TWI689352B - Spray etching device - Google Patents
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- TWI689352B TWI689352B TW105116872A TW105116872A TWI689352B TW I689352 B TWI689352 B TW I689352B TW 105116872 A TW105116872 A TW 105116872A TW 105116872 A TW105116872 A TW 105116872A TW I689352 B TWI689352 B TW I689352B
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- 239000007921 spray Substances 0.000 title claims abstract description 121
- 238000005530 etching Methods 0.000 title claims abstract description 120
- 239000000758 substrate Substances 0.000 claims abstract description 68
- 239000011521 glass Substances 0.000 claims abstract description 48
- 239000007788 liquid Substances 0.000 claims abstract description 48
- 238000000034 method Methods 0.000 claims description 23
- 230000008569 process Effects 0.000 claims description 17
- 238000005507 spraying Methods 0.000 claims description 5
- 238000012423 maintenance Methods 0.000 abstract description 6
- 230000007246 mechanism Effects 0.000 description 13
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 9
- 238000007781 pre-processing Methods 0.000 description 8
- 238000005406 washing Methods 0.000 description 8
- 238000004140 cleaning Methods 0.000 description 7
- 239000002253 acid Substances 0.000 description 5
- 230000014759 maintenance of location Effects 0.000 description 5
- 239000010802 sludge Substances 0.000 description 5
- 230000005540 biological transmission Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 239000002244 precipitate Substances 0.000 description 3
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 2
- 238000007654 immersion Methods 0.000 description 2
- 238000007726 management method Methods 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 230000000717 retained effect Effects 0.000 description 2
- 238000001039 wet etching Methods 0.000 description 2
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 1
- 239000004698 Polyethylene Substances 0.000 description 1
- 239000004699 Ultra-high molecular weight polyethylene Substances 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 229920001577 copolymer Polymers 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 238000009499 grossing Methods 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000000873 masking effect Effects 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- -1 polytetrafluoroethylene Polymers 0.000 description 1
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 1
- 239000004810 polytetrafluoroethylene Substances 0.000 description 1
- 229920000915 polyvinyl chloride Polymers 0.000 description 1
- 239000004800 polyvinyl chloride Substances 0.000 description 1
- 238000002203 pretreatment Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229920000785 ultra high molecular weight polyethylene Polymers 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
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- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Weting (AREA)
- Surface Treatment Of Glass (AREA)
- ing And Chemical Polishing (AREA)
Abstract
提供一種讓維護變得容易,並且容易謀求裝置的輕便化,且可執行高品質的噴灑蝕刻處理之噴灑蝕刻裝置。 Provided is a spray etching device that facilitates maintenance and facilitates the lightening of the device and can perform high-quality spray etching processing.
噴灑蝕刻裝置,至少包含蝕刻腔室(16)、送液單元(40)、及驅動單元(50),它們的送液單元(40)、蝕刻腔室(16)、及驅動單元(50)朝與玻璃基板(100)的搬運方向正交之寬度方向排列。蝕刻腔室(16),至少包含構成為對玻璃基板(100)噴灑蝕刻液之可移動的上側噴灑配管單元(162)及下側噴灑配管單元(164)。 The spray etching device at least includes an etching chamber (16), a liquid sending unit (40), and a driving unit (50), and their liquid sending unit (40), etching chamber (16), and driving unit (50) face The glass substrate (100) is arranged in the width direction orthogonal to the conveying direction. The etching chamber (16) at least includes a movable upper spray piping unit (162) and a lower spray piping unit (164) configured to spray the glass substrate (100) with an etching solution.
Description
本發明有關構成為對玻璃基板等被處理基板進行蝕刻處理之蝕刻裝置。 The present invention relates to an etching apparatus configured to perform etching processing on a substrate to be processed such as a glass substrate.
行動電話、電腦、液晶電視等所使用之玻璃基板的薄型化加工或切斷加工中,運用蝕刻處理的機會逐漸增加。其理由在於,當對玻璃基板施以機械加工的情形下於加工時容易產生傷痕,相對於此當做蝕刻處理的情形下於加工時則不會產生傷痕。藉由使用蝕刻處理,可提高加工後的玻璃基板的強度。 In the thinning or cutting of glass substrates used in mobile phones, computers, LCD TVs, etc., opportunities for applying etching treatment are gradually increasing. The reason is that, when mechanical processing is applied to the glass substrate, scratches are likely to be generated during processing, whereas in the case of etching processing, no scratches are generated during processing. By using an etching process, the strength of the processed glass substrate can be improved.
作為對於玻璃基板之蝕刻處理的代表例,可舉出使用氫氟酸等蝕刻液之濕蝕刻處理。此濕蝕刻處理,若要概分,可分成令玻璃基板浸漬於收容有蝕刻液的浴槽之浸泡方式、及從噴灑噴嘴將蝕刻液對玻璃基板噴灑之噴灑方式。而以往向來是廣泛使用構成簡單,設備費用相對低廉的浸泡方式之蝕刻處理。 As a representative example of the etching process for the glass substrate, a wet etching process using an etchant such as hydrofluoric acid may be mentioned. This wet etching process can be divided into an immersion method of immersing the glass substrate in the bath containing the etching solution and a spraying method of spraying the etching solution on the glass substrate from the spray nozzle. In the past, it has been widely used in the etching process with a simple structure and a relatively low equipment cost in the immersion method.
不過,近年來,噴灑方式之濕蝕刻處理逐漸變得受歡迎,一般認為其污泥(sludge)等析出物的管理 容易,且蝕刻速率的管理亦容易進行(例如參照專利文獻1)。藉由進行這樣的噴灑方式之蝕刻處理,一般認為便能夠良好地進行講求尺寸精度之玻璃基板的加工。 However, in recent years, the spray etching method has gradually become popular, and it is generally considered that the sludge (sludge) and other precipitates are managed It is easy, and the management of the etching rate is also easy (for example, refer to Patent Document 1). By performing etching treatment by such a spray method, it is generally considered that the processing of a glass substrate requiring dimensional accuracy can be performed satisfactorily.
[專利文獻1]日本再表2013-118867號公報 [Patent Document 1] Japanese Republished Publication No. 2013-118867
然而,即使在噴灑方式之蝕刻裝置中,污泥等析出物的管理仍可能成為問題。例如,在將水平載置的玻璃基板從上下予以噴灑蝕刻之構成中,在玻璃基板的上側可能有蝕刻液滯留。 However, even in a spray-type etching apparatus, the management of sludge and other precipitates may still be a problem. For example, in a configuration in which a horizontally placed glass substrate is sprayed and etched from above and below, etching liquid may be retained on the upper side of the glass substrate.
蝕刻液的滯留容易影響蝕刻處理的品質,因此較佳是適當地抑制蝕刻液的滯留。若為了防止此玻璃基板的上側的滯留,而採用令蝕刻的噴灑角度可變之驅動機構的情形下,必須對此驅動機構頻繁地進行適當的維護。特別是當在容易受到蝕刻環境的影響之位置配置驅動機構的情形下,驅動機構的維護必須細心注意。此外,依驅動機構的配置而定,蝕刻裝置的設計可能會受到限制,或蝕刻裝置可能會大型化。 The retention of the etching solution easily affects the quality of the etching process, so it is preferable to appropriately suppress the retention of the etching solution. In order to prevent the retention of the upper side of the glass substrate, in the case where a drive mechanism that changes the spray angle of etching is used, the drive mechanism must be frequently properly maintained. Especially when the drive mechanism is arranged in a position that is easily affected by the etching environment, the drive mechanism must be carefully maintained. In addition, depending on the configuration of the driving mechanism, the design of the etching device may be limited, or the etching device may be enlarged.
本發明之目的,在於提供一種讓維護變得容易,並且容易謀求裝置的輕便化,且可執行高品質的噴灑 蝕刻處理之噴灑蝕刻裝置。 The object of the present invention is to provide a maintenance that is easy, and the device is easy to make lightweight, and can perform high-quality spraying Spray etching device for etching process.
本發明之噴灑蝕刻裝置,構成為對玻璃基板等被處理基板進行噴灑方式之蝕刻處理。此噴灑蝕刻裝置,具備蝕刻腔室、送液單元、及驅動單元。蝕刻腔室,至少包含構成為對朝規定的搬運方向被依序搬運之被處理基板噴灑蝕刻液之可移動的噴灑配管單元。作為噴灑配管單元的構成例,可舉出將設有複數個吐出蝕刻液的噴灑噴嘴之噴灑配管排列複數個並藉由框構件或外殼構件予以單元化而成之構成。 The spray etching apparatus of the present invention is configured to perform a spray-type etching process on a substrate to be processed such as a glass substrate. The spray etching device includes an etching chamber, a liquid sending unit, and a driving unit. The etching chamber includes at least a movable spray piping unit configured to spray the etching liquid to the substrates to be sequentially transported in a predetermined transport direction. As a configuration example of the spray piping unit, a plurality of spray pipes provided with a plurality of spray nozzles for discharging etching liquid are arranged and unitized by a frame member or a housing member.
送液單元,構成為對噴灑配管單元供給蝕刻液。作為送液單元的例子,可舉出具備將蝕刻液槽與蝕刻腔室予以連接的配管群、及設於該些配管群的泵浦類或壓力計等計器類之送液系機構。藉由送液單元,蝕刻液槽中收容的蝕刻液被供給至蝕刻腔室內的噴灑配管單元。此外,視必要,送液單元構成為對各腔室送出蝕刻液以外的液(洗淨液、水等)。另,作為噴灑配管單元的移動方向的代表例,可舉出與被處理基板的搬運方向正交之方向,但亦可構成為朝斜方向移動或以描繪圓的方式移動等。 The liquid feeding unit is configured to supply the etching liquid to the spray piping unit. As an example of the liquid supply unit, a liquid supply mechanism including a piping group that connects the etching solution tank and the etching chamber, and instruments such as pumps or pressure gauges provided in the piping group may be mentioned. With the liquid feed unit, the etching liquid contained in the etching liquid tank is supplied to the spray piping unit in the etching chamber. In addition, if necessary, the liquid feeding unit is configured to send liquids (cleaning liquid, water, etc.) other than the etching liquid to each chamber. In addition, as a representative example of the moving direction of the spray piping unit, a direction orthogonal to the conveying direction of the substrate to be processed may be mentioned, but it may be configured to move in an oblique direction or to move in such a manner as to draw a circle.
驅動單元,構成為至少對噴灑配管單元從蝕刻腔室的外側傳遞驅動力。作為驅動單元的構成例,可舉出將電動機等驅動源、及齒條與齒輪(rack and pinion)機構或曲柄機構等傳遞機構予以單元化而成者。例如,若 從驅動單元透過軸棒等對噴灑配管單元施加推壓力或拉伸力,則噴灑配管單元會在直線上做往復移動。考量噴灑配管單元的維護性,噴灑配管單元較佳是構成為能夠選擇性地解除與驅動單元之連接狀態。 The driving unit is configured to transmit the driving force from the outside of the etching chamber to at least the spray piping unit. Examples of the configuration of the drive unit include a drive source such as a motor and a transmission mechanism such as a rack and pinion mechanism or a crank mechanism. For example, if When a pushing force or a tensile force is applied to the spray piping unit from the drive unit through the shaft bar, etc., the spray piping unit will reciprocate on a straight line. In consideration of the maintainability of the spray piping unit, the spray piping unit is preferably configured to be able to selectively release the connection state with the drive unit.
又,上述噴灑蝕刻裝置中,送液單元、蝕刻腔室、及驅動單元係朝與被處理基板的搬運方向正交之寬度方向排列。藉由採用此排列,當沿著玻璃基板的搬運方向排列蝕刻腔室時,送液單元或驅動單元便不會有物理上的干涉。特別是,當連續地排列蝕刻腔室時,便不必在各蝕刻腔室間配置送液單元或驅動單元,因此裝置的搬運方向的長度不會變得超出必要地長,不會讓裝置大型化。 In addition, in the above-mentioned spray etching apparatus, the liquid supply unit, the etching chamber, and the drive unit are arranged in the width direction orthogonal to the conveyance direction of the substrate to be processed. By adopting this arrangement, when the etching chambers are arranged along the conveying direction of the glass substrate, there is no physical interference of the liquid sending unit or the driving unit. In particular, when the etching chambers are continuously arranged, it is not necessary to arrange the liquid supply unit or the driving unit between the etching chambers, so the length of the device in the transport direction does not become longer than necessary, and the device does not increase in size .
此外,構成為將噴灑配管單元予以單元化而對單元全體施加驅動力使其移動,因此在噴灑配管單元內便不必具有可動部。因此,相較於驅動各噴嘴每一者的情形或採用對各配管每一者傳遞驅動力之構成的情形下而言不易發生故障。此外,藉由準備備用的噴灑配管單元等,便可從蝕刻裝置將噴灑配管單元全體拆卸後進行各噴嘴或配管的維護等,因此維護變得容易進行。 In addition, since the spray piping unit is unitized and a driving force is applied to the entire unit to move it, it is not necessary to have a movable portion in the spray piping unit. Therefore, compared with the case where each of the nozzles is driven or the case where the driving force is transmitted to each of the pipes, a failure is less likely to occur. In addition, by preparing a spare spray piping unit, etc., the entire spray piping unit can be detached from the etching apparatus, and maintenance of each nozzle or piping can be performed. Therefore, maintenance becomes easy.
藉由一面對噴灑配管單元施加驅動力一面進行蝕刻處理,被處理基板的上側之蝕刻液的滯留便不易發生,而防止蝕刻液的滯留所引起之蝕刻不均等的發生。而且,也變得容易防止噴嘴或配管之堵塞或污泥堆積等的發生,因此容易實現蝕刻處理的高品質化。 By performing the etching process while applying a driving force to the spray piping unit, the retention of the etching solution on the upper side of the substrate to be processed is less likely to occur, and the occurrence of uneven etching due to the retention of the etching solution is prevented. Also, it becomes easy to prevent clogging of nozzles or pipes, sludge accumulation, etc., so that it is easy to achieve high-quality etching treatment.
上述噴灑蝕刻裝置中,較佳是構成為,噴灑 配管單元,其腳部被朝寬度方向延伸直線狀之導引構件滑動自如地支撐,驅動單元,將用來讓噴灑配管單元沿著導引構件做往復滑動移動之力施加於噴灑配管單元。藉由採用這樣的構成,可令噴灑配管單元於寬度方向良好地做往復移動,因此會防止蝕刻液滯留在被處理基板的上側。此外,可藉由單純的構成令噴灑配管單元驅動,因此會抑制驅動機構的問題發生。 In the above-mentioned spray etching apparatus, it is preferable that In the piping unit, the leg portion is slidably supported by a linear guide member extending in the width direction, and the driving unit applies a force for reciprocating sliding movement of the spray piping unit along the guide member to the spray piping unit. By adopting such a configuration, the spray piping unit can be reciprocated well in the width direction, so that the etching liquid can be prevented from staying on the upper side of the substrate to be processed. In addition, the spray piping unit can be driven by a simple structure, so that the problem of the driving mechanism is suppressed.
此外,噴灑配管單元,雖亦可配置於被處理基板的搬運路徑的上側或下側之任一方,但較佳是,噴灑配管單元,係構成為由配置於被處理基板的搬運路徑的上側之上側噴灑配管單元、及配置於被處理基板的搬運路徑的下側之下側噴灑配管單元所構成。特別是在此情形下,較佳是,送液單元的下部與上側噴灑配管單元係藉由具備可撓性之軟管而被連接,並且送液單元的上部與下側噴灑配管單元係藉由具備可撓性之軟管而被連接。藉由採用這樣的構成,軟管會變得充分地長,變得容易伴隨噴灑配管單元的移動而良好地使其撓曲。 In addition, the spray piping unit may be disposed on either the upper side or the lower side of the conveying path of the substrate to be processed, but preferably, the spray piping unit is configured to be disposed on the upper side of the conveying path of the substrate to be processed The upper-side spray piping unit and the lower-side spray piping unit disposed below the conveyance path of the substrate to be processed. Especially in this case, it is preferable that the lower part of the liquid supply unit and the upper side spray piping unit are connected by a flexible hose, and the upper part of the liquid supply unit and the lower side spray piping unit are It is connected with a flexible hose. With such a configuration, the hose becomes sufficiently long, and it becomes easy to flex it well as the spray piping unit moves.
按照本發明,可讓維護變得容易,並且容易謀求裝置的輕便化,且執行高品質的噴灑蝕刻處理。 According to the present invention, maintenance can be facilitated, the device can be made lighter, and high-quality spray etching can be performed.
10:蝕刻裝置 10: Etching device
12:導入部 12: Introduction Department
14:前處理腔室 14: Pre-treatment chamber
16:蝕刻腔室 16: Etching chamber
18:洗淨腔室 18: washing chamber
20:排出部 20: Discharge section
30:搬運輥 30: handling roller
40:送液單元 40: Liquid delivery unit
50:驅動單元 50: drive unit
100:玻璃基板 100: glass substrate
162:上側噴灑配管單元 162: Upper spray piping unit
164:下側噴灑配管單元 164: Lower spray piping unit
166:上側軟管單元 166: Upper hose unit
167:下側軟管單元 167: Lower hose unit
168~169:驅動軸棒 168~169: drive shaft rod
170:基座構件 170: base member
172:導引構件 172: Guide member
[圖1]本發明一實施形態之噴灑蝕刻裝置的概略圖。 [Fig. 1] A schematic view of a spray etching apparatus according to an embodiment of the present invention.
[圖2]蝕刻腔室的概略構成示意圖。 [Fig. 2] A schematic configuration diagram of an etching chamber.
[圖3]噴灑配管單元的概略構成示意圖。 [Fig. 3] A schematic configuration diagram of a spray piping unit.
[圖4]噴灑配管單元的動作概略說明圖。 [Fig. 4] A schematic explanatory diagram of the operation of the spray piping unit.
以下利用圖面,說明本發明之噴灑蝕刻裝置的一實施形態。如圖1(A)及圖1(B)所示,噴灑蝕刻裝置10,具備導入部12、前處理腔室14、5個蝕刻腔室16、洗淨腔室18、及排出部20。在前處理腔室14、蝕刻腔室16、及洗淨腔室18,於隔間壁的一部分各自形成有可供玻璃基板100通過之狹縫狀的開口部。以下實施形態中,係說明被處理基板為玻璃基板100之例子,但亦可在玻璃基板100以外的基板(例:陶瓷基板、印刷基板、半導體基板等)之處理中使用噴灑蝕刻裝置10。
Hereinafter, an embodiment of the spray etching apparatus of the present invention will be described using the drawings. As shown in FIGS. 1(A) and 1(B), the
噴灑蝕刻裝置10,具備從最上游位置的導入部12遍佈至最下游位置的排出部20而排列之複數個搬運輥30。搬運輥30,構成為令被設置(裝載)於導入部12之玻璃基板100一面依序經由前處理腔室14、蝕刻腔室16、及洗淨腔室18一面搬運至排出部20。
The
前處理腔室14,構成為將被導入至蝕刻腔室16前的玻璃基板100予以洗淨。本實施形態中,在前處理腔室14對玻璃基板100從上下噴吹洗淨水,藉此玻璃基板100受到水洗。蝕刻腔室16,構成為對玻璃基板100
噴吹蝕刻液,藉此將玻璃基板100予以薄型化。本實施形態中,噴灑蝕刻裝置10具備5個蝕刻腔室16,但可令蝕刻腔室16的數量適當增減。有關蝕刻腔室16的構成後述之。
The
洗淨腔室18,構成為將在蝕刻腔室16受到蝕刻處理後的玻璃基板100予以洗淨。在洗淨腔室18,亦如同前處理腔室14般,對玻璃基板100從上下噴吹洗淨水,藉此玻璃基板100受到水洗。在排出部20,受到蝕刻處理及洗淨處理後的玻璃基板100被排出。排出部20中進行玻璃基板100之取出(卸載)。
The cleaning
如圖1(B)所示,在蝕刻腔室16及洗淨腔室18,設有用來除去玻璃基板100上的液體之乾燥手段(例:風刀、脫水輥等),適當地進行蝕刻液之除去及洗淨水之除去。此外,在噴灑蝕刻裝置10,連接有包含洗氣器(scrubber)等之排氣系統(圖示省略)及包含壓濾機(filter press)等之排水系統(圖示省略),適當地進行排氣及排水。
As shown in FIG. 1(B), the
接下來,利用圖2說明蝕刻腔室16的構成。5個蝕刻腔室16原則上為同一構成,因此此處針對單一的蝕刻腔室16說明之。蝕刻腔室16,至少具備上側噴灑配管單元162、下側噴灑配管單元164、上側軟管單元166、下側軟管單元167(參照圖3)及驅動軸棒168。
Next, the configuration of the
上側噴灑配管單元162,是在於搬運輥30上受到搬運之玻璃基板100的上方相隔規定的距離而配置。
上側噴灑配管單元162,構成為將具備複數個吐出蝕刻液的吐出噴嘴之配管以並列方式配置複數個。本實施形態中,係說明在平行地配置5根之各配管設有6個吐出噴嘴之例子,但配管或吐出噴嘴的數量並不限定於此。
The upper
此處,上側噴灑配管單元162的框構件、吐出噴嘴、及配管是由聚氯乙烯所構成,但亦可使用其他的耐酸性構件。下側噴灑配管單元164,是在於搬運輥30上受到搬運之玻璃基板100的下方相隔規定的距離而配置。下側噴灑配管單元164的基本的構成和上側噴灑配管單元162相同,因此省略說明。
Here, the frame member, discharge nozzle, and piping of the upper
上側噴灑配管單元162及下側噴灑配管單元164在各自底部的4處(本實施形態中為4個角部),具備作為腳部之基座構件170。此基座構件170,是以可滑動的狀態被支撐在設於蝕刻腔室16內的規定位置之8個導引構件172。基座構件170,其底部受到推拔加工,導引構件172,具有和基座構件170的底部吻合之形狀的溝部。基座構件170沿著導引構件172的溝部做往復直線移動,藉此,上側噴灑配管單元162及下側噴灑配管單元164會於和玻璃基板100的搬運方向正交之寬度方向做往復直線移動。
The upper side
基座構件170及導引構件172常時彼此摩擦,因此較佳是使用具備耐酸性,且滑動特性或耐摩耗性高的素材。本實施形態中,基座構件170採用聚四氟乙烯、導引構件172採用超高分子量聚乙烯樹脂(U-
PE),但針對素材並不限定於這些。藉由不將基座構件170及導引構件172的素材訂為相同,彼此會變得不易摩耗。
Since the
上側軟管單元166,由具備可撓性之耐酸性軟管的束所構成,構成為將上側噴灑配管單元162與送液單元40予以連接。下側軟管單元167,由具備可撓性之耐酸性軟管的束所構成,構成為將下側噴灑配管單元164與送液單元40予以連接。(參照圖3)驅動軸棒168,構成為將來自驅動單元50的驅動力傳遞至上側噴灑配管單元162。驅動軸棒169,構成為將來自驅動單元50的驅動力傳遞至下側噴灑配管單元164。驅動軸棒168及驅動軸棒169,會貫通蝕刻腔室16的側壁,因此為保持不透水性及氣密性係使用密封軸承等密封機構。驅動單元50,將來自電動機的力利用齒條與齒輪(rack and pinion)等傳遞機構予以變換成直線狀的驅動力,藉此對驅動軸棒168及驅動軸棒169傳遞驅動力。
The
上側軟管單元166,構成為將來自送液單元40的蝕刻液供給至上側噴灑配管單元162。下側軟管單元167,構成為將來自送液單元40的蝕刻液供給至下側噴灑配管單元164。上側軟管單元166及下側軟管單元167,由四氟乙烯-全氟烷基乙烯基醚共聚物(PFA)等耐酸性構件所構成。上側軟管單元166及下側軟管單元167,設計成比必要量還充份地長,以便即使當因上側噴灑配管單元162及下側噴灑配管單元164的滑動動作而送液單元
40與上側噴灑配管單元162及下側噴灑配管單元164之距離變化了的情形下,仍具有充份的撓性而能夠吸收此變化(參照圖3及圖4)。
The
本實施形態中,構成為上側軟管單元166係將送液單元40的下部與上側噴灑配管單元162予以連接,另一方面,下側軟管單元167係將送液單元40的上部與下側噴灑配管單元164予以連接。其理由在於,能夠增長上側軟管單元166及下側軟管單元167之長度,當上側噴灑配管單元162及下側噴灑配管單元164做往復滑動移動的情形下,上側軟管單元166及下側軟管單元167會變得容易撓曲。
In this embodiment, the
其結果,即使使用相對較硬的氟系樹脂的情形下,上側軟管單元166及下側軟管單元167仍容易發揮原本的功能。此外,可增長上側軟管單元166及下側軟管單元167之長度(特別是位於上側噴灑配管單元162及下側噴灑配管單元164的外側之部分的長度)。又,能夠確實地防止上側軟管單元166及下側軟管單元167垂下至蝕刻液的噴灑區域。
As a result, even in the case where a relatively hard fluorine-based resin is used, the
上述噴灑蝕刻裝置10中,藉由操作者或機械臂等,玻璃基板100被裝載至導入部12。玻璃基板100,相隔適度的間隔而依序地被裝載至導入部12。玻璃基板100,從導入部12通過狹縫狀的開口部而被導入至前處理腔室14,在此其全面藉由洗淨水受到洗淨。接下來,玻璃基板100,從前處理腔室14通過狹縫狀的開口部而被
導入至蝕刻腔室16。
In the
蝕刻腔室16中,從上側噴灑配管單元162及下側噴灑配管單元164對玻璃基板100的上面及下面各自噴灑蝕刻液。於此蝕刻處理時,如圖4(A)及圖4(B)所示,上側噴灑配管單元162及下側噴灑配管單元164會朝寬度方向反覆做往復移動,因此蝕刻液的噴灑角度會隨時變化。其結果,於玻璃基板100的上面會變得不易發生被噴灑之蝕刻液的滯留。
In the
玻璃基板100,一面依序通過複數個蝕刻腔室16一面被薄型化。然後,通過了配置於最下游之蝕刻腔室16後,藉由風刀等受到液切後,被導入至洗淨腔室18。玻璃基板100,於洗淨腔室18藉由洗淨水受到洗淨。其後藉由風刀等受到脫水處理後被排出至排出部20。被排出至排出部20之玻璃基板100,藉由操作者或機械臂而被回收並移往後段的工程。
The
藉由上述這樣的手續,噴灑蝕刻裝置10能夠對大量(例如500片/日以上)的玻璃基板100進行噴灑蝕刻處理。本實施形態中,係說明玻璃基板100之薄型化的例子,但藉由併用具有期望的圖樣佈局之耐蝕刻性的掩蓋劑(masking agent),則亦可進行玻璃基板100的切斷處理或端面平滑化處理等。
Through the above procedure, the
若考量噴灑蝕刻裝置10的維護性,蝕刻腔室16的頂板較佳是構成為可開關、或可拆卸。上側噴灑配管單元162,藉由拆卸上側軟管單元166及驅動軸棒
168,可容易地從蝕刻腔室16的天花板部分拿出至裝置外。此時,上側噴灑配管單元162、與上側軟管單元166及驅動軸棒168,較佳是透過可任意裝卸之構成(螺固、附解除機能之鎖定機構等)而連接。
In consideration of the maintainability of the
此外,將搬運輥30群也預先設計成能夠容易地解除與驅動傳遞部之連結,藉此便可容易地拿出至裝置外。甚者,針對下側噴灑配管單元164亦如同上側噴灑配管單元162般可從天花板部分拿出至裝置外。於裝置外對上側噴灑配管單元162及下側噴灑配管單元164進行除去污泥等析出物等之維護作業,藉此維護性會提升。此外,若預先備妥備用的上側噴灑配管單元162及下側噴灑配管單元164,則可將停止噴灑蝕刻裝置10的投產之時間抑制在最小限度。
In addition, the
上述實施形態之說明中,應認為所有要點均為例示,而非限制性因素。本發明之範圍並非由上述實施形態,而是由申請專利範圍來揭示。又,本發明之範圍中,係意圖包含與申請專利範圍的意義均等及範圍內之所有變更。 In the description of the above-mentioned embodiment, all points should be considered as examples, rather than limiting factors. The scope of the present invention is not disclosed by the above-mentioned embodiments, but by the scope of patent application. In addition, the scope of the present invention is intended to include the meaning equivalent to the scope of patent application and all changes within the scope.
16‧‧‧蝕刻腔室 16‧‧‧Etching chamber
30‧‧‧搬運輥 30‧‧‧Handling roller
40‧‧‧送液單元 40‧‧‧Liquid delivery unit
50‧‧‧驅動單元 50‧‧‧Drive unit
100‧‧‧玻璃基板 100‧‧‧Glass substrate
162‧‧‧上側噴灑配管單元 162‧‧‧Upper spray piping unit
164‧‧‧下側噴灑配管單元 164‧‧‧Lower side spray piping unit
166‧‧‧上側軟管單元 166‧‧‧Upper hose unit
168‧‧‧驅動軸棒 168‧‧‧Drive shaft rod
169‧‧‧驅動軸棒 169‧‧‧Drive shaft rod
170‧‧‧基座構件 170‧‧‧Base member
172‧‧‧導引構件 172‧‧‧Guiding member
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CN107710389A (en) | 2018-02-16 |
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