TWI681699B - Circuit design method and circuit design system - Google Patents

Circuit design method and circuit design system Download PDF

Info

Publication number
TWI681699B
TWI681699B TW107140172A TW107140172A TWI681699B TW I681699 B TWI681699 B TW I681699B TW 107140172 A TW107140172 A TW 107140172A TW 107140172 A TW107140172 A TW 107140172A TW I681699 B TWI681699 B TW I681699B
Authority
TW
Taiwan
Prior art keywords
transmission line
transmission time
voltage level
branch
test signal
Prior art date
Application number
TW107140172A
Other languages
Chinese (zh)
Other versions
TW202019272A (en
Inventor
李彥寬
李諭天
朱政輝
Original Assignee
和碩聯合科技股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 和碩聯合科技股份有限公司 filed Critical 和碩聯合科技股份有限公司
Priority to TW107140172A priority Critical patent/TWI681699B/en
Priority to CN201910555608.3A priority patent/CN111241773B/en
Application granted granted Critical
Publication of TWI681699B publication Critical patent/TWI681699B/en
Publication of TW202019272A publication Critical patent/TW202019272A/en

Links

Images

Landscapes

  • Design And Manufacture Of Integrated Circuits (AREA)

Abstract

A circuit design method and a circuit design system are provided. The circuit design method includes: providing a transmission line on a circuit board; providing a test signal to a main transmission line; obtaining the test signal and a first transmission time through the first via wire and the first branch transmission line via a first branch transmission line of the transmission line, and obtaining a test signal and a second transmission time via a second branch transmission line of the transmission line; obtaining the transmission time difference according to the first transmission time and the second transmission time; obtains the compensation distance according to the transmission time difference; and compensating the length of the first branch transmission line or the second branch transmission line by the compensation distance.

Description

電路佈線設計方法以及電路佈線設計系統Circuit wiring design method and circuit wiring design system

本發明是有關於一種用於設計電路板中的傳輸線的電路佈線設計方法以及電路佈線設計系統。 The invention relates to a circuit wiring design method and a circuit wiring design system for designing transmission lines in a circuit board.

為了降低測試訊號於印刷電路板中位於不同層的至少兩條分支傳輸線因為電氣傳輸長度不同而產生測試訊號多重反射的情況,在目前的T型拓樸(T-topology)的佈線設計上,是藉由使印刷電路板的同一層的多條分支傳輸線在佈線上達到相互對稱,藉以將上述至少兩條分支傳輸線所傳輸的訊號可以在相近的時間點抵達各分支傳輸線的接收端。 In order to reduce the test signal multiple reflections on at least two branch transmission lines at different layers in the printed circuit board due to different electrical transmission lengths, the current T-topology wiring design is By making multiple branch transmission lines of the same layer of the printed circuit board mutually symmetrical in wiring, the signals transmitted by the at least two branch transmission lines can reach the receiving end of each branch transmission line at a similar time point.

然而,這樣的設計僅僅是考量到印刷電路板的單層佈線設計的傳輸線長度等長,而沒有考量到印刷電路板在多層的佈線設計下,多層之間的分支傳輸線之間會可能具有不同的導孔高度。所以,在沒有考量到不同的導孔高度的情況下,上述的訊號多重反射所造成的干擾並不會被降低,進而對分支傳輸線的接收端的元件造成干擾,導致傳輸的訊號被嚴重的破壞。 However, this design only considers the length of the transmission line of the single-layer wiring design of the printed circuit board to be the same length, but does not consider that the printed circuit board in the multilayer wiring design, the branch transmission line between multiple layers may have different Guide hole height. Therefore, without considering the different via heights, the interference caused by the above-mentioned multiple reflection of the signal will not be reduced, thereby causing interference to the components of the receiving end of the branch transmission line, causing the transmitted signal to be severely damaged.

本發明提供一種電路佈線設計方法以及電路佈線設計系統,可用以降低多層佈線時因不同傳輸線的傳輸時間不同,而產生訊號多重反射所造成的干擾。 The invention provides a circuit wiring design method and a circuit wiring design system, which can be used to reduce the interference caused by multiple reflections of signals due to the different transmission time of different transmission lines during multilayer wiring.

本發明的電路佈線設計方法。用於對電路板進行電路佈線設計。電路板包含第一導孔結構及第二導孔結構。電路設計方法包括:於電路板提供傳輸線,傳輸線包含主傳輸線、第一分支傳輸線以及第二分支傳輸線,主傳輸線連接第一導孔結構的一端與第二導孔結構的一端,第一分支傳輸線的一端連接第一導孔結構的另一端,第二分支傳輸線的一端連接第二導孔結構的另一端;對主傳輸線提供測試訊號;經由第一分支傳輸線的另一端獲得通過第一導孔結構及第一分支傳輸線的測試訊號並取得該測試訊號通過的第一傳輸時間,以及經由第二分支傳輸線的另一端獲得通過第二導孔結構及第二分支傳輸線的測試訊號並取得該測試訊號通過的第二傳輸時間;依據第一傳輸時間以及第二傳輸時間獲得傳輸時間差;依據傳輸時間差獲得補償距離;以及藉由補償距離補償第一分支傳輸線或第二分支傳輸線的長度,以使該測試訊號通過該第一導孔結構及該第一分支傳輸線與該第二導孔結構及該第二分支傳輸線的第一傳輸時間與第二傳輸時間相等。 The circuit wiring design method of the present invention. Used for circuit wiring design of circuit board. The circuit board includes a first via structure and a second via structure. The circuit design method includes: providing a transmission line on the circuit board. The transmission line includes a main transmission line, a first branch transmission line, and a second branch transmission line. The main transmission line connects one end of the first via structure and one end of the second via structure. One end is connected to the other end of the first via hole structure, one end of the second branch transmission line is connected to the other end of the second via hole structure; the test signal is provided to the main transmission line; the other end of the first branch transmission line is passed through the first via hole structure and The test signal of the first branch transmission line and obtain the first transmission time for passing the test signal, and the other end of the second branch transmission line obtains the test signal passing through the second via structure and the second branch transmission line and obtains the test signal passing The second transmission time; the transmission time difference is obtained according to the first transmission time and the second transmission time; the compensation distance is obtained according to the transmission time difference; and the length of the first branch transmission line or the second branch transmission line is compensated by the compensation distance to pass the test signal The first transmission time of the first via structure, the first branch transmission line and the second via structure and the second branch transmission line are equal to the second transmission time.

在本發明的電路佈線設計系統設置於電路板。電路板包含第一導孔結構及第二導孔結構。電路佈線設計系統包括傳輸 線、驅動器、第一接收器、第二接收器以及處理器。傳輸線包含主傳輸線、第一分支傳輸線以及第二分支傳輸線,主傳輸線連接第一導孔結構的一端與第二導孔結構的一端,第一分支傳輸線的一端連接第一導孔結構的另一端,第二分支傳輸線的一端連接第二導孔結構的另一端。驅動器用以對主傳輸線提供測試訊號。第一接收器連接第一分支傳輸線的另一端,第一接收器用以獲得自驅動器輸出並通過第一導孔結構及第一分支傳輸線的測試訊號並取得該測試訊號通過的第一傳輸時間。第二接收器連接第二分支傳輸線的另一端,第二接收器用以獲得自驅動器輸出並通過第二導孔結構及第二分支傳輸線的測試訊號並取得該測試訊號通過的第二傳輸時間。處理器耦接於第一接收器與第二接收器。處理器用以依據第一傳輸時間以及第二傳輸時間獲得傳輸時間差,並且依據傳輸時間差獲得補償距離。其中補償距離用以補償第一分支傳輸線或第二分支傳輸線的長度,以使該測試訊號通過該第一導孔結構及該第一分支傳輸線與該第二導孔結構及該第二分支傳輸線的第一傳輸時間與第二傳輸時間相等。 The circuit wiring design system of the present invention is installed on a circuit board. The circuit board includes a first via structure and a second via structure. Circuit wiring design system including transmission Line, driver, first receiver, second receiver, and processor. The transmission line includes a main transmission line, a first branch transmission line, and a second branch transmission line. The main transmission line connects one end of the first via structure and one end of the second via structure, and one end of the first branch transmission line connects to the other end of the first via structure. One end of the second branch transmission line is connected to the other end of the second via structure. The driver is used to provide test signals to the main transmission line. The first receiver is connected to the other end of the first branch transmission line. The first receiver is used to obtain a test signal output from the driver and pass through the first via structure and the first branch transmission line and obtain the first transmission time for the test signal to pass. The second receiver is connected to the other end of the second branch transmission line. The second receiver is used to obtain the test signal output from the driver and pass through the second via structure and the second branch transmission line and obtain the second transmission time for the test signal to pass. The processor is coupled to the first receiver and the second receiver. The processor is used to obtain the transmission time difference according to the first transmission time and the second transmission time, and obtain the compensation distance according to the transmission time difference. The compensation distance is used to compensate the length of the first branch transmission line or the second branch transmission line, so that the test signal passes through the first via structure and the first branch transmission line and the second via structure and the second branch transmission line The first transmission time is equal to the second transmission time.

基於上述,依據第一傳輸時間以及第二傳輸時間獲得傳輸時間差。接下來,依據傳輸時間差獲得補償距離,並藉由補償距離補償第一分支傳輸線或第二分支傳輸線的距離。使得第一傳輸時間與第二傳輸時間相等,如此當測試信號通過第一分支傳輸線時及當測試信號通過第二分支傳輸線時便不會產生因訊號多重反射所造成的干擾。 Based on the above, the transmission time difference is obtained according to the first transmission time and the second transmission time. Next, the compensation distance is obtained according to the transmission time difference, and the distance of the first branch transmission line or the second branch transmission line is compensated by the compensation distance. The first transmission time is equal to the second transmission time, so that when the test signal passes through the first branch transmission line and when the test signal passes through the second branch transmission line, interference caused by multiple reflections of the signal will not occur.

為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。 In order to make the above-mentioned features and advantages of the present invention more obvious and understandable, the embodiments are specifically described below in conjunction with the accompanying drawings for detailed description as follows.

100‧‧‧電路佈線設計系統 100‧‧‧ circuit wiring design system

110‧‧‧驅動器 110‧‧‧Drive

120_1‧‧‧第一接收器 120_1‧‧‧First receiver

120_2‧‧‧第二接收器 120_2‧‧‧Second receiver

130‧‧‧處理器 130‧‧‧ processor

BL1‧‧‧第一分支傳輸線 BL1‧‧‧The first branch transmission line

BL2‧‧‧第二分支傳輸線 BL2‧‧‧Second branch transmission line

C1、C2‧‧‧波形 C1, C2‧‧‧ waveform

H1‧‧‧第一導孔結構 H1‧‧‧First guide hole structure

H2‧‧‧第二導孔結構 H2‧‧‧Second guide hole structure

LV1、LV2‧‧‧高度 LV1, LV2‧‧‧ Height

LL1、LL2‧‧‧長度 LL1, LL2‧‧‧Length

m1‧‧‧第一傳輸時間 m1‧‧‧ First transmission time

m2‧‧‧第二傳輸時間 m2‧‧‧Second transmission time

ML1‧‧‧主傳輸線 ML1‧‧‧Main transmission line

S210、S220、S230、S240、S250、S260‧‧‧步驟 S210, S220, S230, S240, S250, S260

S242、S244、S252、S254、S256、S262、S264‧‧‧步驟 S242, S244, S252, S254, S256, S262, S264

TS‧‧‧測試訊號 TS‧‧‧Test signal

VREF‧‧‧參考電壓準位 VREF‧‧‧Reference voltage level

圖1是依據本發明一實施例所繪示的電路佈線設計系統示意圖。 FIG. 1 is a schematic diagram of a circuit wiring design system according to an embodiment of the invention.

圖2是依據本發明一實施例所繪示的電路佈線設計方法流程圖。 2 is a flowchart of a circuit wiring design method according to an embodiment of the invention.

圖3是依據本發明一實施例所繪示的測試訊號的波形圖。 FIG. 3 is a waveform diagram of a test signal according to an embodiment of the invention.

圖4是依據步驟S230、S240、S250所繪示的電路佈線設計方法流程圖。 FIG. 4 is a flowchart of a circuit wiring design method according to steps S230, S240, and S250.

請參考圖1,圖1是依據本發明一實施例所繪示的電路佈線設計系統示意圖。電路佈線設計系統設置於電路板(未示出),電路板包含第一導孔結構H1以及第二導孔結構H2。在本實施例中,電路佈線設計系統100包括傳輸線、驅動器110、第一接收器120_1、第二接收器120_2以及處理器130。本實施例的傳輸線包含主傳輸線ML1、第一分支傳輸線BL1以及第二分支傳輸線BL2。主傳輸線ML1連接該第一導孔結構H1的第一端以及該第二導孔結構H2的第一端。第一分支傳輸線BL1的第一端連接該 第一導孔結構H1的第二端,該第二分支傳輸線BL2的第一端連接該第二導孔結構H2的第二端。驅動器110用以對主傳輸線ML1提供測試訊號TS。第一接收器120_1連接第一分支傳輸線BL1的第二端。第一接收器120_1經由第一分支傳輸線BL1的第二端獲得自驅動器110輸出並通過第一導孔結構H1及第一分支傳輸線BL1的測試訊號TS並取得測試訊號TS通過第一導孔結構H1及第一分支傳輸線BL1的第一傳輸時間m1。第二接收器120_2連接第二分支傳輸線BL2的第二端。第二接收器120_2經由第二分支傳輸線BL2的第二端獲得自驅動器110輸出並通過第二導孔結構H2及第二分支傳輸線BL2的測試訊號TS並取得測試訊號TS通過第二導孔結構H2及第二分支傳輸線BL2的第二傳輸時間。處理器130耦接於第一接收器120_1以及第二接收器120_2。處理器130用以依據第一傳輸時間以及第二傳輸時間獲得傳輸時間差,依據傳輸時間差獲得補償距離。補償距離是用以補償第一分支傳輸線BL1或第二分支傳輸線BL2的長度,以使第一傳輸時間與第二傳輸時間相等。處理器130可例如是中央處理單元(Central Processing Unit,CPU),或是其他可程式化之一般用途或特殊用途的微處理器(Microprocessor)、數位訊號處理器(Digital Signal Processor,DSP)、可程式化控制器、特殊應用積體電路(Application Specific Integrated Circuits,ASIC)、可程式化邏輯裝置(Programmable Logic Device,PLD)或其他類似裝置或這些裝置的組合,其可載入並執行電腦程式。本發明的分支傳輸線的數量 可以是多個,接收器的數量也可以是多個,並不以本實施例為限。 Please refer to FIG. 1, which is a schematic diagram of a circuit wiring design system according to an embodiment of the invention. The circuit wiring design system is provided on a circuit board (not shown). The circuit board includes a first via structure H1 and a second via structure H2. In this embodiment, the circuit wiring design system 100 includes a transmission line, a driver 110, a first receiver 120_1, a second receiver 120_2, and a processor 130. The transmission line of this embodiment includes a main transmission line ML1, a first branch transmission line BL1, and a second branch transmission line BL2. The main transmission line ML1 connects the first end of the first via structure H1 and the first end of the second via structure H2. The first end of the first branch transmission line BL1 is connected to the The second end of the first via structure H1 and the first end of the second branch transmission line BL2 are connected to the second end of the second via structure H2. The driver 110 is used to provide a test signal TS to the main transmission line ML1. The first receiver 120_1 is connected to the second end of the first branch transmission line BL1. The first receiver 120_1 obtains the test signal TS output from the driver 110 through the second end of the first branch transmission line BL1 and passes through the first via hole structure H1 and the first branch transmission line BL1 and obtains the test signal TS through the first via hole structure H1 And the first transmission time m1 of the first branch transmission line BL1. The second receiver 120_2 is connected to the second end of the second branch transmission line BL2. The second receiver 120_2 obtains the test signal TS output from the driver 110 through the second end of the second branch transmission line BL2 and passes through the second via structure H2 and the second branch transmission line BL2 and obtains the test signal TS through the second via structure H2 And the second transmission time of the second branch transmission line BL2. The processor 130 is coupled to the first receiver 120_1 and the second receiver 120_2. The processor 130 is used to obtain a transmission time difference according to the first transmission time and the second transmission time, and obtain a compensation distance according to the transmission time difference. The compensation distance is used to compensate the length of the first branch transmission line BL1 or the second branch transmission line BL2, so that the first transmission time is equal to the second transmission time. The processor 130 may be, for example, a central processing unit (Central Processing Unit, CPU), or other programmable general-purpose or special-purpose microprocessor (Microprocessor), digital signal processor (DSP), or Programmable controllers, application specific integrated circuits (Application Specific Integrated Circuits, ASIC), programmable logic devices (Programmable Logic Device, PLD), or other similar devices or combinations of these devices can load and execute computer programs. The number of branch transmission lines of the present invention There may be multiple, and the number of receivers may also be multiple, which is not limited to this embodiment.

在主傳輸線ML1、第一分支傳輸線BL1與第二分支傳輸線BL2分別布局在電路板的不同層的情況下,第一導孔結構H1的高度LV1與第二導孔結構H2的高度LV2可能會有不同。第一分支傳輸線BL1具有長度LL1,第一導孔結構H1具有高度LV1。因此,第一分支傳輸線BL1以及第一導孔結構H1所形成的路徑長度是LV1+LL1。同理,第二分支傳輸線BL2具有長度LL2,第二導孔結構H2具有高度LV2,也就是第二分支傳輸線BL2以及第一導孔結構H1所形成的路徑長度是LV2+LL2。 In the case where the main transmission line ML1, the first branch transmission line BL1 and the second branch transmission line BL2 are respectively laid out on different layers of the circuit board, the height LV1 of the first via structure H1 and the height LV2 of the second via structure H2 may have different. The first branch transmission line BL1 has a length LL1, and the first via structure H1 has a height LV1. Therefore, the path length formed by the first branch transmission line BL1 and the first via structure H1 is LV1+LL1. Similarly, the second branch transmission line BL2 has a length LL2, and the second via structure H2 has a height LV2, that is, the path length formed by the second branch transmission line BL2 and the first via structure H1 is LV2+LL2.

電路佈線設計系統100藉由處理器130依據第一傳輸時間以及第二傳輸時間獲得傳輸時間差。在第一分支傳輸線BL1的長度與第二分支傳輸線BL2的長度的情況下,處理器130可以依據第一傳輸時間與第二傳輸時間獲知測試訊號TS在第一導孔結構H1、第二導孔結構H2的傳輸時間差。傳輸時間差可以反應出測試訊號TS在第一導孔結構H1、第二導孔結構H2上的實際傳輸時間的差異。處理器130並依據傳輸時間差獲得補償距離。如此一來,補償距離被用以補償第一分支傳輸線BL1、第二分支傳輸線BL2其中傳輸時間較短之一者,來降低第一分支傳輸線BL1、第二分支傳輸線BL2上實際傳輸時間差異,藉以讓訊號到達第一接收器120_1、第二接收器120_2的時間能夠一致,以消除訊號多重反射所造成的干擾。 The circuit wiring design system 100 uses the processor 130 to obtain the transmission time difference according to the first transmission time and the second transmission time. In the case of the length of the first branch transmission line BL1 and the length of the second branch transmission line BL2, the processor 130 can learn the test signal TS in the first via hole structure H1 and the second via hole according to the first transmission time and the second transmission time The transmission time difference of structure H2. The difference in transmission time can reflect the difference in the actual transmission time of the test signal TS on the first via structure H1 and the second via structure H2. The processor 130 obtains the compensation distance according to the transmission time difference. In this way, the compensation distance is used to compensate the shorter of the first branch transmission line BL1 and the second branch transmission line BL2 to reduce the actual transmission time difference between the first branch transmission line BL1 and the second branch transmission line BL2. The time when the signal reaches the first receiver 120_1 and the second receiver 120_2 can be consistent, so as to eliminate the interference caused by the multiple reflection of the signal.

在第一分支傳輸線BL1與第二分支傳輸線BL2的材料一 致以及對稱設計的情況下,補償距離可視為被用以補償第一導孔結構H1的高度LV1與第二導孔結構H2的高度LV2之間的差異。 Material 1 on the first branch transmission line BL1 and the second branch transmission line BL2 In the case of a consistent and symmetrical design, the compensation distance can be regarded as being used to compensate for the difference between the height LV1 of the first via structure H1 and the height LV2 of the second via structure H2.

具體來說明,請同時參考圖1及圖2,圖2是依據本發明一實施例所繪示的電路佈線設計方法流程圖。如步驟S210所述:提供傳輸線ML1。在步驟S210中,傳輸線ML1被提供在電路板上。主傳輸線ML1會經由連接該第一導孔結構H1的一端與該第二導孔結構H2的一端。第一分支傳輸線BL1的一端連接該第一導孔結構H1的另一端,該第二分支傳輸線BL2的一端連接該第二導孔結構H2的另一端。如步驟S220所述:對主傳輸線ML1提供測試訊號TS。在步驟S220中,驅動器110對主傳輸線ML1的輸入端提供由一第一電壓準位上升至一第二電壓準位的測試訊號TS。第一電壓準位不同於第二電壓準位。在本實施例中,第二電壓準位大於第一電壓準位。在一些實施例中,第一電壓準位大於第二電壓準位。測試訊號TS可以是由至少一週期的脈衝訊號、至少一週期的步進訊號或斜坡訊號來實現。 Specifically, please refer to FIG. 1 and FIG. 2 at the same time. FIG. 2 is a flowchart of a circuit wiring design method according to an embodiment of the invention. As described in step S210: the transmission line ML1 is provided. In step S210, the transmission line ML1 is provided on the circuit board. The main transmission line ML1 connects one end of the first via structure H1 and one end of the second via structure H2. One end of the first branch transmission line BL1 is connected to the other end of the first via hole structure H1, and one end of the second branch transmission line BL2 is connected to the other end of the second via hole structure H2. As described in step S220: a test signal TS is provided to the main transmission line ML1. In step S220, the driver 110 provides a test signal TS that rises from a first voltage level to a second voltage level to the input terminal of the main transmission line ML1. The first voltage level is different from the second voltage level. In this embodiment, the second voltage level is greater than the first voltage level. In some embodiments, the first voltage level is greater than the second voltage level. The test signal TS may be realized by a pulse signal of at least one cycle, a step signal or a ramp signal of at least one cycle.

如步驟S230所述:經由第一分支傳輸線BL1的另一端獲得測試訊號及第一傳輸時間,並經由第二分支傳輸線BL2的另一端獲得測試訊號及第二傳輸時間。於一實施例中,第一接收器120_1會在第一分支傳輸線BL1的第二端獲得通過第一導孔結構H1以及第一分支傳輸線BL1的測試訊號TS,藉以獲得測試訊號TS自第一電壓準位上升至第二電壓準位的第一傳輸時間。並且第二接收器120_2也在第二分支傳輸線BL2的第二端獲得通過第二 導孔結構H2以及第二分支傳輸線BL2的測試訊號TS,藉以獲得測試訊號TS自第一電壓準位上升至第二電壓準位的第二傳輸時間。 As described in step S230: the test signal and the first transmission time are obtained through the other end of the first branch transmission line BL1, and the test signal and the second transmission time are obtained through the other end of the second branch transmission line BL2. In an embodiment, the first receiver 120_1 obtains the test signal TS passing through the first via structure H1 and the first branch transmission line BL1 at the second end of the first branch transmission line BL1, so as to obtain the test signal TS from the first voltage The first transmission time when the level rises to the second voltage level. And the second receiver 120_2 also obtains a pass through the second end of the second branch transmission line BL2 The via signal structure H2 and the test signal TS of the second branch transmission line BL2 are used to obtain a second transmission time for the test signal TS to rise from the first voltage level to the second voltage level.

於另一實施例中,可於第一電壓準位與第二電壓準位之間設定一參考電壓準位VREF。第一接收器120_1可以在第一分支傳輸線BL1的第二端接收測試訊號TS,並且以測試訊號TS自第一電壓準位上升至參考電壓準位VREF時的時間點來作為第一傳輸時間。相同地,第二接收器120_2也可以在第二分支傳輸線BL2的第二端接收測試訊號TS,並且以測試訊號TS自第一電壓準位上升至參考電壓準位VREF時的時間點來作為第二傳輸時間。在本實施例中,參考電壓準位VREF的電壓值為第一電壓準位的電壓值與第二電壓準位的電壓值的平均值。在其他實施例中,在第二電壓準位的電壓值大於參考電壓準位VREF的電壓值的情況下,參考電壓準位VREF的電壓值可以被設定為第二電壓準位的電壓值的10%~90%。在另一些實施例中,在測試訊號TS是第一電壓準位大於第二電壓準位的情況下,也就是在第一電壓準位的電壓值大於參考電壓準位VREF的電壓值的情況下,參考電壓準位VREF的電壓值可以被設定為高於第一電壓準位的電壓值的10%~90%。 In another embodiment, a reference voltage level VREF may be set between the first voltage level and the second voltage level. The first receiver 120_1 may receive the test signal TS at the second end of the first branch transmission line BL1, and use the time point when the test signal TS rises from the first voltage level to the reference voltage level VREF as the first transmission time. Similarly, the second receiver 120_2 can also receive the test signal TS at the second end of the second branch transmission line BL2, and take the time point when the test signal TS rises from the first voltage level to the reference voltage level VREF as the first 2. Transmission time. In this embodiment, the voltage value of the reference voltage level VREF is the average of the voltage value of the first voltage level and the voltage value of the second voltage level. In other embodiments, in the case where the voltage value of the second voltage level is greater than the voltage value of the reference voltage level VREF, the voltage value of the reference voltage level VREF may be set to 10 of the voltage value of the second voltage level %~90%. In other embodiments, when the test signal TS is that the first voltage level is greater than the second voltage level, that is, the voltage value of the first voltage level is greater than the voltage value of the reference voltage level VREF The voltage value of the reference voltage level VREF may be set to be higher than the voltage value of the first voltage level by 10% to 90%.

具體來說,請參考同時參考圖1以及圖3,圖3是依據本發明一實施例所繪示的測試訊號TS的波形圖。在本實施例中,圖3中,第一接收器120_1在第一分支傳輸線BL1的第二端所接收 到測試訊號TS的波形以波形C1來表示。第二接收器120_2在第二分支傳輸線BL2的第二端所接收到測試訊號TS的波形以波形C2來表示。在本實施例中,第一電壓準位的電壓值為0伏特(V),而第二電壓準位的電壓值為1.5V。而參考電壓準位VREF的電壓值為第一電壓準位的電壓值與第二電壓準位的電壓值的平均值。因此,參考電壓準位VREF的電壓值為0.75V。當第一接收器120_1在將所接收到的測試訊號TS從第一電壓準位到達參考電壓準位VREF時的時間點作為第一傳輸時間m1。在圖3中,第一傳輸時間m1為1.041奈秒(nsec)。當第二接收器120_2在將所接收到的測試訊號TS從第一電壓準位到達參考電壓準位VREF時的時間點作為第二傳輸時間m2。在圖3中,第二傳輸時間m2為1.054奈秒。 Specifically, please refer to FIG. 1 and FIG. 3 at the same time. FIG. 3 is a waveform diagram of the test signal TS according to an embodiment of the present invention. In this embodiment, in FIG. 3, the first receiver 120_1 receives at the second end of the first branch transmission line BL1 The waveform to the test signal TS is represented by the waveform C1. The waveform of the test signal TS received by the second receiver 120_2 at the second end of the second branch transmission line BL2 is represented by the waveform C2. In this embodiment, the voltage value of the first voltage level is 0 volts (V), and the voltage value of the second voltage level is 1.5V. The voltage value of the reference voltage level VREF is the average of the voltage value of the first voltage level and the voltage value of the second voltage level. Therefore, the voltage value of the reference voltage level VREF is 0.75V. The time when the first receiver 120_1 receives the received test signal TS from the first voltage level to the reference voltage level VREF is taken as the first transmission time m1. In FIG. 3, the first transmission time m1 is 1.041 nanoseconds (nsec). The time point when the second receiver 120_2 receives the received test signal TS from the first voltage level to the reference voltage level VREF is taken as the second transmission time m2. In FIG. 3, the second transmission time m2 is 1.054 nanoseconds.

請回到圖1以及圖2,在電路佈線設計系統100步驟S230中獲得第一傳輸時間以及第二傳輸時間之後,進入步驟S230。 Please return to FIG. 1 and FIG. 2, after obtaining the first transmission time and the second transmission time in step S230 of the circuit wiring design system 100, proceed to step S230.

如步驟S240所述:依據第一傳輸時間以及第二傳輸時間獲得傳輸時間差。在步驟S240中,處理器130接收來自於第一接收器120_1的第一傳輸時間以及來自於第二接收器120_2的第二傳輸時間。處理器130依據第一傳輸時間以及第二傳輸時間獲得傳輸時間差。 As described in step S240: the transmission time difference is obtained according to the first transmission time and the second transmission time. In step S240, the processor 130 receives the first transmission time from the first receiver 120_1 and the second transmission time from the second receiver 120_2. The processor 130 obtains the transmission time difference according to the first transmission time and the second transmission time.

如步驟S250所述:依據傳輸時間差獲得補償距離。在步驟S240中,處理器130會依據上述的傳輸時間差進行判斷,並藉由判斷的結果獲得補償距離。在獲得補償距離之後,進入步驟 S250。如步驟S260所述:藉由補償距離補償第一分支傳輸線BL1或第二分支傳輸線BL2的長度,以使第一傳輸時間與第二傳輸時間相等。 As described in step S250: the compensation distance is obtained according to the transmission time difference. In step S240, the processor 130 determines based on the above-mentioned transmission time difference, and obtains the compensation distance based on the result of the determination. After obtaining the compensation distance, enter the step S250. As described in step S260: the length of the first branch transmission line BL1 or the second branch transmission line BL2 is compensated by the compensation distance so that the first transmission time is equal to the second transmission time.

進一步來說明,請同時參考圖1、圖2以及圖4,圖4是依據圖2中的步驟S240、S250、S260所繪示的電路佈線設計方法流程圖。在本實施例中,步驟S240進一步包括步驟S242、S244。步驟S250進一步包括步驟S252、S254、S256。步驟S260進一步包括步驟S262、S264。 To further explain, please refer to FIG. 1, FIG. 2 and FIG. 4 at the same time. FIG. 4 is a flowchart of the circuit wiring design method shown in steps S240, S250, and S260 in FIG. In this embodiment, step S240 further includes steps S242 and S244. Step S250 further includes steps S252, S254, and S256. Step S260 further includes steps S262 and S264.

如步驟S242所述:依據第一傳輸時間以及第二傳輸時間獲得傳輸時間差。在步驟S242中,處理器130會對第一傳輸時間與第二傳輸時間進行比較以獲得傳輸時間差。舉例來說,以圖3為例,第一傳輸時間m1為1.041奈秒,並且第二傳輸時間m2為1.054奈秒。因此處理器130可對第一傳輸時間m1與第二傳輸時間m2進行減法運算來獲得第一傳輸時間m1與第二傳輸時間m2之間的傳輸時間差。經減法運算後,傳輸時間差=m1-m2=-0.013奈秒=-13皮秒(psec)。處理器130可進一步在步驟S244中對傳輸時間差的結果進行判斷。在本實施例中,處理器130可藉由傳輸時間差的結果判斷出第一傳輸時間短於、長於或者是等於第二傳輸時間。承上例,傳輸時間差等於-13皮秒的結果說明了第一傳輸時間短於第二傳輸時間約13皮秒。也就是說,測試訊號TS經由第一導孔結構H1以及第一分支傳輸線BL1被傳輸到第一接收器120_1的時間長度短於測試訊號TS經由第二導孔結構H2以 及第二分支傳輸線BL2被傳輸到第二接收器120_2的時間長度。因此處理器130進入步驟S252並依據傳輸時間差獲得補償距離。 As described in step S242: the transmission time difference is obtained according to the first transmission time and the second transmission time. In step S242, the processor 130 compares the first transmission time with the second transmission time to obtain a transmission time difference. For example, taking FIG. 3 as an example, the first transmission time m1 is 1.041 nanoseconds, and the second transmission time m2 is 1.054 nanoseconds. Therefore, the processor 130 may perform a subtraction operation on the first transmission time m1 and the second transmission time m2 to obtain the transmission time difference between the first transmission time m1 and the second transmission time m2. After subtraction, the transmission time difference = m1-m2 = -0.013 nanoseconds = -13 picoseconds (psec). The processor 130 may further determine the result of the transmission time difference in step S244. In this embodiment, the processor 130 may determine that the first transmission time is shorter than, longer than, or equal to the second transmission time based on the result of the transmission time difference. According to the above example, the result of the transmission time difference being -13 picoseconds indicates that the first transmission time is shorter than the second transmission time by about 13 picoseconds. In other words, the test signal TS is transmitted to the first receiver 120_1 via the first via hole structure H1 and the first branch transmission line BL1 in a shorter time than the test signal TS via the second via hole structure H2 And the length of time that the second branch transmission line BL2 is transmitted to the second receiver 120_2. Therefore, the processor 130 proceeds to step S252 and obtains the compensation distance according to the transmission time difference.

如步驟S252所述:依據測試訊號TS在第一分支傳輸線BL1的傳輸速度獲得第一補償距離。在第一傳輸時間短於第二傳輸時間的情況下,處理器130會在步驟S252中取得測試訊號TS在第一分支傳輸線BL1上的傳輸速度。舉例來說,處理器130可例如是由資料庫中得知測試訊號TS在第一分支傳輸線BL1的傳輸速度為153.217皮秒/英吋(psec/inch),也就是0.153217psec/mil。因此處理器130會依據第一傳輸時間短於第二傳輸時間所產生的傳輸時間差與上述的傳輸速度來獲得第一補償距離。承上例,在得到傳輸時間差等於-13皮秒,並且測試訊號TS在第一層傳輸線TL1的傳輸速度為0.153217psec/mil的情況下,處理器130可以將傳輸時間差的絕對值除以測試訊號TS在第一層傳輸線TL1的傳輸速度,以獲得第一補償距離,也就是第一補償距離為13÷0.153217=84.846mil。接著,進入步驟S262。 As described in step S252: the first compensation distance is obtained according to the transmission speed of the test signal TS on the first branch transmission line BL1. If the first transmission time is shorter than the second transmission time, the processor 130 will obtain the transmission speed of the test signal TS on the first branch transmission line BL1 in step S252. For example, the processor 130 may learn from the database that the transmission speed of the test signal TS on the first branch transmission line BL1 is 153.217 picoseconds/inch (psec/inch), that is, 0.153217 psec/mil. Therefore, the processor 130 will obtain the first compensation distance according to the transmission time difference generated by the first transmission time being shorter than the second transmission time and the above-mentioned transmission speed. According to the above example, when the transmission time difference is equal to -13 picoseconds and the transmission speed of the test signal TS in the first layer transmission line TL1 is 0.153217 psec/mil, the processor 130 can divide the absolute value of the transmission time difference by the test signal The transmission speed of TS on the first layer transmission line TL1 to obtain the first compensation distance, that is, the first compensation distance is 13÷0.153217=84.846mil. Then, it progresses to step S262.

如步驟S262所述:藉由第一補償距離增加第一分支傳輸線BL1的長度。當處理器130獲得第一補償距離之後,處理器130可輸出第一補償距離以提供給佈局軟體,佈局軟體則藉由第一補償距離增加第一分支傳輸線BL1的長度。進一步來說,佈局軟體是藉由第一補償距離增加第一分支傳輸線BL1的長度,從而使第一分支傳輸線BL1的長度增加84.846mil。在第一分支傳輸線BL1的長度被增加的情況下,會延長測試訊號TS傳輸到第一接收器 120_1的時間,因此第一傳輸時間可以被延遲。如此一來,第一傳輸時間可接近於第二傳輸時間,藉以降低訊號多重反射所造成的干擾。 As described in step S262: the length of the first branch transmission line BL1 is increased by the first compensation distance. After the processor 130 obtains the first compensation distance, the processor 130 can output the first compensation distance to provide to the layout software, and the layout software increases the length of the first branch transmission line BL1 by the first compensation distance. Further, the layout software increases the length of the first branch transmission line BL1 by the first compensation distance, thereby increasing the length of the first branch transmission line BL1 by 84.846 mil. When the length of the first branch transmission line BL1 is increased, the test signal TS will be extended to the first receiver 120_1 time, so the first transmission time can be delayed. In this way, the first transmission time can be close to the second transmission time, so as to reduce the interference caused by the multiple reflection of the signal.

請回到步驟S244。在一些實施例中,依據第一傳輸時間以及第二傳輸時間所獲得的傳輸時間差也會有在大於0的結果,這樣的結果說明了第二傳輸時間短於第一傳輸時間。也就是說,測試訊號TS經由第二導孔結構H2以及第二分支傳輸線BL2被傳輸到第二接收器120_2的時間長度短於測試訊號TS經由第一導孔結構H1以及第一分支傳輸線BL1被傳輸到第一接收器120_1的時間長度。處理器130會進入步驟S254並依據傳輸時間差獲得補償距離。 Please return to step S244. In some embodiments, the difference in transmission time obtained based on the first transmission time and the second transmission time may also be greater than zero. Such a result indicates that the second transmission time is shorter than the first transmission time. That is, the test signal TS is transmitted to the second receiver 120_2 through the second via hole structure H2 and the second branch transmission line BL2 in a shorter time than the test signal TS is received through the first via hole structure H1 and the first branch transmission line BL1 The length of time transmitted to the first receiver 120_1. The processor 130 proceeds to step S254 and obtains the compensation distance according to the transmission time difference.

如步驟S254所述:依據測試訊號TS在第二分支傳輸線BL2的傳輸速度獲得第二補償距離。在第二傳輸時間短於第一傳輸時間的情況下,處理器130會在步驟S254中取得測試訊號TS在第二分支傳輸線BL2上的傳輸速度。因此處理器130會依據第二傳輸時間短於第一傳輸時間所產生的傳輸時間差與上述的第二分支傳輸線BL2傳輸速度來獲得第二補償距離。 As described in step S254: the second compensation distance is obtained according to the transmission speed of the test signal TS on the second branch transmission line BL2. If the second transmission time is shorter than the first transmission time, the processor 130 will obtain the transmission speed of the test signal TS on the second branch transmission line BL2 in step S254. Therefore, the processor 130 obtains the second compensation distance according to the transmission time difference generated by the second transmission time being shorter than the first transmission time and the transmission speed of the second branch transmission line BL2.

如步驟S264所述:藉由第二補償距離增加第二分支傳輸線BL2的長度。當處理器130步驟S254獲得第二補償距離之後,處理器130可輸出第二補償距離以提供給佈局軟體,佈局軟體則藉由第二補償距離增加第二分支傳輸線BL2的長度。進一步來說,佈局軟體是藉由第二補償距離增加第二分支傳輸線BL2的長 度。在第二分支傳輸線BL2的長度被增加的情況下,會延長測試訊號TS傳輸到第二接收器120_2的時間,因此第二傳輸時間可以被延遲。如此一來,第二傳輸時間可接近於第一傳輸時間,藉以降低因訊號多重反射所造成的干擾。 As described in step S264: the length of the second branch transmission line BL2 is increased by the second compensation distance. After the processor 130 obtains the second compensation distance in step S254, the processor 130 can output the second compensation distance to provide to the layout software, and the layout software increases the length of the second branch transmission line BL2 by the second compensation distance. Further, the layout software increases the length of the second branch transmission line BL2 by the second compensation distance degree. In the case where the length of the second branch transmission line BL2 is increased, the transmission time of the test signal TS to the second receiver 120_2 is extended, so the second transmission time can be delayed. In this way, the second transmission time can be close to the first transmission time, thereby reducing interference caused by multiple reflections of the signal.

請再回到步驟S244。在另一些實施例中,傳輸時間差可能會有等於0的結果,這樣的結果說明了第一傳輸時間等於第二傳輸時間。也就是說,測試訊號TS經由第二導孔結構H2以及第二分支傳輸線BL2被傳輸到第二接收器120_2的時間長度等於測試訊號TS經由第一導孔結構H1以及第一分支傳輸線BL1被傳輸到第一接收器120_1的時間長度。因此,處理器130會進入步驟S256並不產生補償距離。 Please return to step S244 again. In some other embodiments, the transmission time difference may have a result equal to 0. Such a result indicates that the first transmission time is equal to the second transmission time. That is, the test signal TS is transmitted to the second receiver 120_2 through the second via hole structure H2 and the second branch transmission line BL2 equal to the test signal TS being transmitted through the first via hole structure H1 and the first branch transmission line BL1 The length of time to the first receiver 120_1. Therefore, the processor 130 proceeds to step S256 and does not generate the compensation distance.

綜上所述,本發明是在第一分支傳輸線的第二端接收測試訊號的第一傳輸時間,在第二分支傳輸線的第二端接收測試訊號的第二傳輸時間。依據第一傳輸時間以及第二傳輸時間獲得傳輸時間差。依據傳輸時間差獲得補償距離。傳輸時間差可以反應出測試訊號通過第一導孔結構與第一分支傳輸線的傳輸時間以及通過第二導孔結構與第二分支傳輸線的傳輸時間的實際差異,接下來,依據傳輸時間差獲得補償距離。如此一來,將補償距離用以補償第一分支傳輸線、第二分支傳輸線其中一者,來降低第一分支傳輸線、第二分支傳輸線上實際傳輸時間的差異,藉以讓第一傳輸時間以及第二傳輸時間能夠相同,以消除訊號多重反射所造成的干擾。 In summary, the present invention is the first transmission time for receiving the test signal at the second end of the first branch transmission line, and the second transmission time for receiving the test signal at the second end of the second branch transmission line. The transmission time difference is obtained according to the first transmission time and the second transmission time. Obtain the compensation distance according to the transmission time difference. The transmission time difference can reflect the actual difference between the transmission time of the test signal through the first via structure and the first branch transmission line and the transmission time through the second via structure and the second branch transmission line. Next, the compensation distance is obtained according to the transmission time difference. In this way, the compensation distance is used to compensate one of the first branch transmission line and the second branch transmission line to reduce the difference in actual transmission time between the first branch transmission line and the second branch transmission line, so that the first transmission time and the second The transmission time can be the same to eliminate the interference caused by the multiple reflection of the signal.

雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。 Although the present invention has been disclosed as above with examples, it is not intended to limit the present invention. Any person with ordinary knowledge in the technical field can make some changes and modifications without departing from the spirit and scope of the present invention. The scope of protection of the present invention shall be subject to the scope defined in the appended patent application.

S210、S220、S230、S240、S250、S260‧‧‧步驟 S210, S220, S230, S240, S250, S260

Claims (12)

一種電路佈線設計方法,用於對一電路板進行電路佈線設計,該電路板包含一第一導孔結構及一第二導孔結構,該電路佈線設計方法包括: 於該電路板提供一傳輸線,該傳輸線包含一主傳輸線、一第一分支傳輸線以及一第二分支傳輸線,該主傳輸線連接該第一導孔結構的一端與該第二導孔結構的一端,該第一分支傳輸線的一端連接該第一導孔結構的另一端,該第二分支傳輸線的一端連接該第二導孔結構的另一端; 對該主傳輸線提供一測試訊號; 經由該第一分支傳輸線的另一端獲得通過該第一導孔結構及該第一分支傳輸線的該測試訊號並取得該測試訊號通過的一第一傳輸時間,及經由該第二分支傳輸線的另一端獲得通過該第二導孔結構及該第二分支傳輸線的該測試訊號並取得該測試訊號通過的一第二傳輸時間; 依據該第一傳輸時間以及該第二傳輸時間獲得一傳輸時間差; 依據該傳輸時間差獲得一補償距離;以及 藉由該補償距離補償該第一分支傳輸線或該第二分支傳輸線的長度,以使該測試訊號通過該第一導孔結構及該第一分支傳輸線與該第二導孔結構及該第二分支傳輸線的該第一傳輸時間與該第二傳輸時間相等。A circuit wiring design method for circuit wiring design of a circuit board, the circuit board includes a first via structure and a second via structure, the circuit wiring design method includes: providing a transmission line on the circuit board, The transmission line includes a main transmission line, a first branch transmission line and a second branch transmission line, the main transmission line connects one end of the first via structure and one end of the second via structure, and one end of the first branch transmission line connects to the The other end of the first via structure, one end of the second branch transmission line is connected to the other end of the second via structure; a test signal is provided to the main transmission line; the other end of the first branch transmission line is passed through the first The via structure and the test signal of the first branch transmission line and obtain a first transmission time for the test signal to pass, and the second via transmission structure and the second branch transmission line are obtained through the other end of the second branch transmission line The test signal and obtain a second transmission time through which the test signal passes; obtain a transmission time difference based on the first transmission time and the second transmission time; obtain a compensation distance based on the transmission time difference; and compensate by the compensation distance The length of the first branch transmission line or the second branch transmission line, so that the test signal passes through the first via structure and the first branch transmission line and the second via structure and the first transmission of the second branch transmission line The time is equal to the second transmission time. 如申請專利範圍第1項所述的電路佈線設計方法,其中依據該傳輸時間差獲得該補償距離的步驟包括: 依據該傳輸時間差判斷該第一傳輸時間短於或長於該第二傳輸時間;以及 當該第一傳輸時間短於該第二傳輸時間時,依據該第一分支傳輸線的傳輸速度獲得一第一補償距離, 依據該第一補償距離增加該第一分支傳輸線的長度。The circuit wiring design method as described in item 1 of the patent application scope, wherein the step of obtaining the compensation distance according to the transmission time difference includes: judging that the first transmission time is shorter or longer than the second transmission time according to the transmission time difference; and when When the first transmission time is shorter than the second transmission time, a first compensation distance is obtained according to the transmission speed of the first branch transmission line, and the length of the first branch transmission line is increased according to the first compensation distance. 如申請專利範圍第2項所述的電路佈線設計方法,其中依據該傳輸時間差判斷該第一傳輸時間短於或長於該第二傳輸時間的步驟還包括: 當判斷出該第二傳輸時間短於第一傳輸時間時,依據該第二分支傳輸線的傳輸速度獲得一第二補償距離, 依據該第二補償距離增加該第二分支傳輸線的長度。The circuit wiring design method as described in item 2 of the patent application scope, wherein the step of determining that the first transmission time is shorter or longer than the second transmission time according to the transmission time difference further includes: when it is determined that the second transmission time is shorter than At the first transmission time, a second compensation distance is obtained according to the transmission speed of the second branch transmission line, and the length of the second branch transmission line is increased according to the second compensation distance. 如申請專利範圍第1項所述的電路佈線設計方法,其中該測試訊號為由一第一電壓準位上升至一第二電壓準位的一電性訊號,其中獲得該第一傳輸時間及該第二傳輸時間的步驟包括: 自該第一分支傳輸線的另一端接收該測試訊號以將自該第一電壓準位到達該第二電壓準位時的時間點作為該第一傳輸時間;以及 自該第二分支傳輸線的另一端接收該測試訊號以將自該第一電壓準位到達該第二電壓準位時的時間點作為該第二傳輸時間。The circuit wiring design method as described in item 1 of the patent application scope, wherein the test signal is an electrical signal that rises from a first voltage level to a second voltage level, wherein the first transmission time and the The step of the second transmission time includes: receiving the test signal from the other end of the first branch transmission line to use the time point when the first voltage level reaches the second voltage level as the first transmission time; and The other end of the second branch transmission line receives the test signal to use the time point when the first voltage level reaches the second voltage level as the second transmission time. 如申請專利範圍第4項所述的電路佈線設計方法,其中獲得該第一傳輸時間及該第二傳輸時間的步驟包括: 提供一參考電壓準位,其中該參考電壓準位是位於該第一電壓準位與該第二電壓準位之間; 自該第一分支傳輸線的另一端接收該測試訊號以將自該第一電壓準位到達該參考電壓準位時的時間點作為該第一傳輸時間;以及 自該第二分支傳輸線的另一端接收該測試訊號以將自該第一電壓準位到達該參考電壓準位時的時間點作為該第二傳輸時間。The circuit wiring design method as described in item 4 of the patent application scope, wherein the step of obtaining the first transmission time and the second transmission time includes: providing a reference voltage level, wherein the reference voltage level is located at the first Between the voltage level and the second voltage level; receiving the test signal from the other end of the first branch transmission line to use the time point when the first voltage level reaches the reference voltage level as the first transmission Time; and receiving the test signal from the other end of the second branch transmission line to use the time point when the first voltage level reaches the reference voltage level as the second transmission time. 如申請專利範圍第5項所述的電路佈線設計方法,其中該參考電壓準位的電壓值為該第一電壓準位的電壓值與該第二電壓準位的電壓值的平均值。The circuit wiring design method as described in item 5 of the patent application range, wherein the voltage value of the reference voltage level is the average value of the voltage value of the first voltage level and the voltage value of the second voltage level. 一種電路佈線設計系統,設置於一電路板,該電路板包含一第一導孔結構及一第二導孔結構,該電路佈線設計系統包括: 一傳輸線,被提供於該電路板,包含一主傳輸線、一第一分支傳輸線以及一第二分支傳輸線,該主傳輸線連接該第一導孔結構的一端與該第二導孔結構的一端,該第一分支傳輸線的一端連接該第一導孔結構的另一端,該第二分支傳輸線的一端連接該第二導孔結構的另一端; 一驅動器,用以對該主傳輸線提供一測試訊號; 一第一接收器,連接該第一分支傳輸線的另一端,該第一接收器用以獲得自該驅動器輸出並通過該第一導孔結構及該第一分支傳輸線的該測試訊號並取得該測試訊號通過的一第一傳輸時間; 一第二接收器,連接該第二分支傳輸線的另一端,該第二接收器用以獲得自該驅動器輸出並通過該第二導孔結構及該第二分支傳輸線的該測試訊號並取得該測試訊號通過的一第二傳輸時間;以及 一處理器,耦接於該第一接收器與該第二接收器,用以依據該第一傳輸時間以及該第二傳輸時間獲得一傳輸時間差,並且依據該傳輸時間差獲得一補償距離, 其中該補償距離用以補償至該第一分支傳輸線或該第二分支傳輸線的長度,以使該測試訊號通過該第一導孔結構及該第一分支傳輸線與該第二導孔結構及該第二分支傳輸線的該第一傳輸時間與該第二傳輸時間相等。A circuit wiring design system is provided on a circuit board including a first via structure and a second via structure. The circuit wiring design system includes: a transmission line provided on the circuit board, including a main A transmission line, a first branch transmission line and a second branch transmission line, the main transmission line connects one end of the first via structure and one end of the second via structure, and one end of the first branch transmission line connects the first via structure The other end of the second branch transmission line is connected to the other end of the second via structure; a driver for providing a test signal to the main transmission line; a first receiver connected to the other of the first branch transmission line At one end, the first receiver is used to obtain the test signal output from the driver and pass through the first via structure and the first branch transmission line and obtain a first transmission time for the test signal to pass; a second receiver, Connected to the other end of the second branch transmission line, the second receiver is used to obtain the test signal output from the driver and pass through the second via structure and the second branch transmission line and obtain a second transmission through which the test signal passes Time; and a processor, coupled to the first receiver and the second receiver, for obtaining a transmission time difference according to the first transmission time and the second transmission time, and obtaining a compensation distance according to the transmission time difference Where the compensation distance is used to compensate for the length to the first branch transmission line or the second branch transmission line so that the test signal passes through the first via structure and the first branch transmission line and the second via structure and the The first transmission time and the second transmission time of the second branch transmission line are equal. 如申請專利範圍第7項所述的電路佈線設計系統,其中: 其中該處理器還用以: 依據該傳輸時間差判斷該第一傳輸時間短於或長於該第二傳輸時間;以及 當判斷出該第一傳輸時間短於該第二傳輸時間時,依據該第一分支傳輸線的傳輸速度獲得一第一補償距離, 依據該第一補償距離增加該第一分支傳輸線的長度。The circuit wiring design system as described in item 7 of the patent application scope, wherein: wherein the processor is further used for: judging that the first transmission time is shorter or longer than the second transmission time based on the transmission time difference; and when it is determined that the When the first transmission time is shorter than the second transmission time, a first compensation distance is obtained according to the transmission speed of the first branch transmission line, and the length of the first branch transmission line is increased according to the first compensation distance. 如申請專利範圍第8項所述的電路佈線設計系統,其中: 該處理器還用以當該判斷出該第二傳輸時間短於第一傳輸時間時,依據該第二分支傳輸線的傳輸速度獲得一第二補償距離, 依據該第二補償距離增加該第二分支傳輸線的長度。The circuit wiring design system as described in item 8 of the patent application scope, wherein: the processor is further used to obtain the transmission speed of the second branch transmission line when the second transmission time is determined to be shorter than the first transmission time A second compensation distance increases the length of the second branch transmission line according to the second compensation distance. 如申請專利範圍第7項所述的電路佈線設計系統,其中: 該測試訊號為由一第一電壓準位上升至一第二電壓準位的一電性訊號, 該第一接收器自該第一分支傳輸線的另一端接收該測試訊號以將自該第一電壓準位到達該第二電壓準位時的時間點作為該第一傳輸時間, 該第二接收器自該第二分支傳輸線的另一端接收該測試訊號以將自該第一電壓準位到達該第二電壓準位時的時間點作為該第二傳輸時間。The circuit wiring design system as described in item 7 of the patent application scope, wherein: the test signal is an electrical signal that rises from a first voltage level to a second voltage level, and the first receiver The other end of a branch transmission line receives the test signal to use the time point when the first voltage level reaches the second voltage level as the first transmission time, and the second receiver receives the test signal from the second branch transmission line. One end receives the test signal to use the time point when the first voltage level reaches the second voltage level as the second transmission time. 如申請專利範圍第10項所述的電路佈線設計系統,其中: 該測試訊號為由一第一電壓準位上升至一第二電壓準位的一電性訊號, 該第一接收器自該第一分支傳輸線的另一端接收該測試訊號以將自該第一電壓準位到達一參考電壓準位時的時間點作為該第一傳輸時間,其中該參考電壓準位是位於該第一電壓準位與該第二電壓準位之間, 該第二接收器自該第二分支傳輸線的另一端接收該測試訊號以將自該第一電壓準位到達該參考電壓準位時的時間點作為該第二傳輸時間。The circuit wiring design system as described in item 10 of the patent application scope, wherein: the test signal is an electrical signal that rises from a first voltage level to a second voltage level, and the first receiver The other end of a branch transmission line receives the test signal to use the time point from when the first voltage level reaches a reference voltage level as the first transmission time, wherein the reference voltage level is located at the first voltage level Between the second voltage level, the second receiver receives the test signal from the other end of the second branch transmission line to use the time point when the first voltage level reaches the reference voltage level as the first 2. Transmission time. 如申請專利範圍第11項所述的電路佈線設計系統,其中該參考電壓準位的電壓值為該第一電壓準位的電壓值與該第二電壓準位的電壓值的平均值。The circuit wiring design system as described in item 11 of the patent application range, wherein the voltage value of the reference voltage level is the average of the voltage value of the first voltage level and the voltage value of the second voltage level.
TW107140172A 2018-11-13 2018-11-13 Circuit design method and circuit design system TWI681699B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW107140172A TWI681699B (en) 2018-11-13 2018-11-13 Circuit design method and circuit design system
CN201910555608.3A CN111241773B (en) 2018-11-13 2019-06-25 Circuit wiring design method and circuit wiring design system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW107140172A TWI681699B (en) 2018-11-13 2018-11-13 Circuit design method and circuit design system

Publications (2)

Publication Number Publication Date
TWI681699B true TWI681699B (en) 2020-01-01
TW202019272A TW202019272A (en) 2020-05-16

Family

ID=69942750

Family Applications (1)

Application Number Title Priority Date Filing Date
TW107140172A TWI681699B (en) 2018-11-13 2018-11-13 Circuit design method and circuit design system

Country Status (2)

Country Link
CN (1) CN111241773B (en)
TW (1) TWI681699B (en)

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100478827C (en) * 2005-03-30 2009-04-15 撼讯科技股份有限公司 Memory bus wiring structure and wiring method for low profile display card
EP2400821A1 (en) * 2010-06-17 2011-12-28 Fujitsu Limited Wiring substrate
TW201304628A (en) * 2011-07-14 2013-01-16 私立中原大學 Differential mode snake shape delay line structure
TW201309140A (en) * 2011-08-09 2013-02-16 中原大學 Differential flat spiral delay line structure
TW201345355A (en) * 2012-04-30 2013-11-01 Mitrastar Technology Corp Circuit substrate having multi-layered structure and routing method thereof
TW201540148A (en) * 2014-04-02 2015-10-16 中原大學 Serpentine delay line structure
US20170263605A1 (en) * 2015-09-11 2017-09-14 Renesas Electronics Corporation Semiconductor device
TW201811138A (en) * 2016-07-08 2018-03-16 凱特伊夫公司 Guided transport path correction

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004146403A (en) * 2002-10-21 2004-05-20 Advantest Corp Transmission circuit, cmos semiconductor device and method for designing
US7720598B2 (en) * 2005-03-31 2010-05-18 Deere & Company System and method for determining a position of a vehicle with compensation for noise or measurement error
CN103136382A (en) * 2011-11-22 2013-06-05 英业达科技有限公司 Wire layout design method for circuit board
KR102626858B1 (en) * 2016-11-02 2024-01-19 삼성전자주식회사 Test system for measuring propagation time of transmission line

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100478827C (en) * 2005-03-30 2009-04-15 撼讯科技股份有限公司 Memory bus wiring structure and wiring method for low profile display card
EP2400821A1 (en) * 2010-06-17 2011-12-28 Fujitsu Limited Wiring substrate
TW201304628A (en) * 2011-07-14 2013-01-16 私立中原大學 Differential mode snake shape delay line structure
TW201309140A (en) * 2011-08-09 2013-02-16 中原大學 Differential flat spiral delay line structure
TW201345355A (en) * 2012-04-30 2013-11-01 Mitrastar Technology Corp Circuit substrate having multi-layered structure and routing method thereof
TW201540148A (en) * 2014-04-02 2015-10-16 中原大學 Serpentine delay line structure
US20170263605A1 (en) * 2015-09-11 2017-09-14 Renesas Electronics Corporation Semiconductor device
TW201811138A (en) * 2016-07-08 2018-03-16 凱特伊夫公司 Guided transport path correction

Also Published As

Publication number Publication date
TW202019272A (en) 2020-05-16
CN111241773B (en) 2024-03-15
CN111241773A (en) 2020-06-05

Similar Documents

Publication Publication Date Title
US7373574B2 (en) Semiconductor testing apparatus and method of testing semiconductor
TWI681699B (en) Circuit design method and circuit design system
US20030083857A1 (en) Method, apparatus, and computer program for evaluating noise immunity of a semiconductor device
US20090146759A1 (en) Circuit topology for multiple loads
US9500692B2 (en) Detecting circuit and detecting method for determining connection status between first pin and second pin
US7746195B2 (en) Circuit topology for multiple loads
US10969424B2 (en) Chip and performance monitoring method
US6756858B2 (en) Conductive path compensation for matching output driver impedance
US8310246B2 (en) Continuity testing apparatus and continuity testing method including open/short detection circuit
Kim et al. TDR/TDT analysis by crosstalk in single and differential meander delay lines for high speed PCB applications
JP6197573B2 (en) Switching element inspection method and electronic circuit unit
US8640069B2 (en) Noise analysis model and noise analysis method including disposing resistors and setting points in a semiconductor
CN111103522B (en) Chip and efficiency monitoring method
US9069913B2 (en) Circuit topology for multiple loads
US9654060B1 (en) Signal amplification using a reference plane with alternating impedance
TW201311076A (en) Topology structure of multiple loads
WO2016038848A1 (en) Control circuit and control method
US11095251B1 (en) Performance calculation system, performance calculation method, and electronic device
TWI622891B (en) Adjusting method for layout of signal transmission line
CN107506554B (en) Printed circuit board applied to storage system and wiring method and device thereof
EP0214229B1 (en) Logic circuit having improved testability for defective via contacts
TWI681309B (en) Electronic device test data base generating method
JP2019164752A (en) Analysis device, analysis method and analysis program
US20030217342A1 (en) Circuitry cross-talk analysis with consideration of signal transitions
CN110856350A (en) Compensation method and system for board card edge routing return path and board card