid-Open No. 2001-124636
[發明所欲解決之問題][Problems to be solved by the invention]
作為溫度調整裝置,不僅要求測定對象物之溫度,而且要求測定殼體之周圍溫度。殼體之周圍溫度接近於冷接點溫度,故習知亦考慮使用冷接點溫度作為周圍溫度。As a temperature adjustment device, it is required not only to measure the temperature of the object to be measured, but also to measure the temperature around the casing. The surrounding temperature of the housing is close to the cold junction temperature, so it is conventional to consider using the cold junction temperature as the ambient temperature.
然而,冷接點溫度會受溫度調整裝置之配置於殼體內部之發熱源之影響而變化。因此,冷接點溫度與周圍溫度未必一致。進而,該影響會根據溫度調整裝置之殼體之配置方向(配置態樣)而變化。However, the temperature of the cold junction will be affected by the heat source disposed inside the housing of the temperature adjustment device. Therefore, the temperature of the cold junction and the surrounding temperature may not necessarily match. Furthermore, the influence will vary according to the arrangement direction (configuration aspect) of the housing of the temperature adjustment device.
因此,於將冷接點溫度作為周圍溫度之習知之溫度測定方法中,無法將該影響充分地抵消,從而於周圍溫度中會有誤差。Therefore, in the conventional temperature measurement method using the cold junction temperature as the ambient temperature, the influence cannot be sufficiently cancelled, and there will be an error in the ambient temperature.
因此,本發明之目的在於提供一種可抑制內部發熱源之影響、配置態樣之影響,從而精度更佳地測定周圍溫度之溫度測定技術。 [解決問題之技術手段]Therefore, an object of the present invention is to provide a temperature measurement technology that can suppress the influence of the internal heat source and the influence of the arrangement state, thereby measuring the surrounding temperature more accurately. [Technical means to solve the problem]
根據本發明之一例,溫度測定裝置具備端子溫度測定元件、第1內部溫度測定元件、第2內部溫度測定元件、及控制部。端子溫度測定元件配置於殼體內之連接熱電偶之端子之附近。第1內部溫度測定元件於殼體內,配置於相較端子溫度測定元件更靠近發熱源之位置。第2內部溫度測定元件於殼體內,於相較端子溫度測定元件更靠近發熱源之位置,配置於與第1內部溫度測定元件所不同之位置。又,第1內部溫度測定元件、及第2內部溫度測定元件配置於第1內部溫度測定元件之來自發熱源之熱影響、與第2內部溫度測定元件之來自發熱源之熱影響之差會根據殼體之姿勢而變化的位置。控制部使用端子溫度測定元件所測定之端子溫度、第1內部溫度測定元件所測定之第1內部溫度、及第2內部溫度測定元件所測定之第2內部溫度而算出殼體之周圍溫度。According to an example of the present invention, the temperature measuring device includes a terminal temperature measuring element, a first internal temperature measuring element, a second internal temperature measuring element, and a control unit. The terminal temperature measuring element is arranged near the terminal connected to the thermocouple in the housing. The first internal temperature measuring element is arranged in the housing and is located closer to the heat source than the terminal temperature measuring element. The second internal temperature measuring element is located in the housing at a position closer to the heat source than the terminal temperature measuring element, and is arranged at a position different from the first internal temperature measuring element. In addition, the difference between the thermal influence of the first internal temperature measuring element and the second internal temperature measuring element arranged in the first internal temperature measuring element from the heat source and the thermal influence of the second internal temperature measuring element from the heat source is based on The position of the housing changes. The control unit uses the terminal temperature measured by the terminal temperature measuring element, the first internal temperature measured by the first internal temperature measuring element, and the second internal temperature measured by the second internal temperature measuring element to calculate the ambient temperature of the case.
該構成中,藉由使用內部溫度而抑制發熱源之熱對端子溫度之影響。進而,內部溫度之測定部位為殼體內之各不相同之複數個部位,藉此抑制殼體之姿勢對周圍溫度之算出結果造成之影響。In this configuration, by using the internal temperature, the influence of the heat of the heat source on the terminal temperature is suppressed. Furthermore, the measurement location of the internal temperature is a plurality of different locations within the housing, thereby suppressing the influence of the posture of the housing on the calculation result of the surrounding temperature.
根據本發明之一例,第2內部溫度測定元件配置於在殼體之第1姿勢下與第1內部溫度測定元件之熱影響相同、且於殼體之第2姿勢下與第1內部溫度測定元件之熱影響不同的位置。According to an example of the present invention, the second internal temperature measuring element is disposed in the first posture of the casing having the same thermal influence as the first internal temperature measuring element, and in the second posture of the casing and the first internal temperature measuring element The heat affects different locations.
該構成中,使用有用以算出周圍溫度之第1內部溫度與第2內部溫度之修正項之設定變得容易。In this configuration, it is easy to use the setting of the correction terms for the first internal temperature and the second internal temperature that are useful for calculating the ambient temperature.
根據本發明之一例,於控制部算出周圍溫度之算出式中,包含端子溫度與第1內部溫度之差分項,該差分項之修正係數係根據第1內部溫度與上述第2內部溫度而算出之值。According to an example of the present invention, the calculation formula for calculating the ambient temperature by the control unit includes a difference term between the terminal temperature and the first internal temperature, and the correction coefficient of the difference term is calculated based on the first internal temperature and the second internal temperature value.
該構成中,並未使用複雜的算出式算出周圍溫度。In this configuration, the ambient temperature is not calculated using a complicated calculation formula.
根據本發明之一例,修正係數係與第1內部溫度與第2內部溫度之比相對應的值。According to an example of the present invention, the correction coefficient is a value corresponding to the ratio of the first internal temperature to the second internal temperature.
該構成中,使用簡單的算出式算出周圍溫度。 [發明之效果]In this configuration, the ambient temperature is calculated using a simple calculation formula. [Effect of invention]
根據本發明,可抑制內部之發熱源之影響、配置態樣之影響,從而精度更佳地測定周圍溫度。According to the present invention, the influence of the internal heat source and the influence of the configuration can be suppressed, so that the surrounding temperature can be measured more accurately.
以下,參照圖式對本發明之實施形態進行說明。Hereinafter, an embodiment of the present invention will be described with reference to the drawings.
∙應用例 首先,對本發明之實施形態之溫度調整裝置之應用例進行說明。圖1係本發明之實施形態之溫度調整裝置之功能方塊圖。∙Application examples First, an application example of the temperature adjusting device according to the embodiment of the present invention will be described. FIG. 1 is a functional block diagram of a temperature adjustment device according to an embodiment of the present invention.
如圖1所示,溫度調整裝置10具備主控制部20、端子溫度測定元件30、第1內部溫度測定元件31、及第2內部溫度測定元件32。又,溫度調整裝置10具有藉由驅動而產生熱之發熱源110。發熱源110中,例如包含主控制部20、通訊部51、控制輸出部52、及電源供給部70。此外,發熱源110之構成並不限於該等,且並非限於該等之組合。As shown in FIG. 1, the
端子溫度測定元件30配置於熱電偶連接端子60之附近。端子溫度測定元件30測定端子溫度Tb,且輸出至主控制部20。The terminal
第1內部溫度測定元件31配置於相較端子溫度測定元件30更易受到發熱源110之熱之影響的位置。第1內部溫度測定元件31測定第1內部溫度Tin1,且輸出至主控制部20。The first internal
第2內部溫度測定元件32配置於來自發熱源110之熱之影響根據溫度調整裝置10之殼體之姿勢而與第1內部溫度測定元件31不同之位置。第2內部溫度測定元件32測定第2內部溫度Tin2,且輸出至主控制部20。The second internal
主控制部20使用端子溫度Tb、第1內部溫度Tin1、及第2內部溫度Tin2,根據下式算出周圍溫度Ta。The
Ta=Tb-Tg (式1) Tg=(Tin1-Tb)×a+b (式2) 此外,a、b係根據第1內部溫度Tin1與第2內部溫度Tin2而設定之修正值。 又,(Tin1-Tb)相當於本發明中提及之差分項,a相當於本發明中提及之修正係數。進而,如下所述,a係與第1內部溫度Tin1和第2內部溫度Tin2之比相對應的值。Ta=Tb-Tg (Formula 1) Tg=(Tin1-Tb)×a+b (Equation 2) In addition, a and b are correction values set based on the first internal temperature Tin1 and the second internal temperature Tin2. In addition, (Tin1-Tb) corresponds to the difference term mentioned in the present invention, and a corresponds to the correction coefficient mentioned in the present invention. Furthermore, as described below, a is a value corresponding to the ratio of the first internal temperature Tin1 and the second internal temperature Tin2.
藉由使用此種構成及處理,可於算出式上抑制來自溫度調整裝置10內之發熱源110之熱影響,且可抑制因殼體之姿勢導致來自發熱源110之熱影響之變化對周圍溫度Ta之算出造成的影響。藉此,溫度調整裝置10可精度更佳地算出周圍溫度Ta。By using such a configuration and processing, the thermal influence from the
∙構成例 參照圖式對本發明之實施形態之溫度調整裝置進行說明。圖1係本發明之實施形態之溫度調整裝置之功能方塊圖。∙Configuration example The temperature adjusting device according to the embodiment of the present invention will be described with reference to the drawings. FIG. 1 is a functional block diagram of a temperature adjustment device according to an embodiment of the present invention.
(功能方塊)
如圖1所示,溫度調整裝置10具備主控制部20、端子溫度測定元件30、第1內部溫度測定元件31、第2內部溫度測定元件32、溫度檢測信號產生部41、溫度檢測信號產生部42、溫度檢測信號產生部43、溫度檢測信號產生部44、通訊部51、控制輸出部52、通知部53、記憶部54、熱電偶連接端子60、及電源供給部70。(Function block)
As shown in FIG. 1, the
主控制部20係由CPU等運算處理元件構成,且執行下述之溫度測定、或溫度調整處理之程式。記憶部54係由揮發性及非揮發性之記憶器件構成。記憶部54連接於主控制部20。於非揮發性之記憶器件中,記憶有上述程式、及下述修正值。揮發性之記憶器件可用作主控制部20執行程式時之作業區域。The
端子溫度測定元件30、第1內部溫度測定元件31、及第2內部溫度測定元件32例如可藉由測熱電阻體、熱敏電阻、或使用有半導體等之溫度感測器而實現。The terminal
端子溫度測定元件30連接於溫度檢測信號產生部42。溫度檢測信號產生部42連接於主控制部20。The terminal
端子溫度測定元件30產生與所感知之溫度相對應之端子溫度之測定電壓。該端子溫度之測定電壓對應於端子溫度Tb。溫度檢測信號產生部42例如將端子溫度之測定電壓進行放大、A/D(類比/數位)轉換,且輸出至主控制部20。The terminal
第1內部溫度測定元件31連接於溫度檢測信號產生部43。溫度檢測信號產生部43連接於主控制部20。The first internal
第1內部溫度測定元件31產生與所感知之溫度相對應之第1內部溫度之測定電壓。該第1內部溫度之測定電壓對應於第1內部溫度Tin1。溫度檢測信號產生部43例如將第1內部溫度之測定電壓進行放大、A/D(類比/數位)轉換,且輸出至主控制部20。The first internal
第2內部溫度測定元件32連接於溫度檢測信號產生部44。溫度檢測信號產生部44連接於主控制部20。The second internal
第2內部溫度測定元件32產生與所感知之溫度相對應之第2內部溫度之測定電壓。該第2內部溫度之測定電壓對應於第2內部溫度Tin2。溫度檢測信號產生部44例如將第2內部溫度之測定電壓進行放大、A/D(類比/數位)轉換,且輸出至主控制部20。The second internal
熱電偶連接端子60連接於外部之熱電偶600,並且連接於溫度檢測信號產生部41。溫度檢測信號產生部41連接於主控制部20。The
熱電偶連接端子60產生與熱電偶600所感知之溫度相對應之測定電壓。該測定電壓對應於修正前之被偵測體之溫度。溫度檢測信號產生部41例如將修正前之被偵測體之測定電壓進行放大、A/D(類比/數位)轉換,且輸出至主控制部20。The
主控制部20使用端子溫度Tb、第1內部溫度Tin1、及第2內部溫度Tin2而算出周圍溫度Ta。所謂周圍溫度Ta係對應於溫度調整裝置10之熱電偶連接端子60附近之溫度。此外,周圍溫度Ta之具體之算出方法將於以下敍述。The
又,主控制部20使用所算出之端子溫度Tb,根據已知之方法對修正前之被偵測體之溫度進行修正,算出被偵測體之溫度。進而,主控制部20使用所算出之被偵測體之溫度與目標溫度之差而產生溫度控制信號,且輸出至控制輸出部52。溫度控制信號係以使所算出之被偵測體之溫度與目標溫度之差接近於0之方式對控制輸出部52進行控制的信號。In addition, the
通訊部51例如由通訊用之介面IC等構成。通訊部51連接於主控制部20,並且連接於外部之控制網路等。通訊部51例如將由主控制部20算出之周圍溫度Ta、及修正後之被偵測體之溫度之至少一者經由控制網路而發送至其他的控制機器、資料庫等。The
控制輸出部52例如藉由電力控制用之電晶體等構成。控制輸出部52連接於主控制部20,並且連接於控制對加熱被偵測體之加熱器等通電之外部已知的電力控制裝置。藉由電力控制裝置之經由該控制輸出部52之控制而實現對被偵測體之溫度調整。The
通知部53例如藉由LED、液晶顯示面板等構成。通知部53連接於主控制部20。通知部53顯示由主控制部20算出之周圍溫度Ta、修正後之被偵測體之溫度、及溫度調整之狀態等之任一者。The
電源供給部70經由電源用之匯流排線等而連接於外部電源700。電源供給部70自外部電源700接收電力之供給,轉換為與各個功能部相對應之電壓,且將電力供給至必要之各功能部(圖1中所示之以較粗之虛線包圍的部分)。The
於此種構成中,藉由驅動而產生熱之部分成為溫度調整裝置10之發熱源110。例如,於圖1之例中,發熱源110相當於圖1中所示之以較細之虛線包圍的影線部分,且包含主控制部20、通訊部51、控制輸出部52、及電源供給部70。In such a configuration, the portion that generates heat by driving becomes the
(構造) 圖2(A)係溫度調整裝置之前視圖,圖2(B)係表示溫度調整裝置之概略內部構造之側面剖面圖。(structure) FIG. 2(A) is a front view of the temperature adjusting device, and FIG. 2(B) is a side cross-sectional view showing a schematic internal structure of the temperature adjusting device.
如圖2(A)、圖2(B)所示,溫度調整裝置10具備殼體90、及基板900。殼體90具備正面壁901、背面壁902、頂面壁903、底面壁904、側面壁905、及側面壁906。殼體90具有由該等壁所包圍之內部空間。於正面壁901上,配置有熱電偶連接端子60。As shown in FIGS. 2(A) and 2(B), the
於基板900上,安裝有上述之主控制部20、端子溫度測定元件30、第1內部溫度測定元件31、第2內部溫度測定元件32、溫度檢測信號產生部41、溫度檢測信號產生部42、溫度檢測信號產生部43、溫度檢測信號產生部44、通訊部51、控制輸出部52、通知部53、記憶部54、及實現電源供給部70之器件。此外,通知部53亦可不直接安裝於基板900。On the
此時,如圖2(B)所示,端子溫度測定元件30配置於基板900之正面壁901之附近、即熱電偶連接端子60之附近。At this time, as shown in FIG. 2(B), the terminal
第1內部溫度測定元件31及第2內部溫度測定元件32與端子溫度測定元件30相比,配置於容易受到發熱源110之熱影響之位置。所謂容易受到發熱源110之熱影響之位置例如係至發熱源110之物理距離較近之位置,又,其係至發熱源110之導熱較高之位置。The first internal
進而,第1內部溫度測定元件31與第2內部溫度測定元件32配置於在殼體90之第1姿勢下來自發熱源110之熱影響大致相同、且於殼體90之第1姿勢以外之姿勢(第2姿勢、第3姿勢)下來自發熱源110之熱影響不同的位置。此外,此處,所謂第1姿勢係圖2(B)所示之頂面壁903成為殼體90之上側之姿勢,所謂第2姿勢係圖3(A)所示之正面壁901成為殼體90之上側之姿勢,所謂第3姿勢係圖3(B)所示之背面壁902成為殼體90之上側之姿勢。Furthermore, the first internal
而且,作為具體之一例,如圖2(B)、圖3(A)、圖3(B)所示,第1內部溫度測定元件31與第2內部溫度測定元件32於連結殼體90之頂面壁903與底面壁904之方向上,相對於發熱源110配置於相同之側,且該方向上之距發熱源110之距離亦大致相同。進而,第2內部溫度測定元件32相對於第1內部溫度測定元件31配置於朝正面壁901側隔開規定距離之位置。換言之,第2內部溫度測定元件32配置於端子溫度測定元件30與第1內部溫度測定元件31之間。Furthermore, as a specific example, as shown in FIGS. 2(B), 3(A), and 3(B), the first internal
藉由設為此種構造,於圖2(B)所示之第1姿勢下,第1內部溫度測定元件31與第2內部溫度測定元件32受到來自發熱源110之熱影響大致相同。於圖3(A)所示之第2姿勢下,第2內部溫度測定元件32與端子溫度測定元件30同樣地,相較第1內部溫度測定元件31更易受到發熱源110之熱影響。
於圖3(B)所示之第3姿勢下,第2內部溫度測定元件32與端子溫度測定元件30同樣地,相較第1內部溫度測定元件31更難受到發熱源110之熱影響。With such a structure, in the first posture shown in FIG. 2(B), the first internal
圖4(A)係表示朝正面配置(第1姿勢)下的周圍溫度、端子溫度、內部溫度(第1內部溫度)之受內部發熱之影響之大小的圖。圖4(B)係表示朝上配置(第2姿勢)下的周圍溫度、端子溫度、內部溫度(第1內部溫度)之受內部發熱之影響之大小的圖。圖4(C)係表示朝下配置(第3姿勢)下的周圍溫度、端子溫度、內部溫度(第1內部溫度)之受內部發熱之影響之大小的圖。FIG. 4(A) is a diagram showing the influence of internal heat on the ambient temperature, terminal temperature, and internal temperature (first internal temperature) in a front-facing configuration (first posture). FIG. 4(B) is a graph showing the influence of internal heat on the ambient temperature, terminal temperature, and internal temperature (first internal temperature) in the upward arrangement (second posture). FIG. 4(C) is a graph showing the influence of internal heat on the ambient temperature, terminal temperature, and internal temperature (first internal temperature) in the downward arrangement (third posture).
如圖4(A)、圖4(B)、圖4(C)所示,不論配置(姿勢)為何,周圍溫度Ta幾乎不變化。另一方面,端子溫度Tb及第1內部溫度Tin1根據姿勢而變化。例如,如圖4(A)所示,於朝正面配置(第1姿勢)下,端子溫度Tb及第1內部溫度Tin1根據負載之大小而受到類似之影響。如圖4(B)所示,於朝上配置(第2姿勢)下,端子溫度Tb相較第1內部溫度Tin1更大地受到熱之影響。相反地,如圖4(C)所示,於朝下配置(第3姿勢)下,第1內部溫度Tin1相較端子溫度Tb更大地受到熱之影響。As shown in FIGS. 4(A), 4(B), and 4(C), the ambient temperature Ta hardly changes regardless of the arrangement (posture). On the other hand, the terminal temperature Tb and the first internal temperature Tin1 change according to the posture. For example, as shown in FIG. 4(A), in the front-facing configuration (first posture), the terminal temperature Tb and the first internal temperature Tin1 are similarly affected according to the magnitude of the load. As shown in FIG. 4(B), in the upward arrangement (second posture), the terminal temperature Tb is more affected by heat than the first internal temperature Tin1. Conversely, as shown in FIG. 4(C), in the downward arrangement (third posture), the first internal temperature Tin1 is more affected by heat than the terminal temperature Tb.
此種發熱源110位於溫度調整裝置10之情形時,端子溫度Tb會受到由發熱源110產生之熱的影響,從而產生誤差。When the
為了修正此種發熱源110之熱影響所導致的誤差,溫度調整裝置10執行以下所示之構成及處理。In order to correct the error caused by the heat effect of the
圖5係表示第1內部溫度Tin1與第2內部溫度Tin2之差與各姿勢之關係的圖。FIG. 5 is a diagram showing the relationship between the difference between the first internal temperature Tin1 and the second internal temperature Tin2 and each posture.
如上述之圖2(B)、圖3(A)、圖3(B)所示,第2內部溫度測定元件32配置於端子溫度測定元件30與第1內部溫度測定元件31之間。因此,第2內部溫度測定元件32因發熱受到之影響相較第1內部溫度測定元件31因發熱受到之影響,更接近於端子溫度測定元件30因發熱受到之影響。As shown in FIGS. 2(B), 3(A), and 3(B) described above, the second internal
藉此,如圖5所示,由第1內部溫度Tin1減去第2內部溫度Tin2所得之值於朝正面配置(第1姿勢)下大致為0,於朝上配置(第2姿勢)下成為負值,於朝下配置(第3姿勢)下成為正值。By this, as shown in FIG. 5, the value obtained by subtracting the second internal temperature Tin2 from the first internal temperature Tin1 becomes approximately 0 in the front-facing configuration (first posture), and becomes in the upward-facing configuration (second posture) A negative value becomes a positive value in the downward arrangement (third posture).
即,藉由將該相減所得之值用於周圍溫度Ta之算出式之修正,能夠抑制因姿勢導致的誤差。That is, by using the value obtained by the subtraction for the correction of the calculation formula of the ambient temperature Ta, it is possible to suppress errors due to posture.
主控制部20使用以下各式算出周圍溫度Ta。The
Ta=Tb-Tg (式1) Tg=(Tin1-Tb)×a+b (式2) a=(Tin2/Tin1)×c (式3) b=(Tin2/Tin1)×d (式4) 此外,如上所述,Tb為端子溫度,Tg為熱誤差,Tin1為第1內部溫度,Tin2為第2內部溫度。又,c、d係預先藉由實驗等決定之修正值。 如根據式3而明確,a係與第1內部溫度Tin1和第2內部溫度Tin2之比相對應的值。Ta=Tb-Tg (Formula 1) Tg=(Tin1-Tb)×a+b (Equation 2) a=(Tin2/Tin1)×c (Equation 3) b=(Tin2/Tin1)×d (Equation 4) As described above, Tb is the terminal temperature, Tg is the thermal error, Tin1 is the first internal temperature, and Tin2 is the second internal temperature. In addition, c and d are correction values determined in advance by experiments or the like. As is clear from Equation 3, a is a value corresponding to the ratio of the first internal temperature Tin1 and the second internal temperature Tin2.
藉由使用該等式而修正端子溫度Tb中包含之因發熱源110導致之熱誤差Tg。又,可抑制因發熱源110使熱誤差Tg受到之影響。The thermal error Tg due to the
藉此,主控制部20不會受到發熱源110之發熱狀態、殼體90之姿勢之影響,從而可精度良好地算出周圍溫度Ta。Thereby, the
修正值c、d例如只要如下所示進行設定即可。此外,以下之方法於不存在鄰接之機器、或不受到來自鄰接之機器之熱影響的條件下執行。The correction values c and d may be set as follows, for example. In addition, the following method is performed under the condition that there is no adjacent machine or is not affected by heat from the adjacent machine.
(A)第1方法(根據不同之兩種溫度條件而設定之方法)
(A-1)固定為一種姿勢(上述之朝正面配置(第1姿勢)),實現發熱源110之發熱最小之狀態。此時之溫度為任意,但設為一定。測定此時之端子溫度Tb、第1內部溫度Tin1並記錄。又,使用其他溫度測量器等測定周圍溫度Ta並記錄。此處,所謂發熱源110之發熱最小之狀態例如係控制輸出部52處於動作關閉狀態,通訊部51之通訊負載最小之狀態。(A) Method 1 (method set according to two different temperature conditions)
(A-1) It is fixed in a posture (the above-mentioned arrangement toward the front (first posture)), and the state of minimum heat generation of the
(A-2)於與上述(A-1)相同之動作狀態下,設為不同之一定溫度之狀態。測定此時之端子溫度Tb、第1內部溫度Tin1並記錄。又,使用其他溫度測量器等測定周圍溫度Ta並記錄。(A-2) Under the same operating state as the above (A-1), set to a state of a different constant temperature. The terminal temperature Tb and the first internal temperature Tin1 at this time are measured and recorded. In addition, the ambient temperature Ta is measured and recorded using another temperature measuring device or the like.
(A-3)將上述(A-1)、(A-2)之測定結果代入上述(式1)、(式2)中,自聯立方程式算出a、b。然後,將所算出之a設定為修正值c,將所算出之b設為為修正值d。(A-3) Substitute the measurement results of (A-1) and (A-2) above into (Equation 1) and (Equation 2), and calculate a and b from the simultaneous equations. Then, the calculated a is set as the correction value c, and the calculated b is set as the correction value d.
(B)第2方法(根據發熱之差成為最大之條件而設定之方法)
(B-1)與上述(A-1)同樣地,固定為一種姿勢(上述之朝正面配置(第1姿勢)),實現發熱源110之發熱最小之狀態。此時之溫度為任意,但設為一定。測定此時之端子溫度Tb、第1內部溫度Tin1並記錄。又,使用其他溫度測量器等測定周圍溫度Ta並記錄。(B) The second method (method set according to the condition where the difference in heat generation becomes maximum)
(B-1) In the same manner as in (A-1) above, it is fixed in a posture (the above-mentioned arrangement toward the front (first posture)) to achieve a state where the heat generation of the
(B-2)固定為一種姿勢(上述之朝正面配置(第1姿勢)),實現發熱源110之發熱最大之狀態。此時之溫度為任意,但設為一定。測定此時之端子溫度Tb、第1內部溫度Tin1並記錄。又,使用其他溫度測量器等測定周圍溫度Ta並記錄。此處,所謂發熱源110之發熱最大之狀態例如係控制輸出部52處於動作接通狀態,通訊部51之通訊負載最大之狀態。(B-2) It is fixed in a posture (the above-mentioned arrangement toward the front (first posture)) to achieve the state where the heat generation of the
(B-3)將上述(B-1)、(B-2)之測定結果代入上述(式1)、(式2)中,自聯立方程式算出a、b。然後,將所算出之a設定為修正值c,將所算出之b設定為修正值d。(B-3) Substitute the measurement results of (B-1) and (B-2) above into (Equation 1) and (Equation 2), and calculate a and b from the simultaneous equations. Then, the calculated a is set as the correction value c, and the calculated b is set as the correction value d.
藉由使用此種處理,而不使用複雜的算出式便可精度良好地算出周圍溫度Ta。By using such processing, the ambient temperature Ta can be accurately calculated without using a complicated calculation formula.
此外,於上述說明中,雖表示分為複數個功能方塊執行周圍溫度Ta之算出之態樣,但周圍溫度Ta之算出只要至少具有圖6所示之流程所示之處理即可。圖6係表示本發明之實施形態之溫度測定方法之流程圖。In the above description, although the calculation of the ambient temperature Ta is divided into a plurality of functional blocks, the calculation of the ambient temperature Ta only needs to have at least the processing shown in the flow shown in FIG. 6. Fig. 6 is a flowchart showing a temperature measurement method according to an embodiment of the present invention.
溫度調整裝置10取得端子溫度Tb(S11)。溫度調整裝置10取得第1內部溫度Tin1與第2內部溫度Tin2(S12)。溫度調整裝置10將端子溫度Tb、第1內部溫度Tin1、及第2內部溫度Tin2代入上述(式1)、(式2)中,算出周圍溫度Ta。The
又,於上述說明中,雖表示溫度調整裝置10之構成,但於不進行上述溫度調整用之處理之情形時,例如,於不具有控制輸出部52之構成之情形時,亦可用作溫度測定裝置。In the above description, although the configuration of the
又,於上述說明中,使用第1內部溫度Tin1與第2內部溫度Tin2之比作為周圍溫度Ta之算出用之修正係數。然而,只要係與使用有第1內部溫度Tin1與第2內部溫度Tin2之該比相當的值,則可用作修正係數。In the above description, the ratio of the first internal temperature Tin1 to the second internal temperature Tin2 is used as the correction coefficient for calculating the ambient temperature Ta. However, as long as a value corresponding to the ratio between the first internal temperature Tin1 and the second internal temperature Tin2 is used, it can be used as a correction coefficient.
10‧‧‧溫度調整裝置
20‧‧‧主控制部
30‧‧‧端子溫度測定元件
31‧‧‧第1內部溫度測定元件
32‧‧‧第2內部溫度測定元件
41、42、43、44‧‧‧溫度檢測信號產生部
51‧‧‧通訊部
52‧‧‧控制輸出部
53‧‧‧通知部
54‧‧‧記憶部
60‧‧‧熱電偶連接端子
70‧‧‧電源供給部
90‧‧‧殼體
110‧‧‧發熱源
600‧‧‧熱電偶
700‧‧‧外部電源
900‧‧‧基板
901‧‧‧正面壁
902‧‧‧背面壁
903‧‧‧頂面壁
904‧‧‧底面壁
905、906‧‧‧側面壁10‧‧‧
圖1係本發明之實施形態之溫度調整裝置之功能方塊圖。 圖2(A)係溫度調整裝置之前視圖,(B)係表示溫度調整裝置之概略內部構造之側面剖面圖。 圖3(A)、(B)係表示溫度調整裝置之複數個姿勢之一例之圖。 圖4(A)、(B)、(C)係表示姿勢對溫度之影響之曲線圖。 圖5係表示第1內部溫度Tin1與第2內部溫度Tin2之差、與各姿勢之關係的圖。 圖6係表示本發明之實施形態之溫度測定方法之流程圖。FIG. 1 is a functional block diagram of a temperature adjustment device according to an embodiment of the present invention. FIG. 2 (A) is a front view of the temperature adjusting device, and (B) is a side cross-sectional view showing a schematic internal structure of the temperature adjusting device. 3(A) and (B) are diagrams showing an example of a plurality of postures of the temperature adjustment device. Figure 4 (A), (B), (C) are graphs showing the effect of posture on temperature. 5 is a graph showing the relationship between the difference between the first internal temperature Tin1 and the second internal temperature Tin2 and each posture. Fig. 6 is a flowchart showing a temperature measurement method according to an embodiment of the present invention.
10‧‧‧溫度調整裝置 10‧‧‧Temperature adjustment device
20‧‧‧主控制部 20‧‧‧Main Control Department
30‧‧‧端子溫度測定元件 30‧‧‧Terminal temperature measuring element
31‧‧‧第1內部溫度測定元件 31‧‧‧First internal temperature measuring element
32‧‧‧第2內部溫度測定元件 32‧‧‧Second internal temperature measuring element
41、42、43、44‧‧‧溫度檢測信號產生部 41, 42, 43, 44 ‧‧‧ temperature detection signal generation section
51‧‧‧通訊部 51‧‧‧Communications Department
52‧‧‧控制輸出部 52‧‧‧Control output
53‧‧‧通知部 53‧‧‧Notification Department
54‧‧‧記憶部 54‧‧‧ Memory Department
60‧‧‧熱電偶連接端子 60‧‧‧thermocouple connection terminal
70‧‧‧電源供給部 70‧‧‧Power Supply Department
110‧‧‧發熱源 110‧‧‧Fever
600‧‧‧熱電偶 600‧‧‧thermocouple
700‧‧‧外部電源 700‧‧‧External power supply
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DE102013109809A1 (en) * | 2013-09-09 | 2015-03-12 | Endress + Hauser Wetzer Gmbh + Co. Kg | Method for determining the reference junction temperature of a thermocouple |
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JPH09133588A (en) * | 1995-11-10 | 1997-05-20 | Omron Corp | Zero contact compensator and compensation method for temperature measuring apparatus |
TW201205053A (en) * | 2010-03-31 | 2012-02-01 | Microchip Tech Inc | Thermocouple electromotive force voltage to temperature converter with integrated cold-junction compensation and linearization |
TW201506368A (en) * | 2013-03-12 | 2015-02-16 | Lam Res Corp | Multichannel thermocouple compensation for three dimensional temperature gradient |
DE102013109809A1 (en) * | 2013-09-09 | 2015-03-12 | Endress + Hauser Wetzer Gmbh + Co. Kg | Method for determining the reference junction temperature of a thermocouple |
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